AD5940
AD5940
Figure 1.
TABLE OF CONTENTS
Features .............................................................................................. 1 Avoiding Incoherency Errors Between Excitation and
Applications ....................................................................................... 1 Measurement Frequencies During Impedance Measurements
....................................................................................................... 41
Simplified Block Diagram ............................................................... 1
High Speed DAC Calibration Options .................................... 42
Revision History ............................................................................... 3
High Speed DAC Circuit Registers .......................................... 43
Functional Block Diagram .............................................................. 4
High Speed TIA Circuits ............................................................... 46
General Description ......................................................................... 5
High Speed TIA Configuration ................................................ 46
Specifications..................................................................................... 6
High Speed TIA Circuit Registers ............................................ 48
ADC RMS Noise Specifications ............................................... 15
High Performance ADC Circuit................................................... 50
SPI Timing Specifications ......................................................... 15
ADC Circuit Overview .............................................................. 50
Absolute Maximum Ratings.......................................................... 17
ADC Circuit Diagram ............................................................... 50
Thermal Resistance .................................................................... 17
ADC Circuit Features ................................................................ 51
ESD Caution ................................................................................ 17
ADC Circuit Operation ............................................................. 51
Pin Configuration and Function Descriptions ........................... 18
ADC Transfer Function ............................................................. 51
Typical Performance Characteristics ........................................... 20
ADC Low Power Current Input Channel ............................... 52
Reference Test Circuit ................................................................ 22
Selecting Inputs to ADC Mux .................................................. 52
Theory of Operation ...................................................................... 23
ADC Postprocessing .................................................................. 52
Configuration Registers ............................................................. 23
Internal Temperature Sensor Channel .................................... 53
Silicon Identification ...................................................................... 26
Sinc2 Filter (50 Hz/60 Hz Mains Filter) .................................. 53
Identification Registers .............................................................. 26
ADC Calibration ........................................................................ 53
Low Power DAC ............................................................................. 27
ADC Circuit Registers ............................................................... 54
Low Power DAC Switch Options ............................................. 27
ADC Calibration Registers ....................................................... 59
Relationship Between the 12-Bit and 6-Bit Outputs.............. 29
ADC Digital Postprocessing Registers (Optional) ................ 65
Low Power DAC Use Cases ....................................................... 29
ADC Statistics Registers ............................................................ 66
Low Power DAC Circuit Registers ........................................... 30
Programmable Switch Matrix ....................................................... 68
Low Power Potentiostat ................................................................. 33
Switch Descriptions ................................................................... 68
Low Power TIA ............................................................................... 34
Recommended Configuration in Hibernate Mode ............... 68
Low Power TIA Protection Diodes .......................................... 34
Options for Controlling All Switches ...................................... 68
Using an External RTIA ............................................................... 34
Programmable Switches Registers ........................................... 71
Recommended Switch Settings for Various Operating
Modes ........................................................................................... 34 Precision Voltage References ........................................................ 81
Low Power TIA Circuits Registers ........................................... 37 High Power and Low Power Buffer Control Register—
BUFSENCON ............................................................................. 81
High Speed DAC Circuits.............................................................. 40
Sequencer ........................................................................................ 83
High Speed DAC Output Signal Generation .......................... 40
Sequencer Features ..................................................................... 83
Power Modes of the High Speed DAC Core ........................... 40
Sequencer Overview .................................................................. 83
High Speed DAC Filter Options ............................................... 40
Sequencer Commands ............................................................... 83
High Speed DAC Output Attenuation Options ..................... 41
Sequencer Operation ................................................................. 85
High Speed DAC Excitation Amplifier ................................... 41
Sequencer and FIFO Registers ................................................. 87
Coupling an AC Signal from the High Speed DAC to the DC
Level Set by the Low Power DAC ............................................. 41 Waveform Generator...................................................................... 92
Waveform Generator Features .................................................. 92
Waveform Generator Operation .............................................. 92
Rev. 0 | Page 2 of 130
Data Sheet AD5940
Using the Waveform Generator with the Low Power DAC ..92 Digital Inputs/Outputs Operation ..........................................113
Waveform Generator Registers .................................................93 GPIO Registers ..........................................................................114
SPI Interface .....................................................................................96 System Resets .................................................................................117
Overview ......................................................................................96 Analog Die Reset Registers ......................................................117
SPI Pins .........................................................................................96 Power Modes .................................................................................118
SPI Operation ..............................................................................96 Active High Power Mode (>80 kHz) ......................................118
Command Byte............................................................................96 Active Low Power Mode (<80 kHz) .......................................118
Writing to and Reading from Registers ...................................96 Hibernate Mode ........................................................................118
Reading Data from the Data FIFO ...........................................97 Shutdown Mode ........................................................................118
Sleep and Wake-Up Timer .............................................................98 Low Power Mode ......................................................................118
Sleep and Wake-Up Timer Features .........................................98 Power Modes Registers ............................................................118
Sleep and Wake-Up Timer Overview .......................................98 Clocking Architecture ..................................................................121
Configuring a Defined Sequence Order ..................................98 Clock Features ...........................................................................121
Recommended Sleep and Wake-Up Timer Operation ..........98 Clock Architecture Registers ...................................................121
Sleep and Wake-Up Timer Registers ........................................99 Applications Information .............................................................125
Interrupts ....................................................................................... 103 EDA Bioimpedance Measurement Using a Low Bandwidth
Interrupt Controller Interupts ................................................ 103 Loop ............................................................................................125
Configuring the Interrupts ..................................................... 103 Body Impedance Analysis (BIA) Measurement Using a High
Bandwidth Loop........................................................................126
Custom Interrupts .................................................................... 103
High Precision Potentiosat Configuration ............................127
External Interrupt Configuration .......................................... 103
Using the AD5940, AD8232, and AD8233 for Bioimpedance
Interrupt Registers ................................................................... 104 and Electrocardiogram (ECG) Measurements .....................128
External Interrupt Configuration Registers ......................... 109 Smart Water/Liquid Quality AFE ...........................................129
Digital Inputs/Outputs ................................................................ 113 Outline Dimensions ......................................................................130
Digital Inputs/Outputs Features............................................. 113 Ordering Guide .........................................................................130
REVISION HISTORY
3/2019—Revision 0: Initial Version
VREF_2V5
RCAL0 VBIAS 0.92V INTERNAL
CE0 +
DUAL HP
RCAL1 AMP VBIAS PRECISION
–
OUTPUTS REFERENCE BUF
VZERO 12-BIT 16MHz/32MHz OSC
VBIAS0 RE0 VDAC REF 0.92V XTAL
BUF LP REF DRIVER POR
CE0
LPF0 LP
VZERO + 1.8V LP 1.8V HP BUF
LPTIA LDO LDO
SE0 –
RE0 RTIA0 MISO
VZERO0 RTIA0 GAIN 1/1.5/ fC = 50kHz/100kHz/ MOSI
SPI
SE0 2/4/9 250kHz 1.8V SCLK
SWITCH MATRIX
DE0 CS
RC0_0 RC0_1 AVDD/2 16-BIT ADC
BUF PGA BUF 160kSPS/
MUX
LOW BANDWIDTH AFE LOOP VDE0 AAF
RC0_0 VZERO0 400kSPS
RC0_1 VBIAS0 GPIO0
VREF_1V82 COARSE OFFSET GPIO1
RC0_2 RCF CORRECTION
+ DACP GPIO2
PGA
12-BIT
AIN0 DACN VDAC GPIO3
CE0 EXCITATION
AMPLIFIER P
VCE0 ADC FIFO
AIN1 LOOP VBIAS VRE0 WAVEFORM AND MMR GPIO4
AIN2 – N VZERO GENERATOR DFT GPIO5
AIN0
AIN3/BUF_VREF1V8 RE0 AINx GPIO6
VZERO 16MHz CLOCK DIGITAL COMMAND
AIN4/LPF0 OSC GENERATOR FILTERS GPIO7
+ FIFO
AIN6 RLOAD02 HPTIA
SE0 T – VREF_2V5/2
AFE1 32kHz WAKE-UP SEQUENCER
DE0 VREF_1V82 OSC TIMER DNC
AFE2 RLOAD03
AFE3 INTERRUPT DNC
RTIA2 TEMPERATURE GPIO CRC GENERATOR
AFE4 SENSOR DNC
HIGH BANDWIDTH AFE LOOP DIGITAL
VBIAS_CAP
AD5940
16778-001
DVD_REG_1V8 DGND DVDD RESET IOVDD
Figure 2.
GENERAL DESCRIPTION
The AD5940 is a high precision, low power analog front end (AFE) The current inputs include two TIAs with programmable gain
designed for portable applications that require high precision, and load resistors for measuring different sensor types. The first
electrochemical-based measurement techniques, such as amper- TIA, referred to as the low power TIA, measures low bandwidth
ometric, voltammetric, or impedance measurements. The signals. The second TIA, referred to as the high speed TIA,
AD5940 is designed for skin impedance and body impedance measures high bandwidth signals up to 200 kHz.
measurements, and works with the AD8233 AFE in a complete An ultralow leakage, programmable switch matrix connects the
bioelectric or biopotential measurement system. The AD5940 is sensor to the internal analog excitation and measurement blocks.
designed for electrochemical toxic gas sensing. This matrix provides an interface for connecting external RTIAs
The AD5940 consists of two high precision excitation loops and calibration resistors. The matrix can also be used to
and one common measurement channel, which enables a wide multiplex multiple electronic measurement devices to the same
capability of measurements of the sensor under test. The first wearable electrodes.
excitation loop consists of an ultra low power, dual output string, A precision 1.82 V and 2.5 V on-chip reference source is available.
digital-to-analog converter (DAC), and a low power, low noise The internal ADC and DAC circuits use this on-chip reference
potentiostat. One output of the DAC controls the noninverting source to ensure low drift performance for the 1.82 V and 2.5 V
input of the potentiostat, and the other output controls the peripherals.
noninverting input of the transimpedance amplifier (TIA). This
low power excitation loop is capable of generating signals from The AD5940 measurement blocks can be controlled via direct
dc to 200 Hz. register writes through the serial peripheral interface (SPI)
interface, or, alternatively, by using a preprogrammable sequencer,
The second excitation loop consists of a 12-bit DAC, referred to which provides autonomous control of the AFE chip. 6 kB of
as the high speed DAC. This DAC is capable of generating high static random access memory (SRAM) is partitioned for a deep
frequency excitation signals up to 200 kHz. data first in, first out (FIFO) and command FIFO. Measurement
The AD5940 measurement channel features a 16-bit, 800 kSPS, commands are stored in the command FIFO and measurement
multichannel successive approximation register (SAR) analog- results are stored in the data FIFO. A number of FIFO related
to-digital converter (ADC) with input buffers, a built in antialias interrupts are available to indicate when the FIFO is full.
filter, and a programmable gain amplifier (PGA). An input mux A number of general-purpose inputs/outputs (GPIOs) are
in front of the ADC allows the user to select an input channel available and are controlled using the AFE sequencer, which
for measurement. These input channels include multiple allows cycle accurate control of multiple external sensor devices.
external current inputs, external voltage inputs, and internal
channels. The internal channels allow diagnostic measurements The AD5940 operates from a 2.8 V to 3.6 V supply and is
of the internal supply voltages, die temperature, and reference specified over a temperature range of −40°C to +85°C. The
voltages. AD5940 is packaged in a 56-lead, 3.6 mm × 4.2 mm WLCSP
package.
SPECIFICATIONS
AVDD = DVDD = 2.8 V to 3.6 V; the maximum difference between supplies = 0.3 V; IOVDD = 1.8 V ± 10% and 2.8 V to 3.6 V; the ADC
reference, excitation, DAC, and amplifier = 1.82 V, internal reference; low power DAC reference = 2.5 V, internal reference; TA = −40°C to
+85°C, unless otherwise noted.
Table 1.
Parameter Symbol Min Typ Max Unit Test Conditions/Comments
BASIC ADC SPECIFICATIONS Pseudo differential mode measured relative to
ADC bias voltage (voltage on VBIAS_CAP pin,
1.11 V), unless otherwise noted; specifications
based on high speed mode, unless otherwise
noted; ADC voltage channel calibrated in
production with PGA gain = 1.5; AFE die clock
for the analog domain (ACLK) = 32 MHz or
16 MHz, unless otherwise noted
Data Rate 1 fSAMPLE 400 kSPS High speed mode; decimation factor = 4
200 kSPS Normal mode; decimation factor = 4
Resolution1 16 Bits Number of data bits
Integral Nonlinearity1 INL
Normal Mode −4 ±2.0 +4 LSB PGA gain = 1.5, 1.82 V internal reference,
1 LSB = 1.82 V ÷ 215 ÷ PGA gain
−5.6 ±2.0 +4.7 LSB PGA gain = 9, 1.82 V internal reference
Differential Nonlinearity1 DNL
Normal Mode −0.99 ±0.9 +2.5 LSB PGA gain = 1.5, 1.82 V internal reference; 1 LSB =
1.82 V ÷ 215 ÷ PGA gain, no missing codes
DC Code Distribution 2 ±6 LSB PGA gain = 1.5, low power mode, ADC input =
0.9 V; ADC output data rate = 200 kSPS; 1 LSB =
1.82 V ÷ 215
±6 LSB Input channel is low power TIA = 1 µA, RTIA =
512 kΩ, RLOAD = 10 Ω ADC output data rate =
200 kSPS
±6 LSB Input channel is high speed TIA = 1 µA, RTIA =
10 kΩ, RLOAD = 100 Ω ADC output data rate =
200 kSPS
ADC ENDPOINT ERRORS
Offset Error
Low Power Mode −600 ±200 +600 µV PGA gain = 1.5, low power mode, all channels
except AIN3
−620 ±200 +880 µV PGA gain = 1.5, AIN3 only
High Power Mode1, 3 −1.1 ±0.5 +1.4 mV PGA gain = 1.5
Drift1 ±3 µV/°C Using 1.82 V internal reference
Offset Matching ±2 LSB Matching compared to AIN3
Full-Scale Error −1000 ±400 +800 µV PGA gain = 1.5, Excluding internal channels and
AIN3; both negative and positive full scale;
error at both endpoints
-1000 1000 µV PGA gain = 1.5. AIN3 only
High Power Mode1,3 −2.2 ±0.9 +1.82 mV PGA gain = 1.5
Internal Channels 0.21 0.751 % of AVDD/2, DVDD/2, VBIAS_CAP, VREF_2V5,
full- VREF_1V82, AVDD_REG
scale
Gain Drift1 −3 ±1 +3 µV/°C Full-scale error drift minus offset error drift
Gain Error Matching ±3 LSB Mismatch from channel to channel
PGA Mismatch Error1 ADC offset and gain calibration with a gain
value of 1.5
PGA Gain = 1 to 1.5 −0.2 +0.1 +0.3 %
PGA Gain =1.5 to 2 −0.2 +0.1 +0.3 %
PGA Gain = 2 to 4 −0.3 +0.2 +0.8 %
PGA Gain = 4 to 9 −0.55 +0.2 +0.55 %
Table 4.
Parameter Time Unit Description
t1 190 ns maximum CS falling edge to MISO setup time
t2 5 ns minimum CS low to SCLK setup time
t3 40 ns minimum SCLK high time
t4 40 ns minimum SCLK low time
t5 62.5 ns minimum SCLK period
t6 27 ns maximum SCLK falling edge to MISO delay
t7 5 ns minimum MOSI to SCLK rising edge setup time
t8 5 ns minimum MOSI to SCLK rising edge hold time
t9 19 ns minimum SCLK falling edge to hold time CS
t10 80 ns minimum CS high time
tWK 22 μs typical AD5940 wake-up time (not shown in Figure 3)
t2 t3 t4 t5
t9
SCLK
t1 t6
MISO BIT 7 BIT 6 BIT 5 BIT 4 BIT 3 BIT 2 BIT 1 BIT 0 BIT 7 BIT 0 X BIT 7
t8
t7
16778-003
MOSI 7 6 5 4 3 2 1 0 7 7
AIN4/ AIN3/
B RCAL1 AFE1 AIN1 LPF0 BUF_VREF1V8 DE0 VZERO0 RC0_1
DVDD_
G DNC IOVDD GPIO7 XTALI XTALO GPIO4 DNC
REG_1V8
16778-005
DIGITAL REFERENCE
DNC = DO NOT CONNECT.
1.110518
–40 1.110516
1.110514
–50
1.110512
–60 1.110510
1.110508
–70 1.110506
1.110504
–80
1.110502
–90 1.110500
1.110498
–100 1.110496
16778-206
16778-209
10 100 1k 10k 100k 1M 10M 2.7 2.8 2.9 3.0 3.1 3.2 3.3 3.4 3.5 3.6
FREQUENCY (Hz) SUPPLY VOLTAGE (V)
Figure 5. Magnitude vs. Frequency, ADC 1.82 V Voltage Reference AC PSRR Figure 8. High Power Reference vs. Supply Voltage,
1.11 V Voltage Reference DC PSRR
0 1.820950
1.820948
–10
1.820946
–20
HIGH POWER REFERENCE (V)
1.820944
–30 1.820942
MAGNITUDE (dB)
1.820940
–40 1.820938
–50 1.820936
1.820934
–60
1.820932
–70 1.820930
1.820928
–80
1.820926
–90 1.820924
1.820922
16778-210
–100 2.7 2.8 2.9 3.0 3.1 3.2 3.3 3.4 3.5 3.6
16778-207
Figure 6. Magnitude vs. Frequency, Low Power 2.5 V Voltage Reference Figure 9. High Power Reference vs. Supply Voltage,
AC PSRR ADC 1.82 V Voltage Reference DC PSRR
2.49976 6
2.49974
2.49972 5
INPUT BIAS CURRENT (IBIAS) (pA)
2.49970
LOW POWER REFERENCE (V)
2.49968 4
2.49966
2.49964 3
2.49962
2.49960 2
2.49958
2.49956 1
2.49954
0
2.49952
2.49950
–1
2.49948
2.49946
16778-208
2.7 2.8 2.9 3.0 3.1 3.2 3.3 3.4 3.5 3.6 –2
16778-211
0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8 2.0 2.2 2.4
SUPPLY VOLTAGE (V)
RE0 PIN VOLTAGE (V)
Figure 7. Low Power Reference (2.5 V) vs. Supply Voltage, Figure 10. Low Power Potentiostat Input Bias Current (IBIAS) vs. RE0 Pin
DC PSRR Voltage
–20 0.1
–40
0
–60
–80 –0.1
–100
SE0 = 200mV –0.2
SE0 = 1100mV BOARD1 ERROR
–120 BOARD2 ERROR
SE0 = 2100mV
BOARD3 ERROR
–0.3
16778-214
–140
100k 300k 500k 800k 1M 2M 4M 8M 10M
16778-212
–40 25 60 85
IMPEDANCE (Ω)
TEMPERATURE (°C)
Figure 11. Low Power TIA Input Bias Current (IBIAS) vs. Temperature Figure 13. Electrodermal Activity (EDA) Measurement Relative Error
vs. Impedance
0
LOW POWER POTENTIOSTAT
–2
INPUT BIAS CURRENT (pA)
–4
–6
–8
–10
–12
–40 25 60 85
TEMPERATURE (°C)
C1 D EXCITATION
BUFFER
N
EXTERNAL
SENSOR P
MODEL
R1 R2 C2
R3
AD5940
+
T HSTIA
–
16778-103
Figure 14. High Speed Loop Connected to Sensor (R1, R2, and R3), C1 and C2 Represent Capacitance to Ground
THEORY OF OPERATION
The main blocks of the AD5940 are as follows: • Programmable switch matrix. The input switching of the
• Low power, dual-output, string DAC used to set the sensor AD5940 allows full configurability in the connections of
bias voltage and low frequency excitation. Supports the external sensors (see the Programmable Switch Matrix
chronoamperometric and voltammetry electrochemical section).
techniques. • Programmable sequencer (see the Sequencer section).
• Low power potentiostat that applies the bias voltage to the • SPI interface.
sensor. • Waveform generator designed to create sinusoid and
• Low power TIA that performs low bandwidth current trapezoid waveforms up to 200 kHz (see the Waveform
measurements. Generator section).
• High speed DAC and amplifier designed to generate • Interrupt sources that output to a GPIOx pin to alert the
excitation signals for impedance measurements up to host controller that an interrupt event occurred (see the
200 kHz. Interrupts).
• High speed TIA that supports wider signal bandwidth • Digital inputs/outputs (see the Digital Inputs/Outputs
measurements. section).
• High performance ADC circuit (see the High Performance
ADC Circuit section).
CONFIGURATION REGISTERS
Table 8. Configuration Registers Summary
Address Name Description Reset Access
0x00002000 AFECON AFE configuration register 0x00080000 R/W
0x000022F0 PMBW Power modes configuration register 0x00088800 R/W
Configuration Register—AFECON
Address 0x00002000, Reset: 0x00080000, Name: AFECON
SILICON IDENTIFICATION
The AD5940 contains a chip ID register and a hardware always equal to 0x4144. The CHIPID register contains the
revision register. device identifier (Bits[15:4] and silicon revision number
These registers can be read by software to allow users to (Bits[3:0]). The device identifier changes with silicon revision.
determine the revision of the silicon currently in use. ADIID is
IDENTIFICATION REGISTERS
Table 11. Identification Registers Summary
Address Name Description Reset Access
0x00000400 ADIID Analog Devices Inc., identification register 0x4144 R
0x00000404 CHIPID Chip identification register 0x5502 R
The main 6-bit string with the 6-bit subDAC provides the VBIAS0 LOW POWER DAC SWITCH OPTIONS
DAC output. In 12-bit mode, the MSBs select a resistor from the There are a number of switch options available that allow the
main string DAC. The top end of this resistor is selected as the user to configure the low power DAC for various modes of
top of the 6-bit subDAC, and the bottom end of the selected operation. These switches facilitate different use cases, such as
resistor is connected to the bottom of the 6-bit subDAC string, electrochemical impedance spectroscopy. Figure 15 shows the
as shown in Figure 16. available switches, labeled SW0 to SW4. These switches are
The resistor matching between the 12-bit and 6-bit DACs controlled either automatically via Bit 5 in the LPDACCON0
means 64 LSB12 (VBIAS0) is equal to one LSB6 (VZERO0). register, or individually via the LPDACSW0 register
The output voltage range is not rail to rail. Rather, it ranges When LPDACCON0, Bit 5, is cleared, the switches are configured
from 0.2 V to 2.4 V for the 12-bit output of the low power DAC. for normal mode. The SW2 switch and the SW3 switch are
Therefore, the LSB value of the 12-bit output (12-BIT_ closed and the SW0, SW1, and SW4 switches are open. When
DAC_LSB) is LPDACCON0, Bit 5, is set, the switches are configured for
diagnostic mode. The SW0 switch and the SW4 switch are
12-BIT_DAC_LSB = 2.2 V = 537.2 µV closed and the remaining switches are open. This feature is
212 − 1 designed for electrochemical use cases, such as continuous
The 6-bit output range is from 0.2 V to 2.366 V. This range is glucose measurement where, in normal mode, the low power
not 0.2 V to 2.4 V because there is a voltage drop across R1 in TIA measures the sense electrode. Then, in diagnostic mode,
the resistor string (see Figure 16). The LSB value of the 6-bit the high speed TIA measures the sense electrode. By switching
output (6-BIT_DAC_LSB) is the VZERO0 voltage output from the low power TIA to the high
speed TIA, the effective bias on the sensor, VBIAS0 − VZERO0, is
6-BIT_DAC_LSB = 12-BIT_DAC_LSB × 64 = 34.38 mV unaffected. Using the high speed TIA facilitates high bandwidth
To set the output voltage of the 12-bit DAC, write to measurements, such as impedance, ramp, and cyclic
LPDACDAT0, Bits[11:0]. To set the 6-bit DAC output voltage, voltammetry.
write to LPDACDAT0, Bits[17:12]. Use the LPDACSW0 register to control the switches individually.
LPDACSW0, Bit 5, must be set to 1. Then, each switch can be
individually controlled via LPDACSW0, Bits[4:0].
16778-007
HSTIA SW0
–
MAIN DAC
VREF_2.5V
TO TOP
2.4V MUX
TO BOTTOM
R1 MUX
2.366V TO TOP
MUX
63R1
TO BOTTOM SUB DAC
MUX
SET BY
MUX
TOP
TO TOP LPDACDAT0
MUX [5:0]
62R1 TO BOTTOM
MUX
61R1 63R2
12-BIT DAC
SELECTS 6MSBs 62R2
MAIN VIA VOLTAGE 12-BIT
6-BIT DAC ACROSS ONE DAC
OUTPUT DAC
STRING OF THE MAIN OUTPUT
(6-BITS) DAC RESISTORS
(LPDACDAT0DAT[11:6])
SET BY SET BY
LPDACDAT0 LPDACDAT0
[17:12] TO TOP [11:0]
MUX 2R2
TO BOTTOM
3R1 MUX
R2
TO TOP
MUX
TO BOTTOM
BOTTOM
2R1 MUX
MUX
TO TOP
MUX
1R1 TO BOTTOM
MUX
0.2V
16778-008
the selected 12-bit value does have a loading effect on the 6-bit
output that must be compensated for in user code, particularly
when the 12-bit output level is greater than the 6-bit output. RE0
SENSOR
When the 12-bit output is less than the 6-bit output,
12-Bit DAC Output Voltage = 0.2 V + (LPDACDAT0, +
MUX
Bits[11:0] × 12-BIT_LSB_DAC) SE0
LPTIA
–
6-Bit DAC Output Voltage = 0.2 V + (LPDACDAT0,
RTIA
Bits[17:12] × 6-BIT_LSB_DAC) – 12-BIT_LSB_DAC)
16778-009
When the 12-bit output is ≥ the 6-bit output,
12-Bit DAC Output Voltage = 0.2 V + (LPDACDAT0, Figure 17. Electrochemical Standard Configuration
Bits[11:0] × 12-BIT_LSB_DAC) Electrochemical Impedance Spectroscopy
6-Bit DAC Output Voltage = 0.2 V + (LPDACDAT0, In many electrochemical applications, there is significant value
Bits[17:12] × 6-BIT_LSB_DAC) in carrying out a diagnostic measurement. A typical diagnostic
Therefore, in user code, it is recommended to add the technique is to carry out an impedance measurement on the
following: sensor. For some sensor types, the dc bias on the sensor must be
maintained during the impedance measurement. The AD5940
12BITCODE = LPDACDAT0 [11:0];
facilitates this dc bias. To perform this measurement, set
6BITCODE = LPDACDAT0 [17:12]; LPDACCON0, Bit 5 = 1. VZERO0 voltage is set to the input of the
if (12BITCODE < (6BITCODE *64)) high speed TIA and the high speed DAC generates an ac signal.
LPDACDAT [11:0] = (12BITCODE – 1); The level of the ac signal is set via the VBIAS0 voltage output of
This code ensures that the 12-bit output voltage is equal to the the low power DAC, and the voltage on SE0 is maintained by
6-bit output voltage when LPDACDAT0, Bits[11:0] = 64 × VZERO0 voltage. The high speed DAC dc buffers must also be
LPDACDAT0, Bits[17:12]. enabled by setting AFECON, Bit 21.
LOW POWER DAC USE CASES Low Power DAC in 4-Wire Isolated Impedance
Measurements
Electrochemical Amperometric Measurement
For 4-wire isolated impedance measurements, such as body
In an electrochemical measurement, the 12-bit output sets the impedance measurements, a high frequency sinusoidal wave-
voltage on the reference electrode pin via the potentiostat circuit form is applied to the sensor via the high speed DAC. A common-
shown in Figure 17. The voltage on the CE0 pin and RE0 pin is mode voltage is set across the sensor using the low power DAC
referred to as VBIAS0. The 6-bit output sets the bias voltage on the 6-bit output voltage, VZERO, and the low power TIA. This config-
LPTIA_P node; this output sets the voltage on the sense uration sets the common-mode voltage between AIN2 and AIN3
electrode pin, SE0. This voltage is referred to as VZERO0. The bias (see Figure 18). To enable this common-mode voltage setup,
voltage on the sensor effectively becomes the difference SWMUX, Bit 3, must be set to 1. The VBIAS0 voltage output of
between the 12-bit output and the 6-bit output. the low power DAC also sets the common-mode voltage for the
high speed DAC excitation buffer.
HSDAC WAVEFORM
GAIN GENERATOR
RACCESS1 CISO1 RLIMIT CE0 D5
EXCITATION
BUFFER
N
P5 P
VBIAS
10MΩ
RACCESS4 CISO4 AIN3
ADC/
MUX
N2 800kHz DFT = 2048 FIFO
1.1V
+ HSTIA_P
RACCESS2 CISO2 AIN1 HSTIA
–
T2 T9
RTIA
16778-010
CTIA AD5940
Figure 18. Low Power DACs Used in a 4-Wire Impedance Measurement (HSTIA_P = Positive Output of High Speed TIA)
LPDACCON0 Register—LPDACCON0
Address 0x00002128, Reset: 0x00000002, Name: LPDACCON0
LPDACSW0[3] LPDACSW0[1]
SW12 SW13
RE0 LPBUF
SW10 LPDACSW0[2]
SW6
10kΩ 10kΩ
RE0
SW4
SW11 + LPTIA0_P
RLOAD _LPF0
LPTIA
SE0 SW5 SW9
– RLPF
LPTIACON0 SW7 LPTIACON0
[12:10] [15:13] ADC
RTIA MUX
SW1
LPTIACON0
[9:5]
FORCE/SENSE
RC0_0
SW0
RC0_1
ADCVBIAS_CAP (1.11V)
VZERO0
TSWFULLCON[4]
T5 HSTIA1 LPDACSW0[0]
SE0
TSWFULLCON[4]
T7 16778-220
1FOR DETAILS ON THE HSTIA, SEE THE HSTIA CIRCUITS CHAPTER OF THIS DOCUMENT.
Figure 19. Low Bandwidth Loop Switches
16778-015
(UP TO 600mV)
sensor are present for the high speed DAC output. The output of
VZERO0
the 12-bit DAC string is ±300 mV before any attenuation or
Figure 22. Sensor Excitation Signal
gain. At the DAC output, there is a gain stage of 1 or 0.2. At the
PGA stage, there are gain options of 2 or 0.25. Table 28 COUPLING AN AC SIGNAL FROM THE HIGH SPEED
describes the available gain options and the corresponding DAC TO THE DC LEVEL SET BY THE LOW POWER
output voltage ranges. DAC
HIGH SPEED DAC EXCITATION AMPLIFIER The AD5940 contains a low power potentiostat channel to
Figure 21 illustrates the operation of the excitation amplifier configure an electrochemical sensor. In normal operation, the
and its connection to the switch matrix. There are four inputs to bias voltage of the sensor between the RE0 and SE0 electrodes is
the excitation amplifier: DACP, DACN, positive (P), and set by the low power DAC outputs, VBIAS0 and VZERO0, where
negative (N). The high speed DAC is a differential output DAC VBIAS0 sets the bias to the potentiostat and the voltage on the
where the positive and negative inputs feed directly to the CE0 pin. VZERO0 sets the bias voltage on the low power TIA and the
excitation amplifier. The voltage difference between these two SE0 pin. The high speed DAC circuit is not used. However, for
outputs sets the peak-to-peak voltage on the output waveform. ac impedance measurements, the output of the excitation
The P and N inputs maintain the stability of the excitation amplifier must be connected to the CE0 pin. The potentiostat
amplifier by providing a feedback path from the sensor, and set must be disconnected so that the entire signal comes from the
the common-mode for the high speed DAC output. Under excitation amplifier output. The high speed TIA is connected to
normal circumstances, the common mode is set by the VZERO0 the SE0 pin and the low power TIA is disconnected. The sensor
output connected to the N input. There is also an option to bias must then be set by the high speed TIA and the excitation
apply a dc bias voltage to the sensor and couple an ac signal amplifier.
onto this bias, as shown in Figure 22. To set the sensor bias, take the following steps:
An option is available if the sensor requires a bias voltage 1. The VZERO0 output of the low power DAC must be
between the counter and sense electrode. VBIAS0 sets the voltage connected to the noninverting input of the high speed TIA
on the counter electrode (the common-mode voltage of the (HSTIACON, Bits[1:0] = 01), which sets the voltage on the
high speed DAC) and VZERO0 sets the voltage on the sense SE0 pin, or whichever pin is connected to the inverting
electrode. VZERO0 must be connected to the positive terminal on input of the high speed TIA via the switch matrix.
the high speed TIA (HSTIACON, Bits[1:0] = 01). The dc buffers 2. The DAC dc buffers must be enabled (AFECON, Bit 21 = 1).
of the DAC must also be enabled by setting AFECON, Bit 21. Figure 21 shows the connection of the dc buffers to the
With this configuration, a waveform can be achieved, as shown excitation amplifier. These buffers enable the low power
in Figure 22. The bias across the sensor is effectively the DAC outputs to drive the required bias voltage to the
difference between VBIAS0 and VZERO0. excitation amplifier and the high speed TIA.
Note that the high speed DAC signal chain must never be used 3. The dc bias is the difference between VBIAS0 and VZERO0.
in conjunction with the low power TIA. The high speed DAC AVOIDING INCOHERENCY ERRORS BETWEEN
can become unstable, leading to incorrect measurements. EXCITATION AND MEASUREMENT FREQUENCIES
DURING IMPEDANCE MEASUREMENTS
The following settings are recommended to avoid incoherency
R DACP
D + errors between excitation and measurement frequencies during
– 12-BIT
R DACN PGA DAC impedance measurements:
RCF
SWITCH MATRIX
16778-016
(NEGATIVE COMMON-MODE VOLTAGE
FULL SCALE) NEGATIVE FULL SCALE
Calibrate the high speed DAC with the required bit settings
(HSDACCON, Bit 12 and Bit 0). For example, if the DAC is Figure 23. High Speed DAC Transfer Function
calibrated with HSDACCON, Bit 12 = 0 and HSDACCON, The AD5940 software development kit includes sample
Bit 0 = 0, and the user changes HSDACCON, Bit 12 to 1, an functions that demonstrate how to use the ADC to measure the
offset error is introduced. Either the DACOFFSET register or differential voltage across the RCAL resistor and how to adjust the
DACOFFSETHS register must be recalibrated for the new appropriate calibration register until the differential voltage is
output range. ~0 V. The AD5940 software development kit is available for
download from the AD5940 product page.
PMBW[0] PMBW[0]
DACOFFSET 0 0 DACOFFSETATTEN
DACOFFSETHS 1 1 DACOFFSETATTENHS
VREF_1V82
G = 1 OR G = 0.2
HSDACCON[0]
fC = 50kHz/100kHz/ 1.0V
HSDACCON[0] 0 1 DACGAIN
250kHz
P
+
RCAL0 D EXCITATION HIGH SPEED HSDACDAT[11:0]
– PGA
AMP DAC
N RCF
0.2V
RCAL G = 1 OR 0.25 DAC CLK
HSDACCON
[12]
RCAL1 NEGATIVE NODE
ADC MEASURES
DIFFERENTIAL VOLTAGE
BETWEEN P-NODES AND
HSTIACON[1:0] N-NODES TO CALIBRATE DAC
SETS POSITIVE
VBIAS_CAP NODE
COMMON-MODE
(1.11V) VOLTAGE
MUX NEGATIVE
VZERO NODE ADC
MUX TO ADC
+
HSTIA
–
16778-017
to 200 kHz. NL
TR1
The output of the high speed TIA is connected to the main ADC T1 HIGH SPEED
TRANSIMPEDANCE
T2 AMPLIFIER
mux, where this output can be programmed as the ADC input
T3 HSTIA
channel. + OUTPUT
T4
Tx/TR1 –
This block is designed for impedance measurements in SWITCHES T5 HSRTIACON[3:0]
conjunction with the high speed DAC and excitation amplifier. RTIA
flexibility built into the input signal selection, gain resistor HSRTIACON[4]
selection, input load resistor selection, and common-mode RLOAD_DE0
RTIA_DE0
16778-018
SWITCH AND RLOAD
Input Signal Selection CONTROLLED BY
DE0RESCON[7:0]
The input signal options are as follows: Figure 25. High Speed TIA Switches
The SE0 input pin. External RTIA Selection
The AIN0, AIN1, AIN2, and AIN3/BUF_VREF1V8
The high speed TIA has the option of selecting an external gain
input pins.
resistor instead of the internal RTIA gain options. To perform this
The DE0 input pin, which has its own RLOAD/RTIA options
selection, connect one end of the resistor to the DE0 pin and
and is user programmable.
connect the other end to AIN0, AIN1, AIN2, or AIN3/
Gain Resistor Selection BUF_VREF1V8. The DE0 pin must be connected to the output
The gain resistor (RTIA) options are 50 Ω to 160 kΩ for the DE0 of the high speed TIA.
input, and 200 Ω to 160 kΩ for all other input pins. To use the DE0 pin for the external RTIA value, set the following
Load Resistor Selection register values:
DE0RESCON[7:0] DE0RESCON[7:0]
IN+
LSB SW–
MSB CNV
16778-019
IN–
Figure 27. ADC Core Block Diagram (IN+, REF, GND, and IN− are Internal Nodes)
VZERO
+
LPTIA0
SE0 – RLPF AIN4/
LPF0
RTIA
FRONT‐END
BUFFER ADC
+ PREBUFFER
HSTIA GAIN = 1/1.5/2/4/9
+
– – +
ADC INPUT MUX
–
16-BIT ADC POSTPROCESSING BLOCKS:
PGA SECOND- 800kSPS/ OFFSET/GAIN CALIBRATION,
RTIA 1600kSPS DIGITAL FILTERS (SINC3/SINC2)
ORDER
– ANTIALIAS –
VOLTAGE INPUTS: +
AIN0 TO AIN6 + FILTER
VOLTAGE INPUTS:
DE0, SE0, CE0, RE0, VZERO0,
VBIAS0
VOLTAGE INPUTS:
HIGH SPEED DAC
EXCITATION AMP,
POSITIVE AND
NEGATIVE NODES
VOLTAGE INPUTS:
INTERNAL CHANNELS:
TEMP SENSORS,
16778-229
INTERNAL VREFERENCES
POWER SUPPLY VOLTAGES
ADC MUX
16-BIT ADC HEX CODE
RTIA
0x8000 AIN4/
LPF0
16778-022
Figure 30. Low Power TIA Current Input Channel to the ADC
0x4000
SELECTING INPUTS TO ADC MUX
16778-021
0x0000
For optimum ADC operation, the following are the
0.2V 1.1V 2.0V recommended mux inputs based on measurement type:
Figure 29. Ideal ADC Transfer Function, Output Codes vs. Voltage Input
Voltage measurement
Calculate the input voltage, VIN, with the following equation: Positive mux select = CE0, RE0, SE0, DE0, and AINx
1.835 V ADCDAT 0x8000 Negative mux select = VBIAS_CAP pin
VIN = VBIAS _ CAP
PGA _ G 215 DC current measurement on low power TIA
Positive mux select = low-pass filter of low power TIA
where:
Negative mux select =LPTIA_N node
PGA_G is the PGA gain and is selectable as 1, 1.5, 2, 4, or 9.
AC or higher bandwidth current measurements on the low
ADCDAT is the raw ADC code in the ADCDAT register.
power TIA
VBIAS_CAP is the voltage of the VBIAS_CAP pin, typically
1.11 V. Positive mux select = LPTIA_P node
MUXSEL_N = LPTIA_N node
ADC LOW POWER CURRENT INPUT CHANNEL Current and impedance measurement on the high speed TIA
Figure 30 shows the low power TIA input current channel. The MUXSEL_P = positive high speed TIA input
ADC measures the output voltage of the low power TIA. MUXSEL_N = negative high speed TIA input
The positive inputs can be selected via ADCCON, Bits[5:0].
ADC POSTPROCESSING
The negative input is nominally selected to be the 1.11 V
reference source. Perform this selection by setting ADCCON, The AD5940 provides many digital filtering and averaging
Bits[12:8] = 01000 for VBIAS_CAP. options to improve signal-to-noise performance and overall
measurement accuracy. Figure 31 shows an overview of the
An optional programmable gain stage can be selected to amplify
postprocessing filter options.
the positive voltage input. The instrumentation amplifier is
enabled via AFECON, Bit 10. The gain setting is configured via The processing filter options include the following:
ADCCON, Bits[18:16]. Digital filtering (sinc2 or sinc3) and 50 Hz or 60 Hz power
The output of the gain stage goes through an antialias filter. The supply rejection.
cutoff frequency of the antialias filter is set by PMBW, Bits[3:2]. DFT used with impedance measurements to automatically
Set the cutoff frequency to suit the input signal bandwidth. calculate magnitude and phase values.
The ADC output code is calibrated with an offset and gain Programmable averaging of ADC results.
correction factor. This digital adjustment factor occurs Programmable statistics option for calculating mean and
automatically. The offset and gain correction register used variance automatically.
depends on the ADC input channel selected. Sinc3 Filter
See the Low Power TIA section for details on how to configure The input to the sinc3 filter is the raw ADC codes at a rate of
the RLOAD, RTIA, and RFILTER resistor values. The low power TIA 800 kHz (if the 16 MHz oscillator is selected) or 1.6 MHz (if the
output has a low-pass filter consisting of RFILTER and an external 32 MHz oscillator is selected). To enable the sinc3 filter, ensure that
capacitor connected to the AIN4/LPF0 pin. RFILTER is typically ADCFILTERCON, Bit 6 = 0. The filter decimation rate is
1 MΩ and the external capacitor is recommended to be 1 μF, programmable with options of 2, 4, or 5. It is recommended to
which provides a low cutoff frequency. use a decimation rate of 4.
The gain correction block is enabled by default and is not user
programmable.
DATAFIFO_SINC3
DATAFIFO_SINC2
DATAFIFO_VAR/
MEAN
STATISTICS
SINC3 FILTER ADC SINC2 FILTER STATSCON
MUX
50Hz/60Hz DATA
ADC OSR5/4/2 GAIN AND CONFIGURABLE
MUX
NOTCH [6:4]
OFFSET OSR FIFO
MUX
AFECON[15]
DFT
DATAFIFO_DFT
MUX
2 TO 16,384
POINT
1.6MHz DFTCON[21:20]
MUX
0.8MHz
AVG 2/4/8/16 DFTCON[7:4]
HANNING
ADCFILTER ADCFILTERCON ADCFILTER
CON[0] [15:14] CON[7] DFTCON[0]
16778-023
DFT_CORDIC
ADC Gain Calibration for the Low Power TIA Channel Register—ADCGNLPTIA
Address 0x0000228C, Reset: 0x00004000, Name: ADCGNLPTIA
ADC Gain Calibration Auxiliary Input Channel (PGA Gain = 1.5) Register—ADCGAINGN1P5
Address 0x00002270, Reset: 0x00004000, Name: ADCGAINGN1P5
The ADCGAINGN1P5 register provides gain calibration for the voltage input channels to the ADC, including the AINx channels.
HSDAC WAVEFORM
GAIN GENERATOR
TO CE0, RCAL0, Dx/DR0 EXCITATION
AFE1, AFE3, SE0, SWITCHES BUFFER
AIN0 TO AIN3/BUF_VREF1V8
P-NODE
FROM RCAL0,
CE0, SE0, DE0, RE0, Px/Pxx P
AFE1, AFE2, AFE3, SWITCHES N-NODE
AIN0 TO AIN3/BUF_VREF1V8
ADC MUX
VZERO0
FROM RCAL1, SE0, N
AFE3, Nx/Nxx
AIN0 TO AIN3/BUF_VREF1V8 SWITCHES
1.11V
+ HSTIA_P
FROM RCAL1, Tx/TR1 HSTIA
AIN0 TO AIN3/BUF_VREF1V8, SWITCHES –
RLOAD_SE0 , DE0, (CURRENT)
RLOAD_AFE3 , RLOAD_DE0
T9 T10
RTIA
RTIA_DE0
16778-233
CTIA
D3 EXCITATION BUFFER
AMPLIFIER LOOP
D4
Dx/DR0 SWITCHES
CE0 D5
N
AFE1 D6 P
D7
DSWFULLCON
D8 OR SWCON[3:0]
DR0
RCAL0
PL
PR0
RCAL1
P2
P3
Px/Pxx SWITCHES P4
RE0 P5 PSWFULLCON
OR SWCON[7:4]
AFE2 P6
SE0 P7
DE0 P8
AFE3 P9
P11
PL2 DVDD_REG_AD
P12
NL2
NR1
N1
N2
N3
N4
RLOAD_SE0
Nx/Nxx SWITCHES N5
NSWFULLCON
N6 OR SWCON[11:8]
RLOAD_AFE3
N7
N9
NL
TR1
T1
TSWFULLCON
T2 OR SWCON[15:12]
T3
HIGH SPEED
T4 TRANSIMPEDANCE
Tx/TR1 SWITCHES AMPLIFIER
T5
+
T6 TIA OUTPUT
T7 – HSRTIACON[3:0]
RTIA
AIN0 T9 HSRTIACON[12:5]
AIN1
AIN2
CTIA
AIN3
T10
HSRTIACON[4]
RTIA_DE0
RLOAD_DE0
DE0RTIACON[7:0]
SWITCH AND RELOAD
16778-024
CONTROLLED BY
DE0RESCON[7:0]
Figure 33. Switch Matrix Block Diagram—Switches Connecting to the High Speed DAC and High Speed TIA
AVDD
AIN3/BUF_VREF1V8
1.82V FOR
THERMISTOR
1.82V BUFSENCON[8]
ANALOG
LDO
VBIAS_CAP
BUFSENCON[2]
ULP
BUFFER
0.92V VREF_2V5
LP
BAND GAP 2.5V 0.47µF
REFERENCE
LP ADC FOR POTENTIOSTAT
BUFFER
1.82V
REFERENCE
FOR ADC
VOLTAGE REFERENCES
16778-135
BUFSENCON[5]
SEQUENCER
SEQUENCER FEATURES The number of commands executed by the sequencer can be
read from the SEQCNT register. Each time a command is read
The features of the AD5940 sequencer are as follows: from command memory and executed, the counter is increments
• Programmable for cycle accurate applications. by 1. Performing a write to the SEQCNT register resets the counter.
• Four separate command sequences. The sequencer calculates the cyclic redundancy check (CRC) of
• Large 6 kB SRAM to store sequences. all commands it executes. The algorithm used is the CRC-8, using
• FIFO for storing measurement results. the x8 + x2 + x + 1 polynomial. The CRC-8 algorithm performs
• Control via the wake-up timer, SPI command, or GPIO on 32-bit input data (sequencer instructions). Each 32-bit input
toggle. is processed in one clock cycle and the result is available
• Various interrupts from user maskable sources. immediately for reading by the host controller. The CRC value
can be read from the SEQCRC register. This register is reset by
SEQUENCER OVERVIEW the same mechanism as the command count, by writing to the
The role of the sequencer is to allow offloading of the low level SEQCNT register. The SEQCRC resets to a seed value of 0x01.
AFE operations from the external microcontroller and to SEQCRC is a read only register.
provide cyclic accurate control over the analog DSP blocks. The
SEQUENCER COMMANDS
sequencer handles timing critical operations without being
subject to system load. There are two types of commands that can be executed by the
sequencer: write commands and timer commands, which
In the AD5940, four sequences are supported by hardware.
includes wait commands and timeout commands.
These sequences can be stored in SRAM to easily switch between
different measurement procedures. Only one sequence can be Write Command
executed by the sequencer at a time. However, the user can Use a write instruction to write data into a register. The register
configure which sequences the sequencer executes and the address must lie between 0x00000000 and 0x000021FC.
order in which they are executed. Figure 35 shows the format of the instruction. The MSB is equal
The sequencer reads commands from the sequence that is to 1, which indicates a write command.
stored in the command memory and, depending on the In Figure 35, ADDR is the write address and data is the write
command, either waits a certain amount of time or writes a data to be written to the MMR. All write instructions finish within
value to a memory map register (MMR). The execution is one cycle.
sequential, with no branching. The sequencer cannot read
The address field is seven bits wide, allowing access to registers
MMR values or signals from the analog or DSP blocks.
from Address 0x0 to address 0x1FC in the AFE register block. All
To enable the sequencer, set the SEQEN bit in the SEQCON MMR accesses are 32 bits only. Byte and half word accesses are
register. Writing 0 to this bit disables the sequencer. forbidden. All accesses are implied write only. There is a direct
The rate at which the sequencer commands are executed is mapping between the address field and the MMR address. In
provided in the SEQWRTMR bits in the SEQCON register. Figure 35, ADDR corresponds to Bits[8:2] of the 16-bit MMR
When a write command is executed by the sequencer, the address.
sequencer performs the MMR write and then waits SEQWRTMR For example, when writing to the WGCON register directly
clock cycles before fetching the next command in the sequence. through the SPI interface, the address used is 0x2014. To write to
The effect is the same as a write command followed by a wait the same register using the sequencer, the address field must be
command. The main purpose of this setup is to reduce code 0b0000101 (Bits[8:2] of the address used by the external
size when generating arbitrary waveforms. The SEQWRTMR controller).
bits do not have any effect following a wait or timeout command.
The data field is 24 bits wide and only allows writing to the MMR
In addition to a single write command being followed by a wait bits, Bits[23:0]. It is not possible to write to the full 32 bits of the
command, multiple write commands can be executed in succession MMRs via the sequencer. However, Bits[31:24] are not used by
followed by a wait command. Any configuration can be set up any of the MMRs. Therefore, all assigned MMR bits can be
rapidly by the sequencer, regardless of the number of register written by the sequencer.
writes followed by a precisely executed delay.
The sequencer can also be paused by setting the SEQHALT bit
in the SEQCON register. This option applies to each function,
including FIFO operations, internal timers, and waveform
generation. Reads from the MMRs are allowed when the
sequencer is paused. This mode is intended for debugging
during software development.
Rev. 0 | Page 83 of 130
AD5940 Data Sheet
Timer Command the end of execution. These interrupts are cleared by writing to
There are two timer commands in the sequencer, with a the corresponding bits in the INTCCLR register. The current
separate hardware counter for each. value of the counter can be read by the host controller at any
time through the SEQTIMEOUT register.
The wait command introduces wait states in the sequencer
execution. After the programmed counter reaches 0, the The timeout counter is not reset when the sequencer execution
execution is resumed by reading the next command from is stopped as a result of a sequencer write command. However,
command memory. it is reset if the host controller writes a 0 to the SEQEN bit in the
SEQCON register. This reset applies to situations when the host
The timeout command starts a counter that operates independently
must abort the sequence.
of the sequencer flow. When the timer elapses, one of two
interrupts is generated: a sequence timeout error interrupt, The time unit for both timer commands is one ACLK period.
INTSEL17, or a sequence timeout finished interrupts, INTSEL16. For a clock frequency of 16 MHz, the timer resolution is 62.5 ns,
Both interrupts are configured in the INTCSELx registers. The and the maximum timeout is 67.1 sec. These values are true
sequence timeout finished interrupt is asserted at the end of the even if the SEQWRTMR bits in the SEQCON register are
timeout period. The sequence timeout error interrupt is asserted if, nonzero.
at the end of the timeout period, the sequencer does not reach
B31 B30 B29 B28 B27 B26 B25 B24 B23 B22 B21 B20 B19 B18 B17 B16 B15 B14 B13 B12 B11 B10 B9 B8 B7 B6 B5 B4 B3 B2 B1 B0
16778-026
BIT[31] BITS[30:24] BITS[23:0]
CMD ADDR DATA
Figure 35. Sequencer Write Command
B31 B30 B29 B28 B27 B26 B25 B24 B23 B22 B21 B20 B19 B18 B17 B16 B15 B14 B13 B12 B11 B10 B9 B8 B7 B6 B5 B4 B3 B2 B1 B0
0 1
16778-028
BITS[31:30] BITS[29:0]
CMD TIME
B31 B30 B29 B28 B27 B26 B25 B24 B23 B22 B21 B20 B19 B18 B17 B16 B15 B14 B13 B12 B11 B10 B9 B8 B7 B6 B5 B4 B3 B2 B1 B0
0 0
16778-027
BITS[31:30] BITS[29:0]
CMD TIME
Figure 37. Sequencer Wait Command
BOOT
POR MEASUREMENT MEASUREMENT
INITIALIZATION
HIBERNATE HIBERNATE •••
16778-029
2-BIT
16778-030
2-BIT
16778-031
WAVEFORM GENERATOR
The AD5940 implements a digital waveform generator for The sinusoid generator includes a programmable phase offset
generating sinusoid, trapezoid, and square waveforms. This controlled by the WGOFFSET register. When enabled, the phase
section describes how to use the waveform generator. accumulator is initialized with the contents of the phase offset
register. After the sinusoid generator starts, the phase increment
WAVEFORM GENERATOR FEATURES
is always positive.
The waveform generator features sine wave, trapezoid, and
square wave capabilities and can be used with the high speed Trapezoid Generator
DAC or the low power DAC. The definition of the trapezoid waveform is shown in Figure 43
SINE DC LEVEL 2
GENERATION
DC LEVEL 1
MUX
16778-034
FIRST SECOND
PERIOD PERIOD
16778-032
SINE SCALING COMMON-MODE generator with the low power DAC, which limits the bandwidth
GENERATION ADJUSTMENT
SPI INTERFACE
OVERVIEW COMMAND BYTE
The AD5940 provides an SPI interface to facilitate configuration The first byte sent from the host to the AD5940 in an SPI
and control by a host microcontroller. The host controller uses transaction is the command byte. The command byte specifies
the SPI to read from and write to memory, registers, and FIFOs. the SPI protocol used for the SPI transaction. The available
The AD5940 operate as a slave SPI device. commands are detailed in Table 125.
SPI PINS Table 125. SPI Commands
The SPI connections between the host and the AD5940 are CS, Command Value Description
SCLK, MOSI, and MISO. SPICMD_SETADDR 0x20 Set register address for SPI
transaction
Chip Select Enable
SPICMD_READREG 0x6D Specifies SPI transaction is a read
The host must connect the SPI slave enable signal to the CS input transaction
of the AD5940. To initiate an SPI transaction, the host drives SPICMD_WRITEREG 0x2D Specifies SPI transaction is a write
the CS signal low before the first SCLK rising edge and drives it transaction
high again after the last SCLK falling edge. The AD5940 ignores SPICMD_READFIFO 0x5F Command to read FIFO
the SCLK and MOSI signals of the SPI when the CS input is high. Two main SPI transaction protocols are available on the
SCLK AD5940: writing to and reading from registers and reading data
from the data FIFO.
SCLK is the serial clock driven by the host to the AD5940. The
maximum clock speed is 16 MHz. WRITING TO AND READING FROM REGISTERS
MOSI and MISO Writing to and reading from a register requires two SPI
transactions. The first transaction sets the register address. The
MOSI is the data input line driven from the host to the AD5940,
second transaction is the actual read or write to the required
and MISO is the data output from the AD5940 to the host. The
register. The following are the steps to write to a register:
MOSI signal and MISO signal are launched on the falling edge of
the SCLK signal and sampled on the rising edge of the SCLK 1. Write the command byte and configure the register
signal by the host and the AD5940, respectively. The MOSI address.
signal carries the data from the host to the AD5940. The MISO a. Drive CS low.
signal carries the returning read data fields from the AD5940 to b. Send 8-bit command byte: SPICMD_SETADDR.
the host during a read transaction. c. Send 16-bit address of register to read to or write
from.
SPI OPERATION
d. Pull CS high.
The host is the master of the SPI. The features and requirements 2. Write the data to the register.
of SPI operation are as follows: a. Drive CS low.
• SCLK is always slower than the system clock on the AD5940, b. Send 8-bit command byte: SPICMD_WRITEREG.
which is 16 MHz. c. Write either 16-bit or 32-bit data to the register.
• When the CS signal is brought low, a multiple of eight d. Bring CS high.
clock cycles must be generated by the host. 3. Read the data from the register.
• Transfers over the SPI slave are always byte aligned. a. Drive CS low.
• In every octet, the most significant bit (Bit 7) is transmitted b. Send 8-bit command byte: SPICMD_READREG.
and received first. c. Transmit a dummy byte on the SPI bus to initiate a
• If the CS signal is brought high at any time by the host, the read.
AD5940 is ready to accept new SPI transactions when the d. Read returning 16-bit or 32-bit data.
CS signal is brought low again by the host. The minimum e. Bring CS high.
time between CS going high and going low again is t10 (see
Table 4).
MOSI CMD ROFFSETA ROFFSETA ROFFSETA ROFFSETA ROFFSETB ROFFSETB ROFFSETB ROFFSETB ROFFSETC ROFFSETC ROFFSETC ROFFSETC ROFFSETC
16778-140
MISO SSTATUS0 SSTATUS1 SSTATUS2 SSTATUS3 SSTATUS4 SSTATUS5 SSTATUS6 RDATA3 A RDATA2 A RDATA1 A RDATA1 A0 RDATA3 B RDATA2 B RDATA1 B
SEQ2WUPx SEQ3WUPx
ORDER OF SEQUENCES REPEAT
Figure 45. Sleep and Wake-Up Timer Block Diagram
16778-148
SEQ0 SEQ1 SEQ2 SEQ3 SEQ1 SEQ2 SEQ3
SLEEP AND WAKE-UP TIMER OVERVIEW A B C D A B C
The sleep and wake-up timer block consists of a 20-bit timer Figure 47. Sequence Order Diagram
that counts down. The source clock is the 32 kHz, internal, low
frequency oscillator.
RECOMMENDED SLEEP AND WAKE-UP TIMER
OPERATION
SEQUENCE EXECUTION
Analog Devices recommends the following procedure when
HIBERNATE ACTIVE MODE HIBERNATE using the sleep and wake-up timer to optimize performance and
MODE MODE
power consumption:
SEQxWUPx SEQxSLEEPx 1. Disable the timer sleep function by setting PWRMOD,
TIME ELAPSES TIME ELAPSES
Bit 2 to 0. The sleep wake-up timer does not put the device
16778-044
PWRMOD[3]
SEQSLPEN = 1. AUTO SLEEP into hibernate mode. Instead, place the device in sleep
BY SEQUENCER COMMAND
Figure 46. Sleep and Wake-Up Timing Diagram mode by writing to the SEQTRG register at the end of the
sequence. This sleep mode optimizes power consumption.
When the timer elapses, the device wakes up and runs a 2. Enable the timer wakeup function by setting TMRCON,
sequence automatically. Up to eight sequences can run Bit 0 to 1.
sequentially. 3. Enable the sequencer to trigger sleep by setting PWRMOD,
When the timer elapses, the device returns to sleep. If the timer Bit 3 to 1 and the SEQSLPLOCK register to 0xA47E5.
elapses before the sequence completes execution, the remaining 4. Set the final sequence in CON, Bits[3:1]. If only one
commands in the sequence are ignored. Therefore, the user sequence is used, select that sequence.
code must ensure that the values in the SEQxSLEEPx registers 5. Write the sleep time and wake-up time to the SEQxSLEEPH,
are large enough to allow sequences to execute all commands. SEQxSLEEPL, SEQxWUPH, and SEQxWUPL registers.
It is recommended to use the wake-up timer to disable the 6. Configure the order in which sequences are triggered by
timer sleep function (PWRMOD, Bit 2 = 0) and use the using the SEQORDER register.
sequencer to enter hibernate mode. Set PWRMOD, Bit 3 = 1 to 7. Enable the timer by writing to CON, Bit 0 = 1.
enable the sequencer to put the device in hibernate mode.
INTERRUPTS
There are a number of interrupt options available on the AD5940. CUSTOM INTERRUPTS
These interrupts can be configured to toggle a GPIOx pin in Four custom interrupt sources are selectable by the user in
response to an interrupt event. INTCSELx, Bits[12:9]). These custom interrupts can generate
INTERRUPT CONTROLLER INTERUPTS an interrupt event by writing to the corresponding bit in the
The interrupt controller is divided into two blocks. Each block AFEGENINTSTA register. It is only possible to write to this
consists of an INTCSELx register and an INTCFLAGx register. register via the sequencer. Writing to the AFEGENINTSTA
The INTCPOL and INTCCLR registers are common to both register when using the SPI has no effect.
blocks. After an interrupt is enabled in the INTCSELx register, EXTERNAL INTERRUPT CONFIGURATION
the corresponding bit in the INTCFLAGx register is set. The Eight external interrupts are implemented on the AD5940.
available interrupt sources are shown in Table 134. The These external interrupts can be configured to detect any
INTCFLAGx interrupts can be configured to toggle a combination of the following types of events:
GPIOx pin in response to an interrupt event.
• Rising edge. The logic detects a transition from low to high
CONFIGURING THE INTERRUPTS and generates a pulse.
Before configuring the interrupt sources, the GPIOx pin must • Falling edge. The logic detects a transition from high to
be configured as the interrupt output. GPIO0, GPIO3, and low and generates a pulse.
GPIO6 can be configured for the INT0 output. GPIO4 and • Rising or falling edge. The logic detects a transition from
GPIO7 can be configured for the INT1 output. Refer to the low to high or high to low and generates a pulse.
Digital Port Multiplex section for more details. The user can • High level. The logic detects a high level. The interrupt line
program the polarity of the interrupt (rising or falling edge) in is held asserted until the external source deasserts.
the INTCPOL register. When an interrupt is triggered, the • Low level. The logic detects a low level. The interrupt line
selected GPIOx pin toggles to alert the host microcontroller is held asserted until the external source deasserts.
that an interrupt event has occurred. To clear an interrupt
source, write to the corresponding bit in the INTCCLR register. The external interrupt detection unit block allows an external
event to wake up the AD5940 when it is in hibernate mode.
DIGITAL INPUTS/OUTPUTS
DIGITAL INPUTS/OUTPUTS FEATURES Bit Toggle
The AD5940 features eight GPIO pins. The GPIOs are grouped The GP0 port has a corresponding bit toggle register, GP0TGL.
in one port, which is eight bits wide. Each GPIOx contains Using the bit toggle register, it is possible to invert one or more
multiple functions that are configurable by user code. GPIO data outputs without affecting other outputs within the
OUTPUT ENABLE port. Only the GPIOx pin that corresponds to the write data bit
GP0OEN
equal to 1 is toggled. The remaining GPIOs are unaffected.
Input/Output Data Output Enable
OUTPUT DATA The GP0 port has a data output enable register, GP0OEN, by
GP0OUT, GP0SET, GPIO
GP0CLR, GP0TGL which the data output path is enabled. When the data output
enable register bits are set, the values in GP0OUT are reflected
INPUT ENABLE
on the corresponding GPIOx pins.
GP0IEN
Interrupt Inputs
Each GPIOx pin can be configured to react to external events.
INPUT DATA These events can be detected and used to wake up the device or
16778-045
GP0IN
to trigger specific sequences. These events are configured in the
Figure 48. Digital Input/Output Diagram EIxCON register. Writing to the corresponding bit in the EICLR
register clears the interrupt flag. For further information, see
DIGITAL INPUTS/OUTPUTS OPERATION the Interrupts section.
Input/Output Pull-Up Enable
Interrupt Outputs
GPIO0, GPIO1, GPIO3, GPIO4, GPIO5, GPIO6, and GPIO7
The AD5940 has two external interrupts that can be mapped to
pins have pull-up resistors that are enabled or disabled using the
certain GPIOx pins (see the GP0CON register). When an
GP0PE register. Unused GPIOs must have the respective pull-up
interrupt occurs, the AD5940 sets the GPIOx pin high. When
resistors disabled to reduce power consumption.
the interrupt is cleared, the AD5940 brings the GPIOx pin low.
Input/Output Data Input These interrupts are configured in the interrupt controller
When the GPIOs are configured as inputs using the GP0IEN register (see the Interrupts section).
register, the GPIO input levels are available in the GP0IN register. Digital Port Multiplex
Input/Output Data Output The digital port multiplex block provides control over the GPIO
When the GPIOs are configured as outputs, the values in the functionality of the specified pins. These options are configured
GP0OUT register are reflected on the GPIOs. in the GP0CON register.
Bit Set GPIOx Control with the Sequencer
The GP0 port has a corresponding bit set register, GP0SET. Each GPIOx on the AD5940 can be controlled via the sequencer.
Using the bit set register, it is possible to set one or more GPIO This control allows syncing of external devices during timing
data outputs without affecting other outputs within the port. critical applications using a dedicated register, SYNCEXTDEVICE.
Only the GPIOx corresponding to the write data bit equal to 1 To control the GPIOs via this register, the GPIOx must first be
is set. The remaining GPIOs are unaffected. configured as an output in the GP0OEN register and sync must
Bit Clear be selected in the GP0CON register.
GPIO REGISTERS
Table 147. GPIO Registers Summary
Address Name Description Reset Access
0x00000000 GP0CON GPIO Port 0 configuration register 0x0000 R/W
0x00000004 GP0OEN GPIO Port 0 output enable register 0x0000 R/W
0x00000008 GP0PE GPIO Port 0 pull-up and pull-down enable register 0x0000 R/W
0x0000000C GP0IEN GPIO Port 0 input path enable register 0x0000 R/W
0x00000010 GP0IN GPIO Port 0 registered data input register 0x0000 R
0x00000014 GP0OUT GPIO Port 0 data output register 0x0000 R/W
0x00000018 GP0SET GPIO Port 0 data output set register 0x0000 W
0x0000001C GP0CLR GPIO Port 0 data out clear register 0x0000 W
0x00000020 GP0TGL GPIO Port 0 pin toggle register 0x0000 W
SYSTEM RESETS
The AD5940 provides the following reset sources: The host microcontroller can trigger a software reset to the
AD5940 by clearing SWRSTCON, Bit 0. It is recommends to
• External reset.
connect the RESET pin of the AD5940 to a GPIO pin on the
• POR.
host processor to give the controller control over hardware
• Software reset of the digital part of the device. The low
resets.
power PA and low power TIA circuitry is not reset.
The AD5940 reset status register is RSTSTA. Read this register
The AD5940 is reset during an external hardware reset or POR.
to identify the source of the reset to the chip.
The external reset or hardware reset is connected to the external
Software resets can be bypassed to ensure the circuits used to
RESET pin. When this pin is pulled low, a reset occurs. All
bias an external sensor are not disturbed. These circuits include
circuits and control registers return to their default state. the ultra low power DACs, power amplifier, and TIAs. The
programmable switches circuits can also be configured to
maintain their states in the event of a reset.
POWER MODES
There are four main power modes for the AD5940: active high the leakage from the ADC is reduced, which subsequently
power mode (>80 kHz), active normal mode (<80 kHz), reduces the current consumption in hibernate mode.
hibernate mode, and shutdown mode. Optionally, the low power DAC, reference, and amplifiers can
ACTIVE HIGH POWER MODE (>80 kHz) remain active to maintain the bias of an external sensor.
Active high power mode (>80 kHz) is recommended when However, current consumption increases.
generating or measuring high bandwidth signals >80 kHz. The SHUTDOWN MODE
32 MHz oscillator is selected to drive the high speed DAC and Shutdown mode is similar to hibernate, except the user is
ADC circuits to handle the high bandwidth signal. To enable expected to power-down the low power analog blocks.
high power mode, use the following sequence:
LOW POWER MODE
1. Write PMBW = 0x000D.
2. Set the system clock divider to 2 and set the ADC clock The AD5940 provides a feature for ultra low power applications,
divider to 1. such as EDA measurements. Various blocks can be powered
3. Switch the oscillator to 32 MHz. down simultaneously by writing to the LPMODECON register.
4. Set ADCFILTERCON, Bit 0 = 1 to enable a 1.6 MHz ADC Within the LPMODECON register, there are a number of bits
sample rate. corresponding to certain analog blocks. By setting these bits to
1, the corresponding piece of circuitry is powered down to save
ACTIVE LOW POWER MODE (<80 kHz) power. For example, writing 1 to LPMODECON, Bit 1, powers
Active low power mode (<80 kHz) is the default active state of down the high power reference.
the AD5940. The system clock is the 16 MHz internal oscillator The LPMODECON register features key protection. Before
(PWRMOD, Bits[1:0] = 0x1). accessing the register, the user must write 0xC59D6 to the
HIBERNATE MODE LPMODEKEY register.
When the AD5940 is in hibernate mode, the high speed clock Another feature that is useful in ultra low power applications is
circuits are powered down, resulting in all blocks being clocked the ability to switch system clocks to the 32 kHz oscillator using
when entering a low power, clock gated state. The 32 kHz oscillator the sequencer. To enable this feature, write 1 to LPMODECLKSEL,
remains active. The watchdog timer is also active. To place the Bit 0. The sequencer can then switch the system clocks to the
AD5940 in hibernate mode, write PWRMOD, Bits[1:0] = 0x2. It 32 kHz oscillator. The LPMODECLKSEL register is key
is recommended that PWRMOD, Bit 14 = 0. Bit 14 controls a protected by the LPMODKEY register.
power switch to the ADC block. When this switch is turned off,
CLOCKING ARCHITECTURE
CLOCK FEATURES An external clock input option on GPIOx. If the 32 MHz
clock is used, ensure that ADCCLKDIV, Bits[9:6] = 2 to
The AD5940 features the following clock options:
limit the ADC and digital die clock sources to 16 MHz.
A low frequency, 32 kHz internal oscillator (LFOSC).
At power-up, the internal high frequency oscillator is selected as
A high frequency, 16 MHz or 32 MHz internal oscillator
the AFE system clock with a 16 MHz setting. The user code can
(HFOSC). The 32 MHz setting only clocks the high speed
divide the clock by a factor of 1 to 32 to reduce power
DAC to output signals >80 kHz, especially for high
consumption.
frequency impedance measurements.
An external 16 MHz or 32 MHz crystal option. If the Note that the system performance is only validated with AFE
32 MHz crystal is used, ensure that ADCCLKDIV, Bits[9:6] = system clock rates of 32 MHz, 16 MHz, 8 MHz, and 4 MHz.
2 to limit the ADC and digital die clock sources to 16 MHz. The clock architecture diagram is shown in Figure 49.
Note that when using an external 32 MHz crystal, the ADC
clock divider function does not have any affect. The ADC
runs at 32 MHz, and the current consumption of the ADC
is increased.
AFECON[7]
ADC
AFEM
ADCCLK DIV
CLKCON0[9:6] INTC
CLKSEL[3:2] AFE_PCLK
MISC
AFECRC_CTL[0]
01 11 00 10 CRC
HF EXTERNAL 01
XTAL 16MHz/32MHz
11 AFE_SYSCLK SYSCLK DIV
CLKCON0[9:6]
EXT CLK 00
GPIO1 EXTCLK
10
AFE LF
INTERNAL
OSC 32kHz CLKEN0[1]
AFE WAKEUP
TIMER
CLKEN0[2]
16778-046
TIA CHOP
Clock Enable for Low Power TIA Chop and Wake-Up Timer—CLKEN0
Address 0x00000A70, Reset: 0x0004, Name: CLKEN0
APPLICATIONS INFORMATION
EDA BIOIMPEDANCE MEASUREMENT USING A accelerators calculates the real and imaginary values of the data.
LOW BANDWIDTH LOOP A high level block diagram is shown in Figure 50. An accurate
ac impedance value is then calculated. Using the low power
The AD5940 can be used for EDA measurements. This use case
mode features of the AD5940 can achieve an average current
requires an always on measurement with a typical sampling rate
consumption as low as 70 μA. For details, see the AN-1557
of 4 Hz and excitation signal of 100 Hz. The AD5940 uses the
Application Note.
low power DAC to generate the low frequency signal. The low
power TIA converts current to voltages, and the DFT hardware
Z
UNKNOWN SW10 PRECISION
REFERENCE
+
RFILTER LPTIA_LPF0
CISO2 LPTIA
SE0
–
VCEO
MUX
RTIA ADC/800kHz SINC3
LPTIA_N
DFT
LPF0
16778-047
FIFO
AD5940
Figure 50. Low Frequency, 2-Wire, Bioimpedance Loop (Maximum Bandwidth = 300 Hz)
WAVEFORM
GAIN HSDAC GENERATOR
D5
CISO1 RLIMIT CE0
EXCITATION
BUFFER
N
P5
P
F+
VBIAS
16MHz
AIN4/ OSC
CLPF LPF0 VCM
BODY
10MΩ
ADC/
MUX
CTIA
16778-052
AD5940
Figure 51. High Frequency, 4-Wire, Bioimpedance Loop (Maximum Bandwidth = 200 kHz)
VZERO
VBIAS LPDAC0
P11
SEQUENCER
SENSOR
16MHz
N2 OSC
VZERO
+
AIN1 HSTIA
ADC/
MUX
– FIFO
800kHz
T2 T9
RTIA
IVS
16778-049
AD5940
VBIAS0 VZERO0
AIN1
EXCITATION
BUFFER VREF2V5
CISO RLIMIT
CE0 HSDAC
LP DUAL
E1 CE0 OUTPUT
AIN0 DAC
RLIMITECG
RE0 LP RF = 0Ω
AMP
LPTIA AIN4
CISOBIA 10MΩ
AIN3
E3
RLIMIT
ECG AIN1 ADC
AIN0 AAF
COARSE
CISO VBIAS OFFSET
RLIMIT HSTIA CORRECTION
AIN1
E4
RTIA
BIA
AD5940
16778-050
CTIA
BIA
RLIMIT
ECG
Figure 53. Body Composition and ECG System Solution Using the AD5940 with the AD8232 and the AD8233
WAVEFORM
GAIN HSDAC GENERATOR
CE0
EXCITATION
BUFFER
RE0
VBIAS SEQUENCER
VZERO LPDAC0
CONDUCTIVITY 16MHz
OSC
VZERO
+
HSTIA HSTIA
– ADC/
MUX
800kHz FIFO
AIN0
pH LEVEL
ADA469x
AIN1
16778-051
OXIDATION/ AD5940
REDUCTION
OUTLINE DIMENSIONS
4.200
4.160
4.120
8 7 6 5 4 3 2 1
A
BALL A1
IDENTIFIER B
C
3.600
2.40 REF D
3.560
3.520 E
G
0.40
BSC
TOP VIEW 0.40 BOTTOM VIEW
(BALL SIDE DOWN) (BALL SIDE UP)
BSC
2.80 REF
0.320
0.550 0.305
0.505 END VIEW 0.290
0.460 COPLANARITY
0.05
0.287
04-06-2018-A
SEATING 0.230
PLANE
PKG-005910
0.267 0.200
0.247 0.170
ORDERING GUIDE
Model 1 Temperature Range Package Description Package Option
AD5940BCBZ-RL −40°C to +85°C 56-Ball Wafer Level Chip Scale Package [WLCSP] CB-56-3
AD5940BCBZ-RL7 −40°C to +85°C 56-Ball Wafer Level Chip Scale Package [WLCSP] CB-56-3
EVAL-AD5940BIOZ Bioelectric Evaluation Board
EVAL-AD5940ELCZ Electrochemical Evaluation Board
1
Z = RoHS Compliant Part.