Physics Mini Project Sem 1
Physics Mini Project Sem 1
Introduction
D esign C hallenges
Manufacturing Challenges
Applications
Industry T rends
T
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s
t
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g Testing mixed signal ICs requires
specialized equipment and techniques.
M ixed signal oscilloscopes and logic
T analyzers are used to measure both
e analog and digital signals.Built-in self-
c test (BIST) circuits are used to automate
testing and improve reliability.Design for
h test (DFT) techniques are used to
n facilitate testing during manufacturing.
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Future C hallenges
Conclusion
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