Module II
Module II
0.0997 − 0.1
= × 800 = −3.4o °C
0.1
= 50 × 0.00426 × 10
= 2.13Ω
33.3 × 10−3
= = 0.09936mA
50 + 2.13 + 271 + 12
0.09936 − 0.1
= × 800
0.1
= −5.12o °C
This equation is approximately true over a limited temperature range for some metals, notably
platinum, copper and nickel, whose characteristics are summarized in Figure 12. Platinum has the
most linear resistance-temperature characteristic, and it also has good chemical inertness, making
it the preferred type of resistance thermometer in most applications. Its resistance-temperature
relationship is linear within ±0.4% over the temperature range between −200o C and +40o C
Besides having a less linear characteristic, both nickel and copper are inferior to platinum in terms
of their greater susceptibility to oxidation and corrosion. This seriously limits their accuracy and
longevity. However, because platinum is very expensive compared with nickel and copper, the latter
are used in resistance thermometers when cost is important. Another metal, tungsten, is also used
in resistance thermometers in some circumstances, particularly for high temperature measurements.
The working range of each of these four types of resistance thermometer is as shown below:
Platinum-−270o C to +1000o C
18
Copper: −200o C to +260o C
Nickel: −200o C to +430o C
Tungsten: −270o C to +1100o C
The characteristics of these resistance thermometers are as shown in Figure 12
ii. Thermistors Thermistors are manufactured from beads of semiconductor material prepared from
oxides of the iron group of metals such as chromium, cobalt, iron, manganese and nickel. Normally,
thermistors have a negative temperature coefficient, i.e. the resistance decreases as the temperature
increases, according to:
1 1
β −
R = R0 e T T0
19
Figure 13: Typical resistance-temperature characteristics of thermistor materials
In an electronic load cell, the gravitational force on the body being measured is applied to an elastic
element. The electronic load cell uses the physical principle that a force applied to an elastic element
produces a measurable deflection. The elastic elements used are specially shaped and designed, some
examples of which are shown in Figure 14
The design aims are to obtain a linear output relationship between the applied force and the measured
deflection and to make the instrument insensitive forces that are not applied directly along the sensing
axis. Load cells exist in both compression and tension forms. In the compression type, the mea-
sured mass is placed on top of a platform resting on the load cell, which therefore compresses the cell.
In the alternative tension type, the mass is hung from the load cell, thereby putting the cell into tension.
Electronic load cells have significant advantages over most other forms of mass-measuring instrument
in terms of their relatively low cost, wide measurement range, tolerance of dusty and corrosive environ-
ments, remote measurement capability, tolerance of shock loading and ease of installation.
One problem that can affect the performance of load cells is the phenomenon of creep. Creep describes
the permanent deformation that an elastic element undergoes after it has been under load for a period
of time. This can lead to significant measurement errors in the form of a bias on all readings if the
instrument is not recalibrated from time to time. However, careful design and choice of materials can
largely eliminate the problem.
20
Figure 14: Elastic elements used in load cell
In this case the measurand is a force and is applied in a column therefore producing strain. The force
is first detected by the first column and is converted into strain which is a mechanical displacement.
This strain changes the resistance of the strain gauge. Hence we have an output which is a change in
the value of resistance.The measurement of force is a 2-stage process i.e first conversion of force into
strain and second conversion of strain into a change in electrical resistance.
NB: It is common phenomena that when a metal conductor is stretched or compressed, its resistance
changes on account of the fact that both length and diameter of the conductor change. Also there
21
is a change in the value of resistivity of the conductor when it is strained and this property is called
piezo-resistive effect.
Hence resistance strain gauges are also known as piezo resistive gauges. Apart from load cells, other
meters or gauges which employ strain gauges are torque meters, diaphragm type pressure gauges,
temperature sensors, accelerometer and flow-meters may employ strain gauges as secondary transducers.
Consider a strain gauge made up of a circular wire. The dimensions are length L ,area A and diameter
D by being strained. Let wire resistivity be ρ and the resistance of the strain wire be R. Therefore
ρL
R= (1)
A
Let a tensile stress S be applied to the wire as shown in Figure 16 below
Let ∆L , ∆D and ∆R be the changes in length , area , and resistance respectively. Given equation 3
that
ρL dR ρ δL ρL δA L δρ
R= ⇒ = − + (2)
A dS A δS A2 δS A δS
Dividing equation 4 by equation 3 we have
1 dR 1 δL 1 δA 1 δρ
= − + (3)
R dS L δS A δS ρ δS
πD2
A=
4
It follows that
22
δA 2πD δD
=
δS 4 δS
Hence
2π D
1 dA 4 δD 2 δD
= = (4)
A dS π D2 δS D δS
4
1 dR 1 δL 2 δD 1 δρ
= − + (5)
R dS L δS D δS ρ δS
∆R ∆L ∆L ∆ρ
= + 2v + (7)
R L L ρ
The gauge factor is defined as the ratio of per unit change in resistance to per unit change in length.
Gauge factor (Gf )
∆R
Gf = R (8)
∆L
L
OR
∆R ∆L
= Gf = Gf
R L
Where
∆L
= strain =
L
The Gf can be written as
∆ρ
ρ
Gf = 1 + 2v +
∆ρ
ρ
= 1 + 2v + (9)
∆L
L
Note that if the change in the value of resistivity of a material due to strain is neglected the gauge
factor is
Gf = 1 + 2v
The Poisson ratio for the metal is between 0 to 0.5. This gives a gauge factor of approximately 2. The
most common value of Poisson ratio for wires is 0.3. This gives a value of 1.6 for wire wound strain
gauges.
23
EXAMPLE
A strain gauge is bonded to a beam 0.1m long and has a cross section area 4cm2 . Young modulus
for steel is 207GN/m2 . The strain gauge has unstrained resistance of 240Ω and a gauge factor of 2.2.
When a load is applied the resistance of the gauge changes by 0.013Ω. Calculate the change in length
of the steel beam and the amount of force applied to the beam.
SOLUTION
∆R ∆R
Gf = R ⇒ ∆L = R L
∆L Gf
L
0.013
= 240 × 0.1
2.2
= 2.46 × 10−6 m
= 2.037 × 103 N
The resistance change in strain gauges is small and requires the use of a bridge circuit for measurement,
as shown in Figure 17. The strain gauge elements are mounted in two arms of the bridge, and two
resistors, R1 and R2 , form the other two arms. The output signal from the bridge is amplified and
impedance matched.
24
Figure 17: Strain gauge bridge circuit
Rochelle salt, Ammonium dihydrogen phosphate, Lithium sulphate, Quartz, Ceramic dipotassium tar-
tarate and potassium dihydrogen phosphate. Except quartz and ceramics the rest are man made
crystals.
The ceramic materials are polycrystalline in nature and basically are made of barium titanate.
Materials exhibit significant and useful piezo electric effect are divided into two categories
(b) Synthetic group e.g Lithium phosphate and ethylene diamine tartarate
A piezo electric element used for converting mechanical motion to electrical signals may be thought
of as a charge generator and a capacitor. Mechanical deformation generates a charge and the charge
appears as a voltage across the electrodes. The voltage is given by
ϕ
Eo =
C
25
The magnitude and polarity of the induced surface charges are proportional to the magnitude and
direction of the applied force F . The polarity of the induced charge depends upon the direction of the
applied force
ϕ = d ∗ F coulombs (10)
where d=charge sensitivity of the crystal in coulombs/newton and is constant for a given crystal
F = applied force in Newtons
The force F causes a change in thickness of the crystal and
AE
F = ∆t N (11)
t
Where
A = Area of crystal in m2
t = thickness of the crystal in m
E = young modulus of elasticity in N/m2
Therefore
Stress F 1
E= = ×
Strain A ∆t
t
Ft
E= N/m2 (12)
A∆t
but A = wl Where w is the width of the crystal in meters and l is the length of the crystal in meters
∆t
ϕ = dEA (13)
t
The charge at the electrode give rise to an output voltage
ϕ
Eo = (14)
Cp
A
C p = 0 r (15)
t
ϕ dF dt F
Eo = = = (16)
Cp A
0 r t 0 r A
Thus
d
Eo = tp = gtp (17)
0 r
where
d
g= (18)
0 r
26
g is the voltage sensitivity of the crystal. This is a constant for a given crystal circuit. Its units are
V − m/N
Now
Eo
Eo
g= = t (19)
tp p
Electric f ield E
g= = (20)
stress p
d = 0 r g C/N (21)
EXAMPLE 1
A quartz piezo electric crystal has a thickness of 2mm and a voltage sensitivity of 0.055V − m/N . It
is subjected to a pressure of 1.5M N/m2 . Calculate the voltage output.
If the permittivity of quartz is 40.6 × 10−12 F/m , calculate the charge sensitivity
SOLUTION
Eo = gtp
= 165V
charge sensitivity d
d == 0 r g
EXAMPLE 2
A Barium titanic pick up has the dimensions of 5 mm by 5 mm by 1.25 mm. The force acting on it
is 5 N , its charge sensitivity is 150 pC/N and its permittivity is 12.5 × 10−9 F/m . If the modulus of
elasticity of Barium titanic is 12 × 106 N/m2 , calculate the strain , the charge and the capacitance
SOLUTION
Area of plate A
A = 5 × 5 × 10−6 = 25 × 10−6
27
Pressure p
5
p= = 0.2 × 106 N/m2
25 × 10−6
Voltage sensitivity g
d 150 × 10−12
g= =
0 r 12.5 × 10−9
= 12 × 10−3 V m/N
Voltage generated Eo
Eo = gtp = 12 × 10−3 × 1.25 × 10−3 × 0.2 × 106
= 3V
Strain
∆t stress
= =
t young modulus
0.2 × 106
= = 0.0167
12 × 106
charge ϕ
ϕ = dF = 150 × 10−12 × 5
= 750pC
Capacitance Cp
ϕ 750 × 10−12
Cp = =
Eo 3
= 250pF
28
Figure 19: Piezoelectric transducer set-up
C = Cp + Cc + CA (22)
RA Rp
R= (23)
RA + Rp
29
Since the leakage resistance of the transducer is very large of the order 1 × 1011 Ω ,
R ' RA
dq
iCR =
dt
dxi
= kq (24)
dt
where iCR is the current of constant current generator
iCR = iC + iR
output voltage at the load eL
Z Z
1 1
eL = eC = iC dt = iCR − iR dt
C C
OR
deL 1
= iCR − iR
dt C
OR
deL dx e
= iCR − iR = kq i − L
C
dt dt R
deL dx
RC + eL = kq R i (25)
dt dt
But RC = τ
deL dx
τ + eL = kτ i (26)
dt dt
kq
where k = sensitivity constant = C V /m
Taking Laplace transform of equation 29 we have
Transfer function
EL (s) kτ s
= (28)
Xi (s) τs + 1
EL (jω) jωkτ
=
Xi (jω) 1 + jωτ
30
1
=r (29)
1+ 1 2
(ωτ )
From equation 33 it is evident that the steady state response of a piezoelectric transducer to a con-
stant displacement xi is zero. Therefore piezoelectric transducers cannot be used to measure static
displacement.
EXAMPLE
A piezoelectric transducer has a capacitance of 1000pF and a charge sensitivity of 40 × 10−3 C/m. The
connecting cable has a capacitance of 300pF , while the ocr used for read out has a resistance of 1M Ω
with a parallel capacitance of 50pF .
(b) What is the high frequency sensitivity in V/m of the entire measuring system?
(c) What is the lowest frequency that can be measured with 5% amplitude error by the entire system?
(d) What is the value of an external shunt capacitance that can be connected in order to extend the
range of 5% error down to 10Hz
(e) With external capacitance calculated in (b) above connected in the circuit what is the system high
frequency sensitivity?
SOLUTION
(a)
kq = 40 × 10−3 C/m
Cp = 1000 × 10−12 F
kq 40 × 10−3
k= =
Cp 1000 × 10−12
= 40 × 106 V /m
31
(b)
C = Cp + Cc + CA
kq 40 × 10−3
k= =
C 1350 × 10−12
= 29.63 × 106 V /m
(c)
τ = RC = 1 × 106 × 1350 × 10−12 = 1.35ms
m = 0.95
1
0.95 = r
1+ 1 2
(ωτ )
ωτ = 3.04
3.04
ω= = 2254rad/s
1.35 × 10−3
2πf = 2254
2254
f= = 358.7Hz
2π
(d)
3.04 3.04
τ= = = 48.38ms
ω 2π × 10
Total capacitance
τ 48.38 × 10−3
C= =
R 1 × 106
= 48.380nF
External capacitance
Ce = 48380pF − 1350pF
= 47020pF
32
(e) High frequency sensitivity with Ce
40 × 10−3
= = 827kV /m
48380 × 10−12
(b) Used for the measurement of surface roughness and in accelerometers and vibration pick ups
(c) Used in under water detection systems known as sonar and ultrasonic generation element
(a) These transducers need no external power and is therefore self generating (active transducers)
(b) The output of the transducer is affected by changes in temperature. Hence temperature compen-
sating devices have to be used.
a) Potentiometer
This works on the principle that positioning of a slider by an external force varies the resistance in a
potentiometer.
It is used to measure electrical pressure or voltage or mechanical displacement. The schematic diagram
of a potentiometer (POT) is as shown in Figure 22 below.
33
Let L be the total length of the potentiometer and Rt be its total resistance. The input displacement
is xi . The output voltage eo is given by
x
eo = i ei (1)
L
and
eo
xi = L (2)
ei
A transformer consists of a single primary winding (p) and two secondary windings s1 and s2 wound
on a cylindrical former. The secondary windings have equal number of turns and are identically placed
34
at either side of the primary winding. The primary winding is connected to an ac source. A movable
soft iron core is placed inside the transformer. The displacement to be measured is applied to the arm
attached to the soft iron core. In practice the core is made up of high permeability nickel iron which is
annealed. This means low harmonics, low null voltage and a high sensitivity. The assembly is placed
in a stainless steel housing and the end lids provide electrostatic and electromagnetic shielding. The
frequency of ac provided to the primary winding maybe between 50Hz - 20kHz. Since the primary
winding is exited by an alternating current source it provides alternating magnetic field which in turn
induces alternating current in the two secondary windings. The output voltage of s1 is Es1 and that of
s2 is Es2 .In order to convert the outputs from s1 and s2 into a single voltage signal, the two secondary
are connected in series opposition.
Then the output of the transducer is the difference between the two voltages
The differential output voltage
Eo = Es1 − Es2 (3)
When the core is at its normal position (null position) the flux linking both the secondary winding is
equal and hence equal emfs are induced in them.Thus at Null position
Es1 = Es2
Now if the core is moved to the left of the null position, more flux links with the winding s1 and less
with the winding s2
Accordingly output voltage Es1 is more than Es2 . This magnitude of output voltage is thus
Eo = Es1 − Es2
(a) Have high range for measurement of displacement . This can be used to measure displacement of
the order 1.25mm - 250mm
35
(b) It is a frictionless device and hence no mechanical wear. LVDT has infinite mechanical life. This
feature is vital in high reliability mechanisms and systems found in aircraft , missile and space
vehicles and critical industrial equipment
(d) Ruggedness i.e LVDT can tolerate high degree of shock and vibrations especially when the core is
spring induced without any adverse effects.
(e) It has low hysterisis and hence repeatability is excellent under all operating conditions
Disadvantages of LVDTs
(b) LVDTs are sensitive to stray magnetic field but shielding is possible
(e) The dynamic response of these transducers is limited mechanically by the mass of the core and
electrically by the frequency of the applied voltage
(f) Temperature affects the performance of the transducer and hence temperature compensating schemes
need to be employed
(a) Dc tachometer
(b) Ac tachometer
Dc tachometer consists of a small armature which is coupled with the machine whose speed is to be
measured. This armature revolves in the field of permanent magnet.The emf generated is proportional
to the product of speed and flux. Since the flux of a permanent magnet is constant, the voltage
generated is proportional to speed.
The polarity of output voltage indicates the direction of resistance. The emf is measured with the help
of a moving coil voltmeter having a uniform scale and calibrated directly in terms of speed.
Ac tachometer have a rotating magnet which may either be permanent or electro magnet. The coil is
wound on the stator and therefore the problems associated with commutators as in dc tachometers are
absent. The rotation of the magnet causes an emf to be induced in the stator coil. The amplitude and
frequency of emf are both proportional to the speed of rotation.
Thus either amplitude or frequency of the induced voltage may be used to measure the rotational speed.
The output voltage of ac tachometer generator is rectified and is measured with a permanent magnet
moving coil instrument (PMMC)
36
2.4.5 Level Measurement
1. Dipstick
Dipsticks offer a simple means of measuring level approximately. The ordinary dipstick is the cheapest
device available. This consists of a metal bar on which a scale is etched. The bar is fixed at a known
position in the liquid-containing vessel. A level measurement is made by removing the instrument from
the vessel and reading of how far up the scale the liquid has wetted. As a human operator is required
to remove and read the dipstick, this method can only be used in relatively small and shallow vessels.
2. Float Systems
Float systems, whereby the position of a float on the surface of a liquid is measured by means of
a suitable transducer, have a typical measurement inaccuracy of ±1%. This method is also simple,
cheap and widely used. The system using a potentiometer is very common, and is well known for its
application to monitoring the level in motor vehicle fuel tanks.
3. Pressure measuring devices(hydrostatic system) The hydrostatic pressure due to a liquid is directly
proportional to its depth and hence to the level of its surface. Several instruments are available that use
this principle, and they are widely used in many industries, particularly in harsh chemical environments.
In the case of open-topped vessels (or covered ones that are vented to the atmosphere), the level can
be measured by inserting a pressure sensor at the bottom of the vessel, as shown in Figure 25
P
The liquid level h is then related to the measured pressure P according to h = ,whereρ is the liquid
ρg
density and g is the acceleration due to gravity. One source of error in this method can be imprecise
knowledge of the liquid density. This can be a particular problem in the case of liquid solutions and
mixtures and in some cases only an estimate of density is available.
Even with single liquids, the density is subject to variation with temperature, and therefore temperature
measurement may be required if very accurate level measurements are needed.
4. Capacitive devices Capacitive devices are widely used for measuring the level of both liquids and solids
in powdered or granular form. They perform well in many applications, but become inaccurate if the
measured substance is prone to contamination by agents that change the dielectric constant. Ingress of
moisture into powders is one such example of this. They are also suitable for use in extreme conditions
37
measuring liquid metals (high temperatures), liquid gases (low temperatures), corrosive liquids (acids,
e.t.c.) and high pressure processes.
For non-conducting substances two bare-metal capacitor plates in the form of concentric cylinders are
immersed in the substance, as shown in Figure 26
The substance behaves as a dielectric between the plates according to the depth of the substance. For
concentric cylinder plates of radius a and b (b>a), and total height L, the depth of the substance h is
related to the measured capacitance C by:
b
Cloge − 2πεo
a
h=
2πεo (ε − 1)
where ε is the relative permittivity of the measured substance and εo is the permittivity of free space.
5. Ultrasonic level gauge The principle of the ultrasonic level gauge is that energy from an ultrasonic
source above the liquid is reflected back from the liquid surface into an ultrasonic energy detector.
Measurement of the time of flight allows the liquid level to be inferred. In alternative versions, the
ultrasonic source is placed at the bottom of the vessel containing the liquid, and the time of flight
between emission, reflection off the liquid surface and detection back at the bottom of the vessel is
measured.
38
2.5 Classification of transducers
1. Operating principle
2. Sensitivity
3. Operating range
4. Accuracy
5. Cross sensitivity
6. Errors
39