Exida - Failure Modes, Effects and Diagnostic Analysis
Exida - Failure Modes, Effects and Diagnostic Analysis
Project:
Primary Elements
Company:
Rosemount Inc.
Emerson Automation Solutions
Chanhassen, MN
USA
The document was prepared using best effort. The authors make no warranty of any kind and shall not be liable in any
event for incidental or consequential damages in connection with the application of the document.
© All rights reserved.
Management Summary
This report summarizes the results of the hardware assessment in the form of a Failure Modes,
Effects, and Diagnostic Analysis (FMEDA) of the Primary Elements. A Failure Modes, Effects, and
Diagnostic Analysis is one of the steps to be taken to achieve functional safety certification per IEC
61508 of a device. From the FMEDA, failure rates are determined. The FMEDA that is described in
this report concerns only the hardware of the Primary Element. For full functional safety
certification purposes all requirements of IEC 61508 must be considered.
A Flowmeter consists of a Primary Element that is attached to one of the following devices:
Rosemount 3051, Rosemount 3051S, Rosemount 3051S Multivariable, Rosemount 2051, and
Rosemount 3095 differential pressure transmitters. The specific Primary Element that were
considered are the 485 Annubar Primary Element, the 405 Compact Primary Element, and the
1195 Integral Orifice Plate.
Note:This report does not include the failure rates for the Rosemount Pressure Transmitter that the
Primary Element is attached to.
Table 1 gives an overview of the different versions that were considered in the FMEDA of the
Primary Element.
Model Application
Process Connection for Flow – High Trip, Clean Service
485 Annubar Primary Element
Process Connection for Flow – Low Trip, Clean Service
Process Connection for Flow – High Trip, Clean Service
405 Compact Primary Element
Process Connection for Flow – Low Trip, Clean Service
Process Connection for Flow – High Trip, Clean Service
1195 Integral Orifice Plate
Process Connection for Flow – Low Trip, Clean Service
The Primary Element is classified as a device that is part of a Type A1 element according to IEC
61508, having a hardware fault tolerance of 0.
The failure rate data used for this analysis meets the exida criteria for Route 2H. See Section 5.2.
Therefore, the Primary Element can be classified as a 2H device when the listed failure rates are
used. When 2H data is used for all of the devices in an element, then the element meets the
hardware architectural constraints up to SIL 2 at HFT=0 (or SIL 3 @ HFT=1) per Route 2H. If Route
2H is not applicable for the entire sensor element, the architectural constraints will need to be
evaluated per Route 1H.
Based on the assumptions listed in 4.3, the failure rates for the Primary Element are listed in
section 4.4.
These failure rates are valid for the useful lifetime of the product, see Appendix A.
1
Type A element: “Non-Complex” element (using discrete components); for details see 7.4.4.1.2 of IEC 61508-2, ed2,
2010. / Type B element: “Complex” element (using micro controllers or programmable logic); for details see 7.4.4.1.3 of
IEC 61508-2, ed2, 2010.
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The failure rates listed in this report are based on over 350 billion-unit operating hours of process
industry field failure data. The failure rate predictions reflect realistic failures and include site
specific failures due to human events for the specified Site Safety Index (SSI), see section 4.2.2.
A user of the Primary Element can utilize these failure rates in a probabilistic model of a safety
instrumented function (SIF) to determine suitability in part for safety instrumented system (SIS)
usage in a particular safety integrity level (SIL).
Model Application
Process Connection for Flow – High Trip, Clean Service
485 Annubar Primary Element
Process Connection for Flow – Low Trip, Clean Service
Process Connection for Flow – High Trip, Clean Service
405 Compact Primary Element
Process Connection for Flow – Low Trip, Clean Service
Process Connection for Flow – High Trip, Clean Service
1195 Integral Orifice Plate
Process Connection for Flow – Low Trip, Clean Service
The Primary Element is classified as a device that is a part of a Type A2 element according to IEC
61508, having a hardware fault tolerance of 0.
2
Type A element: “Non-Complex” element (using discrete components); for details see 7.4.4.1.2 of IEC 61508-2, ed2,
2010.
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4 Failure Modes, Effects, and Diagnostic Analysis
The Failure Modes, Effects, and Diagnostic Analysis was performed based on the documentation
listed in section 2.4.1 and is documented in [R1].
When the effect of a certain failure mode could not be analyzed theoretically, the failure modes
were introduced on component level and the effects of these failure modes were examined on
system level.
4.2.1 FMEDA
A FMEDA (Failure Mode Effect and Diagnostic Analysis) is a failure rate prediction technique
based on a study of design strength versus operational profile stress in each application. It
combines design FMEA techniques with extensions to identify automatic diagnostic techniques and
the failure modes relevant to safety instrumented system design. It is a technique recommended to
generate failure rates for each failure mode category [N13].
4.3 Assumptions
The following assumptions have been made during the Failure Modes, Effects, and Diagnostic
Analysis of the Primary Element.
The worst-case assumption of a series system is made. Therefore, only a single component
failure will fail the entire Primary Element, and propagation of failures is not relevant.
Failure rates are constant for the useful life period.
Any product component that cannot influence the safety function (feedback immune) is
excluded. All components that are part of the safety function including those needed for
normal operation are included in the analysis.
The stress levels are specified in the exida Profile used for the analysis limited by the
manufacturer’s published ratings.
Materials are compatible with the environmental and process conditions.
The device is installed and operated per the manufacturer’s instructions.
Devices are installed such that the controlled substance will flow through the device in the
direction indicated by the flow arrow, located on the device body.
4.4 Results
Using reliability data extracted from the exida Electrical and Mechanical Component Reliability
Handbook the following failure rates resulted from the FMEDA analysis of the Primary Element.
Table 3 lists the failure rates for the Primary Element according to IEC 61508 with a Site Safety
Index (SSI) of 2 (good site maintenance practices). See Appendix E for an explanation of SSI.
Table 3 Primary Element incremental Failure rates with Good Maintenance Assumptions in FIT @
SSI=2
Incremental failure rates are to be added to the failure rates listed in the transmitter’s FMEDA. This
analysis included consideration for parts of the Primary Element that replace the applicable
transmitter parts that are included in the transmitter FMEDA failure rates.
Where:
λSD = Fail Safe Detected
λSU = Fail Safe Undetected
λDD = Fail Dangerous Detected
λDU = Fail Dangerous Undetected
# = No Effect Failures
E = External Leaks
As the External Leak failure rates are a subset of the No Effect failure rates, the total No Effect
failure rate is the sum of the listed No Effect and External Leak rates. External leakage failure rates
do not directly contribute to the reliability of the device but should be reviewed for secondary safety
and environmental issues.
These failure rates are valid for the useful lifetime of the product, see Appendix A.
According to IEC 61508-2 the architectural constraints of an element must be determined. This can
be done by following the 1H approach according to 7.4.4.2 of IEC 61508-2 or the 2H approach
according to 7.4.4.3 of IEC 61508-2, or the approach according to IEC 61511:2016 which is based
on 2H (see Section 5.2).
The 1H approach involves calculating the Safe Failure Fraction for the entire element.
The 2H approach involves assessment of the reliability data for the entire element according to
7.4.4.3.3 of IEC 61508.
3
Useful lifetime is a reliability engineering term that describes the operational time interval where the failure rate of a
device is relatively constant. It is not a term which covers product obsolescence, warranty, or other commercial issues.
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Appendix B Proof Tests to Reveal Dangerous Undetected Faults
According to section 7.4.5.2 f) of IEC 61508-2, proof tests shall be undertaken to reveal dangerous
faults which are undetected by automatic diagnostic tests. This means that it is necessary to
specify how dangerous undetected faults which have been noted during the Failure Modes,
Effects, and Diagnostic Analysis can be detected during proof testing.
Step Action
1. Bypass the safety function and take appropriate action to avoid a false trip.
2. Inspect the Primary Element for any leaks, visible damage or contamination.
3. Perform a three-point calibration check of the Flow Transmitter by varying the Flow
through the Primary Element.
4. Remove the bypass and otherwise restore normal operation.
4
Humidity rating per IEC 60068-2-3
5
Shock rating per IEC 60068-2-27
6
Vibration rating per IEC 60068-2-6
7
Chemical Corrosion rating per ISA 71.04
8
Surge rating per IEC 61000-4-5
9
EMI Susceptibility rating per IEC 61000-4-3
10
ESD (Air) rating per IEC 61000-4-2
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Appendix D Determining Safety Integrity Level
The information in this appendix is intended to provide the method of determining the Safety
Integrity Level (SIL) of a Safety Instrumented Function (SIF). The numbers used in the examples
are not for the product described in this report.
Three things must be checked when verifying that a given Safety Instrumented Function (SIF)
design meets a Safety Integrity Level (SIL) [N4] and [N7].
These are:
A. Systematic Capability or Prior Use Justification for each device meets the SIL level of the SIF;
B. Architecture Constraints (minimum redundancy requirements) are met; and
C. a PFDavg calculation result is within the range of numbers given for the SIL level.
A. Systematic Capability (SC) is defined in IEC 61508:2010. The SC rating is a measure of design
quality based upon the methods and techniques used to design and development a product. All
devices in a SIF must have a SC rating equal or greater than the SIL level of the SIF. For example,
a SIF is designed to meet SIL 3 with three pressure transmitters in a 2oo3 voting scheme. The
transmitters have an SC2 rating. The design does not meet SIL 3. Alternatively, IEC 61511 allows
the end user to perform a "Prior Use" justification. The end user evaluates the equipment to a given
SIL level, documents the evaluation and takes responsibility for the justification.
B. Architecture constraints require certain minimum levels of redundancy. Different tables show
different levels of redundancy for each SIL level. A table is chosen, and redundancy is incorporated
into the design [N8].
C. Probability of Failure on Demand (PFDavg) calculation uses several parameters, many of which
are determined by the particular application and the operational policies of each site. Some
parameters are product specific and the responsibility of the manufacturer. Those manufacturer
specific parameters are given in this third-party report.
A Probability of Failure on Demand (PFDavg) must be done based on a number of variables
including:
1. Failure rates of each product in the design including failure modes and any diagnostic
coverage from automatic diagnostics (an attribute of the product given by this FMEDA report);
2. Redundancy of devices including common cause failures (an attribute of the SIF design);
3. Proof Test Intervals (assignable by end user practices);
4. Mean Time to Restore (an attribute of end user practices);
5. Proof Test Effectiveness; (an attribute of the proof test method used by the end user with an
example given by this report);
6. Mission Time (an attribute of end user practices);
7. Proof Testing with process online or shutdown (an attribute of end user practices);
8. Proof Test Duration (an attribute of end user practices); and
9. Operational/Maintenance Capability (an attribute of end user practices).
The product manufacturer is responsible for the first variable. Most manufacturers use the exida
FMEDA technique which is based on over 350 billion hours of field failure data in the process
industries to predict these failure rates as seen in this report. A system designer chooses the
second variable. All other variables are the responsibility of the end user site. The exSILentia®
SILVerTM software considers all these variables and provides an effective means to calculate
PFDavg for any given set of variables.
3.50E-02
3.00E-02
PFDavg 2.50E-02
2.00E-02
Series1
Sensor
1.50E-02
Final
Series2
1.00E-02 Element
5.00E-03
0.00E+00
1 2 3 4 5
Proof Test Interval (Years)
with all other variables remaining the same, the PFDavg for the SIF equals 5.76E-02 which barely
meets SIL 1 with a risk reduction factor of 17. The subsystem PFDavg contributions are Sensor
PFDavg = 2.77E-03, Logic Solver PFDavg = 1.14E-05, and Final Element PFDavg = 5.49E-02 (Figure
3).
Level Description
Perfect - Repairs are always correctly performed, Testing is always done correctly and on
schedule, equipment is always replaced before end of useful life, equipment is always
selected according to the specified environmental limits and process compatible materials.
SSI 4
Electrical power supplies are clean of transients and isolated, pneumatic supplies and
hydraulic fluids are always kept clean, etc. Note: This level is generally considered not
possible but retained in the model for comparison purposes.
Almost perfect - Repairs are correctly performed, Testing is done correctly and on schedule,
equipment is normally selected based on the specified environmental limits and a good
SSI 3 analysis of the process chemistry and compatible materials. Electrical power supplies are
normally clean of transients and isolated, pneumatic supplies and hydraulic fluids are mostly
kept clean, etc. Equipment is replaced before end of useful life, etc.
Good - Repairs are usually correctly performed, Testing is done correctly and mostly on
SSI 2
schedule, most equipment is replaced before end of useful life, etc.
Medium – Many repairs are correctly performed, Testing is done and mostly on schedule,
SSI 1
some equipment is replaced before end of useful life, etc.
None - Repairs are not always done, Testing is not done, equipment is not replaced until
SSI 0
failure, etc.