Notes For Sizing Flaws
Notes For Sizing Flaws
Pattern 1
A single sharp signal rising smoothly in height to a
maximum then falling smoothly to zero (see Figure A).
Pattern 2
A single sharp signal rising smoothly in height to a
maximum which is held with or without minor amplitude
fluctuations with probe movement and falling smoothly to
zero (see Figure B).
Pattern 3
A signal, or group of signals, which may be fully or
partially resolved, fluctuating in height as it/they rise
to and fall from one or more principal maxima (see Figure
C).
For Pattern 1 behavior, it is not possible to estimate the
defect size because the width Of the beam in austenitic
weld metal Cannot be accurately known. Such indications
are often associated with volumetric defects, but it is
recommended that indications of this type be assessed by
other angles of probe to confirm a volumetric character.
Fig. B
Fig. C
Bi - Modal Technical
1.0 Description
1.2 The two basic crack sizing techniques for the Bi-Modal
Tecnical are:
1. Time of Flight (TOF), Tau or M-AATT, which is the
peaked Pulse 1 signal, set to specific screen ranges.
2. Delta Time of Flight (Δ TOF), Sigma or M-RATT, which
is the screen division of separation between the Pulse
1 and Pulse 2 signals.
2. Calibration
3.0 Scanning/Evaluation
3.3 Adjust the instrument gain such that the average noise
level is about 10% to 15 % full screen height (FSH).
4.0 Limitations