00696 S4 PIONEER/E MON 28.08.

2001 9:35 Uhr Seite 1

BRUKER ADVANCED X-RAY SOLUTIONS BRUKER ADVANCED X-RAY SOLUTIONS

Technical Data

Analytical performance
The S4 PIONEER combines high analytical performance and space saving and cost efficiency. Its outstanding light
element analysis capacity is based on innovative multilayer analyzer crystals, appropiate collimators and the optimized
close sample/X-ray tube coupling. Besides this, the S4 PIONEER is optimized by the 75 µm ultra thin X-ray tube window, SPECTROMETRY SOLUTIONS
the 150 mA excitation and the high transmission thin detector window technology.
Analysis range Beryllium to Uranium S4 PIONEER
Concentration range concentrations from sub ppm to 100%
Sample form powder, solid, liquid, paste, coating, slurry, film, filter deposit, etc.
Sample size loose powder and liquids: up to 50 ml
solid, film, paper: to 51 mm (2‘‘) ø, 47 mm (1.8‘‘) height
Room planning made easy
Mains 208 V, 230 V (50/60 Hz)
(Generator stability ± 0.0005% of the set value at main voltage fluctuations of ± 1%)
External cooling water 3-8 bar, the water consumption is automatically minimized and The
reduced to a third of normal X-ray spectrometer systems. Short term
water flow interruptions are compensated. Leading
Detector gas P10 (90% Argon, 10% Methane) required with flow counter operation 4K
Vacuum pump vacuum pump integrated in spectrometer
Gas for analysis of
liquids or loose powders Helium or Nitrogen, at reduced or normal atmospheric pressure
(Sample and spectrometer chamber are separated by a programmable air lock (vacuum seal) minimizing the helium
consumption and pump-down times, increasing detector stability and analytical reproducibility)
Dimensions 131cm x 84cm x 99cm; 450 kg
51.6” x 33.1” x 39.0”
(height x width x depth, weight)
Quality & Safety DIN ISO 9001 / EN 29001
CE Certified
Fully Radiation Protected System (e.g. DIN 54113)

BRUKER AXS GMBH BRUKER AXS INC.

Oestliche Rheinbrueckenstr. 50 5465 East Cheryl Parkway

D-76181 KARLSRUHE MADISON, WI 53711
GERMANY USA

TEL. (+49) (7 21) 5 95 -28 88 TEL. (+1) (800) 234- XRAY

FAX (+49) (7 21) 5 95 - 45 87 TEL. (+1) (608) 276- 3000
http://www.bruker-axs.de FAX (+1) (608) 276- 3006
Email [email protected] http://www.bruker-axs.com
Email [email protected]
AIM 00696

All configurations and specifications are subject to change without notice. Order No. B80-E00002 2001 BRUKER AXS Printed in Germany.
00696 S4 PIONEER/E MON 28.08.2001 9:35 Uhr Seite 3

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BRUKER ADVANCED X-RAY SOLUTIONS

The whole periodic table

with just a mouse click?
S4 PIONEER – many samples
in less time!

height: 131 cm
51.6’’

depth: 99 cm
39.0’’

width: 84 cm
33.1’’
00696 S4 PIONEER/E MON 28.08.2001 9:36 Uhr Seite 5

3 4

S4 PIONEER – little effort

in sample preparation and
gigantic analytical versatility ces, chips, wires
small pie
ss, polymers, …
gla
metals

res, ceramics, …
nerals, o
rocks, mi
liquids

X R F for multi-ele pti-

men- crushing,ng
pulverizi
u u s e o
When yo e improvements and on.
lysis, ti m p re p a ra ti
tal ana h sa mple
eg in w it ER ives
g
mization b with the S4 PIONE me
sis ti
XRF analy dvantage, because re 3 min
t a
you a gian r sample preparatio
n a direct
and labo r fo
milling, cutting, ing
minimal.
ta l a nalyses w
ith the
grinding, hot press
Multi-ele m e n estructive
S4 PION E ER e n su re a non-d tical me-
safe analy solution polishing
nmentally is
and enviro oesn’t require the d ples or fusing
pressing
h ich d ss) o mf sa
thod, w ently the lo waste solvents,
pouring
c o n se q u
(and ous
l of hazard
dripping
ds.
the disposa wet chemical metho
as do all th
e
a ly se liquids, pellets dec
loose anting 5s
o u a n
Whether y , pressed powder
metals our sam-
powders, ds; preparation of y
e a ce the 2 min
or fused b s simple. Pour or pla and
a y c up
ples is alw tly into the sample
d ire c r sa mple. 1 min
sample to e xp lo re you preparation of solid and powder
ady
you are re aration of 10 min materials within minutes
re la tin g to the prep nition, bind- 2 min
Data ss on ig
ch as the lo dditional 10 s safe and fast direct analysis of
samples, su dilutions and any a 15 s liquids and loose powders
or sily
ing agents rmation can be ea your 10 s
ica l in fo v e r from direct measurement of small and
chem ta ke n o
r directly
inserted o etwork. irregularly sized samples
n
laboratory
00696 S4 PIONEER/E MON 28.08.2001 9:36 Uhr Seite 7

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S4 PIONEER – even more

samples, even less measuring time

gs you the
S 4 P IO NEER brin worlds. For
The different
es of two or analy-
advantag you have the superi ave-
e lw
the first tim ance of a sequentia r –
tical perfo
rm omete
p e rs iv e X -ray spectr d the best
length dis ighest resolution an rticular
eh pa
such as th y and sensitivity, in ed
c ib ilit – co binm
reprodu e nt analysis ce saving and
h t e le m
for lig of spa
dvantages
with the a y.
nc
cost efficie e used in
S 4 P IO N EER can b in the clean
The er it is
e n v iro n m ent, wheth the rugged sur-
any b, or
nt of the la It provi-
environme the production site. ct from
o f p e
roundings the features you ex
w ith
des you ometer.
ving spectr
a space sa meets the
P IO N E ER not only also
The S4 saving, bu
t
e m a n d s for space and economical
d t
an efficien at 4kW
brings you h power excitation al
hig rn
solution to onnecting to an exte water
sim p ly c e x te rn a l
with e m . The
a ter sy st p nt tap
la
cooling w e from your city or
n b
supply ca ater chiller system.
w
water, or a matically
su m p tion is auto ower
Water c o n
o n the g enerator p
based of
minimized -third that
n d is ty p ically one st ems.
setting, a ometer sy
-ray spectr w and
standard X riations in water flo for.
va ted
Short term tions are compensa S4 PIONEER
in te rru p
flow little in
measuring time
space
installation requirements
effort for setup and calibration
gigantic in
sample throughput
measuring speed
integrated intelligence
analytical flexibility
analytical sensitivity
reproducibility
00696 S4 PIONEER/E MON 28.08.2001 9:36 Uhr Seite 9

8 13

Just one mouse click and you’ll

explore the whole periodic table –
plus
S4 PIONEER with SPECTRA

ation in
a l d a ta communic TCP/IP
Intern plus based on the
in XRF is , the
su ri n g ro u tin e
p le s S P ECTRA
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and startin ept, above all, you and is tic
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sample thro sibilities in the lab. from any c le, from your porta
sp o n ne d r e xa m p em .
other re uickly defi or, fo , via mod
re m e n t jobs are q tor input. w h ere ver you are
Mea su
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ACS total Automatic setup and

Calibration System
Totally Integrated Analytical
Intelligence
virtual, real-time display of
spectrometer and sample magazine
status
simple data transfer within
the Windows™ world and ease
of networking
00696 S4 PIONEER/E MON 28.08.2001 9:36 Uhr Seite 11

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Sequential wavelength-dispersive … realized in a totally new design –

XRF analysis with the look what’s inside:
S4 PIONEER – the better way …
Sample Collimator mask
Sequential wavelength-dispersive
Vacuum seal
Primary beam XRF analysis:
filter
Collimator best light element sensitivity
high count rates (up to one million
X-ray tube cps per element line) for high
accuracy and short measuring time
Analyzer best line resolution for accurate
crystal results
Flow counter flexible background determination
for reliable trace element analysis

Scintillation
counter

n the
tr a n sit io ns betwee -shell)
Electron -, L- and M
er sh e lls of atoms (K gths (or energies)
inn len
ys of wave
create X-ra of the element.
stic ) uses this
Light ele
ment characteri ence analysis (XRF ve and
sc tati
Ejected X-ray fluore radiation for quali
electron cte rist ic s.
chara analysi 00°/min
e element ed up to 2
quantitativ inner shell
s
– scan ning sp e
s between y chemical ow flow
ristic The tr a n sitio n
rbed b to 60 kV n sm is sio n thin wind
Characte on re not distu ntage of itation, up – high tra ents
iati of atoms a refore another adva sam- – unique 4
kW e xc r light elem
counter fo
F rad
n counter
XR
he uid
binding. T is that solid and liq reas or 150 mA 75 µm n c y scintillatio
XRF a n a ly sis
ed dir e c tly , w he
X -ra y tube with – high e ffic ie
g elements
t n
Inciden a ly z tion of up li
X-ray
e a n
ples can b ds require evapora – close co -ray tube window for heavy for optima
l
optical m e th o ult ra thin X
n of u u m operation y
material. sa fe operatio – stable va c
ducibilit
the sample n the ele- – vacuum
se a l fo r and repro
ce radiatio (or energy) loose pow
ders sensitivity ased
From fl u o re sc e n liq u id s a n d
um p ing times b of
velength e d p
– minimiz al vacuum control
lement t c h a ra cteristic wa by energy-disper- collimators u
Heavy e Ejected m e n
parated e
ither tion at an – up to 4 on individ ck
electron can be se r by reflec rsive rystals lo
ly sis o analyzer c sam p le a ir
Fa n a
sive ED-XR stal (wavelength-dis
pe – up to 8 ntrolled bility ± 0.0
5°C
n encoder co Theta ra tu re sta
analy z e r c ry
– high p re cis io
oupled – tempe
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WD-XRF a dvantage goniomete
s o ffers the a est ta
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00696 S4 PIONEER/E MON 28.08.2001 9:36 Uhr Seite 13

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S4 PIONEER … and open communication

plus
and SPECTRA – fully Integrated and unlimited data management
Analytical Intelligence …
integrated data base for all sample data
flexible integration of external
manual or
sample data, for example from preparation or results automatic input
of other analytical methods AXS -051066
of sample name
simple data transfer within the
Windows™ world and ease of networking
sample data from
preparation and
other analytical
methods

ith a mini-
rd le ss a nalysis w brations further
Standa ecific cali sample data
o f u se r input or sp r lowest detection
mu m cy o
hest accura nd SPECTRA
plus
fo r the hig a
PIONEER litative,
limits – S4 ss integration of qua nd quan-
le )a
offer seam (”semiquantitative”
a rd le ss
stand
thods.
titative me Intelli-
tegrate d Analytical ars of
The fully In on more than 40 ye
ased
gence is b nalysis.
e in XRF a
experienc XRF results

spread sheet
calculations

SPC applications
(statistical
precalibrated for all types process control)
of materials
intelligent measuring strategies
applying the best parameters graphical
evaluations and
totally flexible interactive data presentations
evaluation AXS -051066

automatic correction of spectral

overlaps reports,
integrated data base with selection of results by
fully integrated matrix correction sample data sets specific criteria, such as documentation,
with fundamental parameters indivi- date and time, operator, documents, etc.
dually calculated for each sample material, etc.
(”variable alphas”) integration into
LIMS (laboratory
simple and fast optimization with information
material specific standard samples management
systems)