Boundary Scan Tutorial 1

Boundary Scan Tutorial

A tutorial prepared by Dr R G “Ben” Bennetts
DFT Consultant and Director, ASSET InterTech Inc.

Tel: +44 1489 581276 E-mail: [email protected]

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Figure 1

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Introduction and Objectives

IEEE Standard 1149.1 Boundary-Scan

Standard

Figure 2

In this tutorial, you will learn the basic elements of boundary-scan architecture — where it came from,
what problem it solves, and the implications on the design of an integrated-circuit device.

The core reference is the IEEE 1149.1 Standard:

IEEE Standard 1149.1-2001 “Test Access Port and Boundary-Scan Architecture,” available from the
IEEE, 445 Hoes Lane, PO Box 1331, Piscataway, New Jersey 08855-1331, USA. The standard was
first published in 1990, revised in 1993 and 1994, and most recently in 2001. You can obtain a copy of
the Standard via the world wide web on the IEEE home page at: http://standards.ieee.org/catalog.

The 1993 revision to the standard, referred to as “1149.1a-1993,” contained many clarifications,
corrections, and minor enhancements. Two new instructions were introduced in 1149.1a and these
are described in this tutorial.

The 1149.1b-1994 supplement contained a description of the Boundary-Scan Description

Language (BSDL).

The 1149.1-2001 version contains enhancements to the wording, plus removal of the use of the all-0s
code for the Extest instruction. In addition, the mandatory Sample/Preload instruction has been spit
into two separate instructions: Preload and Sample, both still mandatory.
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For further, more recent publications on boundary-scan topics, see the To Probe Further section at
the end of this tutorial.

Course Pre-Requisites

Course Pre-Requisites

You will need to know the basics

of logic design plus have a
general understanding of
Integrated Circuit design and
Printed-Circuit Board design,
assembly and test

Figure 3

Students who participate in this course are expected to know the basics of logic design plus have a
general understanding of Integrated Circuit design principles and Printed-Circuit Board electronic
design, board assembly and test techniques.

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About The Author

About The Author

Dr R G “Ben” Bennetts is an independent consultant in Design-For-Test (DFT),

consulting in product life-cycle DFT strategies, and delivering on-site and open
educational courses in DFT technologies.

Previously, he has worked for LogicVision, Synopsys, GenRad and Cirrus

Computers. Between 1986 and 1993, he was a free-lance consultant and lecturer
on Design-for-Test (DFT) topics. During this time, he was a member of JTAG, the
organization that created the IEEE 1149.1 Boundary-Scan Standard. He is an
Advisory member of the Board of Directors of ASSET InterTech

Ben has published over 90 papers plus three books on test and DFT subjects.
Figure 4

Dr R G “Ben” Bennetts is an independent consultant in Design-For-Test (DFT), consulting in product

life-cycle DFT strategies, and delivering on-site and open educational courses in DFT technologies.
Previously, he has worked for LogicVision, Synopsys, GenRad and Cirrus Computers. Between
1986 and 1993, he was a free-lance consultant and lecturer on Design-for-Test (DFT) topics. During
this time, he was a member of JTAG, the organization that created the IEEE 1149.1 Boundary-Scan
Standard. He is an Advisory member of the Board of Directors of ASSET InterTech.
Ben has published over 90 papers plus three books on test and DFT subjects.

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The Motivation for Boundary-Scan Architecture

Historical Development: In-Circuit Test

In-Circuit & Functional Board Test

Bed-Of-Nails (MDA, ICT) Functional

Figure 5

Since the mid-1970s, the structural testing of loaded printed circuit boards has relied very heavily on
the use of the so-called in-circuit bed-of-nails technique (see Figure 5). This method of testing makes
use of a fixture containing a bed-of-nails to access individual devices on the board through test lands
laid into the copper interconnect, or into other convenient physical contact points. Testing then
proceeds in two phases: power-off tests followed by power-on tests. Power-off tests check the
integrity of the physical contact between nail and the on-board access point, followed by open and
shorts tests based on impedance measurements.

Power-on tests apply stimulus to a chosen device, or collection of devices (known as a cluster), with
an accompanying measurement of the response from that device or cluster. Other devices that are
electrically connected to the device-under-test are usually placed into a safe state (a process called
“guarding”). In this way, the tester is able to check the presence, orientation, and bonding of the
device-under-test in place on the board.

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Changes in Device Packaging Styles

Change of Device Packaging Styles

DIP PGA SOIC TSOP

SOJ PLCC QFP BGA

Figure 6

Fundamentally, the in-circuit bed-of-nails technique relied on physical access to all devices on a
board. For plated-through-hole technology, the access is usually gained by adding test lands into the
interconnects on the “B” side of the board — that is, the solder side of the board. The advent of
onserted devices packaged in surface mount styles – see Figure 6 - meant that system manufacturers
began to place components on both sides of the board — the “A” side and the “B” side. The smaller
pitch between the leads of surface-mount components caused a corresponding decrease in the
physical distance between the interconnects.

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Probing Multi-Layer Boards

Probing Multi-Layer Boards

Figure 7

The move to surface-mount packaging had a serious impact on the ability to place a nail accurately
onto a target test land, as shown in Figure 7. The whole question of access was further compounded
by the development of multi-layer boards created to accommodate the increased number of
interconnects between all the devices. Basically, the ability to physically probe onto the board with a
bed-of-nails system was going away: physical access was becoming limited.

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The Emergence of JTAG

JTAG Meeting, 17 September, 1988

Figure 8

Such was the situation in the mid-1980s when a group of concerned test engineers in a number of
European electronics systems companies got together to examine the board-test problem of limited
access and its possible solutions. The group of people initially called themselves the Joint European
Test Action Group (JETAG). Their preferred method of solution was to bring back the access to
device pins by means of an internal serial shift register around the boundary of the device - a
boundary scan register.

Later, the group was joined by representatives from North American companies and the ‘E’ for
“European” was dropped from the title of the organization leaving it Joint Test Action Group, JTAG
– see Figure 8. (The author is in the front row, third from the right-hand end.) JTAG did not invent
the concept of boundary scan. Several companies, such as IBM, Texas Instruments and Philips,
were already working on the idea. What JTAG did was to convert the ideas into an international
Standard, the IEEE 1149.1-1990 Standard, first published in April 1990.

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Summary

Motivation for Boundary Scan: Summary

Basic motivation was miniaturization of device packaging,

leading to …
surface mount packaging styles, leading to …
double sided boards, leading to …
multi-layer boards, leading to …
a reduction of physical access test lands for traditional
bed-of-nail in-circuit testers

Problem: how to test for manufacturing defects in the

future?
Solution: add boundary-scan registers to the devices

Figure 9

To summarize, the basic motivation for boundary scan was the miniaturization of device packaging,
the development of surface-mounted packaging, and the associated development of the multi-layer
board to accommodate the extra interconnects between the increased density of devices on the
board. These factors led to a reduction of the one thing an in-circuit tester requires: physical access
for the bed-of-nails probes.

The long-term solution to this reduction in physical probe access was to consider building the access
inside the device i.e. a boundary scan register. In the next section, we will take a look at the device-
level architecture of a boundary-scan device, and begin to understand how the boundary-scan
register solves the limited-access board-test problem.

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The Principle of Boundary-Scan Architecture

What is Boundary Scan?

Principle of Boundary Scan

Test Data In (TDI)

Test Clock (TCK)

Any Digital Chip
Test Mode Select (TMS)

Test Data Out (TDO)

PI
Each boundary-scan cell can:
Capture data on its parallel input PI
Update data onto its parallel output PO
SI SO
Serially scan data from SO to its neighbour’s SI
Behave transparently: PI passes to PO
Note: all digital logic is contained inside the
PO boundary-scan register
Figure 10

In a boundary-scan device, each digital primary input signal and primary output signal is
supplemented with a multi-purpose memory element called a boundary-scan cell. Cells on device
primary inputs are referred to as “input cells”; cells on primary outputs are referred to as “output cells.”
“Input” and “output” is relative to the internal logic of the device. (Later, we will see that it is more
convenient to reference the terms “input” and “output” to the interconnect between two or more
devices.) See Figure 10.

The collection of boundary-scan cells is configured into a parallel-in, parallel-out shift register. A
parallel load operation — called a Capture operation — causes signal values on device input pins to
be loaded into input cells, and signal values passing from the internal logic to device output pins to be
loaded into output cells. A parallel unload operation — called an Update operation — causes signal
values already present in the output scan cells to be passed out through the device output pins.
Signal values already present in the input scan cells will be passed into the internal logic.

Data can also be Shifted around the shift register, in serial mode, starting from a dedicated device
input pin called Test Data In (TDI) and terminating at a dedicated device output pin called Test Data

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Out (TDO). The Test ClocK, TCK, is fed in via yet another dedicated device input pin and the various
modes of operation are controlled by a dedicated Test Mode Select (TMS) serial control signal.

Using the Scan Path

Using The Boundary-Scan Path

TDI

Any Digital Chip Any Digital Chip

TCK

Any Digital Chip Any Digital Chip TMS

TDO

Figure 11

At the device level, the boundary-scan elements contribute nothing to the functionality of the internal
logic. In fact, the boundary-scan path is independent of the function of the device. The value of the
scan path is at the board level as shown in Figure 11.

The figure shows a board containing four boundary-scan devices. Notice that there is an edge-
connector input called TDI connected to the TDI of the first device. TDO from the first device is
permanently connected to TDI of the second device, and so on, creating a global scan path
terminating at the edge connector output called TDO. TCK is connected in parallel to each device
TCK input. TMS is connected in parallel to each device TMS input.

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What the Tester Sees

What The Tester Sees

TDI

TCK

TMS

TDO

Figure 12

What the tester sees from the edge connector is simply the concatenation of the various boundary-
scan registers – that is, a single register that provides access to all device outputs now considered to
be drivers (sometimes called a transmitter) onto an interconnect and all device inputs now
considered to be sensors (sometimes called a receiver) from the interconnect – see Figure 12.

In this way, particular tests can be applied across the device interconnects via the global scan path by
loading the stimulus values into the appropriate device-output scan cells via the edge connector TDI
(shift-in operation), applying the stimulus across the interconnects (update operation), capturing the
responses at device-input scan cells (capture operation), and shifting the response values out to the
edge connector TDO (shift-out operation).

Essentially, boundary-scan cells can be thought of as virtual nails, having an ability to set up and
apply tests across the interconnect structures on the board.

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Basic Boundary-Scan Cell (BC_1)

Basic Boundary-Scan Cell (BC_1)

Scan Out = 0, Functional mode
(SO) Mode = 1, Test mode
(for BC_1)

Data In 00
(PI) Data Out
Capture Update 11 (PO)
Scan Cell Hold Cell
00
D Q D Q
11

Clk Clk
C U
Scan In ShiftDR ClockDR UpdateDR
S
(SI)

Figure 13

Figure 13 shows a basic universal boundary-scan cell, known as a BC_1. The cell has four modes of
operation: normal, update, capture, and serial shift. The memory elements are two D-type flip-flops
with front-end and back-end multiplexing of data. (As with all circuits in this tutorial, it is important to
note that the circuit shown in Figure 13 is only an example of how the requirement defined in the
Standard could be realized. The IEEE 1149.1 Standard does not mandate the design of the circuit,
only its functional specification.)

During normal mode, Data_In is passed straight through to Data_Out.

During update mode, the content of the Update Hold cell is passed through to Data_Out.

During capture mode, the Data_In signal is routed to the input Capture Scan cell and the value is
captured by the next ClockDR. ClockDR is a derivative of TCK.

During shift mode, the Scan_Out of one Capture Scan cell is passed to the Scan_In of the next
Capture Scan cell via a hard-wired path.

Note that both capture and shift operations do not interfere with the normal passing of data from the
parallel-in terminal to the parallel-out terminal. This allows on the fly capture of operational values
and the shifting out of these values for inspection without interference. This application of the
boundary-scan register has tremendous potential for real-time monitoring of the operational status of
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a system — a sort of electronic camera taking snapshots — and is one reason why TCK is kept
separate from any system clocks.

Comparing Boundary Scan with In-Circuit Test

Defect Coverage: Bed-Of-Nails

Driver Sensor Driver

(Sensor) (Driver) (Sensor)

Defects covered: nail - plated-through-hole - interconnect

- solder - leg - bond wire - device - bond wire - leg - solder
- interconnect - plated through hole - nail

Figure 14

The use of boundary-scan cells to test the presence, orientation, and bonding of devices was the
original motivation for inclusion in a device. The use of scan cells as a means of applying tests to
individual devices is not the major application of boundary-scan architecture. Consider the reason for
boundary-scan architecture in the first place. The prime function of the bed-of-nails in-circuit tester
was to test for manufacturing defects, such as missing devices, damaged devices, open and short
circuits, misaligned devices, and wrong devices. See Figure 14.

In-circuit testers were not intended to prove the overall functionality of the on-board devices. It was
assumed that devices had already been tested for functionality when they existed only as devices
(i.e., prior to assembly on the board). Unfortunately, in-circuit test techniques had to make use of
device functionality in order to test the interconnect structure — hence the rather large libraries of
merchant device functions and the problems caused by increasing use of ASICs.

Given that boundary-scan registers were seen as an alternative way of testing for the presence of
manufacturing defects, we should question what these defects are, what causes them, and where
they occur.

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An examination of the root cause for board manufacturing defects shows them to be caused by any
one of three reasons: electrical stress (e.g., electrostatic discharge causing damage to input or output
amplifiers), mechanical stress (e.g., bent legs caused by clumsy handling when mounting devices on
the board), or thermal stress (e.g., hot spots caused by the solder operation). A defect, if it occurs, is
likely present either in the periphery of the device (leg, bond wire, driver amplifier), in the solder, or in
the interconnect between devices. It is very unusual to find damage to the internal logic without some
associated damage to the periphery of the device.

In this respect, the boundary-scan cells are precisely where we want them — at the beginning and
ends of the region most likely to be damaged during board assembly i.e. the region between the
output driver scan cell and the input sensor scan cell. This region is more-commonly referred to as
the interconnect region.

Extest Mode

Defect Coverage: Extest

Driver Sensor
Virtual
nails

In
Inthis
thismode
mode (EXternal
(EXternal TEST),
TEST),defects
defectscovered:
covered:
driver
driver (TX) scan cell - driver amp - bond wire--leg
(TX) scan cell - driver amp - bond wire leg--solder
solder--
interconnect
interconnect
-- solder
solder - leg - bond wire -- driver
- leg - bond wire driver amp
amp -- sensor
sensor (RX)
(RX) scan
scancell
cell
Figure 15

Using the boundary-scan cells to test the interconnect structure between two devices is called
External Test, shortened to Extest – see Figure 15. The use of the cells for Extest is the major
application of boundary-scan structures, searching for opens and shorts plus damage to the periphery
of the device. In this mode, the boundary-scan cells are often referred to as virtual nails

Intest Mode

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Defect Coverage: Intest

Driver Sensor Driver Sensor

In
Inthis
thismode
mode (INternal
(INternal TEST),
TEST),defects
defectscovered:
covered:
driver
driver scan cell - device - sensor scancell
scan cell - device - sensor scan cell

Figure 16

It is also possible to use boundary-scan cells to test the internal functionality of a device (Figure 16).
This use of the boundary-scan register is called Internal Test, shortened to Intest. Intest is only
really used for very limited testing of the internal functionality to identify defects such as the wrong
variant of a device, or to detect some gross internal defect.

In the next section, we will take a closer look at the overall architecture of an 1149.1-compliant device
and, particularly, the function of the Instruction register.

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IEEE 1149.1 Device Architecture and Instruction register

Device Architecture

1149.1 Chip Architecture

Boundary-Scan Register

Internal Register

Any Digital Chip

1
Bypass register
TDI TDO

Identification Register

1 Instruction Register

TMS
TAP
Controller
TCK
1
TRST* (optional)

Figure 17

After nearly five year’s discussion, the JTAG organization finally proposed the device architecture
shown in Figure 17.

The Figure shows the following elements:

A set of four dedicated test pins — Test Data In (TDI), Test Mode Select (TMS), Test Clock (TCK),
Test Data Out (TDO) — and one optional test pin Test Reset (TRST*). These pins are collectively
referred to as the Test Access Port (TAP).
A boundary-scan cell on each device primary input and primary output pin, connected internally to
form a serial boundary-scan register (Boundary Scan).
A finite-state machine TAP controller with inputs TCK, TMS, and TRST*.
An n-bit (n >= 2) Instruction register, holding the current instruction.
A 1-bit Bypass register (Bypass).
An optional 32-bit Identification register capable of being loaded with a permanent device
identification code.

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At any time, only one Data register can be connected between TDI and TDO e.g., the Instruction
register, Bypass, Boundary-Scan, Identification, or even some appropriate register internal to the
device. The selected Data register is identified by the decoded parallel outputs of the Instruction
register. Certain instructions are mandatory, such as Extest (boundary-scan register selected),
whereas others are optional, such as the Idcode instruction (Identification register selected).

Mandatory Instructions and Reset Modes

Mandatory Instructions and Reset Modes

Boundary-Scan Register
Instruction Target (Active) Code
Register
Extest Boundary Scan Formerly All-0s

Internal Register Bypass Bypass All-1s

Sample Boundary Scan Undefined
Any Digital Chip
1 Preload Boundary Scan Undefined
Bypass register
TDI TDO

Identification Register

1 Instruction Register IR≥≥22

IR
Reset:
Reset:
TMS TMS
TMS==1,1,55xxTCK
TCK
TAP
Controller
TCK
1
TRST* (optional)

Figure 18

Before we look closer at each part of this architecture there are two general points to note about
Figure 18:

Point 1. Since 1149.1-2001, the latest version of the Standard, there are only four mandatory
instructions: Extest, Bypass, Sample and Preload.

Point 2. The asynchronous Reset signal, TRST*, is optional. If present, the signal is active low. If
not present, there is always a synchronous reset available within the TAP controller. If TMS is held at
logic 1, a maximum of five consecutive TCKs is guaranteed to return the TAP controller to the reset
state of Test_Logic Reset. This will be referred to as the TMS = 1, 5 x TCK synchronous reset.

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Target Register Modes

Target Register Modes

Boundary-Scan Register

Internal Register
Select
Any Digital Chip
1 Capture
Bypass register
TDI TDO
Shift
Identification Register
Update
1 Instruction Register

TMS
TAP
Controller
TCK
1
TRST* (optional)

Figure 19

Whenever a register is selected to become active between TDI and TDO, it is always possible to
perform three operations on the register: parallel Capture followed by serial Shift followed by parallel
Update. The order of these operations is fixed by the state-sequencing design of the TAP controller.
For some target Data registers, some of these operations will be effectively null operations, no ops.

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Open Circuit TDI, TMS and TRST*?

Open-Circuit TDI, TMS and TRST*?

Boundary-Scan Register

An open-circuit TDI, TMS or

Internal Register
TRST* must go to logic-1.
Why?
Any Digital Chip TDI: Bypass instruction is
1 loaded: safe instruction
Bypass register
TDI TDO TMS: TAP controller placed
into Test_Logic Reset state
Identification Register after 5 TCKs, max: safe state
1 Instruction Register TRST* not asserted. Rest of
1149.1 logic still usable
TMS
TAP
Controller
TCK
1
TRST* (optional)

Figure 20

The 1149.1 Standard mandates that an open circuit TDI, TMS or TRST* input must go to logic 1.
This can be achieved with internal weak resistive pull ups, or with active transistor pull ups. The
reasons are as follows:

• For TDI. If the Instruction register is selected as the target register between TDI and TDO ready to
be loaded with a new instruction, then a safe instruction (Bypass, all-1s code) is loaded and
executed into the device with the open-circuit TDI and to all devices downstream of this device.
• For TMS. In a maximum of 5 x TCK cycles, the TAP controller of this device will be placed into its
Test_Logic Reset state. In this state, the boundary-scan logic is inactive but the device can
continue to operate functionally.
• For TRST*, logic 1 is the inactive state and so the device is not prevented from being used either in
functional mode or in 1149.1 modes. The device must be reset with the synchronous reset cycle
(TMS = 1, 5 x TCK) rather than through its asynchronous TRST* signal.

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The Instruction Register

Instruction Register
DR select and control signals routed to selected target register

Decode
DecodeLogic
Logic

Hold
Holdregister
register
(Holds
(Holdscurrent
currentinstruction)
instruction)

From Scan
ScanRegister
Register To
TDI (Scan-in
(Scan-innew
new instruction/scan-out
instruction/scan-outcapture
capturebits)
bits) TDO

TAP 0 1
TAP
Controller IR Control Higher order bits:
Controller
current instruction, status bits, informal ident,
results of a power-up self test, ….
Figure 21

An Instruction register (Figure 21) has a shift scan section that can be connected between TDI and
TDO, and a hold section that holds the current instruction. There may be some decoding logic
beyond the hold section depending on the width of the register and the number of different
instructions. The control signals to the Instruction register originate from the TAP controller and either
cause a shift-in/shift-out through the Instruction register shift section, or cause the contents of the
shift section to be passed across to the hold section (parallel Update operation). It is also possible to
load (Capture) internal hard-wired values into the shift section of the Instruction register. The
Instruction register must be at least two-bits long to allow coding of the four mandatory instructions —
Extest, Bypass, Sample, Preload — but the maximum length of the Instruction register is not
defined. In capture mode, the two least significant bits must capture a 01 pattern. (Note: by
convention, the least-significant bit of any register connected between the device TDI and TDO pins,
is always the bit closest to TDO.) The values captured into higher-order bits of the Instruction
register are not defined in the Standard. One possible use of these higher-order bits is to capture an
informal identification code if the optional 32-bit Identification register is not implemented. In practice,
the only mandated bits for the Instruction register capture is the 01 pattern in the two least-significant
bits. We will return to the value of capturing this pattern later in the tutorial.

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The Standard Instructions

Standard Instructions
Instruction Selected Data Register

Mandatory:
Extest Boundary scan (formerly all-0s code)
Bypass Bypass (initialised state, all-1s code)
Sample Boundary scan (device in functional mode)
Preload Boundary scan (device in functional mode)

Optional:
Intest Boundary scan
Idcode Identification (initialised state if present)
Usercode Identification (for PLDs)
Runbist Result register
Clamp Bypass (output pins in safe state)
HighZ Bypass (output pins in high-Z state)
NB. All unused instruction codes must default to Bypass
Figure 22

The IEEE 1149.1 Standard describes four mandatory instructions: Extest, Bypass, Sample, and
Preload, and six optional instructions: Intest, Idcode, Usercode, Runbist, Clamp and HighZ.
These ten instructions are known as the public instructions. We will look first at the mandatory
instructions.

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Extest Instruction

Extest Instruction
Boundary-Scan Register

Internal Register
Boundary-scan register
selected
1
Any Digital Chip Used to apply patterns to
Bypass register the interconnect
TDI TDO structures on the board
Identification Register Boundary-scan cells
1 Instruction Register
have permission to write
to their outputs (device
TMS
TAP in test mode)
Controller
TCK
1
TRST* (optional)

Figure 23

The Extest instruction selects the boundary-scan register when executed, preparatory to interconnect
testing. The code for Extest used to be defined to be the all-0s code. This requirement has been
relaxed in the 2001 version of the Standard.

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Bypass Instruction

Bypass Instruction
Boundary-Scan Register

Internal Register
Bypass register selected
Used to allow quick
1
Any Digital Chip passage through this
Bypass register device to another device
TDI TDO connected in the chain
Identification Register

1 Instruction Register

TMS
TAP
Controller
TCK
1
TRST* (optional)

Figure 24

The Bypass instruction must be assigned an all-1s code and when executed, causes the Bypass
register to be placed between the TDI and TDO pins.

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Sample and Preload Instructions

Sample and Preload Instruction

Boundary-Scan Register

Boundary scan register

Internal Register
selected
Any Digital Chip Used to Preload known
1 values in the boundary
TDI
Bypass register
TDO
scan cells.
Also used to Sample
Identification Register
(Capture) mission-mode
1 Instruction Register signals into the
boundary-scan cells
TMS
TAP
Controller
Device in functional
TCK
1 mode, not test mode
TRST* (optional)

Figure 25

The Sample and Preload instructions, and their predecessor the Sample/Preload instruction, selects
the Boundary-Scan register when executed. The instruction sets up the boundary-scan cells either to
sample (capture) values or to preload known values into the boundary-scan cells prior to some
follow-on operation.

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Intest Instruction

Intest Instruction
Boundary-Scan Register

Internal Register
Boundary scan register
selected
1
Any Digital Chip Used to apply patterns to
Bypass register the device itself
TDI TDO
Boundary scan cells
Identification Register have permission to write
1 Instruction Register
to their outputs (device
in test mode)
TMS
TAP
Controller
TCK
1
TRST* (optional)

Figure 26

The IEEE 1149.1 Standard defines a number of optional instructions – that is, instructions that do not
need to be implemented but which have a prescribed operation if they are implemented.

The instruction illustrated here is Intest, the instruction that selects the boundary-scan register
preparatory to applying tests to the internal logic of the device.

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Idcode Instruction

Idcode Instruction
Boundary-Scan Register

Internal Register
Optional Identification
register selected, if
Any Digital Chip available, else Bypass
1
Bypass register
register selected
TDI TDO Used to capture internal
Identification Register 32-bit identification code
(manufacturer, part
1 Instruction Register
number, version
TMS
TAP
number) and then shift
TCK
Controller out through TDO
1
TRST* (optional)

Figure 27

Idcode is the instruction to select the Identification register between TDI and TDO, preparatory to
loading the internally-held 32-bit identification code and reading it out through TDO. The 32 bits are
used to identify the manufacturer of the device, its part number and its version number.

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Usercode Instruction

Usercode Instruction
Boundary-Scan Register

Internal Register
Optional Identification
register selected, if
Any Digital Chip available, else Bypass
1
Bypass register
register selected
TDI TDO Use to capture an
Identification Register alternative 32-bit
identification code for
1 Instruction Register
dual personality devices
TMS
TAP
e.g. PLDs
Controller
TCK
1
TRST* (optional)

Figure 28

Usercode selects the same 32-bit register as Idcode, but allows an alternative 32 bits of identity data
to be loaded and serially shifted out. This instruction is used for dual-personality devices, such as
Complex Programmable Logic Devices and Field Programmable Gate Arrays.

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RunBist Instruction

RunBist Instruction
Boundary-Scan Register

BIST Registers
Control registers for
initiating internal BIST
Any Digital Chip (Memory or Logic)
1
Bypass register Pass/fail register
TDI TDO targeted as final selected
Identification Register register
1 Instruction Register

TMS
TAP
Controller
TCK
1
TRST* (optional)

Figure 29

An important optional instruction is RunBist. Because of the growing importance of internal self-test
structures, the behavior of RunBist is defined in the Standard. The self-test routine must be self-
initializing (i.e., no external seed values are allowed), and the execution of RunBist essentially targets
a self-test result register between TDI and TDO. At the end of the self-test cycle, the targeted data
register holds the Pass/Fail result.

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Clamp Instruction

Clamp Instruction
Boundary-Scan Register

Known values are pre-

Internal Register loaded into boundary scan
cells using Preload
1
Any Digital Chip
instruction
Bypass register
TDI TDO Clamp drives these values to
the output pins but leaves
Identification Register
Bypass register as the
1 Instruction Register selected register
TMS
TAP
Controller
TCK
1
TRST* (optional)

Figure 30

Two new instructions introduced in the 1993 revision, 1149.1a-1993, were Clamp and HighZ.
Clamp is an instruction that uses boundary-scan cells to drive preset values established initially with
the Preload instruction onto the outputs of devices, and then selects the Bypass register between TDI
and TDO (unlike the Preload instruction which leaves the device with the boundary-scan register still
selected until a new instruction is executed or the device is returned to the Test_Logic Reset state.

Clamp would be used to set up safe guarding values on the outputs of certain devices in order to
avoid bus contention problems, for example.

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HighZ Instruction

HighZ Instruction
Boundary-Scan Register

Control-to-Z values are

Internal Register
pre-loaded into high-Z
control cells using the
Any Digital Chip Preload instruction
1
Bypass register HighZ drives these values
TDI TDO
to the three-state controls
Identification Register causing them to go to
their high-Z drive state but
1 Instruction Register
leaves Bypass register as
TMS
TAP
the selected register
Controller
TCK
1
TRST* (optional)

Figure 31

HighZ is similar to Clamp, but it leaves the device output pins in a high-impedance state rather than
drive fixed logic-1 or logic-0 values. HighZ also selects the Bypass register between TDI and TDO.

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The Test Access Port (TAP)

The TAP Signals

Test Access Port (TAP)

Boundary-Scan Register Test Data In Serial data in
(TDI) Sampled on rising edge
Default = 1
Test Data Out Serial data out
(TDO) Sampled on falling edge
Data register Default = Z (only active
during a shift operation)
Core Logic
Test Mode Select Input Control
Bypass register
TDI TDO
(TMS) Sampled on rising edge
Default = 1
Identification Register
Test Clock Dedicated clock
(TCK) Any frequency
Instruction Register

TMS
Test Reset Optional async reset
TAP (TRST*) Active low
Controller
TCK Default = 1

TRST* (optional)

Figure 32

We turn now to the Test Access Port (TAP) and its Controller. The TAP consists of four mandatory
terminals plus one optional terminal.

The mandatory terminals are:

Test Data In (TDI): serial test data in with a default value of 1.

Test Data Out (TDO): serial test data out with a default value of Z and only active during a shift
operation.
Test Mode Select (TMS): serial input control signal with a default value of 1.
Test Clock (TCK): dedicated test clock, any convenient frequency (usually determined by the
maximum TCK frequency of the external tester and the slowest boundary-scan device on the
board).

The optional terminal is:

Test Reset (TRST*): asynchronous TAP controller reset with default value of 1 and active low.

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Top-Level View of the TAP Controller

TAP Controller

TMS ClockDR
TCK ShiftDR

TRST* UpdateDR
16-state Reset*
16-stateFSM
FSM
TAP
TAPController
Controller Select
(Moore
(Mooremachine)
machine) ClockIR
ShiftIR
UpdateIR
Enable

Figure 33

TMS and TCK (and the optional TRST*) go to a 16-state finite-state machine controller, which
produces the various control signals. These signals include dedicated signals to the Instruction
register (ClockIR, ShiftIR, UpdateIR) and generic signals to all data registers (ClockDR, ShiftDR,
UpdateDR). The data register that actually responds is the one enabled by the conditional control
signals generated at the parallel outputs of the Instruction register, according to the particular
instruction.

The other signals, Reset, Select and Enable are distributed as follows:

• Reset is distributed to the Instruction register and to the target Data Register
• Select is distributed to the output multiplexer
• Enable is distributed to the output driver amplifier

Note: the Standard uses the term Data Register to mean any target register except the Instruction
register

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The TAP Controller

TAP Controller State Diagram

Test_Logic
1
Reset
0
0 Run_Test/ 1 Select 1 Select 1
Idle DR_Scan IR_Scan
0 0
1 1
Capture_DR Capture_IR

0 0

Shift_DR 0 Shift_IR 0

1 1
1 1
Exit1_DR Exit1_IR

0 0

Pause_DR 0 Pause_IR 0

1 1
0 0
Exit2_DR Exit2_IR

1 1

Update_DR Update_IR

1 0 1 0

Figure 34

Figure 34 shows the 16-state state table for the TAP controller. The value on the state transition arcs
is the value of TMS. A state transition occurs on the positive edge of TCK and the controller output
values change on the negative edge of TCK.

The TAP controller initializes in the Test_Logic Reset state (“Asleep” state). While TMS remains a 1
(the default value), the state remains unchanged. In the Test_Logic Reset state and the active
(selected) register is determined by the contents of the Hold section of the Instruction register. The
selected register is either the Identification register, if present, else the Bypass register. Pulling TMS
low causes a transition to the Run_Test/Idle state (“Awake, and do nothing” state). Normally, we
want to move to the Select IR_Scan state ready to load and execute a new instruction.

An additional 11 sequence on TMS will achieve this. From here, we can move through the various
Capture_IR, Shift_IR, and Update_IR states as required. The last operation is the Update_IR
operation and, at this point, the instruction loaded into the shift section of the Instruction register is
transferred to the Hold section of the Instruction register to become the new current instruction – refer
again to Figure 21. This causes the Instruction register to be de-selected as the register connected
between TDI and TDO and the Data register identified by the new current instruction to be selected as
the new target Data register between TDI and TDO. For example, if the instruction is Bypass, the
Bypass register becomes the selected data register. From now on, we can manipulate the target data
register with the generic Capture_DR, Shift_DR, and Update_DR control signals.

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The Bypass and Identification Registers

The Bypass register

Bypass register
One-bit shift register, selected by the
Bypass instruction
Captures a hard-wired 0
Note: in the Test-Logic/Reset state, the
Bypass register is the default register if no
Identification Register present

0
D Q To TDO
From TDI

ShiftDR Clk

ClockDR

Figure 35

Figure 35 shows a typical design for a Bypass register. It is a 1-bit register, selected by the Bypass
instruction and provides a basic serial-shift function. There is no parallel output (which means that the
Update_DR control has no effect on the register), but there is a defined effect with the Capture_DR
control — the register captures a hard-wired value of logic 0.

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The Identification Register

Identification Register
32-bit shift register
Selected by Idcode and Usercode
instruction
No parallel output
Captures a hard-wired 32-bit word
Main function: identify device owner
and part number
Note: Idcode is power-up instruction if
Identification Register is present, else
Bypass

Figure 36

The optional Identification register (Figure 36) is a 32-bit register with capture and shift modes of
operation. The register is selected by the Idcode and Usercode instructions and the 32-bits of
internal data are loaded into the shift part of the register and scanned out through the device TDO pin.
Recall also that this register, if present, is the selected active register when the TAP controller is in the
Test_Logic Reset state, else the Bypass register is selected in this state..

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The Boundary-Scan Register

Where to Place Boundary-Scan Cells?

Boundary-Scan Register

Shift register with boundary-scan cells

on:
device input pins
device output pins
control of three-state outputs
control of bidirectional cells
Selected by the Extest, Intest, Preload
and Sample instructions

Figure 37

We are now ready to take a more detailed look at the boundary-scan cells and their concatenation
into a general-purpose boundary-scan register. For a given device, boundary-scan cells are placed on
the device digital input ports, digital output ports, and on the control lines of bidirectional (IO) ports
and tristate (0Z) ports. The scan cells are linked together to form the boundary-scan register. The
order of linking within the device is determined by the physical adjacency of the pins and/or by other
layout constraints. The boundary-scan register is selected by the Extest, Sample, Preload, and
Intest instructions.

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Providing Boundary-Scan Cells on IO And OZ Pins

Providing Boundary-Scan Cells: OZ

On all device signal IO, control of three-state:

dual-mode input signal or additional scan cell
Figure 38

Primarily, boundary-scan cells must be provided on all device digital input and digital output signal
pins, with the exception of Power and Ground. Note that there must be no circuitry between the pin
and the boundary-scan cell other than driver amplifiers or other forms of analog circuitry such as
electro-static discharge protection circuitry.

In the case of pin fan-in, boundary-scan cells should be provided on each primary input to the internal
logic. In this way, each input can be set up with an independent value. This provides the maximum
flexibility for Intest.

Similarly, for the case of pin fan-out: if each output pin has a boundary-scan cell, then so Extest is
able to set different and independent values on the multiple outputs.

Where there are OZ tristate output pins, there must be a boundary-scan cell on the status control
signal into the output driver amplifier. Figure 38 shows this situation. The input pin has two modes: as
an input and as an output status-control signal. For this situation, an extra boundary-scan cell is not
required.

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Bidirectional Pins

Providing Boundary-Scan Cells: IO

On control of bidirectional IO:

dual-mode input signal
Figure 39

Figure 39 shows the set up for a bidirectional IO pin. Here, we see that, conceptually at least, three
boundary-scan cells are required: one on the input side, one on the output side, and one to allow
control of the IO status. In practice, the two IO scan cells are usually combined into a single multi-
function cell called a BC_7.

This is the end of the part of the tutorial that has mostly concentrated on the device-level features of
an 1149.1-compliant device. From now on, we will develop the board-level application of 1149.1,
starting with the interconnect test-pattern generation process.

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Application at the Board Level

General Strategy

Application At Board Level: BS Devices

1. BS infrastructure
integrity test

2. Interconnect test

3. Non-BS device test,

including RAM test

Figure 40

For the remainder of this tutorial, we will concentrate on the application of boundary scan at the board
level. First, we will look at the major stages of board-test strategy for a board populated just by IEEE
1149.1-compliant devices (a “pure” boundary-scan board). Later, we will consider the more-realistic
situation of a board containing both boundary-scan devices and non-boundary-scan devices.

A general-purpose strategy for testing a boundary-scan board is:

Step 1. Carry out a board-level boundary-scan infrastructure test. One way to do this is to select
the Instruction register and then cycle through the Capture_IR and Shift_IR operations to
load and shift the 01 checkerboard values built in to the Instruction register. Further optional
infrastructure tests can be carried out if time permits.

Step 2. Use the Extest instruction to select the boundary-scan registers to apply stimulus and
capture responses across the interconnect structures between the boundary-scan devices
on the board. Take care not to damage non-boundary-scan devices attached to these
interconnects.

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Step 3. Apply tests to the non-boundary-scan devices, such as memory devices or unstructured
clusters, that can be accessed from the boundary-scan registers of the boundary-scan
devices.

At the end of Step 1, we have tested the tester. At the end of Step 2, we have tested the pure
boundary-scan to boundary-scan region i.e. the region most susceptible to assembly damage caused
by electrical, mechanical, or thermal stress. Step 2 is the major application of the boundary-scan
structures and we will take a close look at the tests necessary to find open and shorts on the
interconnects.

Step 3 takes us into the non-boundary-scan region and as we will see, this is the most complex region
to test. For now, we will focus on Step 2 but, first, we must consider how to model the manufacturing
defects to determine the objectives and efficiency of the test patterns.

Modeling Board Defects

Board Defects
Missing component, wrong component, mis-oriented
component, broken track, shorted tracks, pin-to-solder open
circuit, pin-to-pin solder shorts
Number of 2-net short circuit faults between k interconnects =
k(k-1)/2
Equivalent fault models for shorts: bridging of type wired-AND
and wired-OR
Open circuits are modelled down-stream as stuck-at-1 or
stuck-at-0 faults

Figure 41

The major causes of board manufacturing defects are: missing components, wrong components, mis-
oriented components, broken track (opens), shorted tracks (track-to-track shorts), pin-to-solder opens,
pin-to-pin solder shorts. To consider the shorts, we assume that the behaviour of any short is logical
i.e. the short behaves as if it were an unwanted wired-AND gate (strong 0, weak 1) or wired-OR gate
(strong 1, weak 0). This is a realistic assumption given that the circuits receiving the result of a short
are themselves digital and therefore will digitize the analog outcome of the short circuit.

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There are many opportunities for short circuits: track-to-track, pin-to-pin, etc., but we will restrict
attention to all possible 2-net shorts, where a net starts and finishes at a device pin and therefore
includes both the pins and the track (interconnect) in between the pins. Recall that the number of 2-
net short circuit faults between k interconnects = k(k-1)/2. In practice, we realize that not all possible
2-net shorts can exist but, as we will see, it is so easy to target all 2-net shorts that we do not worry
about the unrealistic shorts. Note also that targeting all 2-net shorts means that we are also targeting
all 3-net shorts, all 4-net shorts, etc. Any short greater than 2-net can be considered to be a
collection of associated 2-net shorts i.e. a superset of the component 2-net shorts.

Because of the digital nature of the sensors, open circuits are modeled down-stream as boundary-
scan inputs that are either stuck-at-1 or stuck-at-0. Because we are not sure which way the open-
circuit will behave, we will target both polarities of stuck-at faults.

Interconnect Test Patterns

Faults on a 4-Net Interconnect

Wired-OR Short
Chip 1 Chip 2

Net 1

Net 2

Net 3

Net 4

s-a-0 Open

Figure 42

Consider the simple four-net interconnect structure shown in Figure 42. Assume both devices are
IEEE 1149.1 compliant and the left-hand driver boundary-scan cells (Chip 1) drives values into the
right-hand sensor boundary-scan cells (Chip 2). Assume further that there is an unwanted short-
circuit defect between Nets 1 and 2, and an unwanted open-circuit defect along Net 4. How can we
test for such defects?

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Opens and Shorts Test

Generating Open & Short Tests

Wired-OR Short
Chip 1 Chip 2

Scan-in Net 1 Scan-out

stimulus 1011 1 1 response 0111
Net 2
0 1
Net 3
1 1
Net 4
1 0

Parallel s-a-0 Open Parallel

update capture

Figure 43

Figure 43 shows a solution. The short circuit (assumed to behave logically like a wired-OR gate) is
detected by applying unequal logic values (i.e., logic 1 on Net 1, logic 0 on Net 2) from Chip 1 to Chip
2. The wired-OR behavior causes Chip 2 to receive two logic 1s, allowing detection of the defect.

Similarly, if the open-circuit input behaves like a stuck-at-0 fault, the defect is detected by applying a
logic 1 from Chip 1 on Net 4 and observing that Chip 2 captures a logic 0.

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How Many Tests All Together?

Question: How Many Tests Are Needed?

Chip 1 Chip 2
I Igive
giveup!!
up!!
Net 1

Net 2

Net 3

Net 4

Determine a set of tests to detect all:

• open circuits, modelled as any net s-a-1 and s-a-0, and
• short circuits, modelled as all 2-net shorts of type wired-
AND and wired-OR i.e. {1,2}, {1,3}, {1,4}, {2,3}, {2,4},
{3,4}
Figure 44

A question arises — can we devise a general-purpose algorithm for creating a series of tests capable
of detecting any 2-net short circuit (of either a wired-AND or a wired-OR type) and any single-net open
circuit (causing either a downstream stuck-at-1 or a downstream stuck-at-0 fault)?

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Building The Tests

Building the Tests

Chip 1 Chip 2
s-a-1, s-a-0
Net 1 Each code has at
0 0 1 least one 1, one 0
Net 2
0 1 0 2 forbidden codes:
Net 3 all-1s, all-os
0 1 1
Net 4
1 0 0 2-net shorts
Each code is unique

Determine a set of tests to detect all:

* open circuits, modelled as any net s-a-1 and s-a-0, and
* short circuits, modelled as all 2-net shorts of type
wired-AND and wired-OR
i.e. {1,2}, {1,3}, {1,4}, {2,3}, {2,4}, {3,4}
Figure 45

A way to think about the answer is to look at the problem as a net-coding problem and to reason
about the properties of the codes. Look at Figure 45 but this time consider the horizontal code
allocated to each net e.g. 010 allocated to net 1, etc.

To ensure that each net is tested for a stuck-at-1 and stuck-at-0 fault, there must be at least one 1
and at least one 0 in the code. If stuck-at-1, stuck-at-0 coverage were the only requirements, any
code except the all-0s and all-1s codes would be sufficient. This means that there are two
forbidden codes: all-0s and all-1s.

To ensure that two nets, net i and net j, are tested for a short circuit, there must be at least one bit
different between the two codes allocated to net i and net j in order to apply complementary logic
values across the two nets. Complementary logic values are a necessary and sufficient condition to
detect a short circuit, assuming logical behaviour of the short. Given that we are targeting all
possible 2-net combinations, this generalizes into a requirement that says that the same code can
never be allocated to two separate nets i.e. each code assignment is unique.

With this as background, a simple code-assignment is shown in Figure 45. The Figure shows three
consecutive tests applied to Nets 1 to 4. The first test is the vertical pattern 1010; the second is 0110;
and the third is 0001. Now look at the horizontal codes. The code assigned to net 1 is 001; to net 2
is 010, etc. Each code has at least one 1 and one 0, and each code is only used once i.e. is unique.
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Furthermore, each code is simply formed by writing the binary equivalent of the decimal number of the
net. This code-assignment algorithm is known as the Counting Algorithm and is an extremely
simple way of satisfying the code-property requirements. Because of the two forbidden codes, the
total number of bits in each code (which equals the number of tests) is given by ceil [log2(k + 2)],
where ceil means ceiling (the upper integer value of the logarithm) and k is the number of nets. The
“+ 2” accounts for the two forbidden codes.

The Counting Algorithm

Number of Tests?

Number of tests
= Number of bits in the code
= ceil log2(k + 2), k = number of interconnects
= 13 for k = 8000 interconnects

It’s so simple,
it’s beautiful!!

Figure 46

In summary, the number of tests for k interconnects to detect any open circuit behaving downstream
as either a stuck-at-1 or a stuck-at-0, or any two nets from the collection of all k nets short circuited
and behaving as either a wired-AND or a wired-OR gate is given by ceil log2 (k + 2).

As Albert Einstein might have said “It’s so simple, it’s beautiful!!”

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Practical Aspects of Using Boundary-Scan Technology

Handling Non-Boundary-Scan Clusters

Testing non-BS Clusters

On modern boards, most non-boundary-scan devices are

simple pass-thru devices e.g. line drivers
Consequently, tests for presence, orientation and bonding
are easily generated and easily applied via the embracing
boundary-scan devices

Figure 47

In reality, boards are populated with both boundary-scan and non-boundary-scan devices. The
question arises, “what can we do to test the presence, orientation and bonding of the non-boundary-
scan devices?” The answer to the question depends, in part, on the degree of controllability and
observability afforded to the non-boundary-scan devices through the boundary-scan registers of the
boundary-scan devices and, in part, on the complexity of the non-boundary-scan devices.
On most modern boards, the only non-boundary-scan devices are simple line drivers (buffers), with or
without inversion, or re-routing devices such as multiplexers. These devices are generally known as
“pass thru” devices. It is a simple matter to generate Presence, Orientation and Bonding tests for
such devices and then apply the tests via the embracing boundary-scan devices.
But, on older boards, there may be non-boundary-scan MSI devices i.e. devices with more complex
functions, such as flip-flops, counters, shift registers, etc. The next slide discusses how to handle
such devices.

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Cluster Test Objectives

But, if the Cluster is MSI Devices …

U4

U5
U6

U1

U3

U2

Use ICT nails to access uncontrollable/unobservable cluster-internal

nets
Select the real-nail locations on non-BS nets according to access to:
strategic disables for guarding or preventing bus conflicts.
buried nets in non-embraced clusters
other key control signals e.g. O_Enab, Bidir or 3-state control signals

Figure 48

The diagram shows a cluster of three non-boundary-scan MSI devices, U4, U5, U6,
surrounded by three boundary-scan devices, U1, U2, U3. The boundary-scan registers in U1,
U2, U3 can be used to drive test-pattern stimuli into the non-boundary-scan cluster, and to
observe the cluster responses but the difficulty will be to control and observe the truly buried
nets inside the cluster (e.g., between U4 and U5).

Given that we are not testing the full functionality of the non-boundary-scan devices — only
their presence, orientation and bonding — one solution is to develop tests for the non-
boundary-scan cluster that are applied from the boundary-scan driver cells and which drive
signal values through the cluster targeted on cluster opens and shorts. The responses are
propagated out to the boundary-scan sensor cells. Suitable patterns for the non-boundary-
scan clusters can be taken from the extensive libraries of In-Circuit Testers and validated via
a fault simulator.
An alternative solution is to make use of real nails to access the buried nets, as shown in the
diagram. Clearly, these nets have to be brought to the surface of the board (to allow physical
probing) and the cost of test will increase (because of the extra cost of the bed-of-nails
fixture), but this may be the only way to solve the problem. A solution that combines the
virtual access of boundary scan and the real access of a bed-of-nails system is generally
known as a Limited Access solution

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Access to RAM arrays

Testing A RAM Array Via Boundary Scan

RAM RAM

RAM RAM
Core Logic

RAM RAM

RAM RAM

RAM RAM
Core Logic Core Logic

RAM RAM

RAM RAM

Figure 49

Many boards contain arrays of Random Access Memory (RAM) devices (see Figure 49). RAMs are
not usually equipped with boundary scan and so they too present manufacturing-defect testing
challenges. In a way, an array of RAMs is a special case of a cluster of non-boundary-scan devices.

Boards that contain RAMs typically also contain a programmable device, such as a microprocessor.
The usual practice is to use the microprocessor to test the presence, orientation and bonding of the
RAM devices (i.e., the microprocessor becomes an on-board tester). If there is no programmable
device, then the RAMs can be tested for presence, orientation and bonding defects through the
boundary-scan registers of boundary-scan devices as long as the boundary-scan devices have
boundary-scan register access to the control, data and address ports of the RAMs. Test times will be
slow but the number of tests are not that great given that the purpose of the tests is to identify any
opens or shorts on the RAM pins. Suitable tests can be derived from the classical walking-1/walking-
0 patterns or from the ceil [log2 (k+2)] patterns described earlier.

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Assembling The Final Test Program

Assembling A Test Program: Tool Flow

Non-BS
Non-BS Device Device
BSDL
BSDLFiles Create Characteristic
Board
Files Createand
andverify
verifyhierarchical
hierarchicaldatabase
database Characteristic
BoardNetlist
Netlist (device,
(device, module, board,system)
module, board, system)
Data;
Data;I,I,ncy
O,
O,OZ,
OZ,IO
IO
Transp ,
ncy Constraints
Transp , Constraints

Cluster Assemble
AssembleTestTestProgram:
ClusterTests
Tests Program: Fault
FaultCoverage
Coverage
Binary Integrity:
Integrity: Power-OnScan_DR,
Power-On Scan_DR,IR,IR,BS
BSReg
Reg Report
Binary Report
Macro Interconnect: Enhanced Binary Count
MacroLanguage
Language Interconnect: Enhanced Binary Count Final
FinalTests
Tests
Cluster:
Cluster:Simulation
SimulationPatterns,
Patterns,Manual
Manual
RAM
RAMArray:
Array:Slow-Speed,
Slow-Speed,At-Speed
At-Speed
Diagnostics:
Diagnostics:BIST,
BIST,Scan-Thru-TAP,
Scan-Thru-TAP,Intest
Intest

Verify/Apply
Verify/ApplytotoBoard
Board Results:
Detect: Results:Display
Display
Detect:Go/No
Go/NoGo Go and
andDebug
DebugTools
Tools
Locate:Miscompare
Locate:MiscompareData,Data,Net,
Net,Pin
Pin

Figure 50

Figure 50 summarizes the major stages of assembling a final test program. First, the device
Boundary-Scan Description Language (BSDL) files and board netlist data is used to compile a
database. A BSDL file describes all the boundary-scan features included in a specific device. The
device designer normally creates the file after all the boundary-scan features have been synthesized.
Non-boundary-scan characteristic data is also assembled ready to be used by the various pattern
generators. The test program itself is composed of several segments:

Board-level test infrastructure integrity test: inter-device TDO-to-TDI interconnects, distribution of

TMS, TCK and TRST*, if present. Typically, these tests use both a DR_Scan cycle and an
IR_Scan cycle. The former is an application of what is known as the blind interrogation test
whereas the latter uses the 01 captured into the Instruction Register, as described earlier.
Full Enhanced Binary Count tests between all boundary-scan interconnects, setting non-
boundary-scan devices into safe states.
Tests to be applied to non-boundary-scan clusters via a combination of boundary-scan devices,
real nails (if available), and the normal board edge-connector signals. These tests may be input in
a simple Up, Down, Pulse/High, Low, Don’t Care textual format, or by using a higher-level test
language, such as a macro language or C++.
Tests to be applied to on-board RAM devices, either via an on-board microprocessor or via the
boundary-scan registers of the boundary-scan devices.

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Diagnostics applied to production boards may then make use of internal design-for-test structures
such as internal scan (often called Scan-Thru-TAP), Built-In Self Test or simply through the InTest
Instruction, if available. The final test results are displayed to the user through an interface which
allows line-by-line real-time debug, or by means of a graphical display of applied stimulus and
captured test waveforms compared with the expected values.

Tester Hardware

Hardware Required

Internal controller card

or PCMCIA card
Interface pod
(TAP interface + PIO)

PC: Windows 2000, XP or NT

Board-Under-Test
Figure 51

Modern low-cost board testers for boards populated with boundary-scan devices are based on a
Personal Computer (see Figure 51). The limited drive/sense capability of the PC is enhanced through
a controller card fitted either into an expansion slot (PC-AT, PCI or VXI) or into a PC Card slot or USB
port, connecting to the board-under-test via a signal interface pod. TCK speeds are generally in the
region of 10 MHz to 25 MHz, but can be higher. Additional driver/sensors are often available to
provide direct control and observe on selected edge-connector positions (e.g., control a board Master
Reset signal). The stimulus/response patterns themselves, along with the correct value-changes on
TMS, are stored in RAM devices mounted on the controller card. These devices form a hardware
buffer to hold applied stimulus values and collect actual response values for comparison with the
expected values. Overall, the test-preparation and test-application software in the PC is controlled
under Windows 2000, XP or NT.

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Boundary Scan Tutorial 52

Such board testers are low-cost, compared to traditional in-circuit testers, and very portable, opening
up the possibility to make use of the test program in other test requirements on the boards e.g. in
multi-board system integration and debug, and in field service.

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Boundary Scan Tutorial 53

Boundary-Scan Economics, Summary and Conclusions

Summary

Benchtop + In-Circuit Testers

Agilent ASSET InterTech
3070 ICT Boundary-Scan System

Prototype
Volume
Debug
Manufacture System Debug Field Service
Figure 52

Traditionally, manufacturing defects at the board level have been detected and located by bed-of-nail
In-Circuit Testers. These testers utilize a bed-of-nail fixture that penetrates into test lands on the
surface of the board and, in so doing, gain access to the bonding points of the devices. The nails are
controlled by the driver-sensor channels of the In Circuit Tester and allow the application of tests to
determine device presence, device orientation, and correct device bonding (opens and shorts) at
the solder points.

In the mid-1980s, traditional through-hole device packaging began to give way to surface-mount
packaging styles. Surface-mount devices are soldered on the same side of the board as the device
package itself. This opened up the possibility of mounting devices on both surfaces of the board,
thereby increasing the density of devices on the board, and the need to interconnect between them.
Consequently, multi-layer board technology was developed to cope with the increased density of
interconnection.

The result was that the one thing that an In-Circuit Tester requires – physical access for nail probe –
started to decrease. An alternative solution was formulated by an organization called the Joint Test
Action Group (JTAG). This solution defined a new universal register around the boundary of a
digital device to bring back the access to the bonding points. This boundary-scan register added
nothing to the functionality of the device but solved the problem of limited physical access. JTAG

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Boundary Scan Tutorial 54

developed the technology of boundary scan into the first true international standard on testability: the
IEEE 1149.1-1990 Boundary-Scan Standard.

The boundary-scan registers bring back the lost access thereby allowing presence, orientation and
bonding tests to be carried out. The registers also allow access inside the device, if required, to
assist board-level diagnostic test requirements. Particularly, the boundary-scan structures allow re-
use of other internal Design-For-Test structures, such as the internal scan and Built-In Self Test
structures described earlier. Re-use eases the economic cost justification of Design-For-Test by
allowing amortization of Design-For-Test over the life-cycle of the product.

Boundary Scan Economics

Boundary Scan Versus No Boundary Scan

Sales Accounts
Test Engineer Design Manager

Test Manager Production Engineer

Field Service Marketing

Quality Engineer Designer

Reasons
Reasonsfor
forBoundary
BoundaryScan
Scan(board)
(board) Reasons
Reasonsagainst
againstBoundary
BoundaryScan
Scan(chip)
(chip)
• •Efficient
Efficientboard-level
board-levelinterconnect
interconnectATPGATPG • •Increases
• •Short Increasesdevice
devicereal
realestate
estate
Short (~days) test programmingtime
(~days) test programming time • •Requires
Requires four (five)extra
four (five) extrapins/device
pins/device
• •Can
Canuseuselow-cost
low-costPC-based
PC-basedtesters
testers • •Very
• •Effective Verylittle
littlecontribution
contributiontotodevice
devicemission
mission
Effective defect detection/location(via
defect detection/location (via mode
mode
Scan-thru-TAP
Scan-thru-TAPororBIST):BIST):aids
aidsboard
boarddebug
debug • •Impacts
• •System/field diagnosis: 1149.1 is the Impactsperformance
performance
System/field diagnosis: 1149.1 is the • •Increases
Increasesdesign
designtime
time
“internet
“internetofoftest”
test” • •Bad
• • Enhances BadBSDL
BSDL(Board(Boardlevel
levelobjection)
objection)
Enhancesfield-servicing
field-servicingtotoFRU
FRU
• •Only
Only solutionfor
solution forMCMs
MCMsandandlimited-access
limited-access
SMT/ML
SMT/MLboardsboards
• •Enables
EnablesISC:
ISC:CPLD,
CPLD,Flash,
Flash,FPGA,
FPGA,PROM PROM

Figure 53

The economic analysis of boundary-scan is notoriously difficult. To do the analysis properly requires
an in-depth understanding of the economic system used within a company, the type of board and
dynamics of the end-user market, the current way of testing boards, and so on. To help the reader,
Figure 53 summarizes the main factors for and against the use of boundary scan but be warned: this
is a very simplified view. Often, engineers start using boundary scan simply because there is no
other way to solve the limited-access problem at board test!!

Where are we today?

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Boundary Scan Tutorial 55

Where Are We Today?

Safety-Critical BScan
Fast Internal Access BScanTAP
TAP IEEE 5001 GEPDIS
Chip Design for Design Verificatn for
for EmulationTest
Emulation Test Approved 2000

Chip-Level IP BScan
BScanStructures IEEE P1500 ECT
Structures Any SOC Team
Market (SOC) for
forCore
CoreAccess
Access Final Ballot, 2002?

Programmable Logic BScan

In-System BScanAccess
Accessfor
for IEEE 1532 ISC
Device Industry Configuration (ISC) (Re)-Programming Approved 2000
(Re)-Programming

IEEE 1149.1 BScan Prot. Bd Debug Any Elect. Board Board Designers
JTAG, 1990/93/01 Vol. Production Design/Man Co Board Test Eng.

Limited Access
Multi-Layer Boards
IEEE
IEEE1149.4
1149.4Analog
Analog Systems
Approved 1999 Integrators
Approved 1999

GEPDIS: Global Embedded Processor

Debug Interface System
Texas Instruments,
ECT: Embedded Core Test Extension
Extensioninto
into
SOC: System-On-Chip National Semi, Field Service
Backplane
Backplane
JTAG: Joint Test Access Group Lattice, Firecron

Figure 54

There are three major developments fuelling the current boundary-scan market. The first is the
increasing acceptance of ball-grid array styles of IC device packaging. The second is the recent
extension of the boundary-scan Standard into the analog domain: the publication of the IEEE 1149.4-
99 Mixed Signal Test Bus Standard. The third is the increasing desire to program programmable
logic devices on the board, rather than off the board.

Ball-grid array styles of packaging place balls of solder underneath the package of an IC, replacing
the traditional pins of a device and allowing the device to be bonded to the board within the confines
of its own footprint. This increases yet further the density of devices on the board but means that
once the device is bonded to the board, it is not possible to use any form of visual inspection, such as
an automated optical inspection system, to determine the correctness of bonding. The result is that
boundary-scan adoption is now mainstream.

A recent addition to boundary-scan technology is the IEEE 1149.4-1999 Mixed-Signal Test

Standard. The original 1149.1 Boundary-Scan Standard addressed only the digital signal pins of
an IC. 1149.4 addresses the analogue pins of mixed-signal devices and builds on the 1149.1
boundary-scan structures. It is too early to say whether this new Standard will meet with industrial
acceptance but interest is high, especially in the telecommunications market.

Many new logic designs are first created and debugged in programmable IC devices such as
Complex Programmable Logic Devices (CPLDs) or Field-Programmable Gate Arrays (FPGAs).
Such devices are usually programmed off the board on a free-standing programming station but there
is a growing trend to place the devices on the board, un-programmed, and then to program them on

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Boundary Scan Tutorial 56

the board using the board-level boundary-scan pathways. This technique, known as In-System
Configuration (ISC), offers many advantages over the traditional programming station technique and
has caused yet another new IEEE Standards group to be created. The IEEE 1532-2000 In-System
Configuration Standard was approved in 2000 and it relies on and makes use of 1149.1 boundary-
scan structures within the CPLD and FPGA devices. In-System Configuration could become an even
bigger application of boundary scan technology than the original JTAG application to manufacturing
board test.

Conclusion

The Spread of Boundary-Scan Technology

Chip Board System/Field Service

Boundary-Scan
Boundary-Scan
Technology
Technology

5001-00 Texas
TexasInst,
Inst,Nat
NatSemi
5001-00Emulation
Emulation 1149.1-90/93/94/01
1149.1-90/93/94/01 Semi
(eJTAG) Interconnect Back-Plane
Back-PlaneBus
(eJTAG) InterconnectTest
Test Bus

P1500-02(?)
P1500-02(?) Chip
ChipDFT
DFTRe-use
Re-use
Embedded
EmbeddedCore
CoreTest
Test (Int.
(Int. Scan,BIST,
Scan, IDDQ) )
BIST,IDDQ

1149.4-99
1149.4-99
Mixed-Signal
Mixed-SignalBus
Bus

1532-00
1532-00
In-System
In-SystemConfiguration
Configuration
Figure 55

Widespread adoption of the IEEE 1149.1 Boundary-Scan Standard reflects an industry-wide need to
simplify the complex problem of testing boards and systems for a range of manufacturing defects and
performing other design debug tasks. This standard provides a unique opportunity to simplify the
design debug and test processes by enabling a simple and standard means of automatically creating
and applying tests at the device, board, and system levels. Several companies have responded with
boundary-scan-based software tools that take advantage of the access and control provided by
boundary-scan architecture to ease the testing process.

In this tutorial, we have discussed the motivation for the standard, the architecture of an IEEE 1149.1-
compliant device, and presented a simple introduction to the use of the IEEE 1149.1 features at the
board level — both to detect and to locate manufacturing defects. For further details on boundary-
scan — at the device level, board level, or system level — see the references listed in the To Probe
Further section or visit www.vitalect.com for an extended web-based-learning version of this tutorial.

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Boundary Scan Tutorial 57

Ben Bennetts
DFT Consultant
17 August, 2001
(Updated 25 September, 2002)

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Boundary Scan Tutorial 58

To Probe Further ….

• IEEE 1149.1-2002 Test Access Port and Boundary Scan Architecture Standard web site:
http://grouper.ieee.org/groups/1149/1 or http://standards.ieee.org/catalog/Ken Parker, “The boundary-scan
handbook: analog and digital”, Kluwer Academic Press, 1998 (2nd Edition), http:www.wkap.nl/
• Proceedings of the IEEE International Test Conference (ITC), http://www.itctestweek.org/
(Latest developments on boundary scan technology and applications)

• IEEE Design & Test of Computers (D&TC) magazine, http://computer.org/

(The official journal for new announcements about the Standard)

• Agilent Technologies BSDL verification service: http://www.agilent.com/see/bsdl_service or

[email protected] (Free BSDL syntax checker, semantics checker and pattern-generation
service)

• ASSET InterTech web site: www.asset-intertech.com (Market leader in low-cost PC-based testers for
boards populated with boundary-scan and non-boundary-scan devices)
• Texas Instruments’ Web site: http://www.ti.com/sc/docs/jtag/jtaghome.htm (Details of all TI’s boundary-
scan devices, plus downloadable animated tutorial material)

• National Semiconductor’s web site: http://www.national.com/scan/ (Details of all National’s boundary-

scan devices)

• More Advanced Reading

• IEEE 1149.4 Mixed-Signal Test Bus Standard web site: http://grouper.ieee.org/groups/1149/4

• IEEE 1532 In-System Configuration Standard web site: http://grouper.ieee.org/groups/1532/

o Tegethoff, Parker and Lee (Agilent Technologies), “Open boards test coverage: when is 99% really
40%?”, IEEE ITC Proceedings, 1996, Paper 12.2, pp. 333 – 339. See also de Jong et al., ITC2000,
P22.1(Problems and solutions to the placement of boundary-scan cells on Power and Ground)

• Sasidhar et al., “Testing NASA’s 3D-stack MCM space flight computer”, IEEE Design & Test of
Computers, July-Sept., 98, pp. 44-55 (NASA’s application of boundary scan and multi-chip modules for
space computers)

• Barr et al (Lucent Technologies), “End-to-end testing for boards and systems using boundary scan”,
IEEE ITC Proceedings, 2000, Paper 22.2, pp. 585 – 592. (Lucent Technologies’ use of 1149.1 at board level
and as a backplane test bus for system level test)

o Harrison et al (Motorola Network Solutions), “The implementation of IEEE 1149.1 boundary scan test
strategy within a cellular infrastructure production environment”, IEEE ITC Proceedings, 2000, Paper
2.3, pp. 45 – 54. See also follow-up paper at ITC 2001 (P17.2) (Motorola’s use of 1149.1 at board level
and as a backplane test bus for system level test)

• David Marsh, “Simple boundary-scan techniques tackle sophisticated systems”, Electronic Design
News (EDN) Europe, July, 2001, pp. 34 – 42. (Excellent survey of more-recent applications of boundary
scan, including 1532 In-System Configuration and 1149.4 Mixed-Signal Bus. Available on
http://www.ednmag.com)
• Rick Nelson, “PCB test: nails or TAP?”, Test & Measurement World, Sept, 2002, pp. 17 – 24. (Excellent
survey of the technical and business relationships between the low-cost PC-based boundary-scan testers
and the more traditional in-circuit test products and suppliers.) Available from www.tmworld.com

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