R- Chart

UCL = D4R LCL = D3R

R
R=
k
Where
R = range of each sample
k = number of samples (sub groups)

© 2014 John Wiley & Sons, Inc. - Russell and Taylor 8e 3-1
2
Chapter 6 Introduction to Statistical Quality Control, 6th Edition by Douglas C. Montgomery. 3
Copyright (c) 2009 John Wiley & Sons, Inc.
 R-Chart Example
OBSERVATIONS (SLIP- RING DIAMETER, CM)
SAMPLE k 1 2 3 4 5 x R
1 5.02 5.01 4.94 4.99 4.96 4.98 0.08
2 5.01 5.03 5.07 4.95 4.96 5.00 0.12
3 4.99 5.00 4.93 4.92 4.99 4.97 0.08
4 5.03 4.91 5.01 4.98 4.89 4.96 0.14
5 4.95 4.92 5.03 5.05 5.01 4.99 0.13
6 4.97 5.06 5.06 4.96 5.03 5.01 0.10
7 5.05 5.01 5.10 4.96 4.99 5.02 0.14
8 5.09 5.10 5.00 4.99 5.08 5.05 0.11
9 5.14 5.10 4.99 5.08 5.09 5.08 0.15
10 5.01 4.98 5.08 5.07 4.99 5.03 0.10
Totals 50.09 1.15

© 2014 John Wiley & Sons, Inc. - Russell and Taylor 8e 3-4
 R-Chart Example
_
UCL = D4R =
_
LCL = D3R =

Retrieve chart factors D3 and D4

© 2014 John Wiley & Sons, Inc. - Russell and Taylor 8e 3-5
 R-Chart Example
_
UCL = D4R = 2.11(0.115) = 0.243
_
LCL = D3R = 0(0.115) = 0

Retrieve chart factors D3 and D4

© 2014 John Wiley & Sons, Inc. - Russell and Taylor 8e 3-6
 R-Chart Example

© 2014 John Wiley & Sons, Inc. - Russell and Taylor 8e 3-7
 Using x- bar and R-Charts Together
• Process average and process variability must be
in control
• Samples can have very narrow ranges, but
sample averages might be beyond control limits
• Or, sample averages may be in control, but
ranges might be out of control
• An R-chart might show a distinct downward
trend, suggesting some nonrandom cause is
reducing variation

© 2014 John Wiley & Sons, Inc. - Russell and Taylor 8e 3-8
 Control Chart Patterns

• Run
• sequence of sample values that display same
characteristic
• Pattern test
• determines if observations within limits of a control
chart display a nonrandom pattern

© 2014 John Wiley & Sons, Inc. - Russell and Taylor 8e 3-9
 Control Chart Patterns
• To identify a pattern look for:
• 8 consecutive points on one side of the center line
• 8 consecutive points up or down
• 14 points alternating up or down
• 2 out of 3 consecutive points in zone A (on one side of
center line)
• 4 out of 5 consecutive points in zone A or B (on one
side of center line)

© 2014 John Wiley & Sons, Inc. - Russell and Taylor 8e 3-10
 Control Chart Patterns

UCL UCL

LCL LCL

Sample observations Sample observations

consistently below the consistently above the
center line center line

© 2014 John Wiley & Sons, Inc. - Russell and Taylor 8e 3-11
 Control Chart Patterns

UCL UCL

LCL LCL

Sample observations Sample observations

consistently increasing consistently decreasing

© 2014 John Wiley & Sons, Inc. - Russell and Taylor 8e 3-12
 Zones for Pattern Tests
UCL =
3 sigma = x + A2R
Zone A
= 2
2 sigma = x + 3 (A2R)

Zone B
= 1
1 sigma = x + 3 (A2R)

Process Zone C =
x
average
Zone C
=
1 sigma = x - 1 (A2R)
3
Zone B
=
2 sigma = x - 2 (A2R)
3
Zone A
=
LCL 3 sigma = x - A2R
| | | | | | | | | | | | |
1 2 3 4 5 6 7 8 9 10 11 12 13
Sample number
© 2014 John Wiley & Sons, Inc. - Russell and Taylor 8e 3-13
 Performing a Pattern Test

SAMPLE x ABOVE/BELOW UP/DOWN ZONE

1 4.98 B — B
2 5.00 B U C
3 4.95 B D A
4 4.96 B D A
5 4.99 B U C
6 5.01 — U C
7 5.02 A U C
8 5.05 A U B
9 5.08 A U A
10 5.03 A D B

© 2014 John Wiley & Sons, Inc. - Russell and Taylor 8e 3-14
 Sample Size Determination

• Attribute charts require larger sample sizes

• 50 to 100 parts in a sample

• Variable charts require smaller samples

• 2 to 10 parts in a sample

© 2014 John Wiley & Sons, Inc. - Russell and Taylor 8e 3-15
 SPC with Excel

© 2014 John Wiley & Sons, Inc. - Russell and Taylor 8e 3-16
 INDIAN INSTITUTE OF TECHNOLOGY ROORKEE

Process Capability Analysis

Prof. Tarun Sharma
Process Capability

Process variability
• Are they aligned with each
other?
Design
specifications
Definitions

• Process variability
• Design Specifications
• Process Range = 6*sigma
• Upper Specification Limit (USL)
Where sigma is the standard
deviation of the CTQ dimension
• Lower Specification Limit (LSL)

• Tolerance Range = USL - LSL

Definitions

• Process fallout

• Fraction of the process output which does not meet the specification,
i.e., the CTQ dimension is outside of the design specifications
Numeric measure of Process Capability

• Process Capability Ratio (Cp) = Tolerance Range/ Process variation

• Process Capability Index (Cpk) = Min{(Mean – LSL)/(3*sigma),

(USL-Mean)/(3*sigma)}
 Process Capability

• Compare natural variability to design variability

• Natural variability
• What we measure with control charts
• Process mean = 8.80 oz, Std dev. = 0.12 oz
• Tolerances
• Design specifications reflecting product
requirements
• Net weight = 9.0 oz  0.5 oz
• Tolerances are  0.5 oz

© 2014 John Wiley & Sons, Inc. - Russell and Taylor 8e 3-24
 Process Capability
Design
Specifications

(a) Natural variation

exceeds design
specifications; process is
not capable of meeting
specifications all the
time.
Process
Design
Specifications

(b) Design specifications

and natural variation the
same; process is capable
of meeting specifications
most of the time.

Process
© 2014 John Wiley & Sons, Inc. - Russell and Taylor 8e 3-25
 Process Capability
Design
Specifications

(c) Design specifications

greater than natural
variation; process is
capable of always
conforming to
specifications.
Process
Design
Specifications

(d) Specifications greater

than natural variation, but
process off center; capable
but some output will not
meet upper specification.

Process

© 2014 John Wiley & Sons, Inc. - Russell and Taylor 8e 3-26
 Process Capability Ratio

tolerance range
Cp =
process range

upper spec limit - lower spec limit

=
6

© 2014 John Wiley & Sons, Inc. - Russell and Taylor 8e 3-27
 Computing Cp

Net weight specification = 9.0 oz  0.5 oz

Process mean = 8.80 oz
Process standard deviation = 0.12 oz

upper specification limit -

lower specification limit
Cp =
6

© 2014 John Wiley & Sons, Inc. - Russell and Taylor 8e 3-28
 Computing Cp

Net weight specification = 9.0 oz  0.5 oz

Process mean = 8.80 oz
Process standard deviation = 0.12 oz

upper specification limit -

lower specification limit
Cp =
6

9.5 - 8.5
= = 1.39
6(0.12)

© 2014 John Wiley & Sons, Inc. - Russell and Taylor 8e 3-29
 Process Capability Index

=
x - lower specification limit
,
3
Cpk = minimum =
upper specification limit - x
3

© 2014 John Wiley & Sons, Inc. - Russell and Taylor 8e 3-30
 Computing Cpk

Net weight specification = 9.0 oz  0.5 oz

Process mean = 8.80 oz
Process standard deviation = 0.12 oz
=
x - lower specification limit
,
Cpk = minimum 3
=
upper specification limit - x
3

© 2014 John Wiley & Sons, Inc. - Russell and Taylor 8e 3-31
 Computing Cpk

Net weight specification = 9.0 oz  0.5 oz

Process mean = 8.80 oz
Process standard deviation = 0.12 oz
=
x - lower specification limit
,
Cpk = minimum 3
=
upper specification limit - x
3

8.80 - 8.50 9.50 - 8.80

= minimum , = 0.83
3(0.12) 3(0.12)

© 2014 John Wiley & Sons, Inc. - Russell and Taylor 8e 3-32
 Process Capability With Excel

© 2014 John Wiley & Sons, Inc. - Russell and Taylor 8e 3-33