X-RAY POWDER DIFFRACTION

XRD for the analyst

Getting acquainted with the principles

Martin Ermrich

nλ = 2d sin θ Detlef Opper

The Analytical X-ray Company

X-RAY POWDER DIFFRACTION

XRD for the analyst

Getting acquainted with the principles

Martin Ermrich

Detlef Opper
XRD for the analyst

Published in 2011 by:

PANalytical GmbH
Nürnberger Str. 113
34123 Kassel
+49 (0) 561 5742 0
[email protected]

All rights reserved. No part of this publication may be reproduced, stored in a

retrieval system or transmitted in any form by any means electronic, mechanical,
photocopying or otherwise without first obtaining written permission of the
copyright owner.

www.panalytical.de

2nd revised edition published in 2013 by:

PANalytical B.V.
Lelyweg 1, 7602 EA Almelo
P.O. Box 13, 7600 AA Almelo, The Netherlands
Tel: +31 (0)546 534 444
Fax: +31 (0)546 534 598
[email protected]

www.panalytical.com

ISBN: 978-90-809086-0-4

We encourage any feedback about the content of this booklet. Please send to the
address above, referring to XRD_for_the_analyst.

2
XRD for the analyst

Contents

1. Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7

2. What is XRD? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8

3. Basics of XRD . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
3.1 What are X-rays? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
3.2 Interaction of X-rays with matter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
3.3 Generation of X-rays . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
3.3.1 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
3.3.2 The sealed X-ray tube . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
3.3.3 White radiation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
3.3.4 Production of characteristic X-rays . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
3.4 A short introduction to crystallographic terminology . . . . . . . . . . . . . . . 17
3.5 The powder diffractogram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
3.5.1 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
3.5.2 The position of the reflections: Bragg’s law . . . . . . . . . . . . . . . . . . . . . . . 22
3.5.3 The intensity of the reflections . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
3.5.4 The shape of the reflections . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
3.6 Overview of X-ray scattering techniques . . . . . . . . . . . . . . . . . . . . . . . . . 26
3.6.1 Single crystal XRD . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
3.6.2 Powder diffraction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
3.6.3 Special X-ray techniques . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
3.7 General terms used in X-ray powder diffraction . . . . . . . . . . . . . . . . . . . 27

4. The X-ray diffractometer . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30

4.1 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30
4.2 Geometries . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30
4.2.1 Reflection geometry . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30
4.2.2 Transmission geometry . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32
4.2.3 Parallel beam geometry . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32
4.2.4 Microspot analysis . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33
4.3 Optical components in the X-ray beam path . . . . . . . . . . . . . . . . . . . . . . 33
4.3.1 General requirements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33
4.3.2 Slit optics for Bragg-Brentano geometry . . . . . . . . . . . . . . . . . . . . . . . . . 33
4.3.2.1 Divergence and anti-scatter slits . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
4.3.2.2 Soller slits . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35
4.3.3 Optical modules . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36
4.4 Detectors . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38
4.4.1 General remarks . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38
4.4.2 Detector types . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40
4.4.3 Comparison of the detector types . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42

5. XRD data collection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 44

5.1 Sample preparation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 44

3
XRD for the analyst

5.1.1 Ideal powder . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 44

5.1.2 Sample types . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 44
5.1.3 Reflection mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46
5.1.4 Foil transmission . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46
5.1.5 Capillaries . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46
5.2 Measurements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47
5.2.1 Optimum measurement conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47
5.2.2 Resolution . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47
5.2.3 Low quantities . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 48
5.2.4 Air-sensitive / hygroscopic materials . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 49
5.2.5 Minimization of texture . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 49
5.2.6 Thin layers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 51
5.2.7 Rough surfaces . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 52
5.2.8 Standard materials . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 52

6. Qualitative phase analysis . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 54

6.1 Data processing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 54
6.2 The search/match procedure; reference databases . . . . . . . . . . . . . . . . . 55
6.3 Cluster analysis . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 56

7. Quantitative phase analysis . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 58

7.1 Basics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 58
7.2 Special problems . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 59
7.2.1 Preferred orientation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 59
7.2.2 Absorption and micro-absorption . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 60
7.2.3 Limit of detection, limit of quantification,
amorphous amounts and crystallinity . . . . . . . . . . . . . . . . . . . . . . . . . . . . 62
7.3 Methods of quantitative phase analysis . . . . . . . . . . . . . . . . . . . . . . . . . . 63
7.4 Examples . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 66
7.4.1 Discussion of different methods . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 66
7.4.2 Determination of retained austenite . . . . . . . . . . . . . . . . . . . . . . . . . . . . 69
7.4.3 Quantification of cement . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 69

8. Crystallographic analysis . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 71
8.1 Indexing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 71
8.1.1 Lattice parameter determination and refinement . . . . . . . . . . . . . . . . . 71
8.1.2 Structure refinement . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 72
8.1.3 Structure solution . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 72

9. Microstructural analysis . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 73
9.1 Residual stress . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 73
9.1.1 Basics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 73
9.1.2 sin2 ψ method . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 74
9.2 Texture . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 75
9.2.1 Basics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 75
9.2.2 The Lotgering factor . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 76
9.2.3 Omega scan . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 77
9.3 Crystallite size determination . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 77

4
XRD for the analyst

9.3.1 Basics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 77
9.3.2 Crystallite size . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 77
9.3.3 Micro-strain . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 78
9.3.4 The Williamson-Hall plot . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 78
9.3.5 Discussion of the peak broadening . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 80

10. Non-ambient XRD . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 81

10.1 Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 81
10.1.1 Correct sample positioning and height . . . . . . . . . . . . . . . . . . . . . . . . . . 82
10.1.2 Sample and preparation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 82
10.1.3 Temperature measurement and calibration . . . . . . . . . . . . . . . . . . . . . . . 83
10.1.4 Special requirements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 83
10.2 Pressure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 86
10.3 Humidity . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 86

11. Recommended literature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 87

12. Symbols . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 90

Index . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 92

5
XRD for the analyst

About the author

Dr. Martin Ermrich studied Physics at the Technical University in Dresden. In 1997 he
founded his own X-ray laboratory with a special focus on X-ray diffraction.

6
XRD for the analyst

1. Introduction
As a (future) user of a PANalytical X-ray diffractometer you can perform almost
all types of diffraction applications, depending on the configuration of your
system. To get the best possible results out of your system, this book gives you an
introduction to X-ray powder diffraction (XRPD or, mostly used, XRD) and provides
helpful information. It gives a simple explanation of how a diffractometer works
and how XRD analysis is done. This book is intended both for people new to the
field of XRD analysis and for more experienced users to find new applications
which might be helpful in daily work. This book avoids complex mathematical
equations and understanding its contents only requires a basic knowledge
of crystallography, mathematics and physics. It is not dedicated to specific
diffractometer configurations or application areas, but aims to give a global
overview of the various possibilities in XRD.

Chapter 2 briefly explains XRD and its benefits. General application fields are
presented. Chapter 3 gives an introduction to the physics and crystallography
of XRD, while Chapter 4 describes how this is used for diffraction experiments.
Chapter 5 explains the XRD data collection. This includes presentation of sample
preparation and measurement procedures to get the best possible results. In
Chapters 6-9 the procedures to perform qualitative and quantitative phase analysis
are presented. Chapter 10 deals with non-ambient XRD and describes its methods
and applications together with other techniques. Chapter 11 lists recommended
literature for further information on XRD analysis.

Since this book is intended to give an introduction to standard powder diffraction

techniques, it does not cover other X-ray techniques like single crystal diffraction,
high-resolution XRD of heteroepitaxial layers, or small-angle X-ray scattering
(SAXS).

Other books from PANalytical in this series:

P. Brouwer: Theory of XRF – Getting acquainted with the principles
P. Kidd: XRD of gallium nitride and related compounds: strain,
composition and layer thickness
M. van der Haar: XRF applications in the semiconductor and data storage industry
J.P. Willis: XRF sample preparation – Glass beads by borate fusion

7
XRD for the analyst

2. What is XRD?
X-ray diffraction (XRD) is a versatile, non-destructive analytical method to analyze
material properties like phase composition, structure, texture and many more of
powder samples, solid samples or even liquid samples.

Identification of phases is achieved by comparing the X-ray diffraction pattern

obtained from an unknown sample with patterns of a reference database.
This process is very similar to the identification of finger prints in crime scene
investigations. The most comprehensive database is maintained by the ICDD
(International Centre of Diffraction Data). Alternatively, it is possible to build up a
reference database from experimental diffraction patterns of pure phases and/or
patterns published in the scientific literature or derived from own measurements.

Modern computer-controlled diffractometer systems like the PANalytical X’Pert

Powder or Empyrean in combination with phase analysis software (e.g. HighScore)
use automatic routines to measure and interpret the unique diffractograms
produced by individual constituents in even highly complex mixtures.

The main topics of X-ray diffraction are:

• Qualitative and quantitative phase analysis of pure substances and mixtures
• Analysis of the influence of temperature and/or other non-ambient variables,
such as humidity or applied pressure
• Analysis of the microstructure of the material, including properties like
crystallite size, preferred orientation effects and residual stress in polycrystalline
engineered materials.

Many of these techniques can also be used for poly-crystalline layered materials
such as coatings.

Other X-ray diffraction techniques include high-resolution analysis of hetero-

epitaxial layers, X-ray reflectometry on thin films and small-angle X-ray scattering.
These techniques are explained here briefly. More detailed information can be
found in dedicated literature.

X-ray powder diffraction is used in a wide variety of research and process control
environments. For example:
• Characterization of (new) materials at universities and research centers
• Process control in several industries like building materials, chemicals,
pharmaceuticals, for instance phase composition and content
• Determination of polymorphism, API (active pharmaceutical ingredient)
concentration determination, API stability studies in the pharmaceutical industry
• Phase identification of minerals in geological samples
• Optimization of fabrication parameters for wear-resistant ceramics and
biomaterials
• Determination of the crystallinity of a phase
• Determination of amorphous phase contents in mixtures

8
XRD for the analyst

A typical powder pattern is given in Figure  1. It shows a scan of a mixture of a

crystalline phase (quartz) and an amorphous component (glass).
Counts
Cryst50

10000

2500

0
20 30 40 50 60 70 80

Position [°2Theta] (Copper (Cu))

Figure  1. Typical powder pattern showing the presence of a crystalline phase and an amorphous
phase

9
XRD for the analyst

3. Basics of XRD
3.1 What are X-rays?
X-rays are electromagnetic waves with associated wavelengths, or beams of
photons with associated energies. Both views are correct, and the view that you
use at a particular time usually depends on the specific phenomena that you are
interested in. Other electromagnetic waves include visible light, radio waves and
γ-rays. Figure  2 shows that X-rays have wavelengths and energies between those
of γ-rays and ultraviolet light. The wavelengths of X-rays are in the range from
0.01 nm to 10 nm, which corresponds to energies in the range from 0.125 to
125 keV.

Figure  2. X-rays and other electromagnetic radiations

The wavelength λ of X-rays is inversely proportional to its energy E, according to:

c
E = hν = h
λ
where h is the Planck’s constant, ν is the frequency, and c the velocity of light.

The unit Å (Ångström), which is a unit length of 10-10 m, or 0.1 nm, is historically
used in X-ray diffraction because it simplifies the notation of wavelengths, atomic
distances and lattice parameters.

10
XRD for the analyst

3.2 Interaction of X-rays with matter

If X-rays with a wavelength λ and an intensity I0 penetrate a material, they become
attenuated (μ), absorbed (τ ), scattered (σ ) and undergo the so-called ‘pair-
building’ (π ). These parameters act additively. The absorption is the first-order
effect for X-rays in matter, hence the literature often does not distinguish between
the attenuation and the absorption coefficient. Division by the density (ρ) yields
the mass attenuation coefficient (μ /ρ), also referred to in the literature as MAC.
The transmitted intensity I depends on the incident intensity I0 , the attenuation
coefficient μ and the path length through the material d:

I = I 0e − µ d
The attenuation coefficient (μ ) of the material depends on
• atomic number (Z )
• density (ρ)
• packing fraction ( p) (a typical value is between 0.6 to 0.8)
• wavelength (λ)

with the following relationship: µ ~ ρ pZ 3λ 3

The attenuation increases steadily with the wavelength, interrupted by sharp
discontinuities. These discontinuities correspond to the absorption edges caused by
electronic shells of the atoms, see Chapter 3.3.4.
With respect to the scattering process, two main interactions of X-rays with matter
have to be distinguished: coherent and incoherent scattering.

• Coherent or Rayleigh scatter is the most important effect for X-ray diffraction:
it is the elastic scattering of the incoming photon upon collision with inner-shell
electrons. The wavelength of the photon is not changed, i.e. the photon energy
remains constant.
• Incoherent scatter can be divided into Compton scatter and fluorescence. In
both cases, the wavelength of the photon increases by the scattering process,
i.e. the photon energy decreases.
–– Compton scatter: an electron is pushed out of its shell or is excited to a
higher energy state. The incoming X-ray photon looses energy. This type of
scatter can be ignored in laboratory X-ray powder diffraction because of the
low energy of the incoming photons.
–– Fluorescence: the incoming photon ejects an inner-shell electron from the
atom. The vacancy is then filled by an electron from one of the atom’s outer
shells. The action of this electron moving from one shell to another creates an
X-ray photon with the energy difference of the two shells. The energy of this
photon is dependent on the atomic number and is therefore characteristic
for the atom itself. This effect is used in XRF (X-ray fluorescence) analysis
for determination of elemental concentrations. In XRD it is generally
considered as an unwanted radiation because it raises the background of the
diffractogram and reduces the peak/background ratio.

11
XRD for the analyst

3.3 Generation of X-rays

3.3.1 Introduction
There are several physical methods of obtaining X-rays of sufficient intensity for
X-ray diffraction. The most common methods are:
• Bombarding a target of a suitable material (anode) with a focused electron
beam. The maximum achievable X-ray intensity is limited by the maximum
power, which is restricted by the cooling system of the stationary anode.
These X-ray sources are called sealed X-ray tube. Modern designs use ceramic
insulators instead of glass bodies to improve stability and lifetime. These tubes
are widely used in modern laboratory diffraction systems, like the X’Pert PRO
and Empyrean.
• Deflection of high-energy electrons by electromagnetic fields, yielding emission
of X-rays. This principle is used in synchrotrons. These instruments yield a very
strong X-ray intensity but are large and costly to operate so that they are
available only in huge research centers, mainly used by scientists.

3.3.2 The sealed X-ray tube

In a sealed X-ray tube (see Figure  3), electrons are emitted by a hot filament, the
cathode. The high voltage difference (U ) between cathode and anode accelerates
the electrons with a high speed towards the anode material, resulting in a line
image of the filament on the anode. The kinetic energy (Ekin = e  U ) of the
electrons is converted mainly into heat (99%) and X-ray radiation (1%). Hence the
(back side of the) anode has to be cooled effectively.

Be window Ceramic insulator

Water out
HT connection
contacts

Automatic
tube recognition

Water in

Cathode / Focusing Metal tube

filament cylinder body

Figure  3. Schematic drawing of ceramic X-ray tube (X’Pert type)

X-rays are emitted from the tube anode through thin beryllium windows. The
windows keep the tube sealed and allow X-rays to pass through. Optics are
’looking’ to the anode under a grazing angle, which results in a smaller apparent
source spot size. The windows are located at parallel or perpendicular positions
with respect to the focal line to form the point or line focus. In a typical long fine

12
XRD for the analyst

focus tube the line focus has a dimension of 0.04 mm × 12 mm, point focus of
1.2 mm × 0.4 mm. Both focal positions have their typical applications, which are:
• Line focus:
–– High-resolution phase analysis
–– Omega stress
• Point focus:
–– Micro-diffraction
–– Texture
–– Psi stress

These applications are explained in more detail in subsequent chapters.

The intensity of the X-ray tube decreases with time. This is mainly caused by the
evaporation of the tungsten filament (the cathode) leading to deposition of
tungsten on the anode and the Be windows. A deposition of tungsten on the
anode leads to additional lines in the diffractogram.

When the electrons hit the anode, two types of radiations are emitted: white
radiation (bremsstrahlung) and the characteristic X-ray radiation.

3.3.3 White radiation

The interaction of the accelerated electrons with the anode leads to a loss in
energy, resulting in the emission of X-rays in a continuous spectrum, the so-called
white radiation or bremsstrahlung.

The Duane-Hunt law gives an estimation of the lowest wavelength λ0 of the

radiation wavelength, starting with the energy balance:

c
E = eU = hν = h
λ
e elementary charge
U used high voltage of the tube
c velocity of light
h Planck constant
n frequency

hc 12.4
It therefore follows: λ0 = ⇒ λ0 (Å) =
eU U (kV)

The Dauvillier law allows the estimation of the wavelength λmax of the maximum of
the radiation wavelength:

λmax = (between 1.5 and 1.7)λ0

13
XRD for the analyst

The total intensity Iwr of the white radiation wavelength is:

I wr ~ ZU 2i
With Z atomic number
U tube voltage
i used emission current of the tube

It can be derived that:

• the X-ray intensity is linearly dependent on the emission current i
• it is quadratically dependent on the acceleration voltage U
• targets with higher atomic number deliver a higher X-ray intensity, this is caused
by the larger atomic radius (a more effective cross section)

White radiation is unwanted for most X-ray diffraction experiments, the majority
of diffraction experiments require a monochromatic radiation.

3.3.4 Production of characteristic X-rays

In order to understand the principles of the production of characteristic radiation
we will refer to the Bohr ‘shell’ model.

An atom consists of a nucleus with positively charged protons and neutrons

without any charge. The nucleus is surrounded by electrons grouped in shells or
orbitals. The innermost shell is called the K-shell, moving outwards followed by
L-shells, M-shells and so on. The L-shell has 3 sub-shells called LI, LII and LIII. The
M‑shell has 5 sub-shells MI, MII, MIII, MIV and MV. The K-shell can contain 2 electrons,
the L-shell 8 and the M-shell 18. The energy of a specific electron depends on the
shell and on the proton number (i.e. the chemical element). Irradiating an atom
with X-ray photons or electrons with sufficient energy can expel an electron from
the atom (Figure  4).

Figure  4. Production of characteristic radiation

The emission of an electron produces a void in a shell (in the example a void in
the K-shell). This puts the atom in an excited state with a higher energy. The atom
wants to restore the original configuration by releasing the excess energy. This is

14
XRD for the analyst

done by transferring an electron from an outer shell - in this case from the L-shell
- to the void in the K-shell. An L-shell electron has a higher energy than a K-shell
electron. Thus when an L-shell electron is transferred to the K-shell, the energy
excess is emitted as an X-ray photon. The emission energy of the photon is seen as
a certain line in the spectrum. The energy of the emitted X-ray photon depends
on the difference in energy of the shell with the initial void and the energy of the
electron that fills the void (in the example, the difference between the energy
of the K- and the L-shell). Each atom has its specific energy levels, so the emitted
radiation is characteristic for that atom (in this case that of the anode material).

To expel an electron from an atom, the X-rays must have a higher energy than
the binding energy of the electron. If an electron is expelled, the incoming X-ray
photon is absorbed, leading to scattering. If on the other hand the energy is too
high, many photons will ‘pass through’ the atom and interaction with atoms will
only occur occasionally. Figure  5 shows that high energies are hardly absorbed.
If the energy is reduced the absorption increases and the scattering yield goes
up. The highest yield is reached when the energy of the photon is just above
the binding energy of the electron to be expelled. If the energy becomes lower
than the binding energy, a jump or edge can be seen: the energy is too low to
expel electrons from that shell, but is too high to expel electrons from the lower
energetic shells. The figures show the K-edge corresponding to the K-shell, and
three L-edges corresponding with the LI-, LII-and LIII-shells.

Figure  5. Mass absorption coefficient vs. photon energy

Based on quantum mechanics not all transitions are allowed. For instance a
transition from the LI- to the K-shell. Figure  6 gives an overview of the most
important emission lines with their transitions.

15
XRD for the analyst

K-lines L-lines
Figure  6. Major lines and their transitions

Because each atom has its own energy levels, the emitted radiation is specific to
that atom: the so-called characteristic X-ray radiation. This procedure is the basis of
X-ray fluorescence analysis (XRF). The wavelength of the photon depends on the
atomic number Z following the Moseley law:

1
~ Z2
λ
An X-ray tube delivers the characteristic wavelengths of its anode material (most
commonly Cu, Co, or Mo). The characteristic radiation is superimposed on the
white radiation.
6
Kα
5
25kV λmax
4
White radiation or bremsstrahlung
X-ray intensity
(relative units)

3 20
Kβ
Characteristic radiation
2 15

1
10
0 5
0 1.0 2.0 3.0

λ0 Wavelength (Å)

Figure  7. The total X-ray spectrum for various acceleration voltages (Mo X-ray tube)

16
XRD for the analyst

Figure  7 shows the X-ray spectrum for various acceleration voltages, in this case
for a Mo X-ray tube. One can see that if the voltage is too low, the amount of
characteristic radiation is very small. If the excitation voltage is too high, the
amount of white radiation increases over the amount of characteristic radiation.
This leads to a high background in the diffractogram. The photon yields are
described in Chapter 3.3.3.

Each anode material has its own optimal voltage for the production of
characteristic X-rays. This is approximately four times the energy of the Ka line of
the anode material (Table 1).

Table 1. Optimal excitation voltages for different anode materials

Anode material Mo Cu Co Cr
Kα energy (keV) 17.4 8.0 6.9 5.4
Uopt (kV) 60-50 40 30 25-20

As already mentioned, the characteristic spectrum has several lines: the

‘Kα doublet’, consisting of Kα1 and Kα2 radiation, as well as Kβ radiation. In order
to achieve monochromatic Kα radiation, the Kβ line is generally suppressed by a
suitable monochromator (Chapter 4.3.3) or filter.

Table 2 shows some relevant wavelengths and the corresponding attenuation

filters for Kβ radiation.

Table 2. Wavelengths used for XRD and attenuation filters for Kβ radiation (source: ICDD,
International Centre of Diffraction Data)

Anode Wavelength (Å) Kβ-filter

Kα1 Kα2 Kβ
Cr 2.28970 2.29361 2.08487 V
Fe 1.93604 1.93998 1.75661 Mn
Co 1.78897 1.79285 1.62079 Fe
Cu 1.54056 1.54439 1.39222 Ni
Mo 0.70930 0.71359 0.63229 Zr
Intensity relations: (Kα1) : (Kα2) : (Kβ) ≈ 100 : 50 : 25

3.4 A short introduction to crystallographic terminology

Crystal structure
A crystal structure is a unique three-dimensional arrangement of atoms in solid
matter. The crystal structure is composed of a unit cell which is periodically
repeated in three dimensions on a lattice. The spacing between unit cells in various
directions is called its lattice parameters. The symmetry properties of the crystal are
embodied in its space group. An example is given in Figure  8.

17
XRD for the analyst

Figure  8. Crystal structure of NaCl

Unit cell
The unit cell is a spatial arrangement of atoms which is tiled in three-dimensional
space to describe the crystal. The unit cell is given by its lattice parameters. These
are the lengths of the cell edges and the angles between them. The positions of
the atoms inside the unit cell are described by the set of atomic positions (xi,yi,zi)
measured from a selected lattice point.
For each crystal structure there is a conventional unit cell, which is the smallest
unit that has the full symmetry of the crystal. However, the conventional unit cell is
not always the smallest possible choice. A primitive unit cell of a particular crystal
structure is the smallest possible unit cell one can construct such that, when tiled,
it completely fills space. This primitive unit cell does not, however, display all the
symmetries inherent in the crystal.

Crystalline state
The atoms are periodically and regularly arranged in three dimensions. Ideal
crystals are described completely by only one unit cell and its infinite three-
dimensional-periodic repetition (translation symmetry), delivering a long-range
order. Crystalline material leads to pronounced peaks in powder diffractometry.

Amorphous state
In contrast to the crystalline state, in the amorphous state the structure has only a
short-range order of the atoms (or unit cells). This leads to very broad humps in the
diffraction pattern instead of clear diffraction peaks.

Reciprocal lattice
The reciprocal lattice is a mathematical construction that helps to deliver a
description of X-ray diffraction.
Each point (hkl) in the reciprocal lattice corresponds to a set of lattice planes (hkl)
in the real space lattice. The direction of the reciprocal lattice vector corresponds
to the normal to the real space planes, and the magnitude of the reciprocal lattice
vector is equal to the reciprocal of the interplanar spacing of the real space planes.

18
XRD for the analyst

Bravais lattices
The Bravais lattices (see Table 3) are the 14 possible lattices given by translation
symmetry. These simple lattices allow to describe all crystal structures, even
complicated ones (Figure  9).

C I F

Figure  9. Graphical representation of the 14 Bravais lattices

Table 3. The 14 Bravais lattices

System Unit cell lattice parameters angles
triclinic P a b c a b
monoclinic P, C a b c a = b = 90°
orthorhombic P, C, I, F a b c a = b = = 90°
trigonal R a=b=c a=b= 90°
hexagonal P a=b c a = b = 90°, = 120°
tetragonal P, I a=b c a = b = = 90°
cubic P, I, F a=b=c a = b = = 90°
P primitive unit cell
C face-centered unit cell
I body-centered unit cell
F all-face-centered unit cell
Some abbreviations to describe the unit cell:
pc primitive cubic
bcc body-centered cubic
fcc face-centered cubic
hcp hexagonal closed packed

19
XRD for the analyst

Crystal classes
A further classification of the contents of a unit cell can be made by classifying
possible crystal structures into those that obey different symmetry operations:
rotation, glide reflection, inversion and combinations of them. There are 32 crystal
classes (also known as point symmetry groups).

Space groups
If all possible Bravais lattices and crystal classes are taken into consideration, one
ends up with 230 unique space groups. Every crystal has a structure which can be
described by one of the 230 space groups.

Interplanar spacings or lattice planes

It is possible to define imaginary planes in the crystal. These planes are described by
the Miller indices. Their distance is d(hkl ).

Miller indices
The Miller indices are the designation of interplanar spacings, which cut the
axes lengths a, b, c or the axis intercepts in the reciprocal space a/h, b/k and c/l,
respectively. Numbers are reciprocals of the intercepts (see Figure  10). For the (102)
plane for example, you have to go one step in ‘a’ direction and half a step in ‘c’.

Figure  10. Examples of different lattice planes

20
XRD for the analyst

Ewald sphere
The Ewald sphere contains all of the components that are needed to visualize the
diffraction process geometrically. It is a geometric construction which demonstrates
the relationship between
(a) the wavelength of the incident beams of light,
(b) the angle of diffraction for a given reflection,
(c) the unit cell and reciprocal unit cell of the crystal, and
(d) the distance between the crystal and the receiving slit/detector.

A reflection hkl fulfills the Bragg equation, if the lattice point coincides with the
Ewald sphere. The radius of the Ewald sphere is 1/λ (Figure  11).

kh

d k0
θ

k0 vector of the incoming beam

kh scattered beam in h direction

Figure  11. Graphical representation of the Ewald sphere; r =1/λ

3.5 The powder diffractogram

3.5.1 Introduction
A powder diffractogram displays the scattered intensity versus the Bragg angle
(2θ ). It contains a number of peaks (reflections). The peaks are characterized by
their position, intensity and profile. The peaks and the background are the source
of all information of the X-ray powder diffraction technique. Table 4 shows an
overview.

21
XRD for the analyst

Table 4. General survey of the information content of a powder diffractogram

Reflection depends on main information
Position - periodic arrangement of the - qualitative phase analysis
atoms/molecules - lattice parameters
- wavelength used - residual stress
Intensity - crystal structure - quantitative phase analysis
- wavelength used - crystal structure
- sample preparation - preferred orientations/texture
Profile - lattice distortions - micro-strain
- crystallite sizes

The origins of these three fundamental parameters are discussed in more detail in
the following paragraphs.
Intensity (counts)

15000

10000

5000

0
20 25 30 35 40 45 50 55 60 65 70 75
2Theta (°)

Figure  12. Typical diffraction pattern of a mineral mixture

3.5.2 The position of the reflections: Bragg’s law

As a consequence of the regular arrangement of the atoms in solid matter
coherent scattering of X-rays at the atoms results in constructive interference at
certain well-defined angles. This effect is similar to the well-known diffraction of
visible light at gratings with a nm-scaled spacing close to the light’s wavelength
(Figure  13). A crystal can be seen as a three-dimensional grating with a spacing of
a few Ångströms, and diffraction effects can be observed when the wavelength of
the incoming X-ray photon is of similar size.

22
XRD for the analyst

Figure  13. Constructive interference at a grating (visible light)

In 1913 W.H. Bragg and W.L. Bragg described diffraction and interference of X-rays
in a crystal as reflections at the atomic planes of the crystal lattice. The positions of
the reflections are calculated using the optical path difference 2s, with s = d sin θ,
between two reflected rays at neighboring interplanar spacings. As in visible light
optics, maxima are produced for integer multiples of λ.

It follows: 2d sin θ = nλ (Bragg’s law)

d interplanar spacing dhkl (hkl: Miller indices)

θ Bragg angle θB
2θ : angle between incident and reflected beam
n ‘order’ of the interference n = 1,2,3 ..., normally n = 1
(called : reflection of order n)
λ wavelength

Figure  14. Graphical representation of Bragg´s law

23
XRD for the analyst

Discussion of Bragg’s law

1. The interplanar spacing (d) between the different lattice planes is
characterized by the Miller indices hkl (dhkl). So, d100 means the spacing
between the (100) planes.

2. The order n of interferences is described by higher (hkl ), i.e. the second order
of the (111) reflection gets the indices (222). Therefore n = 1 is valid.

3. Bragg’s law is the necessary condition for a reflection, however, certain

reflections may not appear in the diffractogram as a result of destructive
interference, see Chapter 3.5.3.

4. Resolution can be defined as the lowest measurable d-value for a used

wavelength, for sin θ = 1 follows dmin = λ/2.

5. Varying of l causes:
–– the number of measurable reflections to vary, and
–– the angular position of the reflections to vary; also,
–– the separation between two neighboring reflections is changed.

Application: If you use Mo instead of Cu radiation, the reflections move to smaller

angles and get closer together. More reflections can be measured,
but coupled with decreasing resolution.

6. Knowing the d-values, it is possible to determine the lattice parameters (a, b,

c, α, β, γ ) using the so-called ‘quadratic forms’, which will be more complicated
with lower symmetry. Simple examples:

1 h2 + k 2 + l 2
cubic system =
d2 a2
1 h2 + k 2 l 2
tetragonal system = + 2
d2 a2 c
7. Sometimes it is confusing that different terms are used having the same
meaning:
–– Diffraction in the sense of the interaction of waves at a lattice, yielding
interferences.
–– Reflection in the sense of a reflection at the interplanar spacings.

24
XRD for the analyst

3.5.3 The intensity of the reflections

The intensity of a reflection is mainly determined by the following parameters:
• the structure factor, which is determined by
–– the symmetry of the crystal,
–– the positions of the atoms in the unit cell,
–– the number of electrons of the atoms (the amplitude of the diffracted wave
is quadratically dependent on this number).
• the amount of material
• the absorption in the material

All factors that determine the absolute intensity are discussed in Chapter 7.1.

Example: the CsCl (100) reflection

For this particular d-spacing, the wave front constituted of waves originating from
both atom types show an interference that is partly destructive because both
waves are in anti-phase with respect to each other (see wave front A-B, Figure  15),
in other words: the d100 reflection will be weak. Depending on the material and
specific reflections, also amplification or even complete extinction of a particular
reflection can occur.

Figure  15. Wave fronts in CsCl for d100

Systematic extinction is quite common in materials with a high symmetry, for

instance in body-centered cubic (bcc) materials (for example α-Fe or W) only those
reflections obeying the rule h + k + l = 2n (n is an integer number) are visible. In
other words: the (100) and (111) reflections are not observed, the diffractogram
starts with the (110) reflection.

3.5.4 The shape of the reflections

The factors that influence the width and the overall shape of the reflections can be
divided into two main categories:

25
XRD for the analyst

–– Instrument-related effects: determined by the diffractometer geometry, the

particular X-ray optical components and their settings, as well as the detection
system. This is discussed extensively in Chapter 5.
–– Sample-related effects: mainly the average crystallite size and the micro-
strain resulting from defects in the crystal lattice. This is further described in
Chapter 9.3.

3.6 Overview of X-ray scattering techniques

3.6.1 Single crystal XRD

In single crystal X-ray diffraction, a single crystal is rotated around various axes
in order to find a large number of different reflections. The atomic arrangement
within the crystal (the crystal structure) can be determined from the angular
positions and the intensity of these reflections.

A four-circle goniometer is required in order to observe all possible reflections.

Single-crystal diffractometers are dedicated instruments, mainly used in research
institutes and departments.

3.6.2 Powder diffraction

In X-ray powder diffraction, the sample consists of an infinitely large number of
small crystallites, ideally randomly oriented with respect to each other. Because all
orientations are present, it is only necessary to vary the angle of incidence and the
angle of diffraction. A powder diffractogram is obtained by counting the detected
intensity as a function of the angle between the incident and the diffracted beam.

3.6.3 Special X-ray techniques

SAXS (small-angle X-ray scattering)
SAXS is an analytical method of determining the structure of particle systems in
terms of average sizes or shapes. The materials can be solid or liquid and they can
contain solid, liquid or gaseous domains (so-called particles) of the same or another
material in any combination.
Because the SAXS technique looks at particle distances instead of atomic distances,
the effects appear at very small scattering angles near the primary beam. Many of
these measurements can be done on a standard powder system like X´Pert Powder
or Empyrean. The experiments are carried out in transmission geometry, using
X-ray mirrors and a dedicated collimation slit system. There are special cases which
require a dedicated SAXS instrument.

26
XRD for the analyst

PDF (pair distribution function) analysis

Pair distribution function analysis is a technique to investigate all kinds of material,
like amorphous and nanocrystalline materials, or even liquids. This technique
determines average distances between neighboring atoms.
One can calculate or refine a structure model by mathematical treatment of the
scattering data. PDF analysis can be done with a standard laboratory diffractometer
by using short wavelengths like Mo or (better) Ag radiation. Short wavelengths
lead to a large set of recorded d-values and provide more information for
subsequent mathematical modelling.

High-resolution XRD
High-resolution X-ray diffraction (HR XRD) is widely used to investigate the match
of heteroepitaxial layers to a single crystal substrate. These layers have very small
differences in their d-spacing compared with the substrate. Thus the reflections
of substrate and layer have a very close distance in 2θ. This requires a highly
monochromatic X-ray beam with very low divergence in combination with a high-
resolution goniometer.

The technique is commonly used in the research and production of compound

semiconductor materials and is described extensively in the book ‘X-ray Scattering
from Semiconductors’ by Paul F. Fewster (ISBN 1-86094-360-8).

X-ray reflectometry (XRR)

When X-rays penetrate the interface between two materials with a different
density (ρ) the X-rays can be refracted or even reflected, depending on the density
difference, the wavelength of the incoming beam and the angle of incidence. Layer
systems on a substrate produce both constructive and destructive interference. The
measurement of the reflection intensity versus 2θ leads to a reflectivity curve. The
shape of this curve allows characterization of:
–– layer thickness
–– layer density
–– surface / interface roughness
–– quality of layers / interfaces

3.7 General terms used in X-ray powder diffraction

Diffractogram (or diffraction pattern)
A diffractogram is a representation of intensity vs. diffraction angle, which is in
contrast to other ‘spectra’, representing intensity versus energy or wavelength.

Resolution
In powder diffraction, resolution is defined as the ability to separate two (or more)
neighboring reflections. In single crystal diffraction it is defined as the lowest
possible d-value, which can be measured with an instrument. In small-angle X-ray
scattering it is the highest possible d-value.

27
XRD for the analyst

Particle size and crystallite size

XRD line profile analysis is used to determine the crystallite sizes. The crystallite size
corresponds to the size of the coherent scattering domain. Therefore estimations
of the average crystallite size from X-ray diffraction generally lead to smaller values
than particle size determinations.
Particle sizes are normally determined using special particle size analyzers or
electron microscopy methods, but SAXS also provides information about particle
sizes, typically in the 1-100 nm range.

Crystallinity
Crystallinity describes the percentage of the crystalline part in a mixture of
crystalline and amorphous materials (known as the crystallinity index or %
crystallinity). Note that crystallinity is often synonymously used to describe the
quality of the crystal itself in terms of lattice defects, micro-strain etc.

Measurements at low angles

‘Low-angle diffraction’ or ‘small-angle diffraction’ are terms used for several, very
different, techniques:

1. The classical small-angle X-ray scattering (SAXS) as described in Chapter 3.6.3

–– measurements are done very close to the primary beam
–– is used for size determination of particles or pores

2. The so-called ‘thin film’ measurements

–– performed in parallel beam geometry on a standard goniometer. The
incident angle is very small compared to the diffracted beam angle. It is used
for phase analysis of the sample surface or surface layers. Variation of the
incident angle allows the analysis of graded layers or multi-layer systems.

3. Qualitative phase analysis

–– measurements at low angles for the phase analysis of substances with large
lattice parameters (for example: organic materials)

4. Reflectometry as described in Chapter 3.6.3

–– investigation of layers using the total reflection of the X-rays at layer
interfaces (for example: multi-layers, NiC, WC, TaSi, Ta (see Figure  16))
–– interferences are caused by density differences at the interfaces of the layers.

28
XRD for the analyst

Figure  16. Example of a reflectivity curve of a multi-layer sample

29
XRD for the analyst

4. The X-ray diffractometer

4.1 Introduction
In a powder diffractometer, the X-rays produced by the tube pass through primary
optical components, irradiate the sample, are diffracted by the sample phases, pass
secondary optical components and enter the detector. By varying the diffraction
angle (2θ, the angle between the incident and the diffracted beam) through
movements of tube or sample and detector, intensities are recorded to create a
diffractogram.

Depending on the diffractometer geometry and the type of sample, the angle
between the incident beam and the sample is either fixed or variable, normally
coupled to the diffracted beam angle.

4.2 Geometries
There are two main methods to investigate a powder sample with X-rays:
• Reflection geometry: the X-rays are scattered by a flat sample surface,
• Transmission geometry: the X-rays pass through an X-ray transparent sample,
which can be prepared as:
–– a sample between foils,
–– a thin solid sample, transparent for X-rays,
–– a sample in a glass capillary.
The preferable method depends on the sample type as discussed in the following
sections.

4.2.1 Reflection geometry

Figure  17 shows a typical diffractometer setup in the Bragg-Brentano, or reflection
geometry. This geometry is the most commonly used geometry for phase analysis.
The focal spot of the tube, the sample surface and the detector slit are positioned
on the so-called focusing circle.
In addition the focal spot of the tube and the detector slit are positioned on the so-
called measuring circle (here the sample surface is the circle center). But, because
the sample is normally flat, the beam path is para-focussing. In a real focusing
geometry, the sample should be slightly curved to exactly match the focusing circle.

30
XRD for the analyst

X-ray tube Detector

Divergence slit
Beta-filter
Soller slits Soller slits
Anti-scatter slit

Sample

Figure  17. Classical powder diffractometer setup in Bragg-Brentano geometry with components for
reflection measurements

Deviations in sample height lead to a shift of the position of the reflections.

For example moving the sample upwards will shift the 2θ value of a particular
reflection (see Figure  18) to higher angles.

Figure  18. Effect of sample displacement with focusing geometry

In the Bragg-Brentano geometry, the diffracted angle is always twice the incident
angle. In a traditional arrangement the diffractometer works in the θ/2θ-mode, i.e.
the tube is fixed and a 1:2 coupled movement of sample and detector is performed.
Most current vertical diffractometers use the θ/θ-mode, where the sample always
stays horizontal and tube and detector perform a 1:1 movement. This setup has
some advantages:
• no powder spillage at high angles, even when spinning is used
• possibility to measure liquid or molten samples (non-ambient XRD)
• ability to measure very large samples on corresponding sample platforms or
positioned not fixed to the goniometer

31
XRD for the analyst

4.2.2 Transmission geometry

In order to realize a focusing setup in the transmission geometry, an additional
focusing element is required between the X-ray source and the sample. This can be
e.g. a focusing multilayer mirror or a focusing curved monochromator. The beam is
focused through the sample on the (1D or line) detector.

Figure  19 shows a typical transmission beam path. The focus on the detector circle
results in a very high resolution.

Figure  19. Sketch of typical transmission setup for capillary measurements, using focusing X-ray
mirror and line detector

4.2.3 Parallel beam geometry

In a parallel beam geometry diffractometer (ideally equipped with an X-ray mirror
and a parallel plate collimator), sample height variations do no longer influence
the peak positions (see Figure  20). A disadvantage of this geometry is that a 1D
position-sensitive detector can not be used.

Figure  20. Parallel beam geometry and effect of sample height variation

32
XRD for the analyst

4.2.4 Microspot analysis

Microdiffraction experiments require a small irradiated area. Special optics like
mono-capillaries are used, together with e.g. a 1D or 2D detector like PIXcel3D. This
technique allows the investigation of sample areas less than 1 mm2.

4.3 Optical components in the X-ray beam path

The optical path of a diffractometer can be divided in an incident and a diffracted
beam path. These two different paths require different optical modules, depending
on the technique and application. Typical optical components in the incident beam
are divergence slits and mirrors, while in the diffracted beam path receiving slits
and parallel plate collimators in combination with point detectors or position-
sensitive detectors, sometimes in combination with monochromators, are used.

4.3.1 General requirements

The quality of an X-ray powder diffraction pattern is to a large extent determined
by the choice of the optical components and their performance. Typically the
following parameters are important for good quality diffractograms:
–– high resolution of the reflections
–– high intensity of the reflections
–– low background

A standard Bragg-Brentano diffractometer is equipped with the following

components for para-focusing geometry:
–– Soller slits to define the axial divergence of the incident and diffracted beam
–– primary divergence slit to define the illuminated length and mask to define the
width of the beam
–– β-filter and/or monochromator(s)
–– receiving and anti-scatter slits in combination with point detectors, or
–– anti-scatter slits in combination with position-sensitive detectors

Further optical options for specific applications with other than focusing geometry
can be:
–– multi-layer X-ray mirrors
–– monocapillaries
–– polycapillary lenses
–– hybrid monochromators
–– parallel plate collimators

A typical setup of a Bragg-Brentano diffractometer is shown in Figure  17.

4.3.2 Slit optics for Bragg-Brentano geometry

In a diffractometer the primary X-rays (emitted either from the line or point
focus of the tube) have to be conditioned in a way that they just illuminate the
sample. In a Bragg-Brentano setup the sample is illuminated by using a divergent
33
XRD for the analyst

beam, defined by a divergence slit. The divergence is substantial for the focusing
principle, so that the reflected beam from the lattice planes is focused on the
receiving slit in front of the 0D or 1D detector. The distance between the focus and
the sample is the same as between sample and receiving slit/1D detector.

4.3.2.1 Divergence and anti-scatter slits

Incident beam
The divergence slit settings have to be selected in a way that the illuminated area
equals – but not exceeds – the sample size. This produces optimum intensities and
prevents over-illumination. The use of smaller divergence slits leads to slightly
sharper peaks, because flat samples do not allow perfect focusing (therefore called
para-focusing geometry). On flat samples, the focusing condition is only valid
in the middle of the sample. On the other hand, smaller divergence slits reduce
intensity.

Diffracted beam
The anti-scatter slit assures that just the reflected beam and no air scatter reach the
detector. The slit size corresponds to the divergence slit size. The anti-scatter slit
is followed by the receiving slit. The receiving slit is placed at the focal point. The
receiving slit size defines the resolution and the intensity. Smaller slits give higher
resolution and lower intensity and vice versa. The size of the anti scatter slit has
to match the size of the divergence slit to observe just the illuminated length. The
receiving slit has to be set according to the resolution or intensity needed for the
application.

Programmable slits
Programmable divergence and anti-scatter slits can be used both in fixed and in
automatic/variable mode. The difference between the modes is:
–– In fixed mode the length of the irradiated (and observed) area on the sample
changes during a scan. The irradiated volume remains constant, the so-called
measurement with constant sample volume.
–– In automatic (or variable) mode the length of the irradiated (and observed) area
on the sample does not change during a scan. The irradiated length remains
constant, the so-called measurement with constant sample area.
The automatic divergence and anti-scatter slits of the X´Pert PRO and Empyrean
diffractometers use two independently controlled knifes and are controlled to
assure symmetrical sample illumination even at very low angles.
The automatic anti-scatter slit on X’Pert PRO and Empyrean diffractometers
provides additional functionality: together with a motorized receiving slit
or a position-sensitive detector it can define a beam tunnel for reflectivity
measurements, small-angle X-ray scattering or simple parallel-beam path
applications.

34
XRD for the analyst

Typical use of the different divergence slit modes:

Fixed mode:
for phase analysis and Rietveld (structure) refinement, because the diffractograms
match the data of the ICDD database (see Chapter 6.2). The constant sample
volume is a prerequisite for Rietveld analysis.

Automatic mode:
–– for measurements at low angles to reduce the influence of primary beam scatter
–– to improve the counting statistics at higher diffraction angles
In general, fixed slit intensities can be converted to variable slit intensities and vice
versa with algorithms available in e.g. the HighScore phase analysis software.

Figure  21 demonstrates the change of the irradiated length with the 2θ angle for a
range of slit sizes (from 1/32° to 2°) and a measuring circle with R = 240 mm.
Note that at low angles the illuminated length increases drastically.

Figure  21. Slit divergence vs. irradiated length

4.3.2.2 Soller slits

Soller slits consist of a set of thin parallel metal plates. They can be placed in both
the incident and the diffracted beam path. Only those parts of the beam which
are parallel or very close to parallel to the diffraction plane can pass the Soller
slit. Hence they limit the axial divergence of the incident and diffracted beam.
The opening angle of a Soller slit is defined by the length and the distance of the
plates. The typical Soller slit has an opening angle of 0.04 rad, but other sizes (0.08,

35
XRD for the analyst

0.02 and 0.01 rad) are available. A smaller axial divergence improves the symmetry
of the peaks, especially at low angles, as well as the resolution (smaller ‘full width
at half maximum’, FWHM), but leads to lower intensities. The optimum choice
depends on the required resolution and intensity.

4.3.3 Optical modules

In addition to slit systems there are other optical modules available for the incident
and diffracted beam, which can be useful for several applications.

Task Optical module(s) used

Suppression of unwanted wavelengths, Primary or secondary monochromator,
for example white radiation or Kα2 multi-layer mirror, filter
Parallel or focused beam Mirror, collimator or lens
Increase of flux of the incident beam Mirror or lens
intensity
Reduction of beam size and/or intensity Collimator/mask

Kβ filter and monochromator

In order to obtain a good diffractogram it is important to reduce or eliminate the
following unwanted effects:
–– the Kβ radiation
–– the Kα2 radiation
–– the fluorescent radiation of the sample
–– air scatter
–– bremsstrahlung (tube background)

Kβ filters are thin metal foils, which can be mounted in the primary or secondary
beam path. They are usually used in the diffracted beam path to reduce the
influence of sample fluorescence. The filter suppresses the beta emission line
by utilizing the material-specific absorption edge. As shown in Figure  22, a Ni
filter, used with Cu radiation absorbs >99% of the Kβ part but also lowers the Kα
radiation by ~50%. Tungsten (W) L-lines, mainly present when using older tubes,
are also suppressed.

36
XRD for the analyst

Figure  22. Absorption curve of a Ni filter (red)

The materials used as Kβ filters are normally one atomic number below that of the
anode material (Table 5).

Table 5. Relationship between anode and filter material

Anode material K filter material
Cr V
Fe Mn
Co Fe
Cu Ni
Mo Nb or Zr
Ag Rh or Pd

When using X-ray mirrors or primary monochromators, the use of a β filter is not
necessary, since Kβ is completely suppressed by these optics.

Primary monochromators consist of one or more single crystals. They are positioned
in the beam path in such a way that the incident beam on the lattice plane fulfills
the Bragg equation (see Chapter 3.5.2). Since the Bragg equation is only valid for
specific wavelengths at a given angle, the diffracted beam from the crystal is highly
monochromatic. The use of a monochromator always leads to a lower primary
beam intensity, because only a part of the wavelengths is used and intensity is
absorbed in the monochromator crystal. The combination of several adjacent
crystals improves the spectral purity of the incident beam but leads to additional
attenuation of the intensity.

Secondary beam monochromators consist either of a flat or a curved single crystal.

The commonly used single monochromator in the diffracted beam behind the
receiving slit eliminates the Kβ radiation, but the complete Kα doublet passes to
the detector.

37
XRD for the analyst

Figure  23 shows the beam path when using an incident beam monochromator in
reflection mode. The curved incident beam monochromator is aligned in a way
that just the Kα1 wavelength passes the divergence slit. Fluorescent radiation of the
sample is not eliminated, but the monochromator reduces this effect, because now
only the Kα1 component can excite the fluorescence. Kβ and white radiation are
not present any more. If necessary, an additional secondary monochromator can be
used for further suppression of fluorescent radiation.

Figure  23. Beam path and example picture of Alpha-1 Bragg-Brentano diffractometer

4.4 Detectors

4.4.1 General remarks

X-ray detectors can be classified in three different types:

Point or 0D detector All incoming photons are counted, their position on the
active element is not relevant.
Line or 1D detector Also called position-sensitive detector, i.e. photons are
counted relative to their position on the detector window
in 2θ direction.
Area or 2D detector Similar to the line detectors, but intensities are also
detected perpendicular to 2θ axis.

38
XRD for the analyst

Application-specific requirements
The table below lists all the properties that are of importance for a detector used
in X-ray diffraction:

Property Description
Angular resolution The ability of the detection system to
distinguish between different d-spacings (the
ability to separate neighboring reflections).
Mainly defined by slits in front of a point
detector or the width of the channels of a
position-sensitive detector.
Energy resolution The ability of the detection system to detect
only Kα or Kα1 radiation and suppress
unwanted radiation (for example: Kβ or
sample fluorescence). The point and line
detectors incorporate electronics that allow
using a (variable) pulse height discrimination,
which acts like a band pass filter. The energy
resolution of such a filtering is usually
moderate, so that additional means of energy
filtering such as Kβ filters or diffracted beam
monochromators have to be used.
Count rate linearity The intensity at which the recorded intensity
starts to deviate more than 5% from the
incident intensity, above this value, the
deviation will become larger until the detector
finally saturates. In extreme cases this leads to
untypical peak shapes with a minimum at the
peak tip position.
Detector noise The noise level of a detector, in most cases
<< 1 cps.
Dynamic range The counting range of a detector, defined as
the difference between noise level and the
highest intensity possible without saturation.
Measurement time The time that the detector needs to measure a
certain angular range.
Possibility for in-situ Determination of changes in the sample as a
measurements function of an external parameter or time, for
example: temperature-controlled experiments,
humidity, crystallization and so on.
Active length or active area The angular range that is covered by a line
detector or the size of the detecting element
of a point detector (important for grazing
incidence or parallel beam experiments).

39
XRD for the analyst

What a detector really sees

In a polycrystalline material all reflected beams coming from a certain lattice plane
(with a certain d-spacing) form the Debye-Scherrer ‘cones’, centered around the
incident beam.
Figure  24 helps to understand this principle. With a standard diffraction system
using slits or line detectors just a part of that cone is used for the measurement
because point and line detectors measure just one segment of the Debye-Scherrer
rings (yellow lines). This is partly compensated by using the line focus of the
X-ray tube together with Soller slits. In this case many parallel incident beams
hit the sample so that the recorded signal consists of the overlapping tops of the
diffraction rings of the same d-value.

Figure  24. Debye-Scherrer setup with some diffraction cones

4.4.2 Detector types

In modern powder diffractometers different types of detectors can be used,
depending on the application. In the following the most common types are
presented.

Point detectors
Two types of point detectors are widely used for almost all diffraction applications:
gas-filled proportional counters and scintillation counters. The selection of the
appropriate detector heavily depends on the choice of tube anode material.

Gas proportional counter

Gas-filled proportional counters consist of a metal cylinder with an entrance
window for X-ray photons. The cylinder is cross-sected by a thin wire attached to
a high-voltage positive potential. The detector is filled with a noble gas, either
argon or xenon. The incoming X-ray photon ionizes the atoms of the counting

40
XRD for the analyst

gas. The ionization electrons are accelerated to the wire and are ionizing further
atoms (charge avalanche). At the counting wire an impulse with an amplitude
proportional to the energy of the absorbed X-ray photon is generated and
recorded by a pulse-height discriminator.
This detector type is the optimum choice for standard wavelengths as Cu Kα, Co
Kα, and Cr Kα radiation. The detector has a very low background and a good
energy resolution.

Scintillation counter
Scintillation counters consist of a crystal and a photomultiplier. The crystal is
capable to convert an X-ray photon into a UV or visible photon. The incoming X-ray
photon is absorbed in the crystal (for example: NaI, doped with Tl). The resulting
light impulse is recorded by the photomultiplier as an amplitude proportional
to the energy of the absorbed X-ray photon. Scintillation detectors have a lower
energy resolution than gas proportional counters for Cu Kα radiation. However,
they are preferred for short wavelengths (e.g. Mo Kα or Ag Kα).

The main properties of point detectors regarding their applications are

–– high dynamical range (~106)
–– possibility to use a diffracted beam monochromator
–– low (background) noise
–– can be used with focusing or parallel beam geometry
–– cost-effective

Line detectors
Line detectors cover a certain angular range in 2θ. They resemble a large number
of adjacent single detectors. Line detectors are thus much faster than point
detectors. Different types are on the market. The first commercial line detectors
used a wire and a counting gas. Since 2001 semiconductor detectors define the new
standard. The PANalytical X'Celerator with its unique semiconductor RMTS (Real
Time Multiple Strip) technology was the first detector of that kind on the market.
The X'Celerator overcame the problems of the gas-filled detectors, which have a
small dynamic range and need regular maintenance because of aging of counting
gas and detector wires. The current state-of-the art PANalytical PIXcel3D detector
consists of smaller strips than the X’Celerator. The strips are subdivided in segments
so that the PIXcel resembles a solid-state area detector. It has a better resolution
and the highest linearity of all detectors available for laboratory XRD equipment.
The detector can be used in point detection mode, in line detection mode and
as an area detector. This makes it also the ideal detector for measurements of
epitaxial layers, reflectometry and small-angle X-ray scattering, which require a
very large dynamic range. Secondary monochromators are exclusively available for
these detectors, to improve energy resolution and suppress sample fluorescence.

Most line detectors have an active length of a few degrees so that the deviations
from the ideal focusing geometry are not too large. The use as a scanning detector
further reduces this defocusing effect. Line detectors are primarily designed for
focusing geometry, but can also be used with parallel beam geometry in reflection

41
XRD for the analyst

or transmission. In order to maintain an acceptable resolution in these cases, the

width of the beam has to be small.

The main properties of line detectors regarding their applications are:

–– very fast measurements and/or improvement of counting statistics
–– investigation of time-resolved processes
–– small sample amounts and areas can be investigated
–– excellent angular resolution (in case of solid-state types)
–– outstanding linearity (in case of PIXcel)

Area detectors
Area detectors can record larger parts of the Debye rings or even complete rings
at low angles. They are suited for special applications like micro-diffraction and
texture analysis. They are also widely used for single crystal diffraction. Different
designs are on the market.

The main properties of area detectors in powder diffraction are

–– very fast measurements and/or improvement of counting statistics
–– usage of a bigger part of the Debye-Scherrer rings, which allows analysis of small
spots (micro-diffraction) and small sample quantities.
–– improved analysis of highly textured samples
–– resolution sometimes less than with line detectors, but solid-state detector like
PIXcel3D without compromise

4.4.3 Comparison of the detector types

Properties: Point detector Line detector Area detector
Irradiated area From large to small From large to small Small
Sample Integral Integral Small spot
information (micro-diffraction)
Influence of Not directly visible Not directly visible Directly visible
preferred (spotty rings)
orientation and
grain size effects
Angular resolution Excellent Excellent Moderate to
excellent
Data recording Low High High
speed
Energy resolution Very high High Low to high
Linearity High High to very high Moderate to very
high

42
XRD for the analyst

Application areas of the different detector types:

Application Point detector Line detector Area detector
Phase Yes Yes Yes
identification
Quantification Yes Yes Yes
based on one or a
few peaks
Quantification Yes, but slow Yes Yes
based on full
pattern analysis
Residual stress Yes (especially Yes Yes
with parallel beam
geometry)
Texture Yes Yes Yes
Micro-diffraction Yes, but slow Yes Yes
Reflectivity Yes Yes No

43
XRD for the analyst

5. XRD data collection

5.1 Sample preparation
General remarks
–– ensure that the sample is representative
–– do not treat the original sample more than necessary
–– if milling is required, be as careful as possible
–– select the best measuring geometry depending on the sample and the
information needed
–– in reflection mode θ /θ setup is preferred.

5.1.1 Ideal powder

The ideal powder has no internal stress and has no crystallographic preferred
orientations. The optimal particle size of powder diffraction samples is in the range
of 1 to 5 μm.

If the powder is too coarse this results in single points on the Debye-Scherrer ring.
Therefore point or line detectors do not recognize all reflections which leads to
incorrect intensity ratios.

If crystallites are much smaller than 1 μm, reflections are broadened. This effect can
be used for crystallite size determination, see Chapter 9.3.
Table 6 shows some of the possibilities and risks involved in the milling process.

Table 6. Milling processes, their possible problems and remedies

Problem Possible consequences Possible remedy
Heating of the –– phase transitions use easily vaporizable
powder –– oxidation liquids (for example:
acetone)
Plate-like materials –– mills very badly use liquid N2 to make
(for example Mica) –– texture effects the material brittle
Too long grinding –– destruction of crystal lattice grind no longer than
–– sample becomes amorphous necessary
Inhomogeneous The sample can be a mixture of
mixtures hard and soft material and is
therefore more difficult to treat

5.1.2 Sample types

The different X-ray powder diffraction techniques can investigate all kinds of
samples and sample shapes. These include bulk materials and powders, wafers and
thin layers, gels and liquids, polished and rough surfaces, very small quantities, and
air- or humidity-sensitive materials.

44
XRD for the analyst

Figure  25 to Figure  27 show different sample holders for reflection, transmission

and capillary measurements.

Figure  25. Sample holder for reflection measurements

Figure  26. Sample holder for transmission measurements

Figure  27. Capillary sample mounted on goniometer head

45
XRD for the analyst

5.1.3 Reflection mode

In reflection geometry the surface of the samples should fit the focusing circle
of the instrument as best as possible to prevent peak shifts. Polished and rough
surfaces may be investigated as well as gels or liquids. On rough samples, a parallel
beam geometry is preferable.
The sample is often rotated (sample spinning) to improve the particle statistics.

Especially for small-angle diffraction a knife edge (sometimes called a beam knife)
close to the surface of the sample is useful to reduce the background produced by
air scattering.

Bulk materials / powders

Make sure that the surface of the sample is at the correct height in the center of
the measuring circle.

Gels, liquids and loose powders

The θ /θ geometry is the preferable arrangement, since the sample always stays
horizontal. In a θ /2θ diffractometer the incident beam angle ω needs to be fixed so
that the sample does not spill; this technique however can cause peak broadening
and peak shifts.

5.1.4 Foil transmission

For transmission measurements the absorption of the material plays an important
role. Generally, the ratio of the incident beam intensity I0 and the transmitted
intensity I of the sample should not exceed a factor of 3 to 4. The usable sample
thickness depends on the sample itself, ranging from several micrometers for
highly absorbing material up to 3 or 4 mm thick pharmaceutical tablets.

Powders
Powdered samples are placed between two thin foils (e.g. Kapton or Mylar).

Bulk materials and foils

As long as absorption is not too high, bulk samples can be placed directly in the
sample holder.

Gels / liquids
A special sample holder is needed to fix the material in a special small chamber.

5.1.5 Capillaries
Powder samples sensitive to moisture or texture effects are ideally analyzed in
capillaries. The powder is loosely filled into the capillary without application of
pressure.

The X-ray transparency in the capillary may be improved by diluting the sample
with amorphous substances, for example cork flour, glass and/or lycopodium.

46
XRD for the analyst

Powders
The material is filled in 0.1 to 2 mm thick capillaries. The capillary diameter is
selected depending on the grain size and the X-ray transparency.

Gels / liquids
These materials can be prepared into a thicker capillary. Alternatively, the material
can be spread onto the surface of the capillary.

5.2 Measurements

5.2.1 Optimum measurement conditions

Reflection mode
In general a coupled movement of the scan axes (θ /2θ or θ /θ ) is used (Bragg-
Brentano geometry). Other movement modes are possible, depending on the
application (e.g. fixed ω for grazing incidence measurements of thin layers
or ω=0 for SAXS experiments). Variable or fixed slit settings can be used (see
Chapter 4.3.2). Sample spinning improves the particle (crystallite) statistics.

Foil transmission
The maximum sample thickness depends on the sample material. For successful
transmission experiments the sample should have a low mass. When investigating
thick samples (e.g. a 3 mm pharmaceutical tablet) the sample is normally rotated
(spun) to improve the particle statistics and the center of the sample should be at
the center of the rotation in ω. In general sample spinning improves the particle
(crystallite) statistics.

In addition to sample spinning, tilting the sample in ± ω (wobbled scan) further

reduces the effect of preferred orientation.

Capillary
The capillary is fixed on a goniometer head and adjusted using a microscope or
CCD camera (Figure  27).

The incident beam is collimated so that it matches the diameter of the capillary
as good as possible. This will reduce air scattering to a minimum and will lead to
a low background at low angles. The ω angle is fixed at zero and the detector
moves on the 2θ circle. The capillary rotation decreases the influence of preferred
orientations.

5.2.2 Resolution
The resolution of a diffractometer is defined by its ability to differentiate neighbor-
ing reflections (see Chapter 3.7). In order to obtain an optimal resolution, d­ ifferent
geometries with certain properties can be used. The maximum achievable is the

47
XRD for the analyst

sum of the properties of the sample and the diffractometer, i.e. X-ray tube, goni-
ometer radius, incident and diffracted beam optics and detector.

General remarks
Assuming that the sample is fine-grained (see Chapter 4.3.1), unstressed and
without lattice dislocations, the resolution will be improved by
–– increasing the radius of the measuring circle
–– using pure Kα1 radiation instead of the Kα1,2 doublet
–– using longer wavelengths
–– using smaller Soller slits
–– using narrower slit widths:
The divergence slit and Soller slit have a substantial effect on the attainable
half widths of reflections. This is particularly true for the Soller slits when you
consider how they determine the cutout from the Debye-Scherrer cone in the
plane of measurement.
–– making the sample as thin as possible. For
reflection fine powder on zero background holder
foil transmission low amount of powder between the foils
capillary smallest as possible diameter.

Small step sizes in 2θ are necessary when measuring peaks with a small FWHM (at
least five measurement points over the FWHM are required).

In general:
1. A compromise is often necessary, because the possibilities shown here usually
result in a decrease of the measured intensity.

2. With a standard setup FWHMs of approximately Δ2θ = 0.06° to 0.12° over

the whole angular range can be achieved. Higher resolution is possible using
different measurement strategies and optimized setup.

5.2.3 Low quantities

The analysis of low quantities usually leads to problems with limits of detection
(LOD) or limits of quantification (LOQ) (see Chapter 7.2.3).

For best results the incident beam should illuminate as many sample particles as
possible, so careful selection and setup of primary and secondary optics is necessary.
It may be helpful to perform the measurement without spinning the sample, when
particles do not stick to the sample holder.

Remark: If a sample is visible and can be prepared, a useable diffractogram can

be expected.

Reflection mode
The substances should be fixed on a on a 'zero-background holder' (e.g. silicon
(510) or (511) oriented or quartz (6° offcut to c axis)). Also an amorphous
substrate such as glass can be used, but it leads to higher undesired background.

48
XRD for the analyst

Alternatively the sample can be mounted on a special micro-diffraction stage,

which uses a goniometer head for positioning and spinning.

Foil transmission
A small amount of the sample material should be carefully placed between the two
foils. Using a smaller beam mask helps to reduce air scattering.

Capillary
The amount of material in the capillary should be sufficiently illuminated by the
primary beam. If the amount of sample material is insufficient to entirely fill the
capillary one can partially fill it with a supporting substance and subsequently with
the sample so that the sample material is placed in the X-ray beam. Alternatively
the material itself can be diluted with a reflection-free powder (cork powder, glass
and/or lycopodium) to increase the total sample volume.

5.2.4 Air-sensitive / hygroscopic materials

For the analysis of air-sensitive/hygroscopic samples the preparation should be
done immediately before the measurement starts. The measurement must be
performed as quickly as possible and low counting statistics have to be expected.
Note, that the diffractogram may represent different substances at low and at high
2θ angles, e.g. different hydrates, depending on the reaction rate of the sample
with air or moisture.

Reflection mode
The sample is prepared in a special sample holder that can be covered with a foil.

Foil transmission
Prepare the sample between foils, or, if it is thick enough, in a closed sample holder
(only for low absorbing materials).

Capillary
The use of a sealed capillary is usually the best choice when investigating air-
sensitive or hygroscopic materials.

5.2.5 Minimization of texture

Minimizing the effect of preferred orientation(s) and texture is a task to overcome
one of the main problems in qualitative and quantitative phase analysis, see
Figure  28.

Rotating (spinning) the sample only improves the particle statistics. The influence
of preferred orientations may be reduced by oscillating the sample in an additional
direction, for example: ± Δω (wobbled scan).

49
XRD for the analyst

Figure  28. Texture effect through different sample preparation, resulting in missing peaks

Reflection mode
Texture problems are mostly visible when using reflection geometry.
Preferred orientation caused by the preparation of powder measurements can be
minimized by 
–– avoiding smoothing of the surface in one direction
–– back-loading of the sample into the sample holder
–– filling the powder against a lateral glass plate
–– roughing the surface
–– spray-drying the sample on a plate

Note: for clay mineral analysis, texture is sometimes desired to study the swelling of
minerals (determination of moisture absorption) or to simplify the phase analysis.
A special preparation method is used to maximize the preferred orientation of the
platy clay minerals. This method pronounces the (00l) reflection and allows a better
peak position determination (see also Figure  28).

Transmission mode
To enhance the (hk0) reflections, an additional movement of the sample in ± Δω
can help to decrease a texture regarding the (00l) reflections. The influence of
preferred orientation is significantly reduced.

Capillary
The investigation of loosely filled powders in capillaries is clearly advantageous to
overcome the texture problem. Both the rotation of the capillary and the possible
movement of the particles inside the capillary reduce texture effects.

If needle-shaped crystals have to be investigated, putting them into a capillary

is the preferred way of preparation. Furthermore it eradicates the need for any
further handling such as grinding.

50
XRD for the analyst

5.2.6 Thin layers

Thin layers are often defined differently. ‘Thin’ can mean several micrometers,
which can be for example a corrosion layer on a metal or can be a few nanometers
as a coating on glass. The penetration depth, dependent on material, wavelength
and incidence angle, can be just a few microns, so ‘thin’ means sub-micron range
down to several nanometers. The material can be everything from single crystal
to amorphous. The investigation is normally performed using reflection geometry.
Only in a few cases the film can be detached from the substrate and then measured
in transmission mode.

In thin film experiments the intensity of the layer peaks is not comparable to the
intensity we get from powder samples, because the number of reflecting lattice
planes is much less. Besides that the sample is not infinitely thick. This requires a
special beam path to optimize the intensities. Two options are widely used:

1. Usage of parallel beam geometry with grazing incidence of the primary

beam. The sample surface is completely irradiated over the full angular range.
Furthermore the grazing incidence beam is not diffracted by the substrate so
that strong substrate signals are suppressed.

2. If parallel beam geometry cannot be used, it helps to use programmable slits in

the primary beam, set to a fixed illuminated length to keep the irradiated area
and therefore the sample volume of the layer constant.

Table 7 shows how the penetration depth changes by varying the incident angle ω
and the wavelength (λ). A brass sample (layer) is used as an example. A penetration
depth d86,5 (delivering 86.5% of the information) is calculated. It can be clearly seen
that the penetration depth can vary between 9.67 µm and 0.25 µm by changing
from Mo Kα, radiation with a ‘normal’ incident angle of 25° to Cr Kα with an ω of
1.0°.

Table 7. Influence of the used wavelength and the variation of the incident angle ω on penetration
depth

Sample: Brass (30 at.% Zn), for effective penetration depth d86,5 (in µm)
Radiation µ/cm-1 w: 25° 10° 5° 3° 2° 1°
Cr Ka 1351 3.11 1.58 1.01 0.66 0.46 0.25
Co Ka 705 6.00 3.05 1.93 1.27 0.90 0.47
Mo Ka 434 9.67 4.93 3.13 2.07 1.43 0.78

Remark: It may be advantageous to use a wavelength with a high absorption to

make sure that only the sample surface is investigated, for example Cr or
Cu radiation to investigate steel surfaces.

51
XRD for the analyst

5.2.7 Rough surfaces

Rough surfaces (rocks, porous substances, etc.) are usually measured in reflection
geometry. The best primary optic is a parabolic X-ray mirror that produces a
parallel beam. To collect the diffracted intensity of a parallel beam a parallel plate
collimator or a diffracted beam mirror is needed between sample and detector (see
also Figure  20).

5.2.8 Standard materials

Validating a powder diffractometer to check the performance requires the use
of certified materials, called standards. This is especially important in regulated
environments such as those encountered in the pharmaceutical industry. Standards
should be stable over a period of time and be easy to prepare for use in the
diffractometer.

The most regularly used standards come from the US National Institute for
Standards and Technology (NIST). Their Standard Reference Materials (SRMs) are
listed in Table 8.

Table 8. Standard materials for XRD as supplied by NIST (main application field marked (x)).
SRM no. Type Application
Quantitative

parameters
Intensities
Reflection
position

analysis

Lattice
Profile

phase

640d Si X X X X
660b LaB6 X X X X
675 Mica low angles
656 Si3N4 (mixture a / b ) X
674b Mixture Al2O3 , CeO2 , X
Cr2O3 , TiO2 , ZnO
676a Al2O3 powder X spiking method
1878a Respirable α quartz X spiking method
1879a Respirable cristobalite spiking method
2910a Ca-hydroxyapatite X X X
1976b Al2O3 disk X X X

52
XRD for the analyst

Currently, there is no NIST certified standard for powder diffraction at low angles.
Nevertheless silver behenate (CH3(CH2)20COOAg) (reference to Powder Diffr. 10
(1995) 91) is widely used for this purpose.

53
XRD for the analyst

6. Qualitative phase analysis

There is a large variety of information that can be extracted from a powder
diffractogram. In this chapter, most attention is paid to one of the most common
types of analysis: the qualitative analysis of mixtures.

6.1 Data processing

The diffraction pattern (intensity I versus Bragg angle 2θ ) is characteristic for each
crystalline substance, and its crystal structure is represented in the position and the
intensity of the reflections. Also, substances with the same chemical composition,
but different crystal structure (for example TiO2, modifications rutile/ anatase/
brookite) differ in their structure and hence in their diffractograms.

The typical sequence of a phase analysis is:

1. A visual inspection of the diffractogram (peak positions, intensities, peak

widths and background shape).

2. Start of a peak search algorithm to get the positions and both absolute
and relative maximum intensities of the reflections. The strongest line is
normalized to 100% (see Table 9).

3. If necessary (graphical) editing of the peak table.

54
XRD for the analyst

Table 9. A typical peak list

Nr. Position [°2q ] d-value [Å] Rel. intensity [%] Intensity (cts)
1 8.1061 10.9074 14.21 648.14
2 16.2197 5.46486 2.13 97.1
3 24.4002 3.64808 1.17 53.19
4 29.4716 3.03086 4.32 196.96
5 33.7833 2.65325 21.43 977.14
6 38.1742 2.35757 100.00 4560.28
7 39.0926 2.30427 10.73 489.48
8 39.4911 2.28194 59.08 2694.4
9 41.7069 2.16568 2.35 106.96
10 45.8081 1.98088 1.48 67.67
11 49.9124 1.82719 1.89 86.06
12 51.0983 1.78753 0.48 21.91
13 55.0748 1.66751 23.3 1062.53
14 55.7635 1.64854 2.65 121.04
15 57.7995 1.59522 0.81 37.04
16 58.9689 1.56635 1.79 81.54
17 61.4021 1.50999 0.28 12.97
18 63.6738 1.46148 0.88 40.33
19 64.5270 1.44421 3.31 150.81
20 66.1805 1.41208 5.40 246.21
21 69.8449 1.34669 23.11 1053.92
22 72.4648 1.30433 3.59 163.69
23 77.5035 1.23163 1.63 74.37
24 81.6514 1.17924 5.03 229.27
25 84.9777 1.14137 2.08 94.96
26 89.9543 1.0907 1.53 69.73

Such a peak table can be used for the search/match procedure. Better intensities
and peak positions are obtained after a profile fitting step has been applied, but
this is not crucial for a correct phase analysis.

Different software routines like for example available in the HighScore software
package allow automatic processing of data, using user-defined parameter
sets, even including reporting to either a printer or a laboratory information
management system (LIMS), as well as trend analysis.

6.2 The search/match procedure; reference databases

In this procedure, the measured diffractogram (with its peak table and/or
profile) is compared with a reference database consisting of experimentally
determined d-values and intensities (d-I tables or stick patterns) or of calculated

55
XRD for the analyst

patterns from crystal structure data. Such a reference database is provided by

the ICDD (International Centre for Diffraction Data), which supplies the PDF
database (Powder Diffraction File, in former times named ASTM and JCPDS). It
is annually extended with a set of new, experimentally determined reference
patterns. New phases are included in the PDF database after passing an extensive
editorial process. Older data (from films) are more and more replaced by digital
measurements.

Since 1998 the database also contains calculated stick patterns, taken from
databases containing crystal structure information, for example: the ICSD
(Inorganic Crystal Structure Data Base) and the LPF (Linus Pauling File). In
some cases, not only the stick patterns but also the structures themselves are
incorporated in the PDF database. This extends the possibilities to perform certain
types of quantitative analyses directly, such as the Rietveld analysis.

ICDD reference databases

PDF-2 Experimentally determined stick patterns and calculated patterns
taken from the ICSD database
PDF-4+ PDF-2 plus calculated stick patterns and structure data from the
LPF
PDF-4/Organics Calculated stick patterns from the CSD (Cambridge Structure
Database) and experimentally determined patterns relevant for
pharmaceutical research (taken from the PDF-2)
PDF-4/Minerals Subfile of PDF4+, containing mineral phases only

Recently also alternative databases have been developed, ranging from freely
downloadable ones calculated from crystal structures, to specialty databases for
niche fields, such as narcotics.

6.3 Cluster analysis

Cluster analysis is a multi-variate statistical method. It greatly simplifies the
analysis of large amounts of data. It automatically sorts closely related scans of
an experiment into separate clusters and marks the most representative scan of
each cluster as well as the most different patterns of one cluster. It is very useful
for e.g. non-ambient studies, control of syntheses or for example zeolites and
pharmaceuticals, to find polymorphs and solvates in drug development and many
other experiments consisting of a large number of measurements.

Cluster analysis is basically a three step process, but can also include an optional
fourth step:

1. Comparison of all scans with each other. The result is a correlation matrix
representing the similarity of any given pair of scans.

56
XRD for the analyst

2. Agglomerative hierarchical cluster analysis puts the scans in different

classes defined by their similarity. The output of this step is displayed as a
dendrogram, where each scan starts at the left side as a separate cluster, and
these clusters amalgamate in a stepwise fashion until they are all united.
3. The number of clusters is estimated by the KGS test (L.A. KELLEY,
S.P. GARDNER, M.J. SUTCLIFFE) or by the largest relative step on the
dissimilarity scale. Also the most representative scan within each cluster is
determined.
4. PCA (principal components analysis) can be carried out as a separate and
independent method to visualize and to judge the quality of the clustering.
The correlation matrix of step 1 is used as input.

Additionally there are cluster validation techniques like silhouettes or fuzzy

clustering available. It is also possible to connect additional properties to the
cluster analysis, for example the temperature. Even different analyses like NMR or
Raman spectroscopy can be clustered together with XRD scans.

57
XRD for the analyst

7. Quantitative phase analysis

This chapter is designed to provide a brief introduction of using XRD measurements
for quantitative analysis.

7.1 Basics
The fundamental condition of the quantitative phase analysis is that the intensity
of the X-rays diffracted by a certain phase is proportional to its amount in the
phase mixture (H.P. KLUG and L.E. ALEXANDER).
The following equations refer to the investigation of crystalline phases. The
samples are powder mixtures in the sense of the statistical demands. The conditions
for the application of the kinematic theory must be fulfilled.

The intensity Ihkl of a reflection is given by:

2
 F 
I hkl = K 0 a  hkl  H P L
 Vuc 
with
a absorption coefficient
H multiplicity factor
P polarisation factor
L Lorentz factor
Vuc volume of the unit cell
I 0e 4λ 3Q0
K0 constant for the equipment: K 0 =
me 2c 4
with
I 0 intensity of incident or primary beam
e elementary charge
λ used wavelength
Q0 cross section of the incident beam
me mass of the electron
c light velocity
2πi(hx j +ky j +lz j )
Fhkl
structure amplitude: Fhkl = Σ f je-M e
with
fj scattering factor of each atom j
e-M temperature factor
h,k,l Miller indices
x,y,z coordinates of the atoms

To the percentages by volume vk of the individual phases k in a mixture applies

their diffracted intensity Ik:
I k = K 0 Rk Ak vk

provided that Σ vk = 1.

58
XRD for the analyst

The absorption coefficient Ak can be set ½µk , whereby the attenuation coefficient
µk has to be possibly modified for a phase k in the mixture with other phases (then
named µk’).

General remarks
Quantitative phase analysis is usually implemented automatically using calibrations
or the Rietveld method. Some fundamental requirements should be met in order to
get the most reliable results.
–– Use the integral intensities of the reflections.
–– Use as many reflections as possible, but with different indices. Reflections with
the same indices may falsify the result, if they present a preferred orientation
(e.g. 220 and 440 reflection).
–– Take into account a possible influence of the absorption contrast, also called
micro-absorption, especially if a spiking material has to be selected.
–– Take care of the influences of texture through careful milling and/or sample
preparation and sample movements (at least spinning) during the measurement
in an optimal measuring geometry.
–– Check the reproducibility of the quantitative result by repeating the experiment
a couple of times, preferably with a complete new preparation and handling, or
even the use of automatic sample preparation equipment in order to eliminate
operator dependencies.
–– Double-check critical results by validation with an alternative technique, for
example: X-ray fluorescence, cathodoluminescence or another microscopic
method.

The following chapters describe possible ways of carrying out a quantitative

phase analysis with respect to the sample possibilities, attenuation effects, micro-
absorption, preferred orientations, automated procedures and amorphous
contents, from classical methods up to the Rietveld method.

7.2 Special problems

7.2.1 Preferred orientation

Preferred orientation (unwanted texture) is usually the main problem for any
quantitative phase analysis. For bulk solid materials there is no solution to avoid
preferred orientation. For powder samples, one can reduce the influence of
preferred orientations by a careful preparation or choosing different measurement
parameters or diffraction geometries (e.g. wobbled scans or transmission
diffraction).

Preparation
The sample is milled until the ideal particle sizes of 1 to 5 µm are achieved. Because
the preparation effect is especially important for reflection mode measurements,
the preparation problems are described in Chapter 5.1.

59
XRD for the analyst

Measurement
Figure  29 shows the measurements of a mica sample in three measurement modes.
With regard to the reflection intensities it becomes clear that
–– the reflection geometry enhances the (00l)-reflections
–– the foil transmission reduces the (00l)-reflections in favor of the (hk0)-reflections
–– the capillary measurement delivers the optimum result.

Figure  29. Comparison of mica diffractograms in different measurement modes

The rotation of the sample (spinning) may be one way to reduce the preferred
orientations, but in reflection and foil transmission mode it mainly increases the
particle statistics. A more effective way is an additional small oscillation of the
sample holder, i.e. adding up different scans performed with different ω offsets
(wobbled scan).

7.2.2 Absorption and micro-absorption

Absorption
Absorption effects may influence the results of quantitative phase analyses in a
significant way. The absolute intensity of a diffraction peak will be proportional
to the number of diffracting lattice planes. The Bragg-Brentano geometry with
fixed divergence slit setting corresponds to the ideal case where the irradiated
volume of the specimen stays constant at all diffraction angles, because of smaller
surface areas combined with higher penetration depths at increasing angles. Thus,
to account for the effect of specimen absorption on the diffracted intensities, the
intensity equation only requires a constant factor ½µ (see Chapter 7.1).

60
XRD for the analyst

Micro-absorption
If a sample contains particles of different sizes, there is a significant effect on the
resulting intensities, because the size of the particle corresponds to the absorption
factor (the bigger the particles the higher the absorption). This effect strongly
depends on the distribution of the different particles in the sample.

Critical thickness
Figure  30. Effect of different particle sizes on resulting intensities (micro-absorption)

Figure  30 demonstrates the influence of both the differences in particle size and/or
the absorption in a mixture of two phases:

Part A shows 1. The effect of the crystallite size. The particles have different
crystallite sizes.
2. Micro-absorption. The particles differ in their absorption
coefficients µ. In this figure the white circles represent
particles with a higher absorption. Absorption contrasts (the
ratio between the two µ’s) larger than about 5 means that
the intensity ratios will be significantly wrong and therefore
the quantification will be incorrect

Part B of the figure shows the ideal powder mixture.

The effect on the intensity is the same for both examples. The beam either passes
the black particles and stops in a white particle, or it stops in a white particle
without having ‘seen’ any black particles. So the white particles form the ‘preferred
phase’, delivering a higher granularity quantity.

Extinction
Extinction is another effect that decreases intensity. The kinematic theory is not
applicable as the crystallites have a too high degree of perfection. A reduction
of intensity is due to an interference effect from secondary reflections of the
diffracted beam from the undersides of the atomic planes, destructively interfering
with the incident beam (phase shift 180° is given).

61
XRD for the analyst

7.2.3 Limit of detection, limit of quantification, amorphous

amounts and crystallinity
Limit of detection
Following the rules of the statistics of a Poisson distribution, the absolute and
relative standard deviations σ and σrel of a measured number of counts N at a 2θ
position are given by:

σ= N
N 1
σ rel = =
N N
A usual criterion for the limit of detection (LOD) of a particular reflection, is that
Nreflection > Nbackground + 3σbackground

Example: Measuring an Nmax of 10,000 counts, the σrel is 0.01, corresponding to a

relative error of 1%, the counting statistical error.

Note: Imagine we have a background of 100 counts and a small hump of 120
counts. Clearly this cannot be classified as a reflection because 3σbackground = 30 is
obviously higher than 20. The only solution is to increase the measurement time to
improve the peak-background ratio.

Limit of quantification
On the other hand, the limit of quantification (LOQ) depends on the sum of
the possible influences on the intensity: particle size, preferred orientation, line
overlap, crystal symmetry, matrix effects, and amorphous amount. So in many cases
the LOQ of a phase must be carefully determined by a calibration curve.

Amorphous amounts in mixtures

An automated determination of amorphous amounts can be carried out
–– using a full-pattern fitting method (for example Rietveld method) of a
measurement with a simulated amorphous content
–– adding an internal standard and evaluating both measurements before and after
the addition with a full-pattern fitting method.

Percentage crystallinity determination

The percentage of crystallinity (%C ) of a sample is defined by the ratio of the total
intensities in the diffraction peaks Inet and of the sum of all measured intensities
Itot, including the amorphous part and air scatter. The total air scatter intensity Iscat
must be determined separately (by measuring a zero-background holder) and then
subtracted, yielding

I net
%C = 100 ⋅ ∑
∑ tot − ∑ Iscat
I

62
XRD for the analyst

If the pure amorphous phase is available, the ratio C between the crystalline and
the amorphous part of a material can be determined by using diffraction patterns
at each 2θ position of the pure amorphous (a) and the pure crystalline (c) sample in
combination with the mixture:

I ( 2θ ) = m ( c I c ( 2θ ) + (1 − C ) I a ( 2θ ) )
I(2θ ) intensity at positions 2θ of the actual sample and of both the pure
amorphous (a) and the pure crystalline (c) sample
m sample mass

The three diffractograms have to be corrected for air scattering by measuring a

reference sample. This formula is, strictly speaking, only valid for an amorphous
compound with the same elemental composition and the same density as the
(mean value of the) crystalline compound(s).

All measurements have to be carried out using the same instrument settings and
the same scan range parameters.

7.3 Methods of quantitative phase analysis

There are several possibilities to classify the different methods of quantitative
phase analysis (for more information refer to KLUG & ALEXANDER and JENKINS &
SNYDER).

Selecting the optimum method, depends on the answers to several questions:

–– Which type of materials is being investigated: bulk material or powder?
–– Do we need a complete phase analysis of all phases or only of one phase?
–– Which standard material are available? Especially standard(s) for the required
phase or phases?
–– Will there be problems regarding absorption effects by adding a standard?
–– What about possible overlaps of the reflections of the standard?
–– Are all phases and their crystallography known in case we want to use the
Rietveld method?
–– Is a semi-quantitative analysis sufficient, for example the RIR (reference intensity
ratio) method?
–– Is it a recurring application requiring the use of a calibration curve?
–– Which methods are supported by the software available to you?

A decision tree for the possible methods is given in Figure  31.

Starting with the basic question, whether a single or multi-phase quantitative

phase analysis is required, the different methods are given regardless of existing
conditions, like structure data, RIR values, standards or additional problems, for
example the determination of the amorphous amount.

Finally, every problem can be solved - either as a routine method or by being

strenuous in time and measurements leading to (semi)quantitative results.

63
XRD for the analyst

Full pattern
Multi-phase Structures Is there an
Type of fitting method
or hkl files amorphous
application? quantification (e.g. Rietveld)
available? component?
based on
theoretical
Single phase FULLPAT/Le data
quantification Bail method; Quantitative
based on method
experimental
data
Quantitative Are the
method Can the
External constituents
amorphous
standard available as pure
component be
applicable? phases (incl.
modelled?
amorphous)?

Method: Is there a set

Are reference Add a material with a
external of calibration
intensity ratios similar absorption, and
standard, samples
(RIR) values minimum peak overlap
amorphous with known
available? of a known quantity
component compositions?
may exist

RIR method
Semiquantitative
method
Add a material with a
similar absorption, and
Calibration Method: Internal
minimum peak overlap
curve standard or standard
of a known quantity
addition method

Figure  31. Decision tree for quantitative analysis

There are some aspects which should be considered when selecting a standard
material:

It should:
–– be available over a long period of time to enable investigations to be compared
with each other.
–– be possibly an internationally recognized standard material.
–– be chemically stable (no oxidation or hydration).
–– be mechanically stable.
–– have a sufficiently small crystallite size.
–– produce reflections with high intensities, because the quantitative results also
depend on the counting statistics.
–– not have fluorescent radiation.
–– show as few peak overlaps as possible.
–– be a substance with an absorption coefficient similar to that of the mixture to
prevent micro-absorption effects.

64
XRD for the analyst

Absolute calibration methods directly relate the measured intensities to the

concentrations of the corresponding phase(s), measured for example as pure
standard(s) or given as theoretically determined intensities.

Advantage: Fast and easily applicable

Disadvantages: The substance which has to be determined (or another one) must
be present as a standard.
An absorption correction is necessary.
All measurements must be performed under identical measuring
conditions.

Note that the stability of the incident beam intensity has to be monitored. This
is done by repeated measurements of the maximum intensity of a reflection of
a standard sample. The intensity of the standard is used to calculate a correction
factor for the intensity of the sample measurements at a given time.

Addition methods relate the intensity of the phase of interest in the original
sample with the intensity of the sample after the addition of a known amount of
the same phase.

Advantages: The absorption correction can be neglected.

Instrumental (intensity) variations are eliminated by using
internal intensity ratios.
Disadvantages: It is complicated to use for multi-phase mixtures.
The phase of interest must be available as pure substance.

Relative calibration methods (matrix flushing, internal standard) divide the

intensities of the analytical phases by the intensities of reference or standard
phases as a calibration curve before relating them to the phase concentrations.

Advantages: The intensity ratios compensate the instrument (intensity)

variations.
Arbitrary standard materials are useable.
The absorption correction can be ignored.
The calibration curve can be examined for further evaluation.
Disadvantage: It may be time-consuming to build up a calibration curve.

65
XRD for the analyst

7.4 Examples

7.4.1 Discussion of different methods

Spiking method
Figure  32 shows an example diffractogram of a mixture of the two TiO2
modifications rutile and anatase.

Figure  32. Typical diffractogram of a mixture of anatase and rutile, Cu Kα

For the intensity ratio of the sum of (all) integral intensities I(hkl)A and I(hkl)R the
following applies:

I ( hkl )R R( hkl )R ρ A mR
=
I ( hkl)A R( hkl )A ρ B mA
Per gram of the mixture the quantity zR of rutile is added. Then applies

I ( hkl)R R( hkl)R ρ A mR + zR
= = S ( mR + zR )
I ( hkl)A R( hkl )A ρ B mA
S is the slope in the representation I(hkl)R / I(hkl)A as f (zR). The intersection of the
straight line with the x axis delivers the amount mR (note: y = Sx + SzR = 0).

In the following example (Figure  33) for each 1 g of the original mixture pure
rutile was added in amounts of 50 mg, 125 mg, 200 mg, 280 mg and 330 mg.
(Note: sample is different from the one shown in Figure  32).

66
XRD for the analyst

Figure  33. Spiking method for an example mixture, mrutil = 30.2 ± 5.2 wt.% (confidence interval 95%)

Axes : y: Ratio of intensities of both phases

x: left : - wt.% / right : Added gram per gram × 100

Using the Rietveld method for the same sample, which is well established for this
problem, the rutile content is determined to be 28.5 ± 0.5 wt.%.

Semi-quantitative methods are used if calibration standards and pure phases are
not available - but the reference intensity ratios (RIR) or I/Ic- values are published.
The I/Ic - values are given by the ICDD (for Cu radiation only) and correspond to
a 50:50 mixture of the phase and corundum. Analysis is automatically performed
when RIR values of the accepted candidates are available (see Figure  34, HighScore
software).

Advantage: Easy to use

Disadvantage: It might be necessary to determine your own I/Ic- values, sample
texture and grain size effects give wrong results.
Counts

Mixture Rutile / Anatase

22500

10000
red. rutile
blue: anatase

2500

20 30 40 50 60 70

Position [°2theta] (copper (Cu))

Figure  34. RIR analysis of example in Figure  32

67
XRD for the analyst

Full pattern methods (especially the Rietveld method) compare the complete
measured diffractogram with calculated diffractograms of all phases based on their
crystal structure data.

The method is based on the minimization of the sum of the weighted squares
of the deviations between the observed and the theoretical intensities of the
diffractogram. The theoretical diffractogram is calculated from the crystallographic
and structure data of the phases.

The Rietveld method was first introduced for structure refinement of neutron
diffraction experiments (H.M. RIETVELD, 1969). It can also be used for structure
refinement of X-ray data, but is preferably used as a standardless quantification
method in many fields (cement, mineralogy and so on).

The main advantages of the Rietveld method are:

• Differences between the experimental standard and the unknown substance are
minimized, which is important for the quantification of mineralogical samples
with high variability.
• The demand for experimental data on pure standard samples is no longer
necessary.
• Reflection overlaps do not influence the quantification result.
• The lattice parameters of the individual phases and the reflection profiles are
refined.
• The accuracy of the quantitative phase analysis is improved, since the entire
diffractogram and not just one or a few reflections are included in the
evaluation.
• The influence of texture can be corrected, because it is included in the
refinement.
• Absorption effects and the influence of the micro-absorption are modeled and
considered.
• The determination of amorphous amounts is included.
• Crystallite sizes are calculated.
• The chemical composition is calculated. A comparison to the X-ray fluorescence
analysis of the sample can confirm the reliability of both results.
• It works well when implemented into routine processes, for instance for
production control in cement plants.
• Errors of quantification of less than 1 % are achievable.

The major disadvantage of the method is that the structure data of all phases
in the sample have to be known. The currently available structure databases
incorporate most of the common phases and can easily be extended by
experimentally determined structure data, given for example as CIF or hkl files.

68
XRD for the analyst

7.4.2 Determination of retained austenite

The determination of retained austenite in hardened steels is an important
application of X-ray phase analysis. Austenite is a high-temperature phase in
hardened steels. During cooling, most of the austenite transforms to the low-
temperature phase martensite. However, a certain amount of the austenite is not
converted, therefore being ‘retained austenite’. Since this substantially affects the
mechanical characteristics of the hardening structure, there is very much interest in
its determination, especially because X-ray analysis is a reliable and non-destructive
method.

The external standard method is not applicable because neither pure austenite nor
pure martensite phases can be produced. Nevertheless, determining the retained
austenite is an uncomplicated routine procedure. It is straightforward, because
the R values for the reflections and different wavelengths are well known (see
Chapter 7.1, FANINGER & HARTMANN) and µk’ = µk is valid (see Chapter 7.3):
2
 F 
R =  hkl  H P L
 Vuc 
The accuracy of the result decreases with increasing concentrations of alloy
elements. This requires a modification of the R values. Since as many reflections
as possible should be used in the calculation, the use of Mo radiation is strongly
recommended.
Note that additional international norms exist for this type of quantification.

7.4.3 Quantification of cement

Figure  35 shows a typical clinker diffractogram with more than 200 peaks in the
2θ range between 10° and 65°. Because of the multiple line overlaps and the
large number of phases, only full-pattern methods are applicable for quantifying
all phases. The phase composition allows the cement producer to optimize the
production process parameters. As an example, the quantity of certain phases gives
information on the hardening behavior and the compressive strength (for example
alite amount) or the efficiency of the cement mill (sulfate phases).

69
XRD for the analyst

Counts
C:\Program Files\PANalytical\X'Pert HighScore Plus\Tutorial\Clinker.RD
10000 C3S - Alite, Nishi et al 72.00 %
C2S - beta - Belite (Mumme) 9.07 %
Calcium oxide - Lime 0.80 %
Brownmillerite (2/1.52/0.48/5) 10.31 %
C3A - Aluminate cubic 6.79 %
C3A - Na-Aluminate ortho, NIST 0.00 %
Magnesium oxide - Periclase 0.00 %
Potassium sulfate, beta - Arcanite 1.03 %

5000

0
20 30 40 50

Position [°2theta] (copper (Cu))

400
300
200
100
0
-100
-200
-300
-400

Figure  35. A clinker diffractogram showing the experimental pattern as well as the result of the
Rietveld refinement, together with the difference plot

70
XRD for the analyst

8. Crystallographic analysis
This type of analysis is usually carried out on single phase samples. The aim is to
gain a better understanding of the crystallographic structure, ranging from unit
cell refinement to structure solution.

8.1 Indexing
In the indexing or unit cell search procedure, hkl values are assigned to the
reflections in the powder diffractogram. There are several routines described in the
literature, for example:

DICVOL (04)
ITO
TREOR
McMaille

Based on at least 20 to 30 reflections, the various programs propose the various

possible unit cells. The main criteria for a good solution are:
• a complete indexing of all reflections, if possible
• a high FOM (figure of merit),
• the lowest volume of the unit cell and/or,
• the agreement with the known density including the number of atoms/
molecules per unit cell.

Once possible unit cells have been found, the next step is to refine a selected unit
cell and to decide on a lattice and possible space group by recalculating the pattern
and looking for systematic extinctions.

Indexing can be very helpful to determine whether a sample consists of one phase
or more (for example: to detect crystalline impurities).

Generally, to obtain a correct indexing of the diffraction pattern, it is necessary to

use high-quality powder diffraction data that is free of experimental errors such as
sample displacement or a zero shift.

8.1.1 Lattice parameter determination and refinement

When the unit cell (meaning the lattice parameters) is known, either from a
qualitative phase identification or from an indexing, it is possible to refine the
lattice parameters. That may be important for example for atomic substitution
studies or optimization of certain processing parameters.

Often, a lattice parameter refinement is carried out as part of a full pattern

quantitative analysis method, for example the Rietveld method.

71
XRD for the analyst

8.1.2 Structure refinement

When the crystallographic structure of the material is known, it is possible to refine
the complete set of structure parameters, like the atomic positions, occupation
factors, atomic replacements, temperature factors and so on. This is the classical use
of the Rietveld method: matching the total experimental pattern by refining both
instrumental and structure parameters until the best fit is reached.

8.1.3 Structure solution

In general, it is very difficult to determine the structure of an unknown material
from powder diffraction data. Single crystal X-ray diffraction is the preferred
technique for this type of work. However, in certain cases it is not possible to
obtain a large perfect single crystal suitable for single crystal diffraction analysis.
In those cases one can try to propose a structure using high-quality powder
diffraction data. For a successful structure solution, the expected crystal structure
should be known.

72
XRD for the analyst

9. Microstructural analysis
9.1 Residual stress

9.1.1 Basics
Residual stress is mechanical stress, which is present in a material independently
of outside forces and/or moments. X-ray diffraction is an important method
to determine the residual stress by analyzing the interplanar spacings d(hkl) in
different directions.

If a material has a tensile state (or a material is stressed by an axial tensile state),
then the distances of the interplanar spacings, which are perpendicular to the
tension, are increased, while lattice planes parallel to the tension experience a
compression (due to the Poisson contraction).

Residual stresses change the interplanar distances and thus the diffraction angles
2θ (derivation of Bragg's law). By measuring the change of the diffraction angle
(∆ 2θ ) the lattice extension ε can be determined:

d − d0
ε=
d0
Figure  36 shows the definition of the angles used in stress analysis.

Figure  36. Definition of angles in stress analysis

Now, if the coordinate system is put in such a way into the surface that the ε3
direction is the direction of the surface normal, then the extension εϕ,ψ of the
sample surface follows from the main equations of the elasticity theory for the
two axial tensile state delivering the basic equation of the X-ray residual stress
determination:
d φ,ψ − d 0 1
ε φ,ψ = = s1röσ 1 + σ 2 + s2röσ φ sin 2 ψ
d0 2

73
XRD for the analyst

dϕ,ψ strained d-spacing with tilt angle ψ and rotation angle ϕ

d0 strain-free d-spacing
σ1 , σ2 stress of the normal of the diffracting lattice plane, see Figure  36
s1rö, ½ s2rö X-ray elastic constants (XEC’s)
εϕ,ψ lattice extensions in the directions ϕ and ψ
ϕ rotation angle
ψ tilt angle

X-ray measurements are always carried out along the normal of the diffracting
lattice plane (hkl). Due to the small penetration depth of the X-rays σ3 can be set to
0 and it follows

σ φ = σ 1 cos 2 ϕ + σ 2 sin 2 ϕ
The indicated X-ray elastic constants s1 and ½ s2 of σ1 and σ2 are connected by
the Voigt abbreviations with the material parameters n and E (valid for isotropic
materials):

−ν 1 ν +1
s1 = s2 =
E 2 E
E Young’s modulus (modulus of elasticity)
ν Poisson ratio (transverse contraction ratio)

9.1.2 sin2 ψ method

By determining the slope m in the graph dϕ,ψ = f (sin2ψ) or θ = f (sin2ψ) the stress σϕ
can be determined:

Figure  37 shows an example of a sin2ψ plot, exhibiting slight compressive stress.

Figure  37. sin2ψ plot of a steel sample, using the (211) reflection

74
XRD for the analyst

The Δ2θ increases with larger diffraction angles 2θ. Therefore reflections with
higher angles are preferred for residual stress analysis. This might require longer
X-ray wavelengths like Cr or Co radiation. However, when changing to longer
wavelength, the information depth will be decreased. Also, different line overlaps
can occur.

The irradiated area of the sample should be as small as possible, since during
sample tilting the absorption depth in the sample changes. Hence the tube point
focus should be used together with point focus collimators or X-ray lenses.

The different methods of determining the reflection maxima/d spacings (e.g. cross
correlation method, center of gravity, parabola etc.) are available in special analysis
software like PANalytical's Stress software. All methods have their advantages and
disadvantages, so you should choose the one that meets your requirements best.

9.2 Texture

9.2.1 Basics
In a crystal, atoms form a three-dimensional periodic arrangement (crystal lattice).
This periodicity is constant within a crystallite and ends at the grain boundaries.

Polycrystalline materials consist of crystallites varying in shape and size. In practice

the orientations of the crystallites are not randomly distributed like in an ideal
powder specimen. Preferred orientations occur, which are called texture. These
preferred orientations are connected to an interplanar spacing d(hkl).

Texture can be caused by the production process or during treatments (for

example: plastic deformation of bulk materials like rolling, pultrusion and so
on), by crystal growth (epitaxy, rapid solidification) or during the preparation of
powders.

Since the results of the qualitative and quantitative phase analyses are substantially
affected by textures, this has to be taken into consideration or needs to be
minimised as much as possible, see Chapter 7.2.

Note that textures are not necessarily disadvantageous for the property of
materials. They are highly desired in some cases, for example in electrical, magnetic
or also mechanical components, since the anisotropy is the basis for certain physical
properties such as superconductivity. In these cases texture analysis is used to
characterize and quantify the structure / property relation.

Measurement
A texture measurement is performed by rotating the sample around the surface
normal (∆j) and tilting it perpendicular to the beam direction (Δχ) while setting
the goniometer to a fixed 2θ - position corresponding to the selected lattice plane/
reflection (i.e. d value). A point detector is used together with a large receiving slit.
A line detector in receiving slit (0D) mode can be used as well.
75
XRD for the analyst

Pole figure
The result of a texture analysis is displayed as the so-called pole figure, which is a
two-dimensional graphical representation (e.g. stereographic projection) of the
intensity distribution of a particular Bragg reflection relative to the sample surface,
see Figure  38.

ϕ
χ

Figure  38. Representation of the intensities of a certain set of {hkl} planes with respect to the sample
reference frame (pole figure)

Orientation distribution function

The orientation distribution function (ODF) can be determined from a set of
independent pole figures and gives a quantification of the texture. The intensity of
the ODF indicates the volume fraction of the crystallites with a certain orientation.

9.2.2 The Lotgering factor

The Lotgering factor (F) represents a simple but nevertheless very useful way to
give a statement on the quantitative amount of texture of a certain orientation.

It is defined by the equation

P − P0
F=
1 − P0
For example for a (001) texture, the value P is the sum of the integral intensities of
all (00l) directions divided by the sum of all intensity (hkl) directions in the textured
sample. P0 is the equivalent factor for the irregularly oriented sample.

P=
∑I 00l

∑I hkl

The factor F varies between 0 for a completely random orientation in the sample
and 1 for a completely oriented sample.

76
XRD for the analyst

9.2.3 Omega scan

Another simple method to quantify a texture is to perform an Omega scan. When
varying Omega at a fixed 2θ, a randomly oriented sample produces a constant
intensity. On a sample with a preferred orientation a peak will be observed,
representing the preferred orientation of the lattice planes in one direction. The
full width at half maximum (FWHM) of the peak describes the amount of a texture.
For precise analysis a texture-free sample should be measured first to correct for
beam path influences which lead to intensity changes while tilting (e.g. defocusing
effects).

9.3 Crystallite size determination

9.3.1 Basics
The full width at half maximum of a reflection depends both on the diffractometer
geometry and the setup (slits, optics, 2θ angle, detector, etc.) and on the
sample itself. Under ideal conditions (for example: smallest divergence of the
monochromatic beam and a ‘perfect’ sample with crystallite sizes between 0.5 and
5 µm without crystal imperfections) a standard powder diffractometer can produce
diffractograms with peak widths (FWHM) between 0.03° and 0.1° 2θ over the
whole angular range.

Peak broadening caused by the sample can be explained by the presence of very
small crystallites and/or micro-strain.

9.3.2 Crystallite size

The well-established Scherrer equation describes the relation between the
broadening of the reflection and the average crystallite size τ :

Kλ
τ=
β τ cosθ
βτ Broadening of the reflection due to small crystallite sizes
with βτ = (B - b) B FWHM of the reflection of the real sample
b FWHM of the standard reflection
(crystallite size approx. 0.5 to 5 µm)
Note that βτ is indicated in rad!
K approx. 0.9 (0.89 for spherical, 0.94 for cubic crystallites)
λ wavelength
θ diffraction angle

Figure  39 describes the line broadening effect given by decreasing crystallite sizes.
Its influence will be stronger than instrumental broadening for crystallite sizes
much smaller than 1 µm.

77
XRD for the analyst

Figure  39. Line broadening as a function of the crystallite size, in addition to instrumental

broadening (from JENKINS, SNYDER, 1996)

9.3.3 Micro-strain
The peak broadening βε is related to micro-strains ε, for example those caused by
defects or atom substitution, as given in the Wilson equation:

βε
ε=
4 tan θ
βε Broadening of the reflection due to lattice strain
with βε = (B2 -b2)½ B FWHM of the reflection of the real sample
b FWHM of the standard reflection
(crystallite size approx. 0.5 to 5 µm)
Note that βτ is indicated in rad!
θ diffraction angle

9.3.4 The Williamson-Hall plot

To distinguish between broadening by strain and broadening by crystallite size
the reflection profile can be analyzed. The peak profile should be symmetrical.
Asymmetric profiles are due to effects caused by the Soller slit opening (axial
divergence) or depth gradients of the sample. The broadening by crystallite size
leads to a Lorentz profile, the broadening by micro-strains leads to a Gaussian
profile.

Since crystallite- and/or micro-strain-induced broadening differ in their angular

dependence (1/cosθ and tanθ respectively) both effects can be separated.

78
XRD for the analyst

This is done by the Williamson-Hall plot as presented in Figure  40. It can be

easily derived from the fitted peaks of a full diffraction pattern (functionality of
HighScore Plus package). The example shows a particle size of about 61 nm and a
slight micro-strain of 0.15%.

Struct. B * cos(th) = 0.14(4) + 0.60(5) * sin(th)

Williamson-Hall plot

0.7

0.65

0.6
Struct. B * cos(theta)

0.55

0.5

0.45

0.4

0.35

0.3

0.25

0.2

0.2 0.25 0.3 0.35 0.4 0.45 0.5 0.55 0.6 0.65 0.7 0.75 0.8 0.85 0.9 0.95
Size [Å]: 613.9(7) sin(theta)
Strain [%]: 0.15(1)

Figure  40. Example of Williamson-Hall plot (blue: excluded peaks)

79
XRD for the analyst

9.3.5 Discussion of the peak broadening

The following figures explain the possible influences on line broadening, now
including the residual stress (see Chapter 9.1) and the influence of the thermal
treatment of the material.

Figure  41 distinguishes between the different influences of strain on the position

and the broadening of the reflections.

Figure  42 demonstrates the healing process of a rolled material depending on the

temperature. There is no movement of the reflection position.

Figure  41. Influence of strains both on position Figure  42. Influence of thermal treatment on the
and FWHM of the reflections healing process
a) unstrained
b) uniform strain
c) non uniform strain
(from JENKINS, SNYDER, 1996)

80
XRD for the analyst

10. Non-ambient XRD

A further application of X-ray powder diffraction is the investigation of the
behavior of materials under non-ambient conditions, for example higher/lower
temperatures, controlled humidity, high/low pressures, vacuum, inert or reactive
gas atmospheres, stress, electromagnetic fields, etc.

The investigation of non-ambient processes imposes special demands on the

­instrument and the software. The emphasis is on the investigation of phase transi-
tions and the measurement of the stability of existing phases. Also, the expansion or
contraction of the lattice under non-ambient conditions can be studied.

Modern powder diffractometers with dedicated non-ambient chambers allow a

quick and precise exchange between normal and non-ambient experiment setups
and offer computer control and logging of the non-ambient variables.

10.1 Temperature
The most-widely used non-ambient variable is temperature. Low- and high-
temperature chambers are available for both reflection geometries and capillaries
for transmission. The possible temperatures range from 4 K up to more than
2000 K, using different types of non-ambient chambers. The chambers can be built
as a reactor for high pressures, for aggressive gas mixtures or for investigations
under computer-controlled humidity.

The commercially available non-ambient chambers can be divided in two types:

• Direct heaters/coolers, where the sample is attached directly to a heating strip or
cooling block (see Figure  43, left).
• Indirect heaters, where the sample is heated by a surrounding oven (see
Figure  43, right).

Figure  43. Anton Paar TTK 450 Anton Paar HTK 1200N

81
XRD for the analyst

There are three additional issues to be taken into account when performing non-
ambient experiments:
• Correct adjustment and possible changes in position of the sample, causing
shifts of the reflections
• Additional requirements for sample preparation, especially for high
temperatures
• Determination of the actual sample temperature

10.1.1 Correct sample positioning and height

The accurate height of the sample is critical for accurate measurements. A stable
sample height at non-ambient temperatures is thus very important, especially in
reflection geometry. There are various solutions to this problem, depending on the
type of non-ambient chamber:
• Correction of height error in the software by
–– using a pre-determined expansion calibration of the empty sample holder
–– addition of an internal standard
• Active correction of sample height with a computer-controlled height
adjustment stage, for example by using a pre-calibrated function
• Use of parallel beam geometry, e.g. a parabolic X-ray mirror and a parallel plate
collimator

The right choice is especially important when working at low angles of incidence,
for example when investigating thin films.
The problem can be ignored if only phase transitions shall be observed.

10.1.2 Sample and preparation

Capillary geometry
If the sample is in powder form, the capillary geometry is the best technique to
minimize texture effects. Because of indirect heating the maximum temperature
is limited to about 900°C, using quartz capillaries. For low temperature
measurements there are special devices available. They provide a cold laminar gas
stream surrounding the capillary.

The sample amount and the reaction volume can be minimized in the capillary
geometry. By sealing the capillary, a controlled environment can be achieved, so
that for example oxygen or humidity from the ambient air cannot influence the
experiment.
The use of capillaries is also advantageous for samples that react with metallic
heating strips. Since only indirect heating is available, the maximum temperature is
limited.

Reflection geometry
Bulk materials or powders are put on a heating strip or a special sample cup.
The direct or indirect heating has to assure a uniform heating with a minimal
temperature gradient. Small sample amounts (and samples with high thermal

82
XRD for the analyst

conductivity) are favored. In this setup, very high temperatures above 2000°C are
possible.

The arrangement in reflection geometry is favorable for solid samples,

investigations of layers, samples in reactors, and ‘open’ systems. The reflection
geometry is also advantageous for substances that react with quartz or glass
capillaries.

Possible reactions between the sample and the sample carriers (e.g. glass, Pt, Ta,
W, steel, corundum) and/or the inert gasses or an oxidative atmosphere have to be
considered. Also, the emission of reactive gasses during the temperature treatment
could damage the interior of the temperature chamber.

10.1.3 Temperature measurement and calibration

The temperature measurement is generally done by thermocouples. For higher
temperatures (> 1200°C) pyrometers can be used additionally.

The thermocouple has to be as close as possible to the sample in order to minimize

temperature differences. This is especially problematic when using strip heaters,
where the thermocouple is mounted at the bottom of the strip. In addition, the
contact between the strip and the sample is an issue, as well as the temperature
gradient between the bottom and the top of the sample and towards the sides.

Table 10 provides a list of candidates for a high-temperature calibration, showing

both phase transitions and melting points, up to 2000° C. Make sure that the
calibration is done under exactly the same conditions as the actual experiment
(location of the temperature measurement, gas flow or vacuum etc.). The
expansion coefficients for BN and MgO are also given and might be helpful.

10.1.4 Special requirements

There are some further requirements to the experiment, regarding
• the chamber windows (foils):
–– these are often smaller than the size of the line focus
–– they produce additional absorption or even scatter, which can appear as a
broad reflection at low angles
• the atmosphere inside the chamber:
–– different absorption behavior of the X-rays
–– influence on the temperature measurement
• a fast detector with a simultaneous registration to ensure short measuring times
in order to allow real-time in situ observation of the processes
• the software packages, which have to control the temperature for temperature
profiles with heating rates, waiting times and scans, saving them together with
the actual temperatures and allow reporting of the actual temperature profile.
Display of phase transitions in the analysis software package can be done for
example as isolines diagram (see example in Figure  44)

83
XRD for the analyst

400

380
Counts
40,588.617
39,322.087
360 38,055.556
36,789.025
35,522.495
340 34,255.964
32,989.433
31,722.903
30,456.372
320 29,189.841
27,923.31
26,656.78
300 25,390.249
24,123.718
22,857.188
Temperature [°C]

21,590.657
280 20,324.126
19,057.596
17,791.065
260 16,524.534
15,258.004
13,991.473
12,724.942
240 11,458.412
10,191.881
8,925.35
220 7,658.82
6,392.289
5,125.758
3,859.228
200 2,592.697
1,326.166

180

160

140

120

100
8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51
Position [°2theta] (copper (Cu))

Figure  44. Example of a non-ambient (temperature) phase transition experiment

84
XRD for the analyst

Table 10. Some temperatures for calibration using phase transitions / melting points
substance phase transition melting point temperature / (°C)
NH4NO3 orth. ==> tetr.; moist 84.2
tetr. ==> cubic; moist, dry 125.2
TlNO3 orth. ==> trig. 79
trig. ==> cubic 143
KNO3 orth. ==> trig. 128
CsNO3 trig. ==> cubic 160
RbNO3 trig. ==> cubic 164
cubic ==> tetr. 219
tetr. ==> cubic 291
AgNO3 orth. ==> trig. 165
Sn 231.9
KClO4 orth. ==> cubic 295.7
Pb 327.5
KNO3 333.6
Zn 419.6
Ag2SO4 orth. ==> hex. 427
CuCl 430.0
Quartz trig. ==> hex. ( ==> ) 573.0
Sb 630.5
Al 660.2
KCl 776
NaCl 804 ± 3
Bi2O3 820
Ag 962.0
NaF 988.0
Au 1064.4
K2SO4 1069
Cu 1083.0
CaF2 1360
Ca2SiO4 ==> ’ 1425 ± 10
Ni 1453
Co 1495
Fe 1535
Ti 1675
Zr 1852
Cr 1890
Rh 1966
Use of expansion coefficients:
BN: for T = 20...900°C : c / Å = 6.6516 Å + 2.74 · 10-4 · T
MgO: a /Å = 4.2100 Å · (1 + 11.39 · 10-6 T + 2.46 · 10-9 T 2)
(Taylor; Br. Ceram. Trans. J. 83,1984)

85
XRD for the analyst

10.2 Pressure
The operation of high-pressure devices requires a lot of safety precautions.

There are two basic types of high pressure chambers: conventional, commercially
available high-temperature reactor chambers that allow the investigation of
powders or solid materials under certain atmospheres and medium pressure of
up to about 10 MPa (e.g. Anton Paar XRK 900), and special non-commercial high-
pressure cells like diamond anvil cells.

The pressure cell is fully closed; it can either be used as a self-pressurizing system or
can be pressurized by using a gas tube or compressor.

The diamond anvil cell consists of two diamond anvils with a metal foil between
them. A hole (approx. 0.1 mm) in the metal foil takes the sample which is
embedded in a liquid. The high hydrostatic pressure results from pressing the
diamond anvils together, whereby the metal foil becomes smaller by plastic
deformation, and thereby the hole, too. Static pressures up to 100 GPa are
reachable.

In a different type of anvil cell (up to 10 GPa) from ALLAN, MILETICH & ANGEL
the force is generated by four screws which, when tightened, draw two halves of
the cell together. This force is then transmitted through the steel body of the cell,
through the beryllium plates to the diamond anvils. The two anvils are brilliant-
cut diamonds, almost the same as found in wedding rings except that small flat
surfaces are ground on their tips. High pressure is generated because the area of
the diamond tips or culets is much smaller than the area of the screw threads.

10.3 Humidity
Humidity chambers (e.g. Anton Paar CHC) allow the investigation of phase
transitions and stabilities under a controlled humidity. It is normally combined
with a heating and cooling facility to extend the applications to low- and high-
temperature work. The relative humidity range from 5% to 95% is computer-
controlled. The setup is ideal for investigating humidity and/or temperature-
dependent structural changes of pharmaceuticals, fine chemicals, clays or zeolites.

86
XRD for the analyst

11. Recommended literature

D.R. Allan, R. Miletich, R.J. Angel, Rev. Sci. Instrum. (1996), 67, 840

M.E. Bowden and M.J. Ryan, Comparison of Intensities from Fixed and Variable
Divergence X-Ray Diffraction Experiments, Powder. Diffr. (1991), 6, 78

G.W. Brindley, The effects of grain and particle size on X-ray reflections from mixed
powders and alloys, considered in relation to the quantitative determination of
crystalline substances by X-ray methods, Phil. Mag. (1945), 36, 347 - 369

G. Caglioti, A. Paoletti & F.P. Ricci, Choice of collimators for a crystal spectrometer
for neutron diffraction, Nucl. Inst. (1958), 3, 223 - 228

S.J. Chipera & D.L. Bish, Fullpatt: a full-pattern quantitative analysis program for
X-ray powder diffraction using measured and calculated patterns, J. Appl. Cryst.
(2002), 35, 744 - 749

F.H. Chung, Quantitative interpretation of X-ray diffraction patterns, I. Matrix-

flushing method of quantitative multicomponent analysis, J. Appl. Cryst (1974a), 7,
513 - 519

F.H. Chung, Quantitative interpretation of X-ray diffraction patterns, II. Adiabatic

principle of X-ray diffraction analysis of mixtures, J. Appl. Cryst (1974b), 7, 526 - 531

F.H.Chung, Quantitative interpretation of X-ray diffraction patterns, III.

Simultaneous determination of a set of reference intensities, J. Appl. Cryst (1975)

W.A. Dollase, Correction of intensities for preferred orientation in powder

diffractometry: Application of the March model, J. Appl. Cryst. (1986), 19, 267 - 272

G. Faninger, U. Hartmann, Harterei Technische Mitteilungen (1972), 27, 233-244

L.W. Finger, D.E. Cox & A.P. Jephcoat, A correction for powder diffraction peak
asymmetry due to axial divergence, J. Appl. Cryst. (1994), 27, 892 - 900

X.F. Fischer, Divergence slit corrections for Bragg-Brentano diffractometers with

rectangular sample surface, Powder. Diffr. (1996), 11, 17 - 21

J.D. Hanawalt, see: Appendix in: ‘Search Manuals for the Powder Diffraction File’,
International Centre for Diffraction Data, Swarthmore PA, USA, (1988)

H. Herman & M. Ermrich, Microabsorption of X-ray intensity in randomly packed

powder specimens, Acta Cryst. (1987), A43, 401 - 405

R.J. Hill and C.J. Howard, Quantitative Phase Analysis from Powder Diffraction Data
using the Rietveld Method, J. Appl. Cryst. (1987), 20, 467

International Tables for Crystallography, Vol. A, Mathematical, Physical and

Chemical Tables, ed.: A.J.C. Wilson, Kluwer, London (1995), (corrected reprint)

87
XRD for the analyst

R. Jenkins and R.L. Snyder, Introduction to X-Ray Powder Diffractometry, Wiley

1996

T.H. de Keijser, J.L. Langford, E.J. Mittemeijer and A.B.P. Vogels, Use of the
Voigt function in a single line method for the analysis of X-ray diffraction line
broadening, J. Appl. Cryst. (1982), 15, 308-314

L.A. Kelley, S.P. Gardner and M.J. Sutcliffe, An automated approach for clustering
an ensemble of NMR-derived protein structures into conformationally-related
subfamilies, Protein Engineering (1996), 9 1063-1065

H.P. Klug and L.E. Alexander, X-ray Diffraction Procedures, Wiley, New York (1974),
661 pages

J.L. Langford and A.J.C. Wilson, Scherrer after Sixty Years: A Survey and Some New
Results in the Determination of Crystallite Size, J. Appl. Cryst. (1978), 11, 102-113.

G.S. Pawley, Unit-cell refinement from powder diffraction scans, J. Appl. Cryst.
(1981), 14, 357-361

W.A. Rachinger, A correction for the α1 : α2 doublet in the measurement of widths

of X-ray diffraction lines, J. Sci. Instrum., 25, (1948), 254-259

H.M. Rietveld, Line profiles of neutron powder-diffraction peaks for structure

refinement, Acta Cryst. (1967), 22, 151-152

H.M. Rietveld, J. Appl. Cryst. (1969), 2, 65-71

M. Sato, Y. Sato and L.C. Jain, Fuzzy Clustering Models and Applications, Studies in
Fuzziness and Soft Computing vol. 9, Springer group (1997), New York, 122 pages

A. Savitsky and M.J.E. Golay, Smoothing & differentiation of data by simplified least
squares procedures, Anal. Chem. (1964) 36, 8, 1627-1639

P. Scherrer, Bestimmung der Grösse und der inneren Struktur von Kolloidteilchen
mittels Röntgenstrahlen, Nachr. Ges. Wiss. Göttingen, (1918), 2, 96-100

D.K. Smith, G.G. Jr. Johnson, A. Scheible, A.M. Wims, J.L. Johnson and G. Ullmann,
Quantitative X-ray powder diffraction method using the full diffraction pattern,
Powder. Diffr. (1987), 2, 73-77

G.S. Smith and R.L. Snyder, a criterion for rating powder diffraction patterns and
evaluating the reliability of powder indexing, J. Appl. Cryst. (1979), 12, 60-65

R.L. Snyder, The Use of Reference Intensity Ratios in X-Ray Quantitative Analysis,
Powder. Diffr. (1992), 7, 186-193

Taylor; Br. Ceram. Trans. J. 83,1984

88
XRD for the analyst

J.W. Visser, A fully automatic program for finding the unit cell from powder data,
J. App. Cryst (1969), 2, 89

P.E. Werner, L. Eriksson & M. Westdahl, TREOR, a semi-exhaustive trial-and-error

powder indexing program for all symmetries., J. Appl. Cryst. (1985), 18, 367-370

D.B. Wiles and R.A. Young, A new computer program for Rietveld analysis of X-ray
powder diffraction patterns, J. Appl. Cryst. (1981), 14, 149-151

E.R. Wölfel, Theorie und Praxis der Röntgenstrukturanalyse, Vieweg&Sohn 1989

P.M. de Wolff, A simplified criterion for the reliability of a powder diffraction

pattern indexing, J. Appl. Cryst. (1986), 1, 108-113

R.A. Young (editor), The Rietveld Method, Oxford University Press, Oxford (1993),
paperback (1995, 2000)

89
XRD for the analyst

12. Symbols
The symbols used in formulas in this book are:

2θ - Angle between incident and reflected beam

a - Absorption coefficient
Å - Ångstrom, a unit length of 10-10 m, or 0.1 nm
A Amorphous sample
βτ Broadening of the reflection due to small crystallite sizes
C - Face centered unit cell
C Crystalline sample
c The velocity of light
%C Percentage crystallinity
D - material
dϕ,ψ Strained d-spacing with tilt angle ψ and rotation angle ϕ
do Strain-free d-spacing
d - Interplanar spacing (better d(hkl)), hkl…Miller indices
λ The wavelength of X-rays
e Elementary charge
E Energy
E Young’s modulus (modulus of elasticity)
e-M Temperature factor
Ekin Kinetic energy
εϕ,ψ Lattice extensions in the directions ϕ and ψ
F All-face centered unit cell
fj Scattering factor of each atom j
H - Multiplicity factor
h - Planck’s constant
ω The incident beam angle
θ theta Bragg angle θB
I - Body centered unit cell
I - Transmitted intensity
I - Tube’s emission current
I(2θ) - Intensity at positions 2θ of the actual sample
I(hkl) - Integral intensities
Ik Scattered intensity of the individual phases
Iscat Total air scatter intensity
Itot - All measured intensities
I0 - Intensity of incident or primary beam
Iwr - Total intensity of the white radiation
K0 Constant for the equipment
L - Lorentz factor
mk - Mass portion
me - Mass of the electron
µ mu Attenuation coefficient
µ mu Attenuation
µk Attenuation coefficient

90
XRD for the analyst

N - measured number of counts

n nu Frequency
ν nu Poisson ratio (transverse contraction ratio)
P - Polarization factor
P - Primitive unit cell
P0 The equivalent factor for irregularly oriented sample
P Packing fraction
ρ rho Density
ρ k Density of the phase k
ϕ phi Rotation angle
χ chi Tilt angle
Q0 Cross-section of the incident beam
σ sigma Scatter
Σ sigma Absolute deviation
σrel Relative standard deviations
σϕ Tension
τ Absorption
τ Average crystallite size
U High-voltage difference
Vuc - Volume of the unit cell
v percentages by volume of the individual phases
Z Atomic number

91
XRD for the analyst

1. Index

Symbols D
0D detector – 38 Dauvillier law – 13
1D detector – 38 Debye-Scherrer ‘cones’ – 40
2D detector – 38 DICVOL – 71
Diffractogram – 27
A d-I tables – 55
Absorption – 60 Duane-Hunt law – 13
Amorphous amounts – 62
Amorphous state – 18 E
Anatase – 66 Electromagnetic waves – 10
Anode – 12 Epitaxy – 75
Area detectors – 42 Ewald sphere – 21
ASTM – 56 Extinction – 61
Attenuation coefficient (μ ) – 11
F
B Fluorescence – 11
Bragg-Brentano – 30 Foil transmission – 47, 49
Bragg-Brentano geometry – 33 FOM (figure of merit) – 71
Bragg’s law – 22 Full pattern methods – 68
Bravais lattices – 19 Full width at half maximum – 36
Bremsstrahlung – 13, 16 FWHM – 36, 77

C G
Calibration – 83 Gas proportional counter – 40
Capillary – 47, 49, 50 Gels, liquids – 46, 47
Capillary geometry – 82
Capillary measurements – 45 H
Cement – 69 High-pressure devices – 86
Characteristic radiation – 16 Humidity chambers – 86
Characteristic X-ray radiation – 13
Characteristic X-rays – 14 I
Clinker – 69 ICDD (International Centre for
Cluster analysis – 56 Diffraction Data) – 56
Coherent or Rayleigh scatter – 11 Incoherent scatter – 11
Compton scatter – 11 Intensity I0 – 11
Crystal classes – 20 Interplanar spacings – 20
Crystalline state – 18 ITO – 71
Crystallinity – 28
Crystallite size – 28 J
Crystal structure – 17 JCPDS – 56

92
XRD for the analyst

K Peak table – 55
K-edge – 15 Percentage crystallinity
K-shell – 14, 15 determination – 62
Kβ filter – 36 PIXcel3D – 41
Point detectors – 40
L Poisson ratio – 74
Lattice parameters – 71 Pole figure – 76
Lattice planes – 20 Preferred orientation – 59
L-edges – 15 Pultrusion – 75
Limit of detection – 62
Limit of quantification – 62 R
Line detectors – 41 Rapid solidification – 75
LOD – 48 Reciprocal lattice – 18
LOQ – 48 Reflection – 45
Low angles – 28 Reflection geometry – 30, 82
L-shell – 14, 15 Reflection mode – 47, 48, 49, 50
Reflection profile – 78
M Residual stress – 73
McMaille – 71 Resolution – 27
Micro-absorption – 61 Retained austenite – 69
Micro-strains – 78 Rietveld method – 67, 68
Miller indices – 20 Rolling – 75
Monochromator – 36 Rough surfaces – 52
Monochromators – 37 Rutile – 66
Moseley law – 16
S
N Scherrer equation – 77
Non-ambient – 81 Scintillation counter – 41
Search/match – 55
O Semi-quantitative methods – 67
ODF – 76 Soller slit – 78
Omega scan – 77 Space groups – 20
Orientation distribution function – 76 Spiking method – 66
Synchrotrons – 12
P
Particle size – 28 T
PCA (principal components analysis) – 57 Thin layers – 51
PDF-2 – 56 Transmission – 45
PDF-4+ – 56 Transmission geometry – 32
PDF-4/Minerals – 56 Transmission mode – 50
PDF-4/Organics – 56 TREOR – 71
PDF database
(Powder Diffraction File) – 56 U
Peak profile – 78 Unit cell – 18, 71

93
XRD for the analyst

V
Voigt abbreviations – 74

W
Wavelength – 10, 11
Wilson equation – 78

X
X'Celerator – 41
X-ray tube – 12

Y
Young’s modulus – 74

94