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09X Rays

The document discusses the generation of x-rays using an x-ray tube with a copper target, and how x-rays are used for diffraction experiments. It explains that x-rays are generated when high energy electrons eject inner shell electrons from the copper atoms, and higher shell electrons fall to fill these holes, emitting x-rays. X-ray diffraction occurs when x-rays scatter off the periodic structure of crystal lattices, and the angles and intensities of diffracted x-rays are used to determine crystal structures. The document also provides examples of how x-ray diffraction and fluorescence techniques are used for applications like mineral identification and chemical analysis.

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rkred
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48 views

09X Rays

The document discusses the generation of x-rays using an x-ray tube with a copper target, and how x-rays are used for diffraction experiments. It explains that x-rays are generated when high energy electrons eject inner shell electrons from the copper atoms, and higher shell electrons fall to fill these holes, emitting x-rays. X-ray diffraction occurs when x-rays scatter off the periodic structure of crystal lattices, and the angles and intensities of diffracted x-rays are used to determine crystal structures. The document also provides examples of how x-ray diffraction and fluorescence techniques are used for applications like mineral identification and chemical analysis.

Uploaded by

rkred
Copyright
© Attribution Non-Commercial (BY-NC)
Available Formats
Download as PDF, TXT or read online on Scribd
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X-ray Generation

X-ray Diffraction

X-ray tube (sealed) Pure metal target (Cu) Electrons remover inner-shell electrons from target. Other electrons fall into hole.

X-ray Generation
The incoming electron must have enough energy to remove inner 1s electrons from the copper atoms. This energy corresponds to the Cu absorption edge The 2s and 2p electrons fall back into the 1s shell and emit the K1 K2 lines.

X-ray Spectrum from Tube

Energy Calculations
Plancks constant (h) = 6.6 * 10-34 joule-sec 1 electron-volt = 1.6016 * 10-19 joule Speed of light (c) = 3.0 * 108 m/s Photon frequency = c/ Photon Energy E = h = hc/

Energy Calculations
What is the minimum potential in KV that is required to excite Cu K-series radiation from a Cu-target X-ray tube? Absorption edge of Cu = 1.380
E = hc/ = (6.60 10-34)(3*108)/(1.380*10-10)

E = 1.435*10-15 joule E = 1.435*10-15 /1.6016*10-19 = 8958 ev The potential on the tube must exceed 8.958 KV

Diffraction
Diffraction is the coherent scattering of waves from a periodic array of scatterers. The wavelength of light is about half a micron Light is diffracted by the tracks in a CD. The wavelengths of X-rays is about the same as the interatomic distances in crystals.

X-Ray Diffraction

Atoms separated by distance d will scatter in phase when the path length difference is an integral number of wavelengths. Path length difference B-C-D = n n = 2d sin

X-ray Diffraction Experiment


We use the monochromatic K1-2 lines for our diffraction experiment. The wavelength is 1.5405 We use a diffracted beam monochromator to clean up the X-rays entering the detector. We use a powdered sample so that all orientations are present in the sample. We move the detector through angle 2.

Miller Indices
The real use of Miller indices is to describe diffraction planes. For a lattice plane with Miller indices h k l in an orthorhombic lattice a b c, d=1/ [(h/a)2+(k/b)2+(l/c)2]1/2 For cubic: d = a/[h2+k2+l2]1/2

Diffraction Calculations
For forsterite a = 4.75; b = 10.20; c = 5.98 Calculate 2 for the (201) lattice spacing for Cuk ( = 1.5405) d = 1 / [(h/a)2+(k/b)2+(l/c)2]1/2 d = 1/ [(2/4.75)2+(1/5.98)2]1/2 d = 1/0.4530 = 2.207 2 = 2 sin-1 /2d = 2* sin-1 (1.5405/4.414) 2 = 2 * 20.43 = 40.86

XPOW
XPOW uses the unit cell and atom position data to calculate the diffraction pattern. Intensities can be calculated knowing the position and scattering characteristics of each atom. Fhkl = square root of integrated intensity. fj = scattering of atom j at angle 2 Atom j located at fractional coordinates xj, yj, zj.

Fhkl = f j e
j =1

2i ( hx j + ky j + lz j )

Uses of X-ray Powder Diffraction


Mineral identification Determination of Unit Cell Parameters Modal (phase percentage) Analysis Crystal Structure Determination

X-ray Fluorescence

X-ray Fluorescence
Chemical analysis Major and minor element Uses Ag k to excite secondary X-rays from sample. Powdered or flux-fused glass sample.

Electron Microprobe

Electron Microprobe
Chemical analysis Major and minor element Uses electrons to excite secondary Xrays from sample. Electrons can be focussed onto a 10m spot Sample is polished thin section

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