Echo Sensitivity / Ringing Test Circuit For EP Models

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Echo Sensitivity / Ringing Test Circuit for EP Models

D3 VCC
DC 6 - 12V
IFT Specification
User Side 1N4004 R13 1 20 Model L2nd.(mH)Turn Ratio Q @40KHz R6 R7
J1 MCU Vref
150
Vcc 1
R14 400EP14D 10.2 1:10 76 8.2K 47K
White: I/O Signal Echo sensitivity test point (TP2)
Output to MCU 22K 1:10
MCU 2 TP2 400EP14DC 5.1 60 8.2K 20K
R1 2 19
HP_0 Vcc 4.7K 48K
Input from MCU GND 3 2.7K 400EP18A 6.3 1:10 37
C14
R 22nF/200V 400EP18AC 3.1 1:10 40 4.7K 20K
10K Q
0.5ms MMBT4401 R2 3 18
HP_1 Vreg C12 C13
5V 13K C1 100uF/16V 100uF/16V
680pF C10 C11 + +

>15mS C2 0.1uF 0.1uF


Input Control Signal 4 17
LP_0 GND
C3 680pF
2200pF
R3 5 16 R12
LP_1 CLK
4.7K 39K
C9
C4 22pF
470pF
6 TCG_0 ORC3 15
R4 VR1 Adjust VR1 to the frequency of 40KHz
4.7K 1K

7 14 R11
TCG_1 ORC2
3.9K
C5
10nF C8
2200pF
8 GR_0 ORC1 13

Echo sensitivity test point (TP1) D2A


BAV99
TP1 R10
Adjust VR2 for consistent echo sensitivity 9 12 1.5K
GR_1 Ftrace
R5 VR2
20K 50K VCC
D1B R9
BAV99 C6 510 D2B
10 11 BAV99
Echo Driver_0 R8
33nF U1 100
PW0268
IFT
Ringing Adjustment Transducer under test
D1A
BAV99 + C7
200uF/16V R7
R6
Y1
D

G
S
Q1
BSS123

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