AONY36352: 30V Dual Asymmetric N-Channel MOSFET
AONY36352: 30V Dual Asymmetric N-Channel MOSFET
AONY36352: 30V Dual Asymmetric N-Channel MOSFET
DFN 5X6D
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G2
S2
S1/D2 G1
D1
D1 Pin 1
Pin 1
Thermal Characteristics
Parameter Symbol Typ Q1 Typ Q2 Max Q1 Max Q2 Units
Maximum Junction-to-Ambient A t ≤ 10s 30 30 40 40 °C/W
RqJA
Maximum Junction-to-Ambient A D Steady-State 50 50 65 65 °C/W
Maximum Junction-to-Case Steady-State RqJC 4.6 2.2 6 2.8 °C/W
A. The value of RqJA is measured with the device mounted on 1in2 FR-4 board with 2oz. Copper, in a still air environment with TA =25°C. The Power
dissipation PDSM is based on R qJA t≤ 10s and the maximum allowed junction temperature of 150°C. The value in any given application depends on
the user's specific board design.
B. The power dissipation PD is based on TJ(MAX)=150°C, using junction-to-case thermal resistance, and is more useful in setting the upper dissipation
limit for cases where additional heatsinking is used.
C. Single pulse width limited by junction temperature TJ(MAX)=150°C.
D. The RqJA is the sum of the thermal impedance from junction to case RqJC and case to ambient.
E. The static characteristics in Figures 1 to 6 are obtained using <300ms pulses, duty cycle 0.5% max.
F. These curves are based on the junction-to-case thermal impedance which is measured with the device mounted to a large heatsink, assuming a
maximum junction temperature of TJ(MAX)=150°C. The SOA curve provides a single pulse rating.
G. The maximum current rating is package limited.
H. These tests are performed with the device mounted on 1 in2 FR-4 board with 2oz. Copper, in a still air environment with TA=25°C.
APPLICATIONS OR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS ARE NOT AUTHORIZED. AOS DOES NOT
ASSUME ANY LIABILITY ARISING OUT OF SUCH APPLICATIONS OR USES OF ITS PRODUCTS. AOS RESERVES THE RIGHT TO IMPROVE
PRODUCT DESIGN,FUNCTIONS AND RELIABILITY WITHOUT NOTICE.
80 80
10V 4.5V
VDS=5V
4V
60 60
3.5V
ID (A)
ID (A)
40 40
125°C
VGS=3V
20 20
25°C
0 0
0 1 2 3 4 5 0 1 2 3 4 5 6
10 1.8
6 1.4
4 1.2
VGS=10V VGS=4.5V
2 1
ID=20A
0 0.8
0 5 10 15 20 25 30 0 25 50 75 100 125 150 175
25 1.0E+01
ID=20A
1.0E+00
20
125°C
1.0E-01
RDS(ON) (mW)
15
IS (A)
125°C 1.0E-02
10 25°C
1.0E-03
5
1.0E-04
25°C
0 1.0E-05
2 4 6 8 10 0.0 0.2 0.4 0.6 0.8 1.0
VSD (Volts)
VGS (Volts)
Figure 6: Body-Diode Characteristics
Figure 5: On-Resistance vs. Gate-Source Voltage
(Note E)
(Note E)
10 1000
VDS=15V
Ciss
ID=20A
8 800
Capacitance (pF)
VGS (Volts)
6 600
4 400
Coss
2 200
Crss
0 0
0 3 6 9 12 0 5 10 15 20 25 30
1000.0 200
TJ(Max)=150°C
TC=25°C
100.0 160
RDS(ON)
limited 10ms
Power (W)
120
ID (Amps)
10.0
100ms
DC 1ms
1.0 80
10ms
TJ(Max)=150°C
0.1 TC=25°C 40
0
0.0
0.0001 0.001 0.01 0.1 1 10 100
0.01 0.1 1 10 100
VDS (Volts) Pulse Width (s)
Figure 10: Single Pulse Power Rating Junction-to-
VGS> or equal to 4.5V Case (Note F)
Figure 9: Maximum Forward Biased
Safe Operating Area (Note F)
10
D=Ton/T In descending order
ZqJC Normalized Transient
RqJC=6°C/W
1
Ton
T
0.01
1E-05 0.0001 0.001 0.01 0.1 1 10 100
25 60
50
20
Power Dissipation (W)
5
10
0 0
0 25 50 75 100 125 150 0 25 50 75 100 125 150
10000
TA=25°C
1000
Power (W)
100
10
1
1E-05 0.001 0.1 10 1000
10
ZqJA Normalized Transient
0.1
PDM
0.01 Single Pulse
Ton
T
0.001
0.0001 0.001 0.01 0.1 1 10 100 1000
Pulse Width (s)
Figure 15: Normalized Maximum Transient Thermal Impedance (Note H)
A. The value of RqJA is measured with the device mounted on 1in2 FR-4 board with 2oz. Copper, in a still air environment with TA =25°C. The Power
dissipation PDSM is based on R qJA t≤ 10s and the maximum allowed junction temperature of 150°C. The value in any given application depends on
the user's specific board design.
B. The power dissipation PD is based on TJ(MAX)=150°C, using junction-to-case thermal resistance, and is more useful in setting the upper dissipation
limit for cases where additional heatsinking is used.
C. Single pulse width limited by junction temperature TJ(MAX)=150°C.
D. The RqJA is the sum of the thermal impedance from junction to case RqJC and case to ambient.
E. The static characteristics in Figures 1 to 6 are obtained using <300ms pulses, duty cycle 0.5% max.
F. These curves are based on the junction-to-case thermal impedance which is measured with the device mounted to a large heatsink, assuming a
maximum junction temperature of TJ(MAX)=150°C. The SOA curve provides a single pulse rating.
G. The maximum current rating is package limited.
H. These tests are performed with the device mounted on 1 in2 FR-4 board with 2oz. Copper, in a still air environment with TA=25°C.
APPLICATIONS OR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS ARE NOT AUTHORIZED. AOS DOES NOT
ASSUME ANY LIABILITY ARISING OUT OF SUCH APPLICATIONS OR USES OF ITS PRODUCTS. AOS RESERVES THE RIGHT TO IMPROVE
PRODUCT DESIGN,FUNCTIONS AND RELIABILITY WITHOUT NOTICE.
80 80
3V
VDS=5V
60 60
4.5V
10V
ID (A)
ID (A)
40 40
125°C
20 20
25°C
VGS=2.5V
0 0
0 1 2 3 4 5 0 1 2 3 4 5
3 1.8
Normalized On-Resistance
1.6 VGS=10V
2.5 ID=20A
RDS(ON) (mW)
VGS=4.5V
1.4
2
1.2
1.5 VGS=4.5V
1
ID=20A
VGS=10V
1 0.8
0 5 10 15 20 25 30 0 25 50 75 100 125 150 175
6 1.0E+01
ID=20A
5 1.0E+00
125°C
4 1.0E-01
RDS(ON) (mW)
125°C
IS (A)
3 1.0E-02
25°C
2 1.0E-03
1 1.0E-04
25°C
0 1.0E-05
2 4 6 8 10 0.0 0.2 0.4 0.6 0.8 1.0
VGS (Volts) VSD (Volts)
Figure 5: On-Resistance vs. Gate-Source Voltage Figure 6: Body-Diode Characteristics
(Note E) (Note E)
10 3500
VDS=15V
ID=20A 3000
8 Ciss
2500
Capacitance (pF)
VGS (Volts)
6
2000
4 1500
1000 Coss
2
500 Crss
0 0
0 10 20 30 40 0 5 10 15 20 25 30
1000.0 500
TJ(Max)=150°C
TC=25°C
100.0 RDS(ON) 400
10ms
limited
Power (W)
100ms 300
ID (Amps)
10.0
DC 1ms
10ms 200
1.0
TJ(Max)=150°C
TC=25°C 100
0.1
0
0.0
0.0001 0.001 0.01 0.1 1 10 100
0.01 0.1 1 10 100
Pulse Width (s)
VDS (Volts)
Figure 10: Single Pulse Power Rating Junction-to-
VGS> or equal to 4.5V Case (Note F)
Figure 9: Maximum Forward Biased
Safe Operating Area (Note F)
10
D=Ton/T In descending order
ZqJC Normalized Transient
RqJC=2.8°C/W
1
0.1 PDM
Single Pulse
Ton
T
0.01
1E-05 0.0001 0.001 0.01 0.1 1 10 100
50 100
40 80
Power Dissipation (W)
20 40
10 20
0 0
0 25 50 75 100 125 150 0 25 50 75 100 125 150
10000
TA=25°C
1000
Power (W)
100
10
1
1E-05 0.001 0.1 10 1000
10
ZqJA Normalized Transient
0.1
PDM
0.01 Single Pulse
Ton
T
0.001
0.0001 0.001 0.01 0.1 1 10 100 1000
Pulse Width (s)
Figure 15: Normalized Maximum Transient Thermal Impedance (Note H)
Figure
GateA: Charge
Gate Charge Test Circuit
Test Circuit & Waveforms
& Waveform
Vgs
Qg
10V
+
VDC
+ Vds Qgs Qgd
- VDC
DUT -
Vgs
Ig
Charge
Figure B: ResistiveSwitching
Resistive Switching Test
Test Circuit
Circuit &&Waveforms
Waveforms
RL
Vds
Vds
90%
DUT
+ Vdd
Vgs VDC
Rg - 10%
ton toff
Figure C: Unclamped
Unclamped InductiveSwitching
Inductive Switching (UIS)
(UIS) Test
Test Circuit
Circuit&&Waveforms
Waveforms
L 2
Vds EAR= 1/2 LIAR BVDSS
Id Vds
Vgs + Vdd I AR
Vgs VDC
Rg - Id
DUT
Vgs Vgs
Figure
DiodeD:Recovery
Diode Recovery Test Circuit
Test Circuit & Waveforms
& Waveforms
Vds + Q rr = - Idt
DUT
Vgs
t rr
Vds - L Isd IF
Isd dI/dt
+ Vdd I RM
Vgs VDC
Vdd
Ig
- Vds