Design Test3
Design Test3
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Table of Contents
Control i/p
C1 C0 Output
0 0 y1 (1MHz)
0 1 y2 (2MHz)
1 0 y3(500KHz)
1 1 y4(4MHz)
2. Write synthesizable RTL code for a n- bit left shift SISO register such that shifting
happens only for first 2 clock cycles within every four clock cycles. (Reset is active
high, synchronous reset). For the rest 2 clock cycles shifter holds the last shifted value.
(5 M)
3. Draw the stratified event queue for the following snippet: (5 M)
4. Draw the block diagram of a dual port synchronous Static RAM of size (64x16).
Clock is active at posedge , reset is active high synchronous reset. Address pointers
are input ports, “re” and “we” are two active high control inputs. The memory supports
simultaneous read and write operation. Implement parameter over-riding such that the
new RAM has a size (16x64).