Release Notes

ZEISS ZEN core v3.4

ZEISS ZEN core v3.4

Original Manual

Carl Zeiss Microscopy GmbH

Carl-Zeiss-Promenade 10
07745 Jena
Germany
[email protected]
www.zeiss.com/microscopy

Carl Zeiss Microscopy GmbH

Kistlerhofstraße 75
81379 München
Germany

Document Name: ZEISS ZEN core v3.4 Release Notes

Revision: 1
Language: en-US
Effective from: 12/2021

© 2021 Without the prior written consent of ZEISS, this document or any part of it must neither be translated nor
reproduced or transmitted in any form or by any means - including electronic or mechanic methods, by photocopy-
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1 New Modules​ ZEISS

1 New Modules
Module Description
Coded Microscope This module enables you to read-out coded components with
ZEN starter.
§ Basic MTB interface for ZEN Starter for microscopes with
coded components.
§ Coded components will be read-out and displayed in the light
path tool.
§ Note that it is not compatible with microscopes with motor-
ized components.

Intellesis Denoising Important: For the training process a GPU with at least
8GB of memory is recommended.
This module enables you to denoise images based on the
noise2void algorithm.
§ User-friendly tool to train a deep learning based models, with-
out the need to provide any annotations.
§ Trained models can be applied to denoise images.
§ Supports any image data format in ZEN including multidimen-
sional data sets such as Z-stack, multi-channel and tile images
can be processed.

Time Series (Time Lapse) This modules enables you to acquire time series (time lapse) im-
ages. You can define the intervals between images, total acquisi-
tion duration and number of time points. Time series can be
started and stopped manually, at fixed times or after a user-de-
fined waiting period.

Release Notes ZEISS ZEN core v3.4 | en-US | Rev.1 3

2 New Features & Improvements​ ZEISS

2 New Features & Improvements

Area/Module Features / Improvements
General Improvements § The histogram and associated options have been moved to
in Base Package the view options area and are now available for every work-
bench also in ZEN analyzer.
§ When starting ZEN core a splash screen is shown during the
startup time.
§ The name of the microscope configuration from the MTB is
available as image metadata to allow traceability and search-
ing.
§ The use of ZAPHIRE for image analysis in loops has been im-
proved.
§ In Manage Templates the last selected category is persisted
when exiting and re-entering the screen.
§ A new option in the last step when running a job allows to re-
peat the job without saving the result.
§ The folder for temporary storage of documents (“Sandbox”)
can be defined in the archive options.

Multi-Channel Acquisi- The Multi-Channel Acquisition module is now also available for
tion ZEN starter.

ZEN Data Storage You have now the possibility to define custom metadata fields in
the archive. These fields can be mapped to entries in forms and
are added to the respective results.
It is now possible to save the audit trail for GxP module centrally
on the server. The audit trail is accessible from all clients.
The gallery of the ZEN Data Explorer has been updated and
now allows you to customize the metadata panel and search.

Macro Environment More image processing functions are accessible via OAD:
§ Generate Shading Reference From Tile Image
Zen.Processing.Adjust.ShadingReferenceFromTileImage
§ Undo Stitching
Zen.Processing.Transformation.Geometric.UndoStitching
§ Sample Down
Zen.Processing.Transformation.Geometric.SampleDown
§ Deblurring
Zen.Processing.Deconvolution.Deblurring
It is now possible to read and write the general information of an
image via OAD, e.g.
§ img.Title = "Cells"
§ img.Description = "my favorite image"
§ img.Comment = "This is an image with great quality"
§ img.Keywords = "HeLa, Hoechst, Alexa 488 (Tubulin), AF 647
(Mitochondria)"
§ img.Rating = 5

Release Notes ZEISS ZEN core v3.4 | en-US | Rev.1 4

2 New Features & Improvements​ ZEISS

Area/Module Features / Improvements

It is also possible to get selected documents in free mode as a
list:
§ Zen.Application.GetFreeModeSelectedOutputParameters()

Technical Cleanliness The Module ZEN Technical Cleanliness Analysis (TCA) has been
Analysis (TCA) extended. The following new functionality enhances the produc-
tivity for routine analysis in technical cleanliness:
§ TCA offers additional job templates with object classification
for component cleanliness analysis. Three selectable pre-
trained models with different pol channel combinations (pol-0/
pol-90, pol-45/pol-90, pol-135/pol-90) are available. The new
job templates provide improved particle type differentiation,
especially with respect to dark metallic particles and can be
adapted to customer needs by extended model training.
§ Particle height measurement results are now available as part
of the TCA report. The meta data of the largest particle per
type are extended by the measured particle height.

Note! With ZEN core v3.3 the TCA bundles with Axiocam 705
pol are no longer available. Both TCA and Axiocam 705 pol have
to be ordered separately.

Non-Metallic Inclusion The Module ZEN Non-Metallic Inclusion Analysis has been ex-
Analysis (NMI) tended. The following functionality enhances the monitoring of
routine analysis in steel cleanliness:
§ The NMI field based view was extended. It is now possible to
mark serval inclusions and reclassify as artifacts at the same
time.

Visioner 1 The Visioner EDF Panorama (interactive) workbench enables

you to acquire an EDF image of a large sample area with a man-
ual or preferable a motorized stage.

Smartproof ZEN core v3.4 is also available for Smartproof and upgrades
from ZEN core 3.2 or earlier can be purchased.

Cameras With ZEN core v3.3 the ZEN core Camera Packages with the Ax-
iocam series were discontinued. These bundles consisting of ZEN
core, Image Analysis and a Axiocam no longer exist and there are
no equivalents available.

Release Notes ZEISS ZEN core v3.4 | en-US | Rev.1 5

 Release Notes ZEISS ZEN core v3.4 | en-US | Rev.1
Modifications reserved.

Carl Zeiss Microscopy GmbH phone: +49 3641 64 3161

Carl-Zeiss-Promenade 10 fax: +49 3641 64 3439
07745 Jena [email protected]
Germany www.zeiss.com/microscopy