Pulse-Echo Ultrasonic Inspection System For In-Situ Nondestructive Inspection of Space Shuttle RCC Heat Shields

SANDIA REPORT
SAND2005-3429
Unlimited Release
Printed June 2005
Pulse-Echo Ultrasonic Inspection System for

In-Situ Nondestructive Inspection of
Space Shuttle RCC Heat Shields
Dennis Roach, Phil Walkington, and Kirk Rackow
Prepared by
Sandia National Laboratories
Albuquerque, New Mexico 87185 and Livermore, California 94550
Sandia is a multiprogram laboratory operated by Sandia Corporation,

a Lockheed Martin Company, for the United States Department of Energy’s
National Nuclear Security Administration under Contract DE-AC04-94AL85000.
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2
SAND2005-3429
Unlimited Release
Printed June 2005

Dennis Roach
Phil Walkington
Kirk Rackow
Airworthiness Assurance Department, 6252
Sandia National Laboratories

P. O. Box 5800
Albuquerque, NM 87185-0615
Abstract
The reinforced carbon-carbon (RCC) heat shield components on the Space Shuttle’s wings must withstand
harsh atmospheric reentry environments where the wing leading edge can reach temperatures of 3,000oF.
Potential damage includes impact damage, micro cracks, oxidation in the silicon carbide-to-carbon-carbon
layers, and interlaminar disbonds. Since accumulated damage in the thick, carbon-carbon and silicon-carbide
layers of the heat shields can lead to catastrophic failure of the Shuttle’s heat protection system, it was
essential for NASA to institute an accurate health monitoring program. NASA’s goal was to obtain turnkey
inspection systems that could certify the integrity of the Shuttle heat shields prior to each mission. Because of
the possibility of damaging the heat shields during removal, the NDI devices must be deployed without
removing the leading edge panels from the wing. Recently, NASA selected a multi-method approach for
inspecting the wing leading edge which includes eddy current, thermography, and ultrasonics. The
complementary superposition of these three inspection techniques produces a rigorous Orbiter certification
process that can reliably detect the array of flaws expected in the Shuttle’s heat shields. Sandia Labs
produced an in-situ ultrasonic inspection method while NASA Langley developed the eddy current and
thermographic techniques. An extensive validation process, including blind inspections monitored by NASA
officials, demonstrated the ability of these inspection systems to meet the accuracy, sensitivity, and reliability
requirements. This report presents the ultrasonic NDI development process and the final hardware
configuration. The work included the use of flight hardware and scrap heat shield panels to discover and
overcome the obstacles associated with damage detection in the RCC material. Optimum combinations of
custom ultrasonic probes and data analyses were merged with the inspection procedures needed to properly
survey the heat shield panels. System features were introduced to minimize the potential for human factors
errors in identifying and locating the flaws. The in-situ NDI team completed the transfer of this technology to
NASA and USA employees so that they can complete “Return-to-Flight” certification inspections on all
Shuttle Orbiters prior to each launch.
_______________
This work was performed for the National Aeronautics and Space Administration under Work-for-Others agreement 062030623.
Sandia National Laboratories is a multiprogram laboratory operated by Sandia Corporation, a Lockheed Martin Company, for the
United States Department of Energy’s National Nuclear Security Administration under contract DE-AC04-94AL85000.
3
Acknowledgements
This work was sponsored by the National Aeronautics and Space Administration under Work-
for-Others agreement 062030623. This project was managed by Ajay Koshti at NASA-JSC.
Additional project oversight was provided by Ron Allison at NASA-KSC and Alan Ling at
United Space Alliance (NASA-KSC). The Shuttle in-situ NDI project was initiated by Jose
Hernandez at NASA-JSC. Orbiter deployment and system certification efforts were supported
by Marty Agrella and his staff at Oceaneering Space Systems. Guidance on RCC inspection
issues and validation testing was provided by Dan Ryan and the NDI team at United Space
Alliance along with Bob DeVries at Boeing. The test specimens used for technique development
and validation were produced by Bill Sheldon at Boeing. Final validation testing was supported
by Mike Tipton (SAIC) and Mary Litwinski (Boeing). The success of a program such as this
depends on the support of the entire team assembled from personnel at all of the NASA facilities
and their contractors. The authors would like to acknowledge the efforts put forth by the entire
in-situ NDI team (recorded in this report’s distribution list) to aid the overall inspection system
development activities, certification tasks, and logistics for system integration into the Orbiter
Processing Facility.
4
TABLE OF CONTENTS
Section Title Page
1.0 RCC In-Situ NDI Program Background 7

1.1 Inspection Region - Shuttle Wing Leading Edge and Nose Cap RCC Panels 7
1.2 RCC Inspection Requirements 13
2.0 Description of Pulse-Echo Ultrasonic NDI Technique 16

2.1 UT Pulse-Echo Scanner - Equipment Summary 21
2.2 UT Pulse-Echo Scanner - Electrical & Software Description 24
2.3 UT Scanner Overview and Hardware Components 27
2.4 UT Scanner Drawing Set and Materials List 33
3.0 Tripod Positioning Mechanism for Manual Ultrasonic Scanner 40
4.0 Ultrasonic Scanner Deployment in Orbiter Processing Facility 47

4.1 Option 1: Connection to Rail Cart Positioning Mechanism 49
4.2 Option 2: Scanner Deployment on Tripod Positioning Mechanism 51
4.3 Option 3: Scanner Resting on Top of RCC Panel 55
5.0 Performance Assessment of Pulse-Echo Ultrasonic Inspection System 57

5.1 Phase I Specimens Produced from Retired RCC Panels 57
5.2 Phase II Specimens Produced from Panel 9L 79
5.3 Final Validation Specimens: Complete RCC Panel 11L and Tee Seal 12L 94
5.4 Probability of Flaw Detection Results 129
Conclusions 131
Appendices
A RCC Life Cycle Wear Study - Effect of UT/EC Scanner System on

Surface of RCC Panels 132
B Pulse-Echo Ultrasonic Inspection Procedure for Space Shuttle
Silicon Carbide Coated Reinforced Carbon-Carbon (RCC)
Heat Shield Panels 157
5
This Page Intentionally Left Blank
6
Configuration Information on:

Technique, Hardware, Software, Design, and
Performance Testing for
Certification of UT Inspection System
Information for NASA Report:

NASA RCC NDE Test Report KSC-5600-7412
7
1.0 RCC In-Situ NDI Program Background
After the loss of OV-102 during STS-117, the Columbia Accident Investigation Board (CAIB)
was formed to investigate the accident and make recommendations to increase system safety
prior to return to flight (RTF). One of these recommendations was R3.3-1: Develop and
implement a comprehensive inspection plan to determine the structural integrity of all
Reinforced Carbon-Carbon system components. This inspection plan should take advantage of
advanced non-destructive inspection technology. An integrated team of participants from
NASA-JSC, NASA-Langley, Sandia National Laboratories, United Space Alliance (USA),
Oceaneering Space Systems (OSS) and Boeing has been working since 2003 to develop and
demonstrate nondestructive inspection (NDI) systems capable of performing inspection of
Reinforced Carbon-Carbon (RCC) leading edges on-wing in the Orbiter Processing Facility
(OPF). This report details the system development and validation of the ultrasonic testing (UT)
system for detecting flaws in RCC on the Shuttle Orbiter wing leading edge panels and mating
Tee Seals.
NASA Response to the Columbia

Accident Investigation Board
NASA must Continue to Manage the Space Shuttle

as a Development Vehicle:
• Be cognizant of the risks of using the Shuttle in

an operational mission, and manage accordingly.
• Perform more testing on Space Shuttle hardware rather than relying on

computer-based analysis and extrapolated experience to reduce risk -
Inspection plan for recertification of Shuttle for Flights.
• Address aging issues through the Space Shuttle Service Life Extension,
including midlife re-certification.
• Collaborate with high-risk industries such as nuclear power & aviation to

identify and incorporate best practices.
8
Leading Edge Shuttle System – Reinforced Carbon-Carbon
LESS/RCC Overview - Basic Requirements
• Thermal Protection (3200oF)
• Aerodynamic Shape
• Load Distribution
• Impact Resistance
Health Monitoring Objective:

Develop a comprehensive NDE
program for the in-situ health
monitoring of Orbiter RCC
components.
Nose Cap, Fwd External Wing Leading Edge

Chin Panel, Tank Attachment Panels and Seals
And Seals “Arrowhead” Plate
Space Shuttle Orbiter RCC Components
Nose Cap Wing

Leading
and Seals
Edge Panel
Chin Panel
and Seals
9
Areas To Be Inspected on Wing Leading Edge
20
(1-7)
(7-22)
Mandatory NDE Inspection

for Panels 5-19
Wing
Leading
Edge
Spar
Insulator Wing Leading Edge Spar
Line (4 planar surfaces)
12
Cooler portions of the OML are NOT

Hot convective surfaces on mandatory for flight-to-flight NDE
outer mold line (OML) inspection
towards the apex on panels
and gap seals are
mandatory for flight-to-flight
NDE inspection Radiative surfaces on RCC Interior
(lugs, ribs, flanges, gap seal webs)
are NOT mandatory for flight-to-flight
NDE inspection
Inspection Regions on Forward RCC

Nose Cap Expansion Seals (3 total) • Hot convective surfaces
Lower Seal OML inspection is mandatory on outer mold line (OML)
of the nose cap dome,
lower gap seals, and chin
panel are mandatory for
flight-to-flight NDE
inspection
Radiative surfaces on RCC

Interior (lugs, ribs, flanges,
gap seal webs) are NOT
Nose Cap Dome mandatory for flight-to-
OML inspection flight NDE inspection
is mandatory
Forward RCC Mandatory NDE Inspection

Locations Chin Panel & Seal (2 total)
OML inspection is mandatory
Nose Cap Tee Seals (5 total)

OML inspection of lower 3
seals mandatory
10
RCC Component Configurations
UPPER EDG E
POI NT 1
ARC LENGT HS ARE

MEASUR ED ON RCC
OML ALO NG SLI P
SIDE GAP
POI NT 2
POI NT 3
Wing Leading Edge Assembly

Nose Cap Assembly(78 x66 x41 , 544 lbs) 22 panel/seal sets on each wing
(31 x42 x35, 42 lbs typical for each)
ET Arrowhead Assembly
Chin Panel Assembly(67 x22 x18, 57 lbs)
(17 x14 x0.25 , 2 lbs)
Composition of RCC Heat Shield Panels

RCC is composed of carbon substrate, SiC conversion layer and sealant
Carbon Substrate – carries the load
Silicon Carbide Coating – protects the carbon

(craze cracking is prime concern)
TEOS & Type A – internal &

external protection for carbon
11
Deployment of NDI Devices in Orbiter Processing Facility
Nose section Upper RCC with

large overhang
from work platform
Lower RCC (from OPF

floor or platform floor)
Shuttle In-Situ NDI Program
Repetitive flight certification effort –

Dark streaks showing
Production NDI: UT, EC, X-ray, tap test projectile impact area
In situ NDI: consisted of visual and tactile inspections
Goal: deploy a variety of NDI methods to detect RCC

degradation that may compromise LESS performance
RCC Damage Scenarios - impact damage, loss of coating

integrity on the outer surfaces, carbon cracks/fracture,
delaminations, disbonds at Si-C to C-C interface, SiC craze
cracks & subsequent subsurface oxidation produces mass
loss & reduction in strength.
SiC
Carbon
SiC Coating Loss Mechanism via

Convective Mass Loss
12
LESS Thermal Data: WLE Temperature Profile
RCC Panel 19 Temp Contour Plot
Panels 5-19
RCC Panel Inspection Requirements

• NDE Feature Detection Criteria
– Delaminations, Laminar Voids and Local Mass Loss
• Detect delaminations, laminar voids & local mass loss in C-C using
IR thermography.
• Detection sensitivity at SiC/C-C interface on OML side: 1/8"
diameter with 0.005" thickness.
• Detection sensitivity at 0.12” depth from OML: 3/8" diameter with
0.005" thickness.
• Everywhere else in C-C, interpolate/extrapolate this criteria.
– D = 2.8 x d - 0.042“, where D = diameter in inches, d = depth from
OML in inches.
– Cracks
• IR Thermography is not required to detect OML cracks, but any
cracks (excluding craze cracks) detected by IR thermography shall
be reported.
• Detection Sensitivity: A crack with 1/2" length and 0.030" depth in
C-C (or 0.060" surface depth from OML for nominal coating
thickness of 0.030”) and complete separation between crack faces.
13
RCC Panel Inspection Requirements
• NDE Feature Detection Criteria
– Suspect area is identified by visual inspections, IR inspections, or
evidence of an impact/damage event.
– Criteria for further evaluation of suspect area using in-situ NDE.
• Delaminations and impact damage
– Detection sensitivity: 1/4” dia. Use ultrasonic hand scanning.
• Coating
– SiC coating thickness measurement range: 0.005" thru 0.060". Spot
size 1/4" dia. Use eddy current.
• Cracks
– Detection sensitivity: Same as for screening inspection. Use eddy
current.
– C-scan is not mandatory but handheld mapping is required.
• Cover the entire suspect area at the suspect location.
Flaw Detection Requirements for Depths Beyond the Initial Si-C to C-C Interface
D = (2.8 x d) - 0.042
D = flaw diameter in inches
d = depth from OML in inches
0.5
Backside Si-C to C-C Interface in
0.40" Thick RCC Panels
0.4
-------------------------------------------------------------------
Backside Si-C to C-C Interface in

0.3
0.25" Thick RCC Panels
----------------------------
0.2
0.1
0
0.2 0.4 0.6 0.8 1 1.2 1.4
Flaw Diameter (D)
14
Ultrasonic Attenuation vs. Flexural Strength
Data acquired from LMMFC for

localized porosity analysis via
MRB (ref. 3-47200/4L-118)
Data from 1970 s with mass loss
specimens representing the
lower strength samples
Felxural Strength (ksi)
∆ 5dB = ∆1.4ksi
∆10dB = ∆2.7ksi
∆15dB = ∆4.1ksi
∆20dB = ∆5.4ksi
Attenuation (dB)
RCC Mass Loss Relationships

• Mass loss of RCC substrate is directly related to
temperature – especially over 2500°F
– Radiant areas (lugs, ribs, flanges) lose
mass uniformly through the thickness and
have a 0.10 psf loss limit
– Convective areas (OML) loose mass
preferentially at the coating interface and
have a 0.03 psf mass loss limit
• “Invisible” RCC defects are caused by
subsurface mass loss in the convective regions
– This is the key item for flight-to-flight NDE
inspections
SiC
Carbon
SiC Coating Loss Mechanism via

Convective Mass Loss
15
Interface Block Diagram of Shuttle Inspection in Orbiter Processing Facility
Struc Power
Positioning
Water Data Tripod
Subsystem
Air
Operator
Flash
Eddy Current Ultrasonic
Orbiter Thermography
Inspection Inspection
Processing Inspection
Assembly Assembly
Facility Assembly
(OPF)
Operator Operator Operator Orbiter

Workstation & Workstation & Workstation &
Support Equipment Support Equipment Support Equipment
FLASH THERMOGRAPHY EDDY CURRENT PE-ULTRASONIC

SUBSYSTEM SUBSYSTEM SUBSYSTEM
NDE SYSTEM STATION SET

I/F I/F
2.0 Description of Pulse-Echo Ultrasonic NDI Technique

Pulse-Echo Ultrasonic (P-E UT) inspections, short bursts of high frequency sound waves are
introduced into materials for the detection of surface and subsurface flaws in the material. The
sound waves travel through the material with some attendant loss of energy (attenuation) and are
reflected at interfaces. The reflected beam is displayed and then analyzed to define the presence
and location of flaws. Complete reflection, partial reflection, scattering, or other detectable effect
on the ultrasonic waves can be used as the basis of flaw detection. In addition to wave reflection,
other variations in the wave that can be monitored include: time of transit through the test piece,
attenuation, and features of the spectral response. The types of RCC flaws detectable by the
ultrasonic method include cracks, delaminations, voids, local mass loss, global mass loss, and
impact damage.
Wide Area Inspections Aided by C-Scan Mode - It is sometimes difficult to clearly identify
flaws using ultrasonic A-Scan signals alone. Small porosity pockets commonly found in
composites, coupled with signal fluctuations caused by material nonuniformities can create
signal interpretation difficulties. Significant improvements in disbond and delamination
detection can be achieved by taking the A-Scan signals and transforming them into a single C-
Scan image of the part being inspected. C-scans are two-dimensional images (area maps)
produced by digitizing the point-by-point signal variations of an interrogating sensor while it is
scanned over a surface. A computer converts the point-by-point data into a color representation
and displays it at the appropriate point in an image. Specific “gates” can be set within the data
acquisition software to focus on response signals from particular regions within the structure. C-
16
Scan area views provide the inspector with easier-to-use and more reliable data with which to
recognize flaw patterns. This format provides a quantitative display of signal amplitudes or
time-of-flight data obtained over an area. The X-Y position of flaws can be mapped and time-of-
flight data can be converted and displayed by image processing-equipment to provide an
indication of flaw depth.
Amplitude and Time-of-Flight Data - Once the digitized A-scan waveforms are recorded during
the ultrasonic pulse-echo inspection of the RCC material, the amplitude and time of flight peak
signals can be displayed as a C-scan image and analyzed to determine if a flaw exists within the
material. The reflected beam from the back surface of the RCC material can be used as the
starting point for this analysis. The pseudo colored C-scan image can reveal several variations
within the RCC material. The peak amplitude from the back surface is affected by the
attenuation within the material and will be displayed in the pseudo colored C-scan image. Any
large amplitude change (>12db) in the C-scan image shall be reported. Depending upon the
geometry of a flaw and location within the RCC material, the amplitude might not appear very
different than that of the surrounding back surface. This is where the time of flight C-scan image
can show a slight shift in the pseudo color of the back surface. By analyzing both pseudo colored
images (amplitude and time of flight) and the A-scan waveforms, the inspector can determine if a
flaw exists within the RCC material. The time of flight C-scan image also shows thickness
variations or the taper along the edges of the RCC panel.
Pulse-Echo Ultrasonic NDI

1 2 Transducer is both transmitter &
3 4
receiver to keep footprint small
Transducer A UT Response Signal
1
CC 2
DD
5 C
D
1 E F
3
Transducer B UT Response Signal
UT Pulse
Generator
Ultrasonic
Transducer
UT Gel
A B
Couplant
Flaw
Pool 1 Composite Doubler
Aircraft Skin 2 5 A-Scan Signal Trace –
Adhesive Layer 3 Gate 1: delam & porosity
Tear Strap 4 Gate 2: bond interface
Schematic of Pulse-Echo Ultrasonic Gate 3: alum. back wall echo
Inspection and Reflection of UT
Gates allow users to focus on
Waves at Assorted Interfaces
specific phenomenon
UT Niche penetration for deep flaw detection
17
Pulse-Echo Ultrasonic NDI – C-scan Approach
1", 1/2", & 1/4" Disbonds
C-Scan Approach
Color coded image
produced from relative
3.0"
characteristics of the sum
total of signals received
3.0"
• Gate settings, appropriate gain,

& data acquisition mode are key 3-Dimensional Image
elements
• Dynamic display of data is best
for flaw detection
• Optimum probe (signal
strength) is critical in highly
attenuative RCC material
Pulse-Echo Ultrasonic NDI – C-Scan Approach
Manual Scanner
Laptop
Data
Acquisition
Manual Scanner Automated Scanner
Inspection Impediments and Considerations

- Thickness of structure and energy level of excitation
- Attenuation & near-surface signal clarity
- Optimizing S/N ratios; flaw size & depth sensitivity
18
Pulse-Echo Ultrasonic Set-Up
• Smallest footprint for best

coverage and navigation of
curved or uneven surfaces
• Probe variables studied:
Ø 1”, 2”, 3”, 5” focus
Ø 0.5”, 1”, 1.5” dia.
Ø 1- 2.25 MHz freq. Weeper Body
To Data Acquisition System
Ø flat & focused beam

Ultrasonic Transducer
• Probe optimization – Harisonic
1 MHz, 1” dia., 2” focus (RCC Plastic Membrane
mat’l passes 1.5 MHz) Scanning Shoe for
Water Inlet
(pumped in from reservoir)
Offset of UT Wave Captured Water Column
• Probe offset – water column of Excess Water Flow
1.1” to 1.2” Water Couplant Pool (recovered into reservoir)
Inspection Surface
Pulse-Echo Ultrasonic NDI – Flaw Detection Applicability

Goal: detect structural anomalies at all depths within RCC
Physical Detect Fasteners/
Large Significant Local Impact Coating
Technique Contact Deep Delams Mass Tubular
Voids Porosity Damage Msmts.
Required Flaws Loss Voids
Contact P-E
Ultrasonics
X X X X X X X Voids
Sensitivity issue (ref. arc jet disks)

NDE Requirements Document:
Pulse-Echo Ultrasonics (P-E UT) will detect structural anomalies with at least 0.25" X 0.25"
planform dimensions (minimum aspect ratio of 1.0), at any depth within the RCC material at or
below the outer surface interface between the Si-C and C-C, and within 0.5" of the panel edge at
the interface with the T-seal. Inspections will be performed using a frequency of 1 MHz.
Structural variations that manifest themselves as attenuation of an interrogating ultrasonic
wave will be assessed in accordance with existing guidance for allowable attenuation levels in a
Through-Transmission Ultrasonic (TTU) inspection. Attenuation levels produced in TTU will be
related to equivalent attenuation levels in P-E UT so that the same resolution and sensitivity can
be achieved. Attenuation levels will be obtained by reference to adjacent locations of the same
thickness. Structural anomalies detected as per the above discussion include: cracks,
delaminations, and voids/porosity/mass loss. They do not include coating thickness
measurements.
19
Ultrasonic Method Trade Study
• Feasibility study for in-situ RCC ultrasonic inspection performed May to
November 2003
– Assessed multiple ultrasonic composite inspection options using RCC test
specimens: pulse-echo UT, resonance, mechanical impedance analysis, low
frequency bond test
– Research performed by Sandia Labs with support from Lockheed-Martin,
General Electric Corp. Research, SAIC, Boeing, Krautkramer, and Staveley
– Assessed scanner systems based on following criteria: wide area inspection,
automated X-Y coverage, portability, established I/O (data acquisition &
reduction software), lab and field technical support, rapid accommodation of
customization needs
– Results presented at RCC NDE downselect TIM November 2003
• Decision to proceed with UT for in-situ inspection received Dec. 2003

– UltraSpec scanner system with 1 MHz, 1” dia., 2” spherical focus transducer
selected for thru-thickness flaw detection
Timeline and Decision Tree for Ultrasonic Method
UT for RCC Feasibility Study

5/2003
State of the Art Review
Pulse-Echo
In-Situ System Design and
Resonance Fabrication
MIA
LFBT P-E Scanning Optimization UltraSpec Scanning System
with 1 MHz, 2” Sph. Focus
Transducer Design Scanning System Transducer; Water Coupling
with Partial Recovery
Krautkramer (GE) MAUS
Panametrics SAIC
Staveley (Harisonic)
Transducer Deployment
Pulse-Echo Probes Probe housing/weeper system design
Immersion End cap modified for surface water removal
Contact Spring vs. pneumatic contact
Dual element contact
Transducer Suppliers
Harisonic
Krautkramer
Identify Initial Final
Options Downselect Downselect
5-11/2003 11/2003 6/2004
20
UltraSpec Pulse-Echo Scanning - Equipment Summary
– Probe Assembly
• Sensor
• Sensor Housing
• Gimbal Assembly
• Z-Axis Assembly
– Scanner Assembly
– Support Equipment
• I/O Box
• Water Management
– Operator Workstation
SAIC Ultraspec-MP with LPS-100 Manual Scanner
Technical Specifications
Physical Characteristics
· Scanner height: 2.00 inches
· Scanner width: 6.0 inches
· Scanner length: 12.0 inches
· Scanner weight: 7.0 pounds
RCC system specs

· Encoder resolution: 910 pulses/inch
· Positional accuracy: + or - 0.005 inches
· Repeatability: 0.005 inches
· Stroke: 6.0 inches X-axis,
12 inches Y-axis
21
Pulse-Echo Ultrasonic NDI System
• Lightweight (6 lb.), manual scanner
• Local flaw detection assessment in areas identified by thermography
• Can scan up to 12” X 6” area
X increment –
12 “
Advantage: easier & more
rapid to deploy
Limitation: restricted to
“
–6
small area scans
ent
em
ncr
Yi
UT Probe
Pulse-Echo UT System Components

• LPS-100 manual scanner, Data Acquisition System (DAS), laptop
• NASA LaRC linear spring probe mount; probe housing, weeper couplant
LPS-100
Scanner,
Tripod
positioning
mechanism,
DAS and
Laptop
UT Transducer and Housing LaRC Linear Spring
22
UT/EC Manual Scanner (LPS-100)
• Integrates with existing SAIC scanning station

• Designed for 12” X 6” max scan area
• Weight with UT probe is 7 lbs.
13.07"
18.90"
3.31" 2.00"
UltraSpect-MP
Basic Manual Scanning System Interconnection Diagram
Transducer/Probe
e
Scanner
Data Acqusition Module

Encoder Cable
(DAS)
EC Probe 1,2
UT Ch 1
Ultrasonic Pulse/Echo
UT Ch 2
Vacuum Utilities LAN
110 VAC
UltraSpect MP 110 VAC
110 VAC Laptop
• Dimensions
Laptop – Sony VAIO, Model PCG-8N1L
13.9” x 11.8” x 2.0” (Closed)
13.9” x 11.8” x 13.1” (Open @ 90 deg)
DAS Unit – 16.5” x 12.6” x 7.4”
Utility Box (Vacuum) – 20.5” x 16.5” X 16.5”
Manual Scanner – 20” x 15” x 3.5”
23
UltraSpect-MP Electrical System
Output Voltage Levels: Maximum Values
Ø Encoder Cable – 5 V
Ø UT Pulser – 400 V, maximum duration 1000 nsec
Ø EC Coil Drive – 20 V
Output Amperage Levels:

Ø Encoder output to the scanner encoders is 5VDC and is fused at 1.25
amps, however, the actual encoders only draw about 35 milli amps
Ø UT Pulser (peak amperage) - UT pulser charges a capacitor of 0.3
microfarad. It is then discharged to generate a pulse. At the maximum
pulser voltage of 400 V, and a given transducer impedance (typical value
50 ohms), the current draw (according to Ohm's law) is 400/50 = 8 amps
for the duration of the pulse. If a square wave pulser is used, this
Outputduration can be
Amperage varied(continued):
Levels up to 1000 nanoseconds.
Ø UT Pulser (RMS amperage) -
RMS current = peak current * SQRT (T1/T2) where T1 is the pulse on
time (width) and T2 is the off time, which is related to scan speed and
grid size.
Apply Sandia Labs inspection set-up:
Transducer impedance = 75 ohms
Pulser voltage/duration = 300 V, 700 nanoseconds
Scan speed 6 in/sec
Scan index = 0.020" (estimate)
Max current = 300 v/75 ohms = 4 amps
T1 = 700 nsec = 700 x 10^-9 sec
T2 = 1/ ((6 in/sec) / 0.020" index) = 1/300 pts/sec = 0.003333 sec
RMS current = 4 * SQRT[700*10E(-9)/0.003333] = 58 milli amps
* For the safety of the operator, never change a UT probe with the pulser
running. Always close the UT calibration application before changing probes
since it is possible to generate a spark between the connector and probe if
the connect/disconnect is made while the pulser is running.
24
UltraSpect Software Description
Analysis package is the UltraSpect System. The data acquisition software is used to set up the the
process for collecting the information from the different inspection methodologies. The analysis
package allows the acquired data to be analyzed on another computer without tying up the Control
Laptop computer.
The set-up features for data acquisition software does the following:
Ultrasound
Pick the type of scanner
Set up the scanner parameters (x & y scan length, grid size, scan speed)
Ultrasonic parameters (i.e. number of transducers, frequency, time base, number of gates, and
other UT parameters)
Display data acquisition results while scanning.
Eddy Current
Pick the type of scanner
Set up the scanner parameters (x & y scan length, grid size, scan speed)
Eddy Current parameters (i.e. number of probes, frequency, time base, etc)
Display data acquisition results while scanning.
Data analysis for UT
This allows the data acquired to be viewed in various formats (A-scan, B-scan, C-scan). Specific
areas can be zoomed in to view features, gate position and amplitude can be moved to create
additional views
Data Analysis for ET
This allows the data acquired to be viewed in various formats (Lissajous pattern, strip chart, color
C-scan) Certain parameters may be changed to create new images without rescanning the part
A list of the software items follows:
UltraSpect-MP system with Ultrasonic and Eddy Current Capability
Each scanner system includes the following software:

Ultrasonic Data Acquisition Acquisition software
Ultrasonic Data Analysis software.
Eddy Current Data Acquisition software
Eddy Current Data Analysis Software
Microsoft Windows XP Operating System

Microsoft Office XP
Additional Ultrasonic Data Analysis software and Eddy Current Data Analysis software was
purchased (2nd seat) to allow the acquired data to be analyzed on another computer without
tying up the Control Laptop computer.
The procedures for the use of the software is included in the training/operating manuals.
The latest version of software is Version 6.12.2
25
UT Sensor Description
• Manufacturer: GE Inspection Technologies / Krautkramer
Benchmark Series
Immersion Transducer
1 MHz / 1 inch diameter
2 inch spherical focus
• Transducer Part Number : 389-058-620
• Special Descriptor for Custom NASA Probe:

SPFPA-IS8B1NOKNURL2”UHF
Equipment List (For One UT Scanner Unit)
LPS-100 Scanner & DAS – SAIC

UT Transducer – GE/Krautkramer
Weeper System & Transducer Housing – Test Tech
Linear Spring - NASA
Recommended Spares: transducers, scanner cable

bundles, transducer housing, transducer articulation
(yoke, linear spring), weeper system with recovery
26
UT/EC LPS-100 Manual Scanner Details
Y-axis thumb
wheel and lead
screw for precise
indexing
Spring loaded pivot for

probe contact compliance
Probe mount stage
Pulse-Echo UT System Components

• Component list:
– Operator workstation Laptop and DAS software
– I/O Controller Data acquisition module
– Sensor housing Weeper body/transducer with yoke & spring
Linear Scanner Y-Stage

Spring Attachment Bracket
Mount
Ultrasonic
Transducer
Laptop computer,
DAS control box,
Manual Scanner Weeper
Body
Water Line In
Weeper Body Holding UT Transducer
27
UT and EC Scanner System Hook-Up
Connections on Back of DAS Box:
1. UT transducer ⇒ T/R1 (BNC connector)
2. EC transducer ⇒ Probe 1 (9 pin, male)
3. Scanner position encoders ⇒ 9 pin
female connector
4. Network jumper (blue cable) ⇒ connect
LAN to top Network Port
5. DAS-to-computer (orange cable) ⇒
second port on Network
Ports card
6. Power supply to DAS
Data Acquisition Box
Connections on Back of Laptop:

1. Power supply to computer
2. Computer-to-DAS (orange cable)
3. Mouse
Laptop Computer
Manual Scanner with Linear Spring and Probe Attached
28
UT Sensor Housing, Gimbal Assembly, and Z-Axis Tracking Hardware
Assembled View of Weeper Body/Transducer with Yoke & Spring
Scanner Arm
Ultrasonic Weeper Urethane
and Y-Stage
Transducer End Cap Membrane
Water Water
Linear
Line In Line In
Spring
Mount
Weeper
Body
Articulating Yoke
UT Sensor Housing, Gimbal Assembly, & Z-Axis Hardware

Individual View of Weeper Body and End Cap with Yoke & Spring
Water Inlet Weeper Body
Weeper End Cap

with Membrane
UT Transducer
Linear Spring
(Z translation)
Yoke
(X-Y rotation)
29
Individual View of Weeper Body, Ultrasonic Transducer,
Connectors and Coax Cable
Coax
Cable
LIMA-to-BNC
Connector RF-to-BNC
Connector
Ultrasonic
Transducer
Weeper
Body
Yoke
Schematic of Assembled Ultrasonic Sensor System

Weeper Body and Ultrasonic Transducer
To Data Acquisition System

Weeper Body
Ultrasonic Transducer
Plastic Membrane
Water Inlet
Scanning Shoe for (pumped in from reservoir)
Offset of UT Wave
Captured Water Column
Excess Water Flow

Water Couplant Pool (recovered into reservoir)
Inspection Surface
30
View of Assembled Ultrasonic Sensor System
Weeper Body, Yoke, Ultrasonic Transducer, Connectors, and Coax Cable
Coax
Cable Ultrasonic
Transducer
Connectors
Weeper
Body
Yoke
Weeper Base/Membrane
UT/EC Sensor Surface Following with Z-Axis Linear Spring
31
Component Weights
1. Ultrasonic Probe – 178.9 g (6.3 oz.)
2. Probe Housing – 56.8 g (2 oz.)
3. Linear Spring – 147.7 g (5.2 oz.)
Linear Spring Force

• Left Spring – 1.12 lbs.
• Right Spring – 1.12 lbs.
• Both Springs Engaged – 2.24 lbs.
Urethane
Pressure Loads – see section on 1” Membrane
shear and normal force
assessment
1.75”
Transducer
Housing
End Cap
Water Management Equipment Description

Weeper Water Supply and Return (not shown: reservoir top and
base for secondary/safety water containment)
Water
Water
Output
Pump
Weeper 110 AC
Bucket Power Cord
32
Top Level Drawing of Pulse-Echo Scanner System
NOTES:
4 1. REMOVE VACUUM MOUNTING PLATE FROM MANUAL SCANNER
18 2 45 34 49 BEFORE ASSEMBLING SCANNER TO TRIPOD.
3X 2X
2. MAY BE PURCHASED FROM MCMASTER-CARR SUPPLY CO,
9630 NORWALK BLVD, SANTA FE SPRINGS, CA 90670-2932
PH. (562) 692-5911.
3. MAY BE OBTAINED FROM NASA LANGLEY RESEARCH CENTER.
4. MAY BE PURCHASED FROM SAIC - TRANSPORTATION AND

10 3X SECURITY TECHNOLOGY GROUP, 16701 WEST BERNARDO DRIVE,
MS RB-2, SAN DIEGO, CA 92127. PH. (858) 826-5324
5. MAY BE PURCHASED FROM NDT SYSTEMS INC,

4 17811 GEORGETOWN LANE, HUNTINGTON BEACH, CA 92647.
PH. (714) 848-8895
6. MAY BE PURCHASED FROM TESTECH INC, 210 CARTER DRIVE,

UNIT 4, WEST CHESTER, PA 19382. PH. (610) 696-4100
6 7. WHEN ITEM 21 (EDDY CURRENT PROBE ASSEMBLY RCC) IS
USED THE FOLLOWING UT RELATED ITEMS ARE NOT
NECESSARY: 12, 20, 23, 27, 28, 29, AND 30.
8 16
2X 2X
2
TRIPOD LEG TIEDOWN DETAIL
TRIPOD TIEDOWN COLLAR DETAIL 33 40

4X
12
27 6
3
ALT
WEEPER RESERVOIR DETAIL
6 6 6 5
2X (UT) (EC)
34 44 28 29 30 23
46 OR 47 20 OR 21
4X (FOR MOUNTING
3 3 7
SCANNER ON UNDERSIDE)
22 4 5
32 37
8X
2
1 17 (PIN)
2X
41 33
9 8X
2X 34 45
36 32 4X
9 REF
4X 26 7
SCANNER TRIPOD ASSEMBLY
DWG. NO. NASA-1

25 K. RACKOW, 845-9204
D. ROACH, 844-6078
DATE: 2-16-05 REV. #1 SCALE: 1/2
AANC
SANDIA NATIONAL LABORATORIES
33
Pulse-Echo Scanner System –
Top Assembly List of Materials
Scanner Tripod Assembly List of Materials
Qty Part No. Description Note Item No.
50
2 Nut, Hex, Plain, Steel, .190 (#10)-32UNF-2B 49
48
4 Screw, 82 Csnk Head, Steel, .190 (# 10) - 32UNF - 2A X 1.50" Lg. 47
4 Screw, 82 Csnk Head, Steel, .190 (# 10) - 32UNF - 2A X .625" Lg. 46
6 Screw, Socket Head, Steel, .190 (# 10) - 32UNF - 2A X .75" Lg. 45
2 Screw, Socket Head, Steel, .190 (# 10) - 32UNF - 2A X .625" Lg. 44
43
42
8 Screw, Pan Head, Steel, .164 (# 8) - 32UNC - 2A X .625" Lg. 41
4 Screw, Socket Head, Steel, .164 (# 8) - 32UNC - 2A X .50" Lg. 40
39
38
35
8 Washer, Lock, Nom. I.D. # 10 (.190") 34
31
1 30701AM067 BNC to BNC 12" lg. RG174 (50 ohm) Coaxial Cable 6 30
1 30701AM063 BNC/RA Adapter 6 29
1 30701AM62 UHF/BNC Adapter 6 28
1 30701AM100 Weeper Captive Water Column Kit 6 27
1 PSC-3057 Bogen Tripod, Head, Model 3057 26
1 PSC-3058 Bogen Tripod, Model 3058 25
24
1 ALRB02 Lemo Right Angle Plug/BNC Receptacle 5 23
1 LPS100 SAIC Ultra Spec Manual Scanner System 4 22
1 1245825 Eddy Current Probe Assembly RCC 3 21
1 1245938 Ultrasonic Probe Assembly RCC 3 20
19
3 3032T64 Eyebolt, Stainless Steel, W/ Nut, 1/4"-20 thd. 2 18
2 92373A115 Spring Pin, Steel, .062" dia X 1.00" Lg. 2 17
2 90079A245 Knurled Head Pilot (Dog Point) Thumb Screw 1/4"-20 x 1.00" Lg. 2 16
15
14
13
1 NASA-3-WC Probe Holder Assembly 12
11
3 NASA-10-SC Tripod Leg Tiedown Strap 10
2 NASA-9-SC Linear Slide Stop Plate 9
2 NASA-8-SC Linear Slide Positioning Stop 8
1 NASA-7-SC Modified Tripod Head Mounting Plate 7
1 NASA-6-SC Modified Linear Slide Mount 6
1 NASA-5-SC Scanner Mounting Plate 5
1 NASA-4-SC Tripod Tiedown Collar 4
1 NASA-3-SC Probe Holder Extended Attachment Bracket 3
1 NASA-2-SC Probe Holder Standard Attachment Bracket 2
2 NASA-1-SC Scanner Spring Lock Shim 1
34
Design Drawing Set for Pulse-Echo Ultrasonic System
SNL Drawings for NASA Scanner Assembly

Drawing Title Drawing No.
Captive Water Column NASA-1-WC
Modified Membrane NASA-2-WC
Probe Holder Assembly NASA-3-WC
Scanner Spring Lock Shim NASA-1-SC
Probe Holder Standard Attachment Bracket NASA-2-SC
Probe Holder Extended Attachment Bracket NASA-3-SC
Tripod Tiedown Collar NASA-4-SC
Scanner Mounting Plate NASA-5-SC
Modified Linear Slide Mount NASA-6-SC
Modified Tripod Head Mounting Plate NASA-7-SC
Linear Slide Positioning Stop NASA-8-SC
Linear Slide Stop Plate NASA-9-SC
Tripod Leg Tiedown Strap NASA-10-SC
Scanner Tripod Assembly NASA-1
Maximum Height Tripod Deployment Layout NASA-2
Minimum Height Tripod Deployment Layout NASA-3
35
UT Transducer Housing
Drawing of Delrin body, for proper probe offset from
inspection surface, and water coupling
NOTES:
1. MATERIAL: BLACK DELRIN.
2. TOLERANCES NOT SHOWN ARE AS FOLLOWS: .XX" = _
+ .010" AND
.XXX" = + _1 .
_ .003. ANGULAR TOLERANCES = +
2.250"
1.650"
1.480"
1.340"
0.140"
180° .190 (#10) -32UNF - 2B

0.330" 0.187"
(SPOTFACE)
0.300"
0.814"
1.412" 1.260" 0.875" 0.625" 0.813" 1.125"
35°
0.025"
R .005 MAX.
1.559"-1.562" DIA 1.25-16UN-2A
1.850" 0.200"
1.450"
CAPTIVE WATER COLUMN
DWG. NO. NASA-1-WC
2X .125"-.127" DIA X .100" DP K. RACKOW, 845-9204
D. ROACH, 844-6078
DATE: 4-13-05 REV. #1 SCALE: 2/1
AANC
36
UT Transducer Housing
NOTES:
1. MAY BE PURCHASED FROM: TESTECH INC. , 210 CARTER DR.,
UNIT 14, WEST CHESTER, PA 19382, PH. (610) 696-4100.
2. MAY BE PURCHASED FROM: PARKER SEAL GROUP, O'RING DIVISION,

10 2360 PALUMBO DRIVE, PO BOX 11751, LEXINGTON, KY 40512.
PH NO. (606) 269-2351
3. MAY BE PURCHASED FROM: MCMASTER-CARR SUPPLY COMPANY,

PO BOX 54960, LOS ANGELES, CA 90054-0960. PH. NO. (562) 692-5911
11 (SLIDES IN FOR SEAL 4. MAY BE PURCHASED FROM: GE INSPECTION TECHNOLOGIES,
AGAINST O'RING) 50 INDUSTRIAL PARK ROAD, LEWISTOWN, PA 17044.
PH. NO. (717) 242-0327
(SPECIAL NOMEMCLATURE: SPFPA-IS8B1NOKNURL2"SUHF)
5. SEAL END OF TUBE FITTING BY WRAPPING TEFLON TAPE

AROUND THREADS BEFORE ASSEMBLING.
8 AR TEFLON TAPE 5 12
1 389-058-620 2" SPHERICAL FOCUS UT TRANSDUCER, 1MHZ, 1" DIA 4 11
1 5454K12 BARBED TUBE FITTING, BRASS 3 10
9
1 2-124 N64-70 O'RING 2 8
1
7
1 30701AM011-80 "V" MEMBRANE END CAP 1 6
1 30701AM010-1 SPACER RING 1 5
1 NASA-2-WC MODIFIED MEMBRANE 4
1 30701AM005 MEMBRANE END CAP 1 3
2
1 NASA-1-WC CAPTIVE WATER COLUMN 1
3 OR 6 QTY PART NUMBER DESCRIPTION NOTE ITEM

LIST OF MATERIALS
(APEX SCANNING)
PROBE HOLDER ASSEMBLY
DWG. NO. NASA-3-WC

K. RACKOW, 845-9204
D. ROACH, 844-6078
DATE: 2-22-05 REV. #1 SCALE: 2/1
AANC
37
UT Transducer Housing –
Water Column Membrane
NOTES:
1. THIS PART MAY BE PURCHASED FROM: TESTECH INC. , 210 CARTER DR.,
UNIT 14, WEST CHESTER, PA 19382, PH. (610) 696-4100.
2. THE MEMBRANE PART NUMBER IS 30701AM050.
3. TOLERANCES NOT SHOWN ARE AS FOLLOWS: .XX" = +
_ .010" AND
.XXX" = _
+ .003. ANGULAR TOLERANCES = +
_ 1.
5X 72°
(1.25")
.780
MODIFIED MEMBRANE
DWG. NO. NASA-2-WC
K. RACKOW, 845-9204
5X .040-.045 (0.015") D. ROACH, 844-6078
DATE: 11-03-04 REV. #1 SCALE: 2/1
AANC

Assembled View of Weeper Body/Transducer with Yoke & Spring
5.53"
1.13"
SCANNER ARM
1.000"
1.00"
1.89"
(PROBE HOLDER
1.50"
MOUNTING. ADJUSTMENT)
1.80" (PROBE OFFSET

ADJUSTMENT)
3.00"
38
Normal Bracket for Connecting Probe Housing to Scanner Arm
NOTES:
1. MATERIAL: TO BE MADE FROM ANGLE, ALUMINUM, 6061-T6.

_ .03" AND
.XXX" = +
_ .005" .
4X .147 - .152 DIA THRU
1.000"
0.375"
1.000" 1.750" 4X R .125

1.000"
0.187"
0.375"
6X .190 (#10) - 32UNF - 2B THRU
3.00"
2.125"
1.375"
PROBE HOLDER STANDARD

ATTACHMENT BRACKET
0.625" DWG. NO. NASA-2-SC
1.75" K. RACKOW, 845-9204
3.00" D. ROACH, 844-6078
DATE: 1-10-05 REV. #1 SCALE: 1/1
AANC
Reach Extension Bracket for Connecting Probe Housing to Scanner Arm

NOTES:
1. MATERIAL: TO BE MADE FROM ANGLE, ALUMINUM, 6061-T6.

1.750" 1.000"
_ .03" AND
.XXX" = +
_ .005" .
0.250" 1.000" 1.50"
5.50" R .25
4X .147 - .152 DIA THRU
R .25
0.75"
1.000" 4.125" 4X R .125

0.187" 6X .190 (#10) - 32UNF - 2B THRU
2.75"
2.125"
1.375"
0.625"
PROBE HOLDER EXTENDED

3.00" ATTACHMENT BRACKET
DWG. NO. NASA-3-SC
K. RACKOW, 845-9204
D. ROACH, 844-6078
DATE: 1-11-05 REV. #1 SCALE: 1/1
AANC
39
3.0 Tripod Positioning Mechanism for Manual Ultrasonic Scanner
Tripod Positioning Mechanism Design Parameters

Vertical Reach
Upper height: 70”
Lower height: 46”
Horizontal Reach*
Max: 18”
Min: 1”
• Easy transport & set-up
• Can support 16 lbs.
• Provide upright and

inverted scanning
• Positioning locks
• Stabilized by tie-downs
* Assumes PIC boards are not in place & are not

available for supporting tripod legs
Integration of Manual Scanner with Tripod Positioning
Linear slide (with

motion locks)
mounted on tripod –
Allows for inverted
scanning and
scanning in vertical
direction
40
Modified COTS Linear Slide Mount for Scanner Base – Placed on Top of Tripod
1.562" NOTES:
0.500" 1. TOLERANCES NOT SHOWN ARE AS FOLLOWS: .XX" = +_ .03" AND
_ .005" .
.XXX" = +
0.375" 2. SLIDE MAY BE PURCHASED FROM:
SPECIALTY MOTIONS INC.
4X .190 (#10) -32UNF-2B 22343 LA PALMA AVE. #112
THRU YORBA LINDA, CA 92887
1.250" (800)283-3411
PART NO. SSA08C-L24
4X .190 (#10) - 32UNF - 2B X .30" DP

3.375" (FLAT BOTTOM TAP)
0.563" 0.563" 0.188"
(4.50")
.375 - 16UNC - 2B THRU
2.250"
3.375"
4.125"
(4.50")
2X 1.875" 4X .164 (#8) - 32UNC - 2B

0.750" THRU
2.250" 2X
VIEW A-A
4X .190 (#10) -32UNF-2B

1.250" THRU
0.375"
0.500"
1.562"
2.435"
1.905" 4X .138 (#6) - 32UNC - 2B
X .28 DP (FLAT BOTTOM) 1.000" TYP 24X .187 - .191 DIA X .095 - .100 DEEP
0.655" (BOTH ENDS OF SLIDE) BOTH SIDES FLAT BOTTOM HOLE
0.125" 0.500" (NON-ACCUMULATIVE) BOTH SIDES
0.438" BOTH SIDES
MODIFIED LINEAR SLIDE MOUNT
0.125" (0.305") BOTH SIDES DWG. NO. NASA-6-SC
(NOTE: CENTERLINE OF THESE HOLES MUST BE K. RACKOW, 845-9204
IN LINE WITH CENTERLINE OF .25" THREAD ON D. ROACH, 844-6078
A A POSITIONING STOP WHEN MOUNTED TO BASE)
(2.56") DATE: 1-25-05 REV. #1 SCALE: 1/2
AANC
41
Existing Scanner Rail Base for Connecting
Manual Scanner to Tripod Positioner
0.876"
0.312" 1.500"
2.591" 0.751" 0.751" 2.591"
11.754"
2.544"
0.844"
18.531"
Y-Arm Rotational Spring Locking Shim (Prevents Rotation of Y-Arm)

NOTES:
1. MATERIAL: HIGH-DENSITY POLYETHYLENE, .250" STOCK THICKNESS.
0.218"
2. MAY BE PURCHASED FROM MC MASTER-CARR SUPPLY CO,
PO BOX 54960, LOS ANGELES, CA 90054-0960.
_ .02" AND
.XXX" = _
+ .005" .
0.56" 0.153"
0.440" 2X R.06 MAX. 0.077"

.062-.065 DIA
THRU
1.58"
0.844" 2.00"
1.800"
1.20"
0.618"
SCANNER SPRING LOCK SHIM

0.126"
4X .171-.175 DIA THRU DWG. NO. NASA-1-SC
K. RACKOW, 845-9204
1.188" D. ROACH, 844-6078
DATE: 11-30-04 REV. #1 SCALE: 1/1
1.44" AANC
42
Mounting Plate for Placing Scanner on Tripod Positioning Mechanism
NOTES:
1. MATERIAL: ALUMINUM, 6061-T6, .250" THK.
2. TOLERANCES NOT SHOWN ARE AS FOLLOWS: .XX" = _

+ .03"
AND .XXX" = +
_ .005" .
12.88" 0.84"
6.219" 1.562"
0.84"
0.28"
2.00" 1.25" 1.19"
0.38" 0.41"
14.00"
4X .205 - .211 DIA THRU 8X .180 -.185 DIA. THRU
CSK .386 -.392 DIA X 82
Adapter Plate for Mounting Linear Slide on Tripod

NOTES:
1. PART TO BE MODIFIED IS A BOGEN ADAPTER PLATE
PART NO. 3297.
3.375"
4X .234-.240 DIA THRU

3.375" (THRU EXISTING TAPPED
HOLES)
43
Locking Plates for Holding Linear Slide Position
NOTES:
1. MATERIAL: ANGLE, ALUMINUM, 6061-T6, .188 THK.

2X .189-.194 DIA THRU 2. TOLERANCES NOT SHOWN ARE AS FOLLOWS: .XX" = +
_ .02"
0.750"
AND .XXX" = + .005" .
_
0.250"
0.562"
0.625"
0.188"
2X R .12 MAX .250 - 20UNC - 2B THRU
0.188" 1.63"
1.325"
LINEAR SLIDE POSITIONING STOP

0.75" 1.25"
DWG. NO. NASA-8-SC
K. RACKOW, 845-9204
D. ROACH, 844-6078
DATE: 11-29-04 REV. #1 SCALE: 1/1
AANC
Safety Stop Plate for Retaining Linear Slide on Tripod

NOTES:
1. MATERIAL: ALUMINUM, 6061-T6, .125 THK.
2. TOLERANCES NOT SHOWN ARE AS FOLLOWS: .XX" = _+ .02"

AND .XXX" = +
_ .005" .
2.435"
1.905"
4X .154 - .157 DIA THRU
0.655"
0.125" 0.188"
STK
0.438" 0.63"
1.12"
0.50"
0.125"
0.54"
4X R .12" 0.125"
1.48" (RUBBER PAD)
2.56"
BOND RUBBER PAD
AFTER MACHINING
LINEAR SLIDE STOP PLATE
DWG. NO. NASA-9-SC

K. RACKOW, 845-9204
D. ROACH, 844-6078
DATE: 11-24-04 REV. #1 SCALE: 1/1
AANC
44
Connection of Manual Scanner to Positioning Mechanisms
X-rail feet will be

connected to scanner
positioning mechanism
Lower plate & suction

cups retained for upper
surface scans
Lower plate & suction

cups removed for
connection to external
positioning mechanisms
Integration of Manual Scanner with Positioning Mechanisms
45
TRIPOD SET-UP FOR ~56.00" (MAXIMUM) HEIGHT
MAX.
8.0" Tripod Configuration

64.0"
48.0"
and Scanner Reach
42.0"
(APPROX. SIDEVIEW LAYOUT)
TRIPOD LEGS
21.35" 12.75"
(MAX. OFFSET OF PROBE IN
FRONT OF TRIPOD LEGS)
for Maximum
Underwing Height
Inspections of 56”
21.69"
73.14"
R 42.00"
6.00" 19.00" 3.88"

(SCANNER (SLIDE TRAVEL) (EXTENDED
TRAVEL) BRACK ET)
SLIDE SHOWN IN THE FULLY

RETRACTED POSITION
28.88"
(MAXIMUM PROBE COVERAGE)
PROBE LOCATION IN RELATION TO TRIPOD

SET-UP WITH 24.00" SLIDE MECHANISM

TRIPOD SET-UP FOR ~38.00" (MINIMUM) HEIGHT
TRIPOD LEGS
8.0"
30.0"
41.4"
Tripod Configuration
28.5"
(APPROX. SIDEVIEW LAYOUT) and Scanner Reach
for Minimum
14.60" 19.50"
(MAX. OFFSET OF PROBE IN
FRONT OF TRIPOD LEGS)
Underwing Height
21.69"
Inspections of 38”
49.76"
R 28.50"
6.00" 19.00" 3.88"

(SCANNER (SLIDE TRAVEL) (EXTENDED
TRAVEL) BRACKET)
SLIDE SHOWN IN THE FULLY

RETRACTED POSITION
28.88"
(MAXIMUM PROBE COVERAGE)
PROBE LOCATION IN RELATION TO TRIPOD

SET-UP WITH 24.00" SLIDE MECHANISM
46
Manual Scanner and UT Probe Configuration
Normal Probe Deployment Optional Probe Reach Extension
4.0 Scanner Deployment in Orbiter Processing Facility
Concept Of Operations on Wing Leading Edge

• Portable step-up stands (supplied by KSC) will be used as
needed to reach upper WLE surfaces
• Rail cart (shown below) is first option for positioning all NDI
devices
47
RCC Panel Layout with Respect to OPF Floor
Three Scanner Positioning Options for Inspections
Three Types of UT/EC Scanner Deployment
1. Connection to OSS positioning mechanism

2. Connection to tripod positioner
3. Resting on top of RCC panel
Option 2
Option 1
Option 3
48
Scanner Deployment in Orbiter Processing Facility
Gantry
Apex
Positioning
Region
Mechanism
Tripod with
Linear Slide
Upper Surface Scan Lower Surface Scan

Option 1: Connection to Rail Cart Positioning Mechanism
Rail Cart Positioning

Scanner at panel 5
Mechanism
5 6 7 8 9 10 11
12 13 14 15 16 17
18 19
49
Scanner Deployment Option 1: Connection to Rail Cart Positioning Mechanism
Connection of Manual Scanner to Rail Cart Arm
Manually Applied Force Handle Bar
Reaction Force
Between Panel and
Ensolite
Ensolite Cushion
Using Double-
Sided Tape
Adhesive
Positioning cart
locating inspection
device at panel 5
50
Option 2: Scanner Deployed on Tripod Positioning Mechanism
Bogen Tripod (COTS) with Linear Slide LINEAR SLIDE
MANUAL SCANNER
UT TRANSDUCER IN HOUSING
LINEAR SPRING
SURFACE FOLLOWER
LINEAR SLIDE POSITION LOCKS
TRIPOD POSITIONING MECHANISM
Tripod Positioning Mechanism

Manual Scanner Mounting plate
Linear Slide for Extending Scanner Over

and Under RCC Panel
Tripod
Linear slide and Y-Position Locking Mechanism
51
Manual Scan of RCC Upper Surface
Manual Scan of RCC Apex Region
52
Manual Scan of RCC Lower Surface
Manual Scanner Tripod Tiedown Options

Either the center-column collar fixture or the leg straps can be used
to secure the tripod to the floor in the OPF inspection area
OPTION 2: SECURE TRIPOD TO FLOOR USING TRIPOD

TIEDOWN COLLAR MOUNTED ON CENTER COLUMN
NASA SUPPLIED TIEDOWN STRAPS (TYP)
OPTION 1: SECURE TRIPOD TO FLOOR USING

TRIPOD LEG TIEDOWN STRAPS
FLOOR OR TRACK TIEDOWN POINT (TBD)
53
Tripod Tie-Down Collar
• Mounts to center column of tripod positioning mechanism and is connected to OPF floor
• Prevents unintentional movement or tipping of scanner system when deployed on LE RCC panels
NOTES:
1. MATERIAL: ALL PARTS TO BE MADE FROM ALUMINUM 6061-T6.
2. TOLERANCES NOT SHOWN ARE AS FOLLOWS: .XX" = +_ .02" AND
.XXX" = +
_ .005" .
1.800" 1.800"
1.800" 1.800" 4X R.060
3X 0.250"
2X 0.250"
.250 - 20UNC - 2B
X .60 DP (FLAT BOTTOM)
2X .218 - .223 DIA THRU
2X .218 - .223 DIA THRU
4.10"
2X R .030 4X R .100
2.150"
0.50"
2X 1.88"
2X R .100 R 1.50 2X R .030
R FULL
0.25" 1.000
R 0.225"
1.88"
30°
2X R .030 2X 0.100"
50°
2X R .030 0.25"
R 1.000 R 1.50
6X R .100 0.50"
2X R .060 4X R.030 0.200"

130° 0.250"
4.10"
150°
0.50"
2X .250 - 20UNC - 2B
X .75 DP (FLAT BOTTOM)
8X R.060
0.50" 4X R .030
TRIPOD TIEDOWN COLLAR
DWG. NO. NASA-4-SC

4X R .030 K. RACKOW, 845-9204
D. ROACH, 844-6078
DATE: 1-25-05 REV. #1 SCALE: 1/1
AANC
Tripod Tie-Down Strap

• Mounts to each leg of tripod positioning mechanism and is connected to OPF floor
• Prevents unintentional movement or tipping of scanner system when deployed on LE RCC panels
NOTES:
(1.600" DIA)
TRIPOD LEG 1. MAY BE PURCHASED FROM MCMASTER-CARR SUPPLY CO.,
PO BOX 54960, LOS ANGELES, CA 90054-0960, PART NO. 9606K44.
2. TOLERANCES TO BE _
+.06 FOR ALL TIEDOWN DIMENSIONS.
TIEDOWN INSTALLED ON TRIPOD LEG
ROLLED RIM GROMMET (# 3)

W/ SPUR EXTENDED NECK WASHER
(INSTALL PER MFR INSTRUCTIONS)
10.75"
1.
(1.00")
0.75" BOX 'X' STITCH 1.75"

1.25"
(LOOP)
TRIPOD LEG TIEDOWN STRAP

1" X 2500LB NYLON WEBBING
(MIL-W-4088, TYPE XVII) DWG. NO. NASA-10-SC
K. RACKOW, 845-9204
D. ROACH, 844-6078
DATE: 1-19-05 REV. #1 SCALE: 1/1
AANC
54
Tripod Positioning Mechanism – Floor Tiedown Fixtures
Straps (2000 lb. Nylon) Attached to each Tripod Leg
Restraint Collar
Attached to Tripod
Center Column
Inspecting Upper Surface - Scanner Resting on Top of RCC Panel
Option 3
55
Pulse-Echo UT – Scanner Deployment & Data Acquisition
1
Increment
4
Scan
Class 1, Div 2 Compliance Status

• Class 1 Div 2 compliant Flash Thermography equipment enclosures
being evaluated by OSS.
A larger enclosed box is Investigating commercially
placed over the Rack available class 1 Div 2
mounted components and enclosures. Requires re-
purge gas is maintained at packaging of Equipment.
positive pressure throughout
the enclosure.
56
5.0 Performance Assessment of Pulse-Echo Ultrasonic Inspection System
Validation Plan for UT System

Complete inspections on all RCC test specimens
using PE-UT system hardware
Sample Specimens Include:
1. Boeing disks with arc jet exposure
2. 0.25” th. RCC central section
3. 0.44” th. RCC edge section
4. 0.25” th., 2” X 6” Boeing coupon
5. 8L flight hardware (Bill’s Box)
6. Columbia panel with flaws of different aspect ratios
7. Slotted specimens (sloping, straight, & corner slots)
8. NASA impact panels
9. Coupons from 9L RCC panel with engineered flaws
10. 11L RCC panel with engineered flaws
Pulse-Echo Ultrasonic Inspection of Boeing Disks

(Arc Jet Specimen Set)
Backside Inspection
57
Side A Side B
• Inspection from Side A

Crack through Simulates Nearside
Si-C layer (Surface) Flaw
followed by Detection
arc-jet
• Inspection from Side B
exposure
Simulates Backside
(Deep) Flaw Detection
Back Front
Arc Jet Disk Inspection with P-E Ultrasonics

Frontside Flaw Detection - Serial Numbers in Back
Subsurface
Oxidation 01-24 01-32 01-35
Flaws
By-Product
of Engraved
Serial
Numbers
(typical)
Backside Flaw Detection - Serial Numbers in Front
58
Arc Jet Disk Inspection with P-E Ultrasonics (cont.)
Frontside Flaw Detection - Serial Numbers in Back
Gain too high –

False hot spots
Subsurface
Oxidation 01-13 01-18 01-21
Flaws
By-Product
of Engraved
Serial
Numbers
(typical)
Backside Flaw Detection - Serial Numbers in Front
Waveform Comparisons UT PE Signals from Flawed

and Good Areas of ARC JET Specimen #01-24
Frontside Flaws
Good Back Surface Signal
Red--No Back Surface Signal
Gate 2- Amplitude
Backside Flaws
Good Back Surface Signal
Red--No Back Surface Signal
59
Sample Results RCC Flight Hardware
0.24” Th. Panel with Coating
depth .045” .120” .195”
10 11 12
1/8” dia.
1/4” dia. 7 8 9
3/8” dia.
4 5 6
1/2” dia.
1 2 3
Back* Mid Front* * At Si-C to C-C

Side Side interface on back or
front of panel
RCC Flight Hardware – 0.24” Th. Panel with Coating
X X X
1 MHz Pulse-Echo UT Gate 1 - Amplitude

Flaw detection obtained
with weeper coupling
60
Pulse-Echo UT
Flaw detection obtained
1/8” dia. with optimum coupling
11 12
10
(dripless bubbler)
9
1/4” dia.
7 8
5 6 3/8” dia.
4
1/2” dia.
1 2 3
Back* Mid Front*

Side Side
Sample P- E Ultrasonic Signals

Acquired from 1MHz Probe on NASA 0.24” Specimen
Longitudinal wave velocity in RCC is ∼ 0.1 inches/microsecond
so the back wall reflection is seen at 5 microseconds for
movement back and forth through the 0.25 specimen
Good BS
½” Flaw .045” from FS
61
Validation Standards S03-48 and S03-49
1 2 3 4 5
1/8”D 1/2”D 1/4”D
1/8”D 1/4”D 3/16”D 3/8”D

B
1/2”D 1/4”D 3/16”D 3/8”D

C 6.00”
1/4”D 3/8”D
3/16”D
D
1/2” D
1/4”D 3/16”D 3/8”D
E
6.00”
Diameter Depth ID Location 0.030 SiC

1/8”
1/8”
0.030”
0.070”
A1
B1
0.070 Back View
1/4” 0.030” A3 0.130
1/4” 0.070” B3 RCC 0.259
1/4” 0.130” C3 0.190
1/4” 0.190” D3
0.230
1/4” 0.230” E3
3/16” 0.090” A4 SiC
3/16” 0.130” B4
3/16” 0.190” C4 I.D. No. on Bottom Surface
3/16” 0.230” E4
3/8” 0.070” A5
NOTE: Flat Bottom Holes are on 1” centers
3/8” 0.130” B5
3/8” 0.190” C5 1/2” Dia. spaced to eliminate edge effects
3/8” 0.230 D5
1/2” 0.130” A2 6” X 6” RCC NDE STANDARD 03-48, 03-49, & 03-50
1/2” 0.190” C2 WITH 18 - Flat Bottom Holes on 1.00” Centers
1/2’ 0.230” E2
Validation Results, Standard S03-48

1 2 3 4 5
1/8”D 1/2”D 1/4”D
1/8”D 1/4”D 3/16”D 3/8”D

B
1/2”D 1/4”D 3/16”D 3/8”D

C 6.00”
1/4”D 3/8”D
3/16”D
D
1/2” D
1/4”D 3/16”D 3/8”D
E
Amplitude 1 Amplitude 2
6.00”
Diame ter Depth ID Location 0.030 SiC

1/8” 0.030” A1 0.070
1/8” 0.070” B1
1/4” 0.030” A3 0.130
1/4” 0.070” B3 RCC 0.259
1/4” 0.130” C3 0.190
1/4” 0.190” D3
0.230
1/4” 0.230” E3
3/16” 0.090” A4 SiC
3/16” 0.130” B4
3/16” 0.230” E4
3/8” 0.070” A5
3/8” 0.130” B5
3/8” 0.190” C5
1/2” Dia. spaced to eliminate edge effects
3/8” 0.230 D5
1/2’ 0.230” E2
Flaws not found

Time of Flight 1 Time of Flight 2
Sample Scan Images
62
1 2 3 4 5
1/8”D 1/2”D 1/4”D
1/8”D 1/4”D 3/16”D 3/8”D

B
1/2”D 1/4”D 3/16”D 3/8”D

C 6.00”
1/4”D 3/8”D
3/16”D
D
1/2” D
1/4”D 3/16”D 3/8”D
E
Amplitude Amplitude
6.00”
Diamete r Depth ID Location 0.030 SiC

1/8” 0.030” A1 0.070
1/8” 0.070” B1
1/4” 0.030” A3 0.130
1/4” 0.070” B3 RCC 0.259
1/4” 0.130” C3 0.190
1/4” 0.190” D3
0.230
1/4” 0.230” E3
3/16” 0.090” A4 SiC
3/16” 0.130” B4
3/16” 0.230” E4
3/8” 0.070” A5
3/8” 0.130” B5
3/8” 0.190” C5 1/2” Dia. spaced to eliminate edge effects
3/8” 0.230 D5
1/2’ 0.230” E2
Flaws not found Time of Flight
Sample Scan Images
63
Validation Results, Standards S03-51 and S03-53
Flaw
Specimen 03-53 Diameter
0.257” th. RCC
2” W X 6” L plate 0.375”
0.25”
0.217” 0.170” 0.085”

Depth from
0.042” 0.085” 0.170” 0.217”
Front Surface
Flaw
Specimen 03-51 Diameter
0.252” th. RCC 0. 50”
2” W X 6” L plate
0.25”
Depth from
0.170” 0.170” 0.210” 0.70”
Front Surface
Validation Results, Standard S03-51 and S03-53
S03-53 S03-51
64
1/8” dia.
1/4” dia.
Photo here
3/8” dia.
1/2” dia.
Front* Mid Back*

Side Side
* At Si-C to C-C interface on back or front of panel

Amplitude Time of Flight P-E UT Optimum Coupling
X X X X
Back Mid Front Back Mid Front

Side 0.22” Side Side 0.22” Side
0.4” 0.04” 0.4” 0.04”
65
RCC Panel Recovered from Columbia Orbiter
UT inspections revealed
different attenuation levels in
the panel
Flaws with different aspect

ratios were engineered into
panel
Columbia Panel with Flaws of Different Aspect Ratios

Flaw detection in the presence of varying/high attenuation
0.25” W 0.50” W
0.375” W
0.125” H
0.188” H
0.250” H
0.313” H
0.375” H
Gate 2 Time of Flight
66
Columbia Panel with Flaws of Different Aspect Ratios
Gate 2 Time of
Flight (Color
Adjusted)
Krautkramer UT Transducer
Phase 1 Specimen #03-63 with Corner Slots
½”
½”
IR Image
Pulse-Echo
UT Image
67
2” X 6” X 0.205” th. RCC panel
1/8” D 1/8” D 1/8” D 1/4” D 1/4” D
Flaws are flat bottom holes and side

slots across width of specimen
REMOVE SI C COATING 30/40” IN ONE PIECE SiC
A B C D E Side slots (3 plcs)
RCC
SiC
ID Diameter Depth
A 1/8” 0.005”
B 1/8” 0.010”
C 1/8” 0.020”
D 1/4” 0.005”
E 1/4” 0.010”
Phase 1 Specimen #03-54 with Side Slots and FBH (back surface)
1/2” 1/2” 1/2”
1/8” 1/8” 1/8” 1/4” 1/4” Side View

Flaw Depth
From Front 0.198” 0.195” 0.185” 0.198” 0.188”
Engraved
Specimen
Number
Amplitude
68
Inspection of NASA Impact Panels
NASA Impact Panel R1-117-14 (R1-47-14)

Lowest impact velocity of 1470 ft/s with no visible impact damage
Foam-sized area of delamination
FRONT BACK
TTU Ultrasound
Gate 2 Time of Flight Gate 1 Amplitude
Pulse-Echo UT
69
NASA Impact Panel T8015-1
Photo of Impact Pulse-Echo UT Thermography
Surface
Gate 1 Amp
Thru-Trans UT Pulse-Echo UT
90 degree impact
at 2054 fps
Gate 2 ToF
NASA Impact Panel T8015-1 - UT PE Images & Waveforms
Gate 1 Gate 1
Amplitude Time of Flight
Gate 2 Gate 2
Amplitude Time of Flight
Good Back Surface
Impact Area
70
NASA Impact Panel T8015-3
Impact velocity of 1717 ft/s with no visible impact damage
Gate 1 Photo of Impact

Gate 2
Amplitude
Surface
Time of Flight
Gate 2
Amplitude
Good Back Surface
Impact Area
NASA Impact Panel 8015-4
Impact velocity
Thermography
of 1720 ft/s with
Image
no visible impact
damage
BACK
Pulse-Echo UT
(Gate 2 ToF)
TTU Ultrasound Image
71
Gate 1 Photo of Impact Back Surface
Amplitude Surface
Gate 2
Amplitude
Ultrasonic Pulse-Echo Images &
Waveforms from A146-2
Impact Area
Good Back Surface

This region is
completely
delaminated
Note: The ultrasonic signal can be affected by water seeping into

the edge of the delamination area.

Photo of Impact Pulse-Echo UT Thermography
Surface
Gate 1 Amp
Thru-Trans UT
Pulse-Echo UT
90 degree impact
at 2002 fps
Gate 2 Amp
72
Thru-Trans UT Photo of Impact Back Surface
Surface
Pulse-Echo UT
45 degree impact
at 2230 fps –
visible damage on
backside only
NASA Impact Panel 20L-23

Thru-Trans UT Photo of Impact Back Surface
Surface
90 degree impact at
Pulse-Echo UT 2077 fps – no visible
damage on front;
small cracks visible
Gate 2 Time of Flight on back side
73
Impact Test - OV105 Panel 16R
Photo of Crack at Apex
Thermography Image
After panel was Impacted
with Ablator Projectile
Ultrasonic Pulse Echo C-scan of OV105 Panel 16R
Back
Surface
Amplitude Patch
Front Surface Crack
Time of
Flight
74
NDI Image of “Argonne” Specimen
Supplied by Sam Russell with suspected “worm holes” in 0.25” th. plate
Pulse-Echo UT
AMPLITUDE
Detection of
Tubular Voids
Worm hole region

identified by CT/EC and
marked by crosshairs
on panel (all significant
RED areas in scan are
suspect regions as well)
Red - No Back Surface
Dark -Good Back Surface
Pulse-Echo Ultrasonic Scan of 0.25” th. Flight Hardware RCC Panel
AMP Detection of Tubular Voids

Worm hole regions
identified by others and
marked by crosshairs
on panel
Red - No Back Surface
Dark -Good Back Surface
Gate Interaction – adjusted for

attenuation levels; 6-12 dB range
due to heat affects
Internal Ring Down
Gate 1 interaction for near-surface delaminations
75
Pulse-Echo UT Inspection of “Bill’s Box” NASA RCC Panel

Flaw Profile
76
Pulse-Echo UT System Results Using Manual Scanning

Bill’s Box RCC Panel
Flaw
Profile
Flaw Image from Manual Scan
2” X 2”
1/4” flaw @ back area
77
0.4” flaw @ front
1/4” flaw @ front
03-51 Coupon

2” X 6” X 0.25” th. Specimen 03-58 with Sloped Slots
1/8” 3/16” 1/4” 3/8” 3/8”
Side View
78
2” X 6” X 0.25” th. Specimen 03-58 with Sloped Slots
1/8” 3/16” 1/4” 3/8” 3/8”
SiC coating removed on
back side at end of coupon
Side View
1/8” 3/16” 1/4” 3/8” 3/8”
Time of Flight
Amplitude
Min ∆ dB at flaw = 9 dB
Max ∆ dB at flaw = 14 dB
RCC Panel 9L Validation Test Series

15 Individual standards from Upper Surface of 9L:
•Four Thermography/ Ultrasonic Calibration
Standards UPPER SURFACE
•2 from Hot Zone (A, B)
•1 from Cold Zone (D)
•1 Eddy Current Standard (E) F,G,H O N
•From Hot Zone
•3 Four-Point Bend Specimens (if all successful)-- (F,
G, H) M D L
•7 Impact Specimens (if all successful)-- (I-O)
LOWER SURFACE K J I
R S
E C B A
9 Standards from Lower Surface of 9L:

W V •4 Calibration Standards
Reserve
U T •2 from Hot Zone (P, Q)
material for •2 from Transitional Zone (R, S)
future
requirements •3 Four-Point Bend Specimens - (T-W)
P Q •14.25” X 8.5” (for future requirements)
•Wear test specimen for Sandia
79
Validation Results, Phase 2 Specimen 9L – Lower 1 (Q)
RCC CALIBRATION STANDARD
ID# 9 L-LOWER-1
1 2 3
3/ 8 " 1/ 8 " 1 / 2"

A
3/ 8 " 1/ 2 " 1 / 4"

B
1/ 4 " 1/ 8 " 3 / 8"

C
1/ 8 " 1/ 2 " 1 / 4"

D
1/ 4 " 1/ 8 " 3 / 8"

E
0 .24
1 2 3 4 5 AV ERAGE
THICKNESS
3/8”D
0.063
1/8”D
0.063
1/2”D
0.063
BOTTOM VIEW SIDE VIEW
SCA LE=1 :2 SCALE= 1 :2
A
3/8”D 1/2”D 1/4”D

0.125 0.125 0.125 F/ B HOLE DEPTH
B 1 2 3
NOTES:
1/4”D 1/8”D 3/8”D A 0 .06 0 0 .0 6 5 0 .06 0
0.190 0.190 0.190 1. 6x6" SAMPLE SIZE
C 6.00” B 0 .12 5 0 .1 2 5 0 .12 5 2 . ALL DIMS INCHES
1/8”D 1/2”D 1/4”D C 0 .17 2 0 .1 7 5 0 .18 8
0.125 0.210 0.210
D 0 .13 0 0 .1 8 8 0 .18 9
D
E 0 .06 3 0 .0 4 1 0 .20 7
1/4”D 1/8”D 3/8”D
0.063 0.040 0.210
E
6.00”
Validation Results, Phase 2 Specimen 9L – Lower 1 (Q)

1 2 3 4 5
3/8”D 1/8”D 1/2”D

0.063 0.063 0.063
A
3/8”D 1/2”D 1/4 ”D

0.125 0.125 0.125
B
1/4”D 1/8”D 3/8”D

0.190 0.190 0.190
C 6.00”
1/8”D 1/2”D 1/4”D

0.125 0.210 0.210
D
1/4”D 1/8”D 3/8”D

0.063 0.040 0.210
E
6.00”
Amplitude 3
Flaws not found
Time of flight 3 Time of flight 4
80
Validation Results, Phase 2 Specimen 9L – Lower 2 (P)
ID# 9L-LOWER-2
1 2 3
3/ 8 " 1/ 8" 1 / 2"

A
3/ 8 " 1/ 2" 1 / 4"

B
1/ 4 " 1/ 8" 3 / 8"

C
1/ 8 " 1/ 2" 1 / 4"

D
1/ 4 " 1/ 8" 3 / 8"

E
1 2 3 4 5 0 .26
AV ERAGE
THICKNESS
3/8”D 1/8”D 1/2”D
0.063 0.063 0.063
A
SCA LE= 1 :2 SCALE= 1 :2
3/8”D 1/2”D 1/4”D
0.125 0.125 0.125
B
F/ B HOLE DEPTH
3/8”D
1/4”D 1/8”D
0.190
1 2 3
0.190 0.190 NOTES:
C 6.00” A 0 .06 2 0 .06 3 0 .06 3
1 . 6 x6 " SAMPLE SIZE
1/8”D 1/2”D 1/4”D B 0 .12 3 0 .12 6 0 .12 5 2 . ALL DIMS INCHES
0.125 0.210 0.210
D C 0 .16 9 0 .17 6 0 .18 8
1/4”D 3/8”D
D 0 .13 3 0 .18 8 0 .19 2
1/8”D
0.063 0.040 0.210
E 0 .06 4 0 .03 9 0 .20 3
E
6.00”
Validation Results, Phase 2 Specimen 9L – Lower 2 (P)

1 2 3 4 5
3/8”D 1/8”D 1/2”D

0.063 0.063 0.063
A
3/8”D 1/2”D 1/4”D
0.125 0.125 0.125
B
1/4”D 1/8”D 3/ 8”D

0.190 0.190 0.190
C 6.00”
1/ 8”D 1/2”D 1/4”D

0.125 0.210 0.210
D
1/4”D 1/8”D 3/8”D

0.063 0.040 0.210
E
Flaws not found

6.00”
Amplitude 1
Amplitude 2
81
Validation Results, Phase 2 Specimen 9L – Lower 4 (R)
Transition Region with Thickness Tapering from 0.233” to 0.340”
1 2 3 4 5
1/8”D 1/2”D 1/4”D
0.090 0.090 0.090
A
1/2”D
1/4”D 3/8”D
0.185
0.185 0.185
B 8.00” of
0.280” 0.330” 0.336 thk.
3/8”D 1/4”D 1/8”D

0.275 0.275 0.275
C
1/8”D 1/4”D 3/ 8”D

0.185 0.185 0.185
D
START OF TRANSITION
0.275” 0.340” 1/ 4”D 1/2”D 3/8”D

0.150 0.150 0.150
E
MIDDLE OF TRANSITION
1.5” of
1/ 4”D 3/ 8”D 0.233 thk.
1/8”D
0.125 0.125 0.125
F
END OF TRANSITION
0.251” 0.255”

1 2 3 4 5
1/8”D 1/2”D 1/4”D
0.090 0.090 0.090
A
1/2”D
1/ 4”D 3/8”D
Flaws not found
0.185
0. 185 0.185
B 8.00” of
0.336 thk.
3/8”D 1/4”D 1/ 8”D

0.275 0.275 0. 275
C
1/8”D 1/4”D 3/8”D

0.185 0.185 0.185
D
START OF TRANSITION
1/4”D 1/2”D 3/8”D

0.150 0.150 0.150
E
MIDDLE OF TRANSITION
1.5” of
1/4”D 3/8”D 0.233 thk.
1/8”D
0.125 0.125 0.125
F
END OF TRANSITION
Amplitude 1 Time of Flight 4 Amplitude 3
82
Sample of the Total

“Amplitude” and “Time
of Flight” Data Set
Used to Detect Flaws
83
Validation Results, Phase 2 Specimen 9L – Upper 2 (B)
ID# 9 L-UPPER-2
1 2 3
3/ 8" 1/ 8" 1/ 2"

A
3/ 8" 1/ 2" 1/ 4"

B
1/ 4" 1/ 8" 3/ 8"

C
1/ 8" 1/ 2" 1/ 4"

D
1/ 4" 1/ 8" 3/ 8"

E
0.2 6
AVERAGE
1 2 3 4 5 THICKNESS
3/8”D 1/8”D 1/2”D

0.063 SCALE= 1:2 SCALE= 1 :2
0.063 0.063
A
3/8”D 1/2”D 1/4”D
F/ B HOLE DEPTH
0.125 0.125 0.125 1 2 3
B NOTES:
A 0.059 0 .06 5 0 .06 6
1 . 6x6" SAMPLE SIZE
1/4”D 1/ 8”D 3/8”D
0.190
B 0.122 0 .12 3 0 .12 6 2 . ALL DIMS INCHES
0.190 0.190
C 6.00” C 0.170 0 .18 0 0 .18 3
1/2”D 1/4”D
D 0.140 0 .18 4 0 .19 0
1/8”D
0.210 0.210 0.063 0 .04 0 0 .20 2
0.125 E
D
1/4”D 1/8”D 3/8”D

0.063 0.040 0.210
E
6.00”
Validation Results, Phase 2 Specimen 9L – Upper 2 (B)

1 2 3 4 5
3/8”D 1/8”D 1/2”D

0.063 0.063 0.063
A
3/8”D 1/2”D 1/4”D
0.125 0.125 0.125
B
1/4”D 1/8”D 3/8”D

0.190 0.190 0.190
C 6.00”
1/8”D 1/2”D 1/4”D

0.125 0.210 0.210
D
1/4”D 1/8”D 3/8”D

0.063 0.040 0.210
E
6.00”
Flaws not found
Time of Flight 1
84
Validation Results, Phase 2 Specimen 9L – Upper 3 (A)
ID# 9L-UPPER-3
1 2 3
3 /8" 1 /8 " 1/2 "

A
3 /8" 1 /2 " 1/4 "

B
1 /4" 1 /8 " 3/8 "

C
1 /8" 1 /2 " 1/4 "

D
1 /4" 1 /8 " 3/8 "

E
AVERAGE
THICKNESS 0 .25
1 2 3 4 5
3/ 8”D 1/ 8”D 1/2”D SCA LE= 1 :2 SCALE= 1:2
0.063 0.063 0.063
A
F/B HOLE DEPTH
3/8”D 1/2”D 1/4”D 1 2 3
0.125 0.125 0.125 NOTES:
A 0 .06 6 0 .06 6 0 .047
B 1. 6x6" SAMPLE SIZE
B 0 .12 6 0 .12 5 0 .123 2. ALL DIMS INCHES
1/ 4”D 1/8”D 3/8”D
0.190 0.190 0.190 C 0 .17 0 0 .17 9 0 .188
C 6.00” D 0 .13 2 0 .18 9 0 .189
1/2”D E 0 .06 2 0 .04 0 0 .208

1/8”D 1/ 4”D
0.125 0.210 0.210
D
1/4”D 1/ 8”D 3/8”D

0.063 0.040 0.210
E
6.00”
Validation Results, Phase 2 Specimen 9L – Upper 3 (A)

1 2 3 4 5
3/8”D 1/ 8”D 1/2”D

0.063 0.063 0.063
A
3/ 8”D 1/2”D 1/4”D
0.125 0.125 0.125
B
1/ 4”D 1/8”D 3/8”D

0.190 0.190 0.190
C 6.00”
1/8”D 1/ 2”D 1/4”D

0.125 0.210 0.210
D
1/4”D 1/ 8”D 3/ 8”D

0.063 0.040 0.210
E Amplitude 3
6.00”
Flaws not found
Time of Flight 3
85
Validation Results, Phase 2 Specimen 9L – Upper 4 (D)
ID# 9L-UPPER-4
1 2 3
3/ 8" 1/ 8 " 1/ 2"

A
3/ 8" 1/ 2 " 1/ 4"

B
1/ 4" 1/ 8 " 3/ 8"

C
1/ 8" 1/ 2 " 1/ 4"

D
1/ 4" 1/ 8 " 3/ 8"

E
0 .25
AVERAGE
1 2 3 4 5 THICKNESS

3/8”D 1/8”D 1/2”D SCA LE=1 :2 SCALE= 1 :2
0.063 0.063 0.063
A
3/8”D 1/2”D 1/4”D
F/ B HOLE DEPTH
0.125 0.125 0.125 1 2 3
NOTES:
B A 0 .06 5 0 .06 3 0 .06 3
1 . 6 x6 " SAMPLE SIZE
1/4”D 1/8”D 3/8”D B 0 .12 5 0 .12 1 0 .12 4 2 . ALL DIMS INCHES
0.190 0.190 0.190
C 0 .17 0 0 .18 4 0 .16 9
C 6.00”
D 0 .13 2 0 .18 8 0 .18 8
1/8”D 1/2”D 1/4”D
0.210 E 0 .05 9 0 .04 2 0 .18 9
0.125 0.210
D
1/4”D 1/8”D 3/8”D

0.063 0.040 0.210
E
6.00”
Validation Results, Phase 2 Specimen 9L – Upper 4 (D)

1 2 3 4 5
3/ 8”D 1/8”D 1/2”D

0.063 0.063 0.063
A
3/8”D 1/2”D 1/4”D
0.125 0.125 0.125
B
1/4”D 1/8”D 3/ 8”D

0.190 0.190 0.190
C 6.00”
1/8”D 1/2”D 1/ 4”D

0.125 0.210 0.210
D
1/4”D 1/8”D 3/8”D

0.063 0.040 0.210
E
6.00”
Flaws not found
Time of Flight 4 Time of Flight 3
86
Flaw Detection Summary for 1/8” Dia. Flaws in 9L Specimens
Detection of 1/8" Diameter Flaws in RCC 9L Specimens
Detection by
Flaw Identification and Flaw Depth from Front Surface (inches)
Specimen Pulse-Echo UT
0.200 (+) 0.178 0.120 0.080 0.070 0.050 0.040 (-) Yes No
9L-Lower 1 (Q) A-2 X

9L-Lower 1 (Q) C-2 X
9L-Lower 1 (Q) D-1 X
9L-Lower 1 (Q) E-2 X
9L-Lower 2 (P) A-2 X

9L-Lower 2 (P) C-2 X
9L-Lower 2 (P) D-1 X 1/8” dia. flaw
9L-Lower 2 (P) E-2 X detection = 16.8%
9L-Lower 4 (R) A-1 X
9L-Lower 4 (R) C-5 X
9L-Lower 4 (R) D-1 X
9L-Lower 4 (R) F-5 X
9L-Upper 2 (B) A-2 X

9L-Upper 2 (B) C-2 X
9L-Upper 2 (B) D-1 X
9L-Upper 2 (B) E-2 X
9L-Upper 3 (A) A-2 X

9L-Upper 3 (A) C-2 X
9L-Upper 3 (A) D-1 X
9L-Upper 3 (A) E-2 X
9L-Upper 4 (D) A-2 X

9L-Upper 4 (D) C-2 X
9L-Upper 4 (D) D-1 X
9L-Upper 4 (D) E-2 X

Detection by
0.200 (+) 0.178 0.120 0.080 0.070 0.050 0.040 (-) Yes No
9L-Lower 1 (Q) B-3 X

9L-Lower 2 (P) B-3 X

9L-Lower 2 (P) C-1 X
9L-Lower 2 (P) D-3 X
9L-Lower 2 (P) E-1 X 1/4” dia. flaw
detection = 92%
9L-Lower 4 (R) A-5 X
9L-Lower 4 (R) B-3 X
9L-Lower 4 (R) E-1 X
9L-Upper 2 (B) B-3 X

9L-Upper 3 (A) B-3 X

9L-Upper 4 (D) B-3 X

87
Detection by
0.200 (+) 0.178 0.120 0.080 0.070 0.050 0.040 (-) Yes No


9L-Lower 2 (P) C-3 X 3/8” dia. flaw
9L-Lower 2 (P) E-3 X detection = 100%




Detection by
0.200 (+) 0.178 0.120 0.080 0.070 0.050 0.040 (-) Yes No


9L-Lower 2 (P) D-2 X
1/2” dia. flaw
9L-Lower 4 (R) A-3 X detection = 100%



88
Probability of Detection Curve for Pulse-Echo UT Flaw Detection in
Panel 9L – NDI Reference Standard Specimens
UT Validation PoD - Panel 9L Specimens
POD
0.9
0.8
0.7
Probability of Detection
90% PoD = 0.24” dia.

0.6
0.5
0.4
0.3
0.2
0.1
0
0 0.05 0.1 0.15 0.2 0.25 0.3 0.35
Flaw Size (Dia. in Inches)
89
Validation Results, Phase 2 Specimen 9L – 3 Pt. Bend
RCC Specimen Undergoing 3 Pt. Bend Test
3 Pt. Bend Specimens 1 (T), 2 (U), 3 (V), 4 (W), 5 (F), 6 (G), 7(H)
Specimens 1-4 from Lower Surface; 5-7 from Upper Surface

UT Through Transmission Characterization
Areas of some Areas of high
Possible
attenuation attenuation
Crack
1 2 3 4 5 6 7
Crack / Delamination
Mean 63.7751 dB Crack / Delamination Crack / Delamination
Total Area: 1.2000 Sq In Mean 60.9639 dB Mean 53.0924 dB
Total Area: 1.3536 Sq In Total Area: 0.4608 Sq In
90
Spec. #1 MWM EC Results at 5.0 MHz
Amplitude 1
Time of
Flight 1
Amplitude 2
Time of
Flight 2
Specimen #1 Specimen #2
Specimen 1 (side view showing crack)
Eddy Current Inspection Results for Comparison to P-E Ultrasonics Testing

Spec. #1 UltraSpect EC Results at 2.6 MHz

91
Stronger indications on one side of specimen
Amplitude 1
Time of
Flight 1
Amplitude 2 Spec. #4 MWM EC Results at 5.0 MHz
Time of
Flight 2
Specimen #3 Specimen #4
Specimen 3 (side view showing crack)

92
Spec. #5 MWM EC Results at 2.5 MHz Spec. #7 MWM EC Results at 5.0 MHz
Amplitude 1
Time of
Flight 1
Specimen #5 Specimen #6 Specimen #7


Spec. #7 UltraSpect EC Results at 2.6 MHz Spec. #7 MWM EC Results at 5.0 MHz
Moderate Cracking
93
Use of UT Signal Database to Assess Structural Integrity
Comparison of Current UT Signature with UT History
Comparison of signal from Boeing 03-24 specimen when gain is set to:
1) gain used in NASA Upper 8L specimen
2) gain used to optimize set-up on Boeing 03-24 disk
Gain used for Boeing 03-24 Specimen Gain used for NASA Upper 8L Specimen
(indicates that attenuation in pucks is
higher than in 8L specimen)
Validation Testing with RCC Panels 11L & 12L

Objectives of Validation Testing on Retired, Orbiter RCC Panels 11L & 12L
The objectives of this test program are:
• To validate the functionality of the Ultraspec Ultrasonic data acquisition system with LPS
100 manual scanner by performing blind in situ inspection of a full scale RCC Orbiter
Wing leading edge (WLE) Panel and Tee Seal (Panel 11L and Tee Seal 12L) installed on a
test stand to represent actual installed hardware on the Orbiter.
• To validate the ability of each system to detect artificially induced flaws (such as flat
bottom holes) in undeclared locations within four test zones machined into the inner
mold line (IML) of Panel 11L ranging from 0.040 to 0.190 inches in depth and from 0.125 to
0.5 inches in diameter
• To validate the ability of each system to detect artificially induced flaws on the IML and
web junction of Tee Seal 12L
• To validate the ability of each system to accurately inspect hardware in a configuration
that encompasses curvature and thickness variations representative of a RCC Panel
(upper, lower, apex and thickness transition areas) and a RCC Tee Seal (Tee section, vent
holes and non-parallel surfaces)
• To validate that the inspection processes are capable of meeting the applicable
requirements of relevant Boeing MT specifications (MT0501-510 for UT) as witnessed by a
Boeing Level 3 NDE engineer.
• To quantify the range of detection capability of each system on a relevant hardware
configuration per Boeing and USA Level 3 NDE data assessment
94
Validation Testing with RCC Panel 11L and 12L – Ref. TPS #KF0520168
Final Results and Grading from
Ultrasonic Pulse-Echo Validation Tests for Inspection of Shuttle RCC Material
Test Articles: Orbiter Leading Edge Panel 11L and Tee Seal 12L
Full Scale Mock-up of Wing Leading Edge at OSS
Panel 11L
Panel 12L T-Seal
Wing Leading Edge RCC T-Seal

0.250" 0.275"
.275"
FLAW NO. FLAW DIA. FLAW DEPTH
1 .250" .190"
2 .125" .190"
3 .375" .190"
4 .500" .190"
.250" 5 .250" .125"
6 .125" .125"
7 .375" .125"
8 .500" .125"
SECTION THRU 'T' SEAL SECTION THRU 'T' SEAL A
(THINNER CROSS-SECTION AREA) (THICKER CROSS-SECTION AREA)
A
4
'T' SEAL SECTION

3
8 2
7 1
ADDITIONAL PLIES
IN THESE REGIONS
8 4
VIEW A-A
THICKER REGION (0.275")
'T' SEAL LOCKING LIP 7

THICKER REGION (0.275") 3 B
ADDITIONAL PLIES
ALONG THIS STRIP 6
2 'T' SEAL LOCKING LIP
8
ADDITIONAL PLIES ALONG THIS STRIP 5
7 1
6 B
5
VIEW B-B
4
3
2
1
C
VIEW C-C C
95
Wing Leading Edge RCC T-Seal
RCC Panel 11L – Seven Zones (4 val., 3 ref.)

RCC T Seal 12L – Three Zones (Z1 – Z3)
96
RCC Panel 11L – Seven Zones (4 val., 3 ref.)
RCC T Seal 12L – Three Zones (Z1 – Z3)
Flaw Zone Layouts on Panel 11L
Each region was scanned in two

sections:
(a) designation is for upper portion of
region
(b) designation is for lower portion of
region
Note that scan (a) and scan (b)

are NOT related so the X-Y
scales on the two plots
CANNOT be used together for
flaw placement from one
window to the next; they have
similar but slightly different
scan windows
97
Reference and Validation Zones Inside Panel 11L
UPPER RCC SURFACE
0.250” Thick Area
Remaining Material
FBH Thickness 11L-R1
0.040 0.115 0.190

11L-V1
1/8 X X X
1/4 X X X
3/8 X X X
APEX
1/2 X X X 11L-V2 11L-R2
0.365” Thick & Transition Area

Nominal Thickness 0.250”
Remaining Material
FBH 11L-V3
Thickness
0.040 0.182 0.325
1/8 X X X
Transition
1/4 X X X 11L-R3 11L-V4
3/8 X X X
Nominal Thickness 0.365”
1/2 X X X
LOWER RCC SURFACE
Flaw Regions Included in Test

1. 11L-R1 Reference Zone 1 (upper surface)
2. 11L-R2 Reference Zone 2 (apex surface)
3. 11L-R3 Reference Zone 3 (lower surface) Orbiter
4. 11L-V1 Validation Zone 1 (upper surface) Leading Edge
5. 11L-V2 Validation Zone 2 (apex surface) RCC Panel 11L
6. 11L-V3 Validation Zone 3 (lower surface)
7. 11L-V4 Validation Zone 4 (lower transition surface)
8. 12L-V1 Validation Zone 1 (upper surface) Orbiter Leading
9. 12L-V2 Validation Zone 2 (apex surface) Edge RCC Tee
10. 12L-V3 Validation Zone 3 (lower surface) Seal 12L
D = detected
U = undetected
Flaw Detection
F = false call
Grading Designations
M = mislocated
A = ambiguous
98
11L Reference Zone 1 (11L-R1)
2
3 4
5 6
8 9
10
14
11
12
13
Gate 2 Amplitude (a)
1 2
4 3
2 6 5
4 3
7
6
5
7 9 8
9 10
8
10
14
11
14 11
12 12
13
13
Flaw Profile
(mirrored to match UT scans)
= flaw not detected

#6, (1/8” dia.) was not detected in Zone 11L-R1
99
2
2 4 3
4 3
6 5
5 Gate 3 Amplitude (a)
7
9 8 10
10 11L Reference
14 11 Zone 1 (11L-R1)
12 14
13 11
13 12
Flaw Profile
2 3
Gate 1 Time of Flight (a)

5
9 10
11 12
14
Gate 4 Amplitude (a) 13
2
2
4 3
3
6
5 5
7
7
9 8
10
9 8
14 11 10
12 11
13
Flaw Profile 14
13 12
11L Reference
Zone 1 (11L-R1)
100
11L Reference 1
Zone 1 (11L-R1) Far Lower
Flaw Profile
2
1
3
Gate 1 Amplitude (b) mod

Gate 2 Time of Flight (b)
1 1
2 3 2 3
Gate 1 Time of Flight (b) Gate 4 Time of Flight (b)
Flaw Detection Summary for Panel 11L Upper Surface Reference Zone 1
Zone 11L-R1
Drilled FBH Laser Measurements FBH Detected by NDE
Reference FBH Ø @ Ø Remaining Thickness Actual ET MWM UT PE
Hole # Hole Depth Material Near Hole Hole
Thickness Depth
1 3/8 @ 0.040 0.381 0.222 0.251 0.029 N/A N/A D

2 1/2 @ 0.040 0.509 0.220 0.249 0.029 N/A N/A D
3 3/8 @ 0.115 0.383 0.138 0.247 0.109 D D D
4 1/8 @ 0.115 0.128 0.130 0.246 0.116 U D D
5 3/8 @ 0.190 0.381 0.057 0.246 0.189 D D D
6 1/8 @ 0.190 0.132 0.058 0.249 0.191 D D U
7 1/2 @ 0.115 0.512 0.140 0.249 0.109 D D D
8 1/4@ 0.040 0.241 0.215 0.250 0.035 N/A N/A D
9 3/8 @ 0.115 0.384 0.136 0.250 0.114 D D D
10 3/8 @ 0.190 0.384 0.061 0.251 0.190 D D D
11 1/2 @ 0.040 0.507 0.212 0.250 0.038 N/A N/A D
12 1/4 @ 0.115 0.235 0.130 0.250 0.120 D D D
13 1/4 @ 0.190 0.236 0.057 0.250 0.193 D D D
14 3/8 @ 0.040 0.380 0.213 0.251 0.038 N/A N/A D
101
11L Reference Zone 2 (11L-R2) - Apex
1
2
4 5
Gate 4 Amp dB (b)
7
8
9
10
Gate 3 Amp dB (a)
(b)
1
2
3
(a)
4 5 6
7 8
9
10
7
Flaw Profile
9
= flaw not detected 10
#3 (1/8”) was not detected in Zone 11L-R2
Gate 4 Amp dB (a)
102
5 6
Gate 1 Amp dB (b)
5 6
Flaw Detection Summary for Panel 11L Apex Surface Reference Zone 2
Zone 11L-R2
Zones Drilled FBH Laser Measurements FBH Detected by NDE
Referenc FBH Ø @ Hole Ø Remaining Thickness Actual ET MWM UT PE
e Hole # Depth Material Near Hole Hole
Thickness Depth
1 3/8 @ 0.040 0.378 0.221 0.258 0.037 N/A N/A D

2 1/2 @ 0.040 0.501 0.225 0.254 0.029 N/A N/A A
3 1/8 @ 0.115 0.129 0.148 0.259 0.111 U A U
4 1/8 @ 0.190 0.131 0.093 0.252 0.159 D D D
5 3/8 @ 0.115 0.382 0.142 0.252 0.110 D D D
6 1/4 @ 0.115 0.244 0.137 0.248 0.111 D D D
7 3/8 @ 0.190 0.383 0.072 0.254 0.182 D D D
8 1/4 @ 0.040 0.242 0.224 0.255 0.031 N/A N/A A
9 1/2 @ 0.115 0.510 0.144 0.252 0.108 D D D
10 1/4 @ 0.190 0.246 0.070 0.251 0.181 D D D
103
11
12 9
8 7
4
3 2
1 8
7
9 12
3
2 4
5 Gate 1 Amplitude (a)
6 7 8
2 3
4
10 12
9
11
7 8
Flaw Profile
(rotated 180o to match UT scans)
9 12
= flaw not detected 11
#5 (1/8”) and #10 (1/8”) were not detected in Zone 11L-R3
#9 (1/4”) is outside scan region so it is removed from
comparison and listed as N/A Gate 4 Time of Flight (a)
104
2 3 1
4
Flaw Profile
3
2 4
5
6
6 7 8
9 12
10 12
9
11
11L Reference
Zone 3 (11L-R3)
1
1
2 3
4
Gate 3 Amplitude (b)

Flaw Detection Summary for Panel 11L Lower Surface Reference Zone 3
Zone 11L-R3
Reference FBH Ø @ Ø Remaining Thickness Actual ET MWM UT PE
Hole # Hole Depth Material Near Hole Hole
Thickness Depth
1 3/8 @ 0.325 0.384 0.056 0.355 0.299 D D D
2 3/8 @ 0.040 0.380 0.324 0.359 0.035 N/A N/A D
3 1/4 @ 0.182 0.256 0.223 0.357 0.134 U U D
4 1/4 @ 0.325 0.257 0.060 0.354 0.294 D D D
5 1/8 @ 0.300 0.146 0.078 0.354 0.227 D D U
6 1/8 @ 0.185 0.129 0.165 0.345 0.181 U U D
7 1/4 @ 0.182 0.257 0.173 0.347 0.174 D D D
8 3/8 @ 0.185 0.381 0.173 0.348 0.179 D D D
9 1/4 @ 0.185 0.257 0.110 0.291 0.181 D D N/A
10 1/8 @ 0.185 0.129 0.085 0.267 0.182 D D U
11 1/2@ 0.040 0.503 0.220 0.260 0.040 N/A N/A D
12 3/8 @ 0.150 0.381 0.085 0.267 0.182 D D D
105
11L Validation Zone 1 (11L-V1)
Sandia Labs Flaw Call Layout
11L – V1 1 (see C-scan images that follow)
1
2 L
3 2
4 S 3
4
5 M
6 5
S
7 6
M
8
S 7
9 8
M
9 10
10
L
S
= flaw not detected

Photo of Flaw Layout with #3, (1/8” dia.) was not detected in Zone 11L-V1
Sandia Flaw Calls Superimposed
L = large flaw
M = medium flaw
S = small flaw
2
3
4
7
8
10 9
Gate 1 Amplitude (a) Gate 2 Amplitude (a)
4 4 Flaw Profile
(mirrored to
5 5 match UT
6 6 scans)
7 7
9 9
10 10
Gate 3 Amplitude (a) Gate 4 Amplitude (a)
106
4
Caution: data drop
zone; check other scans
5 for confirmation
7
8
9
10
Gate 1 Time of Flight (a) Gate 2 Time of Flight (a)

1
2 4
3
4 5
6
5
7 8
8
9
10 9 10
Flaw Profile
(mirrored to match UT scans) Gate 4 Time of Flight (a)

1
2 1
3
4 2
5
4
6
5
7
8
10 9
1 1
2 2
4 4
5 5
Gate 3 Amplitude (b) Gate 4 Amplitude (b)
107
Flaw Pattern and Size Prediction

2.75”
1
1 L
2 1”
2 Flange
S
3 4 0.75”
4 M
1.75” 5 1.0”
5
S
0.5” 6
6 M 1.25”
7 2.75”
7 S 7
8 8 1.5”
Apex
M
10 9 9 10
0.8”
L
S
2.1” 0.25”
Orientation from Scan Surface
Orientation from Backside Surface
(reversed pattern)
= flaw not detected
Approximate dimensions labeled
#3, (1/8” dia.) was not detected in Zone 11L-V1
L = large flaw
M = medium flaw
S = small flaw
Flaw Detection Summary for Panel 11L Upper Surface Validation Zone 1
Zone 11L-V1
Verification Ø @ Hole Ø Remaining Thickness Actual ET MWM UT PE
Hole # Depth Material Near Hole
Thickness Hole Depth
1 1/2 @ 0.040 0.496 0.218 0.246 0.028 N/A N/A D
2 1/4 @ 0.115 0.257 0.134 0.246 0.112 D D D
3 1/8 @ 0.115 0.128 0.123 0.241 0.118 U D U
4 3/8 @ 0.190 0.381 0.059 0.242 0.183 D D D
5 1/4 @ 0.190 0.257 0.058 0.251 0.193 D D D
6 3/8 @ 0.115 0.381 0.141 0.250 0.109 D D D
7 1/8 @ 0.115 0.128 0.138 0.252 0.114 A D D
8 3/8 @ 0.040 0.381 0.218 0.252 0.034 N/A N/A D
9 1/2 @ 0.115 0.512 0.137 0.247 0.110 D D D
10 1/4 @ 0.040 0.256 0.213 0.249 0.036 N/A N/A D
108
11L Validation Zone 2 (11L-V2) - Apex
(see C-scan images that follow)
11L – V2
2 1 2
S L
3 3
1 M
4 5 4 5 6
S S M
6
7 8
7
8
L
10
9 10
9 S S
= flaw not detected

Photo of Flaw Layout with #7 (1/8”) was not detected in Zone 11L-V2
L = large flaw
M = medium flaw
S = small flaw

8
10
9 10
Gate 4 Amp dB (a) 1 2

3
8 4 5 6
9 7
8
9 10

Flaw Profile
109
1 2 Flange
3
1 2
Apex 3
4 5 6
4 5 6
Flange
Gate 3 Amp (b)

7
8
1
2
Flange
3 9 10
4 Apex
5 6 Flaw Profile
Flange
Gate 4 Amp (b)

1 Flange
3
1 2
Apex
3
Flange 4 5 6
Gate 2 Time of Flight (b) 7

8
Flange
3 9 10
Apex
Flaw Profile
Flange
110

2.2”
1
2 1 2
L S Flange S
3 L
3
M M
2.6”
4 1.6”
6 5 4 5 6
M S S
S S M
Apex
7 2.1”
2.1”
8 8
L
L
1.5”
10 9 9 10
S S Flange L S
Orientation from Scan Surface Orientation from Backside Surface

Approximate dimensions labeled
= flaw not detected
#7 (1/8”) was not detected in Zone 11L-V2 L = large flaw
M = medium flaw
S = small flaw
Flaw Detection Summary for Panel 11L Apex Surface Validation Zone 2
Zone 11L-V2
Verificatio Ø @ Hole Ø Remaining Thickness Actual ET MWM UT PE

n Depth Material Near Hole Hole
Hole # Thickness Depth
1 1/4 @ 115 0.245 0.156 0.259 0.103 D D D
2 1/2 @ 0.040 0.496 0.230 0.256 0.026 N/A N/A D
3 3/8 @ 0.115 0.381 0.140 0.254 0.114 D D D
4 1/4 @ 0.190 0.243 0.067 0.253 0.186 D D D
5 1/8 @ 0.115 0.128 0.126 0.253 0.127 D D D
6 3/8 @ 0.190 0.382 0.073 0.253 0.180 D D D
7 1/8 @ 0.115 0.129 0.140 0.253 0.113 A A U
8 1/2 @ 0.115 0.511 0.138 0.253 0.115 D D D
9 3/8 @ 0.040 0.376 0.221 0.248 0.027 N/A N/A D
10 1/4 @ 0.040 0.244 0.213 0.250 0.037 N/A N/A D
111
11L – V3 (see C-scan images that follow)
4
S 8
4 1 6
L
8 S M
3
1 6 M 9
7
9 2 5
L
3 S
7 10
S
2 5 = flaw not detected

10 #2, (1/8” dia.) and #9 (1/8”) were not detected
in Zone 11L-V3
Photo of Flaw Layout with

L = large flaw
Sandia Flaw Calls Superimposed M = medium flaw
S = small flaw

4
8 1
6
3 4
8
6 1
7
5
3
9
Gate 2 Time of Flight (a) 7

5 2
4 10
8
6 1
Flaw Profile
(mirrored to match
3 UT scans)
7
5
10
112
4
6
1
4
7 8
6 1
3
Gate 1 Time of Flight (a) 9
7
5 2
8 10
6 1
Flaw Profile
3 (mirrored to match
UT scans)
7
5
10
11L Validation Zone 3 (11L-V3) No Flaws Found in Upper Region

(part b) of 11L V3 Zone
Scan Region Relative to

Flaw Profile – No Flaws Present
4
8
6 1
3
9
7
5 2
10
Flaw Profile
(mirrored to match
Gate 3 Amplitude (b) UT scans)
113

4 Flange 4
8
8 S
1 6
6 1
L M S
3
9 3
M
7 7
2 5 5
L
S
10 Apex 10
S
Orientation from Backside Surface Orientation from Scan Surface

(reversed pattern)
= flaw not detected Approximate dimensions labeled

#2, (1/8” dia.) and #9 (1/8”) were not detected
in Zone 11L-V3
L = large flaw
M = medium flaw
S = small flaw
Flaw Detection Summary for Panel 11L Lower Surface Validation Zone 3
Zone 11L-V3
Verification Ø @ Hole Ø Remaining Thickness Actual ET MWM UT PE
Hole # Depth Material Near Hole Hole
Thickness Depth
1 3/8 @ 0.040 0.383 0.207 0.241 0.034 N/A N/A D
2 1/8 @ 0.190 0.127 0.077 0.242 0.165 D D U
3 3/8 @ 0.190 0.384 0.056 0.240 0.184 D D D
4 1/4 @ 0.115 0.257 0.136 0.241 0.105 D D D
5 1/4 @ 0.190 0.243 0.059 0.241 0.182 D D D
6 3/8 @ 0.115 0.383 0.137 0.244 0.107 D D D
7 1/2 @ 0.115 0.497 0.145 0.242 0.097 D D D
8 1/2 @ 0.040 0.502 0.211 0.247 0.036 N/A N/A D
9 1/8 @ 0.115 0.125 0.133 0.240 0.107 A D U
10 1/4 @ 0.040 0.258 0.211 0.247 0.036 N/A N/A D
114
11L – V4 (see C-scan images that follow)
1
M
1
3 2
L M
4
3
4 2 5
6
L L
6
5 9 7
M 8
M
7
10 S
9 8 12
11
L
10
12 11 = flaw not detected
#4, (1/8” dia.), #8 (1/8”), and #11 (1/8”) were
Photo of Flaw Layout with not detected in Zone 11L-V4
L = large flaw
M = medium flaw
S = small flaw
1
Flange
2 3
2 3
5 4
6
5
9 6
7
7
7 9
12 8
10 10
Apex 10
12
11
Gate 2 Amplitude (a) Flaw Profile
(mirrored to match
3 UT scans)
3
5
6
5 Effects of Thickness
6
Taper Region
9
7
9
10
12
Gate 2 Time of Flight (a) Gate 4 Time of Flight (a)
115
11L Validation Zone 4 (11L-V4) 1
Flaw Profile
(mirrored to match
5 2 3 UT scans)
4
9 5
7 6
10 9
12 7 8
10
12
11
Flange
Apex
Gate 2 Time of Flight (b) Gate 2 Amp dB (b)
Flaw Pattern and Size Prediction 2.40”

1
M
1
Flange 1.75”
3 2 2 3
M L
4
1.5”
5 5
6 6
L L
9 7 9
8 7
M M
10 Apex 10
12 S
11 12
L
Orientation from Backside Surface Orientation from Scan Surface

(reversed pattern)
= flaw not detected Approximate dimensions labeled
#4, (1/8” dia.), #8 (1/8”), and #11 (1/8”) were
not detected in Zone 11L-V4 L = large flaw
M = medium flaw
S = small flaw
116
Flaw Detection Summary for Panel 11L Lower Surface Validation Zone 4
Zone 11L-V4
Verification Ø & Hole Ø Remaining Thickness Actual ET MWM UT PE

Hole # Depth Material Near Hole Hole
Thickness Depth
1 1/4 @ 0.040 0.255 0.327 0.355 0.028 N/A N/A D
2 1/4 @ 0.115 0.257 0.241 0.359 0.118 U U D
3 3/8 @ 0.182 0.381 0.224 0.358 0.134 U U D
4 1/8 @ 0.300 0.120 0.066 0.359 0.293 D D U
5 3/8 @ 0.300 0.382 0.244 0.357 0.113 U U D
6 1/2 @ 0.040 0.509 0.328 0.358 0.030 N/A N/A D
7 1/4 @ 0.185 0.257 0.155 0.341 0.186 A D D
8 1/8 @ 0.185 0.131 0.160 0.342 0.182 U U U
9 3/8 @ 0.190 0.384 0.155 0.340 0.185 D D D

10 1/4 @ 0.150 0.257 0.141 0.285 0.144 D D D
11 1/8 @ 0.190 0.125 0.051 0.248 0.197 D D U
12 1/2 @ 0.125 0.514 0.140 0.257 0.117 D D D
Flaw Detection Summary for 1/8” Flaws in RCC Panel 11L

Detection of 1/8" Diameter Flaws in RCC 11L Specimen
Flaw Identification and Flaw Depth from Detection by
Specimen Front Surface (inches) Pulse-Echo UT
0.190 0.120 0.060 Yes No
11L-Reference Zone 1 (upper) 4 X

11L-Reference Zone 2 (apex) 3 X

11L-Reference Zone 2 (apex) 4 X 1/8” dia. flaw
detection = 31%
11L-Reference Zone 3 (lower) 5 X
11L-Validation Zone 1 (upper) 3 X

11L-Validation Zone 2 (apex) 5 X

11L-Validation Zone 3 (lower) 2 X


117
Specimen Front Surface (inches) Pulse-Echo UT
0.190 0.120 0.060 Yes No


detection = 100%
11L-Reference Zone 3 (lower) 9 N/A *



* Flaw #9 out of scan region
11L-Validation Zone 3 (lower) 10 X Flaw #1 is in scan by itself so no
location info available
∆

Specimen
0.190 0.120 0.060 Yes No


11L-Reference Zone 2 (apex) 7 X detection = 100%




118
Specimen
0.190 0.120 0.060 Yes No


11L-Reference Zone 3 (lower) 1 X 1/2” dia. flaw

detection = 100%




Panel 11L – Flaws in Validation Zones Only
UT Validation PoD - Panel 11L Validation Zones
POD
0.9
0.8
90% PoD = 0.15” dia.
0.7
0.6
0.5
0.4
0.3
0.2
0.1
0
0 0.05 0.1 0.15 0.2 0.25 0.3 0.35
119
Panel 11L – Flaws in Reference and Validation Zones
UT Validation PoD - Panel 11L Validation and Reference Zones
POD
0.9
0.8
90% PoD = 0.22” dia.
0.7
0.6
0.5
0.4
Note: one ¼ dia. miss was added
0.3 to the data in order to get the PoD
calculation to converge. Thus, this
0.2 PoD curve is conservative.
0.1
0
0 0.05 0.1 0.15 0.2 0.25 0.3 0.35
12L Tee Seal

Three Similar Flaw Zones (1, 2, 3) – 2 rows of flaws on each
side of middle flange in each zone
120
12L Tee Seal Inspection
Tee Seal
12L Tee Seal

Raised regions
(heat vent tabs) on
one side of T-seal
flange that impede
UT inspection
Tee Seal Cross Section
4 EBM Notches
Across Flange
12L Tee-Seal
8 - Flat Bottom Holes 1/8”, 1/4”, 3/8”, 1/2”
dia. at Depths Indicated & 4 - EDM
Notches @ Junction
121
12L Tee Seal – Zone 1
11L Side 12L (open) Side
Apex
Apex
1 5
2 6
3 7
4 8
Flange
Flange
12L Tee Seal – Zone 1 11L Side 12L (open) Side
11L Side 12L (open) Side Apex

2
Apex 1/8”
3 Gate 2 Amp (a)

3/8”
4 8
1/2” 1/2”
Flange
Flange
2 Heat Vent Tabs
1/8” (ply buildup)
3
3/8”
4 8 Gate 3 Amp (a)

1/2”
1/2”
122
12L Tee Seal – Zone 1 11L Side 12L (open) Side
Apex 5
1
1/4”
1/8” 2
Gate 3 Amp (b)
Flange 5
1
1/4”
2
1/8”

3/8” 1/2”
12L (open) Side
7 8
2 3 4
11L Side
1/4” 1/8” 3/8” 1/2”
1/2” Gate 1 Amplitude
1 2 3 4
1/4” 1/8” 3/8” 1/2”
123
12L (open) Side
11L Side 1/2”
1/2”
1/2” Gate 1 Time of Flight
1 2 3 4
Gate 1 Amplitude
1/4” 1/8” 3/8” 1/2”

12L (open) Side
11L Side
1/2”
7 8
Gate 4 Amplitude
1 2 3 4
1/4” 1/8” 3/8” 1/2”
124
Flaw Detection Summary for Panel 12L Tee Seal
Upper Surface Validation Zone 1
Zone 12L-1
Drilled FBH Laser Measurement FBH Detected by NDE
Lock Side Ø & Hole Depth Ø Remaining Thickness Actual ET MWM UT PE
Hole # Material Near Hole Hole
Thickness Depth
1 1/4 @ 0.190 0.249 0.190 0.249 0.059 D D D
2 1/8 @ 0.190 0.119 0.164 0.294 0.130 D D D
3 3/8 @ 0.190 0.382 0.218 0.296 0.078 U D D
4 1/2 @ 0.190 0.507 0.232 0.299 0.067 U D D
Slip Side
5 1/4 @ 0.125 0.244 0.231 0.292 0.061 U U D
6 1/8 @ 0.125 0.120 0.212 0.296 0.084 U U U
7 3/8 @ 0.125 0.379 0.213 0.301 0.088 U U D
8 1/2 @ 0.125 0.509 0.249 0.300 0.051 U U D
Notch # 1/2 Width EDM Notches Machined @ the Web Junction
1 1/2 Width N/A N/A U U U
12L Tee Seal – Zone 2 (Apex Region)

Flange Flange
1 5
2 6
Apex Apex
3 7
Flange 4 8 Flange
125
7
Flange
3/8” 3/8”
8
Apex 4
1/2” 1/2”
Gate 2 Amp (a)

Flange
3/8”
Gate 3 Amp 4
1/2”
Gate 4 Amp (a)

Apex Surface Validation Zone 2
Zone 12L-2
Hole # Material Near Hole Hole Depth
Thickness
1 1/4 @ 0.190 0.249 0.206 0.280 0.074 U U U
2 1/8 @ 0.190 0.124 0.213 0.276 0.063 U U U
3 3/8 @ 0.190 0.380 0.093 0.276 0.183 D D D
4 1/2 @ 0.190 0.500 Drilled 0.284 D D D
Through
Slip Side
5 1/4 @ 0.125 0.247 0.187 0.308 0.121 U U U
6 1/8 @ 0.125 0.119 0.226 0.301 0.075 U U U
7 3/8 @ 0.125 0.374 0.193 0.294 0.101 D D D
8 1/2 @ 0.125 0.500 0.207 0.277 0.070 U U D
126
11L Side 12L (open) Side 12L (open) Side
Flange
5
1 5
6
2 6
3 7 7
8
4 8
Apex

1/8”
Flange
3/8”
8
4
1/2”
Gate 2 Amp (a)
Apex 2
1/8”
3/8”
1/2”
Gate 3 Amp (a)
127
12L (open) Side
1 2 3 4
11L Side
1/4” 1/8” 3/8” 1/2”

1 2 3 4
1/4” 1/8” 3/8” 1/2”

Lower Surface Validation Zone 3
Zone 12L-3
Hole # Material Near Hole Hole
Thickness Depth
1 1/4 @ 0.190 0.248 0.178 0.281 0.103 D D D
2 1/8 @ 0.190 0.119 0.193 0.280 0.087 U U D
3 3/8 @ 0.190 0.373 0.212 0.284 0.072 U D D
4 1/2 @ 0.190 0.495 0.193 0.290 0.097 D D D
Slip Side
5 1/4 @ 0.125 0.248 0.245 0.302 0.057 D U U
6 1/8 @ 0.125 0.119 0.222 0.302 0.080 U U U
7 3/8 @ 0.125 0.373 0.234 0.296 0.062 U D U
8 1/2 @ 0.125 0.500 0.222 0.294 0.072 D D D
128
Flaw Detection Summary for All Flaws in RCC Tee Seal 12L
Detection Flaws in RCC Tee Seal 12L
Detection by
Flaw Size and Location
Flaw Size Pulse-Echo UT
Lock Side (11L) Slip Side (12L) Yes No
1/8" diameter #2 (Zone 1) X





Panel 12L Tee Seal
PoD Curve for Pulse Echo Ultrasonic NDI Validation on RCC Tee Seal Panels
POD
0.9
0.8
0.7
0.6 90% PoD = 0.38” dia.
0.5
0.4
0.3
0.2
0.1
0
0 0.05 0.1 0.15 0.2 0.25 0.3 0.35 0.4 0.45 0.5
129
All NASA RCC Test Specimens (Phase I & Phase II)
UT Validation PoD - All NASA RCC Specimens
POD
0.9
0.8
90% PoD = 0.21” dia.
0.7
0.6
0.5
0.4
Note: This PoD curve represents the flaw detection capability

0.3
for the pulse-echo ultrasonic inspection method as calculated
from the results of all NASA specimens – Phase I (flat bottom
0.2 holes, EDM notches, side slots, arc jet disks) and Phase II (flat
bottom holes, impact specimens, 3 pt. bend specimens, 9L
0.1 standards, 11L validation panel)
0
0 0.05 0.1 0.15 0.2 0.25 0.3 0.35
Probability of Detection Curves for Pulse-Echo UT Flaw Detection in

Various NASA RCC Test Specimen Sets
PoD Curves for Overall Pulse Echo Ultrasonic NDI Validation
All RCC Panels 11L Val. Zones 11L Val. & Ref. Zones 9L Specimens
0.9 11L Validation Zones

(90% PoD = 0.15” dia.)
0.8
Overall Results for P-E
UT (90% PoD = 0.21” dia.)
0.7
0.6
11L Valid. & Ref. Zones
(90% PoD = 0.22” dia.)
0.5
0.4
9L Reference Stds.
(90% PoD = 0.24” dia.)
0.3
0.2
0.1
0
0 0.05 0.1 0.15 0.2 0.25 0.3 0.35
130
Summary of UT Flaw Detection Evaluation in 11L & 12L
UT Pulse Echo Flaw Detection Summary
• 11L Panel Reference Zones: 29 detected, 5 undetected,
0 mislocated, 2 ambiguous and 0 false
(Reference Zone Misses = five 1/8 flaws; all flaws larger than 1/8 dia.
were detected with no false calls)
• 11L Panel Validation Zones: 35 detected, 7 undetected,
(Validation Zone Misses = seven 1/8 flaws; all flaws larger than 1/8 dia.
were detected with no false calls)
• 12L Tee Seal Validation Zones: 16 detected, 8 undetected,
(Validation Zones Misses = four 1/8 dia. flaws, one 3/8 dia. flaw, &
three 1/4 dia. flaws; all flaws larger than 3/8 dia. were detected with
no false calls)
• 12L Tee Seal EDM Notches: 0 detected, 12 undetected,
(EDM notches located 0.6 below surface & 0.30 below skin-to-vertical
flange interface; notches are below depth of penetration for UT)
Final Conclusions on Pulse-Echo Ultrasonic Inspection

Method for In-Situ Orbiter Health Monitoring
• 18 month test series for UT system certification was completed
in March 2005; tests utilized 46 specimens containing 306 flaws
• 306 flaws 257 hits, 49 misses; 45 of the misses (92%) were 1/8”
dia.; 98% of flaws larger than 1/8” dia. were detected
• Pulse-Echo Ultrasonics is able to locate flaws through the entire
RCC thickness
• Pulse-Echo UT sensitivity ≈ 1/4” dia. flaw in RCC LE panels;
90% PoD level = 0.21” dia. flaw
• Pulse-Echo UT sensitivity ≈ 3/8” dia. flaw in RCC Tee seals;
90% PoD level = 0.38” dia. flaw
131
APPENDIX A
RCC Life Cycle Wear Study -

Effect of UT/EC Scanner System on
Surface of RCC Panels
132
RCC Life Cycle Wear Study -
Effect of UT/EC Scanner System on
Surface of RCC Panels
Reference: RCC NDE Wear Test Plan (Document Number - KSC-5600-7096)
Background
The Orbiter RCC In-Situ NDE System will be used during Orbiter turnaround flow to perform
inspections of the entry critical RCC panels of the leading edge structural subsystem. Design
and fabrication of the complete RCC In-situ NDE systems are underway at various
organizations. The complete NDE system will be comprised of flash Thermography, Pulse echo
ultrasonic subsystem, and eddy current. During implementation of these inspection tools,
caution will be required to protect the RCC from further damage.
Objective
The objective of this test was to perform a wear study on flat panel RCC using the pulse echo
ultrasonic system to determine if any degradation of the RCC coating material could occur
during inspections. The test was carried out based on the likelihood that a certain area of the
RCC will be inspected a finite number of times over the remaining life of the vehicle. The data
from these tests was used for certification of the equipment. Therefore, the data integrity had
Quality oversight.
Test Article
The test article was an 8.5” L x 4.5” H piece of flight hardware RCC material that was cut from
the lower surface of Panel 9L.
Test Description
The test article was pre-scanned using Eddy Current Si-C thickness measurement at NASA
Langley. A pre-scan flaw profile assessment with Thermography was performed at NASA
Langley. Sandia labs performed pre- and post scan mechanical testing. The ultrasonic scans on
the RCC test article were performed at Sandia labs using the same equipment that will be used
during actual shuttle RCC inspections. Once the wear test was completed, Eddy Current and
Thermography post-scans were performed at NASA Langley.
133
RCC Life Cycle Wear Study - UT/EC Scanner System
• Wear specimen - RCC specimen of sufficient size to include a scan area
with adjacent un-scanned area
• Conduct pre-scan surface characterization – EC Si-C thickness
measurement; IR baseline; mechanical thickness measurement; surface
profilometry; microscopic cleanliness baseline
• Scan the surface using NASA linear spring with Sandia probe, probe
housing, and weeper couplant system (60 cycles)
• Conduct mid- and post-scan surface characterization
Stylus Scanner
Surface Texture/Profile Measurement Sample Three Dimensional Surface Topography Map
NDE RCC UT Wear Study Test Plan

1. Obtain flat RCC specimen of sufficient size to include a scan area with adjacent un-scanned area (e.g. 3” x
3” scan on the interior of a 4” x 4” specimen)
2. Conduct pre-scan surface characterization
a) Eddy current Si-C thickness measurement
b) Perform infrared flash Thermography
c) Perform mechanical thickness measurement (1/2” grid over entire surface)
d) Perform mechanical and / or optical surface profilometry
e) Visually scan the sample surface with a 10x to 30x microscope to check for traces of Delrin housing
or urethane membrane material. (Initially for part cleanliness verification only)
f) Measure the thickness of UT fixture contact area using appropriate micrometer
3. Scan the surface using NASA linear spring with Sandia probe housing / transducer
a) Scan at max spring load to be used on orbiter
b) Perform 60 scans over the same area per the following reasoning:
i. Max orbiter remaining flights = 15
ii. Estimate 2 possible scans to the same area after any flight (based on possible re-scan needed
iii. Use a factor of safety of 2
iv. So 15 flights x 2 scans x 2 safety factor = 60 possible scans over one location during the
orbiters remaining flights
4. Conduct surface characterizations identical to Step 2 above after the 30th scan and final characterization
after the 60th scan (IR and ET to be performed pre-test and after 60th scan only)
5. Section RCC panel in a minimum of 3 locations after final characterizations to observe the surface at
scanned areas as well as un scanned (must assure that the Si-C layer can not be smeared by the cutting
process
6. Record and report all results
134
NDE RCC UT Wear Study and Normal/Shear Load Measurement Test Plan
Quality Assurance Checks
Ø Use a Sandia Quality Assurance to sign off on activities at
predetermined steps in the testing. Suggested steps are:
Ø Verify surface characterization at 0 cycles
Ø Check test set-up prior to wear testing and sign off on scanning
operation
Ø Verify surface characterization performed after 30 cycles
Ø Verify surface characterization performed after 60 cycles
Ø Verify shear stress plan operations are completed per test plan
Ø Verify normal stress measurement operations are completed per
test plan
Ø Utilize a USA and / or NASA Quality Assurance inspector as needed
to verify the entire test plan is completed as written
Wear Test Panel Cut from RCC Panel 9L
Wear Test to Assess Potential Wear of RCC

Surface Caused by Ultrasonic Sanning System
135
Grid Points Layout on Wear Test Specimen for Data Logging
9L X
1 2 3 4 5 6 7 8 9
Outer Box (4” X 4”) –
10 11 12 13 14 15 16 17 18 profile measurements
19 20 21 22 23 24 25 26 27
made over entire box
28 29 30 31 32 33 34 35 36
37 38 39 40 41 42 43 44 45
46 47 48 49 50 51 52 53 54
Inner Box (3” X 3”) –
55 56 57 58 59 60 61 62 63 area scanned 60
times by UT system
64 65 66 67 68 69 70 71 72
73 74 75 76 77 78 79 80 81
Scanning Wear Test Panel with Ultrasonic System
136
Microscopic Surface Assessment - Avant 300 Optical Inspection System
Microscopic photography of RCC panel was
performed to determine if any materials from the
probe housing (delrin or plastic membrane) are
deposited on the surface during UT scanning –
photos on following pages indicate that there are
no deposits on the surface following 30 and 60
scans with the UT probe housing
O.G.P. AVANT Photo

Microscope with a
71X magnification
Grid Point 11
Grid Point 17
Grid Point 41
0 Scan Cycles
(pre-UT scans)
Grid Point 65
Grid Point 71
137
O.G.P. AVANT Photo
Microscope with a
71X magnification
Grid Point 21
Grid Point 25
Grid Point 41
After 30 UT
Scan Cycles
Grid Point 57 Grid Point 61
O.G.P. AVANT Photo

Microscope with a
71X magnification
Note: Grid
dots
Grid Point 25 reinstalled
Grid Point 21 with sharpie
after 30
scans so
shape of
black grid
pts. are
different
Grid Point 41
After 60 UT
Scan Cycles
Grid Point 57 Grid Point 61
138
Surface Profilometry - Taylor/Hobson Pneumo (TalySurf Series 2)
Mechanical profilometry (resolution of 1
in.) was used to determine if the UT
scans produced any wear in the RCC Si-C
coating – profile data on the following
pages show that the surface was
unchanged by the UT probe housing after
60 scans over the same area
139
O CYCLES
30 CYCLES
60 CYCLES
Surface Contour Plots of Entire Specimen Before and After UT Scanning -

No Removal of RCC Material Measured
140
Grid Row 19 - 27
0 Cycles
30 Cycles
60 Cycles
Contour Plots Across Grid Line 19-27 Before and After UT Scanning –
141
Grid Row 37 - 45
0 Cycles
30 Cycles
60 Cycles
142
Grid Row 55 - 63
0 Cycles
30 Cycles
60 Cycles
143
Grid Row 3 down to 75
0 Cycles
30 Cycles
60 Cycles
Contour Plots Across Grid Line 3 to 75 Before and After UT Scanning –

144
0 Cycles
30 Cycles
60 Cycles

145
0 Cycles
30 Cycles
60 Cycles

146
Three Dimensional Contour Plots of Entire Specimen Before and After UT Scanning -
147
Three Dimensional Contour Plots of Entire Specimen Before and After UT Scanning -
148
Eddy Current Results - 9LX Wear Test, MWM Scan Direction 1
Prescan EC Image Approximate 3”x3” wear test area Area of increased
coating thickness and
compressed plies
4.5”
9LX
9LX
y 4”
x 3”
Postscan EC Image Approximate 3”x3” wear test area 8.5”
3”
4”
9LX
(0,0)
y Scan Direction
x
x
y
Eddy Current Results - 9LX Wear Test, MWM Scan Direction 2

Prescan EC Image Approximate 3”x3” wear test area
8.5”
4”
9LX
4.5”
y
3”
x
3”
Postscan EC Image
4”
(0,0)
x
Scan
Direction y
y Approximate 3”x3” wear test area
149
Eddy Current Results - 9LX Wear Test, Spot Probe Data
Prescan Postscan
Original Surface After 60 Scans

y x y x by Contact
UT System
9LX
y
x

Prescan Postscan
Original Surface After 60 Scans by Contact UT System

9LX
y
x
150
Extracted Line Data
Prescan
Calculated Coating Thickness
Postscan
UT wear test region
X Position
Postscan data shows a global shift of approximately 0.0005”,
9LX
most likely due to a calibration artifact. The global shift in the
calculated lift-off could not be caused by the UT wear test
scans, as the shift also extends beyond the wear test region
into the unscanned area. y
x
Conclusions from RCC Life Cycle Wear Study

• Contact ultrasonic scanning system was applied to an RCC panel
• 60 scans were completed to conservatively assess any RCC wear
or degradation stemming from repeated exposure to the
ultrasonic transducer housing
• Series of inspections were performed on the RCC panel before
and after scanning to assess any changes in the surface
• Surface profilometry (resolution of 1 in.) determined that the UT
scans did not produce any wear in the RCC Si-C coating; profile
data showed that the surface profile was unchanged by the UT
probe housing after 60 scans over the same area
• Eddy current thickness mapping showed that there was no
change in the thickness of the Si-C coating after 60 scans nor
was there any change in the EC inspection images
• Microscopic photography of RCC panel determined that there
were no materials from the probe housing (delrin or plastic
membrane) deposited on the surface during UT scanning
151
RCC Normal and Shear Loads Assessment
• Measure Normal Loads - force needed to actuate the vertical,
surface-follower springs in the linear spring, probe holder
device
• Measure Shear Loads – A force transducer will be used to
measure the force needed to actuate the scanner arm
(determine the friction load at the transducer-RCC interface)
Shear
Force
Direction
Linear
Normal Force Interface X-Slide
Direction Shear Load
RCC Contact Loads

Scope
– These contact definitions prescribe the loads allowed to be applied to
the RCC by NDE devices and define the allowed materials for devices
applying loads to RCC
– These contact definitions are for the RCC NDE devices including
• Flash Thermography hood
• Eddy Current probe
• Eddy Current MWM conformal array probe
• Pulse Echo Ultrasound probe with weeper
• Marking system templates
152
RCC Contact Loads Allowables
• Contact materials for this interface
– Ensolite, Nylon, Delrin, Kapton, Mylar, urethane, phenolics, Mystic
7000/7001 tape
• Force applied is from the maximum allowed operator or equipment
induced load
• Load applied normal to RCC surface with conforming contact
– not to exceed 6 psi
– not to exceed 30 lb total per panel (WLE, nose, chin) or gap seal
• Load applied normal to RCC surface with flat or nonconforming
contact
– projected contact area not to exceed 3 sq. inches
– not to exceed 3 psi averaged over projected area
• Shear load not to exceed 3 psi
Flat or Nonconformal Contact

Convex at apex Concave at apex
(Panel 19) or nose (Panel 6)
Point contacts
Contact at flat to curve

intersect
Force normal
to surface
Probe or pad
Projected contact area
153
RCC Contact Configuration
Travel any direction in

a plane tangent to RCC
surface
NDE RCC UT Normal and Shear Load Measurement Test Plan

1. Shear Stress Measurement (max 3 psi allowable)
a) Use a force transducer to measure the force needed to move the scanner
arm when the transducer is in the air (not conacting surface); Linear Slide
Resistance in Air = R1
b) Use a force transducer to measure the force needed to move the entire
scanner arm so that the UT transducer moves across the RCC surface at
maximum load. Friction Shear Load + Slide Resistance = R2
c) Calculate friction force at RCC surface. Friction Force at RCC Surface = R2 – R1
d) Divide this force by the projected surface area in contact with the RCC to
determine shear stress.
2. Normal Stress Measurement (max 6 psi allowable; 3 psi for projected area)
a) Use a force transducer to measure the force needed to actuate the
vertical, surface-follower springs.
b) Divide this force by the projected surface area in contact with the RCC to
determine normal stress.
154
Assessment of Shear Forces on RCC
Measurement Device: Quantrol Advanced Force Gage 100N (resolution = 0.1 oz.)
Shear Loads
A force transducer will be used to measure the force needed to actuate the scanner arm as shown below.
One measurement will be made without the transducer in place. This will determine the amount of force
needed to move the scanner arm along the rail (resistance in the linear slide scanner arm). This is called
the linear slide resistance force (R1). A second measurement will be made with the transducer mounted
and an RCC panel in place under the transducer. In the second measurement, the UT transducer will move
across the RCC surface. This second measurement will determine the friction load at the transducer-RCC
interface as well as the resistance in the linear slide (scanner arm). This is called the friction shear load plus
the linear slide resistance force (R2). The first force measurement will be subtracted from the second to
determine the friction shear load on the RCC (R3). This friction shear load on the RCC (R3) will be divided
by the surface area in contact with the RCC to determine the shear stress on the RCC panel. The shear
stress shall not exceed 3 psi.
Shear Force Direction

R2 – R1 = R3
(friction shear load on RCC)
Linear Slide
Determining Shear Forces on RCC

Average Three Measurements
Linear Slide Resistance in Air = 31 oz., 31.5 oz., 30

oz.
R1 = 1.93 lbs. (30.8 oz.)
Friction Shear Load + Slide Resistance = 52.7 oz.,

54 oz., 56 oz.
R2 = 3.39 lbs. (54.2 oz.)
Friction at RCC Surface = R2 – R1 = 1.46 lbs.
Surface Shear Stress = Friction at

RCC/Surface area
Surface Shear Stress = 0.61 psi (min) to 1.88

psi (max)
Allowable shear stress on RCC panel is 3 psi
(membrane dia. = 1.0” for min contact area)

(delrin housing dia. = 1.75” for max contact area)
155
Assessment of Normal Forces on RCC
Measurement Device: Quantrol Advanced Force Gage 100N (resolution = 0.1 oz.)
Normal Loads
A force transducer will be used to

measure the force needed to
actuate the vertical, surface-follower
springs in the NASA linear spring,
probe holder device. The measured
force will be divided by the surface
area in contact with the RCC to
determine the normal stress on the
RCC panel. The normal stress shall
not exceed 6 psi. The force will be
measured at the base of the probe
housing and in the direction shown
below
Determining Normal Forces on RCC

Average Three Measurements
Normal Force = 49.5 oz., 50.5 oz., 50 oz.

Fn = 3.13 lbs. (50.0 oz.)
Normal Surface Stress = Normal

Force at RCC/Surface area
Normal Surface Stress = 1.30 psi
Allowable normal stress on RCC

panel is 3 psi if projected contact
area is used
(delrin housing dia. = 1.75” for

projected contact area A= 2.4 in.2)
156
APPENDIX B
PULSE-ECHO ULTRASONIC INSPECTION

PROCEDURE for SPACE SHUTTLE
SILICON CARBIDE COATED REINFORCED
CARBON-CARBON (RCC)
HEAT SHIELD PANELS
157
PULSE-ECHO ULTRASONIC INSPECTION PROCEDURE for
SILICON CARBIDE COATED REINFORCED CARBON-CARBON (RCC)
HEAT SHIELD PANELS USED ON THE SPACE SHUTTLE
April 2005
Phil Walkington and Dennis Roach
Sandia National Laboratories - Albuquerque, NM
Prepared for NASA
1.0 SCOPE
This procedure describes the criteria and procedure for ultrasonic (UT) inspection of silicon
carbide coated reinforced carbon-carbon (RCC).
2.0 REFERENCES
2.1 SAIC Ultra Image International

Operation Manual UltraSpect-MP
3.0 REQUIREMENTS
3.1 Inspection Equipment
3.1.1 Ultra Image Low Profile 2-Axis Manual Scanner (LPS-100) per Figure 1 & 2
3.1.2 UltraSpect-MP Data Acquisition System per Figure 3
3.1.3 Sony laptop computer with SAIC Ultraspect software
3.1.4 Ultrasonic Probe (GE Inspection Technologies / Krautkramer 1 MHZ; 1.0 inch
diameter; 2.0 inch SPH Focus part # 389-058-620) per Figure 4
3.1.5 Testech Weeper per Figure 5 & 6
3.1.6 Ultrasonic Calibration Standards
3.1.7 Bogen Tripod: manual scanner positioning mechanism (Model # 3058) per Figure 2
3.2 Supplemental Equipment and Materials
3.2.1 Ultrasonic Couplant - Distilled Water
3.2.2 Mystic Tape – approved for placement on RCC surface
158
3.2.3 120 V AC power
3.2.4 Personnel stand/ladder to allow access to points 76" from floor
3.2.5 Mylar film (0.001" thick)
3.3 Personnel
It is recommended that the inspector using this procedure be experienced and knowledgeable
in the fundamentals of ultrasonic testing. Inspectors should fully possess the qualification of
ultrasonic testing personnel as defined in Recommended Practice No. SNT-TC-1A, Personnel
Qualification and Certification in Nondestructive testing, available from ASNT (American
Society for Nondestructive Testing), ATA 105 or other approved certification standard. It is
recommended that the inspector has taken the SAIC Ultra Image International UltraSpect-MP
Scanner Course so that they are familiar with all system software and controls.
4.0 PROCEDURES
Refer to the referenced operation manuals for the description of the software as needed. A
brief overview of the System setup and Calibration Icons are shown in Figure 7.
4.1 Instrument Set-Up
4.1.1 Connect the cables between the laptop PC and data acquisition system (DAS) as shown
in Figure 3. Setup the tripod and attach the manual scanner as shown in Figure 2. Attach
the probe holding fixture (linear spring) to the manual scanner and then attach the
WEEPER body to the yoke on the linear spring as shown in Figure 2. Place the ultrasonic
(UT) probe into the WEEPER body and connect the water line to the weeper body from
the water distribution system as shown in Figure 2. Finalize the cable connections from
the DAS, manual scanner and ultrasonic probe as shown in Figure 3.
4.1.2 Position the manual scanner system over the UT Calibration Standard. Position the
tripod with the manual scanner so that the linear spring which holds the Weeper body is
in contact with the RCC surface. The linear spring should be at middle range of travel so
that the Weeper body can follow gradual contour changes and move smoothly across the
surface. Position the UT probe on the appropriate UT Calibration Standard at an
unflawed area. Turn the power on to the recirculation pump in the water distribution
system and set the recirculation valve to open. Next, adjust the water flow to the
WEEPER body and clear out any air bubbles in the water column by turning the weeper
end cap up so that any air can escape from the holes in the membrane. The UT
Calibration Standard contains a series of flat bottom holes (FBH) at various depths from
the front surface. These FBH locations are referenced in the following inspection
procedure and can be used to interpret the inspection results.
159
4.1.2.1 During inspection of the calibration standard, the scanner and ultrasonic probe
should be in the same orientation as they will be deployed in subsequent RCC
inspections. The cal standard inspection can be completed on an adjacent work
surface or by placing the calibration standard over the region of interest on the RCC
panel. If necessary, Mylar film can be placed between the cal standard and the
RCC surface. By looking at the resulting flaw pattern on the C-scan and comparing
it to the known flaw layout in the calibration standard, this process will allow the
inspector to determine the orientation of the C-scans produced by the system. This
will ensure that any flaw indications found during the actual inspection will be
accurately located on the RCC panel.
4.1.3 Turn the power on to the laptop PC. Once the laptop computer has booted up, go to the
SYSTEM UTILITIES Icon and select which scanner will be used for this inspection
(manual or automatic). The manual scanner can be selected in ‘Defaults’ at “Custom 1”
as shown in Figure 8. The manual scanner can now be set up to perform an ultrasonic
inspection. Turn the power on to the DAS. Now right click the red A icon in the lower
right corner of the screen and then left click ‘Status’ for the System Status window to
appear. In approximately 30 seconds to three minutes, the DAS Subsystem will indicate
‘Online’ as shown in Figure 9.
4.1.4 Now the ultrasonic test parameters can be set up by selecting the UT CALIBRATION
Icon and selecting the ‘OMASTER.tiff’ file as shown in Figure 10. Once the
‘OMASTER.tiff’ file is open, go to ‘File’ and do a ‘Save As’ (example PE03482). The
file is now unlocked so new setup parameters can be entered. Now go to ‘Channel’ and
select “Channel 1” and then go to ‘Settings’ to select ‘Select Ch/Gt’ as shown in Figure
11. Four gates have been selected in this example. The ultrasonic transducer information
can be documented in the ‘Transducer’ section (Figure 12).
4.1.5 Select “Pulser Preamp” and set PULSER TYPE to Sq. Wave and the WIDTH to 700
nanoseconds. Adjust the DAMPING to 100 ohms, GAIN to 35 dB, and VOLTAGE to
300 volts. Set the LP FILTER to off and the HP FILTER to 0.25 MHz.
4.1.6 Set the correct focus of the UT probe in the Weeper body in order to image the BS of
the RCC material. Right now, the time base for the A-trace display is set to show the first
twenty microseconds with the main bang on the left side as shown in Figure13. Go to
“Gate Adjust”, set the A-DELAY and A-WIDTH for 40 microseconds each and the C-
DELAY for 45 microseconds and the C-WIDTH for 12 microseconds. Set the PEAK
MODE to Max so that the highest peak in the gate is recorded. The A-trace display now
displays a flat A-trace on the screen (Figure 14) because the back surface (BS) is later in
time and could be viewed by changing the time base. As the inspector pushes the UT
probe into the Weeper body an echo will appear in the A-trace display (Figure 15). Now
the inspector needs to adjust the time base for the A-trace display for a viewing window
of 44 to 60 microseconds and push the UT probe into the Weeper body until the large
negative peak is at approximately 47 to 48 microseconds as shown in Figure16. The A-
trace signal on the screen from left to right shows: (A) echo from the WEEPER
membrane / front surface (FS) echo, (B) region between front and back surface, and (C)
160
the back surface (BS) echo of the RCC material. The BS echo is approximately 5
microseconds from the FS (time base 53 microseconds). Due to the inspection frequency
of 1 MHz there is a long ring down which makes it difficult to image flaws close to the
FS. The signal variations between (B) and (C) are used to detect flaws in the RCC
material.
4.1.7 Move the transducer around the RCC surface with the manual scanner X-Y Controls
and adjust the “Pulser Preamp” GAIN until the amplitude of the echo from the back
surface (BS) of the RCC reads approximately +80% Full Screen Height (FSH). These
settings can vary from probe to probe and are somewhat dependent on operator
preferences.
4.1.8 Set up the necessary parameters to do a full wave capture of the ultrasonic signals
between the front surface (FS) and back surface (BS) of the RCC specimen. In the
“Acquisition” menu, set the VIDEO MODE to collect “Full” wave (positive and negative
peaks) data acquisition as shown in Figure17. Set the ‘A/D Rate’ to 50 Msps. Select
“Signal Processing” and set the I-Gate from Off to SW (software gate) (Figure 18) and in
the ‘Gate’ menu select the Interface Gate (Figure 19). Now the SURFACE FOLLOWER
is on. The surface follower threshold can be set to approximately 50% by going to ‘File’
and unlocking this file. This selection should give a consistent signal display with the A-
trace screen display triggering on the front surface echo signal (A) as shown in Figure 20.
4.1.9 To detect flaws in the RCC material, a series of gates will be positioned in the data
acquisition system. The gates are set in order to control the acquisition of appropriate UT
information. User specified depth gates allow only those echo signals that are received
within a limited range of delay times following the front surface (FS) echo to be in the C-
scan plot.
4.1.9.1 Now the inspector is ready to select “Gate Adjust” while the Interface Gate is
still selected. The operator can set the V-DELAY to 45 microseconds, V-WIDTH
to 20 microseconds for the full wave signal capture interval (green color on the A-
trace display ) and the I-DELAY to 46 microseconds, I-WIDTH to 12 microseconds
for the C-scan plot (red color on the A-trace display) as shown in Figure 20. The
full wave capture will allow the operator to re-adjust gate delays and widths after
the RCC material has been scanned and generate new C-scan plots. The position
and number of gates will determine the C-scan data plotted. The operator can select
up to four separate gates consisting of either positive, negative, or both signal
amplitudes or time of flight intervals. The gates can be positioned by selecting
‘GATE’ and selecting either Gate 1, 2, 3 or 4 in the menu (Figure 21 and 22).
4.1.9.2 By employing a series of gates in one scan, it is possible to display data over a
wide range of depths. Once ‘Gate 1’ has been selected, the operator can set the I-
DELAY and I-WIDTH for each of the four gates to display C-scan information.
Repeat the gate selection process for each of the four gates.
161
4.1.9.3 Set-up information will be saved for this file upon exit. It is important to
understand that once a file is unlocked, any changes will be saved upon exit. To
recall a particular setup, just go back to the UT CALIBRATION icon and select that
FILE (example PE03482) and go to ‘File’ and do a ‘Save As’ (example PE03482x).
By opening this file, all the old scanning parameters are called in and will be saved
under a new test name. This way the original file won’t be altered.
4.1.10 Complete the calibration standard inspection.

4.1.10.1 Position the UT probe over the reference standard that represents the inspection
zone to be scanned and adjust the water flow to the weeper body to ensure optimum
UT coupling with the RCC surface.
4.1.10.2 Use engineered flaws on the reference standard to check equipment operation
and data acquisition gate settings. Use this set-up and standard to adjust the
position (focus) of the UT probe in its housing so that an optimal back surface
signal is produced.
4.1.10.3 Adjust the gain until the amplitude of the echo from the back surface of the
RCC is approximately 80% of full screen height over a non-flawed area and record
the gain level used.
4.1.10.4 Establish scan boundaries to cover the region of interest, set the step size for
data acquisition in the X and Y direction to 0.040" increments, and complete a scan
of the reference standard.
4.1.10.5 Save the recorded data to the computer hard disk
4.2 Inspection Procedure
4.2.1 Position the tripod with the manual scanner so that the linear spring which holds the
Weeper body is in contact with the silicon carbide coated reinforced carbon-carbon
(RCC) surface. The linear spring should be at middle range of travel so that the Weeper
body can follow gradual contour changes and move smoothly across the surface. Turn
the power on to the recirculation pump in the water distribution system and set the
recirculation valve to open. Next adjust the water flow to the WEEPER body and clear
out any air bubbles in the water column by turning the weeper end cap up so that any air
can escape from the holes in the membrane. Now the ultrasonic test parameters can be
set up by selecting the EXAM icon and selecting the current test name (example
‘PE03482.tiff’) file. After this file is opened, go to ‘Scanner’ and select “Exam
Setup/Position” as shown in Figure 23. Then enter the X-Y scanning dimensions and the
interval for the X-Y data collection in the “Exam Setup/Scanner Position” menu as
shown in Figure 24.
4.2.2 Establish the scan boundaries to cover the region of interest and set the step size for
data acquisition in the X and Y direction to 0.040" increments.
4.1.2.1 Prior to initiating the inspection scan, place a piece of Mystic tape on the RCC
panel such that it is inside the edge of the scan boundary but not over any inspection
area of interest. When the UT probe encounters the tape, a distinct signal – and
162
thus a distinct image – will be produced in the C-scan. This unique portion of the C-
scan will allow the inspector to determine the orientation of the C-scans produced
by the system. This will ensure that any flaw indications found during the actual
inspection will be accurately located on the RCC panel.
4.2.3 Adjust the water flow to the weeper body to ensure optimum UT coupling with the
inspection surface.
4.2.4 Move the UT transducer to at least three different locations within the inspection area
of interest. Adjust the gain until the amplitude of the echo from the back surface of the
RCC is approximately 80% of full screen height over a non-flawed area and record the
gain level used. Gain adjustments from the levels set using the calibration standard will
not exceed ± 4 dB and may not be changed during a scan. The difference between the
reference standard gain and the inspection zone gain used is referred to as the transfer
gain.
4.2.5 Complete the UT inspection by using the manual scanner to move the UT transducer
over the prescribed region of interest. The probe can now be indexed to the starting
position and the “Zero Position” selected so that each axis is set to zero (Figure 24). The
scanning parameters are:
Index Axis: Y
Scan Axis: X
X & Y Resolution EXAMPLE 0.04 inches
Y-Scan Length EXAMPLE 6 inches
X-Scan Length EXAMPLE 6 inches
Y-Scan Exam Vel EXAMPLE 1.0 (Manual)
X-Scan Exam Vel EXAMPLE 1.0(Manual)
Finally, the inspector can check all the Scan Setup Parameters and, if satisfied, the scan
can be started by selecting “Scan” (Figure 25). At the end of the scan, the operator can
STOP and then save the data (Figure26). The engineered flaws are clearly visible when
viewed side-by-side with adjacent, unflawed material.
4.2.6 To RESCAN a specific region within the scan area before the scan is saved, just use the
X-Y controls to go back over an area and the new data will be rewritten.
4.2.7 Save the recorded data to the computer hard disk.
4.2.8 Data analysis: utilize the “Amplitude” and “Time of Flight” C-scan images, along with
select A-scan waveforms from critical regions to determine the presence of flaws in the
material.
4.2.9 To SCAN a new area, go to the UT CALIBRATION Icon and select the “test.tiff” file
that has the right scanning test parameter. Once the “test.tiff’ file is open, go to ‘File’ and
do a ‘Save As’ (example PE03482x). Now the inspector has the new test file ready. The
file is now unlocked so new setup parameters can be entered if needed. Next the
ultrasonic test scan parameters can be set up by selecting the EXAM icon and selecting
163
the new test name (example ‘PE03482x.tiff’) file. Once this file is open, go to ‘Scanner’
and check the X-Y scanning dimensions and the interval for the X-Y data collection. The
probe can now be indexed to the starting position and the “Zero Position” selected so that
each axis is set to zero. Then select “Scan” to start the data collection for the new test.
5.0 EVALUATION
5.1 Once the digitized A-scan waveforms are recorded during the ultrasonic pulse-echo
inspection of the RCC material, the amplitude, dB (attenuation), and time of fight peak
signals can be displayed as a C-scan image and analyzed to determine if a flaw exist within
the material. The reflected beam from the back surface of the RCC material can be used as
the starting point for this analysis. The pseudo colored C-scan image can reveal several
variations within the RCC material. The peak amplitude from the back surface is affected by
the attenuation within the material and will be displayed in the pseudo colored C-scan image.
Any large amplitude change (>12db) in the C-scan image shall be reported. Depending upon
the geometry of a flaw and location within the RCC material, the amplitude might not appear
very different than that of the surrounding back surface. This is where the time of flight C-
scan image can show a slight shift in the pseudo color of the back surface. By analyzing all
pseudo colored images (amplitude, dB, and time of flight) and the A-scan waveforms, the
inspector can determine if a flaw exists within the RCC material. The time of flight C-scan
image also shows thickness variations or the taper along the edges of the RCC panel. Figure
27 is a photo of an RCC test specimen containing flat bottom holes on the backside.
Inspections were completed from the opposite (unflawed) side and the resulting C-scan
image is shown in Figure 28. The flaws are detected by the UT system and clearly imaged in
the color-coded scans.
6.0 INSPECTION RESULTS
6.1 Report all flaws greater than 0.25 inches in diameter and any large amplitude changes
(greater than 12 dB) that appear in the C-scan image to the appropriate engineering personnel
on site for further evaluation / action.
164
Figure 1: Ultra Image Low Profile 2-Axis Manual Scanner
Figure 2: Manual Scanner Mounted on Tripod with Weeper
165
UT and EC Scanner System Hook-Up
Connections on Back of DAS Box:

• UT transducer ⇒ T/R1 (BNC
connector)
• EC transducer ⇒ Probe 1 (9 pin, male)
• Scanner position encoders ⇒ 9 pin
female connector
• Network jumper (blue cable) ⇒
connect
LAN to top Network Port
• DAS-to-computer (orange cable) ⇒
second port on Network
Data Acquisition Box Ports card
Connections on Back of Laptop:

• Power supply to computer
• Computer-to-DAS (orange
cable)
Laptop Computer
Figure 3: Cable Connections Between Laptop, DAS, Manual Scanner and UT Probe
Coax
Cable
LIMA-to-BNC
Connector RF-to-BNC
Connector
Ultrasonic
Transducer
Weeper
Body
Yoke
Figure 4: Individual View of Weeper Body, Ultrasonic Transducer

166
Coax
Cable Ultrasonic
Transducer
Connectors
Weeper
Body
Yoke
Weeper Base/Membrane
Figure 5: Assembled View of Weeper Body, Ultrasonic Transducer,

Figure 6: Testech Weeper Water Supply
167
System Setup and Calibration
As with all inspection processes, Calibration file selection is the first step to setting up the instrument
for data acquisition. Double clicking the calibration icon (shown below) will bring up the file selection
window as shown on the next page. The other system icons and a brief explanation of their function
are also given.
UT Calibration: Ultrasonic parameters setup and calibration module. Setup files may be
selected or created; UT calibrations are performed in this module.
Exam: Data acquisition module. All scanner functions and data collection parameters are
controlled from this module. Motion control for jogging and positioning scanner head
can be performed here.
Analysis: All data analysis and report functions are performed

in this module.
168
Scanner Position: Contains the same motion control for jogging and positioning as found in
Exam but does not require an Exam file to be opened.
System Utilities: Scanner selection, Motion enable and other functions

are found in this module.
Figure 7: System Setup and Calibration Icons
Figure 8: System Utilities Menu
Figure 9: System Status
169
Figure 10: UT File Selection
Figure 11: Channel 1 Gate Selection
170
Figure 12: Transducer Settings
Figure 13: UT Main Bang Signal on A-trace Display
171
Figure 14: UT signal on A-trace Display during Weeper/probe adjust
Figure 15: UT signal on A-trace Display during Weeper/probe adjust
172
Figure 16: UT signal on A-trace Display at Inspection Focus
Figure 17: Acquisition Menu/Video Mode set to Full wave capture
173
Figure 18: Signal Processing Menu/SW Gate selected
Figure 19: Gate Menu/Interface Gate selected
174
Figure 20: Surface Follower Threshold set to 50% FSH
Figure 21: Gate 1 setup to display data at C-Delay of 5 microseconds
175
Figure 22: Gate Menu with Gate 2 selected
Figure 23: Exam Setup/Position Menu
176
Figure 24: Exam Setup/Scanner Position
Figure 25: Exam Scan Start
Figure 26: Exam Stopped
177
Flaw
Diameter
0. 50”
0.25”
Depth from
0.170” 0.170” 0.210” 0.70”
Front Surface
Figure 27: Photo of RCC Specimen 03-51 Containing Simulated Flaws
Figure 28: Amplitude and Time-of-Flight C-scan Images Showing Flaws in

RCC Test Specimen
178
DISTRIBUTION Kenneth Hodges
M&P Engineering-NDE
Marty Agrella NASA Johnson Space Center
Oceaneering 2101 NASA Road One, ES-4
16665 Space Center Blvd. Houston, TX 77058
Houston, TX 77058-2268
Ajay Koshti (4)
Ron Allison Lead - Nondestructive Evaluation
NASA - Johnson Space Center NASA - Johnson Space Center
2101 NASA Road 1 2101 NASA Road 1, ES-4
Mailcode MV6 Bldg 9E, Rm. 142
Houston, TX 77058 Houston, TX 77058
Tony Corak Jim Landy

United Space Alliance United Space Alliance
USK-823 USK-823
8550 Astronaut Blvd 8550 Astronaut Blvd
CCAS - Hangar N CCAS - Hangar N
Cape Canaveral, FL 32920 Cape Canaveral, FL 32920
Vincent Cubero Alan Ling

United Space Alliance United Space Alliance
M/S USK-T35 USK-237
8550 Astronaut Blvd 8550 Astronaut Blvd.
Cape Canaveral, FL 32920 Cape Canaveral, FL 32920-4304
Donald Curry Dave Lubas (2)

NASA Johnson Space Center Boeing
2101 NASA Road 1 Bldg K6-1096; Room 2403C4
M/S ES32 M/C 721Z-K085
Houston, Texas 77058-3696 Kennedy Space Center, FL 32899
Bob DeVries Cliff Manley

Boeing United Space Alliance
M/C H022-F152 USA-T29
5301 Bolsa Ave. 8550 Astronaut Blvd.
Huntington Beach, CA 92647 Cape Canaveral, FL 32920
Mike Gordon Norm Ruffino

Boeing NASA-Johnson Space Center
100 Boeing Way 2101 NASA Road 1, ES-4
M/C 721B-L325 Bldg 9E, Rm. 142
Titusville, FL 32780 Houston, TX 77058
179
Sam Russell
NASA - Marshall Space Flight Center William Winfree
Mail Code ED32 Mail Stop 231
MSFC, AL 35812 3b East Taylor Street
NASA Langley Research Center
Rick Russell Hampton, VA 23681-0001
NASA – Kennedy Space Center
NASA Orbiter Project Support Office
Mail Code: MV7
Kennedy Space Center, FL 32899
Dan Ryan
United Space Alliance Sandia National Labs:
USK-823 MS-0724 Les Shephard, 6000
8550 Astronaut Blvd MS-0741 Margie Tatro, 6200
CCAS - Hangar N MS-0741 Rush Robinett, 6210
Cape Canaveral, FL 32920 MS-1138 John Mitchiner, 6220
MS-0708 Paul Veers, 6214
Fernando Santos MS-0615 Dick Perry, 6252
NASA - Kennedy Space Center MS-0615 Julia Archibeque-Guerra, 6252
Orbiter Mechanical Systems Engineering MS-0615 Jeff Blanchette, 6252
Mail Code: PH-H1, OSB Room 5203Q MS-0615 Mike Bode, 6252
Kennedy Space Center, Florida 32899 MS-0615 Tony Delong, 6252
MS-0615 Tonimarie Dudley, 6252
Bill Sheldon MS-0615 Joe DiMambro, 6252
Boeing MS-0615 Josephine Graham, 6252 (5)
M/C H022-F152 MS-0615 Gerry Langwell, 6252
5301 Bolsa Ave. MS-0615 David Moore, 6252
Huntington Beach, CA 92647 MS-0615 Ciji Nelson, 6252
MS-0615 Kirk Rackow, 6252
Mike Stoner MS-0615 Dennis Roach, 6252 (20)
United Space Alliance MS-0615 Phil Walkington, 6252
USK-443 MS-9019 Central Technical Files, 8945
8550 Astronaut Blvd MS-0899 Technical Library, 9615 (2)
Cape Canaveral, FL 32920
Mike Tipton
SAIC
2200 Space Park Drive, Suite 200
Houston, TX. 77058
Buzz Wincheski
Mail Stop 231
3b East Taylor Street
NASA Langley Research Center
Hampton, VA 23681-0001
180

Pulse-Echo Ultrasonic Inspection System For In-Situ Nondestructive Inspection of Space Shuttle RCC Heat Shields

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Pulse-Echo Ultrasonic Inspection System For In-Situ Nondestructive Inspection of Space Shuttle RCC Heat Shields

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SANDIA REPORT

Pulse-Echo Ultrasonic Inspection System for

Dennis Roach, Phil Walkington, and Kirk Rackow

Sandia is a multiprogram laboratory operated by Sandia Corporation,

Approved for public release; further dissemination unlimited.

Available to DOE and DOE contractors from

Available to the public from

Pulse-Echo Ultrasonic Inspection System for

Sandia National Laboratories

Section Title Page

1.0 RCC In-Situ NDI Program Background 7

2.0 Description of Pulse-Echo Ultrasonic NDI Technique 16

3.0 Tripod Positioning Mechanism for Manual Ultrasonic Scanner 40

4.0 Ultrasonic Scanner Deployment in Orbiter Processing Facility 47

5.0 Performance Assessment of Pulse-Echo Ultrasonic Inspection System 57

A RCC Life Cycle Wear Study - Effect of UT/EC Scanner System on

Configuration Information on:

Information for NASA Report:

NASA Response to the Columbia

NASA must Continue to Manage the Space Shuttle

• Be cognizant of the risks of using the Shuttle in

• Perform more testing on Space Shuttle hardware rather than relying on

• Collaborate with high-risk industries such as nuclear power & aviation to

Health Monitoring Objective:

Nose Cap, Fwd External Wing Leading Edge

Space Shuttle Orbiter RCC Components

Nose Cap Wing

Mandatory NDE Inspection

Cooler portions of the OML are NOT

Inspection Regions on Forward RCC

Radiative surfaces on RCC

Forward RCC Mandatory NDE Inspection

Nose Cap Tee Seals (5 total)

ARC LENGT HS ARE

Wing Leading Edge Assembly

Composition of RCC Heat Shield Panels

Silicon Carbide Coating – protects the carbon

TEOS & Type A – internal &

Nose section Upper RCC with

Lower RCC (from OPF

Shuttle In-Situ NDI Program

Repetitive flight certification effort –

Goal: deploy a variety of NDI methods to detect RCC

RCC Damage Scenarios - impact damage, loss of coating

SiC Coating Loss Mechanism via

RCC Panel 19 Temp Contour Plot

RCC Panel Inspection Requirements

Backside Si-C to C-C Interface in

Data acquired from LMMFC for

RCC Mass Loss Relationships

SiC Coating Loss Mechanism via

Operator Operator Operator Orbiter

FLASH THERMOGRAPHY EDDY CURRENT PE-ULTRASONIC

NDE SYSTEM STATION SET

2.0 Description of Pulse-Echo Ultrasonic NDI Technique

Pulse-Echo Ultrasonic NDI

UT Niche penetration for deep flaw detection

• Gate settings, appropriate gain,

Pulse-Echo Ultrasonic NDI – C-Scan Approach