The document discusses MOSFET circuits. It mentions that while the leakage current of a single transistor is low, the leakage current becomes significant when there are millions of transistors in an integrated circuit due to the cumulative effect. It also discusses the linear and saturation regions for n-MOS and p-MOS transistors based on drain-source voltage and gate-source voltage. An inverter circuit is described as having low power consumption when the output transition from 0V to VDD is abrupt, with power only consumed during the transition. Noise margin values are important specifications for inverters, with larger values being preferred.
The document discusses MOSFET circuits. It mentions that while the leakage current of a single transistor is low, the leakage current becomes significant when there are millions of transistors in an integrated circuit due to the cumulative effect. It also discusses the linear and saturation regions for n-MOS and p-MOS transistors based on drain-source voltage and gate-source voltage. An inverter circuit is described as having low power consumption when the output transition from 0V to VDD is abrupt, with power only consumed during the transition. Noise margin values are important specifications for inverters, with larger values being preferred.
The document discusses MOSFET circuits. It mentions that while the leakage current of a single transistor is low, the leakage current becomes significant when there are millions of transistors in an integrated circuit due to the cumulative effect. It also discusses the linear and saturation regions for n-MOS and p-MOS transistors based on drain-source voltage and gate-source voltage. An inverter circuit is described as having low power consumption when the output transition from 0V to VDD is abrupt, with power only consumed during the transition. Noise margin values are important specifications for inverters, with larger values being preferred.
The document discusses MOSFET circuits. It mentions that while the leakage current of a single transistor is low, the leakage current becomes significant when there are millions of transistors in an integrated circuit due to the cumulative effect. It also discusses the linear and saturation regions for n-MOS and p-MOS transistors based on drain-source voltage and gate-source voltage. An inverter circuit is described as having low power consumption when the output transition from 0V to VDD is abrupt, with power only consumed during the transition. Noise margin values are important specifications for inverters, with larger values being preferred.
Room No.202, ECED block I [email protected] Current IDS is expressed in µA/µm Two different Vth related to linear and saturation regions Even though the off current of a single transistor is low, with millions of transistors, this leakage current becomes significant DIBL = ΔVT / ΔVDS Vin = pulse (0,VDD )
Although the leakage current of a
single transistor is low, a million of them inside and IC will cause a significant leakage current
For n-MOS VDS < VGS-|VT| (linear) VDS>VGS-|VT| (saturation) For p-MOS VSD < VSG-|VT| (linear) VSD>VSG-|VT| (saturation)
So at Vin = 0V, p-MOS is in linear
region and n-MOS is cut-off At Vin=VDD, p-MOS is cut-off and n- MOS is in linear region Ideal transfer characteristic Sudden transition from (3) to (4) indicating a good inverter
When Vout = 0, IDS ~ 0
Vout = VDD, IDS ~ 0 So power is consumed during the transition only. If the transition can be made abrupt, power consumption will be low For low Vin, the point from Vin = 0 until the slope = -1 can be considered as the low noise margin For high Vin, the point from the slope = -1 to Vin = VDD can be considered as the high noise margin