MULUNGUSHI UNIIVERSITY

ASSIGNMENT 1 EGM 241

NAME: BENARD MUMBA

STUDENT NUMBER: 202202235
PROGRAM: CIVIL ENGINEERING
LECTUERER: ENG GOODSON MASHEKA

DATE ASSINGED: SATURDAY 16TH SEPTEMEBER 2023

DUE DATE: MONDAY 25TH SEPTEMBER 2023

Question.
Discuss any five techniques for microscopic examination and of defects of
each technique respectively.
Microscopic techniques

Introduction

Microscopy is a scientific technique of using microscopes to view objects and areas of

objects that cannot be seen with our unaided eye. A microscope is an object that produces
magnified images of small objects that cannot be seen with our naked eye. The constituent
in most materials are of microscopic dimensions, having diameters that may be on the order
of microns. The range of these microstructures (size and shape) can be between mm and
nm. In order to work with these materials, microscopic examination is required to
determine their properties¸ performance as well as function.

With research using microscopy techniques, essential knowledge on the relationship

between structures, properties, functions, and performance can be obtained and put in use
for prospective safe application of such materials in the areas of human health (in medicine,
pharmaceutical and industry) and the environment. Microscopic examination using these
different make it possible to assess the composition, physical properties, and behavior of
materials, thus making a powerful contribution to the development of material science.

Some of the microscopic techniques that are used include;

 OPTICAL MICROCOPY
 SCANNING EELECTRON MICROSCOPY
 TRANSMISSION ELECTRON MICROSCOPY (TEM)
 SCANNING PROBE MICROSCOPY
 ATOMIC FORCE MICROSCOPY

Key
Limitations are referred to defects in this context.

MAINBODY
The following are the mostly widely used microscopy techniques their importance and
defects (limitations).

OPTICAL MICROSCOPY

This technique is also known as light microscopy because visible light and one or
more lens is required to observe the surface of a material. It is one of the most basic
and widely used techniques for defect analysis. Optical microscopy is applied in so
many fields such as in nanophysics and biotechnology. There are different types of
optical microscopy to mention a few including; bright-field microscopy, dark-field
microscopy and fluorescence microscopy.
  Importance of Optical Microscopy

 Research and Development: Optical microscopy assists engineers and scientists in

exploring new materials, developing novel manufacturing processes, and
improving existing technologies. It is also accessible for educational purposes,
such as learning about biology, and anatomy.
 Quality control: It allows engineers to visually inspect and analyze manufactured
components to insure that they meet the required specifications and quality
standards.
 Failure analysis: By examining failed components or structures at the microscopic
level, engineers can identify the root cause of failures, such as cracks, fractures,
or material degradation.

 Limitations or Defects of Optical Microscopy

 Limited resolution: Depending on incident wavelength there is a diffraction-

limited resolution. This technique can only image dark or strongly refracted
objects effectively.
 Limited Chemical Information: It provides morphological information and lacks
the ability to provide detailed chemical information about samples.
 Lack of contrast: Some samples or structures may not exhibit adequate natural
contrast optical microscopy. This make it difficult to distinguish certain features
or components of interest.
 Sample Preparation limitations: preparation of sample for optical microscopy can
be challenging in certain cases. For example in engineering materials may require
extensive polishing or thinning processes, which can introduce artifacts or alter
the sample’s structure.

SCANNING ELECTRON MICROSCOPY (SEM)

Another branch of microscopy with a focused high energy electrons beam to create
high resolution images of a sample’s surface, the image reveals information about
the sample’s external morphology, chemical composition, and crystalline structure
and orientation of materials making up the sample. It is used to investigate into
nanotubes, high temperature super conductors and alloy strength.

 Importance of Scanning Electron Microscopy

 3D Visualization: Scanning Electron Microscopy can create 3D images by

capturing data from different angles. This is crucial for understanding the
topography and morphology of various samples.
 Elemental Analysis: energy dispersive X-ray spectroscopy is often integrated with
scanning electron microscopy, allowing for elemental analysis of the sample’s
surface.
  High-Resolution Imaging: scanning electron microscopy provides high resolution
images of the surface of specimens. This allows scientists to study the fine details
and structures of materials and biological specimens at a much higher level of
detail compared to optical microscopes.

 Limitations of Scanning Electron Microscopy

 Cost: Scanning Electron Microscopy instruments can be expensive to purchase,

install, and maintain, making them less accessible to smaller research groups or
institutions.
 Complex instrumentation: Scanning electron microscopy are relatively complex
and require specialized training to operate. Maintenance and upkeep can also be
costly.
 Sample Damage: this is high-energy electron beam used in scanning electron
microscopy can potentially damage sensitive samples or alter their chemical
composition. This is particularly important when studying biological specimen.

TRANSMISSION ELECTRON MICROSCOPY (TEM)

This is an advanced technique used to examine defects at the atomic scale, it

involves the transfer of a high energy electron beam through an ultrathin sample.
The electrons in the beam are transmitted through the specimen, and their
interaction with the sample are recorded and interpreted to create an image. It is
used to view the internal structure of an objects including grain boundaries and
crystal defects because it produces an image with good quality and resolution.

 Importance of Transmission Electron Microscopy

 Catalysis Research: it plays a role in catalysis research by allowing scientists to

investigate catalyst nanoparticles and their behavior during chemical reactions.
This is critical for improving catalytic processes.
 Material Science: This technique is essential in materials science for studying
polymers, ceramics, metals, and composites. Researchers can observe defects
like dislocations, grain boundaries, and phase boundaries, aiding in material
design and development.
 Environmental Science: Help researchers study the structure and composition of
environmental samples, such as aerosols, soil, and particulate matter, to
understand their impact on ecosystems and human health.

 Limitations of Transmission Electron Microscopy

 Limited field of view: the field of view in transmission electron microscopy is

relatively small portion of the sample is visible at any given time. This requires
multiple images to cover a large area, which can be time consuming.
  Cost: Instruments of this technique are expensive to purchase, install, and
maintain, making them less accessible to smaller research group or institutions.
 Sample preparation complexity: preparing samples can be highly intricate and
time consuming. Specimens must be ultra-thin and require specialized
equipment and techniques for sectioning, thinning, and embedding. Sample
preparation can introduce artifacts and is a critical factor in obtaining accurate
results.

SCANNING PROBE MICROSCOPY

Scanning probe microscopy is a powerful microscopic examination used in scientific

research and various industries. It uses a rectangular pattern known as raster
scanning for study and manipulation of material at Nano scale, providing valuable
insights into their properties and behaviors. It is a very useful technique in the study
and manipulation of molecules, DNA, biological and organic specimen for various
application in medicine, manufacturing, astronomy, physics, and energy. The
importance and limitation of scanning probe microscopy are listed below.

 Importance of Scanning Probe Microscopy

 Education tool: it serve as an educational tool in universities and research

institutions, allowing students to explore and understand Nano scale phenomena
firsthand
 Failure Analysis: scanning probe microscopy is employed in failure analysis of
material of materials and devices, helping to identify defects and understand the
root cause of failures in electronics, materials, and other system.
 High resolution imaging: this technique provide exceptionally high-resolution
imaging at the atomic and molecular scales. This level of detail is crucial for
studying the surface topography and properties of materials at the Nano scale.

 Limitations of Scanning Probe Microscopy

 Cost: high-quality scanning probe microscopy instruments can be expensive to

purchase, install, and maintain making them less accessible to smaller research
groups or institutions.
 Artifact Generation: this technique can introduce artifacts or distortions image,
especially when scanning complex or curved surface. These artifacts can affect
the accuracy of measurements.
 Sample Size: scanning probe is typically used for studying small-scale features
and may not be suitable for larger samples or macroscopic objects.
ATOMIC FORCE MICROSCOPY

This an imaging technique that involves the use-age of a small probe to scan the
surface of the defects, measuring the force between the probe and the sample. The
probe travels across the surface of substances or materials and a laser is used to
measure its deflection in the presence of a photo-detector. It allows precise
measurement of surface and roughness or topography by providing high-resolution
image. Some of its importance and defects are listed below.

 Importance of Atomic Force Microscopy

 Visualization: it enable high image resolution. This is crucial for studying

materials, biological specimens , and structures at dimensions that were
previously inaccessible
 Environmental Science: It can be used to investigate environmental samples, such
as structures of minerals, pollutants, and the behavior of nanoparticles in natural
systems.
 Quality control: Industry atomic force microscopy is employed for quality control
and assurance. It can be used to inspect and characterize the surface of products,
ensuring they meet specific specifications.

 Limitations of Atomic Force Microscopy.

 Vibration and noise: Vibration and external noise source can introduce unwanted
artifacts into atomic force microscopy.
 Complexity: Atomic force microscopy equipment are less accessible to some
users because it requires expertise to operate and interpret data.
 Expensive Equipment: Atomic force microscopy equipment can be costly, limiting
its accessibility to some research groups.

Summary
Microscopy is a scientific technique of using microscopes to view objects and areas of objects
that cannot be seen with our unaided eye. Some of the microscopic techniques that are used
include; Optical microcopy, scanning electron microscopy, transmission electron microscopy
(tem), scanning probe microscopy, and atomic force microscopy.
Microscopic technique are important in many different fields including both in engineering
and health science. They play a crucial role by enabling scientists and researchers to visualize
and analyze samples at various scales. However, there is need for improvement.

References
1.William D. Callister, JR. David G. Rethwisch Material science and engineering page 111-113. 2
Wikilecture, project of first faculty of medicine, Charles University.ISSN 1804-9885.3.The University
of Edinburgh (march6, 2018) “what is microscopy?”, 4. William Rosenthal, spectacles and other
vision aids: a history and guide to collecting, Norman publishing, 1996, page 991-392.