Lecture 5 MoSFET-Circuits

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EC4066D Nanoelectronics

Lecture 5: MoSFET - Circuits

Dr. Venu Anand


Room No.202, ECED block I
[email protected]
Current IDS is expressed in
µA/µm
Two different Vth
related to linear and
saturation regions
Even though the off current of a single transistor
is low, with millions of transistors, this leakage
current becomes significant
DIBL = ΔVT / ΔVDS
Vin = pulse (0,VDD )

Although the leakage current of a


single transistor is low, a million of
them inside and IC will cause a
significant leakage current

For n-MOS
VDS < VGS-|VT| (linear)
VDS>VGS-|VT| (saturation)
For p-MOS
VSD < VSG-|VT| (linear)
VSD>VSG-|VT| (saturation)

So at Vin = 0V, p-MOS is in linear


region and n-MOS is cut-off
At Vin=VDD, p-MOS is cut-off and n-
MOS is in linear region
Ideal transfer
characteristic
Sudden transition from (3) to (4) indicating a
good inverter

When Vout = 0, IDS ~ 0


Vout = VDD, IDS ~ 0
So power is consumed during the transition
only. If the transition can be made abrupt,
power consumption will be low
For low Vin, the point from Vin = 0 until the
slope = -1 can be considered as the low
noise margin
For high Vin, the point from the slope = -1
to Vin = VDD can be considered as the high
noise margin

Large noise margin values are preferred

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