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    Requisition Form XPS

    Uploaded by

    Chandan
    XPS

    Copyright:

    © All Rights Reserved
    Download as PDF, TXT or read online from Scribd

    Requisition Form XPS

    Uploaded by

    Chandan
    7 views2 pages
    XPS

    Original Title

    Requisition_Form_XPS

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    © © All Rights Reserved

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    PDF, TXT or read online from Scribd

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    XPS

    Copyright:

    © All Rights Reserved
    Download as PDF, TXT or read online from Scribd
    Download as pdf or txt
    7 views2 pages

    Requisition Form XPS

    Uploaded by

    Chandan
    XPS

    Copyright:

    © All Rights Reserved
    Download as PDF, TXT or read online from Scribd
    Download as pdf or txt
    of 2

    Requisition Form for XPS Measurements

    CENTRAL RESEARCH FACILITY


    Indian Institute of Technology (ISM) Dhanbad
    Dhanbad-826004

    No.: Date of submission:


    IMPORTANTNOTES:
    i. Samples in the form of powder or gel or those which can degas in ultra-high vacuum will strictly not be allowed.
    Sample(s) should not contain radioactive isotopes.
    ii. There will be a vacuum check of samples prior to loading inside the XPS chamber. The sample(s) must be handed over
    to the lab in the previous evening for vacuum check.
    iii. The sample composition and its preparation should be mentioned.

    1. User’s Profile
    Name of the User: ______________________________________ Tel. / Mob. No.: _____________
    Admission No./Emp.Code : _____________ Department / Centre: ____________________________
    Name of the supervisor:____________________________________________________
    Name of the Institute / College /R&D Lab/ Industry____________________________________________________
    1a. Category(Please tick any)

    Category I: (Internal Users)


    Category II: (Users from Academic Institution)
    Category III (Users from Government funded National laboratory)
    Category IV (Users from industry or private laboratory)
    2. Brief description of the samples(s) to be measured
    Composition/Formula: _____________________ No. of samples to be measured:____

    Form (please tick): Solid (bulk) Pellet Thin Film

    Method of Preparation (in brief):

    3. Desired Options (please tick)


    a. Surface cleaning by sputtering: Yes No
    b. Mode:
    Surface Depth Profile/ Maximum depth = _____ nm
    Survey (XPS)
    Angle-Resolved Line (line analysis) / Map (mapping)/*Charge
    XPS Neutralization

    c. Element‐specific Scan: Yes Elements: __________________________________ No

    __________________________________________________________________________________________
    Details of analysis Charges:
    The estimated charge for the work ₹ ………… (In words … … … … … … … … … … … … … … … … …
    …………………..) has been deposited through †DD (Number ………………..) /†Cash payment in the IIT (ISM)
    Dhanbad Cash counter (Receipt No. …………………) on ……………….. (date) /
    OR
    To be debited from (For internal users only: PDA/PDF/Project): … … … … … … … … …. ….

    †
    Please provide the original DD / CC of cash receipt along with this form.

    Signature of the User /Faculty /Supervisor /PI


    For Official Use Only

    To be filled up at the XPS Laboratory

    Name of the Operator: ______________________________________________


    Date of analysis: ______________________________________________
    Online Payment details: ______________________________________________
    Total number of hours: ______________________________________________
    Vacuum check status : ______________________________________________
    Data collection details, Name of
    person, Date/time
    ______________________________________________
    If any measurement problem should
    be report ______________________________________________

    Signature of the Operator

    N.B.:
    1. Users are advised to submit a hard copy of the form in the XPS lab.
    2. Please collect the sample, data of the completed scans will be copied on to a new CD.
    3. The user will be informed about the date and time of experiment via e‐mail/phone. He/she is expected to be
    present in the lab during the measurement.

    * Charge Neutralization: For Non -Conducting Sample

    Faculty In-charge
    XPS

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