Kingdom of Saudi Arabia

Ministry of education
Prince Sattam Bin Abdullaziz University
College of Engineering
Engineering College

Industrial Engineering Department

IE 3391
Quality Engineer

Lab Report

Student Name Student ID

Mohammed Fahd Aldossri

Abdulaziz Almutairi 441051292
439051101

2/12/2023 Lab report 6 of 1Page

 1.Introduction
1.2 Introduction
In the dynamic landscape of semiconductor manufacturing, achieving consistent and reliable
A control limit chart, also known as a control chart, is a statistical tool used to monitor
production is paramount to meet the stringent demands of the industry. As the complexity of
and analyze the variation in a process over time. It is commonly used in quality control
semiconductor devices continues to increase, maintaining tight control over the manufacturing
and process improvement to identify and address any deviations from the expected
processes becomes a critical factor in ensuring product quality. One key aspect of this control lies
.performance of a process
in the ability to monitor and manage variations in the production process e ectively. This report
focuses on the application of X and R charts in addressing sample-related issues encountered in
The control limit chart typically consists of a central line representing the mean or target
semiconductor manufacturing. As part of our continuous improvement e orts, we have leveraged
value of the process, as well as upper and lower control limits that define the acceptable
the capabilities of Minitab, a leading statistical software package, to analyze and optimize our
range of variation. Data points from the process are plotted on the chart over time,
manufacturing processes. The utilization of X and R charts has played a pivotal role in identifying
allowing for the detection of trends, shifts, or outliers that may indicate a change in the
and mitigating sample-related problems, contributing to enhanced process stability and,
.process
consequently, improved product quality. Throughout this report, we will delve into the signi cance
of X and R charts, the methodology employed in their application, and the outcomes achieved
through By
theirusing
implementation.
a control limitBychart,
showcasing our experience
organizations can identifyinand
resolving
addresssample-related
issues in their
challenges, we aim to underscore the importance of statistical process
processes, leading to improved quality, increased efficiency, and reduced waste. control in semiconductor
It also
manufacturing
providesand emphasize
a visual the role
representation of Minitab
of process as a valuable
performance, making tool in achieving
it easier operational
to communicate and
excellence. Through
understand the this
data exploration, we hope
for decision-making to provide valuable insights and best practices for
purposes.
fellow professionals navigating similar challenges in the ever-evolving landscape of semiconductor
production.

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Procedure :
2.2 Result
We Use the Minitab software to compute the results as following :
1. Open Minitab program.
2. .Enter the data.
3. .Select stat>Control chart>variables charts for subgroup> Xbar-R.
4. .chose (Observa&on for a subgroup are in one row of columns the select c1 to c5.
5. .From Xbar-R Op&on... chose test then select Perform all test for special causes,
Press ok.
6. Press ok to show the chart.

Xbar-r chart :

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 3.Conclusion
In conclusion, a control limit chart is a valuable tool for monitoring and analyzing process
In conclusion,
variationthe application
over time. By of Minitab ainvisual
providing our semiconductor
representation ofmanufacturing processand
process performance has
yielded identifying
insightful results, particularly
deviations in the
from expected analysis ofitXhelps
performance, and R charts. Through
organizations improvemeticulous
quality,
data collection,
efficiency,chart generation,
and reduce and
waste. By thorough
using control examination of control limits,
limit charts, organizations weinformed
can make can
decisions and take corrective actions to ensure their processes are running
con dently assert that the manufacturing process is currently under control. The Control at optimal levels. Limits
of the XOverall,
and R control
charts limit
servecharts are an essential
as valuable tool for
indicators, quality control
allowing and process
us to assess the improvement
stability of our
in various
production industries
process. The fact that the process is within control limits is a positive outcome,
signifying a consistent and predictable manufacturing environment. This is a critical
achievement in semiconductor manufacturing, where precision and reliability are
paramount.The utilization of Minitab has proven instrumental in not only identifying potential
issues but also in implementing corrective actions, thereby enhancing the overall control of the
process. The visual representation provided by the control charts has enabled us to make
informed decisions, leading to improvements and increased con dence in the quality of our
semiconductor products.

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