TESTING AND MEASUREMENT TECHNIQUES,

CONDUCTED DISTURBANCE TRANSIENT TESTS

Martin Lutz
EMC PARTNER AG
Baselstrasse 160
4242 Laufen Switzerland

Phone: ++41 61 763 01 11

Fax: ++41 61 763 01 15

61000-4-11 61000-4-11 Voltage dips and interruption no, IS

1994
1. ACTUAL STATUS INTERNATIONAL (IEC) 61000-4-12 61000-4-12 Oscillatory waves no, IS
1995 amendment >1MHz

Within the International Electrotechnical Com- 61000-4-13 Harmonics, Interharmonics,

Main Signalling
77A/215/CD CD

mission (IEC) the technical committee TC 65 61000-4-14 Voltage fluctuations, 77A/214/CDV CDV
unbalance, variation of the
begun early in the eighties with the publication of power frequency
61000-4-15 Flicker measurement no,
the 801-x EMC standard. The technical committee 1997 amendment verification
65 is responsible for the area industrial process 61000-4-16 Conducted disturbance in the no
range of DC to 150 kHz
IS
1998
measuring and control equipment. In the eighties 61000-4-17 Ripple on DC power supply 77A/207/CDV CDV
the IEC established an other technical committee 61000-4-18
61000-4-19
free
free
77. The committee TC77 is responsible for the 61000-4-20 TEM cells 77B/153/CD CD
Alternative method to 61000-
electro- magnetic compatibility within IEC. In 4-3
addition to own basic EMC standards the TC 77 61000-4-21 Reverberation chamber
Alternative method to 61000-
77B/..../CD CD

has taken over, at the beginning of the nineties, 4-3

61000-4-22 Guide on measurement Status 0 NWI
the technical content of the existing 801-x methods for electromagnetic
phenomena
documents and published them as basic standards 61000-4-23 Test methods for protective 77C/38/CD CD
with the number 1000-4-x. The information in the devices for HEMP radiated
disturbance
table below represents the status of the 61000-4-x 61000-4-24 Test methods for protective no IS
1998 devices for HEMP conducted
series in July 98. disturbance
61000-4-25 HEMP requirements and test 77C/55/CD CD
methods for equipment and
systems
61000-4-26 Calibration of probes and 77B/150/NP NWI
instruments for measuring
electromagnetic fields
61000-4-27 Unbalance in 3phase mains 77A/176/CD CD
61000-4-28 Variation of power frequency 77A/235/CDV CDV
61000-4-29 Voltage dips and interruption 77A/206/CD CD
Standards Standards EN Content, title Revision within the next Status on d.c.
IEC 3 years? 61000-4-30 Measurement of power 77A183/NP NP
61000-4-1 EN61000-4-1 Overview yes IS quality parameters
1992 61000-4-31 Measurement in the 77A/198/CD CD
61000-4-2 EN61000-4-2 ESD no, IS frequency range 2 kHz to 9
1995 amendments kHz
61000-4-3 ENV 50140 E/H field no, amendments IS
1995 TEM cells, reverberation Legend:
chamber, digital radio
61000-4-4 61000-4-4 EFT no, IS CD Committee draft of comment
1995 amendments CDV Committee draft for vote
61000-4-5 61000-4-5 SURGE no IS
1995
DC Draft for comment
61000-4-6 61000-4-6 Conducted disturbances, no IS DIS Draft international standard
1996 induced by radio-frequency DV Draft for voting
fields
61000-4-7 - Harmonics measuring yes IS
IS International standard
1991 NCP National Committee proposal
61000-4-8 61000-4-8 50/60 Hz Magnetic field no IS NP New work item proposal
1993
RV Result of voting
61000-4-9 61000-4-9 SURGE Magnetic field no IS
1993 RVC Result of vote on CDV
61000-4-10 61000-4-10 Oscillatory Magnetic field no IS RVD Report of voting on DIS
1993 RVN Report of voting on NP
WG Working group membership list
 2. ACTUAL STATUS IN EUROPE (EN) published. To understand better the different
among the three standards very briefly the
The European Community EC has issued an EMC
contents of the three types will be described.
directive mandating that all electronic products
must have a certain immunity and overpass not a
certain emission limit. These requirements are
4. BASIC STANDARDS
scheduled to become effective January 1. 1996. In
the transition period whereas no IEC or EN product The content of the basic standard is:
standards are available the EC normalisation • definition and description of the phenomenon
organisation CENELEC (European Committee for • detailed test and measurement methods
Electrotechnical Standardisation) has published • test instrumentation
the so called „Generic standards“. The different • basic test set up
immunity tests and emission measurements in the • range of test levels
generic standards are based on the IEC not included:
documents 1000-4-x. In December 1996 the IEC
• prescribed limits
and the ISO have allocated themselves blocks of
• performance criteria
publication numbers from 60'000 to 79'000 for
IEC. Therefore the numbers of the standards are • product specific test arrangements
equal between the IEC and CENELEC. • test sequences

IEC CENELEC As a consequence of the content of the basic

IEC 61000-4-X EN 61000-4-x standards, EMC immunity test can not carry out
alone with the basic standard. To run EMC test
As long as the IEC product committees has not additional information are needed. The additional
worked out EMC product standards, or in the information is given either in the generic or
existing product standards the EMC aspects are product standards.
not covered, all the electronic equipment must be
tested in accordance with the generic standards to Most of the basic standards work are finished in
pass the EC border after 1st January 96. TC77. Only about two to three basic immunities
basic documents are still in the pipeline of TC77.
Generic Immunity Standard
• EN 50082-1 Part 1: Residential, commercial Electrostatic Discharge ESD, electrical fast
and light industry transient EFT, SURGE and DIPS are the most
important transient's interference sources. An
• EN 50082-2 Part 2: Industrial environment
overview about the different important parameter
as defined in the basic immunity standards are
Generic Emission Standard
given in the table followed:
• EN 50081-1 Part 1: Residential, commercial
and light industry
• EN 50081-2 Part 2: Industrial environment
Characteristics Static discharge Switching Lightning Power trip out
operations

"ESD" "EFT Burst" "Surge" "DIPS"

3. RELATION BETWEEN BASIC, GENERIC AND Voltage U up to 15 kV up to 4 kV up to 6 kV supply voltage

PRODUCT STANDARD Energies at below 10 mJ 300 mJ 300 J -

maximum
charging. voltage
Environment
Repetition rate Single impulse multiple pulses 5 maximum 6 related to the
kHz Impulses / Min power frequency

Generic Application Metal parts, which Power-, Signal-. Power-, Signal-. power supply ac,
Special Equipment under can be touched by Measuring- and Measuring- and dc
Product & Highest
Priority Test persons Datalines Datalines
Product Family
Standards Standards Upper frequency Approx. 1 GHz Approx. 100 MHz Approx. 350 kHz Approx. 100 kHz
Generic limit
Industrial Waveforms
EN 50082-2 Product Product & Second
Standards Family Priority
Standards
Generic IEC 1000-4-2 IEC 1000-4-4 IEC 1000-4-5 IEC 1000-4-11
Domestic
EN 50082-1
Products
Basic Standard IEC 1000-4....
5. GENERIC STANDARDS
The generic standards are only important for the
From the above diagram it can be derived that the transition time up to the publication date of product
product or product family standard has the highest standard.
priority and must be used, when they are
Basically two environments can be differ: 61000-4-3 or part 20 or 21

Residential, commercial and light industry

Locations that are characterised by being supplied In addition to the basic standard the following
directly at low voltage from public mains are information and questions are included the generic
considered to be residential, commercial or light document. The question must be answered to run
industry. EMC tests.

• residential properties, e. g. houses, apartments Applicability of the generic standards

• retail outlets, e. g. shops, supermarkets • The applicability of the test depends on the
• business premises, e. g. offices, banks particular apparatus, its configuration, its ports,
• areas of public entertainment, e. g. cinemas, its technology and its operating conditions.
public bars, dance halls • Test shall only be carried out where the
• outdoor locations, e. g. petrol stations, car relevant ports exist
parks, amusements and sports centres • It may be determined by characteristics and
• light-industrial locations , e. g. workshops, usage that some of the test are inappropriate
laboratories, service centres. and therefore unnecessary. The decision and
justification not to test shall be recorded in the
Industrial environment test report.
Current and associated magnetic fields are high
• industrial, scientific and medical (ISM) Enclosure
apparatus Ports
Signal, Data,
• heavy inductive or capacitive loads are I/O Lines Ports
frequently switched
The generic standard refers to the basic standards.

Phenomena
Basic standard
Tests Residential
and light
industrial special e.g.
power plant
EUT
industrial
61000-4-2 ESD g.a. g.a. g.a.
61000-4-3 Radiated electromagnetic field >80MHz g.a. g.a. g.a. AC / DC
61000-4-4 EFT/Burst g.a. g.a. g.a. Power Ports
61000-4-5 SURGE g.a. g.a. g.a.
61000-4-6 Conducted disturbances, induced by radio- g.a. g.a. g.a.
frequency fields <80MHz Earth Port
61000-4-7 General Guide on harmonics and inter- n.i.s. n.i.s. n.i.s.
harmonics measurements and
instrumentation
61000-4-8 50/60 Hz Magnetic field may may g.a.
61000-4-9 SURGE Magnetic field g.n.a. g.n.a. g.a.
61000-4-10 Oscillatory Magnetic field g.n.a. g.n.a. g.a.
61000-4-11 Voltage dips and interruption g.a. g.a. g.a.
Condition during testing
61000-4-12
61000-4-12
Oscillatory waves „ ring wave“
Oscillatory waves 1MHz
may
g.n.a.
may
may
may
g.a.
• Test shall be made in the most susceptible
61000-4-13* Harmonics, Inter-harmonics, Main g.n.a. g.n.a. g.n.a. operating mode.
• The configuration of the test sample shall be
Signaling
61000-4-14* Voltage fluctuations g.n.a. g.n.a. g.n.a.
61000-4-15
61000-4-16
Flickermeter
Conducted disturbance in the range of DC
n.i.s.
g.n.a.
n.i.s.
may
n.i.s.
g.n.a.
varied to achieve maximum susceptibility
to 150 kHz • If the apparatus is part of a system with
61000-4-17 Ripple on DC power supply g.n.a. may g.n.a.
61000-4-18 free auxiliary apparatus then it shall be tested with
61000-4-19
61000-4-20*
free
TEM cells 2 2 2
the minimum representative configuration of
61000-4-21* Reverberation chambers 2 2 2 auxiliary apparatus.
61000-4-22
61000-4-23*
free
Test methods for protective devices for g.n.a. g.n.a. g.n.a.
• When external protection devices are clearly
61000-4-24
HEMP radiated disturbance
Test methods for protective devices for g.n.a. g.n.a. g.n.a.
specified in the user manual, then the test may
HEMP conducted disturbance be applied with the external protection devises.
• The configuration and mode of operation shall
61000-4-25* HEMP requirements and test methods for g.n.a. g.n.a. g.n.a.
equipment and systems
61000-4-26* Calibration of probes and instruments for n.i.s. n.i.s. n.i.s.
measuring electromagnetic fields be precisely noted in the test report. The most
61000-4-27* Unbalance in 3phase mains no maybe maybe critical mode operations shall be selected.
61000-4-28* Variation of power frequency no maybe maybe
61000-4-29* Voltage dips and interruption on d.c. may may may • If the apparatus has a large number of similar
61000-4-30*
61000-4-31*
Measurement of power quality parameters
Measurements in the frequency range 2
n.i.s.
n.i.s.
n.i.s.
n.i.s.
n.i.s.
n.i.s.
ports a sufficient number shall be selected to
kHz to 9 kHz simulate actual operating conditions.
• Test condition shall be within the operating
Legend: ranges of temperature, humidity, pressure etc.
n.i.s. Not an immunity standard
g.a. Generally applicable except in special cases
may May be applicable in certain circumstances Immunity test requirements
g.n.a. Generally not applicable except in special cases • Test shall be conducted in a well defined and
* The document is in progress but not finally published reproducible manner.
2 Special alternative test method. Application range see
• The test shall be carried out as single tests in Phenomena
Basic
Tests AC-
power
DC
power
Enclosure Signal
Data
Earth

sequence. standards
1000-4-2 ESD -3 g.n.a. g.a. g.n.a. g.n.a.
• The sequence of testing is optional. 1000-4-3 Radiated electromagnetic field g.n.a. g.n.a. g.a. g.n.a. g.n.a.
>80MHz
• Test generator, test method, test set up is 1000-4-4 EFT/Burst g.a. g.a. - g.a. g.a.

given in the basic standards. 1000-4-5

1000-4-6
SURGE
Conducted disturbances,
g.a.
g.a.
may
g.a.
g.n.a.
no
may
g.a.
may
g.a.
• Modification and additional information needed induced by radio-frequency
fields <80MHz
for the practical applications of the tests are 1000-4-7 General Guide on harmonics n.i.s n.i.s n.i.s n.i.s n.i.s
and inter-harmonics
given in the product standard. measurements and
instrumentation
1000-4-8 50/60 Hz Magnetic field - - may - -
General test requirements 1000-4-9
1000-4-10
SURGE Magnetic field
Oscillatory Magnetic field
-
-
-
-
may
may
-
-
-
-
• Reliability of the test results: 1000-4-11 Voltage dips and interruption g.a. - - - -

• number of shots
1000-4-12 Oscillatory waves „ ring wave“ may g.n.a. - may g.n.a.
1000-4-12 Oscillatory waves 1MHz may may - may may

• test time 1000-4-13* Harmonics, Inter-harmonics,

Main Signaling
g.n.a. - - g.n.a. -

• polarity 1000-4-14* Voltage fluctuations g.n.a. - - - -

1000-4-15 Flickermeter n.i.s. n.i.s. n.i.s n.i.s. n.i.s.
• phase angle 1000-4-16 Conducted disturbance in the g.n.a. g.n.a. - g.n.a. -

• synchronisation with EUT operating

range of DC to 150 kHz
1000-4-17* Ripple on DC power supply - may - - -
sequence 1000-4-18
1000-4-19
free
free
• etc. 1000-4-20* TEM cells 2 2 2 2 2

• Statistical aspects
1000-4-21* Reverberation chamber 2 2 2 2 2
1000-4-22 free

• The personnel safety must be guaranteed 1000-4-23* Test methods for protective
devices for HEMP radiated
g.n.a. g.n.a. g.n.a. g.n.a. g.n.a.

during the immunity test. 1000-4-24

disturbance
Test methods for protective g.n.a. g.n.a. g.n.a. g.n.a. g.n.a.
devices for HEMP conducted
disturbance
Performance criteria 1000-4-25* HEMP requirements and test g.n.a. g.n.a. g.n.a. g.n.a. g.n.a.

• The variety of the apparatus makes it difficult

methods for equipment and
systems
1000-4-26* Calibration of probes and n.i.s. n.i.s. n.i.s. n.i.s. n.i.s.
to define precise criteria. instruments for measuring

• As a result of the application of the test the 1000-4-27*

electromagnetic fields
Unbalance in 3phase mains may - - - -
apparatus becomes dangerous or unsafe as a 1000-4-28 Variation of power frequency g.n.a. - - - -
1000-4-29* Voltage dips and variation on - may - - -
consequence the test failed. d.c.

• Definition of performance shall be specified in 1000-4-30* Measurements in the frequency

range 2 kHz to 9 kHz
n.i.s. n.i.s. n.i.s. n.i.s. n.i.s.

a test plan and noted in the test report. 1000-4-31* Measurements in the frequency n.i.s. n.i.s. n.i.s. n.i.s. n.i.s.

Three general performances can be used as a Legend:

guide: n.i.s. Not an immunity standard
A) No loss of function is allowed below and g.a. Generally applicable except in special cases
equal the test levels may May be applicable in certain circumstances
g.n.a. Generally not applicable except in special cases
B) No loss of function is allowed after test. * The document is in progress but not finally published
During the test, degradation of performance 3 Application not possible
is allowed
C)Temporary loss of function is allowed.

Within IEC more than 200 working group are

discussing EMC aspects for their products.
6. PRODUCT STANDARDS
All the questions in the generic standard should be 7. CE MARK
answered in the product standard.
The electronic equipment must be labelled with
the CE mark for free circulation within the EC from
1st January 96 on.
To stick the CE mark onto an equipment, different
immunity test and emission measurements must
be made in accordance with the generic or product
standards. Today the standards are in a transition
period from generic to product standard. For
manufacturers of electronic equipment it is very
difficult to get the actual information about the
status of the product-standard related to theirs
product. Report R110-001:1993. The flowchart
below is copied from the CENELEC report R110-
001:1993 and can be of help for taking decision.
 M. Lutz
Product
The determination of the Immunity to high energy
Does a product EMC standard exists? transients µs-Impulse (SURGE) with the CWG
Combination Wave Generator.
Yes No
Does the product EMC standard cover all Is the generic EMC standard suitable
Syllabus for Technischen Akademie in Esslingen /
the relevant EMC phenomena Germany
Yes No
Yes No
The product EMC Examine if simulta- The generic EMC Prepare a new M. Lutz
standard shall be neous use of exist- standard can be product EMC
used ing EMC product used. No necessity standard. Determination of the immunity to electrostatic
and generic stan- to make product
dards covers all EMC standard discharges ESD
relevant phenomena
(recommended only
for temporary use).
If not prepare a new Standards:
• IEC TC65 drafts and standards 801-x
EMC product
standard.

• IEC TC77B drafts and standards 61000-4-x

• CENELEC TC 110 EN drafts and standards
The manufacturers of electronic equipment will 61000-4-x; EN 50082-x
consequently be compelled to conduct immunity
tests. This will lead to an increased test volume.
Large companies will automate their existing test ABOUT THE AUTHOR:
equipment and will have to integrate their EMC
tests into their quality assurance systems. Small Martin Lutz has over 20 years' experiences in the
and medium companies will most likely have to EMC domain and has served on various technical
rely for their test needs on test houses and official committees within the IEC and the Swiss national
test authorities. standardisation.
One solution for the performance of fast, Martin Lutz is author of different technical EMC
economic and well-documented EMC tests may be articles partly presented at IEEE EMC
the use of automated test systems. EMC symposiums and co-author of EMC books. He
PARTNER AG has developed the TRANSIENT holds a grad. Electrical Eng. of the Engineer
1000 system, which allows the quick automation of University of Biel Switzerland.
the four most important transient immunity tests. Today Martin Lutz is president of EMC PARTNER
AG Switzerland, one of the leading EMC
For a great number of electronic equipment all equipment manufacturer in the world.
four immunity tests are required. If you need any
further information about pulsed immunity test
contact the authors.

8. REFERENCES:
K.Feser
Mikroelektronik, EMP-Phänomene und EMV-
Probleme in unserer Technischen Gesellschaft.
Paper delivered at EMC-Symposium UNI
Stuttgart/Germany 1988.

A. Rodewald / M. Lutz
Interference generated by switching operation and
simulation.
Paper delivered at EMC Symposium Tokyo 1984

M. Lutz
The determination of the immunity to low energy
transients ns-impulses (Burst) with the EFT
Generator.
Syllabus for Technische Akademie in Esslingen /
Germany