The document summarizes an overcurrent protection test. It provides details of the test object parameters, test module information, test settings for fault modeling, and results of 5 shot tests. The shot tests injected faults at different current levels between phases L1-L2 and measured the tripping times. All 5 shots passed with tripping times within the expected tolerance bands. The overall test assessment is that it passed.
The document summarizes an overcurrent protection test. It provides details of the test object parameters, test module information, test settings for fault modeling, and results of 5 shot tests. The shot tests injected faults at different current levels between phases L1-L2 and measured the tripping times. All 5 shots passed with tripping times within the expected tolerance bands. The overall test assessment is that it passed.
The document summarizes an overcurrent protection test. It provides details of the test object parameters, test module information, test settings for fault modeling, and results of 5 shot tests. The shot tests injected faults at different current levels between phases L1-L2 and measured the tripping times. All 5 shots passed with tripping times within the expected tolerance bands. The overall test assessment is that it passed.
The document summarizes an overcurrent protection test. It provides details of the test object parameters, test module information, test settings for fault modeling, and results of 5 shot tests. The shot tests injected faults at different current levels between phases L1-L2 and measured the tripping times. All 5 shots passed with tripping times within the expected tolerance bands. The overall test assessment is that it passed.
General - Values: TimeTolAbs: 0.04 s VT connection: At protected object TimeTolRel: 5.00 % CT starpoint connection: To protected object CurrentTolAbs: 0.05 Iref CurrentTolRel: 5.00 % Directional: No
Elements - Phase: Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction Yes I #1 Phase IEC Normal Inverse 0.29 Iref 0.24 0.95 Non Directional
Test Module Name: OMICRON Overcurrent Version: 3.00 SR 2 Test Start: 02-Mar-2023 09:30:17 Test End: 02-Mar-2023 09:30:28 User Name: Manager: Company:
Test Settings:
Fault Model: Time reference: Fault inception Load current: 0.00 A Load angle: 0.00 ° Prefault time: 0.10 s Abs. max time: 240.00 s Post fault time: 0.50 s Rel. max time: 100.00 % Enable voltage output: No Fault voltage LN (for all but two phase faults): 30.00 V Fault voltage LL (for two phase faults): 51.96 V Decaying DC active: No Time constant: 0.05 s CB char min time: 0.05 s Thermal reset active: No Thermal reset method: Manual Thermal reset message: Please reset the Thermal Memory of the device under test before continuing.
Shot Test: Type Relative To Factor Magnitude Angle tnom tmin tmax L1-L2 I #1 Phase 10.172 2.95 A n/a 707.6 ms 652.7 ms 763.9 ms L1-L2 I #1 Phase 9.862 2.86 A n/a 717.4 ms 662.1 ms 774.2 ms L1-L2 I #1 Phase 9.448 2.74 A n/a 731.4 ms 675.5 ms 788.9 ms L1-L2 I #1 Phase 8.966 2.60 A n/a 749.3 ms 692.6 ms 807.6 ms L1-L2 I #1 Phase 8.379 2.43 A n/a 773.6 ms 715.9 ms 833.2 ms
Binary Outputs: Name State Bin. out 1 0 Bin. out 2 0 Bin. out 3 0 Bin. out 4 0
Binary Inputs: Trigger Logic: And Name Trigger State Trip 1 Start X
Shot Test Results:
Type Relative To Factor Magnitude Angle tnom tact Overload Result L1-L2 I #1 Phase 10.172 2.95 A n/a 707.6 ms 729.1 ms No Passed L1-L2 I #1 Phase 9.862 2.86 A n/a 717.4 ms 736.8 ms No Passed L1-L2 I #1 Phase 9.448 2.74 A n/a 731.4 ms 756.2 ms No Passed L1-L2 I #1 Phase 8.966 2.60 A n/a 749.3 ms 776.7 ms No Passed L1-L2 I #1 Phase 8.379 2.43 A n/a 773.6 ms 794.1 ms No Passed
Charts for Fault Types:
Angle Type
L1-L2 n/a
10000.0
1000.0
100.0 t/s
10.0
1.0
0.3 0.5 0.7 1.0 2.0 3.0 5.0
I/A
State: 5 out of 5 points tested. 5 points passed. 0 points failed.
