ASME BPVC.

V-2019 ARTICLE 4

MANDATORY APPENDIX IV
PHASED ARRAY MANUAL RASTER EXAMINATION TECHNIQUES
USING LINEAR ARRAYS

IV-410 SCOPE IV-462 GENERAL CALIBRATION REQUIREMENTS

This Mandatory Appendix describes the requirements IV-462.7 Focal Law. The focal law to be used during
to be used for phased array, manual raster scanning, ul- the examination shall be used for calibration.
trasonic techniques using linear arrays. The techniques IV-462.8 Beam Calibration. All individual beams
covered by this Appendix are single (fixed angle), E-scan used in the examination shall be calibrated to provide
(fixed angle), and S-scan (sweeping multiple angle). In measurement of distance and amplitude correction over
general, this Article is in conformance with SE-2700, Stan- the sound path employed in the examination. This shall
dard Practice for Contact Ultrasonic Testing of Welds include applicable compensation for wedge sound path
Using Phased Arrays. SE-2700 provides details to be con- variations and wedge attenuation effects.
sidered in the procedures used.

IV-490 DOCUMENTATION
IV-420 GENERAL
IV-492 EXAMINATION RECORD ð19Þ
The requirements of Article 4 apply except as modified
For each examination, the required information of
by this Appendix.
T-492 and the following information shall be recorded:
ð19Þ IV-421 WRITTEN PROCEDURE REQUIREMENTS (a) search unit type, element size and number, and
pitch and gap dimensions
IV-421.1 Requirements. The requirements of Table (b) focal law parameters, including, as applicable, angle,
IV-421 shall apply. element numbers used, range of elements, element incre-
IV-421.2 Procedure Qualification. The requirements mental change, angular range, and angle incremental
of Table IV-421 shall apply. change
(c) wedge angle
ð19Þ IV-422 SCAN PLAN (d) instrument settings to include, as a minimum, exci-
A scan plan shall be developed. The scan plan, in com- tation pulse type, duration and voltage settings, digitiza-
bination with the written procedure, shall address all re- tion rate (e.g., nominal rate as affected by compression
quirements of Table IV-421. and points quantity), rectification, pulse repetition rate,
range start and stop, band pass filters, smoothing, focal
type, and length
IV-460 CALIBRATION (e) scan plan variables
IV-461 INSTRUMENT LINEARITY CHECKS
IV-461.2 Amplitude Control Linearity. The ultraso-
nic instrument’s amplitude control linearity shall be eval-
uated in accordance with Mandatory Appendix II for each
pulser-receiver circuit.

--`,``,``,,`,`,,````,`,``,,,`-`-`,,`,,`,`,,`---
109
Copyright ASME International (BPVC)
Provided by IHS under license with ASME Licensee=Khalda Petroleum/5986215001, User=Amer, Mohamed
No reproduction or networking permitted without license from IHS Not for Resale, 07/02/2019 13:29:23 MDT
 ARTICLE 4 ASME BPVC.V-2019

ð19Þ Table IV-421

Manual Linear Phased Array Raster Scanning Examination Procedure Requirements
Requirements (as Applicable) Essential Nonessential
Weld configurations examined, including joint design, thickness, and base material product form(s) X …
Surfaces from which the examination is performed X …
Surface condition (examination surface, calibration block) X …
Weld axis reference system and marking … X
Personnel qualification requirements X …
Personnel performance demonstration (if required) X …
Primary reference reflector and level X …
Calibration block(s) and technique(s) X …
Standardization method and reflectors (wedge delay, sensitivity, TCG) X …
Computerized data acquisition … X
Wedge cut/natural refracted angle X …
Wedge contouring and/or stabilizing features X …
Wedge height X …
Wedge type (solid wedge, water column, etc.) X …
Wedge material X …
Couplant: brand name or type … X
Instrument manufacturer and model, including all related operating modules X …
Instrument software and revision [Note (1)] X …
Special phased array probes, curved/shaped wedges, shoes, or saddles, when used X …
…
--`,``,``,,`,`,,````,`,``,,,`-`-`,,`,,`,`,,`---

Search unit type (linear, dual linear, dual matrix, tandem, etc.) X
Search unit detail (frequency, element size, number pitch, gap dimensions, element shape) X …
Technique(s) (straight beam, angle beam, contact, and/or immersion) X …
Angle(s) and mode(s) of wave propagation in the material X …
Directions and extent of scanning X …
Scan increment (decrease in overlap amount) X …
Use of scan gain over primary reference level X …
Virtual aperture size (i.e., number of elements, effective height, and element width) X …
Focus length and plane (identify plane projection, depth, or sound path, etc.) X …
For E-scan:
Range of element numbers used (i.e., 1–126, 10–50, etc.) X …
Element incremental change (i.e., 1, 2, etc.) X …
Rastering angle X …
Aperture start and stop numbers X …
For S-scan:
Aperture element numbers (first and last) X …
Decrease in angular range used (i.e., 40 deg to 50 deg, 50 deg to 70 deg, etc.) X …
Maximum angle incremental change (i.e., 1/2 deg, 1 deg, etc.) X …
For compound E-scan and S-scan: all E-scan and S-scan variables apply X …
Digitizing frequency X …
Net digitizing frequency (considers points quantity and other data compression) X …
Instrument dynamic range setting X …
Pulser voltage X …
Pulse type and width X …
Filters and smoothing X …
Pulse repetition frequency X …
Maximum range setting X …
Automatic alarm and/or recording equipment, when applicable … X
Method for discriminating geometric from flaw indications X …
Flaw characterization methodology X …
Method for measuring flaw length X …
Records, including minimum calibration data (e.g., instrument settings) … X
Post-exam cleaning … X

NOTE:
(1) Use of software revisions must be evaluated by the Level III for their impact on the functions as used. A limited extension of qualifica-
tion may be determined to prove software functions. For example, addition of a software feature more capable than that qualified may
be qualified by reanalysis of existing data. If a revision is implemented, personnel must receive training in use of the revised software.

110
Copyright ASME International (BPVC)
Provided by IHS under license with ASME Licensee=Khalda Petroleum/5986215001, User=Amer, Mohamed
No reproduction or networking permitted without license from IHS Not for Resale, 07/02/2019 13:29:23 MDT
 ASME BPVC.V-2019 ARTICLE 4

MANDATORY APPENDIX V
PHASED ARRAY E-SCAN AND S-SCAN LINEAR SCANNING
EXAMINATION TECHNIQUES

V-410 SCOPE V-470 EXAMINATION

This Mandatory Appendix describes the requirements V-471 GENERAL EXAMINATION REQUIREMENTS
to be used for phased array E-scan (fixed angle) and V-471.1 Examination Coverage. The required vol-
S-scan encoded linear scanning examinations using linear ume of the weld and base material to be examined shall
array search units. be scanned using a linear scanning technique with an en-
coder. Each linear scan shall be parallel to the weld axis at
V-420 GENERAL a constant standoff distance with the beam oriented per-
pendicular to the weld axis.
The requirements of Article 4 apply except as modified (a) The search unit shall be maintained at a fixed dis-
by this Appendix. tance from the weld axis by a fixed guide or mechanical
means.
ð19Þ V-421 WRITTEN PROCEDURE REQUIREMENTS (b) The examination angle(s) for E-scan and range of
V-421.1 Requirements. The requirements of Table angles for S-scan shall be appropriate for the joint to be
V-421 shall apply. examined.
V-421.2 Procedure Qualification. The requirements (c) Scanning speed shall be such that data drop-out is
of Table V-421 shall apply. less than 2 data lines/in. (25 mm) of the linear scan length
and that there are no adjacent data line skips.
ð19Þ V-422 SCAN PLAN (d) For E-scan techniques, overlap between adjacent
active apertures (i.e., aperture incremental change) shall
A scan plan shall be developed. The scan plan, in com-
be a minimum of 50% of the effective aperture height.
bination with the written procedure, shall address all re-
(e) For S-scan techniques, the angular sweep incremen-
quirements of Table V-421.
tal change shall be a maximum of 1 deg or sufficient to as-
sure 50% beam overlap.
V-460 CALIBRATION (f) When multiple linear scans are required to cover
the required volume of weld and base material, overlap
V-461 INSTRUMENT LINEARITY CHECKS between adjacent linear scans shall be a minimum of
V-461.2 Amplitude Control Linearity. The ultrasonic 10% of the effective aperture height for E-scans or beam
instrument’s amplitude control linearity shall be evalu- width for S-scans.
ated in accordance with Mandatory Appendix II for each V-471.6 Recording. A-scan data shall be recorded for
pulser-receiver circuit. the area of interest in an unprocessed form with no
--`,``,``,,`,`,,````,`,``,,,`-`-`,,`,,`,`,,`---

thresholding, at a minimum digitization rate of five times

V-462 GENERAL CALIBRATION REQUIREMENTS the examination frequency, and recording increments of a
V-462.7 Focal Law. The focal law to be used during maximum of
the examination shall be used for calibration. (a) 0.04 in. (1 mm) for material < 3 in. (75 mm) thick
V-462.8 Beam Calibration. All individual beams (b) 0.08 in. (2 mm) for material ≥ 3 in. (75 mm) thick
used in the examination shall be calibrated to provide V-471.7 Reflectors Transverse to the Weld Seam. As
measurement of distance and amplitude correction over an alternate to line scanning, a manual angle beam exam-
the sound path employed in the examination. ination may be performed for reflectors transverse to the
weld axis.
V-467 ENCODER CALIBRATION
A calibration check shall be performed at intervals not
to exceed one month or prior to first use thereafter, by
moving the encoder a minimum distance of 20 in.
(500 mm). The display distance shall be within 1% of
the actual distance moved.

111
Copyright ASME International (BPVC)
Provided by IHS under license with ASME Licensee=Khalda Petroleum/5986215001, User=Amer, Mohamed
No reproduction or networking permitted without license from IHS Not for Resale, 07/02/2019 13:29:23 MDT
 ARTICLE 4 ASME BPVC.V-2019

ð19Þ Table V-421

Requirements of Phased Array Linear Scanning Examination Procedures
Workmanship Fracture Mechanics
Requirements (as Applicable) Essential Nonessential Essential Nonessential
Weld configurations examined, including joint design thickness and X … X …
base material product form
Surfaces from which examination is performed X … X …
Surface condition (examination surface, calibration block) X … X …
Weld axis reference system and marking X … X …
Personnel qualification requirements X … X …
Personnel performance demonstration (if required) X … X …
Primary reference reflector and level X … X …
Calibration [calibration block(s) and technique(s)] X … X …
Standardization method and reflectors (wedge delay, sensitivity, TCG) X … X …
Computerized data acquisition X … X …
Wedge cut/natural refracted angle X … X …
Wedge contouring and/or stabilizing features X … X …
Wedge height X … X …
Wedge roof angle, if applicable X … X …
Wedge type (solid wedge, water column, etc.) X … X …
Wedge material X … X …
Scanner type and fixturing X … X …
Search unit mechanical fixturing device (manufacturer and model), X … X …
adhering and guiding mechanism
Search unit separation, if applicable X … X …
Couplant brand name or type … X … X
Instrument manufacturer and model, including all related operating X … X …
modules
Instrument software and revision [Note (1)] X … X …
Use of separate data analysis software and revision [Note (1)] X … X …
Search unit type (linear, dual linear, dual matrix, tandem, etc.) X … X …
Search unit detail (frequency, element size, number pitch, gap X … X …
dimensions, element shape)
Technique(s) (straight beam, angle beam, contact, and/or immersion) X … X …
Angle(s) and mode(s) of wave propagation in the material X … X …
Direction and extent of scanning X … X …
Scanning technique (line vs. raster) X … X …
Scanning technique (automated vs. semiautomated) X … X …
Scanning (manual vs. encoded) X … X …
Scan increment (decrease in overlap) X … X …
Use of scan gain over primary reference level X … X …
Virtual aperture size (i.e., number of elements, effective height, and X … X …
element width)
Focus length and plane (identify plane projection, depth, or sound X … X …
path, etc.)
For E-scan
Range of element numbers used (i.e., 1–126, 10–50, etc.) X … X …
Element incremental change (i.e., 1, 2, etc.) X … X …
Rastering angle X … X …
Aperture start and stop numbers X … X …
For S-scan:
Aperture element numbers (first and last) X … X …
Decrease in angular range used (i.e., 40 deg to 50 deg, 50 deg to 70 X … X …
deg, etc.)
Maximum angle incremental change (i.e., 1/2 deg, 1 deg, etc.) X … X …
For compound E-scan and S-scan: all E-scan and S-scan variables apply X … X …
Digitizing frequency X … X …
Net digitizing frequency (considers digitization frequency together X … X …
with points quantity or other data compression)
Instrument dynamic range setting X … X …
Pulser voltage X … X …
Pulse type and width X … X …
Filters and smoothing X … X …

112
--`,``,``,,`,`,,````,`,``,,,`-`-`,,`,,`,`,,`---

Copyright ASME International (BPVC)

Provided by IHS under license with ASME Licensee=Khalda Petroleum/5986215001, User=Amer, Mohamed
No reproduction or networking permitted without license from IHS Not for Resale, 07/02/2019 13:29:23 MDT
 ASME BPVC.V-2019 ARTICLE 4

Table V-421
Requirements of Phased Array Linear Scanning Examination Procedures (Cont'd)
Workmanship Fracture Mechanics
Requirements (as Applicable) Essential Nonessential Essential Nonessential
Pulse repetition frequency X … X …
Maximum range setting X … X …
Use of digital gain X … X …
Method for discriminating geometric from flaw indications X … X …
Flaw characterization methodology X … NA NA
Method for measuring flaw length X … X …
Method for measuring flaw height NA NA X …
Method for determining indication location relative to surface NA NA X …
Method for determining indication relative to other indications NA NA X …
Records, including minimum calibration data to be recorded (e.g., … X … X
instrument settings)
Post-exam cleaning … X … X

GENERAL NOTE: NA = not applicable.

NOTE:
(1) Use of later software revisions shall be evaluated by the Level III for their impact on the functions as used. A limited extension of qua-
lification may be determined to prove software functions. For example, addition of a software feature more capable than that already
qualified may be qualified by reanalysis of existing data. If a revision is implemented, personnel shall receive training in use of the revised
software.

V-490 DOCUMENTATION (c) wedge natural refracted angle

ð19Þ V-492 EXAMINATION RECORD (d) instrument settings to include, as a minimum, exci-
tation pulse type, duration and voltage settings, digitiza-
For each examination, the required information of tion rate (e.g., nominal rate as affected by compression
T-492 and the following information shall be recorded: and points quantity), rectification, pulse repetition rate,
(a) search unit element size, number, and pitch and gap range start and stop, band pass filters, smoothing, focal
dimensions
type, and length
(b) focal law parameters, including, as applicable, angle
or angular range, element numbers used, angular or ele- (e) scan plan variables
ment incremental change, and start and stop element A-scan recorded data need only be retained until final
numbers or start element number flaw evaluation has been performed.

113
--`,``,``,,`,`,,````,`,``,,,`-`-`,,`,,`,`,,`---

Copyright ASME International (BPVC)

Provided by IHS under license with ASME Licensee=Khalda Petroleum/5986215001, User=Amer, Mohamed
No reproduction or networking permitted without license from IHS Not for Resale, 07/02/2019 13:29:23 MDT