Lecture 14 Low Noise Amplifier Design
Lecture 14 Low Noise Amplifier Design
I Knowledge
I Understand the most important sources of electrical noise, such as thermal noise, shot
noise and flicker noise, and their characteristics.
I Know the definition of noise factor and noise figure for a two-port network.
I Understand the relationship between noise factor and effective noise temperature.
I Understand the relationship between noise figure and source termination for a single
stage and multi-stage amplifiers.
I Understand the basic principles of noise figure measurement and transistor noise
characterisation.
I Skills
I Be able to design a single stage microwave transistor amplifier having the minimum
possible noise figure.
I Be able to design a single stage microwave transistor amplifier having a specified noise
figure and gain.
I Be able to calculate the overall noise figure of a receiver chain.
I Be able to design a single stage microwave transistor amplifier having the minimum
noise measure, and thereby design a multi-stage amplifier having the minimum possible
noise figure.
I Be able to design a single stage microwave transistor amplifier with a specified noise
measure and gain, and thereby design a multi-stage amplifier having a specified noise
figure.
I The most common form of intrinsic electrical noise in circuits is thermal noise,
which is generated by the random thermal motion of electrons within any
conducting or semi-conducting material.
I This thermal motion would cease to exist if the material is ’properly frozen’, i.e.
taken down to absolute zero (0 kelvin). Thermal noise is also known as Johnson
noise after J.B. Johnson who first observed the phenomenon in 1927 [9].
The mean square value of thermal noise voltage and current in a resistor, R (in Ω), in a
bandwidth ∆f (in Hz) and at an absolute operating temperature To (in kelvin) are given,
respectively, by the two equations below :
4kB To ∆f
|int |2 = (in units of A2 ) (2)
R
where kB is Boltzmann’s constant (= 1.3806488 × 10−23 joules per kelvin).
4kB To ∆f
r
int = (4)
R
To find the thermal noise power generated by an arbitrary resistor R, we can apply one
or both of (3) and (4). We then have the noise power, Pnt , generated by the resistor R
as :
The noise voltage across the external load Figure 1 : Maximum noise power extraction from
resistor in figure 1, is vn /2, where vn is defined by a resistor R.
(3). The maximum available noise power from R
is therefore given by:
Pnt (max) = kB To ∆f (8)
I The load resistor in figure 1 is also a source of thermal noise, and that each one of
the two participating resistors generates and dissipates noise in both itself and in
the other resistor.
I This does not alter the validity of (8), since, as the two resistors are physically
separate entities, their noise voltages are not correlated and so do not add
constructively.
We can express the noise power in dBm as follows:
I Shot noise in electronic devices arises from the discrete nature of electric current
and relates to the arrival of charge carriers at a particular place, i.e. when
electrons cross some type of physical ’gap’, such as a pn or Schottky junction.
I Unlike thermal noise, shot noise is characterised by the Poisson distribution[3],
which describes the occurrence of independent and discrete random events.
I When the number of events is sufficiently high, as in the case of the flow of
electrons in a circuit with ’normal’ operating currents, the Poisson distribution
resembles the Gaussian distribution.
I For most practical cases, therefore, we usually assume that the shot noise and
thermal noise have the same distribution.
I This makes our circuit analysis and design more straightforward. In other words,
we simply add the shot noise component to the thermal noise component.
I Shot noise, just like thermal noise, can be characterised as ’white noise’ due to its
flat power spectral density.
As the shot noise has its physical origin in electrons crossing a junction, it is normally
expressed in terms of electron flow, in other words, current. The RMS value of the shot
noise current is given by[5] :
p
ins = 2Iq∆f (12)
where I is the DC current, q is the electron charge, and ∆f is the bandwidth in Hz.
In all active circuits where semiconductor devices are biased, shot noise exists and has
to be accounted for by designers.
We note from (12) that shot noise is not a function of temperature, unlike thermal noise.
We should also note that conductors and resistors do not exhibit shot noise because
there is no ’gap’ as such.
I In addition to thermal noise semiconductor devices also exhibit a particular type of noise
called flicker noise or 1/f noise, after its frequency characteristic which falls off steadily as
frequency increases from zero.
I Because of its spectral characteristics flicker noise is sometimes referred to as ’Pink’ noise (as
opposed to thermal and shot noise which have a ’white’ spectrum).
I Unlike other types of noise, 1/f noise is a non stationary random process[10], in other words
its statistics vary with time.
I The flicker noise corner frequency, fc , defines the boundary between flicker noise dominant
and thermal noise dominant regions in the frequency domain. In fact, 1/f noise has spectral
characteristics that can be described as comprising a number of 1/f α curves with various
cut-off frequencies depending upon the value of the integer α.
I The corner frequencies and the actual spectral density of 1/f noise depend on the type of
material used to construct a semiconductor device, the device geometry and the bias.
I Generally, both the 1/f noise spectral density and the corner frequency increase with bias
current. The corner frequencies range from tens of Hz to tens of kHz[1].
The noise factor of a two-port network is calculated as a simple ratio of input SNR to
output SNR, as follows:
SNRin
F= (13)
SNRout
For any real world device or circuit in which internal noise will be generated as
described in the previous sections, the input SNR will never be less than the output
SNR. The noise factor, F , for such a device can therefore never be less than 1.
The noise factor is most often presented in the form of the Noise Figure, which is
simply the noise factor expressed in dB as follows:
SNRin
FdB = 10 log10 (F ) = 10 log10 (14)
SNRout
I Since any changes in temperature will affect the noise power, the formulae in the
previous slides are valid at a specified operating temperature, To .
I We can therefore define something called the effective noise temperature of any
device or circuit as being the absolute temperature at which a perfect resistor, of
equal resistance to the device or circuit, would generate the same noise power as
that device or circuit at room temperature.
I We can also define the effective input noise temperature of an amplifier or other
two-port network as the source noise temperature that would result in the same
output noise power, when connected to an ideal ’noise-free’ network or amplifier,
as that of the actual network or amplifier connected to a noise-free source.
The relationship between noise factor and noise temperature Te of a device is as
follows:
Te
F =1+ (15)
To
Where To is the actual operating temperature (in kelvin).
A B
v1 in1 v2
Y11 Y12 C D
v1 in1 in2 v2
Y21 Y22
Noise-free 2-port
Noise-free 2-port
The mean square short circuit output current of this network is given by :
Since the components of the right hand side of equation (19) are uncorrelated with
each other, the mean-square value of intot is equal to the sum of the mean-square
values of the components. We can therefore rewrite equation (19) as:
|intot |2
F= (21)
|ins |2
Applying equation (20) this becomes:
|iu |2 |en1 |2
F =1+ + |YS + Ycor |2 (22)
|ins |2 |ins |2
The various voltage and current components of equation (22) may all be defined in
terms of equivalent noise resistances and conductances as follows :
Gu Rn
F =1+ + |YS + Ycor |2 (26)
GS GS
or
Gu Rn
F =1+ + [(GS + Gcor )2 + (BS + Bcor )2 ] (27)
GS GS
Gu Rn
F =1+ + |YS + Ycor |2 (28)
GS GS
or F = f (GS , BS )
Gu R n Fmin
Rn
F = Fmin + [(GS − Gon )2 + (BS − Bon )2 ] (30)
GS
This equation is more often written in its equivalent form:
Rn
F = Fmin + |YS + Yon |2 (31)
GS
1 (1 − ΓS )
YS =
Zo (1 + ΓS )
1 (1 − Γon )
Yon =
Zo (1 + Γon )
(32)
|ΓS − Γon |2
F = Fmin + 4rn (33)
|1 + Γon |2 (1 − |ΓS |2 )
Rn
rn = (34)
Zo
The four scalar parameters, Fmin , |Γon |, ∠Γon and Rn are known as the Noise
Parameters and are often specified in manufacturer’s data sheets for a given
microwave transistor, alongside the S-parameters.
We can build on the two-port noise analysis of the previous slides to set out a design
methodology for low noise microwave transistor amplifiers.
We rely on the noise parameters that are usually provided by the device manufacturer,
but can be measured if necessary.
There are two real and one complex parameter we need for this purpose, being the
parameters used in equation (33), namely :
I The minimum noise figure : Fmin in dB.
I The equivalent noise resistance : Rn in Ω.
I The optimum source termination : Γon (which is dimensionless).
As a reminder, we will use the symbol Rn to represent the ohmic value of equivalent
noise resistance and the symbol rn to represent the normalised value.
|ΓS − Γon |2
F = Fmin + 4rn (33)
|1 + Γon |2 (1 − |ΓS |2 )
Rearranging equation (33) above gives :
Γon
CSn = (40)
1 + Ni
Problem : Draw constant noise figure circles for F = 1.4dB, for F = 2dB and F = 3dB
on the source plane for the Avago ATF-34143 Low Noise HEMT operating at 10GHz,
and hence, or otherwise, determine the lowest possible noise figure commensurate
with the maximum gain available from this device. The S-parameters and noise
parameters of the device with bias conditions VDS = 3V , IDS = 40mA are as follows :
S-parameters :
0.760∠28 0.144∠ − 84
S11 S12
=
S21 S22 1.647∠ − 84 0.410∠23
Noise parameters :
Fmin = 1.22dB
Γon = 0.61∠ − 39o
Rn = 25Ω
Solution : Firstly, we need to investigate the stability of the device, for which we will use
the Edwards Sinsky stability criteria defined by (??) and (??), i.e.:
1 − |S11 |2 0.4224
µ1 = = = 1.1887
∗ | + |S S |
|S22 − ∆S11 12 21 0.3134
1 − |S22 |2 0.8319
µ2 = = = 1.0435
∗ | + |S S |
|S11 − ∆S22 12 21 0.8246
Since both µ1 and µ2 are greater than 1 we conclude that the device is unconditionally
stable, so we are free to choose any terminating impedances lying within the |Γ| = 1
boundary of the source and load plane Smith Charts. Maximum available gain occurs
when the source and load are simultaneously conjugately matched.
=0.8233∠ − 34o
q
B22 − 4|C2 |2
" #
B2 +
p
o 0.3223 + 0.32232 − 4 × 0.11822
Γml =C2∗ = 0.1182∠ − 97
2|C2 |2 2 × 0.11822
=0.4364∠ − 97o
Where :
With the above conjugate terminations the Maximum Available Gain (MAG) of the
device, from (??) is:
|S21 | h p i 1.647 h p i
MAG = K − K2 − 1 = 1.1016 − 1.10162 − 1
|S12 | 0.144
=7.3151 = 8.6dB
In order to draw the constant noise figure circles for F = 1.4dB, F = 2dB and F = 3dB
on the ΓS plane, the first step is to calculate the parameter Ni , as defined by (37) for the
various values of noise figure. For example, for F = 1.4dB we have :
0.0560 × 2.3202
= = 0.0650
2
Similarly, we calculate Ni for F = 2dB and F = 3dB to be 0.3023 and 0.7783
respectively.
Employing (40) and (41) we can now calculate the centres and radii of the three noise
figure circles as follows:
0.61∠ − 39
CSn1.4 = = 0.5730∠ − 39
1 + 0.0650
(0.0042 + 0.0650 × 0.6279)
p
3dB noise figure circle :
γSn1.4 =
1 + 0.0650
0.61∠ − 39
= 0.1993 CSn3.0 = = 0.3430∠ − 39
1 + 0.7783
2dB noise figure circle :
(0.6058 + 0.7783 × 0.6279)
p
0.61∠ − 39 γSn3.0 =
CSn2.0 = = 0.4684∠ − 39 1 + 0.7783
1 + 0.3023
= 0.5883
1
0.9
0.8
0.7
1.5
0.6
5
The noise figure circles are now
0.
I
2
4
plotted on the Smith chart in
0.
.5
the device, when simultaneously
−0
−2
.6
conjugately matched for
−0
.5
−0.7
−1
−0.8
−0.9
maximum gain, will have a noise
−1
figure between 1.4dB and 2dB.
Figure 7 : Constant noise figure circles for Avago
ATF-34143 at 10GHz (VDS = 3V , IDS = 40mA)
We can calculate the exact noise figure of the simultaneously conjugately matched
device by employing equation (33). If the input port is matched with Γms , the noise
figure will be:
|Γms − Γon |2
F =Fmin + 4rn
|1 + Γon |2 (1 − |Γms |2 )
0.0489
=1.3243 + 2.0 ×
2.3202 × 0.3222
Which corresponds with our assessment based on the noise figure circles in figure 7.
Problem : You are required to design an 18GHz low noise amplifier having a gain of at
least 10dB and a noise figure of less than 2dB, using the BFU730F Silicon-Germainum
BJT from NXP. The S-parameters and noise parameters of the device with bias
conditions VC = 2.0V , IC = 10mA are as follows :
S-parameters :
Noise parameters :
Fmin = 1.79dB
Γon = 0.667∠307o
Rn = 28.6Ω
Solution : Firstly, we need to investigate the stability of the device, for which we will use
the Edwards Sinsky stability criteria, i.e.:
1 − |S11 |2 0.4224
µ1 = = = 0.885
∗ | + |S S |
|S22 − ∆S11 12 21 0.3134
1 − |S22 |2 0.8319
µ2 = = = 0.962
∗ | + |S S |
|S11 − ∆S22 12 21 0.8246
Since both µ1 and µ2 are less than 1 we conclude that the device is potentially
unstable. We therefore need to plot stability circles in order to determine the acceptable
range of source terminations.
Since we need to focus on matching the input port to achieve the desired noise
specification, we firstly use equations (??) and (??) to calculate the centre and radius
of the source plane stability circle, as follows:
Once again, we calculate the parameter Ni , as defined by (37), for various values of
noise figure circle (say, F = 2dB, F = 3dB and F = 5dB).
We then calculate the respective noise circle centres and radii using (40) and (41). The
resulting calculations are summarised in the following table :
The above noise figure circles are plotted on the source plane Smith chart, together
with the stability circle as shown in figure 8.
|S21 |2 (1 − |Γon |2 )
GA =
|1 − S11 Γon |2 − |S22 − ∆Γon |2
2.1082 × (1 − 0.6672 )
=
|1 − 0.691∠63o × 0.667∠307o |2 − |0.218∠97o − 0.4778∠120o × 0.667∠307o |2
1.1702
= = 4.24
0.2758
which is equal to around 6.3dB. If we set the source termination to obtain minimum
noise figure, therefore, we will not be able to achieve the required gain specification. In
order to determine a range of source terminations that can achieve the lowest noise
figure consistent with 10 dB of gain we should draw the 10 dB constant available gain
circle on the source plane and see where this circle intersects with the noise figure
circles. The available gain circle are calculated by applying (??) and (??). Firstly, we
need to calculate the normalised gain parameter ga as defined by (??) :
GA 10(10/10)
ga = 2
= = 2.250
|S21 | 2.1082
We now calculate the centres and radii of the 10 dB constant gain circle on the source
reflection coefficient plane, as follows:
q
1 − 2K |S12 S21 |ga + |S12 S21 |2 ga2 0.361
γgS = = = 0.231
1 + ga D1 1.561
Where :
1
0.9
0.8
0.7
1.5
0.6
5
0.
2
4
0.
We therefore choose a −0
.2
−5
source termination of −0
.3
Γon −4
ΓS = 0.74∠ − 62o as 4
⊗
−3
indicated in figure 8, and we −
0.
−2
source termination will result .6
−0
.5
−0.7
−1
−0.8
−0.9
in F < 2dB and GA > 10dB.
−1
Source plane unstable region
GA = 10dB circle
Figure 8 : Constant noise figure circles, Γon and stability and gain
circles on the source plane for the NXP BFU730F at 18GHz
(VC = 2.0V , IC = 10mA)
With the chosen source termination of ΓS = 0.74∠ − 62o , the output reflection
coefficient of the transistor can be calculated using (??), as follows:
S12 S21 ΓS
Γout = S22 +
1 − S11 ΓS
0.2775∠ − 137o
= 0.218∠97o +
0.4892∠ − 1o
= 0.4694∠ − 157.7o
We now need to check whether the required value of load termination, set by ΓL = Γ∗out
is within the load plane stable region. The centre and radius of the load plane stability
circle are calculated using (??) and (??) as follows:
1
0.9
0.8
0.7
1.5
The load plane stability circle is plotted
0.6
I
0.5
2
in figure 9 together with 0.4
ΓL = 0.4694∠157.7o .
0.3 3
0.2 4
20
figure 9.
.5
−0
−2
.6
−0
.5
7
−0.
−1
−0.8
−0.9
Our chosen value of ΓL is therefore
−1
I
By definition, a passive two-port has a gain, G, that is less than unity. Passive circuits
are therefore usually characterised by their attenuation, which is defined by :
1
A= (42)
G
The equivalent noise temperature of a passive two-port having an attenuation, A, and
at operating temperature, To , can be shown to be[2]:
Te = (A − 1)To (43)
Thus, we can write the output noise temperature of such a passive two-port as:
Tin To
Tout = − + To (45)
A A
(A − 1)To
F =1+ = 1 + (A − 1) = A (46)
To
In other words, for any passive two-port device, the noise factor, F , is equal to the
attenuation of the device, A.
I We have seen that a required gain and bandwidth can be obtained by cascading several
single stages. In the context of this chapter, cascading stages in this way raises the question
of the relationship between the noise factor of a multi-stage amplifier and the noise factors of
the individual stages.
I One might intuitively expect that a minimum noise figure multi-stage amplifier could be
constructed by simply cascading a number of individual stages each optimised for minimum
noise factor. It turns out, however, that this approach does not result in the lowest overall noise
figure for the cascade, due to the trade-off between noise factor and gain inherent in single
stage amplifier design, as outlined in the previous sections.
I Figure 10 illustrates a cascade of single stage amplifiers, with the nth stage having a noise
factor Fn and available gain Gn .
F1 , G1 F2 , G2 F3 , G3 Fn , Gn
F2 − 1 F −1 Fn − 1
F = F1 + + 3 + ... (47)
G1 G1 G2 G1 G2 G3 . . . Gn−1
Where :
Consider the case of two stages that are to be cascaded. Let their noise figures be F1 and F2 and
their available gains be Ga1 and Ga2 . There are two possible arrangements as illustrated in figure
11.
(a) (b)
If stage 1 is placed first, as in figure 11(a), the overall noise factor of the cascade, from equation
(47), will be:
F2 − 1
F12 = F1 + (48)
Ga1
On the other hand, if stage 2 is placed first, as in figure 11(b), the overall noise factor of the
cascade, from equation (47) will be:
F1 − 1
F21 = F2 + (49)
Ga2
F2 − 1 F −1
F1 + < F2 + 1 (51)
Ga1 Ga2
Equation (51) can be rearranged to give:
F1 − 1 F −1
< 2 (52)
1 1
1− 1−
Ga1 Ga2
Therefore the lowest overall noise figure results from ensuring that the first stage has
the lowest value, not of F , but of the quantity ’M’ which is defined by :
F −1
M= (53)
1
1−
Ga
The quantity M, which we call the Noise Measure, is therefore a more meaningful
measure of stage noise performance than noise figure when stages are to be
cascaded.
If several stages with the same noise measure are cascaded then the noise measure of
the cascade will be the same as that of each stage. For such a cascade the overall
noise figure is given by [12]:
F =M+1 (54)
We can therefore conclude that, in order to build a multi-stage amplifier with the
minimum overall noise factor, the first stage, and possibly subsequent stages, should
be designed for minimum value of noise measure (i.e. Mmin ). We know that noise
factor is a function of the source termination alone, so we deduce that the minimum
noise measure can be obtained at a particular value of source termination.
We can determine the value of Mmin and the source termination required to realise it,
which we shall refer to as Yom (admittance) or Γom (reflection coefficient) by
differentiating equation (53) with respect to the complex source termination (YS , ΓS )
and setting the derivatives equal to zero. Alternatively, we can derive circles of constant
noise measure in the complex source plane and then consider the circle of zero radius.
We will proceed to derive a set of equations for constant noise measure circles based
on equation (53). We will employ the available gain equation (??) on page ??, i.e.:
|S21 |2 (1 − |ΓS |2 )
GA = (??)
|1 − S11 ΓS |2 − |S22 − ∆ΓS |2
Substituting equation (??) and equation (33), which are both functions only of ΓS , into
(53) and we have:
|ΓS − Γon |2
(Fmin − 1) + 4rn
|1 + Γon |2 (1 − |ΓS |2 )
M= (55)
|1 − S11 ΓS |2 − |S22 − ∆ΓS |2
!
1−
|S21 |2 (1 − |ΓS |2 )
Which can be rearranged as:
|ΓS |2 [M|1 + Γon |2 (|∆|2 − |S21 |2 − |S11 |2 ) − |S21 |2 (4rn − |1 + Γon |2 (Fmin − 1))]+
ΓS (M|1 + Γon |2 C1 + 4rn |S21 |2 Γ∗on ) + Γ∗S (M|1 + Γon |2 C1∗ + 4rn |S21 |2 Γon ) =
|S21 |2 [|1 + Γon |2 (Fmin − 1) + 4rn |Γon |2 ] − M|1 + Γon |2 (|S22 |2 + |S21 |2 − 1)
(57)
Where C1 = S11 − S22 ∗ ∆.
|S21 |2 [|1 + Γon |2 (Fmin − 1) + 4rn |Γon |2 ] − M|1 + Γon |2 (|S22 |2 + |S21 |2 − 1)
" #
M|1 + Γon |2 (|∆|2 − |S21 |2 − |S11 |2 ) − |S21 |2 (4rn − |1 + Γon |2 (Fmin − 1))
(58)
γSm =
s
M|1 + Γon |2 (1 − |S22 |2 − |S21 |2 ) + |S21 |2 [|1 + Γon |2 (Fmin − 1) + 4rn |Γon |2 ]
+ |CSm |2
M|1 + Γon |2 (|∆|2 − |S21 |2 − |S11 |2 ) + |S21 |2 (|1 + Γon |2 (Fmin − 1) − 4rn )
(61)
We can determine the value of the minimum noise measure obtainable with a given
device by considering the noise measure circle of zero radius. This means finding a
value of M that makes γSm in (61) equal to zero. This can be done by trial and error.
The source reflection coefficient which gives rise to Mmin is the centre of the Mmin noise
measure circle. Once the value of Mmin has been determined, the value of Γom can
therefore be determined from equation (60) as:
Problem : Design a single stage amplifier for minimum noise measure using a
NE71083 GaAs MESFET at a center frequency of 10GHz and bias conditions
Vds = 3.0V , ld = 8mA. The S-parameters of the transistor in the common source
configuration were measured, with a 50Ω reference impedance, to be as follows:
The following noise parameters were supplied by the manufacturer of the FET:
Fmin = 1.7dB
Γon = 0.620∠148o
rn = 12Ω
Solution :
The stability of the device is first evaluated using the Edwards Sinsky stability criteria[4]
of (??) and (??), i.e.:
1 − |S11 |2 0.4758
µ1 = = = 0.358 (65)
∗ | + |S S |
|S22 − ∆S11 12 21 1.3283
1 − |S22 |2 0.6205
µ2 = = = 0.563 (66)
∗ | + |S S |
|S11 − ∆S22 12 21 1.1031
Since both µ1 and µ2 are less than unity we conclude that the device is potentially
unstable. We therefore need to draw a source plane stability circle to see whether we
which source terminations we can use.
We calculate the centre and radius of the source plane stability circle using equations
(??) and (??) as follows :
C1∗ 0.1702∠85o
CSS = = = 0.126∠ − 94o
|S11 |2 − |∆|2 −1.3559
|S12 S21 | 0.9329
rSS = = = 0.688
|S11 |2 − |∆|2 1.3559
Where : C1 = S11 − ∆S22 ∗ = 0.1702∠ − 85o
By determining the constant noise measure circle of zero radius the minimum noise
measure obtainable with this device was found to be Mmin = 0.435. Equation (62)
yielded the value of the associated source reflection coefficient, Γom , to be
0.729∠146.7o .
1
0.9
0.8
0.7
interior of the stability circle.
1.5
0.6
M=3
5
0.
M=2
2
I Figure ?? shows that Γom lies 0.
4
M=1
outside the stable region in the 0 .3 3
source reflection coefficient plane. M = 0.5
5
realise a stable amplifier stage ΓS
=
0.6
having the theoretical minimum
0.1
1 ∠1
48o 10
noise measure of Mmin = 0.435. 20
0 0.1 0.2 0.3 0.4 0.5 1 1.5 2 3 4 5 10 20
I From figure ?? we can see that
the M = 0.5 circle just overlaps −0.1
−20
.3 −4
amplifier with a value of M ≤ 0.5. −0
termination ΓS = 0.610∠148
5 .
−0
−2
which lies approximately in the
.6
−0
.5
−0.7
centre of this overlapping region,
−1
−0.8
−0.9
−1
as shown in figure ??.
The noise source in figure 12 is powered on and off under the control of a microprocessor inside the
instrument. The output signal of the DUT is filtered, downconverted (as necessary, depending on
the frequency of operation) and the resulting RMS power level measured and digitised. Each time
the noise source is turned on or off the noise power at the output of the of the DUT is thus
measured and recorded in the memory of the instrument. The microprocessor carries out the noise
figure calculations using the measured data and the equations we will introduce in this section.
Variable
Mixer Amplifier Attenuator
Band Band A
Noise
DUT Pass Pass
source
Filter Filter D
VCO
G, Na
Noise
Tc ,
Power
Th N1 , N2
Meter
Noise source
Noise
power
N2
Source
Noise
Tcold Thot Temperature
The so-called ’Y-Factor’ is defined as the ratio of ’hot’ to ’cold’ measured noise powers,
as follows[15]:
N2
Y = (69)
N1
From (67) and (68) we can write :
Th + Ta
Y = (70)
Tc + Ta
From (70) we can write Ta in terms of the Y-factor as follows[11]:
Th − YTc
Ta = (71)
Y −1
The noise factor of the amplifier is related to the effective noise temperature by (15), so
we can relate Ta to the system operating temperature as follows :
Ta + To
F= (72)
To
Combining (71) and (72) we get the noise factor of the amplifier in terms of the Y-factor
and the temperatures, To , Tc and Th as follows[2]:
(Th /To − 1)
F= (74)
Y −1
Noise sources are usually specified in terms of the Excess Noise Ratio (ENR) which is
defined as the power level difference between hot and cold states, referenced to the
thermal equilibrium noise power at the standard operating temperature, To . ENR is
therefore defined in relation to Th , Tc and To as :
Th − Tc
ENR = 10 log10 (75)
To
Again, the assumption is often made that Tc = To , in which case (75) becomes :
Th
ENR(dB) = 10 log10 −1 (76)
To
Considering (74) and (76) we can now write the formula for calculating the noise figure
of the DUT, in dB, in terms of the measured Y-factor and the ENR of the source, as
follows :
G Gonzalez.
Microwave Transistor Amplifiers, Analysis and Design.
Prentice Hall Inc., Englewood cliffs, N.J., 2 edition, 1997.
IRE. 2015
© Poole-Darwazeh Lecture 14 - Low Noise Amplifier Design Slide67 of 67