Philips Toucam Pro II Sony Icx098bq

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ICX098BQ

Diagonal 4.5mm (Type 1/4) Progressive Scan CCD Image Sensor with Square Pixel for Color Cameras

Description
The ICX098BQ is a diagonal 4.5mm (Type 1/4) 14 pin DIP (Plastic)
interline CCD solid-state image sensor with a square
pixel array which supports VGA format. Progressive
scan allows all pixels signals to be output
independently within approximately 1/30 second.
Also, the adoption of monitoring mode allows output
to an NTSC monitor without passing through the
memory. This chip features an electronic shutter with
variable charge-storage time which makes it possible
to realize full-frame still image without a mechanical
shutter. High resolution and high color reproductivity
are achieved through the use of R, G, B primary color
mosaic filters. Further, high sensitivity and low dark
current are achieved through the adoption of HAD
(Hole-Accumulation Diode) sensors.
This chip is suitable for applications such as

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electronic still cameras, PC input cameras, etc.

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Features Pin 1
• Progressive scan allows individual readout of the
2
image signals from all pixels.

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• High horizontal and vertical resolution (both approx.
400TV-lines) still image without a mechanical

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shutter. V
• Supports monitoring mode

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• Square pixel 8
• Supports VGA format
• Horizontal drive frequency: 12.27MHz 2
H 31
• No voltage adjustments (reset gate and substrate Pin 8
bias are not adjusted.)
• R, G, B primary color mosaic filters on chip
• High resolution, high color reproductivity, high Optical black position
sensitivity, low dark current (Top View)
• Continuous variable-speed shutter
• Low smear
• Excellent antiblooming characteristics
• Horizontal register: 3.3V drive
• 14-pin high precision plastic package (enables dual-surface standard)

Device Structure
• Interline CCD image sensor
• Image size: Diagonal 4.5mm (Type 1/4)
• Number of effective pixels: 659 (H) × 494 (V) approx. 330K pixels
• Total number of pixels: 692 (H) × 504 (V) approx. 350K pixels
• Chip size: 4.60mm (H) × 3.97mm (V)
• Unit cell size: 5.6µm (H) × 5.6µm (V)
• Optical black: Horizontal (H) direction: Front 2 pixels, rear 31 pixels
Vertical (V) direction: Front 8 pixels, rear 2 pixels
• Number of dummy bits: Horizontal 16
Vertical 5
• Substrate material: Silicon

∗ Wfine CCD is a registered trademark of Sony Corporation.


Represents a CCD adopting progressive scan, primary color filter and square pixel.

Sony reserves the right to change products and specifications without prior notice. This information does not convey any license by
any implication or otherwise under any patents or other right. Application circuits shown, if any, are typical examples illustrating the
operation of the devices. Sony cannot assume responsibility for any problems arising out of the use of these circuits.

–1–
E00343A0Y
ICX098BQ

Block Diagram and Pin Configuration

VOUT

GND

Vφ2B

Vφ2A
(Top View)

Vφ3

Vφ1
VL
7 6 5 4 3 2 1

G B G B

Vertical register
R G R G

G B G B

R G R G

G B G B

R G R G Note)

Horizontal register

Note) : Photo sensor


8 9 10 11 12 13 14

φSUB

CSUB

φRG

Hφ1

Hφ2
VDD

GND

Pin Description

Pin No. Symbol Description Pin No. Symbol Description


1 Vφ1 Vertical register transfer clock 8 VDD Supply voltage
2 Vφ3 Vertical register transfer clock 9 GND GND
3 Vφ2A Vertical register transfer clock 10 φSUB Substrate clock
4 Vφ2B Vertical register transfer clock 11 CSUB Substrate bias∗1
5 VL Protective transistor bias 12 φRG Reset gate clock
6 GND GND 13 Hφ1 Horizontal register transfer clock
7 VOUT Signal output 14 Hφ2 Horizontal register transfer clock
∗1 DC bias is generated within the CCD, so that this pin should be grounded externally through a capacitance
of 0.1µF.

Absolute Maximum Ratings


Item Ratings Unit Remarks
VDD, VOUT, φRG – φSUB –40 to +10 V
Vφ2A, Vφ2B – φSUB –50 to +15 V
Against φSUB Vφ1, Vφ3, VL – φSUB –50 to +0.3 V
Hφ1, Hφ2, GND – φSUB –40 to +0.3 V
CSUB – φSUB –25 to V
VDD, VOUT, φRG, CSUB – GND –0.3 to +18 V
Against GND Vφ1, Vφ2A, Vφ2B, Vφ3 – GND –10 to +18 V
Hφ1, Hφ2 – GND –10 to +5 V
Vφ2A, Vφ2B – VL –0.3 to +28 V
Against VL
Vφ1, Vφ3, Hφ1, Hφ2, GND – VL –0.3 to +15 V
Voltage difference between vertical clock input pins to +15 V ∗2
Between input
Hφ1 – Hφ2 –5 to +5 V
clock pins
Hφ1, Hφ2 – Vφ3 –13 to +13 V
Storage temperature –30 to +80 °C
Operating temperature –10 to +60 °C
∗2 +24V (Max.) when clock width < 10µs, clock duty factor < 0.1%.
–2–
ICX098BQ

Bias Conditions
Item Symbol Min. Typ. Max. Unit Remarks
Supply voltage VDD 14.55 15.0 15.45 V
Protective transistor bias VL ∗1

Substrate clock φSUB ∗2

Reset gate clock φRG ∗2

∗1 VL setting is the VVL voltage of the vertical transfer clock waveform, or the same power supply as the VL
power supply for the V driver should be used.
∗2 Do not apply a DC bias to the substrate clock and reset gate clock pins, because a DC bias is generated
within the CCD.

DC Characteristics
Item Symbol Min. Typ. Max. Unit Remarks
Supply current IDD 6.0 mA

Clock Voltage Conditions

Waveform
Item Symbol Min. Typ. Max. Unit Remarks
diagram
Readout clock voltage VVT 14.55 15.0 15.45 V 1
VVH02A –0.05 0 0.05 V 2 VVH = VVH02A
VVH1, VVH2A,
–0.2 0 0.05 V 2
VVH2B, VVH3
VVL1, VVL2A,
–5.8 –5.5 –5.2 V 2 VVL = (VVL1+VVL3)/2
VVL2B, VVL3
Vφ1, Vφ2A,
Vertical transfer clock 5.2 5.5 5.8 V 2
Vφ2B, Vφ3
voltage
| VVL1 – VVL3 | 0.1 V 2
VVHH 0.3 V 2 High-level coupling
VVHL 1.0 V 2 High-level coupling
VVLH 0.5 V 2 Low-level coupling
VVLL 0.5 V 2 Low-level coupling

Horizontal transfer VφH 3.0 3.3 5.25 V 3


clock voltage VHL –0.05 0 0.05 V 3
VφRG 3.0 3.3 5.5 V 4
Reset gate clock
VRGLH – VRGLL 0.4 V 4 Low-level coupling
voltage
VRGL – VRGLm 0.5 V 4 Low-level coupling
Substrate clock voltage VφSUB 19.75 20.5 21.25 V 5

–3–
ICX098BQ

Clock Equivalent Circuit Constant


Item Symbol Min. Typ. Max. Unit Remarks
CφV1 2200 pF
Capacitance between vertical transfer
CφV2A, CφV2B 1500 pF
clock and GND
CφV3 1000 pF
CφV12A, CφV2B1 390 pF
Capacitance between vertical transfer
clocks CφV2A3, CφV32B 680 pF
CφV13 820 pF
Capacitance between horizontal
CφH1, CφH2 15 pF
transfer clock and GND
Capacitance between horizontal transfer
CφHH 47 pF
clocks
Capacitance between reset gate clock
CφRG 3 pF
and GND
Capacitance between substrate clock and
CφSUB 270 pF
GND
R1 15 Ω
Vertical transfer clock series resistor R2A, R2B 100 Ω
R3 62 Ω
Vertical transfer clock ground resistor RGND 47 Ω
Horizontal transfer clock series resistor RφH 15 Ω
Reset gate clock series resistor RφRG 62 Ω

Vφ1 Vφ2A

CφV12A
R1 R2A
RφH RφH
Hφ1 Hφ2
CφV1 CφV2A CφHH
CφV2B1 CφV2A3
CφH1 CφH2

CφV13
CφV2B RGND CφV3
R2B R3
CφV32B

Vφ2B Vφ3

Vertical transfer clock equivalent circuit Horizontal transfer clock equivalent circuit

RφRG
RGφ

CφRG

Reset gate clock equivalent circuit

–4–
ICX098BQ

Drive Clock Waveform Conditions

(1) Readout clock waveform


VT 100%
90%

II II
φM

VVT φM
2
10%
0% 0V
tr twh tf

Note) Readout clock is used by composing vertical transfer clocks Vφ2A and Vφ2B.

(2) Vertical transfer clock waveform


Vφ1 VVH1
VVHH VVH

VVHL

VVLH
VVL01 VVL1 VVL
VVLL

Vφ2A, Vφ2B
VVH2A, VVH2B
VVH02A, VVH02B VVHH VVH

VVHL

VVLH
VVL2A, VVL2B VVL
VVLL

Vφ3 VVH3
VVHH VVH

VVHL

VVL03 VVLH VVL


VVLL

VVH = VVH02A VφV1 = VVH1 – VVL01


VVL = (VVL01 + VVL03) /2 VφV2A = VVH02A – VVL2A
VVL3 = VVL03 VφV2B = VVH02B – VVL2B
VφV3 = VVH3 – VVL03
–5–
ICX098BQ

(3) Horizontal transfer clock waveform


tr twh tf

Hφ2

90%
VCR

VφH twl
VφH
2
10%
VHL
Hφ1
two

Cross-point voltage for the Hφ1 rising side of the horizontal transfer clocks Hφ1 and Hφ2 waveforms is VCR.
The overlap period for twh and twl of horizontal transfer clocks Hφ1 and Hφ2 is two.

(4) Reset gate clock waveform


tr twh tf

VRGH
RG waveform

twl
VφRG
Point A

VRGLH
VRGL
VRGLL
VRGLm

VRGLH is the maximum value and VRGLL is the minimum value of the coupling waveform during the period from
Point A in the above diagram until the rising edge of RG. In addition, VRGL is the average value of VRGLH and
VRGLL.
VRGL = (VRGLH + VRGLL)/2
Assuming VRGH is the minimum value during the interval twh, then:
VφRG = VRGH – VRGL
Negative overshoot level during the falling edge of RG is VRGLm.

(5) Substrate clock waveform

100%
90%

φM

VφSUB φM
2
10%
VSUB 0%
tr twh tf
(A bias generated within the CCD)

–6–
ICX098BQ

Clock Switching Characteristics


twh twl tr tf
Item Symbol Unit Remarks
Min. Typ. Max. Min. Typ. Max. Min. Typ. Max. Min. Typ. Max.
During
Readout clock VT 2.3 2.5 0.5 0.5 µs
readout
Vertical transfer Vφ1,Vφ2A, ∗1
15 350 ns
clock Vφ2B, Vφ3
Hφ1 25.5 30.5 28 33 9 16.5 9 16.5
transfer clock

During ∗2
ns
imaging
Horizontal

Hφ2 28 33 25.5 30.5 9 14 9 14


During Hφ1 0.01 0.01
parallel-serial µs
conversion Hφ2 0.01 0.01

Reset gate clock φRG 11 12 63.5 3 3 ns

During
Substrate clock φSUB 1.5 1.8 0.5 0.5 µs drain
charge
∗1 When vertical transfer clock driver CXD1267AN is used.
∗2 tf ≥ tr – 2ns, and the cross-point voltage (VCR) for the Hφ1 rising side of the Hφ1 and Hφ2 waveforms must be
at least VφH/2 [V].

two
Item Symbol Unit Remarks
Min. Typ. Max.
Horizontal transfer clock Hφ1, Hφ2 21.5 25.5 ns

Spectral Sensitivity Characteristics (excludes lens characteristics and light source characteristics)

1.0
G
R
B
0.8
Relative Response

0.6

0.4

0.2

0
400 450 500 550 600 650 700

Wave Length [nm]

–7–
ICX098BQ

Image Sensor Characteristics (Ta = 25°C)


Measurement
Item Symbol Min. Typ. Max. Unit Remarks
method
G sensitivity Sg 460 580 mV 1

Sensitivity R Rr 0.4 0.55 0.7 1


comparison B Rb 0.3 0.45 0.6 1
Saturation signal Vsat 500 mV 2 Ta = 60°C
Smear Sm 0.0008 0.0025 % 3
20 % 4 Zone 0 and I
Video signal shading SHg
25 % 4 Zone 0 to II'
Uniformity between video ∆Srg 8 % 5
signal channels ∆Sbg 8 % 5
Dark signal Vdt 4 mV 6 Ta = 60°C
Dark signal shading ∆Vdt 1 mV 7 Ta = 60°C
Line crawl G Lcg 3.8 % 8
Line crawl R Lcr 3.8 % 8
Line crawl B Lcb 3.8 % 8
Lag Lag 0.5 % 9

Zone Definition of Video Signal Shading

659 (H)
12 12

12
V
10
H H
8 8 494 (V)

Zone 0, I 10
Zone II, II'

V Ignored region
10
Effective pixel region

Measurement System

CCD signal output [∗A]

Gr/Gb

CCD C.D.S AMP S/H Gr/Gb channel signal output [∗B]

R/B

S/H R/B channel signal output [∗C]

Note) Adjust the amplifier gain so that the gain between [∗A] and [∗B], and between [∗A] and [∗C] equals 1.

–8–
ICX098BQ

Image Sensor Characteristics Measurement Method

Color coding and readout of this image sensor

Gb B Gb B The primary color filters of this image sensor are arranged in the layout
shown in the figure on the left (Bayer arrangement).
R Gr R Gr
Gr and Gb denote the G signals on the same line as the R signal and
Gb B Gb B the B signal, respectively.

R Gr R Gr

Horizontal register

Color Coding Diagram

All pixels signals are output successively in a 1/30s period.


The R signal and Gr signal lines and the Gb signal and B signal lines are output successively.

Readout modes

The diagram below shows the output methods for the following two readout modes.

Progressive scan mode Monitoring mode

7 R G 7 R G

6 G B 6 G B

5 R G 5 R G

4 G B 4 G B

3 R G 3 R G

2 G B 2 G B

1 R G 1 R G

VOUT VOUT

Note) Blacked out portions in the diagram indicate pixels which are not read out.

1. Progressive scan mode


In this mode, all pixel signals are output in non-interlace format in 1/30s.
The vertical resolution is approximately 400TV-lines and all pixel signals within the same exposure period
are read out simultaneously, making this mode suitable for high resolution image capturing.

2. Monitoring mode
The signals for all effective areas are output during a single field period of NTSC standard (approximately 1/60s)
by repeating readout pixels and non-readout pixels every two lines. The vertical resolution is approximately
200TV-lines. Note that the same pixel signal is output for both odd and even fields.
Since signals are output in a format which conforms to NTSC, the external circuit can be simplified when
monitoring using an NTSC monitor.
–9–
ICX098BQ

Measurement conditions

1) In the following measurements, the device drive conditions are at the typical values of the bias and clock
voltage conditions.

2) In the following measurements, spot blemishes are excluded and, unless otherwise specified, the optical
black level (OB) is used as the reference for the signal output, which is taken as the value of the Gr/Gb
signal output or the R/B signal output of the measurement system.

Definition of standard imaging conditions

1) Standard imaging condition I:


Use a pattern box (luminance 706cd/m2, color temperature of 3200K halogen source) as a subject. (Pattern
for evaluation is not applicable.) Use a testing standard lens with CM500S (t = 1.0mm) as an IR cut filter
and image at F5.6. The luminous intensity to the sensor receiving surface at this point is defined as the
standard sensitivity testing luminous intensity.

2) Standard imaging condition ΙΙ:


Image a light source (color temperature of 3200K) with a uniformity of brightness within 2% at all angles.
Use a testing standard lens with CM500S (t = 1.0mm) as an IR cut filter. The luminous intensity is adjusted
to the value indicated in each testing item by the lens diaphragm.

1. G sensitivity, sensitivity comparison


Set to standard imaging condition I. After selecting the electronic shutter mode with a shutter speed of
1/100s, measure the signal outputs (VGr, VGb, VR and VB) at the center of each Gr, Gb, R and B channel
screens, and substitute the values into the following formula.
VG = (VGr + VGb)/2
Sg = VG × 100 [mV]
30
Rr = VR/VG
Rb = VB/VG

2. Saturation signal
Set to standard imaging condition II. After adjusting the luminous intensity to 20 times the intensity with the
average value of the Gr signal output, 150mV, measure the minimum values of the Gr, Gb, R and B signal
outputs.

3. Smear
Set to standard imaging condition II. With the lens diaphragm at F5.6 to F8, first adjust the average value of
the Gr signal output to 150mV. Measure the average values of the Gr signal output, Gb signal output, R signal
output and B signal output (Gra, Gba, Ra, Ba), and then adjust the luminous intensity to 500 times the intensity
with average value of the Gr signal output, 150mV. After the readout clock is stopped and the charge drain is
executed by the electronic shutter at the respective H blankings, measure the maximum value (Vsm [mV]),
independent of the Gr, Gb, R and B signal outputs, and substitute the values into the following formula.

Gra + Gba + Ra + Ba 1 1
Sm = Vsm ÷ × × × 100 [%] (1/10V method conversion value)
4 500 10

4. Video signal shading


Set to standard imaging condition II. With the lens diaphragm at F5.6 to F8, adjust the luminous intensity so
that the average value of the Gr signal output is 150mV. Then measure the maximum (Grmax [mV]) and
minimum (Grmin [mV]) values of the Gr signal output and substitute the values into the following formula.

SHg = (Grmax – Grmin)/150 × 100 [%]


– 10 –
ICX098BQ

5. Uniformity between video signal channels


After measuring 4, measure the maximum (Rmax [mV]) and minimum (Rmin [mV]) values of the R signal
and the maximum (Bmax [mV]) and minimum (Bmin [mV]) values of the B signal, and substitute the values
into the following formula.

∆Srg = (Rmax – Rmin)/150 × 100 [%]


∆Sbg = (Bmax – Bmin)/150 × 100 [%]

6. Dark signal
Measure the average value of the signal output (Vdt [mV]) with the device ambient temperature 60°C and
the device in the light-obstructed state, using the horizontal idle transfer level as a reference.

7. Dark signal shading


After measuring 6, measure the maximum (Vdmax [mV]) and minimum (Vdmin [mV]) values of the dark
signal output and substitute the values into the following formula.

∆Vdt = Vdmax – Vdmin [mV]

8. Line crawl
Set to standard imaging condition II. Adjusting the luminous intensity so that the average value of the Gr
signal output is 150mV, and then insert R, G, and B filters and measure the difference between G signal
lines (∆Glr, ∆Glg, ∆Glb [mV]) as well as the average value of the G signal output (Gar, Gag, Gab).
Substitute the values into the following formula.

Lci = ∆Gli × 100 [%] (i = r, g, b)


Gai

9. Lag
Adjust the Gr signal output value generated by strobe light to 150mV. After setting the strobe light so that it
strobes with the following timing, measure the residual signal (Vlag). Substitute the value into the following
formula.

Lag = (Vlag/150) × 100 [%]

VD

V2A

Light

Strobe light
timing

Gr signal output 150mV Vlag (Lag)


Output

– 11 –
Drive Circuit

15V

1 20
2 19
–5.5V
3 18 3.3/16V
4 17
XSUB
5 16 100
XV1
6 CXD1267AN 15
XV2A
7 14
XSG1
8 13 2SK523
XV2B 22/16V
9 12 1 2 3 4 5 6 7
XSG2 CCD OUT
10 11

VL
XV3

Vφ3
Vφ1
Vφ2A
Vφ2B
VOUT
GND 3.9K
22/20V
ICX098
(Bottom View)

– 12 –
Hφ2
φRG
Hφ1
VDD
GND

CSUB
φSUB

14 13 12 11 10 9 8
100K

33/20V 0.01
0.1

1/35V

0.1
2200p 1M

H2
H1
RG
1/20V
ICX098BQ
ICX098BQ

Sensor Readout Clock Timing Chart Progressive Scan Mode

XV1

XV2A

XV2B

XV3

XSG1

XSG2

Sensor readout clocks XSG1 and XSG2 are used by


composing XV2A and XV2B.

81.4ns (1 bit)

HD
2.53µs (31 bits)
42.2µs (520 bits)

V1

V2A

V2B

V3

– 13 –
ICX098BQ

Sensor Readout Clock Timing Chart Monitoring Mode

XV1

XV2A

XV2B

XV3

XSG1

XSG2

Sensor readout clock XSG1 is used by


composing XV2A.

81.4ns (1 bit)

HD
2.53µs (31 bits)
42.2µs (520 bits)

V1

V2A

V2B

V3

– 14 –
Drive Timing Chart (Vertical Sync) Progressive Scan Mode

VD

HD
5
6

5
9
4
3

3
8
2

4
1
7

2
6
7

1
20

13
16
17

12
11
15

10
14
19
18
504
525

510
520

525
V1

V2A

– 15 –
V2B

V3

CCD
1 2 3 4 5 6 7 8 1 2 3 4 5 6 7 8 9 1011 1 2 3 4 5 6 7 8 1 2
494

OUT
ICX098BQ
Drive Timing Chart (Vertical Sync) Monitoring Mode

FLD

VD

BLK

HD

2
4
5
7

3
6

1
9
8
12
17

11
16
18

14
15
19

13

10
20
285

275
280

520
525
270

260
261
262
263
264
265

– 16 –
V1

V2A

V2B

V3

CCD
1 2 5 6 1 2 5 6 9 1013 1417 18 1 2 5 6 1 2 5 6 9 10 13 1417 18
486
489
490
493
494

486
489
490
493
494
OUT
ICX098BQ
Drive Timing Chart (Horizontal Sync) Progressive Scan Mode

HD 1 78

BLK

780
140
CLK

H1

H2

V1

V2A

V2B

– 17 –
V3

SUB

RG

SHP

SHD
ICX098BQ
Drive Timing Chart (Horizontal Sync) Monitoring Mode

HD 1 78

BLK

780
140
CLK

H1

H2

V1

V2A

– 18 –
V2B

V3

SUB

RG

SHP

SHD
ICX098BQ
ICX098BQ

Notes on Handling

1) Static charge prevention


CCD image sensors are easily damaged by static discharge. Before handling be sure to take the following
protective measures.
a) Either handle bare handed or use non-chargeable gloves, clothes or material.
Also use conductive shoes.
b) When handling directly use an earth band.
c) Install a conductive mat on the floor or working table to prevent the generation of static electricity.
d) Ionized air is recommended for discharge when handling CCD image sensor.
e) For the shipment of mounted substrates, use boxes treated for the prevention of static charges.

2) Soldering
a) Make sure the package temperature does not exceed 80°C.
b) Solder dipping in a mounting furnace causes damage to the glass and other defects. Use a ground 30W
soldering iron and solder each pin in less than 2 seconds. For repairs and remount, cool sufficiently.
c) To dismount an image sensor, do not use a solder suction equipment. When using an electric desoldering
tool, use a thermal controller of the zero cross On/Off type and connect it to ground.

3) Dust and dirt protection


Image sensors are packed and delivered by taking care of protecting its glass plates from harmful dust and
dirt. Clean glass plates with the following operation as required, and use them.
a) Perform all assembly operations in a clean room (class 1000 or less).
b) Do not either touch glass plates by hand or have any object come in contact with glass surfaces. Should
dirt stick to a glass surface, blow it off with an air blower. (For dirt stuck through static electricity ionized
air is recommended.)
c) Clean with a cotton bud and ethyl alcohol if the grease stained. Be careful not to scratch the glass.
d) Keep in a case to protect from dust and dirt. To prevent dew condensation, preheat or precool when
moving to a room with great temperature differences.
e) When a protective tape is applied before shipping, just before use remove the tape applied for
electrostatic protection. Do not reuse the tape.

4) Installing (attaching)
a) Remain within the following limits when applying a static load to the package. Do not apply any load more
than 0.7mm inside the outer perimeter of the glass portion, and do not apply any load or impact to limited
portions. (This may cause cracks in the package.)

AAAA AAAA AAAA


Cover glass

AAAA AAAA AAAA


Plastic package
50N 50N 1.2Nm

Compressive strength Torsional strength

b) If a load is applied to the entire surface by a hard component, bending stress may be generated and the
package may fracture, etc., depending on the flatness of the bottom of the package. Therefore, for
installation, use either an elastic load, such as a spring plate, or an adhesive.

– 19 –
ICX098BQ

c) The adhesive may cause the marking on the rear surface to disappear, especially in case the regulated
voltage value is indicated on the rear surface. Therefore, the adhesive should not be applied to this area,
and indicated values should be transferred to the other locations as a precaution.
d) The notch of the package is used for directional index, and that can not be used for reference of fixing.
In addition, the cover glass and seal resin may overlap with the notch of the package.
e) If the lead bend repeatedly and the metal, etc., clash or rub against the package, the dust may be
generated by the fragments of resin.
f) Acrylate anaerobic adhesives are generally used to attach CCD image sensors. In addition, cyano-
acrylate instantaneous adhesives are sometimes used jointly with acrylate anaerobic adhesives. (reference)

5) Others
a) Do not expose to strong light (sun rays) for long periods, color filters will be discolored. When high
luminance objects are imaged with the exposure level control by electronic-iris, the luminance of the
image-plane may become excessive and discolor of the color filter will possibly be accelerated. In such a
case, it is advisable that taking-lens with the automatic-iris and closing of the shutter during the power-off
mode should be properly arranged. For continuous using under cruel condition exceeding the normal
using condition, consult our company.
b) Exposure to high temperature or humidity will affect the characteristics. Accordingly avoid storage or
usage in such conditions.
c) The brown stain may be seen on the bottom or side of the package. But this does not affect the CCD
characteristics.
d) This package has 2 kinds of internal structure. However, their package outline, optical size, and strength
are the same.
Structure A Structure B

AAA
Package

Chip

Metal plate
(lead frame)

Cross section of
lead frame

The cross section of lead frame can be seen on the side of the package for structure A.

– 20 –
Package Outline Unit: mm
14 pin DIP (400mil)

A
5.0

0˚ to 9˚
14 8 8 14

~
C

2.5
B

8.9
1.7

10.16
1.7

7.0
10.0 ± 0.1
V

5.0

~
2.5
H

1.0 1 8.9 7 7 1

0.5
10.0 ± 0.1

0.25
B'
1. “A” is the center of the effective image area.
7.0 2.5
2. The two points “B” of the package are the horizontal reference.

3.35 ± 0.15

1.0
The point “B'” of the package is the vertical reference.

– 21 –
~ 3. The bottom “C” of the package, and the top of the cover glass “D” are the height reference.

2.6
4. The center of the effective image area relative to “B” and “B'” is (H, V) = (5.0, 5.0) ± 0.15mm.

5. The rotation angle of the effective image area relative to H and V is ± 1˚.

1.27 0.3 6. The height from the bottom “C” to the effective image area is 1.41 ± 0.10mm.

1.27
0.46 The height from the top of the cover glass “D” to the effective image area is 1.94 ± 0.15mm.
0.3 M
7. The tilt of the effective image area relative to the bottom “C” is less than 25µm.

3.5 ± 0.3
The tilt of the effective image area relative to the top “D” of the cover glass is less than 25µm.
PACKAGE STRUCTURE 8. The thickness of the cover glass is 0.75mm, and the refractive index is 1.5.
PACKAGE MATERIAL Plastic 9. The notch of the package is used only for directional index, that must not be used for reference
of fixing.
LEAD TREATMENT GOLD PLATING

LEAD MATERIAL 42 ALLOY

PACKAGE MASS 0.60g


DRAWING NUMBER AS-D3-01(E)

Sony Corporation
ICX098BQ

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