IO-Link Device Test Report TL50 IO-Link 9/28/2016

Device Test Report

Device Test System Revision : 3.0.9.20 Build: 2016-5-13

Vendor : Banner Engineering Corporation Device Name : TL50 IO-Link

Vendor ID : 0x01C3 Device ID : 0x060001

IO-Link Version : 1.1 Product ID : TL50IOLQ8

ISDU supported : True SIO mode supported : False

Process Data Input Bits : 0 Process Data Output Bits : 16

Min Cycle Time : 4000 µs Bitrate : COM2

Implemented Access Locks :

parameter="True" datastorage="True" localParameterization="False" localUserInterface="False"

IODD : Banner_Engineering-TL50-20160616-IODD1.1.xml

Checker : IODD-Checker V1.1.3 CRC : 3746789141

Firmware Revision : 1.0.11 Hardware Revision : V00-01

==============================================================================

Test result : All test were passed with positiv result in complete operation

==============================================================================

Test operated by :

Company : _______________________________

Name : _______________________________

Signature : _______________________________
(c) Copyright 2015 TMG TE GmbH Cover Sheet Page 1
IO-Link Device Test Report TL50 IO-Link 9/28/2016

Testreport : Test Configuration

Test variable for 8 Bit index access :

Index : 244 Length: 1
Data (hex) : 00

Test variable for 16 Bit index access :

Index : 257 Length: 1
Data (hex) : 01

Test variable for 8 Bit index extended length :

Index : 16368 Length: 16
Data (hex) : 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20

Implemented system commands : 1 2 3 4 5 6 130

M-sequence Capability (hex) : 01

Commands to generate events : Index : 16376

Event trigger 1 : appear value = 0 disappear value = 1
Event trigger 2 : appear value = 2 disappear value = 3

=================== Config Messages from Testcases =====================

The testcase is skipped because the device is not capable to change a parameter via local user interface

(c) Copyright 2015 TMG TE GmbH Test Configuration Page 2

IO-Link Device Test Report TL50 IO-Link 9/28/2016

Testreport Overview (1)

TC_Device_Identification ok
support of Physical Layer Tests V1.0.3.19
Data Layer Tests V1.0.3.19
SDCI_TC_0034 TCD_DLPC_STUP_CYCTIME ok
SDCI_TC_0035 TCD_DLPC_STUP_STUPOPER1 ok
SDCI_TC_0036 TCD_DLPC_STUP_STUPOPER2 ok
SDCI_TC_0037 TCD_DLPC_OPER_OPERSTUP1 ok
SDCI_TC_0038 TCD_DLPC_STAR_OPERSTAR2 ok
SDCI_TC_0039 TCD_DLPC_PREO_READDPP1 ok
SDCI_TC_0040 TCD_DLPC_PREO_WRITEDPP1 ok
SDCI_TC_0041 TCD_DLPC_PROP_SHORT_FRAME ok
SDCI_TC_0042 TCD_DLPC_PROP_WRITECOLL ok
SDCI_TC_0043 TCD_DLPC_PROP_SIMRESET ok
SDCI_TC_0044 TCD_DLPC_PROP_FRAMEFAULT ok
SDCI_TC_0045 TCD_DLPC_OPER_READ ok
SDCI_TC_0046 TCD_DLPC_OPER_WRITE ok
SDCI_TC_0048 TCD_DLPC_OPER_WRITECOLL ok
SDCI_TC_0049 TCD_DLPC_OPER_SIMRESET ok
SDCI_TC_0292 TCD_DLPC_PROP_READDPEP ok
ISDU Tests V1.0.3.19
SDCI_TC_0052 TCD_DLPC_ISDU_AVAILFSEQCAP ok
SDCI_TC_0053 TCD_DLIC_ISDU_IDLEBUSYCHECK ok
SDCI_TC_0054 TCD_DLIC_ISDU_READINDEX8 ok
SDCI_TC_0055 TCD_DLIC_ISDU_READ8EXTLENGTH ok
SDCI_TC_0056 TCD_DLIC_ISDU_WRITE8 ok
SDCI_TC_0057 TCD_DLIC_ISDU_READ8RESERVED ok
SDCI_TC_0058 TCD_DLIC_ISDU_READ8NOSUBINDEX ok
SDCI_TC_0059 TCD_DLIC_ISDU_READ16 ok
SDCI_TC_0060 TCD_DLIC_ISDU_WRITE16 ok
SDCI_TC_0061 TCD_DLIC_ISDU_READ16RESERVED ok
SDCI_TC_0062 TCD_DLIC_ISDU_READ16NOSUBINDEX ok
SDCI_TC_0063 TCD_DLIC_ISDU_WRITE8LENOVERRUN ok
SDCI_TC_0064 TCD_DLIC_ISDU_WRITE8WRONGLEN ok
SDCI_TC_0065 TCD_DLIC_ISDU_WRITE8WRONGCHECKSUM ok
SDCI_TC_0066 TCD_DLIC_ISDU_WRITE8ROINDEX ok
SDCI_TC_0067 TCD_DLIC_ISDU_ABORTREADREQ ok
SDCI_TC_0068 TCD_DLIC_ISDU_ABORTREADRESP ok
Event Tests V1.0.3.19
SDCI_TC_0069 TCD_DLIC_EVNT_OPERSINGLEEVENT ok
SDCI_TC_0070 TCD_DLIC_EVNT_PROPSINGLEEVENT ok
SDCI_TC_0071 TCD_DLIC_EVNT_OPEREVENTCLEAR ok
SDCI_TC_0072 TCD_DLIC_EVNT_OPERCOMMINTERRUPT ok

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IO-Link Device Test Report TL50 IO-Link 9/28/2016

Testreport Overview (2)

SDCI_TC_0073 TCD_DLIC_EVNT_OPERPOWERINTERRUPT ok
SDCI_TC_0074 TCD_DLIC_EVNT_OPERAPPEARDISAPPEAR ok
SDCI_TC_0075 TCD_DLIC_EVNT_OPERMULTEVENT ok
SDCI_TC_0076 TCD_DLIC_EVNT_OPERSHORTEVENT ok
Data Storage Tests V1.0.3.19
SDCI_TC_0077 TCD_APPS_DSUP_NOFLAG ok
SDCI_TC_0078 TCD_APPS_DSUP_VIADOWNLOADSTORE ok
SDCI_TC_0079 TCD_APPS_DSUP_VIADOWNLOADSTORENOWRITE ok
SDCI_TC_0080 TCD_APPS_DSUP_VIALOCALCHANGE ok
SDCI_TC_0081 TCD_APPS_DSUP_PARABREAKABORT ok
SDCI_TC_0082 TCD_APPS_DSDN_PARAMODIFICATION ok
SDCI_TC_0083 TCD_APPS_DSDN_FACTORYRESET ok
SDCI_TC_0084 TCD_APPS_DSDN_PARABREAKABORT ok
Legacy Master Tests V1.0.3.19
SDCI_TC_0085 TCD_DLIC_COMP_STARTUP ok
SDCI_TC_0086 TCD_DLIC_COMP_TYPE1INTERLEAVE ok
SDCI_TC_0087 TCD_DLIC_COMP_PDINVALIDEVENT ok
Direct Parameter Page 1 Tests V1.0.3.19
SDCI_TC_0089 TCD_DLPC_STDP_MASTERCYCLETIME ok
SDCI_TC_0090 TCD_DLPC_STDP_MINCYCLETIME ok
SDCI_TC_0091 TCD_DLPC_STDP_FSEQCAPABILITY ok
SDCI_TC_0092 TCD_DLPC_STDP_REVISIONID ok
SDCI_TC_0093 TCD_DLPC_STDP_PDIN ok
SDCI_TC_0094 TCD_DLPC_STDP_PDOUT ok
SDCI_TC_0095 TCD_DLPC_STDP_VENDORID ok
SDCI_TC_0096 TCD_DLPC_STDP_DEVICEID ok
SDCI_TC_0097 TCD_DLPC_STDP_FUNCTIONID ok
SDCI_TC_0100 TCD_DLPC_STDP_READRESPAR ok
SDCI_TC_0101 TCD_DLPC_STDP_WRITERESPAR ok
Predefined Device Parameter Tests V1.0.3.19
SDCI_TC_0104 TCD_DLIC_DEFP_SYSCMDRES ok
SDCI_TC_0107 TCD_DLIC_DEFP_DSINDEX ok
SDCI_TC_0108 TCD_DLIC_DEFP_DSRECORD ok
SDCI_TC_0109 TCD_DLIC_DEFP_ACCESSLOCKSVAL ok
SDCI_TC_0110 TCD_DLIC_DEFP_ACCESSLOCKSINVAL ok
SDCI_TC_0111 TCD_DLIC_DEFP_PROFILCHARAC ok
SDCI_TC_0112 TCD_DLIC_DEFP_PDINDESC ok
SDCI_TC_0113 TCD_DLIC_DEFP_PDOUTDESC ok
SDCI_TC_0114 TCD_DLIC_DEFP_VENDORNAM ok
SDCI_TC_0115 TCD_DLIC_DEFP_VENDORTEXT ok
SDCI_TC_0116 TCD_DLIC_DEFP_PRODUCTNAM ok
SDCI_TC_0117 TCD_DLIC_DEFP_PRODUCTID ok

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IO-Link Device Test Report TL50 IO-Link 9/28/2016

Testreport Overview (3)

SDCI_TC_0118 TCD_DLIC_DEFP_PRODUCTTEXT ok
SDCI_TC_0119 TCD_DLIC_DEFP_SERNUM ok
SDCI_TC_0120 TCD_DLIC_DEFP_HARDREV ok
SDCI_TC_0121 TCD_DLIC_DEFP_FIRMREV ok
SDCI_TC_0122 TCD_DLIC_DEFP_TAGVALID ok
SDCI_TC_0123 TCD_DLIC_DEFP_TAGINVALID ok
SDCI_TC_0124 TCD_DLIC_DEFP_ERRCOUNT ok
SDCI_TC_0128 TCD_DLIC_DEFP_DEVSTAT ok
SDCI_TC_0129 TCD_DLIC_DEFP_DETAILDEVSTAT ok
SDCI_TC_0130 TCD_DLIC_DEFP_DETAILDEVSTATINACTIVE ok
SDCI_TC_0131 TCD_DLIC_DEFP_DETAILDEVSTATACTIVE ok
SDCI_TC_0132 TCD_DLIC_DEFP_PDIN ok
SDCI_TC_0133 TCD_DLIC_DEFP_PDOUT ok
SDCI_TC_0134 TCD_DLIC_DEFP_OFFTIMEVALID ok
SDCI_TC_0135 TCD_DLIC_DEFP_OFFTIMEINVALID ok
SDCI_TC_0136 TCD_DLIC_DEFP_PROFILEPARREAD ok
SDCI_TC_0137 TCD_DLIC_DEFP_PROFILEPARWRITE ok
SDCI_TC_0140 TCD_DLIC_DEFP_WRITETOREADONLY ok
SDCI_TC_0141 TCD_DLIC_DEFP_WRITETOOSHORT ok
SDCI_TC_0142 TCD_DLIC_DEFP_WRITETOOLONG ok
Block Parameter Tests V1.0.3.19
SDCI_TC_0143 TCD_DSBP_APPL_BPDOWNLOAD ok
SDCI_TC_0144 TCD_DSBP_APPL_BPBREAKCMD ok
SDCI_TC_0145 TCD_DSBP_APPL_BPBREAKRESET ok
SDCI_TC_0146 TCD_DSBP_APPL_BPBREAKILLPARAM ok
SDCI_TC_0147 TCD_DSBP_APPL_BPBREAK2DOWNLOADS ok
SDCI_TC_0148 TCD_DSBP_APPL_BPBREAKLOCALLOCK ok
IODD based Tests V1.0.3.19
SDCI_TC_0149 TCD_IODD_PARV_IDENT ok
SDCI_TC_0150 TCD_IODD_PARV_COMPROFILE ok
SDCI_TC_0151 TCD_IODD_PARV_READVERIFY ok
SDCI_TC_0152 TCD_IODD_PARV_WRITEVERIFY ok
SDCI_TC_0155 TCD_IODD_PARV_FACTORYSETTINGS ok
SDCI_TC_0156 TCD_IODD_PARV_ACCESSLOCK ok
SDCI_TC_0157 TCD_IODD_PARV_INDEXCONSISTENT ok

(c) Copyright 2015 TMG TE GmbH Overview Page 5

IO-Link Device Test Report TL50 IO-Link 9/28/2016

Testreport Overview (4)

Test Report Statistics:

Number of test cases overall : 109

Number of test cases ok : 109
Number of test cases failed : 0
Number of test cases skipped : 0
Test Operation : complete

(c) Copyright 2015 TMG TE GmbH Overview Page 6