VLSI Lec 01
VLSI Lec 01
Si Si Si
Si Si Si
Si Si Si
http://onlineheavytheory.net/silicon.html
Dopants
Silicon is a semiconductor at room temperature
Pure silicon has few free carriers and conducts poorly
Adding dopants increases the conductivity drastically
Dopant from Group V (e.g. As, P): extra electron (n-type)
Dopant from Group III (e.g. B, Al): missing electron, called hole (p-type)
Si Si Si Si Si Si
- +
+ -
Si As Si Si B Si
Si Si Si Si Si Si
p-n Junctions
First semiconductor (two terminal) devices
A junction between p-type and n-type semiconductor
forms a diode.
Current flows only in one direction
p-type n-type
anode cathode
A Brief History
Invention of the Transistor
Vacuum tubes ruled in first half of 20th century Large,
expensive, power-hungry, unreliable
1947: first point contact transistor (3 terminal devices)
Shockley, Bardeen and Brattain at Bell Labs
A Brief History, contd..
Kilby’s IC
smithsonianchips.si.edu/ augarten/
13 x 1021 transistors
200 billion CPU cores
A Brief History, contd.
First Planer IC built in 1961
Ref: http://micro.magnet.fsu.edu/creatures/technical/sizematters.html
Transistor Types
Bipolar transistors
npn or pnp silicon structure
Small current into very thin base layer controls large
currents between emitter and collector
Base currents limit integration density
Metal Oxide Semiconductor Field Effect Transistors
nMOS and pMOS MOSFETS
Voltage applied to insulated gate controls current
between source and drain
Low power allows very high integration
First patent in the ’20s in USA and Germany
Not widely used until the ’60s or ’70s
What is MOS
(metal-oxide-semiconductor)
A basic MOS consisting of three layers.
The top layer is a conductive metal electrode.
The middle layer is an insulator of glass or silicon dioxide.
The bottom layer is another conductive electrode made out
of crystal silicon. This layer is a semiconductor whose
conductivity changes with either doping or temperature.
Cross-section Structure of MOS
d is the thickness of the oxide and V is the applied
voltage on the metal field plate
V>(<)0 metal plate is positively (negatively) biased with
respect to the ohmic contact
MOS Transistors
Four terminal device: gate, source, drain, body
Gate – oxide – body stack looks like a capacitor
Gate and body are conductors (body is also called the substrate)
SiO2 (oxide) is a “good” insulator (separates the gate from the body
Called metal–oxide–semiconductor (MOS) capacitor, even though gate is
mostly made of poly-crystalline silicon (polysilicon)
n+ n+ p+ p+
p bulk Si n bulk Si
NMOS PMOS
NMOS Operation
Body is commonly tied to ground (0 V)
Drain is at a higher voltage than Source
When the gate is at a low voltage:
P-type body is at low voltage
Source-body and drain-body “diodes” are OFF
No current flows, transistor is OFF
Source Gate Drain
Polysilicon
SiO2
0
n+ n+
S D
p bulk Si
NMOS Operation Cont.
When the gate is at a high voltage: Positive charge on
gate of MOS capacitor
Negative charge is attracted to body under the gate
Inverts a channel under gate to “n-type” (N-channel, hence
called the NMOS) if the gate voltage is above a threshold
voltage (VT)
Now current can flow through “n-type” silicon from source through
channel to drain, transistor is ON
Source Gate Drain
Polysilicon
SiO2
1
n+ n+
S D
p bulk Si
PMOS Transistor
Similar, but doping and voltages reversed
Body tied to high voltage (VDD)
Drain is at a lower voltage than the Source
Gate low: transistor ON
Gate high: transistor OFF
Bubble indicates inverted behavior Source Gate Drain
Polysilicon
SiO 2
p+ p+
n bulk Si
Power Supply Voltage
GND = 0 V
In 1980’s, VDD = 5V
VDD has decreased in modern processes
High VDD would damage modern tiny transistors
Lower VDD saves power
VDD = 3.3, 2.5, 1.8, 1.5, 1.2, 1.0,
Effective power supply voltage can be lower
due to IR drop across the power grid.
Transistors as Switches
In Digital circuits, MOS transistors are electrically
controlled switches
Voltage at gate controls path from source to drain
g=0 g=1
d d d
nMOS g OFF
ON
s s s
d d d
pMOS g OFF
ON
s s s
CMOS Inverter
A Y
VDD
0
A Y
A Y
GND
CMOS Inverter
A Y
VDD
0
1 0 OFF
A=1 Y=0
ON Y is pulled low by
the turned on
A Y NMOS Device.
Hence NMOS is the
GND
pull-down device.
CMOS Inverter
A Y
VDD Y is pulled high by
0 1 the turned on
PMOS Device.
1 0 ON Hence PMOS is the
pull-up device.
A=0 Y=1
OFF
A Y
GND
CMOS NAND Gate
A B Y
0 0
0 1 Y
1 0
A
1 1
B
CMOS NAND Gate
A B Y
0 0 1 ON ON
0 1 Y=1
1 0 A=0 OFF
1 1
B=0 OFF
CMOS NAND Gate
A B Y
0 0 1 OFF ON
0 1 1 Y=1
1 0 A=0 OFF
1 1
B=1 ON
CMOS NAND Gate
A B Y
0 0 1 ON OFF
0 1 1 Y=1
1 0 1 A=1 ON
1 1
B=0 OFF
CMOS NAND Gate
A B Y
0 0 1 OFF OFF
0 1 1 Y=0
1 0 1 A=1 ON
1 1 0
B=1 ON
CMOS NOR Gate
A B Y
0 0 1
A
0 1 0
1 0 0 B
1 1 0
Y
3-input NAND Gate
Y is pulled low if ALL inputs are 1
Y is pulled high if ANY input is 0
Y
A
B
C
CMOS Fabrication
CMOS transistors are fabricated on silicon wafer
Wafers diameters (200-300 mm)
Lithography process similar to printing press
On each step, different materials are deposited, or patterned or
etched.
Easiest to understand by viewing both top and cross-section of wafer
in a simplified manufacturing process VDD
A Y
GND
Inverter Cross-section
Typically use p-type substrate for nMOS transistors
Requires to make an n-well for body of pMOS
transistors
A
GND VDD
Y SiO 2
n+ diffusion
p+ diffusion
n+ n+ p+ p+
polysilicon
n well
p substrate
metal1
p+ n+ n+ p+ p+ n+
n well
p substrate
GND VDD
n-well
Polysilicon Polysilicon
n+ diffusion
n+ Diffusion
p+ diffusion
p+ Diffusion
Contact
Contact
Metal
In
In reality >40 masks
may be needed Metal
Fabrication Steps
Start with blank wafer (typically p-type where NMOS is created)
Build inverter from the bottom up
First step will be to form the n-well (where PMOS would reside)
Cover wafer with protective layer of SiO2 (oxide)
Remove oxide layer where n-well should be built
Implant or diffuse n dopants into exposed wafer to form n-well
Strip off SiO2
p substrate
Oxidation
Grow SiO2 on top of Si wafer
900 – 1200 C with H2O or O2 in oxidation
furnace
SiO 2
p substrate
Photoresist
Spin on photoresist
Photoresist is a light-sensitive organic polymer
Property changes where exposed to light
Photoresist
_ SiO 2
p substrate
Lithography
Expose photoresist to Ultra-violate (UV)
light through the n-well mask
Strip off exposed photoresist with
chemicals
Photoresist
SiO 2
p substrate
Etch
Etch oxide with hydrofluoric acid (HF)
Seeps through skin and eats bone; nasty stuff!!!
Only attacks oxide where resist has been exposed
N-well pattern is transferred from the mask to
silicon-di-oxide surface; creates an opening to the
silicon surface
Photoresist
SiO 2
p substrate
Strip Photoresist
Strip off remaining photoresist
Use mixture of acids called piranah etch
Necessary so resist doesn’t melt in next
step
SiO 2
p substrate
n-well
n-well is formed with diffusion or ion implantation
Diffusion
Place wafer in furnace with arsenic-rich gas
Heat until As atoms diffuse into exposed Si
Ion Implanatation
Blast wafer with beam of As ions
Ions blocked by SiO2, only enter exposed Si
SiO2 shields (or masks) areas which remain p-type
SiO 2
n well
Strip Oxide
Strip off the remaining oxide using HF
Back to bare wafer with n-well
Subsequent steps involve similar series of
steps
n well
p substrate
Polysilicon
(self-aligned gate technology)
Polysilicon
Thin gate oxide
n well
p substrate
Polysilicon Patterning
Use same lithography process discussed
earlier to pattern polysilicon
Polysilicon
Polysilicon
Thin gate oxide
n well
p substrate
Self-Aligned Process
Use gate-oxide/polysilicon and masking to
expose where n+ dopants should be
diffused or implanted
N-diffusion forms nMOS source, drain,
and n-well contact
n well
p substrate
N-diffusion/implantation
Pattern oxide and form n+ regions
Self-aligned process where gate blocks n-dopants
Polysilicon is better than metal for self-aligned gates
because it doesn’t melt during later processing
n+ Diffusion
n well
p substrate
N-diffusion/implantation cont.
n+ n+ n+
n well
p substrate
N-diffusion cont.
Strip off oxide to complete patterning step
n+ n+ n+
n well
p substrate
P-Diffusion/implantation
Similar set of steps form p+ “diffusion”
regions for PMOS source and drain and
substrate contact
p+ Diffusion
p+ n+ n+ p+ p+ n+
n well
p substrate
Contacts
Now we need to wire together the devices
Cover chip with thick field oxide (FO)
Etch oxide where contact cuts are needed
Contact
Metal
Metal
Thick field oxide
p+ n+ n+ p+ p+ n+
n well
p substrate
Physical Layout
Chips are specified with set of masks
Minimum dimensions of masks determine transistor size
(and hence speed, cost, and power)
Feature size f = distance between source and drain
Set by minimum width of polysilicon
Feature size improves 30% every 3 years or so
Normalize for feature size when describing design rules
Express rules in terms of = f/2
E.g. = 0.3 m in 0.6 m process
Simplified Design Rules
Conservative rules to get you started
Inverter Layout
Transistor dimensions specified as Width / Length
Minimum size is 4-6/ 2sometimes called 1 unit
In f = 0.25 m process, this is 0.5-0.75 m wide (W), 0.25 m
long (L)
Since fm.
Summary
MOS Transistors are stack of gate, oxide,
silicon and p-n junctions
Can be viewed as electrically controlled
switches
Build logic gates out of switches
Draw masks to specify layout of transistors
Now you know everything necessary to
start designing schematics and layout for a
simple chip!
Tasks
Install OpenLane and OpenRoad
Select a opensource digital system core
– Processor
– Convolution Filter
– Computer Vision Based System on Chip
Find out VLSI CAD tools for Graphene
transistors
– Understand Graphene based transistors
– Develop a Graphene transistors Layout in CAD
A flash memory cell (single bit) resembles a
standard MOSFET, except the transistor
has two gates instead of one.