Scanning Probe Microscopy
Scanning probe microscopy (SPM) is a technique to examine materials with
a solid probe scanning the surfaces.
SPM examines surface features whose dimensions range from atomic spacing to a
tenth of a millimeter.
The SPM is considered the most powerful tool for surface structure examination
currently.
SPM started with the scanning tunneling microscope (STM) invented in 1982. An STM
uses a tunneling current, a phenomenon of quantum mechanics, to examine material
surfaces. The tunnelling current flows through an atomic-scale gap between a sharp
metallic tip and conducting surface atoms.
An SFM is commonly called an atomic force microscope (AFM). It uses near-field
forces between atoms of the probe tip apex and the surface to generate signals of
surface topography.
The AFM is more widely used than the STM because it is not restricted to electrically
conducting surfaces
Instrumentation
A sharp probe tip that scans a sample surface.
The tip must remain in very close proximity between the tip and a sample surface
Comparison of surface microscopy techniques.
Figure: The main components of a scanning probe microscope (SPM).
Probe and Scanner
STM-the probe is commonly made from
tungsten wire.
AFM-the probe tip is commonly made from SiO2
or Si3N4
Control and Vibration Isolation
Scanning Tunneling Microscopy
Tunneling Current
The tunneling current is a phenomenon of quantum mechanics. It results
from electrons penetrating an energy barrier larger than the electron energy.
To generate the tunneling current (It), a bias voltage is applied across a gap
between the tip and the sample when the tip is kept near the sample. Without
much knowledge of quantum mechanics, we may quantify the tunneling current
through the following equation
Vb is the bias voltage applied between the tip and the surface (1 mV and 4 V),
C is a constant that depends on the nature of the sample material, and d is the
nearest distance between the tip and the sample surface.
The tunneling current (It) is between 10 pA and 10 nA
Probe Tips and Working Environments
A probe tip is made from a wire of tungsten or Pt–Ir alloys by an electrochemical
etching method produces a sharp tip of tungsten wire.
Ideally, for atomic resolution, a smooth tip should have a radius of a single atom.
Operational Modes
Four operational modes in the STM: constant current, constant height, spectroscopic,
and manipulation modes.
The most commonly used mode is the constant current mode
The constant-height mode can provide much higher scanning rates than that of
constant current. It is useful for observing dynamic processes in which timing is
important.
The spectroscopic mode refers to the operation of recording the tunneling current
as a function of either tip–sample spacing or bias voltage. The spectroscopic mode
is useful for studying surface properties such as super conduction and molecular
adsorption on metal.
The manipulation mode refers to operations of relocating or removing atoms on a
surface.
Typical Applications
The most exciting function of an STM is its ability to image atoms.
used to produce atomic images of various
materials including metals (such as gold,
copper, platinum, and nickel) and layered
crystals (such as graphite and MoS2)
The STM can image adsorbed atoms and single
molecules on surfaces.
An STM image of a 32 nm × 36 nm area on
the Si (111) planes. Surface atoms have been
reconstructed, showing 7 × 7 symmetry.
Three atomic steps separate terraces
Oxygen adsorbed onto a GaAs surface: (a) the sample is under
negative bias voltage (−2.6 V with respect to the tip) and (b) the
sample is under positive bias voltage (+1.5 V with respect to the tip
