IMX6ULLIEC
IMX6ULLIEC
MCIMX6Y0CVM05AA MCIMX6Y0CVM05AB
MCIMX6Y1CVM05AA MCIMX6Y1CVM05AB
MCIMX6Y1CVK05AA MCIMX6Y1CVK05AB
MCIMX6Y2CVM05AA MCIMX6Y2CVM05AB
MCIMX6Y2CVM08AA MCIMX6Y2CVM08AB
MCIMX6Y2CVK08AB
Ordering Information
The i.MX 6ULL processors are specifically useful for applications such as:
• Telematics
• Audio playback
• Connected devices
• IoT Gateway
• Access control panels
• Human Machine Interfaces (HMI)
• Portable medical and health care
• IP phones
• Smart appliances
• eReaders
The features of the i.MX 6ULL processors include:
• Single-core Arm Cortex-A7—The single core A7 provides a cost-effective and power-efficient
solution.
• Multilevel memory system—The multilevel memory system of processor is based on the L1
instruction and data caches, L2 cache, and internal and external memory. The processor supports
many types of external memory devices, including DDR3, low voltage DDR3, LPDDR2, NOR
Flash, NAND Flash (MLC and SLC), OneNAND™, Quad SPI, and managed NAND, including
eMMC up to rev 4.4/4.41/4.5.
• Smart speed technology—Power management implemented throughout the IC that enables
multimedia features and peripherals to consume minimum power in both active and various low
power modes.
• Dynamic voltage and frequency scaling—The power efficiency of devices by scaling the voltage
and frequency to optimize performance.
• Multimedia powerhouse—The multimedia performance of processor is enhanced by a multilevel
cache system, NEON™ MPE (Media Processor Engine) co-processor, a programmable smart
DMA (SDMA) controller, an asynchronous audio sample rate converter, an Electrophoretic
Display (EPD) controller, and a Pixel processing pipeline (PXP) to support 2D image processing,
including color-space conversion, scaling, alpha-blending, and rotation.
• 2x Ethernet interfaces—2x 10/100 Mbps Ethernet controllers.
• Human-machine interface—Each processor supports one digital parallel display interface.
• Interface flexibility—Each processor supports connections to a variety of interfaces: two
high-speed USB on-the-go with PHY, multiple expansion card ports (high-speed MMC/SDIO host
and other), two 12-bit ADC modules with up to 10 total input channels and two CAN ports.
• Advanced security—The processors deliver hardware-enabled security features that enable secure
e-commerce, digital rights management (DRM), information encryption, secure boot, AES-128
encryption, SHA-1, SHA-256 HW acceleration engine, and secure software downloads. The
security features are discussed in the i.MX 6ULL Security Reference Manual (IMX6ULLSRM).
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i.MX 6ULL Introduction
• Integrated power management—The processors integrate linear regulators and internally generate
voltage levels for different domains. This significantly simplifies system power management
structure.
For a comprehensive list of the i.MX 6ULL features, see Section 1.2, “Features"”.
Junction
Part Number Feature Package Temperature Tj
(C)
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NXP Semiconductors 3
i.MX 6ULL Introduction
Junction
Part Number Feature Package Temperature Tj
(C)
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4 NXP Semiconductors
i.MX 6ULL Introduction
Junction
Part Number Feature Package Temperature Tj
(C)
Figure 1 describes the part number nomenclature so that the users can identify the characteristics of the
specific part number they have (for example, cores, frequency, temperature grade, fuse options, and silicon
revision). The primary characteristic which describes which data sheet applies to a specific part is the
temperature grade (junction) field.
• The i.MX 6ULL Applications Processors for Industrial Products Data Sheet (IMX6ULLIEC)
covers parts listed with a “C (Industrial temp)”
Ensure to have the proper data sheet for specific part by verifying the temperature grade (junction) field
and matching it to the proper data sheet. If there will be any questions, visit the web page
NXP.com/imx6series or contact a NXP representative for details.
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NXP Semiconductors 5
i.MX 6ULL Introduction
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i.MX 6 Family X
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i.MX 6ULL Y
1.2 Features
The i.MX 6ULL processors are based on Arm Cortex-A7 MPCore™ Platform, which has the following
features:
• Supports single Arm Cortex-A7 MPCore (with TrustZone) with:
— 32 KB L1 Instruction Cache
— 32 KB L1 Data Cache
— Private Timer and Watchdog
— Cortex-A7 NEON Media Processing Engine (MPE) Co-processor
• General Interrupt Controller (GIC) with 128 interrupts support
• Global Timer
• Snoop Control Unit (SCU)
• 128 KB unified I/D L2 cache
• Single Master AXI bus interface output of L2 cache
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6 NXP Semiconductors
i.MX 6ULL Introduction
• Frequency of the core (including Neon and L1 cache), as per Table 10, "Operating Ranges," on
page 24.
• NEON MPE coprocessor
— SIMD Media Processing Architecture
— NEON register file with 32x64-bit general-purpose registers
— NEON Integer execute pipeline (ALU, Shift, MAC)
— NEON dual, single-precision floating point execute pipeline (FADD, FMUL)
— NEON load/store and permute pipeline
— 32 double-precision VFPv3 floating point registers
The SoC-level memory system consists of the following additional components:
— Boot ROM, including HAB (96 KB)
— Internal multimedia/shared, fast access RAM (OCRAM, 128 KB)
• External memory interfaces: The i.MX 6ULL processors support latest, high volume, cost effective
handheld DRAM, NOR, and NAND Flash memory standards.
— 16-bit LP-DDR2-800, 16-bit DDR3-800 and DDR3L-800
— 8-bit NAND-Flash, including support for Raw MLC/SLC, 2 KB, 4 KB, and 8 KB page size,
BA-NAND, PBA-NAND, LBA-NAND, OneNAND™ and others. BCH ECC up to 40 bits.
— 16/8-bit NOR Flash. All EIMv2 pins are muxed on other interfaces.
Each i.MX 6ULL processor enables the following interfaces to external devices (some of them are muxed
and not available simultaneously):
• Displays:
— One parallel display port, support max 85 MHz display clock and up to WXGA (1366 x 768)
at 60 Hz
— Support 24-bit, 18-bit, 16-bit, and 8-bit parallel display
— Electrophoretic display controller support direct-driver for E-Ink EPD panel, with up to
2048x1536 resolution at 106 Hz
• Camera sensors:
— One parallel camera port, up to 24 bit and 133.3 MHz pixel clock
— Support 24-bit, 16-bit, 10-bit, and 8-bit input
— Support BT.656 interface
• Expansion cards:
— Two MMC/SD/SDIO card ports all supporting:
– 1-bit or 4-bit transfer mode specifications for SD and SDIO cards up to UHS-I SDR-104
mode (104 MB/s max)
– 1-bit, 4-bit, or 8-bit transfer mode specifications for MMC cards up to 52 MHz in both SDR
and DDR modes (104 MB/s max)
– 4-bit or 8-bit transfer mode specifications for eMMC chips up to 200 MHz in HS200 mode
(200 MB/s max)
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NXP Semiconductors 7
i.MX 6ULL Introduction
• USB:
— Two high speed (HS) USB 2.0 OTG (Up to 480 Mbps), with integrated HS USB PHY
• Miscellaneous IPs and interfaces:
— Three I2S/SAI/AC97, up to 1.4 Mbps each
— ESAI
— Sony Philips Digital Interface Format (SPDIF), Rx and Tx
— Eight UARTs, up to 5.0 Mbps each:
– Providing RS232 interface
– Supporting 9-bit RS485 multidrop mode
– Support RTS/CTS for hardware flow control
— Four eCSPI (Enhanced CSPI), up to 52 Mbps each
— Four I2C, supports 400 kbps
— Two 10/100 Ethernet Controller (IEEE1588 compliant)
— Eight Pulse Width Modulators (PWM)
— System JTAG Controller (SJC)
— GPIO with interrupt capabilities
— 8x8 Key Pad Port (KPP)
— One Quad SPI to connect to serial NOR flash
— Two Flexible Controller Area Network (FlexCAN)
— Three Watchdog timers (WDOG)
— 8-bit/10-bit/12-bit/16-bit camera interface
— Two 12-bit Analog to Digital Converters (ADC) with up to 10 input channels in total
The i.MX 6ULL processors integrate advanced power management unit and controllers:
• Provide PMU, including LDO supplies, for on-chip resources
• Use Temperature Sensor for monitoring the die temperature
• Use Voltage Sensor for monitoring the die voltage
• Support DVFS techniques for low power modes
• Use SW State Retention and Power Gating for Arm and NEON
• Support various levels of system power modes
• Use flexible clock gating control scheme
The i.MX 6ULL processors use dedicated hardware accelerators to meet the targeted multimedia
performance. The use of hardware accelerators is a key factor in obtaining high performance at low power
consumption numbers, while having the CPU core relatively free for performing other tasks.
The i.MX 6ULL processors incorporate the following hardware accelerators:
• PXP—Pixel Processing Pipeline for image resize, rotation, overlay and CSC. Off loading key pixel
processing operations are required to support the LCD display applications.
• ASRC—Asynchronous Sample Rate Converter
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i.MX 6ULL Introduction
i.MX 6ULL Applications Processors for Industrial Products, Rev. 1.2, 11/2017
NXP Semiconductors 9
Architectural Overview
2 Architectural Overview
The following subsections provide an architectural overview of the i.MX 6ULL processor system.
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10 NXP Semiconductors
Modules List
3 Modules List
The i.MX 6ULL processors contain a variety of digital and analog modules. Table 2 describes these
modules in alphabetical order.
Table 2. i.MX 6ULL Modules List
ADC1 Analog to Digital — The ADC is a 12-bit general purpose analog to digital
ADC2 Converter converter.
Arm Arm Platform Arm The Arm Core Platform includes 1x Cortex-A7 core. It
also includes associated sub-blocks, such as the Level
2 Cache Controller, SCU (Snoop Control Unit), GIC
(General Interrupt Controller), private timers, watchdog,
and CoreSight debug modules.
ASRC Asynchronous Sample Multimedia The Asynchronous Sample Rate Converter (ASRC)
Rate Converter Peripherals converts the sampling rate of a signal associated to an
input clock into a signal associated to a different output
clock. The ASRC supports concurrent sample rate
conversion of up to 10 channels of about -120dB
THD+N. The sample rate conversion of each channel is
associated to a pair of incoming and outgoing sampling
rates. The ASRC supports up to three sampling rate
pairs.
BCH Binary-BCH ECC System Control The BCH module provides up to 40-bit ECC
Processor Peripherals encryption/decryption for NAND Flash controller
(GPMI)
CCM Clock Control Module, Clocks, Resets, and These modules are responsible for clock and reset
GPC General Power Controller, Power Control distribution in the system, and also for the system power
SRC System Reset Controller management.
CSI Parallel CSI Multimedia The CSI IP provides parallel CSI standard camera
Peripherals interface port. The CSI parallel data ports are up to 24
bits. It is designed to support 24-bit RGB888/YUV444,
CCIR656 video interface, 8-bit YCbCr, YUV or RGB,
and 8-bit/10-bit/16-bit Bayer data input.
CSU Central Security Unit Security The Central Security Unit (CSU) is responsible for
setting comprehensive security policy within the i.MX
6ULL platform.
DAP Debug Access Port System Control The DAP provides real-time access for the debugger
Peripherals without halting the core to:
• System memory and peripheral registers
• All debug configuration registers
The DAP also provides debugger access to JTAG scan
chains. The DAP module is internal to the Cortex-A7
Core Platform.
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NXP Semiconductors 11
Modules List
DCP Data co-processor Security This module provides support for general encryption
and hashing functions typically used for security
functions. Because its basic job is moving data from
memory to memory, it also incorporates a memory-copy
(memcopy) function for both debugging and as a more
efficient method of copying data between memory
blocks than the DMA-based approach.
ENET1 Ethernet Controller Connectivity The Ethernet Media Access Controller (MAC) is
ENET2 Peripherals designed to support 10/100 Mbit/s Ethernet/IEEE 802.3
networks. An external transceiver interface and
transceiver function are required to complete the
interface to the media. The module has dedicated
hardware to support the IEEE 1588 standard. See the
ENET chapter of the reference manual for details.
EPDC Electrophoretic Display Multimedia The EPDC is a feature-rich, low power, and high
Controller Peripherals performance direct-drive active matrix EPD controller. It
is specially designed to drive E-INKTM EPD panels,
supporting a wide variety of TFT backplanes.
EPIT1 Enhanced Periodic Timer Peripherals Each EPIT is a 32-bit “set and forget” timer that starts
EPIT2 Interrupt Timer counting after the EPIT is enabled by software. It is
capable of providing precise interrupts at regular
intervals with minimal processor intervention. It has a
12-bit prescaler for division of input clock frequency to
get the required time setting for the interrupts to occur,
and counter value can be programmed on the fly.
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Modules List
ESAI Enhanced Serial Audio Connectivity The Enhanced Serial Audio Interface (ESAI) provides a
Interface Peripherals full-duplex serial port for serial communication with a
variety of serial devices, including industry-standard
codecs, SPDIF transceivers, and other processors.
The ESAI consists of independent transmitter and
receiver sections, each section with its own clock
generator. All serial transfers are synchronized to a
clock. Additional synchronization signals are used to
delineate the word frames. The normal mode of
operation is used to transfer data at a periodic rate, one
word per period. The network mode is also intended for
periodic transfers; however, it supports up to 32 words
(time slots) per period. This mode can be used to build
time division multiplexed (TDM) networks. In contrast,
the on-demand mode is intended for non-periodic
transfers of data and to transfer data serially at high
speed when the data becomes available.
The ESAI has 12 pins for data and clocking connection
to external devices.
FLEXCAN1 Flexible Controller Area Connectivity The CAN protocol was primarily, but not only, designed
FLEXCAN2 Network Peripherals to be used as a vehicle serial data bus, meeting the
specific requirements of this field: real-time processing,
reliable operation in the Electromagnetic interference
(EMI) environment of a vehicle, cost-effectiveness and
required bandwidth. The FlexCAN module is a full
implementation of the CAN protocol specification,
Version 2.0 B, which supports both standard and
extended message frames.
GPIO1 General Purpose I/O System Control Used for general purpose input/output to external ICs.
GPIO2 Modules Peripherals Each GPIO module supports 32 bits of I/O.
GPIO3
GPIO4
GPIO5
GPMI General Purpose Connectivity The GPMI module supports up to 8x NAND devices and
Memory Interface Peripherals 40-bit ECC encryption/decryption for NAND Flash
Controller (GPMI2). GPMI supports separate DMA
channels for each NAND device.
GPT1 General Purpose Timer Timer peripherals Each GPT is a 32-bit “free-running” or “set and forget”
GPT2 mode timer with programmable prescaler and compare
and capture register. A timer counter value can be
captured using an external event and can be configured
to trigger a capture event on either the leading or trailing
edges of an input pulse. When the timer is configured to
operate in “set and forget” mode, it is capable of
providing precise interrupts at regular intervals with
minimal processor intervention. The counter has output
compare logic to provide the status and interrupt at
comparison. This timer can be configured to run either
on an external clock or on an internal clock.
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NXP Semiconductors 13
Modules List
LCDIF LCD interface Connectivity The LCDIF is a general purpose display controller used
peripherals to drive a wide range of display devices varying in size
and capability. The LCDIF is designed to support dumb
(synchronous 24-bit Parallel RGB interface) and smart
(asynchronous parallel MPU interface) LCD devices.
MQS Medium Quality Sound Multimedia MQS is used to generate 2-channel medium quality
Peripherals PWM-like audio via two standard digital GPIO pins.
PWM1 Pulse Width Modulation Connectivity The pulse-width modulator (PWM) has a 16-bit counter
PWM2 peripherals and is optimized to generate sound from stored sample
PWM3 audio images and it can also generate tones. It uses
PWM4 16-bit resolution and a 4x16 data FIFO to generate
PWM5 sound.
PWM6
PWM7
PWM8
PXP Pixel Processing Pipeline Display peripherals A high-performance pixel processor capable of 1
pixel/clock performance for combined operations, such
as color-space conversion, alpha blending,
gamma-mapping, and rotation. The PXP is enhanced
with features specifically for gray scale applications. In
addition, the PXP supports traditional pixel/frame
processing paths for still-image and video processing
applications, allowing it to interface with the integrated
EPD.
QSPI Quad SPI Connectivity Quad SPI module acts as an interface to external serial
peripherals flash devices. This module contains the following
features:
• Flexible sequence engine to support various flash
vendor devices
• Single pad/Dual pad/Quad pad mode of operation
• Single Data Rate/Double Data Rate mode of
operation
• Parallel Flash mode
• DMA support
• Memory mapped read access to connected flash
devices
• Multi-master access with priority and flexible and
configurable buffer for each master
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Modules List
SDMA Smart Direct Memory System Control The SDMA is multi-channel flexible DMA engine. It
Access Peripherals helps in maximizing system performance by off-loading
the various cores in dynamic data routing. It has the
following features:
• Powered by a 16-bit Instruction-Set micro-RISC
engine
• Multi-channel DMA supporting up to 32 time-division
multiplexed DMA channels
• 48 events with total flexibility to trigger any
combination of channels
• Memory accesses including linear, FIFO, and 2D
addressing
• Shared peripherals between Arm and SDMA
• Very fast Context-Switching with 2-level priority
based preemptive multi-tasking
• DMA units with auto-flush and prefetch capability
• Flexible address management for DMA transfers
(increment, decrement, and no address changes on
source and destination address)
• DMA ports can handle unit-directional and
bi-directional flows (copy mode)
• Up to 8-word buffer for configurable burst transfers
for EMIv2.5
• Support of byte-swapping and CRC calculations
• Library of Scripts and API is available
SJC System JTAG Controller System Control The SJC provides JTAG interface, which complies with
Peripherals JTAG TAP standards, to internal logic. The i.MX 6ULL
processors use JTAG port for production, testing, and
system debugging. In addition, the SJC provides BSR
(Boundary Scan Register) standard support, which
complies with IEEE1149.1 and IEEE1149.6 standards.
The JTAG port must be accessible during platform initial
laboratory bring-up, for manufacturing tests and
troubleshooting, as well as for software debugging by
authorized entities. The i.MX 6ULL SJC incorporates
three security modes for protecting against
unauthorized accesses. Modes are selected through
eFUSE configuration.
SNVS Secure Non-Volatile Security Secure Non-Volatile Storage, including Secure Real
Storage Time Clock, Security State Machine, Master Key
Control, and Violation/Tamper Detection and reporting.
SPDIF Sony Philips Digital Multimedia A standard audio file transfer format, developed jointly
Interconnect Format Peripherals by the Sony and Phillips corporations. Has Transmitter
and Receiver functionality.
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Modules List
TSC Touch Screen Touch Controller With touch controller to support 4-wire and 5-wire
resistive touch panel.
TZASC Trust-Zone Address Security The TZASC (TZC-380 by Arm) provides security
Space Controller address region control functions required for intended
application. It is used on the path to the DRAM
controller.
UART1 UART Interface Connectivity Each of the UARTv2 module supports the following
UART2 Peripherals serial data transmit/receive protocols and
UART3 configurations:
UART4 • 7- or 8-bit data words, 1 or 2 stop bits, programmable
UART5 parity (even, odd or none)
UART6 • Programmable baud rates up to 5 Mbps.
UART7 • 32-byte FIFO on Tx and 32 half-word FIFO on Rx
UART8 supporting auto-baud
uSDHC1 SD/MMC and SDXC Connectivity i.MX 6ULL specific SoC characteristics:
uSDHC2 Enhanced Multi-Media Peripherals All four MMC/SD/SDIO controller IPs are identical and
Card / Secure Digital Host are based on the uSDHC IP. They are:
Controller • Fully compliant with MMC command/response sets
and Physical Layer as defined in the Multimedia Card
System Specification, v4.5/4.2/4.3/4.4/4.41/
including high-capacity (size > 2 GB) cards HC MMC.
• Fully compliant with SD command/response sets
and Physical Layer as defined in the SD Memory
Card Specifications, v3.0 including high-capacity
SDXC cards up to 2 TB.
• Fully compliant with SDIO command/response sets
and interrupt/read-wait mode as defined in the SDIO
Card Specification, Part E1, v3.0
Two ports support:
• 1-bit or 4-bit transfer mode specifications for SD and
SDIO cards up to UHS-I SDR104 mode (104 MB/s
max)
• 1-bit, 4-bit, or 8-bit transfer mode specifications for
MMC cards up to 52 MHz in both SDR and DDR
modes (104 MB/s max)
• 4-bit or 8-bit transfer mode specifications for eMMC
chips up to 200 MHz in HS200 mode (200 MB/s max)
However, the SoC level integration and I/O muxing logic
restrict the functionality to the following:
• Instances #1 and #2 are primarily intended to serve
as interfaces to on-board peripherals. These ports
are equipped with “Card detection” and “Write
Protection” pads and do not support hardware reset.
• All ports can work with 1.8 V and 3.3 V cards. There
are two completely independent I/O power domains
for Ports #1 and #2 in four bit configuration (SD
interface).
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Modules List
USB Universal Serial Bus 2.0 Connectivity USBO2 (USB OTG1 and USB OTG2) contains:
Peripherals • Two high-speed OTG 2.0 modules with integrated
HS USB PHYs
• Support eight Transmit (TX) and eight Receive (Rx)
endpoints, including endpoint 0
WDOG1 Watch Dog Timer Peripherals The Watch Dog Timer supports two comparison points
WDOG3 during each counting period. Each of the comparison
points is configurable to evoke an interrupt to the Arm
core, and a second point evokes an external event on
the WDOG line.
WDOG2 Watch Dog (TrustZone) Timer Peripherals The TrustZone Watchdog (TZ WDOG) timer module
(TZ) protects against TrustZone starvation by providing a
method of escaping normal mode and forcing a switch
to the TZ mode. TZ starvation is a situation where the
normal OS prevents switching to the TZ mode. Such
situation is undesirable as it can compromise the
system’s security. Once the TZ WDOG module is
activated, it must be serviced by TZ software on a
periodic basis. If servicing does not take place, the timer
times out. Upon a time-out, the TZ WDOG asserts a TZ
mapped interrupt that forces switching to the TZ mode.
If it is still not served, the TZ WDOG asserts a security
violation signal to the CSU. The TZ WDOG module
cannot be programmed or deactivated by a normal
mode SW.
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Modules List
CCM_CLK1_P/ One general purpose differential high speed clock Input/output is provided.
CCM_CLK1_N It can be used:
• To feed external reference clock to the PLLs and further to the modules inside SoC.
• To output internal SoC clock to be used outside the SoC as either reference clock or as a
functional clock for peripherals.
See the i.MX 6ULL Reference Manual (IMX6ULLRM) for details on the respective clock trees.
Alternatively one may use single ended signal to drive CLK1_P input. In this case corresponding
CLK1_N input should be tied to the constant voltage level equal 1/2 of the input signal swing.
Termination should be provided in case of high frequency signals.
After initialization, the CLK1 input/output can be disabled (if not used). If unused, either or both of
the CLK1_N/P pairs may remain unconnected.
RTC_XTALI/RTC_XTALO If the user wishes to configure RTC_XTALI and RTC_XTALO as an RTC oscillator, a 32.768 kHz
crystal, (100 k ESR, 10 pF load) should be connected between RTC_XTALI and RTC_XTALO.
Keep in mind the capacitors implemented on either side of the crystal are about twice the crystal
load capacitor. To hit the exact oscillation frequency, the board capacitors need to be reduced to
account for board and chip parasitics. The integrated oscillation amplifier is self biasing, but
relatively weak. Care must be taken to limit parasitic leakage from RTC_XTALI and RTC_XTALO
to either power or ground (>100 M). This will debias the amplifier and cause a reduction of startup
margin. Typically RTC_XTALI and RTC_XTALO should bias to approximately 0.5 V.
If it is desired to feed an external low frequency clock into RTC_XTALI the RTC_XTALO pin should
be remain unconnected or driven with a complimentary signal. The logic level of this forcing clock
should not exceed VDD_SNVS_CAP level and the frequency should be <100 kHz under typical
conditions.
In case when high accuracy real time clock are not required, system may use internal low
frequency ring oscillator. It is recommended to connect RTC_XTALI to GND and keep RTC_XTALO
unconnected.
XTALI/XTALO A 24.0 MHz crystal should be connected between XTALI and XTALO.
The crystal must be rated for a maximum drive level of 250 W. An ESR (equivalent series
resistance) of typical 80 is recommended. NXP BSP (board support package) software requires
24 MHz on XTALI/XTALO.
The crystal can be eliminated if an external 24 MHz oscillator is available in the system. In this
case, XTALO must be directly driven by the external oscillator and XTALI is disconnected.
If this clock is used as a reference for USB, then there are strict frequency tolerance and jitter
requirements. See OSC24M chapter and relevant interface specifications chapters for details.
DRAM_VREF When using DDR_VREF with DDR I/O, the nominal reference voltage must be half of the
NVCC_DRAM supply. The user must tie DDR_VREF to a precision external resistor divider. Use a
1 k 0.5% resistor to GND and a 1 k 0.5% resistor to NVCC_DRAM. Shunt each resistor with a
closely-mounted 0.1 µF capacitor.
To reduce supply current, a pair of 1.5 k 0.1% resistors can be used. Using resistors with
recommended tolerances ensures the ± 2% DDR_VREF tolerance (per the DDR3 specification) is
maintained when two DDR3 ICs plus the i.MX 6ULL are drawing current on the resistor divider.
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Modules List
ZQPAD DRAM calibration resistor 240 1% used as reference during DRAM output buffer driver
calibration should be connected between this pad and GND.
GPANAIO This signal is reserved for NXP manufacturing use only. This output must remain unconnected.
JTAG_nnnn The JTAG interface is summarized in Table 4. Use of external resistors is unnecessary. However,
if external resistors are used, the user must ensure that the on-chip pull-up/down configuration is
followed. For example, do not use an external pull down on an input that has on-chip pull-up.
JTAG_TDO is configured with a keeper circuit such that the non-connected condition is eliminated
if an external pull resistor is not present. An external pull resistor on JTAG_TDO is detrimental and
should be avoided.
JTAG_MOD is referenced as SJC_MOD in the i.MX 6ULL reference manual. Both names refer to
the same signal. JTAG_MOD must be externally connected to GND for normal operation.
Termination to GND through an external pull-down resistor (such as 1 k) is allowed. JTAG_MOD
set to hi configures the JTAG interface to mode compliant with IEEE1149.1 standard. JTAG_MOD
set to low configures the JTAG interface for common SW debug adding all the system TAPs to the
chain.
NC These signals are No Connect (NC) and should be disconnected by the user.
POR_B This cold reset negative logic input resets all modules and logic in the IC.
May be used in addition to internally generated power on reset signal (logical AND, both internal
and external signals are considered active low).
ONOFF ONOFF can be configured in debounce, off to on time, and max time-out configurations. The
debounce and off to on time configurations supports 0, 50, 100 and 500 ms. Debounce is used to
generate the power off interrupt. While in the ON state, if ONOFF button is pressed longer than the
debounce time, the power off interrupt is generated. Off to on time supports the time it takes to
request power on after a configured button press time has been reached. While in the OFF state,
if ONOFF button is pressed longer than the off to on time, the state will transition from OFF to ON.
Max time-out configuration supports 5, 10, 15 seconds and disable. Max time-out configuration
supports the time it takes to request power down after ONOFF button has been pressed for the
defined time.
TEST_MODE TEST_MODE is for NXP factory use. The user must tie this pin directly to GND.
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Modules List
Recommendations
Module Pad Name
if Unused
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Electrical Characteristics
4 Electrical Characteristics
This section provides the device and module-level electrical characteristics for the i.MX 6ULL processors.
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Electrical Characteristics
Natural convection
o 1,2,3
Junction to Ambient Four-layer board (2s2p) RJA 37.6 C/W
Natural convection
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Electrical Characteristics
1
Junction temperature is a function of die size, on-chip power dissipation, package thermal resistance, mounting site (board)
temperature, ambient temperature, air flow, power dissipation of other components on the board, and board thermal
resistance.
2
Per SEMI G38-87 and JEDEC JESD51-2 with the single layer board horizontal.
3
Per JEDEC JESD51-6 with the board horizontal.
4 Thermal resistance between the die and the printed circuit board per JEDEC JESD51-8. Board temperature is measured on
the top surface of the board near the package.
5 Thermal resistance between the die and the case top surface as measured by the cold plate method (MIL SPEC-883 Method
1012.1).
6 Thermal characterization parameter indicating the temperature difference between package top and the junction temperature
per JEDEC JESD51-2. When Greek letters are not available, the thermal characterization parameter is written as Psi-JT.
7 Thermal characterization parameter indicating the temperature difference between package bottom center and the junction
temperature per JEDEC JESD51-12. When Greek letters are not available, the thermal characterization parameter is written
as Psi-JB
Natural Convection
Junction to Ambient (@200 Single layer board (1s) RJMA 51.2 oC/W 1,3
ft/min)
Junction to Ambient (@200 Four layer board (2s2p) RJMA 31.8 oC/W 1,3
ft/min)
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Electrical Characteristics
1
Junction temperature is a function of die size, on-chip power dissipation, package thermal resistance, mounting site (board)
temperature, ambient temperature, air flow, power dissipation of other components on the board, and board thermal
resistance.
2
Per SEMI G38-87 and JEDEC JESD51-2 with the single layer board horizontal.
3
Per JEDEC JESD51-6 with the board horizontal.
4 Thermal resistances between the die and the printed circuit board per JEDEC JESD51-8. Board temperature is measured on
the top surface of the board near the package.
5
Thermal resistance between the die and the case top surface as measured by the cold plate method (MIL SPEC-883 Method
1012.1).
6
Thermal characterization parameter indicating the temperature difference between package top and the junction temperature
per JEDEC JESD51-2. When Greek letters are not available, the thermal characterization parameter is written as Psi-JT.
7
Thermal resistance between the die and the central solder balls on the bottom of the package based on simulation.
Parameter Operating
Symbol Min Typ Max1 Unit Comment
Description Conditions
Run Mode: LDO VDD_SOC_IN A7 core at 792 1.325 — 1.5 V VDD_SOC_IN must be 125 mV
Enabled MHz higher than the LDO Output Set
Point (VDD_ARM_CAP and
A7 core at 528 1.275 — 1.5 VDD_SOC_CAP) for correct
MHz and below supply voltage regulation.
Run Mode: LDO VDD_SOC_IN A7 core 1.15 — 1.26 V A7 core operation above 528 MHz
Bypassed operations at 528 is not supported when LDO is
MHz or below. bypassed.
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Electrical Characteristics
SUSPEND (DSM) VDD_SOC_IN — 0.9 — 1.26 V Refer to Table 15 Low Power Mode
Mode Current and Power Consumption
on page -29
VDD_HIGH VDD_HIGH_IN2 — 2.80 — 3.6 V Must match the range of voltages
internal regulator that the rechargeable backup
battery supports.
GPIO supplies NVCC_CSI2 — 1.65 1.8, 3.6 V All digital I/O supplies
2.8, (NVCC_xxxx) must be powered
NVCC_ENET2 3.3 (unless otherwise specified in this
NVCC_GPIO2 data sheet) under normal
conditions whether the associated
NVCC_UART2 I/O pins are in use or not.
NVCC_LCD2
NVCC_NAND2
NVCC_SD12
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Electrical Characteristics
Table 11 shows on-chip LDO regulators that can supply on-chip loads.
Table 11. On-Chip LDOs1 and their On-Chip Loads
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Electrical Characteristics
The typical values shown in Table 12 are required for use with NXP BSPs to ensure precise time keeping
and USB operation. For RTC_XTALI operation, two clock sources are available.
• On-chip 40 kHz ring oscillator—this clock source has the following characteristics:
— Approximately 25 µA more Idd than crystal oscillator
— Approximately ±50% tolerance
— No external component required
— Starts up quicker than 32 kHz crystal oscillator
• External crystal oscillator with on-chip support circuit:
— At power up, ring oscillator is utilized. After crystal oscillator is stable, the clock circuit
switches over to the crystal oscillator automatically.
— Higher accuracy than ring oscillator
— If no external crystal is present, then the ring oscillator is utilized
The decision of choosing a clock source should be taken based on real-time clock use and precision
time-out.
VDD_HIGH_IN — 1251 mA
VDD_SNVS_IN — 5002 A
USB_OTG1_VBUS — 503 mA
USB_OTG2_VBUS
NVCC_DRAM — (See4) —
NVCC_DRAM_2P5 — 50 mA
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Electrical Characteristics
MISC
DRAM_VREF — 1 mA
1
The actual maximum current drawn from VDD_HIGH_IN will be as shown plus any additional current drawn from the
VDD_HIGH_CAP outputs, depending upon actual application configuration (for example, NVCC_DRAM_2P5 supplies).
2
The maximum VDD_SNVS_IN current may be higher depending on specific operating configurations, such as
BOOT_MODE[1:0] not equal to 00, or use of the Tamper feature. During initial power on, VDD_SNVS_IN can draw up to 1
mA, if available. VDD_SNVS_CAP charge time will increase if less than 1 mA is available.
3 This is the maximum current per active USB physical interface.
4
The DRAM power consumption is dependent on several factors, such as external signal termination. DRAM power
calculators are typically available from the memory vendors. They take in account factors, such as signal termination. See
the i.MX 6ULL Power Consumption Measurement Application Note (AN4581) or examples of DRAM power consumption
during specific use case scenarios.
5
General equation for estimated, maximum power consumption of an IO power supply:
Imax = N x C x V x (0.5 x F)
Where:
N—Number of IO pins supplied by the power line
C—Equivalent external capacitive load
V—IO voltage
(0.5 xF)—Data change rate. Up to 0.5 of the clock rate (F)
In this equation, Imax is in Amps, C in Farads, V in Volts, and F in Hertz.
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Electrical Characteristics
VDD_SNVS ON ON ON OFF
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Electrical Characteristics
Table 15. Low Power Mode Current and Power Consumption (continued)
SYSTEM IDLE: • LDO_ARM and LDO_SOC are set to 1.15 V VDD_SOC_IN (1.325 V) 9 mA
LDO Enabled • LDO_2P5 set to 2.5 V, LDO_1P1 set to 1.1 V
• CPU in WFI, CPU clock gated VDD_HIGH_IN (3.0 V) 9.7
• DDR is in self refresh VDD_SNVS_IN (3.0 V) 0.04
• 24 MHz XTAL is ON
• 528 PLL is active, other PLLs are power down Total 41.15 mW
• High-speed peripheral clock gated, but remain
powered
SYSTEM IDLE: • LDO_ARM and LDO_SOC are set to bypass VDD_SOC_IN (1.25 V) 8.5 mA
LDO Bypassed mode
• LDO_2P5 set to 2.5 V, LDO_1P1 set to 1.1 V VDD_HIGH_IN (3.0 V) 8.8
• CPU in WFI, CPU clock gated VDD_SNVS_IN (3.0 V) 0.04
• DDR is in self refresh
• 24 MHz XTAL is ON Total 37.15 mW
• 528 PLL is active, other PLLs are power down
• High-speed peripheral clock gated, but remain
powered
LOW POWER IDLE: • LDO_SOC is set to 1.15 V, LDO_ARM is in PG VDD_SOC_IN (1.025 V) 1.6 mA
LDO Enabled mode
• LDO_2P5 and LDO_1P1 are set to weak mode VDD_HIGH_IN (3.0 V) 1.25
• CPU in power gate mode VDD_SNVS_IN (3.0 V) 0.03
• DDR is in self refresh
• All PLLs are power down Total 5.48 mW
• 24 MHz XTAL is off, 24 MHz RCOSC used as
clock source
• High-speed peripheral are powered off
LOW POWER IDLE: • LDO_SOC is in bypass mode, LDO_ARM is in PG VDD_SOC_IN (0.9 V) 1.5 mA
LDO Bypassed mode
• LDO_2P5 and LDO_1P1 are set to weak mode VDD_HIGH_IN (3.0 V) 0.3
• CPU in power gate mode VDD_SNVS_IN (3.0 V) 0.05
• DDR is in self refresh
• All PLLs are power down Total 2.4 mW
• 24 MHz XTAL is off, 24 MHz RCOSC used as
clock source
• High-speed peripheral are powered off
SNVS: • All SOC digital logic, analog module are shut off VDD_SOC_IN (0 V) 0 mA
• 32 kHz RTC is alive
• Tamper detection circuit remains active VDD_HIGH_IN (0 V) 0
Total 0.09 mW
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Electrical Characteristics
NOTE
The currents on the VDD_HIGH_CAP and VDD_USB_CAP were
identified to be the voltage divider circuits in the USB-specific level
shifters.
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Electrical Characteristics
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Electrical Characteristics
only and should not be used to power any external circuitry. See the i.MX 6ULL Reference Manual
(IMX6ULLRM) for details on the power tree scheme.
NOTE
The *_CAP signals should not be powered externally. These signals are
intended for internal LDO operation only.
4.3.2.1 LDO_1P1
The LDO_1P1 regulator implements a programmable linear-regulator function from VDD_HIGH_IN (see
Table 10 for minimum and maximum input requirements). Typical Programming Operating Range is 1.0
V to 1.2 V with the nominal default setting as 1.1 V. The LDO_1P1 supplies the USB PHY, and PLLs. A
programmable brown-out detector is included in the regulator that can be used by the system to determine
when the load capability of the regulator is being exceeded to take the necessary steps. Current-limiting
can be enabled to allow for in-rush current requirements during start-up, if needed. Active-pull-down can
also be enabled for systems requiring this feature.
For information on external capacitor requirements for this regulator, see the Hardware Development
Guide for i.MX 6ULL Applications Processors (IMX6ULLHDG).
For additional information, see the i.MX 6ULL Reference Manual (IMX6ULLRM).
4.3.2.2 LDO_2P5
The LDO_2P5 module implements a programmable linear-regulator function from VDD_HIGH_IN (see
Table 10 for minimum and maximum input requirements). Typical Programming Operating Range is
2.25 V to 2.75 V with the nominal default setting as 2.5 V. LDO_2P5 supplies the DDR IOs, USB PHY,
E-fuse module, and PLLs. A programmable brown-out detector is included in the regulator that can be
used by the system to determine when the load capability of the regulator is being exceeded, to take the
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Electrical Characteristics
necessary steps. Current-limiting can be enabled to allow for in-rush current requirements during start-up,
if needed. Active-pull-down can also be enabled for systems requiring this feature. An alternate self-biased
low-precision weak-regulator is included that can be enabled for applications needing to keep the output
voltage alive during low-power modes where the main regulator driver and its associated global bandgap
reference module are disabled. The output of the weak-regulator is not programmable and is a function of
the input supply as well as the load current. Typically, with a 3 V input supply the weak-regulator output
is 2.525 V and its output impedance is approximately 40 ..
For information on external capacitor requirements for this regulator, see the Hardware Development
Guide for i.MX 6ULL Applications Processors (IMX6ULLHDG).
For additional information, see the i.MX 6ULL Reference Manual (IMX6ULLRM).
4.3.2.3 LDO_USB
The LDO_USB module implements a programmable linear-regulator function from the USB VUSB
voltages (4.4 V–5.5 V) to produce a nominal 3.0 V output voltage. A programmable brown-out detector
is included in the regulator that can be used by the system to determine when the load capability of the
regulator is being exceeded, to take the necessary steps. This regulator has a built in power-mux that allows
the user to select to run the regulator from either USB VBUS supply, when both are present. If only one
of the USB VBUS voltages is present, then, the regulator automatically selects this supply. Current limit
is also included to help the system meet in-rush current targets.
For information on external capacitor requirements for this regulator, see the Hardware Development
Guide for i.MX 6ULL Applications Processors (IMX6ULLHDG).
For additional information, see the i.MX 6ULL Reference Manual (IMX6ULLRM).
Parameter Value
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Electrical Characteristics
Parameter Value
Parameter Value
Parameter Value
Parameter Value
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Electrical Characteristics
4.5.1 OSC24M
This block implements an amplifier that when combined with a suitable quartz crystal and external load
capacitors implement an oscillator. The oscillator is powered from NVCC_PLL.
The system crystal oscillator consists of a Pierce-type structure running off the digital supply. A straight
forward biased-inverter implementation is used.
4.5.2 OSC32K
This block implements an amplifier that when combined with a suitable quartz crystal and external load
capacitors implement a low power oscillator. It also implements a power mux such that it can be powered
from either a ~3 V backup battery (VDD_SNVS_IN) or VDD_HIGH_IN such as the oscillator consumes
power from VDD_HIGH_IN when that supply is available and transitions to the backup battery when
VDD_HIGH_IN is lost.
In addition, if the clock monitor determines that the OSC32K is not present, then the source of the 32 K
will automatically switch to a crude internal ring oscillator. The frequency range of this block is
approximately 10–45 kHz. It highly depends on the process, voltage, and temperature.
The OSC32k runs from VDD_SNVS_CAP supply, which comes from the
VDD_HIGH_IN/VDD_SNVS_IN. The target battery is a ~3 V coin cell. Proper choice of coin cell type
is necessary for chosen VDD_HIGH_IN range. Appropriate series resistor (Rs) must be used when
connecting the coin cell. Rs depends on the charge current limit that depends on the chosen coin cell. For
example, for Panasonic ML621:
• Average Discharge Voltage is 2.5 V
• Maximum Charge Current is 0.6 mA
For a charge voltage of 3.2 V, Rs = (3.2-2.5)/0.6 m = 1.17 k.
Table 22. OSC32K Main Characteristics
Fosc — 32.768 KHz — This frequency is nominal and determined mainly by the crystal selected.
32.0 K would work as well.
Current consumption — 4 A — The 4 A is the consumption of the oscillator alone (OSC32k). Total supply
consumption will depend on what the digital portion of the RTC consumes.
The ring oscillator consumes 1 A when ring oscillator is inactive, 20 A
when the ring oscillator is running. Another 1.5 A is drawn from vdd_rtc
in the power_detect block. So, the total current is 6.5 A on vdd_rtc when
the ring oscillator is not running.
Bias resistor — 14 M — This the integrated bias resistor that sets the amplifier into a high gain
state. Any leakage through the ESD network, external board leakage, or
even a scope probe that is significant relative to this value will debias the
amp. The debiasing will result in low gain, and will impact the circuit's ability
to start up and maintain oscillations.
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Electrical Characteristics
Crystal Properties
Cload — 10 pF — Usually crystals can be purchased tuned for different Cloads. This Cload
value is typically 1/2 of the capacitances realized on the PCB on either side
of the quartz. A higher Cload will decrease oscillation margin, but
increases current oscillating through the crystal.
ESR — 50 k 100 k Equivalent series resistance of the crystal. Choosing a crystal with a higher
value will decrease the oscillating margin.
Figure 3. Circuit for Parameters Voh and Vol for I/O Cells
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Electrical Characteristics
1
The DC parameters are for external clock input only.
Keeper Circuit Resistance R_Keeper VI =0.3 x OVDD, VI = 0.7 x OVDD 105 175 k
1 Overshoot and undershoot conditions (transitions above OVDD and below GND) on switching pads must be held below 0.6 V,
and the duration of the overshoot/undershoot must not exceed 10% of the system clock cycle. Overshoot/ undershoot must be
controlled through printed circuit board layout, transmission line impedance matching, signal line termination, or other
methods. Non-compliance to this specification may affect device reliability or cause permanent damage to the device.
2 To maintain a valid level, the transition edge of the input must sustain a constant slew rate (monotonic) from the current DC
level through to the target DC level, Vil or Vih. Monotonic input transition time is from 0.1 ns to 1 s.
3
Hysteresis of 250 mV is guaranteed over all operating conditions when hysteresis is enabled.
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Electrical Characteristics
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Electrical Characteristics
Termination Voltage Vtt Vtt tracking OVDD/2 0.49 x OVDD 0.51 x OVDD V
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Electrical Characteristics
OVDD
80% 80%
20% 20%
Output (at pad) 0V
tr tf
Output Pad Transition Times, rise/fall tr, tf 22 pF Cload, slow slew rate 2.72/2.79
— —
(Max Drive, ipp_dse=111) 22 pF Cload, fast slew rate 1.69/1.82
Output Pad Transition Times, rise/fall tr, tf 22 pF Cload, slow slew rate 3.99/4.44
— —
(High Drive, ipp_dse=101) 22 pF Cload, fast slew rate 2.14/2.50 ns
Output Pad Transition Times, rise/fall tr, tf 22 pF Cload, slow slew rate 4.52/5.01
— —
(Medium Drive, ipp_dse=100) 22 pF Cload, fast slew rate 2.52/3.07
Output Pad Transition Times, rise/fall tr, tf 22 pF Cload, slow slew rate 5.15/5.68
— —
(Low Drive. ipp_dse=011) 22 pF Cload, fast slew rate 3.44/3.73
Input Transition Times1 trm — — — 25 ns
1 Hysteresis mode is recommended for inputs with transition times greater than 25 ns.
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Electrical Characteristics
Output Pad Transition Times, rise/fall tr, tf 22 pF Cload, slow slew rate 1.84/2.06
— —
(Max Drive, ipp_dse=101) 22 pF Cload, fast slew rate 1.09/1.35
Output Pad Transition Times, rise/fall tr, tf 22 pF Cload, slow slew rate 2.44/2.75
— —
(High Drive, ipp_dse=011) 22 pF Cload, fast slew rate 1.75/2.02 ns
Output Pad Transition Times, rise/fall tr, tf 22 pF Cload, slow slew rate 3.26/3.70
— —
(Medium Drive, ipp_dse=010) 22 pF Cload, fast slew rate 2.47/2.92
Output Pad Transition Times, rise/fall tr, tf 22 pF Cload, slow slew rate 5.26/6.19
— —
(Low Drive. ipp_dse=001) 22 pF Cload, fast slew rate 4.88/5.77 ns
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Electrical Characteristics
Skew between pad rise/fall asymmetry + skew tSKD clk = 400 MHz — 0.1 ns
caused by SSN
1
Note that the JEDEC LPDDR2 specification (JESD209_2B) supersedes any specification in this document.
2
Vid(ac) specifies the input differential voltage | Vtr - Vcp | required for switching, where Vtr is the “true” input signal and Vcp
is the “complementary” input signal. The Minimum value is equal to Vih(ac) - Vil(ac).
3 The typical value of Vix(ac) is expected to be about 0.5 x OVDD. and Vix(ac) is expected to track variation of OVDD. Vix(ac)
Table 32 shows the AC parameters for DDR I/O operating in DDR3/DDR3L mode.
Table 32. DDR I/O DDR3/DDR3L Mode AC Parameters1
Single output slew rate, measured between Vol tsr Driver impedance = 34 2.5 — 5 V/ns
(ac) and Voh (ac)
Skew between pad rise/fall asymmetry + skew tSKD clk = 400 MHz — — 0.1 ns
caused by SSN
1 Note that the JEDEC JESD79_3C specification supersedes any specification in this document.
2 Vid(ac) specifies the input differential voltage | Vtr-Vcp | required for switching, where Vtr is the “true” input signal and Vcp is
the “complementary” input signal. The Minimum value is equal to Vih(ac) - Vil(ac).
3 The typical value of Vix(ac) is expected to be about 0.5 x OVDD. and Vix(ac) is expected to track variation of OVDD. Vix(ac)
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Electrical Characteristics
• Double Data Rate I/O (DDR) for LPDDR2, and DDR3/DDR3L modes
NOTE
GPIO and DDR I/O output driver impedance is measured with “long”
transmission line of impedance Ztl attached to I/O pad and incident wave
launched into transmission line. Rpu/Rpd and Ztl form a voltage divider that
defines specific voltage of incident wave relative to OVDD. Output driver
impedance is calculated from this voltage divider (see Figure 6).
OVDD
PMOS (Rpu)
Ztl , L = 20 inches
ipp_do pad
predriver
Cload = 1p
NMOS (Rpd)
OVSS
U,(V)
Vin (do)
VDD
t,(ns)
0
U,(V)
Vout (pad)
OVDD
Vref1 Vref2
Vref
t,(ns)
0
Vovdd - Vref1
Rpu = Ztl
Vref1
Vref2
Rpd = Ztl
Vovdd - Vref2
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Electrical Characteristics
001 260
010 130
Output Driver Rdrv 011 88
Impedance 100 65
101 52
110 43
111 37
Table 34 shows the GPIO output buffer impedance (OVDD 3.3 V).
Table 34. GPIO Output Buffer Average Impedance (OVDD 3.3 V)
001 157
010 78
Output Driver Rdrv 011 53
Impedance 100 39
101 32
110 26
111 23
Typical
Test Conditions DSE
Parameter Symbol NVCC_DRAM=1.5 V NVCC_DRAM=1.2 V Unit
(Drive Strength)
(DDR3) (LPDDR2)
DDR_SEL=11 DDR_SEL=10
Note:
1. Output driver impedance is controlled across PVTs using ZQ calibration procedure.
2. Calibration is done against 240 external reference resistor.
3. Output driver impedance deviation (calibration accuracy) is ±5% (max/min impedance) across PVTs.
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Electrical Characteristics
POR_B
(Input)
CC1
WDOGn_B
(Output)
CC3
NOTE
RTC_XTALI is approximately 32 kHz. RTC_XTALI cycle is one period or
approximately 30 s.
NOTE
WDOG1_B output signals (for each one of the Watchdog modules) do not
have dedicated pins, but are muxed out through the IOMUX. See the IOMUX
manual for detailed information.
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Electrical Characteristics
WE2
EIM_BCLK
... WE3
WE8 WE9
EIM_WE_B
WE10 WE11
EIM_OE_B
WE12 WE13
EIM_EBx_B
WE14 WE15
EIM_LBA_B
WE16 WE17
Output Data
EIM_BCLK
WE18
Input Data
WE19
WE20
EIM_WAIT_B
WE21
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Electrical Characteristics
WE4 Clock rise to -0.5 x t - -0.5 x t + 1.75 -t - 1.25 -t + 1.75 -1.5 x t - -1.5 x t -2 x t - -2 x t + 1.75
address valid3 1.25 1.25 +1.75 1.25
WE5 Clock rise to 0.5 x t - 0.5 x t + 1.75 t - 1.25 t + 1.75 1.5 x t - 1.5 x t 2xt- 2 x t + 1.75
address invalid 1.25 1.25 +1.75 1.25
WE6 Clock rise to -0.5 x t - -0.5 x t + 1.75 -t - 1.25 - t + 1.75 -1.5 x t - -1.5 x t -2 x t - -2 x t + 1.75
EIM_CSx_B valid 1.25 1.25 +1.75 1.25
WE7 Clock rise to 0.5 x t - 0.5 x t + 1.75 t - 1.25 t + 1.75 1.5 x t - 1.5 x t 2xt- 2 x t + 1.75
EIM_CSx_B invalid 1.25 1.25 +1.75 1.25
WE8 Clock rise to -0.5 x t - -0.5 x t + 1.75 -t - 1.25 - t + 1.75 -1.5 x t - -1.5 x t -2 x t - -2 x t + 1.75
EIM_WE_B Valid 1.25 1.25 +1.75 1.25
WE9 Clock rise to 0.5 x t - 0.5 x t + 1.75 t - 1.25 t + 1.75 1.5 x t - 1.5 x t 2xt- 2 x t + 1.75
EIM_WE_B Invalid 1.25 1.25 +1.75 1.25
WE10 Clock rise to -0.5 x t - -0.5 x t + 1.75 -t - 1.25 - t + 1.75 -1.5 x t - -1.5 x t -2 x t - -2 x t + 1.75
EIM_OE_B Valid 1.25 1.25 +1.75 1.25
WE11 Clock rise to 0.5 x t - 0.5 x t + 1.75 t - 1.25 t + 1.75 1.5 x t - 1.5 x t 2xt- 2 x t + 1.75
EIM_OE_B Invalid 1.25 1.25 +1.75 1.25
WE12 Clock rise to -0.5 x t - -0.5 x t + 1.75 -t - 1.25 - t + 1.75 -1.5 x t - -1.5 x t -2 x t - -2 x t + 1.75
EIM_EBx_B Valid 1.25 1.25 +1.75 1.25
WE13 Clock rise to 0.5 x t - 0.5 x t + 1.75 t - 1.25 t + 1.75 1.5 x t - 1.5 x t 2xt- 2 x t + 1.75
EIM_EBx_B Invalid 1.25 1.25 +1.75 1.25
WE14 Clock rise to -0.5 x t - -0.5 x t + 1.75 -t - 1.25 - t + 1.75 -1.5 x t - -1.5 x t -2 x t - -2 x t + 1.75
EIM_LBA_B Valid 1.25 1.25 +1.75 1.25
WE15 Clock rise to 0.5 x t - 0.5 x t + 1.75 t - 1.25 t + 1.75 1.5 x t - 1.5 x t 2xt- 2 x t + 1.75
EIM_LBA_B Invalid 1.25 1.25 +1.75 1.25
WE16 Clock rise to -0.5 x t - -0.5 x t + 1.75 -t - 1.25 - t + 1.75 -1.5 x t - -1.5 x t -2 x t - -2 x t + 1.75
Output Data Valid 1.25 1.25 +1.75 1.25
WE17 Clock rise to 0.5 x t - 0.5 x t + 1.75 t - 1.25 t + 1.75 1.5 x t - 1.5 x t 2xt- 2 x t + 1.75
Output Data Invalid 1.25 1.25 +1.75 1.25
WE20 EIM_WAIT_B 2 — 4 — — — — —
setup time to Clock
rise
i.MX 6ULL Applications Processors for Industrial Products, Rev. 1.2, 11/2017
NXP Semiconductors 49
Electrical Characteristics
1
t is the maximum EIM logic (axi_clk) cycle time. The maximum allowed axi_clk frequency depends on the fixed/non-fixed
latency configuration, whereas the maximum allowed EIM_BCLK frequency is:
—Fixed latency for both read and write is 132 MHz.
—Variable latency for read only is 132 MHz.
—Variable latency for write only is 52 MHz.
In variable latency configuration for write, if BCD = 0 & WBCDD = 1 or BCD = 1, axi_clk must be 104 MHz. Write BCD = 1 and
104 MHz axi_clk, will result in an EIM_BCLK of 52 MHz. When the clock branch to EIM is decreased to 104 MHz, other buses
are impacted which are clocked from this source. See the CCM chapter of the i.MX 6ULL Reference Manual (IMX6ULLRM) for
a detailed clock tree description.
2
EIM_BCLK parameters are being measured from the 50% point, that is, high is defined as 50% of signal value and low is
defined as 50% as signal value.
3
For signal measurements, “High” is defined as 80% of signal value and “Low” is defined as 20% of signal value.
Figure 11 to Figure 14 provide few examples of basic EIM accesses to external memory devices with the
timing parameters mentioned previously for specific control parameters settings.
EIM_WE_B
WE14
EIM_LBA_B WE15
WE10 WE11
EIM_OE_B
WE12 WE13
EIM_EBx_B
WE18
EIM_DATAxx D(v1)
WE19
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50 NXP Semiconductors
Electrical Characteristics
EIM_BCLK
WE4 WE5
EIM_ADDRxx Last Valid Address Address V1
WE6 WE7
EIM_CSx_B
WE8 WE9
EIM_WE_B
WE14
EIM_LBA_B
WE15
EIM_OE_B
WE13
WE12
EIM_EBx_B
WE16 WE17
EIM_DATAxx D(V1)
Figure 12. Synchronous Memory, Write Access, WSC=1, WBEA=0 and WADVN=0
EIM_BCLK
WE5 WE16 WE17
EIM_ADDRxx/ WE4
EIM_ADxx Last Valid Address Address V1 Write Data
WE6 WE7
EIM_CSx_B
WE8 WE9
EIM_WE_B
WE14 WE15
EIM_LBA_B
EIM_OE_B
WE10 WE11
EIM_EBx_B
Figure 13. Muxed Address/Data (A/D) Mode, Synchronous Write Access, WSC=6, ADVA=0, ADVN=1, and
ADH=1
NOTE
In 32-bit muxed address/data (A/D) mode the 16 MSBs are driven on the
data bus.
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NXP Semiconductors 51
Electrical Characteristics
EIM_BCLK
WE4 WE5 WE19
EIM_ADDRxx/ Last Valid Address Address V1 Data
EIM_ADxx WE6 WE18
EIM_CSx_B
WE7
EIM_WE_B
WE14 WE15
EIM_LBA_B WE10
WE11
EIM_OE_B
WE12 WE13
EIM_EBx_B
Figure 14. 16-Bit Muxed A/D Mode, Synchronous Read Access, WSC=7, RADVN=1, ADH=1, OEA=0
start of end of
access access
INT_CLK
EIM_CSx_B MAXCSO
EIM_WE_B
WE39 WE40
EIM_LBA_B
WE35 WE36
EIM_OE_B
WE37 WE38
EIM_EBx_B
WE44
EIM_DATAxx[7:0] MAXCO
D(V1)
WE43 MAXDI
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52 NXP Semiconductors
Electrical Characteristics
start of end of
access access
INT_CLK
MAXCSO
EIM_CSx_B
EIM_ADDRxx/ WE31 MAXDI
EIM_ADxx Addr. V1 D(V1)
WE32A
WE44
EIM_WE_B
WE40A
WE39
EIM_LBA_B
WE35A WE36
EIM_OE_B
WE37 WE38
EIM_EBx_B
MAXCO
Figure 16. Asynchronous A/D Muxed Read Access (RWSC = 5)
EIM_CSx_B
WE41
EIM_ADDRxx/ WE31
Addr. V1 D(V1)
EIM_DATAxx WE32A WE42
WE33 WE34
EIM_WE_B
WE40A
WE39
EIM_LBA_B
EIM_OE_B
WE45 WE46
EIM_EBx_B
i.MX 6ULL Applications Processors for Industrial Products, Rev. 1.2, 11/2017
NXP Semiconductors 53
Electrical Characteristics
EIM_CSx_B
WE41
EIM_ADDRxx/ WE31
Addr. V1 D(V1)
EIM_DATAxx WE32A WE42
WE33 WE34
EIM_WE_B
WE40A
WE39
EIM_LBA_B
EIM_OE_B
WE45 WE46
EIM_EBx_B
EIM_CSx_B
EIM_ADDRxx WE31 WE32
Last Valid Address Address V1 Next Address
EIM_WE_B
WE39 WE40
EIM_LBA_B
WE35 WE36
EIM_OE_B
WE37 WE38
EIM_EBx_B WE44
D(V1)
EIM_DATAxx[7:0] WE43
WE48
EIM_DTACK_B
WE47
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54 NXP Semiconductors
Electrical Characteristics
EIM_CSx_B
WE31 WE32
EIM_ADDRxx Last Valid Address Address V1 Next Address
WE33 WE34
EIM_WE_B
WE39 WE40
EIM_LBA_B
EIM_OE_B
WE45 WE46
EIM_EBx_B
WE42
EIM_DATAxx D(V1)
WE41 WE48
EIM_DTACK_B
WE47
Figure 20. DTACK Mode Write Access (DAP=0)
Table 40. EIM Asynchronous Timing Parameters Table Relative Chip to Select
Determination by Max
Ref No. Parameter Synchronous measured Min (If 132 MHz is Unit
parameters1 supported by SoC)
i.MX 6ULL Applications Processors for Industrial Products, Rev. 1.2, 11/2017
NXP Semiconductors 55
Electrical Characteristics
Table 40. EIM Asynchronous Timing Parameters Table Relative Chip to Select (continued)
Determination by Max
Ref No. Parameter Synchronous measured Min (If 132 MHz is Unit
parameters1 supported by SoC)
WE40A EIM_CSx_B Valid to WE14 - WE6 + (ADVN + ADVA -3 + (ADVN + 3 + (ADVN + ADVA + ns
(muxed EIM_LBA_B Invalid + 1 - CSA) ADVA + 1 - CSA) 1 - CSA)
A/D)
WE41 EIM_CSx_B Valid to Output WE16 - WE6 - WCSA — 3 - WCSA ns
Data Valid
i.MX 6ULL Applications Processors for Industrial Products, Rev. 1.2, 11/2017
56 NXP Semiconductors
Electrical Characteristics
Table 40. EIM Asynchronous Timing Parameters Table Relative Chip to Select (continued)
Determination by Max
Ref No. Parameter Synchronous measured Min (If 132 MHz is Unit
parameters1 supported by SoC)
Chip selects 2 2 2
i.MX 6ULL Applications Processors for Industrial Products, Rev. 1.2, 11/2017
NXP Semiconductors 57
Electrical Characteristics
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i.MX 6ULL Applications Processors for Industrial Products, Rev. 1.2, 11/2017
58 NXP Semiconductors
Electrical Characteristics
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Figure 24. Read Data Latch Cycle Timing Diagram (Non-EDO Mode)
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Figure 25. Read Data Latch Cycle Timing Diagram (EDO Mode)
Timing
T = GPMI Clock Cycle
ID Parameter Symbol Unit
Min. Max.
NF1 NAND_CLE setup time tCLS (AS + DS) T - 0.12 [see 2,3] ns
i.MX 6ULL Applications Processors for Industrial Products, Rev. 1.2, 11/2017
NXP Semiconductors 59
Electrical Characteristics
Timing
T = GPMI Clock Cycle
ID Parameter Symbol Unit
Min. Max.
NF6 NAND_ALE setup time tALS (AS + DS) T - 0.49 [see 3,2] ns
In EDO mode (Figure 24), NF16/NF17 is different from the definition in non-EDO mode (Figure 23).
They are called tREA/tRHOH (RE# access time/RE# HIGH to output hold). The typical values for them
are 16 ns (max for tREA)/15 ns (min for tRHOH) at 50 MB/s EDO mode. In EDO mode, GPMI will
sample NAND_DATAxx at rising edge of delayed NAND_RE_B provided by an internal DPLL. The
delay value can be controlled by GPMI_CTRL1.RDN_DELAY (see the GPMI chapter of the i.MX 6ULL
Reference Manual). The typical value of this control register is 0x8 at 50 MT/s EDO mode. But if the board
delay is big enough and cannot be ignored, the delay value should be made larger to compensate the board
delay.
i.MX 6ULL Applications Processors for Industrial Products, Rev. 1.2, 11/2017
60 NXP Semiconductors
Electrical Characteristics
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i.MX 6ULL Applications Processors for Industrial Products, Rev. 1.2, 11/2017
NXP Semiconductors 61
Electrical Characteristics
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i.MX 6ULL Applications Processors for Industrial Products, Rev. 1.2, 11/2017
62 NXP Semiconductors
Electrical Characteristics
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Timing
T = GPMI Clock Cycle
ID Parameter Symbol Unit
Min. Max.
NF25 NAND_CLE and NAND_ALE setup time tCALS 0.5 tCK - 0.86 ns
NF26 NAND_CLE and NAND_ALE hold time tCALH 0.5 tCK - 0.37 ns
For DDR Source sync mode, Figure 29 shows the timing diagram of NAND_DQS/NAND_DATAxx read
valid window. The typical value of tDQSQ is 0.85ns (max) and 1ns (max) for tQHS at 200MB/s. GPMI
will sample NAND_DATA[7:0] at both rising and falling edge of a delayed NAND_DQS signal, which
can be provided by an internal DPLL. The delay value can be controlled by GPMI register
GPMI_READ_DDR_DLL_CTRL.SLV_DLY_TARGET (see the GPMI chapter of the i.MX 6ULL
Reference Manual). Generally, the typical delay value of this register is equal to 0x7 which means 1/4
i.MX 6ULL Applications Processors for Industrial Products, Rev. 1.2, 11/2017
NXP Semiconductors 63
Electrical Characteristics
clock cycle delay expected. But if the board delay is big enough and cannot be ignored, the delay value
should be made larger to compensate the board delay.
DEV?CLK
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i.MX 6ULL Applications Processors for Industrial Products, Rev. 1.2, 11/2017
64 NXP Semiconductors
Electrical Characteristics
DEV?CLK
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Timing
Symbo T = GPMI Clock Cycle Uni
ID Parameter
l t
Min. Max.
NF1 NAND_CLE setup time tCLS (AS + DS) T - 0.12 [see 2,3] —
NF2 NAND_CLE hold time tCLH DH T - 0.72 [see 2] —
NF3 NAND_CE0_B setup time tCS (AS + DS) T - 0.58 [see 3,2] —
NF6 NAND_ALE setup time tALS (AS + DS) T - 0.49 [see 3,2] —
i.MX 6ULL Applications Processors for Industrial Products, Rev. 1.2, 11/2017
NXP Semiconductors 65
Electrical Characteristics
Timing
Symbo T = GPMI Clock Cycle Uni
ID Parameter
l t
Min. Max.
For DDR Toggle mode, Figure 29 shows the timing diagram of NAND_DQS/NAND_DATAxx read valid
window. The typical value of tDQSQ is 1.4 ns (max) and 1.4 ns (max) for tQHS at 133 MB/s. GPMI will
sample NAND_DATA[7:0] at both rising and falling edge of an delayed NAND_DQS signal, which is
provided by an internal DPLL. The delay value of this register can be controlled by GPMI register
GPMI_READ_DDR_DLL_CTRL.SLV_DLY_TARGET (see the GPMI chapter of the i.MX 6ULL
Reference Manual). Generally, the typical delay value is equal to 0x7 which means 1/4 clock cycle delay
expected. But if the board delay is big enough and cannot be ignored, the delay value should be made larger
to compensate the board delay.
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66 NXP Semiconductors
Electrical Characteristics
(VSYNC), then CSI_HSYNC (HSYNC) is asserted and holds for the entire line. The pixel clock,
CSI_PIXCLK (PIXCLK), is valid as long as HSYNC is asserted.
CSI_VSYNC
P1
CSI_HSYNC
P7
P2 P5 P6
CSI_PIXCLK
P3 P4
CSI_DATA[15:00]
Figure 32. CSI Gated Clock Mode—Sensor Data at Falling Edge, Latch Data at Rising Edge
CSI_VSYNC
P1
CSI_HSYNC
P7
P2 P6 P5
CSI_PIXCLK
P3 P4
CSI_DATA[15:00]
Figure 33. CSI Gated Clock Mode—Sensor Data at Rising Edge, Latch Data at Falling Edge
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NXP Semiconductors 67
Electrical Characteristics
CSI_VSYNC
P1
P6
P4 P5
CSI_PIXCLK
P2 P3
CSI_DATA[15:00]
Figure 34. CSI Ungated Clock Mode—Sensor Data at Falling Edge, Latch Data at Rising Edge
The CSI enables the chip to connect directly to external CMOS image sensors, which are classified as
dumb or smart as follows:
• Dumb sensors only support traditional sensor timing (vertical sync (VSYNC) and horizontal sync
(HSYNC)) and output-only Bayer and statistics data.
• Smart sensors support CCIR656 video decoder formats and perform additional processing of the
image (for example, image compression, image pre-filtering, and various data output formats).
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68 NXP Semiconductors
Electrical Characteristics
ECSPIx_RDY_B
ECSPIx_MOSI
CS9
CS8
ECSPIx_MISO
CS5 ECSPIx_SS_B Lead Time (CS setup time) tSCS Half ECSPIx_SCLK period - 4 — ns
CS6 ECSPIx_SS_B Lag Time (CS hold time) tHCS Half ECSPIx_SCLK period - 2 — ns
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Electrical Characteristics
ECSPIx_SS_B
CS1 CS2 CS6 CS5
CS4
ECSPIx_SCLK
CS2
CS9
ECSPIx_MISO
CS7 CS8
ECSPIx_MOSI
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70 NXP Semiconductors
Electrical Characteristics
Characteristics1,2
No. Symbol Expression2 Min Max Condition3 Unit
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NXP Semiconductors 71
Electrical Characteristics
Characteristics1,2
No. Symbol Expression2 Min Max Condition3 Unit
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72 NXP Semiconductors
Electrical Characteristics
2
bl = bit length
wl = word length
wr = word length relative
3
ESAI_TX_CLK(SCKT pin) = transmit clock
ESAI_RX_CLK(SCKR pin) = receive clock
ESAI_TX_FS(FST pin) = transmit frame sync
ESAI_RX_FS(FSR pin) = receive frame sync
ESAI_TX_HF_CLK(HCKT pin) = transmit high frequency clock
ESAI_RX_HF_CLK(HCKR pin) = receive high frequency clock
4
For the internal clock, the external clock cycle is defined by Icyc and the ESAI control register.
5
The word-relative frame sync signal waveform relative to the clock operates in the same manner as the bit-length frame sync
signal waveform, but it spreads from one serial clock before the first bit clock (like the bit length frame sync signal), until the
second-to-last bit clock of the first word in the frame.
6
Periodically sampled and not 100% tested.
62
63 64
ESAI_TX_CLK
(Input/Output)
78 79
ESAI_TX_FS
(Bit)
Out 82 83
ESAI_TX_FS
(Word) 86 86
Out
84 87
89
91
ESAI_TX_FS
(Bit) In
90 91
ESAI_TX_FS
(Word) In
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NXP Semiconductors 73
Electrical Characteristics
62
63
ESAI_RX_CLK 64
(Input/Output)
65 66
ESAI_RX_FS
(Bit)
Out
69 70
ESAI_RX_FS
(Word)
Out
72
71
Data In First Bit Last Bit
73 75
ESAI_RX_FS
(Bit)
In
74 75
ESAI_RX_FS
(Word)
In
Figure 38. ESAI Receiver Timing
ESAI_TX_HF_CLK
95
ESAI_TX_CLK (output)
96
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74 NXP Semiconductors
Electrical Characteristics
SD2
SD1
SD5
SDx_CLK
SD3
SD6
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NXP Semiconductors 75
Electrical Characteristics
SD1
SDx_CLK
SD2 SD2
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76 NXP Semiconductors
Electrical Characteristics
6'
6' 6'
6&.
6'6'
ELWRXWSXWIURPX6'+&WRFDUG
6' 6'
ELWLQSXWIURPFDUGWRX6'+&
6'
i.MX 6ULL Applications Processors for Industrial Products, Rev. 1.2, 11/2017
NXP Semiconductors 77
Electrical Characteristics
6'
6' 6'
6&.
6'6'
ELWRXWSXWIURPX6'+&WRH00&
ELWLQSXWIURPH00&WRX6'+&
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i.MX 6ULL Applications Processors for Industrial Products, Rev. 1.2, 11/2017
78 NXP Semiconductors
Electrical Characteristics
M3
ENET_RX_CLK (input)
M4
ENET_RX_DATA3,2,1,0
(inputs)
ENET_RX_EN
ENET_RX_ER
M1 M2
1 ENET_RX_EN, ENET_RX_CLK, and ENET0_RXD0 have the same timing in 10 Mbps 7-wire interface mode.
i.MX 6ULL Applications Processors for Industrial Products, Rev. 1.2, 11/2017
NXP Semiconductors 79
Electrical Characteristics
Figure 45 shows MII transmit signal timings. Table 55 describes the timing parameters (M5–M8) shown
in the figure.
M7
ENET_TX_CLK (input)
M5
M8
ENET_TX_DATA3,2,1,0
(outputs)
ENET_TX_EN
ENET_TX_ER
M6
1 ENET_TX_EN, ENET_TX_CLK, and ENET0_TXD0 have the same timing in 10-Mbps 7-wire interface mode.
ENET_CRS, ENET_COL
M9
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80 NXP Semiconductors
Electrical Characteristics
M14
M15
ENET_MDC (output)
M10
ENET_MDIO (output)
M11
ENET_MDIO (input)
M12 M13
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NXP Semiconductors 81
Electrical Characteristics
Figure 48 shows RMII mode timings. Table 58 describes the timing parameters (M16–M21) shown in the
figure.
M16
M17
ENET_CLK (input)
M18
ENET_TX_DATA (output)
ENET_TX_EN
M19
ENET_RX_EN (input)
ENET_RX_DATA[1:0]
ENET_RX_ER
M20 M21
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82 NXP Semiconductors
Electrical Characteristics
0 0
07-N?/54
i.MX 6ULL Applications Processors for Industrial Products, Rev. 1.2, 11/2017
NXP Semiconductors 83
Electrical Characteristics
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L4 LCD pixel clock high to data valid (falling edge capture) td(CLKH-DV) -1 1 ns
L5 LCD pixel clock low to data valid (rising edge capture) td(CLKL-DV) -1 1 ns
L6 LCD pixel clock high to control signal valid (falling edge capture) td(CLKH-CTRLV) -1 1 ns
L7 LCD pixel clock low to control signal valid (rising edge capture) td(CLKL-CTRLV) -1 1 ns
8-bit DOTCLK LCD 16-bit DOTCLK LCD 18-bit DOTCLK LCD 24-bit DOTCLK LCD 8-bit DVI LCD
Pin name
IF IF IF IF IF
LCD_RS — — — — CCIR_CLK
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Electrical Characteristics
LCD_D23 — — — R[7] —
LCD_D22 — — — R[6] —
LCD_D21 — — — R[5] —
LCD_D20 — — — R[4] —
LCD_D19 — — — R[3] —
LCD_D18 — — — R[2] —
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Electrical Characteristics
463,[B6&/.
7,6 7,+ 7,6 7,+
463,[B'$7$>@
Figure 51. QuadSPI Input/Read Timing (SDR mode with internal sampling)
Table 62. QuadSPI Input Timing (SDR mode with internal sampling)
Value
Symbol Parameter Unit
Min Max
463,[B6&/.
463,[B'$7$>@
7,6 7,+ 7,6 7,+
463,[B'46
Figure 52. QuadSPI Input/Read Timing (SDR mode with loopback DQS sampling)
Table 63. QuadSPI Input/Read Timing (SDR mode with loopback DQS sampling)
Value
Symbol Parameter Unit
Min Max
NOTE
• For internal sampling, the timing values assumes using sample point 0,
that is QuadSPIx_SMPR[SDRSMP] = 0.
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Electrical Characteristics
• For loopback DQS sampling, the data strobe is output to the DQS pad
together with the serial clock. The data strobe is looped back from DQS
pad and used to sample input data.
463,[B6&/.
7&6+
7&66 7&.
463,[B&6
7'92 7'92
463,[B6,2
7'+2 7'+2
Value
Symbol Parameter Unit
Min Max
NOTE
Tcss and Tcsh are configured by the QuadSPIx_FLSHCR register, the default
value of 3 are shown on the timing. Please refer to the i.MX 6ULL Reference
Manual (IMX6ULLRM) for more details.
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Electrical Characteristics
463,[B6&/.
7,6 7,+ 7,6 7,+
463,[B'$7$>@
Figure 54. QuadSPI Input/Read Timing (DDR mode with internal sampling)
Table 65. QuadSPI Input/Read Timing (DDR mode with internal sampling)
Value
Symbol Parameter Unit
Min Max
463,[B6&/.
463,[B'$7$>@
7,6 7,+ 7,6 7,+
463,[B'46
Figure 55. QuadSPI Input/Read Timing (DDR mode with loopback DQS sampling)
Table 66. QuadSPI Input/Read Timing (DDR mode with loopback DQS sampling)
Value
Symbol Parameter Unit
Min Max
NOTE
• For internal sampling, the timing values assumes using sample point 0,
that is QuadSPIx_SMPR[SDRSMP] = 0.
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Electrical Characteristics
• For loopback DQS sampling, the data strobe is output to the DQS pad
together with the serial clock. The data strobe is looped back from DQS
pad and used to sample input data.
463,[B6&/.
7&66 7&.
7&6+
463,[B&6
7'92 7'92
463,[B6,2
7'+2 7'+2
Value
Symbol Parameter Unit
Min Max
NOTE
Tcss and Tcsh are configured by the QuadSPIx_FLSHCR register, the default
value of 3 are shown on the timing. Please refer to the i.MX 6ULL Reference
Manual (IMX6ULLRM) for more details.
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Electrical Characteristics
S12 SAI_BCLK pulse width high/low (input) 40% 60% BCLK period
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Electrical Characteristics
SJ1
SJ2 SJ2
JTAG_TCK
(Input) VIH VM VM
VIL
SJ3 SJ3
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Electrical Characteristics
JTAG_TCK
(Input) VIH
VIL
SJ4 SJ5
Data
Inputs Input Data Valid
SJ6
Data
Output Data Valid
Outputs
SJ7
Data
Outputs
SJ6
Data
Outputs Output Data Valid
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Electrical Characteristics
JTAG_TCK
(Input) VIH
VIL
SJ8 SJ9
JTAG_TDI
JTAG_TMS Input Data Valid
(Input)
SJ10
JTAG_TDO
(Output) Output Data Valid
SJ11
JTAG_TDO
(Output)
SJ10
JTAG_TDO
Output Data Valid
(Output)
JTAG_TCK
(Input)
SJ13
JTAG_TRST_B
(Input)
SJ12
All Frequencies
ID Parameter1,2 Unit
Min Max
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Electrical Characteristics
All Frequencies
ID Parameter1,2 Unit
Min Max
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Electrical Characteristics
srckp
srckpl srckph
SPDIF_SR_CLK
VM VM
(Output)
stclkp
stclkpl stclkph
SPDIF_ST_CLK
VM VM
(Input)
UA1 UA1
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Electrical Characteristics
UA2 UA2
RGMII_TXD
(output)
Start Bit 0 Bit 1 Bit 2 Bit 3 Bit 4 Bit 5 Bit 6 Bit 7 Possible STOP
Bit Parity BIT
Bit
UA3 Transmit Bit Time in IrDA mode tTIRbit 1/Fbaud_rate1 - 1/Fbaud_rate + Tref_clk —
Tref_clk2
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Electrical Characteristics
1
Fbaud_rate: Baud rate frequency. The maximum baud rate the UART can support is (ipg_perclk frequency)/16.
2
Tref_clk: The period of UART reference clock ref_clk (ipg_perclk after RFDIV divider).
RGMII_RXD
(input)
Start Bit 0 Bit 1 Bit 2 Bit 3 Bit 4 Bit 5 Bit 6 Bit 7 Possible STOP
Bit Parity BIT
Bit
UA5 Receive Bit Time1 in IrDA mode tRIRbit 1/Fbaud_rate2 - 1/(16 1/Fbaud_rate + 1/(16 x —
x Fbaud_rate) Fbaud_rate)
UA6 Receive IR Pulse Duration tRIRpulse 1.41 s (5/16) x (1/Fbaud_rate) —
1 The UART receiver can tolerate 1/(16 x Fbaud_rate) tolerance in each bit. But accumulation tolerance in one frame must not
exceed 3/(16 x Fbaud_rate).
2 F
baud_rate: Baud rate frequency. The maximum baud rate the UART can support is (ipg_perclk frequency)/16.
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Electrical Characteristics
RAS depends on Sample Time Setting (ADLSMP, ADSTS) and ADC Power Mode (ADHSC, ADLPC). See charts for Minimum
Sample Time vs RAS
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Electrical Characteristics
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Electrical Characteristics
ADLPC=0, 350
ADHSC=0
ADLPC=0, 400
ADHSC=1
ADLSMP=0, 4
ADSTS=01
ADLSMP=0, 6
ADSTS=10
ADLSMP=0, 8
ADSTS=11
ADLSMP=1, 12
ADSTS=00
ADLSMP=1, 16
ADSTS=01
ADLSMP=1, 20
ADSTS=10
ADLSMP=1, 24
ADSTS=11
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Electrical Characteristics
Table 77. 12-bit ADC Characteristics (VREFH = VDDAD, VREFL = VSSAD) (continued)
ADLSMP=0 30
ADSTS=01
ADLSMP=0 32
ADSTS=10
ADLSMP=0 34
ADSTS=11
ADLSMP=1 38
ADSTS=00
ADLSMP=1 42
ADSTS=01
ADLSMP=1 46
ADSTS=10
ADLSMP=1, 50
ADSTS=11
ADLSMP=0 0.75
ADSTS=01
ADLSMP=0 0.8
ADSTS=10
ADLSMP=0 0.85
ADSTS=11
ADLSMP=1 0.95
ADSTS=00
ADLSMP=1 1.05
ADSTS=01
ADLSMP=1 1.15
ADSTS=10
ADLSMP=1, 1.25
ADSTS=11
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Electrical Characteristics
Table 77. 12-bit ADC Characteristics (VREFH = VDDAD, VREFL = VSSAD) (continued)
[L:] Signal to Noise See ENOB SINAD SINAD = 6.02 x ENOB + 1.76 dB —
plus Distortion
1
All accuracy numbers assume the ADC is calibrated with VREFH=VDDAD
2
Typical values assume VDDAD = 3.0 V, Temp = 25°C, Fadck=20 MHz unless otherwise stated. Typical values are for reference
only and are not tested in production.
NOTE
The ADC electrical spec would be met with the calibration enabled
configuration.
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Boot Mode Configuration
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Boot Mode Configuration
Table 78. Fuses and Associated Pins Used for Boot (continued)
LCD_DATA00 Input with 100 K pull-down BT_CFG1[0] Boot Options, Pin value overrides
fuse settings for BT_FUSE_SEL =
LCD_DATA01 Input with 100 K pull-down BT_CFG1[1] ‘0’. Signal Configuration as Fuse
LCD_DATA02 Input with 100 K pull-down BT_CFG1[2] Override Input at Power Up.
These are special I/O lines that
LCD_DATA03 Input with 100 K pull-down BT_CFG1[3] control the boot up configuration
during product development. In
LCD_DATA04 Input with 100 K pull-down BT_CFG1[4]
production, the boot configuration
LCD_DATA05 Input with 100 K pull-down BT_CFG1[5] can be controlled by fuses.
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Boot Mode Configuration
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Boot Mode Configuration
BOOT_CFG1[3:2]= BOOT_CFG1[3:2]=
Ball Name Signal Name Mux Mode Common
01b 10b
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Boot Mode Configuration
BOOT_CFG1[3:2]= BOOT_CFG1[3:2]=
Ball Name Signal Name Mux Mode Common
01b 10b
SDMMC
Mux BOOT_CFG1[1]=1
Ball Name Signal Name Common 4-bit 8-bit MFG
Mode (SD Power Cycle)
mode
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Boot Mode Configuration
Commo BOOT_CFG1[1]=1
Ball Name Signal Name Mux Mode 4-bit 8-bit
n (SD Power Cycle)
ADL16
Ball Name Signal Name Mux Mode Common AD16 Mux
Non-Mux
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Boot Mode Configuration
ADL16
Ball Name Signal Name Mux Mode Common AD16 Mux
Non-Mux
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Boot Mode Configuration
ADL16
Ball Name Signal Name Mux Mode Common AD16 Mux
Non-Mux
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Package Information and Contact Assignments
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Package Information and Contact Assignments
Figure 70. 14 x 14 mm BGA, Case x Package Top, Bottom, and Side Views
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Package Information and Contact Assignments
ADC_VREFH M13 —
DRAM_VREF P4 —
GPANIO R13 —
NGND_KEL0 M12 —
NVCC_CSI F4 —
NVCC_DRAM_2P5 N6 —
NVCC_ENET F13 —
NVCC_GPIO J13 —
NVCC_LCD E13 —
NVCC_NAND E7 —
NVCC_PLL P13 —
NVCC_SD1 C4 —
NVCC_UART H13 —
VDD_HIGH_IN N13 —
VDD_SNVS_CAP N12 —
VDD_SNVS_IN P12 —
VDD_SOC_CAP G8, H8, J8, J11, K8, K11, L8, L9, L10, L11 —
VDDA_ADC_3P3 L13 —
VSS A1, A17, C3, C7, C11, C15, E8, E11, F6, F7, F8, F9, F10,F11, F12, G3, G5, G7, —
G12, G15, H7, H12, J5, J7, J12, K7, K12, L3, L7, L12, M7, M8, M9, M10, M11,
N3, N5, R3, R5, R7, R11, R16, R17, T14, U1, U14, U17
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Package Information and Contact Assignments
Table 91 shows an alpha-sorted list of functional contact assignments for the 14 x 14 mm package.
Table 91. 14 x 14 mm Functional Contact Assignments
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Package Information and Contact Assignments
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Package Information and Contact Assignments
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Package Information and Contact Assignments
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Package Information and Contact Assignments
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Package Information and Contact Assignments
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Package Information and Contact Assignments
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Package Information and Contact Assignments
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122
6.1.3
G F E D C B A
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UART4_TX_DATA UART5_TX_DATA ENET1_RX_DATA1 ENET2_TX_CLK ENET2_RX_DATA0 ENET2_RX_EN VSS 17
G F E D C B A
NXP Semiconductors
P N M L K J H
NXP Semiconductors
DRAM_SDCLK0_P DRAM_ODT0 DRAM_SDBA0 DRAM_ADDR05 DRAM_ADDR02 DRAM_SDWE_B DRAM_SDBA1
i.MX 6ULL Applications Processors for Industrial Products, Rev. 1.2, 11/2017
CCM_CLK1_P GPIO1_IO08 GPIO1_IO05 GPIO1_IO03 GPIO1_IO06 UART2_TX_DATA UART3_TX_DATA
P N M L K J H
123
Package Information and Contact Assignments
124
6.2
6.2.1
U T R
9 x 9 mm Package Information
10 BOOT_MODE1 BOOT_MODE0 SNVS_TAMPER0
Figure 71 shows the top, bottom, and side views of the 9 x 9 mm BGA package.
Table 92. 14 x 14 mm, 0.8 mm Pitch, Ball Map (continued)
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17 VSS XTALO VSS
U T R
NXP Semiconductors
Package Information and Contact Assignments
Figure 71. 9 x 9 mm BGA, Case x Package Top, Bottom, and Side Views
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Package Information and Contact Assignments
ADC_VREFH N13 —
DRAM_VREF T1 —
GPANAIO T11 —
NGND_KEL0 M10 —
NVCC_CSI E5 —
NVCC_DRAM_2P5 K6 —
NVCC_ENET G13 —
NVCC_GPIO M13 —
NVCC_LCD E13 —
NVCC_NAND E11 —
NVCC_PLL T13 —
NVCC_SD1 E7 —
NVCC_UART L13 —
VDD_HIGH_CAP U11 —
VDD_HIGH_IN U15 —
VDD_SNVS_CAP N12 —
VDD_SNVS_IN P12 —
VDD_SOC_CAP G7, G8, H7, H8, J7, J8, K7, K8, L7, L8 —
VDD_SOC_IN J9, J10, J11, K9, K10, K11, L9, L10, L11 —
VDD_USB_CAP N11 —
VDDA_ADC_3P3 T17 —
VSS A2, A7, A12, A17, B1, C15, F1, F3, F8, F10, F17, H6, H12, J3, J15, K12, M1, M3, —
M8, M17, R3, R9, R12, R15, U1, U6, U13, U17
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Package Information and Contact Assignments
Table 94 shows an alpha-sorted list of functional contact assignments for the 9 x 9 mm package.
Table 94. 9 x 9 mm Functional Contact Assignments
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Package Information and Contact Assignments
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Package Information and Contact Assignments
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Package Information and Contact Assignments
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Package Information and Contact Assignments
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Package Information and Contact Assignments
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Package Information and Contact Assignments
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6.2.3
G F E D C B A
NXP Semiconductors
DRAM_ADDR00 VSS DRAM_ODT1 CSI_DATA03 CSI_MCLK VSS 1
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ENET1_RX_DATA0 VSS ENET2_RX_DATA0 ENET2_RX_DATA1 LCD_DATA23 LCD_DATA20 VSS 17
G F E D C B A
135
Package Information and Contact Assignments
136
P N M L K J H
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JTAG_TDI GPIO1_IO04 VSS UART1_RX_DATA UART3_TX_DATA UART2_CTS_B UART4_RX_DATA
P N M L K J H
NXP Semiconductors
U T R
NXP Semiconductors
1 VSS DRAM_VREF DRAM_DM1
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17 VSS VDDA_ADC_3P3 JTAG_TCK
U T R
137
Package Information and Contact Assignments
Revision History
7 Revision History
Table 96 provides a revision history for this data sheet.
Table 96. i.MX 6ULL Data Sheet Document Revision History
Rev.
Date Substantive Change(s)
Number
1.2 11/2017 • Updated the part numbers and added a new part number (MCIMX6Y2CVK08AB) in the Table 1,
"Ordering Information"
• Updated the silicon revision number in the Figure 1, "Part Number Nomenclature—i.MX 6ULL"
• Updated the GPIO1_IO09 signal name in the Table 85, "SD/MMC Boot through USDHC1" and added
a footnote
• Updated the NAND_ALE signal name in the Table 86, "SD/MMC Boot through USDHC2" and added
a footnote
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