Pune Vidyarthi Griha’s College of Engineering & Technology

2020-21
and G. K. Pate(Wani) Institute of Management,Pune-09

DIFFRACTION
Content: Diffraction of waves & Types of diffraction,
Fraunhoffer diffraction at a single slit (geometrical method), conditions for
maxima and minima,
Intensity pattern due to a single slit,
Plane diffraction grating ( Qualitative only),
Conditions for principal maxima and minima,
Intensity pattern
Resolving power of Grating and Telescope
Q1. What is diffraction? What are the conditions to get diffraction pattern?
Diffraction of waves: The phenomena of bending of light around the corner of an
obstacle and their spreading into the reason of geometrical shadow (of an object )
is called diffraction.
The resultant intensity distribution in terms of dark and bright fringes is known as
diffraction pattern.

Fig-1

Condition to get diffraction pattern

• Diffraction pattern (i.e. Bright and dark fringe) is distinctly visible if the slit is very
small (i.e, the dimension of the slit is comparable with the wavelength of the
incident light (λ)
• For the large size slits we can see the area of geometrical shadow in place of
fringe.
 Pune Vidyarthi Griha’s College of Engineering & Technology
2020-21
and G. K. Pate(Wani) Institute of Management,Pune-09

Q2. What are the types of diffraction? Write the difference between them.

Diffraction

Fresnel’s Diffraction Fraunhoffer’s Diffraction

There are two types of Diffraction

i) Fresnel’s Diffraction: The distance of source & screen are effectively at
finite distance from the slit or opaque object
ii) Fraunhofer Diffraction: The distance of source & screen are at infinite
distance from the slit or opaque object

Difference between Fresnel’s and Fraunhoffer Diffraction

Fresnel’s Diffraction Fraunhofer Diffraction

1) Source and screen are at infinite 1) Source and screen are at finite
distance from diffracting element distance from diffracting element
2) Biconvex lens required 2) Lens not required
3) Incident wave front is plane 3) Incident wave front is Spherical or
cylindrical
4) Diffracted wave front is plane 4) Diffracted wave front is Spherical
or cylindrical
5) Initial phase of all the wavelets are 5) Initial phase of all the wavelets are
same at all the points in the plane different at all the points in the
of aperture plane of aperture
6) In this diffraction the angular 6) In this diffraction the lateral
inclination is important distance is important
7) It is used in designing the optical 7) It is less useful in designing the
instrument optical instrument
8) Mathematical treatment is easy 8) Mathematical treatment is not
easy.
 Pune Vidyarthi Griha’s College of Engineering & Technology
2020-21
and G. K. Pate(Wani) Institute of Management,Pune-09

9) Fig 9) Fig

P
S

Fresnel diffraction

Q3. Obtain the equation of amplitude and intensity for Fraunhoffer diffraction due
to single slit and derive the condition of maxima and minima.
OR
 Pune Vidyarthi Griha’s College of Engineering & Technology
2020-21
and G. K. Pate(Wani) Institute of Management,Pune-09

Obtain the condition of maxim and minima in Fraunhoffer diffraction due to single
slit.

A θ
θ
S O
M
B

L1 L2

Slit D

Fraunhofer diffraction

S= source of monochromatic light of wavelength λ

Width of the slit AB= a,
L1= Collimating lens, Source is placed at the focus of the lens
L2= lens used to focus the diffracted light to the screen
XY= Screen
Path difference between the extreme rays from point A & B of the slit is
∆=BM=AB Sinθ=a Sinθ
O Phase difference Between the extreme rays from point A & B of the slit is
Φ = 2π(aSinθ)/λ

Arc AB =Em =Maximum amplitude of vibration

Cord AB=Eθ=Resultant amplitude of vibration at a point P

AB=BC=R

R α = Ф/2
α =φ/2 In ΔABN Sinα =AN/ AB= AN/R
R = AN /Sinα = Em /2 Sinα------------
B ----1

A
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2020-21
and G. K. Pate(Wani) Institute of Management,Pune-09

Arc AB
Φ = 2α =Arc AB/ R = Eθ /R
⸫ R = Eθ / 2α ----------------------------2
Equating equation 1 & 2 we get

Eθ = Em Sinα/α ----------------3

This equation gives the resultant amplitude at a point P

------------- 4
Iθ = Im (Sinα/α)2

Case-1: Condition of Principal maxima

Eθ=Em Sinα/α
𝐸𝑚 𝛼3 𝛼5 𝛼7
𝐸𝜃 = [𝛼 − + − ]
𝛼 3! 5! 7!
𝛼2 𝛼4 𝛼6
𝐸𝜃 = 𝐸𝑚 [1 − + − ]
3! 5! 7!
Hence for Eθ=Em
α =0 & also θ =0
Eθ=Em At θ= 0, Principal maxima is formed
Case2: Condition of Minima
Intensity =0, i.e. Eθ=0
Sinα = 0 =
Sin (± m π) = 0
α=±mπ
where m= 1,2,3,4,…………. and is not equal to zero
π/λ a Sinθ= ± m π
a Sinθ= ± m λ
At θ= 0, Principal maxima is form
α =+mπ & -mπ where m= 1,2,3,4,………….

Case3: Condition of secondary maxima

 Pune Vidyarthi Griha’s College of Engineering & Technology
2020-21
and G. K. Pate(Wani) Institute of Management,Pune-09

Secondary maxima lies on either side of the minima

α=π/λ a Sinθ=± (m+1/2)π

Q4. Draw the Intensity distributation pattern for diffraction due to single
slit

Q5. What will be the effect of the Increases in slit width on diffraction
pattern.
Condition of minimum intensity
α=π/λ(aSinθ)=m π
a Sinθ = +m λ or -m λ
if slit is made narrow i.e. ‘a’ decreases θ increases and central maxima becomes wider
If α=λ, then θ= 90° i.e. central maxima occupies the whole space

Q6. Prove that intensity of secondary maxima decreases with the increase
in order.
 Pune Vidyarthi Griha’s College of Engineering & Technology
2020-21
and G. K. Pate(Wani) Institute of Management,Pune-09

2
  1 
 Sin m +  
:  = 
I 2 
Im   1 
  m +  
  2 
m =1
I
= 0.045
Im
m=2
I
= 0.016,
Im
m=3
I
= 0.0083
Im

Hence Intensity of secondary maxima rapidly decreasing with the increase in order

Q. What is the effect of change in the size of the slit on diffraction pattern
due to single slit?
Ans: The condition for mth order minima in single slit diffraction is
aSinθ= ± m λ----1
For first order minima The condition for first order minima is
aSinθ=± λ
If the slit is made narrow i.e. ‘a’ decreases θ increases i.e. width of central maxima increases.
When a = λ , θ = 90˚, i.e. Central maxima occupies the whole space.

Q What is plane diffraction grating?

A plane diffraction grating is an arrangement consisting of a large number of close, parallel,
straight, transparent and equidistance slits, each of equal width ‘a’ and separated with the
neighboring slits by an opaque region of width ’b’.
The spacing between adjacent slits is known as grating element (i.e.. a+b)

Q. Starting from the equation of amplitude find out the condition of

Principal maxima and minima.
Ans: λ = wavelength of monochromatic light
a = Width of the slit
b = Width of the opaque space
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2020-21
and G. K. Pate(Wani) Institute of Management,Pune-09

d = Grating Element = a+b

L2= lens used to focus the diffracted light to the screen
XY= Screen, placed at the focus of the lens L2, the secondary waves traveling at an angle θ
meet at a point ‘P’ on the screen
Eθ=Em Sinα/α Em = maximum amplitude
α=π/λ(a Sinθ)
S1, S2, S3,……….Sn are the mid point of the slits
S1Kn-1 is the perpendicular drawn from S1 on diffracted ray
The path difference between the waves from slits S1 and S2
S2K1 = (a+b) Sinθ
Corresponding phase difference ∆ Ф =2π /λ (a+b) Sinθ
The path difference between the waves from slits S1 and S3
S3K2=2(a+b) Sinθ
Corresponding phase difference =2(2π /λ (a+b) Sinθ) =2 ∆Ф
The path difference between the waves from slits S1 and SN
SNK2=N(a+b) Sinθ
Corresponding phase difference =N (2π /λ (a+b) Sinθ)=N ∆Ф

K1

K2

K3

N waves each of amplitude Em Sinα/α and the phase difference between the waves from adjacent
slits is
∆ Ф =2π /λ(a+b) Sinθ
the resultant amplitude of n waves from every slit in the diffraction grating
Eθ=Em (Sinα/α)(SinNβ/ Sinβ)
Resultant intensity
Iθ=Im (Sinα/α)2 (SinNβ/ Sin β)2
 Pune Vidyarthi Griha’s College of Engineering & Technology
2020-21
and G. K. Pate(Wani) Institute of Management,Pune-09

where Im (Sinα/α)2 is the intensity by the single slit

(SinNβ/Sin β)2 is the interference term due to ‘N’ slits
Condition of Principal maxima
Eθ =Em (SinNβ/Sin β)
For Eθ to be maximum (SinNβ/ Sinβ) to be maximum i.e Sinβ = 0 = Sin mπ
β = mπ
𝜋
i.e. 𝜆 (a+b) Sinθ = mπ

(a+b) Sinθ = mλ [ m = 0,±1, ±2, ±3, ±4………..]

SinNβ
Using L’ Hospital’s rule , lim =
𝛽→𝑚𝜋 Sin β
CosNβ
= lim 𝑁 =N
𝛽→𝑚𝜋 Cos β

Iθ =Im(Sinα/α)2 [+ -N]2
Iθ = N2 Im intensity of single slit
If the no of slits in the diffraction grating increases principal maxima becomes more bright

Condition of minima
Iθ = 0
Iθ =Im (Sinα/α)2 (SinNβ/ Sinβ)2
Eθ = 0 i.e. SinNβ = 0= Sin nπ
𝑛
(a+b) Sinθ = 𝑁 𝜆

where n=1,2,3…(N-1),(N+1),(N+2),……(2N-1), ……(2N+1),(2N+2),….

i.e. n/N can never be an integer
There are N-1 minima and N-2 secondary maxima between two Principal maxima.
 Pune Vidyarthi Griha’s College of Engineering & Technology
2020-21
and G. K. Pate(Wani) Institute of Management,Pune-09

Resolving Power
Explain Rayleigh’s criterion of resolution. Derive the expression for Resolving Power
of Diffraction Grating.
Ans: Resolving Power: The resolving power of an optical instrument is defined as its ability to show
the two closely spaced objects as separate.
Rayleigh’s criterion of Resolution: The images of two point objects close to each other are regarded
as just resolved if the Principal maxima of one diffraction pattern falls on the minima adjacent to
Principal maxima of second diffraction pattern.
For understanding:

Unresolved Just Resolved Well

Resolved
The resolving power of a plane diffraction grating is defined as its ability to show the two neighboring
spectral lines in a spectrum as separate.
It can also be defined as the ratio of wavelength of any spectral lines to the smallest wavelength
difference between neighboring lines for which the spectral lines can be just resolve at wavelength λ
mathematically.
 Pune Vidyarthi Griha’s College of Engineering & Technology
2020-21
and G. K. Pate(Wani) Institute of Management,Pune-09


R.P. =
d

Consider a diffraction grating on which light consisting of two close wavelengths  and  + d is
incident normally. Let (a+b) be grating element, and N be the total number of slits on the grating.
These two wavelengths will be just resolved if the Principal maxima of  + d falls over the first
minimum of 
The mth Principal maximum of  + d along (θm + dθm) is given by
(a + b) sin (θm + dθm) = m(  + d ) ------(1)
As per the Rayleigh’s criterion, the first minimum of  adjacent to its mth principal maximum should
be along (θm + dθm) for just resolution.
N(a + b) sin (θm + dθm) =(mN+1)  ------ (2)
Explanation: N(a + b) sin θ = n 
Where n= 1,2,3,……….N-1,N+1,…….2N-1, 2N+1,………mN-1, mN+1
Value of m for minima adjacent to 1st principal maximum is (N+1)
Value of m for minima adjacent to 2nd principal maximum is (2N+1)
Value of m for minima adjacent to mth principal maximum is (mN+1)

Multiplying equation (1) by N

N(a + b) sin (θm + dθm) = Nm(  + d ) ------(3)
Equating equations (2) and (3)
 = mN d
 = mN
R.P. =
d
 Pune Vidyarthi Griha’s College of Engineering & Technology
2020-21
and G. K. Pate(Wani) Institute of Management,Pune-09

• Resolving power of a telescope is defined as the reciprocal of the smallest angle subtended
at the objective lens of the telescope by two distant object for which the telescope
produces just resolved image
• If θ= the smallest angle subtended at the objective lens for which two objects are seen to
be resolved then
• R. P. = 1/θ

Consider two distant object subtended an angle θ at the objective of diameter D

As Rayleigh criterion, the 1st minima of the diffraction pattern due to one object must be formed
at an angle θ and coincides with the central maxima of the second object
Condition of first minima
D Sinθ = λ
θ is very small and hence Sinθ = θ
i.e. D θ = λ
R. P. = 1/ θ =D/ λ ( for rectangular aperture)
For circular aperture
D Sinθ = 1.22λ
D θ = 1.22 λ
R. P. = 1/ θ =D/1.22 λ
R.P proportional to D
Pune Vidyarthi Griha’s College of Engineering & Technology
2020-21
and G. K. Pate(Wani) Institute of Management,Pune-09