TesT 18-biT ADCs

with an ultrapure sine-wave oscillator

he ability to faithfully digitize a sine wave is a sensitive test of high-resolution-ADC fidelity. This test requires a sine-wave generator with residual distortion products approaching 1 ppm (part per million). It also requires a computerbased ADC-output monitor to read and display the converters output spectral components. Performing this testing at reasonable cost and complexity requires the construction of its elements and performance verification before its use. A lowdistortion oscillator drives the ADC through an amplifier (Figure 1). The ADCs output interface formats the converter output, which communicates with the computer. The computer executes spectral-analysis software and displays the resulting data.

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image: istockphoto.com

OSCILLATOR CIRCUITRY The systems oscillator is the most difficult-to-design part of the circuit. The oscillator must have transcendentally low levels of impurity to meaningfully test 18-bit ADCs. You must then verify these impurity characteristics by independent means. Start with a design based on the work of Winfield Hill, director of the electronics-engineering laboratory at the Rowland Institute at Harvard University. You can then adapt this design for a 2-kHz Wien-bridge design (Figure 2). Using all of the amplifiers in inverting mode eliminates CMRR (common-mode-rejection-ratio) errors from the signal path. Low-distortion amplifiers A1 and A2 are the active components of this oscillator. The JFET of the original design would introduce conductivity-modulation errors, so you can replace it with an LED-driven CdS (cadmium-sulfide) photocell isolator. You then combine the output of A2 with a filtered dc offset at the input to A3. The capacitor in A3s

AT A G L A N C E

Measuring 18-bit ADCs requires a good oscillator.

You can adapt a Wien-bridge circuit. A photocell performs AGC (automatic gain control) better than does a JFET. Be sure to verify the oscillators circuit performance with calibrated test equipment.

feedback network limits the bandwidth of the amplifier. The output of this 2.6kHz filter drives the input amplifier of the ADC under test. The A1/A2 oscillator needs AGC (automatic gain control), so you accouple the circuits output to a highimpedance, low-noise JFET-input amplifier, A4, which feeds precision rectifier A5. A5 in turn drives integrator A6. A6s dc output represents the ac amplitude of the circuits output sine wave.
SOFTWARE

2-kHz OSCILLATOR

ADC INPUT AMPLIFIER

ADC

DATA ACQUISITION/ INTERFACE

COMPUTER AND DISPLAY

100-MHz CLOCK

Figure 1 In a spectral-purity test system for an ADC and a distortion-free oscillator, the computer displays the Fourier components due to amplifier and ADC infidelity.

EDN 110811DF Figure 1

DIANE

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7.87k 0.1% 0.01 F 7.87k 0.1%

0.01 F

OSCILLATOR

0.0068 F 5 pF 12k* 40.2k 0.1% 9.09k* A3 LT1468

OUTPUT AMPLIFIER AND FILTER

A1 LT1468

249 100

19.1k 909* 0.1%

130 0.47 F

SILONEX NSL32SR3 TRIM 100 ADJUSTMENT FOR ~5V ACROSS HERE 470 5% 15V 100 5% 470 5% 100 F AGC

A2 LT1468 12k

~ 2 kHz TO ADCAMPLIFIER INPUT

1 F 36k 5% 15V A7 LT1006 15 F

12k 100k LT1029 5V 4.3k 5% 15V

47 F

5V 4.5V 0V

~ 2 kHz ON 0.5V

4V BIASED

0.5V

DC OFFSET 10 F

Q1 2N3904

28k

1 F NOTES: BYPASS EACH AMPLIFIER WITH 10-F OS-CON. DO NOT USE CERAMIC CAPACITORS ANYWHERE. USE MYLAR OR SILVER MICA. 0.01 F=POLYSTYRENE PREFERRED. POLYPROPELENE, PPS ACCEPTABLE. OUTER FOIL TO AMPLIFIER OUTPUT. ALL RESISTORS ARE 1% METAL FILM UNLESS NOTED. *=IRC TYPE CAR-5, 1%. 0.1% RESISTORS ARE IRC TYPE CAR-5. RESELECT 909 IN SERIES WITH 100 TRIM IF NECESSARY. 10k

10k 4.99k 10k 1N4148 10k A4 LT1122 AGC 0.1 F SENSE 1M

A6 LT1122

A5 LT1122 1N4148 RECTIFIER

Figure 2 A Wien-bridge oscillator uses inverting amplifiers in the signal path and achieves 3-ppm distortion. An LED photocell replaces the usual JFET as gain control.

A 2V/DIV ON 0.5V DC

A 2V/DIV

B 10 nA/DIV ON 10-mA-DC 30-kHz BANDWIDTH

B 9-PPM EDN 110811DF FigureINDICATED 2.eps DIANE DISTORTION (AMY CHANGED BECAUSE I HAD A DF1)

500 SEC/DIV

200 SEC/DIV

Figure 3 Trace A is the oscillators output. Related residue (Trace B) is just discernible in Q1s emitter noise. At approximately 1 nA, it represents 0.1 ppm of LED-current variation. Heavy AGC signal-path filtering prevents modulation products from influencing the photocell response.

Figure 4 An HP-339A distortion analyzer operating beyond its resolution limit provides misleading distortion indication (Trace B). The analyzer output contains an unreliable combination of oscillator and instrument signatures. Trace A is the oscillators output.

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(a)

bine to generate a significant amount of phase delay. You can accommodate this delay with a 1-F dominant pole at A7, along with a zero-value RC (resistor/capacitor), to achieve stable loop compensation. This approach replaces closely tuned high-order output filters with simple RC roll-off responses, minimizing distortion and maintaining constant output amplitude. It is essential that you eliminate oscillator-related signal components from the LED bias to maintain low distortion. Any such residue modulates the oscillators amplitude, introducing impure frequency components. The bandlimited AGC signal path is well-filtered. The heavy RC time constant in Q1s base provides a final, steep roll-off response. Q1s emitter current shows approximately 1 nA of oscillator-related ripple from a 10-mA totalless than 0.1 ppm (Figure 3). The oscillator needs only one 100 trim to achieve its performance. This adjustment is set in accordance with the notes in Figure 2 and centers the AGCs capture range. OSCILLATOR DISTORTION Verifying oscillator distortion necessitates sophisticated measurement techniques. You will encounter limitations if you attempt to measure distortion with a conventional distortion analyzer, even a high-grade type. An oscilloscope can be used to indicate distortion residuals at the analyzers output (Figure 4).The amplifiers floor faintly outlines noise and uncertainty on any signal activity that relates to the oscillator. The Hewlett-Packard (www.hp.com) HP-339A analyzer specifies a minimum measurable distortion of 18 ppm. The figure shows the instrument indicating 9 ppm, which is beyond the units specification and, hence, highly suspicious. Measuring distortion at or near the limits of your equipment yields pronounced uncertainties. Distortion measurements at or near equipment limits are full of unpleasant surprises (Reference 1). Specialized analyzers with low uncertainty floors are needed to meaningfully measure oscillator distortion. The Audio Precision (www.ap.com) 2722 analyzer has a maximum 2.5-ppm THD+N (total harmonic distortion plus noise) and a typical THD+N of 1.5 ppm. This instrument measures the oscillators THD in three tests and finds THD figures of 110, 105, and 112 dB at 3, 5.8, and 2.4 ppm, respectively (Figure 5). These measurements provide confidence in applying the oscillator to ADC-fidelity characterization.

(b)

(c)

Figure 5 The Audio Precision 2722 analyzer measures oscillator THD at 110 dB, or approximately 3 ppm (a). The analyzer measures oscillator THD+N at 105 dB, or approximately 5.8 ppm (b). Its spectral output indicates a third harmonic peak at 112.5 dB, or 2.4 ppm (c).

Current-summing resistors can be used to balance the dc value against a voltage reference that the Linear Technology (www.linear.com) LT1029 IC creates. The current-summing resistors feed the AGC single-supply amplifier, A7. This amplifier drives Q1, which sets the LED current. The LED current closes a gain-control loop because it ultimately varies the CdS cells resistance, stabilizing the oscillators output amplitude. By deriving the gain-control feedback from the circuits output, you maintain the output amplitude, despite the attenuating, bandlimiting response of A3 and the output filter. This topology also places demands on the loop-closure dynamics of amplifier A7. A3s bandlimiting, the output filter, A6s lag, and the ripple-reduction components that attach to Q1s base com22 eDN | august 11, 2011

Figure 6 A partial display of the test system includes timedomain information, a Fourier spectral plot, and detailed tabular readings for an LT6350-driven ADC.

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ADC TESTING When you test ADCs, you route the oscillators output to the ADC through its input amplifier. The test measures distortion products produced by a combination of the ADC and the ADCs input amplifier. You then examine the ADCs output with a computer, which quantitatively indicates spectral-error components (Figure 6). You can download the code to take measurements and obtain input-amplifier, ADC, computer-data-acquisition, and clock boards from the Linear Technology Web site. Appropriate parts include an oscillator; the Linear Technology LT6350 amplifier; the LTC1279 ADC; the DC718 interface card; and any stable, low-phase-noise, 3.3V clock capable of driving 50. The computer display includes time-domain information showing the biased sine wave centered in the converters operating range. It also displays detailed tabular readings and a Fourier transform indicating spectral-error components. The amplifier/ ADC combination under test produces second harmonic distortion of 111 dB, which is approximately 2.8 ppm. The higher-frequency harmonics are well below this level, indicating that the ADC and its input amplifier are operating properly and within specifications. Harmonic cancellation may occur between the oscillator and amplifier/ADC combo, mandating that you test several amplifier/ADC samples to enhance your confidence in the measurement.EDN REfERENCE
1

ments, sculpture, and restoring old Tektronix oscilloscopes. A long-time EDN contributor, Williams died at age 63 in June 2011 after a stroke. Guy Hoover is an applications engineer at Linear Technology Corp in the mixed-signal-products group supporting SAR (successiveapproximation-register)

ADCs. He has a bachelors degree in electronics-engineering technology from DeVry Institute of Technology (San Francisco, CA). Hoover has written several application notes and articles. His hobbies include watching classic sci-fi movies and collecting high-tech gadgets.
+ Read more articles by Jim Williams at www.edn.com/jimwilliams.

Williams, Jim, Bridge Circuits: Marrying Gain and Balance, Application Note 43, Linear Technology, June 1990, http://bit.ly/pF8qsv.

AUThORS bIOGRAphIES Jim Williams was a staff scientist at Linear Technology Corp, where he specialized in analog-circuit and instrumentation design. He served in similar capacities at National Semiconductor, Arthur D Little, and the Instrumentation Laboratory at the Massachusetts Institute of Technology. He was a former student at Wayne State University (Detroit) and enjoyed sports cars, art, collecting antique scientific instru[www.edn.com] august 11, 2011 | eDN 23