25AA1024
25AA1024
25AA1024
Features: Description:
• 20 MHz max. Clock Speed The Microchip Technology Inc. 25AA1024/25LC1024
• Byte and Page-level Write Operations: (25XX1024*) is a 1024 Kbit serial EEPROM memory
- 256 byte page with byte-level and page-level serial EEPROM func-
- 6 ms max. write cycle time tions. It also features Page, Sector and Chip erase
- No page or sector erase required functions typically associated with Flash-based prod-
• Low-Power CMOS Technology: ucts. These functions are not required for byte or page
- Max. Write current: 5 mA at 5.5V, 20 MHz write operations. The memory is accessed via a simple
- Read current: 7 mA at 5.5V, 20 MHz Serial Peripheral Interface (SPI) compatible serial bus.
- Standby current: 1μA at 2.5V The bus signals required are a clock input (SCK) plus
(Deep power-down) separate data in (SI) and data out (SO) lines. Access to
• Electronic Signature for Device ID the device is controlled by a Chip Select (CS) input.
• Self-Timed Erase and Write Cycles: Communication to the device can be paused via the
- Page Erase (6 ms max.) hold pin (HOLD). While the device is paused, transi-
- Sector Erase (10 ms max.) tions on its inputs will be ignored, with the exception of
- Chip Erase (10 ms max.) Chip Select, allowing the host to service higher priority
• Sector Write Protection (32K byte/sector): interrupts.
- Protect none, 1/4, 1/2 or all of array
The 25XX1024 is available in standard packages
• Built-In Write Protection: including 8-lead PDIP and SOIJ, and advanced 8-lead
- Power-on/off data protection circuitry DFN package. All devices are Pb-free.
- Write enable latch
- Write-protect pin
• High Reliability:
Package Types (not to scale)
- Endurance: 1M erase/write cycles
• Temperature Ranges Supported: DFN PDIP/SOIJ
(MF) (P, SM)
- Industrial (I): -40°C to +85°C
- Automotive (E): -40°C to +125°C CS 1 8 VCC
CS 1 8 VCC
25LC1024
25LC1024
Name Function
† NOTICE: Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the
device. This is a stress rating only and functional operation of the device at those or any other conditions above those
indicated in the operational listings of this specification is not implied. Exposure to maximum rating conditions for an
extended period of time may affect device reliability.
Param.
Sym. Characteristic Min. Max. Units Test Conditions
No.
D001 VIH1 High-level input .7 VCC VCC +1 V
voltage
D002 VIL1 Low-level input -0.3 0.3 VCC V VCC ≥ 2.7V
D003 VIL2 voltage -0.3 0.2 VCC V VCC < 2.7V
D004 VOL Low-level output — 0.4 V IOL = 2.1 mA
D005 VOL voltage — 0.2 V IOL = 1.0 mA, VCC < 2.5V
D006 VOH High-level output VCC -0.5 — V IOH = -400 μA
voltage
D007 ILI Input leakage current — ±1 μA CS = VCC, VIN = VSS TO VCC
D008 ILO Output leakage — ±1 μA CS = VCC, VOUT = VSS TO VCC
current
D009 CINT Internal capacitance — 7 pF TA = 25°C, CLK = 1.0 MHz,
(all inputs and VCC = 5.0V (Note)
outputs)
D010 ICC Read — 10 mA VCC = 5.5V; FCLK = 20.0 MHz;
— SO = Open
Operating current 5 mA VCC = 2.5V; FCLK = 10.0 MHz;
SO = Open
D011 ICC Write — 7 mA VCC = 5.5V
— 5 mA VCC = 2.5V
D012 ICCS — 20 μA CS = VCC = 5.5V, Inputs tied to VCC or
Standby current — VSS, 125°C
12 μA CS = VCC = 5.5V, Inputs tied to VCC or
VSS, 85°C
D13 ICCSPD Deep power-down — 1 μA CS = VCC = 2.5V, Inputs tied to VCC or
current VSS, 85°C
— 2 μA CS = VCC = 5.5V, Inputs tied to VCC or
VSS, 125°C
Note: This parameter is periodically sampled and not 100% tested.
Param.
Sym. Characteristic Min. Max. Units Conditions
No.
1 FCLK Clock frequency — 20 MHz 4.5 ≤ VCC ≤ 5.5
— 10 MHz 2.5 ≤ VCC < 4.5
— 2 MHz 1.8 ≤ VCC < 2.5
2 TCSS CS setup time 25 — ns 4.5 ≤ VCC ≤ 5.5
50 — ns 2.5 ≤ VCC < 4.5
250 — ns 1.8 ≤ VCC < 2.5
3 TCSH CS hold time 50 — ns 4.5 ≤ VCC ≤ 5.5
100 — ns 2.5 ≤ VCC < 4.5
500 — ns 1.8 ≤ VCC < 2.5
(Note 3)
4 TCSD CS disable time 50 — ns
5 Tsu Data setup time 5 — ns 4.5 ≤ VCC ≤ 5.5
10 — ns 2.5 ≤ VCC < 4.5
50 — ns 1.8 ≤ VCC < 2.5
6 THD Data hold time 10 — ns 4.5 ≤ VCC ≤ 5.5
20 — ns 2.5 ≤ VCC < 4.5
100 — ns 1.8 ≤ VCC < 2.5
7 TR CLK rise time — 20 ns (Note 1)
8 TF CLK fall time — 20 ns (Note 1)
9 THI Clock high time 25 — ns 4.5 ≤ VCC ≤ 5.5
50 — ns 2.5 ≤ VCC < 4.5
250 — ns 1.8 ≤ VCC < 2.5
10 TLO Clock low time 25 — ns 4.5 ≤ VCC ≤ 5.5
50 — ns 2.5 ≤ VCC < 4.5
250 ns 1.8 ≤ VCC < 2.5
11 TCLD Clock delay time 50 — ns
12 TCLE Clock enable time 50 — ns
13 TV Output valid from clock low — 25 ns 4.5 ≤ VCC ≤ 5.5
— 50 ns 2.8 ≤ VCC < 4.5
— 250 ns 1.8 ≤ VCC < 2.5
14 THO Output hold time 0 — ns (Note 1)
15 TDIS Output disable time — 25 ns 4.5 ≤ VCC ≤ 5.5
— 50 ns 2.5 ≤ VCC < 4.5
— 250 ns 1.8 ≤ VCC < 2.5
(Note 1)
16 THS HOLD setup time 10 — ns 4.5 ≤ VCC ≤ 5.5
20 — ns 2.5 ≤ VCC < 4.5
100 — ns 1.8 ≤ VCC < 2.5
17 THH HOLD hold time 10 — ns 4.5 ≤ VCC ≤ 5.5
20 — ns 2.5 ≤ VCC < 4.5
100 — ns 1.8 ≤ VCC < 2.5
Note 1: This parameter is periodically sampled and not 100% tested.
2: This parameter is not tested but established by characterization and qualification. For endurance
estimates in a specific application, please consult the Total Endurance™ Model which can be obtained
from our web site at www.microchip.com.
3: Includes THI time.
Param.
Sym. Characteristic Min. Max. Units Conditions
No.
18 THZ HOLD low to output 15 — ns 4.5 ≤ VCC ≤ 5.5
High-Z 30 — ns 2.5 ≤ VCC < 4.5
150 — ns 1.8 ≤ VCC < 2.5
(Note 1)
19 THV HOLD high to output valid 15 — ns 4.5 ≤ VCC ≤ 5.5
30 — ns 2.5 ≤ VCC < 4.5
150 — ns 1.8 ≤ VCC < 2.5
20 TREL CS High to Standby mode — 100 μs VCC = 1.8V to 5.5V
21 TPD CS High to Deep power- — 100 μs VCC = 1.8V to 5.5V
down
22 TCE Chip erase cycle time — 10 ms VCC = 1.8V to 5.5V
23 TSE Sector erase cycle time — 10 ms VCC = 1.8V to 5.5V
24 TWC Internal write cycle time — 6 ms Byte or Page mode and Page
Erase
25 — Endurance 1M — E/W (Note 2) Per Page
Cycles
Note 1: This parameter is periodically sampled and not 100% tested.
2: This parameter is not tested but established by characterization and qualification. For endurance
estimates in a specific application, please consult the Total Endurance™ Model which can be obtained
from our web site at www.microchip.com.
3: Includes THI time.
SCK
18 19
High-Impedance
SO n+2 n+1 n n n-1
Don’t Care 5
SI n+2 n+1 n n n-1
HOLD
CS 12
2 11
7
Mode 1,1 8 3
SI MSB in LSB in
High-Impedance
SO
CS
9 10 3
Mode 1,1
SCK Mode 0,0
13
14 15
Don’t Care
SI
CS
0 1 2 3 4 5 6 7 8 9 10 11 29 30 31 32 33 34 35 36 37 38 39
SCK
Data Out
High-Impedance
SO 7 6 5 4 3 2 1 0
CS
Twc
0 1 2 3 4 5 6 7 8 9 10 11 29 30 31 32 33 34 35 36 37 38 39
SCK
Instruction 24-bit Address Data Byte
SI 0 0 0 0 0 0 1 0 23 22 21 20 2 1 0 7 6 5 4 3 2 1 0
High-Impedance
SO
CS
0 1 2 3 4 5 6 7 8 9 10 11 29 30 31 32 33 34 35 36 37 38 39
SCK
Instruction 24-bit Address Data Byte 1
SI 0 0 0 0 0 0 1 0 23 22 21 20 2 1 0 7 6 5 4 3 2 1 0
CS
40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55
SCK
Data Byte 2 Data Byte 3 Data Byte n (256 max)
SI 7 6 5 4 3 2 1 0 7 6 5 4 3 2 1 0 7 6 5 4 3 2 1 0
CS
0 1 2 3 4 5 6 7
SCK
SI 0 0 0 0 0 1 1 0
High-Impedance
SO
CS
0 1 2 3 4 5 6 7
SCK
SI 0 0 0 0 0 1 10 0
High-Impedance
SO
CS
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15
SCK
Instruction
SI 0 0 0 0 0 1 0 1
CS
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15
SCK
SI 0 0 0 0 0 0 0 1 7 6 5 4 3 2 1 0
High-Impedance
SO
WEL WPEN WP
Protected Blocks Unprotected Blocks STATUS Register
(SR bit 1) (SR bit 7) (pin 3)
0 x x Protected Protected Protected
1 0 x Protected Writable Writable
1 1 0 (low) Protected Writable Protected
1 1 1 (high) Protected Writable Writable
x = don’t care
CS
0 1 2 3 4 5 6 7 8 9 10 11 29 30 31
SCK
High-Impedance
SO
CS
0 1 2 3 4 5 6 7 8 9 10 11 29 30 31
SCK
High-Impedance
SO
CS
0 1 2 3 4 5 6 7
SCK
SI 1 1 0 0 0 1 1 1
High-Impedance
SO
CS
0 1 2 3 4 5 6 7
SCK
SI 1 0 1 1 1 0 0 1
High-Impedance
SO
FIGURE 2-12: RELEASE FROM DEEP POWER-DOWN AND READ ELECTRONIC SIGNATURE
CS
0 1 2 3 4 5 6 7 8 9 10 11 29 30 31 32 33 34 35 36 37 38 39
SCK
Driving CS high after the 8-bit RDID command, but before the Electronic Signature has been transmitted, will still
ensure the device will be taken out of Deep Power-Down mode. However, there is a delay TREL that occurs before the
device returns to Standby mode (ICCS), as shown in Figure 2-13.
FIGURE 2-13: RELEASE FROM DEEP POWER-DOWN AND READ ELECTRONIC SIGNATURE
CS
0 1 2 3 4 5 6 7 TREL
SCK
Instruction
SI 1 0 1 0 1 0 1 1
High-Impedance
SO
XXXXXXX 5LC1024
T/XXXXX I/MF e3
YYWW 0328
NNN 1L7
XXXXXXXX 25AA1024
T/XXXNNN I/P e3 1L7
YYWW 0328
XXXXXXXX 25LC1024
T/XXXXXX I/SM e3
YYWWNNN 07281L7
Note: For very small packages with no room for the Pb-free JEDEC designator
e3 , the marking will only appear on the outer carton or reel label.
Note: In the event the full Microchip part number cannot be marked on one line, it will
be carried over to the next line, thus limiting the number of available
characters for customer-specific information.
* Standard marking consists of Microchip part number, year code, week code, traceability code (facility
code, mask rev#, and assembly code). For marking beyond this, certain price adders apply. Please
check with your Microchip Sales Office.
8-Lead Plastic Dual Flat, No Lead Package (MF) – 6x5 mm Body [DFN-S]
PUNCH SINGULATED
Note: For the most current package drawings, please see the Microchip Packaging Specification located at
http://www.microchip.com/packaging
D e
D1 b L
N N
E
E2
E1
EXPOSED
PAD
NOTE 1 1 2 2 1 NOTE 1
D2
A A2
A1 A3
NOTE 2
Units MILLIMETERS
Dimension Limits MIN NOM MAX
Number of Pins N 8
Pitch e 1.27 BSC
Overall Height A – 0.85 1.00
Molded Package Thickness A2 – 0.65 0.80
Standoff A1 0.00 0.01 0.05
Base Thickness A3 0.20 REF
Overall Length D 4.92 BSC
Molded Package Length D1 4.67 BSC
Exposed Pad Length D2 3.85 4.00 4.15
Overall Width E 5.99 BSC
Molded Package Width E1 5.74 BSC
Exposed Pad Width E2 2.16 2.31 2.46
Contact Width b 0.35 0.40 0.47
Contact Length L 0.50 0.60 0.75
Contact-to-Exposed Pad K 0.20 – –
Model Draft Angle Top φ – – 12°
Notes:
1. Pin 1 visual index feature may vary, but must be located within the hatched area.
2. Package may have one or more exposed tie bars at ends.
3. Dimensioning and tolerancing per ASME Y14.5M.
BSC: Basic Dimension. Theoretically exact value shown without tolerances.
REF: Reference Dimension, usually without tolerance, for information purposes only.
NOTE 1
E1
1 2 3
D
E
A A2
A1 L
c
e
b1 eB
b
Units INCHES
Dimension Limits MIN NOM MAX
Number of Pins N 8
Pitch e .100 BSC
Top to Seating Plane A – – .210
Molded Package Thickness A2 .115 .130 .195
Base to Seating Plane A1 .015 – –
Shoulder to Shoulder Width E .290 .310 .325
Molded Package Width E1 .240 .250 .280
Overall Length D .348 .365 .400
Tip to Seating Plane L .115 .130 .150
Lead Thickness c .008 .010 .015
Upper Lead Width b1 .040 .060 .070
Lower Lead Width b .014 .018 .022
Overall Row Spacing § eB – – .430
Notes:
1. Pin 1 visual index feature may vary, but must be located with the hatched area.
2. § Significant Characteristic.
3. Dimensions D and E1 do not include mold flash or protrusions. Mold flash or protrusions shall not exceed .010" per side.
4. Dimensioning and tolerancing per ASME Y14.5M.
BSC: Basic Dimension. Theoretically exact value shown without tolerances.
D
N
E1
1 2
e
b
c
A2 φ
A
β
A1 L
Units MILLIMETERS
Dimension Limits MIN NOM MAX
Number of Pins N 8
Pitch e 1.27 BSC
Overall Height A 1.77 – 2.03
Molded Package Thickness A2 1.75 – 1.98
Standoff § A1 0.05 – 0.25
Overall Width E 7.62 – 8.26
Molded Package Width E1 5.11 – 5.38
Overall Length D 5.13 – 5.33
Foot Length L 0.51 – 0.76
Foot Angle φ 0° – 8°
Lead Thickness c 0.15 – 0.25
Lead Width b 0.36 – 0.51
Mold Draft Angle Top α – – 15°
Mold Draft Angle Bottom β – – 15°
Notes:
1. SOIJ, JEITA/EIAJ Standard, formerly called SOIC.
2. § Significant Characteristic.
3. Dimensions D and E1 do not include mold flash or protrusions. Mold flash or protrusions shall not exceed 0.25 mm per side.
REVISION HISTORY
Revision C (02/2007)
Revised Features Section (Self-timed Erase and Write
Cycles); Revised Table 1-1 (Param. D012 and D13);
Table 1-2 (Param. 20-24); Revised Package Marking
Information; Replaced Package Drawings; Revised
Product ID System Section (SM package). Changed
PICmicro to PIC.
Revision D (07/2007)
Revised Features; Revised Tables 1-1 and 1-2 (added
Industrial temp. and revised parameters 22-23);
Replaced Package Drawings (Rev. AP); Revised
Product ID System; Changed Flash to EEPROM.
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• Microchip believes that its family of products is one of the most secure families of its kind on the market today, when used in the
intended manner and under normal conditions.
• There are dishonest and possibly illegal methods used to breach the code protection feature. All of these methods, to our
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06/25/07