TS32G 256GPSD330
TS32G 256GPSD330
TS32G 256GPSD330
TS32G~256
256GPSD330
256GPSD330
2.5” Solid State Disk
Description Features
Transcend PSD is a series of 2.5 PATA SSD RoHS compliant products
with high performance and advanced flash control Supports LBA 48bit addressing.
techniques. Due to smaller size (fit the standard Fully compatible with devices and OS that support the
dimensions of 2.5” IDE Hard Disk Drives), huge IDE standard (44-Pin, pitch = 2.00 mm)
capacity, high speed, and low power consumption, Single Power Supply: 5V±10%
Solid State Disk is perfect replacement storage Operating Temperature: 0oC to 70oC
device for PCs, Laptops, gaming systems, and Storage Temperature: -40oC to 85oC
handheld devices. Operating Humidity (Non condensation): 0% to 95%
Storage Humidity (Non condensation): 0% to 95%
Placement Built-in ECC (Error Correction Code) functionality and
global wear-leveling algorithm ensures highly reliable of
data transfer
True IDE Mode supports:
Ultra DMA Mode 0 to Ultra DMA Mode 6
MultiWord DMA Mode 0 to MultiWord DMA Mode 2
PIO Mode 0 to PIO Mode 4
Shock resistance
MTBF : 1,000,000 hours
Support S.M.A.R.T (Self-defined) to monitor Erase
Count for lifetime evaluation.
Support Security Command
Support Static Data Refresh, Early Retirement to
extend product life
Dimensions
Specifications
Physical Specification
Form Factor 2.5-inch HDD
Storage Capacities 32 GB to 256 GB
Length 100.3 0 0.40
Dimensions (mm) Width 69.85 0.20
Height 7.40 0.15
Input Voltage 5V 10%
Weight 55g 5g
Connector 44-Pin standard IDE/ATA connector (Pitch 2.0 mm)
Capacity
Note. PSD330 series is shipped with RAW format. Inquiry for formatted device please contact with sales/PM.
Performance(SEC 19nm)
Performance(Sandisk 15nm)
Note : Test by Crystal Disk Mark V3.0.1, 500MB size @25 oC, P5K-VM(ICH 9), 1GB RAM * 2, IDE interface support up to
UDMA6, Windows® XP SP3
Note: All data above are maximum value from various test patterns.
Endurance
Capacity 32GB 64GB 128GB 256GB
Tera Byte
20 TBW 40 TBW 80 TBW 160 TBW
Write
Note: Based on JEDEC JESD218A specification, Client Application Class. And based on the following scenario: Active
use: 40oC, 8hrs/day; Retention use: 30oC 1year
Interface
Part Number Interface Transfer Mode Connector
Ultra DMA mode 0~6
44pin 2mm pitch Pin male
TS32G~128GPSD330 True IDE mode Multi-Word DMA Mode 0~2
Header
PIO Mode 0 ~ 4
Environmental Specifications
Operating Temperature 0oC to 70 oC
Storage Temperature -40 oC to 85 oC
Operating Humidity (Non condensation) 0% to 95%
Storage Humidity (Non condensation) 0% to 95%
Condition Standard
EMC/EMI
Compliance CE, FCC and BSMI
Interface Specification
Jumper Settings Master/Slave/Cable-select Settings
ATA/ATAPI 8
ATA Compatibility
UDMA Modes 6
Package Dimensions
Below figure illustrates the Transcend 2.5” Solid State Disk. All dimensions are in mm.
*Note: Tighten mounting screws with no more than 2.0Kg-cm (0.14ft-lbs) of torque.
Pin Assignments
Pin Layout
Block Diagram
A. Record the block erase count and save in the wear-leveling table.
C. Check the erase count when the block popped from spare pool. If the block erase count is bigger than
WEARCNT, then it swapped the static-block and over-count-block.
After actual test, global wear leveling successfully even the erase count of every block; hence, it can extend the life
expectancy of Flash product.
In the MLC technology, multiple charge levels are used to store data. There are many variants that would disturb the
charge inside a Flash cell. These variants can be: time, read operations, undesired charge, heat, etc; each variant
would create a charge loss, and the contents shift in their charge levels slightly. In our everyday usage – more than
60% are repeated read operations, the accumulated charge loss would eventually result in the data loss.
Normally, ECC engine corrections are taken place without affecting the host normal operations. As time passes by,
the number of error bits accumulated in the read transaction exceeds the correcting capability of the ECC engine,
resulting in corrupted data being sent to the host.
To prevent this, Transcend’s SPD330 monitor the error bit levels at each read operation; when it reaches the
preset threshold value, the controller automatically performs data refresh to “restore” the correct charge levels in the
cell. This implementation practically restores the data to its original, error-free state, and hence, lengthening the life of
the data.
The StaticDataRefresh feature functions well when the cells in a block are still healthy. As the block ages over time,
it cannot store charge reliably anymore, EarlyRetirement enters the scene.
EarlyRetirement works by moving the static data to another block (a health block) before the previously used block
becomes completely incapable of holding charges for data. When the charge loss error level exceeds another
threshold value (higher from that for StaticDataRefresh), the controller automatically moves its data to another block. In
addition, the original block is then marked as a bad block, which prevents its further use, and thus the block enters the
state of “EarlyRetirement.” Note that, through this process, the incorrect data are detected and effectively corrected by
the ECC engine, thus the data in the new block is stored error-free.
When a power failure takes place, the line voltage drops. When it reaches the first Logic-Freeze Threshold, the core
controller is held at a steady state. Here are some implications. First, it ceases the communication with the host. This
prevents the host from sending in further address/instructions/data that may be corrupted. During power disturbance,
the host is likely experiencing a voltage drop, so the transmission integrity cannot be guaranteed. Second, it stops the
information sending to the Flash. This prevents the controller from corrupting the address/data being transmitted to the
Flash, and corrupting the Flash contents inadvertently.
Further more, Advanced Power Shield cut off the connection between host power and turn off the controller to
reserve most of the energy for NAND Flash to complete programming. Due to MLC structure, an interrupted
programming may damage a paired page which cause the previous written data lost.
Note:Transcend does not guarantee that data can be protected by Power Shield/ Advanced Power Shield under all
conditions.
Support ATA/ATAPI Command List
Support ATA/ATAPI Command Code Protocol
General Feature Set
EXECUTE DIAGNOSTICS 90h Device diagnostic
FLUSH CACHE E7h Non-data
IDENTIFY DEVICE ECh PIO data-In
READ DMA C8h DMA
READ MULTIPLE C4h PIO data-In
READ SECTOR(S) 20h PIO data-In
READ VERIFY SECTOR(S) 40h or 41h Non-data
SET FEATURES EFh Non-data
SET MULTIPLE MODE C6h Non-data
WRITE DMA CAh DMA
WRITE MULTIPLE C5h PIO data-out
WRITE SECTOR(S) 30h PIO data-out
NOP 00h Non-data
READ BUFFER E4h PIO data-In
WRITE BUFFER E8h PIO data-out
Power Management Feature Set
CHECK POWER MODE E5h or 98h Non-data
IDLE E3h or 97h Non-data
IDLE IMMEDIATE E1h or 95h Non-data
SLEEP E6h or 99h Non-data
STANDBY E2h or 96h Non-data
STANDBY IMMEDIATE E0h or 94h Non-data
Security Feature Set
SECURITY SET PASSWORD F1h PIO data-out
SECURITY UNLOCK F2h PIO data-out
SECURITY ERASE PREPARE F3h Non-data
SECURITY ERASE UNIT F4h PIO data-out
SECURITY FREEZE LOCK F5h Non-data
SECURITY DISABLE PASSWORD F6h PIO data-out
SMART Feature Set
SMART Disable Operations B0h Non-data
SMART Enable/Disable Autosave B0h Non-data
SMART Enable Operations B0h Non-data
SMART Return Status B0h Non-data
SMART Execute Off-Line Immediate B0h Non-data
SMART Read Data B0h PIO data-In
Host Protected Area Feature Set
Read Native Max Address F8h Non-data
Set Max Address F9h Non-data
Set Max Set Password F9h PIO data-out
Set Max Lock F9h Non-data
Set Max Freeze Lock F9h Non-data
Set Max Unlock F9h PIO data-out
General Feature Set
FLUSH CACHE (E7h)
This command is used by the host to request the device to flush the write cache. If there is data in the write cache, that
data shall be written to the media. The BSY bit shall remain set to one until all data has been successfully written or an
error occurs.
NOP (00h)
The device shall respond with command aborted. For devices implementing the Overlapped feature set, subcommand
code 00h in the Features register shall abort any outstanding queue. Subcommand codes 01h through FFh in the
Features register shall not affect the status of any outstanding queue.
This command disables all SMART capabilities including any and all timer and event count functions related
exclusively to this feature. After command acceptance, this controller will disable all SMART operations. SMART data in no
longer be monitored or saved. The state of SMART is preserved across power cycles.
B0h with the content of the Features register equal to D4h. This command causes the device to immediately initiate
the optional set of activities that collect SMART data in an off-line mode and then save this data to the device's non-volatile
memory, or execute a self-diagnostic test routine in either captive or off-line mode.
SMART RETURN STATUS
B0h with a Feature register value of DAh. This command causes the device to communicate the reliability status of the
device to the host. If a threshold exceeded condition is not detected by the device, the device shall set the LBA Mid register
to 4Fh and the LBA High register to C2h. If a threshold exceeded condition is detected by the device, the device shall set
the LBA Mid register to F4h and the LBA High register to 2Ch.
tCYC Cycle time allowing for asymmetry and clock variations (from STROBE edge to STROBE edge)
t2CYC Two cycle time allowing for clock variations (from rising edge to next rising edge or from falling edge to next
falling edge of STROBE)
tDS Data setup time at recipient (from data valid until STROBE edge)
tDH Data hold time at recipient (from STROBE edge until data may become invalid)
tDVS Data valid setup time at sender (from data valid until STROBE edge)
tDVH Data valid hold time at sender (from STROBE edge until data may become invalid)
tCVS CRC word valid setup time at host (from CRC valid until DMACK- negation)
tCVH CRC word valid hold time at sender (from DMACK- negation until CRC may become invalid)
tZFS Time from STROBE output released-to-driving until the first transition of critical timing.
tDZFS Time from data output released-to-driving until the first transition of critical timing.
tFS First STROBE time (for device to first negate DSTROBE from STOP during a data in burst)
tAZ Maximum time allowed for output drivers to release (from asserted or negated)
tENV Envelope time (from DMACK- to STOP and HDMARDY- during data in burst initiation and from DMACK to
STOP during data out burst initiation)
tRFS Ready-to-final-STROBE time (no STROBE edges shall be sent this long after negation of DMARDY-)
tRP Ready-to-pause time (that recipient shall wait to pause after negating DMARDY-)
tACK Setup and hold times for DMACK- (before assertion or negation)
tSS Time from STROBE edge to negation of DMARQ or assertion of STOP (when sender terminates a burst)
Initiating an Ultra DMA data-in burst
Sustained Ultra DMA data-in burst
The above technical information is based on industry standard data and has been tested to be reliable. However,
Transcend makes no warranty, either expressed or implied, as to its accuracy and assumes no liability in connection with
the use of this product. Transcend reserves the right to make changes to the specifications at any time without prior notice.
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