D9040PCIC en
D9040PCIC en
The PCI Express electrical test software allows you to automatically execute PCI
Express electrical transmitter tests, and it displays the results in a flexible report
format. In addition to the measurement data, the report provides a margin analysis
that shows how closely your device passed or failed each test.
The PCI Express electrical test software utilizes the prescribed test methods
and algorithms as required by the PCI Express Card Electromechanical (CEM)
specifications for all current PCI Express Standards through PCIe 3.0. This
produces results that are not only consistent with the PCI-SIG® SigTest utility,
but also provides you with a fast and easy means of executing complex two-port
motherboard tests and single port add-in card test with total automation.
With the growing popularity of SSD drives, PCI Express has become the de-facto physical
layer interface for solid state storage drives. One of the more common connectors used
in SSDs today is the U.2 (also called the SFF-8639 connector). Using U.2 Test fixtures
provided by the PCI-SIG, the Keysight PCI Express electrical test software supports the
testing of U.2 based end points and root complexes at 2.5 G, 5 G, and 8 GT/s.
In addition to full swing (800 mV) testing, the software also supports testing for low-power,
half-swing devices (400 mV) as per the PCI Express Architecture Mobile Graphics Low-
Power Addendum to the PCI Express Base Specification Revision 1.0.
Features
The Keysight D9040PCIC PCI Express 4.0 electrical transmitter (TX) test software
represents the latest PCI Express TX test tool that supports PCI Express 4.0 with speeds of
up 16 GT/s. Below is a list of a few of the key features of this software package.
• PCIe 4.0 BASE TX measurements including uncorrelated TJ, DJ, and PWJ, pseudo
package loss and other parameters defined in the 0.7 version of the PCI Express BASE
specification.
• BASE spec TX measurements are supported at 16 GT/s, 8 GT/s, 5 GT/s, and 2.5 GT/s.
• Legacy support for PCI Express 3.x, 2.x, and 1.1 compliance tests (BASE and CEM).
• PCI 4.0 reference clock measurements as defined in v0.9 of the PCIe 4.0 BASE spec.
• Support for U.2 (SFF-8639) PCIe 3.0 CEM measurements for endpoint and root
complex devices (8 GT/s, 5 GT/s, and 2.5 GT/s).
• Automated DUT control for endpoint and root complex testing using a Keysight 81150A
or 81160A Pulse Function Arbitrary Noise Generator.
• New Workshop Compliance mode for rapid PCI SIG-style compliance testing including
Sigtest HTIML report files.
• Support for de-embedding of test fixtures, high speeds switches and cables 1 or the
embedding of channel or package model losses.
• Support for Keysight and BitifEye high speed switch networks to automate testing of
multi-lane DUTs.
With the PCI Express D9040PCIC electrical test software, you can use the same
oscilloscope you use for everyday debugging to perform automated testing and margin
analysis based on the PCI-SIG-specified tests.
While SigTest tests provide a good overview of PCI Express electrical signal quality,
it addresses only a subset of the electrical compliance measurements specified in
the PCI-SIG specification. The SigTest application also provides minimal reporting
capability with pass/fail indication and measurement values, and has limited debugging
capabilities to decipher eye mask violations or excessive jitter.
For PCI Express 4.0 measurements, the software automatically calculates uncorrelated
total jitter, uncorrelated deterministic jitter, and uncorrelated PWJ necessary for
validating new PCIe 4.0 or 3.0 compliant chipsets compliant chipsets. For devices
compliant with versions of PCI Express 2.0 or earlier, random jitter is also reported
for completeness and a voltage margin “eye” diagram is included in the final HTML
report. DJ and TJ values are specified in the PCIe 2.0 specification and are required for
compliance verification compliance verification under that version of the standard.
2. Requires a 4 channel Oscilloscope with the required bandwidth on all 4 channels or the use of
appropriate InfiniiMAX probes and SMA/3.5 mm probe head adapters.
Benefits
PCI Express electrical test software benefits
The PCI Express electrical test software saves you time by setting the stage for automatic
execution of PCI Express electrical tests. Part of the difficulty of performing electrical tests for
PCI Express is hooking up the oscilloscope, loading the proper setup files, and then analyzing
the measured results by comparing them to limits published in the specification. The PCI
Express electrical test software does much of this work for you. In addition, if you discover a
problem with your device, robust debug tools are available to aid in root-cause analysis. Tools
are provided by the Keysight E2688A high-speed serial data analysis software, which you must
install on your oscilloscope to use the PCI Express electrical test software.
The software also now has an integrated interface for controlling the InfiniiSim Waveform
Transformation Toolset for de-embedding of test fixtures. Introduced with PCIe 2.0 and
also required under the PCIe 3.0 and 4.0 standards, de-embedding of test fixtures utilizes
S-parameters as input to create a de-embed model that helps to restore high frequency signal
content that is often lost or significantly attenuated by test fixtures and cables.
The PCI Express electrical test software offers many more electrical tests than the SigTest
application. PCI Express electrical test software automatically configures the oscilloscope
for each test, and it provides an informative results report that includes margin analysis
indicating how close your product is to passing or failing a particular test assertion. Table
1 shows a side-by-side comparison of the capabilities of the SigTest application and the
Keysight PCI Express electrical test software. A list of the measurements made by the PCI
Express electrical test software can be found in Table 3, (Table 3 contains comparison of
SigTest vs. Keysight).
Table 1. Comparison of capabilities of the Keysight PCI Express electrical test software and
the PCI-SIG SigTest application.
Capability Keysight PCI PCI-SIG SigTest
Express software
Support for PCIe 4.0 BASE Spec BASE Spec
Integrated de-embedding support or the Yes (InfiniiSim Varies with version
embedding of channel or package loss waveform level of PCIe std.
transformation toolset
required)
Number of measurement assertions Up to 47 4
Support for PCIe CEM 1.0a, 1.1, 2.0, 3.0 Yes Yes
Support for U.2 2.5G, 5G, and 8G
Reference clock tests 12 (1.1, 2.0, 3.0) 13 0 1
(4.0)
Automated oscilloscope setup for each Yes, guided No, single setup
measurement
Measurement results Pass/fail with margin Pass/fail with
analysis measured value
CEM based measurement methodology Yes Yes
Clock recovery method PCI-SIG SigTest or PCI-SIG SigTest
1st/2nd order PLL
Brick wall filter (2.0 testing) Yes Yes
Custom HTML report generation Yes No
Support for low power device Yes No
Selectable number of tests performed Yes No
Multi-trial run support Yes No
Debug mode for “what if” analysis Yes No
Compliance test boards supported CBB1-4 CLB1-4, U.2 CBB1-4 CLB1-4, U.2
CBB CLB
1. PCI-Sig offers a separate utility (Clock Jitter) for analyzing reference clock phase jitter.
The software allows you to easily specify the test standard you want to use to test the
compliance of your device. This makes test setup easy as only the appropriate tests for
the test point you pick are shown on later test selection pages.
Figure 2a: The software allows you to easily specify the test standard you want to use to
test the compliance of your device. This makes test setup easy as only the appropriate
tests for the test point you pick are shown on later test selection pages
Figure 2b: The Device Definition dialog allows the selection of the data rates to be tested,
testing with SSC enabled or a clean clock, Automatic toggling of compliance patterns,
testing with SigTest, and more
Figure 2c: The Connection Setup dialog allows the user to setup multiple lane testing. One
or two lanes can be tested with the scope alone but all the lanes will be documented. This
testing can be automated with the use of switches available from Keysight or BitifEye
Figure 3: The Keysight automated test engine guides you quickly through selecting tests,
configuring tests, setting up the connection, running the tests, and viewing the results.
Individual tests or groups of tests are easily selected with a mouse click
Figure 5: The D9040PCIC provides the option to use a user provided S-Parameter file
S-Parameter file for 8 GT/s CEM testing
Figure 7: In the Configure tab you can set parameters like number of UI, noise reduction,
signal check, etc.
Figure 8: When you make multiple tests where the connections must be changed, you are
prompted with connection diagrams and/or photographs
Figure 9: Shown here are the proposed PCI-SIG Compliance Base Board the PCI-SIG
Compliance Base Board (CBB4) for Gen4 add-in card testing, and the Compliance Load
Board (CLB4) for Gen4 motherboard or host system testing
Figure 10: The PCI Express electrical test software results report documents your test,
indicates the pass/fail status, the test specification range, the measured values, and shows
how much margin you have
Figure 11: The HTML report provides additional details including test setup conditions,
graphical results, and test limits (where appropriate)
Figure 12: How close you are to passing or failing a test is indicated as a % in the margin
field. A result highlighted in yellow or red indicates that the margin threshold level for a
warning or failure was detected
Figure 14: UDA Add-In tests and utilities in your test application
The commands required for each task may be created using a command wizard or from
“remote hints” accessible throughout the user interface.
Using automation, you can accelerate complex testing scenarios and even automate
manual tasks such as:
Combine the power of built-in automation and extensibility to transform your application
into a complete test suite executive:
• Interact with your device controller to place it into desired states or test modes
before test execution.
• Configure additional instruments used in your test suite such as a pattern generator
and probe switch matrix.
• Export data generated by your tests and post-process it using your favorite
environment, such as MATLAB, Python, LabVIEW, C, C++, Visual Basic etc.
• Sequence or repeat the tests and “Add-In” custom steps execution in any order for
complete test coverage of the test plan.
LabVIEW
UDA add-in
- DUT control Results
- Instrument control
Live signals
DUT
Custom tests/Steps
or post processing
Figure 16: Combine the power of built-in automation and extensibility to transform your
application into a complete test suite executive
• Eliminate reconnections, which saves time and reduces errors through automating
test setup for each lane of a multi-lane bus.
• Maintain accuracy with the use of unique D9010DMBA De-embedding and InfiniiSim
software to compensate for switch path losses and skew.
• Customize testing by using remote programming interface and the user-defined
application tool for device control, instrument control and test customization.
Figure 17: Automated testing for multi-lane digital bus interface through switching solution
The D9040PCIC includes powerful reference clock evaluation tools including phase
jitter. The PCIe 1.1 specification calls for a very specific phase jitter filter that focuses
the measurement on the jitter that lies between 1.5 and 22 MHz. The filter also amplifies
the jitter 3 dB (peaking) within this region. The Keysight D9040PCIC includes proprietary
filtering software the that exactly implements the significantly expanded phase jitter filters
specified in the PCI Express 4.0 Specification. The D9040PCIC also includes reference
clock tests based on the PCIe 2.0 and 3.0 specification.
Reference clock test connection using PCI Express 4.0 Test setup, load, and probe
requirements.
Reference clock
~ 12 inches measurement point
Reference clock
generator component
Figure 19: This figure shows the reference clock compliance channel, compliance load, and
probing requirement for all PCIe 4.0 reference clock tests. Note that these tests are intended
to be used to validate your PCIe reference clock at the component level
Installing the optional D9010PCIP Protocol decode tool provides 8b/10b or 128b/130b
decoding that allows you to identify data-dependent errors that result in eye mask
violations caused by inter-symbol interference (ISI). You can perform 8b/10b decoding
to capture and display serial data synchronized with the analog view of a serial data
stream (For PCIe 1.x and 2.x). The D9010PCIP Protocol Decode Tool also supports the
decoding of 8G and 16G PCIe data under the PCIe 4.0 and PCIe 3.0 standard.
Figure 20: The N5463A provides 8b/10b and 128b/130b decode below
Using the Serial Data Analysis tool you can test for illegal characters in your compliance
pattern. You can also use the mask test feature to identify the specific digital patterns
that caused a specific failure in the eye diagram when testing under the 1.1 specification
(using a first order PLL).
For 2.0 testing you can use a first or second order PLL for clock recovery and apply
a TIE brick wall filter to achieve a proper clock filtering. For PCIe 3.0, you can use a
standard 1st order PLL for clock recovery. If you are testing with SSC enabled, you will
need to use a 2nd order PLL for clock recovery or use an explicit clock reference.
Figure 22: Once the mask test is complete the Serial Data Analysis application allows you
to show the specific signal within the waveform that caused failures
To purchase the PCI Express compliance test fixtures, consult the PCI-
SIG Web site and select the PCI-SIG specification order form link at:
www.pcisig.com/specifications/ordering_information
Compliance Description
test fixture
CBB PCI Express Compliance Base Board for testing PCI Express add-in cards
CLB PCI Express Compliance Load Board for testing PCI Express platforms
CBB2 Gen2 PCI Express Compliance Base Board for testing PCI Express add-in
cards
CLB2 Gen2 PCI Express Compliance Load Board for testing PCI Express platforms
CBB3 Gen3 PCI Express Compliance Base Board for testing PCI Express add-in
cards
CLB3 Gen3 PCI Express Compliance Load Board for testing PCI Express platforms
CBB4 Gen4 PCI Express Compliance base board for testing PCI Express CEM
based, add-in cards
CLB4 Gen4 PCI Express Compliance Load board for testing PCI Express CEM
based platforms
U-2 Pair U.2 (SFF-8639) Pair: Compliance Base Board and Compliance Load Board
Bandwidth requirements for PCI Express 4.0, 3.0, 2.0, and 1.1
PCI Express operates at 2.5 GT/s, 5 GT/s, 8 GT/s and 16 GT/s. The two tables below
provide guidelines on the minimum bandwidth and sample rate recommended for PCI
Express Transmitter measurements. In addition to transmitter measurements, phase jitter
measurements of the PCIe 100 MHz reference clock also call for a minimum sample
rate used to measure the clock as is also shown below. Use this information to help
you select the proper oscilloscope for your specific requirements. Also remember that
receiver testing requires adequate bandwidth to ensure the most accurate calibration
of your bit error ratio tester (BERT). Automated receiver calibration using the N5990xxA
Automated Compliance and Device Characterization tool and the Keysight M8020A or
M8040A J-BERT high performance BERT includes integration and control of Keysight
high performance oscilloscopes for fast BERT calibration for receiver stressed jitter and
stressed voltage testing.
Note: While the PCI-SIG does supply Gen2, Gen3, and Gen4 test fixtures for
motherboard and add-in card testing, you will need to obtain SMP cables, adapters and
terminators from a vendor of your choice as the SIG does not supply them.
1. Requires a 4 channel oscilloscope or (if using only two channels) two InfiniiMax II or InfiniiMax III/+
probe amplifiers and SMA/3.5 mm differential probe heads of the appropriate bandwidth for the
PCIe data rate you intend to test.
Tests Performed
The PCI Express electrical performance validation and compliance software performs
the following tests as per the PCI Express 1.0a and 1.1 electrical specifications for
add-in cards and motherboard systems as documented in Section 4 of the base
specification (“PHY”) and Section 4 of the card electromechanical specification (“EM”).
For reference, the tests performed by the SigTest application are also noted.
For PCI Express 3.0, test coverage includes items listed on table 4-18 under section
4.3.3 of the PCI Express 3.0 Base Specification.
Table 3.
Assertion no. Description Keysight PCI SigTest
Express
Transmitter tests
PHY.3.1#26 DC common mode voltage Y N
PHY.3.2#1 De-emphasis on multiple bits same Y N
polarity in succession
PHY.3.2#2 Transition bit voltage Y N
PHY.3.3#1 Transmitter eye diagram Y N
PHY.3.3#2 Unit interval without SSC variations Y N
PHY.3.3#3 Minimum D+/D- output rise/fall time Y N
PHY.3.3#4 Jitter median to max deviation Y N
PHY.3.3#5 Maximum RMS AC common mode Y N
voltage
PHY.3.3#9 Minimum eye width Y N
Receiver tests
PHY.3.4#1 Minimum receiver eye diagram Y 1
N
PHY.3.4#2 AC peak common mode input Y 1
N
voltage
PHY.3.4#6 Jitter median to max deviation input Y 1
N
System board (connector) tests
EM.4#4 Minimum jitter Y 2
Y
EM.4#20 Transmitter path eye diagram Y 2
Y
Reference clock (connector) tests
PHY.3.3#2 Phase jitter Y N/A 1
1. Receiver tests provided by the Keysight PCI Express software are listed under the PCIe 1.x or 2.0
test tabs do not validate the receiver’s tolerance or ability to correctly receive data. They validate
the signal at the receiver against specified tolerances.
2. Requires a 4 channel oscilloscope or (if using only two channels) two Infiniimax or InfiniiMax III/+
probe amplifiers and SMA/3.5 mm differential probe heads of the appropriate bandwidth for the
PCIe data rate you intend to test.
License terms
• Perpetual – Perpetual licenses can be used indefinitely.
• Time-based – Time-based licenses can be used through the term of the license only
(6, 12, 24, or 36 months).
License types
• Node-locked – License can be used on one specified instrument/computer.
• Transportable – License can be used on one instrument/computer at a time but
may be transferred to another using Keysight Software Manager (internet connection
required).
• USB Portable – License can be used on one instrument/computer at a time but
may be transferred to another using a certified USB dongle (available for additional
purchase with Keysight part number E8900-D10).
• Floating (single site) – Networked instruments/computers can access a license from
a server one at a time. Multiple licenses can be purchased for concurrent usage.
If you are interested in obtaining a quote for this product, please contact your
Keysight representative for pricing and availability.