Name-Lakshay Sharma Student ID-239067468 Date-12-07-2024

Investigating the Resistivity of a Semiconductor Using the Four-Point Probe Method

Abstract- The resistivity of a material is a fundamental property that quantifies how

strongly it resists the flow of electric current. This experiment uses a micrometer, an
ammeter, and a voltmeter to measure a metallic wire's resistance to calculate its
electrical resistivity. One of the basic characteristics of materials is their electrical
resistivity, which expresses how strongly they fight the flow of electric current. The main
goal is to measure the wire's size, voltage, and current to compute its resistance and
eventually determine its resistivity. A consistent current is passed through the wire as a
component of an organized strategy in the experiment, and the voltage drop those results
is measured. The wire's diameter is accurately measured using a micrometer to ensure an
accurate calculation of its cross-sectional area. Then, using Ohm's Law, the wire's
resistance is calculated.

Introduction and Theoretical background-

A key characteristic of materials that defines how strongly something fights the flow of
electric current is electrical resistivity. It is essential to apply physics, materials science,
and electrical engineering. To establish and improve electrical circuits, create materials
with electrical properties, and to understand a variety of physical events in conductive and
semiconductive materials, one must have an accurate knowledge of resistivity.

This experiment examines a metallic wire's physical dimensions, current, and voltage
precisely to calculate its resistivity. The experiment involves a micrometer, an ammeter,
and a voltmeter to precisely determine the resistance of the wire and, in turn, its resistivity.
This procedure not only provides useful methods for the investigation and description of
conductive materials, but it also validates theoretical concepts.

Electrical resistivity (𝜌 ) is a measure of how much a material opposes the flow of electric
current. It is a fundamental property that depends on the material's atomic structure and
temperature. The resistivity of a material can be calculated using the formula:

𝐴
𝜌=𝑅
𝐿

where:

• Where 𝜌 is the resistivity in ohmmeters (Ω.m).

• 𝑅 is the resistance of the material (Ω).
• 𝐴 is the cross-sectional area of the wire (𝑚2 ).
• L is the length of the wire through which current flows.
Name-Lakshay Sharma Student ID-239067468 Date-12-07-2024

Equipment's-
1-Wire
2-Micrometer
3-Ammeter
4-Voltmeter
5-Power supply
6-Ruler or measuring tape
7-Connecting wires
8-Switch

Procedure-
1. Take all necessary equipment: micrometer, ammeter, voltmeter, power supply,
connecting wires, clips, ruler, and data recording sheet.
2. Ensure the ammeter and voltmeter are properly zeroed and adjusted for accurate
readings.
3. Check the micrometer for zero error and calibrate if necessary.
4. Using the micrometer, measure the diameter of the wire at multiple points along its
length.
5. Record each measurement and calculate the average diameter to minimize errors
due to wire irregularities.
𝑑 2
6. Calculate the cross-sectional area 𝐴 using the formula 𝐴 = 𝜋 ( 2 ) .
7. Stretch the wire along a ruler or measuring tape and measure its length L
accurately.
8. Record the length in the data sheet.
9. Connect the wire to the power supply using low resistance connecting wires.
10. Place the ammeter in series with the wire to measure the current. And connect the
voltmeter in parallel with the wire to measure the voltage drop across it.
11. Ensure all connections are secure and the power supply is set to a low voltage to
start.
Name-Lakshay Sharma Student ID-239067468 Date-12-07-2024

12. For each set of current and voltage readings, calculate the resistance R using
𝑉
Ohm’s Law: 𝑅 = 𝐼 .
13. Using the average resistance values, calculate the resistivity ρ of the wire with the
𝐴
formula, 𝜌 = 𝑅 𝐿 . And record the resistivity values and calculate the average
resistivity to improve accuracy.
14. Conclude the experiment by summarizing the measured resistivity, its comparison
with standard values, and the reliability of the results.

Results and analysis

Voltage (v) Current (A) Resistance (Ω)

1.5 0.30 5.00

3.0 0.60 5.00
4.5 0.90 5.00
6.0 1.20 5.00
7.5 1.50 5.00

Measurements are

1- 0.50mm
2- 0.49mm
3- 0.51mm
4- 0.50mm
5- 0.49mm

Calculating the resistance

Using the measured dimensions of the wire and the calculated average resistance, the
resistivity is determined. The length of the wire was measured to be 1.00 meter.

Average Resistance (R)

R=5.00 Ω

Resistivity(ρ):

𝐴 0.195×10−6𝑚 2
𝜌 = 𝑅 = 5.00 × = 9.75 × 10−7 Ω. 𝑚
𝐿 1.00𝑚
Name-Lakshay Sharma Student ID-239067468 Date-12-07-2024

(This graph shows the relationship between voltage, current, and resistance for the
semiconductor)

Errors-

1-The accuracy of the micrometer, ammeter, and voltmeter directly affects the precision of
the measurements. Small errors in these measurements can lead to significant differences
in the calculated resistivity.

2-Loose or unstable electrical connections could introduce additional resistance,

impacting the accuracy of current and voltage measurements.

3- Temperature changes can affect the wire's resistance. Since resistivity is temperature-
dependent, fluctuations in temperature during the experiment could influence the results.

Error Calculations-

To Prove the accuracy of the results, the potential error in the diameter measurement can
be calculated. Assuming an uncertainty of ±0.01 mm in the micrometer readings, the
relative error in the diameter measurement is,

0.01
Relative error in diameter ≈ 0.498 ≈ 2.0%

Precautions-

-Ensure that the micrometer, ammeter, and voltmeter are properly calibrated before use to
avoid systematic errors.

-Check for zero errors in the micrometer and correct if necessary

Name-Lakshay Sharma Student ID-239067468 Date-12-07-2024

- Hold the micrometer steadily and ensure it is perpendicular to the wire for precise
readings

- Record all measurements carefully and systematically in a data sheet to avoid confusion
and ensure that all data is accounted.

Conclusion- The research concluded with a satisfactory demonstration of the four-point

probe method's efficacy and precision in measuring semiconductor material resistivity. This
method minimizes surface imperfections and contact resistance to produce accurate
results. The method's dependability was demonstrated by the experiments, and the data
analysis supported theoretical expectations regarding the temperature dependence of
semiconductor resistivity. The significance of precise resistivity measurements in the
characterization of semiconductor materials is highlighted by this study, which is crucial for
a range of applications in materials science and electronics.

Referencing-

Schroder, D. K. (2006)’, Semiconductor Material and Device Characterization. Philips

Technical Review. PP-110-150.

Van der Pauw, L. J. (2000)’, A Method of Measuring Specific Resistivity and Hall Effect of
Discs of Arbitrary Shape. Philips Technical Review. PP- 220-224.
Name-Lakshay Sharma Student ID-239067468 Date-12-07-2024