Proc. 35th Ann. Freq. Control Symposium, USAERADCOM, F t .

Monmuth, NJ 07703, May 1951

COMPARISON OF HETHODS FOR MEASUREMENT

OF QUARTZ CRYSTAL RESONATORS WITH LOAD CAPACITANCE

W.H. Horton, T.S. Payne, R.C. Smythe h D.A. Symonds

PIEZO TECHNOLOGY INC.

ORLANDO, FLORIDA 32804
Summary motional
inductance and c a p a c i t a n corere l a t e d
propertiessuch as p u l l a b i l i t y .
Measurements on c r y s traels o n a t oarrse
usuallyperformedwith the c r y s t a l u n i t c o n n e c t e d 1.2 To d e t e r m i n ee f f e c t i v e. f r e q u e n c y( f L )a n d
i ns e r i e sw i t h a s p e c i f i e dl o a dc a p a c i t o rf o r
r e a s o n s :f i r s t t, os i m u l a t e the conditionsunder
two resistance
i n t e n d est o
(x ) underloadconditions
di m u l at he o seex i s t i n g
which a r e
when t h e
whichthecrystal w i l l be o p e r a t i n g when used i n crystau l nit is i n c o r p o r a t e di n t oa no s c i l l a t o r
an o s c i l l a t o rs;e c o n d , as one method of d e t e r - circuit. It i s t h i s measurement which is t h e
mining crystal motional parameters. This paper main concern of t h i sp a p e r .
concern i tss epl rf i m a r iw l yitthfhier s t of
these. It is p o s s icbtaol lec u l a t e fL 6 RL
u s i tnchgrey s teaqlu i v a l ecni tr c uviatl u e s
Accurate measurement of theloadresonance measured by o t h e r means1. However s i g n i f i c a n t
f r e q u e n caynrde s i s t a n c e is c o n s i d e r a b l y more e r r o r s may arise due to
nonlinearity,
coupled
d i f f i c u ltth a n measurement of series resonance modes o re r r o r si nt h ec r y s t a le q u i v a l e n tc i r c u i t
frequency and
resistance. load
In
capacitor model. Hence i t i s good p r a c t i ctdeoe t e r m i n e
measurement systems e r r o r s due t ot h ee f f e c t of loadfrequency and r e s i s t a n c e by d i r e c t measure-
known s tcr a p yacitances on f r e q u e anrcey ment.
s t r a i g h t f o r w a rt d
o accommodate. The e f f e c t of
s t r a cya p a c i t a n c e on r e s i s t a n c e measurement is This paper reviews methods for the d i r e c t
more s u b t l eIc.nu r r e n t l y u s e d C 1 m e t e rtsh i s measurement of fL and RL. S e c t i o n 2 reviews some
type of r e s i s t a n c e e r r o r can be s i g n i f i c a n t . e q u i v a l e nct i r c u iftu n d a m e n t a l sS. e c t i o n s 3 and
4 o u t l i n e the advantages and l i m i t a t i o n s of the
In a p a s s i v e measurement system the
tech- l o a dc a p a c i t o r method and the r e a c t a n c eo f f set
nique of phase or r e a c t a n c eo f f s e tc a n be usedto method. S e c t i o n 5 a n a l y s etsh e f f e c t of para-
overcome t h e sdei f f i c u l t i e s . However, t h iisn - s i t i c elements on measurements with a load
d i r e c t method i s n aopt p l i c a btloe C 1 meter c a p a c i t o r and d e s c r i b e s a l o a dc a p a c i t o rf i x t u r e
measurements. having low p a r a s i t i cc a p a c i t a n c e .

This paperreviews and comparesmeasurement F i n a l lSye, c t i o n 6 d i s c u s st eysp e s of

problems
and
techniques
associated
with
the measurementsystems i n c u r r e n t u s e , w h i l e S e c t i o n
followingmethods: 7 g i v e s a comparison of measurements of fLand RL
by the two methods using
several
meaeurement
1. C 1 meter. systems.
2. Pi-networktransmission method.
3. T-network 6 inverted-L network 2.0 Impedance a t Load ResonanceFrequency (f,.)
transmission methods.
4. V - I Method. Consider the s i m p l i f i e de q u i v a l e n ct i r c u i t
5. R e f l e c t i o nc o e f f i c i e n tb r i g e . of a c r y s t a lr e s o n a t o r ,f i g u r el a . Under c e r t a i n
u s u a l l yv a l i da s s u m p t i o n s , the impedance of t h e
Design and c o n s t r u c t i o n of a s p e c i a ll o a d - resonatorcan be represented by a circle i n the
c a p a c i t a n c ef i x t u r e i s d i s c u s s e d . Such a f i x t u r e R-X p l a n ef, i g u r el b . A d e f i n i t i v et r e a t m e n t of
may be usedforboth C1 meter and t r a n s m i s s i o n t h er e s o n a t o r circle diagrams has beengiven by
measurements and f a c i l i t a t e s c o r r e l a t i o n between Hafnerl.
figure
In 11, f r is the s e r i e s
methods. It i s e s p e c i a l l yv a l u a b l ei no b t a i n i n g resonancefrequency, a t which, by d e f i n i t i o n ,t h e
c o r r e l a t i o n between manufacturer and
customer r e s o n a t o r impedance is r e s i s t i v e , of v a l u e %.
when they use d i f f e r e n t measurementsystems. If a l o a d capacitor, CL , is now connected in
series wtrihet hes o n a tfoirg, u2t hrae,
1.O Introduction impedance of the series combination is r e p r e s e n t -
ed by a new c i r c l e whose c e n t e r is s h i f t e d by an
C r y s t aul n i t s are measured w i t h a series amount equalto the reactance of C L , f i g u r e 2b.
l o a dc a p a c i t o rf o r two reasons: The series resonance frequency of the c r y s t a l
unit - loadcapacitorcombination becomes t ,the
1.1 To determine the c r y s t a l e q u i v a l e n t c i r c u i t load resonancefrequency, the frequency a t which

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t h et o t a l impedance is r e s i s t i v e of value RL It . 4.2 Any number of a r b i t r a rvya l u e s of load
is important to
note
that
the
if same c r y s t a l reactancecan be used.
without a l o a dc a p a c i t o r was measured a t the same
frequency fL i t s impedance would be i n series 4.3 Fixtudr ee s i g n is r e l a t i v e lsyi m p l e as
with -CL a s is shown in Fig. 3 . Such a measure- only
the
basic
measurement network is used;
ment w i l l be r e f e r r e dt o as a r e a c t a n c eo f f s e t consequently, there are no strays which cannot
measurement. The advantages and disadvantages of e a s i l y be measured and cancelled.
the
load
capacitor and t rheea c t a n oc fef s e t
methods of measurement arediscussed in thenext 4.4 In m t i o n a l measurements c r y s t a l CO does
two s e c t i o n s . nothaveto be determinedwithgreataccuracyas
e r r o r s in i t s measurement tend t o be s e l f -
3.0 Load Capacitor
Measurements: cancelling. Normally CO i s determined by measur-
ingtheimpedance a tf r e q u e n c i e s above and below
Load capacitor measurements areperformed f r . In subsequent measurements, thesusceptance
with a p h y s i claolca ad p a c i tcoor n n e c t iend of CO i s s u b t r a c t e d from the t o t ar el s o n a t o r
s e r i e sw i t ht h ec r y s t a lu n i t .T h i st e c h n i q u eh a s admittance, giving themotional arm admittance.
the following features : An i t e r a t i v ef r e q u e n c ys e a r c h is performed u n t i l
the motional arm is p u r e l yr e s i s t i v eg, i v i n g f,
3.1 It is o n l yf e a s i b l ef o rn e g a t i v er e a c t a n c e
loads
because of the unavoidable and e x c e s s i v e
and R1 .
Then motionalreactancevalues
a r e measured a tf r e q u e n c i e sf u = fs + A f
X, and
and f
loss e f f e c t sa s s o c i a t e dw i t h
a p o s i t i v er e a c t a n c el o a d .
aninductorused as = fs -
Af .
The motionalinductance is determinedas:

3.2 F i x t u r e s most conveniently

have
only one L =- 1 -
xu-x
v a l u e of loadcapacitance. 4n FU -F
3.3
Careful design i s needed
obtain
to a Note t h af tor re s o n a t o rhsa v i nagd e q u a t e
f i x t u r et h a t is f r e e of s t r a y impedances. f i g u r e s of m e r i t i t is possible measure
to
motionalparameterswithoutmeasuring C O , butthe
3.4 When loadcapacitormeasurementsareused aboveprocedure i s p r e f e r r e d , and thevalue of CO
todeterminemotionalparametersthecrystal CO i s g e n e r a l l yr e q u i r e df o ro t h e rp u r p o s e s .
must be measured, or
elsemeasurements must be
made with more than one loadcapacitorvalue so 4.5 The technique cannot
readily be adapted
t h at h
teef f e c t of CO may be c a n c e l l e d . The f ourswe i tohs c i l l a t o r s because
measurements
normal procedure i s to
measure
fr, CO, fL ( f o r must be made withnon-zerophase s h i f ta c r o s st h e
known CL)and c a l c u l a t e crystal.
L1’ - 1
8 ‘fr(f -
f r > ( C o + CL) 4.6 The measurementtechnique
requires
high
r e s o l u t i o n and accuracy of phase, and t o a l e s s e r
3.5 The measurement can be made i n an o s c i l - extent, amplitude. Consequently
the
measurement
l a t o r , as f L is a frequency where there €S both system i s expensive.
zep r oh a s h
e iafct r o tshcs er y s t a l load -
capacitor combination and a high
phase
slope 4.7 High s i g n a ls o u r c ea m p l i t u d e sa r er e q u i r e d
exists. otbot at yi np i c asl lpye c i f iderdil ve ev e l s
because of th ieegqhu i v a l erneta c t a nicne
3.6 Because of thehighphase slope only small s e r i e s w i t h 5..
e r r o risrne s i s t a n c e and frequency result from
quite
large
phase
changes. Hence, p a s s i v e 5.0 Load Capacitor
Fixture
Design
measurement systems do notrequirehighresolu-
t i o n of phase. 5.1
Stray
Analysis

3.7 High d r i v el e v e l s can be o b t a i n e de a s i l y Numerical a n a l y s i s of thegeneralizedload

because the
impedance af tL is RL
r e a c t a n c eo f f s e t method theimpedance a t f L i s RL
.
In t h e c a p a c i tnoer t w o(rfki4g).
d e t e r m i n teh e f f e c t s
was performed
of s t r a yc a p a c i t a n c e ,
to
and
in series with - XL. Usually, i s much l a r g e r certainnon-ideal,components. A source and load
than R L and limits the maximum d r i v el e v e lt h a t r e s i s t a n c e of 20 ohms was assumed, btuhte
can be obtainedintheLatter method. measurement e r r o r s depend only weakly on t h i s
value. In f i g-u r 4 e,
4.0 Reactance
Offset
Measurements r e p r e s e n t st h el o a dc a p a c i t o r .
and C2,4 representinput and o u t p u t
Reactance offset
measurements2 are made s t r a y st o ground.
p o s s i b l e by t h ea v a i l a b i l i t y of i n s t r u m e n t a t i o n is a b r i d g i n gc a p a c i t o r
which can determine the real and imaginary com- i s s t r a y C from t h el o a d - c r y s t a l
ponents of impedance. The method hasthefollow- junctiontoground.
i n gf e a t u r e s : r e p r e s e n t ss t r a yc a p a c i t a n c ei n
p a r a l l e l w i t h the c r y s t a l Co.
4.1 It can be used f opr o s i t i voenr e g a t i v e i s t h el o s s of a s w i t c ht y p i c a l l y
r e a c t a n c el o a d s . i n c l u d e dt os h o r t - c i r c u i tt h el o a d
capacitor.

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 The r e s u l t s ,t a b l e s 1 and 2, show t h a t the u n i t yl o o pg a i n .
o n l ys t r a y sw h i c hc a u s es i g n i f i c a n te r r o r s are as
follows: 6.1.2Accurate measurement of f r e q u e n c y and
r e s i s t a n c er e q u i r e st h eu s e of c a l i b r a t e ds u b s t i -
5.1.1 C34 ( R e s i s t a n c e r r o r ) . It i s assumed t u t i o rne s i s t o r sS. i n c teh pe h a s seh i f t of the
t h at htl eo acda p a c i t o r C l , 3 w a s a d j u s t e d so a c t i vcei r c u i t r y may be l e v e l - d e p e n d e nt th, i s
t h a tt h ec a p a c i t i v el o a d is c o r r e c t , andhence no s u b s t i t u t i o n must be performed a t t hdee s i r e d
4. e r r o r i s i n t r o d u c e d . d r i v el e v e l .

5.1.2 R13 ( R e s i s t a n c e r r o r )N. o t teh atth e 6.1.3For

fL
and R L measurements a l o a d
e r r o r in ohms i s i n d e p e n d etoch nfret y s t a l c a p a c i t o r i s u s e d ;h e n c et h e r e w i l l be errors due
resistance. t o C, and o t h e sr t r a yc a p a c i t a n c e s as d i s c u s s e d
previously.
5.1.3 C23 ( F r er eqsuainesndt acnyc e
errors). The more s i g n i f i c a nf rt e q u e n ceyr r o r 6.1.4 A t f L t h e impedance between nodes 1
may be c o r r e c t e bd u t a small r e s i s t a n c e r r o r and 2 is R L ( n e g l e c t i n gC S )w , h i c hf a c i l i t a t e s
w i l l remain. t h eu s e of h i g h e rd r i v el e v e l st h e n are a v a i l a b l e
i n t h er e a c t a n c eo f f s e t method (see 3 . 7 . ) .
5.2 Physical
Arrangement
6.2 P a s s i vSe y s t e m s
The f i x t u r e shown in F i g . 5 was d e s i g n e d
t a k i n gi n t oa c c o u n tt h ea b o v ea n a l y s i s . The e s s e n t i a lf e a t u r e s of p a s s i v es y s t e m s
I m p o r t a n tf e a t u r e so ft h ef i x t u r e are: f orre s o n a t omr e a s u r e m e natrdee s c r i b e d by the
block diagram of F i g . 7 . A t u n a b l seo u r c pe r o -
5.2.1 It c a n be u s e di nb o t ho s c i l l a t o r and duces two p h a s ea n da m p l i t u d er e l a t e ds i g n a l s , o n e
P i - networktypemeasurementsystems. which
of is a p p l i etdo the c r y s t at h l rough a
f i x t u r eo r test network. Thisnetwork may be a s
5.2.2 C a l i b r a t i ocna n be performed
using a s i m p l e as a p i - n e t w o r ok r, as complex as a n
3 - t e r m i n a lc a p a c i t a n c eb r i d g e . i m p e d a n coeard m i t t a n cbe r i d g e . The s i g n aol u t -
p u ft r o mt h ef i x t u r e is comparedwith the o t h e r ,
5.2.3 The c a p a c i t a n c tego r o u n d a t t h leo a d r e f e r e n c es ,i g n a l in a v e c t or ra t idoe t e c t o r .
zapacitor - c r y s t a lj u n c t i o n is v e r y small. The impedancecan be d e t e r m i n e df r o mt h er e a d i n g
otfhrea t idoe t e c t o r . A wide v a r i e t y of t e s t
5.2.4 The l o a dc a p a c i t o rs h o r t i n gs w i t c hh a s networkscan be used,eachhaving i t s own advan-
low loss. t a g e s and d i s a d v a n t a g W e sti.ht yhi sp e of
system i t i s p o s s i b l ee i t h etrion s e r t a load
5.2.5
There i s a d e f i n er edf e r e n cp el a n e c a p a c i t o r and s e a r c hf o p r oints of p u r e resist-
c o n n e c t e dt ot e r m i n a l 2. a n coetrsoe a r cfhorre a c t a n c e of a s p e c i f i c
value. As the measurement frequency i s not
5.2.C
6 r y s t aul n i tw
s ith wire o pr i nl e a d s d e t e r m i n e d by t h device being t e s t e d it is
c a n be accommodated. p o s s i b ltm
eo e a s u r e the parameters of unwanted
modes.
5.2.7 I t s r e p r o d u c i b i l i t y makes it useful Commonly usednetworks are:
f o r m e a s u r e m ecnot r r e l a t i ob ne t w e ed ni f f e r e n t
organizations. 6.2.1 Pi Network(Fig. 8)

5.2.8 The maximum u s e a fbrleeq u e n c y is The most common form of thepi-network

l i m i t e d d, e p e n d i n g on d i m e n s i o n s(. T a b l e3 ) . conforms t o IEC S t a n d a r d4 4 4 , 4w i t h R 1 = 15.9 ohm
R2 = 14.2 ohm R3 = 66.2 ohm. When used in a 50
5.2.9Sockets are s u s c e p t i b l et ow e a r so the ohm s y s t e m 1zn i s 12.5 ohm. Some p r o p e r t i e s of
f i x t u r e may n o t be s u i t a b l ef o rh i g h - v o l u m ep r o - t h e P i are:
d u c t i o nu s e .
Its maximum u s ef fr ue ql uency is
6.0
Measurement
Systems limited. IEC S t a n d a r d 444 c o v e rosn ltyhfer e -
quency
range
from 1 MHz t o 125 MHz, a l t h o u g h a
S y s t e mf sor re s o n a t omr e a s u r e m e n t may be method for e x t e n d i n tgh i s t o 250 MHz has been
c l a s s i f i e di n t o two c a t e g o r i e s - o s c i l l a t o r s or proposed5.
C 1 meters, and p a s s i v eo rt r a n s m i s s i o ns y s t e m s .
The d e t e cst iegdanm
a lp l i t u d e is
6.1 C.I. Meter n e a r l y maximum a t zerophase.

O s c i l l a t o r s u i t a b l ef o rc r y s t a m
l easure- The measurement r e l i e s on t haec c u r a c oy f
ment are commonly r e f e r tr oe d as c r y s t a l thPe i - n e t w o r ki m p e d a n c ea, l t h o u g h by measuring
impedance meters ( C . I . meter^)^. A greatly standard im s p e d a n c ce os r r e c t i o n
c as n be made.
simplified C.I. meter i s shown in f i g u 6r e. S u i t a b l es t a n d a r d s are n o te a s i l yo b t a i n a b l e how-
I m p o r t a n tc h a r a c t e r i s t i c s are: e v e r ,e s p e c i a l l yf o rh i g h - f r e q u e n c yu s e .

6.1.1 The maximum v a l u e of RL whichcanbe The c r y s tuanhlniatesi t hpeirn

measured is d e t e r m i n e d by t rheeq u i r e m e n t of grounded.

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 The I E C pi-network
requires 50 ohm which a l s o shows theexternalfrequencysynthe-
source and loadimpedances. s i z er er q u i r etodob t a ifnr e q u e n crye s o l u t i o n
adequateforresonatormeasurements.
6.2.2 Inverted L - Network (Fig. 9) Some p r o p e r t i e s of t h e 4191A a r e :

Properties of t h e L-network are: It is u s e f u lt o 1000 MHz.

I t s maximum usefulfrequency is some-
what greaterthanforthepi-network. By adding The d e t e c t e ds i g n a l is p r o p o r t i o n a lt o
a na d j u s t a b l et a n kc i r c u iot sr t u bl i n ea c r o s s t h er e f l e c t i o nc o e f f i c i e n t of theimpedanceunder
t h e measurement port,thefrequencyrange may be t e s t and is t h e r e f o r e a minimum a t 50 ohms
extended s t i l l f u r t h e r . resistive.

The d e t e cst iegdanm

a lp l i t u d e is It is a coaxial
instrument.
Hence,
n e a r l y minimum atzerophase. thedevicehas one pingrounded.

The measurement r e l i e s on theaccuracy It r e l i e s on the accuracy of c o a x i a l

of Rf, although by measuring standards impedance s t a n d a r d s s, h o r ct i r c u i t , open c i r c u i t
correctionscan be made. and 50 ohms.

The c r y s t a l u n i t has one pingrounded. 6.2.6 ImpedanceandAdmittanceBridges

The network
requires a low impedance R.F. impedance and admittance bridges
(50 ohm) source and a highimpedancedetectorto have been used f o r many yearsforthedetermina-
measure V2. t i o n of c r y s traels o n a t eoqr u i v a l ecnitr c u i t
parameters. Because of t h e ilri m i t e adv a i l a b i l -
6.2.3 T - Network (Fig. 10) i t y ,t h e use of thesebridges w i l l not be consid-
ered here. Moreover, thosecommercially avail-
The p r o p e r t i e s of t h e T-network a r e ablebridges of which the
authorsare
aware,
s i m i l atrtoh o s e of the L-network,except
that besides beingtedious
use,
to
possess range
t h e T permitstheuse of a low impedancedetec- l i m i t a t i o n s which limit t h e i r use f orre a c t a n c e
tor. offsetmeasurements. Also beyond the limited
scope of t h i sp a p e r is theautomatedmicrocircuit
6.2.4 V-I Method ( F i g . 11). bridge system beingdeveloped for
precision
resonator measurements6. This
system uses a
I nt h i st e c h n i q u e a c u r r e n t is passed Schering bridge, and incorporates standard load
through both thedevice
r e f e r e nr ce es i s t o r
to
and
be measured and
from v e c vt oorl t a g e
a c a p a c i t o r sf o rt h e measurement of fLand R, .
measurements of V1 and V2 the impedance of the 6.2.7 Resolution
device is c a l c u l a t e d .
To d e t e r m i n et h er e s o l u t i o no b t a i n a b l e
The t e c h n i q uree l i e s on the
accuracy i n measurements of f L & RL f o r t h e d i f f e r e n t n e t -
ofRref. works by t h er e a c t a n c eo f f s e t method a s i m u l a t i o n
was c a r r i e do u tf o r a t y p i c a l 4 MHz crystal f o r a
The devicebeingmeasured is f l o a t i n g , u n ei tr r oitn
rhl e a s ti g n i f i c a ndti g i t of
a l t h o u g h by suitablearrangement one t e r m i n a l may d i s p l arye s o l u t i o n of s u i t a b lien s t r u m e n t s . No
be grounded . allowances were made f o rf i x t u r ee r r o r s ,a c c u r a c y
e r r o r s ,o rn o i s e .
It is not a 50 ohm system.
The r e s u l t s( T a b l e IV) show t h a t all
The Hewlett Packard 4192A Impedance i n s t r u m e n t sh a v es u f f i c i e n td i s p l a yr e s o l u t i o nt o
analyzer implementsthis
approach and includes o b t a i n the l o a df r e q u e n c yf o rt h i su n i tt ob e t t e r
Kelvinconnections t o the unknown impedance. The than 1 Hz. The measurement of RL is more s e n s i -
blockdiagram of t h i n
s strument is shown i n t i v e . For the example g i v e n ,t h eb e s tr e s o l u t i o n
Fig. 12. By means of i n t e r n aplr o c e s s i ntgh e is obtained on t h e HP 4192 A system.
instrumentcandisplaytheimpedancein series o r
p a r a l l e l form. The upperfrequency l i m i t of t h e 6.2.8 Instrument
Accuracy
instrument i s 13 MHz.
Reliable information on the accuracy
6.2.5ReflectionCoefficientBridge of measured parameters is d i f f i c u lttoe s t i m a t e
from
manufacturers' data. In a l l i n s t r u m e n t s
A system incorporating a reflection usableaccuracytendsto be b e t t e rt h a ns p e c i f i e d
c o e f f i c i e nbt r i d g e is a v a i l a b l e as the Hewlett accuracy,partlybecauseworstcase is used f o r
Packard 4191A Impedance Analyzer. I tosv e r a l l o b t a i n i n gs p e c i f i c a t i o n s and alsobecauseinthe
blockdiagram is a l s or e p r e s e n t e d by Fig. 12. measurement o f f s e t s are made so t h arte l a t i v e
The use of t h i si n s t r u m e n tf o rr e s o n a t o r measure- accuracy is more important than
absolute accu-
ment is t r e a t e di n a companion paper.' racy.

A simplifiedschematic of t h beridge For t h i s measurement t h e Kp 3042

a n ads s o c i a t e cdi r c u i t r y i s g i v einFn i g . 13, system has an
amplitudeaccuracy of about 0.02

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dB/10 dB i fc a l i b r a t e d by t h es y n t h e s i z e r , and a o f f s e t s .C o n n e c t i o nt ot h e can should be made in
phase accuracy of about
0.30". This g i v e sf,o r a s p e c i f i e d manner. To f a c i l i t a t et h i s a third
thepi-network,loadfrequencytowithin0.4 Hz pin
connected to
the can m y be added to
the
anl odraeds i s t a nw
tcoiet h i n 7 ohms. (All c r y s tua nl iAt .l t e r n a t i v e l y , one
pin may be
f i g u r e s in t h i ss e c t i o nr e f e rt or e a c t a n c eo f f s e t connectedtothecan.
measurements of t h e 4 MHz c r y s t adl e s c r i b e d in
Table I V ) . 9.0 Conclusion

The HP 4192A has a C accuracy of about We have described various

methods of
0.22 pf and a G accuracy of about0.4 mS g i v i n g obtaining load resonance frequency & resistance
loadfrequencytowithin0.4 Hz and r e s i s t a n c e t o measurements of c r y s t a lr e s o n a t o r s and introduced
w i t h i n 0.9 ohms f o r t h i s measurementaccordingto a f i x t u rdee s i gtno make p o s s i b lceo r r e l a t i o n
its specification. measurements between o s c i l l a t o r and t r a n s m i s s i o n
measurements. W e have shown t htaihntet r o -
A t low f r e q u e n c i e st h e HP 4191A has a duct i o n of two new R.F. Impedance Analyzers makes
guaranteedaccuracy of l'x & r y of about 0.007and themeasurement by t h er e a c t a n c eo f f s e t method a
t y p i c a l l y 0.0018. This gives load frequency to v i a b l ea l t e r n a t i v et ot h el o a dc a p a c i t o r method.
w i t h i n 56 Hz and r e s i s t a n c et ow i t h i n 119.7 ohms
forguaranteedvaluesorfrequencywithin 9.6 Hz
and r e s i s t a nwc iet h i n ohms
20 ftoyrp i c a l REFERENCES
values. Our r e s u l t s 2s u g g e s t h a t h ef L and RL
e r r o r sa r e no more thanone-tenth of t h el a t t e r 1. Hafner, E . , "The P i e z o l e c t r i cC r y s t a lU n i t -
figures . D e f i n i t i o n s and Methods of Measurements",
Proc. I E E E , v. 57 No. 2, pp. 179-201; Feb.
I t shouldagain be emphasizedthatthe 1969.
e r r o r s in measuring f L and RL a r e in g e n e r a l much
g r e a t e r t h a n in measuringfrand R, o rt h ee q u i v - 2. Smythe, R. C., "An Automated Resonator
a l e n tc i r c u i tp a r a m e t e r s . Measurement
System
using a Reflection
CoefficientBridge",theseProceedings.
7.0 Measurement Results
(Table V)
3. Gerber, E. A., "A Review of Methods for
A c r y s t auln i t was measured in s e v e r a l Measuring The C o n s t a nP ot ifse z o e l e c t r i c
different measuring systems. All measurements Vibrations".
Proc. I.R.E., V. 41, No. 9,
with a physicalloadcapacitorwere made using pp. 1103-1112; S e p t . , 1953.
t h el o a dc a p a c i t a n c ef i x t u r ed e s c r i b e d earlier in
this
paper. Since the measurement temperature 4. I n t e r n a t i o nE
al ectrotechnical Commission,
was not h e l d c o n s t a n t fromsystemtosystem,the "Basic method tfhoer measurement of
frequencydifference A f = ( f L - f r )r a t h e rt h a n resonance frequency and e q u i v a l e ns te r i e s
f L , must be examined. The f i r s tr e a d i n g of Table r e s i s t a n c e of q u a r t zc r y s t a ul n i t s by z e r o
V was a r b i t r a r i lcyh o s e n as t hree f e r e n cteo technique
phase in a - network".
o b t a itnhvea r i a t i o n in Af in ppm. Excluding P u b l i c a t i o n 444 1st Ed.; 1973.
t h er e a c t a n c eo f f s e t measurement in t h e HP 3042
system,the A f v a r i a t i o n was l e s s t h a n one ppm. 5. F i s c h e r , R., & L . Schulzke,"Extending
the
Frequency Range of the TransmissionLine
The value of RL usingthe P T 1 load Method t fhoer Measurement of Quartz
c a p a c i t a n c ef i x t u r e in theSaunders llOHF and t h e C r y s t a l s up t o 250 MHz". Proc.
31st.
RFL 459A C 1 metercould be determinedonlytothe A.F.C.S., pp. 96-101; 1977.
n e a r e s t 5 ohms. The r e a d ifnogr HP 3042
r e a c t a n coef f s e t measurement v a r i e d between 19 6. Malinowski, G . , & E. Hafner,
"Automatic
and 24 ohms. The readingsobtained in t h e M i c r o c i r cB
u irti dfgoer Measurements on
HP4191A, and HP4192A byreactanceoffset and in QuartzCrystalUnits".Proc. 32nd A.F.C.S.,
thepi-network with P T 1 l o a dc a p a c i t o fr i x t u r e pp.
354-364; 1978.
were w i t h i n one ohm of eachother and r e p e a t a b l e .

8.0 E r r o r sd u et ot h e 3 t e r m i n an
l ature of t h e
c r y s t a(lF. i g1 .4 ) .

The value of fL and RL are a f f e c t e d by t h e

e f f e c t i v ev a l u e of C0 of t h ec r y s t a l . The value
of C0 in t h ec i r c u i t is dependent on the type of
connectiontothe can (Fig. 15). Thisconnection
must be s p e c i f i e db e f o r e the load valuescanbe
c o r r e c t l y measured. the
If
connection is not
s p e c i f i e d , c o r r e l a t i o n problemscan e x i s t between
measurementprocedureswhichareotherwiseiden-
tical.

To s o l v e t h i s problem a standardmeasure-
ment procedure i s r e q u i r e w
d i t ahl l o w a n c efso r

275

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 FIGURE I FIGURE 2
CRYSTALWITHOUTLOADCAPACITOR CRYSTALWITHLOADCAPACITOR
Q
'P

CA P

A
FIG. la FIG. Ib
FIG. 2a FIG. 2b

FIGURE 3
EQUIVALENCE AT f L

t
fL
I)

fs = 6397930. HZ
L1 = 26.1 MH
2 c = 6.2 PF
CRYSTALWITHLOAD EQUIVALENT CIRCUIT RI = IO n
AT f L

FIGURE 5
LOADCAPACITANCE FIXTURE

LOAD CAPACIT

TERMINAL 4

TUBULAR CONWCTORS
TERMINAL 2

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 FIGURE 6 FIGURE 7
SIMPLIFIED C.I.METER PASSIVE MEASUREMENTS

'
ATTEN.
3 A

POWER lvAl
SPLITTER lvBl
FIXTURE --b e
VECTOR
ATTEN. RATIO
DETECTOR

FIGURE 8 FIGURE 9
77 NETWORK L NETWORK
R3
I

FIGURE IO FIGURE II
T NETWORK V- I MEASUREMENTMETHOD

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 FIGURE 13
FIGURE 12
TEST PORT
TEST PORT

A 488 BUS
EXTERNAL
SYNTHESIZER
r-------------l

TEST
CHANNEL
OUT
VECTOR MICRO-
FREWENCY RATIO
SYNTH. DETECTOR

DIRECTIONAL
L - - - - - - - - - - -BRIDGE
- - J '
l

REF.
OCHANNEL
OUT
2COAX
DB LINK 2 DB
INTERNAL
SYNTHESIZER

FIGURE 14 FIGURE 15

ERRORS
DUE
TO 3 TERMINAL
NATUREOFCRYSTAL CAN FLOATING 5-W
Q
1

CANCONNECTED
TO PIN 2
C; = C I ~ C13
+
'I-' VARIES
DEPENDING ON
0-
1 Q

T
Apq
CONNECTION TO CAN.

CAN GROUNDED

c; = c12 '13 1 c 23

TABLE I
EFFECT OF STRAY
CAPACITANCE
(RESULTS
FROM COMPUTER ANALYSIS)

STRAY
CAPACITANCE

0 I IO 16399890(14.6

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 TABLE It
EFFECT OF LOSSIN
SERIESCAPACITOR
(RESULTS
FROM
COMPUTER
ANALYSIS)

(PFI (PF)
(PFI

IO 6399915 2 0 3
REFERENCE 10'2 80 6399921 114.0
1 WITH LOSS I 0 I 0 I 32 I IO' 10 I 0 I I
8 0 16399921 120.2 1

TABLE Ip
TABLE III REACTANCEOFFSET
LOAD
CAPACITANCE FIXTURE RESOLUTION LIMITS FOR fL 8 RL
c ~ = 3 2 P F C14=13.57PF C 2 4 = 6 . l 8 P F INSTRUMENT AfL ARL
RESOLUTION
LOAD
CAPACITANCE VS. FREQUENCY (Hz) (a)
12.5O 7r NETWORK .01O - .01 - .22
(HP 3042 SYSTEM) .Olos - 71 .05
32.00 5000O L- NETWORK .01O - .05 .22
O R I O O O O T-NETWORK
~
. (HP3042 SYSTEM) .01OB .71 5.6
CNG .I vs 0 .l5
(HP 4192A 1 .01 PF - 018 -014

REFLECTIONCOEFFICIENT x +.Oool )I - 1.54

BRIDGE 50n(HP4191A 1 r y +,0001 .7 - .l7
FOR A UNIT WITH f S = 4.000 MHZ AT cL=32PF ( x =4 12430)
RS= ZOO RL=23.930
L = 140wH Af * 6 4 6 HZ

TABLE P
MEASUREMENT
RESULTS

I TYPE OF
MEASUREMENT 1 INSTRUMENT
SYSTEM I 2
1 1- 4000029 25 638

REACTANCE

* USING LOA0 CAPACITANCE FIXTURE

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