EXTECH SE Manual

SE Series
SE 7430/SE 7440/SE 7441/SE 7451/SE 7452

Electrical Safety Analyzer
User Manual
E2.01
WARRANTY
EEC certifies that the instrument listed in this manual meets or exceeds published
manufacturing specifications. This instrument was calibrated using standards that are traceable
to Chinese National Laboratory Accreditation (CNLA).
Your new instrument is warranted to be free from defects in workmanship and material for a
period of (2) year from date of shipment. During the warranty period, you must return the
instrument to EEC or its branches or its authorized distributor for repair. EEC reserves the right
to use its discretion on replacing the faulty parts or replacing the assembly or the whole unit.
Any non-authorized modifications, tampering or physical damage will void your warranty.
Elimination of any connections in the earth grounding system or bypassing any safety systems
will void this warranty. This warranty does not cover batteries or accessories not of EEC
manufacture. Parts used must be parts that are recommended by EEC as an acceptable
specified part. Use of non-authorized parts in the repair of this instrument will void the
warranty.
This warranty does not cover accessories not of EEC manufacture.
Except as provided herein, EEC makes no warranties to the purchaser of this instrument and all
other warranties, express or implied (including, without limitation, merchantability or fitness
for a particular purpose) are hereby excluded, disclaimed and waived.
Compliance Information
Conforms with the following product standards:
EMC Standard
EN 61326-1:2013 Class A
EN 61000-3-3:2013 / IEC 61000-3-3:2013
EN 61326-1:2013 (Industrial Locations)
EN 61000-4-2:2009 / IEC 61000-4-2:2008
EN 61000-4-3:2006+A1:2008+A2:2010 / IEC 61000-4-3:2006+A1:2007+A2:2010
EN 61000-4-4:2012 / IEC 61000-4-4:2012
EN 61000-4-5:2006 / IEC 61000-4-5:2005
EN 61000-4-6:2014 / IEC 61000-4-6:2013
EN 61000-4-8:2010 / IEC 61000-4-8:2009
EN 61000-4-11:2004 / IEC 61000-4-11:2004
1. The product is intended for use in non-residential/non-domestic environments. Use of the product in
residential/domestic environments may cause electromagnetic interference.
2. Connection of the instrument to a test object may produce radiations beyond the specified limit.
3. Use high-performance shielded interface cable to ensure conformity with the EMC standards listed above.
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1. Introduction ................................................................................................. 1
1.1 Safety Symbols......................................................................................................... 1
1.1.1 Product Marking Symbols ........................................................................................ 1
1.1.2 Caution and Warning Symbols ................................................................................ 1
1.2 Glossary of Terms .................................................................................................... 2
1.3 Safety ...................................................................................................................... 3
1.3.1 Service and Maintenance ........................................................................................ 3
1.3.2 Test Station .............................................................................................................. 3
1.3.3 Test Operator ........................................................................................................... 4
1.3.4 Instrument Connections .......................................................................................... 5
1.3.5 Device Under Test .................................................................................................... 5
1.3.6 Key Safety Points to Remember .............................................................................. 6
1.4 Introduction to Product Safety Testing ..................................................................... 6
1.4.1 The Importance of Safety Testing ............................................................................ 6
1.5 The Different Types of Safety Tests .......................................................................... 7
1.5.1 Dielectric Withstand Test ........................................................................................ 7
1.5.2 Insulation Resistance Test ..................................................................................... 10
1.5.3 Ground Bond Test .................................................................................................. 10
1.5.4 Run Test ................................................................................................................. 10
1.5.5 Touch Current Test ................................................................................................ 11
1.6 Key Features and Benefits: SE Series....................................................................... 12
2. Getting Started ........................................................................................... 14
2.1. Unpacking and Inspection ..................................................................................... 14
2.1.1 Packaging ............................................................................................................... 14
2.1.2 Returning the Instrument ...................................................................................... 14
2.2 Installation............................................................................................................. 14
2.2.1 Work Area .............................................................................................................. 14
2.2.2 Power Requirements ............................................................................................. 15
2.2.3 Basic Connections .................................................................................................. 15
2.2.4 Environmental Conditions ..................................................................................... 15
3. Specifications and Controls ......................................................................... 17
3.1 Specifications ......................................................................................................... 17
3.2 Instrument Controls ............................................................................................... 22
3.2.1 Front Panel Controls .............................................................................................. 22
3.2.2 Rear Panel Controls ............................................................................................... 25
4. Programming Instructions........................................................................... 28
4.1 Using the Touch Screen .......................................................................................... 28
4.2 Main Menu ............................................................................................................ 29
4.3 Setup System ......................................................................................................... 30
4.3.1 Time and Date ........................................................................................................ 30
4.3.2 Calibration Alert ..................................................................................................... 31
4.3.3 Hardware ............................................................................................................... 33
4.3.4 User Interface .........................................................................................................40
4.3.5 Information ............................................................................................................43
4.3.6 Import and Export System and Test Data ..............................................................43
4.4 SECURITY................................................................................................................ 46
4.5 FAILCHEK................................................................................................................ 48
4.5.1 Continuity FAILCHEK (Opt.7002 , Opt.7006) ..........................................................48
4.5.2 Ground Bond FAILCHEK ..........................................................................................49
4.5.3 AC Hipot FAILCHEK .................................................................................................50
4.5.4 DC Hipot FAILCHEK .................................................................................................51
4.5.5 IR FAILCHEK ............................................................................................................52
4.6 Test Parameters ..................................................................................................... 53
4.6.1 Description of Test Parameters..............................................................................53
4.6.2 Additional Parameter Notes and Functions ...........................................................55
4.7.1 ACW ........................................................................................................................58
4.7.2 DCW........................................................................................................................59
4.7.3 IR.............................................................................................................................60
4.7.4 GND ........................................................................................................................60
4.7.5 Continuity (Opt.7002) ............................................................................................61
4.7.6 View Test Files ........................................................................................................61
4.7.7 Edit Test Files..........................................................................................................61
4.8 PERFORM TESTS ..................................................................................................... 62
5. Test Connections......................................................................................... 65
5.1 Connecting the Test Leads ...................................................................................... 65
5.2 Connecting the Adaptor Box ................................................................................... 65
5.3 Interlock Connector ................................................................................................ 65
6. Results Screens ........................................................................................... 66
6.1 Error Messages and Fail Messages .......................................................................... 68
7. Connection of Remote I/O .......................................................................... 71
7.1 Remote Signal Outputs ........................................................................................... 71
7.2 Remote Signal Inputs and Memory Access .............................................................. 72
7.3 Timing ........................................................................................................................74
8. Bus Remote Interface GPIB / USB / RS-232 ................................................. 75
8.1. RS-232 Interface.................................................................................................... 75
8.1.1. RS-232 Connector..................................................................................................75
8.1.2. Communications Port Configuration ....................................................................75
8.1.3. Sending and Receiving Commands .......................................................................76
8.2 GPIB Interface (Opt.109)......................................................................................... 76
8.2.1 GPIB Connector ......................................................................................................76
8.2.2 GPIB Address ..........................................................................................................76
8.3 Interface Functions ................................................................................................. 77
8.4 USB/RS-232 / GPIB Interface Command List ............................................................ 77
9. CALIBRATION .............................................................................................. 95
9.1 Warranty Requirements ......................................................................................... 95
9.2 Calibration Initialization ......................................................................................... 95
9.3 Calibration of Parameters ...................................................................................... 96
1. Introduction
1.1 Safety Symbols
1.1.1 Product Marking Symbols
Product will be marked with this symbol when it is necessary to refer to the operation
and service manual in order to prevent injury or equipment damage.
Product will be marked with this symbol when hazardous voltages may be present.
Product will be marked with this symbol at connections that require earth grounding.
1.1.2 Caution and Warning Symbols
Calls attention to a procedure, practice, or condition that could possibly

cause bodily injury or death.
Calls attention to a procedure, practice, or condition that could possibly

cause damage to equipment or permanent loss of data
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1.2 Glossary of Terms
Alternating Current, AC: Current that reverses direction on a regular basis, commonly in the U.S.A.
60 per second, in other countries 50 times per second.
Breakdown: The failure of insulation to effectively prevent the flow of current sometimes
evidenced by arcing. If voltage is gradually raised, breakdown will begin suddenly at a certain
voltage level. Current flow is not directly proportional to voltage. Once breakdown current has
flown, especially for a period of time, the next gradual application of voltage will often show
breakdown beginning at a lower voltage than initially.
Conductive: Having a volume resistivity of no more than 103 ohm-cm or a surface resistivity of no
more than 105 ohms per square.
Dielectric: An insulating material that is positioned between two conductive materials in such a
way that a charge or voltage may appear across the two conductive materials.
Direct Current, DC: Current that flows in one direction only. The source of direct current is said to
be polarized and has one terminal that is always at a higher potential than the other.
Hipot Tester: Common term for dielectric-withstand test equipment.
Insulation: Gas, liquid or solid material which has a volume resistivity of at least 10 12 ohm-cm and
is used for the purpose of resisting current flow between conductors.
Insulation Resistance Tester: An instrument or a function of an instrument capable of measuring

resistance's in excess of 200 megohms. Usually employs a higher voltage power supply than used
in ohmmeters measuring up to 200 megohms.
Leakage: AC or DC current flow through insulation and over its surfaces, and AC current flow
through a capacitance. Current flow is directly proportional to voltage. The insulation and/or
capacitance are thought of as a constant impedance, unless breakdown occurs.
Resistance: That property of a substance that impedes current and results in the dissipation of
power, in the form of heat. The practical unit of resistance is the ohm. Symbol = R
Trip Point: A minimum or maximum parameter set point that will cause an indication of
unacceptable performance during a run test.
Voltage: Electrical pressure, the force which causes current through an electrical conductor.
Symbol = V
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1.3 Safety
This product and its related documentation must be reviewed for familiarization with safety
markings and instructions before operation.
This product is a Safety Class I instrument (provided with a protective earth terminal).
Before applying power verify that the instrument is set to the correct line voltage and the correct
fuse is installed (Please refer to 3.1 Specifications).
A Hipot produces voltages and currents that can cause harmful or fatal
electric shock. To prevent accidental injury or death, these safety
procedures must be strictly observed when handling and using the test
instrument.
1.3.1 Service and Maintenance

User Service
To prevent electric shock do not remove the instrument cover. There are no user serviceable parts
inside. Routine maintenance or cleaning of internal parts is not necessary. Avoid the use of
cleaning agents or chemicals on the instrument, some chemicals may damage plastic parts or
lettering. Any external cleaning should be done with a clean dry or slightly damp cloth. Schematics,
when provided, are for reference only. Any replacement cables and high voltage components
should be acquired directly from EEC. Refer servicing to EEC customer support department.
Service Interval
The instrument, its power cord, test leads, and accessories must be returned at least once a year
to EEC customer support department for calibration and inspection of safety related components.
EEC will not be held liable for injuries suffered if the instrument is not properly maintained and
safety checked annually.
User Modifications
Unauthorized user modifications will void your warranty. EEC will not be responsible for any
injuries sustained due to unauthorized equipment modifications or use of parts not specified by
EEC. Instruments returned to EEC with unsafe modifications will be returned to their original
operating condition at the customers expense.
1.3.2 Test Station

Location
Select an area away from the main stream of activity which employees do not walk through in
performing their normal duties. If this is not practical because of production line flow, then the
area should be roped off and marked for HIGH VOLTAGE TESTING. No employees other than the
test operators should be allowed inside.
If benches are placed back-to-back, be especially careful about the use of the bench opposite the
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test station. Signs should be posted: "DANGER - HIGH VOLTAGE TEST IN PROGRESS -
UNAUTHORIZED PERSONNEL KEEP AWAY."
Work Area
Perform the tests on a non-conducting table or workbench, if possible. If you cannot avoid using a
conductive surface, be certain that it is connected to a good earth ground and the high voltage
connection is insulated from the grounded surface.
There should not be any metal in the work area between the operator and the location where
products being tested will be positioned. Any other metal in the work area should be connected to
a good ground, never left "floating".
Position the tester so the operator does not have to reach over the product under test to activate
or adjust the tester. If the product or component being tested is small, it may be possible to
construct guards or an enclosure around the device to be tested. Construct the guards of a non-
conducting material such as clear acrylic, so that the item being tested is within the guards or
enclosure during the test. If possible, the guards or enclosure should also contain safety switches
that will not allow the tester to operate unless the guards are in place or the enclosure closed.
Keep the area clean and uncluttered. All test equipment and test leads not necessary for the test
should be removed from the test bench and put away. It should be apparent to both the operator
and to any observers, the product that is being tested and the product that is waiting to be tested,
or has already been tested.
Do not perform Hipot tests in a combustible atmosphere or in any area where combustible
materials are present.
Power
Dielectric Voltage-Withstand Test Equipment must be connected to a good ground. Be certain that
the power wiring to the test bench is properly polarized and that the proper low resistance
bonding to ground is in place.
Power to the test station should be arranged so that it can be shut off by one prominently marked
switch located at the entrance to the test area. In case of an emergency, anyone can cut off the
power before entering the test area to offer assistance.
1.3.3 Test Operator

Qualifications
This instrument generates voltages and currents that can cause harmful or fatal electric shock and
must only be operated by a skilled worker trained in its use.
The operator should understand the electrical fundamentals of voltage, current, and resistance.
They should recognize that the test instrument is a variable high-voltage power supply with the
return circuit directly connected to earth ground, therefore, current from the high-voltage output
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will flow through any available ground path.
Rules
Operators should be thoroughly trained to follow all of the aforementioned rules, in addition to
any other applicable safety rules and procedures. Defeating any safety system should be
considered a serious offense with severe penalties such as removal from the Hipot testing job.
Allowing unauthorized personnel in the area during a test should also be dealt with as a serious
offense.
Dress
Operators should not wear jewelry that could accidentally complete a circuit.
Medical Restrictions
Personnel with heart ailments or devices such as pacemakers should be informed that the voltages
and currents generated by the instrument are very dangerous. If contacted it may cause heart-
related problems that a person of good health may not experience. Please have the test operator
consult their physician for recommendations.
1.3.4 Instrument Connections
Never perform a hipot test on energized circuitry or equipment.
The instrument is equipped with a safety ground connection, be sure that this is connected
to a good earth ground.
Always connect the return lead first, regardless of whether the item under test is a sample of
insulating material, a component tested with the high voltage test lead, or a cord-connected
device with a two or three prong plug. The return lead should be connected first for any type of
hipot testing.
Plug in the high voltage test lead only when it is being used. Handle its clip only by the insulator---
never touch the clip directly. Be certain that the operator has control over any remote test
switches connected to the Hipot. Double check the return and high voltage connections from the
Hipot and the Line, Neutral, Ground and Case connections from the Line Leakage tester to be
certain that they are proper and secure.
1.3.5 Device Under Test
Never touch the Device Under Test (DUT) or anything connected to it while
high voltage is being applied by the hipot.
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When testing with DC, always discharge the capacitance of the item under test and anything the
high voltage may have contacted--such as test fixtures--before handling it or disconnecting the
test leads.
HOT STICK probes can be used to discharge any capacitance in the device under test as a further
safety precaution. A hot stick is a non-conducting rod about two feet long with a metal probe at
the end that is connected to a wire. To discharge the device under test, two hot sticks are
required. First, connect both probe wires to a good earth ground. Then touch one probe tip to the
same place that the return lead was connected. While holding the first probe in place, touch the
second probe tip to the same place where the high voltage lead was connected.
1.3.6 Key Safety Points to Remember
 Keep unqualified and unauthorized personnel away from the test area.
 Arrange the test station in a safe and orderly manner.
 Never touch the product or connections during a test.
 In case of any problem, turn off the high voltage first.
 Properly discharge any item tested with DC before touching connections.
1.4 Introduction to Product Safety Testing
1.4.1 The Importance of Safety Testing

Product Safety Tests are specified during the design and development stages of a product as well
as in the production of the products to insure that it meets basic safety requirements. These tests
are designed to verify the safety of the electrical products in that they do not jeopardize the safety
of the people, domestic animals, and property of anyone who may come in contact with these
products. In an era of soaring liability costs, original manufacturers of electrical and electronic
products must make sure every item is as safe as possible. All products must be designed and built
to prevent electric shock, even when users abuse the equipment or by-pass built in safety
features.
To meet recognized safety standards, one common test is the "dielectric voltage-withstand test".
Safety agencies which require compliance safety testing at both the initial product design stage
and for routine production line testing include: Underwriters Laboratories, Inc. (UL), the Canadian
Standards Association (CSA), the International Electrotechnical Commission (IEC), the British
Standards Institution (BSI), the Association of German Electrical Engineers (VDE) and (TÜ V), the
Japanese Standards Association (JSI). These same agencies may also require that an insulation
resistance test and high current ground bond test be performed.
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1.5 The Different Types of Safety Tests
1.5.1 Dielectric Withstand Test

The principle behind a dielectric voltage - withstand test is simple. If a product will function when
exposed to extremely adverse conditions, it can be assumed that the product will function in
normal operating circumstances.
Common Applications of the Dielectric Withstand Test:
 Design (performance) testing: Determining design adequacy to meet service conditions.
 Production Line testing: Detecting defects in material or workmanship during processing.
 Acceptance testing: Proving minimum insulation requirements of purchased parts.

 Repair Service testing: Determine reliability and safety of equipment repairs.
The specific technique used to apply the dielectric voltage - withstand test to each product is
different. During a dielectric voltage - withstand test, an electrical device is exposed to a voltage
significantly higher than it normally encounters, for a specified duration of time.
During the test, all current flow from the high voltage output to the return is measured. If, during
the time the component is tested, the current flow remains within specified limits, the device is
assumed safe under normal conditions. The basic product design and use of the insulating material
will protect the user against electrical shock.
The equipment used for this test, a dielectric-withstand tester, is often called a "hipot" (for high
potential tester). The "rule of thumb" for testing is to subject the product to twice its normal
operating voltage, plus 1,000 volts.
However, specific products may be tested at much higher voltages than 2X operating voltages +
1,000 volts. For example, a product designed to operate in the range between 100 to 240 volts can
be tested between 1,000 to 4,000 volts or higher. Most "double insulated" products are tested at
voltages much higher than the "rule of thumb".
Testing during development and prototype stages is more stringent than production run tests
because the basic design of the product is being evaluated. Design tests usually are performed on
only a few samples of the product. Production tests are performed on every item as it comes off
the production line.
The hipot tester must also maintain an output voltage between 100% and 120% of specification.
The output voltage of the hipot must have a sinusoidal waveform with a frequency between 40 to
70 Hz and has a peak waveform value that is not less than 1.3 and not more than 1.5 times the
root-mean-square value.
Types of Failures only detectable with a Hipot test
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 Weak Insulating Materials
 Pinholes in Insulation
 Inadequate Spacing of Components
 Pinched Insulation
Dielectric Withstand Test; AC verses DC

Please check with the Compliance Agency you are working with to see which of the two types of
voltages you are authorized to use. In some cases, a Compliance Agency will allow either AC or DC
testing to be done. However, in other cases the Compliance Agency only allows for an AC test. If
you are unsure which specification you must comply with please contact our CUSTOMER SUPPORT
DEPT.
Many safety agency specifications allow either AC or DC voltages to be used during the hipot test.
When this is the case, the manufacturer must make the decision on which type of voltage to
utilize. In order to do this it is important to understand the advantages and the disadvantages of
both AC and DC testing.
AC testing characteristics
Most items that are hipot tested have some amount of distributed capacitance. An AC voltage
cannot charge this capacitance so it continually reads the reactive current that flows when AC is
applied to a capacitive load.
AC testing advantages
AC testing is generally much more accepted by safety agencies than DC testing. The main reason
for this is that most items being hipot tested will operate on AC voltages. AC hipot testing offers
the advantage of stressing the insulation alternately in both polarities, which more closely
simulates stresses the product will see in real use.
Since AC testing cannot charge a capacitive load the current reading remains consistent from
initial application of the voltage to the end of the test. Therefore, there is no need to gradually
bring up the voltage since there is no stabilization required to monitor the current reading. This
means that unless the product is sensitive to a sudden application of voltage the operator can
immediately apply full voltage and read current without any wait time.
Another advantage of AC testing is that since AC voltage cannot charge a load there is no need to
discharge the item under test after the test.
AC testing disadvantages
One disadvantage of AC testing surfaces when testing capacitive products. Again, since AC cannot
charge the item under test, reactive current is constantly flowing. In many cases, the reactive
component of the current can be much greater than the real component due to actual leakage.
8
This can make it very difficult to detect products that have excessively high leakage current.
Another disadvantage of AC testing is that the hipot has to have the capability of supplying
reactive and leakage current continuously. This may require a current output that is actually much
higher than is really required to monitor leakage current and in most cases is usually much higher
than would be needed with DC testing. This can present increased safety risks as operators are
exposed to higher currents.
DC testing characteristics
During DC hipot testing the item under test is charged. The same test item capacitance that causes
reactive current in AC testing results in initial charging current which exponentially drops to zero in
DC testing.
DC testing advantages
Once the item under test is fully charged, the only current flowing is true leakage current. This
allows a DC hipot tester to clearly display only the true leakage of the product under test.
Another advantage to DC testing is that the charging current only needs to be applied
momentarily. This means that the output power requirements of the DC hipot tester can typically
be much less than what would be required in an AC tester to test the same product.
DC testing disadvantages
Unless the item being tested has virtually no capacitance, it is necessary to raise the voltage
gradually from zero to the full test voltage. The more capacitive the item the more slowly the
voltage must be raised. This is important since most DC hipots have failure shut off circuitry which
will indicate failure almost immediately if the total current reaches the leakage threshold during
the initial charging of the product under test.
Since a DC hipot does charge the item under test, it becomes necessary to discharge the item after
the test.
DC testing unlike AC testing only charges the insulation in one polarity. This becomes a concern
when testing products that will actually be used at AC voltages. This is an important reason that
some safety agencies do not accept DC testing as an alternative to AC.
When performing AC hipot tests the product under test is actually tested with peak voltages that
the hipot meter does not display. This is not the case with DC testing since a sinewave is not
generated when testing with direct current. In order to compensate for this most safety agencies
require that the equivalent DC test be performed at higher voltages than the AC test. The
multiplying factor is somewhat inconsistent between agencies which can cause confusion
concerning exactly what equivalent DC test voltage is appropriate.
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1.5.2 Insulation Resistance Test
Some "dielectric analyzers today come with a built in insulation resistance tester. Typically, the IR
function provides test voltages from 500 to 1,000 volts DC and resistance ranges from kilohms to
gigaohms. This function allows manufacturers to comply with special compliance regulations.
BABT, TÜ V and VDE are agencies that may under certain conditions, require an IR test on the
product before a Hipot test is performed. This typically is not a production line test but a
performance design test.
The insulation resistance test is very similar to the hipot test. Instead of the go/no go indication
that you get with a hipot test the IR test gives you an insulation value usually in Megohms.
Typically, the higher the insulation resistance value the better the condition of the insulation. The
connections to perform the IR test are the same as the hipot test. The measured value represents
the equivalent resistance of all the insulation which exists between the two points and any
component resistance which might also be connected between the two points.
Although the IR test can be a predictor of insulation condition it does not replace the need to
perform a dielectric withstand test.
1.5.3 Ground Bond Test

The Ground Bonding test determines whether the safety ground circuit of the product under test
can adequately handle fault current if the product should ever become defective. A low
impedance ground system is critical in ensuring that in case of a product failure, a circuit breaker
on the input line will act quickly to protect the user from any serious electrical shock.
International compliance agencies such as CSA, IEC, TÜ V, VDE, BABT and others, have
requirements calling out this test. This test should not be confused with low current continuity
tests that are also commonly called out in some safety agency specifications. A low current test
merely indicates that there is a safety ground connection. It does not completely test the integrity
of that connection.
Compliance agency requirements vary on how different products are to be tested. Most
specifications call for test currents of between 10 and 40 amps. Test voltages at these currents are
typically required to be less than 12 volts. Maximum allowable resistance readings of the safety
ground circuit are normally between 100 and 200 milliohms.
If you are testing a product that is terminated in a three-prong plug, you are required to perform a
continuity or ground bond test on the ground conductor to the chassis or dead metal of the
product.
1.5.4 Run Test

All manufacturers of a product that runs on line power normally need to run the DUT (Device
Under Test) after final safety testing so that they can verify the functionality of their products. In
addition to running the DUT to test its basic functionality many customers also require some basic
test data to be recorded while the DUT is powered up. A Run Test System allows the product to be
10
powered up immediately after the safety tests are completed with a single connection to the DUT.
Measurements that are commonly made while the DUT is running can include Amperage, Voltage,
Watts and Power Factor.
1.5.5 Touch Current Test

The Line Leakage test is one of many product safety tests that are normally specified for electrical
products by safety testing agencies such as Underwriters Laboratories (UL) and the International
Electrotechnical Committee (IEC). The line leakage specifications vary as well as the method in
which the measurements are taken depending upon the application or function of a product and
the standard to which the product is being tested.
Current Leakage or Line Leakage tests are general terms that actually describe three different
types of tests. These tests are Earth Leakage Current, Enclosure Leakage Current, and Applied Part
Leakage Current. The main differences in these tests are in the placement of the probe for the
measuring device. The Earth Leakage Current is the leakage current that flows through the ground
conductor in the line cord back to earth. The Enclosure Leakage Current is the current that flows
from any enclosure part through a person back to ground if it were contacted by a person. The
Applied Part Leakage Current or Patient Lead Leakage Current is any leakage that flows from an
applied part, between applied parts or into an applied part. The Applied Part Leakage Current test
is required only for medical equipment. All of these tests are used to determine if products can be
safely operated or handled without posing a shock hazard to the user.
Line Leakage Testers provide the capability of meeting the line leakage test specified in the
following standards; UL 544, IEC 950, UL 1950, IEC 601-1, UL 2601, UL 1563, UL 3101, IEC 1010 and
others. The Line Leakage test, is a test which measures the leakage current of a product, through a
circuit that is designed to simulate the impedance of the human body. The simulation circuit is
called the Measuring Device (MD). The instrument has five different MD circuits, selectable
through the menu, which are representative circuits designed to simulate the impedance of the
human body under different conditions. The impedance of the human body will vary depending
upon point of contact, the surface area of the contact and the path the current flows. For these
reasons, the specifications of the Measuring Devices are different depending upon the type of test
being performed as well as the maximum allowable leakage current. Leakage current
measurements are performed on products under normal conditions and single fault conditions as
well as reversed polarity. This simulates possible problems, which could occur if the product under
test is faulted or misused while the product is operating under high line conditions (110% of the
highest input voltage rating of the product).
Line Leakage tests are normally specified as “Type Tests” or “Design Tests” which are performed
during the development of the product. This helps verify that the design is safe but it does not
guarantee the safety of the products being produced on the production line. The only way to be
sure you are shipping safe products is to test each product at the end of the production line. The
user may perform a Leakage Current test along with other common safety test such as Dielectric
Withstand, Insulation Resistance, and Ground Bond on the production line with a single
connection to the device under test.
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1.6 Key Features and Benefits: SE Series
Alerts the operator that the machine is due for

1.CAL-ALERT
calibration in advance of the calibration due date.
Two test modes allow for a basic Continuity test to be

performed simultaneously with the Hipot test, or a
2.TWO CONTINUITY TEST MODES stand-alone Continuity test to be performed
independently for higher resistance and point-to-point
applications.
SmartGFI™ disables the instrument’s output voltage in

less than 1 millisecond if excessive leakage to ground
3.PATENTED SMARTGFI is detected. If enabled, SmartGFI™ automatically
detects if the DUT is floating or grounding and turns
ON or OFF accordingly.
Allows the operator to set different levels of access to

the instrument’s setup programs. Users can setup
4.SECURITY ACCESS
passwords for restricting access to certain parts of the
menu.
User can link up to 200 steps in a single test file with a

5.EXPANDED TEST MEMORIES
total of 2000 steps available in memory.
SE simultaneously monitors real and total current in

6.REAL CURRENT MEASUREMENT
AC Hipot mode on the same screen.
SE allows operators to setup a user-configured

message that is displayed in between test steps. This is
7.EXCLUSIVE PROMPT AND HOLD
a very convenient feature for applications where test
FUNCTION
leads need to be moved or when DUT switches need
to be activated as part of the test cycle.
Allows the operator to choose whether low-level arcs

8.DIGITALLY CONTROLLED ARC
should be detected. The operator can select from
DETECTION SYSTEM
multiple sensitivity levels.
Allows the operator to linearly increase or decrease

9.ELECTRONIC RAMPING (UP AND the output voltage to the DUT over a specified period
DOWN) of time. Minimizes any damage to sensitive DUT’s
from quick high voltage changes.
Two standard 9 pin interfaces provide outputs for

10.PLC REMOTE INPUTS & PASS, FAIL, RESET and TEST IN PROCESS signals. Inputs
OUTPUTS include TEST, INTERLOCK, RESET and remote recall of
MEMORIES 1 - 3. Provides the user with the ability to
12
operate the SE through simple PLC relay control.
Allows the operator to self-verify the instrument’s

11.FAIL-CHEK
failure detectors.
Allows the operator to set multiple dwell cycles at

12.PRO-VOLT * different voltages for ACW/DCW/IR so that test
voltages can be raised and held in steps
Connect a barcode scanner directly to the instrument

13.BARCODE SCANNING
front panel and perform the appropriate tests.
Transfer test data directly to a USB flash drive after

14.USB STORAGE
performing the test.
*Pro Volt Operational Rules
1. Provolt will only link tests of the same type.

2. If the previous step voltage is higher than next step voltage, it will ignore ramp up of next step.
3. If the previous step voltage is lower than next voltage, it will ignore ramp down of previous step.
4. Frequency changes in ACW are not allowed. If a test sequence has been created with frequency changes and the
system is set to provolt and you attempt to run the file, it will warn you that there are frequency changes in the
file and prevent the operation.
13
2. Getting Started
This section contains information for the unpacking, inspection, preparation for use and storage of
your EEC product.
2.1. Unpacking and Inspection

2.1.1 Packaging
Your instrument was shipped in a custom foam insulated container that complies with ASTM
D4169-92a Assurance Level II Distribution Cycle 13 Performance Test Sequence
If the shipping carton is damaged, inspect the contents for visible damage such as dents, scratches
or broken display. If the instrument is damaged, notify the carrier and EEC's customer support
department. Please save the shipping carton and packing material for the carriers inspection. Our
customer support department will assist you in the repair or replacement of your instrument.
Please do not return your product without first notifying us .
 Please retain all of the original packaging materials.
2.1.2 Returning the Instrument

When it is necessary to return the instrument for servicing or calibration, repackage the
instrument in its original container, please include all accessories and test leads. Indicate the
nature of the problem or type of service needed. Also, please mark the container "FRAGILE" to
insure proper handling.
If you do not have the original packaging materials, please follow these guidelines:
 Wrap the instrument in a bubble pack or similar foam. Enclose the same information as
above.
 Use a strong double-wall container that is made for shipping instrumentation. 350 lb. test
material is adequate.
 Use a layer of shock-absorbing material 70 to 100 mm (3 to 4 inch) thick around all sides of
the instrument. Protect the control panel with cardboard.
 Seal the container securely.
 Mark the container "FRAGILE" to insure proper handling.
2.2 Installation
2.2.1 Work Area

Locate a suitable testing area and be sure you have read all safety
instructions for the operation of the instrument and suggestions on the
test area set-up in the Safety section. Make sure the work area you choose
has a three-prong grounded outlet. Be sure the outlet has been tested for proper wiring before
connecting the instrument to it.
14
2.2.2 Power Requirements
This instrument requires a power source of either 100 - 120 volts AC ± 10%, 50/60 Hz single phase
or 200 - 240 volts AC ± 10%, 50/60 Hz single phase. Please check the rear panel to be sure the
proper switch setting is selected for your line voltage requirements before turning your
instrument on. For operation at 115 and 230 Volts AC use a 6.3A for SE 7430, SE 7440 and SE 7441.
The max. rated power is 700VA. Use a 15A for SE 7450 and SE 7452, 250VAC fuse. The max. rated
power is 1300VA.
Do not switch the line voltage selector switch located on the rear panel
while the instrument is on or operating. This may cause internal damage
and represents a safety risk to the operator.
2.2.3 Basic Connections

Power Cable
Before connecting power to this instrument, the protective ground (Earth)
terminals of this instrument must be connected to the protective
conductor of the line (mains) power cord. The main plug shall only be
inserted in a socket outlet (receptacle) provided with a protective ground (earth) contact. This
protective ground (earth) must not be defeated by the use of an extension cord without a
protective conductor (grounding).
The instrument is shipped with a three-wire power cable. When the cable is connected to an
appropriate AC power source, the cable will connect the chassis to earth ground. The type of
power cable shipped with each instrument depends on the country of destination.
Return Connection
The output power supplies of this instrument are referenced directly to
earth ground. Any conductor that completes a path between the high
voltage and earth ground will form a completed circuit.
When the instrument Return is grounded, any internal and external stray leakage will be
monitored due to currents that flow from High Voltage to earth ground (such as from HV to the
chassis of the instrument). This current is inherent and will cause errors when trying to monitor
very low leakage currents in the micoamp range.
2.2.4 Environmental Conditions

This instrument may be operated in environments with the following limits:
Temperature…………. 0° - 40° C
Relative humidity ……20 - 80%
Altitude ………………6,560 feet (2,000 meters)
Use insulation resistance function before, should be warmed-up 30 minutes.
Storage and Shipping Environment
15
This instrument may be stored or shipped in environments with the following limits:
Temperature.................- 40°- 75°C
Altitude................….....25000 feet (7,620 meters)
The instrument should also be protected against temperature extremes that may cause
condensation within the instrument.
Ventilation: Do not block any ventilation openings, insure that there is at least 6 inches (15 cm) of
space from the rear panel to any wall or obstruction behind the unit.
16
3. Specifications and Controls
3.1 Specifications
Model ACW DCW IR GND CONT. Built-in Scanner
Option
SE 7430 V V V - Option
(8W or 8W+8Cont.)
SE 7440 V V V V Option -
SE 7441 V V V V Option V
SE 7451 V V V - Option -
SE 7452 V V V V Option -
MODEL SE 7430 SE 7440 SE 7441 SE 7451 SE 7452

AC WITHSTAND VOLTAGE
Output Rating 5KVAC/40mA 5KVAC/40mA 5KVAC/40mA 5KVAC/100mA 5KVAC/100mA
Output
6KVAC/30mA 6KVAC/30mA 6KVAC/30mA 6KVAC/80mA 6KVAC/80mA
Rating(OPT.7015)
Range Resolution Accuracy
Output Voltage, kV 0-5.00 0.01 ±(1% of Setting + 0.5% of Range)
Output Voltage,
0-6.00 0.01 ±(1% of Setting + 0.5% of Range)
kV(OPT.7015)
Output Frequency 50Hz/60Hz ± 0.1%, User Selectable
Output Waveform Sine Wave, Crest Factor = 1.3-1.5
Output Regulation ±(1% of output + 5V), From no load to full load
0.000-9.999 0.001
10.00-40.00 ±(2% of Setting + 2 counts)
(SE 7430 , SE 7440 ,
Auto Range SE 7441) 0.01
10.00-99.99
Hi and Lo-Limit (SE 7451 , SE 7452)
±(2% of Setting + 6 counts)
(Total)current, mA 100.0
0.1
(SE 7451 , SE 7452)
0.000-3.500 0.001
3.51-40.00 ±(2% of Setting + 2 counts)
(SE 7430 , SE 7440 ,
Fixed Range SE 7441) 0.01
3.51-99.99
(SE 7451 , SE 7452)
100.0
0.1
(SE 7451 , SE 7452)
0.000-9.999 0.001
10.00-40.00
(SE 7430 , SE 7440 ,
Hi and Lo-Limit SE 7441) 0.01
Auto Range ±(3% of Setting + 50µA)
(Real)current, mA 10.00-99.99
(SE 7451 , SE 7452)
100.0
0.1
(SE 7451 , SE 7452)
Ramp Up Timer,
0.1-999.9
Second
0.1 ±(0.1% of Setting + 0.05s)
Ramp Down Timer,
0.0-999.9
Second
17
0, 0.1-999.9
Auto Range
(0=continuous)
Dwell Time, Second 0.1 ±(0.1% of Setting + 0.05s)
0, 0.2-999.9
Fixed Range
(0=continuous)
0.000-40.00mA(Total current + current Offset ≤40mA) for SE 7430 & SE 7440 & SE 7441
Current Offset
0.000-100.0mA(Total current + current Offset ≤100mA) for SE 7451 & SE 7452
Arc Detection The range is from 1-9(9 is the most Sensitive)
DC WITHSTAND VOLTAGE
Output Rating 6KVDC/10mA 6KVDC/10mA 6KVDC/10mA 6KVDC/10mA 6KVDC/10mA
Output
7.5KVDC/10mA 7.5KVDC/10mA 7.5KVDC/10mA 7.5KVDC/10mA 7.5KVDC/10mA
Rating(OPT.7015)
Output Voltage, kVdc 0-6.00 0.01 ±(1% of Setting + 0.5% of Range)
Output Voltage, kVdc
0-7.50 0.01 ±(1% of Setting + 0.5% of Range)
(OPT.7015)
Output Ripple < 4%(6KV/10mA at Resistive Load)
0.0000-0.9999 0.0001
1.000-9.999 0.001
Low Range is ON.
Auto Range 10.00-99.99 0.01
100.0-999.9 0.1
1000-10000 1
HI and LO-Limit,
0.0000-0.3500 0.0001
current, uA ±(2% of Setting + 10 counts)
0.351-3.500 0.001
Low Range is ON.
3.51-35.00 0.01
Fixed Range
35.1-350.0 0.1
351-3500 1 ±(2% of Setting + 2 counts)
3501 – 10000 1
0.4-999.9 (Low Range = OFF)
Ramp Up Timer, 0.1-999.9 ( when fixed range is ON)
Second
0.5-999.9 (Low Range = ON)
Ramp Down Timer,
0.0, 1.0-999.9
Second
0, 0.4-999.9 , (Low Range = OFF) 0.1 ±(0.1% of Setting + 0.05s)
(0=continuous)
0, 1.0-999.9 , (Low Range = ON)
Dwell Time, Second (0=continuous)
0, 0.1-999.9s, when it be select fixed
range (if low range is ON , the time will
follow low range setting)
0.0000-0.9999 0.0001
1.000-9.999 0.001 ±(2% of Setting + 10 counts)
Low Range is ON 10.00-99.99 0.01
Ramp-HI, current , uA 100.0-999.9 0.1
1000-10000 1
0.0-999.9 0.1
Low Range is OFF
1000-10000 1
Charge LO, current, 0.0-350.0 µA DC or Auto Set, When current range is 3 ranges.
uA 0-3500 nA DC or Auto Set, When current range is 6 ranges.
Discharge Time < 50 msec for no load, < 100 msec for capcitor load(all capacitance values in MAX load spec below)
Maximum Capacitive
1µF < 1KV, 0.75µF < 2KV, 0.5µF < 3KV, 0.08µF < 4KV, 0.04µF < 5KV, 0.015uF < 6KV
Load DC Mode
18
Current Offset 0.0-10000uA(Total current + current Offset ≤10mA)
Arc Detection The range is from 1-9(9 is the most Sensitive)

INSULATION RESISTANCE
Output Rating 6KVDC/50000MΩ
Output Voltage, Vdc 10-6000 1 ±(1% of Setting + 0.5% of Range)
0.10-99.99
0.01
HI and LO-Limit, (HI-Limit：0 = OFF)
±(0.1% Setting)
resistance, MΩ 100.0-999.9 0.1
1000 – 50000 1
0.05-999MΩ (under 10-29V) 0.001/0.01/0.1 MΩ ±(15% of Reading + 2 counts)
0.05-999MΩ (under 30-499V) 0.001/0.01/0.1 MΩ ±(7% of Reading + 2 counts)
Resistance
0.100-999.9MΩ (under 500-6000V) 0.001/0.01/0.1 MΩ ±(2% of Reading + 2 counts)
Measurement
1000-9999MΩ (under 500-6000V) 1 MΩ ±(5% of Reading + 2 counts)
10000-50000MΩ (under 500-6000V) 1 MΩ ±(15% of Reading + 2 counts)
Ramp Up Timer,
0.1-999.9
Second
Ramp Down Timer,
0.0, 1.0-999.9 0.1 ±(0.1% Setting+ 0.05s)
Second
Dwell Time, Second 0, 0.5-999.9(0 = continuous)
Delay Timer, Second 0.5-999.9
Charge LO, current,
0.000-3.500, auto/manual Set
uA
GROUND BOND (SE 7440, SE 7441 & SE 7452 ONLY)
Output Rating 32A/600mΩ/8V
Output AC Current, A 1.00-32.00 0.01 ±(2 % of Setting + 0.5% of Range)
Output AC Current, A
1.00-40.00 0.01 ±(2 % of Setting + 0.5% of Range)
(OPT.799)
Output Voltage, Vac
3.00-8.00 0.01 ±(2 % of Setting + 3 counts)O.C.
Open Circuit Mode
Output Frequency, Hz 50Hz/60Hz ± 0.1%, User Selectable
Output Regulation ±(1% of output + 0.02A), Within maximum load limits, and over input voltage range.
Maximum Loading 1.00-10.00A / 0-600mΩ , 10.01-32.00A / 0-200mΩ
Lead Resistance
0-200 1 ±(2% of Setting + 2 counts)at current > 3A
Offset, mΩ
0-200 (10.01-32.00A)
HI and LO-Limit ±(2% of Setting + 2 counts)
0-600 (6.00-10.00A) 1
Resistance, mΩ
0-600 (1.00-5.99A) ±(3% of Setting + 3 counts)at current > 3A
Dwell Timer, Second 0, 0.5-999.9(0 = continuous) 0.1 ±(0.1% of Setting + 0.05s)
CONTINUITY (Option)
1A for 1.000 Ohm , 0.1A for 10.00 Ohm ,
Output Rating
0.01A for 100.0 Ohm , 0.001A for 1000 Ohm , 0.0001A for 10000 Ohm
0.000-1.000 0.001
1.01-10.00 0.01
HI and LO-Limit, Ω 10.1-100.0 0.1
101-1000 1
1001-10000 1 ±(1% of Setting + 10 counts)
Dwell Timer, Second 0.0, 0.4-999.9(0 = continuous) 0.1 ±(0.1% of Setting + 0.05s)
Resistance Offset, Ω 0.000-10.00 0.001/0.01 ±(1% of reading + 3 counts)
19
Measurement
Range Resolution Accuracy
Voltage, KV(AC/DC) 0.00-7.50 0.01 ±(1% of reading + 0.5% of Range)
Voltage, Vdc 0-1000 1 ±(1% of reading + 0.5% of Range)

(IR only) 1001-6000 1 ±(1% of reading + 0.5% of Range)
0.000-3.500 0.001
3.00-40.00 ±(2% of reading + 3 counts)
0.01
(SE 7430 , SE 7440 , SE 7441)
AC Total Current, mA
(Auto range) 3.00-99.99
0.01
(SE 7451 , SE 7452)
±(2% of reading + 6 counts)
100.0
0.1
(SE 7451 , SE 7452)
0.000-3.500 0.001 ±(2% of reading + 2 counts)

0.00-40.00
AC Total Current, mA 0.01 Additional error when reading < 6%
(SE 7430 , SE 7440 , SE 7441)
(Fixed range) of range for ±(0.1% of range)
0.00-99.99
0.01 Additional error when reading < 3%
(SE 7451 , SE 7452)
of range for ±(0.1% of range)
0.000-9.999 0.001 ±(3% of reading + 50µA)
AC Real Current , mA
10.00-99.99 0.01 All Ranges PF > 0.1 , V > 250VAC
DC Current, nA
0.0-350.0 0.1
(Auto/Fixed Range)
0.300-3.500 0.001 Low Range is ON.
DC Current, µA 3.00-35.00 0.01
(Auto Range)
Low Range is ON.
DC Current, µA Additional error when reading < 6%
0.00-35.00 0.01
(Fixed Range) of range for ±(0.1% of range)
00.0-350.0 0.1
DC Current, mA 0.300-3.500 0.001 ±(2% of reading + 2 counts)

(Auto Range) 3.00-10.00 0.01
0.000-3.500 0.001 Additional error when reading < 6%
DC Current, mA of range for ±(0.1% of range)
(Fixed Range) ±(2% of reading + 2 counts)
0.00-10.00 0.01 Additional error when reading < 6%
of range for ±(0.2% of range)
AC Current, A (GB) 0.00-40.00 0.01 ±(2% of reading + 0.5% of Range)
3.00-32.00 A,
Resistance, mΩ (GB) 0-600 1
±(2 % of reading + 2 counts)
0.000-1.000 0.001
1.01-10.00 0.01
Resistance, Ω ±(1% of reading + 3 counts)
(Continuity) 10.1-100.0 0.1
101-1000 1
1001-10000 1 ±(1% of reading + 10 counts)
20
GENERAL
100-120Vac/200-240V ± 10% auto range, 50/60Hz ± 5%, max. current 6.3A for SE 7430, SE 7440 & SE 7441
Input Voltage AC
100-120Vac/200-240V ± 10% auto range, 50/60Hz ± 5%, max. current 15A for SE 7451 & SE 7452
Input：Test, ReSet, Interlock, Recall File 1 through 15
PLC Remote Control
Output：Pass, Fail, Test-in-Process
2000 steps, allow the User create different memories and steps. But each memory limit max. 200 steps and
Memory
results
Display 4.3＂Color Display(Touch Panel)
Calibration Build-in software and external calibrated meters
Alarm Volume Setting Range：0-9; 0 = OFF, 1 is softest volume, 9 is loudest volume
Built-in Scanner
OPTION - YES - -
Module
External Scanner Port YES YES YES YES YES
USB & RS232
YES YES YES YES YES
Interface
GPIB Interface OPTION OPTION OPTION OPTION OPTION
Multinational The operating screen can Select different language including English/Traditional Chinese/Simplified
Language Chinese/Japanese
CE Compliance YES
Environment 0-40ºC, 20-80%RH
Dimension(W × H ×
430 × 88.1 × 400 430 × 88.1 × 400 430 × 133 × 400 430 × 88.1 × 400 430 × 88.1 × 400
D), mm
Weight 17.6Kg 18.6Kg 20Kg 21Kg 23.4Kg
*product specifications are subject to change without notice.

*1. SE 7451 and SE 7452 short circuit current > 200mA
*2. Environment requirement：humidity < 60%RH(no condensation, no scanner), When I < 150nA.
*3. Only one interface can be selected among RS232 & USB interface card or GPIB & Ethernet interface card.
【Ordering Information】
OPT.798 True Negative Voltage for DCW and IR
OPT.799 GB Output 40A for SE 7440, SE 7441, SE 7452
OPT.7002 DC Continuity Test Function for SE 7430, SE 7451
OPT.7004 Built-in Scanner 8W for SE 7430
OPT.7006 Built-in Scanner 8W + 8 Cont. for SE 7430
OPT.7009 JigA/JigB
OPT.7015 6KVAC/7.5KVDC Output
21
3.2 Instrument Controls
3.2.1 Front Panel Controls
SE 7430 and SE 7451

2 3 4 5 6
1 11 10 9 8 7
SE 7440 and SE 7452
2 3 4 12
1 11 10 9 8 6 7
SE 7441
2 3 4 12
1 11 10 9 8 6 7
22
1. POWER SWITCH: Powers the test instrument ON or OFF.
2. RESET BUTTON: Resets the instrument. If a failure condition occurs during a test, pressing this
button will reset the system, shut off the alarm and clear the failure condition. The Reset
button must be pressed before performing another test or changing any of the setup
parameters. This button also serves as an abort signal to stop any test in progress.
3. TEST BUTTON: Starts a test.
4. TOUCH SCREEN GRAPHIC LCD: Displays all the information and allows full control of the
instrument.
Note : This product has screen saver function. When the instrument is not operated for more
than 30 minutes, it will automatically enter the screen saver. User can touch the screen of the
instrument and RESET key to stop the screen saver function.
5. (OPTION) CONTINUITY OUTPUT TERMINAL: Connector used to attach the return test lead,
adaptor box return lead, or test fixture return lead used during Continuity testing.
6. RETURN TERMINAL: Connector used to attach the return test lead, adapter box return lead or
test fixture return lead to the instrument. This connection provides the return current path.
7. HIGH VOLTAGE OUTPUT TERMINAL: Connector used to attach the high voltage test lead,
adapter box high voltage lead or test fixture high voltage lead to the instrument. This
connection provides the high voltage used during a Hipot test.
8. MY MENU: Allows the user to customize the interface.
9. TOGGLE: This button allows the user to toggle between test files if the user is wearing gloves
since the touch screen will not respond to gloves.
10. DATA USB PORT: This USB style port allows for connecting a USB flash drive to extract test
data.
Note:
Support brand: ADATA, Apotop, Ridata, SanDisk, Team,
Interface: USB 2.0
Capacity limit: under 16GB
Format: FAT 16 or FAT 32
11. BARCODE USB PORT: This USB style port allows for connecting a barcode scanner.
Note:
a. The barcode type needs use code 128.
b. Support CINO-F680, Honeywell, Metrologic, DENSO.
23
12. CURRENT OUTPUT TERMINAL: Connector used to attach the high current output lead,
adapter box high current lead or test fixture high current lead to the instrument. This
connection provides the output current for the ground bond and continuity.
24
3.2.2 Rear Panel Controls
SE 7430
2 1 3 4
12 5 6 7 8 11 10 9
SE 7440
1 4
5 6 13 2 3 8 11 10 9
SE 7441
14
5 6 13 2 3 8 1 4 11 10 9
25
SE7450
1 4
5 6 7 2 3 8 9 10 11
SE 7452
2 1 3 4
5 6 13 8 9 10 11
1. SCANNER CONNECTOR: For connection of optional external Scanner.
2. REMOTE SIGNAL OUTPUT: 9-Pin D sub-miniature female connector for monitoring PASS, FAIL,
and PROCESSING output relay signals.
3. REMOTE SIGNAL INPUT: 9-Pin D subminiature male connector for remote control of TEST,
RESET, and REMOTE INTERLOCK DISABLE functions, as well as MEMORY SELECTION
4. BUS INTERFACE: Standard connector for interconnection to the RS-232 Bus interface. Optional
IEEE 488, Ethernet, USB interface may be substituted for the RS-232.
5. REAR PANEL HIGH VOLTAGE OUTPUT TERMINAL: 2nd high voltage output connector in
parallel with the front panel connector.
6. REAR PANEL RETURN TERMINAL: 2nd return output connector in parallel with the front panel
connector.
26
7. REAR PANEL CONTINUITY OUTPUT TERMINAL (OPT.7002) : 2nd continuity output connector in
parallel with the front panel output.
8. CALIBRATION BUTTON: To put the instrument into the calibration mode push this button and
turn on the power switch simultaneously.
9. FUSE RECEPTACLE: To change the fuse, unplug the power (mains) cord and turn the fuse
receptacle counter-clockwise. The fuse compartment will be exposed. Please replace the fuse
with one of the proper rating.
10. INPUT POWER RECEPTACLE: Standard IEC 320 connector for connection to a standard NEMA
style line power (mains) cord.
11. CHASSIS GROUND (EARTH) CONNECTION: This terminal should be connected to a good earth
ground before operation.
12. SCANNER OUTPUTS (OPT.7004): Optional scanner matrix that provides 8 HV/Return
connections. Please refer to 4.6 Test Parameters.
13. REAR PANEL CURRENT TERMINAL: 2nd current output connector in parallel with the front
panel connector.
14. SCANNER OUTPUTS: Provides 8 HV/Return connections and 8 Ground Bond connections.
27
4. Programming Instructions
4.1 Using the Touch Screen

The touch screen display of the SE provides full control of the instrument. The touch screen will be
used to setup system and test parameters as well as security setup and calibration. SE’s touch
screen functions just like any other touch screen.
Soft Keys
The SE touch screen has 3 soft keys: Back, Home and Perform Tests.
Use the Back key to return to a previous menu:
Use the Home key to return to the Main Menu:
Use the Perform Tests key to navigate to the Perform Tests screen:
28
Touch
The various screens of the SE will display icons and parameters. Touch the appropriate icon or
parameter with the fingertip as shown in the image below:
Scroll and Swipe

A scroll bar on the right side of the screen indicates that there are additional parameters or
features. To scroll up and down between parameters touch the screen anywhere scroll upward or
downward. Swipe left to right in order to change parameters when setting up test or system
values:
4.2 Main Menu

The SE automatically defaults to the main menu screen upon power up. The main menu screen
will appear as follows:
29
The default screen is the main menu screen of the instrument. From this screen all the functions
and settings of the instrument can be accessed:
Setup System – instrument global parameters such as time and date, calibration and hardware.
Perform Tests – navigate to the Perform Tests screen in order to run a test sequence.
Security – access instrument lockout and security features
Setup Tests – create test files
FAIL-CHEK – check the instruments failure detectors
MyMENU – user customized menu
4.3 Setup System

From the default main menu touch the Setup System icon to enter the Setup System sub menu.
This is where all System Parameters are edited:
4.3.1 Time and Date

The next parameter in the System Setup is the Time and Date parameter. Touch the screen on the
Time and Date icon and the following screen will appear:
From this screen the time and date can be set and the display format can be edited.
30
4.3.1.1 Set Date
Use the touchscreen numeric keypad to enter the desired value for the date, month and year.
Upon entering a value the enter key (↵) will appear. Touch the enter key to save the value and
move to the next field. The < (back arrow) key can be used to toggle between date, month and
year. The Prev and Next arrows can be used to toggle between different fields under the Time and
Date menu.
4.3.1.2 Set Time

Use the touchscreen numeric keypad to enter the desired value for the hour, minute and second.
move to the next field. The < (back arrow) key can be used to toggle between hour, minute and
second. The Prev and Next arrows can be used to toggle between different fields under the Time
and Date menu.
4.3.1.3 Date Format

Touch the desired date format and the enter key (↵) will appear. Press the enter key to save the
value and move to the next parameter under the Time and Date menu. The Prev and Next arrows
can be used to toggle between different fields under the Time and Date menu.
4.3.1.4 Time Format

Touch the desired time format and the enter key (↵) will appear. Press the enter key to save the
value and move to the next parameter under the Time and Date menu. The Prev and Next arrows
can be used to toggle between different fields under the Time and Date menu.
4.3.2 Calibration Alert

Calibration Alert is a feature that allows the instrument to give an advanced alert that the
calibration for the instrument is coming due.
Turning this parameter ON will activate the Cal Alert function and when the date matches the
Alert Date, the instrument will display the Calibration Alert Warning screen upon power up.
The Calibration Alert settings can be found in the Setup System screen. Click on the Calibration
Alert icon and the following screen will appear:
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The first field under the Calibration Alert screen allows the user to set the Calibration Alert to ON
or OFF.
Touch the desired value and the enter key (↵) will appear. Press the enter key to save the value
and move to the next parameter under the Calibration Alert menu. The Prev and Next arrows can
be used to toggle between different fields under the Calibration Alert menu.
4.3.2.1 Calibration Due Date and Alert Date

It is recommended that calibration should be performed at least once a year. It is recommended
that the Calibration Due Date not be set greater than one year from the Calibration Date
displayed. After a calibration is performed, the Calibration Due Date is automatically set 1 year
after the calibration date.
This parameter defaults to one year after the calibration date but may be overwritten to any date
desired.
The Calibration Due Date and Alert Date can be set by selecting the appropriate fields on the
touchscreen. The following screens will appear when the Calibration Due Date and Alert Date
fields are selected.
The Alert Date is like an alarm clock that will warn you in advance of the actual Calibration Due
Date. After a calibration is performed, the Alert Date is automatically set 11 months after the
Calibration Date. For example, if the calibration is performed on 12/15/2014 the Alert Date will
automatically be set to 11/15/2015.
This parameter defaults to 11 months after the Calibration Date but may be overwritten to any
advanced date desired. Use the numeric keypad to change the values in the date fields and press
the enter key (↵) to accept the new number or press EXIT to cancel and return to the original
number.
Use the touchscreen numeric keypad to enter the desired value for the date, month and year.
move to the next field. The < (back arrow) key can be used to toggle between date, month and
year. The Prev and Next arrows can be used to toggle between different fields under the Time and
Date menu.
Calibration Date is a non-editable parameter that indicates the date when calibration was last
performed on the instrument. This parameter automatically updates after calibrating the
instrument.
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4.3.3 Hardware
The Hardware menu contains important system parameters which must be set prior to performing
tests. Touch the Hardware icon and the following screen will appear:
The touchscreen can be scrolled downward to see the remaining Hardware parameters. Upon
scrolling down the remaining items appear as follows:
4.3.3.1 Smart GFI

The high voltage power supply of the SE is internally referenced to earth ground. Since the leakage
current measuring circuit of the instrument monitors only current that flows through the return
lead the possibility exists for current to flow directly from the high voltage output to earth ground
without being measured. The SmartGFI (Ground Fault Interrupt) circuit monitors the current
between the high voltage output and earth ground. Therefore, if the operator touches the high
voltage lead and earth ground, the instrument will detect this hazardous condition and shut off
immediately.
SmartGFI goes beyond a standard GFI circuit by automatically determining the return
configuration of the DUT (grounded or floating) and enabling or disabling depending on the
situation. When the SE’s Return lead is floating, the SmartGFI circuit enables, protecting the test
operator from electric shock. When the SE’s Return lead is earth grounded, the SmartGFI circuit
disables and the instrument operates in a grounded return mode of operation. If the GFI were to
remain active in this state, the tester would continuously fail since all current is returning through
earth ground. By disabling the SmartGFI circuit and operating in a grounded return mode, SE
allows the user to perform tests on devices that have their chassis’s earth grounded by the test
fixture or test environment.
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The Smart GFI is an adjustable function ranging from 0.5 - 5.0mA. Setting the Smart GFI value to
0mA will simply turn the function OFF. To set the Smart GFI enter the desired value using the
touchscreen keypad and touch the enter key (↵) to save the value and move on to the next
parameter. To clear the entered value the ← key should be used. To exit back to the previous
menu use the “X” key.
4.3.3.2 PLC Remote

The PLC Remote function can be set to ON or OFF. To set the PLC Remote function, touch the
ON/OFF key. To save the setting touch the enter key (↵) and move to the next parameter.
When the PLC remote is turned ON, the front panel TEST button is disabled and a test may only be
started through the rear panel I/O. If you attempt to start a test from the front panel TEST button
when the PLC Remote function is turned “ON”, a pop-up message will be displayed.
4.3.3.3 Single Step

This function is used to temporarily override the automatic connection feature. When the Single
Step function is ON the instrument will pause after each step is completed. To continue the test
sequence, press the Test button to execute the next connected step. Each time the TEST button is
pressed the next connected step will execute. If you press the RESET button before completing all
connected steps, it will return you to the original starting step. If a step fails and you wish to
continue to the next step, do not press RESET.
The Single Step function can be set to ON or OFF. To set the Single Step, touch the ON/OFF key. To
save the setting touch the enter key (↵) and move to the next parameter.
4.3.3.4 Fail Stop

Fail Stop is a function that will stop a sequence if a failure occurs. If this function is turned off, the
sequence of tests will continue to the end of the sequence regardless of whether or not a failure
has occurred. If the Fail Stop is OFF and a failure occurs during the test sequence, the RESET
button will light and a short alarm will sound but the sequence will continue to the end.
At the end of the test sequence the RESET button will light and alarm will sound indicating failure
during the sequence. Pressing the RESET button will silence the alarm. Pressing the RESET button a
second time will reset the instrument.
The Fail Stop function can be set to ON or OFF. To set the Fail Stop function touch the ON/OFF key.
To save the setting touch the enter key (↵) and move to the next parameter.
4.3.3.5 Measurement
The Measurement function can be set to either True RMS or Average. Touch the screen to select
the desired value and the enter key (↵) to save the selection and move to the next parameter.
4.3.3.6 Baudrate
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The transmission speed of RS232 can be set, it has 9600, 19200, 38400, 57600 and 115200
selectable.
Note: the faster the transmission speed setting will be interference.
4.3.3.7 ProVOLT
The ProVOLT function allows for maintaining, stepping up or stepping down the voltage output
between steps without the voltage dropping to 0V. If ProVOLT = ON, the output voltage will not
drop to 0V between test steps.
Additional notes on the ProVOLT function:
- Test steps must be of the same test type (ACW, DCW). For example if an ACW test is
followed by a DCW test, the ProVOLT function will not operate.
- If stepping up the voltage between steps, the ramp down parameter is ignored.
- If stepping down the voltage between steps, the ramp up parameter is ignored.
4.3.3.8 Screensaver
The Screensaver function can be set to ON or OFF. To set the Screensaver function, touch the
ON/OFF key. To save the setting touch the enter key (↵) and move to the next parameter.
4.3.3.9 A/B Test (Option)

The A/B Test function can be set to ON or OFF. To set the A/B Test function, touch the ON/OFF
key. To save the setting touch the enter key (↵) and move to the next parameter.
4.3.3.10 Reflash
The Reflash function can be set to either STEP or LAST. If set STEP, the display will be updated per
100ms. If set LAST, the display will reflash when all steps has been completed.
4.3.3.11 Reset Clear

If Reset Clear is ON, user has to press RESET key then press TEST to continue testing when has a
fail. If Reset Clear is OFF, user can press TEST to continue testing when has a fail.
4.3.3.12 ARC Frequency

The ARC Frequency measure bandwidth can be set to 10k – 30kHz or 10k – 150kHz. To set the
Screensaver function, touch the ON/OFF key. To save the setting touch the enter key (↵) and move
to the next parameter.
4.3.3.13 Control mode

The Control mode function can be set to SE, 7730 or 7400.
The format and command will compatible to 7730 or 7400 series when the Control mode is 7730
or 7400.
Note: the instrument will can’t use USB and Barcode function and Chinese and Japanese interface
when the Control mode is 7730 or 7400.
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4.3.3.14 Barcode
The Barcode function allows the user to connect a barcode scanner directly to the front panel of
the instrument’s barcode port. This is utilized to enter product and serial number information for
testing.
To use this function, the user will need to plug a USB type barcode reader into the barcode port on
the front panel of the instrument. Once a USB barcode is plugged in, the instrument will notify the
user a reader has been detected:
If there is a problem with the connection to the barcode reader or an incompatible device is
plugged into the USB barcode port, the following message will appear:
If the USB barcode device is removed while the instrument is powered on, the following message
will appear:
There are two options under Barcode, Barcode I/P and Autostart.
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Touch the Barcode I/P icon and the following screen will appear:
The Barcode I/P function can be set to OFF, SERIAL, PROD CHEK/SER, PROD/SER1/SER2, PROD/SER,
PROD one/SER and PRODUCT.
 SERIAL: Only scan the SERIAL number.

 PROD CHEK/SER: Scan the PRODUCT and SERIAL number one time that need to check the
PRODUCT number.
 PROD/SER1/SER2: Scan the PRODUCT number one time and two different SERIAL number.
 PROD/SER: Scan the PRODUCT and SERIAL number one time.
 PROD one/SER: Need to scan the PRODUCT and SERIAL number first time, after only scan the
SERIAL number.
 PRODUCT: only scan the PRODUCT number.
Touch the desired icon to set the Barcode I/P. For example if the user touches the SERIAL # input
another screen will appear:
When the setting is SERIAL, PRODUCT or PROD/SER the user can scan barcodes in the Perform
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Tests screen before the test is started. When the barcode is scanned, one of the following
messages will appear on the display:
After the barcodes are scanned, pressing TEST will initiate the test sequence. Pressing RESET will
abort the TEST sequence. The barcode function allows for the re-scanning of barcodes if the
previously scanned barcode was incorrect. Re-scanning is available in the SERIAL#, PRODUCT# and
SER/PROD modes. Any time before a test is initiated; the user can re-scan a barcode. If the user
decides to re-scan barcodes when the Barcode I/P setting is set to SER/PROD, the barcode
function will first replace the data in the Serial Number field, and if the user re-scans another
barcode, the barcode function will replace the data in the Product Number field.
The RUN FILE selection gives the user the ability to automatically load a test file based on what
barcode is scanned from the Perform Tests screen.
To completely enable this feature, the user must name the desired test file for a particular product
the exact alpha-numeric code that is on the product’s barcode label. For example, if Product A has
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barcode “123456789”, then the test file that the user would like to run when testing Product A
must be named “123456789”. Upon scanning the barcode, the SE will immediately load the test
associated with that barcode. The test file name is limited to 10 characters. However, if the user
names a test file with the maximum 10 characters, this function will still initiate a test when a
product’s barcode begins with those first 10 characters, even if the barcode has more than 10
characters.
When using certain features of barcoding, the instrument’s response to the TD? and RD x?
commands will differ slightly to an instrument that is not utilizing this function. For all types of
tests (ACW, DCW, IR, CONT) two fields are added to the end of the standard response when the
Barcode I/P setting is set to SERIAL#, PRODUCT# or SER/PROD.
The first field contains the Serial Number information and the second field includes the Product
Number information. Both fields are included regardless of which of these three modes are
selected. The Data Storage Card will simply substitute a “0” for the field if it is not applicable to the
setting. For example, if a user had their Barcode I/P setting set to SERIAL#, and scanned a Serial
Number with the value “123456789”, the TD? response for an ACW test could be:
01,ACW,Pass,1.24,1.000,0.900,1.0,123456789,0
Note that there is a “0” in the Product Number field because the Barcode I/P setting is SERIAL#.
When the Barcode I/P setting is RUN FILE or OFF, these fields are not included in the TD? and RD
x? responses.
This is where the selection can be saved by pressing the enter key (↵) and move to the previous
screen.
The Autostart function works in tandem with the Barcode RUN FILE function to automatically start
a test sequence once the product and serial number have been scanned.
Using the Autostart = ON and RUN FILE feature will enable the instrument’s
output once the barcode is scanned. Do not touch the DUT at any time
when using this feature in order to avoid potential shock or serious injury.
The Autostart function can be set to ON or OFF. To set the Autostart function touch the ON/OFF
key. To save the setting touch the enter key (↵) and move to the previous screen.
4.3.3.15 Result Data

From the Setup System menu touch the Results Setup icon and the following screen will appear:
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Location
Select Int. memory if you wish to store the test results on the onboard instrument memory. Select
USB disk if you wish to save the test results on an external USB flash drive. For best results use the
USB flash drive provided by Associated Research.
Test Result
Select PASS to save the results of the steps that passed. Select FAIL to save the results of the steps
that failed. Select ALL to save all the test results. Selecting NONE will not save any results to the
internal memory.
Results Limit
You can set the Results Limit. Select from 0 up to 100000 with 0 being OFF. Selecting 0 will set the
Results limit to OFF which means you can store as many results as desired until you reach the
maximum capability of 100000 results.
Time Limit
The Time Limit allows you to set a time period in days for which the test results will be stored.
After the Time Limit is exceeded no test results will be stored on the internal memory of the
instrument and a warning pop-up message will appear at the end of a test alerting you “The time
limit of the results has exceeded the Time Limit”.
4.3.4 User Interface
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Scroll downward to see the remaining options under the User Interface:
4.3.4.1 Results
The next parameter under User Interface is Results. This allows the user to set the desired results
display after a test sequence has been run. The Results function can be set to ALL, LAST or P/F
(Pass/Fail).
When ALL is selected, a Results summary screen will be displayed at the end of the test or
sequence of connected steps displaying the results of all of the steps. The Results summary screen
When Last is selected, the results of the last step performed will be displayed on the Perform Tests
screen. There will not be a change in appearance or special screen displayed in this mode:
When P/F is selected, a Pass or Fail screen will be displayed at the end of the test. The Pass and
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Fail screens will appear as follows:
Touch the screen to select the desired value and the enter key (↵) to save the selection and move
to the next parameter.
4.3.4.2 Touch Sound

Select Touch Sound icon on and choose between ON and OFF. If Touch Sounds = ON, the
instrument will emit a short audible beep anytime the screen is touched.
4.3.4.3 Alarm Volume

Select Alarm Volume using the touchscreen and use the numeric keypad to enter a value. The
numbers corresponding to the different volume settings are 0 through 9, 0 meaning the volume is
off, and 9 being the loudest setting.
Upon selecting a value, a momentary alarm chirp will occur to indicate the volume of the new
setting, and the enter key (↵) will appear. Touch the enter key to save the value and move to the
next field.
4.3.4.4 Language
Select Language from the touchscreen and choose the desired language. The available languages
on the SE instrument are English, Chinese, Simplified Chinese and Japanese.
4.3.4.5 Animation
Select Animation using the touchscreen display and select between CONTINUE or PAUSE. If PAUSE is selected, the
instrument will stop on the animation screen during power up. The user must touch the screen to continue to the
Main Menu. If CONTINUE is selected, the instrument will automatically navigate to the Main Menu after the animation
screen.
4.3.4.6 Home Screen

This allows the user to set the default screen upon instrument power up. Select Home Screen on
the touchscreen display and choose between Perform Test, Menu or My Menu.
If Perform Test is selected, the instrument will automatically navigate to the Perform Tests screen
upon power up. If Menu is selected, the instrument will automatically navigate to the Main Menu
upon power up. If My Menu is selected, the instrument will automatically navigate to the user’s
My Menu setup upon power up.
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4.3.4.7 Hardware Key
This function applies to the test operators need to wear gloves.
Press My Menu / Select and key to adjust the output voltage when user has wear gloves.
When the Hardware Key is turned ON, the My Menu / Select key is increment voltage, key is
decrease voltage at during output.
4.3.4.8 Auto Save

Select Auto Save from the touchscreen keypad and choose between ON and OFF.
4.3.4.9 Color States

Select the Dull and the following screen will appear:
Select the Vivid and the following screen will appear:
4.3.5 Information
This gives the user the ability to view all instrument information including: Model Number, Serial
Number, Calibration Date, Company Information and Firmware Version.
4.3.6 Import and Export System and Test Data

The SE has the capability of importing and exporting system and test file data. To use this feature
insert a compatible USB disk into the Data port on the front panel. Once you insert a USB disk,
from the main menu select the Setup System icon. Two additional icons will appear at the bottom
of the Setup System screen. The two new icons are Import and Export
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Import Select the Import icon and the following screen will appear:
There are four different Import options available. All the options will import the appropriate files
from the connected USB disk:
System – Import System file
One File – Import a single Test file
System and All Files – Import System and all Test files
All Files – Import all Test files
For example if you decide to import a single test file select Import One File and all the test files
that are on the USB disk will be displayed. Select the test file that needs to be imported and the
screen will display the import progress and once the import is complete the following confirmation
screen will appear:
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If there is no Test file to import the following warning message will appear on the screen:
If the Test file name already exists in the instrument internal memory the following warning
message will appear on the screen:
Export
Select the Export icon and the following screen will appear:
There are four different export options available. All the options will export the appropriate files
into the connected USB disk:
System – Export all System Settings

One File – Export a single Test file
System and All Files – Export all System Settings and Test files
All Files – Export all Test files
For example if you decide to export a single test file select Export One File and all the test files that
are on the instrument internal memory will be displayed. Select the test file that needs to be
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exported and the screen will display the export progress and once the export is complete the
following confirmation screen will appear:
If the Test file with the same name already exists on the USB disk the following message will
appear:
4.4 SECURITY
From the Main Menu select Security and the following screen will appear:
The first option under Security allows the user to set Security to ON or OFF. Select Security using
the touchscreen keypad and choose between ON or OFF.
The next option under security is User Setup where multiple users can be added and assigned
different privileges. To add a user select User Setup from the Security screen and the following
screen will appear:
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1. To add a user, select the Add User icon and the following screen will appear where an alpha-
numerical user ID can be entered and saved.
2. After the User ID is entered, the next screen will ask for entering a Password for the newly
added User ID.
3. Using the numeric keypad enter a password for the newly created User ID. After the password
is entered another screen will appear to confirm the Password.
Once the Password is confirmed the next screen will display the Security Level options for the
newly added User ID. Use the touch screen display to select between Run Only, Recall Setup, Edit
Setup or Full System
The security level descriptions are as follows:

Security Level Description
Full System In this mode the user has full access level to
all instrument setup parameters as well as
system configuration and security levels.
Access at this level should be restricted to
System Administrators
Edit Setup In this mode the user can load files and edit
test parameters.
Recall Setup This mode allows the user to load previously
configured test files but it does not allow any
editing of the parameters. In this mode the
user is restricted from access to the "Setup Test
Parameters" screen.
Run Only This is the most restricted mode of user access.
The user can only initiate a test, reset a failure
or abort a test from the Perform Tests screen.
NOTE: whenever a user’s security level is Run

Only, “Single Step” and “Fail Stop” soft keys will
be disabled at the Perform Test screen.
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NOTE: whenever a user’s security level is Run
Only, you may only start at test step 1.
Once a user has been successfully added the User Setup screen will display the newly added user.
From this screen the user settings can be edited:
4.5 FAILCHEK
FAILCHEK is the process by which an instrument’s failure detectors are proven to be functioning
properly. Checking the failure detection circuitry of the electrical safety tester is required by safety
agencies such as CSA, UL, and TÜ V.
NOTE: this process should be performed at the beginning of each day or each shift, before
testing has begun.
Select the FAILCHEK icon from the main menu and the following screen will appear:
4.5.1 Continuity FAILCHEK (Opt.7002 , Opt.7006)

To perform Continuity FAILCHEK, touch the Continuity icon and the following screen will appear:
Follow the instructions on the screen. Press the Test button on the front panel of the instrument
to start the test. If the FAILCHEK test passes, the following screen will appear:
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If the FAILCHEK test fails, the following screen will appear:
4.5.2 Ground Bond FAILCHEK

To perform Ground Bond FAILCHEK, touch the Ground Bond icon and the following screen will
appear:
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4.5.3 AC Hipot FAILCHEK

To perform an AC Hipot FAILCHEK, touch the AC Hipot icon and the following screen will appear:
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4.5.4 DC Hipot FAILCHEK
To perform a DC Hipot FAILCHEK, touch the DC Hipot icon and the following screen will appear:
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4.5.5 IR FAILCHEK
To perform an IR FAILCHEK, touch the IR icon and the following screen will appear:
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4.6 Test Parameters
This section details the various test parameter descriptions. For information on setting up test
sequences, refer to section 4.7. Setup Tests.
From the Main Menu select Setup Tests and the following screen will appear:
4.6.1 Description of Test Parameters

This section details each test parameter and test parameter description.
Test Type: Select the test item.
Voltage: The voltage that is applied to the high voltage and return terminals during a test.
Output Polarity (option): Select the output voltage is Negative or positive for DCW and IR.
Max Lmt T: ACW test only. Total current maximum limit. The maximum current threshold that
triggers a failure when exceeded.
Max Lmt R: ACW test only. Real current maximum limit. The maximum current or resistance
threshold that triggers a failure when exceeded.
Min Lmt T: ACW test only. Total current minimum limit. The minimum current or resistance
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threshold that triggers a failure when not exceeded.
Min Lmt R: ACW test only. Real current minimum limit. The minimum current or resistance
threshold that triggers a failure when not exceeded.
Max Lmt: The maximum current or resistance threshold that triggers a failure when exceeded.
Min Lmt: The minimum current or resistance threshold that triggers a failure when not exceeded.
Hi-Lmt V: The maximum voltage drop threshold that triggers a failure when exceeded.
LO-Lmt V: The minimum voltage drop threshold that triggers a failure when not exceeded.
Ramp Up: The length of time that is allowed for the test voltage to climb from 0 to the
programmed test voltage.
Dwell: The length of time that is allowed for the programmed test voltage to be applied.
Delay: The length of time that the programmed test voltage is applied but no judgment of the set
parameters is made. Judgment of the parameters is not made until the end of the delay time.
Ramp Down: The length of time that is allowed for the test voltage to decay from programmed
test voltage to 0.
Arc Detect: If the Arc Fail mode is set to ON, the program will indicate an arc failure when the arc
current is exceeds this setting. Arc Detect may be selected ON or OFF.
Arc Sense: The maximum allowable threshold for arcing. The numbers 0 through 9 correspond to
the different arc sensitivity levels, 1 meaning the maximum threshold of allowable arcing, 9
meaning the minimum threshold of allowable arcing, and 0 being OFF. Arc detection is not
required for testing.
Frequency: This parameter is available in AC testing only and may be toggled between 50 and 60
Hz.
Continuity (option): This function checks for a connection between the Cont. Check and Return
lead. This is a basic DC continuity check that measures the continuity value but does not display it.
Continuity may be turned ON or OFF.
Offset: Used during the Continuity test to factor out test lead and fixturing resistance. For
information on how to set the offset value, refer to section 4.6.2 Additional Parameter Notes and
Functions.
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Scanner or EX Scanner: (This parameter will only be seen on units equipped with a scanner). The
high voltage channels can be set to a High (H) or Low (L) level giving the operator the capability to
test from one channel to another channel or from any channel to a common Low or Return point.
The channels can be connected in parallel if desired but there is only one leakage current
measurement for all channels. This parameter allows for setup of multiple Scanner channels. The
three different selectable Scanner states are L (scanner channel set to the return point), H
(scanner set to the high voltage point) and O (OFF).
Range: It can through fixed range to reduce the test time.
Prompt: The Prompt function allows you to insert a short line of text in a step. The Prompt will
appear on the screen before the step is initiated and remains on the screen until the TEST button
is pressed. After the TEST button is pressed, the Prompt will clear and the step will initialize.
Defaults: Pressing this soft key will default the test parameters to their predetermined default
values. Once the default soft key is pressed it is necessary to complete the edit either by pressing
the ENTER key to accept the parameter overwrite or the EXIT key to escape from the edit and
return to the original values.
4.6.2 Additional Parameter Notes and Functions
Real Current
The AC Real Current function allows the user to monitor only the real portion of the leakage
current and ignore any reactive components due to capacitance in the device under test. It is
important to recognize that the total current is the vector sum of the reactive and real current, not
the direct addition of the two components. As in a right triangle, the total current is the square
root of the sum of the squares of the real and reactive currents.
Since the real component is usually much smaller than the reactive current, a doubling of the real
current increases the total current by only a small amount. Unless the two components are
separated, a doubling of the real leakage current can go virtually undetected by a total current
measurement.
Because Real Current is installed in SE, additional parameter selections are added to the ACW test
parameters. The additional test parameters are Max Lmt R (Real Current Maximum limit), Min Lmt
R(Real Current Minimum Limit) and Display. The standard total current limits have a “T” next to
them indicating total current.
The AC Real Current function allows the operator to view both real and total current
simultaneously. The Display parameter allows you to select which meter will display the real and
total current. When the display parameter is set for Total, the large current meter will display the
total current and the real current will be displayed in the small current meter below the memory
location name. The opposite is true when the display parameter is set for Real.
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Ramp-HI
The Ramp-HI function is active during the Ramp period only. Ramp-HI will allow current higher
than the normal Max-Lmt current setting of the DC Withstand Voltage test to avoid false failure
due to charging current.
Charge–LO
The Charge-LO function is used to check if the cables are connected properly at the beginning of a
test. A capacitive DUT will draw charging current on the DC Withstand test when the Output is
activated. If the charging current is lower than the setting, the test cables may not be connected
properly. The instrument can set the Charge-LO parameter manually or automatically. To manually
set the Charge-LO current, use the
Please be aware that the program will activate high voltage on the output
connector while the TEST button is pressed.
The program will read the charging current of the DUT and set the Charge-LO current at
approximately one half (1/2) of the reading. The instrument will beep and the new value will
automatically be updated in the field. You do not need to press the ENTER key for the new
parameter to be accepted.
Continuity
The Continuity test is generally used to test the ground conductor of a line cord. If the resistance
exceeds Max-Lmt trip point or drops below the Min-Lmt trip point the SE will signal a continuity
failure. If you are testing products with two prong plugs, do not activate the continuity circuit.
Offset
This function allows the instrument to compensate for lead and test fixture resistance during a
Continuity test
To manually set an Offset value enter a mΩ value via the numeric keypad and then press the
ENTER key to accept the new value or press the EXIT key to escape from the edit.
To automatically set an Offset value, set the output voltage, current, and frequency to the values
that will be used on the DUT and connect the test cables, test fixture, or Scanner channel with
fixturing to the instrument. Next, short the ends of the test cables and press the TEST button. The
instrument will beep and the new value will automatically be updated in the field. You do not need
to press the ENTER key for the new parameter to be accepted.
NOTE: do not connect the DUT to the instrument when performing an offset. This will create
erroneous results when a test is performed.
Setup Tests
This section of the manual details how to setup a test sequence.
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From the Main Menu select Setup Tests and the following screen will appear:
Touch the Add File icon and enter a name for the new file using the touchscreen keypad and use
the enter key (↵) to save the name and move to the next screen.
Next, add a test to the newly created test file:
Touch the Add Step icon to enter the test parameters screen. In this screen, the test type is
selected and all the relevant test parameters are programmed and saved:
Touch the add Bar icon to enter the barcode number. When you scan the barcode number the
same as this parameter that the instrument will recall the test file.
Touch Test Type icon and the following screen will appear:
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4.7.1 ACW
Touch ACW for the test type and use the enter key (↵) to save the Test Type and move to the next
test parameter:
Note: The Offset value can only be set by performing the auto offset. To perform an auto offset
disconnect the DUT and leave all the test leads open. Press the test button on the front panel.
Reading will be displayed on the screen when the instrument is performing the auto offset. Once
the instrument is has finished performing the auto offset the numeric value will be displayed on
the screen and will be automatically saved to be used when the actual test is performed.
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4.7.2 DCW
Select DCW for the test type and use the enter key (↵) to save the Test Type and move to the next
test parameter:
Note:
1. Charge-Lo: The parameter can be set automatically or manually. To perform an auto Charge-
Lo, connect the DUT and all the test leads as needed to perform a real test. Press the test
button on the front panel. Reading will be displayed on the screen when the instrument is
performing the auto Charge-Lo. Once the instrument is has finished performing the auto
Charge-Lo the numeric value will be displayed on the screen and will be automatically saved to
be used when the actual test is performed.
2. Offset: To perform an auto offset disconnect the DUT and leave all the test leads open. Press
the test button on the front panel. Reading will be displayed on the screen when the
instrument is performing the auto offset. Once the instrument is has finished performing the
auto offset the numeric value will be displayed on the screen and will be automatically saved
to be used when the actual test is performed
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4.7.3 IR
Select IR for the test type and use the enter key (↵) to save the Test Type and move to the next
test parameter:
Note: Charge-Lo: The parameter can be set automatically or manually. To perform an auto Charge-
Lo connect the DUT and all the test leads as needed to perform a real test. Press the test button
on the front panel. Reading will be displayed on the screen when the instrument is performing the
auto Charge-Lo. Once the instrument is has finished performing the auto Charge-Lo the numeric
value will be displayed on the screen and will be automatically saved to be used when the actual
test is performed.
4.7.4 GND
Select GND for the test type and use the enter key (↵) to save the Test Type and move to the next
test parameter:
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4.7.5 Continuity (Opt.7002)
Select Continuity for the test type and use the enter key (↵) to save the Test Type and move to the
next test parameter:
4.7.6 View Test Files

Once all tests have been programmed and saved, navigate to the Main Menu. Select the Setup
Tests icon and select the test file that was previously created. The screen should display all tests
that have been programmed in this test file.
For example:
4.7.7 Edit Test Files

Once multiple test files have been programmed and saved the user can edit these files from the
Setup Test menu. From the main menu select Setup Test.
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4.8 PERFORM TESTS
From the main menu select the Perform Test icon and the following screen will appear:
This screen will display the first test that was saved in the test file. If there are multiple test files
saved in the instrument select the Load icon and all the test files will be displayed:
The user can select the desired test file and the first test step in the selected test file will be
displayed.
Meters
The Perform Test screen of the SE has several different meters depending on the type of test being
performed. These meters can be arranged as desired by the user and can also be tied to the user
security setup. The drag and drop feature of the instrument allows the user to set large and small
meters. For example the following screenshot shows the Perform Test screen of the ACW test:
In the image above, the two large meters display the ACW test voltage and the Hi Limit Total. The
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two small meters on the top of the screen display the Hi Limit Real and Dwell Time. Touch any of
the parameters and drag it on to the location of a different parameter and the two meters will be
swapped. For example in the next screen the Hi Limit Total is the smaller meter and the Hi Limit
Real is the bigger meter.
Default System Parameters
SE comes from the factory with the following system presets:

SYSTEM PARAMETERS
Setup Sys. PLC Remote OFF
Single Step OFF
Fail Stop ON
Alarm 5
Results Last
Address (GPIB only) 8
Smart GFI ON
Results Last
Cal Alert ON
Security Password from Factory 0
Security based on Password OFF
Memory, Step, and Default System Parameter Initialization
Initializing the instrument will overwrite all memories and steps with ACW
default parameters!
All memories and steps will be loaded with the ACW default parameters and the System
parameters will be set to the factory defaults. The default system parameters are as follows:
Setup Sys. PLC Remote OFF

Single Step OFF
Fail Stop ON
Results Last
Address (GPIB only) 8
Smart GFI ON
Results Last
Cal Alert ON
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Date mdy
The following System parameters will not be affected by the system initialization:
Setup Sys. Cal Date No change

Cal Due No change
Alert No change
Date No change
Time No change
Security Password No change
Security No change
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5. Test Connections
5.1 Connecting the Test Leads

The instrument comes with all cables necessary for performing a Hipot and Continuity test. Plug
the red alligator clip into the HV receptacle on the SE. Connect one of two black alligator clip leads
to the Return receptacle and the other to the Cont. Check receptacle.
5.2 Connecting the Adaptor Box

The adapter box provides an easy way to connect a line cord-terminated DUT to the SE.
5.3 Interlock Connector

SE is equipped with a Remote Interlock feature. Remote Interlock utilizes a set of closed contacts
to enable the instrument’s output. If the Remote Interlock contacts are open the output of the
instrument will be disabled. Remote Interlock can also be referred to as a remote system lockout,
utilizing “fail when open” logic. To disable the Remote Interlock feature connect the Interlock Key
into the Signal Input port located on the back of the tester.
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6. Results Screens
After a test has completed the Results icon will be available on the screen. For example:
Select the Results icon to enter the results screen. The Results screen will appear as follows:
The Results screen allows you to view the results of the last test step the instrument performed
and the results of the previously performed tests. Select Present Test to view test results from the
current test sequence that was executed. Select any test step to view more details regarding the
test:
Select Int. Memory to view all the test results stored on the internal memory of the instrument.
Scroll down to view all the test results:
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Touch and hold any test step result on the previous screen and a new screen will pop up:
From this screen you can transfer All results to a USB disk, delete All results or delete a single
result. To transfer results to a USB disk select the Transfer icon and a new pop up screen will
appear where a file name must be entered for the results file. The results will be saved on the USB
disk with this file name.
Once you assign and save a file name the following screen will appear showing the transfer status:
Once the results file transfer is complete a message will appear on the screen confirming the
successful transfer along with the results file name that was previously assigned:
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Selecting Delete All function will simply delete all the test results from the internal memory.
Selecting Delete will delete a selected step.
6.1 Error Messages and Fail Messages
If there is an error during testing, the error description will be displayed on the screen. Below is a
list of error messages that the SE reports:
Abort: This message appears on the display if the test in process is aborted with the RESET button
or remote Reset control.
Hi-Limit: This message appears on the display if the DUT measurement exceeds the Hi-Limit
setting of any parameter.
Lo-Limit: This message appears on the display if the DUT measurement drops below the Lo-Limit.
CONT-Fail: This message appears on the display if the DUT fails the basic continuity check
performed during an AC/DC Withstand test (if Continuity is selected “ON”).
Arc-Fail: This message appears on the display if the DUT arcing current exceeds the Arc Sense limit
and Arc function is active (Arc Sense = 1…9) of the AC/DC Withstand test.
Short: This message appears on the display if the DUT current is well beyond the metering range
of the test.
Charge-LO: This message appears on the display if the leakage current during Ramp-up falls below
the Charge -LO setting.
Breakdown: This message appears on the display if the DUT current is well beyond the metering
range of the test and the arcing condition beyond the arc sense limit.
GND-Fault: This message appears on the display if the GFI threshold is exceeded during the test.
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Interlock Open: This message appears on the display if the Remote Interlock feature is activated
before or during a test. The Remote Interlock feature utilizes a set of closed contacts which will
disable the instrument’s output if they are opened before or during a test. Remote Interlock could
also be referred to as a remote system lockout, utilizing “fail when open” logic. The Remote
Interlock feature may be disabled by plugging the “Interlock Disable Key” provided into the Signal
Input connector. See section 6.2. Remote Signal Inputs and Memory Access for more information.
Output Error: This message appears on the display, if the instruments output reading does not
match the setting. This message will only be seen if the EXIT key is pressed at the Output Error
screen. If the instrument has an output problem when the TEST button is pressed, the Output
Error screen will appear as follows:
The RESET button is not active in this situation. Only the EXIT key will allow you to return to the
Perform Test screen.
Fatal Error: If the instrument has a Fatal Error failure then the following screen will appear:
All of the buttons and keys are not active in this situation. You should contact EEC to receive
further instruction.
Fatal Error identification number will represent type of the failure that occurs.
Error number of 9002 will appears on the display, if the instrument’s System data or
Model/Option/Serial Number data are corrupted and does not match the setting.
Error number of 9003 will appears on the display, if the instrument’s Calibration data is corrupted.
Error code Explain

USB device error.(9) Read barcode error
USB device error.(10) Open file error
USB device error.(11) Load file error
USB device error.(12) File write error
USB device error.(13) File read error
USB device error.(14) Files written to content error
USB device error.(15) File closed error
USB device error.(16) Read the file size error
USB device error.(17) Reading USB disk directory error
USB device error.(18) Read DISK remaining capacity error
USB device error.(19) Read DISK format error
USB device error.(20) Read the byte position error
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DATA hole insert unrecognized DISK, or BARCODE hole
USB device error.(22)
insert unrecognized BARCODE
USB device error.(23) Search HU4 file error

USB device error.(24) Delete file error
USB device error.(26) USB device error
Does not support this USB
DISK format error. It support FAT16 and FAT32
device.(61)
EE ERROR Abnormal code read when during reading step
MEMORY ERROR Program is not functioning properly
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7. Connection of Remote I/O
Two 9-pin “D” type connectors mounted on the rear panel provide REMOTE-INPUT-OUTPUT
control and information. These connectors mate with a standard 9 pin D-sub-miniature connector
provided by the user. The output mates to a male (plug) connector while the input mates to a
female (receptacle) connector. For best performance, a shielded cable should be used. To avoid
ground loops the shield should not be grounded at both ends of the cable. Suggested AMP part
numbers for interconnecting to the Remote I/O are shown below:
7.1 Remote Signal Outputs

The rear panel connector provides three output signals to remotely monitor PASS, FAIL, and
PROCESSING conditions. The monitoring signals are provided by three normally open internal
relays that toggle ON and OFF to indicate the condition of the tester. These are normally open free
contacts and will not provide any voltage or current. The ratings of the contacts are 1 AAC / 120
VAC (0.5 ADC / 24 VDC). The signal outputs are provided on the 9-pin female “D” type connector.
Below is a list that indicates what conditions activate each pin. When a terminal becomes active
the relay closes thereby allowing the external voltage to operate an external device.
Pins 1 and 2 provide the PASS signal.

Pins 3 and 4 provide the FAIL signal.
Pins 5 and 6 provide the PROCESSING signal.
Pins 7 and 8 provide the RESET signal.
The following describes how the relays operate for each test condition:
PROCESSING – The relay contact closes the connection between pin (5) and pin (6) while the
instrument is performing a test. The connection is opened at the end of the test.
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PASS – The relay contact closes the connection between pin (1) and pin (2) after detecting that the
item under test passed all tests. The connection is opened when the next test is initiated or the
reset function is activated.
FAIL – The relay contact closes the connection between pin (3) and pin (4) after detecting that the
item under test failed. The connection will open when the next test is initiated or the reset
function activated.
RESET OUT – The relay contact closes the connection between pin (7) and pin (8) while the reset
function is activated. This is only a continuous closure dependent on the length of time the reset
button is held in an active state.
7.2 Remote Signal Inputs and Memory Access

The SE remote connector enables remote operation of the TEST, RESET, and REMOTE INTERLOCK
functions, and allows the operator to select one of 10 pre-programmed test files.
When the PLC Remote mode is on, the SE will respond to simple switch or relay contacts closures.
A normally open momentary switch can be wired across pins 3 and 5 to allow remote operation of
the TEST function. A minimum pulse width or contact closure of 20mS is required to guarantee a
test start. A normally open momentary switch can be wired across pins 2 and 5 to allow remote
operation of the RESET function. A minimum pulse width or contact closure of 50mS is required to
guarantee that a running test will abort. When the PLC remote function is (ON) the TEST switch on
the front panel will be disabled to prevent a test from being activated through this switch. For
safety, the front panel RESET switch remains active even when a remote reset switch is connected
so that high voltage can be shut down from either location.
The Remote File Select function gives the user the capability to quickly change parameters and
initiate a test remotely. Ten pre-programmed test files can be accessed by connecting pins 1, 6, 8
and 9 to the common pin 7, in different combinations. The memory select bits should be set
simultaneously and remain set for a minimum of 20ms to guarantee that the correct memory will
be selected. However, the memory select bits may be set in sequential manner, provided that the
time delay between each bit is less than 4ms. When the desired bit pattern has been established it
should remain set for a minimum of 20ms to guarantee that the correct memory will be selected.
The Remote File Select Truth Table (binary) shows the different combinations of momentary
switch (relay) closures, and which memory programs that will be selected as the result. It may be
necessary to "OR" the momentary switches (relay contacts) to prevent incorrect program selection
due to timing errors.
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REMOTE FILE SELECT TRUTH TABLE
BIT 4 BIT 3 BIT 2 BIT 1 FILE #
0 0 0 1 01
0 0 1 0 02
0 0 1 1 03
0 1 0 0 04
0 1 0 1 05
0 1 1 0 06
0 1 1 1 07
1 0 0 0 08
1 0 0 1 09
1 0 1 0 10
1 0 1 1 11
1 1 0 0 12
1 1 0 1 13
1 1 1 0 14
1 1 1 1 15
1= Momentary Contact closure between BIT and COMMON
0= No Contact closure between BIT and COMMON
When you want to recall the file 3 that the signal of BIT4 to BIT1 are 0011.
ACTIVATING MEMORY PROGRAM FUNCTIONS THROUGH THE REMOTE

CONNECTOR, SELECTS THE PROGRAM AND STARTS THE TEST WHICH IS
PREPROGRAMMED INTO THAT MEMORY
ACTIVATION DES FONCTIONS DE MÉMOIRE PROGRAMME VIA LE CONNECTEUR REMOTE ,

SÉLECTIONNE LE PROGRAMME ET LANCE LE TEST QUI EST PRÉPROGRAMMÉ DANS CETTE
MÉMOIRE
DO NOT CONNECT VOLTAGE OR CURRENT TO THE SIGNAL INPUTS, THIS

COULD RESULT IN DAMAGE TO THE CONTROL CIRCUITRY.
NE PAS CONNECTER TENSION OU DE COURANT AUX ENTRÉES DE SIGNAL, CELA POURRAIT

PROVOQUER DES DOMMAGES AU CIRCUIT DE CONTRÔ LE
Remote Interlock
SE series is equipped with a Remote Interlock feature. Remote Interlock utilizes a set of closed
contacts to enable the instrument’s output. If the Remote Interlock contacts are open the output
of the instrument will be disabled. Remote Interlock could also be referred to as a remote system
lockout, utilizing “fail when open” logic. If the Remote Interlock contacts are open and the TEST
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button is pushed, a pop-up message will be displayed on the screen for two seconds. The message
If the Remote Interlock contacts are opened during a test, the pop-up message will be displayed
and the test will abort. The hardware and has been configured to provide the interlock
connections on pins 4 and 5 of the Remote Interface, Signal Input port. The instrument can still be
used without the external interlock device as long as the Interlock Disable Key (38075 provided
with unit) is plugged into the Remote Interface, Signal Input port. If there is nothing connected to
the Remote Interface, Signal Input port to provide a connection to the Remote Interlock, the
instrument will not perform tests.
7.3 Timing
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8. Bus Remote Interface GPIB / USB / RS-232
This section provides information on the proper use and configuration of bus remote interface.
The USB / RS-232 remote interface is standard on SE series but the GPIB (IEEE-488) interface
option can be substituted for the USB / RS-232 interface. Please refer to the Option section of this
manual for details on the SE SERIES options. The USB / RS-232 interface also uses the same
command set as the GPIB interface for setting of test parameters. However there are many
functions of the GPIB 488.2 interface that are not available through USB / RS-232. The IEEE-488
interface included with SE SERIES conforms to the requirements of the IEEE-488.2 standard.
8.1. RS-232 Interface
This interface provides all of the control commands and parameter setting commands of the GPIB
interface with the exception of some of the 488.2 Common Commands and SRQ capability. All
commands can be found in section 8.4. USB / RS-232/GPIB Command List. The identification
command *IDN and the Status Reporting commands are also available through RS-232.
8.1.1. RS-232 Connector

The RS-232 cabling should be configured as follows for a 9-pin serial port interface
SE PC / Bus Controller
RD 2 2 RD
TD 3 3 TD
SIG 5 SIG
5
GND GND
8.1.2. Communications Port Configuration

The COM port should have the following configuration:
 9600 baud
 8 data bits
 1 stop bit
 No parity
This interface does not support XON/XOFF protocol or any hardware handshaking. The controller
should be configured to ignore the handshaking lines DTR (pin 4), DSR (pin 6) CTS (pin 8) and RTS
(pin 7). If the port cannot be configured through software to ignore these lines the handshake
lines should be jumpered together in two different sets. Pins 4 and 6 should be jumpered together
and pins 7 and 8 should be jumpered together at the controller end of the cable.
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8.1.3. Sending and Receiving Commands
Sending Data
Once a command is sent to the instrument over the RS-232 bus the instrument will send one of
two responses. If the transfer was recognized and completed the instrument will return with 06
hex or 6 decimal, the Acknowledge (ACK) ASCII control code. If there is an error with the command
string that is sent, the instrument will respond with 15 hex or 21 decimal, the Not Acknowledge
(NAK) ASCII control code. The ACK or NAK response allows for software handshaking to monitor
and control data flow.
Receiving Data
When requesting data from the instrument it will automatically send the data back to the
controller input buffer. The controller input buffer will accumulate data being sent from the
instrument, including the ACK and NAK response strings, until it has been read by the controller.
 If you write a program, instructions and instructions need to be more than 150 milliseconds
interval between the buffer time (instruction readback time as short as 150 milliseconds)
8.2 GPIB Interface (Opt.109)

This interface is optional on the SE and provides all of the control commands and parameter
setting commands of the USB/RS-232 interface along with 488.2 Common Commands and SRQ
capability. All commands can be found in section 8.4. USB/RS-232/GPIB Command List.
8.2.1 GPIB Connector

Connection is usually accomplished with a 24-conductor cable with a plug on one end and a
connector at the other end. Devices may be connected in a linear, star or a combination
configuration.
The standard connector is the Amphenol or Cinch Series 57 Microribbon or AMP CHAMP type. The
GPIB uses negative logic with standard transistor-transistor logic (TTL) levels. When DAV is true,
for example, it is a TTL low level ( 0.8 V), and when DAV is false, it is a TTL high level ( 2.0 V).
Restrictions and Limitations on the GPIB

 A maximum separation of 4 m between any two devices and an average separation of 2 m
over the entire bus.
 A maximum total cable length of 20 m.
 No more than 15 device loads connected to each bus, with no less than two-thirds powered
on. For example 1 GPIB controller and a maximum of 14 GPIB instruments.
 NOTE: A bus extender, which is available from numerous manufacturers, is available to
overcome these limitations.
8.2.2 GPIB Address

Each device on the GPIB (IEEE-488) interface must have a unique address. You can set the address
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of the SE to any value between 0 and 30. The address can only be set from the front panel. The
address is stored in non-volatile memory and does not change when the power has been off or
after a remote reset.
 The address is set to 8 when the instrument is shipped from the factory.
8.3 Interface Functions

The capability of a device connected to the bus is specified by its interface functions. These
functions provide the means for a device to receive, process, and send messages over the bus. The
interface functions are listed in the chart below.
GPIB 488.1 INTERFACE FUNCTIONS

INTERFACE FUNCTION SUBSET DESCRIPTION
Source Handshake SH1 Complete Source handshake capability
Acceptor Handshake AH1 Complete Acceptor handshake capability
Talker T6 Talker functions (unaddress if MLA)
Listener L4 Listener functions (unaddress if MTA)
Service Request SR1 Complete Service request capability
Remote Local RL0 No remote/local capability
Parallel Poll PP0 No parallel poll capability
Device Clear DC1 Complete Device clear capability
Device Trigger DT0 No device trigger capability
Controller C0 No controller capability
Electrical Interface E2 Three-state drivers
Controllable Items Test and Reset control.
Setting of test parameters for tests.
Reading of instrument status and test results.
Data Codes ASCII
Delimiter NL (+ EOI)
8.4 USB/RS-232 / GPIB Interface Command List
Echo and Response Considerations
USB/RS-232 Responses
The USB/RS-232 bus will automatically send any response back to the controller's input buffer.
GPIB Queries and Responses

The SE GPIB bus will not send any data to the controller without being queried. A GPIB read
command must be sent after a command string to retrieve any data from a query command (?).
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8.4.1 Rules for Sending Commands to the Instrument
The following conventions are used to describe the commands syntax for SE:
 Braces ({ }) enclose each parameter for a command string.
 Triangle brackets (< >) indicate that you must substitute a value for the enclosed parameter.
 The Pipe ( | ) is used to separate different parameter options for a command.
 The command and the parameter data must be separated with a space.
 Each command string should be terminated by the ASCII control code, New Line (NL), (OAh)
or the end of line (EOL) message for GPIB.
 All commands that end with a question mark (?) are query commands and required an IEEE-
488 read command to retrieve the data from the device's output buffer.
8.4.2 Test Execution Commands

The following commands are used to control actual output voltage and current from the
instrument. Please observe all safety precautions.
COMMAND DESCRIPTION
TEST Execute a Test
RESET Abort a test in Process or Reset Failures
SAO Set Auto-Offset
SACG Set Auto-Charge-LO
TEST
Starts the test sequence at the selected step loaded into memory (RAM).
RESET
Stop or abort a test. Also used to reset a latched failure condition.
SAO
Set the offset for the Continuity test. The cables and any test fixture should be connected before
executing the command. This command will perform an actual test and all safety precautions
should be observed when using this command.
SACG
Set the Charge-LO parameter for the DCW or IR test. The cables and any test fixture should be
connected before executing the command. The test parameters that are set for the step will be
used when performing the auto setting. This command will perform an actual test and all safety
precautions should be observed when using this command.
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8.4.3 File Editing Commands
The following commands are used to create or modify Test Setup Files.
 Commands should be separated from parameters by a space.

 If multiple parameters are entered, they should be separated by commas.
COMMAND DESCRIPTION VALUE

FL <memory number> File Load memory number = 001-200
FN nn,xxxx File Name nn=01-2000, xxxx=name
FD File Delete Current file in use
FD nn File Delete nn nn=1-200
FS File Save Current file in use
FSA nn,xxxx File Save As nn=1-200, xx=Name
FT? File Total
ST? Step Total
SS <step number> Step Select step step number = 1-200
number
SS? Step Select ?
SAA Step Add ACW test
SAD Step Add DCW test
SAD- Step Add DCW- test
SAI Step Add IR test
SAG Step Add GND test
SAC Step Add CONT test
ADD2 <n,p1,p2,p3…> Add all parameters of n=test type, p=parameters
a test step
ADD3 <n,p1,p2,p3…> Add all parameters of n=test type, p=parameters
a test step
SD Step Delete current
SD nn Step Delete nn nn=01-200
SP <prompt message> Step Prompt Create prompt message = Valid ASCII (1)
maximum 32 characters
SP Step Prompt Delete
LP? List Prompt
LP nn List Prompt current
(1) "Valid ASCII" is the character set that is available from the front panel LCD user interface.
Consisting of upper case alphabet (A-Z), numbers (0-9) and decimal point (.), asterisk (*), dash (-),
under bar (_), tilde (~) and space (SP).
FL <memory number>
Load a file by memory number from non-volatile memory into random access memory RAM.
FN < file name>

Creates a new file name for the active memory loaded into RAM.
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SS <step number>
Selects the active selected step to load into RAM. The step must first be selected before any
specific parameters can be edited.
SAA, SAD, SAI, SAG, SAC

These commands add the appropriate test type within the memory at the step location that has
been selected. The parameters of the previous test type will be deleted and the default values
for the new test type will be recalled. If the same test type is selected that already exists, the
default values will replace the previous parameters.
ADD2 <n, p1,p2,p3…>

This command edits all parameters in a step. Parameters will be edited at the step location that
has been selected. See the command summary tables below to see the specific test type for each
of these commands
The parameter <n> indicates the test type. The values ACW, DCW, IR, GND, or CONT must be used.
The parameters <p1,p2> etc. indicate the individual settings for each parameter of the test. All
parameters must be included with the command and should appear in the same order that is
shown in the table below. Also, like the individual parameter editing commands, the unit should
not be included with the value; only the numeric value should be included in the command string.
When the scanners are being used they should be appended to the end of the string, with the
internal scanner first if installed, followed by the external scanner if connected to the rear panel
scanner control port.
The list of parameters can also be found in the default parameters section of the manual, or refer
to Section 7.4.5 Test Parameter Editing Commands and Companion Queries for the proper values.
The parameter values for file editing commands should use complete text (i.e. "ON" and "OFF" or
“Real” and “Total”) and not use the coded values that are associated with the test parameter
setting commands discussed in Test Parameter Editing Commands and Companion Queries. The
LS? companion command will also list all parameters in complete text in the order as they appear
in the following table, preceded by the step number. The following table shows examples of the
ADD2 and LS2 commands:
ADD2 all parameters for one STEP n=type,

p=parameters
ADD2 ACW,Voltage,HI-Limit T,LO-Limit T,Ramp Up,Dwell Time, Ramp SCANNER install,
Down,Arc Sense,HI-Limit R,LO-Limit R,Offset, Frequency,Arc Scanner Setup
Dectect,Continuity,Range,Scanner Setup parameter exise
ADD2 DCW,Voltage,HI-Limit,LO-Limit,Ramp Up,Dwell Time, Ramp SCANNER install,
Down,Charge LO,Arc Sense,Offset,Ramp-HI,Arc Dectect,Continuity,Range,Low Scanner Setup
Range,Scanner Setup parameter exise
ADD2 DCW-,Voltage,HI-Limit,LO-Limit,Ramp Up,Dwell Time, Ramp SCANNER install,
Down,Charge LO,Arc Sense,Offset,Ramp-HI,Arc Dectect,Continuity,Range,Low Scanner Setup
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ADD2 IR,Voltage,HI-Limit,LO-Limit,Ramp UP,Delay Time,Dwell Time,Ramp SCANNER install,
Down,Charge LO,Scanner Setup Scanner Setup
parameter exise
ADD2 GND,Current,Voltage,HI-Limit,LO-Limit,Dwell Time, SCANNER install,
Offset,Frequency,Scanner Channel Scanner Channel
parameter exise
ADD2 CONT.,HI-Limit,LO-Limit,Dwell Time,Offset,Scanner Channel SCANNER install,
Scanner Channel
parameter exise
When Continuity
delay option is off.
LS2? & LS2 nn? Response Data format
Step number,ACW,Voltage,HI-Limit T,LO-Limit T,Ramp UP,Dwell, SCANNER install,
Ramp Down,Arc Sense,HI-Limit R,LO-Limit R,Offset, Scanner Setup
Frequency,Arc Dectect,Continuity,Range,Scanner Setup parameter exise
Step number,DCW,Voltage,HI-Limit,LO-Limit,Ramp Up,Dwell Time, SCANNER install,
Ramp Down,Charge LO,Arc Sense,Offset,Ramp-HI, Scanner Setup
Arc Dectect,Continuity,Range,Low Range,Scanner Setup parameter exise
Step number,-DCW,Voltage,HI-Limit,LO-Limit,Ramp Up,Dwell Time, SCANNER install,
Ramp Down,Charge LO,Arc Sense,Offset,Ramp-HI, Scanner Setup
Arc Dectect,Continuity,Range,Low Range,Scanner Setup parameter exise
Step number, IR,Voltage,HI-Limit,LO-Limit,Ramp UP,Dwell Time, SCANNER install,
Delay Time,Ramp Down,Charge LO,Scanner Setup Scanner Setup
parameter exise
Step number, GND,Current,Voltage,HI-Limit,LO-Limit,Dwell Time, SCANNER install,
Offset,Frequency,Scanner Channel Scanner Setup
parameter exise
Step number,CONT.,HI-Limit,LO-Limit,Dwell Time,Offset, SCANNER install,
Scanner Setup Scanner Channel
parameter exise
When Continuity
Step number,CONT,HI-Limit,LO-Limit,Dwell Time,Offset, SCANNER install,
Scanner Channel Scanner Channel
parameter exise
When Continuity
delay option is on.
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ADD3 all parameters for one STEP n=type, p=parameters
ADD3 ACW,Voltage,HI-Limit T,LO-Limit T,Ramp Up,Dwell Time,Ramp Down, SCANNER install,
Arc Sense,HI-Limit R,LO-Limit R,Offset,Frequency,Arc Dectect,Continuity, Scanner Setup
ADD3 DCW,Voltage,Output Polarity,HI-Limit,LO-Limit,Ramp Up,Dwell Time, SCANNER install,
Ramp Down,Charge LO,Arc Sense,Offset,Ramp-HI,Arc Dectect,Continuity, Scanner Setup
Range,Low Range,Scanner Setup parameter exise
ADD3 -DCW,Voltage,HI-Limit,LO-Limit,Ramp Up,Dwell Time,Ramp Down, SCANNER install,
Charge LO,Arc Sense,Offset,Ramp-HI,Arc Dectect,Continuity,Range,Low Scanner Setup
ADD3 IR,Voltage,Output Polarity,HI-Limit,LO-Limit,Ramp UP,Delay Time, SCANNER install,
Dwell Time,Ramp Down,Charge LO,Scanner Setup Scanner Setup
parameter exise
ADD3 GND,Current,Voltage,HI-Limit,LO-Limit,HI-Limit V,LO-Limit V,Dwell SCANNER install,
Time,Offset,Offset V,Frequency,Scanner Channel Scanner Channel
parameter exise
ADD3 CONT.,HI-Limit,LO-Limit,Dwell Time,Offset,Scanner Channel SCANNER install,
Scanner Channel
parameter exise
When Continuity
LS3? & LS3 nn? Response Data format
Step number,ACW,Voltage,HI-Limit T,LO-Limit T,Ramp UP,Dwell,Ramp Down, SCANNER install,
Arc Sense,HI-Limit R,LO-Limit R,Offset,Frequency,Arc Dectect,Continuity, Scanner Setup
Step number,DCW,Voltage,Polarity,HI-Limit,LO-Limit,Ramp Up,Dwell Time, SCANNER install,
Ramp Down,Charge LO,Arc Sense,Offset,Ramp-HI, Arc Dectect,Continuity, Scanner Setup
Range,Low Range,Scanner Setup parameter exise
Step number,-DCW,Voltage,HI-Limit,LO-Limit,Ramp Up,Dwell Time,Ramp SCANNER install,
Down,Charge LO,Arc Sense,Offset,Ramp-HI, Arc Dectect,Continuity,Range,Low Scanner Setup
Range,Scanner Setup
parameter exise
Step number, IR,Voltage,Polarity,HI-Limit,LO-Limit,Ramp UP,Delay Time,Dwell SCANNER install,
Time,Ramp Down,Charge LO,Scanner Setup Scanner Setup
parameter exise
Step number,GND,Current,Voltage,HI-Limit,LO-Limit,HI-Limit V,LO-Limit SCANNER install,
V,Dwell Time,Offset,Offset V,Frequency,Scanner Channel Scanner Setup
parameter exise
Step number,CONT.,HI-Limit,LO-Limit,Dwell Time,Offset,Scanner Channel SCANNER install,
Scanner Channel
parameter exise
When Continuity
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SP <prompt message>
Adds or edits a prompt message for the active step.
SP
Removes or deletes the prompt that had been created for the active step.
8.4.4 Test Parameter Editing Commands and Companion Queries

These commands are used to modify the test parameter within each step. These commands
require a parameter value to be included with the command. The companion query command will
read the parameter. The writing of the parameter requires that the unit not be included with the
value, only the numeric value should be included with the command. Also, when the query
commands are used the response will not include the unit’s characters. Many of the commands
will function the same way for multiple test types; however, the input range may be different and
therefore used a different possible set of values.
COMMAND NAME TEST VALUE

TYPES
ED {1|0} Edit Current Meter ACW 1 = Real, 0 = Total
ED? Display
EV <value> Edit Voltage ACW 1 - 5000V
EV? DCW 1 - 6000V
IR 1 - 6000V
GND 3.00 - 8.00V
EC <value> Edit Current GND 1.00 - 32.00A
EC?
EPO n Edit Current Polarity DCW 0=+
EPO? IR 1=-
ECG < value > Edit Charge-Lo DCW 0.0 - 350.0uA
ECG? IR 0.000 - 3.500uA
ECT {1|0} Edit Continuity ACW 1= On, 0=Off
ECT? DCW
ERU < value> Edit Ramp-Up ACW 0.1 - 999.9s
ERU? DCW
IR
ERD <value > Edit Ramp-Down ACW 0.0 - 999.9s
ERD? DCW 0, 1.0 - 999.9s
IR 0, 1.0 - 999.9s
ERH n Edit Ramp-Hi n DCW n=0-10000uA
ERH?
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TYPES
EDW < value > Edit Dwell ACW 0, 0.4 - 999.9s
EDW? DCW 0, 0.4 - 999.9s
IR 0, 0.5 - 999.9s
GND 0, 0.5 - 999.9s
CONT 0, 0.3 - 999.9s
EDE < value > Edit Delay IR 0.5 – 999.9s
EDE?
EO < value > Edit Offset ACW 0
EO? DCW 0.0 -10000uA
GND 0 - 200mΩ
CONT 0.0 -10.00
EOV < value > Edit Offset Voltage GND 0.00 – 6.00
EOV?
EA < value > Edit Arc ACW 1–9
EA? DCW
EAD {1|0} Edit Arc-Detect ACW 1= On, 0=Off
EAD? DCW
EHT < value > Edit Hi-LIMIT-T ACW by Model
EHT?
EHR < value > Edit Hi-LIMIT-R ACW by Model
EHR?
EH < value > Edit Hi-LIMIT DCW 0.0 - 10000uA
EH? IR 0, 0.05 - 50000M
GND 0, 0 - 600m
CONT 0, 0.00 - 2000
EHV < value > Edit Hi-LIMIT V GND 0.00 – 6.00
EHV?
ELV < value > Edit Lo-LIMIT V GND 0.00 – 6.00

ELV
ELT < value > Edit Lo-LIMIT-T ACW by Model

ELT?
ELR < value > Edit Lo-LIMIT-R ACW by Model
ELR?
EL < value > Edit Lo-LIMIT DCW 0.0 - 10000uA
EL? IR 0.05 - 50000M
GND 0, 0 - 600m
CONT 0.0 - 2000 
EF n Edit Frequency ACW n=0-3, 0=50Hz, 1=60Hz,
EF? GND 2=400Hz, 3=800Hz
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TYPES
ES xxxxxxxx…. Edit Scanner-HLO ACW xxxxxxxx=H,L,O
ES? xxxx DCW
IR
CONT
ESN nn Edit Scanner GND nn=1~16 or 24 by Model
ESN?
EIS xxxxxxxx…. Edit Scanner-HLO ACW xxxxxxxx=H,L,O
EIS? xxxx DCW
IR
CONT
EES xxxxxxxx…. Edit Scanner-HLO ACW xxxxxxxx=H,L,O
EES? xxxx DCW
IR
CONT
ERG n Edit Range ACW n=0-1
ERG? DCW 0=Auto, 1=Fixed
ELG n Edit Low Range DCW n=0-1
ELG? 0=Off, 1=On
8.4.5 System Parameter Editing Commands and Companion Queries

These commands are used to modify the system parameters for the instrument. These commands
require a parameter value to be included with the command. The companion query command will
read the parameter using the same value that is used for setting the parameter.
COMMAND NAME VALUE

SPR < value > PLC Remote 1= On, 0=Off
SPR?
SSI < value > Single Step 1= On, 0=Off
SSI?
SF < value > Fail Stop 1= On, 0=Off
SF?
SAL < value > Alarm Volume 0-9
SAL?
SL < value > Lock 1= On, 0=Off
SL?
SSG2 < value > Smart GFI n=0, or 0.4 - 5mA
SSG2?
SSS < value > Screensaver 1= On, 0=Off
SSS?
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COMMAND NAME VALUE
SAF < value > ARC Frequency 1=10k-150k Hz, 0=10k-30k Hz
SAF?
SR < value > Results 0=LAST, 1=ALL, 2=P/F
SR?
SCA < value > Cal Alert 1= On, 0=Off
SCA?
SCDA < value > Cal Date 0=ymd, 1=mdy, 2=dmy
SCDA?
SCDU < value > Cal Due 0=ymd, 1=mdy, 2=dmy
SCDU?
SA < value > Alert Date 0=ymd, 1=mdy, 2=dmy
SA?
SDT < value > System Date 0=ymd, 1=mdy, 2=dmy
SDT?
SDF < value > Date Format 0=ymd, 1=mdy, 2=dmy
SDF?
STM < value > Time hh,mm (24hr)
STM? hh,mm,AM or hh,mm,PM (12hr)
according to STF setting
STF < value > Time Format 0=12hr, 1=24hr
STF?
SPID nnnnnnn Device ID 0 - 9999999
SPID?
SPD n System Display ID n=0-1
SPD? 0=Off, 1=On
SPRE < value > Prn Result n n=0-1
SPRE? 0=FAIL, 1=ALL
SPS < value > Prn Setting n 1= On, 0=Off
SPS?
SFF < value > Form Feed n 1= On, 0=Off
SFF?
SIS Import System
SIF nnnnnnnn Import File nnn=name
SIAF nnnnnnnn Import All File nnn=name
SIAD nnnnnnnn Import All Data nnn=name
SRF? Read USB.HU4 File
SRAF? Read USB.AF File
SRAD? Read USB.AFS File
SES Export System
SEF n Export File nnn=name
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COMMAND NAME VALUE
SEAF nnnnnnnn Export All File nnn=name
SEAD nnnnnnnn Export All Data nnn=name
SMM n Home Screen n=0-2, 0= Menu, 1= Perform Tests,
SMM? 2=My Menu
SAN n Animation n=0-1
SAN? 0=Continue, 1=Pause
SLA n Language n=0-2,
SLA? 0=English, 1=Traditional Chinese
3=Simplified Chinese
SAV n Auto Save n=0-1
SAV? 0=Off, 1=On
STS n Touch Sound n=0-1
STS? 0=Off, 1=On
SHK n Hardware Key n=0-1
SHK? 0=Off, 1=On
SPV n ProVOLT n=0-1
SPV? 0=Off, 1=On
SGP n GPIB Address n=0-30
SGP?
SCT n Color States 1=Vivid,0=Dull
SCT?
SBR n Baud rate 0=9600,1=19200,2=38400,3=57600
SBR? 4=115200
STR n Test Results n=0-3
STR? 0=None, 1=Fail, 2=Pass, 3=All
SRL n Results Limit n=0-100000
SRL?
STL n Time Limit n=0-99
STL?
SRN nnnnnnnn Results Name nnn=name
SRN?
SJAB n JigA/JigB n=0-1
SJAB? 0=Off, 1=On
SSC n Scanner n=0-1
SSC? 0=4W+4W, 1=8W+8W
SMS n Memory n=0-2f
SMS? 0=SE, 1=7730, 2=7400
SUL n? User n=0-5 Name, Password, Level
SUA p,p,p,p User Add SUA Pointer,Name,Password,Level
Pointer: 1-5
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COMMAND NAME VALUE
Name: 8 character max
Password: 8 number max
Level: 0=Run Only,
1=Recall Setup,
2=Edit Step,
3=Full System
SUD n User Delete n=1-5
SUE p,p,p,p User Edit SUA Pointer,Name,Password,Level
Pointer: 1-5
Name: 8 character max
Password: 8 number max
Level: 0=Run Only,
1=Recall Setup,
2=Edit Step,
3=Full System
SM n Measurement n=0-1
SM? 0=True RMS, 1=Average
SBI n Barcode IP Format n=0-6
SBI? 0=Off, 1=PRO CHEK/SER,
2=PROD/SER, 3=PRODUCT,
4=SERIAL, 5=PROD/SER1/SER2,
6=PROD one/SER
SAS n Auto Start Format n=0-1
SAS? 0=Off, 1=On
8.4.6 Query Commands

These query commands will retrieve data from the instrument. The GPIB bus application requires
an IEEE-488 read command to be sent after the query command. These commands include
functions for retrieving test data, test results and remote hardware status as well as setup file
information.
COMMAND NAME VALUE

TD? List Testing Data Test In Process
RDM? Read Max Current ACW: Total current, Real
Current DCW: current
RD <step List Results Data step number = 1-200
number>?
RR? Read Remote Reset 1=Open, 0=Closed
RI? Read Remote Interlock 1=Open, 0=Closed
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COMMAND NAME VALUE
RS? Read Scanner Status 0=None, 1=Int, 2=Ext 1,
3=Int+Ext 1,
4=Ext 2, 5=Int+Ext 2,
6=Ext 1+Ext 2,
7=Int+Ext 1+Ext 2
RU? Read USB Stick 0=NO, 1=YES
FR nnnn File Rename nnn=name
LF? List File Name Active selected memory
LF nn? List File Name Active selected file
LP? List Prompt Active selected Step
LP <step List Prompt by step number step number = 1-200
number>?
LS2? List Step Parameters
LS2 <step List Step Parameters by step number step number = 1-200
number>?
TD?
Read the active data being displayed on the LCD display while the test is in process. Will also read
the last data taken when the test sequence has completed. Each parameter is separated by
commas and includes step number, test type, test status, and metering. The syntax for this
command response is {step, test type, status, meter 1, meter 2, meter 3}. ACW test displays 4
meters. Each meter will contain only the value and not the units. In the case of DCW current
where both uA and mA are used on the display, the command response will always indicate the
current in uA for example 2.0mA will respond with 2000 for 2000uA.
RD <step number>?
Read the results for an individual step. The step number is the actual step number that has been
saved within the file, not the order of which the steps were executed. For example if the test was
executed starting from step 3 and ending with step 5 then the first step test results will be found
in location 3 not in location 1. Each parameter is separated by commas and includes step number,
test type, test status, and metering. The syntax for this command response is {step, test type,
status, meter 1,meter 2,meter 3}. ACW test displays 4 meters. Each meter will contain only the
value and not the units. In the case of DCW current where both uA and mA are used on the display
the command response will always indicate the current in uA for example 2.0mA will respond with
2000 for 2000uA.
RR?
Read the remote Reset input signal. When the remote reset has been activated by closing the
contacts the query will return a value of 1 to indicate the instrument is being Reset.
RI?
Read the remote Interlock input signal. When the remote Interlock has been activated by opening
the contacts the query will return a value of 0 to indicate the instrument is in the Interlock state
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and will not be able to generate output voltage or current.
RS?
Read Scanner Status command will respond with a value that identifies the number of scanners
installed or connected to the instrument. Values 0 – 4 will indicate if there are no scanners
connected, one Internal or External scanner, or if both an Internal and an External scanner are
connected.
LF?
Lists the file name of the memory loaded into active memory (RAM).
LFN?
Lists the memory number of the active memory file loaded into active memory (RAM).
LF <memory number>?
List the file name of any of the 50 memories.
LP?
Lists the prompt that is created for the selected step within active memory (RAM).
LP <step number>?
Lists the prompt that has been created for a particular step of the file within active memory
(RAM).
LS?
Lists all the parameters for the individual step that is currently selected. See the ADD command for
the list of parameters. A comma (,) will separate each parameter and will be preceded with the
step number.
LS <step number>?
Lists all the parameters for the individual step indicated by step number = 1-30. See the ADD
command for the list of parameters. A comma (,) will separate each parameter and will be
preceded with the step number.
8.4.7 IEEE 488.2 Common Commands

These commands are required by the IEEE-488.2 standard with the exception of *PSC, *PSC?.
Most of these commands are not available over the USB/RS-232 bus except for the *IDN?
command which can be used to retrieve the instrument identification information, and the four
status reporting commands *ESR?, *ESE, *ESE? and *STB?
COMMAND NAME DESCRIPTION
*IDN? Identification Query EEC, Model Number, Serial Number,
Firmware Revision
*RST Reset Command Resets SE series
90
COMMAND NAME DESCRIPTION
*TST? Self-Test Query 00H=OK
01H=TEST EEPROM ERROR
*CLS Clear Status Command Clear Standard Event Status Register
Clear Service Request Register
*OPC Operation Complete Command When all selected pending
operations complete, ESR BIT0=1
*OPC? Operation Complete Query When all selected pending
operations complete, Output
Queue=1
*WAI Wait-to-Continue Command
*PSC {1|0} Power-on Status Clear Command 1 = Power-on clear enable registers
0 = Power-on load previous enable
registers
*PSC? Power-on Status Clear Query
*ESR? Standard Event Status Register Query 0 - 255
*ESE <value> Standard Event Status Enable value = 0 - 255
Command
*ESE? Standard Event Status Enable Query 0 - 255
*STB? Read Status Byte Query Read Status Byte
*SRE <value> Service Request Enable Command value = 0 - 255
*SRE? Service Request Enable Query 0 - 255
*IDN?
Read the instrument identification string. Company = EEC
*RST
Reset the instrument to original power on configuration. Does not clear Enable register for
Standard Summary Status or Standard Event Registers. Does not clear the output queue. Does not
clear the power-on-status-clear flag.
*TST?
Performs a self-test of the instrument data memory. Returns 0 if it is successful or 1 if the test
fails.
*CLS
Clears the Status Byte Summary register and Event registers. Does not clear the Enable registers.
*OPC
Sets the operation complete bit (bit 0) in the Standard Event register after a command is
completed successfully.
91
*OPC?
Returns an ASCII "1" after the command is executed.
*WAI
After the command is executed, it prevents the instrument from executing any further query or
commands until the no-operation-pending flag is TRUE.
*PSC {1|0}
Sets the power-on status clear bit. When set to 1 the Standard Event Enable register and Status
Byte Enable registers will be cleared when power is turned ON. 0 setting indicates the Enable
registers will be loaded with Enable register masks from non-volatile memory at power ON.
*PSC?
Queries the power-on status clear setting. Returns 0 or 1.
*ESR?
Queries the Standard Event register. Returns the decimal value of the binary-weighted sum of bits.
*ESE <value>
Standard Event Enable register controls which bits will be logically OR’d together to generate the
Event Summary bit 5 (ESB) within the Status Byte.
*ESE?
Queries the Standard Event enable register. Returns the decimal value of the binary-weighted sum
of bits.
*STB?
Read the Status Byte. Returns the decimal value of the binary-weighted sum of bits.
*SRE <value>
Service Request Enable register controls which bits from the Status Byte should be used to
generate a service request when the bit value = 1.
*SRE?
Queries the Service Request enable register. Returns the decimal value of binary-weighted sum of
bits.
8.4.8 Status Reporting

The status reporting system is configured using two types of registers. An Event register and a
Summary register. The Summary register is known as the Status Byte register and records high-
level summary information acquired by the Event registers.
An Event register report defines conditions or messages at each bit. The bits are latched and
remain at an active state until the register is either Read or Cleared. Reading the Event register
92
automatically clears the register and sets all bits to inactive state or 0. When querying an Event
register the information is returned as a decimal number representing the binary-weighted sum of
all bits within the register.
The Enable registers bits represent the selection of bits that will be logically OR’d together to form
the summary bit in the Status Byte. The *CLS command will not clear the Enable registers and if
you wish to clear the register you must set it to a value of 0. Like the Event register, the enable
register is represented as a decimal number that equals the binary-weighted sum of all bits.
The Enable register will clear to value a of 0 at power up unless the *PSC 0 command had been
executed before power-off. The *PSC command tells the device whether or not it should clear the
Enable registers at power-on. Using this command will allow SQRs to function immediately after
power-on.
EVENT REGISTER STATUS BYTE REGISTER

Bit Binary Event Register Enable Summary Register Enable
weight Register Register
0 1 Operation Complete ALL PASS
1 2 not used FAIL
2 4 Query Error ABORT
3 8 Device Error TEST IN PROCESS
4 16 Execution Error Message Available (MAV)
5 32 Command Error Event Summary Bit (ESB)
6 64 not used Request Service (RQS) or not used
Master Summary Status (MSS)
7 128 Power On PROMPT
*ESR? *ESE *STB? | SPOLL *SRE

*ESE? *SRE?
8.4.9 GPIB Service Request

The service request capability is not available with the USB/RS-232 interface. The SRQ line will be
activated only after one or more of the service request functions have been enabled using the
Status Byte Enable register command *SRE.
The Status Byte bit assignments are as described in the previous section for status reporting.
When the instrument has requested service, the enabled bit or bits and the RQS bit 6 will be active
or 1. Bits 4, 5, and 7 are not used and will be set to false, or 0 for all Status Byte reads.
After the serial poll (SPOLL) is executed the RQS bit will be cleared to 0, and the remaining bits will
remain unchanged. The Status Byte will not change value until the event register is read and
cleared for the corresponding Status Byte bit.
For example after the All Pass SRQ has been enabled, when the test(s) have finished with pass
indications the instrument will set the hardware SRQ line and output the Status Byte of 41 hex.
93
This means that bit 6 and bit 0 are set to a value of 1. After reading the Status Byte the Status Byte
value will change to 01 hex.
94
9. CALIBRATION
This instrument has been fully calibrated at the factory in accordance to our published
specifications. It has been calibrated with standards traceable to the National Institute Standards
& Technology (NIST). You will find in this manual a copy of the "Certificate of Calibration". It is
recommended that you have this instrument re-calibrated and a safety check done at least once
per year. EEC recommends you use "Calibration Standards" that are NIST traceable, or traceable to
agencies recognized by NIST to keep this instrument within published specifications.
End user metrology standards or practices may vary. These metrology standards determine the
measurement uncertainty ratio of the calibration standards being used. Calibration adjustments
can only be made in the Calibration mode and calibration checks or verifications can only be made
while operating in Test mode.
NOTE1: Verification should be performed before and after calibration. Calibration effects will only
be noticeable after exiting calibration mode.
NOTE2: Calibration before, should be warmed-up 30 minutes.
9.1 Warranty Requirements

EEC offers a standard one-year manufacture’s warranty. This warranty can be extended an
additional four years provided that the instrument is returned each year to EEC for it’s annual
calibration. In order to be eligible for the extended warranty instruments must be returned to EEC
for calibration service at least once every twelve months.
Required Calibration Equipment

 0 - 5 KV AC/DC Metered Voltage Divider.
 40 mA AC, 10 mA DC Ammeter.
 30 AAC Current Shunt
 20, 0.25 watt resistor, 250 volt.
 50M, 0.25 watt resistor, 1000 volt.
 500M, 0.25 watt resistor, 1000 volt.
 100K, 250 watt resistor, 5000 volt.
 1M, 20 watt resistor, 5000 volt.
9.2 Calibration Initialization

Press and hold the calibration key on the rear panel with a pen, pencil, or small screwdriver while
powering ON the SE. The SE 7440 enters calibration mode after the power on sequence is
complete. When the calibration is initialized the calibration screen will display each calibration
point and appear as follows:
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Scroll down on the screen to view the next page which will appear as follows:
Scroll down on the screen to view the next page which will appear as follows:
9.3 Calibration of Parameters

From the Calibration screens, use the touchscreen to select the parameter you wish to calibrate. A
calibration prompt screen will now appear that describes the necessary load and connection
information for the parameter being calibrated.
Once you press TEST, the Calibration data entry screen will appear for the selected parameter.
Read the measurement from your standard and enter it using the numeric keypad. Once a value is
entered the screen for the next step will appear.
96
 Calibration of AC Hipot Voltage
1. Connect the standard 5KVAC kilovolt meter from H.V. to Return.
2. When the standard voltmeter is connected, press TEST to start the calibration process.
3. Enter Standard Voltage Reading.
 Calibration of DC Hipot Voltage

1. Connect the standard 6KVDC kilovolt meter from H.V. to Return.
2. When the standard voltmeter is connected, press TEST to start the calibration process.
 Calibration of 30mA AC Total Current Range

1. Connect the 100K load in series with the standard current meter.
2. When the load is connected, press TEST to start the calibration process.
3. Enter Standard Current Reading.
 Calibration of 3.5mA AC Total Current Range

 Calibration of 9.99mA DC Current Range

 Calibration of 3.500mA DC Current Range

 Calibration of 350uA DC Current Range

1. Connect the 1M load in series with the standard current meter.
 Calibration of 35uA DC Current Range

 Calibration of 3.5uA DC Current Range

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 Calibration of 350nA DC Current Range

1. Connect the 1G load in series with the standard current meter.
 Calibration of 8V AC Voltage Range

1. Connect the standard 8.00VAC meter from Current to Return terminal.
2. When the leads are shorted, press TEST to start the calibration process.
 Calibration of 30A AC Current Range

Step1
1. Connect the standard current meter and series 100mΩ load from Current to Return.
2. When the standard current meter is connected, press TEST to start the calibration process.
Step2
1. Connect the Current and Return terminal.
2. When the leads are shorted, press TEST to start the calibration process.
3. Automatic calibration processing.
 Calibration of GFI 5.0mA

Step1
1. Connect the standard 200k with the standard AC current meter from H.V. to Case.
2. When the standard load is connected, press TEST to start the calibration process.
Step2
1. Connect the standard 200k with the standard DC current meter from H.V. to Case.
2. When the standard load is connected, press TEST to start the calibration process.
 Calibration Date 11/05/2014

Enter the date of Calibration.
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SE Series

SE 7430/SE 7440/SE 7441/SE 7451/SE 7452

This warranty does not cover accessories not of EEC manufacture.

Conforms with the following product standards:

1.1 Safety Symbols

1.1.1 Product Marking Symbols

1.1.2 Caution and Warning Symbols

Calls attention to a procedure, practice, or condition that could possibly

Calls attention to a procedure, practice, or condition that could possibly

Hipot Tester: Common term for dielectric-withstand test equipment.

Insulation Resistance Tester: An instrument or a function of an instrument capable of measuring

1.3.1 Service and Maintenance

1.3.2 Test Station

1.3.3 Test Operator

1.3.4 Instrument Connections

Never perform a hipot test on energized circuitry or equipment.

1.3.5 Device Under Test

1.3.6 Key Safety Points to Remember

 Arrange the test station in a safe and orderly manner.

 Never touch the product or connections during a test.

 In case of any problem, turn off the high voltage first.

 Properly discharge any item tested with DC before touching connections.

1.4 Introduction to Product Safety Testing

1.4.1 The Importance of Safety Testing

1.5.1 Dielectric Withstand Test

Common Applications of the Dielectric Withstand Test:

 Design (performance) testing: Determining design adequacy to meet service conditions.

 Production Line testing: Detecting defects in material or workmanship during processing.

 Acceptance testing: Proving minimum insulation requirements of purchased parts.

Types of Failures only detectable with a Hipot test

 Inadequate Spacing of Components

Dielectric Withstand Test; AC verses DC

1.5.3 Ground Bond Test

1.5.4 Run Test

1.5.5 Touch Current Test

Alerts the operator that the machine is due for

Two test modes allow for a basic Continuity test to be

SmartGFI™ disables the instrument’s output voltage in

Allows the operator to set different levels of access to

User can link up to 200 steps in a single test file with a

SE simultaneously monitors real and total current in

SE allows operators to setup a user-configured

Allows the operator to choose whether low-level arcs

Allows the operator to linearly increase or decrease

Two standard 9 pin interfaces provide outputs for

Allows the operator to self-verify the instrument’s

Allows the operator to set multiple dwell cycles at

Connect a barcode scanner directly to the instrument

Transfer test data directly to a USB flash drive after

*Pro Volt Operational Rules

1. Provolt will only link tests of the same type.

2.1. Unpacking and Inspection

2.1.2 Returning the Instrument

2.2.1 Work Area

2.2.3 Basic Connections

2.2.4 Environmental Conditions

Storage and Shipping Environment

MODEL SE 7430 SE 7440 SE 7441 SE 7451 SE 7452

Arc Detection The range is from 1-9(9 is the most Sensitive)

MODEL SE 7430 SE 7440 SE 7441 SE 7451 SE 7452