IGBT Open-Circuit Fault Diagnosis in A Quasi-Z-Source Inverter
IGBT Open-Circuit Fault Diagnosis in A Quasi-Z-Source Inverter
fully edited. Content may change prior to final publication. Citation information: DOI 10.1109/TIE.2018.2847709, IEEE
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Abstract—In this paper, a fast and practical method is degrading the power quality in the power system. Problems
proposed for open-circuit (OC) fault diagnosis (FD) in a such as abnormal stress on circuit elements can occur after
three-phase quasi-Z-source inverter (q-ZSI). Compared to OCF, causing further damage to the system [7]. As OC faults
the existing fast OC FD techniques in three-phase voltage- are prevalent in power device failures, OC FD is a basic step for
source inverters (VSIs), this method is more cost-effective increasing the reliability of a power system. In non-FT systems,
since no ultra-fast processor or high-speed measurement
is required. Additionally, the method is independent of the
using OC FD techniques prevents extra system damages. In FT
load condition. The proposed method is only applicable to systems, it also results in continuous operation after an OC
Z-source family inverters and is based on observing the fault. Speed, cost, reliability, and independence of the load
effect of shoot-through (SH) intervals on the system condition are the main factors for evaluating an OC FD method.
variables during switching periods. The proposed The approaches for OC FD are either current-based or voltage-
algorithm includes two consecutive stages: OC detection based [9]-[10] and each type has different strategies. Current-
and fault location identification. When both stages of the based methods have been considered widely in the literature
OC FD algorithm are done, a redundant leg is activated and [11]-[16]. In [10], a thorough review of these methods is
utilized instead of the failed leg. The accuracy of the presented. In most of these methods, the measured three-phase
proposed method is confirmed by the experimental results
from a low-voltage q-ZSI prototype.
currents are mathematically analyzed to recognize OCF.
Usually, no extra hardware is required in current-based
Index Terms— Quasi-Z-Source Inverter, Open-Circuit methods, making them cost-effective. Low speed, high
Fault, Fault Diagnosis Algorithm. complexity, limitation for multiple faults detection and
malfunction in small loads are the drawbacks of these
approaches [17]. In Table I, some common OC FD methods are
I. INTRODUCTION compared. Park’s vector approach presented in [18] (with
specification as shown in Table I), is a well-known FD method.
T ensure service continuity and increase the reliability of a
O
distributed generation (DG) power system, fault-tolerant
(FT) structures have been considered widely in recent literature
The main drawback is that the detection algorithm is too
complex to fit in a processor designed for power electronics
application. The normalized DC current method in [19] is based
[1]-[4]. A DG power system includes many parts such as the on Park’s vector approach which is not load-dependent (unlike
storage device, the processor unit, the sensors, the input source Park’s vector method). This method is not efficient when
and the power electronics converter. A failure could occur in closed-loop control is implemented. In the modified normalized
any of these parts. According to the study in [5], semiconductor DC current method, this problem is nearly solved [19]. The
and soldering faults cause approximately 34% of power device slope calculated from 𝑖𝑑 and 𝑖𝑞 samples (the current
failures. However, it is estimated that at least 80% of faults in components of Park’s vector), is used for FD in the slope
the converter part are due to semiconductor failures [6]. method [20], in which FD is load-dependent and rather slow. In
Power switch faults which are typically caused by high the AC current instantaneous frequency method, OCF is
thermal or electrical stress are categorized into two main detected from the calculation of the current space vector
groups: short-circuit (SC) and open-circuit (OC) faults [7]-[8]. frequency [20]. The location of the OCF is not recognized by
An OC fault (OCF) in a power converter could occur through a this FD procedure. In [21] another cost-effective and relatively
switch failure or a driver breakdown. Gate driver breakdown is fast current-based alternative is proposed which is also robust
the main cause of converter failure (53% of the converter faults) to load variation. In this method, the difference between the
and results in permanent IGBT OC [7]. reference and the output current is calculated. But this approach
Unlike an SC fault, which usually triggers the SC protection cannot be used in a system with an open-loop control. A similar
of the system, an OCF can remain undetected for a long time, technique, using the system mathematical model is proposed in
[22] for motor drive application. However, its implementation
Manuscript received Dec 13, 2017; revised Jan 25, 2018 and Apr 02,
is rather complex and demands high mathematical calculations.
2018; accepted May 29, 2018. In addition, extra measurement (phase voltage sensing) is
Mokhtar Yaghoubi and Javad S.Moghani are with the Department of needed for the FD procedure. Another model-based method is
Electrical Engineering of Amirkabir University of Technology, Tehran, presented in [23]. Although it is cost-effective as no extra
Iran (e-mail: [email protected], [email protected]).
Negar Noroozi and Mohammad Reza Zolghadri are with the
hardware is required, the accuracy of the FD is strongly
Department of Electrical engineering of Sharif University of Technology, dependent on the pre-assumed values for the system
Tehran, Iran (e-mail: [email protected], [email protected]). parameters. In practice, the method is inefficient.
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TABLE I
THE COMPARISON OF OC FD METHODS IN THREE-PHASE INVERTERS.
FD Time Load Implementation Extra
Method Required variables
(msec) Dependency complexity Cost
Park’s Vector Method [18] 20 High Medium 3-phase currents No
Normalized DC Current Method [19] 18.4 High Low 3-phase currents No
Modified Normalized DC Current Method [19] 18.4 Low Low 3-phase currents No
Slope Method [20] 38.3 High Low 3-phase currents No
AC Current Instantaneous Frequency Method [20] 20 Medium Low 3-phase currents No
The Reference Current Errors Method [21] 13 Low Low 3-phase currents No
Observer-Based Method [22] 19 Low Medium 3-phase currents/voltages Medium
Actual and Reference Quantity Comparison [24] 5 Low High phase, neutral and pole voltages High
Lower Switches Voltage Observation [8] 2.7 Low Medium lower switches voltage High
Instant Voltage Error [7] 2.5 Low Medium 3-phase currents /voltages Low
Real-Time FPGA-Based [25] 0.01 Low High pole voltages/device delays High
Switching Function Model-Based [26] 0.01-10 Low Medium lower switches voltage Medium
In Table I, the specification of some voltage-based FD portion of semiconductor failures is due to switch OC faults [7].
methods are also depicted. In “actual and reference quantity To cover OC faults at both AC and DC sides of a double-stage
comparison” the fault is recognized by comparing the reference PV converter, two separate FT strategies (for AC and DC
and the measured phase voltage values [24]. The method is stages) are required. FT topologies for DC/DC stage in PV
much faster than current-based methods, but it has a costly systems are presented in [34]-[35]. Due to a single-stage
implementation. Sensing the lower switch voltage is another structure and fewer semiconductor elements in q-ZSI,
fast voltage-based FD strategy [8]. It uses op-amp/flip-flop implementing FT strategies in q-ZSI has lower cost and higher
auxiliary circuits for FD, increasing the complexity of the reliability.
system. In [7], an OC FD is proposed based on three-phase FD is the main step in FT systems. In this paper, a novel
current, phase voltage, and DC link voltage measurements. The voltage-based OC FD technique is proposed for three-phase q-
method is fast but the many variables involved in FD could ZSI. The proposed method is much faster than most of the
make the method sensitive to noise. An ultra-fast FPGA-based approaches shown in Table I. This method is able to recognize
approach is proposed in [25]. It is not possible to implement this OC faults in just a few switching cycles. Despite the fast FD
technique in a usual DSP/microcontroller processor used in method in [25], no high-speed processor or ultra-fast
power electronics applications. The need for high-bandwidth measurement is required. In comparison to the existing
voltage measurement is another drawback of this method, techniques, the proposed method has a simpler implementation.
leading to a cost increase. In addition, the assumption on delays In addition, the CPU of the processor is not involved in the FD
in the response time of the circuit elements is required. This procedure during normal work conditions. To implement the
may affect the accuracy of the FD in practice. In [26] another proposed method, only a low-cost auxiliary circuit (including a
voltage-based method is proposed. It is based on the comparator and a resistive divider) is added to the system.
comparison of the lower switch voltage and the added Therefore, the cost of the system does not change significantly
photocoupler output. This approach is low-cost and fast, but it (unlike most voltage-based approaches [8], [24]-[26]). In
is dependent on the characteristics of the devices which can addition, this method is independent of the load condition since
change by thermal conditions or by aging.
In summary, in comparison to current-based FD methods,
_ VC2
voltage-based methods are much faster and have higher +
immunity to false alarms. However, voltage-based methods C2
iL1 L1 D L2 iL2
usually require additional measurement and extra hardware
leading to higher cost and complexity [24]-[26]. + +
+ SaH SbH ScH
The three-phase q-ZSI shown in Fig. 1, is a beneficial Vin VC1 vleg
structure for DG especially in photovoltaic (PV) applications C1
_ _ _ SaL SbL ScL
[27]-[29]. In addition to the single-stage buck-boost
characteristic, q-ZSI can absorb constant power from the input a b c
source. Compared to the traditional Z-source inverter (ZSI) the Lf Lf Lf
voltage on capacitor 𝐶2 (Fig. 1) is much less than that on 𝐶1 ia ib ic
[30], leading to reduced passive component rating and lower load
manufacturing cost. In [31], modeling and controller design of Z Z Z
q-ZSI is discussed. In [31]-[33], q-ZSI with battery storage for
hybrid PV application is presented.
To have a reliable PV power system, applying FT strategies
to q-ZSI has some advantages compared to the traditional
double-stage PV converters. As mentioned, a significant Fig. 1. Three-phase q-ZSI main topology.
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15
10
ia, ib, ic (A)
5
0
-5
-10 ia
-15
0.1 0.15
t (sec)
(a)
15
10
ia, ib, ic (A)
5
0
ia Fig. 7. The leg voltage (normalized by 𝑉𝐵 ) during open-gate fault in
-5
𝑆𝑎𝐻 .
-10
-15
0.1 0.15
in Fig. 6(a)-(b) in the case of OC in a switch and a leg
t(sec) respectively. In both cases, the peak value of the leg terminals
(b) is dropped. 𝑣𝑙𝑒𝑔 during OCF in a switch is shown in Fig. 7. As
Fig. 5. The output currents during OCF in three-phase q-ZSI. (a) shown in Fig. 3 and Fig. 7, in normal work condition, six SH
open-gate fault in 𝑆𝑎𝐻 ; (b) OC in both switches of leg “a” (𝑆𝑎𝐻 and 𝑆𝑎𝐿 ). intervals are visible on 𝑣𝑙𝑒𝑔 during each switching period.
During OCF (in both leg and switch cases), the number of SH
It is also possible that the total leg becomes OC. This fault intervals recognizable from 𝑣𝑙𝑒𝑔 is decreased to four.
may happen by the intervention of the protection system [6]. In
Fig. 5(b), the output currents are shown for the case that both IV. OPEN-CIRCUIT FAULT DIAGNOSIS IN QUASI-Z-SOURCE
switches of leg “a” are OC. INVERTER
After an OCF in a switch, low-frequency harmonics appear
As it is mentioned, all SH states appear as zero-value
in the harmonic content of the qZSI state variables (𝑣𝐶1 , 𝑣C2 ,
intervals on 𝑣𝑙𝑒𝑔 . In this paper, “NFE” is defined as the number
𝑖𝐿1 , and 𝑖𝐿2 ) as well as the output power. The leg voltage peak
value is dropped as the SH state is not implemented by the of falling edges (FE) in 𝑣𝑙𝑒𝑔 waveform during half of the
faulty leg (the boost factor is decreased in practice). For the switching period. It can be said that when all SH states are
simulated q-ZSI, the normalized value of “𝑣𝐶1 + 𝑣𝐶2 ” is shown implemented properly, NFE is three. During OCF, NFE is
reduced to two since the SH state is not implemented by one
1.2
leg.
Assuming normal work condition in an ideal q-ZSI, 𝑡𝐹𝐸𝑖 (𝑖 =
(vC1+ vC2 ) / VB
1.1 OCF
1,2,3) is defined as the falling edge (FE) time at the beginning
1 of its SH state in a switching cycle (shown in Fig. 8). 𝑡𝐹𝐸𝑖 values
are calculated as:
0.9 𝑡𝐹𝐸1 = 0.25(𝑇𝑆𝑤 − 𝑇𝑎 − 𝑇𝑏 − 𝑇𝑠ℎ )
{ 𝑡𝐹𝐸2 = 𝑡𝐹𝐸1 + 𝑇𝑠ℎ /6 + 0.5𝑇𝑎 (4)
0.8 𝑡𝐹𝐸3 = 0.5𝑇𝑠𝑤 − 𝑡𝐹𝐸1 − 𝑇𝑠ℎ /6
0.08 0.1 0.12 0.14 0.16 0.18 0.2
t (sec) 𝜋
𝑇𝑎 /𝑇𝑠𝑤 = 𝑀𝑐 sin (𝑛 − 𝜃)
(a) 3
𝜋
𝑇𝑏 /𝑇𝑠𝑤 = 𝑀𝑐 sin(𝜃 − (𝑛 − 1) ) (5)
1.2 3
1.1
In (5), 𝑉𝑟𝑒𝑓 and 𝜃 are the reference vector amplitude and angle
1 in 𝛼𝛽 plane; “𝑛” is the sector number.
Each FE in Fig. 8 (FE1, FE2, and FE3) is implemented
0.9 through a separate leg. Table II shows the short-circuit leg for
each FE moment along SVM sectors. For example, the second
0.8
0.08 0.1 0.12 0.14 0.16 0.18 0.2
FE (FE2) during the third sector (𝐴3 ) is implemented through
t (sec) leg “c”.
(b) In practice, FE moments in 𝑣𝑙𝑒𝑔 occur with a little delay
Fig. 6. The leg voltage peak value (normalized by 𝑉𝐵 ) (a) open-gate
comparing to 𝑡𝐹𝐸𝑖 values in (4), mainly because of the IGBTs
fault in 𝑆𝑎𝐻 ; (b) OC in both switches of leg “a” (𝑆𝑎𝐻 and 𝑆𝑎𝐿 ).
turning-off delay.
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TABLE II
Considering (6), the peak value of 𝑣𝑙𝑒𝑔 (≈ 𝑉𝐵 ) is scaled down
THE SHORT-CIRCUIT LEGS IN DIFFERENT SECTORS DURING HALF PERIOD. to 3𝑉 at the comparator input. 𝑉𝑐 is set at 1.5𝑉, covering nearly
half of the IGBT delay during digitalizing 𝑣𝑙𝑒𝑔 . The digital
𝑨𝟏 𝑨𝟐 𝑨𝟑 𝑨𝟒 𝑨𝟓 𝑨𝟔
output from the comparator (𝑣𝑐𝑎𝑝 ) is transferred to the capture
FE1 a c b a c b
unit. The detected FE moments, 𝑡𝑐𝑎𝑝𝑗 (𝑗 = 1,2,3 in normal
FE2 b a c b a c
condition and 𝑗 = 1,2 during OCF) are saved to the capture
FE3 c b a c b a registers (CAPj) as shown in Fig. 10. As mentioned, in practice,
the detected FE moments (𝑡𝑐𝑎𝑝𝑗 ) are not exactly equal to the
calculated times (𝑡𝐹𝐸𝑖 ) because of system delays. A delay
A. Falling edges Detection
margin (𝑡𝑑 ) is considered for each 𝑡𝑐𝑎𝑝𝑗 value to be considered
Most of the microcontrollers and DSPs designed for power as a correct FE detection. 𝑡𝑑 is selected due to the IGBTs typical
electronics applications have a “capture” unit used for motor
turning-off time (𝑡𝑜𝑓𝑓 ). In this paper, 𝑡𝑑 is considered 2𝜇𝑠𝑒𝑐
speed or duty cycle measurement. For example,
TMS320x28xxx family from Texas Instrument processors and which is 2.5 times larger than 𝑡𝑜𝑓𝑓 in the used IGBTs. If the
even lower speed processors like dsPIC30F4011 from difference between 𝑡𝑐𝑎𝑝𝑗 and 𝑡𝐹𝐸𝑖 is less than 2𝜇𝑠𝑒𝑐, 𝐹𝐸𝑖
Microchip contain this unit. The capture unit includes a high- detection is confirmed. In Fig. 10, the filled rectangles shows
bandwidth rising/falling-edge detector. When the edge detector the permitted delay margin.
is triggered, the DSP timer value can be saved to a capture
register. Multiple edges timing could also be retrieved from B. Open-Circuit Fault Diagnosis Algorithm
capture registers. TMS320F2808 used in this paper includes The OC FD algorithm proposed in this paper is based on
examining 𝑣𝑙𝑒𝑔 and its zero-value intervals; the missed zero–
DSP board
resistive divider value interval in 𝑣𝑙𝑒𝑔 identifies the OC leg. Comparing to OC
+
krd .vleg vcap 5v
Start
vleg CAP1
+ 0v CAP2
Vc _ CAP3
_ capture unit first stage NFE is saved
(OCF detection)
Comparator
NFE is less than 3
for three sequential no
Fig. 9. The capture unit interface, including the resistive divider and cycles ?
the comparator. yes
Set PF. NFE, tFEi and tCAPj are
vleg saved for the next 5 cycles.
td td td
End
Fig. 10. The timer values sent to capture registers (through to
detection of falling edges in 𝑣𝑙𝑒𝑔 ). Fig. 11. The proposed OC FD algorithm.
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C2 (which could have one or two failed switches), but it is not able
to determine the exact location of the failed switch. Meaning
L1 D L2 that by this algorithm it is not possible to recognize that the
upper, lower or both switches of the leg are failed. Since
replacing the total leg (instead of the failed switch) is introduced
a filter as an optimized FT strategy for three-phase inverters [35], this
Vin C1 b & strategy is used in this paper. Therefore, the determination of
c load the failed switch location is not necessary when the total leg is
redundant leg replaced with another one.
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(a) (a)
(b) (b)
(c) (c)
Fig. 15. The output currents of implemented q-ZSI; (a) during normal Fig. 16. 𝑣𝑐𝑎𝑝 comparing to 𝑣𝑙𝑒𝑔 in the implemented q-ZSI; (a) during
condition; (b) during OC in 𝑆𝑎𝐻 ; (c) during OC in 𝑆𝑎𝐻 and 𝑆𝑎𝐿 . normal condition; (b) during OC in 𝑆𝑎𝐻 ; (c) during OC in 𝑆𝑎𝐻 and 𝑆𝑎𝐿 .
zero.
during OCF is due to the reduction of the real SH duration. The
In Fig. 15(a)-(c), the output currents of the q-ZSI in normal
line-frequency harmonics are also seen after the OCF in Fig.
conditions and during OCF in a switch/leg are shown. In Fig.
17(a)-(b).
15 (a), the RMS value of the output current is equal to 3.5A per
In Fig. 18(a)-(b), DF and PF signals before and after OC fault
phase. In Fig 15(b), the leg “a” only conducts the current with
are depicted. The OC instant is highlighted with a dashed line
negative polarity due to the OCF in 𝑆𝑎𝐻 . The output currents
in Fig. 18(a)-(b). After three cycles from the OC instant, PF is
during OC in both switches of a leg are shown in Fig. 15(c). 𝑆𝑎𝐻
set. A few cycles later, DF is also set. Indeed, setting DF is the
and 𝑆𝑎𝐿 become OC simultaneously. After the fault, the current
declaration of definite OC fault by the algorithm. At this point
of phase “a” is zero.
the algorithm enters the second stage. As an example, the data
𝑣𝑙𝑒𝑔 and 𝑣𝑐𝑎𝑝 (the input of the capture unit) are measured and
shown in Fig. 16(a)-(c) for normal conditions and during OCF TABLE IV
in a switch/leg. Comparing Fig. 16(a) to Fig. 16(b)-(c) shows THE MISSED FE DETECTION FROM THE CALCULATED ERROR
that the number of SH states are reduced during OCF. The CAP1 CAP2 [𝑡𝑒𝑖𝑗 ](usec) Sector
disturbance originated from the OCF is visible on 𝑣𝑙𝑒𝑔 in Fig. Cycle 1 2076 2781 [16.50, 0.85, 6.78, 0.97] 1
16(b)-(c). The peak value of 𝑣𝑐𝑎𝑝 is constant and equals 5𝑉. In Cycle 2 2046 2786 [16.29, 0.85, 7.06, 0.96] 1
Cycle 3 2016 2793 [16.08, 0.84, 7.38, 0.98] 1
Fig. 17(a)-(b), 𝑣𝑙𝑒𝑔 peak value (𝑣𝑐1 + 𝑣𝑐2 ) is depicted during Cycle 4 1989 2780 [15.90, 0.87, 7.52, 0.84] 1
OCF in a switch/leg. The voltage drop across the capacitors Cycle 5 1957 2795 [15.66, 0.85, 7.89, 0.92] 1
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used at the second stage of FD algorithm in the OCF case in Fig. 18(a) are shown in Table IV. 𝑡𝑐𝑎𝑝𝑗 values are calculated
(a) (b)
Fig. 17. The input capacitors voltage (𝑣𝐶1 + 𝑣𝐶2 ); (a) OCF in 𝑆𝑎𝐻 (b) OCF in both 𝑆𝑎𝐻 and 𝑆𝑎𝐿 .
(a) (b)
Fig. 18. PF and DF signals after the OCF (a) OCF in 𝑆𝑎𝐻 (b) OCF in both 𝑆𝑎𝐻 and 𝑆𝑎𝐿 .
(a) (b)
(c) (d)
Fig. 19. The output currents in FT q-ZSI; (a) OCF in 𝑆𝑎𝐻 and replacing the leg “a” in the nominal load; (b) OCF in 𝑆𝑎𝐻 and 𝑆𝑎𝐿 and replacing the
leg “a” in the nominal load; (c) OCF in 𝑆𝑎𝐻 and replacing the leg “a” in 30% of the nominal load; (d) OCF in 𝑆𝑎𝐻 and 𝑆𝑎𝐿 and replacing the leg
“a” in 30% of the nominal load.
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from 𝐶𝐴𝑃𝑗 registers as: [5] D. Xiang, L. Ran, P. Tavner, S. Yang, A. Bryant and P. Mawby,
𝐶𝐴𝑃𝑗 "Condition Monitoring Power Module Solder Fatigue Using Inverter
𝑡𝑐𝑎𝑝𝑗 = 𝑇 (8) Harmonic Identification," in IEEE Transactions on Power Electronics,
2×𝑃𝑅𝐷 𝑠𝑤
vol. 27, no. 1, pp. 235-247, Jan. 2012.
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Transactions on Industrial Electronics
IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS
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0278-0046 (c) 2018 IEEE. Personal use is permitted, but republication/redistribution requires IEEE permission. See http://www.ieee.org/publications_standards/publications/rights/index.html for more information.