16-04-2024

PROCESS CAPABILITY

 Used to analyze whether a product or service meets

the specifications required by the customer.
 Process capability analysis should be conducted
PROCESS CAPABILITY only when a process is in a state of statistical control
 Process capability represents the performance of a
process in a state of statistical control
 A “capable” process is one for which the distributions
of the process characteristics do lie almost entirely
Dr. Dhananjay A. Jolhe within the engineering tolerances.
 Process capability is assessed by a set of indices
Department of Mechanical Engineering,
 Decides the process yield and sigma level of the
Visvesvaraya National Institute of Technology, Nagpur process
© Dr. Dhananjay Jolhe 2

PROCESS CAPABILITY: BASIC CONCEPT PROCESS CAPABILITY: BASIC CONCEPT

 Design tolerances = specification spread (SS)

SPECIFICATION SPECIFICATION
LIMITS  Decided by functional/ customer’s requirement LIMITS
 Process independent
 Bilateral/unilateral, Symmetric/asymmetric
 Three terms:
 USL
 LSL
 M [= (USL + LSL)/2, for symmetric bilateral
tolerance]

PROCESS PROCESS
CAPABILITY CAPABILITY
LIMITS LIMITS

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PROCESS CAPABILITY: BASIC CONCEPT PROCESS CAPABILITY: BASIC CONCEPT

SPECIFICATION
 Permissible spread considering natural variations SPECIFICATION
LIMITS in process parameters = process spread (PS) LIMITS

 Also called Natural Tolerance Limits (NTL): Upper &

Lower, viz. UNTL & LNTL
 Used to decide state of statistical control (using
control charts)
 Five terms:
 UCL (=UNTL)
 LCL (=LNTL)
 µ
PROCESS
CAPABILITY   PROCESS
CAPABILITY
LIMITS  T (process target) [Ideally T = µ = M] LIMITS

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PROCESS SPREAD VS SPECIFICATION PROCESS SPREAD VS SPECIFICATION

SPREAD SPREAD

PS < SS  Process is quite capable. PS < SS  Process is quite capable.

 Safety margin for process to go out of control.  Safety margin for process to go out of control.

 Process is just capable.

PS = SS PS = SS  No safety margin for process to go out of control.
 If µ = M, then process yield = 99.74%.

PS > SS PS > SS

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PROCESS SPREAD VS SPECIFICATION

PROCESS CAPABILITY INDICES
SPREAD

PS < SS  Process is quite capable. Cp

 Safety margin for process to go out of control.

 Process is just capable.

PS = SS  No safety margin for process to go out of control.
 If µ = M, then process yield = 99.74%.

 Process is not capable.

PS > SS
 Process may be in statistical control.
Cpu & Cpl
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PROCESS CAPABILITY INDICES PROCESS CAPABILITY INDICES

Cp Cpk  Proposed by Kane in 1986

 Cpk= min (Cpu, Cpl)

 Upper capability index & Lower capability index  Cpk = Cp (1-k)

 Cpu = (USL - µ)/3σ  Where k = =

/
 Cpl = (µ - LSL)/3σ
 If µ =M, then Cpk = Cp.
 Cpu ≥ 1 & Cpl ≥ 1 are good.  If µ =UCL or LCL, then Cpk = 0.
 If Cpu = Cpl = 1, then only 0.13% items will be non-  Cpk ≥ 1 is desirable.
Cpu & Cpl conforming Cpm
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PROCESS CAPABILITY INDICES PROCESS CAPABILITY INDICES

Cpk Ca  Accuracy Index

 Taguchi Index  Ca = 1- k = 1-
 Proposed by Taguchi in 1985
 If µ = M, Ca =1
 Cpm = = = =
 If µ= LSL (or USL), Ca = 0
• Measures the degrees of process centering
 where, E[.] = 2 = expected value of [.] and 𝛿 =
(µ-T)/ = deviation of µ from T w.r.t. .
 General form: C*pm= D/,
 Where, D = min [(USL-T)/3, (T-LSL)/3]
Cpm  Considers deviation of µ from T. Cpmk
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PROCESS CAPABILITY INDICES PROCESS CAPABILITY INDICES

 Superstructure Cp(u,v) (Suggested by Vannman in 1995)

Ca
 Cp(u,v) =
 Hybrid Index (third-generation capability index)
 Proposed by Pearn in 1992  Cp(0,0) = Cp = 
 Combines merits of Cp, Cpk and Cpm.
 Cp(1,0) = Cpk = = Cp (1-k)

 Cpmk = min , =

=  Cp(0,1) = Cpm =
∗
 Cpmk = =𝐶 ∗𝐶
Cpmk  Cp(1,1) = Cpmk =
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PROCESS CAPABILITY INDICES PROCESS CAPABILITY INDICES

 Three criteria to evaluate process capability indices-  Process Incapability Index

Cpp
 (i) variability in the process,  Proposed by Greenwichand and Jahr-Schaffrath in
 (ii) degree of departure of µ from T, and 1995.
 (iii) location of µ in the interval (LSL, USL).
Chen and Ding (2001)  Cpp = (1/Cpm)2 =

𝐶 = 𝐶 + 𝐶
 Cp = criterion (i) only where,
 Cpk = criteria (i) and (iii) Cia = inaccuracy index (measure of departure of µ
 Cpm = criteria (i) and (ii) from T)
 Cpmk = criteria (i), (ii) and (iii) Cip = impression index (measure of magnitude of 2)
Ccop
© Dr. Dhananjay Jolhe 17
 If Cpp = 0, process is most capable 18

PROCESS CAPABILITY INDICES PROCESS CAPABILITY INDICES

 Loss Index
Cpp Le
 Based on Taguchi’s concept of quadratic loss function

 Le = Lpe + Lot =
𝒅𝟐

𝝈 𝟐
 Lpe = = potential relative expected loss
𝒅
 Conforming output proportion Index 𝝁 𝑻 𝟐
 Lot = = relative off-target squared deviation
𝒅
 Ccop=
 Le= Lpe= Lot =

 If Ccop ≤ 1, then minimum conforming output

Ccop proportion = 99.73%. Vt
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PROCESS CAPABILITY INDICES

Le

 Viability Index
 Proposed by Veevers in 1995
 General index not restricted to normal distribution or
univariate situation
( )
 Vt = = 1-

 If Vt < 0, then process is ‘not viable’.

Vt
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