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JTAG Material

JTAG boundary scan, or IEEE Standard 1149.1, is a testing standard that converts complex testing problems into simpler ones using software. It defines instructions used for interconnect and self-tests. The standard includes a TAP controller, instruction register, and data registers. The TAP controller generates signals for the instruction and data registers to perform operations selected by the instruction loaded via the test access port, which consists of four pins - TCK, TMS, TDI, and TDO - that control the circuit blocks.

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208 views2 pages

JTAG Material

JTAG boundary scan, or IEEE Standard 1149.1, is a testing standard that converts complex testing problems into simpler ones using software. It defines instructions used for interconnect and self-tests. The standard includes a TAP controller, instruction register, and data registers. The TAP controller generates signals for the instruction and data registers to perform operations selected by the instruction loaded via the test access port, which consists of four pins - TCK, TMS, TDI, and TDO - that control the circuit blocks.

Uploaded by

chinnureddyseelam07
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
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JTAG boundary scan, known as IEEE Standard 1149.1, is a testing standard.

The
advantage of this standard is to convert challenging problems into simple problems by
using the software. The standard mechanism is to solve the problems. The standard
defines instructions that are used in interconnect tests and built-in self-tests. The top-
level schematic of the test logic defined by IEEE Std 1149.1 includes three key blocks
that are TAP controller, Instruction register, and Data registers. The figure below shows
the block diagram of the JTAG architecture. It consists of a boundary scan register, ID
code register, user-definable registers, Instruction register, TAP controller, and
Instruction decoder.
TAP Controller:-
The TAP controller responds to the control sequences through the test access port (TAP)
and generates the clock and control signals for the correct operation of other circuit
blocks.
Instruction Register:-
The instruction register is a kind of shift register which is serially loaded with the
instruction that selects an operation to be performed.
Data Registers:-
The data registers consist of the bank of registers created by using the shift register
circuits. The stimuli used for the operation are loaded into the data registers and
execution operation is started. Further, the results obtained after the execution are shifted
for testing.
The TAP is a general-purpose port that can provide access to many test support functions
built into a component, including the test logic defined by this standard. It is composed
of a minimum of three input connections and one output connection required by the test
logic defined by this standard. An optional fourth input connection provides for
asynchronous initialization of the test logic defined by this standard. The JTAG Test
Access Port consists of four pins that drive the circuit blocks. The four pins, are TMS,
TCK, TDI, and TDO.
➢ TCK (Test Clock Input): This pin sequences the TAP controller of the JTAG
registers.
➢ TMS (Test Mode Select Input): This pin is the mode input signal that provides the
control logic for JTAG.
➢ TDI (Test Data Input): This pin is the serial data input to all JTAG instructions and
data registers.
➢ TDO (Test Data Output): This pin is the serial data output for all JTAG instructions
and data registers.

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