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Mixed Signal Review Question

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NIET Ms. Saranya .R - Asst Prof - ECE
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9 views2 pages

Mixed Signal Review Question

Uploaded by

NIET Ms. Saranya .R - Asst Prof - ECE
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as PDF, TXT or read online on Scribd
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NEHRU INSTITUTE OF ENGINEERING AND TECHNOLOGY

An ISO 9001:2015&ISO 14001:2015Certified Institution, Affiliated to Anna University, Chennai


Approved by AICTE, New Delhi, Recognized by UGC with 2(f) & 12(B)
Re-accredited by NAAC “A+”, NBA Accredited (UG Courses): AERO | CSE
Nehru Gardens, Thirumalayampalayam, Coimbatore – 641 105.

DEPARTMENT OF ELECTRONICS AND COMMUNICATION ENGINEERING


B.E./B.Tech.(Full Time) –INTERNAL ASSESSMENT TEST-I, MARCH 2024
REGULATION – 2021
REVIEW QUESTIONS
SUB CODE/NAME: CEC342 – MIXED SIGNAL IC DESIGN TESTING

PART –A (10×2 = 20 Marks)


Answer ALL questions

1. Define mixed signal circuit. Give the example.


2. List the common types of analog and mixed signal circuits.
3. Mention the categories of handlers.
4. Differentiate ADC and DAC.
5. Write the formulas for yield, Defect Level and DL interms of escapes.
6. If 10000 devices are tested with a yield of 63%, how many devices passed the test?
7. What is meant by accuracy and precision?
8. Compare program – program and DIB – DIM correlations.
9. Classify the different encoding formats for ADC and DAC.
10. Define full scale range.
11. What is the role of test engineer?
12. List the examples of analog circuits.
13. Mention the three major components of Automated Test Equipment.
14. Differentiate gravity fed and pick place handlers.
15. What is systematic error and how it is eliminated?
16. Write the types of correlation.
17. What are the ways to improve the measurement accuracy?
18. Compare tester – tester and Day – Day correlations.
19. Draw the segmented DAC conceptual block diagram.
20. Define LSB step size.

PART-B
1 a. Explain the application of mixed signal circuit with an example.

1.b Discuss in detail about the post silicon production flow.

2.a With a neat block diagram, describe about test and diagnostic equipment.

2 b. Why the mixed signal devices need to be tested?

3 a. Explain in detail about the various measurement terminologies.

3 b. Derive the expression for repeatability bias and accuracy with neat sketch.
4 a. Discuss and differentiate the hardware and software calibrations.

4 b. Explain in detail the statistical process control.

5 a. Write short notes on DAC and data formats.

5 b. With a neat diagram, explain the various basic DC tests in DAC.

6 a. Draw the block diagram of Digital Cellular Telephone and explain each blocks.

6.b How testing and packaging is done and compare characterization and production
testing.

7.a With a neat sketch, describe about ATE, Wafer probers, Handlers and E beam Probers.

7 b. Describe the need for testing of mixed signal circuits.

8 a. Explain in detail about the accuracy & Precision, bias errors, random errors, resolution,
stability, repeatability and correlation.

8b. Derive the expression for repeatability bias and accuracy with neat sketch.

9 a. Discuss the concepts of calibrations and checkers.

9 b. Explain in detail the tester specifications with neat diagram.

10 a. Write short notes on principles of ADC and DAC conversions.

10 b. With a neat diagram, explain the various basic transfer curve tests in DAC.

PART-C

1. (i) Describe gauge repeatability and reproducibility.


(ii) Write short notes on Averaging.
(iii) What is code specific parameters?
2. (i) Explain the effects of six sigma quality.
(ii) Describe the analog filtering of improving measurement accuracy.
(iii) Write short notes on DAC failure mechanisms.
3. (iv) Describe the types of mixed signal circuits.
(v) Write short notes on Guard bands.
(vi) What is Full scale Range?
4. (iv) Explain the effects of measurement variability on test yield.
(v) Describe the effects of reproducibility and process variation on yield.
(vi) Write short notes on absolute error and monotonicity in transfer curve tests

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