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Tutorial 3&4 - ATPG PDF

The document contains a tutorial on automatic test pattern generation (ATPG) for combinational and sequential circuits. It provides 4 questions that involve using the D-Algorithm and Boolean Difference methods to generate test vectors for detecting stuck-at faults in different circuit diagrams. The questions focus on applying ATPG techniques to find test patterns that target specific faults like stuck-at-0 on particular lines or nets of the given circuits.

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Harshil Suthar
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86 views1 page

Tutorial 3&4 - ATPG PDF

The document contains a tutorial on automatic test pattern generation (ATPG) for combinational and sequential circuits. It provides 4 questions that involve using the D-Algorithm and Boolean Difference methods to generate test vectors for detecting stuck-at faults in different circuit diagrams. The questions focus on applying ATPG techniques to find test patterns that target specific faults like stuck-at-0 on particular lines or nets of the given circuits.

Uploaded by

Harshil Suthar
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as PDF, TXT or read online on Scribd
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Manipal University Jaipur

Department of Electronics and Communication Engineering


EC3242: VLSI Testing and Testability (Session 2021-2022)

Tutorial#3 & 4
Topic- Automatic Test pattern generation for combinational and sequential circuit
Dated: 8 March 2022

Question 1: Determine the test vector generated by ATPG to detect a stuck-at-0 (S-a-0) fault at the net ‘d’ in
the given circuit in Fig. 1 using Boolean Difference and D-Algorithm.

Fig. 1

Question 2: Find the test pattern required to detect s-a-0 fault on line 5 using D-Algorithm and Boolean
Difference

Fig. 2

Question 3: Perform ATPG for the line d s-a-0 on the circuit shown in Fig. 3 using D-Algorithm and Boolean
Difference

Fig. 3

Question 4: Perform ATPG for the s-a-f on the circuit shown in Fig. 3 using Boolean Difference.

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