Analysis Guideline For The Rohs Directive Ver. 4.0
Analysis Guideline For The Rohs Directive Ver. 4.0
Analysis Guideline For The Rohs Directive Ver. 4.0
Ver. 4.0
Hitachi Group
March 2018
Contents
1 Objective................................................................................................................. 2
2 Abbreviations ......................................................................................................... 3
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Analysis guideline for the RoHS Directive Ver. 4.0
1 Objective
1.1 Main Purpose of Revision
In response to the European RoHS Directive (2002/95/EC) published in January 2003
banning the use of the electric and electronic equipment containing the specific hazardous
substances, the Environment Division (Current the CSR and Environmental Strategy
Division) of Hitachi prepared the first version of this guideline in April, 2004 to indicate to
Hitachi Group companies the analytical method that complies with the RoHS Directive. At
the stage of 2004, there was no official method to check the compliance with the RoHS
Directive. Therefore, individual business divisions and associated companies referred to
this guideline for the analytical method and interpretation and, established the control
system of their own in cooperation with their partners and customers.
Under such situation, IEC contemplated, during 2005 - 2008 in its IEC/TC111/WG3 (Test
Methods), the standardization of the analytical procedures of the specific hazardous
substances contained in the electric and electronic equipment, and produced IEC62321 in
December, 2008 by integrating the results. As the standard of the official method was
established, the analytical guideline of Hitachi group clarified the conformity of IEC62321
in terms of the measurement procedure, and the content of the guideline was expanded to
become useful as operating guidelines by incorporating the basic descriptions of analysis
methods and an introduction to typical practices of the leading divisions, which resulted in
the revision of the guideline as the second version in November 2010.
Later in June 2011, the RoHS Directive in Europe was revised into the Directive
2011/65/EU, with additional category 8 (medical equipment) and category 9 (monitoring
and control equipment), which had previously been out of the scope, now being regulated.
And with the other electrical and electronic equipment not falling under categories 1 to 10
being newly established as category 11, all electrical and electronic equipments are now, as
a rule, within the scope. In addition, preparation and storage of declaration of conformity
for CE markings and technical documents were made obligatory. For restricted substances
subject to the RoHS Directive (hereinafter referred to as "restricted substances"), Directive
(EU) 2015/863, which revises Annex II of Directive 2011/65/EU, was issued in June 2015 to
add four phthalic acid esters as restricted substances. Additions are expected to be made
regularly in the future.
On the other hand, with the revision made in May 2013, it has been decided to issue
IEC62321 as divided into abstract, sampling, screening, detailed analysis method, or as
classified by substance, along with incorporating PAS62596—a sampling guideline. The
analysis methods for restricted substances likely to be added will also be issued.
This guideline is revised in response to the publication of Part 7-2 and Part 8 of IEC62321
in March 2017, which is intended to comply with IEC62321 as well as to supplement the
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technically necessary matters. Therefore, it is expected to utilize this new guideline for
reducing the specific hazardous substances contained in the electronic equipment and to
contribute to the environmental protection and improvement as well as to the health
protection of the users by preventing the contamination due to the specific hazardous
substances.
2 Abbreviations
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3.2.1.2 Definition of numerator for measuring the mass of chemical substances
X-ray fluorescence
Atomic
nucleus
Electron in orbit
Primary X-rays
Primary filter
Collimator
Detector
X-ray
X-ray
tube
tube
CCD camera
One way to screen constituent elements efficiently is to take in an image of the measured
portion of the particular sample while conducting fluorescent X-ray analysis and
scanning, and then obtain information about the distribution of elements on the measured
surface. Figs. 4.5 to 4.7 show some of the measurements taken. Surface information
provides details about the distribution of many chemical substances. Comparing that
distribution information with the image obtained allows you to confirm the presence of
any restricted substances. And because this method identifies the part in question, it
facilitates judgment on whether the part can be excluded. Such information is made
available from energy-dispersive X-ray fluorescence (EDXRF) equipped with element
mapping.
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Fig. 4.6 Lead element mapping Fig. 4.7 Bromine element mapping
Y axis movement of
sample stage X axis movement of
sample stage
Atmosphere
Light source
Detector
Spectral section
Transmitted X-rays Transmitted X-ray
detector Sample
Sample
The atomic absorption is a phenomenon that shows the narrow absorption spectrum width
inherent to the element when the light is irradiated to the atom.
The Atomic Absorption Spectrometry (AAS) is a method to make the quantitative
determination of the element in the sample by atomizing the liquid sample with the heat
at high temperature (in most of the cases, in the flame of acetylene and air or in the
electrically heated graphite furnace) and by measuring the atomic absorption spectrum of
the light transmitted from the sample. As this analytical method indicates a high reliability
to some particular elements, it is employed as the official method for the analysis of the
inorganic materials in many fields like the measurement of the regulation value of the
hazardous metal elements contained in the industrial effluents.
Since the spectrum width of the AAS is extremely narrow, it is compulsory to select, as the
light source, the hollow cathode lamp to emit the light length having the absorption
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characteristic to the target element. Therefore, a same number of lamps as the elements to
be measured must be prepared while those lamps must show high selectivity to specific
elements. There is a composite type of hollow cathode lamp that emits the light in the
absorption wavelengths of plural elements.
Changes in the lamp over time and spectral interference between coexistent substances
other than the target elements entering the sample are avoided by background correction.
Sensitivity is higher in the furnace method (Fig. 4.11) based on a graphite furnace than in
the flame method (Fig. 4.10) based on a combustion flame.
Hitachi High-Tech Science ZA3000 Fig. 4.10 Flame method Fig. 4.11 Furnace method
Fig. 4.9 Atomic absorption spectrometer
Ar gas
Atomization section
(nebulizer)
Sample
Fig. 4.12 Principle of ICP emission spectrometer
ICP stands for "Inductively Coupled Plasma" and refers to plasma generated by a high-
frequency electromagnetic field. An overview of its mechanism is described below. When
high-frequency current is applied to the high-frequency coil around the quartz plasma torch
tube shown in Fig. 4.12, electromagnetic induction generates a high-frequency
electromagnetic field in the torch tube. This field intensifies the motion of electrons in the
torch tube, and argon gas introduced into the tube collides with the activated electrons and
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ionizes into an argon ion and an electron, thereby generating plasma. Then, the electrons
ionized from the argon similarly ionize other argon gas, thereby causing a chain that
maintains high-temperature plasma generation status in the torch tube. The ICP used as
the light source of the emission spectroscopy is the high temperature plasma source of
doughnut shape that is kept lighted stably by ionizing the argon gas which is led through
the triple-tube structured quartz glass tube wound with the coil around its outer surface.
In ICP optical emission spectrometry (ICP-OES), the liquid sample is generally fed to the
ICP by sucking it by pump or by natural suction and atomizing it with the nebulizer. The
introduced sample undergoes the thermal decomposition by absorbing the thermal energy
and becomes atomized, excited or ionized for the most part. The light emitted when the
atom and electron of ion returns from the excited state to the ground state is the emission
inherent to the element contained in the sample (Fig. 4.14), and it is separated into
individual wavelengths by the spectral section and detected by the detector.
As the ICP emission spectrometry is characterized by the optical emission of a number of
simultaneously atomized or excited elements in the sample, it can be used, unlike the
atomic absorption method, for analyzing many types of elements at one time or continuously
and for the qualitative analysis purpose. Though this method is inferior to the atomic
absorption of the furnace method in terms of the sensitivity, it is quite useful for a wide
range of application in the qualitative analysis.
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4.1.4 ICP mass spectrometer (Fig. 4.16)
Detector
Quartz torch
Interface Ion lens
section section
Atomization section
(nebulizer) Ion introducing section
Sample
In the ICP mass spectrometry (ICP-MS), the liquid sample is fed to the ICP by sucking it
by pump or by natural suction and atomizing it with the nebulizer as in the ICP emission
spectrometry. The introduced sample undergoes thermal decomposition by absorbing the
thermal energy and becomes atomized, excited or ionized for the most part. The element
ion produced in the plasma under atmospheric pressure led to the vacuum chamber through
the minute pores (normally two types consisting of the sample cone and the skimmer cone)
called the interface. The ions converge after passing through the ion lens under vacuum,
get separated in the mass spectroscopy section and enter into the detector.
The quadruple electrode is widely used as the mass spectroscopy section of the ICP mass
spectroscopy, and double conversion type is chosen for the high performance application.
Double-conversion types come in two types: high-resolution type and multi-element
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simultaneous analysis type. ICP mass spectroscopy can analyze the quality and quantity of
several kinds of elements at a time, and also offers isotope analysis capability and other
excellent features. Highly sensitive, this method has detection limits two or three digits
lower than those of atomic absorption spectrometry (see 4.1.2) and ICP emission
spectrometry (see 4.1.3), and can exhibit its full performance in fields of very small trace
analysis.
Sample試料注入部
feeder section
Separation
分離用カラム column Ion source Pre-filter
プレフィルタ
イオン源
Ionization
イオン化部 質量分離部
Mass spectrometry Detector
検出器
Carrier
キャリアガス gas section section
(He)
(He)
GC section
GC部 MS section
MS部
- 13 -
polyethylene glycol, or other substance with the inside of a capillary tube 0.25 to 0.53 mm
in inner diameter are mainly used. In GC-MS spectroscopy, capillary columns with higher
resolution, smaller inner diameter, longer length, and capable of little-background trace
analysis are commonly used.
c) Ionization section
It is one way to use the Electron Ionization (EI) to ionize the sample molecule by
bombarding the thermal electron released from the heated filament, and another way is
the Chemical Ionization (CI) to ionize the sample molecule by the action of electric charge
exchange between the sample and methane gas ionized in advance by the method like EI.
The EI method is widely used for GC-MS and the technique of the “target material search”
using the data base available in the market is frequently used as the fragment information
of the sample can be readily obtained.
d) Mass spectrometry section
The quadruple (Q) type is most popular which transmits only the target ions by sending
the ions through the 4 pieces of electrodes and applying the high frequency voltage to the
electrodes. Its advantages are low price, high speed scanning and wide range of
quantitative determination.
The Ion Trap (IT) type, which retains the ion in the trap chamber enclosed by the
electrodes and enables to obtain the spectrometry by the selective release of the ion
through the change of the electric potential, has the high resolution and is capable of the
detailed structural analysis based on the MS/MS technique to split the ions and analyze
the fragments thus produced.
There are also other types such as the high- sensitivity, high resolution triple Q type, Time
of Flight (TOF) type and double convergence type.
Hitachi High-Tech Science SCION SQ 456GC Fig. 4.19 Packed column and
(Made by SCION) capillary column
Fig. 4.18 Gas chromatograph/Mass spectrometer
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4.1.6 Thermal Desorption Gas Chromatography Mass Spectrometry Equipment (Fig. 4.20)
Sampler
Purge valve
O-ring
Screw Cooling fan
Carrier gas
Ceramic heater
Sample cup falling position
ITF heat retaining part
Heat storage adapter
ITF needle N
GC GC inlet
Separation column
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Direct Injection Probe (DIP)
Ionizing chamber 50Pa
イオン化ち
Sluice
valve
Front view ゃんば Dry air
viewvvi chamber
ew
Planchet
+
Li EI Quadrupole
source source
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4.1.9 Liquid chromatograph (Fig. 4.25)
Petroleum ether
Column oven
Pump Column
Liquid plant extract
Coloring matter B
Calcium carbonate Sample
Coloring matter C
Data processing
Detector
Signal intensity
Chromatogram
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The liquid chromatograph consists of the following modules (Fig. 4.24):
- Pump: Sends the mobile phase. It is important to keep a certain flow rate
without pressure fluctuation.
- Sampler: A sample is fed into the flow
path.
There are options of Manual and
Automatic.
- Column oven: Column is kept at constant
temperature to prevent the elution time
error.
- Detector: Detects the component that
eluted from the column and converts it to
the electric signal.
- Data processing: Receives the detector
Hitachi High-Tech Science Chromaster
signal, performs the quantitative
Fig. 4.25 Liquid chromatograph
calculation and prepares the report.
The “Ion Chromatograph” is a kind of liquid chromatograph used mainly for the separation
of the inorganic ions, and it uses the column packed with the ion exchange resins for the
ion separation and the electric conductivity detector for the detection and the quantitative
determination.
%T =( I / I0 )× 100 ・・・(Equation 1)
A = log10( I0 / I ) = εc l ・ ・・(Equation 2)
Diffraction
grating
Reference
detector
Reference cell
XeF light Half mirror
source
Sample
detector
Sample cell
Hitachi High-Tech Science
Double-beam spectrophotometer
UH5300
Fig. 4.26 Overview and photometric principle of Fig. 4.27 Spectrophotometer
spectrophotometers
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4.2 Flow of analytical procedure
Fig. 4.28 shows the flow of the analytical procedure to determine the concentration of the
hazardous substances in the electric and electronic equipment.
Sample
No Yes
Is screening
to be done?
No Yes
Is sample
homogeneous?
Mechanical sample
preparation
Screening analysis
Failure OK
Within Yes No
allowable Perform detail
limits
analysis
Sample does not Sample complies Sample does not Sample complies
comply with with Standard comply with with Standard
Standard Standard
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According to the procedure of the screening analysis, it is necessary to choose either to
subject the sample to the measurement without changing its condition (Non-destructive
sample preparation) or to the measurement by destroying and homogenizing it (Mechanical
sample preparation). The judgment of which method to use should be made by considering
the material type, size and shape of the sample.
In carrying out the screening analysis, either Energy Dispersive X-ray Fluorescence
(EDXRF) or Wavelength Dispersive X-ray Fluorescence (WDXRF) is employed. The
procedure of the screening analysis must be implemented under controlled conditions. It is
necessary to determine the tolerance values for each sample to be analyzed considering the
influence of the sample shape and its material type on the variation of the analysis accuracy.
The details on the analysis procedure are shown in Table 4.1.
(Source: IEC62321:2008)
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4.3 Sampling
4.3.1 Sampling procedure
The sampling should be done by referring to IEC62321-2/Ed.1:2013.
Before carrying out the sampling, it is necessary, at first, to decide the analysis investigation
policy by collecting the maximum possible information as indicated in “4.4 Strategy relating
to Sampling” of IEC62321-2/Ed.1:2013.
Fig. 4.29 shows the general procedure applicable to most of the cases:
Products / components /
assemblies
Purpose of test
Decision of
strategy
Information/
history
No
Sampling / disassembly
/ decomposition
Evaluation
No
5. Analytical method
5.1 Screening analysis by X-ray fluorescence spectrometry
The screening analysis by X-ray fluorescence spectrometry must be performed in
accordance with IEC62321-3-1/Ed.1:2013.
By making the screening analysis by the X-ray fluorescence spectrometry for the
homogeneous material pretreated in some way like the slicing of the sample, the presence
and the approximate quantity of five elements, i.e. Pb, Hg, Cd, total Cr and total Br are
investigated.
a) Scope of application
Polymer materials, metal materials, and ceramic materials
b) Analyzing equipment
- Energy Dispersive X-ray Fluorescence (EDXRF)
- Wavelength Dispersive X-ray Fluorescence (WDXRF)
c) Pretreatment
Non-destructive approach or destructive approach must be chosen appropriately
depending on the sample.
For example, if the sample surface is plated or coated, the plating or coated layer must
be removed so that the exposed base material can be measured (destructive approach).
d) Analytical method
The optimal conditions depend upon the equipment to be used. Therefore, the analysis
should be performed by setting to the conditions recommended by the equipment
makers or the conditions established by the analysis institutions.
The example conditions recommended for various applications of the X-ray fluorescence
are shown in the table below. (Extracted from IEC62321-3-1/Ed.1:2013)
In principle, the measurement range for the sample must be entirely covered. Further,
it is desirable that the sample thickness should be 5 mm or more for the polymer
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materials and the light alloys like aluminum and 1 mm or more for the other metals. If
the thickness is less than the value specified above, the plural pieces of sample must be
stacked for the analysis.
The content is calculated by using the calibration curve or the fundamental parameter
(FP) method for the obtained results. (Generally the software of the automatic
calculation is installed in the analytical equipment.)
Then, after estimating the uncertainty of the result, it is compared with the maximum
allowable content of the applicable analysis component of the material.
The table below shows the judgment criteria of screening. (Excerpt from Annex A of
IEC62321-3-1/Ed.1:2013)
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5.2.3 Cadmium, lead, chrome and their compounds in glass and ceramics (electronic
equipment)
a) Scope of application
The quantitative analysis of cadmium, lead, chrome and compounds in glass and
ceramics (electronic equipment)
b) Analyzing equipment
1) Inductively coupled plasma optical emission spectrometer (ICP-OES)
The emission intensity of the target element is measured.
2) Inductively coupled plasma mass spectrometer (ICP-MS)
The mass/electric charge (m/z) and signal intensity of the target element are
measured.
3) Atomic absorption spectrometer (AAS)
The absorbance of the target element is measured.
c) Pretreatment
1) Mechanical sample preparation
The average sample must be collected that represents the site to be measured.
The collected sample is sliced and pulverized to the size suitable for the selected
analysis method in accordance with the procedure of IEC62321-2/Ed.1:2013 Then,
an unbiased sample is taken by means of the quartering method or the like.
2) Preparation of the test solution
It is done in accordance with IEC62321-5/Ed.1:2013.
i) Wet decomposition method
The sample is decomposed by acid like sulfuric acid, nitric acid, hydrofluoric acid,
hydrogen peroxide or phosphoric acid.
ii) Method of acid decomposition in closed system (microwave decomposition method)
The sample, to which acid is added in the decomposition container made of the
special fluororesin, is subjected to decomposition by the microwave irradiation.
If the sample residue exists, non-presence of target element must be confirmed
by checking the residue with the appropriate measurement, or the test solution
must be prepared by dissolving entirely the sample solution already dissolved
in acid by the other dissolving method (for example, decomposition by alkali
melting or microwave decomposition) and adding this solution to the acid
solution.
d) Analytical method
It should be performed in accordance with IEC62321-5/Ed.1:2013.
The calibration curve is prepared by the procedure like calibration curve, internal
standard or standard addition. After the concentration of each material in the
sample solution is measured, the content of each corresponding material in the solid
sample is calculated.
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5.3 Mercury and its compounds
The quantitative analysis should be performed in accordance with IEC62321-4/Ed.1:2013.
The analysis is performed by dissolving the sample in acid, by vaporizing the solution by
heating or by reduction, then by using it for the measurement with ICP-Optical Emission
Spectrometry (ICP-OES), ICP-Mass Spectrometry (ICP-MS) or Atomic Absorption
Spectrometry (AAS) and by determining quantity with the use of the calibration curve
prepared with the control solution. An alternative method of analysis is to quantify the
samples by using Thermal Decomposition - Gold Amalgamation - Atomic Absorption
Spectrometry (TD(G)-AAS), which requires no wet pretreatment and can measure samples
directly.
Note: As mercury is highly volatile, its loss should be prevented by using the reflux
condenser or the microwave heating equipment.
a) Scope of application
The quantitative analysis of mercury contained in the high-molecular materials,
metal materials, and electronic parts.
b) Analyzing equipment
- Heating vaporized or reducing vaporized atomic absorption spectrometry (AAS)
- Inductively coupled plasma optical emission spectrometer (ICP-OES)
- Inductively coupled plasma mass spectrometry (ICP-MS)
- Thermal Decomposition - Gold Amalgamation - Atomic Absorption Spectrometry
(TD(G)-AAS)
c) Pretreatment
1) Mechanical sample preparation
The average sample must be collected that represents the site to be measured.
The collected sample is sliced and pulverized to the size suitable for the selected
analysis method in accordance with the procedure of IEC62321-2/Ed.1:2013.
Then, an unbiased sample is taken by means of the quartering method or the like.
2) Preparation of the test solution
It is done in accordance with IEC62321-4/Ed.1:2013.
i) Reducing vaporization method (Wet decomposition process)
The sample is decomposed by sulfuric acid, nitric acid or potassium
permanganate using the decomposition flask attached with the reflux condenser.
ii) Method of acid decomposition in closed system (microwave decomposition method)
The sample, to which acid is added, is subjected to decomposition by the
microwave irradiation.
If the sample residue exists, it is necessary to separate it by the use of the
centrifuge or the filter. Then, non-presence of the target element must be
confirmed by checking the residue with the appropriate measurement.
iii) Thermal Decomposition - Gold Amalgamation method
Weighed samples are set directly on the sample boat to generate mercury from
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the sample under predetermined thermal decomposition conditions. Mercury
alone is concentrated as gold amalgam in a special mercury collection pipe, the
obstacle components are removed, and then the reheated and vaporized
mercury is measured using atomic absorption spectrometry.
d) Analytical method
It should be performed in accordance with IEC62321-4/Ed.1:2013.
The calibration curve is prepared by the procedure like calibration curve, internal
standard or standard addition. After the concentration of each material in the
sample solution is measured, the content of each corresponding material in the solid
sample is calculated.
5.4.1 Confirmation test of hexavalent chromium in colorless and colored anticorrosive film
of metal sample
The confirmation test must be done in accordance with IEC62321-7-1/Ed.1:2015.
a) Scope of application
Confirmation test of hexavalent chromium in the colorless and colored anticorrosive
film of the metal sample
b) Analyzing equipment
Spectrophotometer
c) Pretreatment
1) Washing of surface
The contamination on the sample surface such as foulings, oil film, and
fingerprints must be wiped out by the clean, soft cloth wetted with solvent or
removed by cleaning with the appropriate solvent. But, the forced drying at 35C
or above, or alkali treatment are not permitted. If the sample is coated with the
polymer material, only the polymer material layer must be removed by grinding
with the sandpaper of grit size 800 without removing the anticorrosive membrane.
2) Preparation of test solution (Boiling water extraction method)
The sample with the surface area of 50 ± 5 cm2 is subjected to 50 mL boiling water
extraction for 10 minutes.
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If the surface area of a sample is less than 50 ± 5 cm2, several samples may be used
to obtain a total of 50 cm2, but the total surface area must be at least 25 cm2. (The
quantity of boiled water to be extracted at that time must be 1 mL per 1 cm2.)
It is necessary to take the sufficient precautions in the test using the boiling water
since the sample and the container become high in temperature.
d) Analytical method
Being different from the other specific hazardous substances, the concentration of
hexavalent chromium in the sample solution is not measured by the prepared
calibration curve but its conformity/noncoformity is judged by comparing with the
absorbance of the sample solution of a certain concentration (equivalent to 0.10g/cm2
and 0.13g/cm2) according to Table 5.3.
- Diphenyl carbazide spectrophotometry
The absorbance is measured for the colored sample solution.
If the sample has a complicated shape, the surface area is estimated by size and
shape.
(In the case of the flat head screw, the total estimated surface area of screw head
and screw body is calculated. The text of IEC62321-7-1/Ed.1:2015 shows how to
typically calculate the surface area of a screw.)
- 33 -
Table 5.3 Evaluation criteria for hexavalent chromium
Concentration of hexavalent Qualitative evaluation results
chromium by absorption
spectrophotometry
- 34 -
Among several ideas to verify the non-presence, the following four ideas are
suggested here.
1) To verify non-presence of total chromium
2) Apart from the anticorrosive surface treatment by the use of trivalent chromium, the
non-presence of total chromium is verified, for example, by the X-ray fluorescence
spectrometry for the surface treatment not using chromium or for the genuine metal
material.
3) To estimate total chromium quantity on chromium-treated surface layer as
denominator
If the non-presence cannot be verified by 2) above, then the total chromium quantity
per unit area is determined by dissolving the chromium-treated surface layer in acid.
Regarding this value as the denominator, the security for hexavalent chromium
concentration is ensured by referring to the ratio with the value determined in a) to
b).
In this case, it is predicted that the total chromium quantity per unit area (g) is lower
than the weight of the chromium-treated layer. Therefore, if the tentative
concentration of hexavalent chromium (wt%) mentioned here is lower than the
restricted value, the security of the restriction value is sufficiently ensured.
- 35 -
Concentration of hexavalent chromium (wt%)
= Hexavalent chromium elution quantity per unit area (g) / W (g)
Where, the design value or the inspection values of L and d should be obtained from
the manufacturer.
In the generally practiced chromium-based anticorrosive surface treatment, the
finished film becomes 0.2 through 0.5 μm in most of the cases. In regard with the
apparent specific gravity, its value is mentioned to be 2 through 5 in general. Since
the true specific gravity is 7.19 (g/cm3), the apparent specific gravity cannot be
greater than this value. For both the film thickness and the specific gravity, it is wise
to request for the information on the design and the inspection values to the
manufacturer that performed the anticorrosive treatment.
- 37 -
a) Scope of application
Polymers and electronic parts
b) Analyzing equipment
Ion chromatograph
c) Pretreatment
1) Mechanical sample preparation
Sampling should be performed in accordance with IEC62321-2/Ed.1:2013.
Average samples representing the regions to be measured are collected. The
samples collected are cut to sizes suited for the analysis method selected, and
then pulverized. After that, an unbiased sample is taken by means of the
quartering method or the like.
Solid samples are cut to 3 mm x 3 mm or a smaller size with scissors or a similar
tool. Liquid samples are prewashed two or three times with samples for use with
a pipette, and then collected.
2) Combustion treatment of samples
One mg to 100 mg of sample to an accuracy of 0.1 mg is weighed and placed on a
sample boat, and is then burned in accordance with a specified combustion
program. Table 5.4 shows examples of combustion furnace and absorbent
conditions. (Excerpts from IEC62321-3-2/Ed.1:2013, Annex F)
- 40 -
5.6 Phthalic acid esters
Four phthalic acid esters substances shall be covered - DIBP, DBP, BBP, and DEHP - from
among the substances covered by the RoHS directive in accordance with IEC62321-8:2017
“Determination of certain substances in electrotechnical products (phthalates in polymers).”
Table 5.6 Example of analytical conditions of phthalic acid esters by Py -TD -GC -MS
Pyrolyzer (Py) Heating furnace temp. :200℃→20℃/min→
300℃→5℃/min→
340℃(1min)
Interface temp. :300℃ (control mode: manual)
Gas chromatography Column :Dimethylpolysiloxane
(GC) (length 15m, inside diameter 0.25mm,
- 41 -
membrane thickness 0.05μm)
Vaporization chamber temp. :320℃
Oven temp. :80℃→20℃/min→300℃(5min)
Injection mode :Split
(Split 比 1/50)
Carrier gas : Helium 52.1cm/s
(fixed linear velocity)
Mass spectrography Ion source temp. :230℃
equipment (MS) Electron accelerating voltage:70eV(electron ionization (EI))
Monitor ion mass number :
(m/z)
Component Fixed Confirmation Confirmation
quantity ion 1 ion 2
ion
DIBP 223 205 149
DBP 223 205 149
BBP 206 91 149
DEHP 279 167 149
e) Judgment method
- 42 -
Polymer materials (polymers) and electronic components
Conformed Non-conformed
GC-MSmethod
5.6.2 Screening analysis for phthalate esters by IAMS (ion attachment mass
spectrometry) and TD-MS (thermal desorption mass spectrometry) (assay in accordance
with PBMS)
a) Scope of application
Polymer materials (polymers) and electronic components
b) Analytical apparatus
thermal desorption mass spectrometry (example: Hitachi High-Tech Science
HM1000)
c) Pretreatment
Mechanical sample preparation
Extract average sample representing measurement position.
d) Analytical method
Use smallest scale of up to 0.01mg to accurately measure out sample (approx. 0.2mg)
to sample pan, and set on sample rack of apparatus auto sampler. Before sample
measurement, use phthalate ester standard sample (NMIJ CRM 8152-a) to prepare
calibration curve, and use this to calculate fixed quantity and contents.
- 43 -
Table 5.7 Example of analytical requirements of phthalate esters by thermal desorption
mass spectrometry
- 44 -
extracting for at least 6 hours, use a rotational evaporator under reduced pressure to
concentrate to approx. 10ml and then dilute in measuring cylinder to 50ml with hexane.
For polymer samples dissolved in THF (e.g., PVC), it is also possible to use as an
alternative the extraction procedure with ultrasonic waves as shown below.
In case of ultrasonic extraction, add surrogate solution and THF10ml to 300±10mg of
sample, and seal. Thereafter, carry out ultrasonic wave treatment for 30~60 minutes until
sample dissolves, and cool. Drip 20ml of acetonitrile and deposit the polymer parts. Filter
with 0.45μm PTFE membrane and remove polymer parts.
d) Analytical method
Add internal standard solution to treatment solution prepared in c), and carry out
qualitative analysis by GC-MS. The calibration curve for quantitative analysis is
produced by preparing 5 or more solutions at equal intervals with concentrations of
standard solution, and quantitatively measuring based on the measurement value of
peak area. Data (including blank values) is to be managed in accordance with paragraph
11 of IEC62321-8/Ed.1:2017.
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Revision history
No. Revision date Revised content
First 2004.4 Following the establishment of the RoHS
edition directive in January 2003, established as
(Ver.1) guideline of the conformity confirmation analysis
method in the RoHS directive of Hitachi Group
Ver.2 2010.11 Harmonization with measurement procedure of
IEC 62321, addition of basic explanation of
analysis methods, and attachment of separate
volume of previous case studies at Business
Divisions
Ver.3 2016.4 Addition of technical items necessary for use
Ver.4 2018.3 Addition of measurement methods in Part 7-2
(Hexavalent chromium in polymers) and Part 8
(Phthalic acid esters)
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Analysis Guideline Revision Working Group Members
Business Group/Company Affiliation Name
Hitachi Power Solutions Consulting Engineering Kunio Sukegawa
Headquarters Takahiro Kobayashi
Hitachi Industrial Equipment Environmental Control Center, Shohei Tsugami
Drive & Solutions Environmental Business Takushi Endo
Division
Hitachi High-Tech Science Quality Assurance Division Rikio Komakine
Analysys & Application Kenji Namiki
Technology Division
Hitachi Urban Investment Material Analysis Group, Yoshiki Kurosawa
Solution Division, Facility Hirotsugu Esaki
Headquarters
Business Planning Division, Koichi Yamamoto
Facility Headquarters
Hitachi Metals Quality Assurance Division, Yasuhiro Yokoyama
Cable Material Company
Material Processing Group Ryutaro Kikuchi
Cable Materials Research
Laboratory
Cable Material Company
Hitachi Chemical Techno Analysis & Technology Katsuya Kakuba
Service Division,
Hitachi Works
Hitachi Appliances Quality Assurance Division, Hitoshi Furuyama
Taga Home Appliances
Headquarters, Home
Appliances & Environmental
Equipment Division
Environment Promotion Kazuo Mino
Division, Main Office
Hitachi Plant Services Analytical Technology Center, Yasunari Uchitomi
New Business Promotion
Headquarters
Research & Development Advanced Materials Research Toshiaki Ishii
Group Division, Material Innovation
Center, R&D Technology
Motoko Harada
Innovation Control
Headquarters
Systems & Services Business Environment Policy Center Katsuhiro Sasajima
Environment Policy Division
Systems & Services Business
Division
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Hitachi Automotive Systems Product Environmental Takafumi Enami
Management Gr.
Global Manufacturing
Division
CSR and Environmental Energy & Environment Hikaru Kagiwada
Strategy Division Promotion Division
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