Lecture 4
Lecture 4
ANNOUNCEMENTS
• Prof. King will not hold office hours this week, but will hold
an extra office hour next Mo (2/3) from 11AM-12:30PM
• Quiz #1 will be given at the beginning of class on Th 2/6
– covers material in Chapters 1 & 2 (HW#1 & HW#2)
– closed book; one page of notes allowed
OUTLINE
– Drift (Chapter 3.1)
» carrier motion
» mobility
» resistivity
Spring 2003 EE130 Lecture 4, Slide 1
Ev + 3kT ≤ EF ≤ Ec − 3kT
1
Degenerately Doped Semiconductor
• If a semiconductor is very heavily doped, the Boltzmann
approximation is not valid.
In Si at T=300K: Ec-EF < 3kT if ND > 1.6x1018 cm-3
Ev + 3kT ≤ EF ≤ Ec − 3kT
N = 1018 cm-3:
N = 1019 cm-3:
2
Free Carriers in Semiconductors
• Three primary types of carrier action occur
inside a semiconductor:
– drift
– diffusion
– recombination-generation
3
Carrier Effective Mass
In an electric field, , an electron or a hole accelerates:
electrons
holes
Thermal Velocity
3 1
Average electron or hole kinetic energy = kT = m * vth
2
2 2
3 kT 3 × 0 . 026 eV × (1 . 6 × 10 − 19 J/eV)
v th = =
m* 0 . 26 × 9 . 1 × 10 − 31 kg
= 2 . 3 × 10 5 m/s = 2 . 3 × 10 7 cm/s
4
Carrier Scattering
• Mobile electrons and atoms in the Si lattice are
always in random thermal motion.
– Electrons make frequent collisions with the vibrating atoms
• “lattice scattering” or “phonon scattering”
– increases with increasing temperature
– Average velocity of thermal motion for electrons: ~107 cm/s @ 300K
• Other scattering mechanisms:
– deflection by ionized impurity atoms
– deflection due to Coulombic force between carriers
• “carrier-carrier scattering”
• only significant at high carrier concentrations
Carrier Drift
• When an electric field (e.g. due to an externally applied
voltage) is applied to a semiconductor, mobile charge-
carriers will be accelerated by the electrostatic force. This
force superimposes on the random motion of electrons:
2
3 1
4 electron
5
5
Electron Momentum
• With every collision, the electron loses momentum
mn*vd
Carrier Mobility
6
Electron and Hole Mobilities
cm/s cm 2
µ has the dimensions of v/ : =
V/cm V ⋅ s
Si Ge GaAs InAs
2
µ n (cm /V·s) 1400 3900 8500 30000
µ p (cm2/V·s) 470 1900 400 500
Solution:
7
Mobility Dependence on Doping
1600
1400 1 1 1
= +
1200
τ τ phonon τ impurity
E lectrons
1 1 1
= +
Mobility (cm V s )
-1
1000
µ µ phonon µ impurity
-1
800
2
600
400
H o les
200
1E 14 1E 15 1E 16 1E 17 1E 18 1E 19 1E 20
-3
Total Doping
T otal Concentration
Im p urity C on ce nra tio nN(a
A + ND (cm )
to m s cm -3)
Drift Current
8
Conductivity and Resistivity
9
Electrical Resistance
V
I _
+
W
t
homogeneously doped sample
V L
Resistance R≡ =ρ (Unit: ohms)
I Wt
where ρ is the resistivity
Spring 2003 EE130 Lecture 4, Slide 19
Example
Consider a Si sample doped with 1016/cm3 Boron.
What is its resistivity?
Answer:
NA = 1016/cm3 , ND = 0 (NA >> ND Æ p-type)
Æ p ≈ 1016/cm3 and n ≈ 104/cm3
1 1
ρ= ≅
qnµ n + qpµ p qpµ p
[
= (1.6 × 10 −19 )(1016 )(450) ]−1
= 1.4 Ω − cm
Spring 2003 EE130 Lecture 4, Slide 20
10
Example: Dopant Compensation
Consider the same Si sample, doped additionally
with 1017/cm3 Arsenic. What is its resistivity?
Answer:
NA = 1016/cm3, ND = 1017/cm3 (ND>>NA Æ n-type)
Æ n ≈ 9x1016/cm3 and p ≈ 1.1x103/cm3
1 1
ρ= ≅
qnµ n + qpµ p qnµ n
[
= (1.6 ×10 −19 )(9 × 1016 )(600) ]
−1
= 0.12 Ω − cm
Spring 2003 EE130 Lecture 4, Slide 21
Summary
• Electrons and holes moving under the influence of an
electric field can be modelled as quasi-classical
particles with average drift velocity
|vd| = µ
1 1
• Resistivity ρ= =
σ qnµ n + qpµ p
Spring 2003 EE130 Lecture 4, Slide 22
11