GAL16LV8: Features Functional Block Diagram
GAL16LV8: Features Functional Block Diagram
GAL16LV8: Features Functional Block Diagram
Features
HIGH PERFORMANCE E2CMOS TECHNOLOGY 3.5 ns Maximum Propagation Delay Fmax = 250 MHz 2.5 ns Maximum from Clock Input to Data Output UltraMOS Advanced CMOS Technology 3.3V LOW VOLTAGE 16V8 ARCHITECTURE JEDEC-Compatible 3.3V Interface Standard 5V Compatible Inputs I/O Interfaces with Standard 5V TTL Devices (GAL16LV8C) ACTIVE PULL-UPS ON ALL PINS (GAL16LV8D Only) E CELL TECHNOLOGY Reconfigurable Logic Reprogrammable Cells 100% Tested/100% Yields High Speed Electrical Erasure (<100ms) 20 Year Data Retention EIGHT OUTPUT LOGIC MACROCELLS Maximum Flexibility for Complex Logic Designs Programmable Output Polarity PRELOAD AND POWER-ON RESET OF ALL REGISTERS 100% Functional Testability APPLICATIONS INCLUDE: Glue Logic for 3.3V Systems DMA Control State Machine Control High Speed Graphics Processing Standard Logic Speed Upgrade ELECTRONIC SIGNATURE FOR IDENTIFICATION
2
GAL16LV8
Low Voltage E2CMOS PLD Generic Array Logic
8 I 8 I
OLMC
I/O/Q
OLMC
I/O/Q
OLMC
I/O/Q
OLMC
I/O/Q
OLMC
I/O/Q
OLMC
I/O/Q
I 8 I 8 I
OLMC
OE
OLMC
I/O/Q
I/O/Q
I/OE
Description
The GAL16LV8D, at 3.5 ns maximum propagation delay time, provides the highest speed performance available in the PLD market. The GAL16LV8C can interface with both 3.3V and 5V signal levels. The GAL16LV8 is manufactured using Lattice Semiconductor's advanced 3.3V E2CMOS process, which combines CMOS with Electrically Erasable (E2) floating gate technology. High speed erase times (<100ms) allow the devices to be reprogrammed quickly and efficiently. The 3.3V GAL16LV8 uses the same industry standard 16V8 architecture as its 5V counterpart and supports all architectural features such as combinatorial or registered macrocell operations. Unique test circuitry and reprogrammable cells allow complete AC, DC, and functional testing during manufacture. As a result, Lattice Semiconductor delivers 100% field programmability and functionality of all GAL products. In addition, 100 erase/write cycles and data retention in excess of 20 years are specified.
Pin Configuration
PLCC
I I 2 I I I I I 8 14 9 I GND 11 I/OE I/O/Q 13 I/O/Q 6 4 I/CLK Vcc 20 18 I/O/Q I/O/Q I/O/Q
GAL16LV8
Top View
16
Copyright 1997 Lattice Semiconductor Corp. All brand or product names are trademarks or registered trademarks of their respective holders. The specifications and information herein are subject to change without notice.
LATTICE SEMICONDUCTOR CORP., 5555 Northeast Moore Ct., Hillsboro, Oregon 97124, U.S.A. Tel. (503) 268-8000; 1-800-LATTICE; FAX (503) 268-8556; http://www.latticesemi.com
December 1997
16lv8_04
Specifications GAL16LV8
GAL16LV8 Ordering Information
Commercial Grade Specifications
Tpd (ns) 3.5 5 7.5 10 15 Tsu (ns) 3 4 6 7 12 Tco (ns) 2.5 3 5 7 10 Icc (mA) 70 70 65 65 65 Ordering # GAL16LV8D-3LJ GAL16LV8D-5LJ GAL16LV8C-7LJ GAL16LV8C-10LJ GAL16LV8C-15LJ Package 20-Lead PLCC 20-Lead PLCC 20-Lead PLCC 20-Lead PLCC 20-Lead PLCC
GAL16LV8D Device Name GAL16LV8C Speed (ns) L = Low Power Power Grade Blank = Commercial
Package J = PLCC
Specifications GAL16LV8
Output Logic Macrocell (OLMC)
The following discussion pertains to configuring the output logic macrocell. It should be noted that actual implementation is accomplished by development software/hardware and is completely transparent to the user. There are three global OLMC configuration modes possible: simple, complex, and registered. Details of each of these modes are illustrated in the following pages. Two global bits, SYN and AC0, control the mode configuration for all macrocells. The XOR bit of each macrocell controls the polarity of the output in any of the three modes, while the AC1 bit of each of the macrocells controls the input/output configuration. These two global and 16 individual architecture bits define all possible configurations in a GAL16LV8. The information given on these architecture bits is only to give a better understanding of the device. Compiler software will transparently set these architecture bits from the pin definitions, so the user should not need to directly manipulate these architecture bits. The following is a list of the PAL architectures that the GAL16LV8 can emulate. It also shows the OLMC mode under which the GAL16LV8 emulates the PAL architecture.
PAL Architectures Emulated by GAL16LV8 16R8 16R6 16R4 16RP8 16RP6 16RP4 16L8 16H8 16P8 10L8 12L6 14L4 16L2 10H8 12H6 14H4 16H2 10P8 12P6 14P4 16P2 GAL16LV8 Global OLMC Mode Registered Registered Registered Registered Registered Registered Complex Complex Complex Simple Simple Simple Simple Simple Simple Simple Simple Simple Simple Simple Simple
Registered ABEL CUPL LOG/iC OrCAD-PLD PLDesigner TANGO-PLD P16V8R G16V8MS GAL16V8_R "Registered"1 P16V8R2 G16V8R
1) Used with Configuration keyword. 2) Prior to Version 2.0 support. 3) Supported on Version 1.20 or later.
Specifications GAL16LV8
Registered Mode
In the Registered mode, macrocells are configured as dedicated registered outputs or as I/O functions. Architecture configurations available in this mode are similar to the common 16R8 and 16RP4 devices with various permutations of polarity, I/O and register placement. All registered macrocells share common clock and output enable control pins. Any macrocell can be configured as registered or I/ O. Up to eight registers or up to eight I/Os are possible in this mode. Dedicated input or output functions can be implemented as subsets of the I/O function. Registered outputs have eight product terms per output. I/Os have seven product terms per output. The JEDEC fuse numbers, including the User Electronic Signature (UES) fuses and the Product Term Disable (PTD) fuses, are shown on the logic diagram on the following page.
CLK
Registered Configuration for Registered Mode - SYN=0. - AC0=1. - XOR=0 defines Active Low Output. - XOR=1 defines Active High Output. - AC1=0 defines this output configuration. - Pin 1 controls common CLK for the registered outputs. - Pin 11 controls common OE for the registered outputs. - Pin 1 & Pin 11 are permanently configured as CLK & OE for registered output configuration.
Q Q
XOR
OE
Combinatorial Configuration for Registered Mode - SYN=0. - AC0=1. - XOR=0 defines Active Low Output. - XOR=1 defines Active High Output. - AC1=1 defines this output configuration. - Pin 1 & Pin 11 are permanently configured as CLK & OE for registered output configuration.
XOR
Note: The development software configures all of the architecture control bits and checks for proper pin usage automatically.
Specifications GAL16LV8
Registered Mode Logic Diagram
PLCC Package Pinout
1
0 4 8 12 16 20
24
28
2128 PTD
0000
OLMC
0224
19
2
0256
XOR-2048 AC1-2120
OLMC
0480
18
3
0512
XOR-2049 AC1-2121
OLMC
0736
17
4
0768
XOR-2050 AC1-2122
OLMC
0992
16
5
1024
XOR-2051 AC1-2123
OLMC
1248
15
6
1280
XOR-2052 AC1-2124
OLMC
1504
14
7
1536
XOR-2053 AC1-2125
OLMC
1760
13
8
1792
XOR-2054 AC1-2126
OLMC
2016
12
9
2191
XOR-2055 AC1-2127
OE
11
SYN-2192 AC0-2193
Specifications GAL16LV8
Complex Mode
In the Complex mode, macrocells are configured as output only or I/O functions. Architecture configurations available in this mode are similar to the common 16L8 and 16P8 devices with programmable polarity in each macrocell. Up to six I/Os are possible in this mode. Dedicated inputs or outputs can be implemented as subsets of the I/O function. The two outer most macrocells (pins 12 & 19) do not have input capability. Designs requiring eight I/Os can be implemented in the Registered mode. All macrocells have seven product terms per output. One product term is used for programmable output enable control. Pins 1 and 11 are always available as data inputs into the AND array. The JEDEC fuse numbers including the UES fuses and PTD fuses are shown on the logic diagram on the following page.
Combinatorial I/O Configuration for Complex Mode - SYN=1. - AC0=1. - XOR=0 defines Active Low Output. - XOR=1 defines Active High Output. - AC1=1. - Pin 13 through Pin 18 are configured to this function.
XOR
Combinatorial Output Configuration for Complex Mode - SYN=1. - AC0=1. - XOR=0 defines Active Low Output. - XOR=1 defines Active High Output. - AC1=1. - Pin 12 and Pin 19 are configured to this function.
XOR
Note: The development software configures all of the architecture control bits and checks for proper pin usage automatically.
Specifications GAL16LV8
Complex Mode Logic Diagram
PLCC Package Pinout
1
2128
0
0000
12
16
20
24
28
PTD
OLMC
0224
19
2
0256
XOR-2048 AC1-2120
OLMC
0480
18
3
0512
XOR-2049 AC1-2121
OLMC
0736
17
4
0768
XOR-2050 AC1-2122
OLMC
0992
16
5
1024
XOR-2051 AC1-2123
OLMC
1248
15
6
1280
XOR-2052 AC1-2124
OLMC
1504
14
7
1536
XOR-2053 AC1-2125
OLMC
1760
13
8
1792
XOR-2054 AC1-2126
OLMC
2016
12
XOR-2055 AC1-2127
11
2191
SYN-2192 AC0-2193
Specifications GAL16LV8
Simple Mode
In the Simple mode, macrocells are configured as dedicated inputs or as dedicated, always active, combinatorial outputs. Architecture configurations available in this mode are similar to the common 10L8 and 12P6 devices with many permutations of generic output polarity or input choices. All outputs in the simple mode have a maximum of eight product terms that can control the logic. In addition, each output has programmable polarity. Pins 1 and 11 are always available as data inputs into the AND array. The center two macrocells (pins 15 & 16) cannot be used as input or I/O pins, and are only available as dedicated outputs. The JEDEC fuse numbers including the UES fuses and PTD fuses are shown on the logic diagram.
Vcc
Combinatorial Output with Feedback Configuration for Simple Mode - SYN=1. - AC0=0. - XOR=0 defines Active Low Output. - XOR=1 defines Active High Output. - AC1=0 defines this configuration. - All OLMC except pins 15 & 16 can be configured to this function.
XOR
XOR
- SYN=1. - AC0=0. - XOR=0 defines Active Low Output. - XOR=1 defines Active High Output. - AC1=0 defines this configuration. - Pins 15 & 16 are permanently configured to this function.
Dedicated Input Configuration for Simple Mode - SYN=1. - AC0=0. - XOR=0 defines Active Low Output. - XOR=1 defines Active High Output. - AC1=1 defines this configuration. - All OLMC except pins 15 & 16 can be configured to this function.
Note: The development software configures all of the architecture control bits and checks for proper pin usage automatically.
Specifications GAL16LV8
Simple Mode Logic Diagram
PLCC Package Pinout
1
2128
0
0000
12
16
20
24
28
PTD
OLMC
XOR-2048 AC1-2120
19
0224
2
0256
OLMC
XOR-2049 AC1-2121
18
0480
3
0512
OLMC
XOR-2050 AC1-2122
17
0736
4
0768
OLMC
XOR-2051 AC1-2123
16
0992
5
1024
OLMC
XOR-2052 AC1-2124
15
1248
6
1280
OLMC
XOR-2053 AC1-2125
14
1504
7
1536
OLMC
XOR-2054 AC1-2126
13
1760
8
1792
OLMC
XOR-2055 AC1-2127
12 11
2016
2191
SYN-2192 AC0-2193
Specifications GAL16LV8D
Absolute Maximum Ratings(1)
Supply voltage VCC ................................... 0.5 to +4.6V Input voltage applied ................................ 0.5 to +5.6V I/O voltage applied ................................... 0.5 to +4.6V Off-state output voltage applied ............... 0.5 to +4.6V Storage Temperature ................................ 65 to 150C Ambient Temperature with Power Applied ........................................ 55 to 125C
1.Stresses above those listed under the Absolute Maximum Ratings may cause permanent damage to the device. These are stress only ratings and functional operation of the device at these or at any other conditions above those indicated in the operational sections of this specification is not implied (while programming, follow the programming specifications).
DC Electrical Characteristics
Over Recommended Operating Conditions (Unless Otherwise Specified) SYMBOL PARAMETER Input Low Voltage Input High Voltage I/O High Voltage CONDITION MIN. Vss 0.3 2.0 2.0 0V VIN VIL (MAX.) (Vcc-0.2)V VIN VCC Vcc VIN 5.25V Vcc VIN 4.6V IOL = MAX. Vin = VIL or VIH IOL = 500A Vin = VIL or VIH 2.4 Vcc-0.2V VCC = 3.3V VOUT = 0.5V TA= 25C 15 TYP.3 MAX. 0.8 5.25 Vcc+0.5 100 10 10 20 0.4 0.2 8 8 80 UNITS V V V A A A mA V V V V mA mA mA
Input or I/O Low Leakage Current Input or I/O High Leakage Current Input High Leakage Current I/O High Leakage Current
IOH = MAX. Vin = VIL or VIH IOH = -100A Vin = VIL or VIH
Low Level Output Current High Level Output Current Output Short Circuit Current
VIL = 0V VIH = 3.0V Unused Inputs at VIL ftoggle = 1MHz Outputs Open
45
70
mA
1) The leakage current is due to the internal pull-up resistor on all pins. See Input Buffer section for more information. 2) One output at a time for a maximum duration of one second. Vout = 0.5V was selected to avoid test problems caused by tester ground degradation. Characterized but not 100% tested. 3) Typical values are at Vcc = 3.3V and TA = 25 C
10
Specifications GAL16LV8D
AC Switching Characteristics
Over Recommended Operating Conditions
COM PARAMETER COM
TEST COND1. A A A
DESCRIPTION Input or I/O to Combinational Output Clock to Output Delay Clock to Feedback Delay Setup Time, Input or Feedback before Clock Hold Time, Input or Feedback after Clock Maximum Clock Frequency with External Feedback, 1/(tsu + tco) Maximum Clock Frequency with Internal Feedback, 1/(tsu + tcf) Maximum Clock Frequency with No Feedback Clock Pulse Duration, High Clock Pulse Duration, Low Input or I/O to Output Enabled OE to Output Enabled Input or I/O to Output Disabled OE to Output Disabled 1 1 3 0
-3
-5 UNITS
3.5 2.5 2
1 1 4 0 142.8
5 3 2
ns ns ns ns ns MHz
180
fmax4
A A
200 250
166 166
MHz MHz
B B C C
2 2
3 3
6 5 6 5
ns ns ns ns ns ns
Refer to Switching Test Conditions section. Minimum values for tpd and tco are not 100% tested but established by characterization. Calculated from fmax with internal feedback. Refer to fmax Descriptions section. Refer to fmax Descriptions section. Characterized but not 100% tested.
11
Specifications GAL16LV8C
Absolute Maximum Ratings(1)
Supply voltage VCC ................................... 0.5 to +5.6V Input voltage applied ................................ 0.5 to +5.6V Off-state output voltage applied ............... 0.5 to +5.6V Storage Temperature ................................ 65 to 150C Ambient Temperature with Power Applied ........................................ 55 to 125C
1.Stresses above those listed under the Absolute Maximum Ratings may cause permanent damage to the device. These are stress only ratings and functional operation of the device at these or at any other conditions above those indicated in the operational sections of this specification is not implied (while programming, follow the programming specifications).
DC Electrical Characteristics
Over Recommended Operating Conditions (Unless Otherwise Specified) SYMBOL PARAMETER Input Low Voltage Input High Voltage Input or I/O Low Leakage Current Input or I/O High Leakage Current 0V VIN VIL (MAX.) (VCC - 0.2)V VIN VCC VCC VIN 5.25V CONDITION MIN.
Vss 0.5
TYP.2
UNITS V V A A mA V V V V V mA mA mA
2.0 2.4 Vcc-0.45 Vcc-0.2 VCC = 3.3V VOUT = 0.5V TA = 25C -10
-10
10 30 0.4 0.2 8 -4 -60
IOL = MAX. Vin = VIL or VIH IOL = 500 A Vin = VIL or VIH
IOH = MAX. Vin = VIL or VIH IOH = -500 A Vin = VIL or VIH IOH = -100 A Vin = VIL or VIH
Low Level Output Current High Level Output Current Output Short Circuit Current
45
65
mA
1) One output at a time for a maximum duration of one second. Vout = 0.5V was selected to avoid test problems by tester ground degradation. Characterized but not 100% tested. 2) Typical values are at Vcc = 3.3V and TA = 25 C
12
Specifications GAL16LV8C
AC Switching Characteristics
Over Recommended Operating Conditions (Unless Otherwise Specified)
COM PARAMETER COM COM
TEST COND1. A A A
DESCRIPTION Input or I/O to Combinational Output Clock to Output Delay Clock to Feedback Delay Setup Time, Input or Feedback before Clock Hold Time, Input or Feedback after Clock Maximum Clock Frequency with External Feedback, 1/(tsu + tco) Maximum Clock Frequency with Internal Feedback, 1/(tsu + tcf) Maximum Clock Frequency with No Feedback Clock Pulse Duration, High Clock Pulse Duration, Low Input or I/O to Output Enabled OE to Output Enabled Input or I/O to Output Disabled OE to Output Disabled 1 1 6 0
-7
-10
-15 UNITS
7.5 5 4
1 1 7 0 71.4
10 7 5
1 1 12 0 45.5
15 10 8
ns ns ns ns ns MHz
90.9
fmax4
A A
100 100
83.3 83.3
50 62.5
MHz MHz
B B C C
5 5
9 6 9 6
6 6
10 8 10 8
8 8
15 15 15 15
ns ns ns ns ns ns
1) Refer to Switching Test Conditions section. 2) Minimum values for tpd and tco are not 100% tested but established by characterization. 3) Calculated from fmax with internal feedback. Refer to fmax Descriptions section. 4) Refer to fmax Descriptions section. Characterized but not 100% tested.
13
Specifications GAL16LV8
Switching Waveforms
VALID INPUT
tsu
INPUT or I/O FEEDBACK
th
CLK
VALID INPUT
tco
REGISTERED OUTPUT 1/fmax (external fdbk)
tpd
COMBINATIONAL OUTPUT
Combinatorial Output
Registered Output
OE
tdis
COMBINATIONAL OUTPUT
ten
REGISTERED OUTPUT
tdis
ten
OE to Output Enable/Disable
twh
CLK 1/ fmax (w/o fb)
twl
tcf
REGISTERED FEEDBACK
tsu
Clock Width
14
Specifications GAL16LV8
fmax Descriptions
CL K
LOGIC ARR AY
CLK
R EG I S T E R
LOGIC ARRAY
ts u
tc o
REGISTER
t cf t pd
tsu + th
Note: tcf is a calculated value, derived by subtracting tsu from the period of fmax w/internal feedback (tcf = 1/fmax - tsu). The value of tcf is used primarily when calculating the delay from clocking a register to a combinatorial output (through registered feedback), as shown above. For example, the timing from clock to a combinatorial output is equal to tcf + tpd.
15
Specifications GAL16LV8
GAL16LV8D: Switching Test Conditions
Input Pulse Levels Input Rise and Fall Times Input Timing Reference Levels Output Timing Reference Levels Output Load GND to 3.0V 1.5ns 10% 90% 1.5V 1.5V See Figure
TEST POINT R1 +1.45V
GAL16LV8D Output Load Conditions (see figure) Test Condition A B C High Z to Active High at 1.9V High Z to Active Low at 1.0V Active High to High Z at 1.9V Active Low to High Z at 1.0V R1 50 50 50 50 50 CL 35pF 35pF 35pF 35pF 35pF
FROM OUTPUT (O/Q) UNDER TEST Z0 = 50, CL = 35pF*
3-state levels are measured 0.5V from steady-state active level. GAL16LV8C Output Load Conditions (see figure) Test Condition A B C Active High Active Low Active High Active Low R1 316 316 316 316 316 R2 348 348 348 348 348 CL 35pF 35pF 35pF 5pF 5pF
R2
C L*
16
Specifications GAL16LV8
Electronic Signature
An electronic signature is provided in every GAL16LV8 device. It contains 64 bits of reprogrammable memory that can contain user defined data. Some uses include user ID codes, revision numbers, or inventory control. The signature data is always available to the user independent of the state of the security cell. NOTE: The electronic signature is included in checksum calculations. Changing the electronic signature will alter the checksum.
Security Cell
A security cell is provided in the GAL16LV8 devices to prevent unauthorized copying of the array patterns. Once programmed, this cell prevents further read access to the functional bits in the device. This cell can only be erased by re-programming the device, so the original configuration can never be examined once this cell is programmed. The Electronic Signature is always available to the user, regardless of the state of this control cell.
Input Buffers
GAL16LV8 devices are designed with TTL level compatible input buffers. These buffers have a characteristically high impedance, and present a much lighter load to the driving logic than bipolar TTL devices. The GAL16LV8D input and I/O pins have built-in active pull-ups. As a result, unused inputs and I/O's will float to a TTL "high" (logical "1"). Lattice Semiconductor recommends that all unused inputs and tri-stated I/O pins be connected to another active input, VCC, or Ground. Doing this will tend to improve noise immunity and reduce ICC for the device.
Latch-Up Protection
GAL16LV8 devices are designed with an on-board charge pump to negatively bias the substrate. The negative bias minimizes the potential of latch-up caused by negative input undershoots.
Device Programming
GAL devices are programmed using a Lattice Semiconductor-approved Logic Programmer, available from a number of manufacturers. Complete programming of the device takes only a few seconds. Erasing of the device is transparent to the user, and is done automatically as part of the programming cycle.
17
Specifications GAL16LV8
Power-Up Reset
Vcc
Vcc (min.)
t su
CLK
t wl t pr
Circuitry within the GAL16LV8 provides a reset signal to all registers during power-up. All internal registers will have their Q outputs set low after a specified time (tpr, 1s MAX). As a result, the state on the registered output pins (if they are enabled) will always be high on power-up, regardless of the programmed polarity of the output pins. This feature can greatly simplify state machine design by providing a known state on power-up. Because of the asynchronous nature of system power-up, some
conditions must be met to provide a valid power-up reset of the device. First, the VCC rise must be monotonic. Second, the clock input must be at static TTL level as shown in the diagram during power up. The registers will reset within a maximum of tpr time. As in normal system operation, avoid clocking the device until all input and feedback path setup times have been met. The clock must also meet the minimum pulse width requirements.
Vcc
Active Pull-up Circuit (GAL16LV8D Only) Active Pull-up Circuit (GAL16LV8D Only) Tri-State Control Vcc Vref
Vcc
ESD Protection Circuit
Vref
Vcc
PIN
PIN
18
Specifications GAL16LV8
GAL16LV8D: Typical AC and DC Characteristic Diagrams
Normalized Tpd vs Vcc
1.1 1.05
Normalized Tpd
Normalized Tco
1.05
Normalized Tsu
PT H->L PT L->H
PT H->L
1.1
PT L->H
1
0.95
0.975
0.9
0.9 3.00
3.15
3.30
3.45
3.60
0.95 3.00
3.15
3.30
3.45
3.60
0.8 3.00
3.15
3.30
3.45
3.60
Normalized Tpd
Normalized Tco
Normalized Tsu
PT H->L PT L->H
RISE FALL
PT H->L PT L->H
25
50
75
100
125
-55
-25
25
50
75
100
125
-55
-25
25
50
75
100
125
Temperature (deg. C)
Temperature (deg. C)
Temperature (deg. C)
-0.1
-0.2
-0.3
RISE FALL
RISE FALL
1 2 3 4 5 6 7 8
-0.4 1 2 3 4 5 6 7 8
RISE
18
RISE FALL
14 10 6 2 -2 -6 0 50
FALL
14 10 6 2 -2 -6
100
50
100
150
200
250
300
19
Specifications GAL16LV8
GAL16LV8D: Typical AC and DC Characteristic Diagrams
Vol vs Iol
2.25 2 2.5 1.75 2.95 3
Voh vs Ioh
3
Voh vs Ioh
Voh (V)
Voh (V)
5.00 10.00 15.00 20.00 25.00
Vol (V)
1.5
2.9
2.85
2.8 0.00
1.00
2.00
3.00
4.00
Iol (mA)
Ioh(mA)
Ioh(mA)
Normalized Icc
Normalized Icc
1.1
Normalized Icc
-55 -25 0 25 50 75 100 125
1.03
1.00
0.9
0.98
0.95 0 25 50 75 100
Temperature (deg. C)
Frequency (MHz)
Iik (mA)
0.50 1.00 1.50 2.00 2.50 3.00 3.50
15 20 25
-1.50
-1.00
-0.50
0.00
Vin (V)
Vik (V)
20
Specifications GAL16LV8
GAL16LV8C: Typical AC and DC Characteristic Diagrams
Normalized Tpd vs Vcc
1.2 1.1
Normalized Tpd
Normalized Tco
1.1
Normalized Tsu
PT H->L PT L->H
PT H->L
1.1
PT L->H
1
0.9
0.95
0.9
0.8 3.00
3.15
3.30
3.45
3.60
0.9 3.00
3.15
3.30
3.45
3.60
0.8 3.00
3.15
3.30
3.45
3.60
Normalized Tpd
Normalized Tco
Normalized Tsu
PT H->L PT L->H
RISE FALL
PT H->L PT L->H
25
50
75
100
125
-55
-25
25
50
75
100
125
-55
-25
25
50
75
100
125
Temperature (deg. C)
Temperature (deg. C)
0.05
RISE FALL
RISE FALL
RISE FALL
26 22 18 14 10 6 2 -2 -6 0 50
RISE FALL
100
150
200
250
300
21
Specifications GAL16LV8
GAL16LV8C: Typical AC and DC Characteristic Diagrams
Vol vs Iol
1 0.8 4
Voh vs Ioh
3
Voh vs Ioh
2.9
Voh (V)
0.6 0.4 0.2 0 0.00 5.00 10.00 15.00 20.00 25.00 30.00 35.00
Voh (V)
2.00 4.00 6.00 8.00 10.00 12.00 14.00
Vol (V)
2.8
2.7
0 0.00
Iol (mA)
Ioh (mA)
Ioh (mA)
Normalized Icc
Normalized Icc
1.10
Normalized Icc
-55 -25 0 25 50 75 100 125
1.60
1.00
1.40
0.90
1.20
1.00 0 25 50 75 100
Temperature (deg. C)
Frequency (MHz)
20
Iik (mA)
0.50 1.00 1.50 2.00 2.50 3.00 3.50
8 6 4 2 0 0.00
Vin (V)
Vik (V)
22