Engineering and Technology Journal e-ISSN: 2456-3358

Volume 07 Issue 07 July-2022, Page No.-1342-1345

DOI: 10.47191/etj/v7i7.03, I.F. – 6.484
© 2022, ETJ

Demodulation of Interferogram with Closed Fringes Using the Phase

Shifting Technique
H Ulises Rodríguez Marmolejo1, Daniel Jauregui Acevedo2, Debani Ximena Rodríguez Muñoz3
1,2
Departament of Electric & Electronics Engineering, Tecnológico Nacional de México Campus Aguascalientes, México
3
Departament of Electronics Engineering, Centro Universitario de los Lagos CULAGOS UdeG Lagos de Moreno Jalisco,
México

ABSTRACT: This research exposes the foundations of optical metrology which occupies one of the most important in optics. A
brief description is made of interferometry which in turn is part of the optical metrology. It demonstrates how an interferogram is
obtained. It is also explained the way in which one of the most advanced techniques is applied simple in the demodulation of the
phase, since the goal of any technique in interferometry is to find the term “phase” which refers to the physical quantity to be
measured whether effort, displacement, distance, pressure, temperature, velocity, shape, dimensions, etc; since it is not possible to
achieve it by the conventional methods. The phase obtained in the present article corresponds to the image (interferogram) of a
pattern of closed fringes of a lens, which uses a technique called phase shift that consists of acquiring several interferograms, which
in turn lead to a result known as phase wrapped so it is necessary to apply some method phase unwrapping to obtain the solution.
KEYWORDS: Optics, interferometry, shifts, demodulation, wrapped phase and unwrapped phase.

I. INTRODUCTION purpose of the investigation is the demodulation of an

Worldwide, the growth of optics has had as a consequence interferogram.
novel applications in the daily activities of the human being,
which are divided into four large areas within all research: II. THEORETICAL FUNDAMENTS
optical instrumentation, communications optics, optical The conditions for achieving light interference are known as
metrology and photonics [1]. Inside of optical metrology is the Fresnel-Arago laws and are the following:
the interferometry whose main task is to find the term  The waves that produce interference have to be
“phase”. Exist dozens of techniques applied in demodulation consistent. This happens only when they have their origin
or obtaining phase [2]. For example, Mitsu Takeda to from a in the same source and is achieved in a much easier using
computational processing finds the differences between a laser.
elevations and valleys of the phase in study [3]. Manuel  The light beams must be linearly polarized. That is, they
Servin introduces a modulation space with a conical carrier must vibrate in the same plane.
and from there he estimates the phase [4]. Rodríguez-Vera  The beams must be monochromatic, which means they
applies a novel strategy of phase clamping [5], analogous to have to be of the same frequency, this is achieved by
the clamping cycle of phase of an electronic circuit (PLL). placing an interference filter or using a laser.
Studies developments in the demodulation of fringe patterns The equipment that generates the fringe pattern is known as
optimization algorithms have been used; Such as genetic an interferometer, a good example is the Twyman-Green
algorithms, swarming particles, neural networks, harmonic interferometer which is illustrated in figure 2.1.
search, etc. [6]; whose main goal is to minimize a function The Twyman-Green interferometer works causing two
cost with excellent results. The present article indicates the wavefronts to interfere: the “arm” one or the illumination of
necessary conditions for have an interference, the basics are the surface under test, and the one with the “arm” two or
demonstrated mathematical and finally the results are shown reference; both fronts of wave are recombined by the light
obtained in the demodulation of an interferogram with closed beam splitter, then showing the interference of both rays of
fringes applying the simple technique by phase shift. If we light at the focal point (focus lens), which is named
mathematically relate shifts phase is found in wrapped mode interference who is taken to a photo by detector (digital
(phase shift) so it is necessary to apply some method of phase camera), the data is stored and reproduced as an interferogram
"unwrapping" which is not described in this article since the on the screen of a computer.

1342 H Ulises Rodríguez Marmolejo1, ETJ Volume 7 Issue 07 July 2022

 “Demodulation of Interferogram with Closed Fringes Using the Phase Shifting Technique”
I1 ( x, y )  a( x, y )  b( x, y)cos( ( x, y))

I 2 ( x, y )  a( x, y )  b( x, y)cos( ( x, y)  )
2 (4)
I 3 ( x, y )  a( x, y)  b( x, y)cos( ( x, y)   )
3
I 4 ( x, y )  a( x, y )  b( x, y)cos( ( x, y)  )
2
Applying the trigonometric identity, the previous equations
are
Fig. 2.1 Twyman-Green arrangement. I1 ( x, y )  a( x, y )  b( x, y )cos( ( x, y ))

III. GENERATION OF THE PHASE IMAGE

I 2 ( x, y )  a( x, y )  b( x, y ) sen( ( x, y ))
(5)
A digital record of an image of study object which has a I 3 ( x, y )  a( x, y )  b( x, y )cos( ( x, y ))
projected pattern of fringes, it can be describe mathematically I 4 ( x, y )  a( x, y )  b( x, y ) sen( ( x, y ))
by the expression
(1) Solving these four equations to find  ( x, y ) , at each point
I ( x, y)  a( x, y)  b( x, y)cos( ( x, y)) of the interferogram we have
where the first term a( x, y ) represents a background I 4  I 2  2b( x, y ) sen( ( x, y ))
intensity in the image, the second term b( x, y ) can be I1  I 3  2b( x, y )cos( ( x, y ))
understood as a factor that determines the visibility of the I 4  I 2 sen( ( x, y ))
observed fringes, it is the phase  ( x, y ) of the optical field   tg ( ( x, y )) (6)
I1  I 3 cos( ( x, y ))
that we want to reconstruct [7]. The topography of an object
 I4  I2 
turns out to be directly proportional to the phase term  ( x, y )  tg 1  
appearing in equation (1).  I1  I 3 
3.2 Phase shift interferometry Therefore  ( x, y ) , it corresponds to the demodulation of the
In phase shift interferometers the reference wavefront moves interferogram mathematically [9].
along the propagation direction with respect to the wavefront
under test, thus changing the positions of the interference IV. RESULT AND DISCUSSION
fringes [8]. The technique known as interferometry of phase To implement the optical array, it was used PASCO's
shift (PSI), It is based on the idea of proposing a set of reconfigurable interferometer SCIENTIFICS with OS-8514
equations, which allows to determine the difference of phase He-Ne laser emitter (fig. 4.1) and to obtain the images of the
(4). trial lens at analyze, an EOS REBEL T6S camera of the
3.3 Theoretical basis of the 4-step method. Cannon brand which acquires and carries the pattern of
The four-step method requires four interferograms that are stripes to the personal computer, so that the captured images
totally independent of the object under test; Interferograms were obtained with the greater sharpness so that they would
should be recorded or digitized. An optical phase shift is be easy to process by the phase shift algorithm.
introduced into of the reference beam between each
interferogram recorded sequentially. Because the measures
are integers, the dependence of the x, y axes of the image have
to change, by indices i,ii between pixel and pixel. The
function δ(t) takes four values
 3
 (t )  0, , , ; i  1,2,3,4 (2)
i
2 2
Substituting each of these four values into the resulting
interferogram intensity pattern equation
I ( x, y)  a( x, y)  b( x, y)cos( ( x, y)   (t )) (3)
where the function δ(t) is directly proportional to the
Fig. 4.1 Experimental equipment to acquire the image of
difference in frequency and time, this difference in frequency
the material to be analyzed.
increases the linear phase shift between the reference and test
beams, thus resulting in four equations describing the four
The format in which the images are sent from the acquisition
patterns of intensity of the interferograms measured, this is
device (camera) to the computer is that of 8-bit JPG format

1343 H Ulises Rodríguez Marmolejo1, ETJ Volume 7 Issue 07 July 2022

 “Demodulation of Interferogram with Closed Fringes Using the Phase Shifting Technique”
color and size selected in the camera is 100x100 pixels. For
image processing interferograms, the Matlab software was
used. The way to perform the calculations is based on the
management of data arrays. This requires that the format of
the digital images will be in BMP and transfer it in 8-bit
grayscale, since the use of grayscale in images ensures that
the image contains in each of its records only the
corresponding intensity value since Matlab uses a single array
to store the data. Figures 4.2-4.5 shows the 4 interferograms
of 4 different shifts. Inside the image editor (Paint) in case is
necesary to cut the image, it is done using the cutting tool
contained in the package. After this each image is exported in
format 8-bit grayscale linear BMP.

Fig. 4.5 Intensity 4.

Once the 4 shifts have been physically performed which

correspond to the 4 closed fringe patterns shown in the
previous figures and indicated mathematically by equations
(5), we proceed to relate them mathematically in Matlab from
(6) so obtain the wrapped phase (x,y) whose result is shown
in figure 4.6

Fig. 4.2 Intensity 1.

Figure 4.6 Phase obtained from the phase shift

Fig. 4.3 Intensity 2. technique.

It should be clarified that the one obtained (Fig. 4.6) is in the

"wrapped" form, also known as the wrapped phase. It is
necessary to apply a phase unwrapping algorithm (unwrapped
phase) to visualize the study surface in 3D [10]. In this article,
the unwrapping method applied to the wrapped phase of
Figure 4.6 is not specified or developed, which is why only
the unwrapped phase is shown in figure 4.7.

Fig. 4.4 Intensity 3.

1344 H Ulises Rodríguez Marmolejo1, ETJ Volume 7 Issue 07 July 2022

 “Demodulation of Interferogram with Closed Fringes Using the Phase Shifting Technique”
6. Sulaiman M., Salhi A., Selamoglu B.I., and Kirikchi
O.B., (2014). “A Plant Propagation Algorithm for
Constrained Engineering Optimization Problems”,
Mathematical Problems in Engineering (1), Article
ID 627416, 10 pages
7. Malacara, D., Servin, M., Malacara, Z., (2005).
Interferogram Analysis for Optical Testing, 2nd ed.,
Taylor & Francis, Boca Raton.
8. Gåsvik K.J. (2002). Optical Metrology, 3rd ed., John
Wiley & Sons, LTD, Sussex.
9. Malacara, D., Servin, M., Malacara, Z., (2005).
Interferogram Analysis for Optical Testing, 2nd ed.,
Taylor & Francis: Boca Raton.
10. Ghiglia D., Pritt M., (1998). Two-Dimensional
Phase Unwrapping Theory, Algorithms and
Figure 4.7. Found 3D image of the unwrapped phase. Applications, John Wiley & Sons: USA (1998).

V. CONCLUSIONS
Optical metrology is an important branch of optics. The
physical quantity to be measured or known of the
interferogram under study is defined by the phase term
 ( x, y ) . Within optical interferometry, the phase shift
technique is one of the simplest so in this article it was applied
and explained a simple and attractive way; also this method
is valid for the analysis of different materials at micrometer
level. It also provides information easily understood
qualitative and quantitative illustration, as well as being non-
invasive and non-destructive. With this research report it is
explained a of the simplest techniques to analyze and
compare different materials with applications to sampling,
whether for quality control, reverse engineering, etc., because
in addition to faithfully reproducing contours of the parsed
objects, values can be provided numerical (micrometric or
nanometric) of the heights and depths.

REFERENCES
1. Hariharan, P. (1996). Basic of Interferometry.
Academic Press: New York.
2. Goodman, J.W. (1996). Introduction of Fourier
Optics. Mc. Graw-Hill: Singapore
3. Mitsuo Takeda, Hideki Ina, and Seiji Kobayashi,
(1982). “Fourier-transform method of fringe-pattern
analysis for computer-based topography and
interferometry”, Journal of the Optical Society of
America, Vol. 72, Issue 1, pp. 156-160.
4. Servin, M., Marroquin, J.L. Cuevas, F. (2001).
“Fringe-follower regularized phase tracker for
demodulation of closed-fringe interferograms”,
Journal of the Optical Society of America,
18(3):689-695
5. Rodriguez-Vera, R Servin M., (1993). “Two
dimensional phase locked loop demodulation of
interferograms”. J. Mod. Opt. 40(11), 2087-2094

1345 H Ulises Rodríguez Marmolejo1, ETJ Volume 7 Issue 07 July 2022