INTERNATIONAL ISO

STANDARD 18563-2

First edition
2017-07

Non-destructive testing —
Characterization and verification of
ultrasonic phased array equipment —
Part 2:
Probes
Essais non destructifs
iTeh STANDARD — Caractérisation et vérification de
PREVIEW
l’appareillage de contrôle par ultrasons en multiéléments —
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Partie 2: Traducteurs

ISO 18563-2:2017
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b50b690182d3/iso-18563-2-2017

Reference number
ISO 18563-2:2017(E)

© ISO 2017
ISO 18563-2:2017(E)


iTeh STANDARD PREVIEW

(standards.iteh.ai)
ISO 18563-2:2017
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b50b690182d3/iso-18563-2-2017

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 ISO 18563-2:2017(E)


Contents Page

Foreword......................................................................................................................................................................................................................................... iv
1 Scope.................................................................................................................................................................................................................................. 1
2 Normative references....................................................................................................................................................................................... 1
3 Terms and definitions...................................................................................................................................................................................... 1
4 Symbols........................................................................................................................................................................................................................... 2
5 General compliance............................................................................................................................................................................................ 2
6 Technical information for phased array probes................................................................................................................... 2
7 Test equipment....................................................................................................................................................................................................... 4
7.1 Electronic equipment......................................................................................................................................................................... 4
7.2 Test blocks and other equipment............................................................................................................................................. 4
7.2.1 General...................................................................................................................................................................................... 4
7.2.2 Contact technique............................................................................................................................................................ 4
7.2.3 Immersion technique.................................................................................................................................................... 4
8 Performance tests for phased array probes............................................................................................................................. 4
8.1 General............................................................................................................................................................................................................ 4
8.2 Physical aspects....................................................................................................................................................................................... 5
8.2.1 Method....................................................................................................................................................................................... 5
8.2.2 Acceptance criterion...................................................................................................................................................... 5
8.3 iTeh STANDARD PREVIEW
Relative pulse-echo sensitivity variation.......................................................................................................................... 5
8.3.1 General...................................................................................................................................................................................... 5
8.3.2 (standards.iteh.ai)
Method....................................................................................................................................................................................... 5
8.3.3 Acceptance criteria......................................................................................................................................................... 5
8.4 Frequency, bandwidth andISO pulse duration...................................................................................................................... 6
18563-2:2017
8.4.1 General...................................................................................................................................................................................... 6
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8.4.2 b50b690182d3/iso-18563-2-2017
Method....................................................................................................................................................................................... 6
8.4.3 Acceptance criteria......................................................................................................................................................... 6
8.5 Probe sensitivity..................................................................................................................................................................................... 7
8.5.1 General...................................................................................................................................................................................... 7
8.5.2 Method....................................................................................................................................................................................... 7
8.5.3 Acceptance criteria......................................................................................................................................................... 7
8.6 Inter-element cross-talk (optional)....................................................................................................................................... 7
8.6.1 General...................................................................................................................................................................................... 7
8.6.2 Method....................................................................................................................................................................................... 7
8.6.3 Acceptance criterion...................................................................................................................................................... 8
8.7 Number of elements “out of specification”...................................................................................................................... 8
8.7.1 General...................................................................................................................................................................................... 8
8.7.2 Method....................................................................................................................................................................................... 8
8.7.3 Acceptance criteria......................................................................................................................................................... 8
Bibliography................................................................................................................................................................................................................................. 9

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ISO 18563-2:2017(E)


Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards
bodies (ISO member bodies). The work of preparing International Standards is normally carried out
through ISO technical committees. Each member body interested in a subject for which a technical
committee has been established has the right to be represented on that committee. International
organizations, governmental and non-governmental, in liaison with ISO, also take part in the work.
ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of
electrotechnical standardization.
The procedures used to develop this document and those intended for its further maintenance are
described in the ISO/IEC Directives, Part 1. In particular the different approval criteria needed for the
different types of ISO documents should be noted. This document was drafted in accordance with the
editorial rules of the ISO/IEC Directives, Part 2 (see www​.iso​.org/​directives).
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. ISO shall not be held responsible for identifying any or all such patent rights. Details of
any patent rights identified during the development of the document will be in the Introduction and/or
on the ISO list of patent declarations received (see www​.iso​.org/​patents).
Any trade name used in this document is information given for the convenience of users and does not
constitute an endorsement.
For an explanation on the voluntary nature of standards, the meaning of ISO specific terms and
expressions related to conformity assessment, as well as information about ISO’s adherence to the
iTeh STANDARD PREVIEW
World Trade Organization (WTO) principles in the Technical Barriers to Trade (TBT) see the following
URL: www​.iso​.org/​iso/​foreword​.html
(standards.iteh.ai)
This document was prepared by the European Committee for Standardization (CEN) Technical
Committee CEN/TC 138, Non-destructive testing,ISO 18563-2:2017 with ISO Technical Committee TC 135,
in collaboration
Non-destructive testing, Subcommittee SC 3, Ultrasonic testing, in accordance with the Agreement on
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technical cooperation between ISO and CEN b50b690182d3/iso-18563-2-2017
(Vienna Agreement).
A list of all parts in the ISO 18563 series can be found on the ISO website.

iv  © ISO 2017 – All rights reserved

INTERNATIONAL STANDARD ISO 18563-2:2017(E)

Non-destructive testing — Characterization and

verification of ultrasonic phased array equipment —
Part 2:
Probes

1 Scope
This document specifies the characterization tests performed at the end of the fabrication of a phased
array probe. It defines both methodology and acceptance criteria.
This document is applicable to the following phased array probes used for ultrasonic non-destructive
testing in contact technique (with or without a wedge) or in immersion technique, with centre
frequencies in the range 0,5 MHz to 10 MHz:
a) non-matrix array probes:
— linear;
— encircling; iTeh STANDARD PREVIEW
— partial annular sectorial(standards.iteh.ai)
(type “daisy”);
b) 2D-matrix array probes.
ISO 18563-2:2017
This document does not give methods and acceptance criteria to characterize the performance of
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an ultrasonic phased array instrument or the performance of a combined system. These are given in
b50b690182d3/iso-18563-2-2017
ISO 18563–1 and in ISO 18563–3.

2 Normative references
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any amendments) applies.
ISO 2400, Non-destructive testing — Ultrasonic testing — Specification for calibration block No. 1
ISO 5577, Non-destructive testing — Ultrasonic testing — Vocabulary
EN 16018, Non-destructive testing — Terminology — Terms used in ultrasonic testing with phased arrays

3 Terms and definitions

For the purposes of this document, the terms and definitions given in ISO 5577 and EN 16018 and the
following apply.
ISO and IEC maintain terminological databases for use in standardization at the following addresses:
— ISO Online browsing platform: available at http://​w ww​.iso​.org/​obp
— IEC Electropedia: available at http://​w ww​.electropedia​.org/​

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ISO 18563-2:2017(E)


3.1
probe data sheet
document giving technical specifications of the same type of phased array probes
3.2
probe test report
document showing compliance with ISO 18563-2 giving the measured values of the required parameters
of one specific phased array probe, including test equipment and conditions
3.3
element out of specification
element which does not meet the acceptance criteria of one of the tests defined in 8.3 and 8.4

4 Symbols
Symbol Unit Meaning
CT dB Inter-element cross-talk
f0 Hz Centre frequency
fu Hz Upper frequency limit at –3 dB
fl Hz Lower frequency limit at –3 dB
Δf Hz Frequency bandwidth
Δfrel % Relative bandwidth
Sel dB iTeh STANDARD PREVIEW
Relative pulse-echo sensitivity variation of each element
Spr dB Probe sensitivity
Vav V
(standards.iteh.ai)
Arithmetic mean of V el
Vel V Amplitude of reference echo
ISO 18563-2:2017
Vexc V Amplitude of excitation burst
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Vrec V Amplitude receivedb50b690182d3/iso-18563-2-2017
by an adjacent element
Vref V Amplitude of reference exciting signal

5 General compliance
An ultrasonic phased array probe complies with this document if it fulfils all of the following
requirements.
a) A probe data sheet corresponding to the probe which defines the performance criteria in accordance
with Clause 6 shall be available.
b) The ultrasonic phased array probe shall comply with Clause 8.
c) The probe shall be clearly marked to identify the manufacturer and carry a unique serial number or
show a permanent reference number from which information can be traced to the probe data sheet.
d) A declaration of conformity shall be available, issued by either the manufacturer, by the purchaser
or by a third party that could be a test laboratory.

6 Technical information for phased array probes

Technical information listed in Table 1 shall be supplied with the probe (M = measurement, OI = other
information). Optional technical information is listed in Table 2.

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 ISO 18563-2:2017(E)


Table 1 — List of information to be given in a probe data sheet or probe test report
Information required Information type Comments
Trade name OI —
Identification OI Serial number, reference
Probe type OI —
Probe dimensions OI Outer dimensions
Shape, orientation, arrangement, dimen-
Geometry of the array OI sion, pitch, space between elements and
element dimensions
Type of connector OI Commercial name
Details of connections between elements
Wiring plan OI
and connector
Cable length, outer diameter and outer
Cable OI
material
Dimensions, geometry and material of Only valid for contact probes with
OI
integrated wedge integrated wedge
e.g. housing material and shape of the
Physical aspects OI
contact face; see 8.2
Nominal frequency, nominal relative
OI —
bandwidth, nominal pulse duration
Centre frequency, relative bandwidth
M Measured for each element; see 8.4
and pulse duration iTeh STANDARD PREVIEW
Average centre frequency, average
(standards.iteh.ai)
bandwidth and average pulse duration
M Calculated for probe; see 8.4

Relative pulse-echo sensitivity M See 8.3

ISO 18563-2:2017
Nominal probe sensitivity OI —
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Probe sensitivity M
b50b690182d3/iso-18563-2-2017 See 8.5
Minimum value of the inter-element cross-
Nominal inter-element cross-talk OI
talk
Maximum allowable squint angle Maximum value of the squint angle with
OI
(for contact probes only) indication of the plane of reference
Maximum amplitude of the backing echo
Echo from the transducer backing OI
compared to a reference echo (dB difference)
For example, temperature range, humidity,
Environmental conditions OI
sealing, pressure
Equipment and procedure reference used
OI —
for characterization tests
For example, for storage, for protection
Special conditions OI
during transportation

Table 2 — Optional technical information to be given

Optional information Information type Comments
General drawing and tolerances OI —
Measured cross-talk value corresponding
Inter-element cross-talk M
to the probe; see 8.6
Measured squint angle value with
Squint angle (for contact probe only) M
indication of the plane of reference
Amplitude of the backing echo compared
Echo from the transducer backing M
to a reference echo (dB difference)

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ISO 18563-2:2017(E)


7 Test equipment

7.1 Electronic equipment

The measurement equipment used for the tests specified in Clause 8 shall be stated in the probe test
report. Conformity of this equipment shall be checked periodically.
Testing shall be carried out with the probe cables and matching devices specified on the probe data sheet.
In addition to the ultrasonic phased array instrumentation or laboratory pulser-receiver, the following
equipment or its equivalent is essential to test phased array probes in accordance with this document:
a) an oscilloscope with a minimum bandwidth of 100 MHz;
b) a frequency spectrum analyser with a minimum bandwidth of 100 MHz or an oscilloscope
performing Fast Fourier Transform (FFT).

7.2 Test blocks and other equipment

7.2.1 General

Phased array probes can be used in contact technique (with or without a wedge) or in immersion
technique. Depending on this, the performance tests shall be carried out under corresponding
conditions.
iTeh STANDARD PREVIEW
Details of the test block (geometry, material, reflector type, shape and position, sound speed) shall be
stated in the probe test report.
(standards.iteh.ai)
For partial annular sectorial array probe (type “daisy”), the measurement shall be performed directly
on a flat reflector. ISO 18563-2:2017
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7.2.2 Contact technique b50b690182d3/iso-18563-2-2017

If the wedge can be removed, the tests shall preferably be performed without the wedge.
a) With wedge (integrated or not integrated): A block of the same material as the wedge and proper
dimensions shall be used so that the total ultrasonic path is the same for each element.
b) Without wedge: A block of the material to be tested shall be used so that the total ultrasonic path is
the same for each element. If no material is specified, a block of steel grade according to ISO 2400
shall be used.

7.2.3 Immersion technique

Performance tests shall be carried out in immersion fluid using a defined reflector. If no fluid is
specified, water shall be used.

8 Performance tests for phased array probes

8.1 General
Measurements shall be performed at the probe connector once the probe is completely assembled.
It should be noted that acceptance criteria are only valid under the test conditions defined for the
considered probe.
For 2D-matrix array probes, a number of elements which do not fulfil the criteria are accepted. The
criteria are defined in 8.7.

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 ISO 18563-2:2017(E)


8.2 Physical aspects

8.2.1 Method

Visually inspect the outside of the probe for correct identification and assembly.
Verify that the physical geometry of the probe agrees with the intended design.

8.2.2 Acceptance criterion

The probe physical geometry falls within the prescribed tolerances in the probe data sheet.

8.3 Relative pulse-echo sensitivity variation

8.3.1 General

Measurements shall be done on all elements of the same shape and size.

8.3.2 Method

Measurements are performed in transmit–receive mode according to 7.2.

The transmitter pulse shall be either a negative square pulse with duration equal to half the period
corresponding to the nominal probe frequency or a negative spike pulse.
iTeh STANDARD PREVIEW
The echo of the reflector shall be placed in a time window, the duration of which is at least twice the
(standards.iteh.ai)
echo pulse duration measured at –20 dB of the signal amplitude.
The amplitude in volts, Vel, of the reflector echo of each element shall be measured and recorded. The
ISO 18563-2:2017
arithmetic mean value, Vav, of the Vel amplitudes shall be calculated and recorded.
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Sel, of each element shall be calculated using Formula (1):
b50b690182d3/iso-18563-2-2017
Relative pulse-echo sensitivity variation,
Vel
S el = 20lg (1)
Vav

8.3.3 Acceptance criteria

8.3.3.1 Non-matrix array probes

The relative pulse-echo sensitivity variation, Sel, over all the elements shall be within ±3 dB for all
elements having the same size and shape. For “daisy” and encircling probes, the variation for all the
elements shall be within ±4 dB.

8.3.3.2 2D-matrix array probes

The acceptable relative pulse-echo sensitivity variation, Sel, over all the elements is given in Table 3.

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