Embedded Jtag Boundary Scan Test
Embedded Jtag Boundary Scan Test
FOR
BOUNDARY-SCAN TEST
TECHNICAL OVERVIEW
BY ALAN SGUIGNA
Embedded JTAG for Boundary-Scan Test
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Embedded JTAG for Boundary-Scan Test
Table of Contents
Executive Summary ........................................................................................................................ 4
Learn More...................................................................................................................................... 9
Table of Figures
Figure 1: IEEE 1149.1 Tap Controller........................................................................................... 4
ASSET, ScanWorks and SourcePoint are registered trademarks, and the ScanWorks logo are trademarks of ASSET InterTech,
Inc. All other trade and service marks are the properties of their respective owners.
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Embedded JTAG for Boundary-Scan Test
Executive Summary
ASSET InterTech develops and delivers JTAG/boundary-scan based test tools for a wide variety
of board designs of various architectures where key silicon components implement IEEE Std
1149.1 and related embedded instrumentation accessible via the standard test access port (TAP)
(Figure 1). Based on its long experience with JTAG, ASSET provides for the embedding of
boundary scan test utilities resident within OEMs’ printed circuit boards. These test utilities
(ASSET’s ScanWorks Embedded Diagnostics for Boundary-Scan Test, or SED for BST) are
used by test and debug engineers during the lifecycle of the product, unencumbered by external
hardware controllers, cables and fixturing. This provides substantial productivity gains and cost
savings to OEMs in the forms of improved yields, test capital cost reduction, test time
compression, and enhanced diagnosability of repair depot and field failures.
This document is a brief description of the technology and implementation for SED for BST.
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Embedded JTAG for Boundary-Scan Test
BST provides a very effective means of detecting and diagnosing in-situ assembly defects. The
boundary-scan application, being software-based, is usable throughout the lifecycle of the
product. By embedding BST, thereby removing any external hardware (controller/pod, cabling,
fixturing) dependencies, it can be applied at a system-level and in a parallel fashion in such
environments as manufacturing production lines, ESS, repair/return depots, or even in the field.
Technical Description
SED for Test enables the means to execute ScanWorks actions (tests) in an embedded
environment. These actions (tests) are developed using the ScanWorks Development software on
a Windows PC. The ScanWorks Development software provides a data format for each
supported action that allows the action to be run by the embedded action players. The action data
is then either embedded on each unit under test (UUT) by storing the associated data in on-board
flash memory, or downloaded to the UUT via an off-board link, preferably Ethernet.
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Embedded JTAG for Boundary-Scan Test
The customer is responsible for ensuring their embedded system has adequate processor real-
time capacity and memory footprint to accommodate ASSET’s IP, the requirements for which
are described below.
Action Types:
The following action types are supported:
An action consists of the necessary data and/or code specific to a UUT to perform a test.
Action Players:
The action players reside on the UUT target and provide the runtime environment. They allow
for flow control (looping, branching and advanced coding) and support advanced diagnostics and
flexible test capabilities. ScanWorks actions run via the embedded action player.
The action player and actions as specified herein can be non-resident. That is, they can be
downloaded over Ethernet, and executed dynamically at run-time. Action players support all
supported action types on all UUTs. Actions themselves are specific to the UUT and an action
type.
Each action as specified above is a standalone application that can be run on the UUT via a
command line in a telnet (serial port) session. Pass results are piped to the console. Fail
notifications are sent to the console, and diagnostic data is uploaded via Ethernet. BST failure
diagnostic data needs to be uploaded into a ScanWorks benchtop license for diagnostic
processing and reporting. BST applications access the embedded SED library and execute
IRScan and DRScan functions.
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Embedded JTAG for Boundary-Scan Test
The OEM is responsible for downloading the action player and appropriate actions to the
applicable UUTs, running/stopping tests, uploading pass/fail status and diagnostic results,
parsing results data, cleaning up the file system when complete, and other management
functions.
Resource Requirements
The action players occupy <= 2MB of flash footprint. The action data size is dependent upon the
application. BST SPV and BST MAV action data are negligibly small. BST interconnect actions
can be >~1MB for large designs, with a typical range of ~ 200kB - 300kB. The runtime memory
needed to run STAPL files is entirely dependent upon the size of the file.
The IP that implements the IEEE 1149.1 (JTAG) TAP Controller signals is a proven high-
performance design that is utilized in several of ASSET’s off-the shelf-hardware offerings. For
hardware board designs supporting an FPGA that has real-estate to support the JTAG mastering
function, an implementation for the TAP controller written in VHDL will be provided (in
obfuscated form with exception of the top level entity) and included for each customer design.
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Embedded JTAG for Boundary-Scan Test
Note: The TAP controller IP is designed to operate with jtag_clk up to 50MHz and has no
minimum frequency requirement, although a jtag_clk must be present for the TAP controller IP
to operate.
The use of a system clock as well as a jtag_clk allows reading and writing internal FIFOs and
registers at much faster rates than the TCK is operating. This improves performance and frees the
controlling processor to perform other tasks.
FPGA Resources:
The resources required by the TAP Controller IP are small when compared to today’s FPGAs.
The IP will reside in fewer than 4,000 Lookup Tables (LUTs) (or equivalent) and require only
74k-bits of memory. These memory requirements are based on send and receive FIFOs sized at
2k by 18-bits. The following is a small excerpt from a place and route report of a similar
implementation in a Xilinx Virtex-5 xc5vlx50t:
The address space required by the SED Controller IP is 256 32-bit locations (8 address bits) of
contiguous addresses within the FPGA.
Two global clock circuits will be required for routing the system and JTAG clock sources within
the FPGA.
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Embedded JTAG for Boundary-Scan Test
Conclusion
Mission-critical systems are expected to operate 24 X 7 with close to zero outage downtime. To
achieve this level of performance, such systems must combine high reliability with rapid field
repair and replacement.
ASSET provides embedded firmware solutions for structural/functional testing and CPU run-
control for many industries, including military/aerospace, servers, storage, telecom, and others.
This third-party Intellectual Property (IP) reduces development costs and accelerates time-to-
market.
With embedded boundary-scan test, OEMs and their customers can debug intermittent,
irreproducible hardware defects in the lab and in the field, that are often the source of costly
NTFs and customer dissatisfaction. The focus can then shift to product functionality, product
differentiation, and high levels of customer service and satisfaction.
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