Smic Confidential: Semiconductor Manufacturing International Corporation

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The document provides an overview and characterization of semiconductor devices fabricated on SMIC's 0.18um process.

The document is a manual describing SMIC's 0.18um V3E BCD 1.8V/5V/6V/9V/12V/16V/20V/24V/30V/35V/40V platform device introduction and characterization.

The document covers topics such as an introduction, device characterization summary, and details on various device models and their parameters.

Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev.
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/20V/24V/30V/35V 0 Rev:
/40V Platform Device Introduction and Character V1.20_REV
Design Manual
0

Document Level: (For Engineering & Quality Document/工程暨品质文件专用)


 Level 1 - Manual  Level 2 - Procedure/SPEC/Report  Level 3 - Operation Instruction
Security Level: Security A - Top Secret  Security B - SMIC Confidential
 Security C - SMIC Restricted  Security D - SMIC Internal

Document Change History

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Doc. Tech Dev. Effective Author Change Description
Rev. Rev. Date

TI
0 V1.20_REV 2022-03-09 Mary Shi Initiate
0

EN
ID
NF
CO
IC
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

SEMICONDUCTOR MANUFACTURING INTERNATIONAL CORPORATION

0.18um V3E BCD 1.8V/5V/6V/9V/12V/16V/20V/24V/30V/35V /40V Platform Device Introduction

AL
and Character Design Manual

TI
EN
Version V1.20_REV0
ID
NF

SMIC Confidential – Do Not Copy


CO
IC
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 2 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

CONTENTS
1. TITLE: .............................................................................................................................................8
2. PURPOSE: ........................................................................................................................................8
3. SCOPE: ............................................................................................................................................8
4. NOMENCLATURE: ............................................................................................................................8

AL
5. REFERENCE:....................................................................................................................................8
6. RESPONSIBILITY: .............................................................................................................................8
7. SUBJECT CONTENT: ........................................................................................................................9

TI
7.1. INTRODUCTION ...............................................................................................................................9

7.1.1. Document Overview...............................................................................................................9


EN
7.1.2. Process Overview ..................................................................................................................9
ID

7.1.3. Supported Potentials ..............................................................................................................9


NF

7.1.4. 0.18um Tech. Seal Ring and Scribe Lane ............................................................................10


CO

7.2. DEVICE CHARACTERIZATION SUMMARY ....................................................................................... 11

7.2.1. LV/MV devices characterization summary .......................................................................... 11


IC

7.2.1.1. 1.8V NMOS (n18_ckt) ................................................................................................ 11


7.2.1.2. 1.8V PMOS (p18_ckt) .................................................................................................16
SM

7.2.1.3. 1.8V native NMOS (nnt18_ckt) ..................................................................................20


7.2.1.4. 5V NMOS (n50_ckt) ...................................................................................................23
7.2.1.5. 5V PMOS (p50_ckt) ....................................................................................................27
7.2.1.6. 5V native NMOS (nnt50_ckt) .....................................................................................32
7.2.1.7. 1.8V and 5V in HVBN pocket .....................................................................................35

7.2.2. LDMOS/DEMOS devices characterization summary .........................................................41

7.2.2.1. 5V NLDMOS (D4) (nld5g5_sa_iso_hvbn_ckt) ..........................................................42


7.2.2.2. 6V NLDMOS (nld6g5_sa_iso_hvbn_ckt) ...................................................................46

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
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Introduction and Character
Design Manual

7.2.2.3. 9V NLDMOS (nld9g5_gs_iso_hvbn_ckt) ...................................................................50


7.2.2.4. 9V NDEMOS (nde9g5_gs_iso_hvbn_ckt) ..................................................................55
7.2.2.5. 12V NLDMOS (nld12g5_gs_iso_hvbn_ckt) ...............................................................59

AL
7.2.2.6. 12V NDEMOS (nde12g5_gs_iso_hvbn_ckt) ..............................................................63
7.2.2.7. 16V NLDMOS (nld16g5_gs_iso_hvbn_ckt) ...............................................................68

TI
7.2.2.8. 20V NLDMOS (nld20g5_gs_iso_hvbn_ckt) ...............................................................72
7.2.2.9. 20V NDEMOS (nde20g5_gs_iso_hvbn_ckt) ..............................................................77
7.2.2.10.
7.2.2.11.
EN
24V NLDMOS (nld24g5_gs_iso_hvbn_ckt) ...............................................................80
30V NLDMOS (nld30g5_gs_iso_hvbn_ckt) ...............................................................85
ID
7.2.2.12. 30V NDEMOS (nde30g5_gs_iso_hvbn_ckt) ..............................................................89
7.2.2.13. 35V NLDMOS (nld35g5_rox_gs_ckt) ........................................................................92
NF

7.2.2.14. 40V NLDMOS (nld40g5_rox_gs_ckt) ........................................................................97


7.2.2.15. 5V PDEMOS (pde5g5_sa_hvbn_ckt) ........................................................................102
CO

7.2.2.16. 6V PDEMOS (pde6g5_sab_hvbn_ckt) ......................................................................106


7.2.2.17. 9V PDEMOS (pde9g5_gs_hvbn_ckt) ....................................................................... 110
7.2.2.18. 12V PDEMOS (pde12g5_gs_hvbn_ckt) ................................................................... 115
IC

7.2.2.19. 16V PDEMOS (pde16g5_gs_hvbn_ckt) ...................................................................120


SM

7.2.2.20. 20V PDEMOS (pde20g5_gs_hvbn_ckt) ...................................................................124


7.2.2.21. 24V PDEMOS (pde24g5_gs_hvbn_ckt) ...................................................................129
7.2.2.22. 30V PDEMOS (pde30g5_gs_hvbn_ckt) ...................................................................134
7.2.2.23. 35V PDEMOS (pde35g5_sti_hvbn_ckt) ...................................................................138
7.2.2.24. 40V PDEMOS (pde40g5_sti_hvbn_ckt) ...................................................................140

7.2.3. Bipolar Transistor characterization data summary...........................................................143

7.2.3.1. 1.8V vertical PNP (pnp18a100_ckt) ..........................................................................143


7.2.3.2. 1.8V vertical PNP (pnp18a25_ckt) ............................................................................146
7.2.3.3. 1.8V vertical PNP (pnp18a4_ckt) ..............................................................................148

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

7.2.3.4. 5V vertical PNP (pnp50a100_poly_ckt) ....................................................................150


7.2.3.5. 5V vertical PNP (pnp50a25_poly_ckt) ......................................................................153
7.2.3.6. 5V vertical NPN (npn50a100_sab_ckt ) ....................................................................154

AL
7.2.3.7. 5V vertical NPN (npn50a25_sab_ckt ) ......................................................................157
7.2.3.8. HV lateral PNP (pnphva100_poly_ckt ) ....................................................................160

TI
7.2.3.9. HV lateral PNP (pnphva25_poly_ckt ) ......................................................................161
7.2.3.10. HV vertical NPN (npnhva100_poly_ckt ) .................................................................163
7.2.3.11.
7.2.3.12.
EN
HV vertical NPN (npnhva25_poly_ckt ) ...................................................................166
HVBN ISO lateral PNP (pnphvbniso100_poly_ckt ) ................................................169
ID
7.2.3.13. HVBN ISO lateral PNP (pnphvbniso25_poly_ckt ) ..................................................171
7.2.3.14. High Beta vertical NPN (npnhbeta100_poly_ckt) .....................................................173
NF

7.2.3.15. High Beta NPN (npnhbeta100_sab100_ckt) .............................................................175


7.2.3.16. High Beta NPN (npnhbeta100_sab25_ckt) ...............................................................177
CO

7.2.3.17. High Beta NPN (npnhbeta100_sab4_ckt) .................................................................180

7.2.4. Diode characterization data summary ..............................................................................182


IC

7.2.4.1. 1.8V N+/Pwell diode (ndio18) ..................................................................................182


7.2.4.2. 1.8V P+/N-well diode (pdio18) .................................................................................185
SM

7.2.4.3. 1.8V P+/N-well diode (pdio18) .................................................................................186


7.2.4.4. 1.8V P+/N-well diode (pdio18) .................................................................................187
7.2.4.5. 1.8V N-well/Psub diode (nwdio18) ...........................................................................190
7.2.4.6. 5V N+/Pwell diode (ndio50) .....................................................................................192
7.2.4.7. 5V P+/Nwell Diode (pdio50).....................................................................................195
7.2.4.8. 5V Nwell/Psub Diode (nwdio50) ..............................................................................198
7.2.4.9. 5V Pwell/HVBN Diode (pwhvbndio50)....................................................................199
7.2.4.10. HV Pwell/HVBN Diode (pwhvbndiohv) ...................................................................200
7.2.4.11. 5V HVBN/Psub Diode (hvbnpsubdio50) ..................................................................201

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

7.2.4.12. HVBN/Psub Diode (hvbnpsubdio) ............................................................................202


7.2.4.13. Zener Diode (5.5V) ....................................................................................................203
7.2.4.14. Schottky Diode (30V) ................................................................................................205

AL
7.2.5. ESD PNP characterization data summary ........................................................................207

7.2.5.1. 9V ESD Protection.....................................................................................................208

TI
7.2.5.2. 12V ESD Protection...................................................................................................210
7.2.5.3.
7.2.5.4.
EN
16V ESD Protection...................................................................................................212
20V ESD Protection...................................................................................................214
ID
7.2.5.5. 24V ESD Protection...................................................................................................216
7.2.5.6. 30V ESD Protection...................................................................................................218
NF

7.2.5.7. 35V ESD Protection...................................................................................................220


7.2.5.8. 40V ESD Protection...................................................................................................221
CO

7.2.6. ESD MOS characterization data summary........................................................................224

7.2.6.1. 1.8V N GGMOS (n1d8_esd_ckt) ..............................................................................224


IC

7.2.6.2. 1.8V P GDMOS (p1d8_esd_ckt) ...............................................................................226


7.2.6.3. 1.8V ESD N+/Pwell Diode (ndio1d8_esd) ................................................................227
SM

7.2.6.4. 1.8V ESD P+/Nwell Diode (pdio1d8_esd) ................................................................228


7.2.6.5. 5V N GGMOS (n5_esd_ckt) .....................................................................................228
7.2.6.6. 5V N GRMOS ...........................................................................................................230
7.2.6.7. 5V P GDMOS (p5_esd_ckt) ......................................................................................230
7.2.6.8. 5V ESD N+/Pwell Diode (ndio5_esd) .......................................................................231
7.2.6.9. 5V ESD P+/Nwell Diode (pdio5_esd) .......................................................................232
7.2.6.10. 6V P GDMOS (p6_esd_ckt) ......................................................................................232

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

7.2.7. Capacitor characterization data summary ........................................................................233

7.2.7.1. MIM location options ................................................................................................233


7.2.7.2. 1.0fF MIM .................................................................................................................237

AL
7.2.7.3. 2fF MIM ....................................................................................................................238
7.2.7.4. MOM .........................................................................................................................239

TI
7.2.7.5. Top metal MOM ........................................................................................................241
7.2.7.6. 1.8V NMOS Varactor ................................................................................................241
7.2.7.7. EN
5V NMOS Varactor ...................................................................................................243
7.2.7.8. 5V NMOS Varactor in HVBN ...................................................................................245
ID
7.2.8. Resistor characterization data summary ...........................................................................246
NF

7.2.8.1. 1K ohm/sq P- Poly HRI w/o silicide .........................................................................247


7.2.8.2. 3K ohm/sq P- Poly HRI w/o silicide .........................................................................249
CO

7.2.8.3. P+ Poly w/o silicide ...................................................................................................251


7.2.8.4. P+ Poly w/i silicide ....................................................................................................253
7.2.8.5. N+ Poly w/o silicide ..................................................................................................255
IC

7.2.8.6. N+ Poly w/i silicid .....................................................................................................257


SM

7.2.8.7. P+ DIFF w/o silicide ..................................................................................................259


7.2.8.8. P+ DIFF w/i silicide...................................................................................................262
7.2.8.9. N+ DIFF w/o silicide .................................................................................................263
7.2.8.10. N+ DIFF w/i silicide ..................................................................................................265
7.2.8.11. NW diff(under AA) ....................................................................................................266
7.2.8.12. NW diff(under STI) ...................................................................................................267
7.2.8.13. 5V NW diff(under AA) ..............................................................................................269
7.2.8.14. 5V NW diff(under STI) .............................................................................................270
7.2.8.15. M1 Resistor (rm1)......................................................................................................272

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

7.2.8.16. M2 Resistor (rm2)......................................................................................................272


7.2.8.17. M3 Resistor (rm3)......................................................................................................273
7.2.8.18. M4 Resistor (rm4)......................................................................................................274

AL
7.2.8.19. M5 Resistor (rm5)......................................................................................................275
7.2.8.20. TM_8K (rtm_8k) .......................................................................................................276

TI
7.2.8.21. TM_9K (rtm_9k) .......................................................................................................277
7.2.8.22. TM_33K (rtm_33k) ...................................................................................................280
7.2.8.23. EN
TM_40K (rtm_33k) ...................................................................................................280

7.2.9. MVN to MVP BV ................................................................................................................281


ID
8. ATTACHMENT: NA ......................................................................................................................281
NF
CO
IC
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 8 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

1. Title:
0.18um V3E BCD 1.8V/5V/6V/9V/12V/16V/20V/24V/30V/35V /40V Platform Device
Introduction and Character Design Manual

AL
2. Purpose:
This design manual defines the 0.18um V3E BCD technology and provides 0.18um V3E BCD all

TI
devices typical characterization data

3. Scope:
All SMIC TD/Fabs
EN
4. Nomenclature:
ID
LDMOS: Channel length fix |Vgs| ≤5V.
DEMOS: Channel length changeable, |Vgs| ≤5V.
NF

5. Reference:
CO

Reference documents Reference Tech


Item Reference documents title
No version
0.18um V3E BCD
0.18um V3E BCD 1.8V/2.5V/5V/6V/9V/12V/16V/20
TD-BC18-SP-2006 V1.20_REV2
IC

spice model V/24V/30V/35V/40V SPICE


Model
0.18um V3E BCD
SM

0.18um V3E BCD TD-BC18-DR-201


1.8V/5V/6V/9V/12V/16V/20V/24V V1.20_REV0
design rule 0
/30V/35V/40V Design Rule

6. Responsibility:
TD is responsible for this design manual maintenance before the technology is transferred to FAB; Fab/PIE
is responsible for this design manual maintenance after the technology is transferred to FAB.

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

7. Subject Content:
7.1. Introduction

7.1.1. Document Overview

AL
Following is a brief overview of the contents:

Section 7.2, Device Characterization summary -Describes the devices available in the process,

TI
layout, cross section, device symbol, spice data vs PCM spec, operating potentials,
characterization curve.
EN
Section 7.3, Isolation-Identify the rules for isolation

7.1.2. Process Overview


ID
0.18um V3E BCD is a 0.18um process to cover 0.18um BCD V3 and 0.152um PMU suitable
NF

for all Power IC applications at or below 40V.


1 FEOL : 1.8/5V+HV low-Ron LDMOS
2 BEOL: follow 0.15um CT/VIA/metal cover 1.8/5V shrink requirement.
CO

1.8V kept as 1.8/5V baseline ( 84% shrink) , IO 5V N/P MOS Lg shrink to 0.5/0.45um from
BL 0.6 / 0.5 um.
3 Pure-5V process: parasitic 2.5/3.3V for standard-cell.
4 Parasitic LVT 1.8/5V CMOS in 1.8V/5V/HV process.
IC

The process features thin/thick gate oxide and complementary MOSFETs with 1.8V/5V and
LDMOS structure with 5V/6V/9V/12V/16V/20V/24V/30V/35V/40V. The basic process
includes 6 layers of metal.
SM

7.1.3. Supported Potentials

0.18um V3E BCD is designed for operation up to 40V. The allowed operating voltages for
each device are outlined in detail under the device descriptions found in Section 2, Device
characterization summary. Any deviations from the allowed potentials given for each device,
even momentary spikes, take the device out of the operating region that SMIC has qualified.
Therefore, any deviations are at the customer's risk.

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

7.1.4. 0.18um Tech. Seal Ring and Scribe Lane

AL
TI
EN
ID
NF
CO
IC
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

7.2. Device Characterization summary

7.2.1. LV/MV devices characterization summary

AL
Vtgm Vtlin Vtsat Idlin Idsat IOFF BV Ron
Device name
(V) (V) (V) (μA/μm) (μA/μm) (pA/μm) (V) (mΩ*mm2)
n18_ckt - 0.41 0.37 77.30 593.74 23 6.05 0.387

TI
p18_ckt - -0.49 -0.43 -38.30 -242.49 -10 -6.05 1.514
nnt18_ckt - 0.04 0.02 40.49 342.54 - 6.61 NA
n50_ckt
p50_ckt
0.80
-0.74
0.74
-0.77
0.60
-0.71
62.22
-18.06
EN
602.01
-295.66
0.13
0.35
12.02
-9.96
1.446
4.709
nnt50_ckt 0.08 0.094 0.13 22.63 416.82 - 12.52 NA
ID
7.2.1.1. 1.8V NMOS (n18_ckt)
NF

1) Device description
Device description 1.8V NMOS
CO

Model name n18_ckt


Terminal count 4
Terminal definition DGSB
IC

SLDD NLL
DLDD NLL
SM

2) Operation voltage range


Voltage (V) Max. tolerance
|Vgs| 1.8 +10%
|Vds| 1.8 +10%
|Vbs| 1.8 +10%

3) Device symbol

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
4) Layout

EN
ID
NF

5) Cross section
CO
IC
SM

6) Device curve

Vtlin Vtsat Idlin Idsat IOFF BV Pitch Ron


Device name
(V) (V) (μA/μm) (μA/μm) (pA/μm) (V) (um) (mΩ*mm2)
n18_ckt 0.41 0.37 150 593.74 23 6.05 0.58 0.387

C-V curve
1) Fitting Cgg vs Vgs of n18_ckt W/L/M=50um/50um/1 at temp=25C
2) Fitting Cgc vs Vgs of n18_ckt W/L/M =400um/0.5um/40 at temp=25C

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
EN
IDVG and ISUB
ID
NF
CO
IC
SM

DC-SOA

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
EN
Noise
ID
NF
CO
IC
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

Mismatch

AL
TI
EN
ID
NF
CO
IC
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

7.2.1.2. 1.8V PMOS (p18_ckt)

1) Device description

AL
Device description 1.8V PMOS
Model name p18_ckt
Terminal count 4

TI
Terminal definition DGSB
SLDD PLL
DLDD PLL EN
2) Operation voltage range
ID
Voltage (V) Max. tolerance
|Vgs| 1.8 +10%
NF

|Vds| 1.8 +10%


|Vbs| 1.8 +10%

3) Device symbol
CO
IC
SM

4) Layout

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

5) Cross-section

AL
TI
6) Device curve
EN
Idlin IOFF Pitch Ron
ID
Vtlin Vtsat Idsat BV
Device name (μA/μm (pA/μm (um) (mΩ*mm2)
(V) (V) (μA/μm) (V)
) )
NF

p18_ckt -0.49 -0.43 -38.30 -242.49 -10 -6.05 0.58 1.514


CO

C-V curve
1) Fitting Cgg vs Vgs of p18_ckt W/L/M=50um/50um/1 at temp=25C
2) Fitting Cgc vs Vgs of 1.8V p18_ckt W/L/M =400um/0.5um/40 at temp=25C
IC
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

IDVG

AL
TI
EN
ID

DC-SOA
NF
CO
IC
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

Noise

AL
TI
EN
Mismatch
ID
NF
CO
IC
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

7.2.1.3. 1.8V native NMOS (nnt18_ckt)

1) Device description

AL
Device description 1.8V native NMOS
Model name nnt18_ckt
Terminal count 4

TI
Terminal definition D G S B
SLDD NLL
DLDD NLL

2) Operation voltage range


EN
Voltage (V) Max. tolerance
ID
|Vgs| 1.8 +10%
|Vds| 1.8 +10%
NF

|Vbs| 1.8 +10%

3) Device symbol
CO
IC
SM

4) Layout

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

5) Cross-section

AL
TI
6) Device curve
EN
ID
Vtlin Vtsat Idlin Idsat IOFF BV
Device name
(V) (V) (μA/μm) (μA/μm) (pA/μm) (V)
nnt18_ckt 0.04 0.02 40.49 342.54 17.71 6.61
NF

IDVD
CO
IC
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

IDVG

AL
TI
EN
ID
Noise
NF
CO
IC
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

7.2.1.4. 5V NMOS (n50_ckt)

1) Device description

AL
Device description 5V NMOS
Model name n50_ckt

TI
Terminal count 4
Terminal definition DGSB
SLDD
NLDD
NLH
NLH
EN
ID
2) Operation voltage range

Voltage (V) Max. tolerance


NF

|Vgs| 5 +10%
|Vds| 5 +10%
|Vbs| 5 +10%
CO

3) Device symbol
IC
SM

4) Layout

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

5) Cross-section

AL
TI
6) Device curve
EN
ID
Vtsa Pitch Ron
Vtgm Vtlin Idlin Idsat IOFF BV
Device name t (um) (mΩ*mm
(V) (V) (μA/μm) (μA/μm) (pA/μm) (V) 2)
(V)
NF

n50_ckt 0.80 0.74 0.60 62.22 602.01 0.13 12.02 0.9 1.446
CO

C-V curve
Fitting Cgg vs Vgs of n50_ckt W/L/M=50um/50um/1 at temp=25C
IC
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

IDVG and ISUB

AL
TI
EN
ID
NF

DC-SOA
CO
IC
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

TLP-SOA

AL
TI
EN
ID
Noise
NF
CO
IC
SM

Mismatch

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
EN
7.2.1.5. 5V PMOS (p50_ckt)
ID
1) Device description
NF

Device description 5V PMOS


Model name p50_ckt
CO

Terminal count 4
Terminal definition DGSB
SLDD PLH
IC

DLDD PLH

2) Operation voltage range


SM

Voltage (V) Max. tolerance


|Vgs| 5 +10%
|Vds| 5 +10%
|Vbs| 5 +10%

3) Device symbol

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

4) Layout

AL
TI
5) Cross-section
EN
ID
NF
CO

6) Device curve
Device Vtgm Vtlin Vtsat Idlin Idsat IOFF BV Pitch Ron
name (V) (V) (V) (μA/μm) (μA/μm) (pA/μm) (V) (um) (mΩ*mm2)
p50_ckt -0.74 -0.77 -0.71 -18.06 -295.66 0.35 -9.96 0.85 4.709
IC
SM

C-V curve
1) Fitting Cgg vs Vgs of p50_ckt W/L/M=50um/50um/1 at temp=25C
2) Fitting Cgc vs Vgs of p50_ckt W/L/M=5000um/0.45um/1 at temp=25C

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 29 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
IDVG and ISUB
EN
ID
NF
CO
IC

DC-SOA
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 30 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
TLP SOA
EN
ID
NF
CO
IC

Mismatch
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 31 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
EN
ID
NF
CO
IC
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

7.2.1.6. 5V native NMOS (nnt50_ckt)

1) Device description

AL
Device description 5V native NMOS
Model name nnt50_ckt
Terminal count 4

TI
Terminal definition D G S B
SLDD NA
DLDD NA

2) Operation voltage range


EN
Voltage (V) Max. tolerance
ID
|Vgs| 5 +10%
|Vds| 5 +10%
NF

|Vbs| 5 +10%

3) Device symbol
CO
IC
SM

4) Layout

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

5) Cross-section

AL
TI
6) Device curve
EN
ID
Vtgm Vtlin Vtsat Idlin Idsat IOFF BV
Device name
(V) (V) (V) (μA/μm) (μA/μm) (pA/μm) (V)
nnt50_ckt 0.08 0.094 0.13 22.63 416.82 0.24 12.52
NF

IDVD
CO
IC
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

IDVG

AL
TI
EN
Noise
ID
NF
CO
IC
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

Mismatch

AL
TI
EN
ID
NF
CO
IC
SM

7.2.1.7. 1.8V and 5V in HVBN pocket

1) 1.8V NMOS in HVBN pocket

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
PWH to
NWH
D1 D2 D3 D4 EN
*ISO6 0um 16V 15V 11V 54V
ID
*ISO12 1.6um 25V 15V 11V 54V
*ISO30 2um 40V 15V 11V 54V
*ISO40 5um 54V 15V 11V 54V
NF

2) 1.8V PMOS in HVBN pocket


CO
IC
SM

PWH to
D1 D2
NWH
*ISO6 0um 16V 54V

3) 1.8V PMOS in HVBN pocket 7 terminal

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
Note: NW 和 HVBN 中间的 psub 非常薄,不能耐压,所以 NW 和 HVBN 必须同电位
PWH to NWH D1 D2 D3 D4 D5
EN
*ISO6 0um 16V 15V 15V 54V 10.5V
ID
*ISO12 1.6um 25V 15V 15V 54V 10.5V
*ISO30 2um 40V 15V 15V 54V 10.5V
NF

*ISO40 5um 54V 15V 15V 54V 10.5V


CO

4) 1.8V Fully PMOS


IC
SM

B1
PWH to NWH D1 D2 D3 D4 D5 D6
(P+/NW/PWHT)
*ISO6 0um 16V 15V 15V 54V 10.5V
*ISO12 1.6um 25V 15V 15V 54V 10.5V
*ISO30 2um 40V 15V 15V 54V 10.5V
*ISO40 5um 54V 15V 15V 54V 10.5V

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

5) 1.8V Native in HVBN pocket

AL
TI
EN
PWH to NWH D1 D2 D3
ID
*ISO6 0um 16V 15V 54V
*ISO12 1.6um 25V 15V 54V
NF

*ISO30 2um 40V 15V 54V


*ISO40 5um 54V 15V 54V
CO

6) 5V NMOS in HVBN pocket


IC
SM

PWH to NWH D1 D2 D3 D4
*ISO6 0um 16V 16V 42V 54V
*ISO12 1.6um 25V 16V 42V 54V
*ISO30 2um 40V 16V 42V 54V
*ISO40 5um 54V 16V 42V 54V

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

7) 5V PMOS in HVBN pocket

AL
TI
EN
ID
PWH to NWH D1 D2
*ISO6 0um 16V 54V
NF

*ISO12 1.6um 25V 54V


*ISO30 2um 40V 54V
*ISO40 5um 54V 54V
CO

8) 5V PMOS in HVBN pocket 7 terminal


IC
SM

PWH to NWH D1 D2 D3 D4 D5
*ISO6 0um 16V 16V 16V 42V 54V
*ISO12 1.6um 25V 16V 16V 42V 54V
*ISO30 2um 40V 16V 16V 42V 54V
*ISO40 5um 54V 16V 16V 42V 54V

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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Introduction and Character
Design Manual

9) 5V Fully PMOS

AL
TI
EN
ID
PWH to B1
D1 D2 D3 D4 D5 D6 D7
NWH (P+/NWH/PWHT)
*ISO6 0um 16V 16V 16V 18 27.5 54V 10.5V 10.5V
NF

*ISO12 1.6um 25V 16V 16V 18 27.5 54V 10.5V 10.5V


*ISO30 2um 40V 16V 16V 18 27.5 54V 10.5V 10.5V
*ISO40 5um 54V 16V 16V 18 27.5 54V 10.5V 10.5V
CO

10) 5V Native in HVBN pocket


IC
SM

PWH to NWH D1 D2 D3 D4 D5
*ISO6 0um 16V 16V 42V 54V 15V
*ISO12 1.6um 25V 16V 42V 54V 15V
*ISO30 2um 40V 16V 42V 54V 15V
*ISO40 5um 54V 16V 42V 54V 15V

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Introduction and Character
Design Manual

7.2.2. LDMOS/DEMOS devices characterization summary

Vtsat Idsat Ron


Pitch Vtgm Vtlin (V) Idlin (μA/μm) IOFF BV
Device name
(um) (V) (V) (μA/μm) (pA/μm) (V) (mΩ*mm2)

AL
nld5g5_sa_iso_hvbn_ckt 0.84 1.48 1.18 - 69 - 0.047 12.9 1.18
nld6g5_sa_iso_hvbn_ckt 0.94 1.46 1.2 - 63.6 - 0.059 13.8 1.5
nld9g5_gs_iso_hvbn_ckt 1.33 1.43 1.29 - 43 - 0.069 19.8 2.9

TI
3T 2.10 -
nde9g5_gs_iso_hvbn_ckt 0.92 0.92 25 390 0.1 20.1 NA
4T 2.44
nld12g5_gs_iso_hvbn_ckt

nde12g5_gs_hvbn_ckt
1.53
3T 2.20
1.41

0.92
1.26

0.92
-
-
EN 40

22
-

375
0.081

0.1
21.8

22
3.6

NA
4T 2.54
ID
nld16g5_gs_iso_hvbn_ckt 1.98 1.41 1.22 - 32 - 0.1 29.5 6.3
nld20g5_gs_iso_hvbn_ckt 2.18 1.39 1.2 - 29 - 0.137 34.5 7.7
NF

nde20g5_gs_iso_hvbn_ckt 3.82 0.95 1 - 15.9 298 0.04 34 NA


nld24g5_gs_iso_hvbn_ckt 2.68 1.37 1.2 - 24 - 0.108 38 10.5
nld30g5_gs_iso_hvbn_ckt 3.23 1.34 1.18 - 19.5 - 0.175 41 16.6
CO

nde30g5_gs_iso_hvbn_ckt 4.92 0.95 1 - 12.35 281 0.06 38.5 NA


nld35g5_rox_gs_ckt 3.44 0.88 0.78 - 13 - 0.19 54 26
nld40g5_rox_gs_ckt 3.84 0.87 0.76 - 12 - 0.29 55 32
pde5g5_sa_hvbn_ckt 0.83/1.43 -0.75 -0.7 -0.63 -20.75 -303.9 -0.3 -9.2 3.7
IC

3T 1.48
pde6g5_sab_hvbn_ckt -0.92 -1.06 -1.04 -16.5 -260 -0.3 -11 7.6
4T 1.82
SM

3T 1.78
pde9g5_gs_hvbn_ckt -0.82 -1.00 -0.60 -10 -250 -0.3 -17.6 15
4T 2.12
3T 1.88
pde12g5_gs_hvbn_ckt -0.82 -1.02 -0.99 -9 -245 -0.3 -22.5 20
4T 2.22
3T 2.33
pde16g5_gs_hvbn_ckt -0.92 -1.03 -0.82 -7.0 -225 -0.3 -31.2 30
4T 2.67
3T 2.53
pde20g5_gs_hvbn_ckt -0.92 -0.87 -0.78 -6.7 -220 -0.3 -34.2 35
4T 2.87
3T 2.98
pde24g5_gs_hvbn_ckt -0.92 -1.05 -0.78 -6 -210 -0.3 -40.4 45.6
4T 3.32
3T 4.23
pde30g5_gs_hvbn_ckt -0.92 -1.1 -0.81 -4.4 -185 -0.3 -45 89.6
4T 4.57

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Introduction and Character
Design Manual

7.2.2.1. 5V NLDMOS (D4) (nld5g5_sa_iso_hvbn_ckt)

1) Device description

AL
Device description 5V NLDMOS
Model name nld5g5_sa_iso_hvbn_ckt

TI
Terminal count 6
Terminal definition d g s b hvbn psub
SLDD
DLDD
NA
NA
EN
ID
2) Operation voltage range
Voltage (V) Max. tolerance
|Vgs| 5 +10%
NF

|Vds| 5 +10%

3) Device symbol
CO
IC
SM

4) Layout

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Platform Device
Introduction and Character
Design Manual

5) Cross-section

AL
TI
Parasitic Diode
Diode D1 D2 D3
EN D4 D5 D6
BV 25V 25V 42V 54V 40V 40V
ID
PWH to PWH to PWH to NDRF=0.1
Space
NWH=1.6um NWH=1.6um um
NF

6) Device curve (D4, LB=D2)


All numbers are for a device with Width=40um, length=0.2um
Pitch Vtgm Vtlin Idlin IOFF BV Ron
CO

Device name
(um) (V) (V) (μA/μm) (pA/μm) (V) (mΩ*mm2)
nld5g5_sa_iso_hvbn_ckt 0.84 1.48 1.18 69 0.047 12.9 1.18
IC

Ron-Vgs Curve
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Platform Device
Introduction and Character
Design Manual

DC SOA curve

AL
TI
EN
ID
NF
CO
IC

TLP SOA curve


SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Introduction and Character
Design Manual

HCI SOA

AL
TI
EN
Idlin
ID
Vdmax (V) @ t 0.1%=0.2yrs
Vg (V)
(△idlin≥10%)
NF

0 11
1.25 6.3
2.5 6.2
CO

4 5.8
5.5 5.5
IC

Self-protection
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Introduction and Character
Design Manual

FOM
Idlin Pitch Ron W Qgg Qgd Qgg*Ron Qgd*Ron
(μA/μm) (um) (mΩ*mm2) (um) (nC) (nC) (nC*mΩ) (mC*Ω)
69 0.84 1.18 40000 0.31 0.089 11.304 3.223

AL
TI
EN
ID
NF

7.2.2.2. 6V NLDMOS (nld6g5_sa_iso_hvbn_ckt)


CO

1) Device description
Device description 6V NLDMOS
Model name nld6g5_sa_iso_hvbn_ckt
IC

Terminal count 6
Terminal definition d g s b hvbn psub
SLDD NA
SM

DLDD NA

2) Operation voltage range

Voltage (V) Max. tolerance


|Vgs| 5 +10%
|Vds| 6 +10%

3) Device symbol

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
4) Layout

EN
ID
NF
CO

5) Cross-section
IC
SM

Parasitic Diode
Diode D1 D2 D3 D4 D5 D6
BV 25V 25V 42V 54V 40V 40V
PWH to PWH to PWH to NDRF=0.1
Space
NWH=1.6um NWH=1.6um um

6) Device curve
All numbers are for a device with Width=40um, length=0.2um

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Introduction and Character
Design Manual

Pitch Vtgm Vtlin Idlin IOFF BV Ron


Device name
(um) (V) (V) (μA/μm) (pA/μm) (V) (mΩ*mm2)
nld6g5_sa_iso_hvbn_ckt 0.94 1.46 1.2 63.6 0.059 13.8 1.5

AL
Ron-Vgs Curve

TI
EN
ID
NF

DC SOA curve
CO
IC
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Platform Device
Introduction and Character
Design Manual

TLP SOA curve

AL
TI
EN
ID
NF

HCI SOA
CO
IC
SM

Idlin
Vdmax (V) @ t 0.1%=0.2yrs
Vg (V)
(△idlin≥10%)
0 10.75
1.25 6.53
2.5 7.59
4 6.3
5.5 4.96

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Introduction and Character
Design Manual

Self-protection

AL
TI
EN
ID
FOM
Idlin Pitch Ron W Qgg Qgd Qgg*Ron Qgd*Ron
NF

(μA/μm) (um) (mΩ*mm2) (um) (nC) (nC) (nC*mΩ) (nC*mΩ)


63.6 0.94 1.5 40000 0.366 0.106 14.387 4.169
CO
IC
SM

7.2.2.3. 9V NLDMOS (nld9g5_gs_iso_hvbn_ckt)

1) Device description
Device description 9V NLDMOS
Model name Nld9g5_gs_iso_hvbn_ckt
Terminal count 6
Terminal definition d g s b hvbn psub
SLDD NA
NLDD NA

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Introduction and Character
Design Manual

2) Operation voltage range


Voltage (V) Max. tolerance
|Vgs| 5 +10%
|Vds| 9 +10%

AL
3) Device symbol

TI
EN
ID
4) Layout
NF
CO
IC

5) Cross-section
SM

Parasitic Diode
Diode D1 D2 D3 D4 D5 D6
BV 25V 25V 42V 54V 40V 40V
PWH to PWH to PWH to NDRF=0.1
Space
NWH=1.6um NWH=1.6um um

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Introduction and Character
Design Manual

6) Device curve
All numbers are for a device with Width=40um, length=0.2um
Pitch Vtgm Vtlin Idlin IOFF BV Ron
Device name
(um) (V) (V) (μA/μm) (pA/μm) (V) (mΩ*mm2)
nld9g5_gs_iso_hvbn_ckt 1.33 1.43 1.29 43 0.069 19.8 2.9

AL
Ron-Vgs Curve

TI
EN
ID
NF
CO

DC SOA curve
IC
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
TLP SOA curve
EN
ID
NF
CO
IC
SM

HCI SOA

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Introduction and Character
Design Manual

Idlin
Vdmax (V) @ t 0.1%=0.2yrs
Vg (V)
(△idlin≥10%)
0 18

AL
1.25 15.18
2.5 10.4
4 14.74

TI
5.5 9.4

Self-protection EN
ID
NF
CO
IC

FOM
SM

Idlin Pitch Ron W Qgg Qgd Qgg*Ron Qgd*Ron


(μA/μm) (um) (mΩ*mm2) (um) (nC) (nC) (nC*mΩ) (nC*mΩ)
43 1.33 2.9 20000 0.176 0.036 20.465 4.186

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Design Manual

7.2.2.4. 9V NDEMOS (nde9g5_gs_iso_hvbn_ckt)

1) Device description
Device description 9V NDEMOS

AL
Model name nde9g5_gs_iso_hvbn_ckt
Terminal count 6
Terminal definition d g s b hvbn psub

TI
SLDD NA
DLDD NA

2) Operation voltage range


EN
Voltage (V) Max. tolerance
ID
|Vgs| 5 +10%
|Vds| 9 +10%
NF

3) Device symbol
CO
IC
SM

4) Layout

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Introduction and Character
Design Manual

5) Cross-section
3T

AL
TI
4T EN
ID
NF

Parasitic Diode/BJT
CO

Diode D1 D2 D3 D4 D5 D6
BV 25V 25V 42V 54V 40V 40V
PWH to PWH to PWH to NDRF=0.1
Space
IC

NWH=1.6um NWH=1.6um um

6) Device curve
SM

All numbers are for a device with Width=40um, length=0.4um


Pitch Vtgm Vtlin Idlin Idsat IOFF BV
Device name
(um) (V) (V) (μA/μm) (μA/μm) (pA/μm) (V)
nde9g5_gs_iso_hvbn_ckt 3T 2.1/4T 2.44 0.92 0.92 25 390 0.1 20.1

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Introduction and Character
Design Manual

Ron-Vgs Curve (3T)

AL
TI
DC SOA curve
EN
ID
NF
CO
IC
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Platform Device
Introduction and Character
Design Manual

TLP SOA curve

AL
TI
EN
ID
HCI SOA
NF
CO
IC
SM

Idlin
Vdmax (V) @ t 0.1%=0.2yrs
Vg (V)
(△idlin≥10%)
0 19
1.25 12.43
2.5 11.97
4 12
5.5 11.28

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Design Manual

7.2.2.5. 12V NLDMOS (nld12g5_gs_iso_hvbn_ckt)

1) Device description

AL
Device description 12V NLDMOS
Model name nld12g5_gs_iso_hvbn_ckt
Terminal count 6

TI
Terminal definition d g s b hvbn psub
SLDD NA
DLDD NA EN
2) Operation voltage range
ID
Voltage (V) Max. tolerance
|Vgs| 5 +10%
NF

|Vds| 12 +10%

3) Device symbol
CO
IC
SM

4) Layout

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Introduction and Character
Design Manual

5) Cross-section

AL
TI
EN
Parasitic Diode
ID
Diode D1 D2 D3 D4 D5 D6
BV 25V 25V 42V 54V 40V 40V
PWH to PWH to PWH to NDRF=0.1
NF

Space
NWH=1.6um NWH=1.6um um

6) Device curve
CO

All numbers are for a device with Width=40um, length=0.2um


Pitch Vtgm Vtlin Idlin IOFF BV Ron
Device name
(um) (V) (V) (μA/μm) (pA/μm) (V) (mΩ*mm2)
nld12g5_gs_iso_hvbn_ckt 1.53 1.41 1.26 40 0.081 21.8 3.6
IC
SM

Ron-Vgs curve

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

DC SOA curve

AL
TI
EN
ID
NF
CO
IC

TLP SOA curve


SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

HCI SOA curve

AL
TI
EN
ID
Idlin
DC ≥ 0.2yr
Vg (V) Vbd
Vdmax_T0.1
NF

0 23 29
1.25 14.9 28
2.5 18 25.4
CO

4 17 21.5
5.5 11 17.3
IC

Self-protection
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

FOM
Idlin Pitch Ron W Qgg Qgd Qgg*Ron Qgd*Ron
(μA/μm) (um) (mΩ*mm2) (um) (nC) (nC) (nC*mΩ) (nC*mΩ)
40 1.53 3.6 20000 0.203 0.0535 25.375 6.693

AL
TI
EN
ID
NF

7.2.2.6. 12V NDEMOS (nde12g5_gs_iso_hvbn_ckt)

1) Device description
CO

Device description 12V NDEMOS


Model name nde12g5_gs_iso_hvbn_ckt
IC

Terminal count 6
Terminal definition d g s b hvbn psub
SM

SLDD NA
DLDD NA

2) Operation voltage range


Voltage (V) Max. tolerance
|Vgs| 5 +10%
|Vds| 12 +10%

3) Device symbol

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
4) Layout

EN
ID
NF

5) Cross-section
CO

3T
IC
SM

4T

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

Parasitic Diode
Diode D1 D2 D3 D4 D5 D6
BV 25V 25V 42V 54V 40V 40V
PWH to PWH to PWH to NDRF=0.1
Space
NWH=1.6um NWH=1.6um um

AL
6) Device curve
All numbers are for a device with Width=40u length m, =0.45um

TI
Pitch Vtgm Vtlin Idlin Idsat IOFF BV
Device name
(um) (V) (V) (μA/μm) (μA/μm) (pA/μm) (V)
nde12g5_gs_hvbn_ckt 3T 2.2/4T 2.54 0.92 0.92 22 EN375 0.1 22
ID
Ron-Vgs Curve (3T)
NF
CO
IC
SM

DC SOA curve

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
EN
TLP SOA curve
ID
NF
CO
IC
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

HCI SOA curve

AL
TI
EN
ID
Idlin
DC ≥ 0.2yr
Vg (V) Vbd/V
Vdmax_T0.1
NF

0 22 27.5
1.25 20 26
CO

2.5 19.6 25
4 14 22
5.5 18 22.5
IC
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

7.2.2.7. 16V NLDMOS (nld16g5_gs_iso_hvbn_ckt)

1) Device description

AL
Device description 16V NLDMOS
Model name nld16g5_gs_iso_hvbn_ckt

TI
Terminal count 6
Terminal definition d g s b hvbn psub
SLDD
DLDD
NLH
NLH
EN
ID
2) Operation voltage range
Voltage (V) Max. tolerance
|Vgs| 5 +10%
NF

|Vds| 16 +10%

3) Device symbol
CO
IC
SM

4) Layout

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

5) Cross-section

AL
TI
Parasitic Diode
EN
ID
Diode D1 D2 D3 D4 D5 D6
BV 40V 40V 42V 54V 40V 40V
PWH to PWH to PWH to NDRF=0.1
NF

Space
NWH=2um NWH=2um um

6) Device curve
CO

All numbers are for a device with Width=40um, length=0.2um


Pitch Vtgm Vtlin Idlin IOFF BV Ron
Device name
(um) (V) (V) (μA/μm) (pA/μm) (V) (mΩ*mm2)
nld16g5_gs_iso_hvbn_ckt 1.98 1.41 1.22 32 0.1 29.5 6.3
IC
SM

Ron-Vgs Curve

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

DC SOA curve

AL
TI
EN
ID
NF
CO
IC

TLP SOA curve


SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

HCI SOA curve

AL
TI
Idlin
EN
DC ≥ 0.2yr
ID
Vg (V) Vbd/V
Vdmax_T0.1
0 26.5 40
NF

1.25 20.1 40
2.5 25 37
4 27 38
CO

5.5 20 40

Self-protection
IC
SM

FOM
Idlin Pitch Ron W Qgg Qgd Qgg*Ron Qgd*Ron
(μA/μm) (um) (mΩ*mm2) (um) (nC) (nC) (nC*mΩ) (nC*mΩ)
32 1.98 6.3 20000 0.221 0.046 34.531 7.212

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
7.2.2.8. 20V NLDMOS (nld20g5_gs_iso_hvbn_ckt) EN
1) Device description
ID

Device description 20V NLDMOS


NF

Model name Nld20g5_gs_iso_hvbn_ckt


Terminal count 6
Terminal definition d g s b hvbn psub
CO

SLDD NLH
DLDD NLH
IC

2) Operation voltage range


SM

Voltage (V) Max. tolerance


|Vgs| 5 +10%
|Vds| 20 +10%

3) Device symbol

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

4) Layout

AL
TI
5) Cross-section
EN
ID
NF
CO
IC

Parasitic Diode
Diode D1 D2 D3 D4 D5 D6
SM

BV 40V 40V 42V 54V 40V 40V


PWH to PWH to PWH to NDRF=0.1
Space
NWH=2um NWH=2um um

6) Device curve
All numbers are for a device with Width=40um, length=0.2um
Pitch Vtgm Vtlin Idlin IOFF BV Ron
Device name
(um) (V) (V) (μA/μm) (pA/μm) (V) (mΩ*mm2)
nld20g5_gs_iso_hvbn_ckt 2.18 1.39 1.2 29 0.137 34.5 7.7

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

Ron-Vgs Curve

AL
TI
EN
DC SOA curve
ID
NF
CO
IC
SM

TLP SOA curve

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
EN
ID
HCI SOA curve
NF
CO
IC
SM

Idlin
DC ≥ 0.2yr
Vg (V)
Vdmax_T0.1
0 34.8
1.25 24
2.5 27
4 26
5.5 20.8

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

Self-protection

D18V3E RF39 HT0215#15 20V GS


NLDMOS ESD TW Vs. IT2
10

AL
8 y = -通用格式x - -通用格式
It2 (A)

6 R² = -通用格式
4

TI
2
0
5000 10000 15000 20000
Total Width (um)
EN
FOM
ID
Idlin Pitch Ron W Qgg Qgd Qgg*Ron Qgd*Ron
(μA/μm) (um) (mΩ*mm2) (um) (nC) (nC) (nC*mΩ) (nC*mΩ)
NF

29 2.18 7.7 20000 0.2 0.054 34.483 9.270


CO
IC
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

7.2.2.9. 20V NDEMOS (nde20g5_gs_iso_hvbn_ckt)

1) Device description

AL
Device description 20V NDEMOS
Model name nde20g5_gs_iso_hvbn_ckt

TI
Terminal count 6
Terminal definition d g s b hvbn psub
SLDD
DLDD
NLH
NLH
EN
ID
2) Operation voltage range

Voltage (V) Max. tolerance


NF

|Vgs| 5 +10%
|Vds| 20 +10%
CO

3) Device symbol
IC
SM

4) Layout

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

5) Cross-section

AL
TI
Parasitic Diode
Diode D1 D2 D3
EN D4 D5 D6
BV 40V 40V 42V 54V 40V 40V
ID
PWH to PWH to PWH to NDRF=0.1
Space
NWH=2um NWH=2um um
NF

6) Device curve (4T)


All numbers are for a device with Width=40um, length=0.6um
CO

Pitch Vtgm Vtlin Idlin Idsat IOFF BV


Device name
(um) (V) (V) (μA/μm) (μA/μm) (pA/μm) (V)
nde20g5_gs_iso_hvbn_ckt 3.82 0.95 1 15.9 298 0.04 34
IC

Ron-Vgs Curve
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

DC SOA curve

AL
TI
EN
ID
NF
CO
IC

TLP SOA curve


SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

HCI SOA

AL
TI
EN
ID
Idlin
Vdmax (V) @ t 0.1%=0.2yrs
Vg (V)
(△idlin≥10%)
NF

0 27
1.25 25
2.5 27
CO

4 27
5.5 25
IC

7.2.2.10. 24V NLDMOS (nld24g5_gs_iso_hvbn_ckt)


SM

1) Device description

Device description 24 NLDMOS


Model name nld24g5_gs_iso_hvbn_ckt
Terminal count 6
Terminal definition d g s b hvbn psub
SLDD NLH
DLDD NLH

2) Operation voltage range

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

Voltage (V) Max. tolerance


|Vgs| 5 +10%
|Vds| 24 +10%

3) Device symbol

AL
TI
EN
4) Layout
ID
NF
CO

5) Cross-section
IC
SM

Parasitic Diode
Diode D1 D2 D3 D4 D5 D6
BV 40V 40V 42V 54V 43V 40V
PWH to PWH to PWH to NDRF=0.1
Space
NWH=2um NWH=2um um

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

6) Device curve
All numbers are for a device with Width=40um, length=0.2um
Pitch Vtgm Vtlin Idlin IOFF BV Ron
Device name
(um) (V) (V) (μA/μm) (pA/μm) (V) (mΩ*mm2)
nld24g5_gs_iso_hvbn_ckt 2.68 1.37 1.2 24 0.108 38 10.5

AL
Ron-Vgs curve

TI
EN
ID
NF
CO

DC SOA curve
IC
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
EN
TLP SOA curve
ID
NF
CO
IC
SM

HCI SOA curve

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

Idlin
DC ≥ 0.2yr
Vg (V)
Vdmax_T0.1
0 34.8
1.25 30

AL
2.5 32
4 28
5.5 22.4

TI
Self-protection
EN
ID
NF
CO
IC

FOM
Idlin Pitch Ron W Qgg Qgd Qgg*Ron Qgd*Ron
SM

(μA/μm) (um) (mΩ*mm2) (um) (nC) (nC) (nC*mΩ) (nC*mΩ)


24 2.68 10.5 20000 0.205 0.047 42.708 9.792

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

7.2.2.11. 30V NLDMOS (nld30g5_gs_iso_hvbn_ckt)

1) Device description
Device description 30V NLDMOS

AL
Model name nld30g5_gs_iso_hvbn_ckt
Terminal count 6
d g s b hvbn psub

TI
Terminal definition
SLDD NLH
DLDD NLH

2) Operation voltage range


EN
ID
Voltage (V) Max. tolerance
|Vgs| 5 +10%
NF

|Vds| 30 +10%

3) Device symbol
CO
IC
SM

4) Layout

5) Cross-section

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 86 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
Parasitic Diode
Diode D1 D2 D3
EN D4 D5 D6
BV 40V 40V 42V 54V 43V 40V
ID
PWH to PWH to PWH to NDRF=0.1
Space
NWH=2um NWH=2um um
NF

6) Device curve
All numbers are for a device with Width=40um, length=0.2um
CO

Pitch Vtgm Vtlin Idlin IOFF BV Ron


Device name
(um) (V) (V) (μA/μm) (pA/μm) (V) (mΩ*mm2)
nld30g5_gs_iso_hvbn_ckt 3.23 1.34 1.18 19.5 0.175 41 16.6
IC

Ron-Vgs curve
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

DC SOA curve

AL
TI
EN
ID
NF
CO
IC

TLP SOA curve


SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

HCI SOA curve

AL
TI
Idlin
EN
DC ≥ 0.2yr
Vg (V) Vbd/V
ID
Vdmax_T0.1
0 40 52
1.25 40 52
NF

2.5 38 49
4 36 45
5.5 32 43
CO

Self-protection
IC
SM

FOM

Idlin Pitch Ron W Qgg Qgd Qgg*Ron Qgd*Ron

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

(μA/μm) (um) (mΩ*mm2) (um) (nC) (nC) (nC*mΩ) (nC*mΩ)


19.5 3.23 16.6 20000 0.213 0.050 54.615 12.849

AL
TI
EN
ID
7.2.2.12. 30V NDEMOS (nde30g5_gs_iso_hvbn_ckt)
NF

1) Device description

Device description 30V NDEMOS


CO

Model name nde30g5_gs_iso_hvbn_ckt


Terminal count 6
Terminal definition d g s b hvbn psub
IC

SLDD NLH
DLDD NLH
SM

2) Operation voltage range


Voltage (V) Max. tolerance
|Vgs| 5 +10%
|Vds| 30 +10%

3) Device symbol

4) Layout

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
5) Cross-section EN
ID
NF
CO

Parasitic Diode
Diode D1 D2 D3 D4 D5 D6
IC

BV 40V 40V 42V 54V 40V 40V


PWH to PWH to PWH to NDRF=0.1
SM

Space
NWH=2um NWH=2um um

6) Device curve (4T)


All numbers are for a device with Width=40um, length=0.6um
Pitch Vtgm Vtlin Idlin Idsat IOFF BV
Device name
(um) (V) (V) (μA/μm) (μA/μm) (pA/μm) (V)
nde30g5_gs_iso_hvbn_ckt 4.92 0.95 1 12.35 281 0.06 38.5

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

Ron-Vgs Curve

AL
TI
DC SOA curve
EN
ID
NF
CO
IC
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

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Platform Device
Introduction and Character
Design Manual

TLP SOA curve

AL
TI
EN
ID
HCI SOA
NF
CO
IC
SM

Idlin
Vdmax (V) @ t 0.1%=0.2yrs
Vg (V)
(△idlin≥10%)
0 38
1.25 31.2
2.5 33.2
4 38
5.5 36.6

7.2.2.13. 35V NLDMOS (nld35g5_rox_gs_ckt)

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

1) Device description
Device description 35V NLDMOS
Model name nld35g5_rox_gs_ckt
Terminal count 4

AL
Terminal definition dgsb
SLDD NA

TI
DLDD NA

2) Operation voltage range

|Vgs|
Voltage (V) Max. tolerance
5 +10%
EN
|Vds| 35 +10%
ID

3) Device symbol
NF
CO
IC

4) Layout
SM

5) Cross-section

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
Parasitic Diode
Diode D1 D2 D3
BV 60V
PWH
60V
to PWH
54V EN
to PWH to DDN=0.1
Space
NWH=5um NWH=5um um
ID
NF

6) Device curve
All numbers are for a device with Width=40um, length=0.4um
Pitch Vtgm Vtlin Idlin IOFF BV Ron
Device name
(μA/μm) (pA/μm)
CO

(um) (V) (V) (V) (mΩ*mm2)


nld35g5_rox_gs_ckt 3.44 0.88 0.78 13 0.19 54 26
IC

Ron-Vgs curve
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

DC SOA curve

AL
TI
EN
ID
NF
CO
IC

TLP SOA curve


SM

HCI SOA curve

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
Idlin
EN
ID
Vdmax (V) @ t 0.1%=0.2yrs
Vg (V)
(△idlin≥10%)
0 55.6
NF

1.25 39.6
2.5 44.6
4 41.4
CO

5.5 35
IC

Self-protection
SM

FOM
Idlin Pitch Ron W Qgg Qgd Qgg*Ron Qgd*Ron
(μA/μm) (um) (mΩ*mm2) (um) (nC) (nC) (nC*mΩ) (nC*mΩ)

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

13 3.44 26 20000 0.224 0.027 86.154 10.354

AL
TI
EN
ID
7.2.2.14. 40V NLDMOS (nld40g5_rox_gs_ckt)
NF

1) Device description
Device description 40V NLDMOS
Model name nld40g5_rox_gs_ckt
CO

Terminal count 4
Terminal definition dgsb
SLDD NA
IC

DLDD NA
SM

2) Operation voltage range

Voltage (V) Max. tolerance


|Vgs| 5 +10%
|Vds| 40 +10%

3) Device symbol

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
4) Layout

EN
ID
NF
CO
IC

5) Cross-section
SM

Parasitic Diode
Diode D1 D2 D3
BV 60V 60V 54V
Space PWH to NWH=5um PWH to NWH=5um PWH to DDN=0.1 um

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

6) Device curve
All numbers are for a device with Width=40um, length=0.4um
Pitch Vtgm Vtlin Idlin IOFF BV Ron
Device name
(um) (V) (V) (μA/μm) (pA/μm) (V) (mΩ*mm2)
nld40g5_rox_gs_ckt 3.84 0.87 0.76 12 0.29 55 32

AL
Ron-Vgs curve

TI
EN
ID
NF
CO

DC SOA curve
IC
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
TLP SOA curve
EN
ID
NF
CO
IC

HCI SOA curve


SM

Idlin

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

Vdmax (V) @ t 0.1%=0.2yrs


Vg (V)
(△idlin≥10%)
0 63.2
1.25 40
2.5 53.5

AL
4 45.6
5.5 42

TI
Self-protection
EN
ID
NF
CO

FOM
IC

Idlin Pitch Ron W Qgg Qgd Qgg*Ron Qgd*Ron


(μA/μm) (um) (mΩ*mm2) (um) (nC) (nC) (nC*mΩ) (nC*mΩ)
SM

12 3.84 32 20000 0.226 0.027 94.167 11.25

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

7.2.2.15. 5V PDEMOS (pde5g5_sa_hvbn_ckt)

1) Device description

AL
Device description 5V PDEMOS
Model name pde5g5_sa_hvbn_ckt
Terminal count 5

TI
Terminal definition d g s b psub
SLDD PLH
DLDD PLH EN
2) Operation voltage range
ID
Voltage (V) Max. tolerance
|Vgs| -5 +10%
NF

|Vds| -5 +10%

3) Device symbol
CO
IC
SM

4) Layout

5) Cross-section
Only with N+ Body pick up AA ring, without N+ Body pick up AA

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
With N+ Body pick up AA ring and block

EN
ID
NF

Parasitic Diode
Diode D1 D2
CO

BV 25V 54V
PWH to
Space
NWH=1.6um
IC

6) Device Curve
All numbers are for a device with Width=40um, length=0.4um
SM

Vtli
Pitch Vtgm Vtsat Idlin Idsat IOFF BV Ron
n
Device name
(mΩ*mm
(μm) (V) (V) (V) (μA/μm) (μA/μm) (pA/μm) (V) 2)

pde5g5_sa_hvbn_ 0.83/1.4
-0.75 -0.7 -0.63 -20.75 -303.9 -0.3 -9.2 3.7
ckt 3

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

Ron-Vgs Curve

AL
TI
DC SOA curve
EN
ID
NF
CO
IC
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Platform Device
Introduction and Character
Design Manual

TLP SOA curve

AL
TI
EN
ID
HCI SOA curve
NF
CO
IC
SM

Idlin
DC ≥ 0.2yr
Vg (V)
Vdmax_T0.1
0 7.5
0.95 7.2
1.9 5.5
3.7 3.8
5.5 3.4

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

Self-protection

AL
TI
EN
7.2.2.16. 6V PDEMOS (pde6g5_sab_hvbn_ckt)
ID

1) Device description
NF

Device description 6V PDEMOS


Model name pde6g5_sab_hvbn_ckt
Terminal count 5
CO

Terminal definition d g s b psub


SLDD PLH
DLDD PLH
IC

2) Operation voltage range


SM

Voltage (V) Max. tolerance


|Vgs| -5 +10%
|Vds| -6 +10%

3) Device symbol

4) Layout

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
EN
ID
5) Cross-section
3T
NF
CO
IC

4T
SM

Parasitic Diode
Diode D1 D2
BV 25V 54V
PWH to
Space
NWH=1.6um

6) Device Curve

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

All numbers are for a device with Width=40um, length=0.2um


Pitch Vtgm Vtlin Vtsat Idlin Idsat IOFF
Ron BV
Device name 2
(μm) (V) (V) (V) (μA/μm) (μA/μm) (pA/μm) (V) (mΩ*mm )
pde6g5_sab_hvbn_ckt 3T1.48/4T1.82 -0.92 -1.06 -1.04 -16.5 -260 -0.3 -11 7.6

AL
TI
Ron-Vgs Curve

EN
ID
NF
CO

DC SOA curve
IC
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
TLP SOA curve
EN
ID
NF
CO
IC
SM

HCI SOA curve

Idlin

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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Platform Device
Introduction and Character
Design Manual

DC ≥ 0.2yr
Vg (V) Vbd/V
Vdmax_T0.1
0 13 16
1.25 12 16

AL
2.5 7.4 15
4 6.6 14
5.5 6 12

TI
Self-protection
EN
ID
NF
CO

FOM
IC

Idlin Pitch Ron W Qgg Qgd Qgg*Ron Qgd*Ron


(μA/μm) (um) (mΩ*mm2) (um) (nC) (nC) (nC*mΩ) (nC*mΩ)
SM

16.5 1.48 7.6 20000 0.13786 0.029 41.78 8.782

7.2.2.17. 9V PDEMOS (pde9g5_gs_hvbn_ckt)

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 111 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

1) Device description
Device description 9V PDEMOS
Model name pde9g5_gs_hvbn_ckt
Terminal count 5

AL
Terminal definition d g s b psub
SLDD PLH
DLDD PLH

TI
2) Operation voltage range
Voltage (V) Max. tolerance
|Vgs|
|Vds|
-5
-9
+10%
+10%
EN
ID
3) Device symbol
NF
CO
IC

4) Layout
SM

5) Cross-section
3T

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 112 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
4T

EN
ID
NF

Parasitic Diode/BJT
CO

Diode D1 D2 D3 D4 B1
BV 25V 45V 54V 47V 51V
PWH to PDRF to
Space
NWH=1.6um NWH=0um
IC

6) Device Curve
SM

All numbers are for a device with Width=40um, length=0.2um


Pitch Vtgm Vtlin Vtsat Idlin Idsat IOFF BV Ron
Device name
(um) (V) (V) (V) (μA/μm) (μA/μm) (pA/μm) (V) (mΩ*mm2)
pde9g5_gs_hvbn_ckt 3T1.78/4T2.12 -0.82 -1.00 -0.60 -10 -250 -0.3 -17.6 18.0

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 113 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

Ron-Vgs Curve

AL
TI
DC SOA curve
EN
ID
NF
CO
IC
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 114 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

TLP SOA curve

AL
TI
EN
ID

HCI SOA curve


NF
CO
IC
SM

Idlin
DC ≥ 0.2yr
Vg (V)
Vdmax_T0.1
0 12.1
1.25 15
2.5 13.2
4 13.6
5.5 12.6

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 115 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

Self-protection

AL
TI
FOM
EN
Idlin Pitch Ron W Qgg Qgd Qgg*Ron Qgd*Ron
ID
(μA/μm) (um) (mΩ*mm2) (um) (nC) (nC) (nC*mΩ) (nC*mΩ)
10 1.78 18.0 20000 0.24 0.07 120.00 35.20
NF
CO
IC
SM

7.2.2.18. 12V PDEMOS (pde12g5_gs_hvbn_ckt)

1) Device description

Device description 12V PDEMOS


Model name Pde12g5_gs_hvbn_ckt
Terminal count 5
Terminal definition d g s b psub
SLDD PLH
DLDD PLH

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 116 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

2) Operation voltage range


Voltage (V) Max. tolerance
|Vgs| -5 +10%
|Vds| -12 +10%

AL
3) Device symbol

TI
EN
ID
4) Layout
NF
CO
IC
SM

5) Cross-section
3T

4T

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 117 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
Parasitic Diode
Diode D1 D2 D3 D4 B1
BV
Space
25V
PWH
45V
to PDRF to
EN
54V 47V 51V

NWH=1.6um NWH=0um
ID
6) Device Curve
All numbers are for a device with Width=40um, length=0.2um
NF

Pitch Vtgm Vtlin Vtsat Idlin Idsat IOFF BV Ron


Device name
(um) (V) (V) (V) (μA/μm) (μA/μm) (pA/μm) (V) (mΩ*mm2)
Pde12g5_gs_hvbn_ckt 3T1.88/4T2.22 -0.82 -1.02 -0.99 -9 -245 -0.3 -22.5 20
CO

Ron-Vgs Curve
IC
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 118 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

DC SOA curve

AL
TI
EN
ID
NF
CO
IC

TLP SOA curve


SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 119 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

HCI SOA curve

AL
TI
Idlin
EN
DC ≥ 0.2yr
ID
Vg (V) Vbd/V
Vdmax_T0.1
0 18 25
NF

1.25 22 30
2.5 18 27.5
4 15 22.5
CO

5.5 17.3 25

Self-protection
IC
SM

FOM

Idlin Pitch Ron W Qgg Qgd Qgg*Ron Qgd*Ron

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 120 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

(μA/μm) (um) (mΩ*mm2) (um) (nC) (nC) (nC*mΩ) (nC*mΩ)


9 1.88 20 20000 0.258 0.088 143.333 48.862

AL
TI
EN
ID
7.2.2.19. 16V PDEMOS (pde16g5_gs_hvbn_ckt)

1) Device description
NF

Device description 16V PDEMOS


Model name Pde16g5_gs_hvbn_ckt
CO

Terminal count 5
Terminal definition d g s b psub
SLDD PLH
PLH
IC

DLDD

2) Operation voltage range


SM

Voltage (V) Max. tolerance


|Vgs| -5 +10%
|Vds| -16 +10%

3) Device symbol

4) Layout

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 121 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
3T
5) Cross-section EN
ID
NF
CO

4T
IC
SM

Parasitic Diode/BJT
Diode D1 D2 D3 D4 B1
BV 40V 45V 54V 47V 51V
PWH to PDRF to
Space
NWH=2um NWH=0um

6) Device Curve
All numbers are for a device with Width=40um, length=0.25um

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 122 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

Pitch Vtgm Vtlin Vtsat Idlin Idsat IOFF BV Ron


Device name
(um) (V) (V) (V) (μA/μm) (μA/μm) (pA/μm) (V) (mΩ*mm2)
Pde16g5_gs_hvbn_ckt 3T2.33/4T2.67 -0.92 -1.03 -0.82 -7.0 -225 -0.3 -31.2 30

AL
Ron-Vgs Curve

TI
EN
ID

DC SOA curve
NF
CO
IC
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 123 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

TLP SOA curve

AL
TI
EN
ID
HCI SOA curve
NF
CO
IC
SM

Idlin
DC ≥ 0.2yr
Vg (V) Vbd/V
Vdmax_T0.1
0 27 42
1.25 26 41.5
2.5 26 42.5
4 27 40.5
5.5 25 39.5

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 124 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

Self-protection

AL
TI
EN
ID
FOM
Idlin Pitch Ron W Qgg Qgd Qgg*Ron Qgd*Ron
NF

(μA/μm) (um) (mΩ*mm2) (um) (nC) (nC) (nC*mΩ) (nC*mΩ)


7 2.33 30 20000 0.286 0.097 204.614 69.6
CO
IC
SM

7.2.2.20. 20V PDEMOS (pde20g5_gs_hvbn_ckt)

1) Device description
Device description 20V PDEMOS
Model name pde20g5_gs_hvbn_ckt
Terminal count 5
Terminal definition d g s b psub
SLDD PLH
DLDD PLH

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 125 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

2) Operation voltage range


Voltage (V) Max. tolerance
|Vgs| -5 +10%
|Vds| -20 +10%

AL
3) Device symbol

TI
EN
ID
4) Layout
NF
CO
IC
SM

5) Cross-section
3T

4T

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 126 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
Parasitic Diode/BJT
Diode
BV
D1
40V
D2
45V
EN D3
54V
D4
47V
B1
51V
Space PWH to NWH=2um PDRF to NWH=0um
ID
6) Device curve
NF

All numbers are for a device with Width=40um, length=0.25um


Pitch Vtgm Vtlin Vtsat Idlin Idsat IOFF BV Ron
Device name
(um) (V) (V) (V) (μA/μm) (μA/μm) (pA/μm) (V) (mΩ*mm2)
Pde20g5_gs_hvbn_ckt 3T2.53/4T2.87 -0.92 -0.87 -0.78 -6.7 -220 -0.3 -34.2 35
CO

Ron-Vgs Curve
IC
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 127 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

DC SOA curve

AL
TI
EN
ID
NF
CO
IC

TLP SOA curve


SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 128 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

HCI SOA curve

AL
TI
EN
ID
Idlin
DC ≥ 0.2yr
Vg (V)
Vdmax_T0.1
NF

0 27.6
1.25 24.8
2.5 26
CO

4 26
5.5 28
IC

Self-protection
SM

FOM

Idlin Pitch Ron W Qgg Qgd Qgg*Ron Qgd*Ron

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 129 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

(μA/μm) (um) (mΩ*mm2) (um) (nC) (nC) (nC*mΩ) (nC*mΩ)


6.7 2.53 35 20000 0.321 0.104 239.657 77.627

AL
TI
EN
7.2.2.21. 24V PDEMOS (pde24g5_gs_hvbn_ckt)
ID

1) Device description
NF

Device description 24V PDEMOS


Model name pde24g5_gs_hvbn_ckt
Terminal count 5
CO

Terminal definition d g s b psub


SLDD PLH
DLDD PLH
IC

2) Operation voltage range


Voltage (V) Max. tolerance
SM

|Vgs| -5 +10%
|Vds| -24 +10%

3) Device symbol

4) Layout

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 130 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
5) Cross-section
EN
3T
ID
NF
CO

4T
IC
SM

Parasitic Diode
Diode D1 D2 D3 D4 B1
BV 40V 45V 54V 47V 51V
Space PWH to NWH=2um PDRF to NWH=0um

6) Device curve
All numbers are for a device with Width=40um, length=0.25um

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 131 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

Pitch Vtgm Vtlin Vtsat Idlin Idsat IOFF BV Ron


Device name
(um) (V) (V) (V) (μA/μm) (μA/μm) (pA/μm) (V) (mΩ*mm2)
Pde24g5_gs_hvbn_ckt 3T2.98/4T3.32 -0.92 -1.05 -0.78 -6 -210 -0.3 -40.4 45.6

Ron-Vgs Curve

AL
TI
EN
ID

DC SOA curve
NF
CO
IC
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 132 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

TLP SOA curve

AL
TI
EN
ID

HCI SOA curve


NF
CO
IC
SM

Idlin
DC ≥ 0.2yr
Vg (V)
Vdmax_T0.1
0 29
1.25 28.8
2.5 29.2
4 33.6
5.5 34

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 133 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

Self-protection

AL
TI
EN
ID
FOM
NF

Idlin Pitch Ron W Qgg Qgd Qgg*Ron Qgd*Ron


(μA/μm) (um) (mΩ*mm2) (um) (nC) (nC) (nC*mΩ) (nC*mΩ)
6 2.98 45.6 20000 0.396 0.137 329.867 114.467
CO
IC
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 134 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

7.2.2.22. 30V PDEMOS (pde30g5_gs_hvbn_ckt)

1) Device description

AL
Device description 30V PDEMOS
Model name pde30g5_gs_hvbn_ckt
Terminal count 5

TI
Terminal definition d g s b psub
SLDD PLH
DLDD PLH EN
2) Operation voltage range
ID
Voltage (V) Max. tolerance
|Vgs| -5 +10%
NF

|Vds| -30 +10%

3) Device symbol
CO
IC
SM

4) Layout

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 135 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

5) Cross-section
3T

AL
TI
4T
EN
ID
NF
CO

Parasitic Diode/BJT
Diode D1 D2 D3 D4 B1
BV 40V 45V 54V 47V 51V
IC

PWH to PDRF to
Space
NWH=2um NWH=0um
SM

6) Device curve
All numbers are for a device with Width=40um, length=0.25um
Pitch Vtgm Vtlin Vtsat Idlin Idsat IOFF BV Ron
Device name
(um) (V) (V) (V) (μA/μm) (μA/μm) (pA/μm) (V) (mΩ*mm2)
Pde30g5_gs_hvbn_ckt 3T4.23/4T4.57 -0.92 -1.1 -0.81 -4.4 -185 -0.3 -45 89.6

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

Ron-Vgs Curve

AL
TI
DC SOA curve
EN
ID
NF
CO
IC
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Platform Device
Introduction and Character
Design Manual

TLP SOA curve

AL
TI
EN
ID

HCI SOA curve


NF
CO
IC
SM

Idlin
DC ≥ 0.2yr
Vg (V) Vbd/V
Vdmax_T0.1
0 38 50
1.25 33 45
2.5 30 45
4 35 45
5.5 35 45

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Platform Device
Introduction and Character
Design Manual

Self-protection

AL
TI
EN
ID
FOM
Idlin Pitch Ron W Qgg Qgd Qgg*Ron Qgd*Ron
NF

(μA/μm) (um) (mΩ*mm2) (um) (nC) (nC) (nC*mΩ) (nC*mΩ)


4.4 4.23 89.6 20000 0.472 0.154 536.364 175
CO
IC
SM

7.2.2.23. 35V PDEMOS (pde35g5_sti_hvbn_ckt)


This device HCI Idlin fail, not suggest use. Provide new structure pde35v in 2022/06.

1) Device description

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Platform Device
Introduction and Character
Design Manual

Device description 35V PDEMOS


Model name pde35g5_sti_hvbn_ckt
Terminal count 5
Terminal definition d g s b psub

AL
SLDD PLH
DLDD PLH

TI
2) Operation voltage range
Voltage (V) Max. tolerance
|Vgs|
|Vds|
-5
-35
+10%
+10%
EN
ID
3) Layout
NF
CO
IC
SM

4) Cross section
3T

4T

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
Parasitic Diode
Diode D1 D2 D3 D4
BV 54V >50V 54V 50V
Space PWH to NWH=5um
DDP
NWH=2um
to
EN
ID
5) Device curve
Pitch Vtgm Vtlin Vtsat Idlin Idsat IOFF BV Ron
Device name
NF

(um) (V) (V) (V) (μA/μm) (μA/μm) (pA/μm) (V) (mΩ*mm2)


3T3.045
Pde35g5_sti_hvbn_ckt -0.94 -1.06 -1.04 -3.8 -142 0.05 -46.8 85
/4T3.383
CO

Ron-Vgs Curve
IC
SM

7.2.2.24. 40V PDEMOS (pde40g5_sti_hvbn_ckt)


This device HCI Idlin fail, not suggest use. Provide new structure pde40v in 2022/06

1) Device description

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

Device description 40V PDEMOS


Model name Pde40g5_sti_hvbn_ckt
Terminal count 5
Terminal definition d g s b psub

AL
SLDD PLH
DLDD PLH

TI
2) Operation voltage range
Voltage (V) Max. tolerance
|Vgs|
|Vds|
-5
-40
+10%
+10%
EN
ID
3) Layout
NF
CO
IC
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Platform Device
Introduction and Character
Design Manual

4) Cross section
3T

AL
TI
4T
EN
ID
NF
CO

Parasitic Diode/BJT
Diode D1 D2 D3 D4
BV 54V >50V 54V 50V
IC

Space PWH to NWH=5um DDP to NWH=2um


SM

5) Device Curve
Pitch Vtgm Vtlin Vtsat Idlin Idsat IOFF BV Ron
Device name
(um) (V) (V) (V) (μA/μm) (μA/μm) (pA/μm) (V) (mΩ*mm2)
3T 3.145/
Pde40g5_sti_hvbn_ckt -0.91 -1 -0.97 -3.5 -176 0.05 -51 85.6
4T 3.485

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Platform Device
Introduction and Character
Design Manual

Ron-Vgs Curve

AL
TI
7.2.3. Bipolar Transistor characterization data summary
EN
Device HFE BVeco(V) BVebo(V) BVceo(V) BVcbo(V) Vbe(V) VA(V)
ID
pnp18a100_ckt 2.95 6.9 11 16 16 0.76 >500
pnp18a25_ckt 2.5 6.9 11 16 16 0.81 >500
NF

pnp18a4_ckt 2.5 6.9 11 16 16 0.8 >500


pnp50a100_poly_ckt 1.67 10.7 10.3 20 20 0.77 550
CO

pnp50a25_poly_ckt 1.62 10.4 10.1 19.3 19 0.85 480


npn50a100_sab_ckt 2.85 12.3 12.1 18 18 0.77 333
npn50a25_sab_ckt 3.1 12.5 12.2 18.4 18.4 0.82 333
IC

pnphva100_poly_ckt 34.5 11.9 14.8 20 19 0.76 20


pnphva25_poly_ckt 25 11.5 14.3 20 20 0.8 20
SM

npnhva100_poly_ckt 2.91 10.4 10 18 18 0.76 50


npnhva25_poly_ckt 3 10.2 10.1 18.2 18.1 0.83 50
pnphvbniso100_poly_ckt 25.2 12 15 43 38 0.8 5
pnphvbniso25_poly_ckt 25 13 14 41 39 0.8 5
npnhbeta100_poly_ckt 30 13 15 20 21 0.71 42
npnhbeta100_sab100_ckt 82 11 11.5 28 28 0.77 9
npnhbeta100_sab25_ckt 92 11 11.5 27.6 27.6 0.77 9
npnhbeta100_sab4_ckt 117.4 11 11.5 31 29.5 0.77 9

7.2.3.1. 1.8V vertical PNP (pnp18a100_ckt)

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

1) Device description
1.8V vertical PNP (10X10)
Device description
(P+/PLL)_NW_PSUB
Model name pnp18a100_ckt
Terminal count 3

AL
Terminal definition E B C
Emitter LDD PLL

TI
2) Symbol

EN
ID

3) Layout
NF
CO
IC

4) Cross section
SM

Diode D1 D2 D3
BV 15V 10.5V 28.5V
Space PW to NW=0

5) WAT

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Platform Device
Introduction and Character
Design Manual

Device HFE BVeco(V) BVebo(V) BVceo(V) BVcbo(V) Vbe(V) VA(V)


pnp18a100_ckt 2.95 6.9 11 16 16 0.76 >500

AL
TI
EN
ID
NF
CO

6) Spice data Vs Si data


WAT Model
IC

area Ie(uA) -40C 25C 125C -40C 25C 125C


BETAPNP A67C1 PNP18 100 0.5 1.75 2.59 3.93 1.695 2.498 3.745
SM

BETAPNP A67C2 PNP18 100 1 1.75 2.59 3.93 1.696 2.5 3.748
BETAPNP A67C3 PNP18 100 2.5 1.72 2.56 3.86 1.696 2.5 3.747
VBE A67C PNP18 100 1 -0.8 -0.6 -0.4 -0.77 -0.64 -0.44
VBE A67C PNP18 100 0.5 -0.8 -0.6 -0.4 -0.75 -0.62 -0.42
VBE A67C PNP18 100 25 -0.8 -0.7 -0.6 -0.83 -0.72 -0.55

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Platform Device
Introduction and Character
Design Manual

7.2.3.2. 1.8V vertical PNP (pnp18a25_ckt)

1) Device description

AL
1.8V vertical PNP(5X5)
Device description
(P+/PLL)_NW_PSUB
Model name pnp18a25_ckt

TI
Terminal count 3
Terminal definition E B C
Emitter LDD PLL

2) Symbol
EN
ID
NF

3) Layout
CO
IC
SM

4) Cross section

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
Diode D1 D2 D3
BV
Space
15V
PW to NW=0
10.5V 28.5V EN
ID
5) WAT
Device HFE BVeco(V) BVebo(V) BVceo(V) BVcbo(V) Vbe(V) VA(V)
NF

pnp18a25_ckt 2.5 6.9 11 16 16 0.81 >500


CO
IC
SM

6) Spice data Vs Si data


WAT Model
area Ie(uA) -40C 25C 125C -40C 25C 125C
BETAPNP A67B1 PNP18 25 0.5 1.69 2.56 4 1.656 2.523 3.872
BETAPNP A67B2 PNP18 25 1 1.69 2.57 4 1.656 2.523 3.872
BETAPNP A67B3 PNP18 25 2.5 1.65 2.5 3.93 1.655 2.521 3.864
VBE A67B PNP18 25 1 -0.8 -0.7 -0.5 -0.79 -0.67 -0.48
VBE A67B PNP18 25 0.5 -0.8 -0.7 -0.5 -0.78 -0.65 -0.46
VBE A67B PNP18 25 25 -0.9 -0.8 -0.6 -0.86 -0.76 -0.59

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
7.2.3.3. 1.8V vertical PNP (pnp18a4_ckt)
EN
ID
1) Device description
1.8V vertical PNP (2X2)
Device description
NF

(P+/PLL)_NW_PSUB
Model name pnp18a4_ckt
Terminal count 3
CO

Terminal definition E B C
Emitter LDD PLL

2) Symbol
IC
SM

3) Layout

4) Cross section

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
Diode D1 D2 D3
BV 15V 10.5V 28.5V
Space PW to NW=0
EN
ID
5) WAT
Device HFE BVeco(V) BVebo(V) BVceo(V) BVcbo(V) Vbe(V) VA(V)
NF

pnp18a4_ckt 2.5 6.9 11 16 16 0.8 >500


CO
IC
SM

6) Spice data Vs Si data


WAT Model
area Ie(uA) -40 25 125 -40 25 125
BETAPNP A67A1 PNP18 4 0.5 1.69 2.67 4.35 1.677 2.637 4.138
BETAPNP A67A2 PNP18 4 1 1.69 2.67 4.35 1.675 2.634 4.133
BETAPNP A67A3 PNP18 4 2.5 1.63 2.61 4.25 1.672 2.627 4.112
VBE A67A PNP18 4 1 -0.82 -0.71 -0.54 -0.83 -0.72 -0.54
VBE A67A PNP18 4 0.5 -0.81 -0.7 -0.51 -0.81 -0.7 -0.51
VBE A67A PNP18 4 25 -0.89 -0.8 -0.65 -0.89 -0.8 -0.65

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Platform Device
Introduction and Character
Design Manual

AL
TI
7.2.3.4. 5V vertical PNP (pnp50a100_poly_ckt)
EN
ID
1) Device description
NF

5V vertical PNP (10X10)


Device description
(P+/PLH)_NWH_PSUB
Model name pnp50a100_poly_ckt
CO

Terminal count 3
Terminal definition E B C
Emitter LDD PLH
IC

2) Symbol
SM

3) Layout

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Platform Device
Introduction and Character
Design Manual

4) Cross Section

AL
TI
Diode D1 D2 D3
BV
Space
19V
PWH to NWH=0um
10.5V 55V
EN
5) WAT
ID
Device HFE BVeco(V) BVebo(V) BVceo(V) BVcbo(V) Vbe(V) VA(V)
pnp50a100_poly_ckt 1.67 10.7 10.3 20 20 0.77 550
NF
CO
IC
SM

6) Mismatch
beta vbe diff
area 1/sqrt(area)
data model data model beta vbe
25e-12 0.2 3.44E-03 3.34E-03 8.59E-05 8.73E-05 -2.82% 1.64%
1.00E-10 0.1 2.68E-03 2.60E-03 6.47E-05 6.73E-05 -3.01% 3.92%

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
EN
7) Spice data Vs Si data
ID
NF
CO
IC
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Introduction and Character
Design Manual

7.2.3.5. 5V vertical PNP (pnp50a25_poly_ckt)

1) Device description

AL
Device description 5V vertical PNP (5X5) (P+/PLH)_NWH_PSUB
Model name pnp50a25_poly_ckt

TI
Terminal count 3
Terminal definition EBC
Emitter LDD PLL
EN
2) Symbol
ID
NF
CO

3) Layout
IC
SM

4) Cross Section

Diode D1 D2 D3
BV 19V 10.5V 55V
Space PWH to NWH=0um

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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Platform Device
Introduction and Character
Design Manual

5) WAT
Device HFE BVeco(V) BVebo(V) BVceo(V) BVcbo(V) Vbe(V) VA(V)
pnp50a25_poly_ckt 1.62 10.4 10.1 19.3 19 0.85 480

AL
TI
EN
6) Mismatch
ID
beta vbe diff
area 1/sqrt(area)
data model data model beta vbe
NF

25e-12 0.2 3.44E-03 3.34E-03 8.59E-05 8.73E-05 -2.82% 1.64%


1.00E-10 0.1 2.68E-03 2.60E-03 6.47E-05 6.73E-05 -3.01% 3.92%
CO
IC
SM

7) Spice data Vs Si data

7.2.3.6. 5V vertical NPN (npn50a100_sab_ckt )

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Platform Device
Introduction and Character
Design Manual

1) Device description

5V vertical NPN (10X10)


Device description
(N+/NLH)_PWH_HVBN
Model name npn50a100_sab_ckt

AL
Terminal count 4
Terminal definition c b e psub
Emitter LDD NLH

TI
2) Symbol
EN
ID

3) Layout
NF
CO
IC

4) Cross Section
SM

Diode D1 D2 D3 D4 D5
BV 16V 11V 16V 40V 54V
Space PWH to NWH=0um PWH to NWH=0um

5) WAT
Device HFE BVeco(V) BVebo(V) BVceo(V) BVcbo(V) Vbe(V) VA(V)

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 156 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

npn50a100_sab_ckt 2.85 12.3 12.1 18 18 0.77 333

AL
TI
EN
ID
NF
CO

6) Mismatch
beta vbe diff
area 1/sqrt(area)
data model data model beta vbe
IC

25e-12 0.2 4.50E-03 4.50E-03 2.21E-04 2.22E-04 0.01% 0.70%


1.00E-10 0.1 4.36E-03 4.35E-03 1.19E-04 1.19E-04 -0.20% -0.09%
SM

7) Spice data Vs Si data

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 157 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
EN
ID
7.2.3.7. 5V vertical NPN (npn50a25_sab_ckt )
NF

1) Device description

5V vertical NPN (5X5)


Device description
CO

(N+/NLH)_PWH_HVBN
Model name npn50a25_sab_ckt
Terminal count 4
Terminal definition c b e psub
IC

Emitter LDD NLH


SM

2) Symbol

3) Layout

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 158 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

4) Cross Section

AL
TI
Diode D1 D2 D3 D4 D5
BV
Space
16V
PWH to NWH=0um
11V 16V EN
PWH to NWH=0um
40V 54V
ID
5) WAT
Device HFE BVeco(V) BVebo(V) BVceo(V) BVcbo(V) Vbe(V) VA(V)
NF

npn50a25_sab_ckt 3.1 12.5 12.2 18.4 18.4 0.82 333


CO
IC
SM

6) Mismatch
beta vbe diff
area 1/sqrt(area)
data model data model beta vbe
25e-12 0.2 4.50E-03 4.50E-03 2.21E-04 2.22E-04 0.01% 0.70%
1.00E-10 0.1 4.36E-03 4.35E-03 1.19E-04 1.19E-04 -0.20% -0.09%

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 159 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
7) Spice data Vs Si data EN
ID
NF
CO
IC
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 160 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

7.2.3.8. HV lateral PNP (pnphva100_poly_ckt )

1) Device description

AL
Device description HV lateral PNP (10x10) P+_NDRF_PWH
Model name pnphva100_poly_ckt
Terminal count 3

TI
Terminal definition cbe
LDD NA
EN
2) Symbol
ID
NF
CO

3) Layout
IC
SM

4) Cross Section

Diode D1 D2 D3
BV 18V 16V 40V
Space PWH to NDRF=0um

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 161 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

5) WAT
Device HFE BVeco(V) BVebo(V) BVceo(V) BVcbo(V) Vbe(V) VA(V)
Pnphva100_poly_ckt 34.5 11.9 14.8 20 19 0.76 20

AL
TI
EN
ID
NF
CO

6) Mismatch
IC

beta vbe
area 1/sqrt(area)
data model data model
25e-12 0.2 7.01E-03 7.00E-03 1.15E-04 1.95E-04
SM

pnphva_poly
1.00E-10 0.1 7.11E-03 7.10E-03 5.23E-05 1.87E-04

7.2.3.9. HV lateral PNP (pnphva25_poly_ckt )

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 162 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

1) Device description

Device description HV lateral PNP (5x5) P+_NDRF_PWH


Model name pnphva25_poly_ckt
Terminal count 3

AL
Terminal definition cbe
LDD NA

TI
2) Symbol
EN
ID

3) Layout
NF
CO
IC

4) Cross Section
SM

Diode D1 D2 D3
BV 18V 16V 40V
Space PWH to NDRF=0um

5) WAT
Device HFE BVeco(V) BVebo(V) BVceo(V) BVcbo(V) Vbe(V) VA(V)

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 163 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

Pnphva25_poly_ckt 25 11.5 14.3 20 20 0.8 20

AL
TI
EN
ID
NF
CO

6) Mismatch

beta vbe
IC

area 1/sqrt(area)
data model data model
25e-12 0.2 7.01E-03 7.00E-03 1.15E-04 1.95E-04
SM

pnphva_poly
1.00E-10 0.1 7.11E-03 7.10E-03 5.23E-05 1.87E-04

7.2.3.10. HV vertical NPN (npnhva100_poly_ckt )

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 164 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

1) Device description

HV vertical NPN (10x10)


Device description
N+_PWH_HVBN)
Model name npnhva100_poly_ckt

AL
Terminal count 4
Terminal definition c b e psub
LDD NA

TI
2) Symbol
EN
ID

3) Layout
NF
CO
IC
SM

4) Cross Section

Diode D1 D2 D3 D4 D5
BV 16V 40V 11V 54V 40V
Space PWH to NWH=0um PWH to NWH=2um

5) WAT
Device HFE BVeco(V) BVebo(V) BVceo(V) BVcbo(V) Vbe(V) VA(V)

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 165 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

npnhva100_poly_ckt 2.91 10.4 10 18 18 0.76 50

AL
TI
EN
ID
NF
CO
IC
SM

6) Mismatch

beta vbe
area 1/sqrt(area)
data model data model
25e-12 0.2 7.18E-03 7.18E-03 2.91E-04 2.98E-04
npnhva_poly
1.00E-10 0.1 3.62E-03 3.61E-03 8.23E-05 9.45E-05

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 166 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
7) Spice data Vs Si data
EN
ID
NF
CO
IC
SM

7.2.3.11. HV vertical NPN (npnhva25_poly_ckt )

1) Device description

Device description HV NPN (5x5) (N+_PWH_HVBN)


Model name npnhva25_poly_ckt
Terminal count 4
Terminal definition c b e psub
LDD NA

2) Symbol

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 167 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
3) Layout

TI
EN
ID
NF

4) Cross Section
CO
IC

Diode D1 D2 D3 D4 D5
SM

BV 16V 40V 11V 54V 40V


Space PWH to NWH=0um PWH to NWH=2um

5) WAT
Device HFE BVeco(V) BVebo(V) BVceo(V) BVcbo(V) Vbe(V) VA(V)
npnhva25_poly_ckt 3 10.2 10.1 18.2 18.1 0.83 50

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 168 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
6) Mismatch

area 1/sqrt(area)
beta
data
EN
model
vbe
data model
ID
25e-12 0.2 7.18E-03 7.18E-03 2.91E-04 2.98E-04
npnhva_poly
1.00E-10 0.1 3.62E-03 3.61E-03 8.23E-05 9.45E-05
NF
CO
IC
SM

7) Spice data Vs Si data

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 169 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
7.2.3.12. EN
HVBN ISO lateral PNP (pnphvbniso100_poly_ckt )

1) Device description
ID
Device description HVBN ISO PNP (10*10) (P+_NDRF_PWH)
Model name pnphvbniso100_poly_ckt
NF

Terminal count 5
Terminal definition c b e hvbn psub
LDD NA
CO

2) Symbol
IC
SM

3) Layout

4) Cross Section

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 170 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
Diode D1 D2 D3 D4 D5 D6 D7

TI
BV 40V 20V 40V 15V 40V 54V 40V
PWH to
Space PWH to NWH=1um PWH to NWH=2um
NDRF=0.1um
EN
5) WAT
ID
Device HFE BVeco(V) BVebo(V) BVceo(V) BVcbo(V) Vbe(V) VA(V)
pnphvbniso100_poly_ckt 25.2 12 15 43 38 0.8 5
NF
CO
IC
SM

6) Mismatch

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 171 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

beta vbe
area 1/sqrt(area)
data model data model
25e-12 0.2 7.01E-03 7.00E-03 1.15E-04 1.95E-04
Pnphvbniso100_poly
1.00E-10 0.1 7.11E-03 7.10E-03 5.23E-05 1.87E-04

AL
TI
EN
ID
NF

7.2.3.13. HVBN ISO lateral PNP (pnphvbniso25_poly_ckt )

1) Device description
CO

Device description HVBN ISO PNP (5X5) (P+_NDRF_PWH)


Model name pnphvbniso25_poly_ckt
Terminal count 5
IC

Terminal definition c b e hvbn psub


LDD NA
SM

2) Symbol

3) Layout

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 172 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
4) Cross Section
EN
ID
NF

Diode D1 D2 D3 D4 D5 D6 D7
CO

BV 40V 20V 40V 15V 40V 54V 40V


PWH to
Space PWH to NWH=1um PWH to NWH=2um
NDRF=0.1um
IC

5) WAT
Device HFE BVeco(V) BVebo(V) BVceo(V) BVcbo(V) Vbe(V) VA(V)
SM

Pnphvbniso25_poly_ckt 25 13 14 41 39 0.8 5

6) Mismatch

beta vbe
area 1/sqrt(area)
data model data model
25e-12 0.2 7.01E-03 7.00E-03 1.15E-04 1.95E-04
Pnphvbniso100_poly
1.00E-10 0.1 7.11E-03 7.10E-03 5.23E-05 1.87E-04

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 173 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
7.2.3.14. EN
High Beta vertical NPN (npnhbeta100_poly_ckt)

1) Device description
ID
Device description High Beta NPN (10X10) (N+_PDRF_HVBN)
Model name npnhbeta100_poly_ckt
NF

Terminal count 4
Terminal definition c b e psub
LDD NA
CO

2) Symbol
IC
SM

3) Layout

4) Cross Section

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 174 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
Diode D1 D2 D3 D4
BV 47V 40V 21V 54V
Space PDRF to NWH=1um

5) WAT
PWH to NWH=2um EN
ID
Device HFE BVeco(V) BVebo(V) BVceo(V) BVcbo(V) Vbe(V) VA(V)
npnhbeta100_poly_ckt 30 13 15 20 21 0.71 42
NF
CO
IC
SM

6) Mismatch
Silicon Model Ratio
Beta_mis 0.00552 0.0055 -0.37%
Vbe_mis 9.00E-05 9.022E-05 0.24%

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 175 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

7.2.3.15. High Beta NPN (npnhbeta100_sab100_ckt)

1) Device description

Device description High Beta NPN

AL
Model name npnhbeta100_sab100_ckt
Terminal count 4
Terminal definition c b e psub

TI
LDD NA

2) Symbol EN
ID
NF

3) Layout
CO
IC
SM

4) Cross Section

Diode D1 D2 D3 D4 D5
BV ~47V 40V 11.5V 28V 54V
Space PC to NWH=1um PWH to NWH=2um

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 176 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

5) WAT
Device HFE BVeco(V) BVebo(V) BVceo(V) BVcbo(V) Vbe(V) VA(V)
npnhbeta100_sab100_ckt 82 11 11.5 28 28 0.77 9
(Q5T0, HL5180.A07)

AL
TI
EN
ID
NF
CO
IC

6) Mismatch
beta vbe diff
SM

Device area 1/sqrt(area)


data model data model beta vbe
1 0.5 1.40E-02 1.41E-02 1.13E-04 1.12E-04 -0.19% 5.64E-04
npnhbeta100_sab 1 0.2 1.02E-02 1.02E-02 6.49E-05 6.53E-05 0.33% -3.77E-04
1 0.1 4.11E-03 4.10E-03 4.82E-05 4.88E-05 0.32% -6.01E-04

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 177 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

7) Spice data Vs Si data

AL
TI
EN
ID
NF

7.2.3.16. High Beta NPN (npnhbeta100_sab25_ckt)


CO

1) Device description

Device description High Beta NPN


Model name npnhbeta100_sab25_ckt
IC

Terminal count 4
Terminal definition c b e psub
SM

LDD NA

2) Symbol

3) Layout

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 178 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
4) Cross Section
EN
ID
NF

Diode D1 D2 D3 D4 D5
CO

BV ~47V 40V 11.5V 28V 54V


Space PC to NWH=1um PWH to NWH=2um

5) WAT
IC

Device HFE BVeco(V) BVebo(V) BVceo(V) BVcbo(V) Vbe(V) VA(V)


npnhbeta100_sab25_ckt 92 11 11.5 27.6 27.6 0.77 9
SM

(Q5T0, HL5180.A07)

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
6) Mismatch
EN
beta vbe diff
Device area 1/sqrt(area)
ID
data model data model beta vbe
1 0.5 1.40E-02 1.41E-02 1.13E-04 1.12E-04 -0.19% 5.64E-04
NF

npnhbeta100_sab 1 0.2 1.02E-02 1.02E-02 6.49E-05 6.53E-05 0.33% -3.77E-04


1 0.1 4.11E-03 4.10E-03 4.82E-05 4.88E-05 0.32% -6.01E-04
CO
IC
SM

7) Spice data Vs Si data

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Platform Device
Introduction and Character
Design Manual

AL
TI
7.2.3.17. High Beta NPN (npnhbeta100_sab4_ckt)
EN
ID
1) Device description

Device description High Beta NPN


NF

Model name npnhbeta100_sab4_ckt


Terminal count 4
Terminal definition c b e psub
CO

LDD NA

2) Symbol
IC
SM

3) Layout

4) Cross Section

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

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Platform Device
Introduction and Character
Design Manual

AL
Diode D1 D2 D3 D4 D5

TI
BV ~47V 40V 11.5V 28V 54V
Space PC to NWH=1um PWH to NWH=2um

5) WAT
EN
Device HFE BVeco(V) BVebo(V) BVceo(V) BVcbo(V) Vbe(V) VA(V)
ID
npnhbeta100_sab4_ckt 117.4 11 11.5 31 29.5 0.77 9
(Q5T0, HL5180.A07)
NF
CO
IC
SM

6) Mismatch
Device area 1/sqrt(area) beta vbe diff

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

data model data model beta vbe


1 0.5 1.40E-02 1.41E-02 1.13E-04 1.12E-04 -0.19% 5.64E-04
npnhbeta100_sab 1 0.2 1.02E-02 1.02E-02 6.49E-05 6.53E-05 0.33% -3.77E-04
1 0.1 4.11E-03 4.10E-03 4.82E-05 4.88E-05 0.32% -6.01E-04

AL
TI
EN
ID
NF

7) Spice data Vs Si data


CO
IC
SM

7.2.4. Diode characterization data summary

7.2.4.1. 1.8V N+/Pwell diode (ndio18)

1) Device description
Device description 1.8V N+/P-well diode
Model name ndio18

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

Terminal count 2
Terminal definition pw nd
LDD NLL

2) Symbol

AL
TI
3) Layout
EN
ID
NF
CO
IC

4) Cross section
SM

Diode BV
D1 ~11V

5) Spice data Vs Si data:

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Platform Device
Introduction and Character
Design Manual

Parameters Unit TT FF SS
djs_ndio18 A/m^2 0 1.06E-07 -1.06E-07
djsw_ndio18 --- 0 5.00E-16 -5.00E-16
dn_ndio18 A/m 0 -1.02E-02 1.02E-02

AL
dcj_ndio18 F/ m^2 0 -4.84E-05 4.84E-05
dcjsw_ndio18 F/m 0 -3.98E-12 3.98E-12

TI
6) ESD characterization
ESD performance(Forward) 2KV HBM
1.8V diode Perimeter

D1 1.8V N+/PW diode 100


EN
Von (V)
0.7
It2(A)
1.905
Spec
Pass
D2 1.8V N+/PW diode 200 0.7 2.822 Pass
ID
NF
CO
IC
SM

7) CV/IV curve
ndio18 area=1.80E-08 m2, pj=0.00072 m CV/IV curve

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
EN
ID
NF
CO
IC
SM

7.2.4.2. 1.8V P+/N-well diode (pdio18)

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Platform Device
Introduction and Character
Design Manual

1) Device description
Device description 1.8V P+/N-well diode
Model name pdio18
Terminal count 2
Terminal definition pd nw

AL
LDD PLL

2) Symbol

TI
EN
ID

3) Layout
NF
CO
IC
SM

4) Cross section

Diode BV
D1 ~11V
7.2.4.3. 1.8V P+/N-well diode (pdio18)

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Platform Device
Introduction and Character
Design Manual

1) Device description
Device description 1.8V P+/N-well diode
Model name pdio18
Terminal count 2
Terminal definition pd nw

AL
LDD PLL

2) Symbol

TI
EN
ID

3) Layout
NF
CO
IC
SM

4) Cross section

Diode BV
D1 ~11V

7.2.4.4. 1.8V P+/N-well diode (pdio18)

1) Device description

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Platform Device
Introduction and Character
Design Manual

Device description 1.8V P+/N-well diode


Model name pdio18
Terminal count 2
Terminal definition pd nw
LDD PLL

AL
2) Symbol

TI
EN
ID
3) Layout
NF
CO
IC

4) Cross section
SM

Diode BV
D1 ~11V

5) Spice data Vs Si data


Parameters Unit TT FF SS
djs_pdio18 A/m^2 0 4.98E-08 -4.98E-08

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Introduction and Character
Design Manual

djsw_pdio18 --- 0 5.00E-16 -5.00E-16


dn_pdio18 A/m 0 -1.01E-02 1.01E-02
dcj_pdio18 F/ m^2 0 -5.35E-05 5.35E-05
dcjsw_pdio18 F/m 0 -4.95E-12 4.95E-12

AL
6) ESD characterization
ESD performance(Forward) 2KV

TI
1.8V diode Perimeter HBM
Von (V) It2(A) Spec
D11 1.8V P+/NW diode 100 0.7 3.008 Pass
D12
D13
1.8V P+/NW diode
1.8V P+/NW diode
200
400
EN 0.7
0.7
3.303
4.286
Pass
Pass
D14 1.8V P+/NW diode 800 0.7 5.64 Pass
ID
NF
CO
IC
SM

7) CV/IV curve
pdio18 area=1.80E-08 m2, pj=0.00072 m CV/IV curve

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
EN
ID
NF
CO
IC
SM

7.2.4.5. 1.8V N-well/Psub diode (nwdio18)

1) Device description

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Platform Device
Introduction and Character
Design Manual

Device description 1.8V N-well to Psub


Model name nwdio18
Terminal count 2
Terminal definition pw nw
LDD NA

AL
2) Symbol

TI
EN
ID
3) Layout
NF
CO
IC

4) Cross section
SM

Diode BV
D1 15V

5) Spice data Vs Si data


Parameters Unit TT FF SS
djs_nwdio A/m^2 0 4.26E-07 -4.26E-07

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Introduction and Character
Design Manual

djsw_nwdio --- 0 5.00E-16 -5.00E-16


dn_nwdio A/m 0 -1.01E-02 1.01E-02
dcj_nwdio F/ m^2 0 -7.25E-06 7.25E-06
dcjsw_nwdio F/m 0 -2.50E-11 2.50E-11

AL
6) CV curve

TI
EN
ID
NF
CO
IC
SM

7.2.4.6. 5V N+/Pwell diode (ndio50)

1) Device description
Device description 5V N+/Pwell Diode

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Platform Device
Introduction and Character
Design Manual

Model name ndio50


Terminal count 2
Terminal definition pw, nd
LDD NLH

AL
2) Symbol

TI
EN
3) Layout
ID
NF
CO
IC

4) Cross Section
SM

Diode BV
D1 ~11.5V

5) ESD characterization
ESD performance(Forward) 2KV
5V diode Perimeter HBM
Von (V) It2(A) Spec

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Introduction and Character
Design Manual

D21 5V N+/PW diode 100 0.7 1.829 Pass


D22 5V N+/PW diode 200 0.7 2.786 Pass
D23 5V N+/PW diode 400 0.7 3.206 Pass
D24 5V N+/PW diode 800 0.7 4.468 Pass

AL
TI
EN
ID
NF

6) CV/IV curve
CO

ndio50 area=1.80E-08 m2, pj=0.00072 m CV/IV curve


IC
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
EN
ID
NF
CO
IC
SM

7.2.4.7. 5V P+/Nwell Diode (pdio50)

1) Device description
Device description 5V P+/Nwell Diode
Model name pdio50
Terminal count 2
Terminal definition pd,nw
LDD PLL

2) Symbol

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
3) Layout

TI
EN
ID
NF

4) Cross Section
CO
IC
SM

Diode BV
D1 ~10.5V

5) ESD characterization

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

ESD performance(Forward) 2KV


5V diode Perimeter HBM
Von (V) It2(A) Spec
D31 5V P+/NW diode 100 0.7 2.799 Pass
D32 5V P+/NW diode 200 0.7 3.355 Pass

AL
D33 5V P+/NW diode 400 0.7 4.266 Pass
D34 5V P+/NW diode 800 0.7 5.564 Pass

TI
EN
ID
NF
CO

6) CV/IV Curve
pdio50 area=1.80E-08 m2, pj=0.00072 m CV/IV curve
IC
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Platform Device
Introduction and Character
Design Manual

AL
TI
EN
ID
NF
CO

7.2.4.8. 5V Nwell/Psub Diode (nwdio50)


IC

1) Device description
SM

Device description 5V Nwell/Psub Diode


Model name nwdio50
Terminal count 2
Terminal definition pw, nw
LDD NA

2) Symbol

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

3) Layout

AL
TI
EN
4) Cross Section
ID
NF
CO
IC

Diode BV Space
D1 16V PWH to NWH=0
SM

7.2.4.9. 5V Pwell/HVBN Diode (pwhvbndio50)

1) Device description
Device description 5V Pwell/HVBN Diode
Model name pwhvbndio50
Terminal count 2
Terminal definition pw, hvbn
LDD NA

2) Symbol

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
3) Layout

TI
EN
ID

4) Cross Section
NF
CO
IC
SM

Diode D1 D2 D3 D4
BV 16V 16V 40V 54V
Space PWH to NWH=0 PWH to NWH=0

7.2.4.10. HV Pwell/HVBN Diode (pwhvbndiohv)

1) Device description
Device description HV Pwell/HVBN Diode
Model name pwhvbndio50
Terminal count 2
Terminal definition pw, hvbn
LDD NA

2) Symbol

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
3) Layout

TI
EN
ID
NF

4) Cross Section
CO
IC
SM

Diode D1 D2 D3 D4
BV 40V 54V 40V 54V
Space PWH to NWH=5um PWH to NWH=5um

7.2.4.11. 5V HVBN/Psub Diode (hvbnpsubdio50)

1) Device description
Device description 5V HVBN/Psub Diode
Model name hvbnpsubdio50
Terminal count 2
Terminal definition pw, hvbn
LDD NA

2) Symbol

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
3) Layout

TI
EN
ID
NF

4) Cross Section
CO
IC
SM

Diode BV Space
D1 16V PWH to NWH=0
D2 54V

7.2.4.12. HVBN/Psub Diode (hvbnpsubdio)

1) Device description
Device description HVBN/Psub Diode
Model name hvbnpsubdio
Terminal count 2
Terminal definition pw, hvbn
LDD NA

2) Symbol

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
3) Layout

TI
EN
ID

4) Cross Section
NF
CO
IC
SM

Diode BV Space
D1 54V PWH to NWH=5um
D2 54V

7.2.4.13. Zener Diode (5.5V)

1) Description
Device description N+/Pbody Zener Diode
Model name zddio
Terminal count 4
Terminal definition p n hvbn psub
LDD NLH

2) Symbol

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 204 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
3) Layout

EN
ID
NF

4) Cross Section
CO
IC
SM

Diode D1 D2 D3 D4 D5
BV 40V 40V 5.5V 40V 54V
Space PWH to NWH=2um PWH to NWH=2um

1) When positive P+(Anode) and NBL(NWH) short (suggest)


2) When negative(clamp) N+(Cathode) and NBL (NWH) short(suggest)

5) Reverse BV Curve

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
7.2.4.14. Schottky Diode (30V)
EN
ID
1) Description
Device description 30v Schottky Diode
NF

Model name sdmte30_hvbn_ckt


Terminal count 3
Terminal definition anode cathode psub
LDD NA
CO

2) Symbol
IC
SM

3) Layout

4) Cross Section

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 206 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
Diode D1 D2 D3

TI
BV 40V 40V 54V
Space PWH to NWH=2um PWH to NDRF=0um

5) Device curve
EN
ID
Junction area [email protected]
BV(v) [email protected](A)
100um2 (A)
-40C 41.0 6.65E-13 3.5E-04
NF

25C 44.2 3.20E-10 4.1E-04


175C 49.0 1.90E-06 1.7E-03
CO
IC
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
EN
ID
NF

7.2.5. ESD PNP characterization data summary


CO

ESD design window ESD 2KV HBM ESD 4KV HBM ESD 8KV HBM
Device
IC

Area Area Area


Vop+1.5V BV-1.5V Vtri (V) It2(A) It2(A) It2(A)
(um2) (um2) (um2)
9V 10.5 18 14.2 2.3 59*110 3.5 77*110 6.5 124*110
SM

12V 13.5 19 15.0 2.4 81*110 3.5 101*110 6.5 149*110


16V 17.5 26 20.5 2.4 58*110 3.5 77*110 6.7 132*110
20V 21.5 34 25.0 2.5 53*110 3.5 79*110 6.6 151*110
24V 25.5 36 29.0 2.6 66*110 3.6 105*110 6.6 223*110
30V 31.5 40 36.2 2.5 145*110 3.6 195*110 6.6 344*110
35V 36.5 52 42.0 2.4 90*110 3.6 124*110 6.5 209*110
40V 41.5 55 48.0 2.4 162*110 3.6 271*110 6.5 533*110

1. SMIC provides ESD device for 0.18BCD V3E high voltage 6V~40V application for 2KV/4KV/8KV
HBM target.
2. ESD design window is defined based on normal operation and device breakdown voltage, customer
need consult SMIC if chip operates at overdrive or any special operation condition.
nd nd
3. ESD parameter: trigger voltage (Vt1); holding voltage (Vh); 2 breakdown voltage (Vt2); 2
breakdown current (It2).

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 208 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

4. It2 level and HBM ESD correlation: HBM voltage (KV)~It2 (A)*1.5Kohm.

ESD protection window : (Operating Voltage+⧍, Breakdown Voltage -⧍) ⧍: 1.5V

AL
TI
EN
ID
NF

7.2.5.1. 9V ESD Protection


CO

1) 9V ESD Device cross section


(-) (+)
IC

PGR b c e c b PGR
SP SN SP SP SP SN SP
SM

PBODY PBODY

WP WN WP

P-sub

(-) (+)

PGR b c e c b PGR
SP SN SP SP SP SN SP

PBODY PBODY

WP WN WP

P-sub

2) 9V ESD Device IV CV curve

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 209 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
EN
ID
3) 9V ESD Device parameter
NF

25C25C/125C 125C
9V ID Capcitor
Vtri(V) Finger Y(um) BV(v) Ioff(pA) BV(v) Ioff(nA)
PNP @18V (1.1VOP)pF
CO

9V02 14.2 9 100 1.7 14.8 14.4 15.9 3.0 1.47


9V05 14.2 12 100 2.2 14.2 7.65 15.8 3.3 1.76
9V08 14.2 24 100 4.5 14.1 12.9 15.6 5.0 2.95
IC

4) 9V ESD Device TLP result


SM

Estimated size (*KV ESD_HBM: 1500Ω *IT2)

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 210 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

9V PNP Vtri(V) Total W (um) Finger Cell size (um2) Wf (um) IT2(A) @ 18V
2KV 14.2 2160 12 59*110 90 2.3
4KV 14.2 3240 18 77*110 90 3.5
8KV 14.2 5940 33 124*110 90 6.5

AL
Notice:
1. 2K, 4KV, 8KV size is calculated base on test data

TI
2. Process: SMIC 0.18BCD V3E platform
3. 9V ESD protection: using PNP for HV 9V ESD protection
4. Cell size include Psub ring
EN
7.2.5.2. 12V ESD Protection
ID
1) 12V ESD Device cross section
NF

(-) (+)
CO

PGR b c e c b PGR
SP SN SP SP SP SN SP

PBODY PBODY
WP WN WN WN WP
IC

HVBN

P-sub
SM

(-) (+)

PGR b c e c b PGR
SP SN SP SP SP SN SP

PBODY PBODY
WP WN WN WN WP
HVBN

P-sub

2) 12V ESD Device IV CV curve

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 211 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
EN
3) 12V ESD Device parameter
ID
NF

25C 125C 25C/125C


Capcitor
12V Finge Y(um ID @ Ioff(pA
Vtri(V) BV(v) BV(v) Ioff(nA) (1.1VOP)p
PNP r ) 19V )
CO

F
Z3_DC1 15 24 100 4.6 14.1 18.8 15.4 16.9 3.4
Z3_AC1 15 48 100 10 14.1 34.7 15.3 29.6 5.8
Z3_BC1 15 96 100 20 14.1 66.5 15.2 55.8 10.7
IC

4) 12V ESD Device TLP result


SM

Estimated size (*KV ESD_HBM: 1500Ω *It2)

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 212 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

12V PNP Vtri(V) Total W(um) Finger Cell size (um2) Wf (um) It2(A) @19V
2KV 15 2700 15 81*110 90 2.4
4KV 15 3600 20 101*110 90 3.5
8KV 15 5760 32 149*110 90 6.5

AL
Notice:
1. 2K, 4KV, 8KV size is calculated base on test data
2. Process: SMIC 0.18BCD V3E platform

TI
3. 12V ESD protection: using PNP for HV 12V ESD protection
4. Cell size include Psub ring

EN
ID
7.2.5.3. 16V ESD Protection
NF

1) 16V ESD Device cross section

(-) (+)
CO

PGR b c SAB e SAB c b PGR


SP SN SP SP SP SN SP
PDRF

PDRF
IC

WP WN WP WN WP WN WP
HVBN
SM

P-sub

(-) (+)

PGR b c SAB e SAB c b PGR


SP SN SP SP SP SN SP
PDRF

PDRF

WP WN WP WN WP WN WP
HVBN

P-sub

2) 16V ESD IV CV curve

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 213 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
EN
3) 16V ESD Device parameter
ID
25C 125C 25C/125C
NF

ID
Capcitor
16V PNP Vtri(V) Finger Y(um) @ BV(v) Ioff(pA) BV(v) Ioff(nA)
(1.1VOP)pF
26V
CO

12NA16b 20.5 16 100 4.44 20.1 13.6 20.8 5.64 3.08


12NA17b 20.5 20 100 5.41 20.1 16.4 20.7 6.63 3.67
12NA18b 20.5 24 100 6.77 20.1 18.4 20.8 7.32 4.22
IC

4) 16V ESD Device TLP result


SM

Estimated size (*KV ESD_HBM: 1500Ω *IT2)

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 214 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

16V PNP Vtri(V) Total W(um) Finger Cell size (um2) Wf (um) It2(A) @26V
2KV 20.5 1440 8 58*110 90 2.4
4KV 20.5 2160 12 77*110 90 3.5
8KV 20.5 4320 24 132*110 90 6.7

AL
Notice:
1. 2K, 4KV, 8KV size is calculated base on test data
2. Process: SMIC 0.18BCD V3E platform

TI
3. 16V ESD protection: using PNP for HV 16V ESD protection
4. Cell size include Psub ring

7.2.5.4. 20V ESD Protection


EN
ID
1) 20V ESD Device cross section
NF

(-) (+)
CO

PGR b c SAB e SAB c b PGR


SP SN SP SP SP SN SP
PDRF

PDRF

WP WN WP WN WP WN WP
IC

HVBN

P-sub
SM

(-) (+)

PGR b c SAB e SAB c b PGR


SP SN SP SP SP SN SP
PDRF

PDRF

WP WN WP WN WP WN WP
HVBN

P-sub

2) 20V ESD IV CV curve

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
EN
3) 20V ESD Device parameter
ID

25C 125C
25C/125C
NF

20V ID @ Capcitor
Vtri(V) Finger Wf(um) BV(v) Ioff(pA) BV(v) Ioff(nA)
PNP 19V (1.1VOP)pF
12NA26a 25 16 90 4.2 25.1 25.5 26.0 6.5 2.92
CO

12NA27a 25 20 90 5.31 25.1 32.1 26.1 7.7 3.43


12NA28a 25 24 90 6.37 25.1 40.0 26.2 9.2 3.98
IC

4) 20V ESD Device TLP result


SM

Estimated size (*KV ESD_HBM: 1500Ω *IT2)


20V PNP Vtri(V) Total W(um) Finger Cell size (um2) Wf(um) It2(A)@34V
2KV 25 1080 6 53*110 90 2.5

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 216 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

4KV 25 1980 11 79*110 90 3.5


8KV 25 4500 25 151*110 90 6.6
Notice:
1. 2K, 4KV, 8KV size is calculated base on test data

AL
2. Process: SMIC 0.18BCD V3E platform
3. 20V ESD protection: using PNP for HV 20V ESD protection
Cell size include Psub ring

TI
7.2.5.5. 24V ESD Protection

1) 24V ESD Device cross section EN


ID
(-) (+)
NF

PGR b c SAB e SAB c b PGR


SP SN SP SP SP SN SP
PDRF

PDRF

CO

WP WN WP WN WP WN WP
HVBN

P-sub
IC

(-) (+)
SM

PGR b c SAB e SAB c b PGR


SP SN SP SP SP SN SP
PDRF

PDRF

WP WN WP WN WP WN WP
HVBN

P-sub

2) 24V ESD Device IV CV curve

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 217 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
EN
3) 24V ESD Device parameter
ID

25C 125C 25C/125C


NF

ID
24V Capcitor
Vtri(V) Finger Y(um) @ BV(v) Ioff(pA) BV(v) Ioff(nA)
PNP (1.1VOP)pF
36V
CO

NA31a 29 16 100 3.66 29.0 10.8 30.4 8.4 2.82


NA32a 29 20 100 4.26 28.9 13.0 30.4 9.9 3.33
NA33a 29 24 100 4.65 28.9 15.5 30.3 11.2 3.85
IC

4) 24V ESD Device TLP result


SM

Estimated size (*KV ESD_HBM: 1500Ω *IT2)

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 218 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

24V PNP Vtri(V) Total W(um) Finger Cell size(um2) Wf (um) It2(A)@36V
2KV 29 1440 8 66*110 90 2.6
4KV 29 2700 15 105*110 90 3.6
8KV 29 6480 36 223*110 90 6.6

AL
Notice:
1. 2K, 4KV, 8KV size is calculated base on test data
2. Process: SMIC 0.18BCD V3E platform

TI
3. 24V ESD protection: using PNP for HV 24V ESD protection
Cell size include Psub ring

7.2.5.6. 30V ESD Protection


EN
ID
1) 30V ESD Device cross section
NF

(-) (+)
CO

PGR b c SAB e SAB c b PGR


SP SN SP SP SP SN SP
PDRF

PDRF

WP WN WP WN WP WN WP
IC

HVBN

P-sub
SM

(-) (+)

PGR b c SAB e SAB c b PGR


SP SN SP SP SP SN SP
PDRF

PDRF

WP WN WP WN WP WN WP
HVBN

P-sub

2) 30V ESD Device IV CV curve

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 219 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
EN
3) 30V ESD Device parameter
ID
Tested data: (TLP 10ns rise time/100ns pulse width)
NF

25C 25C/125C 125C


30V ID @ Capcitor
Vtr(V) Finger Y(um) BV(v) Ioff(pA) BV(v) Ioff(nA)
CO

PNP 40V (1.1VOP)pF


NA66 35.7 16 100 1.95 34.7 540.0 37.0 40.1 2.75
NA67 35.7 20 100 2.15 34.5 540.0 37.3 45.4 3.27
NA68 35.7 24 100 2.63 34.7 765.0 37.0 48.1 3.78
IC
SM

4) 30V ESD Device TLP result

Estimated size (*KV ESD_HBM: 1500Ω *IT2)

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 220 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

30V PNP Vtri(V) Total W(um) Finger Cell size(um2) Wf (um) It2(A)@40V
2KV 35.7 3600 20 145*110 90 2.5
4KV 35.7 5040 28 195*110 90 3.6
8KV 35.7 9360 52 344*110 90 6.6

AL
Notice:
1. 2K, 4KV, 8KV size is calculated base on test data
2. Process: SMIC 0.18BCD V3E platform

TI
3. 30V ESD protection: using PNP for HV 30V ESD protection
Cell size include Psub ring

7.2.5.7. 35V ESD Protection


EN
ID
1) 35V ESD Device cross section
(-) (+)
NF

PGR b c e c b PGR
CO

SP SN SP SP SP SN SP

WP WN WP WN WP WN WP

P-sub
IC

(-) (+)
2) 35V ESD Device IV CV curve
SM

PGR b c e c b PGR
SP SN SP SP SP SN SP

WP WN WP WN WP WN WP

P-sub

3) 35V ESD Device parameter

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 221 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

25C 125C 25C/125C


ID
35V Capcitor
Vtr(V) Finger Y(um) @ BV(v) Ioff(pA) BV(v) Ioff(nA)
PNP (1.1VOP)pF
52V

AL
35B01 42 25 130 6.51 41.6 37.6 45.5 18.2 3.47
35B02 42 30 130 7.6 41.5 45.1 45.3 20.5 4.02
35B03 42 35 130 9.4 41.5 51.5 45.4 22.8 4.57

TI
4) 35V ESD Device TLP result
EN
ID
NF
CO
IC

Estimated size (*KV ESD_HBM: 1500Ω *IT2)


35V PNP Vtri(V) Total W(um) Finger Cell size(um2) Wf (um) It2(A)@52V
SM

2KV 42 2160 12 90*110 90 2.4


4KV 42 3240 18 124*110 90 3.6
8KV 42 5940 33 209*110 90 6.5
Notice:
1. 2K, 4KV, 8KV size is calculated base on test data
2. Process: SMIC 0.18BCD V3E platform
3. 40V ESD protection: using PNP for HV 40V ESD protection
Cell size include Psub ring

7.2.5.8. 40V ESD Protection

1) 40V ESD Device cross section

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Introduction and Character
Design Manual

(-) (+)

PGR b c e c b PGR

AL
SP SN SP SP SP SN SP

WP WN WP WN WP WN WP

TI
P-sub

(-) (+)

PGR
2) 40V ESD Device IV CV curve

b c e c b PGR
EN
SP SN SP SP SP SN SP
ID
WP WN WP WN WP WN WP
NF

P-sub
CO
IC

3) 40V ESD Device parameter


SM

25C 125C 25C/125C


ID
40V Capcitor
Vtri(V) Finger Y(um) @ BV(v) Ioff(pA) BV(v) Ioff(nA)
PNP (1.1VOP)pF
55V
40A01 48 17 100 1.75 50.2 36.3 54.2 17.1 3.45
40A02 48 18 100 2.04 50.2 41.4 54.1 19.0 3.98
40A03 48 19 100 2.26 50.1 41.6 54.0 20.0 4.53

4) 40V ESD Device TLP result

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Introduction and Character
Design Manual

AL
TI
Estimated size (*KV ESD_HBM: 1500Ω *IT2)
EN
40V PNP Vtri(V) Total W(um) Finger Cell size(um2) Wf (um) It2(A)@52V
ID
2KV 48 3960 22 162*110 90 2.4
4KV 48 7020 39 271*110 90 3.6
NF

8KV 48 14400 80 533*110 90 6.5


Notice:
1. 2K, 4KV, 8KV size is calculated base on test data
CO

2. Process: SMIC 0.18BCD V3E platform


3. 40V ESD protection: using PNP for HV 40V ESD protection
4. Cell size include Psub ring
5. Suggest 40V PNP 8KV with two block stack: 210*110*2
IC

6. 40V ESD_PNP High Current Array Size Advice

• For large current STI_PNP ESD, the multi-finger structure can remarkbly improve the capacity of
SM

discharging comparing to the long single-finger structure.


• The Vtri will degrade when the W of single finger is too large.

Cellname FingerW FingerNo Total W ArrY Remark VOP HVBN


The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

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Introduction and Character
Design Manual

40A07 120 90 10800 1 new BSL LDBK40 None


40A08 120 45 10800 2 new BSL LDBK40 None
40A09 120 30 10800 3 new BSL LDBK40 None
40A10 240 45 10800 1 new BSL LDBK40 None

AL
TI
EN
ID
NF
CO

7.2.6. ESD MOS characterization data summary


IC

7.2.6.1. 1.8V N GGMOS (n1d8_esd_ckt)


SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

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Design Manual

Total SABOVG
Wf(um) Length(um) Finger SCP(um) DCP(um) SAB GT_Pin Vt1 Vh leak@Vop It2
Width(W) (um)
240 30 0.18 8 0.75 2.22 Y 0.06 Ground 5.806 4.086 1.16E-09 >2.421
360 30 0.18 12 0.75 2.22 Y 0.06 Ground 5.788 3.865 1.75E-09 >3.36
480 30 0.18 16 0.75 2.22 Y 0.06 Ground 5.768 3.898 2.29E-09 >4.375

AL
600 30 0.18 20 0.75 2.22 Y 0.06 Ground 5.738 3.888 2.95E-09 >5.398

TI
EN
ID
NF

Total ESD It2(A) 2KV HBM


CO

Wf Length SCP DCP SABOVG


Device Width Finger SAB Spec
(um) (um) (um) (um) (um) Forward
(um) Reverse (It2:1.33A)
Diode
1.8V GGMOS 360 30 0.18 12 0.75 2.22 Y 0.06 >3.36 >3.42 Pass
1.8V GDPMOS 360 30 0.18 12 0.75 2.22 Y 0.06 2.203 >3.30 Pass
IC
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Introduction and Character
Design Manual

DCP It2 Vh
0.65 2.29 3.87
0.82 2.91 3.72
1.22 3.03 3.74

AL
1.82 3.27 3.84
2.22 3.33 3.84

TI
7.2.6.2. 1.8V P GDMOS (p1d8_esd_ckt)

EN
ID
NF
CO
IC

Total Length SCP DCP SABOVG


Wf(um) Finger SAB GT_Pin Vt1 Vh leak@Vop It2
Width(W) (um) (um) (um) (um)
SM

240 30 0.18 8 0.75 2.22 Y 0.06 Ground 6.223 5.553 1.68E-09 1.398
360 30 0.18 12 0.75 2.22 Y 0.06 Ground 6.395 5.448 2.75E-09 2.203
480 30 0.18 16 0.75 2.22 Y 0.06 Ground 6.326 5.39 3.08E-09 2.819
600 30 0.18 20 0.75 2.22 Y 0.06 Ground 6.276 5.369 4.20E-09 3.517

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
EN
ID
Total ESD It2(A) 2KV HBM
Wf Length SCP DCP SABOVG
Device Width Finger SAB Spec
(um) (um) (um) (um) (um) Forward
(um) Reverse (It2:1.33A)
NF

Diode
1.8V GGMOS 360 30 0.18 12 0.75 2.22 Y 0.06 >3.36 >3.42 Pass
1.8V GDPMOS 360 30 0.18 12 0.75 2.22 Y 0.06 2.203 >3.30 Pass
CO

7.2.6.3. 1.8V ESD N+/Pwell Diode (ndio1d8_esd)


IC
SM

2KV HBM
ESD performance(Forward)
1.8V diode Perimeter Spec
Von (V) It2(A)
D1 1.8V N+/PW diode 100 0.7 1.905 Pass
D2 1.8V N+/PW diode 200 0.7 2.822 Pass

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Introduction and Character
Design Manual

7.2.6.4. 1.8V ESD P+/Nwell Diode (pdio1d8_esd)

AL
TI
EN
ID
ESD performance
2KV HBM Spec
1.8V diode Perimeter (Forward)
Von (V) It2(A)
NF

D11 1.8V P+/NW diode 100 0.7 3.008 Pass


D12 1.8V P+/NW diode 200 0.7 3.303 Pass
D13 1.8V P+/NW diode 400 0.7 4.286 Pass
CO

D14 1.8V P+/NW diode 800 0.7 5.64 Pass

7.2.6.5. 5V N GGMOS (n5_esd_ckt)


IC
SM

Total Wf Length Finger SCP DCP SAB SABOVG GT_Pin Vt1 Vh leak@Vop It2

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Design Manual

Width(W) (um) (um) (um) (um) (um)


240 30 0.5 8 0.75 2.22 Y 0.06 Ground 10.713 6.557 5.00E-11 2.24
360 30 0.5 12 0.75 2.22 Y 0.06 Ground 10.679 6.522 5.00E-11 3.002
480 30 0.5 16 0.75 2.22 Y 0.06 Ground 10.684 6.616 5.00E-11 3.774

AL
600 30 0.5 20 0.75 2.22 Y 0.06 Ground 10.684 6.286 5.00E-11 4.822

TI
EN
ID
NF
CO

2KV HBM
Total ESD It2(A) Spec
Wf Length SCP DCP SABOVG
Device Width Finger SAB (It2:1.33A)
(um) (um) (um) (um) (um)
(um) Forward
Reverse
Diode
IC

GGMOS 360 30 0.5 12 0.75 2.22 Y 0.06 3.002 >3.45 Pass


5V
GDPMOS 360 30 0.45 12 0.75 2.22 Y 0.06 1.211 >3.40 Pass
SM

DCP It2 Vh

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Introduction and Character
Design Manual

0.82 6.31 1.93


1.22 6.43 2.58
1.82 6.42 2.78
2.22 8.82 2.97

AL
7.2.6.6. 5V N GRMOS
MOS No. Split Name W total L R Vtri(V) Vhold(V) It2(A)

TI
M29 GR NMOS 5VNMOS_string_R50K 480 0.6 50K 7.75 5.80 3.78
M45 GR NMOS 5VNMOS_string_R100K 480 0.6 100K 7.60 6.00 3.80
M61
M77
GR NMOS
GR NMOS
5VNMOS_string_R200K
5VNMOS_string_R400K
480
480
EN 0.6 200K
0.6 400K
7.00
6.60
5.80
5.80
3.78
3.90
ID
The external resistance combined with GRMOS refer to the table above. When choosing HRP resistance,
satisfy the resistance width exceed the gate length.
NF

7.2.6.7. 5V P GDMOS (p5_esd_ckt)


CO
IC
SM

Total Length SCP DCP SABOVG


Wf(um) Finger SAB GT_Pin Vt1 Vh leak@Vop It2
Width(W) (um) (um) (um) (um)
240 30 0.45 8 0.75 2.22 Y 0.06 Ground 9.96 9.18 5.00E-11 0.9
360 30 0.45 12 0.75 2.22 Y 0.06 Ground 9.9 9.17 5.00E-11 1.211
480 30 0.45 16 0.75 2.22 Y 0.06 Ground 10.24 9.04 5.00E-11 1.723
600 30 0.45 20 0.75 2.22 Y 0.06 Ground 9.91 9.38 5.00E-11 2.229

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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20V/24V/30V/35V /40V 0_REV0
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Introduction and Character
Design Manual

AL
TI
EN
ID
Total ESD It2(A) 2KV HBM
Wf Length SCP DCP SABOVG
Device Width Finger SAB Forward Spec
(um) (um) (um) (um) (um) Reverse
(um) Diode (It2:1.33A)
GGMOS 360 30 0.5 12 0.75 2.22 Y 0.06 3.002 >3.45 Pass
NF

5V
GDPMOS 360 30 0.45 12 0.75 2.22 Y 0.06 1.211 >3.40 Pass

7.2.6.8. 5V ESD N+/Pwell Diode (ndio5_esd)


CO
IC
SM

ESD performance(Forward) 2KV HBM Spec


5V diode Perimeter
Von (V) It2(A)
D21 5V N+/PW diode 100 0.7 1.829 Pass
D22 5V N+/PW diode 200 0.7 2.786 Pass
D23 5V N+/PW diode 400 0.7 3.206 Pass
D24 5V N+/PW diode 800 0.7 4.468 Pass

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Introduction and Character
Design Manual

7.2.6.9. 5V ESD P+/Nwell Diode (pdio5_esd)

AL
TI
EN
ESD performance(Forward) 2KV HBM Spec
ID
5V diode Perimeter
Von (V) It2(A)
D31 5V P+/NW diode 100 0.7 2.799 Pass
NF

D32 5V P+/NW diode 200 0.7 3.355 Pass


D33 5V P+/NW diode 400 0.7 4.266 Pass
D34 5V P+/NW diode 800 0.7 5.564 Pass
CO

7.2.6.10. 6V P GDMOS (p6_esd_ckt)


IC

Process: SMIC 0.18BCD V3E platform


6V ESD protection: using GDPMOS for 6V ESD protection.
TLP Characterization:
SM

(+) (-)

G G
PGR B S D S B PGR

SP SN SP SP SP SN SP

WP WP
WN

PSUB

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Introduction and Character
Design Manual

Cell name HBM Target Vt1(V) Vh(V) Vt2(V) It2(A) DC BV (V)


GDPMOS6_ESD_W480 2KV 9.91 9.38 11.3 (at 1.33A) 1.65 10.2

AL
Cell name(Estimated) HBM Target Vt1(V) Vh(V) Vt2(V) It2(A) DC BV (V)
GDPMOS6_ESD_W600 2KV 9.91 9.38 11.3 (at 1.33A) 2.1 10.2
GDPMOS6_ESD_W1200 4KV 9.91 9.38 11.3 (at 2.67A) 3.8 10.2

TI
GDPMOS6_ESD_W1800 8KV 9.91 9.38 11.3 (at 5.33A) 6 10.2

EN
The estimated It2 showed in the table refers to the second breakdown current within ESD design
window (Vt1&Vt2<device BV, Vh>Vop+1.5V).
ID
7.2.7. Capacitor characterization data summary
NF

7.2.7.1. MIM location options


CO

For 1 Top metal(TM1 or TM2 or MTT2)

MIM
MIM Location 1P3M 1P4M 1P5M 1P6M
IC

Option
between M2 and top metal X
between M3 and top metal X
SM

1st option
between M4 and top metal X
between M5 and top metal X
between M2 and M3 X
2nd option between M3 and M4 X
between M4 and M5 X
3rd option between M3 and M4 X

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Introduction and Character
Design Manual

For 2 Top metal (TM1+(TM2 or MTT2))

MIM Option MIM Location 1P4M 1P5M 1P6M


between M2 and first top metal X
between M3 and first top metal X

AL
1st option
between M4 and first top metal X
between M5 and first top metal
between M2 and M3

TI
2nd option between M3 and M4 X
between M4 and M5
EN
1) 1st MIM
ID
NF
CO
IC
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Introduction and Character
Design Manual

AL
TI
EN
ID
NF
CO

1st MIM Via table

Metal Option Under Via Bottom Metal Above Via


IC

1P3M V1 M2 TV1
1P4M V2 M3 TV1
SM

One TM
1P5M V3 M4 TV1
1P6M V4 M5 TV1
1P4M V1 M2 V2
Two TMs 1P5M V2 M3 V3
1P6M V3 M4 V4

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Introduction and Character
Design Manual

2) 2nd MIM

AL
TI
EN
ID
NF

2nd MIM Via table


CO

Metal Option Under Via Bottom Metal Above Via


1P4M V1 M2 V2
One TM 1P5M V2 M3 V3
IC

1P6M V3 M4 V4
Two TMs 1P6M V2 M3 V3
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Introduction and Character
Design Manual

3) 3rd MIM

AL
TI
EN
ID
NF
CO

3rd MIM Via table

Metal Option Under Via Bottom Metal Above Via


IC

Two TMs 1P6M V2 M3 V3


SM

7.2.7.2. 1.0fF MIM

1) Device description
Device description 1.0fF MIM
Model name mim_ckt
Terminal count 2
Terminal definition n2 n1
BV 36V

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Platform Device
Introduction and Character
Design Manual

2) Device symbol

AL
TI
3) Layout

EN
ID
NF

4) Mismatch
CO
IC
SM

MIM(Cspec=1 fF/um2) capacitor mismatch vs 1/Area at T=25 Y=0.0074* (MiM area um2)

7.2.7.3. 2fF MIM

1) Device description
Device description 2fF MIM
Model name mim2_ckt
Terminal count 2
Terminal definition n2 n1
BV 33V

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Introduction and Character
Design Manual

2) Device symbol

AL
3) Layout

TI
EN
ID
NF

4) Mismatch
CO
IC
SM

MIM(2fF/mm2) Capacitor Mismatch vs 1/sqrt(Wdrawn*Ldrawn*M) at T=25C

7.2.7.4. MOM

1) Device description
Device description MOM
Model name mom_ckt
Terminal count 2
Terminal definition n1 n2
BV >60V

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
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Introduction and Character
Design Manual

2) Device symbol

AL
TI
3) Layout
EN
ID
NF
CO

4) Mismatch
IC
SM

MOM Capacitor Mismatch vs 1/sqrt(cap*1e12) at T=25C

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

7.2.7.5. Top metal MOM

1) Device description
Device description Top metal MOM

AL
Model name mom_tm_ckt
Terminal count 2
Terminal definition n1 n2

TI
BV >60V

2) Device symbol
EN
ID
NF

3) Layout
CO
IC
SM

7.2.7.6. 1.8V NMOS Varactor

1) Device Description

Device description 1.8V NMOS Varactor


Model name pvar18_ckt
Terminal count 2
Terminal definition n1 n2
BV 5.2V
LDD NLL

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

2) Device symbol

AL
TI
3) Layout EN
ID
NF
CO

4) Cross section
IC
SM

Diode D1
BV 15V
Space PW to NW=0um

5) CV curve
FF/SS corner range is about -/+5%

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
7.2.7.7. 5V NMOS Varactor
EN
ID
1) Device Description
NF

Device description 5V NMOS Varactor


Model name pvar50_ckt
Terminal count 2
CO

Terminal definition n1 n2
BV 15V
LDD NLH
IC
SM

2) Device symbol

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

3) Layout

AL
TI
4) Cross section

EN
ID
NF

Diode D1
BV 15V
CO

Space PW to NW=0um

5) CV curve
IC

FF/SS corner range is about -/+5%


SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

7.2.7.8. 5V NMOS Varactor in HVBN

1) Device Description
Device description 5V N Well with HVBN Varactor

AL
Model name pvar50hvbniso_ckt
Terminal count 2
Terminal definition n1 n2

TI
BV 15V
LDD NLH

2) Device symbol EN
ID
NF
CO

3) Layout
IC
SM

4) Cross section

Diode D1 D2
BV 16V 54V
Space PWH to NWH=0um

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

7.2.8. Resistor characterization data summary

Type Sheet Resistance(Ω/􀂆) TC1(1/℃) TC2(1/℃2)


1K HRP 985 -8.37e-4 1.72e-6
3K HRP 3245 -1.8e-3 4.06e-6

AL
P+ poly sab 344.2 -2.94E-04 5.92E-07
P+ poly 9.5 2.89E-03 7.21E-07

TI
N+ poly sab 700 -1.40E-03 -4.47E-08
N+ poly 9.5 2.93E-03 1.17E-06
P+ diff sab
P+ diff
142.3
7.2
EN
1.14E-03 -7.89E-07
ID
N+ diff sab 95.02 1.39E-03 -1.52E-06
N+ diff 8
NW_AA 432 2.77E-03 1.12E-05
NF

NW_STI 895.2 2.54E-03 2.22E-05


5V NW_AA 270 3.63E-03 2.17E-05
CO

5V_NW_STI 313.1 3.73E-03 9.99E-06


M1 Resistor 0.1319 3.37E-03 -3.42E-06
M2 Resistor 0.08577 3.43E-03 -2.63E-06
IC

M3 Resistor 0.08101 3.39E-03 -1.05E-06


M4 Resistor 0.08076 3.36E-03 -2.20E-06
SM

M5 Resistor 0.08076 3.36E-03 -2.20E-06


TM 8k Resistor 0.0338 3.6e-03 -5.15e-07
TM 9k Resistor 0.0297 3.6e-03 -5.15e-07
TM 33k Resistor 0.01 3.6e-03 -5.15e-07
TM 38k Resistor 0.0083 3.6e-03 -5.15e-07

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

7.2.8.1. 1K ohm/sq P- Poly HRI w/o silicide

1) Device description
Device description 1K ohm/sq P- Poly HRI w/o

AL
silicide
Model name rhrp_ckt, rhrp_3t_ckt,
rhrphv_3t_ckt

TI
2) Key Parameters
Type Sheet Resistance(Ω/􀂆) TC1(1/℃) TC2(1/℃2)
1K HRP 985 -8.37e-4 1.72e-6 EN
3) Symbol
ID
NF
CO

4) Layout/Cross section
rhrp_3t_ckt: the voltage between poly and psub exceed 60V in case of STI width = 0.63um, the STI
IC

surface suffer the leakage risk.


rhrphv_3t_ckt: the voltage between poly and psub exceed 60V in case of STI width = 2um, no risk.
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 248 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
5) Device curve
EN
Length/Resistance versus width for sheet resistance and delta width’s extraction (25C)
Extracted sheet resistance versus width for recommend width’s selection (25C)
Simulated (lines) and measured (symbols) resistance which normalized to Rsh(V=0) versus voltage
ID
Sheet resistance which normalized to Rsh (T=25C) for various widths (Tc1=-8.37E-04, Tc2=1.72E-06)
NF
CO
IC
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

6) Mismatch

AL
TI
EN
ID
7.2.8.2. 3K ohm/sq P- Poly HRI w/o silicide
NF

1) Device description
Device description 3K ohm/sq P- Poly HRI w/o silicide
CO

Model name rhrp_3k_ckt, rhrp_3k_3t_ckt, rhrphv_3k_3t_ckt

2) Key Parameters
IC

Type Sheet Resistance(Ω/􀂆) TC1(1/℃) TC2(1/℃2)


3K HRP 3245 -1.8e-3 4.06e-6
SM

3) Symbol

4) Layout/Cross section
rhrp_3k_3t_ckt: the voltage between poly and psub exceed 60V in case of STI width = 0.63um, the STI
surface suffer the leakage risk.
rhrphv_3k_3t_ckt: the voltage between poly and psub exceed 60V in case of STI width = 2um, no risk.

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
EN
ID
NF

5) Device curve
Length/Resistance versus width for sheet resistance and delta width’s extraction (25C)
CO

Extracted sheet resistance versus width for recommend width’s selection (25C)
Simulated (lines) and measured (symbols) resistance which normalized to Rsh(V=0) versus voltage
Sheet resistance which normalized to Rsh (T=25C) for various widths (Tc1=-1.8E-03, Tc2=4.06E-06)
IC
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
6) Mismatch
EN
ID
NF
CO

7.2.8.3. P+ Poly w/o silicide


IC

1) Device description
SM

Device description P+ Poly w/o silicide


Model name rpposab_ckt, rpposab_3t_ckt, rpposabhv_3t_ckt

2) Key Parameters
Type Sheet Resistance(Ω/􀂆) TC1(1/℃) TC2(1/℃2)
rpposab 344.2 -2.94E-04 5.92E-07

3) Symbol

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

4) Layout/Cross section
rpposab_3t_ckt: the voltage between poly and psub exceed 60V in case of STI width = 0.44/0.25um, the
STI surface suffer the leakage risk.
rpposabhv _3t_ckt: the voltage between poly and psub exceed 60V in case of STI width = 2um, no risk.

AL
TI
EN
ID
NF
CO

5) Device curve
IC
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
EN
ID
6) Mismatch
NF
CO
IC
SM

7.2.8.4. P+ Poly w/i silicide

1) Device description
Device description P+ Poly w/i silicide
Model name rppo_ckt, rppo_3t_ckt, rppohv_3t_ckt

2) Key Parameters
Type Sheet Resistance(Ω/􀂆) TC1(1/℃) TC2(1/℃2)
rppo (W≥2um) 9.5 2.89E-03 7.21E-07

3) Symbol

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
4) Layout/Cross section
rppo_3t_ckt: the voltage between poly and psub exceed 60V in case of STI width = 0.17um, the STI

TI
surface suffer the leakage risk.
rppohv_3t_ckt: the voltage between poly and psub exceed 60V in case of STI width = 2um, no risk.
EN
ID
NF
CO
IC
SM

5) Device curve

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
EN
ID
6) Mismatch
NF
CO
IC
SM

7.2.8.5. N+ Poly w/o silicide

1) Device description
Device description N+ Poly w/o silicide
Model name rnposab_ckt, rnposab_3t_ckt, rnposabhv_3t_ckt

2) Key Parameters
Type Sheet Resistance(Ω/􀂆) TC1(1/℃) TC2(1/℃2)
rnposab 700 -1.40E-03 -4.47E-08

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

3) Symbol

AL
TI
4) Layout/Cross section
rpposab_3t_ckt: the voltage between poly and psub exceed 60V in case of STI width = 0.44/0.25um, the
STI surface suffer the leakage risk. EN
rpposabhv_3t_ckt: the voltage between poly and psub exceed 60V in case of STI width = 2um, no risk.
ID
NF
CO
IC
SM

5) Device curve

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
EN
ID
NF
CO
IC

6) Mismatch
SM

7.2.8.6. N+ Poly w/i silicid

1) Device description

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

Device description N+ Poly w/i silicide


Model name rnpo_ckt, rnpo_3t_ckt, rnpohv_3t_ckt

2) Key Parameters

AL
Type Sheet Resistance(Ω/􀂆) TC1(1/℃) TC2(1/℃2)
rnpo 9.5 2.93E-03 1.17E-06

TI
3) Symbol

EN
ID

4) Layout/Cross section
NF

rpposab_3t_ckt: the voltage between poly and psub exceed 60V in case of STI width = 0.25um, the STI
surface suffer the leakage risk.
rpposabhv_3t_ckt: the voltage between poly and psub exceed 60V in case of STI width = 2um, no risk.
CO
IC
SM

5) Mismatch

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
EN
ID
7.2.8.7. P+ DIFF w/o silicide

1) Device description
NF

Device description 3T P+ DIFF w/o silicide


Model name rpdifsab_3t_ckt
CO

Terminal count 3
Terminal definition In out sx

2) Key Parameters
IC

Type Sheet Resistance(Ω/􀂆) TC1(1/℃) TC2(1/℃2)


rpdifsab_3t_ckt 142.3 1.14E-03 -7.89E-07
SM

3) Symbol

4) Layout/Cross section

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
EN
ID
NF
CO
IC
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

5) Device curve

AL
TI
EN
ID
NF
CO
IC
SM

6) Mismatch

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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Platform Device
Introduction and Character
Design Manual

7.2.8.8. P+ DIFF w/i silicide

1) Device description
Device description 3T P+ DIFF w/i silicide

AL
Model name rpdif_3t_ckt
Terminal count 3
Terminal definition in out sx

TI
2) Key Parameters
Type Sheet Resistance(Ω/􀂆) TC1(1/℃) TC2(1/℃2)
rpdif_3t_ckt 7.2
EN
ID
3) Symbol
NF
CO

4) Layout/Cross section
IC
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

5) Mismatch

AL
TI
EN
ID
7.2.8.9. N+ DIFF w/o silicide
NF

1) Device description
Device description 3T N+ DIFF w/o silicide
Model name rndifsab_3t_ckt
CO

Terminal count 3
Terminal definition in out sx

2) Key Parameters
IC

Type Sheet Resistance(Ω/􀂆) TC1(1/℃) TC2(1/℃2)


rndifsab_3t_ckt 95.02 1.39E-03 -1.52E-06
SM

3) Symbol

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

4) Layout/Cross section

AL
TI
5) Device curve
EN
ID
NF
CO
IC
SM

6) Mismatch

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 265 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
EN
7.2.8.10. N+ DIFF w/i silicide
ID

1) Device description
NF

Device description 3T N+ DIFF w/i silicide


Model name rndif_3t_ckt
Terminal count 3
CO

Terminal definition In out sx

2) Key Parameters
Type Sheet Resistance(Ω/􀂆) TC1(1/℃) TC2(1/℃2)
IC

rndif_3t_ckt 8
SM

3) Symbol

4) Layout/Cross section

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 266 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
5) Mismatch

EN
ID
NF
CO
IC

7.2.8.11. NW diff(under AA)


SM

1) Device description
Device description 3T_NW diff under AA
Model name rnwaa_3t_ckt
Terminal count 3
Terminal definition in out sx

2) Key Parameters
Type Sheet Resistance(Ω/􀂆) TC1(1/℃) TC2(1/℃2)
rnwaa_3t_ckt 432 2.77E-03 1.12E-05

3) Symbol

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
4) Layout/Cross section
EN
ID
NF
CO
IC
SM

7.2.8.12. NW diff(under STI)

1) Device description
Device description 3T_NW diff under STI
Model name rnwsti_3t_ckt
Terminal count 3
Terminal definition in out sx

2) Key Parameters

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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Platform Device
Introduction and Character
Design Manual

Type Sheet Resistance(Ω/􀂆) TC1(1/℃) TC2(1/℃2)


rnwsti_3t_ckt 895.2 2.54E-03 2.22E-05

3) Symbol

AL
TI
EN
4) Layout/Cross section
ID
NF
CO
IC
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 269 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

7.2.8.13. 5V NW diff(under AA)

1) Device description
Device description 3T_5V NW diff under AA

AL
Model name rnwaa50_3t_ckt
Terminal count 3
Terminal definition in out sx

TI
2) Key Parameters
Type Sheet Resistance(Ω/􀂆) TC1(1/℃) TC2(1/℃2)
rnwaa50_3t_ckt 270 3.63E-03 2.17E-05
EN
3) Symbol
ID
NF
CO

4) Layout/Cross section
IC
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 270 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

5) Device curve

AL
TI
EN
ID
NF
CO
IC
SM

7.2.8.14. 5V NW diff(under STI)

1) Device description
Device description 3T_5V NW diff under STI
Model name rnwsti50_3t_ckt
Terminal count 3
Terminal definition in out sx

2) Key Parameters
Type Sheet Resistance(Ω/􀂆) TC1(1/℃) TC2(1/℃2)
rnwsti50_3t_ckt 313.1 3.73E-03 9.99E-06

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 271 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

3) Symbol

AL
TI
4) Layout/Cross section

EN
ID
NF

5) Device curve
CO
IC
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 272 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
EN
7.2.8.15. M1 Resistor (rm1)
ID

1) Device description
NF

Device description M1 Resistor


Model name rm1
Terminal count 2
CO

Terminal definition in out

2) Key Parameters
Type Sheet Resistance(Ω/􀂆) TC1(1/℃) TC2(1/℃2)
IC

M1 Resistor 0.1319 3.37E-03 -3.42E-06


SM

3) Symbol

4) Layout

7.2.8.16. M2 Resistor (rm2)

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 273 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

1) Device description
Device description M2 Resistor
Model name rm2
Terminal count 2
Terminal definition in out

AL
2) Key Parameters

TI
Type Sheet Resistance(Ω/􀂆) TC1(1/℃) TC2(1/℃2)
M2 Resistor 0.08577 3.43E-03 -2.63E-06

3) Symbol EN
ID
NF

4) Layout
CO
IC
SM

7.2.8.17. M3 Resistor (rm3)

1) Device description
Device description M3 Resistor
Model name rm3
Terminal count 2
Terminal definition in out

2) Key Parameters
Type Sheet Resistance(Ω/􀂆) TC1(1/℃) TC2(1/℃2)
M3 Resistor 0.08101 3.39E-03 -1.05E-06

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 274 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

3) Symbol

AL
TI
4) Layout
EN
ID
NF
CO

7.2.8.18. M4 Resistor (rm4)

1) Device description
IC

Device description M4 Resistor


Model name rm4
SM

Terminal count 2
Terminal definition in out

2) Key Parameters
Type Sheet Resistance(Ω/􀂆) TC1(1/℃) TC2(1/℃2)
M4 Resistor 0.08076 3.36E-03 -2.20E-06

3) Symbol

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
4) Layout

TI
EN
ID
7.2.8.19. M5 Resistor (rm5)
NF

1) Device description
Device description M5 Resistor
CO

Model name rm5


Terminal count 2
Terminal definition in out
IC

2) Key Parameters
SM

Type Sheet Resistance(Ω/􀂆) TC1(1/℃) TC2(1/℃2)


M5 Resistor 0.08076 3.36E-03 -2.20E-06

3) Symbol

4) Layout

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
EN
ID
7.2.8.20. TM_8K (rtm_8k)
NF

1) Device description
Device description TM_8K
Model name rtm_8k
CO

Terminal count 2
Terminal definition in out
IC

2) Key Parameters
Type Sheet Resistance(Ω/􀂆) TC1(1/℃) TC2(1/℃2)
SM

rtm_8k 0.0338 3.6e-03 -5.15e-07

3) Symbol

4) Layout

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
EN
ID
NF

7.2.8.21. TM_9K (rtm_9k)


CO

1) Device description
Device description TM_9K
Model name rtm_9k
IC

Terminal count 2
Terminal definition in out
SM

2) Key Parameters
Type Sheet Resistance(Ω/􀂆) TC1(1/℃) TC2(1/℃2)
rtm_9k 0.0297 3.6e-03 -5.15e-07

3) Symbol

4) Layout
The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 278 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
EN
ID
NF

5) Device curve
Length/Resistance versus width for sheet resistance and delta width’s extraction (25C)
CO
IC
SM

Sheet resistance which normalized to Rsh (T=25C) for various widths

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 279 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

AL
TI
EN
ID
NF
CO
IC
SM

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
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20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

7.2.8.22. TM_33K (rtm_33k)

1) Device description
Device description TM_33K

AL
Model name rtm_33k
Terminal count 2
Terminal definition in out

TI
2) Key Parameters
Type
rtm_33k
Sheet Resistance(Ω/􀂆) TC1(1/℃) TC2(1/℃2)
0.01 3.6e-03 -5.15e-07
EN
ID
3) Symbol
NF
CO
IC

4) Layout
SM

7.2.8.23. TM_40K (rtm_33k)

1) Device description
Device description TM_40K
Model name rtm_40k
Terminal count 2
Terminal definition in out

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02
Semiconductor Manufacturing International Corporation

Doc. No.: Doc. Title: 0.18um V3E BCD Doc.Rev: Tech Dev Page No.:
TD-BC18-DM-2004 1.8V/5V/6V/9V/12V/16V/ 0 Rev:V1.2 281 / 281
20V/24V/30V/35V /40V 0_REV0
Platform Device
Introduction and Character
Design Manual

2) Key Parameters
Type Sheet Resistance(Ω/􀂆) TC1(1/℃) TC2(1/℃2)
rtm_40k 0.0083 3.6e-03 -5.15e-07

AL
3) Symbol

TI
EN
4) Layout
ID
NF
CO

7.2.9. MVN to MVP BV


IC
SM

8. Attachment: NA

The information contained herein is the exclusive property of SMIC, and shall not be distributed, reproduced, or disclosed in
whole or in part without prior written permission of SMIC.

According to: SMIC Document Control Procedure; Attachment No.: QR-QUSM-02-2001-023; Rev.:2 2017-11-02

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