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IMX6ULLIEC

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50 views139 pages

IMX6ULLIEC

ic datasheet
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as PDF, TXT or read online on Scribd
You are on page 1/ 139

NXP Semiconductors Document Number: IMX6ULLIEC

Rev. 1.2, 11/2017


Data Sheet: Technical Data

MCIMX6Y0CVM05AA MCIMX6Y0CVM05AB
MCIMX6Y1CVM05AA MCIMX6Y1CVM05AB
MCIMX6Y1CVK05AA MCIMX6Y1CVK05AB
MCIMX6Y2CVM05AA MCIMX6Y2CVM05AB
MCIMX6Y2CVM08AA MCIMX6Y2CVM08AB
MCIMX6Y2CVK08AB

i.MX 6ULL Applications


Processors for Industrial
Products Package Information
Plastic Package
MAPBGA 14 x 14 mm, 0.8 mm pitch
MAPBGA 9 x 9 mm, 0.5 mm pitch

Ordering Information

See Table 1 on page 3

1 i.MX 6ULL Introduction 1. i.MX 6ULL Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . 1


1.1. Ordering Information . . . . . . . . . . . . . . . . . . . . . . . 3
1.2. Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
The i.MX 6ULL processors represent NXP’s latest 2. Architectural Overview . . . . . . . . . . . . . . . . . . . . . . . . . . 10
achievement in integrated multimedia-focused products 2.1. Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
3. Modules List . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
offering high performance processing with a high degree 3.1. Special Signal Considerations . . . . . . . . . . . . . . . 18
of functional integration, targeted towards the growing 3.2. Recommended Connections for Unused Analog
Interfaces . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
market of connected devices. 4. Electrical Characteristics . . . . . . . . . . . . . . . . . . . . . . . . 21
4.1. Chip-Level Conditions . . . . . . . . . . . . . . . . . . . . . 21
The i.MX 6ULL is a high performance, ultra efficient 4.2. Power Supplies Requirements and Restrictions . 31
processor family with featuring NXP’s advanced 4.3. Integrated LDO Voltage Regulator Parameters . . 32
implementation of the single Arm Cortex®-A7 core, 4.4. PLL’s Electrical Characteristics . . . . . . . . . . . . . . . 34
4.5. On-Chip Oscillators . . . . . . . . . . . . . . . . . . . . . . . 36
which operates at speeds of up to 792 MHz. i.MX 6ULL 4.6. I/O DC Parameters . . . . . . . . . . . . . . . . . . . . . . . . 37
includes integrated power management module that 4.7. I/O AC Parameters . . . . . . . . . . . . . . . . . . . . . . . . 40
4.8. Output Buffer Impedance Parameters . . . . . . . . . 43
reduces the complexity of external power supply and 4.9. System Modules Timing . . . . . . . . . . . . . . . . . . . . 46
simplifies the power sequencing. Each processor in this 4.10. Multi-Mode DDR Controller (MMDC) . . . . . . . . . . 57
family provides various memory interfaces, including 4.11. General-Purpose Media Interface (GPMI) Timing 58
4.12. External Peripheral Interface Parameters . . . . . . . 66
LPDDR2, DDR3, DDR3L, Raw and Managed NAND 4.13. A/D converter . . . . . . . . . . . . . . . . . . . . . . . . . . . . 98
flash, NOR flash, eMMC, Quad SPI, and a wide range of 5. Boot Mode Configuration . . . . . . . . . . . . . . . . . . . . . . . 103
5.1. Boot Mode Configuration Pins . . . . . . . . . . . . . . 103
other interfaces for connecting peripherals, such as 5.2. Boot Device Interface Allocation . . . . . . . . . . . . . 104
WLAN, Bluetooth™, GPS, displays, and camera 6. Package Information and Contact Assignments . . . . . 111
sensors. 6.1. 14 x 14 mm Package Information . . . . . . . . . . . . 111
6.2. 9 x 9 mm Package Information . . . . . . . . . . . . . . 124
7. Revision History . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 138

© 2016-2017 NXP B.V.


i.MX 6ULL Introduction

The i.MX 6ULL processors are specifically useful for applications such as:
• Telematics
• Audio playback
• Connected devices
• IoT Gateway
• Access control panels
• Human Machine Interfaces (HMI)
• Portable medical and health care
• IP phones
• Smart appliances
• eReaders
The features of the i.MX 6ULL processors include:
• Single-core Arm Cortex-A7—The single core A7 provides a cost-effective and power-efficient
solution.
• Multilevel memory system—The multilevel memory system of processor is based on the L1
instruction and data caches, L2 cache, and internal and external memory. The processor supports
many types of external memory devices, including DDR3, low voltage DDR3, LPDDR2, NOR
Flash, NAND Flash (MLC and SLC), OneNAND™, Quad SPI, and managed NAND, including
eMMC up to rev 4.4/4.41/4.5.
• Smart speed technology—Power management implemented throughout the IC that enables
multimedia features and peripherals to consume minimum power in both active and various low
power modes.
• Dynamic voltage and frequency scaling—The power efficiency of devices by scaling the voltage
and frequency to optimize performance.
• Multimedia powerhouse—The multimedia performance of processor is enhanced by a multilevel
cache system, NEON™ MPE (Media Processor Engine) co-processor, a programmable smart
DMA (SDMA) controller, an asynchronous audio sample rate converter, an Electrophoretic
Display (EPD) controller, and a Pixel processing pipeline (PXP) to support 2D image processing,
including color-space conversion, scaling, alpha-blending, and rotation.
• 2x Ethernet interfaces—2x 10/100 Mbps Ethernet controllers.
• Human-machine interface—Each processor supports one digital parallel display interface.
• Interface flexibility—Each processor supports connections to a variety of interfaces: two
high-speed USB on-the-go with PHY, multiple expansion card ports (high-speed MMC/SDIO host
and other), two 12-bit ADC modules with up to 10 total input channels and two CAN ports.
• Advanced security—The processors deliver hardware-enabled security features that enable secure
e-commerce, digital rights management (DRM), information encryption, secure boot, AES-128
encryption, SHA-1, SHA-256 HW acceleration engine, and secure software downloads. The
security features are discussed in the i.MX 6ULL Security Reference Manual (IMX6ULLSRM).

i.MX 6ULL Applications Processors for Industrial Products, Rev. 1.2, 11/2017
2 NXP Semiconductors
i.MX 6ULL Introduction

• Integrated power management—The processors integrate linear regulators and internally generate
voltage levels for different domains. This significantly simplifies system power management
structure.
For a comprehensive list of the i.MX 6ULL features, see Section 1.2, “Features"”.

1.1 Ordering Information


Table 1 provides examples of orderable part numbers covered by this data sheet.
Table 1. Ordering Information

Junction
Part Number Feature Package Temperature Tj
(C)

MCIMX6Y0CVM05AA Features supports: 14 x 14 mm, 0.8 pitch -40 to +105


MCIMX6Y0CVM05AB • 528 MHz, industrial grade for general purpose MAPBGA
• No security
• No LCD/CSI
• No CAN
• Ethernet x1
• USB OTG x1
• ADC x1
• UART x4
• SAI x1
• No ESAI
• Timer x2
• PWM x4
• I2C x2
• SPI x2

MCIMX6Y1CVM05AA Features supports: 14 x 14 mm, 0.8 pitch -40 to +105


MCIMX6Y1CVM05AB • 528 MHz, industrial grade for general purpose MAPBGA
• Basic security
• No LCD/CSI
• CAN x1
• Ethernet x1
• USB OTG x2
• ADC x1
• UART x8
• SAI x3
• ESAI x1
• Timer x4
• PWM x8
• I2C x4
• SPI x4

i.MX 6ULL Applications Processors for Industrial Products, Rev. 1.2, 11/2017
NXP Semiconductors 3
i.MX 6ULL Introduction

Table 1. Ordering Information

Junction
Part Number Feature Package Temperature Tj
(C)

MCIMX6Y1CVK05AA Features supports: 9 x 9 mm, 0.5 pitch -40 to +105


MCIMX6Y1CVK05AB • 528 MHz, industrial grade for general purpose MAPBGA
• Basic security
• No LCD/CSI
• CAN x1
• Ethernet x1
• USB OTG x2
• ADC x1
• UART x8
• SAI x3
• ESAI x1
• Timer x4
• PWM x8
• I2C x4
• SPI x4

MCIMX6Y2CVM05AA Features supports: 14 x 14mm, 0.8 pitch -40 to +105


MCIMX6Y2CVM05AB • 528 MHz, industrial grade for general purpose MAPBGA
• Basic security
• With LCD/CSI
• CAN x2
• Ethernet x2
• USB OTG x2
• ADC x2
• UART x8
• SAI x3
• ESAI x1
• Timer x4
• PWM x8
• I2C x4
• SPI x4

i.MX 6ULL Applications Processors for Industrial Products, Rev. 1.2, 11/2017
4 NXP Semiconductors
i.MX 6ULL Introduction

Table 1. Ordering Information

Junction
Part Number Feature Package Temperature Tj
(C)

MCIMX6Y2CVM08AA Features supports: 14 x 14 mm, 0.8 pitch -40 to +105


MCIMX6Y2CVM08AB • 792 MHz, industrial grade for general purpose MAPBGA
• Basic security
• With LCD/CSI
• CAN x2
• Ethernet x2
• USB OTG x2
• ADC x2
• UART x8
• SAI x3
• ESAI x1
• Timer x4
• PWM x8
• I2C x4
• SPI x4

MCIMX6Y2CVK08AB Features supports: 9 x 9 mm, 0.5 pitch -40 to +105


• 792 MHz, industrial grade for general purpose MAPBGA
• Basic security
• With LCD/CSI
• CAN x2
• Ethernet x2
• USB OTG x2
• ADC x2
• UART x8
• SAI x3
• ESAI x1
• Timer x4
• PWM x8
• I2C x4
• SPI x4

Figure 1 describes the part number nomenclature so that the users can identify the characteristics of the
specific part number they have (for example, cores, frequency, temperature grade, fuse options, and silicon
revision). The primary characteristic which describes which data sheet applies to a specific part is the
temperature grade (junction) field.
• The i.MX 6ULL Applications Processors for Industrial Products Data Sheet (IMX6ULLIEC)
covers parts listed with a “C (Industrial temp)”
Ensure to have the proper data sheet for specific part by verifying the temperature grade (junction) field
and matching it to the proper data sheet. If there will be any questions, visit the web page
NXP.com/imx6series or contact a NXP representative for details.

i.MX 6ULL Applications Processors for Industrial Products, Rev. 1.2, 11/2017
NXP Semiconductors 5
i.MX 6ULL Introduction

MC IMX6 X @ + VV $$ % A

Qualification Level MC Silicon Rev A

Prototype Samples PC Rev 1.0 (Mask number: 0N70S) A

Mass Production MC Rev 1.1 (Mask number: 1N70S) B

Special SC

Fuse Option %
i.MX 6 Family X
Reserved A
i.MX 6ULL Y

Arm Cortex-A7 Frequency $$


Part differentiator @
528 MHz 05
With EPDC 7
792 MHz 08
Reserved 6
900 MHz 09
5
4

3 Package Type ROHS

General Purpose 2 (Full Feature) 2 MAPBGA 14 x 14 mm, 0.8 pitch VM


General Purpose 1 (Reduced Feature) 1
MAPBGA 9 x 9 mm, 0.5 pitch VK
Baseline 0

Junction Temperature (Tj) +


Consumer: 0 to + 95 °C D

Industrial: -40 to +105 °C C

Figure 1. Part Number Nomenclature—i.MX 6ULL

1.2 Features
The i.MX 6ULL processors are based on Arm Cortex-A7 MPCore™ Platform, which has the following
features:
• Supports single Arm Cortex-A7 MPCore (with TrustZone) with:
— 32 KB L1 Instruction Cache
— 32 KB L1 Data Cache
— Private Timer and Watchdog
— Cortex-A7 NEON Media Processing Engine (MPE) Co-processor
• General Interrupt Controller (GIC) with 128 interrupts support
• Global Timer
• Snoop Control Unit (SCU)
• 128 KB unified I/D L2 cache
• Single Master AXI bus interface output of L2 cache

i.MX 6ULL Applications Processors for Industrial Products, Rev. 1.2, 11/2017
6 NXP Semiconductors
i.MX 6ULL Introduction

• Frequency of the core (including Neon and L1 cache), as per Table 10, "Operating Ranges," on
page 24.
• NEON MPE coprocessor
— SIMD Media Processing Architecture
— NEON register file with 32x64-bit general-purpose registers
— NEON Integer execute pipeline (ALU, Shift, MAC)
— NEON dual, single-precision floating point execute pipeline (FADD, FMUL)
— NEON load/store and permute pipeline
— 32 double-precision VFPv3 floating point registers
The SoC-level memory system consists of the following additional components:
— Boot ROM, including HAB (96 KB)
— Internal multimedia/shared, fast access RAM (OCRAM, 128 KB)
• External memory interfaces: The i.MX 6ULL processors support latest, high volume, cost effective
handheld DRAM, NOR, and NAND Flash memory standards.
— 16-bit LP-DDR2-800, 16-bit DDR3-800 and DDR3L-800
— 8-bit NAND-Flash, including support for Raw MLC/SLC, 2 KB, 4 KB, and 8 KB page size,
BA-NAND, PBA-NAND, LBA-NAND, OneNAND™ and others. BCH ECC up to 40 bits.
— 16/8-bit NOR Flash. All EIMv2 pins are muxed on other interfaces.
Each i.MX 6ULL processor enables the following interfaces to external devices (some of them are muxed
and not available simultaneously):
• Displays:
— One parallel display port, support max 85 MHz display clock and up to WXGA (1366 x 768)
at 60 Hz
— Support 24-bit, 18-bit, 16-bit, and 8-bit parallel display
— Electrophoretic display controller support direct-driver for E-Ink EPD panel, with up to
2048x1536 resolution at 106 Hz
• Camera sensors:
— One parallel camera port, up to 24 bit and 133.3 MHz pixel clock
— Support 24-bit, 16-bit, 10-bit, and 8-bit input
— Support BT.656 interface
• Expansion cards:
— Two MMC/SD/SDIO card ports all supporting:
– 1-bit or 4-bit transfer mode specifications for SD and SDIO cards up to UHS-I SDR-104
mode (104 MB/s max)
– 1-bit, 4-bit, or 8-bit transfer mode specifications for MMC cards up to 52 MHz in both SDR
and DDR modes (104 MB/s max)
– 4-bit or 8-bit transfer mode specifications for eMMC chips up to 200 MHz in HS200 mode
(200 MB/s max)

i.MX 6ULL Applications Processors for Industrial Products, Rev. 1.2, 11/2017
NXP Semiconductors 7
i.MX 6ULL Introduction

• USB:
— Two high speed (HS) USB 2.0 OTG (Up to 480 Mbps), with integrated HS USB PHY
• Miscellaneous IPs and interfaces:
— Three I2S/SAI/AC97, up to 1.4 Mbps each
— ESAI
— Sony Philips Digital Interface Format (SPDIF), Rx and Tx
— Eight UARTs, up to 5.0 Mbps each:
– Providing RS232 interface
– Supporting 9-bit RS485 multidrop mode
– Support RTS/CTS for hardware flow control
— Four eCSPI (Enhanced CSPI), up to 52 Mbps each
— Four I2C, supports 400 kbps
— Two 10/100 Ethernet Controller (IEEE1588 compliant)
— Eight Pulse Width Modulators (PWM)
— System JTAG Controller (SJC)
— GPIO with interrupt capabilities
— 8x8 Key Pad Port (KPP)
— One Quad SPI to connect to serial NOR flash
— Two Flexible Controller Area Network (FlexCAN)
— Three Watchdog timers (WDOG)
— 8-bit/10-bit/12-bit/16-bit camera interface
— Two 12-bit Analog to Digital Converters (ADC) with up to 10 input channels in total
The i.MX 6ULL processors integrate advanced power management unit and controllers:
• Provide PMU, including LDO supplies, for on-chip resources
• Use Temperature Sensor for monitoring the die temperature
• Use Voltage Sensor for monitoring the die voltage
• Support DVFS techniques for low power modes
• Use SW State Retention and Power Gating for Arm and NEON
• Support various levels of system power modes
• Use flexible clock gating control scheme
The i.MX 6ULL processors use dedicated hardware accelerators to meet the targeted multimedia
performance. The use of hardware accelerators is a key factor in obtaining high performance at low power
consumption numbers, while having the CPU core relatively free for performing other tasks.
The i.MX 6ULL processors incorporate the following hardware accelerators:
• PXP—Pixel Processing Pipeline for image resize, rotation, overlay and CSC. Off loading key pixel
processing operations are required to support the LCD display applications.
• ASRC—Asynchronous Sample Rate Converter

i.MX 6ULL Applications Processors for Industrial Products, Rev. 1.2, 11/2017
8 NXP Semiconductors
i.MX 6ULL Introduction

Security functions are enabled and accelerated by the following hardware:


• Arm TrustZone including the TZ architecture (separation of interrupts, memory mapping, etc.)
• SJC—System JTAG Controller. Protecting JTAG from debug port attacks by regulating or
blocking the access to the system debug features.
• SNVS—Secure Non-Volatile Storage, including Secure Real Time Clock, both active tamper and
passive tamper detection logic has up to 10 tamper inputs. Voltage monitor, temperature monitor,
and clock frequency monitor protects the secure key storage.
• CSU—Central Security Unit. Enhancement for the IC Identification Module (IIM). Will be
configured during boot and by eFUSEs and will determine the security level operation mode as
well as the TZ policy.
• A-HAB—Advanced High Assurance Boot—HABv4 with the new embedded enhancements:
AES-128 encryption, SHA-1, and SHA-256 HW acceleration engine, 2048-bit RSA key, version
control mechanism, warm boot, CSU, and TZ initialization.
NOTE
The actual feature set depends on the part numbers as described in Table 1.
Functions, such as display and camera interfaces, connectivity interfaces.

i.MX 6ULL Applications Processors for Industrial Products, Rev. 1.2, 11/2017
NXP Semiconductors 9
Architectural Overview

2 Architectural Overview
The following subsections provide an architectural overview of the i.MX 6ULL processor system.

2.1 Block Diagram


Figure 2 shows the functional modules in the i.MX 6ULL processor system.

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Figure 2. i.MX 6ULL System Block Diagram

i.MX 6ULL Applications Processors for Industrial Products, Rev. 1.2, 11/2017
10 NXP Semiconductors
Modules List

3 Modules List
The i.MX 6ULL processors contain a variety of digital and analog modules. Table 2 describes these
modules in alphabetical order.
Table 2. i.MX 6ULL Modules List

Block Mnemonic Block Name Subsystem Brief Description

ADC1 Analog to Digital — The ADC is a 12-bit general purpose analog to digital
ADC2 Converter converter.

Arm Arm Platform Arm The Arm Core Platform includes 1x Cortex-A7 core. It
also includes associated sub-blocks, such as the Level
2 Cache Controller, SCU (Snoop Control Unit), GIC
(General Interrupt Controller), private timers, watchdog,
and CoreSight debug modules.

ASRC Asynchronous Sample Multimedia The Asynchronous Sample Rate Converter (ASRC)
Rate Converter Peripherals converts the sampling rate of a signal associated to an
input clock into a signal associated to a different output
clock. The ASRC supports concurrent sample rate
conversion of up to 10 channels of about -120dB
THD+N. The sample rate conversion of each channel is
associated to a pair of incoming and outgoing sampling
rates. The ASRC supports up to three sampling rate
pairs.

BCH Binary-BCH ECC System Control The BCH module provides up to 40-bit ECC
Processor Peripherals encryption/decryption for NAND Flash controller
(GPMI)

CCM Clock Control Module, Clocks, Resets, and These modules are responsible for clock and reset
GPC General Power Controller, Power Control distribution in the system, and also for the system power
SRC System Reset Controller management.

CSI Parallel CSI Multimedia The CSI IP provides parallel CSI standard camera
Peripherals interface port. The CSI parallel data ports are up to 24
bits. It is designed to support 24-bit RGB888/YUV444,
CCIR656 video interface, 8-bit YCbCr, YUV or RGB,
and 8-bit/10-bit/16-bit Bayer data input.
CSU Central Security Unit Security The Central Security Unit (CSU) is responsible for
setting comprehensive security policy within the i.MX
6ULL platform.

DAP Debug Access Port System Control The DAP provides real-time access for the debugger
Peripherals without halting the core to:
• System memory and peripheral registers
• All debug configuration registers
The DAP also provides debugger access to JTAG scan
chains. The DAP module is internal to the Cortex-A7
Core Platform.

i.MX 6ULL Applications Processors for Industrial Products, Rev. 1.2, 11/2017
NXP Semiconductors 11
Modules List

Table 2. i.MX 6ULL Modules List (continued)

Block Mnemonic Block Name Subsystem Brief Description

DCP Data co-processor Security This module provides support for general encryption
and hashing functions typically used for security
functions. Because its basic job is moving data from
memory to memory, it also incorporates a memory-copy
(memcopy) function for both debugging and as a more
efficient method of copying data between memory
blocks than the DMA-based approach.

eCSPI1 Configurable SPI Connectivity Full-duplex enhanced Synchronous Serial Interface,


eCSPI2 Peripherals with data rate up to 52 Mbit/s. It is configurable to
eCSPI3 support Master/Slave modes, four chip selects to
eCSPI4 support multiple peripherals.

EIM NOR-Flash /PSRAM Connectivity The EIM NOR-FLASH / PSRAM provides:


interface Peripherals • Support 16-bit (in muxed IO mode only) PSRAM
memories (sync and async operating modes), at
slow frequency
• Support 16-bit (in muxed IO mode only) NOR-Flash
memories, at slow frequency
• Multiple chip selects

ENET1 Ethernet Controller Connectivity The Ethernet Media Access Controller (MAC) is
ENET2 Peripherals designed to support 10/100 Mbit/s Ethernet/IEEE 802.3
networks. An external transceiver interface and
transceiver function are required to complete the
interface to the media. The module has dedicated
hardware to support the IEEE 1588 standard. See the
ENET chapter of the reference manual for details.
EPDC Electrophoretic Display Multimedia The EPDC is a feature-rich, low power, and high
Controller Peripherals performance direct-drive active matrix EPD controller. It
is specially designed to drive E-INKTM EPD panels,
supporting a wide variety of TFT backplanes.

EPIT1 Enhanced Periodic Timer Peripherals Each EPIT is a 32-bit “set and forget” timer that starts
EPIT2 Interrupt Timer counting after the EPIT is enabled by software. It is
capable of providing precise interrupts at regular
intervals with minimal processor intervention. It has a
12-bit prescaler for division of input clock frequency to
get the required time setting for the interrupts to occur,
and counter value can be programmed on the fly.

i.MX 6ULL Applications Processors for Industrial Products, Rev. 1.2, 11/2017
12 NXP Semiconductors
Modules List

Table 2. i.MX 6ULL Modules List (continued)

Block Mnemonic Block Name Subsystem Brief Description

ESAI Enhanced Serial Audio Connectivity The Enhanced Serial Audio Interface (ESAI) provides a
Interface Peripherals full-duplex serial port for serial communication with a
variety of serial devices, including industry-standard
codecs, SPDIF transceivers, and other processors.
The ESAI consists of independent transmitter and
receiver sections, each section with its own clock
generator. All serial transfers are synchronized to a
clock. Additional synchronization signals are used to
delineate the word frames. The normal mode of
operation is used to transfer data at a periodic rate, one
word per period. The network mode is also intended for
periodic transfers; however, it supports up to 32 words
(time slots) per period. This mode can be used to build
time division multiplexed (TDM) networks. In contrast,
the on-demand mode is intended for non-periodic
transfers of data and to transfer data serially at high
speed when the data becomes available.
The ESAI has 12 pins for data and clocking connection
to external devices.

FLEXCAN1 Flexible Controller Area Connectivity The CAN protocol was primarily, but not only, designed
FLEXCAN2 Network Peripherals to be used as a vehicle serial data bus, meeting the
specific requirements of this field: real-time processing,
reliable operation in the Electromagnetic interference
(EMI) environment of a vehicle, cost-effectiveness and
required bandwidth. The FlexCAN module is a full
implementation of the CAN protocol specification,
Version 2.0 B, which supports both standard and
extended message frames.

GPIO1 General Purpose I/O System Control Used for general purpose input/output to external ICs.
GPIO2 Modules Peripherals Each GPIO module supports 32 bits of I/O.
GPIO3
GPIO4
GPIO5

GPMI General Purpose Connectivity The GPMI module supports up to 8x NAND devices and
Memory Interface Peripherals 40-bit ECC encryption/decryption for NAND Flash
Controller (GPMI2). GPMI supports separate DMA
channels for each NAND device.

GPT1 General Purpose Timer Timer peripherals Each GPT is a 32-bit “free-running” or “set and forget”
GPT2 mode timer with programmable prescaler and compare
and capture register. A timer counter value can be
captured using an external event and can be configured
to trigger a capture event on either the leading or trailing
edges of an input pulse. When the timer is configured to
operate in “set and forget” mode, it is capable of
providing precise interrupts at regular intervals with
minimal processor intervention. The counter has output
compare logic to provide the status and interrupt at
comparison. This timer can be configured to run either
on an external clock or on an internal clock.

i.MX 6ULL Applications Processors for Industrial Products, Rev. 1.2, 11/2017
NXP Semiconductors 13
Modules List

Table 2. i.MX 6ULL Modules List (continued)

Block Mnemonic Block Name Subsystem Brief Description

LCDIF LCD interface Connectivity The LCDIF is a general purpose display controller used
peripherals to drive a wide range of display devices varying in size
and capability. The LCDIF is designed to support dumb
(synchronous 24-bit Parallel RGB interface) and smart
(asynchronous parallel MPU interface) LCD devices.

MQS Medium Quality Sound Multimedia MQS is used to generate 2-channel medium quality
Peripherals PWM-like audio via two standard digital GPIO pins.

PWM1 Pulse Width Modulation Connectivity The pulse-width modulator (PWM) has a 16-bit counter
PWM2 peripherals and is optimized to generate sound from stored sample
PWM3 audio images and it can also generate tones. It uses
PWM4 16-bit resolution and a 4x16 data FIFO to generate
PWM5 sound.
PWM6
PWM7
PWM8

PXP Pixel Processing Pipeline Display peripherals A high-performance pixel processor capable of 1
pixel/clock performance for combined operations, such
as color-space conversion, alpha blending,
gamma-mapping, and rotation. The PXP is enhanced
with features specifically for gray scale applications. In
addition, the PXP supports traditional pixel/frame
processing paths for still-image and video processing
applications, allowing it to interface with the integrated
EPD.

RNGB Random Number Security Random number generating module.


Generator

QSPI Quad SPI Connectivity Quad SPI module acts as an interface to external serial
peripherals flash devices. This module contains the following
features:
• Flexible sequence engine to support various flash
vendor devices
• Single pad/Dual pad/Quad pad mode of operation
• Single Data Rate/Double Data Rate mode of
operation
• Parallel Flash mode
• DMA support
• Memory mapped read access to connected flash
devices
• Multi-master access with priority and flexible and
configurable buffer for each master

SAI1 — — The SAI module provides a synchronous audio


SAI2 interface (SAI) that supports full duplex serial interfaces
SAI3 with frame synchronization, such as I2S, AC97, TDM,
and codec/DSP interfaces.

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14 NXP Semiconductors
Modules List

Table 2. i.MX 6ULL Modules List (continued)

Block Mnemonic Block Name Subsystem Brief Description

SDMA Smart Direct Memory System Control The SDMA is multi-channel flexible DMA engine. It
Access Peripherals helps in maximizing system performance by off-loading
the various cores in dynamic data routing. It has the
following features:
• Powered by a 16-bit Instruction-Set micro-RISC
engine
• Multi-channel DMA supporting up to 32 time-division
multiplexed DMA channels
• 48 events with total flexibility to trigger any
combination of channels
• Memory accesses including linear, FIFO, and 2D
addressing
• Shared peripherals between Arm and SDMA
• Very fast Context-Switching with 2-level priority
based preemptive multi-tasking
• DMA units with auto-flush and prefetch capability
• Flexible address management for DMA transfers
(increment, decrement, and no address changes on
source and destination address)
• DMA ports can handle unit-directional and
bi-directional flows (copy mode)
• Up to 8-word buffer for configurable burst transfers
for EMIv2.5
• Support of byte-swapping and CRC calculations
• Library of Scripts and API is available

SJC System JTAG Controller System Control The SJC provides JTAG interface, which complies with
Peripherals JTAG TAP standards, to internal logic. The i.MX 6ULL
processors use JTAG port for production, testing, and
system debugging. In addition, the SJC provides BSR
(Boundary Scan Register) standard support, which
complies with IEEE1149.1 and IEEE1149.6 standards.
The JTAG port must be accessible during platform initial
laboratory bring-up, for manufacturing tests and
troubleshooting, as well as for software debugging by
authorized entities. The i.MX 6ULL SJC incorporates
three security modes for protecting against
unauthorized accesses. Modes are selected through
eFUSE configuration.

SNVS Secure Non-Volatile Security Secure Non-Volatile Storage, including Secure Real
Storage Time Clock, Security State Machine, Master Key
Control, and Violation/Tamper Detection and reporting.

SPDIF Sony Philips Digital Multimedia A standard audio file transfer format, developed jointly
Interconnect Format Peripherals by the Sony and Phillips corporations. Has Transmitter
and Receiver functionality.

System Counter — — The system counter module is a programmable system


counter which provides a shared time base to the
Cortex A series cores as part of Arm’s generic timer
architecture. It is intended for use in application where
the counter is always powered on and supports
multiple, unrelated clocks.

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NXP Semiconductors 15
Modules List

Table 2. i.MX 6ULL Modules List (continued)

Block Mnemonic Block Name Subsystem Brief Description

TSC Touch Screen Touch Controller With touch controller to support 4-wire and 5-wire
resistive touch panel.

TZASC Trust-Zone Address Security The TZASC (TZC-380 by Arm) provides security
Space Controller address region control functions required for intended
application. It is used on the path to the DRAM
controller.

UART1 UART Interface Connectivity Each of the UARTv2 module supports the following
UART2 Peripherals serial data transmit/receive protocols and
UART3 configurations:
UART4 • 7- or 8-bit data words, 1 or 2 stop bits, programmable
UART5 parity (even, odd or none)
UART6 • Programmable baud rates up to 5 Mbps.
UART7 • 32-byte FIFO on Tx and 32 half-word FIFO on Rx
UART8 supporting auto-baud

uSDHC1 SD/MMC and SDXC Connectivity i.MX 6ULL specific SoC characteristics:
uSDHC2 Enhanced Multi-Media Peripherals All four MMC/SD/SDIO controller IPs are identical and
Card / Secure Digital Host are based on the uSDHC IP. They are:
Controller • Fully compliant with MMC command/response sets
and Physical Layer as defined in the Multimedia Card
System Specification, v4.5/4.2/4.3/4.4/4.41/
including high-capacity (size > 2 GB) cards HC MMC.
• Fully compliant with SD command/response sets
and Physical Layer as defined in the SD Memory
Card Specifications, v3.0 including high-capacity
SDXC cards up to 2 TB.
• Fully compliant with SDIO command/response sets
and interrupt/read-wait mode as defined in the SDIO
Card Specification, Part E1, v3.0
Two ports support:
• 1-bit or 4-bit transfer mode specifications for SD and
SDIO cards up to UHS-I SDR104 mode (104 MB/s
max)
• 1-bit, 4-bit, or 8-bit transfer mode specifications for
MMC cards up to 52 MHz in both SDR and DDR
modes (104 MB/s max)
• 4-bit or 8-bit transfer mode specifications for eMMC
chips up to 200 MHz in HS200 mode (200 MB/s max)
However, the SoC level integration and I/O muxing logic
restrict the functionality to the following:
• Instances #1 and #2 are primarily intended to serve
as interfaces to on-board peripherals. These ports
are equipped with “Card detection” and “Write
Protection” pads and do not support hardware reset.
• All ports can work with 1.8 V and 3.3 V cards. There
are two completely independent I/O power domains
for Ports #1 and #2 in four bit configuration (SD
interface).

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16 NXP Semiconductors
Modules List

Table 2. i.MX 6ULL Modules List (continued)

Block Mnemonic Block Name Subsystem Brief Description

USB Universal Serial Bus 2.0 Connectivity USBO2 (USB OTG1 and USB OTG2) contains:
Peripherals • Two high-speed OTG 2.0 modules with integrated
HS USB PHYs
• Support eight Transmit (TX) and eight Receive (Rx)
endpoints, including endpoint 0

WDOG1 Watch Dog Timer Peripherals The Watch Dog Timer supports two comparison points
WDOG3 during each counting period. Each of the comparison
points is configurable to evoke an interrupt to the Arm
core, and a second point evokes an external event on
the WDOG line.

WDOG2 Watch Dog (TrustZone) Timer Peripherals The TrustZone Watchdog (TZ WDOG) timer module
(TZ) protects against TrustZone starvation by providing a
method of escaping normal mode and forcing a switch
to the TZ mode. TZ starvation is a situation where the
normal OS prevents switching to the TZ mode. Such
situation is undesirable as it can compromise the
system’s security. Once the TZ WDOG module is
activated, it must be serviced by TZ software on a
periodic basis. If servicing does not take place, the timer
times out. Upon a time-out, the TZ WDOG asserts a TZ
mapped interrupt that forces switching to the TZ mode.
If it is still not served, the TZ WDOG asserts a security
violation signal to the CSU. The TZ WDOG module
cannot be programmed or deactivated by a normal
mode SW.

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NXP Semiconductors 17
Modules List

3.1 Special Signal Considerations


Table 3 lists special signal considerations for the i.MX 6ULL processors. The signal names are listed in
alphabetical order.
The package contact assignments can be found in Section 6, “Package Information and Contact
Assignments".” Signal descriptions are provided in the i.MX 6ULL Reference Manual (IMX6ULLRM).
Table 3. Special Signal Considerations

Signal Name Remarks

CCM_CLK1_P/ One general purpose differential high speed clock Input/output is provided.
CCM_CLK1_N It can be used:
• To feed external reference clock to the PLLs and further to the modules inside SoC.
• To output internal SoC clock to be used outside the SoC as either reference clock or as a
functional clock for peripherals.
See the i.MX 6ULL Reference Manual (IMX6ULLRM) for details on the respective clock trees.
Alternatively one may use single ended signal to drive CLK1_P input. In this case corresponding
CLK1_N input should be tied to the constant voltage level equal 1/2 of the input signal swing.
Termination should be provided in case of high frequency signals.
After initialization, the CLK1 input/output can be disabled (if not used). If unused, either or both of
the CLK1_N/P pairs may remain unconnected.

RTC_XTALI/RTC_XTALO If the user wishes to configure RTC_XTALI and RTC_XTALO as an RTC oscillator, a 32.768 kHz
crystal, (100 k ESR, 10 pF load) should be connected between RTC_XTALI and RTC_XTALO.
Keep in mind the capacitors implemented on either side of the crystal are about twice the crystal
load capacitor. To hit the exact oscillation frequency, the board capacitors need to be reduced to
account for board and chip parasitics. The integrated oscillation amplifier is self biasing, but
relatively weak. Care must be taken to limit parasitic leakage from RTC_XTALI and RTC_XTALO
to either power or ground (>100 M). This will debias the amplifier and cause a reduction of startup
margin. Typically RTC_XTALI and RTC_XTALO should bias to approximately 0.5 V.
If it is desired to feed an external low frequency clock into RTC_XTALI the RTC_XTALO pin should
be remain unconnected or driven with a complimentary signal. The logic level of this forcing clock
should not exceed VDD_SNVS_CAP level and the frequency should be <100 kHz under typical
conditions.
In case when high accuracy real time clock are not required, system may use internal low
frequency ring oscillator. It is recommended to connect RTC_XTALI to GND and keep RTC_XTALO
unconnected.

XTALI/XTALO A 24.0 MHz crystal should be connected between XTALI and XTALO.
The crystal must be rated for a maximum drive level of 250 W. An ESR (equivalent series
resistance) of typical 80  is recommended. NXP BSP (board support package) software requires
24 MHz on XTALI/XTALO.
The crystal can be eliminated if an external 24 MHz oscillator is available in the system. In this
case, XTALO must be directly driven by the external oscillator and XTALI is disconnected.
If this clock is used as a reference for USB, then there are strict frequency tolerance and jitter
requirements. See OSC24M chapter and relevant interface specifications chapters for details.

DRAM_VREF When using DDR_VREF with DDR I/O, the nominal reference voltage must be half of the
NVCC_DRAM supply. The user must tie DDR_VREF to a precision external resistor divider. Use a
1 k 0.5% resistor to GND and a 1 k 0.5% resistor to NVCC_DRAM. Shunt each resistor with a
closely-mounted 0.1 µF capacitor.

To reduce supply current, a pair of 1.5 k 0.1% resistors can be used. Using resistors with
recommended tolerances ensures the ± 2% DDR_VREF tolerance (per the DDR3 specification) is
maintained when two DDR3 ICs plus the i.MX 6ULL are drawing current on the resistor divider.

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Modules List

Table 3. Special Signal Considerations (continued)

Signal Name Remarks

ZQPAD DRAM calibration resistor 240  1% used as reference during DRAM output buffer driver
calibration should be connected between this pad and GND.

GPANAIO This signal is reserved for NXP manufacturing use only. This output must remain unconnected.

JTAG_nnnn The JTAG interface is summarized in Table 4. Use of external resistors is unnecessary. However,
if external resistors are used, the user must ensure that the on-chip pull-up/down configuration is
followed. For example, do not use an external pull down on an input that has on-chip pull-up.

JTAG_TDO is configured with a keeper circuit such that the non-connected condition is eliminated
if an external pull resistor is not present. An external pull resistor on JTAG_TDO is detrimental and
should be avoided.

JTAG_MOD is referenced as SJC_MOD in the i.MX 6ULL reference manual. Both names refer to
the same signal. JTAG_MOD must be externally connected to GND for normal operation.
Termination to GND through an external pull-down resistor (such as 1 k) is allowed. JTAG_MOD
set to hi configures the JTAG interface to mode compliant with IEEE1149.1 standard. JTAG_MOD
set to low configures the JTAG interface for common SW debug adding all the system TAPs to the
chain.

NC These signals are No Connect (NC) and should be disconnected by the user.

POR_B This cold reset negative logic input resets all modules and logic in the IC.
May be used in addition to internally generated power on reset signal (logical AND, both internal
and external signals are considered active low).

ONOFF ONOFF can be configured in debounce, off to on time, and max time-out configurations. The
debounce and off to on time configurations supports 0, 50, 100 and 500 ms. Debounce is used to
generate the power off interrupt. While in the ON state, if ONOFF button is pressed longer than the
debounce time, the power off interrupt is generated. Off to on time supports the time it takes to
request power on after a configured button press time has been reached. While in the OFF state,
if ONOFF button is pressed longer than the off to on time, the state will transition from OFF to ON.
Max time-out configuration supports 5, 10, 15 seconds and disable. Max time-out configuration
supports the time it takes to request power down after ONOFF button has been pressed for the
defined time.

TEST_MODE TEST_MODE is for NXP factory use. The user must tie this pin directly to GND.

Table 4. JTAG Controller Interface Summary

JTAG I/O Type On-chip Termination

JTAG_TCK Input 47 kpull-up


JTAG_TMS Input 47 kpull-up

JTAG_TDI Input 47 kpull-up

JTAG_TDO 3-state output Keeper

JTAG_TRSTB Input 47 kpull-up

JTAG_MOD Input 100 kpull-up

3.2 Recommended Connections for Unused Analog Interfaces


Table 5 shows the recommended connections for unused analog interfaces.

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Modules List

Table 5. Recommended Connections for Unused Analog Interfaces

Recommendations
Module Pad Name
if Unused

CCM CCM_CLK1_N, CCM_CLK1_P Not connect

USB USB_OTG1_CHD_B, USB_OTG1_DN, USB_OTG1_DP, USB_OTG1_VBUS, Not connect


USB_OTG2_DN, USB_OTG2_DP, USB_OTG2_VBUS

ADC ADC_VREFH Tie to


VDDA_ADC_3P3
VDDA_ADC_3P3 VDDA_ADC_3P3
must be powered
even if the ADC is
not used.

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Electrical Characteristics

4 Electrical Characteristics
This section provides the device and module-level electrical characteristics for the i.MX 6ULL processors.

4.1 Chip-Level Conditions


This section provides the device-level electrical characteristics for the IC. See Table 6 for a quick reference
to the individual tables and sections.
Table 6. i.MX 6ULL Chip-Level Conditions

For these characteristics Topic appears

Absolute Maximum Ratings on page 22

Thermal Resistance on page 22

Operating Ranges on page 24

External Clock Sources on page 26

Maximum Supply Currents on page 27

Power Modes on page 28

USB PHY Current Consumption on page 31

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Electrical Characteristics

4.1.1 Absolute Maximum Ratings


Table 7. Absolute Maximum Ratings

Parameter Description Symbol Min Max Unit

Core Supply Voltage VDDSOC_IN -0.3 1.6 V

Internal Supply Voltage VDDARM_CAP -0.3 1.4 V


VDDSOC_CAP

GPIO Supply Voltage NVCC_CSI -0.5 3.7 V


NVCC_ENET
NVCC_GPIO
NVCC_UART
NVCC_LCD
NVCC_NAND
NVCC_SD1

DDR IO Supply Voltage NVCC_DRAM -0.4 1.9751 V

VDD_SNVS_IN Supply Voltage VDD_SNVS_IN -0.3 3.6 V

VDDHIGH_IN Supply voltage VDD_HIGH_IN -0.3 3.7 V

USB VBUS USB_OTG1_VBUS — 5.5 V


USB_OTG2_VBUS

Input voltage on USB_OTG_DP and USB_OTG1_DP/USB_OTG1_DN -0.3 3.63 V


USB_OTG_DN pins USB_OTG2_DP/USB_OTG2_DN

Input/Output Voltage Range Vin/Vout -0.5 OVDD+0.32 V

ESD damage Immunity: Vesd

Human Body Model (HBM) — 2000 V


Charge Device Model (CDM) — 500
oC
Storage Temperature Range TSTORAGE -40 150
1 The absolute maximum voltage includes an allowance for 400 mV of overshoot on the IO pins. Per JEDEC standards, the
allowed signal overshoot must be derated if NVCC_DRAM exceeds 1.575 V.
2 OVDD is the I/O supply voltage.

4.1.2 Thermal Resistance

4.1.2.1 14 x 14 mm (VM) Package Thermal Resistance


Table 8 displays the 14 x 14 mm (VM) package thermal resistance data.
Table 8. 14 x 14 (VM) Thermal Resistance Data

Rating Test Conditions Symbol Value Unit Notes

Junction to Ambient Single-layer board (1s) RJA 58.4 oC/W 1,2

Natural convection
o 1,2,3
Junction to Ambient Four-layer board (2s2p) RJA 37.6 C/W
Natural convection

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Electrical Characteristics

Table 8. 14 x 14 (VM) Thermal Resistance Data (continued)

Rating Test Conditions Symbol Value Unit Notes


o 1,3
Junction to Ambient (@200 Single layer board (1s) RJMA 48.6 C/W
ft/min)
o 1,3
Junction to Ambient (@200 Four layer board (2s2p) RJMA 32.9 C/W
ft/min)
o 4
Junction to Board — RJB 21.8 C/W
o 5
Junction to Case — RJC 19.3 C/W

Junction to Package Top Natural Convection JT 2.3 o


C/W 6

Junction to Package Bottom Natural Convection JB 12.0 o


C/W 7

1
Junction temperature is a function of die size, on-chip power dissipation, package thermal resistance, mounting site (board)
temperature, ambient temperature, air flow, power dissipation of other components on the board, and board thermal
resistance.
2
Per SEMI G38-87 and JEDEC JESD51-2 with the single layer board horizontal.
3
Per JEDEC JESD51-6 with the board horizontal.
4 Thermal resistance between the die and the printed circuit board per JEDEC JESD51-8. Board temperature is measured on
the top surface of the board near the package.
5 Thermal resistance between the die and the case top surface as measured by the cold plate method (MIL SPEC-883 Method
1012.1).
6 Thermal characterization parameter indicating the temperature difference between package top and the junction temperature
per JEDEC JESD51-2. When Greek letters are not available, the thermal characterization parameter is written as Psi-JT.
7 Thermal characterization parameter indicating the temperature difference between package bottom center and the junction
temperature per JEDEC JESD51-12. When Greek letters are not available, the thermal characterization parameter is written
as Psi-JB

4.1.2.2 9 x 9 MM (VK) Package Thermal Resistance


Table 9 displays the 9 x 9 MM (VK) thermal resistance data.
Table 9. 9 x 9 MM (VK) Thermal Resistance Data

Rating Test Conditions Symbol Value Unit Notes


oC/W 1,2
Junction to Ambient Single-layer board (1s) RJA 65.6
Natural Convection
Junction to Ambient Four-layer board (2s2p) RJA 36.2 oC/W 1,2,3

Natural Convection

Junction to Ambient (@200 Single layer board (1s) RJMA 51.2 oC/W 1,3

ft/min)
Junction to Ambient (@200 Four layer board (2s2p) RJMA 31.8 oC/W 1,3

ft/min)

Junction to Board — RJB 17.1 oC/W 4

Junction to Case — RJC 14.5 oC/W 5

Junction to Package Top Natural Convection JT 0.6 oC/W 6

Junction to Package Bottom Natural Convection JB_CSB 11.1 oC/W 7

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NXP Semiconductors 23
Electrical Characteristics

1
Junction temperature is a function of die size, on-chip power dissipation, package thermal resistance, mounting site (board)
temperature, ambient temperature, air flow, power dissipation of other components on the board, and board thermal
resistance.
2
Per SEMI G38-87 and JEDEC JESD51-2 with the single layer board horizontal.
3
Per JEDEC JESD51-6 with the board horizontal.
4 Thermal resistances between the die and the printed circuit board per JEDEC JESD51-8. Board temperature is measured on
the top surface of the board near the package.
5
Thermal resistance between the die and the case top surface as measured by the cold plate method (MIL SPEC-883 Method
1012.1).
6
Thermal characterization parameter indicating the temperature difference between package top and the junction temperature
per JEDEC JESD51-2. When Greek letters are not available, the thermal characterization parameter is written as Psi-JT.
7
Thermal resistance between the die and the central solder balls on the bottom of the package based on simulation.

4.1.3 Operating Ranges


Table 10 provides the operating ranges of the i.MX 6ULL processors. For details on the chip's power
structure, see the “Power Management Unit (PMU)” chapter of the i.MX 6ULL Reference Manual
(IMX6ULLRM).
Table 10. Operating Ranges

Parameter Operating
Symbol Min Typ Max1 Unit Comment
Description Conditions

Run Mode: LDO VDD_SOC_IN A7 core at 792 1.325 — 1.5 V VDD_SOC_IN must be 125 mV
Enabled MHz higher than the LDO Output Set
Point (VDD_ARM_CAP and
A7 core at 528 1.275 — 1.5 VDD_SOC_CAP) for correct
MHz and below supply voltage regulation.

VDD_ARM_CAP A7 core at 792 1.2 1.26 V —


MHz

A7 core at 528 1.15 — 1.26


MHz

A7 core at 396 1.00 — 1.26


MHz

A7 core at 198 0.925 — 1.26


MHz

VDD_SOC_CAP — 1.15 — 1.26 V —

Run Mode: LDO VDD_SOC_IN A7 core 1.15 — 1.26 V A7 core operation above 528 MHz
Bypassed operations at 528 is not supported when LDO is
MHz or below. bypassed.

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Electrical Characteristics

Table 10. Operating Ranges (continued)

Low Power Run VDD_SOC_IN — 1.275 — 1.5 V VDD_SOC_IN must be 125 mV


Mode: LDO higher than the LDO Output Set
Enabled Point (VDD_ARM_CAP and
VDD_SOC_CAP) for correct
supply voltage regulation.

VDD_SOC_CAP All PLL 0.925 — 1.26 V —


bypassed, all
VDD_ARM_CAP clocks running at 0.925 — 1.26 V
24 MHz or below

Low Power Run VDD_SOC_IN All PLL 0.925 — 1.26 V —


Mode: LDO bypassed, all
Bypassed clocks running at
24 MHz or below

SUSPEND (DSM) VDD_SOC_IN — 0.9 — 1.26 V Refer to Table 15 Low Power Mode
Mode Current and Power Consumption
on page -29
VDD_HIGH VDD_HIGH_IN2 — 2.80 — 3.6 V Must match the range of voltages
internal regulator that the rechargeable backup
battery supports.

Backup battery VDD_SNVS_IN2, 3 — 2.40 — 3.6 V Can be combined with


supply range VDDHIGH_IN, if the system does
not require keeping real time and
other data on OFF state.

USB supply USB_OTG1_VBUS — 4.40 — 5.5 V —


voltages
USB_OTG2_VBUS — 4.40 — 5.5 V —

DDR I/O supply NVCC_DRAM LPDDR2 1.14 1.2 1.3 V —

DDR3L 1.28 1.35 1.45 V —

DDR3 1.43 1.5 1.575 V —

NVCC_DRAM2P5 — 2.25 2.5 2.75 V —

GPIO supplies NVCC_CSI2 — 1.65 1.8, 3.6 V All digital I/O supplies
2.8, (NVCC_xxxx) must be powered
NVCC_ENET2 3.3 (unless otherwise specified in this
NVCC_GPIO2 data sheet) under normal
conditions whether the associated
NVCC_UART2 I/O pins are in use or not.
NVCC_LCD2

NVCC_NAND2

NVCC_SD12

A/D converter VDDA_ADC_3P32 — 3.0 3.15 3.6 V VDDA_ADC_3P3 must be


powered when chip is in RUN
mode, IDLE mode, or SUSPEND
mode.
VDDA_ADC_3P3 should not be
powered when chip is in SNVS
mode.

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NXP Semiconductors 25
Electrical Characteristics

Table 10. Operating Ranges (continued)

Temperature Operating Ranges


o
Junction TJ Standard -40 — 105 C See i.MX 6ULL Product Lifetime
temperature Commercial Usage Estimates for information on
product lifetime (power-on years)
for this processor.
1
Applying the maximum voltage results in maximum power consumption and heat generation. NXP recommends a voltage set
point = (Vmin + the supply tolerance). This result in an optimized power/speed ratio.
2
Applying the maximum voltage results in shorten lifetime. 3.6 V usage limited to < 1% of the use profile. Rest of profile limited
to below 3.49 V.
3
In setting VDD_SNVS_IN voltage with regards to Charging Currents and RTC, refer to the i.MX 6ULL Hardware Development
Guide (IMX6ULLHDG).

Table 11 shows on-chip LDO regulators that can supply on-chip loads.
Table 11. On-Chip LDOs1 and their On-Chip Loads

Voltage Source Load Comment

VDD_HIGH_CAP NVCC_DRAM_2P5 Board-level connection to VDD_HIGH_CAP


1
On-chip LDOs are designed to supply i.MX 6ULL loads and must not be used to supply external loads.

4.1.4 External Clock Sources


Each i.MX 6ULL processor has two external input system clocks: a low frequency (RTC_XTALI) and a
high frequency (XTALI).
The RTC_XTALI is used for low-frequency functions. It supplies the clock for wake-up circuit,
power-down real time clock operation, and slow system and watch-dog counters. The clock input can be
connected to either external oscillator or a crystal using internal oscillator amplifier. Additionally, there is
an internal ring oscillator, which can be used instead of the RTC_XTALI if accuracy is not important.
The system clock input XTALI is used to generate the main system clock. It supplies the PLLs and other
peripherals. The system clock input can be connected to either external oscillator or a crystal using internal
oscillator amplifier.
Table 12 shows the interface frequency requirements.
Table 12. External Input Clock Frequency

Parameter Description Symbol Min Typ Max Unit

RTC_XTALI Oscillator1,2 fckil — 32.7683/32.0 — kHz

XTALI Oscillator2,4 fxtal — 24 — MHz


1 External oscillator or a crystal with internal oscillator amplifier.
2
The required frequency stability of this clock source is application dependent. For recommendations, see the Hardware
Development Guide for i.MX 6ULL Applications Processors (IMX6ULLHDG).
3
Recommended nominal frequency 32.768 kHz.
4 External oscillator or a fundamental frequency crystal with internal oscillator amplifier.

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The typical values shown in Table 12 are required for use with NXP BSPs to ensure precise time keeping
and USB operation. For RTC_XTALI operation, two clock sources are available.
• On-chip 40 kHz ring oscillator—this clock source has the following characteristics:
— Approximately 25 µA more Idd than crystal oscillator
— Approximately ±50% tolerance
— No external component required
— Starts up quicker than 32 kHz crystal oscillator
• External crystal oscillator with on-chip support circuit:
— At power up, ring oscillator is utilized. After crystal oscillator is stable, the clock circuit
switches over to the crystal oscillator automatically.
— Higher accuracy than ring oscillator
— If no external crystal is present, then the ring oscillator is utilized
The decision of choosing a clock source should be taken based on real-time clock use and precision
time-out.

4.1.5 Maximum Supply Currents


The data shown in Table 13 represent a use case designed specifically to show the maximum current
consumption possible. All cores are running at the defined maximum frequency and are limited to L1
cache accesses only to ensure no pipeline stalls. Although a valid condition, it would have a very limited
practical use case, if at all, and be limited to an extremely low duty cycle unless the intention was to
specifically show the worst case power consumption.
See the i.MX 6ULL Power Consumption Measurement Application Note (AN4581) for more details on
typical power consumption under various use case definitions.
Table 13. Maximum Supply Currents

Power Line Conditions Max Current Unit

VDD_SOC_IN 792 MHz Arm clock 500 mA


based on Dhrystone
test

VDD_HIGH_IN — 1251 mA

VDD_SNVS_IN — 5002 A

USB_OTG1_VBUS — 503 mA
USB_OTG2_VBUS

VDDA_ADC_3P3 100 Ohm maximum 35 mA


loading for touch panel

Primary Interface (IO) Supplies

NVCC_DRAM — (See4) —

NVCC_DRAM_2P5 — 50 mA

NVCC_GPIO N=16 Use maximum IO Equation5 —

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Table 13. Maximum Supply Currents (continued)

Power Line Conditions Max Current Unit

NVCC_UART N=16 Use maximum IO equation5 —

NVCC_ENET N=16 Use maximum IO equation5 —


5
NVCC_LCD N=29 Use maximum IO equation —

NVCC_NAND N=17 Use maximum IO equation5 —

NVCC_SD N=6 Use maximum IO equation5 —

NVCC_CSI N=12 Use maximum IO equation5 —

MISC

DRAM_VREF — 1 mA
1
The actual maximum current drawn from VDD_HIGH_IN will be as shown plus any additional current drawn from the
VDD_HIGH_CAP outputs, depending upon actual application configuration (for example, NVCC_DRAM_2P5 supplies).
2
The maximum VDD_SNVS_IN current may be higher depending on specific operating configurations, such as
BOOT_MODE[1:0] not equal to 00, or use of the Tamper feature. During initial power on, VDD_SNVS_IN can draw up to 1
mA, if available. VDD_SNVS_CAP charge time will increase if less than 1 mA is available.
3 This is the maximum current per active USB physical interface.
4
The DRAM power consumption is dependent on several factors, such as external signal termination. DRAM power
calculators are typically available from the memory vendors. They take in account factors, such as signal termination. See
the i.MX 6ULL Power Consumption Measurement Application Note (AN4581) or examples of DRAM power consumption
during specific use case scenarios.
5
General equation for estimated, maximum power consumption of an IO power supply:
Imax = N x C x V x (0.5 x F)
Where:
N—Number of IO pins supplied by the power line
C—Equivalent external capacitive load
V—IO voltage
(0.5 xF)—Data change rate. Up to 0.5 of the clock rate (F)
In this equation, Imax is in Amps, C in Farads, V in Volts, and F in Hertz.

4.1.6 Power Modes


The i.MX 6ULL has the following power modes:
• RUN Mode: CPU is active, some portion of the chip can be clock gated or power gated. Support
multiple voltage/frequency scaling set point for power saving;
• Low Power Mode: CPU in WFI state or power gate, some portion of the chip can be shut off for
power saving. The Suspend, Low Power Idle, System Idle are consider as sub-modes of the RUN
mode;
• SNVS Mode: only RTC and tamper detection logic is active, with 12 GPIOs in low power state
retention mode;
• OFF Mode: all power rails are off.
The following table summarizes the external power supply state in all the power modes.

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Table 14. Power Supply State in Power Modes

Power Rail RUN Low Power SNVS OFF

VDD_SOC_IN ON ON OFF OFF

VDD_HIGH_IN ON ON OFF OFF

VDD_SNVS ON ON ON OFF

USB_OTG1_VBUS ON / OFF ON / OFF OFF OFF


USB_OTG2_VBUS

NVCC_DRAM_2P5 ON ON OFF OFF

VDDA_ADC_3P3 ON / OFF ON / OFF OFF OFF

NVCC_DRAM ON ON OFF OFF

NVCC_XXX ON / OFF ON / OFF OFF OFF

4.1.6.1 RUN Mode


In RUN mode, the CPU is active and running, and the analog / digital peripheral modules inside the
processor will be enabled. In this mode, all the external power rails to the processor have to be ON and the
SoC will be able to draw as many current.
Typically, when the CPU is doing DVFS, it switches the VDD_ARM voltage according to Table 10.

4.1.6.2 Low Power Mode


When the CPU is not running, the processor can enter low power mode. i.MX 6ULL processor supports a
very flexible set of power mode configurations in low power mode.
Typically there are three low power modes used, System IDLE, Low Power IDLE, and SUSPEND:
• System IDLE—This is a mode that the CPU can automatically enter when there is no thread
running. All the peripherals can keep working and the CPU’s state is retained so the interrupt
response can be very short. The cores are able to individually enter the WAIT state.
• Low Power IDLE—This mode is for the case when the system needs to have lower power but still
keep some of the peripherals alive. Most of the peripherals, analog modules, and PHYs are shut
off. The interrupt response in this mode is expected to be longer than the System IDLE, but its
power is much lower.
• Suspend—This mode has the greatest power savings; all clocks, unused analog/PHYs, and
peripherals are off. The external DRAM stays in Self-Refresh mode. The exit time from this mode
is much longer.
Table 15 shows the current core consumption (not including I/O) of i.MX 6ULL processors in selected low
power modes.
Table 15. Low Power Mode Current and Power Consumption

Mode Test Conditions Supply Typical Units

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Table 15. Low Power Mode Current and Power Consumption (continued)

SYSTEM IDLE: • LDO_ARM and LDO_SOC are set to 1.15 V VDD_SOC_IN (1.325 V) 9 mA
LDO Enabled • LDO_2P5 set to 2.5 V, LDO_1P1 set to 1.1 V
• CPU in WFI, CPU clock gated VDD_HIGH_IN (3.0 V) 9.7
• DDR is in self refresh VDD_SNVS_IN (3.0 V) 0.04
• 24 MHz XTAL is ON
• 528 PLL is active, other PLLs are power down Total 41.15 mW
• High-speed peripheral clock gated, but remain
powered

SYSTEM IDLE: • LDO_ARM and LDO_SOC are set to bypass VDD_SOC_IN (1.25 V) 8.5 mA
LDO Bypassed mode
• LDO_2P5 set to 2.5 V, LDO_1P1 set to 1.1 V VDD_HIGH_IN (3.0 V) 8.8
• CPU in WFI, CPU clock gated VDD_SNVS_IN (3.0 V) 0.04
• DDR is in self refresh
• 24 MHz XTAL is ON Total 37.15 mW
• 528 PLL is active, other PLLs are power down
• High-speed peripheral clock gated, but remain
powered

LOW POWER IDLE: • LDO_SOC is set to 1.15 V, LDO_ARM is in PG VDD_SOC_IN (1.025 V) 1.6 mA
LDO Enabled mode
• LDO_2P5 and LDO_1P1 are set to weak mode VDD_HIGH_IN (3.0 V) 1.25
• CPU in power gate mode VDD_SNVS_IN (3.0 V) 0.03
• DDR is in self refresh
• All PLLs are power down Total 5.48 mW
• 24 MHz XTAL is off, 24 MHz RCOSC used as
clock source
• High-speed peripheral are powered off

LOW POWER IDLE: • LDO_SOC is in bypass mode, LDO_ARM is in PG VDD_SOC_IN (0.9 V) 1.5 mA
LDO Bypassed mode
• LDO_2P5 and LDO_1P1 are set to weak mode VDD_HIGH_IN (3.0 V) 0.3
• CPU in power gate mode VDD_SNVS_IN (3.0 V) 0.05
• DDR is in self refresh
• All PLLs are power down Total 2.4 mW
• 24 MHz XTAL is off, 24 MHz RCOSC used as
clock source
• High-speed peripheral are powered off

SUSPEND: • LDO_SOC is in bypass mode, LDO_ARM is in PG VDD_SOC_IN (0.9 V) 0.3 mA


mode
• LDO_2P5 and LDO_1P1 are shut off VDD_HIGH_IN (3.0 V) 0.03
• CPU in power gate mode VDD_SNVS_IN (3.0 V) 0.03
• DDR is in self refresh
• All PLLs are power down Total 0.45 mW
• 24 MHz XTAL is off, 24 MHz RCOSC is off
• All clocks are shut off, except 32 kHz RTC
• High-speed peripheral are powered off

SNVS: • All SOC digital logic, analog module are shut off VDD_SOC_IN (0 V) 0 mA
• 32 kHz RTC is alive
• Tamper detection circuit remains active VDD_HIGH_IN (0 V) 0

VDD_SNVS_IN (3.0 V) 0.03

Total 0.09 mW

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4.1.6.3 SNVS Mode


SNVS mode is also called RTC mode, where only the power for the SNVS domain remain on. In this
mode, only the RTC and tamper detection logic is still active.
The power consumption in SNVS model with all the tamper detection logic enabled will be less than 0.03
[email protected] on VDD_SNVS for typical silicon at 25C.
In SNVS mode, the supported wakeup source are RTC alarm, ONOFF event, and also the 12 GPIO pads
in VDD_SNVS_IN domain.
In some applications, the SNVS mode is powered by non-rechargeable coin cell battery, so the power
consumption in SNVS mode has to be very low.

4.1.6.4 OFF Mode


In OFF mode, all power rails are shut off.

4.1.7 USB PHY Current Consumption

4.1.7.1 Power Down Mode


In power down mode, everything is powered down, including the USB VBUS valid detectors in typical
condition. Table 16 shows the USB interface current consumption in power down mode.
Table 16. USB PHY Current Consumption in Power Down Mode

VDD_USB_CAP (3.0 V) VDD_HIGH_CAP (2.5 V) NVCC_PLL (1.1 V)

Current 5.1 A 1.7 A < 0.5 A

NOTE
The currents on the VDD_HIGH_CAP and VDD_USB_CAP were
identified to be the voltage divider circuits in the USB-specific level
shifters.

4.2 Power Supplies Requirements and Restrictions


The system design must comply with power-up sequence, power-down sequence, and steady state
guidelines as described in this section to guarantee the reliable operation of the device. Any deviation from
these sequences may result in the following situations:
• Excessive current during power-up phase
• Prevention of the device from booting
• Irreversible damage to the processor (worst-case scenario)

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4.2.1 Power-Up Sequence


The below restrictions must be followed:
• VDD_SNVS_IN supply must be turned on before any other power supply.
• If a coin cell is used to power VDD_SNVS_IN, then ensure that it is connected before any other
supply is switched on.
• VDD_HIGH_IN should be turned on before VDD_SOC_IN.
NOTE
The POR_B input (if used) must be immediately asserted at power-up and
remain asserted until after the last power rail reaches its working voltage. In
the absence of an external reset feeding the POR_B input, the internal POR
module takes control. See the i.MX 6ULL Reference Manual
(IMX6ULLRM) for further details and to ensure that all necessary
requirements are being met.
NOTE
Need to ensure that there is no back voltage (leakage) from any supply on
the board towards the 3.3 V supply (for example, from the external
components that use both the 1.8 V and 3.3 V supplies).
NOTE
USB_OTG1_VBUS and USB_OTG2_VBUS are not part of the power
supply sequence and may be powered at any time.

4.2.2 Power-Down Sequence


The following restrictions must be followed:
• VDD_SNVS_IN supply must be turned off after any other power supply.
• If a coin cell is used to power VDD_SNVS_IN, then ensure that it is removed after any other supply
is switched off.
• VDD_HIGH_IN should be turned off after VDD_SOC_IN is switched off.

4.2.3 Power Supplies Usage


All I/O pins should not be externally driven while the I/O power supply for the pin (NVCC_xxx) is OFF.
This can cause internal latch-up and malfunctions due to reverse current flows. For information about I/O
power supply of each pin, see “Power Rail” columns in pin list tables of Section 6, “Package Information
and Contact Assignments".”

4.3 Integrated LDO Voltage Regulator Parameters


Various internal supplies can be powered ON from internal LDO voltage regulators. All the supply pins
named *_CAP must be connected to external capacitors. The onboard LDOs are intended for internal use

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only and should not be used to power any external circuitry. See the i.MX 6ULL Reference Manual
(IMX6ULLRM) for details on the power tree scheme.
NOTE
The *_CAP signals should not be powered externally. These signals are
intended for internal LDO operation only.

4.3.1 Digital Regulators (LDO_ARM, LDO_SOC)


There are two digital LDO regulators (“Digital”, because of the logic loads that they drive, not because of
their construction). The advantages of the regulators are to reduce the input supply variation because of
their input supply ripple rejection and their on-die trimming. This translates into more stable voltage for
the on-chip logics.
These regulators have two basic modes:
• Power Gate. The regulation FET is switched fully off limiting the current draw from the supply.
The analog part of the regulator is powered down here limiting the power consumption.
• Analog regulation mode. The regulation FET is controlled such that the output voltage of the
regulator equals the programmed target voltage. The target voltage is fully programmable in 25 mV
steps.
For additional information, see the i.MX 6ULL Reference Manual (IMX6ULLRM).

4.3.2 Analog Regulators (LDO_1P1, LDO_2P5, and LDO_USB)

4.3.2.1 LDO_1P1
The LDO_1P1 regulator implements a programmable linear-regulator function from VDD_HIGH_IN (see
Table 10 for minimum and maximum input requirements). Typical Programming Operating Range is 1.0
V to 1.2 V with the nominal default setting as 1.1 V. The LDO_1P1 supplies the USB PHY, and PLLs. A
programmable brown-out detector is included in the regulator that can be used by the system to determine
when the load capability of the regulator is being exceeded to take the necessary steps. Current-limiting
can be enabled to allow for in-rush current requirements during start-up, if needed. Active-pull-down can
also be enabled for systems requiring this feature.
For information on external capacitor requirements for this regulator, see the Hardware Development
Guide for i.MX 6ULL Applications Processors (IMX6ULLHDG).
For additional information, see the i.MX 6ULL Reference Manual (IMX6ULLRM).

4.3.2.2 LDO_2P5
The LDO_2P5 module implements a programmable linear-regulator function from VDD_HIGH_IN (see
Table 10 for minimum and maximum input requirements). Typical Programming Operating Range is
2.25 V to 2.75 V with the nominal default setting as 2.5 V. LDO_2P5 supplies the DDR IOs, USB PHY,
E-fuse module, and PLLs. A programmable brown-out detector is included in the regulator that can be
used by the system to determine when the load capability of the regulator is being exceeded, to take the

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necessary steps. Current-limiting can be enabled to allow for in-rush current requirements during start-up,
if needed. Active-pull-down can also be enabled for systems requiring this feature. An alternate self-biased
low-precision weak-regulator is included that can be enabled for applications needing to keep the output
voltage alive during low-power modes where the main regulator driver and its associated global bandgap
reference module are disabled. The output of the weak-regulator is not programmable and is a function of
the input supply as well as the load current. Typically, with a 3 V input supply the weak-regulator output
is 2.525 V and its output impedance is approximately 40 ..
For information on external capacitor requirements for this regulator, see the Hardware Development
Guide for i.MX 6ULL Applications Processors (IMX6ULLHDG).
For additional information, see the i.MX 6ULL Reference Manual (IMX6ULLRM).

4.3.2.3 LDO_USB
The LDO_USB module implements a programmable linear-regulator function from the USB VUSB
voltages (4.4 V–5.5 V) to produce a nominal 3.0 V output voltage. A programmable brown-out detector
is included in the regulator that can be used by the system to determine when the load capability of the
regulator is being exceeded, to take the necessary steps. This regulator has a built in power-mux that allows
the user to select to run the regulator from either USB VBUS supply, when both are present. If only one
of the USB VBUS voltages is present, then, the regulator automatically selects this supply. Current limit
is also included to help the system meet in-rush current targets.
For information on external capacitor requirements for this regulator, see the Hardware Development
Guide for i.MX 6ULL Applications Processors (IMX6ULLHDG).
For additional information, see the i.MX 6ULL Reference Manual (IMX6ULLRM).

4.4 PLL’s Electrical Characteristics

4.4.1 Audio/Video PLL’s Electrical Parameters

Table 17. Audio/Video PLL’s Electrical Parameters

Parameter Value

Clock output range 650 MHz ~1.3 GHz

Reference clock 24 MHz

Lock time <11250 reference cycles

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4.4.2 528 MHz PLL

Table 18. 528 MHz PLL’s Electrical Parameters

Parameter Value

Clock output range 528 MHz PLL output

Reference clock 24 MHz

Lock time <11250 reference cycles

4.4.3 Ethernet PLL

Table 19. Ethernet PLL’s Electrical Parameters

Parameter Value

Clock output range 500 MHz

Reference clock 24 MHz

Lock time <11250 reference cycles

4.4.4 480 MHz PLL

Table 20. 480 MHz PLL’s Electrical Parameters

Parameter Value

Clock output range 480 MHz PLL output

Reference clock 24 MHz

Lock time <383 reference cycles

4.4.5 Arm PLL

Table 21. Arm PLL’s Electrical Parameters

Parameter Value

Clock output range 648 MHz ~ 1296 MHz

Reference clock 24 MHz

Lock time <2250 reference cycles

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4.5 On-Chip Oscillators

4.5.1 OSC24M
This block implements an amplifier that when combined with a suitable quartz crystal and external load
capacitors implement an oscillator. The oscillator is powered from NVCC_PLL.
The system crystal oscillator consists of a Pierce-type structure running off the digital supply. A straight
forward biased-inverter implementation is used.

4.5.2 OSC32K
This block implements an amplifier that when combined with a suitable quartz crystal and external load
capacitors implement a low power oscillator. It also implements a power mux such that it can be powered
from either a ~3 V backup battery (VDD_SNVS_IN) or VDD_HIGH_IN such as the oscillator consumes
power from VDD_HIGH_IN when that supply is available and transitions to the backup battery when
VDD_HIGH_IN is lost.
In addition, if the clock monitor determines that the OSC32K is not present, then the source of the 32 K
will automatically switch to a crude internal ring oscillator. The frequency range of this block is
approximately 10–45 kHz. It highly depends on the process, voltage, and temperature.
The OSC32k runs from VDD_SNVS_CAP supply, which comes from the
VDD_HIGH_IN/VDD_SNVS_IN. The target battery is a ~3 V coin cell. Proper choice of coin cell type
is necessary for chosen VDD_HIGH_IN range. Appropriate series resistor (Rs) must be used when
connecting the coin cell. Rs depends on the charge current limit that depends on the chosen coin cell. For
example, for Panasonic ML621:
• Average Discharge Voltage is 2.5 V
• Maximum Charge Current is 0.6 mA
For a charge voltage of 3.2 V, Rs = (3.2-2.5)/0.6 m = 1.17 k.
Table 22. OSC32K Main Characteristics

Min Typ Max Comments

Fosc — 32.768 KHz — This frequency is nominal and determined mainly by the crystal selected.
32.0 K would work as well.

Current consumption — 4 A — The 4 A is the consumption of the oscillator alone (OSC32k). Total supply
consumption will depend on what the digital portion of the RTC consumes.
The ring oscillator consumes 1 A when ring oscillator is inactive, 20 A
when the ring oscillator is running. Another 1.5 A is drawn from vdd_rtc
in the power_detect block. So, the total current is 6.5 A on vdd_rtc when
the ring oscillator is not running.

Bias resistor — 14 M — This the integrated bias resistor that sets the amplifier into a high gain
state. Any leakage through the ESD network, external board leakage, or
even a scope probe that is significant relative to this value will debias the
amp. The debiasing will result in low gain, and will impact the circuit's ability
to start up and maintain oscillations.

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Table 22. OSC32K Main Characteristics

Min Typ Max Comments

Crystal Properties

Cload — 10 pF — Usually crystals can be purchased tuned for different Cloads. This Cload
value is typically 1/2 of the capacitances realized on the PCB on either side
of the quartz. A higher Cload will decrease oscillation margin, but
increases current oscillating through the crystal.

ESR — 50 k 100 k Equivalent series resistance of the crystal. Choosing a crystal with a higher
value will decrease the oscillating margin.

4.6 I/O DC Parameters


This section includes the DC parameters of the following I/O types:
• General Purpose I/O (GPIO)
• Double Data Rate I/O (DDR) for LPDDR2 and DDR3/DDR3L modes
NOTE
The term ‘OVDD’ in this section refers to the associated supply rail of an
input or output.

Figure 3. Circuit for Parameters Voh and Vol for I/O Cells

4.6.1 XTALI and RTC_XTALI (Clock Inputs) DC Parameters


Table 23 shows the DC parameters for the clock inputs.
Table 23. XTALI and RTC_XTALI DC Parameters 1

Parameter Symbol Test Conditions Min Max Unit

XTALI high-level DC input voltage Vih — 0.8 x NVCC_PLL NVCC_PLL V

XTALI low-level DC input voltage Vil — 0 0.2 V

RTC_XTALI high-level DC input voltage Vih — 0.8 1.1 V

RTC_XTALI low-level DC input voltage Vil — 0 0.2 V

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1
The DC parameters are for external clock input only.

4.6.2 Single Voltage General Purpose I/O (GPIO) DC Parameters


Table 24 shows DC parameters for GPIO pads. The parameters in Table 24 are guaranteed per the
operating ranges in Table 10, unless otherwise noted.
Table 24. Single Voltage GPIO DC Parameters

Parameter Symbol Test Conditions Min Max Units

High-level output voltage1 VOH Ioh= -0.1mA (ipp_dse=001,010) OVDD-0.15 – V


Ioh= -1mA
(ipp_dse=011,100,101,110,111)

Low-level output voltage1 VOL Iol= 0.1mA (ipp_dse=001,010) – 0.15 V


Iol= 1mA
(ipp_dse=011,100,101,110,111)
High-Level input voltage1,2 VIH — 0.7 x OVDD OVDD V

Low-Level input voltage1,2 VIL — 0 0.3 x V


OVDD

Input Hysteresis (OVDD= 1.8V) VHYS_LowVDD OVDD=1.8V 200 — mV

Input Hysteresis (OVDD=3.3V VHYS_HighVDD OVDD=3.3V 200 — mV

Schmitt trigger VT+2,3 VTH+ — 0.5 x OVDD — mV

Schmitt trigger VT-2,3 VTH- — — 0.5 x mV


OVDD

Pull-up resistor (22_k PU) RPU_22K Vin=0V — 212 uA

Pull-up resistor (22_k PU) RPU_22K Vin=OVDD — 1 uA

Pull-up resistor (47_k PU) RPU_47K Vin=0V — 100 uA

Pull-up resistor (47_k PU) RPU_47K Vin=oOVDD — 1 uA

Pull-up resistor (100_k PU) RPU_100K Vin=0V — 48 uA

Pull-up resistor (100_k PU) RPU_100K Vin=OVDD — 1 uA

Pull-down resistor (100_k PD) RPD_100K Vin=OVDD — 48 uA

Pull-down resistor (100_k PD) RPD_100K Vin=0V — 1 uA

Input current (no PU/PD) IIN VI = 0, VI = OVDD -1 1 uA

Keeper Circuit Resistance R_Keeper VI =0.3 x OVDD, VI = 0.7 x OVDD 105 175 k
1 Overshoot and undershoot conditions (transitions above OVDD and below GND) on switching pads must be held below 0.6 V,
and the duration of the overshoot/undershoot must not exceed 10% of the system clock cycle. Overshoot/ undershoot must be
controlled through printed circuit board layout, transmission line impedance matching, signal line termination, or other
methods. Non-compliance to this specification may affect device reliability or cause permanent damage to the device.
2 To maintain a valid level, the transition edge of the input must sustain a constant slew rate (monotonic) from the current DC

level through to the target DC level, Vil or Vih. Monotonic input transition time is from 0.1 ns to 1 s.
3
Hysteresis of 250 mV is guaranteed over all operating conditions when hysteresis is enabled.

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4.6.3 DDR I/O DC Parameters


The DDR I/O pads support LPDDR2 and DDR3/DDR3L operational modes. For details on supported
DDR memory configurations, see Section 4.10, “Multi-Mode DDR Controller (MMDC)".
MMDC operation with the standards stated above is contingent upon the board DDR design adherence to
the DDR design and layout requirements stated in the Hardware Development Guide for the i.MX 6ULL
Applications Processor (IMX6ULLHDG).

4.6.3.1 LPDDR2 Mode I/O DC Parameters


Table 25. LPDDR2 I/O DC Electrical Parameters1

Parameters Symbol Test Conditions Min Max Unit

High-level output voltage VOH Ioh= -0.1mA 0.9 x OVDD — V

Low-level output voltage VOL Iol= 0.1mA — 0.1 x OVDD V

Input Reference Voltage Vref — 0.49 x OVDD 0.51 x OVDD V

DC High-Level input voltage Vih_DC — Vref+0.13 OVDD V

DC Low-Level input voltage Vil_DC — OVSS Vref-0.13 V

Differential Input Logic High Vih_diff — 0.26 Note2 —

Differential Input Logic Low Vil_diff — Note2 -0.26 —

Pull-up/Pull-down Impedance Mismatch Mmpupd — -15 15 %

240  unit calibration resolution Rres — — 10 

Keeper Circuit Resistance Rkeep — 110 175 k

Input current (no pull-up/down) Iin VI = 0, VI = OVDD -2.5 2.5 A


1 Note that the JEDEC LPDDR2 specification (JESD209_2B) supersedes any specification in this document.
2
The single-ended signals need to be within the respective limits (Vih(dc) max, Vil(dc) min) for single-ended signals as well as
the limitations for overshoot and undershoot.

4.6.3.2 DDR3/DDR3L Mode I/O DC Parameters


The parameters in Table 27 are guaranteed per the operating ranges in Table 10, unless otherwise noted.
Table 27. DDR3/DDR3L I/O DC Electrical Characteristics

Parameters Symbol Test Conditions Min Max Unit

High-level output voltage VOH Ioh= -0.1mA 0.8 x OVDD1 — V


Voh (for ipp_dse=001)
Low-level output voltage VOL Iol= 0.1mA 0.2 x OVDD — V
Vol (for ipp_dse=001)

High-level output voltage VOH Ioh= -1mA 0.8 x OVDD — V


Voh (for all except ipp_dse=001)

Low-level output voltage VOL Iol= 1mA 0.2 x OVDD — V


Vol (for all except ipp_dse=001)

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Table 27. DDR3/DDR3L I/O DC Electrical Characteristics (continued)

Parameters Symbol Test Conditions Min Max Unit

Input Reference Voltage Vref — 0.49 x OVDD 0.51 x ovdd V

DC High-Level input voltage Vih_DC — Vref2+0.1 OVDD V

DC Low-Level input voltage Vil_DC — OVSS Vref-0.1 V

Differential Input Logic High Vih_diff — 0.2 See Note3 V

Differential Input Logic Low Vil_diff — — -0.2 V

Termination Voltage Vtt Vtt tracking OVDD/2 0.49 x OVDD 0.51 x OVDD V

Pull-up/Pull-down Impedance Mismatch Mmpupd — -10 10 %

240 unit calibration resolution Rres — — 10 

Keeper Circuit Resistance Rkeep — 105 165 k

Input current (no pull-up/down) Iin VI = 0,VI = OVDD -2.9 2.9 A


1
OVDD – I/O power supply (1.425 V–1.575 V for DDR3 and 1.283 V–1.45 V for DDR3L)
2
Vref – DDR3/DDR3L external reference voltage
3 The single-ended signals need to be within the respective limits (Vih(dc) max, Vil(dc) min) for single-ended signals as well as

the limitations for overshoot and undershoot.

4.6.4 LVDS I/O DC Parameters


The LVDS interface complies with TIA/EIA 644-A standard. See TIA/EIA STANDARD 644-A,
“Electrical Characteristics of Low Voltage Differential Signaling (LVDS) Interface Circuits” for details.
Table 28 shows the Low Voltage Differential Signaling (LVDS) I/O DC parameters.
Table 28. LVDS I/O DC Characteristics

Parameter Symbol Test Conditions Min Typ Max Unit

Output Differential Voltage VOD Rload-100  Diff 250 350 450 mV

Output High Voltage VOH IOH = 0 mA 1.25 1.375 1.6 V

Output Low Voltage VOL IOL = 0 mA 0.9 1.025 1.25 V

Offset Voltage VOS — 1.125 1.2 1.375 V

4.7 I/O AC Parameters


This section includes the AC parameters of the following I/O types:
• General Purpose I/O (GPIO)
• Double Data Rate I/O (DDR) for LPDDR2 and DDR3/DDR3L modes
The GPIO and DDR I/O load circuit and output transition time waveforms are shown in Figure 4 and
Figure 5.

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From Output Test Point


Under Test
CL

CL includes package, probe and fixture capacitance

Figure 4. Load Circuit for Output

OVDD
80% 80%

20% 20%
Output (at pad) 0V
tr tf

Figure 5. Output Transition Time Waveform

4.7.1 General Purpose I/O AC Parameters


The I/O AC parameters for GPIO in slow and fast modes are presented in the Table 29 and Table 30,
respectively. Note that the fast or slow I/O behavior is determined by the appropriate control bits in the
IOMUXC control registers.
Table 29. General Purpose I/O AC Parameters 1.8 V Mode

Parameter Symbol Test Condition Min Typ Max Unit

Output Pad Transition Times, rise/fall tr, tf 22 pF Cload, slow slew rate 2.72/2.79
— —
(Max Drive, ipp_dse=111) 22 pF Cload, fast slew rate 1.69/1.82

Output Pad Transition Times, rise/fall tr, tf 22 pF Cload, slow slew rate 3.99/4.44
— —
(High Drive, ipp_dse=101) 22 pF Cload, fast slew rate 2.14/2.50 ns
Output Pad Transition Times, rise/fall tr, tf 22 pF Cload, slow slew rate 4.52/5.01
— —
(Medium Drive, ipp_dse=100) 22 pF Cload, fast slew rate 2.52/3.07

Output Pad Transition Times, rise/fall tr, tf 22 pF Cload, slow slew rate 5.15/5.68
— —
(Low Drive. ipp_dse=011) 22 pF Cload, fast slew rate 3.44/3.73
Input Transition Times1 trm — — — 25 ns
1 Hysteresis mode is recommended for inputs with transition times greater than 25 ns.

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Table 30. General Purpose I/O AC Parameters 3.3 V Mode

Parameter Symbol Test Condition Min Typ Max Unit

Output Pad Transition Times, rise/fall tr, tf 22 pF Cload, slow slew rate 1.84/2.06
— —
(Max Drive, ipp_dse=101) 22 pF Cload, fast slew rate 1.09/1.35

Output Pad Transition Times, rise/fall tr, tf 22 pF Cload, slow slew rate 2.44/2.75
— —
(High Drive, ipp_dse=011) 22 pF Cload, fast slew rate 1.75/2.02 ns
Output Pad Transition Times, rise/fall tr, tf 22 pF Cload, slow slew rate 3.26/3.70
— —
(Medium Drive, ipp_dse=010) 22 pF Cload, fast slew rate 2.47/2.92

Output Pad Transition Times, rise/fall tr, tf 22 pF Cload, slow slew rate 5.26/6.19
— —
(Low Drive. ipp_dse=001) 22 pF Cload, fast slew rate 4.88/5.77 ns

Input Transition Times1 trm — — — 25 ns


1
Hysteresis mode is recommended for inputs with transition times greater than 25 ns.

4.7.2 DDR I/O AC Parameters


The DDR I/O pads support LPDDR2 and DDR3/DDR3L operational modes. For details on supported
DDR memory configurations, see Section 4.10, “Multi-Mode DDR Controller (MMDC)".
MMDC operation with the standards stated above is contingent upon the board DDR design adherence to
the DDR design and layout requirements stated in the Hardware Development Guide for the i.MX 6ULL
Applications Processor (IMX6ULLHDG).
Table 31 shows the AC parameters for DDR I/O operating in LPDDR2 mode.
Table 31. DDR I/O LPDDR2 Mode AC Parameters1

Parameter Symbol Test Condition Min Max Unit

AC input logic high Vih(ac) — Vref + 0.22 OVDD V

AC input logic low Vil(ac) — 0 Vref - 0.22 V

AC differential input high voltage2 Vidh(ac) — 0.44 — V

AC differential input low voltage Vidl(ac) — — 0.44 V


3
Input AC differential cross point voltage Vix(ac) Relative to Vref -0.12 0.12 V

Over/undershoot peak Vpeak — — 0.35 V

Over/undershoot area (above OVDD Varea 400 MHz — 0.3 V-ns


or below OVSS)

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Table 31. DDR I/O LPDDR2 Mode AC Parameters1 (continued)

Parameter Symbol Test Condition Min Max Unit

tsr 50 to Vref. 1.5 3.5 V/ns


5 pF load.
Drive impedance = 40 
Single output slew rate, measured between ± 30%
Vol (ac) and Voh (ac) 50 to Vref. 1 2.5
5pF load.Drive
impedance = 60 ±
30%

Skew between pad rise/fall asymmetry + skew tSKD clk = 400 MHz — 0.1 ns
caused by SSN
1
Note that the JEDEC LPDDR2 specification (JESD209_2B) supersedes any specification in this document.
2
Vid(ac) specifies the input differential voltage | Vtr - Vcp | required for switching, where Vtr is the “true” input signal and Vcp
is the “complementary” input signal. The Minimum value is equal to Vih(ac) - Vil(ac).
3 The typical value of Vix(ac) is expected to be about 0.5 x OVDD. and Vix(ac) is expected to track variation of OVDD. Vix(ac)

indicates the voltage at which differential input signal must cross.

Table 32 shows the AC parameters for DDR I/O operating in DDR3/DDR3L mode.
Table 32. DDR I/O DDR3/DDR3L Mode AC Parameters1

Parameter Symbol Test Condition Min Typ Max Unit

AC input logic high Vih(ac) — Vref + 0.175 — OVDD V

AC input logic low Vil(ac) — 0 — Vref - 0.175 V

AC differential input voltage2 Vid(ac) — 0.35 — — V


3
Input AC differential cross point voltage Vix(ac) Relative to Vref Vref - 0.15 — Vref + 0.15 V

Over/undershoot peak Vpeak — — — 0.4 V

Over/undershoot area (above OVDD Varea 400 MHz — — 0.5 V-ns


or below OVSS)

Single output slew rate, measured between Vol tsr Driver impedance = 34  2.5 — 5 V/ns
(ac) and Voh (ac)

Skew between pad rise/fall asymmetry + skew tSKD clk = 400 MHz — — 0.1 ns
caused by SSN
1 Note that the JEDEC JESD79_3C specification supersedes any specification in this document.
2 Vid(ac) specifies the input differential voltage | Vtr-Vcp | required for switching, where Vtr is the “true” input signal and Vcp is
the “complementary” input signal. The Minimum value is equal to Vih(ac) - Vil(ac).
3 The typical value of Vix(ac) is expected to be about 0.5 x OVDD. and Vix(ac) is expected to track variation of OVDD. Vix(ac)

indicates the voltage at which differential input signal must cross.

4.8 Output Buffer Impedance Parameters


This section defines the I/O impedance parameters of the i.MX 6ULL processors for the following I/O
types:
• Single Voltage General Purpose I/O (GPIO)

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• Double Data Rate I/O (DDR) for LPDDR2, and DDR3/DDR3L modes
NOTE
GPIO and DDR I/O output driver impedance is measured with “long”
transmission line of impedance Ztl attached to I/O pad and incident wave
launched into transmission line. Rpu/Rpd and Ztl form a voltage divider that
defines specific voltage of incident wave relative to OVDD. Output driver
impedance is calculated from this voltage divider (see Figure 6).

OVDD

PMOS (Rpu)
Ztl , L = 20 inches
ipp_do pad
predriver
Cload = 1p

NMOS (Rpd)

OVSS
U,(V)
Vin (do)
VDD

t,(ns)
0

U,(V)
Vout (pad)
OVDD

Vref1 Vref2
Vref

t,(ns)
0
Vovdd - Vref1
Rpu =  Ztl
Vref1

Vref2
Rpd =  Ztl
Vovdd - Vref2

Figure 6. Impedance Matching Load for Measurement

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4.8.1 Single Voltage GPIO Output Buffer Impedance


Table 33 shows the GPIO output buffer impedance (OVDD 1.8 V).
Table 33. GPIO Output Buffer Average Impedance (OVDD 1.8 V)

Parameter Symbol Drive Strength (DSE) Typ Value Unit

001 260
010 130
Output Driver Rdrv 011 88
Impedance 100 65 
101 52
110 43
111 37

Table 34 shows the GPIO output buffer impedance (OVDD 3.3 V).
Table 34. GPIO Output Buffer Average Impedance (OVDD 3.3 V)

Parameter Symbol Drive Strength (DSE) Typ Value Unit

001 157
010 78
Output Driver Rdrv 011 53
Impedance 100 39 
101 32
110 26
111 23

4.8.2 DDR I/O Output Buffer Impedance


Table 35 shows DDR I/O output buffer impedance of i.MX 6ULL processors.
Table 35. DDR I/O Output Buffer Impedance

Typical
Test Conditions DSE
Parameter Symbol NVCC_DRAM=1.5 V NVCC_DRAM=1.2 V Unit
(Drive Strength)
(DDR3) (LPDDR2)
DDR_SEL=11 DDR_SEL=10

000 Hi-Z Hi-Z


001 240 240
010 120 120
Output Driver 011 80 80

Impedance Rdrv 100 60 60
101 48 48
110 40 40
111 34 34

Note:
1. Output driver impedance is controlled across PVTs using ZQ calibration procedure.
2. Calibration is done against 240  external reference resistor.
3. Output driver impedance deviation (calibration accuracy) is ±5% (max/min impedance) across PVTs.

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4.9 System Modules Timing


This section contains the timing and electrical parameters for the modules in each i.MX 6ULL processor.

4.9.1 Reset Timings Parameters


Figure 7 shows the reset timing and Table 36 lists the timing parameters.

POR_B
(Input)

CC1

Figure 7. Reset Timing Diagram

Table 36. Reset Timing Parameters

ID Parameter Min Max Unit

CC1 Duration of POR_B to be qualified as valid. 1 — RTC_XTALI cycle

4.9.2 WDOG Reset Timing Parameters


Figure 8 shows the WDOG reset timing and Table 37 lists the timing parameters.

WDOGn_B
(Output)

CC3

Figure 8. WDOGn_B Timing Diagram

Table 37. WDOGn_B Timing Parameters

ID Parameter Min Max Unit

CC3 Duration of WDOGn_B Assertion 1 — RTC_XTALI cycle

NOTE
RTC_XTALI is approximately 32 kHz. RTC_XTALI cycle is one period or
approximately 30 s.
NOTE
WDOG1_B output signals (for each one of the Watchdog modules) do not
have dedicated pins, but are muxed out through the IOMUX. See the IOMUX
manual for detailed information.

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4.9.3 External Interface Module (EIM)


The following subsections provide information on the EIM.

4.9.3.1 EIM Interface Pads Allocation


EIM supports 32-bit, 16-bit and 8-bit devices operating in address/data separate or multiplexed modes.
Table 38 provides EIM interface pads allocation in different modes.
Table 38. EIM Multiplexing1
Non Multiplexed Address/Data Mode Multiplexed Address/Data mode
8 Bit 16 Bit 16 Bit 32 Bit
Setup
MUM = 0, MUM = 0, MUM = 0, MUM = 1, MUM = 1,
DSZ = 100 DSZ = 101 DSZ = 001 DSZ = 001 DSZ = 011
A[15:0] EIM_DA[15:0] EIM_DA[15:0] EIM_DA[15:0] EIM_DA[15:0] EIM_DA[15:0]
A[25:16] EIM_A[25:16] EIM_A[25:16] EIM_A[25:16] EIM_A[25:16] EIM_D[9:0]
D[7:0], EIM_D[7:0] — EIM_D[7:0] EIM_DA[7:0] EIM_DA[7:0]
EIM_EB0
D[15:8], — EIM_D[15:8] EIM_D[15:8] EIM_DA[15:8] EIM_DA[15:8]
EIM_EB1
D[23:16], — — — — EIM_D[7:0]
EIM_EB2
D[31:24], — — — — EIM_D[15:8]
EIM_EB3
1 For more information on configuration ports mentioned in this table, see the i.MX 6ULL reference manual.

4.9.3.2 General EIM Timing-Synchronous Mode


Figure 9, Figure 10, and Table 39 specify the timings related to the EIM module. All EIM output control
signals may be asserted and deasserted by an internal clock synchronized to the EIM_BCLK rising edge
according to corresponding assertion/negation control fields.

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WE2

EIM_BCLK
... WE3

WE4 WE1 WE5


EIM_ADDRxx
WE6 WE7
EIM_CSx_B

WE8 WE9
EIM_WE_B

WE10 WE11
EIM_OE_B

WE12 WE13
EIM_EBx_B

WE14 WE15
EIM_LBA_B

WE16 WE17
Output Data

Figure 9. EIM Outputs Timing Diagram

EIM_BCLK

WE18
Input Data
WE19
WE20
EIM_WAIT_B
WE21

Figure 10. EIM Inputs Timing Diagram

4.9.3.3 Examples of EIM Synchronous Accesses


Table 39. EIM Bus Timing Parameters 1

BCD = 0 BCD = 1 BCD = 2 BCD = 3


ID Parameter
Min Max Min Max Min Max Min Max

WE1 EIM_BCLK Cycle t — 2xt — 3xt — 4xt —


time2
WE2 EIM_BCLK Low 0.4 x t — 0.8 x t — 1.2 x t — 1.6 x t —
Level Width

WE3 EIM_BCLK High 0.4 x t — 0.8 x t — 1.2 x t — 1.6 x t —


Level Width

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Table 39. EIM Bus Timing Parameters (continued)1

BCD = 0 BCD = 1 BCD = 2 BCD = 3


ID Parameter
Min Max Min Max Min Max Min Max

WE4 Clock rise to -0.5 x t - -0.5 x t + 1.75 -t - 1.25 -t + 1.75 -1.5 x t - -1.5 x t -2 x t - -2 x t + 1.75
address valid3 1.25 1.25 +1.75 1.25

WE5 Clock rise to 0.5 x t - 0.5 x t + 1.75 t - 1.25 t + 1.75 1.5 x t - 1.5 x t 2xt- 2 x t + 1.75
address invalid 1.25 1.25 +1.75 1.25

WE6 Clock rise to -0.5 x t - -0.5 x t + 1.75 -t - 1.25 - t + 1.75 -1.5 x t - -1.5 x t -2 x t - -2 x t + 1.75
EIM_CSx_B valid 1.25 1.25 +1.75 1.25

WE7 Clock rise to 0.5 x t - 0.5 x t + 1.75 t - 1.25 t + 1.75 1.5 x t - 1.5 x t 2xt- 2 x t + 1.75
EIM_CSx_B invalid 1.25 1.25 +1.75 1.25

WE8 Clock rise to -0.5 x t - -0.5 x t + 1.75 -t - 1.25 - t + 1.75 -1.5 x t - -1.5 x t -2 x t - -2 x t + 1.75
EIM_WE_B Valid 1.25 1.25 +1.75 1.25

WE9 Clock rise to 0.5 x t - 0.5 x t + 1.75 t - 1.25 t + 1.75 1.5 x t - 1.5 x t 2xt- 2 x t + 1.75
EIM_WE_B Invalid 1.25 1.25 +1.75 1.25

WE10 Clock rise to -0.5 x t - -0.5 x t + 1.75 -t - 1.25 - t + 1.75 -1.5 x t - -1.5 x t -2 x t - -2 x t + 1.75
EIM_OE_B Valid 1.25 1.25 +1.75 1.25

WE11 Clock rise to 0.5 x t - 0.5 x t + 1.75 t - 1.25 t + 1.75 1.5 x t - 1.5 x t 2xt- 2 x t + 1.75
EIM_OE_B Invalid 1.25 1.25 +1.75 1.25

WE12 Clock rise to -0.5 x t - -0.5 x t + 1.75 -t - 1.25 - t + 1.75 -1.5 x t - -1.5 x t -2 x t - -2 x t + 1.75
EIM_EBx_B Valid 1.25 1.25 +1.75 1.25
WE13 Clock rise to 0.5 x t - 0.5 x t + 1.75 t - 1.25 t + 1.75 1.5 x t - 1.5 x t 2xt- 2 x t + 1.75
EIM_EBx_B Invalid 1.25 1.25 +1.75 1.25

WE14 Clock rise to -0.5 x t - -0.5 x t + 1.75 -t - 1.25 - t + 1.75 -1.5 x t - -1.5 x t -2 x t - -2 x t + 1.75
EIM_LBA_B Valid 1.25 1.25 +1.75 1.25

WE15 Clock rise to 0.5 x t - 0.5 x t + 1.75 t - 1.25 t + 1.75 1.5 x t - 1.5 x t 2xt- 2 x t + 1.75
EIM_LBA_B Invalid 1.25 1.25 +1.75 1.25

WE16 Clock rise to -0.5 x t - -0.5 x t + 1.75 -t - 1.25 - t + 1.75 -1.5 x t - -1.5 x t -2 x t - -2 x t + 1.75
Output Data Valid 1.25 1.25 +1.75 1.25
WE17 Clock rise to 0.5 x t - 0.5 x t + 1.75 t - 1.25 t + 1.75 1.5 x t - 1.5 x t 2xt- 2 x t + 1.75
Output Data Invalid 1.25 1.25 +1.75 1.25

WE18 Input Data setup 2 — 4 — — — — —


time to Clock rise

WE19 Input Data hold 2 — 2 — — — — —


time from Clock
rise

WE20 EIM_WAIT_B 2 — 4 — — — — —
setup time to Clock
rise

WE21 EIM_WAIT_B hold 2 — 2 — — — — —


time from Clock
rise

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1
t is the maximum EIM logic (axi_clk) cycle time. The maximum allowed axi_clk frequency depends on the fixed/non-fixed
latency configuration, whereas the maximum allowed EIM_BCLK frequency is:
—Fixed latency for both read and write is 132 MHz.
—Variable latency for read only is 132 MHz.
—Variable latency for write only is 52 MHz.
In variable latency configuration for write, if BCD = 0 & WBCDD = 1 or BCD = 1, axi_clk must be 104 MHz. Write BCD = 1 and
104 MHz axi_clk, will result in an EIM_BCLK of 52 MHz. When the clock branch to EIM is decreased to 104 MHz, other buses
are impacted which are clocked from this source. See the CCM chapter of the i.MX 6ULL Reference Manual (IMX6ULLRM) for
a detailed clock tree description.
2
EIM_BCLK parameters are being measured from the 50% point, that is, high is defined as 50% of signal value and low is
defined as 50% as signal value.
3
For signal measurements, “High” is defined as 80% of signal value and “Low” is defined as 20% of signal value.

Figure 11 to Figure 14 provide few examples of basic EIM accesses to external memory devices with the
timing parameters mentioned previously for specific control parameters settings.

EIM_BCLK WE4 WE5


EIM_ADDRxx Last Valid Address Address v1
WE6 WE7
EIM_CSx_B

EIM_WE_B
WE14
EIM_LBA_B WE15
WE10 WE11
EIM_OE_B
WE12 WE13
EIM_EBx_B
WE18
EIM_DATAxx D(v1)
WE19

Figure 11. Synchronous Memory Read Access, WSC=1

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EIM_BCLK
WE4 WE5
EIM_ADDRxx Last Valid Address Address V1
WE6 WE7
EIM_CSx_B
WE8 WE9
EIM_WE_B
WE14
EIM_LBA_B
WE15

EIM_OE_B
WE13
WE12
EIM_EBx_B
WE16 WE17
EIM_DATAxx D(V1)

Figure 12. Synchronous Memory, Write Access, WSC=1, WBEA=0 and WADVN=0

EIM_BCLK
WE5 WE16 WE17
EIM_ADDRxx/ WE4
EIM_ADxx Last Valid Address Address V1 Write Data
WE6 WE7
EIM_CSx_B
WE8 WE9
EIM_WE_B
WE14 WE15

EIM_LBA_B

EIM_OE_B
WE10 WE11
EIM_EBx_B

Figure 13. Muxed Address/Data (A/D) Mode, Synchronous Write Access, WSC=6, ADVA=0, ADVN=1, and
ADH=1

NOTE
In 32-bit muxed address/data (A/D) mode the 16 MSBs are driven on the
data bus.

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EIM_BCLK
WE4 WE5 WE19
EIM_ADDRxx/ Last Valid Address Address V1 Data
EIM_ADxx WE6 WE18

EIM_CSx_B
WE7

EIM_WE_B
WE14 WE15

EIM_LBA_B WE10
WE11
EIM_OE_B
WE12 WE13
EIM_EBx_B
Figure 14. 16-Bit Muxed A/D Mode, Synchronous Read Access, WSC=7, RADVN=1, ADH=1, OEA=0

4.9.3.4 General EIM Timing-Asynchronous Mode


Figure 15 through Figure 19, and Table 40 help to determine timing parameters relative to the chip select
(CS) state for asynchronous and DTACK EIM accesses with corresponding EIM bit fields and the timing
parameters mentioned above.
Asynchronous read & write access length in cycles may vary from what is shown in Figure 15 through
Figure 18 as RWSC, OEN and CSN is configured differently. See the i.MX 6ULL Reference Manual
(IMX6ULLRM) for the EIM programming model.

start of end of
access access

INT_CLK
EIM_CSx_B MAXCSO

EIM_ADDRxx/ WE31 WE32


EIM_ADxx Last Valid Address Address V1 Next Address

EIM_WE_B
WE39 WE40
EIM_LBA_B
WE35 WE36
EIM_OE_B
WE37 WE38
EIM_EBx_B
WE44
EIM_DATAxx[7:0] MAXCO
D(V1)
WE43 MAXDI

Figure 15. Asynchronous Memory Read Access (RWSC = 5)

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start of end of
access access

INT_CLK
MAXCSO
EIM_CSx_B
EIM_ADDRxx/ WE31 MAXDI
EIM_ADxx Addr. V1 D(V1)
WE32A
WE44
EIM_WE_B
WE40A
WE39
EIM_LBA_B
WE35A WE36
EIM_OE_B
WE37 WE38
EIM_EBx_B
MAXCO
Figure 16. Asynchronous A/D Muxed Read Access (RWSC = 5)

EIM_CSx_B
WE41
EIM_ADDRxx/ WE31
Addr. V1 D(V1)
EIM_DATAxx WE32A WE42
WE33 WE34
EIM_WE_B
WE40A
WE39
EIM_LBA_B

EIM_OE_B
WE45 WE46
EIM_EBx_B

Figure 17. Asynchronous Memory Write Access

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EIM_CSx_B
WE41
EIM_ADDRxx/ WE31
Addr. V1 D(V1)
EIM_DATAxx WE32A WE42
WE33 WE34
EIM_WE_B
WE40A
WE39
EIM_LBA_B

EIM_OE_B
WE45 WE46
EIM_EBx_B

Figure 18. Asynchronous A/D Muxed Write Access

EIM_CSx_B
EIM_ADDRxx WE31 WE32
Last Valid Address Address V1 Next Address

EIM_WE_B
WE39 WE40
EIM_LBA_B
WE35 WE36
EIM_OE_B
WE37 WE38
EIM_EBx_B WE44

D(V1)
EIM_DATAxx[7:0] WE43
WE48
EIM_DTACK_B
WE47

Figure 19. DTACK Mode Read Access (DAP=0)

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EIM_CSx_B
WE31 WE32
EIM_ADDRxx Last Valid Address Address V1 Next Address
WE33 WE34
EIM_WE_B
WE39 WE40
EIM_LBA_B

EIM_OE_B
WE45 WE46
EIM_EBx_B
WE42
EIM_DATAxx D(V1)
WE41 WE48
EIM_DTACK_B
WE47
Figure 20. DTACK Mode Write Access (DAP=0)

Table 40. EIM Asynchronous Timing Parameters Table Relative Chip to Select

Determination by Max
Ref No. Parameter Synchronous measured Min (If 132 MHz is Unit
parameters1 supported by SoC)

WE31 EIM_CSx_B valid to Address WE4 - WE6 - CSA2 — 3 - CSA ns


Valid
WE32 Address Invalid to EIM_CSx_B WE7 - WE5 - CSN3 — 3 - CSN ns
invalid

WE32A(m EIM_CSx_B valid to Address t4 + WE4 - WE7 + (ADVN5 + -3 + (ADVN + — ns


uxed A/D Invalid ADVA6 + 1 - CSA) ADVA + 1 - CSA)

WE33 EIM_CSx_B Valid to WE8 - WE6 + (WEA - WCSA) — 3 + (WEA - WCSA) ns


EIM_WE_B Valid

WE34 EIM_WE_B Invalid to WE7 - WE9 + (WEN - WCSN) — 3 - (WEN_WCSN) ns


EIM_CSx_B Invalid

WE35 EIM_CSx_B Valid to WE10 - WE6 + (OEA - RCSA) — 3 + (OEA - RCSA) ns


EIM_OE_B Valid

WE35A EIM_CSx_B Valid to WE10 - WE6 + (OEA + RADVN -3 + (OEA + 3 + (OEA + ns


(muxed EIM_OE_B Valid + RADVA + ADH + 1 - RCSA) RADVN+RADVA+ RADVN+RADVA+AD
A/D) ADH+1-RCSA) H+1-RCSA)

WE36 EIM_OE_B Invalid to WE7 - WE11 + (OEN - RCSN) — 3 - (OEN - RCSN) ns


EIM_CSx_B Invalid

WE37 EIM_CSx_B Valid to WE12 - WE6 + (RBEA - RCSA) — 3 + (RBEA - RCSA) ns


EIM_EBx_B Valid (Read
access)

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Table 40. EIM Asynchronous Timing Parameters Table Relative Chip to Select (continued)

Determination by Max
Ref No. Parameter Synchronous measured Min (If 132 MHz is Unit
parameters1 supported by SoC)

WE38 EIM_EBx_B Invalid to WE7 - WE13 + (RBEN - RCSN) — 3 - (RBEN- RCSN) ns


EIM_CSx_B Invalid (Read
access)

WE39 EIM_CSx_B Valid to WE14 - WE6 + (ADVA - CSA) — 3 + (ADVA - CSA) ns


EIM_LBA_B Valid

WE40 EIM_LBA_B Invalid to WE7 - WE15 - CSN — 3 - CSN ns


EIM_CSx_B Invalid (ADVL is
asserted)

WE40A EIM_CSx_B Valid to WE14 - WE6 + (ADVN + ADVA -3 + (ADVN + 3 + (ADVN + ADVA + ns
(muxed EIM_LBA_B Invalid + 1 - CSA) ADVA + 1 - CSA) 1 - CSA)
A/D)
WE41 EIM_CSx_B Valid to Output WE16 - WE6 - WCSA — 3 - WCSA ns
Data Valid

WE41A EIM_CSx_B Valid to Output WE16 - WE6 + (WADVN + — 3 + (WADVN + ns


(muxed Data Valid WADVA + ADH + 1 - WCSA) WADVA + ADH + 1 -
A/D) WCSA)

WE42 Output Data Invalid to WE17 - WE7 - CSN — 3 - CSN ns


EIM_CSx_B Invalid

MAXCO Output maximum delay from 10 — — ns


internal driving
EIM_ADDRxx/control FFs to
chip outputs

MAXCSO Output maximum delay from 10 — — ns


CSx internal driving FFs to CSx
out

MAXDI EIM_DATAxx maximum delay 5 — — ns


from chip input data to its
internal FF

WE43 Input Data Valid to EIM_CSx_B MAXCO - MAXCSO + MAXDI MAXCO - — ns


Invalid MAXCSO +
MAXDI

WE44 EIM_CSx_B Invalid to Input 0 0 — ns


Data invalid

WE45 EIM_CSx_B Valid to WE12 - WE6 + (WBEA - — 3 + (WBEA - WCSA) ns


EIM_EBx_B Valid (Write WCSA)
access)

WE46 EIM_EBx_B Invalid to WE7 - WE13 + (WBEN - — -3 + (WBEN - WCSN) ns


EIM_CSx_B Invalid (Write WCSN)
access)

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Table 40. EIM Asynchronous Timing Parameters Table Relative Chip to Select (continued)

Determination by Max
Ref No. Parameter Synchronous measured Min (If 132 MHz is Unit
parameters1 supported by SoC)

MAXDTI MAXIMUM delay from 10 — — —


EIM_DTACK_B to its internal
FF + 2 cycles for
synchronization

WE47 EIM_DTACK_B Active to MAXCO - MAXCSO + MAXDTI MAXCO - — ns


EIM_CSx_B Invalid MAXCSO +
MAXDTI

WE48 EIM_CSx_B Invalid to 0 0 — ns


EIM_DTACK_B Invalid
1
For more information on configuration parameters mentioned in this table, see the i.MX 6ULL Reference Manual (IMX6ULLRM).
2
In this table, CSA means WCSA when write operation or RCSA when read operation.
3
In this table, CSN means WCSN when write operation or RCSN when read operation.
4
t is axi_clk cycle time.
5 In this table, ADVN means WADVN when write operation or RADVN when read operation.
6
In this table, ADVA means WADVA when write operation or RADVA when read operation.

4.10 Multi-Mode DDR Controller (MMDC)


The Multi-Mode DDR Controller is a dedicated interface to DDR3/DDR3L/LPDDR2 SDRAM.

4.10.1 MMDC compatibility with JEDEC-compliant SDRAMs


The i.MX 6ULL MMDC supports the following memory types:
• LPDDR2 SDRAM compliant with JESD209-2B LPDDR2 JEDEC standard release June, 2009
• DDR3/DDR3L SDRAM compliant with JESD79-3D DDR3 JEDEC standard release April, 2008
MMDC operation with the standards stated above is contingent upon the board DDR design adherence to
the DDR design and layout requirements stated in the Hardware Development Guide for the i.MX 6ULL
Applications Processor (IMX6ULLHDG).

4.10.2 MMDC supported DDR3/DDR3L/LPDDR2 configurations


Table 41 shows the supported DDR3/DDR3L/LPDDR2 configurations:
Table 41. i.MX 6ULL Supported DDR3/DDR3L/LPDDR2 Configurations

Parameter DDR3 DDR3L LDDDR2

Clock frequency 400 MHz 400 MHz 400 MHz

Bus width 16-bit 16-bit 16-bit

Channel Single Single Single

Chip selects 2 2 2

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4.11 General-Purpose Media Interface (GPMI) Timing


The i.MX 6ULL GPMI controller is a flexible interface NAND Flash controller with 8-bit data width, up
to 200 MB/s I/O speed and individual chip select.
It supports Asynchronous timing mode, Source Synchronous timing mode and Samsung Toggle timing
mode separately described in the following subsections.

4.11.1 Asynchronous Mode AC Timing (ONFI 1.0 Compatible)


Asynchronous mode AC timings are provided as multiplications of the clock cycle and fixed delay. The
maximum I/O speed of GPMI in asynchronous mode is about 50 MB/s. Figure 21 through Figure 24
depicts the relative timing between GPMI signals at the module level for different operations under
asynchronous mode. Table 42 describes the timing parameters (NF1–NF17) that are shown in the figures.

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58 NXP Semiconductors
Electrical Characteristics


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Figure 24. Read Data Latch Cycle Timing Diagram (Non-EDO Mode)

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Figure 25. Read Data Latch Cycle Timing Diagram (EDO Mode)

Table 42. Asynchronous Mode Timing Parameters1

Timing
T = GPMI Clock Cycle
ID Parameter Symbol Unit
Min. Max.

NF1 NAND_CLE setup time tCLS (AS + DS)  T - 0.12 [see 2,3] ns

NF2 NAND_CLE hold time tCLH DH  T - 0.72 [see 2] ns

NF3 NAND_CE0_B setup time tCS (AS + DS + 1)  T [see 3,2] ns

NF4 NAND_CE0_B hold time tCH (DH+1)  T - 1 [see 2] ns

NF5 NAND_WE_B pulse width tWP DS  T [see 2] ns

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Electrical Characteristics

Table 42. Asynchronous Mode Timing Parameters1 (continued)

Timing
T = GPMI Clock Cycle
ID Parameter Symbol Unit
Min. Max.

NF6 NAND_ALE setup time tALS (AS + DS)  T - 0.49 [see 3,2] ns

NF7 NAND_ALE hold time tALH (DH  T - 0.42 [see ] 2


ns

NF8 Data setup time tDS DS  T - 0.26 [see 2] ns

NF9 Data hold time tDH DH  T - 1.37 [see ] 2


ns

NF10 Write cycle time tWC (DS + DH)  T [see 2] ns

NF11 NAND_WE_B hold time tWH DH  T [see ] 2


ns

NF12 Ready to NAND_RE_B low tRR4 (AS + 2)  T [see 3,2] — ns

NF13 NAND_RE_B pulse width tRP DS  T [see 2]


ns

NF14 READ cycle time tRC (DS + DH)  T [see 2] ns

NF15 NAND_RE_B high hold time tREH DH  T [see 2] ns

NF16 Data setup on read tDSR — (DS  T -0.67)/18.38 [see 5,6] ns

NF17 Data hold on read tDHR 0.82/11.83 [see 5,6] — ns


1
GPMI’s Async Mode output timing can be controlled by the module’s internal registers
HW_GPMI_TIMING0_ADDRESS_SETUP, HW_GPMI_TIMING0_DATA_SETUP, and HW_GPMI_TIMING0_DATA_HOLD.
This AC timing depends on these registers settings. In the table, AS/DS/DH represents each of these settings.
2 AS minimum value can be 0, while DS/DH minimum value is 1.
3
T = GPMI clock period -0.075ns (half of maximum p-p jitter).
4
NF12 is guaranteed by the design.
5 Non-EDO mode.
6
EDO mode, GPMI clock  100 MHz
(AS=DS=DH=1, GPMI_CTL1 [RDN_DELAY] = 8, GPMI_CTL1 [HALF_PERIOD] = 0).

In EDO mode (Figure 24), NF16/NF17 is different from the definition in non-EDO mode (Figure 23).
They are called tREA/tRHOH (RE# access time/RE# HIGH to output hold). The typical values for them
are 16 ns (max for tREA)/15 ns (min for tRHOH) at 50 MB/s EDO mode. In EDO mode, GPMI will
sample NAND_DATAxx at rising edge of delayed NAND_RE_B provided by an internal DPLL. The
delay value can be controlled by GPMI_CTRL1.RDN_DELAY (see the GPMI chapter of the i.MX 6ULL
Reference Manual). The typical value of this control register is 0x8 at 50 MT/s EDO mode. But if the board
delay is big enough and cannot be ignored, the delay value should be made larger to compensate the board
delay.

4.11.2 Source Synchronous Mode AC Timing (ONFI 2.x Compatible)


Figure 26 to Figure 28 show the write and read timing of Source Synchronous Mode.

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Electrical Characteristics

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Figure 29. NAND_DQS/NAND_DQ Read Valid Window

Table 43. Source Synchronous Mode Timing Parameters1

Timing
T = GPMI Clock Cycle
ID Parameter Symbol Unit
Min. Max.

NF18 NAND_CE0_B access time tCE CE_DELAY  T - 0.79 [see 2] ns

NF19 NAND_CE0_B hold time tCH 0.5  tCK - 0.63 [see 2] ns

NF20 Command/address NAND_DATAxx setup time tCAS 0.5  tCK - 0.05 ns

NF21 Command/address NAND_DATAxx hold time tCAH 0.5  tCK - 1.23 ns

NF22 Clock period tCK — ns

NF23 Preamble delay tPRE PRE_DELAY  T - 0.29 [see 2] ns

NF24 Postamble delay tPOST POST_DELAY  T - 0.78 [see 2] ns

NF25 NAND_CLE and NAND_ALE setup time tCALS 0.5  tCK - 0.86 ns

NF26 NAND_CLE and NAND_ALE hold time tCALH 0.5  tCK - 0.37 ns

NF27 NAND_CLK to first NAND_DQS latching transition tDQSS T - 0.41 [see 2] ns

NF28 Data write setup — 0.25  tCK - 0.35 —

NF29 Data write hold — 0.25  tCK - 0.85 —


NF30 NAND_DQS/NAND_DQ read setup skew — — 2.06 —

NF31 NAND_DQS/NAND_DQ read hold skew — — 1.95 —


1 GPMI’s source synchronous mode output timing can be controlled by the module’s internal registers
GPMI_TIMING2_CE_DELAY, GPMI_TIMING_PREAMBLE_DELAY, GPMI_TIMING2_POST_DELAY. This AC timing depends
on these registers settings. In the table, CE_DELAY/PRE_DELAY/POST_DELAY represents each of these settings.
2
T = tCK(GPMI clock period) -0.075ns (half of maximum p-p jitter).

For DDR Source sync mode, Figure 29 shows the timing diagram of NAND_DQS/NAND_DATAxx read
valid window. The typical value of tDQSQ is 0.85ns (max) and 1ns (max) for tQHS at 200MB/s. GPMI
will sample NAND_DATA[7:0] at both rising and falling edge of a delayed NAND_DQS signal, which
can be provided by an internal DPLL. The delay value can be controlled by GPMI register
GPMI_READ_DDR_DLL_CTRL.SLV_DLY_TARGET (see the GPMI chapter of the i.MX 6ULL
Reference Manual). Generally, the typical delay value of this register is equal to 0x7 which means 1/4

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Electrical Characteristics

clock cycle delay expected. But if the board delay is big enough and cannot be ignored, the delay value
should be made larger to compensate the board delay.

4.11.3 Samsung Toggle Mode AC Timing

4.11.3.1 Command and Address Timing


NOTE
Samsung Toggle Mode command and address timing is the same as ONFI
1.0 compatible Async mode AC timing. See Section 4.11.1, “Asynchronous
Mode AC Timing (ONFI 1.0 Compatible)",” for details.

4.11.3.2 Read and Write Timing

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Table 44. Samsung Toggle Mode Timing Parameters1

Timing
Symbo T = GPMI Clock Cycle Uni
ID Parameter
l t
Min. Max.

NF1 NAND_CLE setup time tCLS (AS + DS)  T - 0.12 [see 2,3] —
NF2 NAND_CLE hold time tCLH DH  T - 0.72 [see 2] —

NF3 NAND_CE0_B setup time tCS (AS + DS)  T - 0.58 [see 3,2] —

NF4 NAND_CE0_B hold time tCH DH  T - 1 [see 2] —

NF5 NAND_WE_B pulse width tWP DS  T [see 2] —

NF6 NAND_ALE setup time tALS (AS + DS)  T - 0.49 [see 3,2] —

NF7 NAND_ALE hold time tALH DH  T - 0.42 [see 2] —

NF8 Command/address NAND_DATAxx setup time tCAS DS  T - 0.26 [see 2] —

NF9 Command/address NAND_DATAxx hold time tCAH DH  T - 1.37 [see 2] —

NF18 NAND_CEx_B access time tCE CE_DELAY  T [see 4,2] — ns

NF22 clock period tCK — — ns

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Table 44. Samsung Toggle Mode Timing Parameters1 (continued)

Timing
Symbo T = GPMI Clock Cycle Uni
ID Parameter
l t
Min. Max.

NF23 preamble delay tPRE PRE_DELAY  T [see 5,2] — ns

NF24 postamble delay tPOST POST_DELAY  T +0.43 [see ] 2


— ns

NF28 Data write setup tDS6 0.25  tCK - 0.32 — ns

NF29 Data write hold tDH 6


0.25  tCK - 0.79 — ns

NF30 NAND_DQS/NAND_DQ read setup skew tDQSQ — 3.18 —


7

NF31 NAND_DQS/NAND_DQ read hold skew tQHS7 — 3.27 —


1
The GPMI toggle mode output timing can be controlled by the module’s internal registers
HW_GPMI_TIMING0_ADDRESS_SETUP, HW_GPMI_TIMING0_DATA_SETUP, and HW_GPMI_TIMING0_DATA_HOLD.
This AC timing depends on these registers settings. In the table, AS/DS/DH represents each of these settings.
2
AS minimum value can be 0, while DS/DH minimum value is 1.
3 T = tCK (GPMI clock period) -0.075ns (half of maximum p-p jitter).
4
CE_DELAY represents HW_GPMI_TIMING2[CE_DELAY]. NF18 is guaranteed by the design. Read/Write operation is started
with enough time of ALE/CLE assertion to low level.
5
PRE_DELAY+1)  (AS+DS)
6
Shown in Figure 30.
7 Shown in Figure 31.

For DDR Toggle mode, Figure 29 shows the timing diagram of NAND_DQS/NAND_DATAxx read valid
window. The typical value of tDQSQ is 1.4 ns (max) and 1.4 ns (max) for tQHS at 133 MB/s. GPMI will
sample NAND_DATA[7:0] at both rising and falling edge of an delayed NAND_DQS signal, which is
provided by an internal DPLL. The delay value of this register can be controlled by GPMI register
GPMI_READ_DDR_DLL_CTRL.SLV_DLY_TARGET (see the GPMI chapter of the i.MX 6ULL
Reference Manual). Generally, the typical delay value is equal to 0x7 which means 1/4 clock cycle delay
expected. But if the board delay is big enough and cannot be ignored, the delay value should be made larger
to compensate the board delay.

4.12 External Peripheral Interface Parameters


The following subsections provide information on external peripheral interfaces.

4.12.1 CMOS Sensor Interface (CSI) Timing Parameters

4.12.1.0.1 Gated Clock Mode Timing


Figure 32 and Figure 33 shows the gated clock mode timings for CSI, and Table 45 describes the timing
parameters (P1–P7) shown in the figures. A frame starts with a rising/falling edge on CSI_VSYNC

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(VSYNC), then CSI_HSYNC (HSYNC) is asserted and holds for the entire line. The pixel clock,
CSI_PIXCLK (PIXCLK), is valid as long as HSYNC is asserted.

CSI_VSYNC

P1

CSI_HSYNC
P7
P2 P5 P6

CSI_PIXCLK

P3 P4

CSI_DATA[15:00]

Figure 32. CSI Gated Clock Mode—Sensor Data at Falling Edge, Latch Data at Rising Edge

CSI_VSYNC

P1

CSI_HSYNC

P7
P2 P6 P5

CSI_PIXCLK

P3 P4

CSI_DATA[15:00]

Figure 33. CSI Gated Clock Mode—Sensor Data at Rising Edge, Latch Data at Falling Edge

Table 45. CSI Gated Clock Mode Timing Parameters

ID Parameter Symbol Min. Max. Units

P1 CSI_VSYNC to CSI_HSYNC time tV2H 33.5 — ns

P2 CSI_HSYNC setup time tHsu 1 — ns

P3 CSI DATA setup time tDsu 1 — ns

P4 CSI DATA hold time tDh 1 — ns

P5 CSI pixel clock high time tCLKh 3.75 — ns

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Table 45. CSI Gated Clock Mode Timing Parameters (continued)

ID Parameter Symbol Min. Max. Units

P6 CSI pixel clock low time tCLKl 3.75 — ns

P7 CSI pixel clock frequency fCLK — 133.3 MHz

4.12.1.0.2 Ungated Clock Mode Timing


Figure 34 shows the ungated clock mode timings of CSI, and Table 46 describes the timing parameters
(P1–P6) that are shown in the figure. In ungated mode the CSI_VSYNC and CSI_PIXCLK signals are
used, and the CSI_HSYNC signal is ignored.

CSI_VSYNC
P1
P6
P4 P5

CSI_PIXCLK

P2 P3

CSI_DATA[15:00]

Figure 34. CSI Ungated Clock Mode—Sensor Data at Falling Edge, Latch Data at Rising Edge

Table 46. CSI Ungated Clock Mode Timing Parameters

ID Parameter Symbol Min. Max. Units

P1 CSI_VSYNC to pixel clock time tVSYNC 33.5 — ns

P2 CSI DATA setup time tDsu 1 — ns

P3 CSI DATA hold time tDh 1 — ns

P4 CSI pixel clock high time tCLKh 3.75 — ns

P5 CSI pixel clock low time tCLKl 3.75 — ns

P6 CSI pixel clock frequency fCLK — 133.3 MHz

The CSI enables the chip to connect directly to external CMOS image sensors, which are classified as
dumb or smart as follows:
• Dumb sensors only support traditional sensor timing (vertical sync (VSYNC) and horizontal sync
(HSYNC)) and output-only Bayer and statistics data.
• Smart sensors support CCIR656 video decoder formats and perform additional processing of the
image (for example, image compression, image pre-filtering, and various data output formats).

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4.12.2 ECSPI Timing Parameters


This section describes the timing parameters of the ECSPI blocks. The ECSPI have separate timing
parameters for master and slave modes.

4.12.2.1 ECSPI Master Mode Timing


Figure 35 depicts the timing of ECSPI in master mode. Table 47 lists the ECSPI master mode timing
characteristics.

ECSPIx_RDY_B

ECSPIx_SS_B CS10 CS5


CS3 CS2 CS6
CS1
CS4
ECSPIx_SCLK
CS2
CS7 CS3

ECSPIx_MOSI

CS9
CS8
ECSPIx_MISO

Figure 35. ECSPI Master Mode Timing Diagram

Table 47. ECSPI Master Mode Timing Parameters

ID Parameter Symbol Min Max Unit

CS1 ECSPIx_SCLK Cycle Time–Read tclk 43 — ns


ECSPIx_SCLK Cycle Time–Write 15

CS2 ECSPIx_SCLK High or Low Time–Read tSW 21.5 — ns


ECSPIx_SCLK High or Low Time–Write 7
CS3 ECSPIx_SCLK Rise or Fall1 tRISE/FALL — — ns

CS4 ECSPIx_SS_B pulse width tCSLH Half ECSPIx_SCLK period — ns

CS5 ECSPIx_SS_B Lead Time (CS setup time) tSCS Half ECSPIx_SCLK period - 4 — ns

CS6 ECSPIx_SS_B Lag Time (CS hold time) tHCS Half ECSPIx_SCLK period - 2 — ns

CS7 ECSPIx_MOSI Propagation Delay (CLOAD = 20 pF) tPDmosi -1 1 ns

CS8 ECSPIx_MISO Setup Time tSmiso 14 — ns

CS9 ECSPIx_MISO Hold Time tHmiso 0 — ns


2
CS10 RDY to ECSPIx_SS_B Time tSDRY 5 — ns
1 See specific I/O AC parameters Section 4.7, “I/O AC Parameters".”
2
SPI_RDY is sampled internally by ipg_clk and is asynchronous to all other CSPI signals.

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4.12.2.2 ECSPI Slave Mode Timing


Figure 36 depicts the timing of ECSPI in slave mode. Table 48 lists the ECSPI slave mode timing
characteristics.

ECSPIx_SS_B
CS1 CS2 CS6 CS5
CS4
ECSPIx_SCLK
CS2
CS9
ECSPIx_MISO

CS7 CS8
ECSPIx_MOSI

Figure 36. ECSPI Slave Mode Timing Diagram

Table 48. ECSPI Slave Mode Timing Parameters

ID Parameter Symbol Min Max Unit

CS1 ECSPIx_SCLK Cycle Time–Read tclk 15 — ns


ECSPI_SCLK Cycle Time–Write 43

CS2 ECSPIx_SCLK High or Low Time–Read tSW 7 — ns


ECSPIx_SCLK High or Low Time–Write 21.5

CS4 ECSPIx_SS_B pulse width tCSLH Half ECSPIx_SCLK period — ns

CS5 ECSPIx_SS_B Lead Time (CS setup time) tSCS 5 — ns

CS6 ECSPIx_SS_B Lag Time (CS hold time) tHCS 5 — ns

CS7 ECSPIx_MOSI Setup Time tSmosi 4 — ns

CS8 ECSPIx_MOSI Hold Time tHmosi 4 — ns

CS9 ECSPIx_MISO Propagation Delay (CLOAD = 20 pF) tPDmiso 4 19 ns

4.12.3 Enhanced Serial Audio Interface (ESAI) Timing Parameters


The ESAI consists of independent transmitter and receiver sections, each section with its own clock
generator. Table 49 shows the interface timing values. The number field in the table refers to timing signals
found in Figure 37 and Figure 38.

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Table 49. Enhanced Serial Audio Interface (ESAI) Timing

Characteristics1,2
No. Symbol Expression2 Min Max Condition3 Unit

62 Clock cycle4 tSSICC 4  Tc 30.0 — i ck ns


4  Tc 30.0 — i ck

63 Clock high period: ns


• For internal clock — 2  Tc 9.0 6 — —
• For external clock — 2  Tc 15 — —

64 Clock low period: ns


• For internal clock — 2  Tc 9.0 6 — —
• For external clock — 2  Tc 15 — —

65 ESAI_RX_CLK rising edge to ESAI_RX_FS out (bl) high — — — 17.0 x ck ns


— — — 7.0 i ck a

66 ESAI_RX_CLK rising edge to ESAI_RX_FS out (bl) low — — — 17.0 x ck ns


— — — 7.0 i ck a

67 ESAI_RX_CLK rising edge to ESAI_RX_FS out (wr) — — — 19.0 x ck ns


high5 — — — 9.0 i ck a

68 ESAI_RX_CLK rising edge to ESAI_RX_FS out (wr) low5 — — — 19.0 x ck ns


— — — 9.0 i ck a

69 ESAI_RX_CLK rising edge to ESAI_RX_FS out (wl) high — — — 16.0 x ck ns


— — — 6.0 i ck a

70 ESAI_RX_CLK rising edge to ESAI_RX_FS out (wl) low — — — 17.0 x ck ns


— — — 7.0 i ck a

71 Data in setup time before ESAI_RX_CLK (SCK in — — 12.0 — x ck ns


synchronous mode) falling edge — — 19.0 — i ck

72 Data in hold time after ESAI_RX_CLK falling edge — — 3.5 — x ck ns


— — 9.0 — i ck

73 ESAI_RX_FS input (bl, wr) high before ESAI_RX_CLK — — 2.0 — x ck ns


falling edge5 — — 12.0 — i ck a

74 ESAI_RX_FS input (wl) high before ESAI_RX_CLK — — 2.0 — x ck ns


falling edge — — 12.0 — i ck a

75 ESAI_RX_FS input hold time after ESAI_RX_CLK falling — — 2.5 — x ck ns


edge — — 8.5 — i ck a

76 Flags input setup before ESAI_RX_CLK falling edge — — 0.0 — x ck ns


— — 19.0 — i ck s

77 Flags input hold time after ESAI_RX_CLK falling edge — — 6.0 — x ck ns


— — 0.0 — i ck s

78 ESAI_TX_CLK rising edge to ESAI_TX_FS out (bl) high — — — 18.0 x ck ns


— — — 8.0 i ck

79 ESAI_TX_CLK rising edge to ESAI_TX_FS out (bl) low — — — 20.0 x ck ns


— — — 10.0 i ck

80 ESAI_TX_CLK rising edge to ESAI_TX_FS out (wr) — — — 20.0 x ck ns


high5 — — — 10.0 i ck

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Table 49. Enhanced Serial Audio Interface (ESAI) Timing (continued)

Characteristics1,2
No. Symbol Expression2 Min Max Condition3 Unit

81 ESAI_TX_CLK rising edge to ESAI_TX_FS out (wr) low5 — — — 22.0 x ck ns


— — — 12.0 i ck

82 ESAI_TX_CLK rising edge to ESAI_TX_FS out (wl) high — — — 19.0 x ck ns


— — — 9.0 i ck

83 ESAI_TX_CLK rising edge to ESAI_TX_FS out (wl) low — — — 20.0 x ck ns


— — — 10.0 i ck

84 ESAI_TX_CLK rising edge to data out enable from high — — — 22.0 x ck ns


impedance — — — 17.0 i ck

85 ESAI_TX_CLK rising edge to transmitter #0 drive enable — — — 17.0 x ck ns


assertion — — — 11.0 i ck

86 ESAI_TX_CLK rising edge to data out valid — — — 18.0 x ck ns


— — — 13.0 i ck

87 ESAI_TX_CLK rising edge to data out high impedance 67 — — — 21.0 x ck ns


— — — 16.0 i ck

88 ESAI_TX_CLK rising edge to transmitter #0 drive enable — — — 14.0 x ck ns


deassertion7 — 9.0 i ck

89 ESAI_TX_FS input (bl, wr) setup time before — — 2.0 — x ck ns


ESAI_TX_CLK falling edge5 — — 18.0 — i ck

90 ESAI_TX_FS input (wl) setup time before ESAI_TX_CLK — — 2.0 — x ck ns


falling edge — — 18.0 — i ck

91 ESAI_TX_FS input hold time after ESAI_TX_CLK falling — — 4.0 — x ck ns


edge — — 5.0 — i ck

92 ESAI_TX_FS input (wl) to data out enable from high — — — 21.0 — ns


impedance

93 ESAI_TX_FS input (wl) to transmitter #0 drive enable — — — 14.0 — ns


assertion

94 Flag output valid after ESAI_TX_CLK rising edge — — — 14.0 x ck ns


— 9.0 i ck

95 ESAI_RX_HF_CLK/ESAI_TX_HF_CLK clock cycle — 2 x TC 15 — — ns

96 ESAI_TX_HF_CLK input rising edge to ESAI_TX_CLK — — — 18.0 — ns


output

97 ESAI_RX_HF_CLK input rising edge to ESAI_RX_CLK — — — 18.0 — ns


output
1 i ck = internal clock
x ck = external clock
i ck a = internal clock, asynchronous mode
(asynchronous implies that ESAI_TX_CLK and ESAI_RX_CLK are two different clocks)
i ck s = internal clock, synchronous mode
(synchronous implies that ESAI_TX_CLK and ESAI_RX_CLK are the same clock)

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2
bl = bit length
wl = word length
wr = word length relative
3
ESAI_TX_CLK(SCKT pin) = transmit clock
ESAI_RX_CLK(SCKR pin) = receive clock
ESAI_TX_FS(FST pin) = transmit frame sync
ESAI_RX_FS(FSR pin) = receive frame sync
ESAI_TX_HF_CLK(HCKT pin) = transmit high frequency clock
ESAI_RX_HF_CLK(HCKR pin) = receive high frequency clock
4
For the internal clock, the external clock cycle is defined by Icyc and the ESAI control register.
5
The word-relative frame sync signal waveform relative to the clock operates in the same manner as the bit-length frame sync
signal waveform, but it spreads from one serial clock before the first bit clock (like the bit length frame sync signal), until the
second-to-last bit clock of the first word in the frame.
6
Periodically sampled and not 100% tested.

62
63 64
ESAI_TX_CLK
(Input/Output)

78 79

ESAI_TX_FS
(Bit)
Out 82 83

ESAI_TX_FS
(Word) 86 86
Out
84 87

First Bit Last Bit


Data Out

89

91

ESAI_TX_FS
(Bit) In
90 91

ESAI_TX_FS
(Word) In

Figure 37. ESAI Transmitter Timing

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62

63

ESAI_RX_CLK 64
(Input/Output)

65 66
ESAI_RX_FS
(Bit)
Out
69 70
ESAI_RX_FS
(Word)
Out
72
71
Data In First Bit Last Bit

73 75
ESAI_RX_FS
(Bit)
In
74 75
ESAI_RX_FS
(Word)
In
Figure 38. ESAI Receiver Timing

ESAI_TX_HF_CLK

95
ESAI_TX_CLK (output)

96

Figure 39. ESAI ESAI_TX_HF_CLK Timing

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4.12.4 Ultra High Speed SD/SDIO/MMC Host Interface (uSDHC) AC


timing
This section describes the electrical information of the uSDHC, which includes SD/eMMC4.3 (Single
Data Rate) timing, eMMC4.4/4.41 (Dual Date Rate) timing and SDR104/50(SD3.0) timing.

4.12.4.1 SD/eMMC4.3 (Single Data Rate) AC Timing


Figure 40 depicts the timing of SD/eMMC4.3, and Table 50 lists the SD/eMMC4.3 timing characteristics.
SD4

SD2
SD1
SD5

SDx_CLK
SD3
SD6

Output from uSDHC to card


SDx_DATA[7:0]
SD7 SD8

Input from card to uSDHC


SDx_DATA[7:0]

Figure 40. SD/eMMC4.3 Timing

Table 50. SD/eMMC4.3 Interface Timing Specification

ID Parameter Symbols Min Max Unit

Card Input Clock

SD1 Clock Frequency (Low Speed) fPP1 0 400 kHz

Clock Frequency (SD/SDIO Full Speed/High Speed) fPP2 0 25/50 MHz

Clock Frequency (MMC Full Speed/High Speed) fPP3 0 20/52 MHz

Clock Frequency (Identification Mode) fOD 100 400 kHz

SD2 Clock Low Time tWL 7 — ns

SD3 Clock High Time tWH 7 — ns

SD4 Clock Rise Time tTLH — 3 ns

SD5 Clock Fall Time tTHL — 3 ns

uSDHC Output/Card Inputs SD_CMD, SDx_DATAx (Reference to CLK)

SD6 uSDHC Output Delay tOD -6.6 3.6 ns

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Table 50. SD/eMMC4.3 Interface Timing Specification (continued)

ID Parameter Symbols Min Max Unit

uSDHC Input/Card Outputs SD_CMD, SDx_DATAx (Reference to CLK)

SD7 uSDHC Input Setup Time tISU 2.5 — ns


4
SD8 uSDHC Input Hold Time tIH 1.5 — ns
1
In low speed mode, card clock must be lower than 400 kHz, voltage ranges from 2.7 to 3.6 V.
2
In normal (full) speed mode for SD/SDIO card, clock frequency can be any value between 0–25 MHz. In high-speed mode,
clock frequency can be any value between 0–50 MHz.
3
In normal (full) speed mode for MMC card, clock frequency can be any value between 0–20 MHz. In high-speed mode, clock
frequency can be any value between 0–52 MHz.
4
To satisfy hold timing, the delay difference between clock input and cmd/data input must not exceed 2 ns.

4.12.4.2 eMMC4.4/4.41 (Dual Data Rate) AC Timing


Figure 41 depicts the timing of eMMC4.4/4.41. Table 51 lists the eMMC4.4/4.41 timing characteristics.
Be aware that only DATA is sampled on both edges of the clock (not applicable to CMD).

SD1

SDx_CLK

SD2 SD2

Output from eSDHCv3 to card


......
SDx_DATA[7:0]
SD3 SD4

Input from card to eSDHCv3


SDx_DATA[7:0] ......

Figure 41. eMMC4.4/4.41 Timing

Table 51. eMMC4.4/4.41 Interface Timing Specification

ID Parameter Symbols Min Max Unit

Card Input Clock

SD1 Clock Frequency (eMMC4.4/4.41 DDR) fPP 0 52 MHz

SD1 Clock Frequency (SD3.0 DDR) fPP 0 50 MHz

uSDHC Output / Card Inputs SD_CMD, SDx_DATAx (Reference to CLK)

SD2 uSDHC Output Delay tOD 2.5 7.1 ns

uSDHC Input / Card Outputs SD_CMD, SDx_DATAx (Reference to CLK)

SD3 uSDHC Input Setup Time tISU 1.7 — ns

SD4 uSDHC Input Hold Time tIH 1.5 — ns

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4.12.4.3 SDR50/SDR104 AC Timing


Figure 42 depicts the timing of SDR50/SDR104, and Table 52 lists the SDR50/SDR104 timing
characteristics.

6'

6' 6'

6&.
6'6'

ELWRXWSXWIURPX6'+&WRFDUG
6' 6'

ELWLQSXWIURPFDUGWRX6'+&
6'

Figure 42. SDR50/SDR104 Timing

Table 52. SDR50/SDR104 Interface Timing Specification

ID Parameter Symbols Min Max Unit

Card Input Clock

SD1 Clock Frequency Period tCLK 5.0 — ns

SD2 Clock Low Time tCL 0.46 x tCLK 0.54 x tCLK ns

SD3 Clock High Time tCH 0.46 x tCLK 0.54 x tCLK ns

uSDHC Output/Card Inputs SD_CMD, SDx_DATAx in SDR50 (Reference to CLK)

SD4 uSDHC Output Delay tOD –3 1 ns

uSDHC Output/Card Inputs SD_CMD, SDx_DATAx in SDR104 (Reference to CLK)

SD5 uSDHC Output Delay tOD –1.6 0.74 ns

uSDHC Input/Card Outputs SD_CMD, SDx_DATAx in SDR50 (Reference to CLK)

SD6 uSDHC Input Setup Time tISU 2.5 — ns

SD7 uSDHC Input Hold Time tIH 1.5 — ns

uSDHC Input/Card Outputs SD_CMD, SDx_DATAx in SDR104 (Reference to CLK)1

SD8 Card Output Data Window tODW 0.5 x tCLK — ns


1Data window in SDR104 mode is variable.

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4.12.4.4 HS200 Mode Timing


Figure 43 depicts the timing of HS200 mode, and Table 53 lists the HS200 timing characteristics.

6'

6' 6'

6&.
6'6'

ELWRXWSXWIURPX6'+&WRH00&

ELWLQSXWIURPH00&WRX6'+&
6'

Figure 43. HS200 Mode Timing

Table 53. HS200 Interface Timing Specification

ID Parameter Symbols Min Max Unit

Card Input Clock

SD1 Clock Frequency Period tCLK 5.0 — ns

SD2 Clock Low Time tCL 0.46 x tCLK 0.54 x tCLK ns

SD3 Clock High Time tCH 0.46 x tCLK 0.54 x tCLK ns

uSDHC Output/Card Inputs SD_CMD, SDx_DATAx in HS200 (Reference to CLK)

SD5 uSDHC Output Delay tOD –1.6 0.74 ns

uSDHC Input/Card Outputs SD_CMD, SDx_DATAx in HS200 (Reference to CLK)1

SD8 Card Output Data Window tODW 0.5 x tCLK — ns


1HS200 is for 8 bits while SDR104 is for 4 bits.

4.12.4.5 Bus Operation Condition for 3.3 V and 1.8 V Signaling


Signaling level of SD/eMMC4.3 and eMMC4.4/4.41 modes is 3.3 V. Signaling level of SDR104/SDR50
mode is 1.8 V. The DC parameters for the NVCC_SD1 supply are identical to those shown in Table 24,
"Single Voltage GPIO DC Parameters," on page 38.

4.12.5 Ethernet Controller (ENET) AC Electrical Specifications


The following timing specs are defined at the chip I/O pin and must be translated appropriately to arrive
at timing specs/constraints for the physical interface.

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4.12.5.1 ENET MII Mode Timing


This subsection describes MII receive, transmit, asynchronous inputs, and serial management signal
timings.

4.12.5.1.1 MII Receive Signal Timing (ENET_RX_DATA3,2,1,0, ENET_RX_EN,


ENET_RX_ER, and ENET_RX_CLK)
The receiver functions correctly up to an ENET_RX_CLK maximum frequency of 25 MHz + 1%. There
is no minimum frequency requirement. Additionally, the processor clock frequency must exceed twice the
ENET_RX_CLK frequency.
Figure 44 shows MII receive signal timings. Table 54 describes the timing parameters (M1–M4) shown in
the figure.

M3

ENET_RX_CLK (input)

M4
ENET_RX_DATA3,2,1,0
(inputs)
ENET_RX_EN
ENET_RX_ER
M1 M2

Figure 44. MII Receive Signal Timing Diagram

Table 54. MII Receive Signal Timing

ID Characteristic1 Min. Max. Unit

M1 ENET_RX_DATA3,2,1,0, ENET_RX_EN, ENET_RX_ER to 5 — ns


ENET_RX_CLK setup
M2 ENET_RX_CLK to ENET_RX_DATA3,2,1,0, ENET_RX_EN, 5 — ns
ENET_RX_ER hold

M3 ENET_RX_CLK pulse width high 35% 65% ENET_RX_CLK period

M4 ENET_RX_CLK pulse width low 35% 65% ENET_RX_CLK period

1 ENET_RX_EN, ENET_RX_CLK, and ENET0_RXD0 have the same timing in 10 Mbps 7-wire interface mode.

4.12.5.1.2 MII Transmit Signal Timing (ENET_TX_DATA3,2,1,0, ENET_TX_EN,


ENET_TX_ER, and ENET_TX_CLK)
The transmitter functions correctly up to an ENET_TX_CLK maximum frequency of 25 MHz + 1%.
There is no minimum frequency requirement. Additionally, the processor clock frequency must exceed
twice the ENET_TX_CLK frequency.

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Figure 45 shows MII transmit signal timings. Table 55 describes the timing parameters (M5–M8) shown
in the figure.

M7

ENET_TX_CLK (input)

M5
M8
ENET_TX_DATA3,2,1,0
(outputs)
ENET_TX_EN
ENET_TX_ER
M6

Figure 45. MII Transmit Signal Timing Diagram

Table 55. MII Transmit Signal Timing

ID Characteristic1 Min. Max. Unit

M5 ENET_TX_CLK to ENET_TX_DATA3,2,1,0, ENET_TX_EN, 5 — ns


ENET_TX_ER invalid

M6 ENET_TX_CLK to ENET_TX_DATA3,2,1,0, ENET_TX_EN, — 20 ns


ENET_TX_ER valid

M7 ENET_TX_CLK pulse width high 35% 65% ENET_TX_CLK period

M8 ENET_TX_CLK pulse width low 35% 65% ENET_TX_CLK period

1 ENET_TX_EN, ENET_TX_CLK, and ENET0_TXD0 have the same timing in 10-Mbps 7-wire interface mode.

4.12.5.1.3 MII Asynchronous Inputs Signal Timing (ENET_CRS and ENET_COL)


Figure 46 shows MII asynchronous input timings. Table 56 describes the timing parameter (M9) shown in
the figure.

ENET_CRS, ENET_COL

M9

Figure 46. MII Async Inputs Timing Diagram

Table 56. MII Asynchronous Inputs Signal Timing

ID Characteristic Min. Max. Unit

M91 ENET_CRS to ENET_COL minimum pulse width 1.5 — ENET_TX_CLK period

1 ENET_COL has the same timing in 10-Mbit 7-wire interface mode.

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4.12.5.1.4 MII Serial Management Channel Timing (ENET_MDIO and ENET_MDC)


The MDC frequency is designed to be equal to or less than 2.5 MHz to be compatible with the IEEE 802.3
MII specification. However the ENET can function correctly with a maximum MDC frequency of
15 MHz.
Figure 47 shows MII asynchronous input timings. Table 57 describes the timing parameters (M10–M15)
shown in the figure.

M14

M15
ENET_MDC (output)

M10

ENET_MDIO (output)

M11

ENET_MDIO (input)

M12 M13

Figure 47. MII Serial Management Channel Timing Diagram

Table 57. MII Serial Management Channel Timing

ID Characteristic Min. Max. Unit

M10 ENET_MDC falling edge to ENET_MDIO output invalid (min. 0 — ns


propagation delay)

M11 ENET_MDC falling edge to ENET_MDIO output valid (max. — 5 ns


propagation delay)

M12 ENET_MDIO (input) to ENET_MDC rising edge setup 18 — ns

M13 ENET_MDIO (input) to ENET_MDC rising edge hold 0 — ns

M14 ENET_MDC pulse width high 40% 60% ENET_MDC period

M15 ENET_MDC pulse width low 40% 60% ENET_MDC period

4.12.5.2 RMII Mode Timing


In RMII mode, ENET_CLK is used as the REF_CLK, which is a 50 MHz ± 50 ppm continuous reference
clock. ENET_RX_EN is used as the RMII_CRS_DV in RMII. Other signals under RMII mode include
ENET_TX_EN, ENET_TX_DATA[1:0], ENET_RX_DATA[1:0], and ENET_RX_ER.

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Figure 48 shows RMII mode timings. Table 58 describes the timing parameters (M16–M21) shown in the
figure.

M16

M17
ENET_CLK (input)

M18

ENET_TX_DATA (output)
ENET_TX_EN

M19

ENET_RX_EN (input)
ENET_RX_DATA[1:0]
ENET_RX_ER
M20 M21

Figure 48. RMII Mode Signal Timing Diagram

Table 58. RMII Signal Timing

ID Characteristic Min. Max. Unit

M16 ENET_CLK pulse width high 35% 65% ENET_CLK period

M17 ENET_CLK pulse width low 35% 65% ENET_CLK period

M18 ENET_CLK to ENET0_TXD[1:0], ENET_TX_DATA invalid 4 — ns

M19 ENET_CLK to ENET0_TXD[1:0], ENET_TX_DATA valid — 13 ns

M20 ENET_RX_DATAD[1:0], ENET_RX_EN(ENET_RX_EN), ENET_RX_ER 2 — ns


to ENET_CLK setup

M21 ENET_CLK to ENET_RX_DATAD[1:0], ENET_RX_EN, ENET_RX_ER 2 — ns


hold

4.12.6 Flexible Controller Area Network (FLEXCAN) AC Electrical


Specifications
The Flexible Controller Area Network (FlexCAN) module is a communication controller implementing
the CAN protocol according to the CAN 2.0B protocol specification. The processor has two CAN modules
available for systems design. Tx and Rx ports for both modules are multiplexed with other I/O pins. See
the IOMUXC chapter of the i.MX 6ULL Reference Manual (IMX6ULLRM) to see which pins expose Tx
and Rx pins; these ports are named FLEXCAN_TX and FLEXCAN_RX, respectively.

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4.12.7 I2C Bus Characteristics


The Inter-Integrated Circuit (I2C) provides functionality of a standard I2C master and slave. The I2C is
designed to be compatible with the I2C Bus Specification, version 2.1, by Philips Semiconductor (now
NXP Semiconductors).

4.12.8 Pulse Width Modulator (PWM) Timing Parameters


This section describes the electrical information of the PWM. The PWM can be programmed to select one
of three clock signals as its source frequency. The selected clock signal is passed through a prescaler before
being input to the counter. The output is available at the pulse-width modulator output (PWMO) external
pin.
Figure 49 depicts the timing of the PWM, and Table 59 lists the PWM timing parameters.

0 0

07-N?/54

Figure 49. PWM Timing

Table 59. PWM Output Timing Parameters

ID Parameter Min Max Unit

PWM Module Clock Frequency 0 66 MHz

P1 PWM output pulse width high 15 — ns

P2 PWM output pulse width low 15 — ns

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Electrical Characteristics

4.12.9 LCD Controller (LCDIF) Parameters


Figure 50 shows the LCDIF timing and Table 60 lists the timing parameters.

/ / /

/&'QB&/.
IDOOLQJHGJHFDSWXUH

/&'QB&/.
ULVLQJHGJHFDSWXUH

/&'QB'$7$>@
/&'Q&RQWURO6LJQDOV
/
/
/
/

Figure 50. LCD Timing

Table 60. LCD Timing Parameters

ID Parameter Symbol Min Max Unit

L1 LCD pixel clock frequency tCLK(LCD) — 150 MHz

L2 LCD pixel clock high (falling edge capture) tCLKH(LCD) 3 — ns

L3 LCD pixel clock low (rising edge capture) tCLKL(LCD) 3 — ns

L4 LCD pixel clock high to data valid (falling edge capture) td(CLKH-DV) -1 1 ns

L5 LCD pixel clock low to data valid (rising edge capture) td(CLKL-DV) -1 1 ns

L6 LCD pixel clock high to control signal valid (falling edge capture) td(CLKH-CTRLV) -1 1 ns

L7 LCD pixel clock low to control signal valid (rising edge capture) td(CLKL-CTRLV) -1 1 ns

4.12.9.1 LCDIF Signal Mapping


Table 61 lists the details about the mapping signals.
Table 61. LCD Timing Parameters

8-bit DOTCLK LCD 16-bit DOTCLK LCD 18-bit DOTCLK LCD 24-bit DOTCLK LCD 8-bit DVI LCD
Pin name
IF IF IF IF IF

LCD_RS — — — — CCIR_CLK

LCD_VSYNC* LCD_VSYNC LCD_VSYNC LCD_VSYNC LCD_VSYNC —


(Two options)

LCD_HSYNC LCD_HSYNC LCD_HSYNC LCD_HSYNC LCD_HSYNC —

LCD_DOTCLK LCD_DOTCLK LCD_DOTCLK LCD_DOTCLK LCD_DOTCLK —

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Table 61. LCD Timing Parameters (continued)

LCD_ENABLE LCD_ENABLE LCD_ENABLE LCD_ENABLE LCD_ENABLE —

LCD_D23 — — — R[7] —

LCD_D22 — — — R[6] —

LCD_D21 — — — R[5] —

LCD_D20 — — — R[4] —

LCD_D19 — — — R[3] —

LCD_D18 — — — R[2] —

LCD_D17 — — R[5] R[1] —

LCD_D16 — — R[4] R[0] —

LCD_D15 / — R[4] R[3] G[7] —


VSYNC*

LCD_D14 / — R[3] R[2] G[6] —


HSYNC**

LCD_D13 / — R21] R[1] G[5] —


LCD_DOTCLK
**

LCD_D12 / — R[1] R[0] G[4] —


ENABLE**

LCD_D11 — R[0] G[5] G[3] —

LCD_D10 — G[5] G[4] G[2] —

LCD_D9 — G[4] G[3] G[1] —

LCD_D8 — G[3] G[2] G[0] —

LCD_D8 — G[3] G[2] G[0] —

LCD_D7 R[2] G[2] G[1] B[7] Y/C[7]

LCD_D6 R[1] G[1] G[0] B[6] Y/C[6]

LCD_D5 R[0] G[0] B[5] B[5] Y/C[5]


LCD_D4 G[2] B[4] B[4] B[4] Y/C[4]

LCD_D3 G[1] B[3] B[3] B[3] Y/C[3]

LCD_D2 G[0] B[2] B[2] B[2] Y/C[2]

LCD_D1 B[1] B[1] B[1] B[1] Y/C[1]

LCD_D0 B[0] B[0] B[0] B[0] Y/C[0]

LCD_RESET LCD_RESET LCD_RESET LCD_RESET LCD_RESET —

LCD_BUSY / LCD_BUSY (or LCD_BUSY (or LCD_BUSY (or LCD_BUSY (or —


LCD_VSYNC optional optional LCD_VSYNC) optional optional
LCD_VSYNC) LCD_VSYNC) LCD_VSYNC)

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4.12.10 QUAD SPI (QSPI) Timing Parameters


Measurement conditions are with 35 pF load on SCK and SIO pins and input slew rate of 1 V/ns.

4.12.10.1 SDR Mode

463,[B6&/.
7,6 7,+ 7,6 7,+

463,[B'$7$>@

Figure 51. QuadSPI Input/Read Timing (SDR mode with internal sampling)

Table 62. QuadSPI Input Timing (SDR mode with internal sampling)

Value
Symbol Parameter Unit
Min Max

TIS Setup time for incoming data 8.67 — ns

TIH Hold time requirement for incoming data 0 — ns

   

463,[B6&/.

463,[B'$7$>@
7,6 7,+ 7,6 7,+

463,[B'46

Figure 52. QuadSPI Input/Read Timing (SDR mode with loopback DQS sampling)

Table 63. QuadSPI Input/Read Timing (SDR mode with loopback DQS sampling)

Value
Symbol Parameter Unit
Min Max

TIS Setup time for incoming data 2 — ns

TIH Hold time requirement for incoming data 1 — ns

NOTE
• For internal sampling, the timing values assumes using sample point 0,
that is QuadSPIx_SMPR[SDRSMP] = 0.

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• For loopback DQS sampling, the data strobe is output to the DQS pad
together with the serial clock. The data strobe is looped back from DQS
pad and used to sample input data.

463,[B6&/.
7&6+
7&66 7&.

463,[B&6
7'92 7'92

463,[B6,2
7'+2 7'+2

Figure 53. QuadSPI Output/Write Timing (SDR mode)

Table 64. QuadSPI Output/Write Timing (SDR mode)

Value
Symbol Parameter Unit
Min Max

TDVO Output data valid time — 2 ns

TDHO Output data hold time -0.5 — ns

TCK SCK clock period 10 — ns

TCSS Chip select output setup time 3 — SCK cycle(s)

TCSH Chip select output hold time 3 — SCK cycle(s)

NOTE
Tcss and Tcsh are configured by the QuadSPIx_FLSHCR register, the default
value of 3 are shown on the timing. Please refer to the i.MX 6ULL Reference
Manual (IMX6ULLRM) for more details.

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4.12.10.2 DDR Mode

463,[B6&/.
7,6 7,+ 7,6 7,+

463,[B'$7$>@

Figure 54. QuadSPI Input/Read Timing (DDR mode with internal sampling)

Table 65. QuadSPI Input/Read Timing (DDR mode with internal sampling)

Value
Symbol Parameter Unit
Min Max

TIS Setup time for incoming data 8.67 — ns

TIH Hold time requirement for incoming data 0 — ns

   

463,[B6&/.

463,[B'$7$>@
7,6 7,+ 7,6 7,+

463,[B'46

Figure 55. QuadSPI Input/Read Timing (DDR mode with loopback DQS sampling)

Table 66. QuadSPI Input/Read Timing (DDR mode with loopback DQS sampling)

Value
Symbol Parameter Unit
Min Max

TIS Setup time for incoming data 2 — ns

TIH Hold time requirement for incoming data 1 — ns

NOTE
• For internal sampling, the timing values assumes using sample point 0,
that is QuadSPIx_SMPR[SDRSMP] = 0.

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• For loopback DQS sampling, the data strobe is output to the DQS pad
together with the serial clock. The data strobe is looped back from DQS
pad and used to sample input data.
 

463,[B6&/.
7&66 7&.
7&6+

463,[B&6
7'92 7'92

463,[B6,2
7'+2 7'+2

Figure 56. QuadSPI Output/Write Timing (DDR mode)

Table 67. QuadSPI Output/Write Timing (DDR mode)

Value
Symbol Parameter Unit
Min Max

TDVO Output data valid time — (0.25 x TSCLK) + 2 ns

TDHO Output data hold time (0.25 x TSCLK) - 0.5 — ns

TCK SCK clock period 20 — ns

TCSS Chip select output setup time 3 — SCK cycle(s)

TCSH Chip select output hold time 3 — SCK cycle(s)

NOTE
Tcss and Tcsh are configured by the QuadSPIx_FLSHCR register, the default
value of 3 are shown on the timing. Please refer to the i.MX 6ULL Reference
Manual (IMX6ULLRM) for more details.

4.12.11 SAI/I2S Switching Specifications


This section provides the AC timings for the SAI in master (clocks driven) and slave (clocks input) modes.
All timings are given for non-inverted serial clock polarity (SAI_TCR[TSCKP] = 0, SAI_RCR[RSCKP]
= 0) and non-inverted frame sync (SAI_TCR[TFSI] = 0, SAI_RCR[RFSI] = 0). If the polarity of the clock
and/or the frame sync have been inverted, all the timings remain valid by inverting the clock signal
(SAI_BCLK) and/or the frame sync (SAI_FS) shown in the figures below.
Table 68. Master Mode SAI Timing

Num Characteristic Min Max Unit

S1 SAI_MCLK cycle time 2 x tsys — ns

S2 SAI_MCLK pulse width high/low 40% 60% MCLK period

S3 SAI_BCLK cycle time 4 x tsys — ns

S4 SAI_BCLK pulse width high/low 40% 60% BCLK period

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Table 68. Master Mode SAI Timing (continued)

Num Characteristic Min Max Unit

S5 SAI_BCLK to SAI_FS output valid — 15 ns

S6 SAI_BCLK to SAI_FS output invalid 0 — ns

S7 SAI_BCLK to SAI_TXD valid — 15 ns

S8 SAI_BCLK to SAI_TXD invalid 0 — ns

S9 SAI_RXD/SAI_FS input setup before SAI_BCLK 15 — ns

S10 SAI_RXD/SAI_FS input hold after SAI_BCLK 0 — ns

Figure 57. SAI Timing — Master Modes

Table 69. Master Mode SAI Timing

Num Characteristic Min Max Unit

S11 SAI_BCLK cycle time (input) 4 x tsys — ns

S12 SAI_BCLK pulse width high/low (input) 40% 60% BCLK period

S13 SAI_FS input setup before SAI_BCLK 10 — ns

S14 SAI_FA input hold after SAI_BCLK 2 — ns

S15 SAI_BCLK to SAI_TXD/SAI_FS output valid — 20 ns

S16 SAI_BCLK to SAI_TXD/SAI_FS output invalid 0 — ns

S17 SAI_RXD setup before SAI_BCLK 10 — ns

S18 SAI_RXD hold after SAI_BCLK 2 — ns

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Figure 58. SAI Timing — Slave Modes

4.12.12 SCAN JTAG Controller (SJC) Timing Parameters


Figure 59 depicts the SJC test clock input timing. Figure 60 depicts the SJC boundary scan timing.
Figure 61 depicts the SJC test access port. Signal parameters are listed in Table 70.

SJ1
SJ2 SJ2
JTAG_TCK
(Input) VIH VM VM
VIL
SJ3 SJ3

Figure 59. Test Clock Input Timing Diagram

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JTAG_TCK
(Input) VIH
VIL

SJ4 SJ5

Data
Inputs Input Data Valid

SJ6

Data
Output Data Valid
Outputs

SJ7

Data
Outputs

SJ6

Data
Outputs Output Data Valid

Figure 60. Boundary Scan (JTAG) Timing Diagram

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JTAG_TCK
(Input) VIH
VIL
SJ8 SJ9
JTAG_TDI
JTAG_TMS Input Data Valid
(Input)
SJ10

JTAG_TDO
(Output) Output Data Valid

SJ11

JTAG_TDO
(Output)

SJ10

JTAG_TDO
Output Data Valid
(Output)

Figure 61. Test Access Port Timing Diagram

JTAG_TCK
(Input)
SJ13
JTAG_TRST_B
(Input)

SJ12

Figure 62. JTAG_TRST_B Timing Diagram

Table 70. JTAG Timing

All Frequencies
ID Parameter1,2 Unit
Min Max

SJ0 JTAG_TCK frequency of operation 1/(3•TDC)1 0.001 22 MHz

SJ1 JTAG_TCK cycle time in crystal mode 45 — ns

SJ2 JTAG_TCK clock pulse width measured at VM2 22.5 — ns

SJ3 JTAG_TCK rise and fall times — 3 ns

SJ4 Boundary scan input data set-up time 5 — ns

SJ5 Boundary scan input data hold time 24 — ns

SJ6 JTAG_TCK low to output data valid — 40 ns

SJ7 JTAG_TCK low to output high impedance — 40 ns

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Table 70. JTAG Timing (continued)

All Frequencies
ID Parameter1,2 Unit
Min Max

SJ8 JTAG_TMS, JTAG_TDI data set-up time 5 — ns

SJ9 JTAG_TMS, JTAG_TDI data hold time 25 — ns

SJ10 JTAG_TCK low to JTAG_TDO data valid — 44 ns

SJ11 JTAG_TCK low to JTAG_TDO high impedance — 44 ns

SJ12 JTAG_TRST_B assert time 100 — ns

SJ13 JTAG_TRST_B set-up time to JTAG_TCK low 40 — ns


1
TDC = target frequency of SJC
2
VM = mid-point voltage

4.12.13 SPDIF Timing Parameters


The Sony/Philips Digital Interface Format (SPDIF) data is sent using the bi-phase marking code. When
encoding, the SPDIF data signal is modulated by a clock that is twice the bit rate of the data signal.
Table 71, Figure 63, and Figure 64 show SPDIF timing parameters for the Sony/Philips Digital
Interconnect Format (SPDIF), including the timing of the modulating Rx clock (SPDIF_SR_CLK) for
SPDIF in Rx mode and the timing of the modulating Tx clock (SPDIF_ST_CLK) for SPDIF in Tx mode.
Table 71. SPDIF Timing Parameters

Timing Parameter Range


Characteristics Symbol Unit
Min Max

SPDIF_IN Skew: asynchronous inputs, no specs apply — — 0.7 ns

SPDIF_OUT output (Load = 50pf)


• Skew — — 1.5 ns
• Transition rising — — 24.2
• Transition falling — — 31.3

SPDIF_OUT1 output (Load = 30pf)


• Skew — ns
— — 1.5
• Transition rising
— — 13.6
• Transition falling
— 18.0

Modulating Rx clock (SPDIF_SR_CLK) period srckp 40.0 — ns

SPDIF_SR_CLK high period srckph 16.0 — ns

SPDIF_SR_CLK low period srckpl 16.0 — ns

Modulating Tx clock (SPDIF_ST_CLK) period stclkp 40.0 — ns

SPDIF_ST_CLK high period stclkph 16.0 — ns

SPDIF_ST_CLK low period stclkpl 16.0 — ns

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srckp

srckpl srckph
SPDIF_SR_CLK
VM VM
(Output)

Figure 63. SPDIF_SR_CLK Timing Diagram

stclkp

stclkpl stclkph
SPDIF_ST_CLK
VM VM
(Input)

Figure 64. SPDIF_ST_CLK Timing Diagram

4.12.14 UART I/O Configuration and Timing Parameters

4.12.14.1 UART RS-232 Serial Mode Timing


The following sections describe the electrical information of the UART module in the RS-232 mode.

4.12.14.1.1 UART Transmitter


Figure 65 depicts the transmit timing of UART in the RS-232 serial mode, with 8 data bit/1 stop bit format.
Table 72 lists the UART RS-232 serial mode transmits timing characteristics.
Possible
UA1 UA1 Parity
Bit
Next
Start Start
UARTx_TX_DATA Bit Bit 0 Bit 1 Bit 2 Bit 3 Bit 4 Bit 5 Bit 6 Bit 7 Par Bit STOP Bit
(output) BIT

UA1 UA1

Figure 65. UART RS-232 Serial Mode Transmit Timing Diagram

Table 72. RS-232 Serial Mode Transmit Timing Parameters

ID Parameter Symbol Min Max Unit

UA1 Transmit Bit Time tTbit 1/Fbaud_rate1 - Tref_clk2 1/Fbaud_rate + Tref_clk —


1
Fbaud_rate: Baud rate frequency. The maximum baud rate the UART can support is (ipg_perclk frequency)/16.
2
Tref_clk: The period of UART reference clock ref_clk (ipg_perclk after RFDIV divider).

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4.12.14.1.2 UART Receiver


Figure 66 depicts the RS-232 serial mode receives timing with 8 data bit/1 stop bit format. Table 73 lists
serial mode receive timing characteristics.
Possible
Parity
UA2 UA2
Bit
Next
Start Start
UARTx_RX_DATA Bit Bit 0 Bit 1 Bit 2 Bit 3 Bit 4 Bit 5 Bit 6 Bit 7 Par Bit STOP Bit
(output) BIT

UA2 UA2

Figure 66. UART RS-232 Serial Mode Receive Timing Diagram

Table 73. RS-232 Serial Mode Receive Timing Parameters

ID Parameter Symbol Min Max Unit

UA2 Receive Bit Time1 tRbit 1/Fbaud_rate2 - 1/(16 1/Fbaud_rate + —


x Fbaud_rate) 1/(16 x Fbaud_rate)
1 The UART receiver can tolerate 1/(16 x Fbaud_rate) tolerance in each bit. But accumulation tolerance in one frame must not
exceed 3/(16 x Fbaud_rate).
2 F
baud_rate: Baud rate frequency. The maximum baud rate the UART can support is (ipg_perclk frequency)/16.

4.12.14.1.3 UART IrDA Mode Timing


The following subsections give the UART transmit and receive timings in IrDA mode.

UART IrDA Mode Transmitter


Figure 67 depicts the UART IrDA mode transmit timing, with 8 data bit/1 stop bit format. Table 74 lists
the transmit timing characteristics.

UA3 UA3 UA4


UA3 UA3

RGMII_TXD
(output)

Start Bit 0 Bit 1 Bit 2 Bit 3 Bit 4 Bit 5 Bit 6 Bit 7 Possible STOP
Bit Parity BIT
Bit

Figure 67. UART IrDA Mode Transmit Timing Diagram

Table 74. IrDA Mode Transmit Timing Parameters

ID Parameter Symbol Min Max Unit

UA3 Transmit Bit Time in IrDA mode tTIRbit 1/Fbaud_rate1 - 1/Fbaud_rate + Tref_clk —
Tref_clk2

UA4 Transmit IR Pulse Duration tTIRpulse (3/16) x (1/Fbaud_rate) (3/16) x (1/Fbaud_rate) —


- Tref_clk + Tref_clk

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1
Fbaud_rate: Baud rate frequency. The maximum baud rate the UART can support is (ipg_perclk frequency)/16.
2
Tref_clk: The period of UART reference clock ref_clk (ipg_perclk after RFDIV divider).

UART IrDA Mode Receiver


Figure 68 depicts the UART IrDA mode receive timing, with 8 data bit/1 stop bit format. Table 75 lists the
receive timing characteristics.
UA5 UA5 UA6
UA5 UA5

RGMII_RXD
(input)

Start Bit 0 Bit 1 Bit 2 Bit 3 Bit 4 Bit 5 Bit 6 Bit 7 Possible STOP
Bit Parity BIT
Bit

Figure 68. UART IrDA Mode Receive Timing Diagram

Table 75. IrDA Mode Receive Timing Parameters

ID Parameter Symbol Min Max Unit

UA5 Receive Bit Time1 in IrDA mode tRIRbit 1/Fbaud_rate2 - 1/(16 1/Fbaud_rate + 1/(16 x —
x Fbaud_rate) Fbaud_rate)
UA6 Receive IR Pulse Duration tRIRpulse 1.41 s (5/16) x (1/Fbaud_rate) —
1 The UART receiver can tolerate 1/(16 x Fbaud_rate) tolerance in each bit. But accumulation tolerance in one frame must not
exceed 3/(16 x Fbaud_rate).
2 F
baud_rate: Baud rate frequency. The maximum baud rate the UART can support is (ipg_perclk frequency)/16.

4.12.15 USB PHY Parameters


This section describes the USB-OTG PHY parameters.
The USB PHY meets the electrical compliance requirements defined in the Universal Serial Bus Revision
2.0 OTG with the following amendments.
• USB ENGINEERING CHANGE NOTICE
— Title: 5V Short Circuit Withstand Requirement Change
— Applies to: Universal Serial Bus Specification, Revision 2.0
• Errata for USB Revision 2.0 April 27, 2000 as of 12/7/2000
• USB ENGINEERING CHANGE NOTICE
— Title: Pull-up/Pull-down resistors
— Applies to: Universal Serial Bus Specification, Revision 2.0
• USB ENGINEERING CHANGE NOTICE
— Title: Suspend Current Limit Changes
— Applies to: Universal Serial Bus Specification, Revision 2.0

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• USB ENGINEERING CHANGE NOTICE


— Title: USB 2.0 Phase Locked SOFs
— Applies to: Universal Serial Bus Specification, Revision 2.0
• On-The-Go and Embedded Host Supplement to the USB Revision 2.0 Specification
— Revision 2.0 plus errata and ecn June 4, 2010
• Battery Charging Specification (available from USB-IF)
— Revision 1.2, December 7, 2010
— Portable device only

4.13 A/D converter


The following subsections provide information about A/D converter.

4.13.1 12-bit ADC electrical characteristics

4.13.1.1 12-bit ADC operating conditions


Table 76. 12-bit ADC Operating Conditions

Characteristic Conditions Symb Min Typ1 Max Unit Comment

Supply voltage Absolute VDDAD 3.0 - 3.6 V —

Delta to VDD VDDAD -100 0 100 mV —


(VDD-VDDAD)2

Ground voltage Delta to VSS VSSAD -100 0 100 mV —


(VSS-VSSAD)

Ref Voltage High — VREFH 1.13 VDDAD VDDAD V —

Ref Voltage Low — VREFL VSSAD VSSAD VSSAD V —

Input Voltage — VADIN VREFL — VREFH V —

Input Capacitance 8/10/12 bit modes CADIN — 1.5 2 pF —

Input Resistance ADLPC=0, ADHSC=1 RADIN — 5 7 kohms —

ADLPC=0, ADHSC=0 — 12.5 15 kohms —

ADLPC=1, ADHSC=0 — 25 30 kohms —

Analog Source 12 bit mode fADCK = RAS — — 1 kohms Tsamp=150


Resistance 40MHz ADLSMP=0, ns
ADSTS=10, ADHSC=1

RAS depends on Sample Time Setting (ADLSMP, ADSTS) and ADC Power Mode (ADHSC, ADLPC). See charts for Minimum
Sample Time vs RAS

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Table 76. 12-bit ADC Operating Conditions (continued)

Characteristic Conditions Symb Min Typ1 Max Unit Comment

ADC Conversion Clock ADLPC=0, ADHSC=1 fADCK 4 — 40 MHz —


Frequency 12 bit mode

ADLPC=0, ADHSC=0 4 — 30 MHz —


12 bit mode

ADLPC=1, ADHSC=0 4 — 20 MHz —


12 bit mode
1
Typical values assume VDDAD = 3.0 V, Temp = 25°C, fADCK=20 MHz unless otherwise stated. Typical values are for reference
only and are not tested in production.
2
DC potential differences

Figure 69. 12-bit ADC Input Impedance Equivalency Diagram

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4.13.1.1.1 12-bit ADC characteristics


Table 77. 12-bit ADC Characteristics (VREFH = VDDAD, VREFL = VSSAD)

Characteristic Conditions1 Symb Min Typ2 Max Unit Comment

[L:] Supply Current ADLPC=1, IDDAD — 250 — µA ADLSMP=0


ADHSC=0 ADSTS=10 ADCO=1

ADLPC=0, 350
ADHSC=0

ADLPC=0, 400
ADHSC=1

[L:] Supply Current Stop, Reset, Module IDDAD — 0.01 0.8 µA —


Off
ADC Asynchronous ADHSC=0 fADACK — 10 — MHz tADACK = 1/fADACK
Clock Source
ADHSC=1 — 20 —

Sample Cycles ADLSMP=0, Csamp — 2 — cycles —


ADSTS=00

ADLSMP=0, 4
ADSTS=01

ADLSMP=0, 6
ADSTS=10

ADLSMP=0, 8
ADSTS=11

ADLSMP=1, 12
ADSTS=00

ADLSMP=1, 16
ADSTS=01

ADLSMP=1, 20
ADSTS=10

ADLSMP=1, 24
ADSTS=11

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Table 77. 12-bit ADC Characteristics (VREFH = VDDAD, VREFL = VSSAD) (continued)

Characteristic Conditions1 Symb Min Typ2 Max Unit Comment

Conversion Cycles ADLSMP=0 Cconv — 28 — cycles —


ADSTS=00

ADLSMP=0 30
ADSTS=01

ADLSMP=0 32
ADSTS=10

ADLSMP=0 34
ADSTS=11

ADLSMP=1 38
ADSTS=00

ADLSMP=1 42
ADSTS=01

ADLSMP=1 46
ADSTS=10

ADLSMP=1, 50
ADSTS=11

Conversion Time ADLSMP=0 Tconv — 0.7 — µs Fadc=40 MHz


ADSTS=00

ADLSMP=0 0.75
ADSTS=01

ADLSMP=0 0.8
ADSTS=10

ADLSMP=0 0.85
ADSTS=11

ADLSMP=1 0.95
ADSTS=00

ADLSMP=1 1.05
ADSTS=01
ADLSMP=1 1.15
ADSTS=10

ADLSMP=1, 1.25
ADSTS=11

[P:][C:] Total 12 bit mode TUE — 4.5 — LSB —


Unadjusted Error 1 LSB =
10 bit mode — 2 — (VREFH -
8 bit mode — 1.5 — VREFL)/2
N

[P:][C:] Differential 12 bit mode DNL — 1 — LSB —


Non-Linearity
10bit mode — 0.5 —
8 bit mode — 0.2 —

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Table 77. 12-bit ADC Characteristics (VREFH = VDDAD, VREFL = VSSAD) (continued)

Characteristic Conditions1 Symb Min Typ2 Max Unit Comment

[P:][C:] Integral 12 bit mode INL — 2.6 — LSB —


Non-Linearity
10bit mode — 0.8 —

8 bit mode — 0.3 —

Zero-Scale Error 12 bit mode EZS — -0.3 — LSB —

10bit mode — -0.15 —

8 bit mode — -0.15 —

Full-Scale Error 12 bit mode EFS — -2.5 — LSB —

10bit mode — -0.6 —

8 bit mode — -0.3 —

[L:] Effective Number 12 bit mode ENOB 10.1 10.7 — Bits —


of Bits

[L:] Signal to Noise See ENOB SINAD SINAD = 6.02 x ENOB + 1.76 dB —
plus Distortion
1
All accuracy numbers assume the ADC is calibrated with VREFH=VDDAD
2
Typical values assume VDDAD = 3.0 V, Temp = 25°C, Fadck=20 MHz unless otherwise stated. Typical values are for reference
only and are not tested in production.

NOTE
The ADC electrical spec would be met with the calibration enabled
configuration.

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Boot Mode Configuration

5 Boot Mode Configuration


This section provides information on boot mode configuration pins allocation and boot devices interfaces
allocation.

5.1 Boot Mode Configuration Pins


Table 78 provides boot options, functionality, fuse values, and associated pins. Several input pins are also
sampled at reset and can be used to override fuse values, depending on the value of BT_FUSE_SEL fuse.
The boot option pins are in effect when BT_FUSE_SEL fuse is ‘0’ (cleared, which is the case for an
unblown fuse). For detailed boot mode options configured by the boot mode pins, see the i.MX 6ULL Fuse
Map document and the System Boot chapter in i.MX 6ULL Reference Manual (IMX6ULLRM).
Table 78. Fuses and Associated Pins Used for Boot

Pin Direction at reset eFuse name Details

BOOT_MODE0 Input with 100 K pull-down N/A Boot mode selection

BOOT_MODE1 Input with 100 K pull-down N/A Boot mode selection

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Boot Mode Configuration

Table 78. Fuses and Associated Pins Used for Boot (continued)

Pin Direction at reset eFuse name Details

LCD_DATA00 Input with 100 K pull-down BT_CFG1[0] Boot Options, Pin value overrides
fuse settings for BT_FUSE_SEL =
LCD_DATA01 Input with 100 K pull-down BT_CFG1[1] ‘0’. Signal Configuration as Fuse
LCD_DATA02 Input with 100 K pull-down BT_CFG1[2] Override Input at Power Up.
These are special I/O lines that
LCD_DATA03 Input with 100 K pull-down BT_CFG1[3] control the boot up configuration
during product development. In
LCD_DATA04 Input with 100 K pull-down BT_CFG1[4]
production, the boot configuration
LCD_DATA05 Input with 100 K pull-down BT_CFG1[5] can be controlled by fuses.

LCD_DATA06 Input with 100 K pull-down BT_CFG1[6]

LCD_DATA07 Input with 100 K pull-down BT_CFG1[7]

LCD_DATA08 Input with 100 K pull-down BT_CFG2[0]

LCD_DATA09 Input with 100 K pull-down BT_CFG2[1]

LCD_DATA10 Input with 100 K pull-down BT_CFG2[2]

LCD_DATA11 Input with 100 K pull-down BT_CFG2[3]

LCD_DATA12 Input with 100 K pull-down BT_CFG2[4]

LCD_DATA13 Input with 100 K pull-down BT_CFG2[5]

LCD_DATA14 Input with 100 K pull-down BT_CFG2[6]

LCD_DATA15 Input with 100 K pull-down BT_CFG2[7]

LCD_DATA16 Input with 100 K pull-down BT_CFG4[0]

LCD_DATA17 Input with 100 K pull-down BT_CFG4[1]

LCD_DATA18 Input with 100 K pull-down BT_CFG4[2]

LCD_DATA19 Input with 100 K pull-down BT_CFG4[3]

LCD_DATA20 Input with 100 K pull-down BT_CFG4[4]

LCD_DATA21 Input with 100 K pull-down BT_CFG4[5]

LCD_DATA22 Input with 100 K pull-down BT_CFG4[6]

LCD_DATA23 Input with 100 K pull-down BT_CFG4[7]

5.2 Boot Device Interface Allocation


The following tables list the interfaces that can be used by the boot process in accordance with the
specific boot mode configuration. The tables also describe the interface’s specific modes and IOMUXC
allocation, which are configured during boot when appropriate.
Table 79. QSPI Boot trough QSPI

Mux Quad + Port A + Port A + Port + Port B + Port B


Ball Name Signal Name Common
Mode Mode DQS CS1 B DQS CS1

NAND_WP_B qspi.A_SCLK Alt2 Yes Yes

NAND_DQS qspi.A_SS0_B Alt2 Yes Yes

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Table 79. QSPI Boot trough QSPI (continued)

NAND_READY_B qspi.A_DATA[0] Alt2 Yes Yes

NAND_CE0_B qspi.A_DATA[1] Alt2 Yes Yes

NAND_CE1_B qspi.A_DATA[2] Alt2 Yes Yes

NAND_CLE qspi.A_DATA[3] Alt2 Yes Yes

NAND_DATA05 qspi.B_DATA[3] Alt2 Yes

NAND_DATA04 qspi.B_DATA[2] Alt2 Yes

NAND_DATA03 qspi.B_DATA[1] Alt2 Yes

NAND_DATA02 qspi.B_DATA[0] Alt2 Yes

NAND_WE_B qspi.B_SS0_B Alt2 Yes

NAND_RE_B qspi.B_SCLK Alt2 Yes

NAND_DATA07 qspi.A_SS1_B Alt2 Yes

NAND_ALE qspi.A_DQS Alt2 Yes

NAND_DATA00 qspi.B_SS1_B Alt2 Yes

NAND_DATA01 qspi.B_DQS Alt2 Yes

Table 80. SPI Boot through ECSPI1

Mux BOOT_CFG4 BOOT_CFG4 BOOT_CFG4 BOOT_CFG4


Ball Name Signal Name Common
Mode [5:4]=00b [5:4]=01b [5:4]=10b [5:4]=11b

CSI_DATA07 ecspi1.MISO Alt 3 Yes


CSI_DATA06 ecspi1.MOSI Alt 3 Yes

CSI_DATA04 ecspi1.SCLK Alt 3 Yes

CSI_DATA05 ecspi1.SS0 Alt 3 Yes

LCD_DATA05 ecspi1.SS1 Alt 8 Yes

LCD_DATA06 ecspi1.SS2 Alt 8 Yes

LCD_DATA07 ecspi1.SS3 Alt 8 Yes

Table 81. SPI Boot through ECSPI2

BOOT_CFG BOOT_CFG4 BOOT_CFG4 BOOT_CFG4


Ball Name Signal Name Mux Mode Common
4[5:4]=00b [5:4]=01b [5:4]=10b [5:4]=11b

CSI_DATA03 ecspi2.MISO Alt 3 Yes

CSI_DATA02 ecspi2.MOSI Alt 3 Yes

CSI_DATA00 ecspi2.SCLK Alt 3 Yes

CSI_DATA01 ecspi2.SS0 Alt 3 Yes

LCD_HSYNC ecspi2.SS1 Alt 8 Yes

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Table 81. SPI Boot through ECSPI2 (continued)

LCD_VSYNC ecspi2.SS2 Alt 8 Yes

LCD_RESET ecspi2.SS3 Alt 8 Yes

Table 82. SPI Boot through ECSPI3

Mux BOOT_CFG4 BOOT_CFG4[ BOOT_CFG4[ BOOT_CFG4


Ball Name Signal Name Common
Mode [5:4]=00b 5:4]=01b 5:4]=10b [5:4]=11b

UART2_RTS_B ecspi3.MISO Alt 8 Yes

UART2_CTS_B ecspi3.MOSI Alt 8 Yes

UART2_RX_DATA ecspi3.SCLK Alt 8 Yes

UART2_TX_DATA ecspi3.SS0 Alt 8 Yes

NAND_ALE ecspi3.SS1 Alt 8 Yes

NAND_RE_B ecspi3.SS2 Alt 8 Yes

NAND_WE_B ecspi3.SS3 Alt 8 Yes

Table 83. SPI Boot through ECSPI4

Mux BOOT_CFG4 BOOT_CFG4[ BOOT_CFG4[ BOOT_CFG


Ball Name Signal Name Common
Mode [5:4]=00b 5:4]=01b 5:4]=10b 4[5:4]=11b

ENET2_TX_CLK ecspi4.MISO Alt 3 Yes


ENET2_TX_EN ecspi4.MOSI Alt 3 Yes

ENET2_TX_DATA1 ecspi4.SCLK Alt 3 Yes

ENET2_RX_ER ecspi4.SS0 Alt 3 Yes

NAND_DATA01 ecspi4.SS1 Alt 8 Yes

NAND_DATA02 ecspi4.SS2 Alt 8 Yes

NAND_DATA03 ecspi4.SS3 Alt 8 Yes

Table 84. NAND Boot through GPMI

BOOT_CFG1[3:2]= BOOT_CFG1[3:2]=
Ball Name Signal Name Mux Mode Common
01b 10b

NAND_CLE rawnand.CLE Alt 0 Yes

NAND_ALE rawnand.ALE Alt 0 Yes

NAND_WP_B rawnand.WP_B Alt 0 Yes

NAND_READY_B rawnand.READY_B Alt 0 Yes

NAND_CE0_B rawnand.CE0_B Alt 0 Yes

NAND_CE1_B rawnand.CE1_B Alt 0 Yes Yes

NAND_RE_B rawnand.RE_B Alt 0 Yes

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Table 84. NAND Boot through GPMI (continued)

BOOT_CFG1[3:2]= BOOT_CFG1[3:2]=
Ball Name Signal Name Mux Mode Common
01b 10b

NAND_WE_B rawnand.WE_B Alt 0 Yes

NAND_DATA00 rawnand.DATA00 Alt 0 Yes

NAND_DATA01 rawnand.DATA01 Alt 0 Yes

NAND_DATA02 rawnand.DATA02 Alt 0 Yes

NAND_DATA03 rawnand.DATA03 Alt 0 Yes

NAND_DATA04 rawnand.DATA04 Alt 0 Yes

NAND_DATA05 rawnand.DATA05 Alt 0 Yes

NAND_DATA06 rawnand.DATA06 Alt 0 Yes

NAND_DATA07 rawnand.DATA07 Alt 0 Yes

NAND_DQS rawnand.DQS Alt 0 Yes

CSI_MCLK rawnand.CE2_B Alt 2 Yes

CSI_PIXCLK rawnand.CE3_B Alt 2 Yes

Table 85. SD/MMC Boot through USDHC1

SDMMC
Mux BOOT_CFG1[1]=1
Ball Name Signal Name Common 4-bit 8-bit MFG
Mode (SD Power Cycle)
mode

UART1_RTS_B usdhc1.CD_B Alt 2 Yes

SD1_CLK usdhc1.CLK Alt 0 Yes

SD1_CMD usdhc1.CMD Alt 0 Yes

SD1_DATA0 usdhc1.DATA0 Alt 0 Yes

SD1_DATA1 usdhc1.DATA1 Alt 0 Yes Yes

SD1_DATA2 usdhc1.DATA2 Alt 0 Yes Yes

SD1_DATA3 usdhc1.DATA3 Alt 0 Yes

NAND_READY_B usdhc1.DATA4 Alt 1 Yes

NAND_CE0_B usdhc1.DATA5 Alt 1 Yes

NAND_CE1_B usdhc1.DATA6 Alt 1 Yes

NAND_CLE usdhc1.DATA7 Alt 1 Yes

GPIO1_IO09 GPIO1_IO091 Alt 5 Yes

GPIO1_IO05 usdhc1.VSELECT Alt 4 Yes


1 The Boot ROM uses GPIO1_IO09 to implement SD1_RESET_B.

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Table 86. SD/MMC Boot through USDHC2

Commo BOOT_CFG1[1]=1
Ball Name Signal Name Mux Mode 4-bit 8-bit
n (SD Power Cycle)

NAND_RE_B usdhc2.CLK Alt 1 Yes

NAND_WE_B usdhc2.CMD Alt 1 Yes

NAND_DATA00 usdhc2.DATA0 Alt 1 Yes

NAND_DATA01 usdhc2.DATA1 Alt 1 Yes Yes

NAND_DATA02 usdhc2.DATA2 Alt 1 Yes Yes

NAND_DATA03 usdhc2.DATA3 Alt 1 Yes

NAND_DATA04 usdhc2.DATA4 Alt 1 Yes

NAND_DATA05 usdhc2.DATA5 Alt 1 Yes

NAND_DATA06 usdhc2.DATA6 Alt 1 Yes

NAND_DATA07 usdhc2.DATA7 Alt 1 Yes

NAND_ALE NAND_ALE1 Alt 5 Yes

GPIO1_IO08 usdhc2.VSELECT Alt 4 Yes


1 The Boot ROM uses NAND_ALE to implement SD2_RESET_B.

Table 87. NOR/OneNAND Boot through EIM

ADL16
Ball Name Signal Name Mux Mode Common AD16 Mux
Non-Mux

CSI_DATA00 weim.AD[0] Alt 4 Yes

CSI_DATA01 weim.AD[1] Alt 4 Yes

CSI_DATA02 weim.AD[2] Alt 4 Yes


CSI_DATA03 weim.AD[3] Alt 4 Yes

CSI_DATA04 weim.AD[4] Alt 4 Yes

CSI_DATA05 weim.AD[5] Alt 4 Yes

CSI_DATA06 weim.AD[6] Alt 4 Yes

CSI_DATA07 weim.AD[7] Alt 4 Yes

NAND_DATA00 weim.AD[8] Alt 4 Yes

NAND_DATA01 weim.AD[9] Alt 4 Yes

NAND_DATA02 weim.AD[10] Alt 4 Yes

NAND_DATA03 weim.AD[11] Alt 4 Yes

NAND_DATA04 weim.AD[12] Alt 4 Yes

NAND_DATA05 weim.AD[13] Alt 4 Yes

NAND_DATA06 weim.AD[14] Alt 4 Yes

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Table 87. NOR/OneNAND Boot through EIM (continued)

ADL16
Ball Name Signal Name Mux Mode Common AD16 Mux
Non-Mux

NAND_DATA07 weim.AD[15] Alt 4 Yes

NAND_CLE weim.ADDR[16] Alt 4 Yes Yes

NAND_ALE weim.ADDR[17] Alt 4 Yes Yes

NAND_CE1_B weim.ADDR[18] Alt 4 Yes Yes

SD1_CMD weim.ADDR[19] Alt 4 Yes Yes

SD1_CLK weim.ADDR[20] Alt 4 Yes Yes

SD1_DATA0 weim.ADDR[21] Alt 4 Yes Yes

SD1_DATA1 weim.ADDR[22] Alt 4 Yes Yes

SD1_DATA2 weim.ADDR[23] Alt 4 Yes Yes

SD1_DATA3 weim.ADDR[24] Alt 4 Yes Yes

ENET2_RXER weim.ADDR[25] Alt 4 Yes Yes

ENET2_CRS_DV weim.ADDR[26] Alt 4 Yes Yes

CSI_MCLK weim.CS0_B Alt 4 Yes

LCD_DATA08 weim.DATA[0] Alt 4 Yes

LCD_DATA09 weim.DATA[1] Alt 4 Yes

LCD_DATA10 weim.DATA[2] Alt 4 Yes

LCD_DATA11 weim.DATA[3] Alt 4 Yes

LCD_DATA12 weim.DATA[4] Alt 4 Yes

LCD_DATA13 weim.DATA[5] Alt 4 Yes

LCD_DATA14 weim.DATA[6] Alt 4 Yes

LCD_DATA15 weim.DATA[7] Alt 4 Yes

LCD_DATA16 weim.DATA[8] Alt 4 Yes

LCD_DATA17 weim.DATA[9] Alt 4 Yes

LCD_DATA18 weim.DATA[10] Alt 4 Yes

LCD_DATA19 weim.DATA[11] Alt 4 Yes

LCD_DATA20 weim.DATA[12] Alt 4 Yes

LCD_DATA21 weim.DATA[13] Alt 4 Yes

LCD_DATA22 weim.DATA[14] Alt 4 Yes

LCD_DATA23 weim.DATA[15] Alt 4 Yes

NAND_RE_B weim.EB_B[0] Alt 4 Yes Yes

NAND_WE_B weim.EB_B[1] Alt 4 Yes Yes

CSI_HSYNC weim.LBA_B Alt 4 Yes

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Table 87. NOR/OneNAND Boot through EIM (continued)

ADL16
Ball Name Signal Name Mux Mode Common AD16 Mux
Non-Mux

CSI_PIXCLK weim.OE Alt 4 Yes

CSI_VSYNC weim.RW Alt 4 Yes

Table 88. Serial Download through UART1

Ball Name Signal Name Mux Mode Common

UART1_TX_DATA uart1.TX_DATA Alt 0 Yes

UART1_RX_DATA uart1.RX_DATA Alt 0 Yes

Table 89. Serial Download through UART2

Ball Name Signal Name Mux Mode Common

UART2_TX_DATA uart2.TX_DATA Alt 0 Yes

UART2_RX_DATA uart2.RX_DATA Alt 0 Yes

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Package Information and Contact Assignments

6 Package Information and Contact Assignments


This section includes the contact assignment information and mechanical package drawing.

6.1 14 x 14 mm Package Information

6.1.1 14 x 14 mm, 0.8 mm Pitch, Ball Matrix


Figure 70 shows the top, bottom, and side views of the 14 x 14 mm BGA package.

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Package Information and Contact Assignments

Figure 70. 14 x 14 mm BGA, Case x Package Top, Bottom, and Side Views

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Package Information and Contact Assignments

6.1.2 14 x 14 mm Supplies Contact Assignments and Functional Contact


Assignments
Table 90 shows the device connection list for ground, sense, and reference contact signals.
Table 90. 14x14 mm Supplies Contact Assignment

Supply Rail Name Ball(s) Position(s) Remark

ADC_VREFH M13 —

DRAM_VREF P4 —

GPANIO R13 —

NGND_KEL0 M12 —

NVCC_CSI F4 —

NVCC_DRAM G6, H6, J6, K6, L6, M6 —

NVCC_DRAM_2P5 N6 —

NVCC_ENET F13 —

NVCC_GPIO J13 —

NVCC_LCD E13 —

NVCC_NAND E7 —

NVCC_PLL P13 —

NVCC_SD1 C4 —

NVCC_UART H13 —

VDD_ARM_CAP G9, G10, G11, H11 —

VDD_HIGH_CAP R14, R15 —

VDD_HIGH_IN N13 —

VDD_SNVS_CAP N12 —
VDD_SNVS_IN P12 —

VDD_SOC_CAP G8, H8, J8, J11, K8, K11, L8, L9, L10, L11 —

VDD_SOC_IN H9, H10, J9, J10, K9, 10 —


VDD_USB_CAP R12 —

VDDA_ADC_3P3 L13 —

VSS A1, A17, C3, C7, C11, C15, E8, E11, F6, F7, F8, F9, F10,F11, F12, G3, G5, G7, —
G12, G15, H7, H12, J5, J7, J12, K7, K12, L3, L7, L12, M7, M8, M9, M10, M11,
N3, N5, R3, R5, R7, R11, R16, R17, T14, U1, U14, U17

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Table 91 shows an alpha-sorted list of functional contact assignments for the 14 x 14 mm package.
Table 91. 14 x 14 mm Functional Contact Assignments

Out of Reset Condition


14x14 Power Ball
Ball Name
Ball Group Type Default Default Input/
Value
Mode Function Output

BOOT_MODE0 T10 VDD_SNVS_IN GPIO ALT5 GPIO5_IO10 Input 100 k


pull-down

BOOT_MODE1 U10 VDD_SNVS_IN GPIO ALT5 GPIO5_IO11 Input 100 k


pull-down

CCM_CLK1_N P16 VDD_HIGH_CAP CCM — CCM_CLK1_N — —

CCM_CLK1_P P17 VDD_HIGH_CAP CCM — CCM_CLK1_P — —

CCM_PMIC_STBY_REQ U9 VDD_SNVS_IN CCM ALT0 CCM_PMIC_VSTBY_REQ Output —

CSI_DATA00 E4 NVCC_CSI GPIO ALT5 GPIO4_IO21 Input Keeper

CSI_DATA01 E3 NVCC_CSI GPIO ALT5 GPIO4_IO22 Input Keeper

CSI_DATA02 E2 NVCC_CSI GPIO ALT5 GPIO4_IO23 Input Keeper

CSI_DATA03 E1 NVCC_CSI GPIO ALT5 GPIO4_IO24 Input Keeper

CSI_DATA04 D4 NVCC_CSI GPIO ALT5 GPIO4_IO25 Input Keeper

CSI_DATA05 D3 NVCC_CSI GPIO ALT5 GPIO4_IO26 Input Keeper

CSI_DATA06 D2 NVCC_CSI GPIO ALT5 GPIO4_IO27 Input Keeper

CSI_DATA07 D1 NVCC_CSI GPIO ALT5 GPIO4_IO28 Input Keeper

CSI_HSYNC F3 NVCC_CSI GPIO ALT5 GPIO4_IO20 Input Keeper

CSI_MCLK F5 NVCC_CSI GPIO ALT5 GPIO4_IO17 Input Keeper

CSI_PIXCLK E5 NVCC_CSI GPIO ALT5 GPIO4_IO18 Input Keeper

CSI_VSYNC F2 NVCC_CSI GPIO ALT5 GPIO4_IO19 Input Keeper

DRAM_ADDR00 L5 NVCC_DRAM MMDC ALT0 DRAM_ADDR00 Output 100 k


pull-up

DRAM_ADDR01 H2 NVCC_DRAM DDR ALT0 DRAM_ADDR01 Output 100 k


pull-up

DRAM_ADDR02 K1 NVCC_DRAM DDR ALT0 DRAM_ADDR02 Output 100 k


pull-up

DRAM_ADDR03 M2 NVCC_DRAM DDR ALT0 DRAM_ADDR03 Output 100 k


pull-up

DRAM_ADDR04 K4 NVCC_DRAM DDR ALT0 DRAM_ADDR04 Output 100 k


pull-up

DRAM_ADDR05 L1 NVCC_DRAM DDR ALT0 DRAM_ADDR05 Output 100 k


pull-up

DRAM_ADDR06 G2 NVCC_DRAM DDR ALT0 DRAM_ADDR06 Output 100 k


pull-up

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Table 91. 14 x 14 mm Functional Contact Assignments (continued)

DRAM_ADDR07 H4 NVCC_DRAM DDR ALT0 DRAM_ADDR07 Output 100 k


pull-up

DRAM_ADDR08 J4 NVCC_DRAM DDR ALT0 DRAM_ADDR08 Output 100 k


pull-up

DRAM_ADDR09 L2 NVCC_DRAM DDR ALT0 DRAM_ADDR09 Output 100 k


pull-up

DRAM_ADDR10 M4 NVCC_DRAM DDR ALT0 DRAM_ADDR10 Output 100 k


pull-up

DRAM_ADDR11 K3 NVCC_DRAM DDR ALT0 DRAM_ADDR11 Output 100 k


pull-up

DRAM_ADDR12 L4 NVCC_DRAM DDR ALT0 DRAM_ADDR12 Output 100 k


pull-up

DRAM_ADDR13 H3 NVCC_DRAM DDR ALT0 DRAM_ADDR13 Output 100 k


pull-up

DRAM_ADDR14 G1 NVCC_DRAM DDR ALT0 DRAM_ADDR14 Output 100 k


pull-up

DRAM_ADDR15 K5 NVCC_DRAM DDR ALT0 DRAM_ADDR15 Output 100 k


pull-up
DRAM_CAS_B J2 NVCC_DRAM DDR ALT0 DRAM_CAS_B Output 100 k
pull-up

DRAM_CS0_B N2 NVCC_DRAM DDR ALT0 DRAM_CS0_B Output 100 k


pull-up

DRAM_CS1_B H5 NVCC_DRAM DDR ALT0 DRAM_CS1_B Output 100 k


pull-up

DRAM_DATA00 T4 NVCC_DRAM DDR ALT0 DRAM_DATA00 Input 100 k


pull-up

DRAM_DATA01 U6 NVCC_DRAM DDR ALT0 DRAM_DATA01 Input 100 k


pull-up

DRAM_DATA02 T6 NVCC_DRAM DDR ALT0 DRAM_DATA02 Input 100 k


pull-up

DRAM_DATA03 U7 NVCC_DRAM DDR ALT0 DRAM_DATA03 Input 100 k


pull-up

DRAM_DATA04 U8 NVCC_DRAM DDR ALT0 DRAM_DATA04 Input 100 k


pull-up

DRAM_DATA05 T8 NVCC_DRAM DDR ALT0 DRAM_DATA05 Input 100 k


pull-up

DRAM_DATA06 T5 NVCC_DRAM DDR ALT0 DRAM_DATA06 Input 100 k


pull-up

DRAM_DATA07 U4 NVCC_DRAM DDR ALT0 DRAM_DATA07 Input 100 k


pull-up

DRAM_DATA08 U2 NVCC_DRAM DDR ALT0 DRAM_DATA08 Input 100 k


pull-up

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Table 91. 14 x 14 mm Functional Contact Assignments (continued)

DRAM_DATA09 U3 NVCC_DRAM DDR ALT0 DRAM_DATA09 Input 100 k


pull-up

DRAM_DATA10 U5 NVCC_DRAM DDR ALT0 DRAM_DATA10 Input 100 k


pull-up

DRAM_DATA11 R4 NVCC_DRAM DDR ALT0 DRAM_DATA11 Input 100 k


pull-up

DRAM_DATA12 P5 NVCC_DRAM DDR ALT0 DRAM_DATA12 Input 100 k


pull-up

DRAM_DATA13 P3 NVCC_DRAM DDR ALT0 DRAM_DATA13 Input 100 k


pull-up

DRAM_DATA14 R2 NVCC_DRAM DDR ALT0 DRAM_DATA14 Input 100 k


pull-up

DRAM_DATA15 R1 NVCC_DRAM DDR ALT0 DRAM_DATA15 Input 100 k


pull-up

DRAM_DQM0 T7 NVCC_DRAM DDR ALT0 DRAM_DQM0 Output 100 k


pull-up

DRAM_DQM1 T3 NVCC_DRAM DDR ALT0 DRAM_DQM1 Output 100 k


pull-up
DRAM_ODT0 N1 NVCC_DRAM DDR ALT0 DRAM_ODT0 Output 100 k
pull-down

DRAM_ODT1 F1 NVCC_DRAM DDR ALT0 DRAM_ODT1 Output 100 k


pull-down

DRAM_RAS_B M5 NVCC_DRAM DDR ALT0 DRAM_RAS_B Output 100 k


pull-up

DRAM_RESET G4 NVCC_DRAM DDR ALT0 DRAM_RESET Output 100 k


pull-down

DRAM_SDBA0 M1 NVCC_DRAM DDR ALT0 DRAM_SDBA0 Output 100 k


pull-up

DRAM_SDBA1 H1 NVCC_DRAM DDR ALT0 DRAM_SDBA1 Output 100 k


pull-up

DRAM_SDBA2 K2 NVCC_DRAM DDR ALT0 DRAM_SDBA2 Output 100 k


pull-up

DRAM_SDCKE0 M3 NVCC_DRAM DDR ALT0 DRAM_SDCKE0 Output 100 k


pull-down

DRAM_SDCKE1 J3 NVCC_DRAM DDR ALT0 DRAM_SDCKE1 Output 100 k


pull-down

DRAM_SDCLK0_N P2 NVCC_DRAM DDRCL ALT0 DRAM_SDCLK0_N Input 100 k


K pull-up

DRAM_SDCLK0_P P1 NVCC_DRAM DDRCL ALT0 DRAM_SDCLK0_P Input 100 k


K pull-up

DRAM_SDQS0_N P7 NVCC_DRAM DDRCL ALT0 DRAM_SDQS0_N Input 100 k


K pull-down

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Table 91. 14 x 14 mm Functional Contact Assignments (continued)

DRAM_SDQS0_P P6 NVCC_DRAM DDRCL ALT0 DRAM_SDQS0_P Input 100 k


K pull-down

DRAM_SDQS1_N T2 NVCC_DRAM DDRCL ALT0 DRAM_SDQS1_N Input 100 k


K pull-down

DRAM_SDQS1_P T1 NVCC_DRAM DDRCL ALT0 DRAM_SDQS1_P Input 100 k


K pull-down

DRAM_SDWE_B J1 NVCC_DRAM DDR ALT0 DRAM_SDWE_B Output 100 k


pull-up

DRAM_ZQPAD N4 NVCC_DRAM GPIO — DRAM_ZQPAD Input Keeper

ENET1_RX_DATA0 F16 NVCC_ENET GPIO ALT5 GPIO2_IO0 Input Keeper


ENET1_RX_DATA1 E17 NVCC_ENET GPIO ALT5 GPIO2_IO1 Input Keeper

ENET1_RX_EN E16 NVCC_ENET GPIO ALT5 GPIO2_IO2 Input Keeper

ENET1_RX_ER D15 NVCC_ENET GPIO ALT5 GPIO2_IO7 Input Keeper

ENET1_TX_CLK F14 NVCC_ENET GPIO ALT5 GPIO2_IO6 Input Keeper

ENET1_TX_DATA0 E15 NVCC_ENET GPIO ALT5 GPIO2_IO3 Input Keeper

ENET1_TX_DATA1 E14 NVCC_ENET GPIO ALT5 GPIO2_IO4 Input Keeper

ENET1_TX_EN F15 NVCC_ENET GPIO ALT5 GPIO2_IO5 Input Keeper

ENET2_RX_DATA0 C17 NVCC_ENET GPIO ALT5 GPIO2_IO8 Input Keeper

ENET2_RX_DATA1 C16 NVCC_ENET GPIO ALT5 GPIO2_IO9 Input Keeper

ENET2_RX_EN B17 NVCC_ENET GPIO ALT5 GPIO2_IO10 Input Keeper

ENET2_RX_ER D16 NVCC_ENET GPIO ALT5 GPIO2_IO15 Input Keeper

ENET2_TX_CLK D17 NVCC_ENET GPIO ALT5 GPIO2_IO14 Input Keeper

ENET2_TX_DATA0 A15 NVCC_ENET GPIO ALT5 GPIO2_IO11 Input Keeper

ENET2_TX_DATA1 A16 NVCC_ENET GPIO ALT5 GPIO2_IO12 Input Keeper

ENET2_TX_EN B15 NVCC_ENET GPIO ALT5 GPIO2_IO13 Input Keeper

GPIO1_IO00 K13 NVCC_GPIO GPIO ALT5 GPIO1_IO00 Input Keeper

GPIO1_IO01 L15 NVCC_GPIO GPIO ALT5 GPIO1_IO01 Input Keeper

GPIO1_IO02 L14 NVCC_GPIO GPIO ALT5 GPIO1_IO02 Input Keeper

GPIO1_IO03 L17 NVCC_GPIO GPIO ALT5 GPIO1_IO03 Input Keeper

GPIO1_IO04 M16 NVCC_GPIO GPIO ALT5 GPIO1_IO04 Input Keeper

GPIO1_IO05 M17 NVCC_GPIO GPIO ALT5 GPIO1_IO05 Input Keeper


GPIO1_IO06 K17 NVCC_GPIO GPIO ALT5 GPIO1_IO06 Input Keeper

GPIO1_IO07 L16 NVCC_GPIO GPIO ALT5 GPIO1_IO07 Input Keeper

GPIO1_IO08 N17 NVCC_GPIO GPIO ALT5 GPIO1_IO08 Input Keeper

GPIO1_IO09 M15 NVCC_GPIO GPIO ALT5 GPIO1_IO09 Input Keeper

i.MX 6ULL Applications Processors for Industrial Products, Rev. 1.2, 11/2017
NXP Semiconductors 117
Package Information and Contact Assignments

Table 91. 14 x 14 mm Functional Contact Assignments (continued)

JTAG_MOD P15 NVCC_GPIO SJC ALT0 SJC_MOD Input 100 k


pull-up

JTAG_TCK M14 NVCC_GPIO SJC ALT0 SJC_TCK Input 47 k


pull-up

JTAG_TDI N16 NVCC_GPIO SJC ALT0 SJC_TDI Input 47 k


pull-up

JTAG_TDO N15 NVCC_GPIO SJC ALT0 SJC_TDO Output Keeper

JTAG_TMS P14 NVCC_GPIO SJC ALT0 SJC_TMS Input 47 k


pull-up

JTAG_TRST_B N14 NVCC_GPIO SJC ALT0 SJC_TRSTB Input 47 k


pull-up

LCD_CLK A8 NVCC_LCD GPIO ALT5 GPIO3_IO0 Input Keeper

LCD_DATA00 B9 NVCC_LCD GPIO ALT5 GPIO3_IO5 Input Keeper

LCD_DATA01 A9 NVCC_LCD GPIO ALT5 GPIO3_IO6 Input Keeper

LCD_DATA02 E10 NVCC_LCD GPIO ALT5 GPIO3_IO7 Input Keeper

LCD_DATA03 D10 NVCC_LCD GPIO ALT5 GPIO3_IO8 Input Keeper

LCD_DATA04 C10 NVCC_LCD GPIO ALT5 GPIO3_IO9 Input Keeper

LCD_DATA05 B10 NVCC_LCD GPIO ALT5 GPIO3_IO10 Input Keeper

LCD_DATA06 A10 NVCC_LCD GPIO ALT5 GPIO3_IO11 Input Keeper

LCD_DATA07 D11 NVCC_LCD GPIO ALT5 GPIO3_IO12 Input Keeper

LCD_DATA08 B11 NVCC_LCD GPIO ALT5 GPIO3_IO13 Input Keeper

LCD_DATA09 A11 NVCC_LCD GPIO ALT5 GPIO3_IO14 Input Keeper

LCD_DATA10 E12 NVCC_LCD GPIO ALT5 GPIO3_IO15 Input Keeper

LCD_DATA11 D12 NVCC_LCD GPIO ALT5 GPIO3_IO16 Input Keeper

LCD_DATA12 C12 NVCC_LCD GPIO ALT5 GPIO3_IO17 Input Keeper

LCD_DATA13 B12 NVCC_LCD GPIO ALT5 GPIO3_IO18 Input Keeper


LCD_DATA14 A12 NVCC_LCD GPIO ALT5 GPIO3_IO19 Input Keeper

LCD_DATA15 D13 NVCC_LCD GPIO ALT5 GPIO3_IO20 Input Keeper

LCD_DATA16 C13 NVCC_LCD GPIO ALT5 GPIO3_IO21 Input Keeper

LCD_DATA17 B13 NVCC_LCD GPIO ALT5 GPIO3_IO22 Input Keeper

LCD_DATA18 A13 NVCC_LCD GPIO ALT5 GPIO3_IO23 Input Keeper

LCD_DATA19 D14 NVCC_LCD GPIO ALT5 GPIO3_IO24 Input Keeper

LCD_DATA20 C14 NVCC_LCD GPIO ALT5 GPIO3_IO25 Input Keeper

LCD_DATA21 B14 NVCC_LCD GPIO ALT5 GPIO3_IO26 Input Keeper

LCD_DATA22 A14 NVCC_LCD GPIO ALT5 GPIO3_IO27 Input Keeper

LCD_DATA23 B16 NVCC_LCD GPIO ALT5 GPIO3_IO28 Input Keeper

i.MX 6ULL Applications Processors for Industrial Products, Rev. 1.2, 11/2017
118 NXP Semiconductors
Package Information and Contact Assignments

Table 91. 14 x 14 mm Functional Contact Assignments (continued)

LCD_ENABLE B8 NVCC_LCD GPIO ALT5 GPIO3_IO1 Input Keeper

LCD_HSYNC D9 NVCC_LCD GPIO ALT5 GPIO3_IO2 Input Keeper

LCD_RESET E9 NVCC_LCD GPIO ALT5 GPIO3_IO4 Input Keeper

LCD_VSYNC C9 NVCC_LCD GPIO ALT5 GPIO3_IO3 Input Keeper

NAND_ALE B4 NVCC_NAND GPIO ALT5 GPIO4_IO10 Input Keeper

NAND_CE0_B C5 NVCC_NAND GPIO ALT5 GPIO4_IO13 Input Keeper

NAND_CE1_B B5 NVCC_NAND GPIO ALT5 GPIO4_IO14 Input Keeper

NAND_CLE A4 NVCC_NAND GPIO ALT5 GPIO4_IO15 Input Keeper

NAND_DATA00 D7 NVCC_NAND GPIO ALT5 GPIO4_IO2 Input Keeper

NAND_DATA01 B7 NVCC_NAND GPIO ALT5 GPIO4_IO3 Input Keeper

NAND_DATA02 A7 NVCC_NAND GPIO ALT5 GPIO4_IO4 Input Keeper

NAND_DATA03 D6 NVCC_NAND GPIO ALT5 GPIO4_IO5 Input Keeper

NAND_DATA04 C6 NVCC_NAND GPIO ALT5 GPIO4_IO6 Input Keeper

NAND_DATA05 B6 NVCC_NAND GPIO ALT5 GPIO4_IO7 Input Keeper

NAND_DATA06 A6 NVCC_NAND GPIO ALT5 GPIO4_IO8 Input Keeper

NAND_DATA07 A5 NVCC_NAND GPIO ALT5 GPIO4_IO9 Input Keeper

NAND_DQS E6 NVCC_NAND GPIO ALT5 GPIO4_IO16 Input Keeper

NAND_RE_B D8 NVCC_NAND GPIO ALT5 GPIO4_IO0 Input Keeper

NAND_READY_B A3 NVCC_NAND GPIO ALT5 GPIO4_IO12 Input Keeper

NAND_WE_B C8 NVCC_NAND GPIO ALT5 GPIO4_IO1 Input Keeper

NAND_WP_B D5 NVCC_NAND GPIO ALT5 GPIO4_IO11 Input Keeper

ONOFF R8 VDD_SNVS_IN SRC ALT0 SRC_RESET_B Input 100 k


pull-up

POR_B P8 VDD_SNVS_IN SRC ALT0 SRC_POR_B Input 100 k


pull-up

RTC_XTALI T11 VDD_SNVS_CAP ANALO — RTC_XTALI — —


G

RTC_XTALO U11 VDD_SNVS_CAP ANALO — RTC_XTALO — —


G

SD1_CLK C1 NVCC_SD GPIO ALT5 GPIO2_IO17 Input Keeper

SD1_CMD C2 NVCC_SD GPIO ALT5 GPIO2_IO16 Input Keeper


SD1_DATA0 B3 NVCC_SD GPIO ALT5 GPIO2_IO18 Input Keeper

SD1_DATA1 B2 NVCC_SD GPIO ALT5 GPIO2_IO19 Input Keeper

SD1_DATA2 B1 NVCC_SD GPIO ALT5 GPIO2_IO20 Input Keeper

SD1_DATA3 A2 NVCC_SD GPIO ALT5 GPIO2_IO21 Input Keeper

i.MX 6ULL Applications Processors for Industrial Products, Rev. 1.2, 11/2017
NXP Semiconductors 119
Package Information and Contact Assignments

Table 91. 14 x 14 mm Functional Contact Assignments (continued)

SNVS_PMIC_ON_REQ T9 VDD_SNVS_IN GPIO ALT0 SNVS_PMIC_ON_REQ Output 100 k


pull-up

SNVS_TAMPER0 R10 VDD_SNVS_IN GPIO ALT5 GPIO5_IO00/SNVS_TAMPE Input Keeper/N


R01 ot
connecte
d1,2
SNVS_TAMPER1 R9 VDD_SNVS_IN GPIO ALT5 GPIO5_IO01/SNVS_TAMPE Input Keeper/N
R11 ot
connecte
d1,2
SNVS_TAMPER2 P11 VDD_SNVS_IN GPIO ALT5 GPIO5_IO02/SNVS_TAMPE Input Keeper/N
R21 ot
connecte
d1,2
SNVS_TAMPER3 P10 VDD_SNVS_IN GPIO ALT5 GPIO5_IO03/SNVS_TAMPE Input Keeper/N
R31 ot
connecte
d1,2
SNVS_TAMPER4 P9 VDD_SNVS_IN GPIO ALT5 GPIO5_IO04/SNVS_TAMPE Input Keeper/N
R41 ot
connecte
d1,2
SNVS_TAMPER5 N8 VDD_SNVS_IN GPIO ALT5 GPIO5_IO05/SNVS_TAMPE Input Keeper/N
R51 ot
connecte
d1,2
SNVS_TAMPER6 N11 VDD_SNVS_IN GPIO ALT5 GPIO5_IO06/SNVS_TAMPE Input Keeper/N
R61 ot
connecte
d1,2
SNVS_TAMPER7 N10 VDD_SNVS_IN GPIO ALT5 GPIO5_IO07/SNVS_TAMPE Input Keeper/N
R71 ot
connecte
d1,2
SNVS_TAMPER8 N9 VDD_SNVS_IN GPIO ALT5 GPIO5_IO08/SNVS_TAMPE Input Keeper/N
R81 ot
connecte
d1,2
SNVS_TAMPER9 R6 VDD_SNVS_IN GPIO ALT5 GPIO5_IO09/SNVS_TAMPE Input Keeper/N
R91 ot
connecte
d1,2
TEST_MODE N7 VDD_SNVS_IN TCU ALT0 TCU_TEST_MODE Input Keeper

UART1_CTS_B K15 NVCC_UART GPIO ALT5 GPIO1_IO18 Input Keeper

UART1_RTS_B J14 NVCC_UART GPIO ALT5 GPIO1_IO19 Input Keeper

UART1_RX_DATA K16 NVCC_UART GPIO ALT5 GPIO1_IO17 Input Keeper

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120 NXP Semiconductors
Package Information and Contact Assignments

Table 91. 14 x 14 mm Functional Contact Assignments (continued)

UART1_TX_DATA K14 NVCC_UART GPIO ALT5 GPIO1_IO16 Input Keeper

UART2_CTS_B J15 NVCC_UART GPIO ALT5 GPIO1_IO22 Input Keeper

UART2_RTS_B H14 NVCC_UART GPIO ALT5 GPIO1_IO23 Input Keeper

UART2_RX_DATA J16 NVCC_UART GPIO ALT5 GPIO1_IO21 Input Keeper

UART2_TX_DATA J17 NVCC_UART GPIO ALT5 GPIO1_IO20 Input Keeper

UART3_CTS_B H15 NVCC_UART GPIO ALT5 GPIO1_IO26 Input Keeper

UART3_RTS_B G14 NVCC_UART GPIO ALT5 GPIO1_IO27 Input Keeper

UART3_RX_DATA H16 NVCC_UART GPIO ALT5 GPIO1_IO25 Input Keeper

UART3_TX_DATA H17 NVCC_UART GPIO ALT5 GPIO1_IO24 Input Keeper

UART4_RX_DATA G16 NVCC_UART GPIO ALT5 GPIO1_IO29 Input Keeper

UART4_TX_DATA G17 NVCC_UART GPIO ALT5 GPIO1_IO28 Input Keeper

UART5_RX_DATA G13 NVCC_UART GPIO ALT5 GPIO1_IO31 Input Keeper

UART5_TX_DATA F17 NVCC_UART GPIO ALT5 GPIO1_IO30 Input Keeper

USB_OTG1_CHD_B U16 OPEN DRAIN GPIO — USB_OTG1_CHD_B — —

USB_OTG1_DN T15 VDD_USB_CAP ANALO — USB_OTG1_DN — —


G

USB_OTG1_DP U15 VDD_USB_CAP ANALO — USB_OTG1_DP — —


G

USB_OTG1_VBUS T12 USB_VBUS VBUS — USB_OTG1_VBUS — —


POWE
R

USB_OTG2_DN T13 VDD_USB_CAP ANALO — USB_OTG2_DN — —


G

USB_OTG2_DP U13 VDD_USB_CAP ANALO — USB_OTG2_DP — —


G

USB_OTG2_VBUS U12 USB_VBUS VBUS — USB_OTG2_VBUS — —


POWE
R

XTALI T16 NVCC_PLL ANALO — XTALI — —


G

XTALO T17 NVCC_PLL ANALO — XTALO — —


G
1 SNVS_TAMPER0 to SNVS_TAMPER9 can be configured as GPIO or tamper detection pin, it is depending on the fuse setting
TAMPER_PIN_DISABLE[1:0]. When the pad is configured as GPIO, the value is keeper out of reset.
2 SNVS_TAMPER0 to SNVS_TAMPER9 is input unconnected in the following conditions.

—SNVS low power mode when configured as GPIO


—Tamper functions are not used when configured as TAMPER detection pins
It is required to connect external 1M Ohm pull-up or pull-down resistors to the pad to avoid the undesired leakage under two
conditions above.

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NXP Semiconductors 121
122
6.1.3

G F E D C B A

DRAM_ADDR14 DRAM_ODT1 CSI_DATA03 CSI_DATA07 SD1_CLK SD1_DATA2 VSS 1

DRAM_ADDR06 CSI_VSYNC CSI_DATA02 CSI_DATA06 SD1_CMD SD1_DATA1 SD1_DATA3 2

VSS CSI_HSYNC CSI_DATA01 CSI_DATA05 VSS SD1_DATA0 NAND_READY_B 3

DRAM_RESET NVCC_CSI CSI_DATA00 CSI_DATA04 NVCC_SD1 NAND_ALE NAND_CLE 4

VSS CSI_MCLK CSI_PIXCLK NAND_WP_B NAND_CE0_B NAND_CE1_B NAND_DATA07 5

NVCC_DRAM VSS NAND_DQS NAND_DATA03 NAND_DATA04 NAND_DATA05 NAND_DATA06 6


Package Information and Contact Assignments

VSS VSS NVCC_NAND NAND_DATA00 VSS NAND_DATA01 NAND_DATA02 7

VDD_SOC_CAP VSS VSS NAND_RE_B NAND_WE_B LCD_ENABLE LCD_CLK 8

VDD_ARM_CAP VSS LCD_RESET LCD_HSYNC LCD_VSYNC LCD_DATA00 LCD_DATA01 9

VDD_ARM_CAP VSS LCD_DATA02 LCD_DATA03 LCD_DATA04 LCD_DATA05 LCD_DATA06 10


14 x 14 mm, 0.8 mm Pitch, Ball Map

VDD_ARM_CAP VSS VSS LCD_DATA07 VSS LCD_DATA08 LCD_DATA09 11

VSS VSS LCD_DATA10 LCD_DATA11 LCD_DATA12 LCD_DATA13 LCD_DATA14 12

UART5_RX_DATA NVCC_ENET NVCC_LCD LCD_DATA15 LCD_DATA16 LCD_DATA17 LCD_DATA18 13

UART3_RTS_B ENET1_TX_CLK ENET1_TX_DATA1 LCD_DATA19 LCD_DATA20 LCD_DATA21 LCD_DATA22 14


Table 92. 14 x 14 mm, 0.8 mm Pitch, Ball Map
Table 92 shows the 14 x 14 mm, 0.8 mm pitch ball map for the i.MX 6ULL.

VSS ENET1_TX_EN ENET1_TX_DATA0 ENET1_RX_ER VSS ENET2_TX_EN ENET2_TX_DATA0 15

UART4_RX_DATA ENET1_RX_DATA0 ENET1_RX_EN ENET2_RX_ER ENET2_RX_DATA1 LCD_DATA23 ENET2_TX_DATA1 16

i.MX 6ULL Applications Processors for Industrial Products, Rev. 1.2, 11/2017
UART4_TX_DATA UART5_TX_DATA ENET1_RX_DATA1 ENET2_TX_CLK ENET2_RX_DATA0 ENET2_RX_EN VSS 17

G F E D C B A

NXP Semiconductors
P N M L K J H

NXP Semiconductors
DRAM_SDCLK0_P DRAM_ODT0 DRAM_SDBA0 DRAM_ADDR05 DRAM_ADDR02 DRAM_SDWE_B DRAM_SDBA1

DRAM_SDCLK0_N DRAM_CS0_B DRAM_ADDR03 DRAM_ADDR09 DRAM_SDBA2 DRAM_CAS_B DRAM_ADDR01

DRAM_DATA13 VSS DRAM_SDCKE0 VSS DRAM_ADDR11 DRAM_SDCKE1 DRAM_ADDR13

DRAM_VREF DRAM_ZQPAD DRAM_ADDR10 DRAM_ADDR12 DRAM_ADDR04 DRAM_ADDR08 DRAM_ADDR07

DRAM_DATA12 VSS DRAM_RAS_B DRAM_ADDR00 DRAM_ADDR15 VSS DRAM_CS1_B

DRAM_SDQS0_P NVCC_DRAM_2P5 NVCC_DRAM NVCC_DRAM NVCC_DRAM NVCC_DRAM NVCC_DRAM

DRAM_SDQS0_N TEST_MODE VSS VSS VSS VSS VSS

POR_B SNVS_TAMPER5 VSS VDD_SOC_CAP VDD_SOC_CAP VDD_SOC_CAP VDD_SOC_CAP

SNVS_TAMPER4 SNVS_TAMPER8 VSS VDD_SOC_CAP VDD_SOC_IN VDD_SOC_IN VDD_SOC_IN

SNVS_TAMPER3 SNVS_TAMPER7 VSS VDD_SOC_CAP VDD_SOC_IN VDD_SOC_IN VDD_SOC_IN

SNVS_TAMPER2 SNVS_TAMPER6 VSS VDD_SOC_CAP VDD_SOC_CAP VDD_SOC_CAP VDD_ARM_CAP

VDD_SNVS_IN VDD_SNVS_CAP NGND_KEL0 VSS VSS VSS VSS

NVCC_PLL VDD_HIGH_IN ADC_VREFH VDDA_ADC_3P3 GPIO1_IO00 NVCC_GPIO NVCC_UART

JTAG_TMS JTAG_TRST_B JTAG_TCK GPIO1_IO02 UART1_TX_DATA UART1_RTS_B UART2_RTS_B

JTAG_MOD JTAG_TDO GPIO1_IO09 GPIO1_IO01 UART1_CTS_B UART2_CTS_B UART3_CTS_B


Table 92. 14 x 14 mm, 0.8 mm Pitch, Ball Map (continued)

CCM_CLK1_N JTAG_TDI GPIO1_IO04 GPIO1_IO07 UART1_RX_DATA UART2_RX_DATA UART3_RX_DATA

i.MX 6ULL Applications Processors for Industrial Products, Rev. 1.2, 11/2017
CCM_CLK1_P GPIO1_IO08 GPIO1_IO05 GPIO1_IO03 GPIO1_IO06 UART2_TX_DATA UART3_TX_DATA

P N M L K J H

123
Package Information and Contact Assignments
124
6.2

6.2.1
U T R

1 VSS DRAM_SDQS1_P DRAM_DATA15

2 DRAM_DATA08 DRAM_SDQS1_N DRAM_DATA14

3 DRAM_DATA09 DRAM_DQM1 VSS

4 DRAM_DATA07 DRAM_DATA00 DRAM_DATA11

5 DRAM_DATA10 DRAM_DATA06 VSS

6 DRAM_DATA01 DRAM_DATA02 SNVS_TAMPER9


Package Information and Contact Assignments

7 DRAM_DATA03 DRAM_DQM0 VSS

8 DRAM_DATA04 DRAM_DATA05 ONOFF

9 CCM_PMIC_STBY_REQ SNVS_PMIC_ON_REQ SNVS_TAMPER1

9 x 9 mm Package Information
10 BOOT_MODE1 BOOT_MODE0 SNVS_TAMPER0

9 x 9 mm, 0.5 mm Pitch, Ball Matrix


11 RTC_XTALO RTC_XTALI VSS

12 USB_OTG2_VBUS USB_OTG1_VBUS VDD_USB_CAP

13 USB_OTG2_DP USB_OTG2_DN GPANAIO

14 VSS VSS VDD_HIGH_CAP

15 USB_OTG1_DP USB_OTG1_DN VDD_HIGH_CAP

Figure 71 shows the top, bottom, and side views of the 9 x 9 mm BGA package.
Table 92. 14 x 14 mm, 0.8 mm Pitch, Ball Map (continued)

16 USB_OTG1_CHD_B XTALI VSS

i.MX 6ULL Applications Processors for Industrial Products, Rev. 1.2, 11/2017
17 VSS XTALO VSS

U T R

NXP Semiconductors
Package Information and Contact Assignments

Figure 71. 9 x 9 mm BGA, Case x Package Top, Bottom, and Side Views

i.MX 6ULL Applications Processors for Industrial Products, Rev. 1.2, 11/2017
NXP Semiconductors 125
Package Information and Contact Assignments

6.2.2 9 x 9 mm Supplies Contact Assignments and Functional Contact


Assignments
Table 93 shows the device connection list for ground, sense, and reference contact signals.
Table 93. 9 x 9 mm Supplies Contact Assignment

Supply Rail Name Ball(s) Position(s) Remark

ADC_VREFH N13 —

DRAM_VREF T1 —

GPANAIO T11 —

NGND_KEL0 M10 —

NVCC_CSI E5 —

NVCC_DRAM G5, L5, M5, N6 —

NVCC_DRAM_2P5 K6 —

NVCC_ENET G13 —

NVCC_GPIO M13 —

NVCC_LCD E13 —

NVCC_NAND E11 —

NVCC_PLL T13 —

NVCC_SD1 E7 —

NVCC_UART L13 —

VDD_ARM_CAP G9, G10, G11, H9, H10, H11 —

VDD_HIGH_CAP U11 —

VDD_HIGH_IN U15 —

VDD_SNVS_CAP N12 —
VDD_SNVS_IN P12 —

VDD_SOC_CAP G7, G8, H7, H8, J7, J8, K7, K8, L7, L8 —

VDD_SOC_IN J9, J10, J11, K9, K10, K11, L9, L10, L11 —
VDD_USB_CAP N11 —

VDDA_ADC_3P3 T17 —

VSS A2, A7, A12, A17, B1, C15, F1, F3, F8, F10, F17, H6, H12, J3, J15, K12, M1, M3, —
M8, M17, R3, R9, R12, R15, U1, U6, U13, U17

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126 NXP Semiconductors
Package Information and Contact Assignments

Table 94 shows an alpha-sorted list of functional contact assignments for the 9 x 9 mm package.
Table 94. 9 x 9 mm Functional Contact Assignments

Out of Reset Condition


9x9 Power Ball
Ball Name
Ball Group Type Default Default Input/
Value
Mode Function Output

BOOT_MODE0 T8 VDD_SNVS_IN GPIO ALT5 GPIO5_IO10 Input 100 k


pull-down

BOOT_MODE1 U8 VDD_SNVS_IN GPIO ALT5 GPIO5_IO11 Input 100 k


pull-down

CCM_CLK1_N U16 VDD_HIGH_CAP LVDS — CCM_CLK1_N — —

CCM_CLK1_P T16 VDD_HIGH_CAP LVDS — CCM_CLK1_P — —

CCM_PMIC_STBY_REQ U7 VDD_SNVS_IN GPIO ALT0 CCM_PMIC_VSTBY_REQ Output —

CSI_DATA00 C3 NVCC_CSI GPIO ALT5 GPIO4_IO21 Input Keeper

CSI_DATA01 D4 NVCC_CSI GPIO ALT5 GPIO4_IO22 Input Keeper

CSI_DATA02 B2 NVCC_CSI GPIO ALT5 GPIO4_IO23 Input Keeper

CSI_DATA03 D1 NVCC_CSI GPIO ALT5 GPIO4_IO24 Input Keeper

CSI_DATA04 C4 NVCC_CSI GPIO ALT5 GPIO4_IO25 Input Keeper

CSI_DATA05 B3 NVCC_CSI GPIO ALT5 GPIO4_IO26 Input Keeper

CSI_DATA06 A3 NVCC_CSI GPIO ALT5 GPIO4_IO27 Input Keeper

CSI_DATA07 C2 NVCC_CSI GPIO ALT5 GPIO4_IO28 Input Keeper

CSI_HSYNC D2 NVCC_CSI GPIO ALT5 GPIO4_IO20 Input Keeper

CSI_MCLK C1 NVCC_CSI GPIO ALT5 GPIO4_IO17 Input Keeper

CSI_PIXCLK D5 NVCC_CSI GPIO ALT5 GPIO4_IO18 Input Keeper

CSI_VSYNC D3 NVCC_CSI GPIO ALT5 GPIO4_IO19 Input Keeper

DRAM_ADDR00 G1 NVCC_DRAM DDR ALT0 DRAM_ADDR00 Output 100 k


pull-up

DRAM_ADDR01 G2 NVCC_DRAM DDR ALT0 DRAM_ADDR01 Output 100 k


pull-up

DRAM_ADDR02 H1 NVCC_DRAM DDR ALT0 DRAM_ADDR02 Output 100 k


pull-up

DRAM_ADDR03 J2 NVCC_DRAM DDR ALT0 DRAM_ADDR03 Output 100 k


pull-up

DRAM_ADDR04 M4 NVCC_DRAM DDR ALT0 DRAM_ADDR04 Output 100 k


pull-up

DRAM_ADDR05 H2 NVCC_DRAM DDR ALT0 DRAM_ADDR05 Output 100 k


pull-up

DRAM_ADDR06 E4 NVCC_DRAM DDR ALT0 DRAM_ADDR06 Output 100 k


pull-up

i.MX 6ULL Applications Processors for Industrial Products, Rev. 1.2, 11/2017
NXP Semiconductors 127
Package Information and Contact Assignments

Table 94. 9 x 9 mm Functional Contact Assignments (continued)

DRAM_ADDR07 J4 NVCC_DRAM DDR ALT0 DRAM_ADDR07 Output 100 k


pull-up

DRAM_ADDR08 J5 NVCC_DRAM DDR ALT0 DRAM_ADDR08 Output 100 k


pull-up

DRAM_ADDR09 J1 NVCC_DRAM DDR ALT0 DRAM_ADDR09 Output 100 k


pull-up

DRAM_ADDR10 M2 NVCC_DRAM DDR ALT0 DRAM_ADDR10 Output 100 k


pull-up

DRAM_ADDR11 K5 NVCC_DRAM DDR ALT0 DRAM_ADDR11 Output 100 k


pull-up

DRAM_ADDR12 L3 NVCC_DRAM DDR ALT0 DRAM_ADDR12 Output 100 k


pull-up

DRAM_ADDR13 H4 NVCC_DRAM DDR ALT0 DRAM_ADDR13 Output 100 k


pull-up

DRAM_ADDR14 E3 NVCC_DRAM DDR ALT0 DRAM_ADDR14 Output 100 k


pull-up

DRAM_ADDR15 E2 NVCC_DRAM DDR ALT0 DRAM_ADDR15 Output 100 k


pull-up
DRAM_CAS_B G4 NVCC_DRAM DDR ALT0 DRAM_CAS_B Output 100 k
pull-up

DRAM_CS0_B L1 NVCC_DRAM DDR ALT0 DRAM_CS0_B Output 100 k


pull-up

DRAM_CS1_B H5 NVCC_DRAM DDR ALT0 DRAM_CS1_B Output 100 k


pull-up

DRAM_DATA00 T3 NVCC_DRAM DDR ALT0 DRAM_DATA00 Input 100 k


pull-up

DRAM_DATA01 N5 NVCC_DRAM DDR ALT0 DRAM_DATA01 Input 100 k


pull-up

DRAM_DATA02 T4 NVCC_DRAM DDR ALT0 DRAM_DATA02 Input 100 k


pull-up

DRAM_DATA03 T5 NVCC_DRAM DDR ALT0 DRAM_DATA03 Input 100 k


pull-up

DRAM_DATA04 U5 NVCC_DRAM DDR ALT0 DRAM_DATA04 Input 100 k


pull-up

DRAM_DATA05 T6 NVCC_DRAM DDR ALT0 DRAM_DATA05 Input 100 k


pull-up

DRAM_DATA06 R4 NVCC_DRAM DDR ALT0 DRAM_DATA06 Input 100 k


pull-up

DRAM_DATA07 U3 NVCC_DRAM DDR ALT0 DRAM_DATA07 Input 100 k


pull-up

DRAM_DATA08 P1 NVCC_DRAM DDR ALT0 DRAM_DATA08 Input 100 k


pull-up

i.MX 6ULL Applications Processors for Industrial Products, Rev. 1.2, 11/2017
128 NXP Semiconductors
Package Information and Contact Assignments

Table 94. 9 x 9 mm Functional Contact Assignments (continued)

DRAM_DATA09 U2 NVCC_DRAM DDR ALT0 DRAM_DATA09 Input 100 k


pull-up

DRAM_DATA10 P3 NVCC_DRAM DDR ALT0 DRAM_DATA10 Input 100 k


pull-up

DRAM_DATA11 R2 NVCC_DRAM DDR ALT0 DRAM_DATA11 Input 100 k


pull-up

DRAM_DATA12 P4 NVCC_DRAM DDR ALT0 DRAM_DATA12 Input 100 k


pull-up

DRAM_DATA13 N2 NVCC_DRAM DDR ALT0 DRAM_DATA13 Input 100 k


pull-up

DRAM_DATA14 N1 NVCC_DRAM DDR ALT0 DRAM_DATA14 Input 100 k


pull-up

DRAM_DATA15 P2 NVCC_DRAM DDR ALT0 DRAM_DATA15 Input 100 k


pull-up

DRAM_DQM0 U4 NVCC_DRAM DDR ALT0 DRAM_DQM0 Output 100 k


pull-up

DRAM_DQM1 R1 NVCC_DRAM DDR ALT0 DRAM_DQM1 Output 100 k


pull-up
DRAM_ODT0 K2 NVCC_DRAM DDR ALT0 DRAM_ODT0 Output 100 k
pull-down

DRAM_ODT1 E1 NVCC_DRAM DDR ALT0 DRAM_ODT1 Output 100 k


pull-down

DRAM_RAS_B L4 NVCC_DRAM DDR ALT0 DRAM_RAS_B Output 100 k


pull-up

DRAM_RESET F2 NVCC_DRAM DDR ALT0 DRAM_RESET Output 100 k


pull-down

DRAM_SDBA0 H3 NVCC_DRAM DDR ALT0 DRAM_SDBA0 Output 100 k


pull-up

DRAM_SDBA1 F5 NVCC_DRAM DDR ALT0 DRAM_SDBA1 Output 100 k


pull-up

DRAM_SDBA2 G3 NVCC_DRAM DDR ALT0 DRAM_SDBA2 Output 100 k


pull-up

DRAM_SDCKE0 L2 NVCC_DRAM DDR ALT0 DRAM_SDCKE0 Output 100 k


pull-down

DRAM_SDCKE1 K1 NVCC_DRAM DDR ALT0 DRAM_SDCKE1 Output 100 k


pull-down

DRAM_SDCLK0_N K4 NVCC_DRAM DDRC ALT0 DRAM_SDCLK0_N Input 100 k


LK pull-up

DRAM_SDCLK0_P K3 NVCC_DRAM DDRC ALT0 DRAM_SDCLK0_P Input 100 k


LK pull-up

DRAM_SDQS0_N R5 NVCC_DRAM DDRC ALT0 DRAM_SDQS0_N Input 100 k


LK pull-down

i.MX 6ULL Applications Processors for Industrial Products, Rev. 1.2, 11/2017
NXP Semiconductors 129
Package Information and Contact Assignments

Table 94. 9 x 9 mm Functional Contact Assignments (continued)

DRAM_SDQS0_P P5 NVCC_DRAM DDRC ALT0 DRAM_SDQS0_P Input 100 k


LK pull-down

DRAM_SDQS1_N N4 NVCC_DRAM DDRC ALT0 DRAM_SDQS1_P Input 100 k


LK pull-down

DRAM_SDQS1_P N3 NVCC_DRAM DDRC ALT0 DRAM_SDQS1_N Input 100 k


LK pull-down

DRAM_SDWE_B F4 NVCC_DRAM DDR ALT0 DRAM_SDWE_B Output 100 k


pull-up

DRAM_ZQPAD T2 NVCC_DRAM GPIO — DRAM_ZQPAD Input Keeper

ENET1_RX_DATA0 G17 NVCC_ENET GPIO ALT5 GPIO2_IO0 Input Keeper


ENET1_RX_DATA1 F16 NVCC_ENET GPIO ALT5 GPIO2_IO1 Input Keeper

ENET1_RX_EN G16 NVCC_ENET GPIO ALT5 GPIO2_IO2 Input Keeper

ENET1_RX_ER G14 NVCC_ENET GPIO ALT5 GPIO2_IO7 Input Keeper

ENET1_TX_CLK G15 NVCC_ENET GPIO ALT5 GPIO2_IO6 Input Keeper

ENET1_TX_DATA0 E16 NVCC_ENET GPIO ALT5 GPIO2_IO3 Input Keeper

ENET1_TX_DATA1 F13 NVCC_ENET GPIO ALT5 GPIO2_IO4 Input Keeper

ENET1_TX_EN F15 NVCC_ENET GPIO ALT5 GPIO2_IO5 Input Keeper

ENET2_RX_DATA0 E17 NVCC_ENET GPIO ALT5 GPIO2_IO8 Input Keeper

ENET2_RX_DATA1 D17 NVCC_ENET GPIO ALT5 GPIO2_IO9 Input Keeper

ENET2_RX_EN D16 NVCC_ENET GPIO ALT5 GPIO2_IO10 Input Keeper

ENET2_RX_ER H13 NVCC_ENET GPIO ALT5 GPIO2_IO15 Input Keeper

ENET2_TX_CLK H14 NVCC_ENET GPIO ALT5 GPIO2_IO14 Input Keeper

ENET2_TX_DATA0 E14 NVCC_ENET GPIO ALT5 GPIO2_IO11 Input Keeper

ENET2_TX_DATA1 F14 NVCC_ENET GPIO ALT5 GPIO2_IO12 Input Keeper

ENET2_TX_EN E15 NVCC_ENET GPIO ALT5 GPIO2_IO13 Input Keeper

GPIO1_IO00 M14 NVCC_GPIO GPIO ALT5 GPIO1_IO00 Input Keeper

GPIO1_IO01 M15 NVCC_GPIO GPIO ALT5 GPIO1_IO01 Input Keeper

GPIO1_IO02 M16 NVCC_GPIO GPIO ALT5 GPIO1_IO02 Input Keeper

GPIO1_IO03 N16 NVCC_GPIO GPIO ALT5 GPIO1_IO03 Input Keeper

GPIO1_IO04 N17 NVCC_GPIO GPIO ALT5 GPIO1_IO04 Input Keeper

GPIO1_IO05 P15 NVCC_GPIO GPIO ALT5 GPIO1_IO05 Input Keeper


GPIO1_IO06 N15 NVCC_GPIO GPIO ALT5 GPIO1_IO06 Input Keeper

GPIO1_IO07 N14 NVCC_GPIO GPIO ALT5 GPIO1_IO07 Input Keeper

GPIO1_IO08 P14 NVCC_GPIO GPIO ALT5 GPIO1_IO08 Input Keeper

GPIO1_IO09 P16 NVCC_GPIO GPIO ALT5 GPIO1_IO09 Input Keeper

i.MX 6ULL Applications Processors for Industrial Products, Rev. 1.2, 11/2017
130 NXP Semiconductors
Package Information and Contact Assignments

Table 94. 9 x 9 mm Functional Contact Assignments (continued)

JTAG_MOD R13 NVCC_GPIO SJC ALT0 SJC_MOD Input 100 k


pull-up

JTAG_TCK R17 NVCC_GPIO SJC ALT0 SJC_TCK Input 47 k


pull-up

JTAG_TDI P17 NVCC_GPIO SJC ALT0 SJC_TDI Input 47 k


pull-up

JTAG_TDO R16 NVCC_GPIO SJC ALT0 SJC_TDO Output Keeper

JTAG_TMS R14 NVCC_GPIO SJC ALT0 SJC_TMS Input 47 k


pull-up

JTAG_TRST_B P13 NVCC_GPIO SJC ALT0 SJC_TRSTB Input 47 k


pull-up

LCD_CLK C11 NVCC_LCD GPIO ALT5 GPIO3_IO0 Input Keeper

LCD_DATA00 D11 NVCC_LCD GPIO ALT5 GPIO3_IO5 Input Keeper

LCD_DATA01 B12 NVCC_LCD GPIO ALT5 GPIO3_IO6 Input Keeper

LCD_DATA02 D10 NVCC_LCD GPIO ALT5 GPIO3_IO7 Input Keeper

LCD_DATA03 B11 NVCC_LCD GPIO ALT5 GPIO3_IO8 Input Keeper

LCD_DATA04 A11 NVCC_LCD GPIO ALT5 GPIO3_IO9 Input Keeper

LCD_DATA05 D12 NVCC_LCD GPIO ALT5 GPIO3_IO10 Input Keeper

LCD_DATA06 D13 NVCC_LCD GPIO ALT5 GPIO3_IO11 Input Keeper

LCD_DATA07 C12 NVCC_LCD GPIO ALT5 GPIO3_IO12 Input Keeper

LCD_DATA08 B13 NVCC_LCD GPIO ALT5 GPIO3_IO13 Input Keeper

LCD_DATA09 A13 NVCC_LCD GPIO ALT5 GPIO3_IO14 Input Keeper

LCD_DATA10 D14 NVCC_LCD GPIO ALT5 GPIO3_IO15 Input Keeper

LCD_DATA11 C13 NVCC_LCD GPIO ALT5 GPIO3_IO16 Input Keeper

LCD_DATA12 C14 NVCC_LCD GPIO ALT5 GPIO3_IO17 Input Keeper

LCD_DATA13 A14 NVCC_LCD GPIO ALT5 GPIO3_IO18 Input Keeper


LCD_DATA14 B14 NVCC_LCD GPIO ALT5 GPIO3_IO19 Input Keeper

LCD_DATA15 A16 NVCC_LCD GPIO ALT5 GPIO3_IO20 Input Keeper

LCD_DATA16 A15 NVCC_LCD GPIO ALT5 GPIO3_IO21 Input Keeper

LCD_DATA17 D15 NVCC_LCD GPIO ALT5 GPIO3_IO22 Input Keeper

LCD_DATA18 B15 NVCC_LCD GPIO ALT5 GPIO3_IO23 Input Keeper

LCD_DATA19 E12 NVCC_LCD GPIO ALT5 GPIO3_IO24 Input Keeper

LCD_DATA20 B17 NVCC_LCD GPIO ALT5 GPIO3_IO25 Input Keeper

LCD_DATA21 C16 NVCC_LCD GPIO ALT5 GPIO3_IO26 Input Keeper

LCD_DATA22 B16 NVCC_LCD GPIO ALT5 GPIO3_IO27 Input Keeper

LCD_DATA23 C17 NVCC_LCD GPIO ALT5 GPIO3_IO28 Input Keeper

i.MX 6ULL Applications Processors for Industrial Products, Rev. 1.2, 11/2017
NXP Semiconductors 131
Package Information and Contact Assignments

Table 94. 9 x 9 mm Functional Contact Assignments (continued)

LCD_ENABLE A10 NVCC_LCD GPIO ALT5 GPIO3_IO1 Input Keeper

LCD_HSYNC B10 NVCC_LCD GPIO ALT5 GPIO3_IO2 Input Keeper

LCD_RESET E10 NVCC_LCD GPIO ALT5 GPIO3_IO4 Input Keeper

LCD_VSYNC C10 NVCC_LCD GPIO ALT5 GPIO3_IO3 Input Keeper

NAND_ALE D8 NVCC_NAND GPIO ALT5 GPIO4_IO10 Input Keeper

NAND_CE0_B E8 NVCC_NAND GPIO ALT5 GPIO4_IO13 Input Keeper

NAND_CE1_B B6 NVCC_NAND GPIO ALT5 GPIO4_IO14 Input Keeper

NAND_CLE B7 NVCC_NAND GPIO ALT5 GPIO4_IO15 Input Keeper

NAND_DATA00 D7 NVCC_NAND GPIO ALT5 GPIO4_IO2 Input Keeper

NAND_DATA01 A9 NVCC_NAND GPIO ALT5 GPIO4_IO3 Input Keeper

NAND_DATA02 C9 NVCC_NAND GPIO ALT5 GPIO4_IO4 Input Keeper

NAND_DATA03 C7 NVCC_NAND GPIO ALT5 GPIO4_IO5 Input Keeper

NAND_DATA04 C8 NVCC_NAND GPIO ALT5 GPIO4_IO6 Input Keeper

NAND_DATA05 A6 NVCC_NAND GPIO ALT5 GPIO4_IO7 Input Keeper

NAND_DATA06 B9 NVCC_NAND GPIO ALT5 GPIO4_IO8 Input Keeper

NAND_DATA07 B8 NVCC_NAND GPIO ALT5 GPIO4_IO9 Input Keeper

NAND_DQS E6 NVCC_NAND GPIO ALT5 GPIO4_IO16 Input Keeper

NAND_RE_B D9 NVCC_NAND GPIO ALT5 GPIO4_IO0 Input Keeper

NAND_READY_B E9 NVCC_NAND GPIO ALT5 GPIO4_IO12 Input Keeper

NAND_WE_B A8 NVCC_NAND GPIO ALT5 GPIO4_IO1 Input Keeper

NAND_WP_B D6 NVCC_NAND GPIO ALT5 GPIO4_IO11 Input Keeper

ONOFF R6 VDD_SNVS_IN SRC ALT0 SRC_RESET_B Input 100 k


pull-up

POR_B R10 VDD_SNVS_IN SRC ALT0 SRC_POR_B Input 100 k


pull-up

RTC_XTALI T12 VDD_SNVS_CA ANAL — RTC_XTALI — —


P OG

RTC_XTALO U12 VDD_SNVS_CA ANAL — RTC_XTALO — —


P OG

SD1_CLK C5 NVCC_SD GPIO ALT5 GPIO2_IO17 Input Keeper

SD1_CMD C6 NVCC_SD GPIO ALT5 GPIO2_IO16 Input Keeper


SD1_DATA0 A5 NVCC_SD GPIO ALT5 GPIO2_IO18 Input Keeper

SD1_DATA1 A4 NVCC_SD GPIO ALT5 GPIO2_IO19 Input Keeper

SD1_DATA2 B5 NVCC_SD GPIO ALT5 GPIO2_IO20 Input Keeper

SD1_DATA3 B4 NVCC_SD GPIO ALT5 GPIO2_IO21 Input Keeper

i.MX 6ULL Applications Processors for Industrial Products, Rev. 1.2, 11/2017
132 NXP Semiconductors
Package Information and Contact Assignments

Table 94. 9 x 9 mm Functional Contact Assignments (continued)

SNVS_PMIC_ON_REQ T7 VDD_SNVS_IN GPIO ALT0 SNVS_PMIC_ON_REQ Output 100 k


pull-up

SNVS_TAMPER0 R8 VDD_SNVS_IN GPIO ALT5 GPIO5_IO00/SNVS_TAMPE Input Keeper1,


R01 2

SNVS_TAMPER1 P6 VDD_SNVS_IN GPIO ALT5 GPIO5_IO01/SNVS_TAMPE Input Keeper/N


R11 ot
connecte
d1,2
SNVS_TAMPER2 N10 VDD_SNVS_IN GPIO ALT5 GPIO5_IO02/SNVS_TAMPE Input Keeper/N
R21 ot
connecte
d1,2
SNVS_TAMPER3 P10 VDD_SNVS_IN GPIO ALT5 GPIO5_IO03/SNVS_TAMPE Input Keeper/N
R31 ot
connecte
d1,2
SNVS_TAMPER4 P7 VDD_SNVS_IN GPIO ALT5 GPIO5_IO04/SNVS_TAMPE Input Keeper/N
R41 ot
connecte
d1,2
SNVS_TAMPER5 P8 VDD_SNVS_IN GPIO ALT5 GPIO5_IO05/SNVS_TAMPE Input Keeper/N
R51 ot
connecte
d1,2
SNVS_TAMPER6 R7 VDD_SNVS_IN GPIO ALT5 GPIO5_IO06/SNVS_TAMPE Input Keeper/N
R61 ot
connecte
d1,2
SNVS_TAMPER7 N9 VDD_SNVS_IN GPIO ALT5 GPIO5_IO07/SNVS_TAMPE Input Keeper/N
R71 ot
connecte
d1,2
SNVS_TAMPER8 N8 VDD_SNVS_IN GPIO ALT5 GPIO5_IO08/SNVS_TAMPE Input Keeper/N
R81 ot
connecte
d1,2
SNVS_TAMPER9 P9 VDD_SNVS_IN GPIO ALT5 GPIO5_IO09/SNVS_TAMPE Input Keeper/N
R91 ot
connecte
d1,2
TEST_MODE N7 VDD_SNVS_IN TCU ALT0 TCU_TEST_MODE Input Keeper

UART1_CTS_B L14 NVCC_UART GPIO ALT5 GPIO1_IO18 Input Keeper

UART1_RTS_B K14 NVCC_UART GPIO ALT5 GPIO1_IO19 Input Keeper

UART1_RX_DATA L17 NVCC_UART GPIO ALT5 GPIO1_IO17 Input Keeper

UART1_TX_DATA L15 NVCC_UART GPIO ALT5 GPIO1_IO16 Input Keeper

i.MX 6ULL Applications Processors for Industrial Products, Rev. 1.2, 11/2017
NXP Semiconductors 133
Package Information and Contact Assignments

Table 94. 9 x 9 mm Functional Contact Assignments (continued)

UART2_CTS_B J17 NVCC_UART GPIO ALT5 GPIO1_IO22 Input Keeper

UART2_RTS_B J14 NVCC_UART GPIO ALT5 GPIO1_IO23 Input Keeper

UART2_RX_DATA K16 NVCC_UART GPIO ALT5 GPIO1_IO21 Input Keeper

UART2_TX_DATA L16 NVCC_UART GPIO ALT5 GPIO1_IO20 Input Keeper

UART3_CTS_B H16 NVCC_UART GPIO ALT5 GPIO1_IO26 Input Keeper

UART3_RTS_B H15 NVCC_UART GPIO ALT5 GPIO1_IO27 Input Keeper

UART3_RX_DATA K15 NVCC_UART GPIO ALT5 GPIO1_IO25 Input Keeper

UART3_TX_DATA K17 NVCC_UART GPIO ALT5 GPIO1_IO24 Input Keeper

UART4_RX_DATA H17 NVCC_UART GPIO ALT5 GPIO1_IO29 Input Keeper

UART4_TX_DATA J16 NVCC_UART GPIO ALT5 GPIO1_IO28 Input Keeper

UART5_RX_DATA J13 NVCC_UART GPIO ALT5 GPIO1_IO31 Input Keeper

UART5_TX_DATA K13 NVCC_UART GPIO ALT5 GPIO1_IO30 Input Keeper

USB_OTG1_CHD_B T15 OPEN DRAIN GPIO — USB_OTG1_CHD_B — —

USB_OTG1_DN R11 VDD_USB_CAP ANAL — USB_OTG1_DN — —


OG

USB_OTG1_DP P11 VDD_USB_CAP ANAL — USB_OTG1_DP — —


OG

USB_OTG1_VBUS T9 USB_VBUS VBUS — USB_OTG1_VBUS — —


POWE
R

USB_OTG2_DN T10 VDD_USB_CAP ANAL — USB_OTG2_DN — —


OG

USB_OTG2_DP U10 VDD_USB_CAP ANAL — USB_OTG2_DP — —


OG

USB_OTG2_VBUS U9 USB_VBUS VBUS — USB_OTG2_VBUS — —


POWE
R

XTALI T14 NVCC_PLL ANAL — XTALI — —


OG

XTALO U14 NVCC_PLL ANAL — XTALO — —


OG
1 SNVS_TAMPER0 to SNVS_TAMPER9 can be configured as GPIO or tamper detection pin, it is depending on the fuse setting
TAMPER_PIN_DISABLE[1:0]. When the pad is configured as GPIO, the value is keeper out of reset.
2 SNVS_TAMPER0 to SNVS_TAMPER9 is input unconnected in the following conditions.

—SNVS low power mode when configured as GPIO


—Tamper functions are not used when configured as TAMPER detection pins
It is required to connect external 1M Ohm pull-up or pull-down resistors to the pad to avoid the undesired leakage under two
conditions above.

i.MX 6ULL Applications Processors for Industrial Products, Rev. 1.2, 11/2017
134 NXP Semiconductors
6.2.3

G F E D C B A

NXP Semiconductors
DRAM_ADDR00 VSS DRAM_ODT1 CSI_DATA03 CSI_MCLK VSS 1

DRAM_ADDR01 DRAM_RESET DRAM_ADDR15 CSI_HSYNC CSI_DATA07 CSI_DATA02 VSS 2

DRAM_SDBA2 VSS DRAM_ADDR14 CSI_VSYNC CSI_DATA00 CSI_DATA05 CSI_DATA06 3

DRAM_CAS_B DRAM_SDWE_B DRAM_ADDR06 CSI_DATA01 CSI_DATA04 SD1_DATA3 SD1_DATA1 4

NVCC_DRAM DRAM_SDBA1 NVCC_CSI CSI_PIXCLK SD1_CLK SD1_DATA2 SD1_DATA0 5

NAND_DQS NAND_WP_B SD1_CMD NAND_CE1_B NAND_DATA05 6

VDD_SOC_CAP NVCC_SD1 NAND_DATA00 NAND_DATA03 NAND_CLE VSS 7

VDD_SOC_CAP VSS NAND_CE0_B NAND_ALE NAND_DATA04 NAND_DATA07 NAND_WEB 8

VDD_ARM_CAP NAND_READY_B NAND_RE_B NAND_DATA02 NAND_DATA06 NAND_DATA01 9


9 x 9 mm, 0.5 mm Pitch, Ball Map

VDD_ARM_CAP VSS LCD_RESET LCD_DATA02 LCD_VSYNC LCD_HSYNC LCD_ENABLE 10

VDD_ARM_CAP NVCC_NAND LCD_DATA00 LCD_CLK LCD_DATA03 LCD_DATA04 11

LCD_DATA19 LCD_DATA05 LCD_DATA07 LCD_DATA01 VSS 12

NVCC_ENET ENET1_TX_DATA1 NVCC_LCD LCD_DATA06 LCD_DATA11 LCD_DATA08 LCD_DATA09 13


Table 95. 9x9 mm, 0.5 mm Pitch, Ball Map
Table 95 shows the 9 x 9 mm, 0.5 mm pitch ball map for the i.MX 6ULL.

ENET1_RX_ER ENET2_TX_DATA1 ENET2_TX_DATA0 LCD_DATA10 LCD_DATA12 LCD_DATA14 LCD_DATA13 14

ENET1_TX_CLK ENET1_TX_EN ENET2_TX_EN LCD_DATA17 VSS LCD_DATA18 LCD_DATA16 15

ENET1_RX_EN ENET1_RX_DATA1 ENET1_TX_DATA0 ENET2_RX_EN LCD_DATA21 LCD_DATA22 LCD_DATA15 16

i.MX 6ULL Applications Processors for Industrial Products, Rev. 1.2, 11/2017
ENET1_RX_DATA0 VSS ENET2_RX_DATA0 ENET2_RX_DATA1 LCD_DATA23 LCD_DATA20 VSS 17

G F E D C B A

135
Package Information and Contact Assignments
136
P N M L K J H

DRAM_DATA08 DRAM_DATA14 VSS DRAM_CS0_B DRAM_SDCKE1 DRAM_ADDR09 DRAM_ADDR02

DRAM_DATA15 DRAM_DATA13 DRAM_ADDR10 DRAM_SDCKE0 DRAM_ODT0 DRAM_ADDR03 DRAM_ADDR05

DRAM_DATA10 DRAM_SDQS1_P VSS DRAM_ADDR12 DRAM_SDCLK0_P VSS DRAM_SDBA0

DRAM_DATA12 DRAM_SDQS1_N DRAM_ADDR04 DRAM_RAS_B DRAM_SDCLK0_N DRAM_ADDR07 DRAM_ADDR13

DRAM_SDQS0_P DRAM_DATA01 NVCC_DRAM NVCC_DRAM DRAM_ADDR11 DRAM_ADDR08 DRAM_CSI_B

SNVS_TAMPER1 NVCC_DRAM NVCC_DRAM_2P5 VSS


Package Information and Contact Assignments

SNVS_TAMPER4 TEST_MODE VDD_SOC_CAP VDD_SOC_CAP VDD_SOC_CAP VDD_SOC_CAP

SNVS_TAMPER5 SNVS_TAMPER8 VSS VDD_SOC_CAP VDD_SOC_CAP VDD_SOC_CAP VDD_SOC_CAP

SNVS_TAMPER9 SNVS_TAMPER7 VDD_SOC_IN VDD_SOC_IN VDD_SOC_IN VDD_ARM_CAP

SNVS_TAMPER3 SNVS_DAMPER2 NGND_KEL0 VDD_SOC_IN VDD_SOC_IN VDD_SOC_IN VDD_ARM_CAP

USB_OTG1_DP VDD_USB_CAP VDD_SOC_IN VDD_SOC_IN VDD_SOC_IN VDD_ARM_CAP

VDD_SNVS_IN VDD_SNVS_CAP VSS VSS

JTAG_TRST_B ADC_VREFH NVCC_GPIO NVCC_UART UART5_TX_DATA UART5_RX_DATA ENET2_RX_ER

GPIO1_IO08 GPIO1_IO07 GPIO1_IO00 UART1_CTS_B UART1_RTS_B UART2_RTS_B ENET2_TX_CLK

GPIO1_IO05 GPIO1_IO06 GPIO_IO01 UART1_TX_DATA UART3_RX_DATA VSS UART3_RTS_B


Table 95. 9x9 mm, 0.5 mm Pitch, Ball Map (continued)

GPIO1_IO09 GPIO1_IO03 GPIO1_IO02 UART2_TX-DATA UART2_RX_DATA UART4_TX_DATA UART3_CTS_B

i.MX 6ULL Applications Processors for Industrial Products, Rev. 1.2, 11/2017
JTAG_TDI GPIO1_IO04 VSS UART1_RX_DATA UART3_TX_DATA UART2_CTS_B UART4_RX_DATA

P N M L K J H

NXP Semiconductors
U T R

NXP Semiconductors
1 VSS DRAM_VREF DRAM_DM1

2 DRAM_DATA09 DRAM_ZQPAD DRAM_DATA11

3 DRAM_DATA07 DRAM_DATA00 VSS

4 DRAM_DQM0 DRAM_DATA02 DRAM_DATA06

5 DRAM_DATA04 DRAM_DATA03 DRAM_SDQS0_N

6 VSS DRAM_DATA05 ONOFF

7 CCM_PMIC_STBY_REQ SNVS_PMIC_ON_REQ SNVS_TAMPER6

8 BOOT_MODE1 BOOT_MODE0 SNVS_TAMPER0

9 USB_OTG2_VBUS USB_OTG1_VBUS VSS

10 USB_OTG2_DP USB_OTG2_DN POR_B

11 VDD_HIGH_CAP GPANAIO USB_OTG1_DN

12 RTC_XTALO RTC_XTALI VSS

13 VSS NVCC_PLL JTAG_MOD

14 XTALO XTALI JTAG_TMS

15 VDD_HIGH_IN USB_OTG1_CHD_B VSS


Table 95. 9x9 mm, 0.5 mm Pitch, Ball Map (continued)

16 CCM_CLK1_N CCM_CLK1_P JTAG_TDO

i.MX 6ULL Applications Processors for Industrial Products, Rev. 1.2, 11/2017
17 VSS VDDA_ADC_3P3 JTAG_TCK

U T R

137
Package Information and Contact Assignments
Revision History

7 Revision History
Table 96 provides a revision history for this data sheet.
Table 96. i.MX 6ULL Data Sheet Document Revision History

Rev.
Date Substantive Change(s)
Number

1.2 11/2017 • Updated the part numbers and added a new part number (MCIMX6Y2CVK08AB) in the Table 1,
"Ordering Information"
• Updated the silicon revision number in the Figure 1, "Part Number Nomenclature—i.MX 6ULL"
• Updated the GPIO1_IO09 signal name in the Table 85, "SD/MMC Boot through USDHC1" and added
a footnote
• Updated the NAND_ALE signal name in the Table 86, "SD/MMC Boot through USDHC2" and added
a footnote

1.1 05/2017 • Changed terminology from “floating” to “not connected”


• Changed the LV-DDR3 to DDR3L in the Section 1.2, “Features"
• Added a footnote regarding maximum voltage allowance in the Table 7, "Absolute Maximum Ratings"
• Updated the minimum value of VDD_SOC_CAP in the Low Power Run Mode: LDO Enabled from the
Table 10, "Operating Ranges"
• Removed the LPSR mode in the Section 4.1.6, “Power Modes"
• Removed a note in the Section 4.2.1, “Power-Up Sequence"
• Replaced the MMDC compatible information with a cross reference in the Section 4.6.3, “DDR I/O DC
Parameters" and Section 4.7.2, “DDR I/O AC Parameters"
• Removed the Section 4.9.4, “DDR SDRAM Specific Parameters (DDR3 and LPDDR2)”
• Added a new Section 4.10, “Multi-Mode DDR Controller (MMDC)"
• Changed SD3 min to 1.7 ns in the Table 51, "eMMC4.4/4.41 Interface Timing Specification"

1 02/2017 • Added a new part number in the Table 1, "Ordering Information"


• Updated the Part differentiator number 3 to Reserved, removed 300 MHz from frequency, and added
792 MHz in the Figure 1, "Part Number Nomenclature—i.MX 6ULL"
• Updated the DDR I/O supply voltage and added a table not in the Table 7, "Absolute Maximum
Ratings"
• Updated Table 10, "Operating Ranges"
• Added Max. current for VDD_SOC_IN at 792 MHz in the Table 13, "Maximum Supply Currents"
• Updated the LDO_2P5 of the LOW POWER IDLE: LDO Bypassed row in the Table 15, "Low Power
Mode Current and Power Consumption" and the VDD_SOC_IN supply voltage for LDO enable mode
• Updated the Figure 18, "Asynchronous A/D Muxed Write Access"
• Added a new Section 4.12.9.1, “LCDIF Signal Mapping"
• Added a note in the Section 4.2.1, “Power-Up Sequence"
• Updated VDD_HIGH_CAP pin assignment in the Table 90, "14x14 mm Supplies Contact Assignment"
• Updated VDD_HIGH_CAP pin in the Table 92, "14 x 14 mm, 0.8 mm Pitch, Ball Map"

0 09/2016 • Initial public release

i.MX 6ULL Applications Processors for Industrial Products, Rev. 1.2, 11/2017
138 NXP Semiconductors
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Document Number: IMX6ULLIEC


Rev. 1.2
11/2017

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