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ISOW7840, ISOW7841, ISOW7842, ISOW7843, ISOW7844

SLLSEY2G – MARCH 2017 – REVISED AUGUST 2021

ISOW784x High-Performance, 5000-VRMS Reinforced Quad-Channel Digital Isolators


with Integrated High-Efficiency, Low-Emissions DC-DC Converter

1 Features 3 Description
• 100 Mbps data rate The ISOW784x is a family of high-performance, quad-
• Robust isolation barrier: channel reinforced digital isolators with an integrated
– >100-Year projected lifetime at 1 kVRMS high-efficiency power converter. The integrated DC-
working voltage DC converter provides up to 650 mW of isolated
– Up to 5000 VRMS isolation rating power at high efficiency and can be configured
– Up to 10 kVPK surge capability for various input and output voltage configurations.
– ±100 kV/µs minimum CMTI Therefore these devices eliminate the need for a
• Integrated high-efficiency DC-DC converter with separate isolated power supply in space-constrained
on-chip transformer isolated designs.
• 3-V to 5.5-V Wide input supply range Device Information
• Regulated 5-V or 3.3-V output
PART NUMBER(1) PACKAGE BODY SIZE (NOM)
• Up to 0.65-W output power
ISOW7840
• 5 V to 5 V; 5 V to 3.3 V: Available load current ≥ ISOW7841
130 mA ISOW7842 SOIC (16) 10.30 mm × 7.50 mm
• 3.3 V to 3.3 V: Available load current ≥ 75 mA ISOW7843
• 3.3 V to 5 V: Available load current ≥ 40 mA ISOW7844
• Soft-start to limit inrush current (1) For all available packages, see the orderable addendum at
• Overload and short-circuit protection the end of the data sheet.
• Thermal shutdown
• Default output: High and Low options Isolation Transformer

• Low propagation delay: 13 ns Typ (5-V supply) DC-DC DC-DC


• Robust electromagnetic compatibility (EMC) VCC
Primary Secondary
VISO

– System-level ESD, EFT, and surge immunity


– ±8 kV IEC 61000-4-2 contact discharge VSI VSO
Isolation Capacitors
protection across isolation barrier
INx OUTx
– Low emissions
• 16-pin Wide SOIC package
GNDI GNDO
• Extended temperature range: –40°C to +125°C
• Safety-related certifications: VCC is the primary supply voltage referenced to GND1. VISO is
– 7071-VPK reinforced isolation per DIN V VDE V the isolated supply voltage referenced to GND2.
0884-11:2017-01 VSI and VSO can be either VCC or VISO depending on the
– 5000-VRMS isolation for 1 minute per UL 1577 channel direction.
– CSA Certification per IEC 60950-1, IEC VSI is the input-side supply voltage referenced to GNDI and
62368-1 and IEC 60601-1 end equipment VSO is the output-side supply voltage referenced to GNDO.
standards Simplified Schematic
– CQC Approval per GB4943.1-2011
– TUV Certification according to EN 60950-1 and
EN 61010-1
2 Applications
• Industrial automation
• Motor control
• Grid infrastructure
• Medical equipment
• Test and measurement

An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
ISOW7840, ISOW7841, ISOW7842, ISOW7843, ISOW7844
SLLSEY2G – MARCH 2017 – REVISED AUGUST 2021 www.ti.com

Table of Contents
1 Features............................................................................1 7.18 Switching Characteristics—3.3-V Input, 5-V
2 Applications..................................................................... 1 Output..........................................................................26
3 Description.......................................................................1 7.19 Switching Characteristics—5-V Input, 3.3-V
4 Revision History.............................................................. 2 Output..........................................................................26
5 Description (continued).................................................. 5 7.20 Switching Characteristics—3.3-V Input, 3.3-V
6 Pin Configuration and Functions...................................5 Output..........................................................................26
Pin Functions.................................................................... 7 7.21 Insulation Characteristics Curves........................... 27
7 Specifications.................................................................. 9 7.22 Typical Characteristics............................................ 28
7.1 Absolute Maximum Ratings........................................ 9 8 Parameter Measurement Information.......................... 33
7.2 ESD Ratings............................................................... 9 9 Detailed Description......................................................34
7.3 Recommended Operating Conditions.........................9 9.1 Overview................................................................... 34
7.4 Thermal Information..................................................10 9.2 Functional Block Diagram......................................... 35
7.5 Power Ratings...........................................................10 9.3 Feature Description...................................................36
7.6 Insulation Specifications............................................11 9.4 Device Functional Modes..........................................37
7.7 Safety-Related Certifications.................................... 12 10 Application and Implementation................................ 39
7.8 Safety Limiting Values...............................................12 10.1 Application Information........................................... 39
7.9 Electrical Characteristics—5-V Input, 5-V Output..... 13 10.2 Typical Application.................................................. 39
7.10 Supply Current Characteristics—5-V Input, 5-V 11 Power Supply Recommendations..............................42
Output..........................................................................14 12 Layout...........................................................................43
7.11 Electrical Characteristics—3.3-V Input, 5-V 12.1 Layout Guidelines................................................... 43
Output..........................................................................16 12.2 Layout Example...................................................... 44
7.12 Supply Current Characteristics—3.3-V Input, 5- 13 Device and Documentation Support..........................45
V Output...................................................................... 17 13.1 Device Support....................................................... 45
7.13 Electrical Characteristics—5-V Input, 3.3-V 13.2 Documentation Support.......................................... 45
Output..........................................................................18 13.3 Related Links.......................................................... 45
7.14 Supply Current Characteristics—5-V Input, 3.3- 13.4 Receiving Notification of Documentation Updates..45
V Output...................................................................... 19 13.5 Support Resources................................................. 45
7.15 Electrical Characteristics—3.3-V Input, 3.3-V 13.6 Trademarks............................................................. 45
Output..........................................................................22 13.7 Electrostatic Discharge Caution..............................46
7.16 Supply Current Characteristics—3.3-V Input, 13.8 Glossary..................................................................46
3.3-V Output................................................................ 23 14 Mechanical, Packaging, and Orderable
7.17 Switching Characteristics—5-V Input, 5-V Output.. 26 Information.................................................................... 47

4 Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
Changes from Revision F (March 2019) to Revision G (August 2021) Page
• Added 3.3 V to 5 V power converter support throughout....................................................................................1
• Removed references to 100 uF capacitor throughout........................................................................................ 1
• Removed paragraph discussing secondary VISO monitoring.......................................................................... 42

Changes from Revision E (November 2017) to Revision F (March 2019) Page


• Made editorial and cosmetic changes throughout the document....................................................................... 1
• Added "Robust Isolation Barrier" bullet in Features ...........................................................................................1
• Added ">100-Year Projected Lifetime at 1 kVRMS Working Voltage" bullet in Features .....................................1
• Added "Up to 5000 VRMS Isolation Rating" bullet in Features ........................................................................... 1
• Added "Up to 10 kVPK Surge Capability" bullet in Features .............................................................................. 1
• Added "±8 kV IEC 61000-4-2 Contact Discharge Protection across Isolation Barrier" bullet in Features ......... 1
• Updated Simplified Schematic to show two isolation capacitors in series instead of a single capacitor for
signal isolation channels ....................................................................................................................................1
• Added "Contact discharge per IEC 61000-4-2; Isolation barrier withstand test" specification of ±8000 in
Section 7.2 table................................................................................................................................................. 9
• Added table note "IEC ESD strike is applied across the barrier with all pins on each side tied together
creating a two-terminal device" to Section 7.2 table........................................................................................... 9

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• Deleted "TJ or Junction temperature" parameter from Section 7.3 table as it is already specified in Section 7.1
table.................................................................................................................................................................... 9
• Added "see Figure 10-5" to TEST CONDITIONS of VIOWM specification......................................................... 11
• Added the following note to Figure 8-2: "Optional 100 µF capacitor can be added between VCC and GND1;
refer to Section 11" .......................................................................................................................................... 33
• Added the following note to Isolated Power and SPI for ADC Sensing Application with ISOW7841-Q1:
"Optional 100 µF capacitor can be added between VCC and GND1; refer to Power Supply Recommendations"
..........................................................................................................................................................................39
• Added the following text to Section 10.2.1: "Optional 100 µF decoupling capacitor can be added between VCC
and GND1 pins; refer to Section 11 for more details........................................................................................ 39
• Added the following note to Figure 10-2: "Optional 100 µF capacitor can be added between VCC and GND1;
refer to Section 11" .......................................................................................................................................... 40
• Added Section 10.2.3.1 sub-section under Section 10.2.3 section.................................................................. 41
• Added text to Section 11 section to emphasise that input decoupling capacitor should be larger than output
capacitor by at least 100 µF .............................................................................................................................42
• Added the following note to Figure 12-1: "Optional 100 µF capacitor can be added between VCC and GND1;
refer to Section 11" .......................................................................................................................................... 44

Changes from Revision D (November 2017) to Revision E (November 2017) Page


• Changed the ISOW7843 device from Preview to Production Data ................................................................... 5
• Added the ISOW7843 current parameters to each Supply Current Characteristics table ............................... 14
• Added the supply current versus data rate graphs for the ISOW7843 in the Typical Characteristics section.. 28

Changes from Revision C (October 2017) to Revision D (November 2017) Page


• Changed the ISOW7840 device from Preview to Production Data ................................................................... 5
• Added the ISOW7840 current parameters to each Supply Current Characteristics table ............................... 14
• Changed IISO to ILOAD and the value of wave clock input from 0.5, 5, and 50 MHz to 1, 10, and 100 Mbps in
the test conditions for the ISOW7841 current parameters in each Supply Current Characteristics table ....... 14
• Deleted no external ILOAD test condition for the current available to isolated supply parameter for the
ISOW7842 and ISOW7844 devices in each Supply Current Characteristics table ......................................... 14
• Changed the labels of the curves in the Thermal Derating Curve for Safety Limiting Current per VDE ..........27
• Added the supply current versus data rate graphs for the ISOW7840 in the Typical Characteristics section.. 28
• Changed the ground symbols for the input schematic for devices with F suffix and the SEL pin in the Device
I/O Schematics figure....................................................................................................................................... 38

Changes from Revision B (June 2017) to Revision C (October 2017) Page


• Changed the Safety-Related Certifications Features list.................................................................................... 1
• Changed header row From: DIN V VDE 0884-10 (VDE V 0884-10): 2016-12 To: DIN V VDE 0884-11:2017-01
in the Insulation Specifications .........................................................................................................................11
• Changed VIOSM test conditions in Insulation Specifications .............................................................................11
• Changed VISO(UL) test conditions in Insulation Specifications ..........................................................................11
• Changed the Safety-Related Certifications table..............................................................................................12
• Changed Note 1 of the Safety Limiting Values table........................................................................................ 12
• Added the ISOW7842 current parameters to each Supply Current table ........................................................14
• Added the supply current versus data rate graphs for the ISOW7842 in the Typical Characteristics section.. 28

Changes from Revision A (March 2017) to Revision B (June 2017) Page


• Added the ISOW7844 current parameters to each Supply Current table ........................................................14

Changes from Revision * (March 2017) to Revision A (March 2017) Page


• Changed the maximum propagation delay time and the typical and maximum values for pulse width distortion
in all Switching Characteristics tables...............................................................................................................26

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• Changed the maximum limit for output signal rise and fall times from 3 to 4 ns in the Switching Characteristics
—5-V Input, 3.3-V Output table........................................................................................................................ 26

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5 Description (continued)
The ISOW784x family of devices provides high electromagnetic immunity and low emissions while isolating
CMOS or LVCMOS digital I/Os. The signal-isolation channel has a logic input and output buffer separated by
a double capacitive silicon dioxide (SiO2) insulation barrier, whereas, power isolation uses on-chip transformers
separated by thin film polymer as insulating material. Various configurations of forward and reverse channels are
available. If the input signal is lost, the default output is high for the ISOW784x devices without the F suffix and
low for the devices with the F suffix (see VSI and VSO can be either VCC or VISO depending on the channel
direction).
These devices help prevent noise currents on data buses, such as RS-485, RS-232, and CAN, or other circuits
from entering the local ground and interfering with or damaging sensitive circuitry. Through innovative chip
design and layout techniques, electromagnetic compatibility of the device has been significantly enhanced to
ease system-level ESD, EFT, surge and emissions compliance. The high-efficiency of the power converter
allows operation at a higher ambient temperature. The device is available in a 16-pin SOIC wide-body (SOIC-
WB) DWE package.
6 Pin Configuration and Functions

VCC 1 16 VISO

GND1 2 15 GND2

INA 3 14 OUTA
ISOLATION

INB 4 13 OUTB

INC 5 12 OUTC

IND 6 11 OUTD

NC 7 10 SEL

GND1 8 9 GND2

Figure 6-1. ISOW7840 DWE Package 16-Pin SOIC-WB Top View

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VCC 1 16 VISO

GND1 2 15 GND2

INA 3 14 OUTA

ISOLATION
INB 4 13 OUTB

INC 5 12 OUTC

OUTD 6 11 IND

NC 7 10 SEL

GND1 8 9 GND2

Figure 6-2. ISOW7841 DWE Package 16-Pin SOIC-WB Top View

VCC 1 16 VISO

GND1 2 15 GND2

INA 3 14 OUTA
ISOLATION

INB 4 13 OUTB

OUTC 5 12 INC

OUTD 6 11 IND

NC 7 10 SEL

GND1 8 9 GND2

Figure 6-3. ISOW7842 DWE Package 16-Pin SOIC-WB Top View

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VCC 1 16 VISO

GND1 2 15 GND2

INA 3 14 OUTA

ISOLATION
OUTB 4 13 INB

OUTC 5 12 INC

OUTD 6 11 IND

NC 7 10 SEL

GND1 8 9 GND2

Figure 6-4. ISOW7843 DWE Package 16-Pin SOIC-WB Top View

VCC 1 16 VISO

GND1 2 15 GND2

OUTA 3 14 INA
ISOLATION

OUTB 4 13 INB

OUTC 5 12 INC

OUTD 6 11 IND

NC 7 10 SEL

GND1 8 9 GND2

Figure 6-5. ISOW7844 DWE Package 16-Pin SOIC-WB Top View

Pin Functions
PIN
NO. I/O DESCRIPTION
NAME
ISOW7840 ISOW7841 ISOW7842 ISOW7843 ISOW7844
GND1 2, 8 2, 8 2, 8 2, 8 2, 8 — Ground connection for VCC
GND2 9, 15 9, 15 9, 15 9, 15 9, 15 — Ground connection for VISO
INA 3 3 3 3 14 I Input channel A
INB 4 4 4 13 13 I Input channel B
INC 5 5 12 12 12 I Input channel C
IND 6 11 11 11 11 I Input channel D
NC 7 7 7 7 7 — Not connected
OUTA 14 14 14 14 3 O Output channel A
OUTB 13 13 13 4 4 O Output channel B
OUTC 12 12 5 5 5 O Output channel C
OUTD 11 6 6 6 6 O Output channel D
VISO selection pin. VISO = 5 V when SEL shorted to VISO.
SEL 10 10 10 10 10 I VISO = 3.3 V, when SEL shorted to GND2 or when left
floating. For more information see the Section 9.4.
VCC 1 1 1 1 1 — Supply voltage

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PIN
NO. I/O DESCRIPTION
NAME
ISOW7840 ISOW7841 ISOW7842 ISOW7843 ISOW7844
VISO 16 16 16 16 16 — Isolated supply voltage determined by SEL pin

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7 Specifications
7.1 Absolute Maximum Ratings
See (1) (2)
MIN MAX UNIT
VCC Supply voltage –0.5 6 V
VISO Isolated supply voltage –0.5 6 V
VCC + 0.5,
VIO Voltage at INx, OUTx, SEL pins –0.5 V
VISO + 0.5(3)
IO Maximum output current through data channels –15 15 mA
TJ Junction temperature 150 °C
Tstg Storage temperature –65 150 °C

(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress
ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under
Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device
reliability.
(2) All voltage values except differential I/O bus voltages are with respect to the local ground pin (GND1 or GND2) and are peak voltage
values.
(3) This value depends on whether the pin is located on the VCC or VISO side. The maximum voltage at the I/O pins should not exceed 6 V.

7.2 ESD Ratings


VALUE UNIT
Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1) ±2000
Electrostatic
V(ESD) Charged-device model (CDM), per JEDEC specification JESD22-C101(2) ±1000 V
discharge
Contact discharge per IEC 61000-4-2; Isolation barrier withstand test(3) ±8000

(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
(3) IEC ESD strike is applied across the barrier with all pins on each side tied together creating a two-terminal device.

7.3 Recommended Operating Conditions


(1)

MIN NOM MAX UNIT


VCC Supply voltage 3 5.5 V
VSO (1) = 5 V –4
IOH High level output current(2) mA
VSO = 3.3 V –2
VSO = 5 V 4
IOL Low level output current(2) mA
VSO = 3.3 V 2
VIH High-level input voltage 0.7 × VSI VSI V
VIL Low-level input voltage 0 0.3 × VSI V
DR Data rate 100 Mbps
TA Ambient temperature –40 125 °C

(1) VSI is the input side supply, VSO is the output side supply
(2) This current is for data output channel.

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7.4 Thermal Information


ISOW784x
THERMAL METRIC(1) DWE (SOIC) UNIT
16 PINS
RθJA Junction-to-ambient thermal resistance 56.8 °C/W
RθJC(top) Junction-to-case (top) thermal resistance 15.6 °C/W
RθJB Junction-to-board thermal resistance 28.5 °C/W
ΨJT Junction-to-top characterization parameter 2.4 °C/W
ΨJB Junction-to-board characterization parameter 28.5 °C/W
RθJC(bot) Junction-to-case (bottom) thermal resistance — °C/W

(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report.

7.5 Power Ratings


VCC = 5.5 V, IISO = 110 mA, TJ = 150°C, TA ≤ 80°C, CL = 15 pF, input a 50-MHz 50% duty-cycle square wave
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
PD Maximum power dissipation (both sides) 1.02 W
PD1 Maximum power dissipation (side-1) 0.51 W
PD2 Maximum power dissipation (side-2) 0.51 W

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7.6 Insulation Specifications


PARAMETER TEST CONDITIONS VALUE UNIT
GENERAL
CLR External clearance(1) Shortest terminal-to-terminal distance through air >8 mm
Shortest terminal-to-terminal distance across the
CPG External creepage(1) >8 mm
package surface
Minimum internal gap (internal clearance – capacitive
> 21
signal isolation)
DTI Distance through the insulation µm
Minimum internal gap (internal clearance –
>120
transformer power isolation)
CTI Comparative tracking index DIN EN 60112 (VDE 0303-11); IEC 60112 > 600 V
Material group According to IEC 60664-1 I
Rated mains voltage ≤ 300 VRMS I-IV
Overvoltage category per IEC 60664-1 Rated mains voltage ≤ 600 VRMS I-IV
Rated mains voltage ≤ 1000 VRMS I-III
DIN V VDE 0884-11:2017-01(2)
Maximum repetitive peak isolation
VIORM AC voltage (bipolar) 1414 VPK
voltage
AC voltage; Time dependent dielectric breakdown
1000 VRMS
VIOWM Maximum working isolation voltage (TDDB) Test; See Figure 10-5
DC voltage 1414 VDC
VTEST = VIOTM; t = 60 s (qualification);
VIOTM Maximum transient isolation voltage 7071 VPK
VTEST = 1.2 × VIOTM; t = 1 s (100% production)
Test method per IEC 62368-1, 1.2/50 µs waveform,
VIOSM Maximum surge isolation voltage(3) 6250 VPK
VTEST = 1.6 × VIOSM = 10000 VPK(qualification)
Method a, after input/output safety test subgroup 2/3,
Vini = VIOTM, tini = 60 s; ≤5
Vpd(m) = 1.2 × VIORM, tm = 10 s
Method a, after environmental tests subgroup 1,
≤5
qpd Apparent charge(4) Vini = VIOTM, tini = 60 s; Vpd(m) = 1.6 × VIORM, tm = 10 s pC
Method b1, at routine test (100% production) and
preconditioning (type test),
≤5
Vini = 1.2 × VIOTM, tini = 1 s;
Vpd(m) = 1.875 × VIORM, tm = 1 s
CIO Barrier capacitance, input to output(5) VIO = 0.4 × sin (2πft), f = 1 MHz ~3.5 pF
VIO = 500 V, TA = 25°C > 1012
RIO Insulation resistance(5) VIO = 500 V, 100°C ≤ TA ≤ 125°C > 1011 Ω
VIO = 500 V, TS = 150°C > 109
Pollution degree 2
Climatic category 40/125/21
UL 1577
VTEST = VISO(UL)= 5000 VRMS, t = 60 s (qualification),
VISO(UL) Withstand isolation voltage VTEST = 1.2 × VISO(UL) = 6000 VRMS, t = 1 s (100% 5000 VRMS
production)

(1) Creepage and clearance requirements should be applied according to the specific equipment isolation standards of an application.
Care should be taken to maintain the creepage and clearance distance of a board design to ensure that the mounting pads of the
isolator on the printed-circuit board do not reduce this distance. Creepage and clearance on a printed-circuit board become equal
in certain cases. Techniques such as inserting grooves, ribs, or both on a printed circuit board are used to help increase these
specifications.
(2) This coupler is suitable for safe electrical insulation only within the safety ratings. Compliance with the safety ratings shall be ensured
by means of suitable protective circuits.
(3) Testing is carried out in air or oil to determine the intrinsic surge immunity of the isolation barrier.
(4) Apparent charge is electrical discharge caused by a partial discharge (pd).
(5) All pins on each side of the barrier tied together creating a two-terminal device.

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7.7 Safety-Related Certifications


VDE CSA UL CQC TUV
Certified according to IEC Recognized under Certified according to EN
Certified according to DIN Certified according to
60950-1, IEC 62368-1, and IEC UL 1577 Component 61010-1:2010 and EN
V VDE V 0884-11:2017-01 GB 4943.1-2011
60601-1 Recognition Program 60950- 1:2006/A2:2013
Reinforced insulation per
CSA 60950-1-07+A1+A2, IEC
60950-1 2nd Ed.+A1+A2, CSA
Reinforced insulation; 62368-1-14 and IEC 62368-1 5000 VRMS Reinforced
Maximum transient 2nd Ed., 800 VRMS maximum insulation per EN 61010-
isolation voltage, 7071 working voltage (pollution Reinforced Insulation, 1:2010 up to working
VPK; degree 2, material group I); Altitude ≤ 5000 m, voltage of 600 VRMS;
Single protection, 5000
Maximum repetitive peak 2 MOPP (Means of Patient Tropical Climate, 700 5000 VRMS Reinforced
VRMS
isolation voltage, 1414 Protection) per CSA 60601-1:14 VRMS maximum working insulation per EN 60950-
VPK; and IEC 60601-1 Ed. 3+A1, 250 voltage; 1:2006/A2:2013 up to
Maximum surge isolation VRMS maximum working voltage; working voltage of 800
voltage, 6250 VPK Temperature rating is 90°C VRMS
for reinforced insulation and
125°C for basic insulation; see
certificate for details.
Certificate number: Master contract number: 220991 File number: E181974 Certificate number: Client ID number: 77311
40040142 CQC15001121716

7.8 Safety Limiting Values


Safety limiting intends to minimize potential damage to the isolation barrier upon failure of input or output circuitry.
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
RθJA = 56.8°C/W, VI = 5.5 V, TJ = 150°C,
400
TA = 25°C, see Figure 7-1
IS Safety input, output, or supply current(1) mA
RθJA = 56.8°C/W, VI = 3.6 V, TJ = 150°C,
611
TA = 25°C, see Figure 7-1
RθJA = 56.8°C/W, TJ = 150°C, TA = 25°C,
PS Safety input, output, or total power(1) 2200 mW
see Figure 7-2
TS Maximum safety temperature(1) 150 °C

(1) The maximum safety temperature, TS, has the same value as the maximum junction temperature, TJ, specified for the device. The
IS and PS parameters represent the safety current and safety power respectively. The maximum limits of IS and PS should not be
exceeded. These limits vary with the ambient temperature, TA.
The junction-to-air thermal resistance, RθJA, in the Section 7.4 table is that of a device installed on a high-K test board for leaded
surface-mount packages. Use the following equations to calculate the value for each parameter:
TJ = TA + RθJA × P, where P is the power dissipated in the device.
TJ(max) = TS = TA + RθJA × PS, where TJ(max) is the maximum allowed junction temperature.
PS = IS × VI, where VI is the maximum input voltage.

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7.9 Electrical Characteristics—5-V Input, 5-V Output


VCC = 5 V ±10%, SEL shorted to VISO (over recommended operating conditions, unless otherwise specified)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
External IISO = 0 to 50 mA 4.75 5.07 5.43
VISO Isolated supply voltage V
External IISO = 0 to 130 mA 4.5 5.07 5.43
VISO(LINE) DC line regulation IISO = 50 mA, VCC = 4.5 V to 5.5 V 2 mV/V
VISO(LOAD) DC load regulation IISO = 0 to 130 mA 1%
IISO = 130 mA, CLOAD = 0.1 µF || 10 µF;
Efficiency at maximum load
EFF VI = VSI (ISOW784x); VI = 0 V (ISOW784x 53%
current
with F suffix)
Positive-going UVLO threshold
VCC+(UVLO) 2.7 V
on VCC, VISO
Negative-going UVLO threshold
VCC–(UVLO) 2.1 V
on VCC, VISO
UVLO threshold hysteresis on
VHYS (UVLO) 0.2 V
VCC, VISO
VITH Input pin rising threshold 0.7 VSI
VITL Input pin falling threshold 0.3 VSI
Input pin threshold hysteresis
VI(HYS) 0.1 VSI
(INx)
IIL Low level input current VIL = 0 at INx or SEL –10 µA
IIH High level input current VIH = VSI (1) at INx or SEL 10 µA
VSO (1) –
VOH High level output voltage IO = –4 mA, see Figure 8-1 V – 0.2 V
0.4 SO
VOL Low level output voltage IO = 4 mA, see Figure 8-1 0.2 0.4 V
Common mode transient
CMTI VI = VSI or 0 V, VCM = 1000 V; see Figure 8-2 100 kV/us
immunity
DC current from supply under
ICC_SC VISO shorted to GND2 137 mA
short circuit on VISO
Output ripple on isolated supply 20-MHz bandwidth, CLOAD = 0.1 µF || 20 µF,
VISO(RIP) 100 mV
(pk-pk) IISO = 130 mA

(1) VSI = input side supply; VSO = output side supply

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7.10 Supply Current Characteristics—5-V Input, 5-V Output


VCC = 5 V ±10%, SEL shorted to VISO (over recommended operating conditions, unless otherwise specified)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
ISOW7840
No external ILOAD; VI = 0 V (ISOW7840);
23
VI = VSI (1) (ISOW7840 with F suffix)
No external ILOAD; VI = VSI (ISOW7840);
17
VI = 0 V (ISOW7840 with F suffix)
Current drawn from All channels switching with square wave clock input of 1 Mbps;
ICC 21 mA
supply CL = 15 pF, No external ILOAD
All channels switching with square wave clock input of 10 Mbps;
24
CL = 15 pF, No external ILOAD
All channels switching with square wave clock input of 100 Mbps;
56
CL = 15 pF, No external ILOAD
VI = 0 V (ISOW7840);
128
VI = VSI (ISOW7840 with F suffix)
VI = VSI (ISOW7840);
130
VI = 0 V (ISOW7840 with F suffix)
Current available to All channels switching with square wave clock input of 1 Mbps;
IISO(OUT) (2) 128 mA
isolated supply CL = 15 pF
All channels switching with square wave clock input of 10 Mbps;
127
CL = 15 pF
All channels switching with square wave clock input of 100 Mbps;
111
CL = 15 pF
ISOW7841
No external ILOAD; VI = 0 V (ISOW7841);
23
VI = VSI (1) (ISOW7841 with F suffix)
No external ILOAD; VI = VSI (ISOW7841);
17
VI = 0 V (ISOW7841 with F suffix)
Current drawn from All channels switching with square wave clock input of 1 Mbps;
ICC 20 mA
supply CL = 15 pF, No external ILOAD
All channels switching with square wave clock input of 10 Mbps;
24
CL = 15 pF, No external ILOAD
All channels switching with square wave clock input of 100 Mbps;
54
CL = 15 pF, No external ILOAD
VI = 0 V (ISOW7841); VI = VSI (ISOW7841 with F suffix) 128
VI = VSI (ISOW7841); VI = 0V (ISOW7841 with F suffix) 130
All channels switching with square wave clock input of 1 Mbps;
128
Current available to CL = 15 pF
IISO(OUT) (2) mA
isolated supply
All channels switching with square wave clock input of 10 Mbps;
127
CL = 15 pF
All channels switching with square wave clock input of 100 Mbps;
112
CL = 15 pF

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VCC = 5 V ±10%, SEL shorted to VISO (over recommended operating conditions, unless otherwise specified)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
ISOW7842
No external ILOAD; VI = 0 V (ISOW7842);
24
VI = VSI (1) (ISOW7842 with F suffix)
No external ILOAD; VI = VSI (ISOW7842);
18
VI = 0 V (ISOW7842 with F suffix)
Current drawn from All channels switching with square wave clock input of 1 Mbps;
ICC 21 mA
supply CL = 15 pF, No external ILOAD
All channels switching with square wave clock input of 10 Mbps;
24
CL = 15 pF, No external ILOAD
All channels switching with square wave clock input of 100 Mbps;
51
CL = 15 pF, No external ILOAD
VI = 0 V (ISOW7842);
126
VI = VSI (ISOW7842 with F suffix)
VI = VSI (ISOW7842);
130
VI = 0 V (ISOW7842 with F suffix)
Current available to All channels switching with square wave clock input of 1 Mbps;
IISO(OUT) (2) 128 mA
isolated supply CL = 15 pF
All channels switching with square wave clock input of 10 Mbps;
127
CL = 15 pF
All channels switching with square wave clock input of 100 Mbps;
116
CL = 15 pF
ISOW7843
No external ILOAD; VI = 0 V (ISOW7843);
25
VI = VSI (1) (ISOW7843 with F suffix)
No external ILOAD; VI = VSI (ISOW7843);
17
VI = 0 V (ISOW7843 with F suffix)
Current drawn from All channels switching with square wave clock input of 1 Mbps;
ICC 21 mA
supply CL = 15 pF, No external ILOAD
All channels switching with square wave clock input of 10 Mbps;
24
CL = 15 pF, No external ILOAD
All channels switching with square wave clock input of 100 Mbps;
48
CL = 15 pF, No external ILOAD
VI = 0 V (ISOW7843);
125
VI = VSI (ISOW7843 with F suffix)
VI = VSI (ISOW7843);
130
VI = 0 V (ISOW7843 with F suffix)
Current available to All channels switching with square wave clock input of 1 Mbps;
IISO(OUT) (2) 127 mA
isolated supply CL = 15 pF
All channels switching with square wave clock input of 10 Mbps;
126
CL = 15 pF
All channels switching with square wave clock input of 100 Mbps;
120
CL = 15 pF

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VCC = 5 V ±10%, SEL shorted to VISO (over recommended operating conditions, unless otherwise specified)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
ISOW7844
No external ILOAD; VI = 0 V (ISOW7844);
26
VI = VSI (1) (ISOW7844 with F suffix)
No external ILOAD; VI = VSI (ISOW7844);
17
VI = 0 V (ISOW7844 with F suffix)
Current drawn from All channels switching with square wave clock input of 1 Mbps;
ICC 22 mA
supply CL = 15 pF, No external ILOAD
All channels switching with square wave clock input of 10 Mbps;
24
CL = 15 pF, No external ILOAD
All channels switching with square wave clock input of 100 Mbps;
46
CL = 15 pF, No external ILOAD
VI = 0 V (ISOW7844);
123
VI = VSI (ISOW7844 with F suffix)
VI = VSI (ISOW7844);
130
VI = 0 V (ISOW7844 with F suffix)
Current available to All channels switching with square wave clock input of 1 Mbps;
IISO(OUT) (2) 126 mA
isolated supply CL = 15 pF
All channels switching with square wave clock input of 10 Mbps;
126
CL = 15 pF
All channels switching with square wave clock input of 100 Mbps;
126
CL = 15 pF

(1) VSI = input side supply; VSO = output side supply


(2) Current available to load should be derated by 2 mA/°C for TA > 80°C.

7.11 Electrical Characteristics—3.3-V Input, 5-V Output


VCC = 3.3 V ±10%, SEL shorted to VISO (over recommended operating conditions, unless otherwise specified)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
VISO Isolated supply voltage External IISO = 0 to 40 mA 4.5 5.07 5.43 V
VISO(LINE) DC line regulation IISO = 20 mA, VCC = 4.5 V to 5.5 V 2 mV/V
VISO(LOAD) DC load regulation IISO = 0 to 40 mA 1%
IISO = 40 mA, CLOAD = 0.1 µF || 10 µF;
Efficiency at maximum load
EFF VI = VSI (ISOW7841A-Q1); VI =0 V 42%
current
(ISOW7841A-Q1 with F suffix)
Positive-going UVLO threshold
VCC+(UVLO) 2.7 V
on VCC, VISO
Negative-going UVLO threshold
VCC–(UVLO) 2.1 V
on VCC, VISO
UVLO threshold hysteresis on
VHYS (UVLO) 0.2 V
VCC, VISO
VITH Input pin rising threshold 0.7 VSI
VITL Input pin falling threshold 0.3 VSI
Input pin threshold hysteresis
VI(HYS) 0.1 VSI
(INx)
IIL Low level input current VIL = 0 at INx or SEL –10 µA
IIH High level input current VIH = VSI (1) at INx or SEL 10 µA
VSO (1) –
VOH High level output voltage IO = –4 mA, see Figure 8-1 V – 0.2 V
0.4 SO
VOL Low level output voltage IO = 4 mA, seeFigure 8-1 0.2 0.4 V
Common mode transient
CMTI VI = VSI or 0 V, VCM = 1000 V; see Figure 8-2 100 kV/us
immunity

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PARAMETER TEST CONDITIONS MIN TYP MAX UNIT


DC current from supply under
ICC_SC VISO shorted to GND2 137 mA
short circuit on VISO
Output ripple on isolated supply 20-MHz bandwidth, CLOAD = 0.1 µF || 20 µF,
VISO(RIP) 90 mV
(pk-pk) IISO = 40 mA

(1) VSI = input side supply; VSO = output side supply

7.12 Supply Current Characteristics—3.3-V Input, 5-V Output


VCC = 3.3 V ±10%, SEL shorted to VISO (over recommended operating conditions, unless otherwise specified)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
ISOW7841
No external ILOAD; VI = 0 V (ISOW7841);
31
VI = VSI (1) (ISOW7841 with F suffix)
No external ILOAD; VI = VSI (ISOW7841);
24
VI = 0V (ISOW7841 with F suffix)
Current drawn from All channels switching with square wave clock input of 1 Mbps;
ICC 28 mA
supply CL = 15 pF, No external ILOAD
All channels switching with square wave clock input of 10 Mbps;
33
CL = 15 pF, No external ILOAD
All channels switching with square wave clock input of 100 Mbps;
80
CL = 15 pF, No external ILOAD
VI = 0 V (ISOW7841); VI = VSI (ISOW7841 with F suffix) 38
VI = VSI (ISOW7841); VI = 0V (ISOW7841 with F suffix) 40
All channels switching with square wave clock input of 1 Mbps;
38
((2)) Current available to CL = 15 pF
IISO(OUT) mA
isolated supply
All channels switching with square wave clock input of 10 Mbps;
37
CL = 15 pF
All channels switching with square wave clock input of 100 Mbps;
22
CL = 15 pF

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7.13 Electrical Characteristics—5-V Input, 3.3-V Output


VCC = 5 V ±10%, SEL shorted to GND2 (over recommended operating conditions, unless otherwise specified)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
External IISO = 0 to 50 mA 3.13 3.34 3.56
VISO Isolated supply voltage V
External IISO = 0 to 130 mA 3 3.34 3.56
VISO(LINE) DC line regulation IISO = 50 mA, VCC = 4.5 V to 5.5 V 2 mV/V
VISO(LOAD) DC load regulation IISO = 10 to 130 mA 1%
IISO = 130 mA, CLOAD = 0.1 µF || 10 µF;
Efficiency at maximum load
EFF VI = VSI (ISOW784x); VI = 0 V (ISOW784x 48%
current
with F suffix)
Positive-going UVLO threshold
VCC+(UVLO) 2.7 V
on VCC, VISO
Negative-going UVLO threshold
VCC–(UVLO) 2.1 V
on VCC, VISO
UVLO threshold hysteresis on
VHYS (UVLO) 0.2 V
VCC, VISO
VITH Input pin rising threshold 0.7 VSI
VITL Input pin falling threshold 0.3 VSI
Input pin threshold hysteresis
VI(HYS) 0.1 VSI
(INx)
IIL Low level input current VIL = 0 at INx or SEL –10 µA
IIH High level input current VIH = VSI (1) at INx or SEL 10 µA
VSO (1) –
VOH High level output voltage IO = –2 mA, see Figure 8-1 VSO – 0.1 V
0.3
VOL Low level output voltage IO = 2 mA, see Figure 8-1 0.1 0.3 V
Common mode transient VI = VSI or 0 V, VCM = 1000 V; see Figure
CMTI 100 kV/us
immunity 8-2
DC current from supply under
ICC_SC VISO shorted to GND2 137 mA
short circuit on VISO
Output ripple on isolated supply 20-MHz bandwidth, CLOAD = 0.1 µF || 20 µF,
VISO(RIP) 100 mV
(pk-pk) IISO = 130 mA

(1) VSI = input side supply; VSO = output side supply

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7.14 Supply Current Characteristics—5-V Input, 3.3-V Output


VCC = 5 V ±10%, SEL shorted to GND2 (over recommended operating conditions, unless otherwise specified)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
ISOW7840
No external ILOAD; VI = 0 V (ISOW7840);
20
VI = VSI (1) (ISOW7840 with F suffix)
No external ILOAD; VI = VSI (ISOW7840);
15
VI = 0 V (ISOW7840 with F suffix)
Current drawn from All channels switching with square wave clock input of 1 Mbps;
ICC 17 mA
supply CL = 15 pF, No external ILOAD
All channels switching with square wave clock input of 10 Mbps;
19
CL = 15 pF, No external ILOAD
All channels switching with square wave clock input of 100 Mbps;
39
CL = 15 pF, No external ILOAD
VI = 0 V (ISOW7840);
128
VI = VSI (ISOW7840 with F suffix)
VI = VSI (ISOW7840);
130
VI = 0 V (ISOW7840 with F suffix)
Current available to All channels switching with square wave clock input of 1 Mbps;
IISO(OUT) (2) 129 mA
isolated supply CL = 15 pF
All channels switching with square wave clock input of 10 Mbps;
128
CL = 15 pF
All channels switching with square wave clock input of 100 Mbps;
116
CL = 15 pF
ISOW7841
No external ILOAD; VI = 0 V (ISOW7841);
20
VI = VSI (1) (ISOW7841 with F suffix)
No external ILOAD; VI = VSI (ISOW7841);
14
VI = 0 V (ISOW7841 with F suffix)
Current drawn from All channels switching with square wave clock input of 1 Mbps;
ICC 17 mA
supply CL = 15 pF, No external ILOAD
All channels switching with square wave clock input of 10 Mbps;
20
CL = 15 pF, No external ILOAD
All channels switching with square wave clock input of 100 Mbps;
40
CL = 15 pF, No external ILOAD
VI = 0 V (ISOW7841); VI = VSI (ISOW7841 with F suffix) 128
VI = VSI (ISOW7841); VI = 0 V (ISOW7841 with F suffix) 130
All channels switching with square wave clock input of 1 Mbps;
129
Current available to CL= 15 pF
IISO(OUT) (2) mA
isolated supply
All channels switching with square wave clock input of 10 Mbps;
128
CL = 15 pF
All channels switching with square wave clock input of 100 Mbps;
118
CL = 15 pF

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VCC = 5 V ±10%, SEL shorted to GND2 (over recommended operating conditions, unless otherwise specified)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
ISOW7842
No external ILOAD; VI = 0 V (ISOW7842);
20
VI = VSI (1) (ISOW7842 with F suffix)
No external ILOAD; VI = VSI (ISOW7842);
15
VI = 0 V (ISOW7842 with F suffix)
Current drawn from All channels switching with square wave clock input of 1 Mbps;
ICC 18 mA
supply CL = 15 pF, No external ILOAD
All channels switching with square wave clock input of 10 Mbps;
20
CL = 15 pF, No external ILOAD
All channels switching with square wave clock input of 100 Mbps;
39
CL = 15 pF, No external ILOAD
VI = 0 V (ISOW7842); VI = VSI (ISOW7842 with F suffix) 126
VI = VSI (ISOW7842); VI = 0V (ISOW7842 with F suffix) 130
All channels switching with square wave clock input of 1 Mbps;
128
(2) Current available to CL = 15 pF
IISO(OUT) mA
isolated supply
All channels switching with square wave clock input of 10 Mbps;
127
CL = 15 pF
All channels switching with square wave clock input of 100 Mbps;
119
CL = 15 pF
ISOW7843
No external ILOAD; VI = 0 V (ISOW7843);
20
VI = VSI (1) (ISOW7843 with F suffix)
No external ILOAD; VI = VSI (ISOW7843);
14
VI = 0 V (ISOW7843 with F suffix)
Current drawn from All channels switching with square wave clock input of 1 Mbps;
ICC 18 mA
supply CL = 15 pF, No external ILOAD
All channels switching with square wave clock input of 10 Mbps;
20
CL = 15 pF, No external ILOAD
All channels switching with square wave clock input of 100 Mbps;
39
CL = 15 pF, No external ILOAD
VI = 0 V (ISOW7843);
125
VI = VSI (ISOW7843 with F suffix)
VI = VSI (ISOW7843);
130
VI = 0 V (ISOW7843 with F suffix)
Current available to All channels switching with square wave clock input of 1 Mbps;
IISO(OUT) (2) 127 mA
isolated supply CL = 15 pF
All channels switching with square wave clock input of 10 Mbps;
127
CL = 15 pF
All channels switching with square wave clock input of 100 Mbps;
123
CL = 15 pF

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VCC = 5 V ±10%, SEL shorted to GND2 (over recommended operating conditions, unless otherwise specified)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
ISOW7844
No external ILOAD; VI = 0 V (ISOW7844);
21
VI = VSI (1) (ISOW7844 with F suffix)
No external ILOAD; VI = VSI (ISOW7844);
15
VI = 0 V (ISOW7844 with F suffix)
Current drawn from All channels switching with square wave clock input of 1 Mbps;
ICC 18 mA
supply CL = 15 pF, No external ILOAD
All channels switching with square wave clock input of 10 Mbps;
20
CL = 15 pF, No external ILOAD
All channels switching with square wave clock input of 100 Mbps;
41
CL = 15 pF, No external ILOAD
VI = 0 V (ISOW7844); VI = VSI (ISOW7844 with F suffix) 123
VI = VSI (ISOW7844); VI = 0 V (ISOW7844 with F suffix) 130
All channels switching with square wave clock input of 1 Mbps;
126
(2) Current available to CL = 15 pF
IISO(OUT) mA
isolated supply
All channels switching with square wave clock input of 10 Mbps;
126
CL = 15 pF
All channels switching with square wave clock input of 100 Mbps;
126
CL = 15 pF

(1) VSI = input side supply; VSO = output side supply


(2) Current available to load should be derated by 2 mA/°C for TA > 105°C.

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7.15 Electrical Characteristics—3.3-V Input, 3.3-V Output


VCC = 3.3 V ±10%, SEL shorted to GND2 (over recommended operating conditions, unless otherwise specified)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
External IISO = 0 to 30 mA 3.13 3.34 3.58
VISO Isolated supply voltage V
External IISO = 0 to 75 mA 3 3.34 3.58
VISO(LINE) DC line regulation IISO = 30 mA, VCC = 3 V to 3.6 V 2 mV/V
VISO(LOAD) DC load regulation IISO = 0 to 75 mA 1%
IISO = 75 mA, CLOAD = 0.1 µF || 10 µF;
Efficiency at maximum load
EFF VI = VSI (ISOW784x); VI = 0 V (ISOW784x with 47%
current
F suffix)
Positive-going UVLO threshold
VCC+(UVLO) 2.7 V
on VCC, VISO
Negative-going UVLO threshold
VCC–(UVLO) 2.1 V
on VCC, VISO
UVLO threshold hysteresis on
VHYS (UVLO) 0.2 V
VCC, VISO
VITH Input pin rising threshold 0.7 VSI
VITL Input pin falling threshold 0.3 VSI
Input pin threshold hysteresis
VI(HYS) 0.1 VSI
(INx)
IIL Low level input current VIL = 0 at INx or SEL –10 µA
IIH High level input current VIH = VSI (1) at INx or SEL 10 µA
VSO (1) – VSO –
VOH High level output voltage IO = –2 mA, see Figure 8-1 V
0.3 0.1
VOL Low level output voltage IO = 2 mA, see Figure 8-1 0.1 0.3 V
Common mode transient
CMTI VI = VSI or 0 V, VCM = 1000 V; see Figure 8-2 100 kV/us
immunity
DC current from supply under
ICC_SC VISO shorted to GND2 143 mA
short circuit on VISO
Output ripple on isolated supply 20-MHz bandwidth, CLOAD = 0.1 µF || 20 µF, IISO
VISO(RIP) 90 mV
(pk-pk) = 75 mA

(1) VSI= input side supply; VSO = output side supply

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7.16 Supply Current Characteristics—3.3-V Input, 3.3-V Output


VCC = 3.3 V ±10%, SEL shorted to GND2 (over recommended operating conditions, unless otherwise specified)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
ISOW7840
No external ILOAD; VI = 0 V (ISOW7840);
26
VI = VSI (1) (ISOW7840 with F suffix)
No external ILOAD; VI = VSI (ISOW7840);
20
VI = 0 V (ISOW7840 with F suffix)
Current drawn from All channels switching with square wave clock input of 1 Mbps;
ICC 23 mA
supply CL = 15 pF, No external ILOAD
All channels switching with square wave clock input of 10 Mbps;
26
CL = 15 pF, No external ILOAD
All channels switching with square wave clock input of 100 Mbps;
54
CL = 15 pF, No external ILOAD
VI = 0 V (ISOW7840);
73
VI = VSI (ISOW7840 with F suffix)
VI = VSI (ISOW7840);
75
VI = 0 V (ISOW7840 with F suffix)
Current available to All channels switching with square wave clock input of 1 Mbps;
IISO(OUT) (2) 74 mA
isolated supply CL = 15 pF
All channels switching with square wave clock input of 10 Mbps;
73
CL = 15 pF
All channels switching with square wave clock input of 100 Mbps;
61
CL = 15 pF
ISOW7841
No external ILOAD; VI = 0 V (ISOW7841);
26
VI = VSI (1) (ISOW7841 with F suffix)
No external ILOAD; VI = VSI (ISOW7841);
20
VI = 0 V (ISOW7841 with F suffix)
Current drawn from All channels switching with square wave clock input of 1 Mbps;
ICC 23 mA
supply CL = 15 pF, No external ILOAD
All channels switching with square wave clock input of 10 Mbps;
26
CL = 15 pF, No external ILOAD
All channels switching with square wave clock input of 100 Mbps;
53
CL = 15 pF, No external ILOAD
VI = 0 V (ISOW7841);
73
VI = VSI (ISOW7841 with F suffix)
VI = VSI(ISOW7841);
75
VI = 0 V (ISOW7841 with F suffix)
Current available to All channels switching with square wave clock input of 1 Mbps;
IISO(OUT) (2) 74 mA
isolated supply CL = 15 pF
All channels switching with square wave clock input of 10 Mbps;
73
CL = 15 pF
All channels switching with square wave clock input of 100 Mbps;
61
CL = 15 pF

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VCC = 3.3 V ±10%, SEL shorted to GND2 (over recommended operating conditions, unless otherwise specified)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
ISOW7842
No external ILOAD; VI = 0 V (ISOW7842);
28
VI = VSI (1) (ISOW7842 with F suffix)
No external ILOAD; VI = VSI (ISOW7842);
20
VI = 0 V (ISOW7842 with F suffix)
Current drawn from All channels switching with square wave clock input of 1 Mbps;
ICC 24 mA
supply CL = 15 pF, No external ILOAD
All channels switching with square wave clock input of 10 Mbps;
26
CL = 15 pF, No external ILOAD
All channels switching with square wave clock input of 100 Mbps;
49
CL = 15 pF, No external ILOAD
VI = 0 V (ISOW7842);
71
VI = VSI (ISOW7842 with F suffix)
VI = VSI (ISOW7842);
75
VI= 0 V (ISOW7842 with F suffix)
Current available to All channels switching with square wave clock input of 1 Mbps;
IISO(OUT) (2) 73 mA
isolated supply CL = 15 pF
All channels switching with square wave clock input of 10 Mbps;
72
CL = 15 pF
All channels switching with square wave clock input of 100 Mbps;
64
CL = 15 pF
ISOW7843
No external ILOAD; VI = 0 V (ISOW7843);
28
VI = VSI (1) (ISOW7843 with F suffix)
No external ILOAD; VI = VSI (ISOW7843);
19
VI = 0 V (ISOW7843 with F suffix)
Current drawn from All channels switching with square wave clock input of 1 Mbps;
ICC 24 mA
supply CL = 15 pF, No external ILOAD
All channels switching with square wave clock input of 10 Mbps;
26
CL = 15 pF, No external ILOAD
All channels switching with square wave clock input of 100 Mbps;
45
CL = 15 pF, No external ILOAD
VI = 0 V (ISOW7843);
70
VI = VSI (ISOW7843 with F suffix)
VI = VSI (ISOW7843);
75
VI = 0 V (ISOW7843 with F suffix)
Current available to All channels switching with square wave clock input of 1 Mbps;
IISO(OUT) (2) 72 mA
isolated supply CL = 15 pF
All channels switching with square wave clock input of 10 Mbps;
72
CL = 15 pF
All channels switching with square wave clock input of 100 Mbps;
68
CL = 15 pF

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VCC = 3.3 V ±10%, SEL shorted to GND2 (over recommended operating conditions, unless otherwise specified)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
ISOW7844
No external ILOAD; VI = 0 V (ISOW7844);
30
VI = VSI (1) (ISOW7844 with F suffix)
No external ILOAD; VI = VSI (ISOW7844);
19
VI = 0 V (ISOW7844 with F suffix)
Current drawn from All channels switching with square wave clock input of 1 Mbps;
ICC 25 mA
supply CL = 15 pF, No external ILOAD
All channels switching with square wave clock input of 10 Mbps;
26
CL = 15 pF, No external ILOAD
All channels switching with square wave clock input of 100 Mbps;
42
CL = 15 pF, No external ILOAD
VI = 0 V (ISOW7844);
68
VI = VSI (ISOW7844 with F suffix)
VI = VSI (ISOW7844);
75
VI = 0 V (ISOW7844 with F suffix)
Current available to All channels switching with square wave clock input of 1 Mbps;
IISO(OUT) (2) 71 mA
isolated supply CL = 15 pF
All channels switching with square wave clock input of 10 Mbps;
71
CL = 15 pF
All channels switching with square wave clock input of 100 Mbps;
71
CL = 15 pF

(1) VSI = input side supply; VSO = output side supply


(2) Current available to load should be derated by 2 mA/°C for TA > 115°C.

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7.17 Switching Characteristics—5-V Input, 5-V Output


VCC = 5 V ±10%, SEL shorted to VISO (over recommended operating conditions, unless otherwise specified)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
tPLH, tPHL Propagation delay time See Figure 8-1 13 17.6 ns
PWD Pulse width distortion(1) |tPHL – tPLH| 0.6 4.7 ns
tSK(o) Channel-channel output skew time(2) Same-direction channels 2.5 ns
tSK(p-p) Part-part skew time(3) 4.5 ns
tr, tf Output signal rise and fall times 2 4 ns

(1) Also known as pulse skew.


(2) tsk(o) is the skew between outputs of a single device with all driving inputs connected together and the outputs switching in the same
direction while driving identical loads.
(3) tsk(pp) is the magnitude of the difference in propagation delay times between any terminals of different devices switching in the same
direction while operating at identical supply voltages, temperature, input signals and loads.

7.18 Switching Characteristics—3.3-V Input, 5-V Output


VCC = 3.3 V ±10%, SEL shorted to VISO (over recommended operating conditions, unless otherwise specified)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
tPLH, tPHL Propagation delay time See Figure 8-1 13.5 19.6 ns
PWD Pulse width distortion(1) |tPHL – tPLH| 0.6 4.7 ns
tSK(o) Channel-channel output skew time(2) Same-direction channels 2.5 ns
tSK(p-p) Part-part skew time(3) 4.5 ns
tr, tf Output signal rise and fall times 2 4 ns

(1) Also known as pulse skew.


(2) tsk(o) is the skew between outputs of a single device with all driving inputs connected together and the outputs switching in the same
direction while driving identical loads.
(3) tsk(pp) is the magnitude of the difference in propagation delay times between any terminals of different devices switching in the same
direction while operating at identical supply voltages, temperature, input signals and loads.

7.19 Switching Characteristics—5-V Input, 3.3-V Output


VCC = 5 V ±10%, SEL shorted to GND2 (over recommended operating conditions, unless otherwise specified)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
tPLH, tPHL Propagation delay time See Figure 8-1 14 19.7 ns
PWD Pulse width distortion(1) |tPHL – tPLH| 0.6 4.4 ns
tSK(o) Channel-channel output skew time(2) Same-direction channels 2 ns
tSK(p-p) Part-part skew time(3) 4.5 ns
tr, tf Output signal rise and fall times 1 4 ns

(1) Also known as pulse skew.


(2) tsk(o) is the skew between outputs of a single device with all driving inputs connected together and the outputs switching in the same
direction while driving identical loads.
(3) tsk(pp) is the magnitude of the difference in propagation delay times between any terminals of different devices switching in the same
direction while operating at identical supply voltages, temperature, input signals and loads.

7.20 Switching Characteristics—3.3-V Input, 3.3-V Output


VCC = 3.3 V ±10%, SEL shorted to GND2 (over recommended operating conditions, unless otherwise specified)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
tPLH, tPHL Propagation delay time See Figure 8-1 14.5 20.2 ns
PWD Pulse width distortion(1) |tPHL – tPLH| 0.6 4.4 ns
tSK(o) Channel-channel output skew time(2) Same-direction channels 2.2 ns
tSK(p-p) Part-part skew time(3) 4.5 ns

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VCC = 3.3 V ±10%, SEL shorted to GND2 (over recommended operating conditions, unless otherwise specified)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
tr, tf Output signal rise and fall times 1 3 ns

(1) Also known as pulse skew.


(2) tsk(o) is the skew between outputs of a single device with all driving inputs connected together and the outputs switching in the same
direction while driving identical loads.
(3) tsk(pp) is the magnitude of the difference in propagation delay times between any terminals of different devices switching in the same
direction while operating at identical supply voltages, temperature, input signals and loads.

7.21 Insulation Characteristics Curves

700 2500
VCC = 3.6 V
600 VCC = 5.5 V
2000
Safety Limiting Current (mA)

Safety Limiting Power (mW)


500

1500
400

300 1000

200
500
100

0 0
0 20 40 60 80 100 120 140 160 0 50 100 150 200
Ambient Temperature (qC) Ambient Temperature (qC) D002
D001

Figure 7-1. Thermal Derating Curve for Safety Figure 7-2. Thermal Derating Curve for Safety
Limiting Current per VDE Limiting Power per VDE

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7.22 Typical Characteristics

3.45 5.2
VCC = 3.3 V
3.43 VCC = 5 V
3.41
5.15
3.39
Output Voltage (V)

Output Voltage (V)


3.37
3.35 5.1
3.33
3.31
5.05
3.29
3.27
3.25 5
0 20 40 60 80 100 120 140 0 20 40 60 80 100 120 140
Load Current (mA) Load Current (mA)
VISO = 3.3 V TA = 25°C VISO = 5 V TA = 25°C

Figure 7-3. Isolated Supply Voltage (VISO) vs Load Figure 7-4. Isolated Supply Voltage (VISO) vs Load
Current (IISO) Current (IISO)
300 100
275 VCC = 3.3 V, V ISO = 3.3 V VCC = 3.3 V, V ISO = 3.3 V
VCC = 5 V, V ISO = 3.3 V 90 VCC = 5 V, V ISO = 3.3 V
250 VCC = 5 V, V ISO = 5 V VCC = 5 V, V ISO = 5 V
80
Input Supply Current (mA)

225 VCC = 3.3 V, V ISO = 5 V VCC = 3.3 V, V ISO = 5 V


70
200
Efficiency (%)

175 60
150 50
125 40
100
30
75
20
50
25 10
0 0
0 20 40 60 80 100 120 140 160 0 20 40 60 80 100 120 140
Load Current (mA) Load Current (mA)
TA = 25°C TA = 25°C

Figure 7-5. ISOW7841 Supply Current (ICC) vs Load Figure 7-6. ISOW7841 Efficiency vs Load Current
Current (IISO) (IISO)
640 3.4
Isolated Output Power Supply Voltage (V)

VCC = 3.3 V, V ISO = 3.3 V


560 VCC = 5 V, V ISO = 3.3 V
VCC = 5 V, V ISO = 5 V
VCC = 3.3 V, V ISO = 5 V
Power Dissipation (mW)

480 3.35

400

320 3.3
240

160
3.25
80

0
0 20 40 60 80 100 120 140 3.2
Load Current (mA) -40 -20 0 20 40 60 80 100 120
Free-Air Temperature (qC) D008
TA = 25°C
No IISO load VCC = 5 V VISO = 3.3 V
Figure 7-7. ISOW7841 Power Dissipation vs Load
Current (IISO) Figure 7-8. 3.3-V Isolated Supply Voltage (VISO) vs
Free-Air Temperature

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5.14 130 800


Isolated Output Power Supply Voltage (V)

125 700

Short-Circuit Supply Current (mA)

Short-Circuit Power (mW)


5.09
120 600

115 500
5.04
110 400

105 300
4.99
100 200

95 Short-circuit Supply Current 100


4.94
-40 -20 0 20 40 60 80 100 120 Short-circuit Power
Free-Air Temperature (qC) 90 0
3 3.2 3.4 3.6 3.8 4 4.2 4.4 4.6 4.8 5 5.2 5.4
No IISO load VCC = 5 V VISO = 5 V Input Supply Voltage (V)
Figure 7-9. 5-V Isolated Supply Voltage (VISO) vs VISO shorted to GND2 TA = 25°C
Free-Air Temperature Figure 7-10. Short-Circuit Supply Current (ICC) and
Power (P) vs Supply Voltage (VCC)
70 40

60 35

30
50
Supply Current (mA)

Supply Current (mA)

25
40
20
30
15
20
10
ICC at VCC = 3.3 V, VISO = 3.3 V ICC at VCC = 3.3 V, VISO = 3.3 V
10 ICC at VCC = 5 V, VISO = 3.3 V 5 ICC at VCC = 5 V, VISO = 3.3 V
ICC at VCC = 5 V, VISO = 5 V ICC at VCC = 5 V, VISO = 5 V
0 0
0 25 50 75 100 0 25 50 75 100
Data Rate (Mbps) D022
Data Rate (Mbps) D023

CL = 15 pF TA = 25°C No IISO load CL = no load TA = 25°C No IISO load

Figure 7-11. ISOW7840 Supply Current vs Data Figure 7-12. ISOW7840 Supply Current vs Data
Rate Rate
120 80
110 ICC (mA) at VCC = 5 V, V ISO = 5 V ICC (mA) at VCC = 5 V, V ISO = 5 V
ICC (mA) at VCC = 5 V, V ISO = 3.3 V 70 ICC (mA) at VCC = 5 V, V ISO = 3.3 V
100 ICC (mA) at VCC = 3.3 V, V ISO = 3.3 V ICC (mA) at VCC = 3.3 V, VISO = 3.3 V
90 ICC (mA) at VCC = 3.3 V, V ISO = 5 V 60 ICC (mA) at VCC = 3.3 V, VISO = 5 V
Supply Current (mA)
Supply current (mA)

80
50
70
60 40
50
30
40
30 20
20
10
10
0 0
0 25 50 75 100 0 25 50 75 100
Data Rate (Mbps) Data Rate (Mbps)
CL = 15 pF TA = 25°C No IISO load CL = no load TA = 25°C No IISO load

Figure 7-13. ISOW7841 Supply Current vs Data Figure 7-14. ISOW7841 Supply Current vs Data
Rate Rate

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60 40

35
50
30
Supply Current (mA)

Supply Current (mA)


40
25

30 20

15
20
10
10 ICC at VCC = 3.3 V, VISO = 3.3 V ICC at VCC = 3.3 V, VISO = 3.3 V
ICC at VCC = 5 V, VISO = 3.3 V 5 ICC at VCC = 5 V, VISO = 3.3 V
ICC at VCC = 5 V, VISO = 5 V ICC at VCC = 5 V, VISO = 5 V
0 0
0 25 50 75 100 0 25 50 75 100
Data Rate (Mbps) D021
Data Rate (Mbps) D020

CL = 15 pF TA = 25°C No IISO load CL = no load TA = 25°C No IISO load

Figure 7-15. ISOW7842 Supply Current vs Data Figure 7-16. ISOW7842 Supply Current vs Data
Rate Rate
60 40

35
50
30
Supply Current (mA)

Supply Current (mA)


40
25

30 20

15
20
10
10 ICC at VCC = 3.3 V, VISO = 3.3 V ICC at VCC = 3.3 V, VISO = 3.3 V
ICC at VCC = 5 V, VISO = 3.3 V 5 ICC at VCC = 5 V, VISO = 3.3 V
ICC at VCC = 5 V, VISO = 5 V ICC at VCC = 5 V, VISO = 5 V
0 0
0 25 50 75 100 0 25 50 75 100
Data Rate (Mbps) D024
Data Rate (Mbps) D025

CL = 15 pF TA = 25°C No IISO load CL = no load TA = 25°C No IISO load

Figure 7-17. ISOW7843 Supply Current vs Data Figure 7-18. ISOW7843 Supply Current vs Data
Rate Rate
50 40
45 35
40
30
Supply Current (mA)

Supply Current (mA)

35
30 25

25 20
20 15
15
10
10 ICC at VCC = 3.3 V, VISO = 3.3 V ICC at VCC = 3.3 V, VISO = 3.3 V
5 ICC at VCC = 5 V, VISO = 3.3 V 5 ICC at VCC = 5 V, VISO = 3.3 V
ICC at VCC = 5 V, VISO = 5 V ICC at VCC = 5 V, VISO = 5 V
0 0
0 25 50 75 100 0 25 50 75 100
Data Rate (Mbps) D018
Data Rate (Mbps) D019

CL = 15 pF TA = 25°C No IISO load CL = no load TA = 25°C No IISO load

Figure 7-19. ISOW7844 Supply Current vs Data Figure 7-20. ISOW7844 Supply Current vs Data
Rate Rate

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2.6 20

18
Power Supply UVLO Threshold (V)

2.5

Propogation Delay Time (ns)


16

2.4 14

12
tPLH(ns) at VCC = 5 V, V ISO = 5 V
2.3 10 tPHL(ns) at VCC = 5 V, V ISO = 5 V
tPLH(ns) at VCC = 5 V, V ISO = 3.3 V
8 tPHL(ns) at VCC = 5 V, V ISO = 3.3 V
2.2 tPLH(ns) at VCC = 3.3 V, VISO = 3.3 V
6 tPHL(ns) at VCC = 3.3 V, VISO = 3.3 V
tPLH(ns) at VCC = 3.3 V, VISO = 5 V
2.1 4 tPHL(ns) at VCC = 3.3 V, VISO = 5 V
VCC Rising
VCC Falling 2
2 -40 -20 0 20 40 60 80 100 120 140
-40 -20 0 20 40 60 80 100 120 Free Air Temperature (°C)
Free-Air Temperature (qC)
Figure 7-22. Propagation Delay Time vs Free-Air
Figure 7-21. Power-Supply Undervoltage Temperature
Threshold vs Free Air Temperature
6 0.9

0.8
5
High-Level Output Voltage (V)

Low-Level Output Voltage (V)


0.7

4 0.6

0.5
3
0.4

2 0.3

0.2
1
VSO = 3.3 V 0.1 VSO = 3.3 V
VSO = 5 V VSO = 5 V
0 0
-15 -10 -5 0 0 5 10 15
High-Level Output Current (mA) Low-Level Output Current (mA) D016
D015

TA = 25°C TA = 25°C

Figure 7-23. High-Level Output Voltage vs High- Figure 7-24. Low-Level Output Voltage vs Low-
Level Output Current Level Output Current

VISO = 3.3 V (50 mV/div)(1) ICC (40 mA/div)

110 mA IISO VISO = 3.3 V (1 V/div)

10 mA 10 mA

100 µs/div 2 ms/div

VCC = 5 V VISO = 3.3 V VCC = 5 V VISO = 3.3 V


Negligible undershoot and overshoot because of load Current spike is because of charging the input supply
transient capacitor

Figure 7-25. 10-mA to 110-mA Load Transient Figure 7-26. Soft Start at 10-mA Load
Response

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ICC (40 mA/div)


ICC (40 mA/div)

VISO = 5 V (1 V/div)
VISO = 3.3 V (1 V/div)

2 ms/div 2 ms/div

VCC = 5 V VISO = 3.3 V VCC = 5 V VISO = 5 V


Input current spike is because of charging the input supply Input current spike is because of charging the input supply
decoupling capacitor decoupling capacitor

Figure 7-27. Soft Start at 120-mA Load Figure 7-28. Soft Start at 10-mA Load

ICC (40 mA/div)

VISO = 5 V (20 mV/div)

20 mV

VISO = 5 V (1 V/div)

2 ms/div 5 µs/div

VCC = 5 V VISO = 5 V VCC = 5 V VISO = 5 V


Input current spike is because of charging the input supply Figure 7-30. VISO Ripple Voltage at 130 mA
decoupling capacitor

Figure 7-29. Soft Start at 130-mA Load

VISO = 3.3 V (20 mV/div)


20 mV

5 µs/div

VCC = 5 V VISO = 3.3 V

Figure 7-31. VISO Ripple Voltage at 130 mA

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8 Parameter Measurement Information

VSI

Isolation Barrier
VI 50% 50%
IN OUT
0V
tPLH tPHL
Input Generator CL
(See Note A) VI 50 VO See Note B VOH
50% 90% 50%
VO
10%
VOL
tr tf

The input pulse is supplied by a generator having the following characteristics: PRR ≤ 50 kHz, 50% duty cycle, tr ≤ 3 ns, tf ≤ 3 ns, ZO =
50 Ω. At the input, 50-Ω resistor is required to terminate the input generator signal. The resistor is not required in the actual application.
CL = 15 pF and includes instrumentation and fixture capacitance within ±20%.

Figure 8-1. Switching Characteristics Test Circuit and Voltage Waveforms

5V
5V
VSO
VSI 10 …F || 0.1 µF
10 …F 0.1 …F C3 C4
GNDI

OUT
IN CL

GNDI GNDO

+ ±
VCM

CL = 15 pF and includes instrumentation and fixture capacitance within ±20%.


Pass-fail criteria: Outputs must remain stable.

Figure 8-2. Common-Mode Transient Immunity Test Circuit

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9 Detailed Description
9.1 Overview
The ISOW784x family of devices has a high-efficiency, low-emissions isolated DC-DC converter, and four
high-speed isolated data channels. Figure 9-1 shows the functional block diagram of the ISOW784x family of
devices.
The integrated DC-DC converter uses switched mode operation and proprietary circuit techniques to reduce
power losses and boost efficiency. Specialized control mechanisms, clocking schemes, and the use of a high-Q
on-chip transformer provide high efficiency and low radiated emissions. The integrated transformer uses thin film
polymer as the insulation barrier.
The VCC supply is provided to the primary power controller that switches the power stage connected to the
integrated transformer. Power is transferred to the secondary side, rectified and regulated to either 3.3 V or 5
V, depending on the SEL pin. The output voltage, VISO, is monitored and feedback information is conveyed to
the primary side through a dedicated isolation channel. The duty cycle of the primary switching stage is adjusted
accordingly. The fast feedback control loop of the power converter ensures low overshoots and undershoots
during load transients. Undervoltage lockout (UVLO) with hysteresis is integrated on the VCC and VISO supplies
which ensures robust system performance under noisy conditions. An integrated soft-start mechanism ensures
controlled inrush current and avoids any overshoot on the output during power up.
The integrated signal-isolation channels employ an ON-OFF keying (OOK) modulation scheme to transmit the
digital data across a silicon-dioxide based isolation barrier. The transmitter sends a high-frequency carrier
across the barrier to represent one state and sends no signal to represent the other state. The receiver
demodulates the signal after signal conditioning and produces the output through a buffer stage. The signal-
isolation channels incorporate advanced circuit techniques to maximize the CMTI performance and minimize the
radiated emissions from the high frequency carrier and IO buffer switching. Figure 9-2 shows a functional block
diagram of a typical signal isolation channel.
The ISOW784x family of devices is suitable for applications that have limited board space and require more
integration. This family of devices is also suitable for very-high voltage applications, where power transformers
meeting the required isolation specifications are bulky and expensive.

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9.2 Functional Block Diagram

Transformer

VCC

Power VISO
Transformer Rectifier
Controller Driver

UVLO, Soft-start
Thermal
Shutdown,
UVLO, Soft-start

FB Channel (Rx) FB Channel (Tx) FB Controller


Vref

I/O Channels I/O Channels


Data Channels Data Channels
(4) (4)

Isolation Barrier

Figure 9-1. Block Diagram

Transmitter Receiver

OOK
Modulation
TX IN SiO2 based
TX Signal Capacitive RX Signal Envelope RX OUT
Conditioning Isolation Conditioning Detection
Barrier

Emissions
Oscillator Reduction
Techniques

Figure 9-2. Conceptual Block Diagram of a Capacitive Data Channel

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Figure 9-3 shows a conceptual detail of how the OOK scheme works.

TX IN

Carrier signal through


isolation barrier

RX OUT

Figure 9-3. On-Off Keying (OOK) Based Modulation Scheme

9.3 Feature Description


Table 9-1 shows an overview of the device features.
Table 9-1. Device Features
DEFAULT OUTPUT
PART NUMBER(1) CHANNEL DIRECTION MAXIMUM DATA RATE RATED ISOLATION(2)
STATE
ISOW7840 High
4 forward, 0 reverse
ISOW7840F Low
ISOW7841 High
3 forward, 1 reverse
ISOW7841F Low
ISOW7842 High
2 forward, 2 reverse 100 Mbps 5 kVRMS / 7071 VPK
ISOW7842F Low
ISOW7843 High
1 forward, 3 reverse
ISOW7843F Low
ISOW7844 High
0 forward, 4 reverse
ISOW7844F Low

(1) The F suffix is part of the orderable part number. See the Section 14 section for the full orderable part number.
(2) For detailed isolation ratings, see the Section 7.7 table.

9.3.1 Electromagnetic Compatibility (EMC) Considerations


The ISOW784x family of devices uses emissions reduction schemes for the internal oscillator and advanced
internal layout scheme to minimize radiated emissions at the system level.
Many applications in harsh industrial environment are sensitive to disturbances such as electrostatic discharge
(ESD), electrical fast transient (EFT), surge and electromagnetic emissions. These electromagnetic disturbances
are regulated by international standards such as IEC 61000-4-x and CISPR 22. Although system-level
performance and reliability depends, to a large extent, on the application board design and layout, the
ISOW784x family of devices incorporates many chip-level design improvements for overall system robustness.
Some of these improvements include:
• Robust ESD protection cells for input and output signal pins and inter-chip bond pads.
• Low-resistance connectivity of ESD cells to supply and ground pins.
• Enhanced performance of high voltage isolation capacitor for better tolerance of ESD, EFT and surge events.
• Bigger on-chip decoupling capacitors to bypass undesirable high energy signals through a low impedance
path.
• PMOS and NMOS devices isolated from each other by using guard rings to avoid triggering of parasitic
SCRs.
• Reduced common mode currents across the isolation barrier by ensuring purely differential internal operation.
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9.3.2 Power-Up and Power-Down Behavior


The ISOW784x family of devices has built-in UVLO on the VCC and VISO supplies with positive-going and
negative-going thresholds and hysteresis. When the VCC voltage crosses the positive-going UVLO threshold
during power-up, the DC-DC converter initializes and the power converter duty cycle is increased in a controlled
manner. This soft-start scheme limits primary peak currents drawn from the VCC supply and charges the
VISO output in a controlled manner, avoiding overshoots. Outputs of the isolated data channels are in an
indeterminate state until the VCC or VISO voltage crosses the positive-going UVLO threshold. When the UVLO
positive-going threshold is crossed on the secondary side VISO pin, the feedback data channel starts providing
feedback to the primary controller. The regulation loop takes over and the isolated data channels go to the
normal state defined by the respective input channels or their default states. Design should consider a sufficient
time margin (typically 10 ms with 10-µF load capacitance) to allow this power up sequence before valid data
channels are accounted for system functionality.
When VCC power is lost, the primary side DC-DC controller turns off when the UVLO lower threshold is reached.
The VISO capacitor then discharges depending on the external load. The isolated data outputs on the VISO side
are returned to the default state for the brief time that the VISO voltage takes to discharge to zero.
9.3.3 Current Limit, Thermal Overload Protection
The ISOW784x family of devices is protected against output overload and short circuit. Output voltage starts
dropping when the power converter is not able to deliver the current demanded during overload conditions. For a
VISO short-circuit to ground, the duty cycle of the converter is limited to help protect against any damage.
Thermal protection is also integrated to help prevent the device from getting damaged during overload and
short-circuit conditions on the isolated output. Under these conditions, the device temperature starts to increase.
When the temperature goes above 180°C, thermal shutdown activates and the primary controller turns off
which removes the energy supplied to the VISO load, which causes the device to cool off. When the junction
temperature goes below 150°C, the device starts to function normally. If an overload or output short-circuit
condition prevails, this protection cycle is repeated. Care should be taken in the design to prevent the device
junction temperatures from reaching such high values.
9.4 Device Functional Modes
Table 9-2 lists the supply configurations for these devices.
Table 9-2. Supply Configurations
SEL INPUT VCC VISO
Shorted to VISO 5V 5V
Shorted to VISO 3.3 V 5V
Shorted to GND2 or floating 5V 3.3 V(1)
Shorted to GND2 or floating 3.3 V 3.3 V(1)

(1) The SEL pin has a weak pulldown internally. Therefore for VISO = 3.3 V, the SEL pin should be
strongly connected to the GND2 pin in noisy system scenarios.

Table 9-3 lists the functional modes for ISOW784x devices.


Table 9-3. Function Table
INPUT SUPPLY INPUT OUTPUT
COMMENTS
(VCC)(1) (INx) (OUTx)
H H
Output channel assumes the logic state of its input
L L
PU
Default mode(2): When INx is open, the corresponding
Open Default output channel assumes logic based on default output
mode of selected version
PD X Undetermined(3)

(1) PU = Powered up (VCC ≥ 2.7 V); PD = Powered down (VCC < 2.1 V); X = Irrelevant; H = High level; L = Low level, VCC = Input-side
supply

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(2) In the default condition, the output is high for ISOW784x and low for ISOW784x with the F suffix.
(3) The outputs are in an undetermined state when VCC < 2.1 V.

9.4.1 Device I/O Schematics

Input (Devices without F suffix) Input (Devices with F suffix)

VCC VCC VCC VCC VCC VCC VCC

1.5 M

985 985
INx INx

1.5 M

Output SEL Pin


VISO
VISO VISO VISO

~20 1970
OUTx SEL

2M

Figure 9-4. Device I/O Schematics

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10 Application and Implementation


Note
Information in the following applications sections is not part of the TI component specification, and
TI does not warrant its accuracy or completeness. TI’s customers are responsible for determining
suitability of components for their purposes. Customers should validate and test their design
implementation to confirm system functionality.

10.1 Application Information


The device is a high-performance, quad channel digital isolator with integrated DC-DC converter. Typically digital
isolators require two power supplies isolated from each other to power up both sides of device. Due to the
integrated DC-DC converter in the device, the isolated supply is generated inside the device that can be used
to power isolated side of the device and peripherals on isolated side, thus saving board space. The device uses
single-ended CMOS-logic switching technology. When designing with digital isolators, keep in mind that because
of the single-ended design structure, digital isolators do not conform to any specific interface standard and are
only intended for isolating single-ended CMOS or TTL digital signal lines. The isolator is typically placed between
the data controller (that is Microcontroller or UART), and a data converter or a line transceiver, regardless of the
interface type or standard.
The device is suitable for applications that have limited board space and desire more integration. The device
is also suitable for very high voltage applications, where power transformers meeting the required isolation
specifications are bulky and expensive.
10.2 Typical Application
For step-by-step design procedure, circuit schematics, bill of materials, printed circuit board (PCB) files,
simulation results, and test results, refer to TI Design TIDA-01333, Eight-Channel, Isolated, High-Voltage
Analog Input Module With ISOW7841 Reference Design.

Figure 10-1 shows the typical schematic for SPI isolation.

Reference
22 …F 0.1 …F 0.1 …F 22 …F
3.3VIN
VCC VISO
3.3VOUT
SEL
DVCC AVDD DVDD
CS INA OUTA CS REF

SCLK INB ISOW7841 OUTB SCLK ADC Analog Input


MCU
SDO INC OUTC SDI
SDI OUTD IND SDO AGND DGND
DVSS GND1 GND2

Figure 10-1. Isolated Power and SPI for ADC Sensing Application with ISOW7841

10.2.1 Design Requirements


To design with this device, use the parameters listed in Table 10-1.
Table 10-1. Design Parameters
PARAMETER VALUE
Input voltage 3 V to 5.5 V
Decoupling capacitor between VCC and GND1 0.1 µF to 10 µF

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Table 10-1. Design Parameters (continued)


PARAMETER VALUE
Decoupling capacitor between VISO and GND2 0.1 µF to 10 µF

Because of very-high current flowing through the ISOW7841 device VCC and VISO supplies, higher decoupling
capacitors typically provide better noise and ripple performance. Although a 10-µF capacitor is adequate, higher
decoupling capacitors (such as 47 µF) on both the VCC and VISO pins to the respective grounds are strongly
recommended to achieve the best performance.
10.2.2 Detailed Design Procedure
The devices requires only external bypass capacitors to operate. These low-ESR ceramic bypass capacitors
must be placed as close to the chip pads as possible.
10 F 10 F

2 mm Maximum 2 mm Maximum
from Vcc from VISO

0.1 F 0.1 F
VCC VISO
1 16

GND1 2 15 GND2

INA 3 14 OUTA

INB 4 13 OUTB

INC 5 12 OUTC

OUTD 6 11 IND

7 10 SEL

8 9

GND1 GND2

Optional 100 µF capacitor can be added between VCC and GND1; refer to Section 11.

Figure 10-2. Typical ISOW7841 Circuit Hook-Up

The VCC power-supply input provides power to isolated data channels and to the isolated DC-DC converter. Use
Equation 1 to calculate the total power budget on the primary side.

ICC = (VISO × IISO) / (η × VCC) + Iinpx (1)

where
• ICC is the total current required by the primary supply.
• VISO is the isolated supply voltage.
• IISO is the external load on the isolated supply voltage.
• η is the efficiency.
• VCC is the supply voltage.

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• Iinpx is the total current drawn for the isolated data channels and power converter when data channels are
toggling at a specific data rate. This data is shown in the Section 7.9 table.
10.2.3 Application Curve

ICC (40 mA/div)

VISO (600 mV/div)

VCC = 3.3 V IISO = 70 mA


Input current spike is because of charging the input supply decoupling capacitor

Figure 10-3. Soft-Start Waveform

10.2.3.1 Insulation Lifetime


Insulation lifetime projection data is collected by using industry-standard Time Dependent Dielectric Breakdown
(TDDB) test method. In this test, all pins on each side of the barrier are tied together creating a two-terminal
device and high voltage applied between the two sides; See Figure 10-4 for TDDB test setup. The insulation
breakdown data is collected at various high voltages switching at 60 Hz over temperature. For reinforced
insulation, VDE standard requires the use of TDDB projection line with failure rate of less than 1 part per million
(ppm). Even though the expected minimum insulation lifetime is 20 years at the specified working isolation
voltage, VDE reinforced certification requires additional safety margin of 20% for working voltage and 87.5% for
lifetime which translates into minimum required insulation lifetime of 37.5 years at a working voltage that's 20%
higher than the specified value.
Figure 10-5 shows the intrinsic capability of the isolation barrier to withstand high voltage stress over its lifetime.
Based on the TDDB data, the intrinsic capability of the insulation is 1000 VRMS with a lifetime of 1184 years.

A
Vcc 1 Vcc 2

Time Counter

DUT > 1 mA

GND 1 GND 2
VS

Oven at 150 °C

Figure 10-4. Test Setup for Insulation Lifetime Measurement

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Figure 10-5. Insulation Lifetime Projection Data

11 Power Supply Recommendations


To help make sure that operation is reliable at data rates and supply voltages, adequate decoupling capacitors
must be located as close to supply pins as possible. The input supply (VCC) must have an appropriate current
rating to support output load and switching at the maximum data rate required by the end application. For more
information, refer to the Section 10.2.2 section.

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12 Layout
12.1 Layout Guidelines
A minimum of four layers is required to accomplish a low-EMI PCB design (see Figure 12-1). Layer stacking
should be in the following order (top-to-bottom): high-speed signal layer, ground plane, power plane, and
low-frequency signal layer.
• Routing the high-speed traces on the top layer avoids the use of vias (and the introduction of their
inductances) and allows for clean interconnects between the isolator and the transmitter and receiver circuits
of the data link.
• Placing a solid ground plane next to the high-speed signal layer establishes controlled impedance for
transmission line interconnects and provides an excellent low-inductance path for the return current flow.
• Placing the power plane next to the ground plane creates additional high-frequency bypass capacitance of
approximately 100 pF/in2.
• Routing the slower speed control signals on the bottom layer allows for greater flexibility as these signal links
usually have margin to tolerate discontinuities such as vias.
• Keep decoupling capacitors as close as possible to the VCC and VISO pins.
If an additional supply voltage plane or signal layer is needed, add a second power or ground plane system
to the stack to keep it symmetrical. This makes the stack mechanically stable and prevents it from warping.
Also the power and ground plane of each power system can be placed closer together, thus increasing the
high-frequency bypass capacitance significantly.
Because the device has no thermal pad to dissipate heat, the device dissipates heat through the respective GND
pins. Ensure that enough copper is present on both GND pins to prevent the internal junction temperature of the
device from rising to unacceptable levels.
The integrated signal and power isolation device simplifies system design and reduces board area. The use of
low-inductance micro-transformers in the device necessitates the use of high frequency switching, resulting in
higher radiated emissions compared to discrete solutions. The device uses on-chip circuit techniques to reduce
emissions compared to competing solutions. For further reduction in radiated emissions at system level, refer to
the Low-Emission Designs With ISOW7841 Integrated Signal and Power Isolator application report.
12.1.1 PCB Material
For digital circuit boards operating at less than 150 Mbps, (or rise and fall times greater than 1 ns), and trace
lengths of up to 10 inches, use standard FR-4 UL94V-0 printed circuit board. This PCB is preferred over cheaper
alternatives because of lower dielectric losses at high frequencies, less moisture absorption, greater strength
and stiffness, and the self-extinguishing flammability-characteristics.

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12.2 Layout Example


Solid supply islands reduce
inductance because large peak 2 mm 2 mm
currents flow into the VCC pin maximum maximum
from VCC from VISO

VCC VISO
1 16

10 …F 0.1 …F GND1 GND2 0.1 …F 10 …F


2 15

3 14

4 13

5 12

6 11

SEL
7 10

GND1 GND2
8 9

Solid ground islands help


dissipate heat through PCB

Figure 12-1. Layout Example

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13 Device and Documentation Support


13.1 Device Support
13.1.1 Development Support
For development support, refer to:
• 8-ch Isolated High Voltage Analog Input Module with ISOW7841 Reference Design
• Isolated RS-485 With Integrated Signal and Power Reference Design
• Isolated RS-232 With Integrated Signal and Power Reference Design
13.2 Documentation Support
13.2.1 Related Documentation
For related documentation see the following:
• Texas Instruments, Digital Isolator Design Guide
• Texas Instruments, Isolation Glossary
• Texas Instruments, ISOW784x Quad-Channel Digital Isolator With Integrated DC-DC Converter Evaluation
Module user's guide
• Texas Instruments, Low-Emission Designs With ISOW7841 Integrated Signal and Power Isolator application
report
• Texas Instruments, Overvoltage protection for isolated DC/DC convertertech note
13.3 Related Links
The table below lists quick access links. Categories include technical documents, support and community
resources, tools and software, and quick access to sample or buy.
Table 13-1. Related Links
TECHNICAL TOOLS & SUPPORT &
PARTS PRODUCT FOLDER ORDER NOW
DOCUMENTS SOFTWARE COMMUNITY
ISOW7840 Click here Click here Click here Click here Click here
ISOW7841 Click here Click here Click here Click here Click here
ISOW7842 Click here Click here Click here Click here Click here
ISOW7843 Click here Click here Click here Click here Click here
ISOW7844 Click here Click here Click here Click here Click here

13.4 Receiving Notification of Documentation Updates


To receive notification of documentation updates, navigate to the device product folder on ti.com. In the upper
right corner, click on Alert me to register and receive a weekly digest of any product information that has
changed. For change details, review the revision history included in any revised document.
13.5 Support Resources
TI E2E™ support forums are an engineer's go-to source for fast, verified answers and design help — straight
from the experts. Search existing answers or ask your own question to get the quick design help you need.
Linked content is provided "AS IS" by the respective contributors. They do not constitute TI specifications and do
not necessarily reflect TI's views; see TI's Terms of Use.
13.6 Trademarks
TI E2E™ is a trademark of Texas Instruments.
All trademarks are the property of their respective owners.

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13.7 Electrostatic Discharge Caution


This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled
with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may
be more susceptible to damage because very small parametric changes could cause the device not to meet its published
specifications.

13.8 Glossary
TI Glossary This glossary lists and explains terms, acronyms, and definitions.

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14 Mechanical, Packaging, and Orderable Information


The following pages include mechanical, packaging, and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and revision of
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.

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PACKAGE OPTION ADDENDUM

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PACKAGING INFORMATION

Orderable Device Status Package Type Package Pins Package Eco Plan Lead finish/ MSL Peak Temp Op Temp (°C) Device Marking Samples
(1) Drawing Qty (2) Ball material (3) (4/5)
(6)

ISOW7840DWE ACTIVE SOIC DWE 16 40 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 ISOW7840

ISOW7840DWER ACTIVE SOIC DWE 16 2000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 ISOW7840

ISOW7840FDWE ACTIVE SOIC DWE 16 40 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 ISOW7840F

ISOW7840FDWER ACTIVE SOIC DWE 16 2000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 ISOW7840F

ISOW7841DWE ACTIVE SOIC DWE 16 40 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 ISOW7841

ISOW7841DWER ACTIVE SOIC DWE 16 2000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 ISOW7841

ISOW7841FDWE ACTIVE SOIC DWE 16 40 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 ISOW7841F

ISOW7841FDWER ACTIVE SOIC DWE 16 2000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 ISOW7841F

ISOW7842DWE ACTIVE SOIC DWE 16 40 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 ISOW7842

ISOW7842DWER ACTIVE SOIC DWE 16 2000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 ISOW7842

ISOW7842FDWE ACTIVE SOIC DWE 16 40 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 ISOW7842F

ISOW7842FDWER ACTIVE SOIC DWE 16 2000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 ISOW7842F

ISOW7843DWE ACTIVE SOIC DWE 16 40 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 ISOW7843

ISOW7843DWER ACTIVE SOIC DWE 16 2000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 ISOW7843

ISOW7843FDWE ACTIVE SOIC DWE 16 40 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 ISOW7843F

ISOW7843FDWER ACTIVE SOIC DWE 16 2000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 ISOW7843F

ISOW7844DWE ACTIVE SOIC DWE 16 40 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 ISOW7844

ISOW7844DWER ACTIVE SOIC DWE 16 2000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 ISOW7844

ISOW7844FDWE ACTIVE SOIC DWE 16 40 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 ISOW7844F

ISOW7844FDWER ACTIVE SOIC DWE 16 2000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 ISOW7844F

Addendum-Page 1
PACKAGE OPTION ADDENDUM

www.ti.com 2-Mar-2021

(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.

(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based
flame retardants must also meet the <=1000ppm threshold requirement.

(3)
MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.

(4)
There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.

(5)
Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.

(6)
Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two
lines if the finish value exceeds the maximum column width.

Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.

In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.

Addendum-Page 2
PACKAGE MATERIALS INFORMATION

www.ti.com 4-Jan-2022

TAPE AND REEL INFORMATION

*All dimensions are nominal


Device Package Package Pins SPQ Reel Reel A0 B0 K0 P1 W Pin1
Type Drawing Diameter Width (mm) (mm) (mm) (mm) (mm) Quadrant
(mm) W1 (mm)
ISOW7840DWER SOIC DWE 16 2000 330.0 16.4 10.75 10.7 2.7 12.0 16.0 Q1
ISOW7840FDWER SOIC DWE 16 2000 330.0 16.4 10.75 10.7 2.7 12.0 16.0 Q1
ISOW7841DWER SOIC DWE 16 2000 330.0 16.4 10.75 10.7 2.7 12.0 16.0 Q1
ISOW7841FDWER SOIC DWE 16 2000 330.0 16.4 10.75 10.7 2.7 12.0 16.0 Q1
ISOW7842DWER SOIC DWE 16 2000 330.0 16.4 10.75 10.7 2.7 12.0 16.0 Q1
ISOW7842FDWER SOIC DWE 16 2000 330.0 16.4 10.75 10.7 2.7 12.0 16.0 Q1
ISOW7843DWER SOIC DWE 16 2000 330.0 16.4 10.75 10.7 2.7 12.0 16.0 Q1
ISOW7843FDWER SOIC DWE 16 2000 330.0 16.4 10.75 10.7 2.7 12.0 16.0 Q1
ISOW7844DWER SOIC DWE 16 2000 330.0 16.4 10.75 10.7 2.7 12.0 16.0 Q1
ISOW7844FDWER SOIC DWE 16 2000 330.0 16.4 10.75 10.7 2.7 12.0 16.0 Q1

Pack Materials-Page 1
PACKAGE MATERIALS INFORMATION

www.ti.com 4-Jan-2022

*All dimensions are nominal


Device Package Type Package Drawing Pins SPQ Length (mm) Width (mm) Height (mm)
ISOW7840DWER SOIC DWE 16 2000 350.0 350.0 43.0
ISOW7840FDWER SOIC DWE 16 2000 350.0 350.0 43.0
ISOW7841DWER SOIC DWE 16 2000 350.0 350.0 43.0
ISOW7841FDWER SOIC DWE 16 2000 350.0 350.0 43.0
ISOW7842DWER SOIC DWE 16 2000 350.0 350.0 43.0
ISOW7842FDWER SOIC DWE 16 2000 350.0 350.0 43.0
ISOW7843DWER SOIC DWE 16 2000 350.0 350.0 43.0
ISOW7843FDWER SOIC DWE 16 2000 350.0 350.0 43.0
ISOW7844DWER SOIC DWE 16 2000 350.0 350.0 43.0
ISOW7844FDWER SOIC DWE 16 2000 350.0 350.0 43.0

Pack Materials-Page 2
PACKAGE MATERIALS INFORMATION

www.ti.com 4-Jan-2022

TUBE

*All dimensions are nominal


Device Package Name Package Type Pins SPQ L (mm) W (mm) T (µm) B (mm)
ISOW7840DWE DWE SO-MOD 16 40 506.98 12.7 4826 6.6
ISOW7840FDWE DWE SO-MOD 16 40 506.98 12.7 4826 6.6
ISOW7841DWE DWE SO-MOD 16 40 506.98 12.7 4826 6.6
ISOW7841FDWE DWE SO-MOD 16 40 506.98 12.7 4826 6.6
ISOW7842DWE DWE SO-MOD 16 40 506.98 12.7 4826 6.6
ISOW7842FDWE DWE SO-MOD 16 40 506.98 12.7 4826 6.6
ISOW7843DWE DWE SO-MOD 16 40 506.98 12.7 4826 6.6
ISOW7843FDWE DWE SO-MOD 16 40 506.98 12.7 4826 6.6
ISOW7844DWE DWE SO-MOD 16 40 506.98 12.7 4826 6.6
ISOW7844FDWE DWE SO-MOD 16 40 506.98 12.7 4826 6.6

Pack Materials-Page 3
PACKAGE OUTLINE
DWE0016A SCALE 1.500
SOIC - 2.65 mm max height
SOIC

10.63 SEATING PLANE


TYP
9.97
PIN 1 ID 0.1 C
A
AREA
14X 1.27
16
1

10.5 2X
10.1 8.89
NOTE 3

8
9
0.51
16X
0.31
7.6
B 0.25 C A B 2.65 MAX
7.4
NOTE 4

0.33
TYP
0.10

SEE DETAIL A
0.25
GAGE PLANE

0.3
0 -8 0.1
1.27
0.40 DETAIL A
(1.4) TYPICAL

4223098/A 07/2016

NOTES:

1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. This dimension does not include mold flash, protrusions, or gate burrs. Mold flash, protrusions, or gate burrs shall not
exceed 0.15 mm, per side.
4. This dimension does not include interlead flash. Interlead flash shall not exceed 0.25 mm, per side.
5. Reference JEDEC registration MS-013.

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EXAMPLE BOARD LAYOUT
DWE0016A SOIC - 2.65 mm max height
SOIC

SYMM SYMM
16X (2) 16X (1.65) SEE
SEE DETAILS
DETAILS
1 1
16 16

16X (0.6) 16X (0.6)

SYMM SYMM

14X (1.27) 14X (1.27)


8 9 8 9

(9.3) (9.75)

IPC-7351 NOMINAL HV / ISOLATION OPTION


7.3 mm CLEARANCE/CREEPAGE 8.1 mm CLEARANCE/CREEPAGE

LAND PATTERN EXAMPLE


SCALE:4X

SOLDER MASK SOLDER MASK METAL


METAL OPENING OPENING

0.07 MAX 0.07 MIN


ALL AROUND ALL AROUND

NON SOLDER MASK SOLDER MASK


DEFINED DEFINED

SOLDER MASK DETAILS

4223098/A 07/2016

NOTES: (continued)

6. Publication IPC-7351 may have alternate designs.


7. Solder mask tolerances between and around signal pads can vary based on board fabrication site.

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EXAMPLE STENCIL DESIGN
DWE0016A SOIC - 2.65 mm max height
SOIC

SYMM SYMM
16X (2) 16X (1.65)

1 1
16 16

16X (0.6) 16X (0.6)

SYMM SYMM

14X (1.27) 14X (1.27)


8 9 8 9

(9.3) (9.75)

IPC-7351 NOMINAL HV / ISOLATION OPTION


7.3 mm CLEARANCE/CREEPAGE 8.1 mm CLEARANCE/CREEPAGE

SOLDER PASTE EXAMPLE


BASED ON 0.125 mm THICK STENCIL
SCALE:4X

4223098/A 07/2016

NOTES: (continued)

8. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
9. Board assembly site may have different recommendations for stencil design.

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