Nandha College of Technology: Academic Year 2022-23 (Even Semester)
Nandha College of Technology: Academic Year 2022-23 (Even Semester)
ACTUAL
STAFF HoD
S.No DATE PERIOD TOPICS DATE OF
SIGN SIGN
COMPLETION
1 1.2.23 6 Introduction.
2 2.2.23 1 MOS transistors.
3 3.2.23 4 CMOS Logic,CMOS Inverter.
4 4.2.23 5 Pass transistor,Transmission gate.
5 6.2.23 7 Layout Design Rules,Gate layouts.
6 7.2.23 2 Stick Diagram.
7 8.2.23 6 Long channel I-V,C-V characteristics.
8 9.2.23 1 Non ideal Effects,DC Transfer characteristics.
9 10.2.23 4 RC delay model,Elmore delay ,Linear Delay model.
10 13.2.23 7 Logical effort,Parasitic Delay,Delay in logic gates.
11 14.2.23 2 Scaling.
UNIT II- COMBINATIONAL MOS LOGIC CIRCUITS
COURSE OBJECTIVES
1. To Study the fundamentals of CMOS circuits and its characteristics.
2. Understanding and realization of combinational digital circuits.
3. Understanding and realization of sequential digital circuits.
4. Impart Knowledge on Architectural choices and performance tradeoffs involved in designing and realizing the circuits in CMOS technology.
5. Understanding the different FPGA architectures and testability of VLSI circuits.
ACTUAL
STAFF HoD
S.No DATE PERIOD TOPICS DATE OF
SIGN SIGN
COMPLETION
1 Introduction.
2 MOS transistors.
3 CMOS Logic,CMOS Inverter.
4 Pass transistor,Transmission gate.
5 Layout Design Rules,Gate layouts.
6 Stick Diagram.
7 Long channel I-V,C-V characteristics.
8 Non ideal Effects,DC Transfer characteristics.
9 RC delay model,Elmore delay ,Linear Delay model.
10 Logical effort,Parasitic Delay,Delay in logic gates.
11 Scaling.
UNIT II- COMBINATIONAL MOS LOGIC CIRCUITS
43 FPGA Introduction.
44 FPGA Building Block Architectures.
45 FPGA Interconnect Routing Procedures.
46 Design for Testability: Ad Hoc Testing.
47 Scan Design.
48 BIST.
49 IDDQ Testing.
50 Design for Manufacturability.
51 Boundary Scan.
52 Revision.
COURSE OBJECTIVES
1. To Study the fundamentals of CMOS circuits and its characteristics.
2. Understanding and realization of combinational digital circuits.
3. Understanding and realization of sequential digital circuits.
4. Impart Knowledge on Architectural choices and performance tradeoffs involved in designing and realizing the circuits in CMOS technology.
5. Understanding the different FPGA architectures and testability of VLSI circuits.
Staff Signature HOD/ECE Principal
NANDHA COLLEGE OF TECHNOLOGY
Academic Year 2022-23 (Even Semester)
LESSON PLAN
Name of the staff/
Mrs.K.Poornima /AP/E.C.E.
Designation/Dept
ACTUAL
STAFF HoD
S.No DATE PERIOD TOPICS DATE OF
SIGN SIGN
COMPLETION
1 Introduction.
2 MOS transistors.
3 CMOS Logic,CMOS Inverter.
4 Pass transistor,Transmission gate.
5 Layout Design Rules,Gate layouts.
6 Stick Diagram.
7 Long channel I-V,C-V characteristics.
8 Non ideal Effects,DC Transfer characteristics.
9 RC delay model,Elmore delay ,Linear Delay model.
10 Logical effort,Parasitic Delay,Delay in logic gates.
11 Scaling.
UNIT II- COMBINATIONAL MOS LOGIC CIRCUITS
43 FPGA Introduction.
44 FPGA Building Block Architectures.
45 FPGA Interconnect Routing Procedures.
46 Design for Testability: Ad Hoc Testing.
47 Scan Design.
48 BIST.
49 IDDQ Testing.
50 Design for Manufacturability.
51 Boundary Scan.
52 Revision.
COURSE OBJECTIVES
1. To Study the fundamentals of CMOS circuits and its characteristics.
2. Understanding and realization of combinational digital circuits.
3. Understanding and realization of sequential digital circuits.
4. Impart Knowledge on Architectural choices and performance tradeoffs involved in designing and realizing the circuits in CMOS technology.
5. Understanding the different FPGA architectures and testability of VLSI circuits.
Staff Signature HOD/ECE Principal